Sunday 28 August
08:00

"Sunday 28 August"

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PSA
08:00 - 18:15

Poster Session A
Display poster from Sunday 28, 2:00 pm to Friday 2, 4:00 pm

Poster sessions:
Monday 16.30 > 18.15
Tuesday 16.45 > 18.15
Wednesday 17.00 > 18.45
Thursday at 16.00 > 18.15
08:00 - 18:15 #4885 - IM09-108 Optical far-field super-resolution microscopy with local probes.
IM09-108 Optical far-field super-resolution microscopy with local probes.

The local fields, such as magnetic, optic and temperature, can be used to characterize the properties of physical and biological materials. These local fields could be measured with closely placed quantum emitters. The imaging process were usually accomplished by placing the probe on a scanning tip. However, the moving of tips might change the local field distribution. Another promising method is to place an array of probes close to the sample and detect the probes with super-resolution optical far-field microscopy. In this way, the relative distance between the probe and sample is fixed, and the scanning process would not affect the results of detection. The resolution of fluorescence based optical far-field microscopy has been improved to several nanometers in recent years. It is possible to detect the nanoscale physical local effects with optical far-field microscopy.

  In this work, we used the nitrogen vacancy (NV) center in diamond as probes to detect the local optical field passing through aluminum structures. By improving the spatial resolution of optical microscopy with NV center, we can detect the shape of structures with resolution below diffraction limit. This method has the potential to detect other materials, which enable it to be a universal super-resolution microscope.

  It has been proved that the charge state conversion of NV center can be pumped by lasers with different wavelengths. The green laser can initialize the center to the negative charge state with fidelity about 75%, while red laser can initialize the center to neutral charge state with fidelity about 95%. To realize high spatial resolution microscopy, we used a Gaussian shaped 637 nm laser beam to initialize the charge state, and then a doughnut shaped 532 nm laser beam to switch the charge state of NV, as shown in Fig.1 (a). Therefore, the doughnut shaped 532 nm laser beam will change the charge state of NV from NV0 to NV-. Only the charge state of NV at the center of 532 nm laser beam will not be changed by doughnut laser beam (Fig. 1 (b)). The charge state was finally detected by a weak 589 nm laser. By detecting the fluorescence of NV-, the intensity of fluorescence would show a dark spot, which indicated the position of NV with resolution below diffraction limit. This super-resolution microscopy was named as charge state depletion (CSD) microscopy.

  In order to improve the resolution of microscopy, one way was to increase the power of 532 nm laser. Instead, we applied another 780 nm Gaussian shaped laser beam, as in Fig. 1(a). The 780 nm laser can accelerate the charge state conversion pumped by 532 nm. Therefore, the resolution of microscopy was significantly improved by applying the 780 nm laser, as shown in Fig 1(c). And the power of 532 nm laser can be reduced by a factor about 10 times by applying 0.4 mW 780 nm laser. The resolution of 50 nm can be obtained with 0.14 mW 532 nm laser. As the 780 nm laser might cause less photon damage than 532 nm laser, this method could be applied to the biological imaging.

  In further step, we used the super-resolution microscopy with NV center in bulk diamond to detect the structure of nanoscale materials, as shown in Fig.2. Aluminum was deposited on the surface of diamond plate. The laser beams were used to pump NV center through the aluminum structures. The local optical field below diamond surface was affected by the shape of aluminum material. And the charge state conversion of NV center was pumped by the local optical field below diamond surface. By applying CSD microscopy, we can detect the charge state of NV center with high spatial resolution. Subsequently, the structure of aluminum was imaged with spatial resolution higher than that with confocal microscopy, as in Fig.2 (c)-(e). This method can be used to detect properties of other nanoparticles.

  In summary, we demonstrated the super-resolution microscopy with NV center based on charge state conversion. The power of laser was decreased at least one order by applying an additional 780 nm laser. A universal super-resolution microscopy was developed by using the NV center ensemble in bulk diamond as local optical field probes.

 


Xiangdong CHEN (Hefei, China), Fangwen SUN
08:00 - 18:15 #5849 - IM09-109 Z-stack of super-resolved bright-field microscopic images and its simplified reporting.
IM09-109 Z-stack of super-resolved bright-field microscopic images and its simplified reporting.

We  describe an algorithm of processing of z-stacks of images of unlabelled live cells obtained from wide-field bright-field optical transmission microscopy to achieve the super-resolved volumes of intracellular objects in the order of 20×20×100 nm3, including the classification of pixels according to an intracellular dynamics and spectral properties [1].

This super-resolved method is based on

(1) non-interpolating de-mosaicing of a 12-bit z-stack of raw images obtained from a camera chip equipped by a Bayer mask, which preserves as much information in the image as possible to obtain RGB images.

(2) searching for pixels of unchanged (or near) intensities between two consecutive images, after either the simple subtraction of two consecutive images or the calculation of a point divergence gain (PDG).

The latter step of image processing is responsible for evaluation of the intracellular dynamics. If PDG = 0 (the same intensities at the same position in two consecutive images), large intensity homogenous non-moving objects are mainly segmented. At minimal and maximal values of PDG (a pixel of the rarest intensity is replaced by a pixel of the most frequent intensity and vice versa), we track a large moving organelles. The other values of PDG correspond either to the other intracellular objects or to other intensities in the course of the sum of point spread functions of the live cell.

(3) the selection and evaluation of each colour channel of the image. In the blue channel, we observe mainly autofluorescence. In the green channel, the light diffraction is also projected. In the red channel, the light absorption in near infrared region is further observed.

We also show a method of simplified reporting of resulting data on the example of a living mammalian cell.

 

References:

[1] R. Rychtáriková et al., in ISCS 2014: Interdisciplinary Symposium on Complex Systems (Emergence, Complexity and Computation 14), edited by A. Sanayei, O.E. Rössler, I. Zelinka (Switzerland: Springer), 2014, pp. 261–267.

Acknowledgements:

This work was nancially supported by CENAKVA (No. CZ.1.05/2.1.00/01.0024), CENAKVA II (No.LO1205 under the NPU I program) and The CENAKVA Centre Development (No. CZ.1.05/2.1.00/19.0380).


Renata RYCHTARIKOVA (Ceske Budejovice, Czech Republic), Dalibor STYS
08:00 - 18:15 #6066 - IM09-110 Study of Nucleation of Microbubbles at a Solid/Water Interface with Optical Microscopy and Atomic Force Microscopy.
IM09-110 Study of Nucleation of Microbubbles at a Solid/Water Interface with Optical Microscopy and Atomic Force Microscopy.

Microbubbles (MBs) or air bubbles have been explored for various applications in many fields of science and technology, such as water treatment, biomedical engineering and nanomaterials. The so-called nanobubble was first proposed in 1994 and also confirmed their existence at the interfaces between water and hydrophobic solids [1]. In a previous study, microbubbles may evolve spontaneously on smooth modified hydrophobic Si surfaces following the decompression [2]. It was proposed that nanobubbles may be the gas micronuclei responsible for the microbubble formation. However, direct observation of microbubble nucleation sites is not yet reported. In this work, we investigated the formation process of microbubbles at a solid/water interface using pe-degassed and N2-saturated water. Optical microscopy was first used to observe the nucleation site of microbubbles and atomic force microscopy (AFM) was utilized to obtain high-resolution images of the nucleation sites. In figures 1(a)-(c), optical images show that the formation process of microbubbles on graphene-coated mica surface in N2-saturated water. Microbubbles tend to form on hydrophobic graphite or graphene-coated areas but not on pure mica areas. Interestingly, there were certain sites on graphene-coated areas that microbubbles prefer to form when we inject N2-saturated water. We zoomed in an area with the preferential gas nucleation sites [figure 1(d)] and acquired high-resolution AFM images [figure 1(e)] after injecting pre-degassed water to make the microbubbles disappear. The preferential bubble nucleation sites appeared dark in optical images, but AFM images revealed that these sites were local protrusions in the height images. In addition, AFM images showed presence of nanobubbles on flat graphene-covered areas outside the protrusions [figure 1(f)]. The relation between microbubble and nanobubble will be discussed.

Ref [1]. Parker J L, Claesson P M and Attard P, J. Phys. Chem. 98 8468–80 (1994)

Ref [2]. Arieli R., Marmur A., Respir Physiol Neurobiol. 177(1):19-23 (2011)


Chih-Wen YANG (Taipei, Taiwan), Hsien-Chen KO, Ya-Ling CHIANG, Yi-Hsien LU, Ing-Shouh HWANG
08:00 - 18:15 #6093 - IM09-111 Simultaneous multi-plane, multi-colour microscopy imaging using quadratically distorted (QD) grating and grisms.
IM09-111 Simultaneous multi-plane, multi-colour microscopy imaging using quadratically distorted (QD) grating and grisms.

The recent emergence of super-resolution microscopy imaging techniques has surpassed the diffraction limit to improve image resolution. Contrary to the breakthroughs of spatial resolution, high temporal resolution remains a challenge. By introducing a detour phase term, a quadratically distorted (QD) grating, which imparts an equal but opposing focal power in the positive and negative diffracted orders, can provide a simple, versatile avenue for simultaneous multi-plane microscopy imaging when combined with a lens [1]. As Fig. 1 illustrated, objects A, B and C located at different distances from QD grating are imaged simultaneously and spatially separated on a single image plane, and the biological images on the right side are, for example, the partial views of a stage 8 drosophila egg chamber (Δz~7.3µm). This narrowband multi-plane bioimaging work was in collaboration with Prof. Ilan Davis of Oxford University.

However, QD gratings are dispersive and the multi-colour images may be chromatically smeared if the dispersion is not corrected. A correction scheme based on grism, which is a combination of blazed grating and prism, has been demonstrated earlier [2]. In principle, utilizing the inherent non-periodic chirps of QD grating, identical diffraction angles with respect to different wavelengths could be obtained, thus correcting the chromatic dispersion (Fig. 2a). Therefore a collimated beam in which the spectral components are laterally displaced has been created by a pair of grisms (Fig. 2b). The lateral shear between the polychrome components in the output beam is controlled by varying the separation between the grisms. Due to the various errors in alignment of the long optical path (>1 metre in reference [2]) and the defects in the fabrication of grisms and their mounts, the grism-based approach we proposed before is also limiting, which is only applicable for optical tests rather than the real microscopy imaging [2].

We have recently customized a new pair of grisms and their mounts, and optimized the design of QD grating with practicable parameters, such that the optical system can be effectively improved and hence available for simultaneous multi-plane, multi-colour microscopy imaging. Fabricated from Schott B270 glass, a 17.5° wedge/blazed angle was designed, and a transmission grating of 300 grooves/mm was cemented to one side of the prism, thus forming a grism with an un-deviated wavelength of 527.3nm. The grism pair was mounted between two 250mm achromatic lenses for qualitatively evaluating the wide-range chromatic correction capability. The achromats were spaced 200mm apart, and the QD grating (a nominal axial period of 50μm, a curvature W20 of 50 waves and radius of 10mm) was placed 208mm from the second principal plane of the compound achromats system, thus equal magnification images can be obtained in each diffraction order. Then a simulated 3D imaging of eGFP fluorophore was implemented — a high power fibre continuum source (Fianium SC450-PP-HE) filtered by a set of 20nm bandpass filters (Thorlabs) with central wavelengths from 480nm to 600nm in 20nm steps was applied, and the system was focused for the central wavelength of ~532nm in 0th order, with and without grism correction. The combined greyscale image of all the 7 wavebands (simulated from bandpass weighting) demonstrate that the chromatic smearing of first-order images can be effectively corrected (Fig. 3). The grism and thus the optical system can also be designed for broadband simultaneous multi-plane imaging of various fluorophores/wavebands.

This technique can be realised with a simple optical attachment fully compatible with commercial microscopes and standard camera systems, and has direct applications for studies of rapidly-changing objects in cell-biology, fluid-flow and high-speed, 3D tracking. A few biological applications are still in process, and the details of which may be published in the near future.

References

[1] P. Blanchard and A. Greenaway, Applied Optics, 38(32), 6692-6699 (1999).

[2] Y. Feng, P. Dalgarno, D. Lee, Y. Yang, R. Thomson and A. Greenaway, Optics Express 20(18), 20705-20714 (2012).


Yan FENG (Edinburgh, United Kingdom), Yuewei LIU, Zhengkun LIU
08:00 - 18:15 #6361 - IM09-112 Crystal structure solution of K6.4(Nb,Ta)36.3O94 compound, by using advanced TEM.
IM09-112 Crystal structure solution of K6.4(Nb,Ta)36.3O94 compound, by using advanced TEM.

We determined the crystal structure of the K6.4Nb28.2Ta8.1O94 pseudo-tetragonal tungsten bronze-type material using advanced transmission electron microscopy techniques with an aberration corrected microscope. [1] The crystal structure solution obtained with TEM was afterwards refined using X-ray and neutron powder diffraction data. The crystal structure consists of a framework containing trigonal, tetragonal and pentagonal tunnels, all built from (Nb,Ta)O6 octahedra. Using ABF-STEM and atomic resolution EDX we found that the tetragonal tunnels are occupied by K and Nb atoms, not observed before in the K2Nb8O21 counterpart, whereas part of the trigonal tunnels are occupied with K. The occupation of the trigonal tunnels was not reported before for any of the compounds with similar structure type. 

[1] Robert Paria Sena, Artem A. Babaryk, Sergiy Khainakov, Santiago Garcia-Granda, Nikolay S. Slobodyanik, Gustaaf Van Tendeloo, Artem M. Abakumov, Hadermann, Joke, Dalton Transactions 45 (2016) 973-979

 

Acknowledgements

 

We thank Dr. E. Suard and Dr. O. Fabello for assistance collecting the neutron diffraction data. R.P.S. acknowledges funding from the European Research Council under the 7th Framework Program (FP7), ERC Grant No.246791-COUNTATOMS. The titan microscope was partly funded by the Hercules fund from the Flemish Government. The authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative. Reference No. 312483-ESTEEM2.


Robert PARIA SENA (Antwerp, Belgium), Artem A. BABARYK, Sergiy KHAINAKOV, Santiago GARCIA-GRANDA, Nikolay S. SLOBODYANIK, Gustaaf VAN TENDELOO, Artem M ABAKUMOV, Joke HADERMANN
08:00 - 18:15 #6883 - IM09-113 Nanometric localization of synaptic proteins by combining single-molecule localization imaging with scanning electron microscopy.
IM09-113 Nanometric localization of synaptic proteins by combining single-molecule localization imaging with scanning electron microscopy.

Synapses are compartmentalized organelles containing thousands of proteins. Their precise localization at both pre- and post- synaptic elements is essential for a correct processing and transfer of information between excitable cells. To decipher cellular and molecular mechanisms that regulate and maintain neurotransmitter receptors at synapses we are using C. elegans neuromuscular junction (NMJ) as a model of synapse. In particular, we are interested in a novel mechanism of clustering acetylcholine and GABAA receptors based on extracellular scaffolding proteins in the synaptic cleft. The transparency and simple morphology of C. elegans combined with the ease of genomic engineering to tag endogenous proteins, provide a means to address the localization and organization of these extracellular scaffolding proteins.

We used 2D and 3D direct Stochastic Optical Reconstruction Microscopy (dSTORM) on immuno-stained worms and we found that acetylcholine receptor (AChR) clusters are close but not in perfect register with presynaptic boutons. We then built a knock-in strain expressing AChR tagged with the photoswitchable protein Eos and used PALM to analyze AChR content at individual synapses. We found that the number of AChRs is variable depending on synaptic size but the density or receptors is remarkably constant. We are now mapping protein distribution on synaptic ultrastructure by combining the tomo-array technique with STORM/PALM imaging.

 


Camilla LUCCARDINI (VILLEURBANNE CEDEX), Manon PERRET, Sebastian MARKERT, Christian STIGLOHER, Béatrice BURDIN, Jean-Louis BESSEREAU
08:00 - 18:15 #4488 - IM10-114 IM10+ RISE Microscopy: Correlative Raman and SEM Imaging.
IM10-114 IM10+ RISE Microscopy: Correlative Raman and SEM Imaging.

RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and Scanning Electron (RISE) microscopy within one microscope system (Fig. 1a). This unique combination provides distinct advantages with regard to comprehensive sample characterization: electron microscopy is an excellent technique for visualizing surface structures in the nanometer range and confocal Raman imaging is an established method for detection of the chemical and molecular components of a sample with diffraction-limited resolution. In contrast to conventional systems in which individual Raman spectra are collected from areas several micrometers across, RISE can produce diffraction-limited confocal Raman images from the same sub-micron areas investigated by SEM. It can also generate 3D-images and depth profiles to visualize the distribution of the molecular compounds within a sample volume. Both analytical methods are fully integrated into the RISE microscope. Between measurements a precise translation stage automatically transfers the sample inside the microscope's vacuum chamber and re-positions it. The RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid.

The instrument itself as well as example measurements demonstrating the potential of its hybrid approach will be presented. An example of correlative Raman and SEM imaging is presented in Figure 1b-d, showing the distribution of TiO2 nanoparticles. Fig. 1b shows the SEM image of TiO2, revealing nanoparticles of two different sizes. From the same sample area an array of 150 x 150 complete Raman spectra was acquired with an integration time per spectrum of 37 ms. From this array two distinct spectra were evaluated as shown in Fig. 1c. They show the two polymorphic phases of TiO2: rutile and anatase. The correlative Raman-SEM image (Fig. 1d) reveals that the large particles correspond to the rutile phase of TiO2, whereas the small particles consist of anatase TiO2, enabling the fine crystallographic structure of the nanoparticles to be differentiated.


Ute SCHMIDT, Philippe AYASSE (Ulm, Germany), Olaf HOLLRICHER
08:00 - 18:15 #5905 - IM10-115 Correlative microscopy for elemental analysis by NanoSIMS and Electron microscopy: optimization of sample preparation methods.
IM10-115 Correlative microscopy for elemental analysis by NanoSIMS and Electron microscopy: optimization of sample preparation methods.

Electron microscopy (EM) and nano secondary ion mass spectrometry (NanoSIMS) aim to acquiring nanometric information, which also imply ultraresolution and therefore these techniques require the best preservation of samples. Analytical techniques such as X-ray spectroscopy and NanoSIMS are able to identify, localize and quantify chemical elements both at the whole cell and at the intracellular level. These techniques can be coupled with biological structural analysis. The goal in sample preparation is to maintain chemical elements at their original localization site as well as at their physiological active site. Therefore, sample preparation has to prevent also delocalization of the biological molecules (e.g. proteins, lipids). In EM and NanoSIMS, samples are subjected to drastic conditions such as high vacuum and beam energy. Thus, due to the characteristics of these devices, analyses are incompatible with native biological systems. Moreover, these techniques require thin sections of samples (TEM/X-EDS (70-100nm) and NanoSIMS (200-300nm)). The sample should not be destroyed too quickly under the beam or by vacuum sublimation and must be stable chemically. Diffusible elements are quickly lost during dehydration and embedding step used for the routine preparation of biological specimens and so these methods can only be used if it is already known that the elements of interest are tightly bound. Sample preparation for EM and NanoSIMS must immobilize the biological elements, must eliminate water and must allow sectioning of the sample. As generally accepted in the literature, cryofixation by high pressure freezing followed by cryosubstitution are the best methods to limit redistribution of metal ions. In general, the preparation of biological samples for TEM and NanoSIMS is rather similar. Therefore, both techniques can be easily applied together and in a complementary way for bioimaging.

 

In this work, different biological sample preparation techniques will be presented. The goal is to compare several cryomethods like cryosubstitution with different resins or freeze-drying. An advanced sample preparation protocol was developed basing on high pressure freezing cryofixation follow by cryosubstitution or freeze-drying, in order to limit metal redistribution, and preparation of adjacent ultramicrotome sections for parallel TEM and NanoSIMS analyses of the same cell.

 

Best results were obtained by correlative imaging of a single cell by TEM and NanoSIMS combining the advantages of both techniques. As an illustration, the ultrastructure of a C. reinhardtii cell (Fig. 2) could be directly related to the spatial distribution of macro and trace elements present at basal levels in the cell (Figs. 1 and 3). Thus, metals could be localized in different cell organelles such as the pyrenoid and granules. For another example, epidermal cells on adherent culture (keratinocytes), localization of elements (e.g. Ni) demonstrates the importance of sample preparation. Correlative TEM and NanoSIMS shows potential for many future applications of subcellular imaging of trace elements in medicine and biology.

 

Acknowledgments

Ministère de l’Enseignement Supérieur et de la Recherche : ANR-11-EQPX-0027 MARSS, PhD fellowship for  Florent Penen and ANR-10-INBS-04 FranceBioImaging.


Etienne GONTIER (Bordeaux Cedex), Florent PENEN, Julien MALHERBE, Marie-Pierre ISAURE, Anne-Laure BULTEAU, Philippe LE COUSTUMER, Dirk SCHAUMLÖFFEL
08:00 - 18:15 #5941 - IM10-116 Improvement of 3D atom probe tomography reconstruction integrating transmission electron microscopy information.
IM10-116 Improvement of 3D atom probe tomography reconstruction integrating transmission electron microscopy information.

We propose to improve atom probe tomography (APT) reconstruction methods to increase the reliability and the accuracy of the resulting 3D volumes. Currently, 3D reconstructions are done iteratively atom by atom, to convert the ion sequence (#N) and the detected position (XD,YD) into atomic coordinates (x,y,z). To obtain a more realistic reconstruction, a better estimation of the main reconstruction parameters (e.g. image compression factor, detection efficiency, evolution of the tip radius) is required [1].

 

Some techniques have already been developed in order to estimate the reconstruction parameters. Those calibrations are based on voltage curve, tip image, field ion microscopy or desorption images. Most of these techniques have been shown to give accurate results on homogenous or metallic materials (in this case, the crystallographic pole or atomic planes can easily be observed) [2]. Unfortunately, these techniques are poorly suited for semiconductor materials, since the projection laws and the physics of field evaporation affect the reconstruction parameters, especially in the case of multiphase materials where evaporation fields are different from one phase to another.

 

In this study, we aim to correlate the information obtained by transmission electron microscopy (TEM) with atom probe tomography to improve the current reconstruction model. We focused on high-K multilayer materials where the evaporation field is very different between each layer. As we can see on figure 1, the original sample contains flat and chemically well-defined interfaces, whereas those interfaces are strongly distorted (figure2.a) when a classic reconstruction algorithm (with cone angle consideration) is used.  This distortion comes from the assumption that two atoms arriving one after the other on the detector were close to one another in the tip, which is not the case in wide field of view APT.

 

In our model, the reconstruction is performed by dealing separately with different (and previously defined) areas of the detector surface. The ions are labeled independently in every sub-detector, allowing different reconstruction parameters for each subdetector and therefore a better match of the theoretical thickness of every layer. The new reconstruction (figure 2.b) shows homogenous atom density, flat interfaces and more accurate layer thicknesses, making the chemical quantification more reliable. This study could be extended to 3D objects, where the microstructural features observed in TEM could be used to constrain the resulting APT volume.

 

[1] Vurpillot et al., Ultramicroscopy, 132, 19, 2013.

[2] B. Gault et al., Microscopy and Microanalysis, 14 (04), 296, 2008.

 

This work has been funded by the French ANR Recherche Technologique de Base (RTB) programme. The experiments were performed on the Nanocharacterisation platform (PFNC) at MINATEC.


Isabelle MOUTON (GRENOBLE CEDEX 9), Robert ESTIVILL-STROUD, Adeline GRENIER, Magalie GREGOIRE, Marc JUHEL, Jean Paul BARNES
08:00 - 18:15 #6158 - IM10-117 Study of the interaction of Macrobrachium rosenbergii Nodavirus and its virus-like particles (MrNV-VLPs) in Sf9 insect cells: the dependence upon caveolin-mediated endocytosis and the possible existence of a capsid ligand domain.
IM10-117 Study of the interaction of Macrobrachium rosenbergii Nodavirus and its virus-like particles (MrNV-VLPs) in Sf9 insect cells: the dependence upon caveolin-mediated endocytosis and the possible existence of a capsid ligand domain.

Macrobrachium rosenbergii Nodavirus (MrNV) causes white tail disease (WTD) in the giant freshwater prawn M. rosenbergii. In our past studies, we generated Macrobrachium rosenbergii Nodavirus virus-like particles (MrNV-VLPs) that were capable of being “nanocontainers” through the uptake of foreign plasmids after viral capsid disassembling/reassembling treatment. Nevertheless, the studies into the binding and internalization of this particular virus into susceptible host cells have been lacking; therefore our team has utilized live MrNV and recombinantly synthesized MrNV-VLPs as a tool to examine viral entry mechanisms in Sf9 insect cells; whereby revealing the dependence upon the caveolin-mediated endocytotic pathway for internalization and infection. Furthermore, viral capsid protein subunit modeling and capsid enzyme digestion were performed for revealing viral protrusions/ligands.


Monsicha SOMRIT, Atthaboon WATTHAMMAWUT (BANGKOK, Thailand), Wattana WEERACHATYANUKUL, Yann GUERARDEL
08:00 - 18:15 #6176 - IM10-118 Understanding the in vivo reactivity of metal orthopaedic implants.
IM10-118 Understanding the in vivo reactivity of metal orthopaedic implants.

CoCr alloys became commonly used in orthopaedic implants, especially for younger patients, owing to their superior wear and corrosion resistance. However, severe inflammation resulted in unexpectedly high failure rates, leading to the withdrawal of some CoCr devices from the market, and lawsuits were filed in the US. Simulation studies show that, despite exhibiting lower volumetric wear, CoCr implants produce more, smaller (50 nm-3 µm), particles; up to one trillion nanoparticles (NPs) can be produced in each patient annually. The observed inflammation in patients is believed to be caused by these wear-produced NPs. CoCr NPs have been observed in macrophage cells in periprosthetic tissue. While CoCr is extremely corrosion resistant in bulk form, Co2+ ions have been observed in blood and other organs such as the liver and spleen raising question on the mechanism of the dissolution of the CoCr NPs particles in vivo.

Ex situ studies of CoCr NPs in simulated biological environment have been performed in our lab with the use of an applied electrochemical potential to simulate the oxidising environment generated during inflammatory response. Electron microscopy showed morphological changes in the particles as they developed into a porous sponge-like structures (e.g. shown in Figure 1). This phenomena has not been observed in CoCr alloys before, revealing a new mechanism of dissolution of these alloys at the nanoscale. This research suggests that new testing criteria are required for implant materials, in particular where there is wear debris generated, where bulk form testing must be accompanied with studying reactivity of materials at the nanoscale.

The morphological changes apparent at the nanoscale, through electron microscopy, was correlated with chemical changes through the high energy resolution of Transmission X-ray Microscopy/X-ray Absorption Spectroscopy at Stanford Synchrotron Light Source. This was done at both the Co and Cr X-ray absorption edges, to reveal the points of oxidation of Co and Cr in the particles.


Mohamed KORONFEL (London, United Kingdom), Angela GOODE, Johanna WEKER, Thiago SIMOES, Richard DRUMMOND-BRYDSON, Alister HART, Michael TONEY, Alexandra PORTER, Mary RYAN
08:00 - 18:15 #6411 - IM10-119 Correlative microscopy on tissue: Development applied to the skin and the nervous system.
IM10-119 Correlative microscopy on tissue: Development applied to the skin and the nervous system.

Correlative Light and Electron Microscopy (CLEM) combines two imaging techniques at different scales to figure out the precise localization of rare elements in a well-defined biological context. Light microscopy (LM) allows positional mapping of the sample labeled with a fluorochrome. Electron microscopy (EM) provides the nanometer resolution of the mapped area. The general principle of CLEM is to collect different informations from a single region in a sample. The data are then combined toward a global understanding of the sample ultrastructure. The precise localization of molecules of interest in their biological context serves to define their functional role. In the present study, we aimed to apply CLEM to tissue samples. We have chosen define regions of interest (ROI) by fiducial laser marks surrounding the ROI. For this purpose, we applied the “Near infrared branding” (NIRB) method (Bishop et al., 2011).

This NIRB technique consists to create easily detectable fiducial marks in three dimensions in a fixed tissue sample. A specific region of the sample is imaged with LM, the fiducial marks are performed, and the same region is analysed with EM. The fiducial marks are detectable both in optical and electron microscopy. They are made with a femtosecond pulsed titanium-sapphire laser. The laser is used to create a user defined pattern with line or points scans. The size of the marks depends on the fraction of laser power used or the number of laser swipes. The NIRB marks can be placed with a three-dimensional micrometer precision in close proximity to the ROI. Laser-made marks are visualized through tissue photo-oxidation that induces autofluorescence in LM and is a characteristic marker for EM. When using Green Fluorescent Protein (GFP) labelling, no GFP photo-oxidation is noticed when drawing NIRB.

The present study focused on adjustments that are necessary to adapt the NIRB method to nervous tissue and skin. These two types of tissue present a very different composition and are therefore well suited to compare the conditions of NIRB implementation. The NIRB technique has been set using immunostaining of easily detectable and strongly represented antigens with a specific location in well-defined regions. In nervous tissue, the constitutive extra-membranous mitochondrial protein TOM20 was used as a target antigen in spinal cord sections. For the skin, the development relied on Langerin immunostaining (a type II transmembrane, C-type lectin receptor on Langerhans cells). The goal is to locate the Langerhans cells in the epidermis. All immunostaining strategies are performed with a pre-embedding method. It consists in immunostaining on chemically fixed samples before embedding in resin and ultra-sectioning for TEM.

First, we set the method to achieve the ROI localization. Then, we defined our own parameter settings using our multiphoton system. Finally, it is essential to adapt the marks to the size of the region of interest, and the type of sample. The delimited ROI can size up to 70μm3. Future perspectives are to develop three-dimensional CLEM approach using electron tomography.

 

Acknowledgments

Ministère de l’Enseignement Supérieur et de la Recherche : ANR-10-INBS-04 FranceBioImaging.


Etienne GONTIER (Bordeaux Cedex), Jimmy LEDIGABEL, Sabrina LACOMME, Marie GLAVIER, Gwendal JOSSE, Marc LANDRY
08:00 - 18:15 #6525 - IM10-120 Improving 3d correlation in integrated correlated light and electron microscopy using confocal laser scanning microscopy.
IM10-120 Improving 3d correlation in integrated correlated light and electron microscopy using confocal laser scanning microscopy.

In CLEM experiments biological samples are typically first investigated by light microscopy (LM) to locate a region of interest. Next, nanometer-scale imaging can be achieved by electron microscopy (EM). This results in identification of biomolecules within the ultrastructure and/or the possibility to correlate ultrastructure with preliminary live-cell dynamics on biomolecules [1].

We have developed an integrated CLEM with which widefield fluorescence microscopy (WF-FM) and EM can be performed in principle simultaneously [2]. Integration of these two modalities allows for fast ROI retrieval [3], optional fast switching between modalities increasing CLEM throughput, high (5 nm) correlation accuracy for the overlay [4], and novel imaging applications [5]. However, for WF-FM the depth correlation for thick specimen or live cells contained in a dedicated liquids sample holder [6] is relatively poor. WF-FM images through the entire sample and SEM only the upper ~100 nm (depending on e-beam energy). We therefore integrated a Confocal Laser Scanning Microscope (CLSM) into a scanning electron microscope (SEM) via a Delmic Secom stage (Fig. 1-4). This system will allow imaging with improved depth-correlation by suppression of out-of-focus light contributions and will provide 3D optical information in CLEM.

We present our integrated CLSM SEM, using a commercial confocal scanner unit. We also demonstrate the procedure for alignment of the CLSM and SEM axes, needed to image the same area with both modalities. Lastly, the results of proof-of-principle experiments are presented, showing optical sectioning in thick specimen such as resin blocks or whole cells for improved LM-SEM correlation along the axial direction.    

 

[1] P. de Boer, J.P. Hoogeboom, B.N.G. Giepmans, Correlated light and electron microscopy: ultrastructure lights up!, Nature methods, 12, 503-513 (2015)

[2] A.C. Zonnevylle, R.F.C. Van Tol, N. Liv, A.C. Narvaez, A.P.J. Effting, P. Kruit, J.P. Hoogenboom, Integration of a high-NA light microscope in a scanning electron microscope, Journal of Microscopy, 252-1, 58-70 (2013)

[3] N. Liv, A.C. Zonnevylle, A.C. Narvaez, A.P.J. Effting, P.W. Voorneveld, M.S. Lucas, J.C. Hardwick, R.A. Wepf, P. Kruit, J.P. Hoogenboom, Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy, PLOS one, 8-2, e55707 (2013)

[4] M.T. Haring, N. Liv, A.C. Zonnevylle, A.C. Narvaez, L.M. Voortman, P.Kruit, J.P.Hoogenboom (submitted)

[5] J. Sueters, N. Liv, J.P. Hoogenboom, Using Advanced Correlative Microscopy to Study Complex Biological Samples, Encyclopedia of analytical chemistry, a9473, (2016, in press).

[6] N. Liv, D.S.B. Van Oosten Slingeland, J-P. Baudoin, P. Kruit, D.W. Piston, J.P. Hoogenboom, Electron microscopy of living cells during in situ fluorescence microscopy, ACS Nano, 10-1, 265-273 (2016)   

   


Josey SUETERS-DI MEO (Hengelo, The Netherlands), Pieter KRUIT, Jacob HOOGENBOOM
08:00 - 18:15 #6558 - IM10-121 Optimizing CLEM protocols for plants cells: A good preservation of GFP fluorescence and ultrastructure in Arabidopsis roots.
IM10-121 Optimizing CLEM protocols for plants cells: A good preservation of GFP fluorescence and ultrastructure in Arabidopsis roots.

While there is an explosion in Correlative Electron and Light Microscopy (CLEM) protocols, many have been developed on different eukaryotic models, though reports on plant cell exploration by CLEM remain scarce (Bell et al., 2013). Indeed, plant cells represent a challenge for imaging in many ways. Plant specificities have to be taken into account when optimizing CLEM protocols. To name some, strong autofluorescence of cellular components specifically present in plant cells (chlorophyll, pigments, etc.) and interfering with fluorescent signals of reporter proteins, presence of a large central vacuole complicating the fixation and the dehydration processes needed for TEM processing, cell wall and cuticles acting as physical barriers and impairing resin embedding processes (Hawes et al., 2001).

 

Here we report two “in hand” robust and easily reproducible protocols to make such CLEM approaches on plant material. The proposed protocols had been worked out on the delicate question of autophagosomes identity in plant cells. Autophagy is a degradation process of intracellular components mainly implicated in response to environmental stresses. It consists in the delivery of cytosolic cargos entrapped by a compartment, named autophagosome, to lytic compartments for degradation and recycling. In plant cells as in any eukaryotic cells, autophagosomes have been identified as ring-shape or punctate structures, thanks to the light imaging of reporter proteins of markers for autophagosomes (Le Bars et al., 2014).

 

This study is using a Arabidopsis transgenic lines stably expressing GFP-ATG8, which is a common marker for autophagosomes. Two CLEM protocols are used:  firstly the high pressure freezing followed by acrylic resin embedding, and on the other hand the Tokuyasu method.  Here we compare the performance of the two protocol to preserve GFP fluorescence and enhanced ultrastructural features in plant cells.

 

References:

Hawes, C. and Satiat-Jeunemaitre, B. 2001 Plant Cell Biology: A Pratical Approach, 2nd edn. Oxford: Oxford University Press, 1–324.

Bell, K., Mitchell, S., Paultre, D., Posch, M., Oparka, K., 2013. Correlative Imaging of Fluorescent Proteins in Resin-Embedded Plant Material. Plant Physiol. 161, 1595–1603.

Le Bars, R., Marion, J., Le Borgne, R., Satiat-Jeunemaitre, B., Bianchi, M.W., 2014. ATG5 defines a phagophore domain connected to the endoplasmic reticulum during autophagosome formation in plants. Nat. Commun. 5.


Jessica MARION (GIF SUR YVETTE CEDEX), Romain LE BARS, Béatrice SATIAT-JEUNEMAITRE, Claire BOULOGNE
08:00 - 18:15 #6698 - IM10-122 Simple CLEM method to asses rare pulmonary vascular remodeling.
IM10-122 Simple CLEM method to asses rare pulmonary vascular remodeling.

Simple CLEM method to asses rare pulmonary vascular remodeling

Péchoux C1; Antigny F2; Hautefort A2; Ranchoux B2 ; Gouadon E2 ; Humbert M2; Perros F2; Rücker-Martin C2

1- GABI, Inra, AgroparisTech, Université Paris-Saclay, MIMA2, 78350 Jouy-en-Josas, France

2- Centre Chirurgical Marie Lannelongue, Inserm UMR-S999, Le Plessis-Robinson, France

Key Words: CLEM, PAH, FNG,

 

Pulmonary Arterial Hypertension (PAH) is a rare disease featured by obstructive lesions of small pulmonary arteries (Ø<500µm), such lesions representing only 1% of the pulmonary tissue. Recently, we evidenced the implication of the endothelial-mesenchymal transition (EndoMT), the increase of phosphorylated vimentin (P-Vim) and the decrease of KCNK3 channel in cellular processes at the origin of the occlusive vascular remodeling in PAH. For these purposes, we adapted the CLEM methodology usually performed on small samples to large tissue taking into account two major biological specificities. First, the lung is a soft organ, consisting of air-filled alveoli, on which CLEM classical preservation methods cannot be applied because of the formation of large crystals which tear and disrupt structures. Second, PAH impacted arteries are 200-500 µm large and represent only 1% of the total lung mass (Figure 1). Therefore, we have developed a complete fixation process based on constraints imposed by electron microscopy, suitable for immunoflurorescent labeling and an immunolabeling process responding to fluorescent confocal microscopy constraints (low autofluorescence) suitable for transmitted electron microscopy (pulmonary ultra-structure preservation and use of various antibodies).

Fresh lung tissue was gently inflated through the bronchi using an automated formalin-pump and immersed in buffered formalin for 24 hours. Then, lung samples (size 2×2.5 cm) were impregnated in increasing sucrose baths (10%/ 40%/ 40) before embedded in Tissu Tek® and frozen. Before immunolabeling, thick cryosections (10µm) were collected on gridded correlative slides, quenched with NH4Cl and nonspecific sites blocked. Sections were incubated with primary antibody before FluoroNanogold™ Conjugates. Pulmonary arteries of interest were identified under a LSM 700 confocal microscope. After confocal acquisition, sections were post-fixed with 1% glutaraldehyde, quenched with glycine, incubated with the Gold reagent and fixed in osmium tetroxide. After dehydratation in ethanol, sections were embedded in Epon. Areas of interest identified by confocal microscopy were sectioned to perform TEM. Ultrathin sections (70 - 80 nm) were collected onto 150 mesh cooper grids and counterstained with Oolong Tea extract (OTE) 0.05% and lead citrate before examination with a Hitachi HT7700 operated at 80kV.

In contrast to cryopreservation, this lung adapted methodology allows to preserve the tissue structure closed to results obtained with Epon embedding (Figure 2) and to follow PAH lesions unambiguously during all the steps. Moreover, such tissue fixation and embedding allow the antigens preservation without producing non-specific labeling. In PAH lesions, confocal microscopy analysis was not resolutive enough to specifically identify, localize and quantify P-Vim or KCNK3 labeling. CLEM approach confirmed Western-blot results with significant increase in P-Vim and decrease in KCNK3 in PAH lesions (Figure 3).

Hence, using correlative microscopy, we overcame the difficulties associated to the lung ultrastructure which is difficult to preserve during EM techniques (hydrophilic resins, Cryo-TEM) and to the location and identification of the small arteries of interest. We found out a good compromise that allowed us to evidence the presence and the exact location of proteins in rare pulmonary lesions, little or not visible in confocal fluorescence microscopy.

 


Christine LONGIN-PÉCHOUX (JOUY EN JOSAS CEDEX), Fabrice ANTIGNY, Benoit RANCHOUX, Elodie GOUADON, Marc HUMBERT, Frédéric PERROS, Catherine RÜCKER-MARTIN
08:00 - 18:15 #6734 - IM10-123 Correlative microscopy on animal and vegetal samples with In Resin Fluorescence approach.
IM10-123 Correlative microscopy on animal and vegetal samples with In Resin Fluorescence approach.

Understanding the biological role of molecules requires to know their precise localization and structural environment. Thanks to fluorescence microscopy and biotechnologies, the localization of proteins of interest has become relatively easy. But in more and more cases, this resolution is not enough and the lack of data on the molecule/cell environment does not allow the characterization of their biological function. Transmission Electron Microscopy (TEM) and immuno-gold labelling can be used to characterize at the same time the cellular compartments associated with the protein of interest and the ultrastructure of the cellular environment at a high resolution. However, the antigenicity preservation as well as the antibody production are sometimes difficult. Moreover, TEM observations only give access to a static “snapshot” of a fixed, dead sample. For several years, many attempts have been made to correlate Fluorescent and Electron Microscopy in order to combine the advantages of both microscopy techniques on a unique sample. In this way, we develop on the BIC new protocols of sample preparation for animal and vegetal sample (culture cells and tissues), allowing to maintain simultaneously the fluorescence and the overall ultrastructure (Figure 1 and 2), using Quick Freeze Substitution (McDonald KL and Webb RI, J. Microsc, 2011). This technique will allow the correlation of both Light and Electron Microscopy data on the same section (CLEM: Correlative Light Electron Microscopy), works with classical fluorescent tags and improve the antigenicity for gold immunolabelling.

Acknowledgement: We acknowledge France BioImaging, IDEX Bordeaux and the CNRS for the support.

Plant lines and reconstructed tissue are respectively friendly given by Claire Bréhélin (UMR5200, Laboratoire de Biogénèse membranaire, Bordeaux) and, Murielle Rémy and Olivia Kérourédan (INSERM U1026 BioTis, Université de Bordeaux)


Melina PETREL, Clément CHAMBAUD, Fabrice CORDELIÈRES, Jennifer PETERSEN, Etienne GONTIER, Lysiane BROCARD (BORDEAUX CEDEX)
08:00 - 18:15 #6824 - IM10-124 Correlative ECCI and CL of single GaN microstructures obtained using ECP by beam rocking on small areas.
IM10-124 Correlative ECCI and CL of single GaN microstructures obtained using ECP by beam rocking on small areas.

SEM can be used to characterize the crystal structure at smooth surfaces, e.g. by mapping of electron channeling pattern (ECP). Layers of GaN grown on foreign substrates usually include a huge amount of threading dislocations (TDs). ECP are also used to align a sample in specific diffraction conditions of the crystal structure for evaluating the density of TDs and its type by electron channeling contrast imaging (ECCI)1.

Beside columnar rods 2,3 also elongated µm-structures like fins 4 with high aspect ratios are supposed to have substantial advantages over conventional planar optoelectronic and sensing devices. Thus the synthesis of such 3D-structures, in particular by bottom up growth using molecular beam epitaxy and metalorganic vapor phase epitaxy (MOVPE) on patterned substrates, is under investigation - requesting methods for characterizing local properties of the crystal material.

We present results obtained with an FE-SEM which is equipped with secondary electron (SE), In-Beam SE, low-kV backscattered electron (BSE), electron beam induced current (EBIC) and monochromatic CL detection as well as a piezo controlled manipulator setup, c.f. Figure 1. Simultaneous usage of all available detectors and the manipulator is possible, only the BSE and optical detection are physically hindered by another. A modified parabolic collection mirror enables measuring luminescence from planar samples in a tilted view up to 30°, with respect to the large chamber this enables also a nondestructive investigation of full 4’’-wafers.

The electron optics (EO) of this FE-SEM is also capable of rocking the electron beam on a small area, e.g. rocking in a cone of ±12° on an area of about 15 µm in diameter. We will present how the rocking alignment can be adjusted and evaluated by using samples with dedicated contrast structures.

The EO tilt can also be used to image the sample by the SEM from a certain direction without affecting the tip contact by stage movement. This enables a fine adjustment of the diffraction conditions and subsequent ECCI images for evaluating the type of defects. A subsequent scanning of the sample from different incident directions enables topography reconstruction and generates a three dimensional impression, e.g. by a stereographic image.

By switching from the BSE detector to the mirror for light collection also a correlative analysis of ECCI with EBIC and CL can be performed at the same diffraction condition, see Figure 2. Although having a certain topography contrast also 3D-structures with dimensions of a few µm can be analyzed regarding their crystal structure and orientation using ECP. As CL is quite sensitive also to intrinsic and extrinsic point defects, such correlative images obtained on sidewall and cleavage edges of fin-GaN structures will give valuable insights for discussion of defect mechanism and optical properties.

As the resolution of channeling contrast (e.g. ECCI) and scattering volume (e.g. CL) versus the beam energy are different to another, a correlation of images obtained on the same sample area using different energies improves the identification of individual features. This demonstrates further options for investigating the material quality of 3D structures.

 

1. Naresh-Kumar, G. et al. Electron channelling contrast imaging for III-nitride thin film structures. Mater. Sci. Semicond. Process. 47, 44–50 (2016). doi: 10.1016/j.mssp.2016.02.007

2. Schimpke, T. et al. Phosphor-converted white light from blue-emitting InGaN microrod LEDs. Phys. status solidi 8, n/a–n/a (2016). doi: 10.1002/pssa.201532904

3. Mandl, M. et al. Group III nitride core-shell nano- and microrods for optoelectronic applications. Phys. status solidi - Rapid Res. Lett. 7, 800–814 (2013). doi: 10.1002/pssr.201307250a

4. Hartmann, J. et al. High Aspect Ratio GaN Fin Microstructures with Nonpolar Sidewalls by Continuous Mode Metalorganic Vapor Phase Epitaxy. Cryst. Growth Des. 16, 1458–1462 (2016). doi: 10.1021/acs.cgd.5b01598


Johannes LEDIG (Braunschweig, Germany), Frederik STEIB, Jana HARTMANN, Sönke FÜNDLING, Hergo-Heinrich WEHMANN, Andreas WAAG
08:00 - 18:15 #7045 - IM10-125 Analytical electron microscopy and atom probe tomography investigation of interfacial segregation.
IM10-125 Analytical electron microscopy and atom probe tomography investigation of interfacial segregation.

The chemistry of internal interfaces plays a key role in modern physical metallurgy, in particular for the development of the new generations of steels. Despite the tremendous instrumental developments over the last decade, the atomic scale characterization of these interfaces in steels is still a very challenging problem.

Analytical electron microscopy (EDX and EELS in STEM mode) and atom probe tomography are the two techniques presenting spatial and analytical resolutions suitable for such characterizations. Their respective advantages and complementarity will be illustrated on the basis of quantitative determination of segregated amounts of interstitial and substitutional elements at interfaces, with particular emphasis on the intensive specimen preparation efforts required to reach their ultimate capabilities. 


F. DANOIX (Rouen), X. SAUVAGE, M. GOUNÉ, B. GAULT, F. CUVILLY
08:00 - 18:15 #5834 - LS01-001 The near-atomic resolution cryo electron microscopy structure of the lactococcal siphophage 1358 virion mature full capsid.
LS01-001 The near-atomic resolution cryo electron microscopy structure of the lactococcal siphophage 1358 virion mature full capsid.

Lactococcus lactis, a Gram(+) lactic acid-producing bacterium used for the manufacture of several fermented dairy products, is subject to infection by diverse virulent tailed phages, leading to industrial fermentation failures. Despite the availability of several antiphage measures, new phages keep emerging in this ecosystem. This constant viral risk has led to a sustained interest in the study of their biology, diversity, and evolution. Lactococcal phages now constitute a wide ensemble of at least 10 distinct genotypes within the Caudovirales order, many of them belonging to the Siphoviridae family. Lactococcal siphophage 1358, currently the only member of its group, displays a noticeably high genomic similarity to some Listeria phages as well as a host range limited to a few L. lactis strains. These genomic and functional characteristics stimulated our interest in this phage.

Here, we report the near-atomic resolution cryo electron microscopy (cryo-EM) structure of the 1358 virion mature full capsid. Recent advances in cryo-EM have enabled structure determination of macromolecular complexes at near-atomic resolution. However, structure determination and atomic modelling still remains a challenging task susceptible to model bias and overfitting especially while using de novo methods. This study demonstrates a practical approach to obtain a rigorously validated atomic resolution cryo-EM structure allowing to complement the previously published complete structural picture of a unique lactococcal phage at lower resolution and have deeper insight into structural organization of it's capsid.


Igor ORLOV (ILLKIRCH CEDEX), Bruno KLAHOLZ
08:00 - 18:15 #5969 - LS01-002 Structural Mechanism of Assembly and Maturation of the HBs Antigen.
LS01-002 Structural Mechanism of Assembly and Maturation of the HBs Antigen.

Hepatitis B surface antigen (HBsAg) is overexpressed in great excess during hepatitis B (HBV) infection in the form of noninfectious (DNA-free) subviral particles. These particles greatly outnumber mature virus particles (virions) and presumably function as decoys for the immune system to facilitate infection by the DNA-containing virions. These properties are exploited in the current HBV vaccine, in which recombinant HBsAg is used as a potent antigen capable to induce a strong immune response and long-term immunological memory. Several studies have implicated that HBsAg consist of a lipid bilayer with embedded HBs subunits [1-3]. The particles appear as pleomorphic spheres with an average diameter of ~23 nm and an empty internal cavity. Particles produced for the vaccine contain monomeric HBs subunits that subsequently cross-link via formation of disulfide bridges within the HBsAg particles.

We employed cryo-electron tomography to image individual HBsAg particles in their native environment at different times of maturation. Reconstructed 3D tomograms showed different kinds of HBsAg particles that could be classified into three groups: (i) small spherical particles of ~16 nm in diameter, (ii) spherical particles of ~25 nm in diameter with an internal cavity and (iii) elongated oval particles with an internal cavity of ~20 nm diameter and 25-30 nm length. The electron-dense shell of HBsAg particles is about 5 nm thick and likely represents the lipid bilayer. The shell contains short protrusions with higher density (Figure 1) that are spaced 5-6 nm apart and likely represent lipid-embedded HBs subunits.

Parallel measurements of proton NMR spectra indicated significant structural changes in protein backbone and aliphatic side chains of lipids during HBsAg particles maturation. Those variations support a decreased flexibility and suggested more rigid structure of the lipid bilayer during HBsAg maturation [4].

We analyzed size distribution of HBsAg particles and densities corresponding to HBs subunits within the particles to assess the molecular architecture of particles during maturation. The results provide insights into how structural changes in the lipid bilayer and cross-linking of HBs subunits affect the molecular architecture of HBsAg particles that is directly related to immunogenicity of the HBV vaccine.

This research has been funded by and performed at Sanofi Pasteur.

References

[1] Gastaminza, P. et al. (2010) Ultrastructural and biophysical characterization of hepatitis C virus particles produced in cell culture. J. Virol. 84, 10999–11009.

[2] Milhiet, P. E. et al. (2011) Nanoscale topography of hepatitis B antigen particles by atomic force microscopy. Biochimie (Paris) 93, 254–259.

[3] Grélard, A. et al. (2013) Hepatitis B subvirus particles display both a fluid bilayer membrane and a strong resistance to freeze drying: a study by solid-state NMR, light scattering, and cryo-electron microscopy/tomography. FASEB J. 27, 1–11.

[4] Zhao, Q. et al. (2006) Maturation of recombinant hepatitis B virus surface antigen particles.Hum Vaccin. 2,174-80.


Aurelie DELIOT, Marie-Claire NICOLAI, Vanessa BUOSI, Laurent THION, Patricia SEPULCRI, Daniel NEMECEK (MARCY L’ETOILE)
08:00 - 18:15 #5978 - LS01-003 Self-assembly characterization of Saccaharomyces Cerevisiae and Drosophila Melanogaster septins by cryo-electron microscopy and tomography.
LS01-003 Self-assembly characterization of Saccaharomyces Cerevisiae and Drosophila Melanogaster septins by cryo-electron microscopy and tomography.

Septins are a highly conserved1 family of proteins in eukaryotes required for cell division. These proteins are recognized as the fourth component of the cytoskeleton. They promote membrane remodelling by a specific phosphoinositide binding2. Consequently, septins are multi-tasking proteins and have prominent role in cytokinesis3, establishing diffusion barriers  for membrane-bound proteins4, neuron morphogenesis5 and contribute to the development of neurodegenerative diseases (Alzheimer, Parkinson6) as well as tumor formation. Thus, recent years have seen renewed for the study of septins.

Septins are GTPases proteins which are bound to the inner cell membrane.  As opposed to other cytoskeletal proteins, they polymerize in a non-polar fashion into paired filaments2,7. They display a remarkable plasticity, both in term of binding partners (several proteins, membranes) and self-assembly organizations. Indeed, the filaments have a potential to self-assemble into higher-order structures including rods, filaments, rings and gauzes2,7,8.  

We focus our interest in understanding how septins self-assembly in distinct ultra-structures. To this end, we are using cryo-electron microscopy and tomography. Thus, we are now characterizing (i) liposome remodelling by septins (ii) septins organizations in the different ultra-structures (iii) physico-chemical conditions required for the formations of the ultra-structures and their functions (type of lipid, membrane curvature…). So far, we concentrate our study on Saccaharomyces Cerevisiae septins and recently on Drosophila Melanogaster ones, which is one of the first septins ultra-structure characterization in higher eukaryotes.                                                                                                                                                                                                                                                                                                                                                                                                                                                                                              

1-       Pan and al  “Analysis of Septins across Kingdoms Reveals Orthology and New Motifs.” BMC Evolutionary Biology 7 (2007)

2-       Bertin and al  “Phosphatidylinositol-4,5-Bisphosphate Promotes Budding Yeast Septin Filament Assembly and Organization.” Journal of Molecular Biology 404, no. 4 (December 10, 2010)

3-       McMurray and al “Septins: Molecular Partitioning and the Generation of Cellular Asymmetry.” Cell Division 4 (2009)

4-       Barral and al “Compartmentalization of the Cell Cortex by Septins Is Required for Maintenance of Cell Polarity in Yeast.” Molecular Cell 5, no. 5 (May 2000)

5-       Tsang and al “Superfluous Role of Mammalian Septins 3 and 5 in Neuronal Development and Synaptic Transmission.” Molecular and Cellular Biology 28, no. 23 (December 2008)

6-       Kinoshita, Makoto. “[Role of septin cytoskeleton in dopaminergic neurotransmission and neurodegeneration].”  Japanese Journal of Psychopharmacology 32, no. 1 (February 2012)

7-       Bertin and al “Saccharomyces Cerevisiae Septins: Supramolecular Organization of Heterooligomers and the Mechanism of Filament Assembly.” Proceedings of the National Academy of Sciences 105, no. 24 (June 17, 2008)

8-      Garcia and al “Subunit-Dependent Modulation of Septin Assembly: Budding Yeast Septin Shs1 Promotes Ring and Gauze Formation.” The Journal of Cell Biology 195, no. 6 (December 12, 2011)


Cyntia TAVENEAU (paris), Aurelie DI CICCO, Daniel LEVY, Aurélie BERTIN
08:00 - 18:15 #6107 - LS01-004 Tracing acetylcholine binding-proteins microscopically in tissues of the snail Biomphalaria glabrata.
LS01-004 Tracing acetylcholine binding-proteins microscopically in tissues of the snail Biomphalaria glabrata.

The nicotinic acetylcholine receptors (nAChR) are members of the Cys-loop receptor superfamily. Playing important neurophysiological roles they are in the focus of biomedical research. The acetylcholine binding proteins (AChBP) in the hemolymph of gastropods are structural and functional homologues of the ligand binding domain of nAChR. In contrast to the membrane-bound nAChR, AChBP is water soluble. Therefore, AChBP is a very efficient surrogate for indirect investigations of nAChR functions [1]. AChBP is based on 25 kDa polypeptides. Like nAChR (Fig. 1A), AChBP is usually a pentamer (Fig. 1B,C). However, in the hemolymph of the planorbid snail Biomphalaria glabrata (vector snail of the schistosomiasis parasite) it exists as a pentagonal dodecahedron (12 pentamers), 25 nm in diameter (Fig. 1D). This large size and high symmetry makes it well accessible to 3D electron microscopy [2]. Moreover, in B. glabrata two different AChBP polypeptides (designated as Bg-ACHBP1 and Bg-AChBP2) were detected, recombinantly expressed, and reassembled to functional oligomers [2]. Recombinant Bg-AChBP1 readily formed dodecahedra, whereas recombinant Bg-AChBP2 formed only pentamers and dipentamers [2]. The existence of hetero-oligomers could be excluded, but not the possibility that in the hemolymph also Bg-AChBP2 might be present as dodecahedra. Agonist and antagonist binding properties of AChBP and nAChR are comparable [1]. Concerning biological functions of AChBP in snails, several possibilities have been discussed (for references, see [1,2]): (i) suppressor of cholinergic transmission; (ii) regulator of CaCO3 crystallization (shell growth); (iii) binding agent of algal toxins.

 

Here we show by in situ hybridization that in B. glabrata, AChBP is expressed in the mantle epithelium (Fig. 2A). In this context, it should be remembered that the molluscan shell is secreted by the mantle. Transmission electron microscopy revealed ultrastructural details of this epithelium (Fig. 2B). The applied cDNA probe was inefficient to discriminate between Bg-AChBP1 and Bg-AChBP2, but immunofluorescence microscopy using isoform-specific rabbit antibodies revealed the presence of Bg-AChBP1 and the absence of Bg-AChBP2 in the mantle epithelium (not shown). Therefore, Bg-AChBP1 might be involved in regulating shell growth. Although these data are preliminary, they suggest that the two Bg-AChBP isoforms significantly differ in their biological functions within the snail. We now perform CaCO3 crystallization experiments in the presence of Bg-AChBP1.

 

Acknowledgments

We thank Kristiane Rusitzka, Dr. Wolfgang Gebauer, Sandra Braukmann, Dr. Nadine Leidecker, Julia Markl and Martin Haugwitz for experimental advices, Thomas Schubert, Elisabeth Sehn and Gabriele Stern-Schneider for technical support, Mirko Montigny, Prof. Dr. Wolfgang Tremel and Prof. Dr. Dirk Schneider for cooperation and the Max Planck Graduate Center (MPGC) in Mainz for financial support and a grant to DT.

 

[1] Shahsavar et al. Basic Clin Pharmacol Toxicol. 2015; doi: 10.1111/bcpt.12528

[2] Saur et al. PLOS One 2012; 7:e43685


Daniela TREIBER (Bobenheim, Germany), Maria KOKKINOPOULOU, Bernhard LIEB, Jürgen MARKL
08:00 - 18:15 #6115 - LS01-005 Crystalline nanoplatelets of a PCL-fructose block copolymer.
LS01-005 Crystalline nanoplatelets of a PCL-fructose block copolymer.

 

Nanosheets have in recent years received considerable attention because of their unique electronic and mechanical properties. They can be prepared by exfoliation of layered materials, but can also be formed via self-assembly which offers a much larger variability in size and chemical functionality. Self-assembly of amphiphilic molecules and polymers though usually leads to the formation of spherical, cylindrical and vesicular structures. The generation of nanosheets requires one to adjust the molecular structure such that planar bilayers sheets are formed with large bending constant to prevent closure into vesicles.

We report the formation of nanosheets or nanoplatelets from an amphiphilic block copolymer consisting of a poly(caprolactone) (PCL) and a fructose-functionalized poly(acrylate) (PFA) block (Scheme 1), prepared by RAFT-polymerization, in water. The nanoplatelets have a core/shell-structure, consisting of an inner core-sheet of the water-insoluble PCL-blocks and an outer sheet of the water-soluble PFA-blocks. The nanoplatelets are stabilized by the crystallization of the poly(caprolactone) block providing a sufficiently large bending constant. We use transmission electron microscopy (TEM) with phosphotungstic acid (PTA) negative staining to determine the thickness and lateral dimension of the nanoplatelets (Fig. 1). Using selected area electron diffraction (SAED) we prove the crystallinity of the poly(caprolactone) core-sheet (Fig. 2). The fructose-functionalized nanoplatelets have a thickness of 8 nm and lateral dimensions of 50 – 200 nm and are potential vectors for targeted drug delivery, where the planar geometry allows for large-area cooperative binding to cell surface receptors.


Beate FÖRSTER (Bayreuth, Germany), Sylvia GANDA, Martina STENZEL
08:00 - 18:15 #6165 - LS01-006 Single particle EM study of the E1 helicase from Papillomavirus in complex with DNA.
LS01-006 Single particle EM study of the E1 helicase from Papillomavirus in complex with DNA.

The papillomaviruses (PV) are small dsDNA tumour viruses of significant medical importance and the prototype of the group is bovine PV (BPV-1). PVs encode one highly conserved replication enzyme, E1, that acts as an initiator and a helicase. E1 forms hexamers and unwinds double stranded DNA (dsDNA) into single stranded DNA (ssDNA) products using the energy of ATP hydrolysis. However, how the helicase engages the replication fork at the molecular level is unclear. BPV-1 E1 is comprised of four domains: a regulatory domain (residues 1-158), a sequence specific ori DNA binding domain (OBD, residues 159-299) and the C-terminal half (residues 300-605, E1HD) that has helicase activity and is further divided into the oligomerisation domain (OD, residues 308-378) and the AAA+ ATPase domain. A C-terminal acidic tail domain (AT, residues 579-605) is required for helicase processivity (Figure A). We have obtained structures of the full length E1 helicase (E1FL) in complex with a DNA replication fork with and without DNA labelling with protein tags. The 5’ end of dsDNA and the 5’ ssDNA end of the fork were labelled and helicase structures studied using single particle electron microscopy.

Negatively stained images (with 2% uranyl acetate) of E1FL/DNAfork/Fab /Streptavidin were taken and the structure obtained at a resolution of~ 20 Å (Figure B). We are currently working on the native structure by cryoEM (Figure C). The 3D reconstruction of E1FL (Figure D) has a three-tier organisation with well-defined domains (N-terminal, DBD, OD, and AAA+). Domains were localised by docking of available atomic structures. The 3D structure of the E1/ labelled DNA fork confirmed the triple ring organisation with an internal small chamber above the helicase motor domain where DNA unwinding appears to take place. Interestingly, dsDNA enters into the chamber via a side tunnel above the helicase motor domain, with the 5´-ssDNA strand leaving through a narrow tunnel located on the opposite side, while the 3´-ssDNA is pulled through the hexamer’s central tunnel (Figure D). Our findings are confirmed by DNA footprint experiments and FRET experiments. Recently we analysed a cryoEM structure of the E1FL in complex with a DNA fork at subnanometer resolution that reveals the same structural organization and provides more detail on the interaction with DNA.

 Our structural studies demonstrate that the process of DNA separation takes place inside the E1FL complex rather than on the exterior surface of E1. In the light of our results we suggest that the current ‘steric exclusion’ model for strand separation should be revised. A molecular understanding of E1 function will be essential to shed light on the early phase of DNA replication and will assist in the understanding of E1 as a therapeutic target of viral DNA replication.


Francesca COSCIA (LONDON, United Kingdom), Ksenia RYZHENKOVA, Yurij CHABAN, Cyril SANDERS, Elena V ORLOVA
08:00 - 18:15 #6224 - LS01-007 Structural study of the BPV E1 helicase/DNA complex using electron microscopy.
LS01-007 Structural study of the BPV E1 helicase/DNA complex using electron microscopy.

DNA replication is a key cellular process and is the basis for cell division. In order to understand replication initiation in mammalian cells, viral systems such as bovine papillomavirus (BPV) are used as simplified models of the process. BPV uses a single protein E1 to perform both DNA binding and unwinding functions essential for the initiation of replication (Figure A). Biochemical assays for a cell-free replication initiation system has been established for BPV. To have a clearer understanding of a biological process at a molecular level, it is essential to determine the three-dimensional (3D) arrangement and dynamics of molecules and how macromolecular machines are assembled. Electron microscopy (EM), single particle analysis and image processing have been used in this work to reveal the structures of the BPV E1 helicase domain (E1HD), full-length E1 (E1FL), a single-labelled E1FL-replication fork DNA complex with monovalent tetrameric streptavidin (MTS) on the dsDNA of the fork and a double-labelled E1FLwith MTS on the dsDNA and FAB on the ssDNA of the fork.

The structure of BPV E1FL in complex with DNA was initially determined by EM both by applying 6-fold symmetry and without applying any symmetry. EM demonstrated that the E1FL helicase forms a hexamer that has a diameter of 130Å and a height of 100Å, consistent with an overall mass of ~410 kDa. The oligomer has a central channel inside the molecule, with a variable diameter. E1FL is a single polypeptide chain, and the OBD domain can be fitted into the structure in two different ways. In one case the DNA binding site would be located on the inner surface and in the other case it would be on the outer surface of the complex. To determine the orientation of the OBD domain, a 12-residue epitope sequence GGYPYDVPDYAG was inserted into the OBD domain after the residue 226. EM has demonstrated that the antibody was bound to the E1FL. That proves that the binding site for AB is located on the outer surface of E1FL (Figure B). The points of the entrance of dsDNA and exit of 5′ ssDNA were also determined in the complex of E1FL and DNA. Labelling with streptavidin was performed to reveal the position of the dsDNA, whereas ssDNA was labelled with DIG-FAB to reveal the 5′ ssDNA position in an asymmetrical structure of the BPV E1 hexamer bound to a replication fork DNA substrate. Comparison of the 3D structures showed that dsDNA enters the molecule between the N-terminus and oriDNA-binding domain (OBD), and the 5′ ssDNA exits the molecule between the collar domain and OBD. The angle between the point of dsDNA entrance and 5′ ssDNA exit was ~170°.

Prior to our research, the most accepted model of “steric exclusion” for dsDNA unwinding suggested that the active 3′ ssDNA strand is pulled through the helicase motor and dsDNA is wedged apart outside the protein assembly (Figure C). Our structural observations indicated that strand separation is taking place inside E1 in a chamber above the helicase domain and that the 5′ passive ssDNA strand leaves the assembly through a channel located on the opposite side to dsDNA entry. Therefore, our data suggest an alternative model for DNA unwinding by this general class of replication enzymes.


Ksenia RYZHENKOVA (London, United Kingdom), Francesca COSCIA, Yuriy CHABAN, Cyril SANDERS, Elena ORLOVA
08:00 - 18:15 #6268 - LS01-008 Grain boundaries in nanoparticles made of self-assembled amphiphilic β-cyclodextrins.
LS01-008 Grain boundaries in nanoparticles made of self-assembled amphiphilic β-cyclodextrins.

One major challenge of nanomedicine is to design nanocarriers that deliver active compounds to a target site, at a sufficient concentration and without premature degradation, in order to maximize the efficiency of the substance while limiting secondary effects. In this context, we have developed colloidal nanovectors based on cyclodextrin (CD) amphiphilic derivatives obtained by an enzymatically-catalyzed transesterification by thermolysin. We have shown that after dissolution in acetone, depending on the length of the grafted alkyl chains, the derivatives had the ability to self-organize in water, forming nanoparticles with various shapes and ultrastructures [Gèze et al., Mater. Sci. Eng. C29 (2009), 458]. The knowledge of the morphology and ultrastructure of these nanovectors is crucial in order to optimize their formulation and lyoavailability.

The present communication focuses on the βCD-C14 derivative, i.e. βCDs (made of 7 glucosyl units) acylated on their secondary face with C14 chains. The resulting nanoparticle suspensions were quench-frozen and observed by cryo-transmission electron microscopy (cryo-TEM). The βCD-C14 particles exhibited tortuous multidomain shapes (Figure 1a) and the corresponding small-angle X-ray scattering (SAXS) pattern collected from a concentrated suspension contained peaks whose distribution was consistent with a columnar hexagonal structure (Figure 1c). Depending on the orientation of the particles in the embedding film of vitreous ice, the cryo-TEM images revealed that some particles consisted of misoriented domains separated by sharp interfaces (Figure 1b). A direct view of the hexagonal organization was obtained when the incident beam was parallel to the columns and grain boundaries with various tilt angles were observed. The analysis of the structure of the grain boundaries was based on the concepts of coincidence site lattice (CSL) and structural units (SUs) frequently used to describe the atomic structure of interfaces in metallic alloy and semiconductor polycrystals [Thibault et al., Mat. Sci. Eng. A 164 (1993), 93-100]. An example of stepped tilt boundary is shown in Figure 2b. Assuming that the repeating motif in each grain corresponds to the projection of hollow columns made of βCD-C14 molecules (Figure 2a), the boundary was described with a series of SUs differing by the number of neighboring columns (5, 6 or 7), each of them exhibiting a distinct contrast (Figure 2c) To our knowledge, it is the first time that such grain boundaries are observed in nanoparticles of self-organized amphiphilic molecules and described at the nanometric scale.

We thank Agence Nationale de la Recherche (contract #ANR-11-BS10-0007) and Institut de Chimie Moléculaire de Grenoble for financial support, Cyrille Rochas and the French CRG (BM02 beamline) at ESRF for granting beamtime for SAXS experiments, and Delphine Levilly (DPM) for the synthesis of the βCD-C14 derivative.


Jean-Luc PUTAUX (Grenoble Cedex 9), Christine LANCELON-PIN, Luc CHOISNARD, Annabelle GÈZE, Denis WOUESSIDJEWE
08:00 - 18:15 #6271 - LS01-009 Colloidal Rods in Irregular Spatial Confinement.
LS01-009 Colloidal Rods in Irregular Spatial Confinement.

Spontaneous assembly of anisometric colloidal particles, such as rod-like particles, in two-dimensions (2D) can be carried out via incubation of colloid-containing suspensions on solid surfaces [1]. Rod-like particles having a high aspect ratio (e.g. very long inoviruses) show liquid crystal (LC) behavior in suspensions. An ordered medium of liquid crystals often possesses a variety of defects, at which the director n(r) of the liquid crystal undergoes an abrupt change. Experimental research on these effects has remained challenging and has not been performed, to our knowledge, on confined rod-like colloidal particles on irregularly structured substrates. Therefore, we studied semi-flexible M13 phages in contact with irregular stranded webs of thin amorphous carbon (a-C) films (Figure 1a,b) using transmission electron microscopy (TEM) and theoretical considerations. In this work, we show that on the structureless and wide amorphous carbon (a-C) surface areas, far from the surface edges, the phages exhibited random orientations (Figure 1c). However, close to the surface edges the orientation of M13 phages in two-dimensional nematic films was controlled by the orientation and curvature of the edges. When constrained to surface strands, the M13 phages adopted a configuration that matched the confining boundary conditions (Figure 2). An annulus sector was superimposed on these oriented phage bundles that allowed us to derive analytic expressions for the bending energy of such oriented bundles. Our theoretical approach provides an explanation for the different number of phages orienting close to the surface edges with different local curvatures. By comparing the self-assembly on differently shaped carbon substrates, it was demonstrated that the alignment of the phages can be controlled by choosing appropriate substrate shapes [2]. This offers a convenient means to fabricate designed structures of orientationally ordered M13 phages. The understanding of such systems opens up new possibilities for defect engineering of liquid crystals, which can be beneficial for applications of liquid crystals in the presence of microscopic surface pores and irregularities.

Acknowledgements

The financial support by the DFG is gratefully acknowledged. The research leading to these results has received funding from the European Union Seventh Framework Programme [FP7/2007-2013] under grant agreement no. 312483 (ESTEEM2). P. M. thanks Dr. M. Bier (MPI-IS, Stuttgart, Germany) for discussions.

References

[1] P. Moghimian, V. Srot, D. Rothenstein, S. J. Facey, L. Harnau, B. Hauer, J. Bill, P. A. van Aken, “Adsorption and Self-Assembly of M13 Phage into Directionally Organized Structures on C and SiO2 Films”, Langmuir, 2014;30:11428-11432.

[2] P. Moghimian, L. Harnau, V. Srot, F. de la Peña, N.F. Bafi, S. J. Facey, P. A. van Aken, “Controlled Self-Assembly of Biomolecular Rods on Structured Substrates”, Soft Matter, 2016; in press, DOI: 10.1039/C6SM00073H.3.


Pouya MOGHIMIAN, Ludger HARNAU, Vesna SROT (Stuttgart, Germany), Francisco DE LA PEÑA, Nima FARAHMAND BAFI, Sandra J. FACEY, Peter A. VAN AKEN
08:00 - 18:15 #6296 - LS01-010 Tag-free labeling of tubulin in live cells with fluorescent organic dyes.
LS01-010 Tag-free labeling of tubulin in live cells with fluorescent organic dyes.

High-resolution fluorescence imaging, combined with the latest labeling techniques available today have yet been able to provide the necessary spatiotemporal resolution to record all cellular processes in live cells. Substituting the bulky fluorescent protein tags (such as GFP) currently used in live-cell applications with much smaller fluorescent dyes that possess superior photophysical characteristics will markedly improve these advanced imaging techniques. Genetic code expansion and bioorthogonal labeling offer, for the first time, a non-invasive way to specifically and directly attach such fluorescent dyes to proteins in live cells. Here we employ this strategy to directly tag α-tubulin in live mammalian cells. By screening different conditions we have optimized the system for quantitative high-resolution recording of microtubules in live cells. We will present data demonstrating the feasibility and efficiency of the approach and will discuss the advantages and limitations of using genetic code expansion for quantitative high-resolution microscopy.


Tomer SCHVARTZ, Noa ALUSH, Dikla NACHMIAS, Eyal ARBELY, Natalie ELIA (Beer Sheva, Israel)
08:00 - 18:15 #6465 - LS01-011 Structural insight into the function of full-length human Fanconi Anemia FANCD2/FANCI complex by cryo-electron microscopy.
LS01-011 Structural insight into the function of full-length human Fanconi Anemia FANCD2/FANCI complex by cryo-electron microscopy.

1.     INTRODUCTION

At the center of the DNA damage Fanconi Anemia repair pathway is the FANCD2/FANCI complex, which is monoubiquitinated upon DNA damage, and this monoubiquitination is indispensable for activation of the pathway. However, neither FANCD2 nor FANCI have any recognizable domains, which results in limited understanding of the molecular functions of the complex. In this study, we have taken a structural approach to better understand the function of the human FANCD2/FANCI complex.

2.     RESULTS

Experimental methods The native full-length human FANCD2/FANCI complex and the FANCD2/FANCI complex with the C-terminus FANCD2 truncated  were purified and subjected to cryo-EM analysis. The activity of the complex was studied in vivo and in vitro using various assays.

Results

Here, we provide the first structural insight into the full-length human FANCD2/FANCI complex utilizing cryo-EM. The complex has a pocket-like main body, a thumb-like structure consisting of the C-terminus of FANCI and a distinctive fork-like tower consisting of the C-terminus of FANCD2 (figure). Deletion of the C-terminus of FANCD2 leads to defective DNA interstrand cross-link repair (ICL repair). FANCD2 lacking the C-terminus cannot be monoubiquitunated, while the bona fide monoubiquitination site (Lysine 561) is still present. Furthermore, the association with FANCI and the interaction between FANCD2 and the responsible E3 ligase complex, the FA core complex, remain unaffected in the mutant.  The structure of the FANCD2/FANCI complex with the C-terminus FANCD2 truncated  was also studied using cryo-EM, this truncated domain is located in the fork-like tower (Figure ) 

3.     Conclusion

Conclusion A new domain of FANCD2 was discovered. The fork-like tower domain in the C-terminus of FANCD2 is required for its complete functions in the ICL repair. Interestingly, several disease-causing mutations lie within this region, underscoring the importance of this domain.

 Translational applicability

Our results contribute to uncover the mechanism of how the FANCD2/FANCI complex functions. A better understanding of the molecular mechanism underlying the FA pathway will increase our chances of developing better and more targeted modes of treatment.

 

Reference

 1- Liang CC, Zhan B, Yoshikawa Y, Haas W, Gygi SP and Cohn MA. UHRF1 Is a Sensor for DNA Interstrand Crosslinks and Recruits FANCD2 to Initiate the Fanconi Anemia Pathway. Cell reports 10, 1947-1956, doi:10.1016/j.celrep.2015.02.053 (2015


Zhuolun LI, Chih-Chao LIANG, William NICHOLSON, Martin COHN, Catherine VENIEN-BRYAN (Paris)
08:00 - 18:15 #6489 - LS01-012 CryoEM offers novel insights into the nucleoprotein-RNA interaction in the measles virus nucleocapsids.
LS01-012 CryoEM offers novel insights into the nucleoprotein-RNA interaction in the measles virus nucleocapsids.

Measles a one of the most contagious human diseases. Last year we determined the structure of the helical nucleocapsid formed by the folded domain of the measles virus nucleoprotein encapsidating an RNA at 4.3 Å resolution (Gutsche et al, Science 2015). This structure revealed the molecular determinants of the nucleoprotein packing into a helix and provided first insights into the mode of nucleoprotein-RNA interaction in the nucleocapsid. We will now present our most recent high resolution cryoEM dataobtained with the goal to gain more precise structural information about the rationale of the RNA encapsidation.


Irina GUTSCHE (IBS, Grenoble), Ambroise DESFOSSES, Gregory EFFANTIN, Wai Li LING, Rob Wh RUIGROK, Carsten SACHSE, Guy SCHOEHN
08:00 - 18:15 #6609 - LS01-013 Fusion to a symmetric scaffold allows cryo-EM analysis of a small monomeric protein.
LS01-013 Fusion to a symmetric scaffold allows cryo-EM analysis of a small monomeric protein.

Single particle cryo-electron microscopy (cryoEM) is a powerful method for determining the structures of large macromolecules and their complexes. Recent technical advances in direct electron detectors, phase plates and computational procedures for image processing have revolutionized the field, allowing 3D reconstructions to be obtained at near-atomic resolution (<4 Å). However, most monomeric proteins of biomedical interest remain too small (<100 kDa) for cryo-EM analysis.  In this work we propose a new method to overcome this size limitation by fusing a monomeric protein (target) to a homo-oligomeric scaffold protein, whose large size and symmetry facilitates cryoEM analysis. As proof-of-principle, we fused maltose-binding protein (MBP), a 40 kDa monomer, to glutamine synthetase (GS), a dodecamer formed by two hexameric rings. 

We designed an initial MBP-GS construct with a linker sufficiently long to allow the fused moieties to fold properly without mutual steric hindrance. The junction was optimized by progressively deleting linker and/or flanking residues to reduce the spatial separation between the two fusion partners, thereby restricting the relative mobility of the target subunits (Figure A). We bacterially expressed 18 MBP-GS constructs and used biophysical analysis (native poly-acrylamide gel electrophoresis, size exclusion chromatography, dynamic light scattering and differential scanning fluorimetry) to screen for particle compactness and homogeneity. Negative stain EM analysis confirmed the trend observed by the biophysical assays, and both approaches identified the same construct as the most compact and conformationally homogeneous.

Cryo-EM analysis of the most promising construct led to a reconstruction with an overall resolution of 4.2 Å (FSC=0.143 criterion) and a local resolution that varied from ~4 Å within the GS subunit to between 6 and 10 Å within the MBP subunit.  Fitting the GS crystal structure into this map revealed an excellent fit, allowing all secondary structure elements and certain large side chains to be visualized.  A good fit was also observed for MBP: the N- and C-terminal lobes enclosing the active site were clearly defined, several helical elements were well resolved, and the bound maltose ligand was partly visible (Figure B). These findings illustrate the feasibility of using homo-oligomeric scaffolds to enable cryo-EM analysis of monomeric proteins, raising the prospect of applying this strategy to more challenging structures resistant to crystallographic and NMR analysis.


Francesca COSCIA, Leandro ESTROZI, Fabienne HANS, Hélène MALET, Marjolaine NOIRCLERC-SAVOYE, Guy SCHOEHN (Grenoble), Carlo PETOSA
08:00 - 18:15 #6731 - LS01-014 Transmission electron microscopy of unstained DNA origami structures on free-standing graphene.
LS01-014 Transmission electron microscopy of unstained DNA origami structures on free-standing graphene.

DNA origami has received great attention in recent years due to its accessible self-assembly, versatility and potential for single-molecule biophysical studies. Origami is often imaged in TEM. Monolayer-thin graphene may provide the ultimate substrate for high-resolution imaging of DNA origami. However, little is known about interaction of DNA origami and graphene. Here, we report on microscopic observations of the interaction between graphene and DNA origami using transmission electron microscopy (TEM) and atomic force microscopy (AFM). We designed a symmetric origami structure that can be well recognized in imaging, which consists of different features like cavities in the middle, DNA bundles on the side arms and a free dsDNA loop at the bottom (Fig1.a). Fig1.c shows AFM images of these origami structures on highly oriented pyrolytic graphite (HOPG) substrates. The origami structures are observed to be severely distorted upon adsorption onto graphite whereas normal, undistorted adsorption is seen on mica substrates (Fig1.b). Interesting, origami exhibits excellent spreading and no severe distortions on amorphous carbon film (Fig1.d). It thus appears from Fig1.b-d that DNA origami is particularly distorted on graphite. Next, we investigated these origami structures with TEM experiments on CVD-grown graphene. We obtained images with uranyl-stained DNA origami, but interestingly also could obtain good contrast with unstained DNA origami if we employed a focused beam in STEM mode, or with dark-field microscopy with the stop of central beam (known as DF-000 technique) – see Fig2.b-d.  The imaging of unstained DNA origami is promising for future applications where possible side effects due to staining with uranyl needs to be avoided. TEM results again showed disruption of the DNA origami structures, suggesting that this is inherent to the interaction between DNA and graphene layer. These distortions may be due to DNA dehybridization caused by favorable interactions between the hydrophobic DNA bases and graphene.


Yoones KABIRI (Delft, The Netherlands), Adithya ANANTH, Jaco VAN DER TORRE, Allard KATAN, Sairam MALLADI, Jin-Yong HONG, Jing KONG, Henny ZANDBERGEN, Cees DEKKER
08:00 - 18:15 #6735 - LS01-015 Snapshots of co-translational protein targeting complexes.
LS01-015 Snapshots of co-translational protein targeting complexes.

The membrane targeting and insertion of proteins is facilitated by a conserved machinery that acts concomitantly with translation. Nascent proteins are recognized by the signal recognition particle (SRP) and transferred to the SRP receptor (SR) on the membrane. A series of conformational rearrangements of SRP and SR coordinates the handover of the nascent chain to the translocon, which inserts proteins into the membrane or facilitates their secretion. Here we used single particle cryo electron microscopy to obtain snapshots of co-translational protein targeting complexes at near atomic resolution [1]. We observe conformational changes of the SRP M domain induced by binding of the nascent chain, which are coupled to rearrangements of the SRP and SR. In addition we reconstructed a near atomic resolution structure of the translocon in complex with a translating ribosome. A detailed analysis of the ribosome interaction sites of SRP and translocon gives novel insight into the handover of the nascent chain to the translocon.

[1] Jomaa A, Boehringer D, Leibundgut M, Ban N. Structures of the E. coli translating ribosome with SRP and its receptor and with the translocon. 2016. Nat Commun. 7:10471


Ahmad JOMAA, Daniel BOEHRINGER (Zuerich, Switzerland), Marc LEIBUNDGUT, Nenad BAN
08:00 - 18:15 #6796 - LS01-016 Switching mechanism of DNA replication fork complex revealed by single particle analysis.
LS01-016 Switching mechanism of DNA replication fork complex revealed by single particle analysis.

  A number of proteins are involved in DNA replication, which is essential for the inheritance of genetic information. These proteins assemble to form a huge complex, called replisome, and accomplish each function through highly regulated manner. Electron microscopic single particle analysis is one of the most powerful methods to study such complex system, which is difficult to study by X-ray crystallography.

  DNA replication in archaea and eukaryotes is executed by family B DNA polymerases, which exhibit full activity when complexed with the DNA clamp, proliferating cell nuclear antigen (PCNA). PCNA has a trimeric ring structure that encircles the DNA, and increases the processivity of the bound DNA polymerase by tethering it to the DNA. It is known now, that PCNA also interacts with multiple partners to control DNA replication, DNA repair, and cell cycle progression, and works not only as the platform, but also as the conductor for the recruitment and release of these factors. However, the molecular architectures as well as the mechanism of the regulation of these replication factors are not known in detail.

  We have been focusing our interest on the mechanism of synthesis and maturation of Okazaki fragments during lagging strand DNA replication in which three replication factors, i.e. DNA polymerase, Flap endonuclease, DNA ligase, are playing essential roles (Fig. 1A-C). As all of these 3 enzymes are known to interact with PCNA trimer, a switching mechanism between these factors has been proposed, called PCNA tool belt model, which is considered to increase the efficiency of these sequential reactions (Fig 1D). Recent biochemical study, on the other hand, suggests a sequential switching mechanism of these factors. Little is known regarding the switching mechanism, due to the lack of the structural data of these complexes.

  We have investigated the three-dimensional structure of the core components of the replisome, such as DNA polymerase B(PolB)-PCNA-DNA, and DNA ligase-PCNA-DNA ternary complexes, by single particle analysis (2- 3). Besides the authentic interaction through a PCNA-interacting protein box (PIP-box), we could find a novel contact between both polymerase-PCNA and ligase-PCNA. Mutant analysis showed that these contacts are involved in the regulation of the replication factors, such as the switching between the polymerizing and editing modes of the PolB. Our results, showing that both factors interacting with two subunits of the PCNA trimer ring, were inconsistent with the standard tool belt model. However, the third PCNA subunit was still free in both complexes, thus we analyzed the complex structures with two replication factors bound to a PCNA ring, in order to investigate the switching mechanism between them in more detail.

 

  References
(1) Dovrat, et al., PNAS, 111, 14118-14123 (2014)

(2) Mayanagi, et al., PNAS, 108, 1845-1849 (2011)

(3) Mayanagi, et al., PNAS, 106, 4647-4652 (2009)


Kouta MAYANAGI (Fukuoka, Japan), Sonoko ISHINO, Mika TAKAFUJI, Kaoru MITSUOKA, Tsuyoshi SHIRAI, Shinichi KIYONARI, Hirokazu NISHIDA, Daisuke KOHDA, Kosuke MORIKAWA, Yoshizumi ISHINO
08:00 - 18:15 #6813 - LS01-017 Structure of an elongation factor G-ribosome complex captured in the absence of any inhibitor.
LS01-017 Structure of an elongation factor G-ribosome complex captured in the absence of any inhibitor.

The ribosome is a large molecular machine performing protein synthesis (translation) in all living cells. During the elongation cycle of protein synthesis, new amino acids are iteratively delivered to the ribosome by aminoacylated transfer RNAs (tRNAs) and incorporated into a growing polypeptide chain, directed by the decoding of mRNA codons. In prokaryotes, this process is catalyzed by the two universal GTPase elongation factors EF-Tu and EF-G. EF-G is a large GTPase protein made of five domains. It is structurally similar to the ternary complex made by EF-Tu in complex with the incoming tRNA and GTP, with its fourth domain mimicking the anticodon stem-loop of the tRNA recognizing the codon into the ribosomal A-site. Several structures of ribosome complexes with EF-G were recently determined by X-ray or cryo-electron microscopy (cryo-EM), allowing for an accurate understanding of EF-G interactions and conformational changes during translocation. However, all the reported structures were obtained by trapping EF-G into the ribosome, using non hydrolyzable guanosine 5’-triphosphate (GTP) analogs, specific inhibitors (eg fusidic acid, thiostrepton, viomycin or dithyromycin) or a mutated form of EF-G. How EF-G binds to the ribosome in the absence of any inhibitor is still elusive. To obtain insights into the engagement of EF-G into the ribosome in a pre-translocation state, we performed cryo-electron microscopy experiments in the presence of GTP. To avoid extensive release of EF-G from the ribosome we increased the EF-G/ribosome molecular ratio and used a non-productive translation complex (NTC) stalled on a truncated mRNA and therefore unable to trigger GTP hydrolysis. We report a new high resolution structure of the ribosome complexes wtih EF-G, providing new insights into the way EF-G interacts with the decoding center.  


Kevin MACE, Sophie CHAT (IGDR UMR6290 CNRS UR1, Rennes), Daniel THOMAS, Emmanuel GIUDICE, Reynald GILLET
08:00 - 18:15 #6843 - LS01-018 Structural characterisation of nanomaterials incorporated into bioengineered samples: An electron microscopy approach.
LS01-018 Structural characterisation of nanomaterials incorporated into bioengineered samples: An electron microscopy approach.

This study analyses the properties of nanohydroxyapatite (nHA) and layered double hydroxide (LDH) materials that can be used as non-viral gene delivery vectors. The former is a biocompatible, non-toxic calcium phosphate mineral which makes it a suitable candidate as a delivery platform1. On the other hand, LDHs are composed of brucite-like layers with a charge compensating anionic interlayer2.
   (Scanning) Transmission electron microscopy ((S)TEM) and Energy Dispersive X-ray Spectroscopy (EDX)   methods were utilised to characterize LDH and nHA nanomaterials and their respective interactions with plasmid DNA structures (pDNA). The current work also characterizes the ultrastructure of mesenchymal stem cells (MSCs), as well as investigating the uptake and localisation of the LDH gene delivery vectors at the nanoscale.
   Fig. 1(a) and Fig. 1(b) present the TEM images of the nHA and LDH particles respectively. The nHA particles are found to have a spherical structure of diameter ~50nm, indicating that nHA is a good candidate for cellular transfection. LDHs present a well-defined hexagonal platelet-like structure of ~100nm, providing promising results towards their application as a gene delivery vector.
   The interaction of nHA and LDH particles with pDNA was also investigated using STEM. Morphological variations are clearly evident in both the pDNA-nHA and pDNA-LDH composites. An annular-like structure is presented in the case of pDNA-nHA, whereas the DNA structures absorb to the surface of the LDH particles, displayed in Fig. 2(a) and Fig. 2(b) respectively.
   The application of STEM to MSCs highlight intracellular features such as membranes and nuclei, as shown in Fig. 3. The complimentary EDX techniques portray evidence of the LDH gene delivery vectors within the cell due to a presence of an Mg, Al and P peak, hence confirming uptake and localisation at the molecular level. The enhanced resolution provided by electron microscopy techniques allows for the study and understanding of cellular biological processes, such as that of pDNA-nanoparticle delivery.

References

[1] Curtin et. al, Adv. Mater. , 2012, 24, 749-754.              
[2] Xue Bi et. al, Pharmaceutics, 2014, 6, 298-332.         


Christopher HOBBS (Dublin, Ireland), Sonia METEL, Valeria NICOLOSI
08:00 - 18:15 #6984 - LS01-019 Cryo-electron microscopy from vitreous thin films in complement to AFM for understanding the multiscale supramolecular assemblies: a few examples.
LS01-019 Cryo-electron microscopy from vitreous thin films in complement to AFM for understanding the multiscale supramolecular assemblies: a few examples.

The considerable growth of nano-technologies and nano-sciences requires the implementation of very well adapted characterization tools and methods to combine both a nanometer resolution and a good preservation of the nano-objects. This point is absolutely critical when the nanostructures are made of hydrated and organic compounds. Cryo-electron microscopy (cryo-TEM) made from vitrified thin films has proved to be a method of choice for characterizing the hierarchy of supramolecular assemblies of proteins and hydroxy fatty acids with maximum resolution and minimal damage.

We aim here to present a selection of applications of cryo-TEM showing the characterization of dispersions of organic or hybrid organic/inorganic nanoparticles with a large range of sizes, shapes and composition (synthetic polymers, polysaccharides, proteins, lipids).

In particular, we will detail how cryo-TEM helped to elucidate the supramolecular self-assembling of fatty acids through a multiscale approach. The unique benefits as well as the limitations of cryo-TEM will be discussed and compared with conventional SEM and TEM techniques as well as with liquid AFM.

 

 

References

Gaillard C. and Douliez JP. Cryo-TEM and AFM for the characterization of vesicle-like nanoparticle dispersions and self-assembled supramolecular fatty-acid-based structures: a few examples,   in: A. Méndez-Vilas. (Ed.) Current microscopy contributions to advances in science and technology. 2012, v. 5, 912-922

F. Dutertre, C. Gaillard, C. Chassenieux, T. Nicolai, Branched Wormlike Micelles Formed by Self-Assembled Comblike Amphiphilic Copolyelectrolytes, Macromolecules, 2015; 48(20): DOI:10.1021/acs.macromol.5b01503

H.T.P. Nguyen, E. Allard-Vannier, C. Gaillard, I. Eddaoudi, L. Miloudi, M. Sourcé, I. Chourpa, E. Munnier "On the interaction of alginate-based core-shell nanocarriers with keratinocytes in vitro" Colloids and Surfaces B: Biointerfaces, 2016, accepté

Fameau, A.-L.; Saint-Jalmes, A.; Cousin, F.; Houinsou Houssou, B.; Novales, B.; Navailles, L.; Nallet, F.; Gaillard, C.; Boué, F.; Douliez, J.-P., 2011. Smart Foams: Switching Reversibly between Ultrastable and Unstable Foams. Angewandte Chemie International Edition, 50 (36): 8264-8269.

Douliez J.P. and Gaillard C., Self-assembly of fatty acids: from foams to protocell vesicles, New Journal of Chemistry, 2014, 38, 5142-5148


Cédric GAILLARD (NANTES)
08:00 - 18:15 #7077 - LS01-020 Structure and genome delivery mechanism of Staphylococcus aureus phage therapy agent phi812-K1 determined by cryo-electron microscopy.
LS01-020 Structure and genome delivery mechanism of Staphylococcus aureus phage therapy agent phi812-K1 determined by cryo-electron microscopy.

Worldwide occurrence of multidrug-resistant pathogenic bacteria has increased interest in alternative treatments including bacteriophage-based therapy. Bacteriophage phi812 belongs to genus Twort-like virus, subfamily Spounavirinae and can infect at least 75% of Methicilin-resitant S. aureus strains (MRSA) and 95% of Methicillin-sensitive S. aureus strains. We have employed cryo-electron microscopy to determine structure and  genome delivery mechanism for polyvalent staphylococcal backteriophage phi812-K1. Phi812-K1 has a 90 nm diameter isometric head and 240 nm long contractile tail ended by a double layered baseplate. The tail and baseplate of the native phage are dynamic. Therefore, a divide-and-conquer strategy was employed to separately determine the cryo-EM reconstructions of the individual phage parts. The structure of the icosahedral head could be refined to 5.0 Å resolution and additional sub-averaging within the T=16 icosahedral asymmetric unit allowed determination of the major capsid protein to 3.8 Å resolution. The structures of the native tail and baseplate were solved to 8 Å and 12 Å resolution, respectively. In order to examine the mechanism of the infection process, we determined the structure of the phage in the contracted state. The phage head is not altered after the DNA ejection. However, both the baseplate and tail undergo large reorganizations documented in their 6 Å and 8 Å resolution structures. Comparison of the tail and baseplate structures in the native and contracted conformation allowed us to determine the changes  accompanying cell wall recognition and binding which is then followed by injection of the bacteriophage genome into the host bacteria.


Jiří NOVÁČEK (Brno, Czech Republic), Marta ŠIBOROVÁ, Martin BENEŠÍK, Roman PANTŮČEK, Jiří DOŠKAŘ, Pavel PLEVKA
08:00 - 18:15 #5018 - LS02-021 The application of nano-analysis techniques in yeasts: a review.
LS02-021 The application of nano-analysis techniques in yeasts: a review.

The application of the transmission electron microscope (TEM) in essence may be regarded as one of the first instruments used to visualize molecular structures at nano-analysis level inside biological cells, although not always recognized as such. These biological structures ranged over the decades since 1939 from membranes and many other inclusions specific of cell morphology to virus structures. Different preparation techniques on cells led to different observations and conclusions. This can vary between negative staining, e.g. extracted DNA, potassium permanganate (oxidative) or a double fixation technique (reductive and oxidative), dehydration, embedding, sectioning and a variety of heavy metal staining techniques. The identification and interpretation of cellular components thus solely depend on such specific techniques. Any technique of the aforementioned is known and daily applied in electron microscopy laboratories, therefore no specific references are presented.

            Many published TEM images pertaining to specifically yeast (Ascomycetes) research, show structures in cells that were not described in either results or discussions [1]. The latest research on fermentative yeast cells highlighted the occurrence of gas in the cell cytoplasm appearing as bubbles (Fig. 1 and Fig. 2). Using TEM only, similar structures were observed in the past in yeast cells [2] but never defined, nonetheless as gas bubbles. In almost all cases the absence of membranes around such structures led many researchers either to ignore it, probably because studies covered other cell phenomena, or confusingly and incorrectly defined as lipids. The formation of gas (carbon dioxide) in yeast cells is important in the brewing and bakers industry, e.g. for the perfect leavening of bread. Therefore the importance of studies to understand gas formation, retention and release by yeast cells may help in developing improved yeast strains.

            Scanning electron microscope (SEM) techniques, however, cannot reveal internal structures of cells sufficiently. Nano scanning Auger microscopy (NanoSAM), a nano-analysis technique not typically developed for biological material, was applied in an attempt to clarify this phenomena of prominent membrane-less structures in fermenting yeast cells [3]. The NanoSAM has the additional advantage over SEM to blast the cells with an argon-gun. This process allows controlled erosion of cells and can reveal internal components such as gas bubbles. Elemental analysis can also be done at nano-levels.

            The exact same set of samples can afterwards be transferred to a high resolution field emission gun SEM to examine cell structure of bubbles in detail (Fig. 3). NanoSAM analysis of nano-areas in the exposed areas of the cells was performed to reveal chemical composition to determine the presence of zinc (Fig. 4). Zinc was added to the growth medium, which reacts to carbonic acid in cells related to fermentation gas release. Compared to TEM examination of these bubble-like structures the distribution, size and appearance correspond well to observations with this novel application of the NanoSAM in biology. Comparatively, lipids are not expected to appear as vacant structures as gas bubbles observed after argon gun erosion in the NanoSAM.

            Conclusively, this review emphasizes the importance to search and find applications such as NanoSAM with typical applications in physics research, which can then be used to reveal missing links with current and past research in other fields such as biology. Furthermore, it can also be emphasized that many areas now uncovered, can lead to other hidden phenomena in biological cells above and beyond the yeast group. Other techniques such as time-of-flight secondary ion mass spectrometry (TOF-SIMS), is also able to provide elemental, chemical state, and molecular information not only from surfaces of solid materials but from biological organisms as well. Current research in this field has already been started by this research group.

 

References

[1] Wilson, C.L. et al (1970). Phytopathology 60, 216-227.

[2] Van der Walt, J.P. and von Arx (1985). South African Journal of Science 81, 156-159.

[3] Swart, C.W. et al (2012). FEMS Yeast Research 12, 867-869.

 

Acknowledgement

The Authors wish to thank you University of the Free State (UFS) and the National Research Foundation (NRF) of South Africa for funding the project. Ms. H. Grobler, Laboratory Manager of the Laboratory for Microscopy for SEM and Dr. E. Coetzee-Hugo, Department of Physics, UFS, for NanoSAM analysis.


Pieter W.j. VAN WYK (Bloemfontein, South Africa), Chantel W. SWART-PISTOR
08:00 - 18:15 #5251 - LS02-022 Revealing chromatin at different microscopy resolutions.
LS02-022 Revealing chromatin at different microscopy resolutions.

Chromatin in cell nuclei is formed by DNA associated with nucleosomes which consist of the core histone proteins (H2A, H2B, H3, H4). These play a crucial role in genome organization and are well-known regulators of a variety of biological processes occurring at the DNA template such as transcriptional activity. The histone subtype H3 exists in several varieties. Whereas most varieties are synthesized during S-phase of the cell cycle, the variant H3.3 is expressed throughout interphase and has been associated with transcriptionally active chromatin [1]. These differences suggest diverging roles of these variants in chromatin organization and function.

Here, we expressed histone H3 variants in normal and malignant cells and compared the nuclear expression patterns at different resolution levels using conventional epifluorescence and confocal microscopy, structured illumination imaging (SIM) and electron microscopy (Fig. 1).

We observed differing distribution patterns of the histone H3 variants within interphase cell nuclei (Fig. 2). In addition, we found distinct banding patterns after expression of histone H3.3 in mitotic chromosomes. Together this indicates differences in functions of these chromatin constituents in the interphase nucleus [2]. Surprisingly, the highly transcribed ribosomal genes within nucleoli were not labelled with histone H3.3 suggesting a difference in nucleosomal architecture or nucleosomal dynamics in active ribosomal genes to genes transcribed into mRNA molecules. In summary, we could demonstrate that histone H3 variants show diverging expression patterns in interphase nuclei and in mitotic chromosomes.

References: 1. K. Ahmad, S. Henikoff, Mol. Cell., 9, 2002; 2. L. Snyers et al., Nucleus, 5, 2014.


Christian SCHÖFER (Vienna, Austria)
08:00 - 18:15 #5736 - LS02-023 AMNIOTIC MEMBRANE SCAFFOLD ENRICHED WITH BLADDER FIBROBLASTS PROMOTES ESTABLISHMENT OF HIGHLY DIFFERENTIATED UROTHELIUM.
LS02-023 AMNIOTIC MEMBRANE SCAFFOLD ENRICHED WITH BLADDER FIBROBLASTS PROMOTES ESTABLISHMENT OF HIGHLY DIFFERENTIATED UROTHELIUM.

Introduction: Human amniotic membrane (AM) is the innermost layer of placenta and is composed of three distinct strata, namely single epithelial layer, a thick basement membrane and avascular stroma. AM has been widely adopted as a biomaterial in tissue engineering and surgical reconstructions, since it promotes wound healing and epithelialization, has low immunogenicity, reduces inflammation and scarring, and was also shown to possess anti-cancer properties (1). We have shown that AM promotes formation of highly differentiated urothelium, in particular when urothelial cells are cultured on AM stromal side (2). Although AM stroma scaffold allows establishment of differentiated urothelium, its orientation probably does not favour AM integration into surrounding tissue, if applied in vivo. Therefore, we established an in vitro AM model which would allow incorporation of fibroblasts into the AM stroma as well as promote urothelial differentiation.

Materials and Methods: Porcine bladder fibroblasts were seeded onto porous membranes and were labelled with green lipophilic dye when subconfluent. Cryopreserved human AMs mounted into Scaffadex holders were de-epithelized and laid onto cultures of fibroblasts in such a manner that fibroblasts were in close contact with the AM stromal layer. Fibroblasts were left to grow into AM stroma in medium adapted for fibroblasts for up to a week, when porcine urothelial cells were seeded on the opposite side of the AM scaffold i.e. on the AM basement membrane. The constructs were maintained for three additional weeks in the medium adapted for urothelial cells. As a control, urothelial cells seeded on the de-epithelized AM scaffold without integrated fibroblasts were used to evaluate contribution of fibroblasts on urothelial differentiation. Growth of urothelial cells was monitored daily. Integration of fibroblasts and differentiation of urothelial cells was determined by electron microscopy, histological and immunofluorescence techniques.

Results: Fibroblasts cultured in close contact with AM stroma in the medium adapted for fibroblasts integrated into AM stroma and remained viable after three additional weeks of maintenance in the medium for urothelial cells. Proliferation and differentiation of urothelial cells depended largely on the presence of fibroblasts. In comparison to the control, urothelial cells on fibroblast enriched AM scaffolds reached confluency faster, and more importantly, reached higher differentiation stage (Figure 1).

Discussion and Conclusion: Our data demonstrate that bladder fibroblast enriched AM scaffold promotes urothelial differentiation in vitro. Besides being suitable in vitro research tool to study epithelial-mesenchymal interactions, this model also indicates that de-epithelized human AM could integrate into bladder lamina propria and could be as such potentially used as a graft for urothelial reconstruction.

 

References

  1. A. C. Mamede et al., Amniotic membrane: from structure and functions to clinical applications. Cell Tissue Res 349, 447, 2012.

  2. U.D. Jerman et al., Amniotic membrane scaffolds enable the development of tissue-engineered urothelium with molecular and ultrastructural properties comparable to that of native urothelium. Tissue Eng Part C Methods 20, 317, 2014.


Urška DRAGIN JERMAN (Škofja Loka, Slovenia), Peter VERANIČ, Tina CIRMAN, Mateja ERDANI KREFT
08:00 - 18:15 #5779 - LS02-024 Use of fib-sem to address the ultrastructure of the periplastidial and internal chloroplast compartments of the diatom Phaeodactylum tricornutum.
LS02-024 Use of fib-sem to address the ultrastructure of the periplastidial and internal chloroplast compartments of the diatom Phaeodactylum tricornutum.

Use of FIB-SEM to address the ultrastructure of the periplastidial and internal chloroplast compartments of the diatom Phaeodactylum tricornutum

 Serena Flori1, Pierre-Henri Jouneau2, Benoit Gallet3, Christine Moriscot3, Leandro Estrozi3, Dimitris Petroutsos1, Cécile Breyton3, Guy Schoehn3, Eric Maréchal1, Giovanni Finazzi1 and Denis Falconet1

1Laboratoire de Physiologie Cellulaire et Végétale; UMR5168 CNRS / Univ. Grenoble Alpes / CEA / UMR1417 INRA; Institut de Biosciences et Biotechnologies de Grenoble (BIG), France.

2Laboratoire d'Etudes des Matériaux par Microscopie Avancée (LEMMA); Institut Nanosciences et Cryogénie; Service de Physique des matériaux et Microstructures; CEA-Grenoble, France.

3UMR5075, Institut de Biologie Structurale (IBS), Grenoble, France.

 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables photographic, chemical, and structural analysis of many inorganic and organic samples. Among different features FIB-SEM allows 3D tomography with nanometer-scale resolution thus becoming an instrument of choice for obtaining 3D information at the EM level.

In this study, FIB tomography has been realized in a Zeiss NVision 40 dual-beam microscope to reveal the ultrastructure of the unique chloroplast present in the diatom Phaeodactylum tricornutum, a member of these key ecological players in oceans for CO2 sequestration via photosynthesis. A striking feature of diatoms is their sophisticated ultrastructure, inside highly packed cells, including a chloroplast bounded by four membranes known as 'secondary' plastid when 'primary' plastids as those present in plant cells have two membranes. Although their photosynthetic apparatus is similar to that of plants, photosynthesis takes place in a different plastid environment, where membranes are note differentiated in appressed (grana stacks) and non-appressed regions (stroma lamellae).

Analyze of 4 nm ultrathin sections (figure 1) of disrupted Phaeodactylum tricornutum allows the detection of membrane connectivity in the three dimensions and thus the ultrastructure scanning of single organelle (chloroplast, mitochondrion or nucleus). The inner (iEM) and outer (oEM) envelope membranes of the symbiont's chloroplast together with the two outermost membranes: the chloroplastic endoplasmic reticulum membrane (cERM), which is continuous with the outer nuclear envelope and the periplastidial membrane (PPM) are well defined. Images reveal the presence of a vesicular network (VN) between the oEM and the PPM delineating the remaining of the symbiont cytoplasm and referred as the periplastidial compartment (PPC) (figure 2) [1].

Reconstitution of the three-dimensional architecture of the chloroplast in Phaeodactylum tricornutum using focused ion beam scanning electron microscopy allows proposing a structural model for the arrangement of photosynthetic complexes in this chloroplast. This model challenges the classic view of the organization of the photosynthetic membranes in chloroplasts derived form a secondary endosymbiosis, and accounts for partitioning of absorbed light between the photosystems, without restraining electron flow capacity, as required for optimum photosynthesis (figure3) [2].

[1] Flori et al. Ultrastructure of the periplastidial compartment of the diatom Phaeodactylum tricornutum. Protist (under revision)

[2] Flori et al. In preparation

Acknowledgements SF and GF were supported by a grant from the Marie Curie ITN Accliphot (FP7-PEPOPLE-2012-ITN; 316427). GF, EM and DF were supported by a grant from ANR (ANR-12-BIME-0005 DiaDomOil). EM was supported by a grant from the Investissement d’Avenir Program (Oceanomics).


Serena FLORI (CEA, Grenoble), Pierre-Henri JOUNEAU, Benoit GALLET, Christine MORISCOT, Leandro ESTROZI, Dimitris PETROUTSOS, Cécile BREYTON, Guy SCHOEHN, Eric MARÉCHAL, Giovanni FINAZZI, Denis FALCONET
08:00 - 18:15 #5817 - LS02-025 Serial section (S)TEM tomography of prokaryotic cells.
LS02-025 Serial section (S)TEM tomography of prokaryotic cells.

Cell complexity in prokaryotic cells, whether Bacteria or Archaea, is generally considered low, with a single compartment. A few examples, however, have been recently reported showing evidence for compartmentalization [e.g. 1,2,3]. These studies gained in particular from improved sample preparation methods (plunge freezing or high-pressure freezing), adequate follow-up methods, and 3D imaging of the samples, either by FIB-SEM or by electron tomography. Here we report on our analyses of the ultrastructure of exceptional Archaea of the genera Ignicoccus and Pyrococcus, which show remarkable physiological characteristics (e.g. optimal growth at T~85 up to 100°C, under anoxic conditions), and unusual ultrastructural features. Although prokaryotes, these cells have a diameter of > 1 µm, which does not allow for reasonable cryoTEM observation without sectioning. Thus, samples were harvested by gentle concentration on ultrafiltration membranes, cryo-immobilized by high-pressure freezing, freeze-substituted, and finally resin-embedded; this enabled us to perform 3D ultrastructural analysis by (S)TEM tomography and immuno-localization studies on sections of the same resin block.

So far, we are about to routinely investigate single or serial sections (ranging from 200 up to 800 nm in thickness), on a transmission electron microscope operated as TEM or STEM at 200 keV. For STEM, the illumination is adjusted to have an almost parallel beam, i.e. small convergence angle, resulting in an extended depth of focus [4]. Under these conditions, if the sample is imaged at high tilt angle (e.g. up to 70 deg), all visible image details are seen 'in focus', which greatly facilitates image alignment during 3D image reconstruction using IMOD (Boulder, Co, USA). In addition, the system in use allows parallel acquisition of BF and DF signal. Reconstruction and visualization is done using either WBP or SIRT in IMOD, and final manual segmentation using AMIRA®.

Our 3D data show novel and remarkable ultrastructural features: (A) Ignicoccus cells possess two membranes; in the intermembrane compartment, there is a complex endogenous membrane system. Attached to the outer cellular membrane, we have localized enzyme complexes for proton gradient generation, ATP and acetyl-CoA synthesis, and CO2 fixation [5]. (B) Pyrococccus cells possess flagella of the archaeal type [6], i.e. extracellular filaments involved in motility and cell-cell interaction, and a cytoplasmic membrane and an S-layer, and a so far unknown layer inside the cytoplasm presumbably involved in anchoring or organizing the flagellar bundle.

[1] R Santarella-Mellwig et al 2013 PLOS Biol 11, e1001565

[2] S Schlimpert et al 2012 Cell 151, 1270

[3] B Junglas et al 2008 Arch Microbiol 190: 395

[4] AA Sousa and RD Leapman 2012 Ultramicroscopy 123, 38

[5] H Huber et al 2012 Antonie van Leeuwenhoek 102, 203

[6] D Näther-Schindler et al 2014 Frontiers Microbiol 5, 695


Reinhard RACHEL (Regensburg, Germany), Veronika HEINZ, Jennifer FLECHSLER, Ralph WITZGALL, Thomas HEIMERL
08:00 - 18:15 #5861 - LS02-026 Study of mitochondrial networks in pancreatic islet β-cells by SBF-SEM.
LS02-026 Study of mitochondrial networks in pancreatic islet β-cells by SBF-SEM.

Mitochondria play an essential metabolic role in all eukaryotic cells because they are the organelles that provide energy to drive chemical reactions. Mitochondria are highly dynamic and change their shape between discrete structures and large interconnected networks by selective fission and fusion of their membranes. The resulting fused three-dimensional networks can permeate through an entire cell, but their advantages, relative to isolated discrete organelles, are not fully understood.  It has been suggested that networks might have the following functions: dampen biochemical fluctuations; provide a mechanism for quality control and selective mitophagy; enable diffusion of proteins; and transmit calcium signals and mitochondrial membrane depolarization throughout the cell [1, 2]. Despite their highly dynamic state, useful structural information can nevertheless be obtained from electron microscopy by studying the organization of mitochondrial networks at a given time point.

 

We have used a SIGMA VP (Zeiss Inc.) scanning electron microscope (SEM), equipped with a 3View (Gatan Inc.) serial block face (SBF) system [3], to quantify the connectivity of mitochondrial networks in entire insulin-secreting b-cells of mouse pancreatic islets of Langerhans. Previous work has suggested that alterations in mitochondrial fission and fusion might play a role in nutrient-induced b-cell apoptosis with possible involvement in the pathophysiology of Type 2 diabetes [4].

 

Previously, we found that manual segmentation of SBF-SEM mitochondrial volumes in a single b-cell took about one week for a trained operator, which precluded analysis of multiple cells within a reasonable time.  We have explored a faster and more practicable approach by making use of tools within the Amira visualization software package (FEI Inc.) to partially automate the segmentation process, and enabling an entire cell to be analyzed in approximately two hours (Figure 1). Using this approach we were able to analyze quantitatively mitochondrial networks in individual pancreatic b-cells in terms of the total mitochondrial volume, average volume per network, total network length, and average network length. We found that approximately one-third of the mitochondrial volume was contained in networks of length less than 3 µm, one-third in networks of length between 3 µm and 10 µm, and one-third in highly fused networks of length between 10 µm and 60 µm (Figure 2).

 

SBF-SEM thus provides quantitative data on the organization of mitochondrial networks, making it feasible to test computational models for mitochondrial fusion and fission.

 

The authors thank Drs. A.L. Notkins, T. Cai, and H. Xu for providing the specimens of pancreatic islets of Langerhans. This research was supported by the intramural program of the National Institute of Biomedical Imaging and Bioengineering, NIH.

 

[1]  H. Hoitzing et al, Bioessays 37 (2015) p. 687.

[2]  B. Clancy et al, Nature 523 (2015) p. 617.

[3]  W. Denk and H. Horstmann, PLoS Biol. 2 (2004) p. 1900.

[4]  A.J.A. Molina et al, Diabetes 58 (2009) p. 2303.

[5]  C.R. Pfeifer et al, J. Struct. Biol. 189 (2015) p. 44.

[6]  A. Shomorony et al, J. Microsc. 259 (2015) p. 155.


Richard LEAPMAN (Bethesda, USA), Jake HOYNE, Bryan KUO, Gina CALCO, Guofeng ZHANG, Maria ARONOVA
08:00 - 18:15 #6044 - LS02-027 FIB characterisation of cell/device interface.
LS02-027 FIB characterisation of cell/device interface.

Cryo-preparation of biological samples for electron microscopy has many advantages against the chemical fixation. Cryo-fixation is extremely rapid which can inhibit, within milliseconds, the intracellular movements of macromolecules and other substances. Due to its rapidity, it may even allow the detection of the processes of contacting between the vesicles and the membrane in the cells. One can try to capture the processes at synapse contact, which would be impossible with much slower chemical fixation.

  The problems may arrive if the biological sample is contacting to the solids for example at the interface of biological sensor. Due to different thermal expansion coefficient of the solid and biological materials, it may lead to unwonted artefacts at the interface area.

  We will present the information about the interface between our structurally modified biosensors and biological cells of different preparation techniques. We have used cryo-fixation, standard chemical fixation with critical point drying and epoxy embedding. For characterisation of the interface, we apply SEM and FIB (FEI Helios NanoLab DualBeam) sectioning at cryo- and room temperatures.


Gregory PANAITOV (Jülich, Germany), Elmar NEUMANN, Andreas OFFENHÄUSSER
08:00 - 18:15 #6126 - LS02-028 Intracellular Organization in Cochlear Inner Hair Cells by 3D Electron Microscopy.
LS02-028 Intracellular Organization in Cochlear Inner Hair Cells by 3D Electron Microscopy.

The ways in which cell architecture is modelled to meet cell function is a poorly understood facet of cell biology.  However, the compartmentalization of mutually exclusive reactions in different regions of cells by membrane-enclosed organelles or by self-assembling macromolecular complexes is a basic mechanism of life.  Fluorescent tags can display proteins confined to compartments in living cells, but provides no glimpse of the underlying ultrastructure.  The electron microscope has the resolution to display cellular ultrastructure.  Transmission electron microscopy (TEM) tomography of thin slices (~100-300nm depth) can reveal complex subcellular cellular ultrastructure.  Serial Block Face Scanning Electron Microscopy (SBFSEM) can provide ultrastructural resolution throughout a much longer (μm to mm) sample depth, enabling quantitative analysis of ultrastructural features throughout the length of most complex cells.  

 

We have studied the cytoarchitecture of a cell with highly specialised organisation, the cochlear inner hair cell (IHC), using multiple hierarchies of 3D electron microscopy analyses.  We have shown that synaptic terminal distribution on the IHC surface correlates with cell shape, and the distribution of a highly organised network of membranes and mitochondria encompassing the infranuclear region of the cell.  Structural linkages between organelles that underlie this organisation were identified by high resolution imaging.  Together these techniques have the potential for clarifying functionally specialised cytoarchitecture of other cell types.  Strategies employed to improve data quality will be discussed. 


Roland FLECK (London, United Kingdom), Gema VIZAY-BARRENA, Anewn BULLEN
08:00 - 18:15 #6209 - LS02-029 Traditional and modern methods in tardigrade analysis.
LS02-029 Traditional and modern methods in tardigrade analysis.

Tardigrada (also known as water bears) are microscopic, cosmopolitan invertebrates that are closely related to Arthropods. They are widespread in marine and brackish, freshwater, terrestrial habitats throughout the world, and they can be found in hot springs, Himalaya mountaintops, under the ice layer and even in ocean sediments. These animals are well known due to their unbelievable abilities that allow them to survive in extreme environments (such as temperatures ranging from −272°C to 151°C, pressure, dehydration, radiation,  toxins, outer space, etc.). Although there are many more researches that are focused on tardigrades, this Phylum is still not very well known. Since knowledge about tardigrades has contributed to the discovery of dry vaccines, it seems that the research conducted on these animals is valuable.

In our research we focused on the traditional and modern methods that are used in the analysis of tardigrades. From the traditional methods, we used light microscopy, transmission and scanning electron microscopy as well as histo- and immunohistochemical methods. We also present a new method that is used in invertebrate analysis SBEM (serial block- face scanning electron microscopy), which had not previously been used for analysis of invertebrates. SBEM is a method that generates high resolution three-dimensional (3D) images from the two-dimensional (2D) images that are obtained by scanning the block-face of an analysed sample. It was invented by Winfried Denk in 2004 to analyse the connectivity of the axons in the human brain. In this method, a microscope that connects the scanning electron microscopy, transmission electron microscopy and microtome into one tool is used.

 

 

Part of this work was supported by research grant from Polish National Science Centre. Contract grant number: UMO-2014/15/N/NZ4/04350.


Marta HYRA (Katowice, Poland), Michaela CZERNEKOVA, Sebastian STUDENT, Izabela POPRAWA
08:00 - 18:15 #6282 - LS02-030 Using cryomethods around SEM technologies to characterize waxes on the petals surface of Rosa damascena.
LS02-030 Using cryomethods around SEM technologies to characterize waxes on the petals surface of Rosa damascena.

The rosaceae is one of the major family of flowering plants with 3200 species in 115 genera. The genus Rosa encompasses approximately 190 species and more than 18 000 cultivar forms of the plant have been identified [1]. The species Rosa damascena is well known for its intensely fragrant flowers. In the cosmetic field, essential oils and waxes are two major components which are extracted from the rose flower. Rose essential oils are very often used in fine fragrances whereas waxes can be used as active components to play a major role in the skin physiology.

Rose petals’ surfaces have already been studied by conventional SEM technologies. The rose scent compounds are emitted by both epidermal layers [2]. Residues of secretory substances have already been observed on both surfaces [2,3]. The wax components are localized in the cuticle on the surface of the epidermal cells. The cuticle of floral organs presents a micro-relief defined as cuticular patterns [4]. Although the shape of epidermal cells is variable between both the petal rose faces, the cuticle presents some common patterns which results in parallel folds. Circular wax patterns were also observed on the abaxial surface [2,3,5].

 

The aim of our study was principally to characterize more precisely the wax aspect at the surface of petals of the Rosa damascena. Wax microstructures are fragile and to avoid sample preparation artifacts we decided to work on fresh hydrated specimens and innovate by mixing cryomethods with different observation modes in SEM.

In a first approach we manually plunged the petal sample into liquid nitrogen and transferred it into the SEM chamber equipped with Peltier freezing stage. The surface analysis using SE and BSE detectors in variable pressure mode allowed us to distinguish two shapes of epidermal cells on the abaxial face. Both are elliptical but one of them shows globular structures (Figure 1). This latter shape would appear to be associated with circular wax models.  In a second time, the cryofixation was carried out with a semi-automated plunge freezing device. The specimen was etched, coated and then transferred from the cryo preparation chamber onto a SEM-FEG cryo-stage. High resolution imaging with an in-lens SE detector at low voltage permitted us to analyse the extreme surface of petals and observe the structure of the rose petal waxes.

 

We confirmed by this study the interest of mixing cryomethods to preserve the rose petal wax patterns as close as their native state. In addition using numerous and complementary detectors in different vacuum modes allowed us to collect new information on the wax aspect at the surface of petals of the Rosa damascena. The optimizing protocols of cryomethods can also be an opportunity to have a better understanding of the scent molecules release from the epidermal cells though the cuticle. Our first observations in this direction are encouraging.

 

References

[1] Mohammad Hossein Boskabady, Mohammad Naser Shafei, Zahra Saberi and Somayeh Amini. 2011. Pharmacological Effects of Rosa Damascena. Iran J Basic Med Sci. Vol. 14(4): 295–307.

[2] V. Bergougnoux  J.C. Caissard,  F. Jullien,  Jean-Louis Magnard, Gabriel Scalliet,  Jeremy M. Cock, Philippe Hugueney, Sylvie Baudino. 2007. Both the adaxial and abaxial epidermal layers of the rose petal emit volatile scent compounds. Planta. Vol. 226 (4): 853-866.

[3] Aneta Sulborska, Elżbieta Weryszko-Chmielewska, Mirosława Chwil. 2012.Micromorphology of Rosa rugosa Thunb. petal epidermis secreting fragrant substances. Acta Agrobotanica. Vol 65 (4): 21-28.

[4] Rea L. Antoniou Kourounioti, Leah R. Band, John A. Fozard, Anthony Hampstead, Anna Lovrics, Edwige Moyroud, Silvia Vignolini, John R. King, Oliver E. Jensen, Beverley J. Glover. 2013. Buckling as an origin of ordered cuticular patterns in flower petals. Journal of the royal society. Vol. 10 (80).

[5] Gaurav Sharma, M. L. Sharma , S. K. Sharma, and H. P. S. Kang. 2005. Single-Step Surface Replication of Flower Petals for SEM. Microscopy and Analysis, 19 (1): 21-23.


Eric FERNANDEZ (Yves Rocher), Christophe ROSE, Sylvie MARULL-TUFEU
08:00 - 18:15 #6357 - LS02-031 High-resolution micro-tomographic X-ray imaging of stained mouse brain.
LS02-031 High-resolution micro-tomographic X-ray imaging of stained mouse brain.

High-resolution structural visualization of animal organs at the micro- and submicrometer scale is essential for functional, comparative and developmental studies. Histology is the gold standard to examine microstructures in stained thin sections of animal organs using optical and electron microscopies. However, due to limitations intrinsic to these imaging techniques, the sample preparation protocol is usually very time-consuming, the images obtained are two-dimensional and they only exhibit structures of small sections of the organs imaged.  

Recent works have shown that the chemical staining of animal organs is a good strategy to increase the low inherent contrast of soft tissues in X-ray absorption micro-computed tomography (microCT).[1,2] However, it is repeatedly described in several works in this area that the slow and inhomogeneous diffusion of the staining agent into the samples can limit the use of stains in microCT. To overcome this issue, long staining times consisting of one or more weeks are used,[2,3] as well as highly concentrated staining solutions, that can cause sample shrinkage. 

We have recently made some significant improvements to a well known staining protocol applied to soft-tissue samples and non-distorted three-dimensional (3D) structural information of entire animal organs were easily accessed.[4] The images obtained with a bench top microCT scanner reveal rich morphological information of the whole organs analysed. Moreover, with our protocol, the chemical agents that increase the contrast were able to reach small structures and we have demonstrated that organs structures and some cells types can be discriminated in the microCT images obtained. As an example, the digital mid-sagittal section of a mouse brain stained with our protocol (Fig. 1) reveals brain regions including the cerebellum (Cb); the thalamus (Th); the hippocampus (Hp); the striatum (Str), the corpus callosum (cc) and the neocortex (NCx). In a higher-resolution measurement of the cerebellum (Fig. 2), the stratum moleculare (a); and the stratum granulosum (b) are discriminated. Moreover, we have detected microstructures of tens of mm in diameter, which due to their location, size, shape and density are presumably the Purkinje cells (Fig. 2, arrows). In a higher-resolution measurement of the brain (Fig. 3), the thalamus; the hypothalamus; the striatum, the corpus callosum and the neocortex are seen in an even more detailed fashion, and the cells organization in the corpus callosum is much more evident.  

By selecting the appropriate agent or even by combining different staining agents, we are able to improve the contrast in selected areas and a few distinct structures could then be discriminated in one entire mouse brain using microCT. These images demonstrate that staining allied to microCT is a promising strategy to increase the contrast of features of the same order of magnitude of axons in the corpus callosum and and Purkinje cells in the cerebellum, thus allowing the reconstruction in 3D of the structural  organization of some specific cells of interest and therefore being a complementary technique to histology in functional, comparative and developmental studies.

_____________

[1] Metscher, B. D. Biological applications of X-ray microtomography: imaging micro-anatomy, molecular expression and organismal
diversity. Microsc. Anal. 27, 13–16 (2013).

[2] Aslanidi, O. V. et al. Application of micro-computed tomography with iodine staining to cardiac imaging, segmentation and computational model development. IEEE Trans. Med. Imaging 32, 8–17 (2013). 

[3] Cox, P. G. & Faulkes, C. G. Digital dissection of the masticatory muscles of the naked mole-rat. PeerJ 2, e448 (2014). 

[4] Martins de Souza e Silva, J. et. al. Three-dimensional non-destructive soft-tissue visualization with X-ray staining micro-tomography. Scientific Reports 5, Article number: 14088 (2015).


Juliana MARTINS DE SOUZA E SILVA (Garching bei Muenchen, Germany), Franz PFEIFFER
08:00 - 18:15 #6400 - LS02-032 Formation of bacterial nanostructures: the impact of growth dead phase and antibiotics.
LS02-032 Formation of bacterial nanostructures: the impact of growth dead phase and antibiotics.

Background. The existence of nanobacteria as a separate systematic unit is still under the doubt (1, 2). Nanobacteria are characterized as mycoplasmas and as L-transformed forms, too (3).

The aim of current investigations was to evaluate the possibilities of formation of "nanostructure - nanobacteria" in overgrowth bacterial cultures (death phase of growth) and in the presence of antibiotics.

 

Material and methods. E. coli1257 and S. flexnerii130 were used in these investigations to follow the changes in bacterial membrane structures in death phase of growth and after the treatment of antibiotics. Bacteria were grown anaerobically in LB medium (48 hours, 37Co), solidified with 1.8% agar when necessary. The following antibiotics were used: tetracycline (15 µg/ml), doxycycline (15 µg/ml), amoxicillin  (25 µg/ml), ampicillin (35 µg/ml), cefoxitin (50 µg/ml), kanamycin (50 µg/ml), gentamicin (50 µg/ml), chloramphenicol (30 µg/ml), and streptomycin (50µg/ml).

Transmission (TEM) electron microscopy technique was used to evaluate the changes in bacterial membrane structures.

 

Results. The formation of spherical granules in 40-100nm surrounding by membrane structures of S. flexnerii in growth death phase (Fig. 1) and formation of outgrowths on E. coli cell walls with different length during the ampicillin-treatment (Fig. 2) were detected in these studies. These formations could be discussed as a basis for the development of nanobacteria under the specific conditions of environment.

 

References.

[1]. Robert J.C, Mc Lean, Brenda L. Kirland (2014) Nanostructure and Nanobacteria.p.1-10, Nanomicrobiology: Physological and Environmental CharacteristicsL\ Eds. Lary Barton, Demis Bazilski, Huifang Xu. 125p. DOI 10.1007/978-14939-16672-1

[2]. Jan Martel; Hsin-Hsin Peng; David Young; Cheng-Yeu Wu; John D Young. Of nanobacteria, nanoparticles, biofilms and their role in health and disease: facts, fancy and future.Nanomedicine. 2014;9(4):483-499.

[3]. VD Timakov, G.YA Kagan (1973) L-form bacteria and bacteria family Mycoplas-mataceae pathology. Ed. "Medicine". Moscow, 385C.


Margarita HOVNANYAN, Astghik PEPOYAN, Karlen HOVNANYAN (Yerevan, Armenia)
08:00 - 18:15 #6405 - LS02-033 Investigation of Biofilm Forming Capabilities on Stainless Steel Surfaces of Some Foodborne Pathogens.
LS02-033 Investigation of Biofilm Forming Capabilities on Stainless Steel Surfaces of Some Foodborne Pathogens.

 

Biofilm is a major problem in the food industry produced by pathogenic microorganisms, because adhered cells to biotic or abiotic surfaces are more resistant against antimicrobials and disinfectants than planktonic cells.The retention of bacteria on food contact surfaces is an important  in food processing, catering and the domestic environments. Salmonella species and Listeria monocytogenes are the most important food-borne pathogenic bacteria. In this study, L. monocytogenesis and Salmonella species isolated from several food sources in the region of Eskisehir were screened for their biofilm forming ability on the stainless steel material and biofilm development stages were examined with scanning electron microscopy (SEM)

In our study, L.monocytogenesisveSalmonella spp isolates were identified by standard microbiological procedures. The biofilm forming capabilities of isolates were tested by microtiter plate and tube methods. Moderate and strong degree of biofilm-forming organisms on the stainless stain surfaces were taken into electron microscopic procedures. They were examined on 2, 4, 6, 24 ve 48thhours for their structure of the biofilm and imaged by SEM (JEOL JSM-5600LV).

Stainles steel materials are  commonly used surfaces in food production, storage and processing processes.L.monocytogenesis and Salmonella spp. have been shown to adhere to stainless steel surfaces. According to our results, biofilm formation has started from 24th  hour.  Isolation of theese microorganisms from variety foods showed that these foods can be easily infected with bacteria at any stages of food production. It carries risks for public health.

Acknowledgment: This work was supported by a grant from Eskisehir Osmangazi University (Project Number:2015-910)


Bükay YENICE GÜRSU (eskişehir, Turkey), Gökhan DIKMEN, İlknur DAĞ
08:00 - 18:15 #6732 - LS02-034 Mathematical modeling of Cajal body formation.
LS02-034 Mathematical modeling of Cajal body formation.

In the living cells, there are many structures and organelles enveloped with a membrane that defines their border and controls the communication between the inner and outer environment. In contrast to membrane bound compartment, cells contain numerous membrane-less structures, whose formation is based on specific interactions among their components. These types of structures include Cajal bodies (CBs), PML bodies and P-Bodies found in most cell types, stress granules that appear upon environmental stress (heat shock, oxidative stress etc.) or various aggregates that form as result of protein/RNA mutations (e.g. protein inclusions in ALS). The biological role of the membrane-less structures is a topic of intensive research and the function of several bodies have been revealed. However, little is known about principles that lead to their formation. As an archetypal compartment, we employed the CB (Fig.1), the self-organizing structure involved in metabolism of various ribonucleoprotein particles. We employed time-gated Stimulated Emission Depletion (gSTED) microscopy to acquire superresolution microscopy images of the CB and surrounding nucleoplasm. We have visualized the CB scaffolding protein coilin using indirect immunofluorescence in situ. Our preliminary data clearly showed the sub-resolution structures of the CB (subCBs). Moreover, the substructures are also visible in the surrounding nucleoplasm and indicate that the CB is an aggregate of those basic building blocks (Fig.2-B). Here, we would like to present our work on a mathematical model based on the fundamental thermodynamic rules of condensation and phase-separation to describe the formation of membrane-less bodies. We will present superresolution fluorescence microscopy, photo-kinetic experiments and fast time-lapse live cell imaging results and progress of the work on determining of basic biophysical behavior of individual CB components. The project is interdisciplinary and combines advanced fluorescence microscopy techniques and mathematical modeling and simulations.


Michaela BLAZIKOVA (Prague, Czech Republic), Anna MALINOVA, Ivan NOVOTNY
08:00 - 18:15 #6740 - LS02-035 Subcellular localization of metal pools determined by TEM-EDS in embryo Arabidopsis thaliana mutants.
LS02-035 Subcellular localization of metal pools determined by TEM-EDS in embryo Arabidopsis thaliana mutants.

Transmission Electron Microscopy equipped with Energy Dispersive Spectroscopy (TEM-EDS) is known to be a powerful tool to study metal speciation in biological and environmental samples. The characterisation of different metal pools present in organisms is indeed essential to understand optimal development under various environmental constraints. For instance in plant cells, iron (Fe) is known to be an essential co-factor for electron transfer in many biological reactions. Fe remobilization by specific membrane transporters in seeds is especially important for germination.  In Arabidopsis thaliana seeds, the AtVIT1 transporter is involved in Fe influx into perivascular vacuoles whereas the AtNRAMP3 and AtNRAMP4 function in Fe retrieval. The vit1-1 and nramp3nramp4vit1-1 mutants display an altered Fe pattern.

 

To examine the subcellular localization of Fe and Mn in cotyledons from wild-type, vit1-1 and nramp3nramp4vit1-1 triple mutant dried seeds, we used Energy Dispersive Spectroscopy (EDS) combined with Transmission Electron Microscope (TEM). This technique collects the X-rays spectrum emitted by plant sample sections bombarded with a focused beam of electrons to obtain a localized chemical analysis (Figure 1). A cartography using STEM-EDX data complete the characterization of these mutants and open new questions of the iron localization and chemistry in the triple mutant.

 

Results (Figure 2) show that in vit1-1 mutant embryos, Fe and Mn were both concentrated in subepidermal cell globoids, whereas Fe is localized in perivascular globoids in wild-type. In the nramp3nramp4vit1-1 triple mutant Fe was detected at low level in globoids from subepidermal and perivascular cells although vit1-1 and nramp3nramp4vit1-1 have the same pattern revealed by Perl’s/DAB staining (1).

 

To further localize and quantify metal elements such as Fe or Ni in cells, we also developed a CEMOVIS approach which will allow to perform elemental chemical analysis from lyophilized cryosections observed by STEM-EDX.

 

 

(1)    Mary V. et al. (2015). Bypassing Iron storage in endodermal vacuoles rescues the iron mobilization defect in the natural resistance associated- macrophage protein3natural resistance associated-macrophage protein4 double mutant. Plant Physiology, 169, 748-760

 


Cynthia GILLET (CNRS I2BC), Viviane MARY, Vanesa SANCHEZ GARCIA DE LA TORRE, Sébastien THOMINE, Béatrice SATIAT-JEUNEMAÎTRE
08:00 - 18:15 #6768 - LS02-036 Comparison of different EM methods for observation of lipidic structures in the cell nucleus.
LS02-036 Comparison of different EM methods for observation of lipidic structures in the cell nucleus.

Permanent progress in electron microscopy (EM) techniques enables us to reveal the finest ultrastructural details of the cell nucleus. Our recent work is focused on the previously unrecognized nucleoplasmic structures composed of phosphatidylinositol 4,5-bisphosphate, so called PIP2 islets. The super-resolution light microscopy enabled us to localize PIP2 islets inside the cell nucleus and reveal their colocalization with several components of Pol II transcription machinery and chromatin. However, only EM provides sufficient resolution to reveal the PIP2 islets ultrastructure and composition via immunostaining.

The usage of appropriate method for EM sample preparation is a crucial step in the whole procedure as PIP2 islets are lipidic structures which are predisposed to extraction or translocations. Here we compare different EM sample preparation techniques which we have optimized for the best ultrastructural preservation and antigenicity retention of PIP2 islets. We have analyzed several chemical fixation and cryoimmobilization approaches followed by various embedding media including both acrylic and epoxy resins. Moreover, different immunolabeling techniques were used such as pre-embedding, on-section labeling, and Tokuyasu method. With all these approaches we were able to observe roundish PIP2 islets (40-100 nm) recognized by anti-PIP2 antibodies. Preliminary results demonstrate that PIP2 islets are stable nuclear structures resistant to aldehyde fixation and extraction during preparation and cutting procedures. Based on the upcoming statistical analysis, the best approach for immunological studies of PIP2 islets will be selected. 


Jana SCHRENKOVA (Prague, Czech Republic), Margarita SOBOL, Vlada PHILIMONENKO, Pavel HOZAK
08:00 - 18:15 #6774 - LS02-037 New insights on the fertile megagametophyte and female sterility obtained from Maytenus obtusifolia Mart. (Celastraceae) plants under TEM.
LS02-037 New insights on the fertile megagametophyte and female sterility obtained from Maytenus obtusifolia Mart. (Celastraceae) plants under TEM.

Maytenus obtusifolia Mart. is an abundant species in restingas (sandy coastal plains), mainly in Rio de Janeiro state, Brazil. Populations in restinga of Maricá are gynodioecious formed by female individuals with pistillate flowers and hermaphrodites with perfect flowers. Pistillate flowers bear a developed gynoecium and staminodes. Perfect flowers have gynoecium with varied development and fertile stamens. Hermaphrodite plants have lower fruiting rate than female plants which was associated to the presence of sterile ovules with hypertrophied synergids and egg cell. The aim of this study was to compare fertile and sterile megagametophytes under TEM. Preanthesis buds were collected at restinga of Maricá/RJ, fixed in Karnovsky, post-fixed in osmium tetroxide, embedded in Araldite, sectioned, contrasted and observed in Tecnai Spirit TEM. In fertile ovules of pistillate and perfect flowers, the egg cell presents cytoplasm dense and polarized, with vacuole facing the micropilar pole. Synergids have thin walls with evident fibrillar apparatus; polarized cytoplasm, vacuome facing the chalazal pole; mitochondria; plastids; nucleus; linear RER concentrically arranged; well developed dictyosomes with enlarged borders forming secretory vesicles. The central cell has thin walls with slightly disorganized cellulose fibrils; cytoplasm arranged in the cell periphery; developed vacuome occupying almost the entire cell; polar nucleus; ribosomes; vesicles with associated ribosomes, derived from RER; dictyosomes; oil bodies and mitochondria. In sterile ovules of perfect flowers, synergids undergo a vacuolization process, with subsequent fusion of small vacuoles; nucleus with fragmented or degenerated nuclear envelope; mitochondria and RER with signs of degeneration; organelles debris and plastids. In these hypertrophied synergids and the egg cell, disruption of tonoplast promote the cell lyses. Vacuole membranes and organelles debris are found inside synergids and central cell. Egg cell cytoplasm has fragments of nucleus. This study reveals that female sterility in perfect flowers seems to be caused by a vacuolization process followed by tonoplast disruption suggesting the occurrence of massive autophagy in megagametophyte cells. 

Acknowledgements: We thank CAPES for the PhD Fellowship by the first author; CNPq (Proc. 401053/2016-4) for the grant to S.R. Machado, and the Electron Microscopy Centre (CME) IBB, UNESP and its technicians for lab assistance.

 


Isabella HADDAD, Lygia SANTIAGO-FERNANDES, Silvia MACHADO, Silvia MACHADO (Botucatu, Sao Paulo state, Brazil)
08:00 - 18:15 #6779 - LS02-038 Fine ultrastructure and composition of nuclear PIP2 islets.
LS02-038 Fine ultrastructure and composition of nuclear PIP2 islets.

During the last decade importance of phosphoinositides in nucleus was uncovered. We defined previously unknown nuclear structures which occupy nearly 2% of nuclear volume and contain almost 30% of the nuclear pool of phosphatidylinositol 4,5-bisphosphate (PIP2). These non-membranous structures of 40 – 100 nm are decorated by PIP2, so we name them PIP2 islets. PIP2 islets are surrounded by phosphorus and nitrogen, hence proteins and nucleic acids are in their vicinity. We showed that PIP2 on the periphery of the islets is associated with Pol II transcription complex, nuclear myosin 1, chromatin and nascent RNA transcripts. We prove that PIP2 islets contribute to efficient DNA transcription. Further, we were interested in the fine ultrastructure and precise composition of the islets to clarify their role in the nuclear architecture.

PIP2 islets are filled by carbon-rich compounds, however we were not able to identify these molecules by immunolabeling on either resin sections or Tokuyasu sections. The possible reason for this could be the high mobility of the lipids and their extraction during aldehyde fixation. To avoid problem of lipid fixation we are optimizing the method of quick- freeze fracture replica labelling for the interior of the cell nucleus. The samples are fixed physically – by high pressure freezing, and subsequently mechanically – by coating with carbon/platinum layer. This method enables a reliable fixation and immunolabeling of lipids in cellular membranes. The applicability of the method for the study of fine ultrastructure and immunolabeling of intranuclear non-membranous lipidic structures will be discussed.

Acknowledgements: This work was supported by JSPS (15K21738), GACR (15-08738S, 16-03346S), TACR (TE01020118), the Human Frontier Science Program (RGP0017/2013), and by institutional grant (long-term conceptual development of the scientific organization; RVO: 68378050). We acknowledge the Microscopy Centre, IMG AS, Prague, Czech Republic supported by the MEYS CR (LM2015062 Czech-BioImaging).


Margarita SOBOL, Zuzana LUBOVSKÁ (Prague, Czech Republic), Alžběta KALENDOVÁ, Sukriye YILDIRIM, Vlada PHILIMONENKO, Pavel MARÁŠEK, Ilona KALASOVÁ, Lukáš PASTOREK, Toyoshi FUJIMOTO, Pavel HOZÁK
08:00 - 18:15 #6797 - LS02-039 3D reconstruction of Euglena gracilis using serial block face scanning electron microscopy.
LS02-039 3D reconstruction of Euglena gracilis using serial block face scanning electron microscopy.

Euglena gracilis is a unicellular fresh water photosynthetic flagellate at which a bleaching phenomenon was described. Using antibacterial compounds like quinolones and cumarins, the photosynthetic activity may be destroyed and results in irreversible elimination of chloroplasts. Beside the loss of chloroplasts in E. gracilis, damage and ultrastructural transformation of mitochondria leading to a formation of giant mitochondria has been also shown [1,2,3]. In this study, we used serial block face scanning electron microscopy (SBF-SEM) for 3D reconstruction of E.gracilis to see whether the giant mitochondria are inside the bleached non-photosynthetic mutant cells or they were just an artifact/myth caused during specimen preparation.  

For SBF-SEM, biological samples are standardly prepared according the protocol described by Deerinck et al. (2010) In this case, we needed the ultrastructure preservation of our sample as close as possible to the native state, therefore we decided to use high pressure freezing followed by the freeze substitution method. To increase the image contrast in backscatter electron imaging, we added soluble salts containing heavy metals in freeze substitution solutions. We tested four modified protocols in which we used various combinations of the following compounds: osmium tetroxide, thiocarbohydrazide, potassium ferricyanide, lead nitrate, uranyl acetate, phosphotungstic acid.   Resin embedding was done using low viscosity Spurr (EMS) at room temperature.

At first, the ultrathin sections were cut from polymerized blocks using the ultramicrotome (Leica EM UC6).  Sections were examined in transmission electron microscope (TEM, JEOL 1010) and the contrast of mitochondria was compared in recorded images of mutant cells prepared by modified and standard Deerinck protocols (Fig.1). The sample with the highest contrast was roughly trimmed by a razor blade and mounted on the stub using a superglue and conductive colloidal silver paint (EMS). Small pyramids with square block face in size appr. 100x100x100 µm were prepared using a diamond trimming tool (Diatome) or glass knife in the microtome.

The high resolution SEM (Tescan Maia3 XMU FEG) equipped with ultramicrotome (Gatan 3View2XP) in the microscope chamber was used for the collection of images recorded at the accelerating voltages 1.5 and 3.0 kV. More than 1000 slices with the thickness of either 30 or 50 nm were cut from sample pyramids with the oscillating diamond knife working at cutting speed 0.5 mm/s. To prevent the sample charging, the image acquisition was performed at the chamber pressure 50 Pa. Gaussian 3D filter in Image J software was applied to recorded images to reduce a noise. 3D model was created using automatic segmentation tool in the Amira software package.

The resulting 3D reconstructions did not prove the presence of giant mitochondria in the mutant cells. However SBF-SEM in the combination with the current methods of specimen preparation has proven to be the method of choice allowing the study of the distribution of cell organelles and their mutual position in the whole cell volume.

References:

[1] L. Ebringer, J. Polónyi, J. Krajcovic, Arzneimittel-Forschung, 43(7), (1993), 777–81.

[2] J.Polonyi  et al., Folia Microbiol. 43(6), (1998),661-66.

[3] J.Polónyi et al., Zeitschrift für mikroskopisch-anatomische Forschung, 104(1),(1990), 61-78.

[4] The study was supported by the Technology Agency of the Czech Republic (TE01020118) and from the program for large research infrastructures of the Ministry of Education, Youth and Sports within the project „National Infrastructure for Biological and Medicinal Imaging  (Czech-BioImaging LM2015062)

 


Jana NEBESAROVA (Ceske Budejovice, Czech Republic), Eva DOBAKOVA, Michal PETROV, Tomas BILY, Marie VANCOVA
08:00 - 18:15 #6861 - LS02-040 Wet STEM in SEM for Morphological Characterization of Novel Bacterial Species: Vibrio galatheae and Photobacterium galatheae.
LS02-040 Wet STEM in SEM for Morphological Characterization of Novel Bacterial Species: Vibrio galatheae and Photobacterium galatheae.

Scanning electron microscope (SEM) is increasingly used for morphology characterization in various research fields. The technique is appealing due to the fact that it has a fairly large field of view (µm to mm) with nm lateral resolution, which makes it suitable for characterization of micrometer scale objects, which have nm scale features, such as bacteria. The major limiting factors for SEM as a visualization tool of bacteria are the sample preparation, which is prone to artefacts, and the sample interaction volume, which limits the lateral resolution. Here, we present an approach for morphology characterization, which involves minimal sample preparation and maximized lateral resolution: the use of environmental SEM (E-SEM) with a scanning transmission electron detector (STEM); wet STEM. We use wet STEM for morphological characterization (identification of cell shape, size and appendices) of two bacteria isolated from a mussel collected in the Solomon Sea (Solomon Islands) during the Danish research expedition Galathea 3: Vibrio galatheae1 and Photobacterium galatheae2.

The bacteria were grown in marine broth in flask cultures. After 24h growth at 25˚C the marine broth was washed with miliQ water and a 0.5 µL droplet placed on a plasma treated carbon film 200 mesh copper grid. The sample was negatively stained with 2 % uranyl acetate aqueous solution and imaged in an FEI Quanta 200 FEG E-SEM with an electron beam with spot 3 accelerated to 15 keV. During electron microscopy the bacterial cells were kept fully hydrated by using water as auxiliary gas and continuously condensing water on the sample. The bacteria were imaged using the transmitted electrons and a STEM detector (a 2 quad, diode back scattered electron detector mounted below the sample).

The wet STEM micrographs revealed that the Vibrio galatheae, has Vibrio monotrichous cells, 1.482±0.365 µm long, 0.743±0.181 µm width and 3.625±0.639 µm long flagellum (Figure 1), and the Photobacterium galatheae has Bacillus monotrichous cells , 2.261±0.404 µm long, 0.985±0.128 µm wide and  4.306±1.094 µm long flagellum (Figure 2).  

References

1. Vibrio galatheae sp. nov., a member of the family Vibrionaceae isolated from a mussel, Sonia Giubergia, Henrique Machado, Ramona Valentina Mateiu and Lone Gram, International Journal of Systematic and Evolutionary Microbiology (2016), 66, 347–352.

2. Photobacterium galatheae sp. nov., a bioactive bacterium isolated from a mussel in the Solomon Sea, Henrique Machado, Sonia Giubergia, Ramona Valentina Mateiu and Lone Gram, International Journal of Systematic and Evolutionary Microbiology (2015), 65, 4503–4507.


Ramona Valentina MATEIU (Kgs. Lyngby, Denmark), Sonia GIUBERGIA, Henrique MACHADO, Lone GRAM, Jakob BIRKEDAL WAGNER
08:00 - 18:15 #6869 - LS02-041 Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum.
LS02-041 Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum.

Magnetotactic bacteria (MTB) are known to produce single-domain magnetite or greigite crystals within intracellular membrane organelles and to navigate along he Earth’s magnetic field lines. MTB have been suggested as being one of the most ancient biomineralizing metabolisms on the Earth and they represent a fundamental model of intracellular biomineralization. Moreover, the determination of their specific structure and morphology is essential for paleoenvironmental studies. Yet, the mechanisms of MTB biomineralization remain poorly understood, although this process has been extensively studied in several cultured MTB strains in the Proteobacteria phylum. Here, we present a comprehensive TEM study of magnetic and structural properties down to atomic scales on bullet-shaped magnetites produced by the uncultured strain MYR-1 belonging to the Nitrospirae phylum, a deeply branching phylogenetic MTB group. HAADF-STEM imaging and XEDS elemental mapping revealed a phenotypical heterogeneity among MYR-1 cells, Phenotype III produces numerous sulfur-rich globules (fig.1a-c). Electron tomography (ET) demonstrated that the bullet-shaped magnetosomes are organized into 3–5 bundles of chains (fig.1d,e). Off-axis Electron Holography results show that each bundle of MYR-1 chains appears to behave magnetically as a large uniaxial single domain (USD) magnet that maximizes the net magnetic moment of the cell (fig.1f).

We observed a multiple-step crystal growth of MYR-1 magnetite: initial growth forming cubo-octahedral particles (fig.2), subsequent anisotropic growth and a systematic final elongation along [001] direction (fig. 3). During the crystal growth, one major {111} face is developed and preserved at the larger basal end of the crystal (fig. 4.a). The basal {111} face appears to be terminated by a tetrahedral–octahedral-mixed iron surface, suggesting dimensional advantages for binding protein(s), which may template the crystallization of magnetite  (fig. 4b,c). This study offers new insights for understanding magnetite biomineralization within the Nitrospirae phylum.

Reference : J. R. Soc. Interface 201512 20141288; DOI: 10.1098/rsif.2014.1288


Jinhua LI, Nicolas MENGUY (PARIS), Christophe GATEL, Victor BOUREAU, Etienne SNOECK, Eric LEROY, Gilles PATRIARCHE
08:00 - 18:15 #6873 - LS02-042 Observations about the tongue mucosa of White-Eared-Opossum (Didelphis albiventris), employing scanning and transmission electron microscopy.
LS02-042 Observations about the tongue mucosa of White-Eared-Opossum (Didelphis albiventris), employing scanning and transmission electron microscopy.

            The White-Eared-Opossum (Didelphis albiventris) is a marsupial that occupies a large variety of habitats, spreading through several Brazilian biomes and some urban areas [1], with an important role in seed dissemination. As a mammalian, its tongue evolved to specialized functions and, in the neonate, in addition to milk suckling, it also serves to  keep them attached to the female nipple, as a support for protection within the marsupium, reflecting the success of organogenesis. Furthermore, the lingual papillae provides an indicative of the animal habits, mechanical uses, diet and taxonomic relationships [2].

                        The organs were collected from individuals found dead by the roads in the state of Rio Grande do Sul, southern of Brazil. This material was previously fixed in modified Karnovsky aqueous solution and, once identified the tissue quality, it was submitted to processing for scanning (SEM) and transmission (TEM) electron microscopy.

            Through TEM the epithelial layers that forms the lingual mucosa were easily distinguished and identified, both in adults and fetuses. The stratum corneum at both stages demonstrate the epithelial renewal process through the release of the most superficial cells; the granular layer is more tenuous in fetuses than in adults, where many tonofilaments and several keratohyaline granules were observed; the spinous layer was similar in both ages and marked by the large number of desmossomes between the cells.

            Two adult tongues were used in the SEM study. One was used for the mucosa analysis, and revealed filiform papillae with different morphologies according to the region. The apex is filled with "major" papillae, like acute columns. The space among them is filled with tuft of "minor" thin and flat filiform papillae. This "minor" filiform papillae covers the entire top of the body surface but is much denser than in the apex, giving a velvet appearance to the organ. The fungiform papillae are scattered in the apex and body, and partially covered by an elevation of mucosa, looking like circumvallate papillae, since it present a moat-like trough. Circumvallate papillae are 3 in number and form a triangle on the lingual root, with the apex oriented caudally. Foliate papillae are small and thin elevations in the caudolateral border of the tongue, ranging from 12 to 16.

            The other SEM study used corrosion with Sodium Hydroxide to remove the epithelial layer, reaching the connective tissue that supports the lingual mucosa. It was observed that the filiform papillae subepithelial tissue is similar to what is seen with the conventional technique. The other types of papillae present an irregular surface with some dorsal depressions. The subepithelial tissue of the two circumvallate papillae, located more rostrally, are oval like the epithelium, while the third is rounded.

            The characteristics observed in the tongue of D. albiventris are similar to those observed in other marsupial species.

            This research is supported by the São Paulo Research Foundation (FAPESP. Proc.: 2015/05065-9).

 

References

[1] Faria-Corrêa M; Vilella FS; Jardim MMA (2007) Biodiversidade 23:356-366.

[2]Okada S; Schraufnagel D (2005) MicroscopyandMicroanalysis11:319-332.


Bárbara Tavares SCHÄFER (São Paulo, Brazil), Althen TEIXEIRA FILHO, Ii-Sei WATANABE
08:00 - 18:15 #4461 - LS03-043 Thrombotic, inflammatory reactions, and disease progressions visualized by multi-scale in vivo 1P, 2P microscope, and on-chip imager.
LS03-043 Thrombotic, inflammatory reactions, and disease progressions visualized by multi-scale in vivo 1P, 2P microscope, and on-chip imager.

We made multi-scale imager including micro 2P XYZT microscope, macro 1P imager, and on-chip fluorescence imager. We utilized multi-modalities to cover from micro to macro scale for space and time axis, and we revealed thrombotic and inflammatory processes in diseased conditions.

 

First one is high resolution imaging system based on non-linear optics. Real-time, multi-color XYZT multi-photon imaging enabled us to visualize single platelet behavior, morphological changes, and elucidate thrombus formation in cardiovascular events. Second, macro imaging system for awake mice was developed, and free behavior monitoring revealed the tight association between metabolism and vascular reactions for daily stress.. Fluorescent imaging from body surface using 8K CMOS camera, image intensifier, and macro-lens enabled us to visualize cellular dynamics without anesthesia. Third, wearable and implantable devices for long-time recording were developed using lens-less and on-chip technologies.

 

We utilized these system with light-manipulation technique, to induce thrombus or inflammation reactions. We induced thrombus formation by photo-chemical reactions in vein, and observed rapidly developing thrombi composed of discoid platelets, and elucidated the novel contributing factor; Endothelial cell disruption by laser irradiations induced inflammation and thrombus formation. Remarkable transient neutrophil accumulation was induced, which was followed by spontaneous cell death and monocyte recruitment. Artery contraction reactions were induced by ROS, and elucidated the dynamics NO/ROS balances.

 

In sum, we developed multi-scale imaging system which can evaluate the therapeutic strategies against thrombotic and inflammatory processes in adult-common disease.


Satoshi NISHIMURA (TOCHIGI, Japan)
08:00 - 18:15 #5130 - LS03-044 Actin-dependent mechanisms during vesicle fusion link exo- and endocytosis in synapses.
LS03-044 Actin-dependent mechanisms during vesicle fusion link exo- and endocytosis in synapses.

During the synaptic vesicle fusion at the active zone a fusion pore is formed that results in a formation of an Ω-shape intermediate structure (Ω-profile) at the plasma membrane for releasing contents, followed by closure (called kiss-and-run) or merging of the Ω-profile into the plasma membrane (called full fusion). Ω-profile closure limits vesicular content release and cargo delivery, but recycles vesicles economically. In contrast, Ω-profile merging allows for rapid, complete content release and cargo delivery, but couples exocytosis to classical endocytosis, involving membrane invagination, Ω-profile formation and fission, for retrieving merged vesicles. In other words, Ω-profile merging defines the mode of fusion (full fusion instead of kiss-and-run) and the mode of endocytosis (classical endocytosis instead of kiss-and-run) [1-3]. Despite these fundamental roles, the mechanism underlying Ω-profile merging is unclear in neurons, in which vesicles are less then 50 nm in diameter and fusion takes place rapidly after calcium influx.

Giant presynaptic nerve terminals in lamprey that allow intracellular microinjections of active compounds were used in our experiments to investigate the role of actin dynamics during the synaptic vesicle fusion in synapses. Compounds perturbing the actin dynamics, such as latrunculin A and cytochalasin D, phalloidin and non-dissociable profilin-actin directly tagged with fluorescence or along with a fluorescent carrier to monitor microinjections, were introduced into giant synapses stimulated at 5 Hz and 20 Hz and studied by confocal and electron microscopy. Phalloidin labeling was observed at the synaptic active zone and a large number of omega-shaped membrane invaginations with dimensions corresponded to the size of synaptic vesicles and larger were observed at active zones in synapses microinjected with compounds disrupting actin polymerization as compared to control synapses, injected with dextran or GST and stimulated at the same rate (Fig. 1). In synapses simulated at 20 Hz a larger number of vesicles was observed at active zones at sites of microinjection supporting that SV release was inhibited.

Our results indicate that actin dynamics is involved at stages when synaptic vesicle merges with the active zone and when its membrane relocates to the periactive zone for endocytosis.

[1] A.A. Alabi and R.W.Tsien, Annu. Rev. Physiol 75, 393-422 (2013).

[2] Wu,L.G., Hamid,E., Shin,W., & Chiang,H.C. Exocytosis and endocytosis: modes, functions, and coupling mechanisms. Annu. Rev. Physiol 76, 301-331 (2014).

[3] Jahn,R. & Fasshauer,D. Molecular machines governing exocytosis of synaptic vesicles. Nature 490, 201-207 (2012).


Gianvito ARPINO, Tuomas NÄREOJA, Elena SOPOVA, Oleg SHUPLIAKOV (Stockholm, Sweden)
08:00 - 18:15 #5187 - LS03-045 Spatial organization of microtubules within the ring canals in the male germ-line clusters of Dendrobaena veneta.
LS03-045 Spatial organization of microtubules within the ring canals in the male germ-line clusters of Dendrobaena veneta.

The formation of syncytial groups of germ-line cells (cysts, clusters) is a widespread phenomenon in animal gametogenesis. There are three major types of the spatial organization of germ-line cysts – linear, branched and cysts that have a central cytoplasmic mass (cytoplasmic core). In our studies, we focused on cysts with a central cytoplasm mass because this type of cyst is still poorly understood. We chose the earthworm Dendrobaena veneta as the model organism because it is easy to cultivate and a large number of germ cells clusters can be obtained from a single specimen.

Generally, clustered germ cells are interconnected via broad cell junctions called intercellular bridges or ring canals (Fig. 1, 2 and 3). Ring canals allow the cytoplasm to flow freely from one cell to another in the entire cluster. Ring canals are nothing more than modified contractile rings that do not close during late cytokinesis. The role of ring canals in the proper functioning of germ-cell clusters is best known in such model species as Caenorhabditis elegans, Drosophila melanogaster and Mus musculus, in which any disorders in the construction and functioning of ring canals result in infertility. Not only is the functioning of ring canals well known in the model species but also their structure and molecular composition. Numerous studies have shown that a rich F-actin cytoskeleton is present in the cortical layer of ring canals (Fig. 3) and that it is required to stabilize the bridges in order to keep them unobstructed, which is necessary for correct exchange of the cytoplasm. On the other hand, it is also known that microtubules play an active role in the development and functioning of germ-cell cysts(Fig. 2). Ring canals are places in which F-actin and microtubules cooperate together with other proteins (e.g. anilin) in order to stabilize the cytoplasmic channel and to optimize its functioning.

In clusters with a central cytoplasmic mass (called a cytophore in annelids), each germ cell has only one intercellular bridge that connects it to the cytophore (Fig. 1, 2 and 3). Therefore, the cytophore is an intermediate structure that mediates cytoplasm sharing between clustering cells.

Our previous studies showed that both F-actin (Fig. 3) and microtubules (Fig. 2) are present in D. veneta germ-line clusters. The aim of the presented studies was to investigate the spatial organization of the microtubules within the ring canals of the male germ-cell clusters in D. veneta. To achieve this goal, we used immunofluorescent methods to visualize the F-actin and microtubules and confocal microscopy to collect high-resolution images. Based on the collected images, we reconstructed the cytoskeletal network within the ring canals.


Karol MAŁOTA (Góra Siewierska, Poland), Piotr ŚWIĄTEK
08:00 - 18:15 #5397 - LS03-046 In vitro hemocompatibility of thin films materials for direct blood contact.
LS03-046 In vitro hemocompatibility of thin films materials for direct blood contact.

The main objective of the study was modified surface thin film materials deposited on polymer substrate constituting the microenvironment for the uptake and controlled differentiation of stem cells the controlled share caused by residual stress and optimized stiffness of the surface using the plasma methods.

Plasma surface modification method generating a controlled part of residual stress in the coating affect the formation of the surface topography in the form of a nano- wrinkles similar to the niches in the tissue environment where stem cells are stored. Niches like structures can catch stem cells from blood flow and prevent their rapid differentiation. Topography and stiffness of the surface of the coating allow for targeted cellular differentiation. The properly formed full confluence of the endothelial cells effectively inhibits blood clotting processes.

The challenge of the work was to develop the surfaces which would mobilize and activate stem and progenitor cells. The idea was to produce the surface containing the niche like structures, the most appropriate structure for the stem cells. The coatings were developed with controlled residual stresses participation, proper microstructure
(Fig. 1) and mechanical properties. Controlled share of residual stress created nano-wrinkles, similar to the niches where stem cells reside in the natural conditions. The creation of stress generated wrinkles did not lead to delaminating of the coating from the substrate. The coating adhered well to the substrate, and wrinkles provided the cellular microenvironment (Fig. 2). The microstructure and mechanical properties were the key factor that determined the controlled cellular differentiation. The differentiation of stem cells was carried out for endothelial cells formation. The following scientific problems were studied: the anchoring mechanisms of the coating to the polymeric substrate, the effect of ion methods for surface modification towards the microenvironment creation for the stem cells and blood- material interaction.

ACKNOWLEDGMENT

The research was financially supported by the Project no. 2014/13/B/ST8/04287 “Bio-inspired thin film materials with the controlled contribution of the residual stress in terms of the restoration of stem cells microenvironment” of the Polish National Center of Science.

 


Roman MAJOR (Cracow, Poland), Klaudia TREMBECKA- WOJCIGA, Jurgen M LACKNER, Hanna PLUTECKA
08:00 - 18:15 #5689 - LS03-047 Image-Based Analysis of a Human Neurosphere Stem Cell Model for the Evaluation of Potential Neurotoxicants.
LS03-047 Image-Based Analysis of a Human Neurosphere Stem Cell Model for the Evaluation of Potential Neurotoxicants.

Developmental neurotoxicity (DNT) of environmental chemicals has long been identified as a threat to the health of the human population, as the developing nervous system is particularly susceptible to toxicant exposure. The resulting neurological deficits can have long-term effects on families and society both financially and emotionally. Current DNT testing guidelines involve the use of animal models; primarily rodents. The testing strategy incorporates large numbers of animals, which can be extremely time- and cost-intensive; particularly due to the backlog of chemicals needing to be tested (Lein et al., 2005). This demand, in addition to current and future proposed regulations on the use of animals for testing makes it imperative that new models be found to reduce animal experimentation while providing a suitable method to test new chemicals.

Three-dimensional cell models, which incorporate human neural stem cells (hNSCs) aggregated into neurospheres, have been proposed as a viable alternative for DNT testing. The in vitro system has the ability to recapitulate the processes of brain development, including proliferation, migration, differentiation and apoptosis (Salma et al., 2015). Inclusion of human cells, as opposed to murine, also meets recommendations to circumvent the drawback of species differences between in vivo testing and actual exposure effects.

Here we will demonstrate the use of a 3D neurosphere model, composed of hNSCs, to conduct toxicity testing of potential neurotoxicants. A spheroid microplate was used to create and maintain cells in the 3D model. 3D neurosphere proliferation, multipotency, along with the continued capacity to differentiate into neurons, astrocytes, and oligodendrocytes was initially validated. Neurotoxicity testing was then performed using neurospheres maintained in the 3D spheroid plate. Detection of induced levels of oxidative stress, apoptotic, and necrotic activity within treated neurospheres, compared to negative control spheres, was evaluated. Monitoring of cell proliferation, differentiation, multipotency and experimental testing was performed using a novel cell imaging multi-mode reader. 


Brad LARSON, Hilary SHERMAN, Hannah GITSCHIER, Alexandra WOLFF, Wini LUTY, Damien BRECHET (Winooski, USA)
08:00 - 18:15 #5781 - LS03-048 Cytochemical localization of pectinases and cellulases in developing laticifers of Maclura tinctoria and Ficus montana (Moraceae).
LS03-048 Cytochemical localization of pectinases and cellulases in developing laticifers of Maclura tinctoria and Ficus montana (Moraceae).

Laticifers are latex-producing structures which occur in some plant families. In Moraceae (the mulberry family), laticifers are of the non-articulated and branched type and are distributed throughout the whole plant, i.e., they consist of a very long single cell that branches, forming a continuous network throughout the plant tissues. Given that the laticifer wall of Moraceae species is under continuing expansion and consists mainly of pectin and cellulose, the action of pectinases and cellulases must be of great importance in the laticifer development. Thus, this work aimed to verify the subcellular producing sites of pectinases and cellulases and their role in the laticifer development in two Moraceae species, using as a tool cytochemical analysis associated with transmission electron microscopy. Reproductive meristems of Maclura tinctoria (L.) D.Don ex Steud. and Ficus montana Burm.f. were collected, fixed in Karnovsky's solution and stored in 0.1 M phosphate buffer (pH 7.2) at 4°C. For pectinase detection the samples were incubated in 0.1 M sodium acetate buffer (pH 5.0) containing 0.5% of pectin for 20 min. at room temperature. To detect cellulase the samples were incubated in 0.05 M citrate buffer (pH 4.8) containing 0.02% of carboxymethylcellulose for 10 min. at room temperature. The materials from both treatments were transferred to Benedict's reagent heated to 80°C for 10 min., and then washed in 0.1 M phosphate buffer and postfixed in 1% osmium tetroxide for 2 h at 4°C. The samples were washed in distilled water, dehydrated, embedded in Araldite resin and sectioned at ca. 70 nm thick. The obtained sections were stained with 2% uranyl acetate for 25 min and Reynolds lead citrate for 5 min. and observed in a Jeol 100CX II transmission electron microscope. The cytolocalization controls of pectinases and cellulases followed the same methods but without the incubation of the samples in pectin and carboxymethylcellulose, respectively. Pectinases and cellulases were found in regions of the laticifer wall close to the middle lamella in both species (Figures 1 and 2). The pectinases should act on the dissolution of the middle lamella, enabling intrusive apical growth of laticifers through the plant tissues. The occurrence of pectinases is expected for the development of non-articulated laticifers but it is the first record of cellulase presence in this type of laticifer. Cellulases have been reported in laticifers of the articulated type, in which they operate in the degradation of the end cell walls. In the case of the non-articulated laticifers like those of Moraceae, it is likely that cellulases act on the partial disassembly of cellulosic components of the wall near to the middle lamella facilitating the intrusive growth. Both pectinases and cellulases are synthesized in the endoplasmic reticulum (Figure 3) and transported to the cell wall by exocytosis or stored in the vacuole (Figure 4) of Maclura tinctoria and Ficus montana. The production of these enzymes in the reticulum has been recorded for the secretory cavities of Citrus; however, this is the first study in which were identified the organelles involved in the synthesis of pectinases and cellulases in laticifers.

 

Acknowledgments: São Paulo Research Foundation – Fapesp (process numbers: 2013/21794-5 and 2014/07453-3).


Cristina MARINHO (Ribeirão Preto, Brazil), Simone TEIXEIRA
08:00 - 18:15 #5883 - LS03-049 A potential therapeutic effects of BMN673, a novel PARP inhibitor, on Triple Negative Breast Cancer.
LS03-049 A potential therapeutic effects of BMN673, a novel PARP inhibitor, on Triple Negative Breast Cancer.

Triple negative breast cancer (TNBC) is the most aggressive and lethal subtype of breast cancer due to a higher rate of early recurrence, distant metastases and also heterogeneity in the molecular levels. Thus, there is a urgent need for effective therapies. In the recent years, PARP inhibitors have drawn considerable attention for especially BRCA-associated sporadic TNBC patients. In the present study, we aimed to determine the cytotoxic and apoptotic effects of BMN 673, which is a novel and highly potent PARP inhibitor,  on TNBC cell line.

Triple-negative BRCA1-defective HCC1937 breast cancer cell line was treated with BMN673 and the cytoxoxicity effects was evaluated by WST-1 analysis. The apoptotic effects was evaluated using Annexin V-propidium iodide (PI) and cell cycle analysis. The double stained with acridine orange/ethidium bromide of these cells was observed under the fluorescence microscope.

Initial cytotoxicity screening showed that BMN673 displayed the anti-proliferative effect, with in time (6-12 days) and dose-dependent (0.01, 0.1, 1 and 10 nM) (p<0.05). The maximum inhibition rate was measured 19.54%, 24.21%, 49.91%  and 58.0% at 0.01, 0.1, 1 and 10 nM of BMN673 at 12 days, respectively (p<0.05). There was an increase of apoptotic cell death and cell cycle progression in all concentrations compared to the untreated control. Treatment with doses of 0.01, 0.1, 1 and 10 nM BMN673 significantly induced total apoptotic cells (6.2%, 23.45%, 47.95% and 61.28%, respectively) and a significant block at the G2/M phase. Additionally, we observed a loss of membrane integrity, chromatin condensation and increasing vacuole formation in HCC1937 cells when treated with the maximum concentration of BMN673.

In conlusion, this study has revealed that BMN673 inhibits cell proliferation and  induces cell cycle progression and apoptosis within the minimum concentration. Thus, BMN673 could represent a potentially therapeutic strategy for especially, BRCA-defective TNBC.


Gamze GUNEY ESKILER (Bursa, Turkey), Gulsah CECENER, Unal EGELI, Berrin TUNCA
08:00 - 18:15 #6179 - LS03-050 Metformin ameliorates testicular damage in diabetes and prostate cancer model.
LS03-050 Metformin ameliorates testicular damage in diabetes and prostate cancer model.

Diabetes is a chronic metabolic disease which lasts for the whole life. Cancer is the second cause of death in the world, according to World Health Organization data. Association of diabetes with cancer is a major health concern. Diabetes and cancer is a serious metabolic disorder with many functional and structural complications as well as having a significant impact both directly and indirectly on all systems (1). Prostate cancer has a great importance for male morbidity and mortality observed both in our country and also in the globe. It is at the second rank among cancer-related mortality cases. Prostate cancer can be determined as the alteration of the balance between cell proliferation and cell death in the prostate which causes a malign increase of the organ volume. Dunning prostate cancer model is formed by subcutaneous injection of strongly metastatic MAT-Lylu cells in a Copenhagen rats (2). Experimental diabetes model is widely induced by streptozotocin (STZ). Metformin is a drug that used for the treatment of type 2 diabetes. Besides, the studies related to reduce the risk of cancer of the metformin have recently drawn attention (3). The aim of this study is to investigate the role of metformin on testicular damage in diabetic+prostate cancer model.

Male Copenhagen rats were divided into three groups: 1) Control group: % 0.9 physiological saline was received during 14 days, 2) Diabetic+ cancer group: 2x104 Mat-LyLu cells were received after injection of 65 mg/kg STZ. 3) Diabetic+ cancer+metformin group: metformin was received 250 mg/kg during experimental period, following injection of STZ and inocculation of Mat-LyLu cells. At the end of the experimental period (day 14) testes tissues were taken. Tissues were stained with hematoxylin and eosin and periodic acid-Schiff reaction and determined the degree of histopathological damage. The degree of histopathological damage in the seminiferous tubules were evaluated as: normal, regressive, degenerative and atrophic (4). Apoptotic cells in testes tissue were detected with TUNEL reaction. Biochemically, serum glucose, glutathione, malondialdehyde, prostate specific antigen levels and testis protein carbonyl levels and myeloperoxidase, xanthine oxidase activities were determined.

Testes tissue of the control group presented a normal testicular morphology and regular seminiferous tubules. The histopathological damage score of testicular tissue was significantly increased in diabetic+cancer group compared to control group. The number of regressive and degenerative tubules in diabetic+cancer+metformin group was decreased by metformin treatment. TUNEL positive cells were observed in all groups. The total number of TUNEL positive cells throughout the testes was increased in diabetic+cancer+metformin group compared to diabetic+cancer group. According to biochemical data, serum glutathione levels were decreased in diabetic+cancer group compared to control group. Serum glucose, malondialdehyde, prostate specific antigen levels, and testis protein carbonyl levels and myeloperoxidase and xanthine oxidase activities were increased in diabetic+cancer group. Treatment with metformin reversed these effects.

It was indicated that metformin has been shown to be protective against testicular damage in diabetic male rats (5). It was has been reported that metformin was used as protective agent to prevent high-fat diet induced testicular damage. Metformin inhibits the growth of cancer cell lines which suggests that it also has an inhibitory effect on cancer progression (6). Our results suggest that administration of metformin prevents the testicular damage by ameliorating the oxidative stress parameters and tissue damage. In conclusion, we can say that metformin has a potential protective effect on the testes tissue in diabetes and Dunning prostate cancer model.

Acknowledgements

This study was supported by a Research Found from Istanbul University, Project no: 48418.

References

1. Giovannucci et al. CA Cancer J Clin. 2010, 60 (4): 207–21.

2. Michaud et al. Ther Adv Urol 2015, 7(6):378-87.

3. Tao et al.. Int J Mol Sci 2013, 14: 24603-24618.

4. Hess et al. J Androl 1988, 9: 327- 342.

5. Mahmoud et al. J Vet Sci 2014, 9 (4): 277-284.

6. Sahra et al. Cancer Res 2010, 70: 2465–2475.


Pınar KOROGLU (İstanbul, Turkey), Omur KARABULUT BULAN, Ismet Burcu TURKYILMAZ, Ilknur BUGAN, Seyhan ALTUN, Refiye YANARDAG
08:00 - 18:15 #6289 - LS03-051 Specificity of pork masseter muscle metabolic and contractile type identified by histology.
LS03-051 Specificity of pork masseter muscle metabolic and contractile type identified by histology.

Skeletal muscle is usually composed of four types of muscle cells (I, IIA, IIX, IIB) varying on their speed of contraction (slow: type I; fast: type II) and their metabolism pathway of glycogen (oxidative: type I and IIA; glycolytic: Type IIX and IIB). Depending on the anatomical position and muscle function, the proportion of these different muscle fiber types is variable. The different fibers types are identified longstanding by histoenzymology. ATPase activity in type I fibers is labile at alkali pH and resistant at acidic pH. In contrast, the ATPase activity of type II fibers is alkali resistant and acid labile (For review, see Pette & Staron, 1990, 2000, Schiaffino & Reggiani, 2011). The molecular basis of this typology resides in the polymorphism of myosin heavy chains (MyHC). The use of monoclonal antibodies against MyHC isoforms allows to identify precisely the type I IIA IIX and IIB fibers and hybrid fibers expressing simultaneously different isoforms of myosin (Schiaffino & Reggiani, 2011).

Our goal was to characterise the fiber type of porcine masseter muscle.

Materiel and methodes

Ten 6 months old pigs (105-115 Kg) were slaughtered in a commercial abattoir and masseter muscles (jaw) were extracted from the head at 30 min postmortem. Muscle sample (1X1X1.5 cm) were frozen in cooled isopentane (−160 °C). Serial cross-sections (10 µm thick, cryostat Microm, HM 560) were collected on glass. Fiber types were identified by histoenzymology both by revealing ATPase activity after acidic incubation, and SDH activity that reflect oxidative metabolism. Fiber types were also identified by immunohistofluorescence using three monoclonal antibodies specific to MyHC isoform (BAD5 specific for type I, S58 H2 all except type IIa, and BF35 all types except type IIb and IIx) (Schiaffino & Reggiani, 2011). Histological sections were observed on a photonic microscope (Olympus BX 61) coupled to a high resolution digital camera (Olympus DP 71) and the Cell F software. The percentage of each fiber type was calculated according to Meunier et al. (2010) using the image analysis Visilog 6.7 Professional Software.

Results and discussion

ATPase histoenzymology (Fig.1) revealed only type I (30.6%) and IIA (69.4%) oxidative fibers according to Ström & Holm, 1997. Immunohistochemistry (Fig.2) revealed that 17% of the masseter fibers are hybrid fibers containing two MyHC isoforms IIa and IIx (Fig.3). These hybrid fibers are generally a transitional step to move from a pure type to another (Schiaffino & Reggiani, 2011). In this study, no pure type IIX is highlighted, suggesting that the transition is not completed or that the IIA-IIX hybrids are the final stage of transition in this muscle.

For a given muscle, fiber type evolves mainly with physical activity and age of the animals. In our case, pigs were reared in a building without noticeable change in their physical activity. The pigs were slaughtered at the age of 6 months, which corresponds to a period of entry into sexual maturity. It is possible that the fibers are in transition classes, however, no study has highlighted the presence of IIX fibers in pork masseter, suggesting that the hybrid could be permanent. A large proportion of IIA-IIX fibers (74 %) were found in rat masseter but several pure glycolytic fibers were detected (Pette & Staron, 1990) and unique HCIIm isoforms were identified in primate and carnivore masseter muscles (Pette & Staron, 1990, 2000). All these data highlight the special feature of masseter compared to other skeletal muscles.  

Conclusion

The use of monoclonal antibodies revealed the presence of a high proportion of hybrid fibers IIA-IIX in pork masseter and did not allow the detection of any pure type IIX. These results suggest a specificity of porcine masseter muscle in which the hybrid type IIA-IIX would not be a transitory state.

References

Pette, D., & Staron, R. S. (2000). Microscopy Research and Technique. 50, 500–509.

Pette, D. & Staron, R. S. (1990). Reviews in Physiology, Biochemistry and Pharmacology. 116, 2-76.

Ström, D. & Holm, S. (1997). Journal of oral rehabilitation. 24, 389-400.

Schiaffino, S. & Reggiani, C. (2011). Physiol. Rev. 91, 1447–1531.

Meunier, B., Picard, B., Astruc, T., Labas, R. (2010). Histochem. Cell. Biol. 134, 307-317.


Annie VÉNIEN (ST GENES CHAMPANELLE), Jeanne DANON, Olivier LOISON, Thierry ASTRUC
08:00 - 18:15 #6379 - LS03-052 The Investigation of Effect of Carvacrol on Biofilm positive Salmonella spp and Listeria monocytogenes isolates.
LS03-052 The Investigation of Effect of Carvacrol on Biofilm positive Salmonella spp and Listeria monocytogenes isolates.

The Investigation of Effect of Carvacrol on Biofilm positive Salmonella spp and Listeria monocytogenes isolates

 

İlknur  Dağ*,  BükayYenice Gürsu, Gökhan Dikmen,

1 Eskişehir Osmangazi University; Central Research Laboratory Application and Research Center (ARUM)  26480, Odunpazarı, Eskişehir-Turkey

idag280@gmail.com

 

Salmonella spp. and Listeria monocytogenes are important pathogenic bacteria, which are transmitted by food. It is known that both microorganisms may produce biofilm on biotic or abiotic surfaces. An adherence of pathogenic microorganisms to food contact surfaces and biofilm formation is dangerous with respect to food security. Because biofilms provide several advantages to their members including such as protection from antibiotics, disinfectans and chemicals.

Recently, alternative strategies or more effective agents exhibiting activity against biofilm-producing microorganisms are of great interest. Researchs focused on effects on plant materials and essential oils. It is reported that the Carvacrol [2-methyl-5-(1-methylethyl)phenol] exhibited strong antimicrobial activity and it is one of the phenolic components of thyme. The aims of this study were (i) to investigate the biofilm existing of Salmonella ve L. monocytogenesis obtained from variety food samples, (ii) to extend the research to evalute the antimicrobial activity of carvacrol on planctonic cells of biofilm positive Salmonella spp ve L. monocytogenesis strains by microbiological and electronmicroscopic methods.

Among the 603 food samples taken for analysis, a total of 6 samples were confirmed positive L. monocytogenes; 8 samples were confirmed positive for Salmonella spp. Isolates were identified by standard microbiological procedures. Biofilm detection was evaluated by microtiter plate assay and tube method. In addition, biofilm production and developments were also investigated on granit surfaces by Scanning electron microscope. All tested Salmonella spp and L. monocytogenes isolates produced biofilm. The minimum inhibitory concentration (MIC) of carvacrol was determined using the broth microdilution method according to M7-A8 of the Clinical Laboratory Standards Institute. Carvacrol was introduced into Mueller Hinton Broth at a concentration of 0.0015, 0.003%, 0.006%, 0.013%, 0.025%, 0.05%, 0.1%, 0.2%, 0.4% and 0.8% (vol/vol) to determine the minimum inhibitory concentration (MIC) and the maximal tolerated concentration (MTC) for each isolates evaluated. Ampicillin was used as a standard drug against E. coli ATCC 25922. MIC results showed a MIC ⩽ 0.025% (vol/vol) for all isolates tested. For Scanning and Transmission electron microscopic studies, isolates were also exposured to the carvacrol at concentrations of  2xMIC, MIC and ½ MIC and results were compared with the control. According to our results, carvacrol showed a high antibacterial potential with very low MIC values on planktonic cells of Salmonella spp and L. monocytogenes. Electronmicroscopically, no growth was observed for the MIC value and a  concentrations higher; cellular damage was also determined at sub MIC concentrations.

Key words: Carvacrol, Salmonella spp, Listeria monocytogenesis, electron microscope

Acknowledgment

This work was supported by a grant from Eskisehir Osmangazi University (Project number  2015-910).


Ilknur DAG (Eskisehir, Turkey), Bukay YENICE GURSU, Gokhan DIKMEN
08:00 - 18:15 #6463 - LS03-053 OKA-induced tau hyperphosphorylation decrease BDNF protein levels in primary cortical neuron cultures.
LS03-053 OKA-induced tau hyperphosphorylation decrease BDNF protein levels in primary cortical neuron cultures.

Intracellular aggregation of abnormally phosphorylated tau in neurofibrillary tangles (NFTs) is a major neuropathological hallmark of Tauopathies such as Alzheimer’s disease. Tau phosphorylation is controlled by the homeostasis of glycogen synthase kinase-3β (GSK-3β) and protein phosphatase-2A (PP2A). Okadaic acid (OKA) is a potent inhibitor of PP2A, leading to abnormal tau phosphorylation. Brain-derived neurotrophic factor (BDNF) is a member of the neurotrophin family and is selectively downregulated in AD brain. In this study, we investigated the effects of tau phosphorylation on secreted and cellular BDNF levels in primary cortical neurons. Primary cortical neurons were prepared from embryonic day 16 (E16) Sprague-Dawley rat embryos. After 7 days in vitro, neurons were treated with 25 nM OKA for inducing tau hyperphosphorylation. Tau phosphorylation was assessed by Western blot using antibody against phospho-Thr231 and non-phosphorylated tau protein was detected with the Tau-1 antibody. Levels of BDNF secreted to the culture medium were determined by ELISA at the 4th, 8th and 24th hours of treatment. Cellular localization and the protein expression of BNDF were determined by immunofluorescent labeling and fluorescent intensity measurements.

Our results show that after 8 hours of OKA treatment, tau phosphorylation at Thr231 increased, whereas Tau-1 signal decreased (p<0.0001) Compared with the control groups, BDNF levels in the OKA treated group were significantly lower after 4 and 24 hours of treatment (p<0.0001) but were not significantly different at 8 hours of treatment (p>0.05). While prominent BDNF immunoreactivity was seen in cytoplasm and neurites of the neurons in control groups, BDNF immunoreactivity significantly decreased in the OKA treated group (p<0.0001) and this attenuation was significant especially at neurites.

Our results suggested that decreased BDNF protein levels might depend on the defects in axonal transport as a result of disrupted microtubule structure caused by tau hyperphosphorylation.


İrem L. ATASOY, Selma YILMAZER (ISTANBUL, Turkey), Erdinç DURSUN, Derya METİN ARMAĞAN, Melek ÖZTÜRK, Duygu GEZEN-AK
08:00 - 18:15 #6631 - LS03-054 Ultracytochemical detection of iron in plant tissues by TEM.
LS03-054 Ultracytochemical detection of iron in plant tissues by TEM.

Iron (Fe) is an essential micronutrient operating in several important processes. It is found in high concentrations in mangrove sediment, and in contaminated areas, the level of this element may increase substantially. Mangrove vascular plants have strategies to deal with the high concentration of this metal, involving Fe-plaque formation on the surface of the root, metal retention in the epidermis and endoderm cells, and compartmentalization in the vacuoles. Some methods have been used for the intracellular localization of iron, such as electron spectroscopic imaging and energy-dispersive X-ray analysis. Perl’s reagent has been traditionally used to detect iron in tissue plants by light microscopy; however, its use in ultrastructural studies has been limited to animal cells. This study aimed to assess whether the Perl’s reagent can be used successfully in plant material under TEM. Samples of Rhizophora mangle L. (Rhizophoraceae) mature leaves were incubated for 24 h at 4oC in a fixative solution containing 3% glutaraldehyde in 0.1 M cacodylate buffer (pH 7.3). Then, materials were immersed for 30 min at 25oC in Perl’s reagent (1% potassium ferrocyanide and 2% HCl, 1v/1v). Samples were rinsed using a sucrose-cacodylate buffer, postfixed for 1 h at 4oC with 1% OsO4 (0.1 M cacodylate buffer pH 7.3), dehydrated in alcohol series and propylene oxide, and embedded in Spurr’s resin. Thin sections (80 nm) were cut with a diamond knife, and stained with uranyl acetate and lead citrate, and viewed with a Tecnai Spirit TEM. Sections without contrast were analyzed for enhanced identification of the reaction. Dense iron deposits, cuboid or irregular in shape, were detected in the peripheral cytoplasm and in cell walls (Fig. 1). The use of this method was able to show intracellular sites of iron compartmentalization in plant cells, and indicates the apoplastic and symplastic routes for the iron movement throughout the leaf tissues.

Acknowledgements: We thank FAPESP (Proc. 2014/06870-0) for financial support; CAPES for the PhD Fellowship by the first author;  CNPq (Proc. 401053/2016-4 ) for the grant to S.R. Machado, and the Electron Microscopy Centre (CME) IBB, UNESP and its technicians for  lab assistance.

 


Silvia MACHADO (Botucatu, Sao Paulo state, Brazil), Hiulana ARRIVABENE, Camilla MILANEZ
08:00 - 18:15 #6915 - LS03-055 In vivo calibration of a ratiometric sensor for pH and anions concentration in Arabidopsis cells.
LS03-055 In vivo calibration of a ratiometric sensor for pH and anions concentration in Arabidopsis cells.

In plants, ions fluxes are involved in several physiological processes such as nutrient uptake, signaling pathways, cell elongation and stomata movements. However, little information is available about the intracellular anionic concentrations and anion fluxes among plant cell compartments. In the last years some promising anion concentration sensors have been developed (ClopHensor, Arosio et al. 2010) but have never been used in plant cells. The ClopHensor sensor (Figure 1) is a genetically encoded non-FRET based sensor developed in mammals cells. It is based on a modified GFP (E²GFP) that is sensitive to chloride and nitrate concentration, and coupled to a DsRed. The DsRed fluorescent protein is used as an internal control for the expression of the construction, because its fluorescence is insensitive to anions concentration and pH, and clearly separated in term of spectral properties. The E²GFP fluorescent protein, excited at 488 nm, is sensitive to pH and anions concentration. But when it excited at 458 nm, the fluorescent signal is only sensitive to anion concentration. Thus, we are able to obtain simultaneously the intracellular pH and anion concentration maps in the cytosol by calculating ratios of fluorescence emission intensity. To do that we used a scanning confocal microscope equipped with an argon laser which provides these laser lines.

In the present collaboration work, Arabidopsis thaliana transgenic lines stably expressing ClopHensor in the cytosol were generated by Elsa Demes (phD student). We are currently performing the in vivo characterization of the ClopHensor sensor in Arabidopsis cells. Indeed, we are establishing the relationship between the fluorescent signal, and pH or anion concentration values, by generating in cellulo calibration curves. This work will lead to the creation of both pH and anions maps to study those parameters at the cell level.


Laetitia BESSE (GIF SUR YVETTE CEDEX), Elsa DEMES, Alexis DE ANGELI, Béatrice SATIAT-JEUNEMAÎTRE
08:00 - 18:15 #6285 - LS04-056 Cell surface properties of probiotic Escherichia coli strains.
LS04-056 Cell surface properties of probiotic Escherichia coli strains.

Background. Beneficial effects of probiotic Nissle 1917 on the host health have been shown in a range of investigations(1). During our previous studies the positive effects of E. coli 2-1 on human and animals organism have also been described(2), and the liquid-crystal state of cell walls from the E. coli cells was shown by the x-ray diffraction method under the small and large angles (Fig. 1).

Taking into account that solid-liquid interfaces could have a considerable effect on host bacterial physiology(3) we aimed to investigate the cell surface hydrophobicities of probiotic strains E. coli M-17 and E. coli 2-1 strains.

Methods. The probiotic strains E. coli 2-1 from the probiotic formulation ASAP (Armenia) and E. coli M-17 from the probiotic formulation Colibacteron (Armenia) were used during these investigations. The twenty-four gut commensal E. coli strains from the four healthy volunteers were used as controls. The cell surface hydrophobicities of the E. coli strains were determined by a MATH test according to Koss and coauthors(4 ), and the crystallization levels of cell walls (35 % water suspensions) from these strains were assessed semi-quantitatively at 25'C with polarizing microscopy MIN-8 with Bertrán's prism and increase x 300. The determination of the sizes of structural units carried out by a standard way with the help an eyepiece - a micrometer; the +150W halogen lamp was a light source.

Results. Comparative MATH test experiments show that both investigated probiotic strains’ cells surfaces are more hydrophobic than the bacterial surfaces of strains from the normal gut microbiota. At the same time, the low crystallization levels of cell wall proteins for probiotic E. coli strains were described. Most probably, the comparative hydrophobic structure of bacterial membranes from probiotic strains regulates “probiotic-characteristics” of E. coli M-17 and E. coli 2-1 strains.

References.

[1]. Sylvia K, et al. Ed. B. A. McCormick.Infection and Immunity 82.5 (2014): 1801–1812. PMC. Web. 19 Mar. 2016.

[2]. Balayan M, et al. International Journal of Biological and Medical Sciences. 2010 (68), 670-675.

[3]. De Wouters T, et al.2015; 10(8):e0136437. Epub 2015 Aug 21.

[4]. Kos, et al. J. Appl. Microbiol. 2003;94:981-987.


Astghik PEPOYAN (Yerevan, Armenia), Marine BALAYAN, Anahit MANVELYAN, Marianna ISAJANYAN, Vardan TSATURYAN, Margarita HOVNANYAN, Karlen HOVNANYAN
08:00 - 18:15 #6594 - LS04-057 Structural characterization of the human potassium channel Kir 2.1.
LS04-057 Structural characterization of the human potassium channel Kir 2.1.

Inwardly-rectifying potassium (Kir) channels regulate membrane electrical excitability and K+ transport in many cell types where they control such diverse processes as heart rate, vascular tone, insulin secretion and salt/fluid balance. The physiological importance of eukaryotic Kir channels is highlighted by the fact that genetically-inherited defects in Kir channels are responsible for a number of human diseases such as in Andersen’s syndrome (Kir2.1), Bartter syndrome (Kir1.1), and neonatal diabetes (Kir6.2). To date, the available treatment is unfortunately not rational but rather empirical and this is mostly due to the lack of knowledge about atomic structure of these channels.

To elucidate how channel function becomes defective in the disease state requires a detailed understanding of channel structure in both the open and closed states. We have reported the structure of a homologous bacterian KirBac3.1 potassium channel with an open bundle crossing indicating a mechanism of channel gating determined by X-ray crystallography at 3Å resolution. In this model, the rotational twist of the cytoplasmic domain is coupled to opening of the bundle-crossing gate via a network of inter- and intra-subunit interactions [1,2]. In addition, we have also used EM analysis of 2D crystals of the same Kirbac channel trapped in an open state and compared these results with the 3D structure [3].   

We are now focusing in characterizing the structural determinants correlated to malfunctioning behind Andersen mutants forms. We are therefore studying the structure of the human potassium channel kir2.1.The full-length human Kir2.1 (50 kDa the monomer, 200kDa the tetrameric functional form) was over expressed in yeast Pichia Pastoris and subjected to various method for its characterization.

Here we show preliminary results on the expression, the purification and the imaging of negatively stained isolated kir 2.1 in detergent. The particles have an averaged size of 12 nm consistent with a tetrameric form of the native channel. The oligomeric organisation is supported by native gel electrophoresis and Dynamic Light Scattering measurements.

Our results will hopefully contribute to uncover the mechanism of clinically-relevant disease-causing mutations on the structure, dynamics, and function of kir2.1 potassium channels and at investigating the potential of pharmaceutical correctors.

References

[1] Bavro VN, De Zorzi R, Schmidt MR, Muniz JR, Zubcevic L, Sansom MS, Vénien-Bryan C, Tucker SJ  Nature Structural & Molecular Biology Structure of a KirBac potassium channel with an open bundle crossing indicates a mechanism of channel gating 7, 158–163 (2012).

[2] Zubcevic L, Bavro VN, Muniz JR, Schmidt MR, Wang S, De Zorzi R, Venien-Bryan C, Sansom MS, Nichols CG, Tucker SJ. J Biol Chem. 2014 Jan 3;289(1):143-51. Control of KirBac3.1 Potassium Channel Gating at the Interface between Cytoplasmic Domains.

 [3] De Zorzi R., Nicholson WV, Guigner JM, Erne-Brand F, Vénien- Bryan C Growth of large and highly ordered 2D crystals of a K+ channel, structural role of lipidic environement. Biophys J. 2013;105(2):398-408


Manuela DEZI, Renaud WAGNER, Said BENDAHHOU, Catherine VENIEN-BRYAN (Paris)
08:00 - 18:15 #6707 - LS04-058 Short time of ZnO nanoparticles uptake induces DNA damage and specific mitochondrial degeneration in human colon carcinoma cells.
LS04-058 Short time of ZnO nanoparticles uptake induces DNA damage and specific mitochondrial degeneration in human colon carcinoma cells.

Thanks to their unique physico-chemical properties, ZnO nanoparticles are widely used in consumer and industrial products, due to their higher chemical reactivity, stronger oxidation and corrosion resistance, antimicrobial properties, as compared with larger micro-sized counterparts (Madhumitha et al., 2016). Recent studies have shown that ZnO nanoparticles can be promising candidates for biomedical applications and therapeutic interventions, and also successful as drug carrier and in targeted gene delivery (Peng et al., 2015; Velmurugan et al.,2015). In our previous in vitro study, ZnO nanoparticles showed to induce oxidative stress in human colon carcinoma cells (LoVo), resulting in significant decrease of cell viability (De Berardis et al., 2010).

In order to gain insight into the mechanism of action at subcellular level, aim of the present investigation was to carry out an ultrastructural study by transmission electron microscopy (TEM) on the subcellular localization of ZnO nanoparticles and a semi-quantitative analysis of cellular uptake at multiple time points (from a few minutes up to 24 h of exposure). Electron microscopy observations of ZnO treated cells revealed two different mechanisms of cellular uptake, passive diffusion and endocytosis. Control cells show a mitochondria and nuclear normal shape (Fig. 1A). Small particles entry by passive diffusion crossing the plasma membrane without altering its structure (30 min of treatment, Fig. 1B; arrow indicates the nanoparticle in the cell membrane area). After 1h of treatment  ZnO nanoparticles are already visible in the mitochondria cristae (Fig. 1C). The induction of the apoptosis is clearly showed in Fig. 1D, after 24 h of treatment. Quantitative analysis of cell death has been performed by flow cytometry.

We also evaluated the intracellular ions release from ZnO nanoparticles, their genotoxic potential by determining 7,8-dihydro-8-oxo-deoxyguanosine (8-oxodG) levels, and the expression of phosphorylated histone H2AX (γ-H2AX). The simultaneous presence of ZnO nanoparticles and Zn2+ ions in the LoVo cells determined the formation of reactive oxygen species at the mitochondrial and nuclear level, inducing severe DNA damage.

In conclusion, our observations showed that ZnO nanoparticles entered LoVo cells  by either passive diffusion or endocytosis or  both, depending on the agglomeration state of the nanomaterial. ZnO nanoparticles coming into contact with acid pH of lysosomes altered organelles structure, resulting in the release of Zn2+ ions. Taken together, the results of this study provide the evidence that damage induced by ZnO nanoparticles in LoVo cells derives from a combined action between intact nanoparticles and Zn2+ ions, leading new insights into their toxicity.

References

Madhumitha, G.,et al., 2016. Biotechnological aspects of ZnO nanoparticles: overview on synthesis and its applications. Appl. Microbiol. Biotechnol. 100, 571-581.

Peng, H., et al., 2015. ultifunctional β-CD-modified Fe3O4@ZnO:Er(3+),Yb(3+) nanocarrier for antitumor drug delivery and microwave-triggered drug release.Mater. Sci. Eng. C Mater. Biol. Appl. 46, 253-263.

Velmurugan, P., et al., 2015. Phytofabrication of bioinspired zinc oxide nanocrystals for biomedical application. Artif. Cells Nanomed. Biotechnol. 27, 1-8.

De Berardis, B., et al., 2010. Exposure to ZnO nanoparticles induces oxidative stress and cytotoxicity in human Ccolon carcinoma cells. Toxicol. Appl. Pharmacol.  246, 116-127.


Maria CONDELLO, Stefania MESCHINI (Rome, Italy), Barbara DE BERARDIS, Maria Grazia AMMENDOLIA, Giancarlo CONDELLO, Evelin PELLEGRINI
08:00 - 18:15 #5485 - LS05-060 Apical chitinous matrix and basal lamina - the ultrastructure and formation of two distinct extracellular matrices of crustacean hindgut cells.
LS05-060 Apical chitinous matrix and basal lamina - the ultrastructure and formation of two distinct extracellular matrices of crustacean hindgut cells.

Ectodermally derived gut and epidermal cells in crustaceans are covered by cuticle, a chitinous apical extracellular matrix, and at the opposite side they are underlined by a basal lamina. Thus, the same cell performs synthesis and spatiotemporal control of elaboration of two extracellular matrices that differ in ultrastructure, composition and functions. Differentiation of the extracellular matrix in epithelial tissues is an integrative part of the establishment and maintenance of the characteristic apicobasal polarized cell architecture. We present here the ultrastructural description of the hindgut cells' apical matrix differentiation during embryonic and larval development of crustacean Porcellio scaber. In addition, in the same developmental stages the ultrastructure of basal lamina was described.

The ultrastructural hallmarks of the hindgut cells and their extracellular matrices (ECM) in adults are: (i) apical ECM is a chitinous cuticle, consisting of distinct horizontal layers - electron dense epicuticle and electron lucent procuticle (Fig. 1), (ii) extensive apical and basal plasma membrane infoldings, forming prominent membrane labyrinths, (iii) basal lamina that is forming an extensive interface surface to hemolymph space (Fig. 2). The ultrastructure of cuticle differs in the two anatomic regions of the hindgut, namely the anterior chamber and the papillate region. In the anterior chamber the epicuticle is much thinner than procuticle and lamellae are discernible in the procuticle due to helicoidally arranged chitin protein fibers (Fig. 1). In papillate region epicuticle and procuticle are of approximately equal thicknesses and no lamellae could be discerned in the procuticle.

Differentiation of the hindgut cuticular matrix during embryonic and larval development involves a sequential formation and shedding of several apical matrices, which gradually display ultrastructural features characteristic for adults. The outline of the pre-cuticluar apical matrix in embryos is ruffled and consists of homogenous lucent material and a distal electron dense lamina. In late embryos of stage 18 the first deposition of the apical cuticle was evidenced. In marsupial larvae the cuticle follows the outline of apical hindgut surface and is already differentiated into thin electron dense epicuticle and thicker electron lucent procuticle. In the epicuticle a trilayered surface lamina and electron dense material beneath are discernible (Fig. 3). The procuticle is homogenous along the whole length of the hindgut and non-lamellate as is characteristic in anterior chamber of adults. The basal side of the hindgut epithelium of marsupial larvae is in contact with basal lamina (Fig. 4) exhibiting fibrillary structure in certain section profiles.


Urban BOGATAJ (Ljubljana, Slovenia), Polona MRAK, Jasna ŠTRUS, Nada ŽNIDARŠIČ
08:00 - 18:15 #5971 - LS05-061 SIRTUIN 1 DOWNREGULATION EXACERBATES FIBROSIS AND INFLAMMATION IN OBESE MICE LIVER.
LS05-061 SIRTUIN 1 DOWNREGULATION EXACERBATES FIBROSIS AND INFLAMMATION IN OBESE MICE LIVER.

Non-alcoholic fatty liver (NAFLD) occurs as simple hepato-steatosis and its evolution into severe non-alcoholic steatohepatitis (NASH) is strictly connected to obesity, but the pathogenesis is still obscure. Recently, a multiple hit theory suggested that from gut and adipose tissue different adipokines and inflammatory markers influenced the liver where steatosis, collagen deposition and inflammation might occur. Sirtuin 1 (Sirt1) is a NAD-dependent enzyme involved in longevity and in the regulation of multiple cellular functions and metabolism. Here we hypothesized that Sirt 1 down-regulation might exacerbate liver damage and mitochondrial lesions in hepatocytes in dietary-induced obesity in mice. To best analyse these events, we studied male C57BL/6 mice (WT) and Sirt 1 deficient heterozygous mice (HET) (by an established colony in CSIC generated from founders from Dr David Sinclair laboratory, Harvard University, Boston, USA). Animals housed in calorimetric rooms on a 12h: 12h light/dark cycle were placed for 16 wks, from 12 to 28 wks of age, on a standard rodent diet (8% fat -13.0 kJ/g) or on a high fat diet (HFAT- 35% lard-18.8kJ/g Tekland Research Diet–TD03584). Body weight was monitored at the beginning, at 3wks and at 16 wks before euthanasia. Livers were fixed in 4% paraformaldehyde overnight for histopathology, immunohistochemistry or in Karnowsky mixture (4% paraformaldehyde and 1% glutaraldehyde) then post-fixed in 1% osmium tetroxide for transmission electron microscopy analysis (TEM). By H&E, Masson trichrome and Sirius red staining at bright and polarized microscopy significant increase in steatosis and fibrosis in HET mice received HFAT diet vs WT fed HFAT diet were detected (Fig.1 and Fig.2). Interstitial collagen type I, type III, and basal membrane associated collagen type IV fibres were detected in pericentral vascular wall, intermediate lobular area and in thickened sinusoidal wall at light microscopy and at TEM (Fig.3). In contrast, WT or HET animals fed standard diet (as control groups) displayed negligible liver changes. Remarkably, HET mice fed HFAT diet showed abnormal giant mitochondria and activated Kupffer cells, strongly positive to Perls Prussian Blue iron staining, that were lacking in other groups. Finally, in HET obese mice myofibroblasts immersed in an abundant extracellular matrix and fibrous debris were observed by TEM (Fig.4). To highlight the crucial role of oxidative damage and caspase 1 complex in the progression to NASH, we analysed 4HNE and pro-caspase 1 expressions. Remarkably, strong 4HNE and moderate caspase 1 signals were present in pericentral and midzonal hepatocytes in HET HFAT diet mice but weak in WT HFAT diet group and absent in controls. All these data suggest that Sirt 1 is critical to limit fibrogenesis and inflammation associated to irreversible NASH in HFAT diet induced obesity in mice.

Acknowledgements

New Pet Food Italia Srl generously supports this study. Authors thank Mr G. Bozzoni and Mrs S. Castrezzati for expert TEM sample preparation and trimming.


Alessandra STACCHIOTTI (Brescia, Italy), Gaia FAVERO, Lorena GIUGNO, Antonio LAVAZZA, Cristina SANCHEZ-RAMOS, Ignacio PRIETO, Maria MONSALVE-PEREZ, Rita REZZANI
08:00 - 18:15 #6197 - LS05-062 Visualization of aligned collagen fibrils in cartilage by second harmonic generation microscopy.
LS05-062 Visualization of aligned collagen fibrils in cartilage by second harmonic generation microscopy.

Articular cartilage is located at the bone ends in synovial joints and enables smooth and pain-free joint motion. Its function is in large part determined by a network of collagen fibrils organized into zones and compartments, but little is known about how this organization is achieved in growing animals [1]. The articular cartilage develops superficially to a layer of temporary growth cartilage. The growth cartilage is responsible for the expansion of the bone ends and is replaced by bone during growth. The interface between the immature articular cartilage and the growth cartilage is histologically indistinguishable [2]. On the other hand, aligned collagen fibrils encapsulate cells in the articular cartilage but not in the growth cartilage, so the immature articular cartilage and the growth cartilage can be distinguished by locating these fibrils with transmission electron microscopy (TEM) in growing animals [1]. However, TEM requires extensive sample preparation and has limited field of view.

Second harmonic generation (SHG) microscopy is a promising image modality that is highly specific to collagen fibrils without any staining [3]. SHG is a coherent nonlinear optical process that is specific for non-centrosymmetric structures such as collagen fibrils and is characterized by frequency-doubling of light. In contrast to fluorescence, the SHG intensity and radiation direction is highly sensitive to the arrangement of collagen fibrils. In addition, as the arrangement of fibrils can vary at different length scales, this sensitiveness can depend on the size of the focal volume.

The aim of this study was to examine if the aligned fibrils encapsulating cells could be visualized by SHG microscopy without any staining in order to locate the immature articular cartilage of a growing animal.

The cartilage located at the distal femur of growing piglets was imaged by detecting the forward and backward directed SHG. Focusing objectives with different numerical aperture (NA), i.e. focal volume, were used to examine the collagen fibrils at different length scales. The results demonstrated that the ratio of forward to backward SHG was dependent on the NA and that the dependence on the NA varied with distance from the articular surface (Figure 1). The high forward to backward ratio at low NA near the articular surface (Figure 2) was interpreted to represent the aligned fibrils characterizing the articular cartilage. The gradual transition between the immature articular cartilage and the growth cartilage was therefore clearly visualized by SHG, and SHG microscopy is therefore a promising technique to study the development of the collagen matrix in articular cartilage.

[1] J. M. Clark, A. Norman, and H. Nötzli, J. Anat. 191, 215–221 (1997).

[2] R. Rivas and F. Shapiro, J Bone Jt Surg. 84, 85–100 (2002).

[3] G. Cox, E. Kable, A. Jones, I. Fraser, F. Manconi, and M. D. Gorrell, J. Struct. Biol. 141, 53–62 (2003)


Andreas FINNØY (Trondheim, Norway), Kristin OLSTAD, Magnus LILLEDAHL
08:00 - 18:15 #5082 - LS06-063 Nanoscopic localization of he components of the origin recognition complex during Trypanosome brucei cell cycle.
LS06-063 Nanoscopic localization of he components of the origin recognition complex during Trypanosome brucei cell cycle.

Origin recognition complex (ORC) architecture has only been explored in depth in the opisthokont supergroup of eukaryotes, which includes yeast and mammals, with little work in protists. The Kinetoplastida is a well-studied order of eukaryotic microbes and contains several important human parasites, such as Trypanosoma brucei. Genome sequencing of T. brucei identified only a single ORC-related protein – TbORC1/CDC6. A number of TbORC1/CDC6-interacting factors have been identified, raising the possibility that an ORC is present in T. brucei. However, many of these interactors are highly diverged in sequence from canonical ORC subunits and none has been shown to have a role in replication. To compare the localization pattern of TbORC1/CDC6 with two of these factors (TbORC1b, and TbORC4), and with a subunit (TbMCM3) of the replicative MCM helicase that ORC is through to recruit, each protein was tagged with 12 copies of the c-myc epitope (12myc). Analysis of the ratio and morphology of the nucleus (N) and kinetoplast (K) delineates the cell cycle stage of cells within the population: 1N1K for G1 phase; 1N1eK (elongated - replicating - but not yet divided kinetoplast) for S phase; 1N2K cells for S-G2 phase; and 2N2K cells for postmitosis. Using Super-resolution structured illumination microscopy (SR-SIM) we characterized the distribution pattern of each factor using anti-myc antiserum and compared this with replicating DNA, which was detected with EdU labeling, and with chromatin (DAPI). TbORC1/CDC6 and TbORC4 presented a punctate distribution in non-replicating cells, and did not localize to a specific region within the nucleus. In early S phase cells there was limited co-localization between either TbORC1/CDC6 or TbORC4 and EdU, which was also seen in puncta. An overlap in the myc and EdU signals became more pronounced in 1N2K cells, where S phase is more complete, and at that cell cycle stage the protein and replication puncta become more abundant and appeared more diffuse. In 2N2K cells, after completion of replication, localization of TbORC1/CDC6 and TbORC4 returned to a similar pattern to that of 1N1K cells. SR-SIM imaging revealed that TbORC1B is only seen in the nucleus of S phase cells (1N1eK and 1N2K), where a comparable pattern to TbORC1/CDC6 and TbORC4 was seen, with signal throughout the nucleus in a similarly large number of puncta and with some overlap with EdU. TbMCM3 signal was more abundant and more homogenous in the nucleus that any of the putative ORC-factors, and displayed little obvious variation in the different cell cycle stages, indicating that each of TbORC1/CDC6, TbORC4 and TbORC1B display distinct sub-nuclear localisation to that of TbMCM3. SR-SIM imaging has helped reveal that ORC architecture and regulation appear to be diverged features of replication initiation in T. brucei.

Acknowledgements: This work was supported by the Wellcome Trust [083485], the BBSRC [BB/K006495/1] and Fundação para a Ciência e Tecnologia (FCT, Portugal) [SFRH/BD/68784/2010]. The Wellcome Trust Centre for Molecular Parasitology is supported by core funding from the Wellcome Trust [085349].


Leandro LEMGRUBER (GLASGOW, United Kingdom), Catarina MARQUES, Richard MCCULLOCH
08:00 - 18:15 #5926 - LS06-065 3 dimensional measurements of tuberculosis granulomas using optical clearing techniques.
LS06-065 3 dimensional measurements of tuberculosis granulomas using optical clearing techniques.

Tuberculosis remains one of the major infectious diseases in the world. Current vaccine testing relies on in vivo models including the mouse aerosol challenge model. To determine structural changes in the 3D of granulomas caused by Mycobacterium tuberculosis previous observations have relied on serial sectioning with histopathology techniques. However, this has several disadvantages including the possibility of missing or distorting information in the 3D.

Optical clearing techniques may offer a way around this by making the whole organs transparent using chemical procedures, and then imaging by confocal laser scanning microscopy to produce optical sections. Therefore this study aimed to see whether optical clearing techniques can be used to study granulomas in 3D and the structural changes to the surrounding tissue. Results to date have shown that it is possible to optically clear lobes of the mouse lung and to resolve individual nuclei. We now hope to use the same techniques to image M. tuberculosis infected lung and to compare with other organs.


Robert FRANCIS (Hertfordshire, United Kingdom), James KEEBLE, Bhagwati KHATRI, Belinda DAGG, Mei Mei HO, Kirsty MACLELLAN-GIBSON
08:00 - 18:15 #5936 - LS06-066 Quantification of particles in samples of a split-virion influenza vaccine.
LS06-066 Quantification of particles in samples of a split-virion influenza vaccine.

Influenza is an infectious disease caused by Orthomyxoviridae viruses that infect 3-5 million people worldwide during seasonal epidemics. Influenza vaccines must be produced and administred annually to respond to the high rate of mutations and possible exchange of genomic segments between different strains. The vaccines are produced by a well established prodedure in inoculated embryonated eggs. Influenza virions are purified by sucrose gradient and then split by detergent filtered and inactivated by formaldehyde. Samples of split virions contain mainly HA and NP viral proteins.

To monitor quality of produced vaccines, quantitative information about the oligomerization state and molecular assembly of antigens in produced lots is desirable. We have developed a new approach to determine the size distribution of particles in split-viron influenza vaccine samples by electron microscopy and could thus interpret elution profiles from the asymmetrical flow field-flow fractionation (A4F) method. Samples were imaged by negative-stain electron microscopy using organo-tungstate stain (nanoW, pH 8.0) at 19,000x magnification (5.59 Å/pix) and 4-μm defocus (Figure 1). About 40-60 micrographs were initially filtered to remove variations in background and improve signal-to-noise ratio [1]. Individual particles were then segmented by a watershed algorithm [2]. Areas of the segmented 2D projections were determined in ImageJ [3] and plotted as histograms of the size distribution. (Figure 2). This approach is able to distinguish among different oligomeric states of HA and NP subunits in the sample, however all larger assemblies and aggregates are not resolved.

In parallel, we analyzed the same samples by A4F. Elution profiles resolved three peaks of small particles (diameter 200 nm). While the first three peaks correspond to the HA and NP oligomers resolved in the size distribution resolved in the analysis by electron microscopy, the latter peaks reflect presence of large lipid vesicles with embedded HA proteins. Interpretation of the A4F elution profiles allows routine screening and monitoring of produced split-virion influenza vaccines.

This study has been funded by Sanofi Pasteur.

 

References

[1] Tang, G. et al. (2007) J. Struct. Biol., 157, 38-46.

[2] Heymann, J.B. (2001) J. Struct. Biol.,133, 156-169.

[3] Schneider, C.A. et al. (2012) Nature Methods, 9, 671-675.


Marie-Claire NICOLAI (MARCY L’ETOILE), Aurelie DELIOT, Frederic RONZON, Jean-François COTTE, Catherine MANIN, Daniel NEMECEK
08:00 - 18:15 #6022 - LS06-067 Modulation of DAMP-mediated NET formation by p33.
LS06-067 Modulation of DAMP-mediated NET formation by p33.

The formation of neutrophil extracellular traps (NETs) is often associated to entrapment and growth inhibition of several pathogens. However, an excessive NET formation or impaired degradation of the DNA fibres can result in the development of autoimmune diseases, such as SLE or psoriasis. Also NET-associated molecules, like host defence peptide LL-37 and cationic histones can have harmful effects. Thus, the host organism needs to rely on precautions to circumvent such deleterious effects.

Our group recently published that p33, a multi-ligand protein present on several cells types, is able to inhibit the cytolytic activity of LL-37 on endothelial cells. Additionally, it was found that the application of p33 prevents histone-mediated platelet aggregation as well as lethal haemolysis in mice treated with histones.

In order to investigate whether p33 plays a role in the formation of NETs, first NETosis was analysed microscopically and biochemically. p33 administration abolished the PMA-mediated release of DNA fibres and additionally reduced the PMA-triggered production of ROS. Moreover, both cationic LL-37 and histones significantly triggered the formation of NETs as well as the release of MPO. However, the simultaneous addition of p33 in a 1:2 ratio decreased the amount of released MPO and the protein-triggered NETosis. Utilising DNA-intercalating dye PicoGreen, the effect of p33 on the stabilisation of DNA, backbone of the NET structures, was investigated. Due to their cationic properties, histones as well as LL-37 bind and protect DNA against bacterial nuclease MN. Interestingly, additional application of p33 diminished the protection of DNA mediated by both LL-37 and Histones against S. aureus nuclease. Taking together, we hypothesise that p33 plays a role in modulating NET induction and NET stabilisation.


Ariane NEUMANN, Ariane NEUMANN (Lund, Sweden), Praveen PAPAREDDY, Heiko HERWALD
08:00 - 18:15 #6047 - LS06-068 A combined microscopy approach to study plant-phytoplasma interaction using Arabidopsis thaliana.
LS06-068 A combined microscopy approach to study plant-phytoplasma interaction using Arabidopsis thaliana.

Phytoplasmas, obligate parasites of plants and phloem-feeding insects, belong to Mollicutes (Lee et al., 2004) and are associated with several hundreds of diseases affecting over one thousand plant species, including many economically important crops (Marcone, 2014). There is no effective curative strategy available so far, so the sole ways to limit the infection outbreaks are the use of insecticides and the removal of symptomatic plants (Bertaccini et al., 2014).

Even if not all infections are necessarily deleterious, symptoms in infected plants suggest heavy disorders of phloem functions and growth-regulator balancing (Lee et al., 2000). Upon their discovery (Doi et al., 1967), the study of phytoplasmas has been hindered by the extreme difficulty to culture them in vitro, due to their lack of fundamental metabolic pathways (Bai et al., 2006). Moreover, the study in natural plant hosts is often limited by environmental conditions, long plant life cycle and poor knowledge of host-plant biology. Therefore, in the last decade some authors suggested to use Arabidopsis thaliana as model plant for studying phytoplasma-plant interactions. This choice was supported by the correspondence between the macroscopic symptoms developed in infected A. thaliana and those observed in natural host plants (Bressan and Purcell, 2005; Hoshi et al., 2009; Cettul and Firrao, 2011; MacLean et al., 2011). Nevertheless, morphological and ultrastructural modifications occurring in infected A. thaliana tissues have never been described in detail.

In this work, we adopted a combined microscopy approach to verify if this plant is a reliable model for the study of phytoplasma-plant interactions at microscopical level.

Using DAPI and fluorescence microscopy (FM), phytoplasma presence and localization were demonstrated in every infected plant. Transmission electron microscopy (TEM) observations confirmed phytoplasma massive presence into the sieve elements (SEs) (Figure 1). Phytoplasma appeared well preserved, with typical pleomorphic shape, free-floating and dividing in the lumen or adhered to SE membrane, probably connecting to the host (Marcone et al., 2014; Buxa et al., 2015). Phytoplasmas also established relationships with sieve element reticulum (SER). Pathogen presence, probably linked to nutrient uptake (Celli et al., 2015; Musetti et al., 2016), caused SER hyperproliferation, as observed in many other plant-phytoplasma interaction (Rudzinska-Langwald and Kaminska, 2001; Buxa et al., 2015) (Figure 1). Pathogen spread was documented by the passage through sieve pores.

As remarked above, phytoplasma presence affected host plant development (Lee et al., 2000). In infected A. thaliana plants, light microscopy (LM) evidenced a profound disturbance in phloem morphology at histological level, mainly consisting in collapse, necrosis and hyperplasia of the phloem components. The relationship between necrosis and hyperplasia could be explained as a plant response to the impaired phloem functionality (Oshima et al., 2001) or due to pathogen effectors (Bai et al., 2009; Sugio et al., 2011).

At ultrastructural level, as previously observed in other phytoplasma hosts (Musetti et al., 2000; 2013; Kaminska et al., 2001; Santi et al., 2013), phloem components showed plasmolysis or were collapsed or necrotized. Even in vital SEs, abnormalities of cell membrane profile and cell wall thickness were visible. TEM observations showed two typical plant responses to phytoplasma infection: phloem-protein agglutination and callose deposition at the sieve plates, which limited sieve-pore diameter (Figure 1). These phenomena have been interpreted as a plant reaction to physically limit pathogen spread (Lherminier et al., 2003; Gamalero et al., 2010; Luna et al., 2011; Musetti et al., 2010; 2013).

Phloem functionality experiments using CFDA and confocal laser scanner microscopy (CLSM) suggested that sieve-pore obstruction leads to phloem impairment (Figure 2 A, C). This phenomenon is also associated to the accumulation of photo-assimilates, visible as chloroplast starch deposits under LM and TEM (Figure 2 B, D), as previously reported in other host plants (Maust et al., 2003; Junqueira et al., 2004; Musetti et al., 2013).

This study proved that phloem tissue of infected A. thaliana presented the main morphological and ultrastructural response to phytoplasma infection as reported in natural hosts. Moreover, analyses carried on A. thaliana were not affected by troubles linked to low phytoplasma titre and uneven distribution, typical of woody plants. Therefore, we can state that A. thaliana revealed a reliable model plant for phytoplasma-plant interactions, concerning both macroscopic symptoms and morphological and ultrastructural changes.


Laura PAGLIARI (tavagnacco, Italy), Rita MUSETTI
08:00 - 18:15 #6146 - LS06-069 Terrestrial isopods as models for host-symbiont interactions.
LS06-069 Terrestrial isopods as models for host-symbiont interactions.

Being the most numerous, diverse and ubiquitous group of animals, the arthropods have established a wide array of interactions with bacteria. Despite their considerable potential in agriculture, health-care and pest control, exploration of these associations is limited to a few well studied associations (Bourtzis & Miller 2003), while comprehensive understanding of interactions between bacteria and arthropods generally remain underexplored, due to lack of appropriate model organisms. Our work in recent years has been therefore focused on bacterial associations in terrestrial isopod crustaceans (Fig. 1), a diverse and ubiquitous group of arthropods, with considerable ecological role, well-known biology and undemanding maintenance under laboratory conditions.

In order to expand our knowledge on isopod-bacteria associations we used a wide array of microscopic approaches on crustacean tissues including FE-SEM, TEM and fluorescence microscopy with structured illumination in combination with histochemistry, fluorescent ‘in situ’ hybridization and EDXS analytical techniques.

Beside diverse transitional bacterial microbiota inhabiting the gut, our observations revealed three groups of bacteria exhibiting specific adaptations to the isopod host as their environment. The first are filamentous gut bacteria, belonging to a novel and distant phylogenetic lineage named ‘Candidatus Bacilloplasma’ (2). These commensal developed specific attachment structures, enabling their attachment to the tips of the cuticular structures covering the inner surface of the hindgut of common woodlouse, Porcellio scaber (Fig. 2). The second specific interaction comprises the intracellular pathogen Rhabdochlamydia porcellionis (Fig. 3), which represents the first description of the Chlamydiae in arthropods (3). Studies of infection in established cell culture (4) and in the digestive glands of its natural host, isopod P. scaber (5), enabled insight into chlamydial interactions with the host and mechanisms of pathogenesis of R. porcellionis, currently recognized as emerging pathogen. The third association includes bacterial community inhabiting specialized organs, known as the calcium bodies (6,7). These chevron-shaped organs in the body cavity of trichoniscid isopods serve as transitional storage of calcium during moulting of the exoskeleton and comprise a bacterial community of phosphate-accumulating bacteria arranged in densely packed layers surrounding a mineralized core (Fig. 4). Due to involvement of the polyphosphate-accumulating bacteria in phosphorous metabolism, the latter of described isopod symbioses can be, in contrast to the previous two, described as beneficial to the host and therefore mutualistic.

Our results show that terrestrial isopods can be considered important, yet overlooked evolutionary playgrounds, which enabled specific bacterial adaptations to the arthropod hosts and the development of novel bacterial lineages. By displaying the full scope of bacterial symbiosis ranging from pathogens, over commensals to mutualists, the terrestrial isopods have considerable potential as model organisms for much needed studies on host-symbiont interactions.

 

References:

(1) Bourtzis K., Miller T.A. (2003): Insect symbiosis. CRC Press, 347 pp.

(2) Kostanjšek R. Štrus, J., Avguštin G. (2007). Appl. Environ. Microbiol. 73(17): 5566-5573.

(3) Kostanjšek R., Štrus J., Drobne D., Avguštin G. (2004).  Int J Syst Evol Microbiol, 54: 543-549.

(4) Sixt B.S., Kostanjšek R., Mustedanagic A., Toenshoff E.R., Horn M. (2013). Environ. Microbiol. 15(1): 2980-2993.

 (5) Kostanjšek R., Pirc Marolt T. (2015). J Invertbr. Pathol. 125: 56-67.

(6) Vittori M., Kostanjšek R., Žnidaršič N., Žagar K., Čeh M., Štrus J. (2012). J. Struct. Biol 180(1): 216-225.

(7) Vittori M., Rozman A., Gradodolnik J., Novak U., Štrus J. (2013). PloS one 8(3) 1-14, e58968.

 


Rok KOSTANJSEK (Ljubljana, Slovenia), Milos VITTORI, Jasna STRUS
08:00 - 18:15 #6255 - LS06-070 The activation, ROS induction and cytokine secretion in human monocytes exposed to H. pylori lipopolysaccharide depend on the availability of TLR4/2 and TLR2/6 receptor complexes.
LS06-070 The activation, ROS induction and cytokine secretion in human monocytes exposed to H. pylori lipopolysaccharide depend on the availability of TLR4/2 and TLR2/6 receptor complexes.

Introduction: Helicobacter pylori (H.pylori) is a Gram-negative bacterium that causes chronic gastritis, peptic ulcers and stomach cancer. The activity of immune cells, including monocytes, infiltrating gastric mucosa of H. pylori infected individuals depend on the ability to recognize and react to the bacterial antigens including lipopolysaccharide (LPS) H.pylori. The LPS of this bacterium has a unique structure of lipid A and possess Lewis (Le) determinants that allow bacteria to modulate host immune responses and promote chronic infection. However little is known about the role of Le determinants in H.pylori – host cell interactions and receptors involved in binding of H.pylori LPS. Aim: To evaluate TLR receptors involved in binding H.pylori LPS with or without Lewis antigens and to evaluate the consequences of this interaction: cell signaling, activity, morphology, ROS production and tumor necrosis factor (TNF-α) secretion. Material and Methods: THP-1XBlue™ cells were used as a model of human monocytes - a reporter cell line that when activated via TLR receptors induce NFk-B transcription factor and secrete embryonic alkaline phosphatase (SEAP). Cells were seeded in 96-well tissue culture plates (1×105 cells/well) and stimulated for 24 h with LPS of: H.pylori LeXY(+) or H.pylori LeXY(-), or standard LPS E. coli O55:B5, in a final concentration of 100ng/ml. To evaluate the involvement of particular TLR receptors and signaling molecules in LPS binding 30 min. prior stimulation monoclonal antibodies: mAbα: TLR2, TLR4, TLR6 (Novus, CO, USA) or MyD88 inhibitor (Selleckchem) were introduced. After stimulation supernatants were used for SEAP (QuantiBlue reagent) and TNF-α quantification (ELISA, ElabSciences). ROS production was estimated with Total ROS Detection Kit (Enzo Life Sciences). Simultaneously, the cells were fixed for 10 min. with 99.8% methanol and stained with DAPI (1:2000) and DiOC (2: 1000) for 15 min. and 5 min. respectively. The microscopic evaluation was performed with Leica TCS SP8 (Leica-Microsystems, Wetzlar, Germany). Results: All LPS types have potential to activate monocytes, however each LPS with different intensity. The LPS of H.pylori LeXY(-) (OD=0.870±0.07) as well as H.pylori LeXY(+) (OD=0.677±0.05) exhibited significantly lower potential to activate monocytes in comparison to  the standard LPS of E. coli (OD=1.361±0,.44), p<0.001). Confocal microscopy analysis showed that the cells stimulated with LPS of E. coli lost their ability to adhere (78%) and the integrity of cellular membrane was disturbed (Figure 1), whereas the cells incubated in the presence of H.pylori LPS LeXY(-) remained in a condition similar to untreated controls. The LPS of H.pylori LeXY(+) did not affect the adhesive properties however we observed a significant drop of fluorescence signal from DAPI which suggest its influence on cellular nuclei. The experiments with mAbαTLR receptors revealed that the activation induced by standard LPS of E. coli solely depended on the presence of TLR4 receptor (or in complex with TLR2), whereas the H.pylori LeXY(+)/LeXY(-) – mediated monocyte activation was related with the presence of receptor complexes: TLR2/4 (p=0.0001) or TLR2/6 (p=0.003), whereas the blocking of TLR4 did not reduce the level of monocyte activation. The experiments with LPS evaluated by confocal microscopy were consistent with cellular culture study and showed that the lower activation of monocytes mediated by H.pylori LPS is accompanied by lower ROS production in comparison to that induced by E. coli LPS (3631±184). H. pylori LPS with Lewis antigens induced significantly higher ROS production than the H.pylori LPS without Lewis residues(1446±138 vs 853±62), which might suggest the involvement of sugar moieties in this phenomenon. Further studies showed that LPS E.coli-mediated stimulation was strongly correlated with the secretion of high doses of TNF-α by monocytes (150,5±9.4 pg/ml) whereas the level of this cytokine secreted in response to H.pylori LeXY(+) or H.pylori Le XY(-) was notably lower (101.5±18.1 and 64.2±5.9, respectively, p<0.001). Additional experiments with the utility of Myd88 inhibitor used before stimulation showed that in all cases TNF-α production was Myd88 dependent and resulted with at least 70% inhibition of its release. Conclusion: Our results suggest that the LPS of H.pylori is recognized not solely by classic TLR4 receptor but rather by TLR4/2 or TLR2/6 receptor complexes and that the Lewis residues present in 80% of H.pylori isolates are involved in that process. The immunomodulatory activity of H.pylori is weaker in regard to ROS production and TNF-α which is associated with the level of monoCyte activation and might explain the chronic character of this infection.


Karolina RUDNICKA (Łódź, Poland), Anna NIEWIADOMSKA, Paulina SKIBIŃSKA, Sylwia MICHLEWSKA, Maria WALENCKA, Dominik MATUSIAK, Gerd DÖRING, Magdalena CHMIELA
08:00 - 18:15 #6542 - LS06-071 Visualization of Dengue virus like particles interacting with antibodies.
LS06-071 Visualization of Dengue virus like particles interacting with antibodies.

Dengue virus (DENV) is one of the most important arthropod-borne viruses that infect humans. Approximately 400 million people are infected annually in tropical and sub-tropical regions worldwide [1]. In 2015, Sanofi Pasteur released the first commercialized and approved tetravalent vaccine that is protective against the four DENV serotypes [2].

In the context of developing a better understanding of the interaction of dengue antigen with the immune system, it is important to fully understand the structure and accessibility of specific epitopes. Particularly in the case of the dengue virus, viral capsids bud into the host endoplasmic reticulum and acquire structural proteins prM and E embedded in the membrane. The prM and E proteins are assembled as trimers as part of an immature icosahedral shell and undergo significant structural rearrangement during viral exit via the Golgi apparatus. In the Golgi, Host furin-type proteases concomitantly cleave the pr peptide triggering rearrangement of the trimers into dimers, which is necessary for infectivity of the viral particle [3]. However, maturation of DENV virions is not efficient and partly immature particles are released during DENV infection as well. It has been hypothesized that these particles function as decoys to avoid neutralization of the infectious mature particles by the immune system [4].

Recombinant antigens in the form of virus-like particles are attractive as reagents for understanding antigen-antibody interactions. Here, we investigated the molecular architecture of virus like particles (VLPs) made of dengue structural subunits, which are produced by The Native Antigen Company (Oxfordshire, UK). We found by SDS-PAGE and confirmed by Western blot that DENV-2 and DENV-3 VLPs contain a significant fraction of uncleaved prM subunits. To assess the molecular architecture and conformation of subunits in the VLP particles, we determined 3D structure of individual particles by cryo-electron tomography. The particles have a spherical (DENV-2 VLPs) or elongated (DENV-3 VLPs) outer shell with short spikes and an internal cavity (Figure 1). The spikes exhibit the same morphology as the prM/E subunits in the immature dengue viral particles. We additionally imaged and reconstructed the 3D structure of VLP particles mixed with monoclonal antibodies specific to the mature conformation of DENV. We identified bound antibodies to individual particles in subtomograms after subtraction of the VLP shell (Figure 2). Binding of the antibodies to the VLP particles was subsequently confirmed by Western blot and immunogenicity assays suggesting that these VLPs could adopt a mixed conformation with mature dimers and immature trimers on the same particles, as previously described for DEN virions or adopt a specific new conformation of mature prME specific to VLPs.

This study was funded by Sanofi Pasteur using equipment installed at Sanofi Pasteur.

References

[1] Bhatt S., Gething P. W., Brady O. J., et al. (2013) Nature, 496, 504–507.

[2] Hadinegoro, S.R. et al. (2015) N Engl J Med., 373, 1195–206.

[3] Kuhn R. J., Zhang W., Rossmann M. G., et al. (2002) Cell, 108, 717–725.

[4] Rodenhuis-Zybert IA1, Wilschut J, Smit JM. (2011) Trends Microbiol., 19, 248-254.


Aurelie DELIOT (Marcy l'Etoile), Marie-Claire NICOLAI, Frederic RONZON, Valerie LECOUTURIER, Daniel NEMECEK
08:00 - 18:15 #6568 - LS06-072 In vivo structural characterization of bacteriophage 812K1-420 virion lytic cycle intermediates.
LS06-072 In vivo structural characterization of bacteriophage 812K1-420 virion lytic cycle intermediates.

Staphylococcus aureus is one of the most important bacterial pathogens causing a wide spectrum of diseases varying in severity. Treatment of the infections is often complicated by S. aureus resistant to antibiotics. Current development of antibiotics is not fast enough to counterpart the emergence of antibiotic-resistance. Preclinical studies showed, that phage therapy is promising alternative for treatment of bacterial infections including those caused by resistant strains, but approval of bacteriophage-based drugs requires a detailed functional understanding of the molecular mechanisms of phage infection which we are still lacking.

Bacteriophage 812K1-420 from the family Myoviridae is potential candidate to be used in phage therapy against S. aureus. Polyvalent and strictly virulent bacteriophage 812K1-420 virion is composed of an icosahedral head containing linear 145,5 kb dsDNA, contractile tail and baseplate which specifically recognizes specific surface on the bacterial host. Replication and virion-assembly mechanisms inside host cell are not fully explored yet, although few bacteriophage 812K1-420 lytic cycle intermediates of virion assembly were reproduced in vitro.

Here we present initial structural analysis of bacteriophage 812K1-420 infection in vivo using cryo-electron tomography. We used cryo FIB milling technique to thin plunge frozen S. aureus cells (600-1000 nm in diameter) infected by phage 812K1-420 into wedge geometry . The cryoET data acquired on FEI Titan Krios microscope and tomograms were reconstructed using program IMOD.


Miroslav PETEREK (Brno, Czech Republic), Jiri NOVACEK, Pavel PLEVKA
08:00 - 18:15 #6641 - LS06-073 Induction of conoid extrusion is asociated to MIC secretion in Toxoplasma gondii tachyzoites.
LS06-073 Induction of conoid extrusion is asociated to MIC secretion in Toxoplasma gondii tachyzoites.

INTRODUCTION

Toxoplasma gondii is an intracellular protozoan parasite which affects animals and humans causing encephalitis, chorioretinitis and death. The tachyzoite has structures that allow it to perform cell invasion. During the invasion, the tachyzoite adheres to the target cell membrane through proteins MIC that come from micronemes and then projects a highly dynamic structure called conoid [1,2]. Subsequently the parasite enters the cell and is housed in a parasitophorous vacuole proliferating by endodyogeny. After several cycles of replication, the parasites leave the infected cell by mechanisms such as conoid extrusion and secretion, which enables the parasite to invade neighboring cells. This replication cycle results in cell destruction and is responsible for the major clinical manifestations of toxoplasmosis. Ethanol is a well-characterized inductor calcium-dependent events in different cell models. In this work we used ethanol and we analyze the asociation between conoid extrusion and MIC secretion.

 
METHODS

Cell culture. The cell model used for our invasion, proliferation and egress assays was HEP-2 cells (human epithelial laryngeal carcinoma cells) (Hep-2,ATCCCCL-23).

Parasites and conoid extrusion. The RH strain of T. gondii was maintained in BALB/c mice, purified and incubated with 0.5M ethanol, fixed, and processed for electron microscopy and immunofluorescence.

Eletronic microscopy. The samples were fixed, dehydrated and infiltrated in resin or processed for scanning electron microscopy. Thin sections obtained were contrasted with uranyl acetate and examined in a transmission electron microscope (Jeol 2000 EX).
Immunodetection. MIC2 protein detection was performed without permeating in extracellular tachyzoites. The samples were fixed and incubated with specific primary antibodies and analyzed using confocal microscopy.


RESULTS

The exposure of tachyzoites to ethanol induces reversible conoid extrusion, clearly observed the projection of the apical part of tachyzoites (Fig. 1). We also observed the presence of vesicle components accumulating in the back of tachyzoites, associated with some changes in the plasma membrane. We could detected that these vesicular components presenting on its surface was always associated with the extruded conoid(Fig. 1). For immunofluorescence, we showed that the secreted products during extrusion conoid micronemes come from. These results suggest a similar mechanism of secretion and induction for extrusion.

 

REFERENCES

[1] Mondragón y Frixione . J. Euk. Microbiol. 43 (1996) 120-127.

[2] González-Del Carmen, et al. Cell Microbiol 11(2009):967-82

 

 

ACKNOWLEDGEMENTS

This work was supported by the project CONACYT # 165282 


Manuel GONZALEZ DEL CARMEN (Mendoza, Veracruz, Mexico), Lizbeth CARIÑO CALVO, Ricardo MONDRAGÓN
08:00 - 18:15 #6880 - LS06-074 Structural characterization of the protein P2, the aphid transmission factor of the cauliflower mosaic virus.
LS06-074 Structural characterization of the protein P2, the aphid transmission factor of the cauliflower mosaic virus.

Cauliflower mosaic virus (CaMV) is transmitted from plant to plant through an interaction with aphid vectors, according to a non-circulant transmission (1). Until recently, it was admitted that CaMV transmission was not specific. However, our colleagues have recently identified a proteic receptor at the extreme tip of the aphid maxillary stylets involved in interaction with the viral protein P2, the transmission factor of  CaMV, suggesting a specific and complex interaction process (2).

As a consequence, it is now believed that  CaMV transmission involves an aphid receptor and two viral proteins, P2 and P3. P2 binds both to the aphid receptor and to P3, which is tightly associated with the CaMV viral particle, forming the transmissible viral complex (Figure 1). We have previously resolved the P3 structure by X-ray crystallography (3) and proposed a model  for the CaMV:P3 complex based on single particle cryo-electron microscopy (cryo-EM) studies (4). We are now trying to characterize P2, the viral helper-component, which acts as a bridge between the aphid receptor and the viral complex CaMV:P3, thus playing a major role in plant-vector transmission. Structure predictions indicate that P2 is composed by a N-terminal globular domain, followed by two coiled-coil domains. Due to the presence of these coiled-coil domains which seem to confer the protein a strong tendency to aggregate, it is extremely difficult to work and manipulate the native P2 protein. Hence, we have adopted a hybrid strategy combining  X-ray crystallography and cryo-EM studies to investigate the structural organization of P2. In this context, we are trying to crystallize various domains of the P2 protein over-expressed in bacteria. Additionally, we want to obtain the tertiary structure of P2 by using electron microscopy. Indeed, as His-tagged P2 protein can form paracrystals when expressed in sf9 cells (Figure 2), we use  cryo-electron tomography  and sub-tomogram averaging methods to get first structural data on P2 and interactions between coiled-coil domains. Moreover, a P2 mutant (157m) was shown to decorate microtubules in sf9 cells (Figure 3). We defined conditions of purification and used these decorated microtubules to engage a single particle analysis in cryo-EM and image processing.

This poster presents the first structural results in the organization of the P2 protein and its multiple interactions.

(1)    Martinière et al., Plant Signaling & Behavior, 4:6, 548-550, 2009

(2)    Uzest et al., PNAS, vol. 104 no. 46, 17959-17964, 2007

(3)    Hoh et al., Journal of Virology, vol. 84 no. 9, 4706-4713, 2010

(4)    Plisson et al., J. Mol. Biol, 346:267-277, 2005


Francois LECORRE (MONTPELLIER), Joséphine LAI KEE HIM
08:00 - 18:15 #5432 - LS07-075 Visualization of GFP mouse embryos and embryonic hearts using various tissue clearing methods and 3D imaging modalities.
LS07-075 Visualization of GFP mouse embryos and embryonic hearts using various tissue clearing methods and 3D imaging modalities.

Our goal was to find an optimal tissue clearing protocol for whole mount imaging of embryonic and adult hearts and whole embryos of transgenic mice that, unlike the golden standard BABB protocol used for whole mount immunohistochemistry, would preserve GFP fluorescence and to compare different currently available 3D imaging modalities.

We tested various organic solvent- or water-based clearing protocols intended to preserve GFP fluorescence in central nervous system: tetrahydrofuran dehydration and dibenzylether protocol (DBE), SCALE, CLARITY, and CUBIC and evaluated their ability to render hearts and whole embryos transparent.

DBE clearing protocol did not preserve GFP fluorescence; in addition, it caused considerable tissue shrinking artifacts when compared to the golden standard BABB protocol. The CLARITY method considerably improved tissue transparency at later stages, but also decreased GFP fluorescence intensity. The SCALE clearing resulted in sufficient tissue transparency up to ED12.5; at later stages the useful depth of imaging was limited by tissue light scattering. The best method for the cardiac specimens proved to be the CUBIC protocol, which preserved GFP fluorescence well, and cleared the specimens sufficiently even at the adult stages. In addition, CUBIC decolorized the blood and myocardium by removing iron from the tissues.

Good 3D renderings of whole fetal hearts and embryos were obtained with OPT and SPIM, although at resolutions lower than with a confocal microscope. Comparison of five tissue clearing protocols and three imaging methods for study of GFP mouse embryos and hearts shows that the optimal method depends on stage and level of detail required.

Figure 1 demonstrates 3D visualizations of specimens cleared by various techniques, acquired and visualized by an OPT microscope and VolViewer software package, Bangham Lab, A)-C) and a SPIM and Amira 3D, FEI Software, D), respectively.

A) is an ED12.5 mouse heart with a scissor cut through the right ventricle, BABB clearing, primary antibody against GFP detected with Cy5-coupled secondary. Red-grey channel is transmission one, green channels is iso-surface rendering of the fluorescent channel acquired using excitation of 628/40 nm and emission of 692/40 nm.

B) shows an ED16.5 mouse heart with a scissor cuts through both ventricles, SCALE clearing. Maximum intensity projection (MIP) visualization of overlays of red (transmission) channel and green (fluorescent) channel using excitation of 425/40 nm and emission of 475 nm (high pass). GFP-positive network of Purkinje fibers is clearly visible.

C) depicts an ED12.5 mouse embryo cleared in CUBIC. MIP visualization of fluorescent channel using excitation of 425/40 nm and emission of 475 nm (high pass). GFP positivity is seen in the head arteries and heart; lot of autofluorescence is apparent in the liver.

And, finally, D) represents ED12.5 mouse heart with a virtual cut through the right atrium and ventricle. Strong GFP signal (shown in red with the pseudocolor display) is visible in the pectinate muscles of the atrium and ventricular trabeculae. Cleared in CUBIC.

Used abbreviations: LA – left atrium, LV – left ventricle, RA – right atrium, RV – right ventricle.

 

Acknowledgements. Supported by 13-12412S from the Czech Science Foundation, Ministry of Education PRVOUK P35/LF1/5, institutional support RVO:67985823, and Charles University UNCE 204013.


Hana KOLESOVA, Martin CAPEK (Prague, Czech Republic), Barbora RADOCHOVA, Jiri JANACEK, David SEDMERA
08:00 - 18:15 #5622 - LS07-076 An integrated structural perspective on morphogenesis of crustacean epidermis and gut by complementary microscopy.
LS07-076 An integrated structural perspective on morphogenesis of crustacean epidermis and gut by complementary microscopy.

To understand developmental processes it is essential to consider both, molecular / genetic data and structural aspects of morphogenesis and differentiation. Integration of both approaches is beneficial to interpret the data obtained and unravel tissue and organism formation. Sequential morphological changes during animal development can be followed by different microscopic methods that enable us to combine imaging of intact embryos, elucidation of the tissue and cell architecture at different size scales, localization of tissue constituents in their original location and correlative imaging, supplemented by analytical microscopy at the specific stages of development.

Here we present a combined use of light microscopy, histology, transmission (TEM) and scanning electron microscopy (SEM), labelling with specific ligands and analytical microscopy to unravel the differentiation of epidermis and gut epithelium in a crustacean model. Our study addresses the interrelation of tissue morphogenesis, epithelial cell differentiation at the ultrastructural level and differentiation of the corresponding apical extracellular matrix, the cuticle, examined in the embryos and marsupial larvae of Porcellio scaber. Cuticle is a chitin-based matrix, secreted apically by ectodermal epithelia during development and renewal in arthropods. We integrate structural information at different scale levels with data on matrix elemental and molecular composition in the selected developmental stages. Developmental stages and gross morphological changes in epidermal and gut tissues were identified by imaging the intact embryos and larvae (Fig. 1A), fluorescence labelling of nuclei and imaging of histological sections (Fig. 1B). Architecture of tissues, cells and matrix was characterized at the levels of light and electron microscopy. To determine the organic scaffold composition of the matrix, we performed localization of macromolecules containing N-acetyl-glucosamine (chitin) by labelling with lectin wheat germ agglutinin. The epidermal cuticle in crustaceans is in addition mineralized, forming a stiff exoskeleton. Analytical microscopy was applied to examine calcification of the forming cuticular matrix in marsupial larvae, performed by energy dispersive X-ray spectroscopy (EDS) to analyse elemental composition and Raman spectroscopy to determine mineral forms in the cuticle. The results show that several apical matrices are produced sequentially during epidermis and gut morphogenesis and that matrix renewal is coupled with major morphological modifications such as growth of appendages, elongation or bending of embryo body and hatching from egg envelopes. The early stages of apical matrix formation are similar in the epidermis and gut. Later in marsupial larval stages, specialization of both cuticles is evident, implying the establishment of their specific functions. Exoskeletal cuticle with elaborate surface structures (Fig. 2A) differentiates in several layers displaying chitin-protein fibres patterns (Fig. 2B) and is already prominently calcified. Hindgut cuticle displays differentiation in a homogenous electron lucent procuticle and prominent electron dense epicuticle (Fig. 3A).In concert with the stages of apical matrix formation, a gradual formation of the subapical cell junctions, one of the key factors that determines cell polarity, was evidenced (Fig. 3B). We consider our model system as valuable system to study tissue and cell differentiation in their native environment, with applying the integrated structure-function perspective.


Polona MRAK, Urban BOGATAJ (Ljubljana, Slovenia), Kristina ŽAGAR, Miran ČEH, Andreja GAJOVIĆ, Nada ŽNIDARŠIČ, Jasna ŠTRUS
08:00 - 18:15 #6034 - LS07-077 Flower development of Cannabaceae species using SEM.
LS07-077 Flower development of Cannabaceae species using SEM.

Developmental studies are important to understand the morphology and evolution of the flower, an exclusive unique structure of the Angiosperms. For such studies, the analysis in SEM is essential to the understanding of organogenesis and organ initiation order. The Cannabaceae family, well known to include species such Humulus lupulus (hop) and Cannabis sativa (hemp), recently had its circunscription expanded, with the addition of some genera (e.g. Celtis and Trema) before belonging to Ulmaceae family. The flowers of these four genera have some diagnostic differences (dicliny, monocliny), but share some conditions (perianth single, few stamens, pseudomonomerous gynoecium) which causes the authors to consider them reduced compared to other related families. Then, the aim of this work was to study the development pathways that result in flower of the Celtis iguanaea (Jacq.) Sarg. and Trema micrantha (L.) Blume using SEM and compare them to the data available for Cannabis sativa and Humulus lupulus. From this comparison it will be possible to infer if the development of the flower is homologous in this group, which would support the inclusion of Celtis and Trema in Cannabaceae. To this end, flowers in various stages of development were fixed in buffered formalin, dehydrated in an ethanol series, critical-point dried, mounted on aluminum stubs with carbon tape, and coated with gold of 85,5 nm thick in current of 40mA. Samples were analyzed and documented in SEM (Zeiss IVO-50) with voltage 10 kV. Interpretations of electron micrographs shows that the species analyzed have similar floral development. The floral meristem is rounded and subtended by an abaxial bract and two small lateral bracts (figure 1).  The floral meristem iniates five sepals, five opposite stamens and a carpel primordia. The order of sepal and stamen initiation is helical (figure 2) and none of the species presents petals from the inception (figure 2), resulting in flowers single perianthed. The pistil starts its development as a single primordium (figure 2), which subsequently divides into two, giving rise to two carpels (figure 3 and 4); however, only one is responsible for the formation of the ovule. This pathway gives rise to the pseudomonomerous gynoecium. In Trema micrantha, a dioecious species, the dicliny occurs by abortion of the pistil in the staminate flowers and of the stamens in the pistillate flowers (figure 3). In Celtis iguanaea, an andromonoecious species, occurs abortion of the pistil in the staminate flowers (figure 4). No pistillate flowers were found in studied plants (figure 4), but perfect (=bisexual) flowers. Our results show that Celtis iguanaea, Trema micrantha, Cannabis sativa and Humulus lupulus do not have similar floral development. Only the absence of petals is shared among the four species of the four genera. The dicliny occurs by abortion in Celtis and Trema, and by inception in Cannabis and Humulus. The beginning of pistil development is also different: a single primordium initiates in Celtis and Trema while two primordia initiate in Cannabis and Humulus. Thus, we can conclude that the floral developmental features do not support the phylogenetic positioning of Celtis iguanaea and Trema micrantha in Cannabaceae. Different developmental vias give rise to the reduced flower in this group.

 

Acknowledgements: We thank to CAPES and FAPESP (process number 2014/07453-3) for financial support.

 


Flávia Maria LEME (Ribeirão Preto, Brazil), Simone Pádua TEIXEIRA
08:00 - 18:15 #6036 - LS07-078 Light and electron microscopy analyses elucidate the structure and function of the pistillode in Urticaceae species.
LS07-078 Light and electron microscopy analyses elucidate the structure and function of the pistillode in Urticaceae species.

Urticaceae is a botanical family well known for its urticating trichomes that cause allergic reactions when touching the human skin.  The members of the family are anemophilous, which means that pollen grain transfer from staminate flowers to the stigma of pistillate flowers of the same individual occurs through the wind, without the participation of any biotic vector. They are also characterized by monoecious or dioecious sexual expression, and staminate flowers can develop a pistil called pistillode which is aborted during development. In most cases, the term pistillode refers to an aborted nonfunctional gynoecium in the mature flower that can be developed or rudimentary; the developed pistillode can perform various functions in pollination. Morphology studies based on microscopy help us to understand the floral mechanisms acting on pollen dispersal by the wind. Thus the objective of the present study was to investigate by light and scanning microscopy the morphology and functioning of staminate flowers of four species belonging to four Urticaceae genera: Boehmeria cylindrica (L.) Sw., Laportea aestuans (L.) Chew, Myriocarpa stipitata Benth. and Urera baccifera (L.) Gaudich. ex Wedd., with emphasis on the pistillode. Flower buds in a stage preceding anthesis and developed flowers were collected, fixed in buffered formalin or in Karnovsky solution, dissected with the aid of a Leica MZ 75 stereomicroscopic magnifying glass and processed for surface (scanning electron microscopy – SEM) and anatomical observations (light microscopy - LM). For SEM examination the dissected material was dried to the critical point, mounted on metal holders, placed on a carbon adhesive tape, sputtered with gold (exposure of 340 seconds) and observed with a Jeol JSM-6610LV scanning electron miroscope at 25 kV. For the LM exam the material was embedded in historesin and sectioned crosswise and lengthwise with a rotary microtome (2 to 4 μm thick sections). Serial sections were stained with 0.05% Toluidine Blue in phosphate buffer, pH 4.4, mounted on synthetic resin and observed with a light microscope. Photomicrographs were obtained with a Leica DM 4500 B photomicroscope coupled to a Leica DFC 320 digital camera. The pistillode arises as a single central protuberance after the initiation of four or five sepal primordia together with the primordia of lateral stamens. The elongation of the pistillode is rapid, exceeding the height of the stamens during the intermediate phases of flower development (figure 1). At the end of development, stamens and pistillode exhibit the same height since the stamens take on an inflex position in the flower bud. The pistillode does not contain ovules, exhibits an epidermis with voluminous and mucilaginous cells and a mesophyll consisting of aerenchyma in Laportea aestuans and Urera baccifera (figure 2), empty in Boehmeria cylindrica (figure 3), and of parenchyma in Myriocarpa stipitata (figure 4). Our results, added to those reported in the literature, indicate that the pistillode, together with the inflexed stamens, whose anthers are embedded in the sepals, acts on the explosive mechanism of release of the pollen to be transported by the wind. The pistillode, inflated by the accumulation of air in the mesophyll during development, presses the anthers, which separate from the sepals and move in the direction opposite to the flower, releasing pollen that can be agglutinated by the mucilage produced in the epidermis of the pistillode. We believe that this floral mechanism involving pistillode, stamens and sepals, optimizes anemophily, so that the pollen can reach farther distances, avoiding self-pollination and guaranteeing a greater genetic variability for these species.

Acknowledgements: This study was supported by São Paulo Research Foundation (Fapesp - process numbers: 2013/19459-3 and 2014/07453-3).

 

 


Giseli Donizete PEDERSOLI (Ribeirão Preto, Brazil), Simone Pádua TEIXEIRA
08:00 - 18:15 #6053 - LS07-079 Female germ-line cyst composition and functioning in the sludge worm Tubifex tubifex (Tubificinae).
LS07-079 Female germ-line cyst composition and functioning in the sludge worm Tubifex tubifex (Tubificinae).

The single female germ-line cyst constitutes the whole ovary in Tubifex tubifex. The cyst is polarized and germ cells in the consecutive stages of oogenesis are localized along their long axis. The entire cyst consists of more than 2 000 germ cells. As oogenesis progresses, clustered germ cells differentiate into two morphologically distinguishable categories – the smaller but more numerous nurse cells and only eight growing oocytes at a time on average. During oogenesis, the oocytes gather organelles and storage material, i.e. lipid droplets, glycogen granules and protein yolk and grow considerably on the one side of the ovary in a linear arrangement. Vitellogenic oocytes lose their connections to the ovary and are released into the body cavity.

The spatial organization of germ-line cysts in T. tubifex is broadly similar to the other clitellate annelids known to date, and each cyst is composed of two elements – 1) a common and anuclear cytoplasmic mass (cytophore), which in T. tubifex is long and branched and snakes back and forth within a cyst and 2) germ cells located on the cytophore periphery. Each germ cell is connected to the cytophore by one stable intercellular bridge (ring canal). A rich cytoskeleton was observed within the cyst, which was mainly an inner microfilamentous rim of ring canals, prominent strands of actin filaments within the cytoplasm of the cytophore and a dense microtubular network that filled the cytoplasm of the germ cells and cytophore. Using the techniques of life cell imaging, experiments with cytotoxic substances that inhibit cytoskeletal polymerization and SBEM methods (Serial block-face scanning electron microscopy),we attempted to study the formation and functioning of germ-line cysts and the role of the cytoskeleton. It appears that the cytoskeleton within the germ-line cysts of T. tubifex plays an active role in maintaining the integrity of the huge and multicellular syncytium and takes part in the cytoplasmic transport of organelles and macromolecules from the nurse cells via the cytophore towards the growing oocytes.


Anna URBISZ (Katowice, Poland), Łukasz CHAJEC, Piotr ŚWIĄTEK
08:00 - 18:15 #6082 - LS07-080 Studying synaptic architecture in the zebrafish Danio rerio.
LS07-080 Studying synaptic architecture in the zebrafish Danio rerio.

A fixation technique, which allows a “near-to-native” state tissue preservation, such as high-pressure freezing in combination with electron tomography is required for studying synapses systematically at high resolution in 3D. With these techniques we are studying the ultrastructural architecture of synapses in the zebrafish Danio rerio which can be high-pressure frozen as intact animals at early stages. Currently we are focusing at a group of cytoskeletal proteins, the septins, which play important roles in synapse formation and synaptic function. We localize them with various microscopy techniques ranging from light to 3D electron microscopy in the nervous system. A limiting factor in 3D electron microscopy is the annotation of structures. We therefore developed an automatic vesicle annotation macro with Fiji, which helps us to automatically measure the size of synaptic vesicles and their density.  


Frederik HELMPROBST (Würzburg, Germany), Kristin SCHUCH, Katja SCHULZE, Constantin BERGER, Christina LILLESAAR, Thomas DANDEKAR, Christian STIGLOHER
08:00 - 18:15 #6360 - LS07-081 Ontogeny resolves the unusual flower morphology of urticalean rosids.
LS07-081 Ontogeny resolves the unusual flower morphology of urticalean rosids.

 

The flower has always aroused great interest of researchers because it is considered the key innovation in the evolution of plants, featuring a very special group, the Angiosperms. It is conceptualized as a specialized stem apex or as a lateral branch with shortened internodes and appendices hypothetically homologous to leaves, modified for reproductive functions in sepals, petals, stamens and carpels. The predominance of angiosperm species on Earth is due probably to the success of the appearance of the flower, which enabled more effective ways in interbreeding. This fact is closely related to pollinators, which, along with the flowers, have diversified, becoming sometimes specialized in the pollination of a single plant species. A group of well-known plants, the urticalean rosids, composed of Cannabaceae, Moraceae, Ulmaceae and Urticaceae, surprises by displaying a flower of unusual morphology: small, inconspicuous, diclinous (= single-sex), perianth single or none, androecium with few stamens (1-5) arranged in one whorl, pseudomonomerous gynoecium, a single functional ovule inserted in different ways, in addition to a stigma with various forms. Thus, this flower, if compared to that of other rosids (Rosaceae, for example), can be considered reduced. Although morphological features of the flower of urticalean rosids are recorded since a long time (about 150 years), comprehensive studies on floral development, which could elucidate how this floral reduction takes place in this group are missing. This study aims to show how the ontogeny can explain the variations in flower structure of urticalean rosids. Flower morphology and pollination syndrome are also addressed. Our interpretations are based on data from at least 20 species obtained by analyses of surface in scanning electron microscopy and of histology in conventional light microscopy. The main points we raised are summarized in: (A) The condition perianth single (Fig. 1) or none (Fig. 2) results from the absence of the corolla organs or of both calyx and corolla organs from the inception. The interspecific variation in the calyx number of organs is also due to the absence of organs from the inception and not by organ abortion throughout the development. (B) The synorganization can be congenital (rare) (Fig. 3) or postgenital in the perianth and congenital in the gynoecium and androecium (rare). (C) Male and female flowers result of stamen and carpel abortion (Fig. 4) in most cases. Thus female flowers bear a pistillode and the male flowers a staminode. (D) The ontogeny of pseudomonomerous gynoecium deserves to be highlighted: one primordium arises in the center of the floral meristem, divides into two, but only one forms an ovule, although the other also participates in the style and stigma structure. (E) The arrangement of floral organs and pollination syndrome is strongly related in some species of Urticaceae (anemophily) and Moraceae (anemophily and entomophily). The inflate pistillode together with the anthers arrested by sepals in the staminate flowers of Urticaceae, for example, compose an explosive mechanism of pollen release which is then transported by the wind to a pistillate flower. In the few genera of Moraceae with entomophilous species, the union of several stigmas of different flowers within the inflorescence (fig), forming platforms (Ficus), or the offer of pollen and various exudates to pollinator insects (Artocarpus, Castilla, Dorstenia) ensures the formation of seeds. We conclude that the floral reduction in urticalean rosids takes place by different ontogenetic pathways, even among members of the same family. This finding contradicts the current paradigm which predicts that the floral ontogeny is conserved in related groups. Floral specializations, observed late in development, appear as responses to selection pressures exerted by different pollinators observed in the urticalean rosids.

 

We thank to FAPESP (process number 2014/07453-3, 2013/19459-3, 2012/15644-8), CNPq (process number 303493/2015-1) and CAPES for financial support.


Simone TEIXEIRA (Ribeirão Preto, Brazil), Viviane LEITE, Flávia LEME, Marina COSTA, Giseli PEDERSOLI
08:00 - 18:15 #6407 - LS07-082 Pre-Sertoli Cells: A Light And Electron Microscopic Study.
LS07-082 Pre-Sertoli Cells: A Light And Electron Microscopic Study.

INTRODUCTION
Sry gene expression, starting at 10,5dpc, initiates male sex determination. Sry gene initiates testis differentiation by regulating the differentiation of precursor supporting cells not into Granulosa cells but Sertoli cells (1). Pre-Sertoli cells are the first cell type to show sex differentiation in gonads. This study aimed to observe the light and electron microscopic features of pre-Sertoli cells.
MATERIAL AND METHODS
In this study 27 embryos obtained from 6 balb/c type pregnant female mice from 11,5 to 12,5 dpc were used. Sections were observed by using light and electron microscope.
RESULTS
Pre-Sertoli cells, stained with PAS, were seen as forming a cord around germ cells starting from central parts of gonads (Fig.1). Germ cells and epithelial cells lining the gonadal ridge were PAS (-). On electron microscope pre-Sertoli cells were seen mostly disorderly but also clustered and encircled the germ cells at some parts. The nuclei of pre-Sertoli cells were pulled at one pole of the cells. The cytoplasm at the other pole consisted of granuler and smooth endoplasmic reticulum, ribosomes, Golgi apparatus, mitochondria and large amount of glycogen granules (Fig. 2). Lipid granules were also seen in cytoplasm.
DISCUSSION
Pre-Sertoli cells are found disorderly in gonadal ridges as they are first developed. Shortly after that they proliferate and cumulate to form circular cords around germ cells (2). The accumulation of glycogen starting in pre-Sertoli cells is responsible for PAS(+) staining. The in vitro study of Matoba et al. stated that, testis specific accumulation of glycogen is a tissue-otonomous event as it is possible even with no serum or in the absence of adjacent mezonephrosis(4). The same study puts forward that the activation of PI3K-AKT pathway after Sry gene expression enhances glycogen accumulation in pre-Sertoli cells. Sox9, Mis, Dhh, Fgf9 are reported as pre-Sertoli cell marker genes(3). By using the fact that pre-Sertoli cells are stained PAS(+) because of glycogen they use as energy resource, it can easily be determined if the gonad is developing as male or female, before it is seen morphologically at 12,5dpc.
REFERENCES
1. Albrecht K H, and Eicher E M. (2001) Evidence That Sry Is Expressed in Pre-Sertoli Cells and Sertoli and Granulosa Cells Have a Common Precursor. Dev Biol 240, 92–107 2. Chen S, Liu Y. (2016) Testis cord maintenance in Mouse emmryos: Genes and Signaling. Biol Reprod. 94(2): 42 3. Cory AT, Boyer A, Pilon N, Lussier JG, Silversides DW.( 2007) Presumptive pre-Sertoli cells express genes involved in cell proliferation and cell signalling during a critical window in early testis differentiation. Mol Reprod Dev74(12):1491-504 4. Matoba S, Kanai Y, Kidokoro T, Kanai-Azuma M, Kawakami H, Hayashi Y, Kurohmaru M. (2005) A novel Sry-downstream cellular event which preserves the readily available energy source of glycogen in mouse sex differentiation. J Cell Sci. 1;118(Pt 7):1449-59


Merve ALBAYRAK, Özge HÜRDOĞAN, Fadime AKTAR, Ekin KUNTSAL, Leyla TAPUL (Istanbul, Turkey)
08:00 - 18:15 #6459 - LS07-083 Examination Of Retinoic Acid And Oct3/4 Relationship In Gonadal Development.
LS07-083 Examination Of Retinoic Acid And Oct3/4 Relationship In Gonadal Development.

INTRODUCTION

Early developmentof the gonads is monitored in the same morphological appearance in both sexes. Retinoic acid, plays a role in the formation process of mammalian germ cells and is also effective in the selection of male or female identity (2).  Oct3/4, which is a transcription factor, is expressed in blastula, morula, inner cell mass of blastocyst and then in the primordial germ cells (8). Retinoic acid has been reported to be one of the possible regulators of Oct3/4 expression (3,7). This study was planned to evaluate the effects of the exogenous retinoic acid on gonadal development in mouse embryos and Oct3/4 expression of primordial germ cells.

MATERIALS AND METHODS

In this study, we used 12 Balb/c pregnant mice. No drug was given to the control group. The experimental group of Balb/c mice were given by oral gavage a dose of 80 mg / kg of retinoic acid dissolved in a mixture of absolute ethyl alcohol-corn oil (the days of 6.5, 7.5, 8.5). In the meantime, the second control group was formed and given by oral gavage only a suspension of absolute ethyl alcohol-corn oil for 3 days. Total of 73 embryos 11.5 - 12.5dpc from the control and experimental groups were evaluated.

RESULTS

In fetal gonads of the experimental group (Fig. 1and 2), a smaller number of primordial germ cells was marked with Oct 3/4  immunohistochemically compared to the first and second control groups.

DISCUSSION

A fine set of changes in the levels of retinoic acid are reported to control gonadal development at  different stages of  embryogenesis (1). Retinoic acid has been reported to have an important role in the sex differentiation of mouse gonads and shows its effect as a meiosis inducing factor  (4,5). Suppression of Oct3/4 expression in primordial germ cells that reached and settled in the gonads, is a critical step in the process of embryogenesis. A retinoic acid sensitive element localized in the promoter-enhancer region has been reported to play a role in suppression of Oct 3/4 in a study of embryonal carcinoma cells(6). The study concluded that, retinoic acid regulates the development and differentiation of primordial germ cells during embryogenesis by suppressing Oct 3/4 expression and the opinion to control this process externally by using activators or inhibitors of retinoic acid receptors, become stronger.

REFERENCES

1.  Bowles J, Knight D, Smith C, Wilhelm D, Richman J, Mamiya S, Yashiro K, Chawengsaksophak K, Wilson   MJ, Rossant J, Hamada H, Koopman P. 2006. Retinoid signaling determines germ cell fate in mice. Science, 28;312(5773), 596-600.

2.  Bowles J, Koopman P. 2007. Retinoic acid, meiosis and germ cell fate in mammals. Development, 134(19), 3401-3411.

3. Fuhrmann G, Chung AC, Jackson KJ, Hummelke G, Baniahmad A, Sutter J, Sylvester I, Schöler HR, Cooney AJ. 2001. Mouse germline restriction of Oct4 expression by germ cell nuclear factor. Developmental Cell, 1(3), 377–387.

4.  Koubova J, Menke DB, Zhou Q, Capel B, Griswold MD, Page DC. 2006. Retinoic acid regulates sex-specific timing of  meiotic initiation  in mice. Proceedings  of The National Academy of Sciences, 103(8), 2474-2479.

5. Ohta K, Lin Y, Hogg N, Yamamoto M, Yamazaki Y. 2010. Direct effects of retinoic acid on entry of fetal male germ cells into meiosis in mice. Biology of Reproduction, 83(6), 1056-1063.

6.  Pikarsky E, Sharir H, Ben-Shushan E, Bergman Y. 1994. Retinoic acid represses Oct-3/4 gene expression through several retinoic acid-responsive elements located in the promoter-enhancer region. Molecular and Cellular Biology, 14(2), 1026-1038.

7.  Saiti D, Lacham-Kaplan O. 2007. Mouse germ cell development in-vivo and in-vitro. Biomark Insights, 2, 241-252.

8.  Spiller CM, Bowles J. 2015. Sex determination in mammalian germ cells. Asian Journal of Andrology, 17(3), 427-432.


Merve ALBAYRAK, Leyla TAPUL (Istanbul, Turkey)
08:00 - 18:15 #8310 - LS08-084 The effects of Noni on the TNF-α, iNOS levels and plasma cell numbers in the spleen of PNMC administered rats.
The effects of Noni on the TNF-α, iNOS levels and plasma cell numbers in the spleen of PNMC administered rats.

Noni is a native fruit which grows abundantly from Southeast Asia to Australia and is cultivated in Polynesia, India, the Caribbean, Central and northern South America. Morinda citrifolia L. (Noni), family Rubiaceae, has been used in Polynesia for over 2000 years in traditional medicine. Noni, has been reported to show a wide range of therapeutic effects including anticancer, anti inflammatory and antioxidant effects. The 3-methyl-4-nitrophenol (PNMC) isolated from diesel exhaust particles and also a degradation product of the insecticide fenitrothion. In this study we aimed to evaluate the effects on TNF-α and iNOS immunohistochemically and investigate the effects of Noni on plasma cell distribution in the spleen of rats exposed to PNMC. In the study, fifty-six mature male rats were randomly divided into eight groups (n: 7). Control group received phosphate-buffered saline+0.05% Tween-80 (vehicle). First experimental group received only Noni and other experimental groups received 1, 10 and 100 mg/kg PNMC (S.C) alone or in combination with Noni (2 ml per rat by gavage) respectively for 5 days. At the sixth day animals were sacrificed and spleen tissues were removed and weighted. After routine histological process, paraffin sections were stained with methyl green-pyronin for identification of plasma cells and TNF-α and iNOS antibodies were applied immunohistochemically and evaluated under light microscope. Immunohistochemical staining of TNF-α and iNOS were eveluated with histological scoring system (H-scores). Spleen indices were close to control in Noni administered groups. Plasma cell numbers were decreased in 1, 10 and 100 mg/kg PNMC recevied groups (P<0.001) while plasma cell numbers were close to control in Noni recevied groups. According to TNF-α and iNOS H-score results, the values of Noni recevied groups were similar to control. TNF-α and iNOS H-Score levels were increased in all PNMC recevied groups. Noni administration showed no effect on TNF-α H-Score levels, however in Noni+1 mg/kg PNMC combination group iNOS H-Score levels were decreased obviously with the effect of Noni (P<0.001). According to these results, it has been shown that oral administration of Noni has positive effects on plasma cell numbers in the spleen of rats which exposed to various doses of PNMC and on iNOS levels in the spleen of 1 mg/kg PNMC administered rats.


Elif İlkay IKITIMUR-ARMUTAK, Suzan DAGLIOGLU (Istanbul, Turkey), Funda YIGIT, Osman Behzat Burak ESENER, Sonmez KIVILCIM, Ebru GUREL-GUREVIN, Abit AKTAS, Yilmazer NADIM
08:00 - 18:15 #4779 - LS08-085 Investigation on Effects of Atorvastatin and Gliclazide Combination Therapy on Male Reproductive System on Streptozotocin-Induced Diabetic Rats.
LS08-085 Investigation on Effects of Atorvastatin and Gliclazide Combination Therapy on Male Reproductive System on Streptozotocin-Induced Diabetic Rats.

Diabetes Mellitus is characterized by hyperglycemia resulting from abnormalities in insulin secretion, insulin action, or both. It is one of the most serious challanges of 21th century because of both increased prevalence due to industrialization, urbanization and changed lifestyle habits, and socio-economic impacts. Lifestyle reforms, treatment of oral antidiabetics for glycemic control and of statins to improve the dyslipidemia are crucial in the prevention and treatment of cardiovascular diseases caused by diabetes. Numerous studies proved that diabetes has negative effects on male reproductive system, however, data obtained about atorvastatin and gliclazide are conflicted.

In this study diabetes was induced in 250-300g young adult male Sprague-Dawley rats by streptozotocin. Diabetic rats were given atorvastatin, gliclazide and atorvastatin/gliclazide combination by oral gavage for 28 days. Rats were sacrificed on day 28 and hormone analysis in heart blood, morphological evaluations in sperms, light microscopic and ultrastructural examinations in testes were conducted. The obtained data were analyzed by using one-way ANOVA.

The following results were obtained: (i) diabetes and individually the drugs did not change the hormone levels, while atorvastatin/gliclazide combination reduced the testosterone level, (ii) diabetes decreased sperm count, altered sperm morphology, caused damage in testes and impaired spermatogenesis, (iii) in diabetic rats atorvastatin did not effect sperm count and not improve testes structure, yet ameliorated sperm morphology, (iv) in diabetic rats gliclazide increased sperm count, ameliorated sperm morphology, improved testes structure and spermatogenesis, (v) in diabetic rats atorvastatin/gliclazide combination did not effect sperm count, ameliorated sperm morphology, improved testes structure, however, the improvement has not reached to control level.

In conclusion, data obtained from the study, which the effects of atorvastatin and gliclazide combination in diabetes-induced damage on male reproductive system were evaluated, is believed to contribute to the literature.


Ezgi ÖZTAŞ, Tuğba EKIZ YILMAZ (istanbul, Turkey), Elif GÜZEL, Gül ÖZHAN
08:00 - 18:15 #4780 - LS08-086 Effect of Systemic D Vitamin Supplementation on The Treatment of Full Thickness Articular Cartilage Defects.
LS08-086 Effect of Systemic D Vitamin Supplementation on The Treatment of Full Thickness Articular Cartilage Defects.

Although the articular cartilage is complex and thin structure it is crucial in the structure and function of the joint. Treatment of the articular cartilage injuries has an significant role in orthopedic practice. Nevertheless, to heal the damaged articular cartilage in hyaline cartilage has not yet been achieved. In this study it was aimed to evaluate not only the effects of vitamin D to the cellular and extracellular matrix components of the articular cartilage but also the effects of vitamin D in the healing of the damaged articular cartilage by the microfracture technique which is frequently used in the treatment of the articular cartilage injuries. 

In this study, twenty-four 18-months-old New Zealand rabbits were divided into four groups based on the treatment modality. Standart full thickness articular cartilage defect was applied in the medial femoral condile of the right knee of the all rabbits in the experimental groups. In group 1, only cartilage defect was established. After cartilage defect, in group 2, microfracture technique was applied. In Group 3, vitamin D was supplemented. And in group 4 both microfracture technique and vitamin D supplementation was applied as a treatment method. All animals were sacrified after 16 weeks and were evaluated histologically by ICRS, O’Driscoll and Pineda scoring systems.

It was not observed any improvement in the area of the tissue defect in group 1. In group 2, the recovery of the defected tissue was not pure hyaline cartilage character. It was in the fibrous cartilage structure. Moreover a few round cells resembling chondrocytes were observed especially in the deep part of the healing tissue within the fibrous matrix. In group 3, the healing tissue in the defect area was a fibrous matrix character and although most of the embedded cells in matrix were fibroblast character, the existence of cartilage-like cells was also recognized. Fibrotic tissue was observed in the superficial part of the healing tissue in the cartilage defect area but also in the deep layer close to the bone hyaline cartilage-like tissue repairing was detected. Even though all other groups were reached statistically significant better results compared with Group 1, hyalin-like cartilage repair was observed in Group 4. But this repair degree could not reach statistical significance when compared with Group 2.

As a result, in this study it was shown that the systemic vitamin D supplementation has a positive effect in the treatment of local full-thickness articular cartilage defects in rabbits. We suggest that more comprehensive and further long term studies are necessary for better understanding of the effects of vitamin D on the articular cartilage defects.


Okan TOK, Tuğba EKIZ YILMAZ (istanbul, Turkey), Elif GÜZEL, Önder AYDINGÖZ, Mehmet Can ÜNLÜ
08:00 - 18:15 #4977 - LS08-087 Histologic And Histomorphometric Comparison Of Bone Regeneration Between Bone Morphogenetic Protein-2 And Platelet-Derived Growth Factor-BB In Guinea Pigs.
LS08-087 Histologic And Histomorphometric Comparison Of Bone Regeneration Between Bone Morphogenetic Protein-2 And Platelet-Derived Growth Factor-BB In Guinea Pigs.

In dental implant treatment, the atrophic alveolar crest remains a challenging area for optimum rehabilitation. Growth factors have great potential for bone regeneration at the atrophied alveolar crest. Among the various growth factors, recombinant human bone morphogenic protein-2 (rhBMP-2) and recombinant human platelet-derived growth factor (rhPDGF) have received a great deal of attention. This study evaluates the efficacy of rhBMP-2 and rhPDGF-BB delivered via absorbable collagen sponge (ACS) on bone formation in guinea pig.

A total of 24 adult Dunkin-Hartley guinea pigs aged 6–7 months, weighing 700–800 g were randomly assigned initially into two groups as 15 and 45 days of healing which have 12 animals in each group. Three-millimeter-circular bone defects were created on the tibias of animals as 2 defects per each tibia and totally 4 defects per each animal. The four groups in each animal corresponded to the biomaterial used to fill the created bone defects as follows: rhBMP-2+ACS, rhPDGF-BB+ACS, ACS only (positive control), and no treatment (empty; negative control). To prevent the possibility of growth factor interactions between two biomaterials, randomization was performed so that rhBMP-2+ACS and rhPDGF-BB+ACS were not applied to the same tibia consecutively. New bone formation was evaluated histologically and histomorphometrically at 15 (early healing) and 45 days (late healing). Data were subjected to statistical analysis. Quantities of new bone were analyzed with one-way ANOVA followed by post hoc Holm-Sidak testing. Statistical calculations were performed using Sigma Stat for Windows, version 3.0; P < 0.05 was considered to be significant.

At day 15, new bone formation was seen at the peripheral portion of the defect where ACS was partly resorbed. Significant fibrous callus formation was observed in the rhBMP-2+ACS group. The amounts of fibrous callus and newly formed bone trabeculae in the rhBMP-2+ACS group were significantly higher than in the other groups (P < 0.05). Highest amount of new bone per defect area was seen in the rhBMP-2+ACS group at the end of day 15. New bone formation in the rhPDGF-BB+ACS group was lower than that observed in the rhBMP-2+ACS group on day 15. However, the amount of newly formed bone trabeculae was significantly higher than in the control groups (ACS only and empty; P < 0.05). The ratio of new bone to total defect area increased significantly over time. At the end of day 45, a large part of the ACS had been resorbed. New bone per defect area at day 45 was significantly higher than at day 15 in the rhPDGF BB+ACS group (P ≤ 0.001). In the rhPDGF-BB+ACS group, at the end of day 45, the defects were almost filled with new bone, and remodeling was determined. At the end of day 45, new bone formation was significantly higher in the rhPDGF-BB+ACS group than in the control groups (P = 0.007 and P = 0.006 for empty and ACS only groups, respectively). There was no significant difference between the rhBMP-2+ACS and rhPDGF-BB+ACS groups at day 45.

Advances in suitable carriers, coupled with the osteoinductive effects of rhBMP-2 and rhPDGF-BB, could ultimately create a future gold standard for bone grafting. Although further long-term studies and clinical trials are required, the findings presented herein suggest a promising use of rhBMP-2 and rhPDGF-BB for bone regeneration applications.


Gokhan GUVEN, Selenay FURAT RENCBER (KOCAELI, Turkey), Elif GUZEL MEYDANLI, Alper GULTEKIN, Gamze SENOL GUVEN, Selim ERSANLI
08:00 - 18:15 #5122 - LS08-088 Bismuth Ferrite Harmonic Nanoparticles and Biphotonic Microscopy: Innovative Approach to Track In Vivo Muscle Stem Cells, a Promising Candidate for Cell Therapy of Muscular Dystrophy.
LS08-088 Bismuth Ferrite Harmonic Nanoparticles and Biphotonic Microscopy: Innovative Approach to Track In Vivo Muscle Stem Cells, a Promising Candidate for Cell Therapy of Muscular Dystrophy.

Bismuth Ferrite Harmonic Nanoparticles and Biphotonic Microscopy: Innovative Approach to Track In Vivo Muscle Stem Cells, a Promising Candidate for Cell Therapy of Muscular Dystrophy

 

Duchenne Muscular Dystrophy (DMD) is a fatal X-linked recessive muscle disease that represents the most common form of muscular dystrophy, affecting one in 5,000 male births. It is caused by mutations or deletions in the gene encoding dystrophin leading to the lack of dystrophin protein. This results in muscle fiber degeneration followed by severe endomysial sclerosis, leading to progressive muscle weakness and premature death at the age of 20-30 years. Currently, there is no effective treatment for DMD. In 2011, we showed that a stem cell population (named MuStem cells) isolated from healthy dog skeletal muscle induces long-term muscle repair and striking clinical efficacy after its systemic delivery in the dystrophic dog representing the clinically relevant DMD animal model. During last years, our group isolated the human counterparts (hMuStem) and demonstrated that they share the same phenotypic and in vitro behavioral features of canine cells. Currently, little is known about the homing in the muscle tissue and the whole body distribution of the MuStem cells following a systemic delivery which are nevertheless essential to determine the safety and efficacy aspect of the therapeutic strategy. To address this need, we use bismuth ferrite harmonic nanoparticles (BFO-NP, 100-120 nm range) as probes for the tracking of MuStem cells to study in vivo the hMuStem cell engraftment.

 

The nanoparticles are very interesting tools because capable to generate both Second Harmonic Generation (SHG) and Third Harmonic Generation (THG) signals. The origin of the signals is related to the crystalline properties of the nanoparticles, in particular its peculiar non-centrosymmetric structure. Cell tracking is therefore possible from the NPs SHG and THG signals detected with a two-photon confocal microscope A1RMP Nikon and this work provides the opportunity for long-term, three-dimensional cell tracking.

 

Uncoated and poly-ethylene glycol(PEG)-coated BFO-NP were investigated to label hMuStem cells in vitro. The cells were exposed to BFO-NP and BFO-PEG-NP. Localisation and cytotoxicity of the NPs were investigated in vitro during two weeks.BFO-labeled cells were tracked in the mouse Tibialis anterior muscle after their intramuscular injection by using biphotonic microscopy.

 

 

Acknowledgements

This research was supported by funds from the FEDER (Fonds Européens de Développement Régional N°37085 and 38436). It was carried out in the context of the IHU-Cesti project that received French government financial support managed by the National Research Agency via the investment for the future programme ANR-10-IBHU-005. The IHU-Cesti project is also supported by Nantes Metropole and the Pays de la Loire Region.


Laurence DUBREIL (INRA/ONIRIS), Isabelle LEROUX, Mireille LEDEVIN, Claire LOVO, Cindy SCHLEDER, Lydie LAGALICE, Sandrine GERBER, Luigi BONACINA, Karl ROUGER
08:00 - 18:15 #5815 - LS08-090 Light and electron microscopic evaluation of lattice corneal dystrophy (LCD).
LS08-090 Light and electron microscopic evaluation of lattice corneal dystrophy (LCD).

INTRODUCTION

There are three types of corneal dystrophies: anterior, posterior and stromal. Lattice corneal dystrophies (LCD) are a part of stromal dystrophies and characterized by an accumulation of amyloid deposition with in the stroma. LCD is diognosed with biomicroscopic examination and the diognosis confirmed by histological examination after keratoplasty. Genetic analysis may be required for specific cases.

In our study, the corneal buttons of four patients, three of them belonging to the same family, who applied to the Ophthalmology Clinic of Cerrahpasa Medical Faculty with lattice corneal dystrophy, histologically examined with light and electron microscopies.

MATERIAL-METHOD

For light microscopic examination, a portion of corneal buttons were embedded into the parafine blocks after fixation and dehidration steps. Parafine blocks were cut as 5 µ sections and stained with hematoxylen & eosin and periodic acid & Schiff (PAS). For electron microscopic examination, the other pieces of corneal buttons were fixed glutaraldehyde and osmium tetroxide (OsO4). After the dehidration, corneal buttons embedded into araldite and the blocks were sectioned 500-700Å. The sections taken on copper grids were analyzed and photographed.   

FINDINGS

In the light microscopic examination of hematoxylin & eosin stained corneal buttons; the local deposits seen in a circular arrangment, was observed and it was suggested that these were amyloid deposits. In only one of the four patients’ corneal buttons, these deposits were seen in the stroma, but in the other three patients’, belonging to the same family, deposits increased epithelial level and led to significant damage to the epithelium. When the samples were stained with periodic acid- Schiff reagent, positive reaction was observed in these deposits. Electron microscopic examination revealed that typical amyloid fibrils also occurred in deposits.

Despite local areas were damaged due to these amyloid deposits, no inflammation was observed.

CONCLUSION

As in other corneal dystrophies, a systematic approach and histopathological evaluation, including special staining and ultrastructural studies, are critical to a correct diagnosis, also in LCD. Therefore, it is important to make a histopathologic examination for all grafts clinically diagnosed or undiagnosed.


Ismail SECKIN, Mustafa Erdogan CICIK, Osman Sevki ARSLAN, Basak ISILDAR (ISTANBUL, Turkey), Cezmi DOĞAN, Ozan BURGAZDERE, Samira HAGVERDİYEVA
08:00 - 18:15 #5824 - LS08-091 Evaluation of antibacterial mechanism of polymeric nano-particles by scanning transmission electron microscopy-cathodoluminescence technique.
LS08-091 Evaluation of antibacterial mechanism of polymeric nano-particles by scanning transmission electron microscopy-cathodoluminescence technique.

Introduction:

Biofilm infection disease has become a serious problem as it is related to various types of refractory infections. Biofilms, with a three-dimensional (3D) structure, are formed by bacterial cells covered by a thick film of extracellular polymeric substance matrix. This 3D matrix-like structure can protect the bacterial cells within the biofilm from antibacterial drugs, rendering drug therapy against biofilm infection disease ineffective. This problem accelerates several refractory infections, such as periodontal disease and nosocomial infectious disease. Therefore, we have developed drug-encapsulated polymeric nanoparticles (NPs) for drug delivery system to treat the biofilm infection disease. If microscopic observation of efficacy of prepared NPs at a nanoscale level can be carried out, preparation of suitable NPs for drug delivery can be determined. Therefore, the goal of this study is developing a scanning transmission electron microscopy-cathodoluminescence (STEM-CL) technique for evaluation of the antibacterial activity derived from NPs on the bacterial cells within the biofilm.

Materials and method:

S. epidermidis was used as a model biofilm forming bacterial strain. An ionic liquid (IL) 1-butyl-3-methylimidazolium tetrafluoroborate was employed in sample preparation of STEM-CL observation. The STEM-CL observation was carried out by a JEM 2100M using a Gatan Vulcan TEM-CL holder with a liquid nitrogen cooling system. For the TEM observation, the sample preparation method using IL and TEM observation using the cooling holder was combined. Samples for STEM and TEM observations were cooled down to 100 K. In addition, field emission-scanning electron microscopy observation was also performed using a JXA-8530FA. Using the LIVE/DEAD BacLight bacterial viability kit, antibacterial assays of the prepared NPs on the biofilm were performed. Polymeric NPs were prepared with polymeric poly (DL-lactide-co-glycolide) (lactide:glycolide = 75:25, PLGA) NPs and Soluplus® (Sol) micelles using the emulsion solvent diffusion (ESD) method. Clarithromycin and chitosan were used for antibacterial drug and surface modifier for NPs. The particle size and zeta potential of prepared NPs were determined using a Zetasizer Nano ZS90.

Results and discussion:

We developed the STEM-CL technique for design of polymeric NPs on the biofilm. By CL imaging of fluorescence substance derived from NPs, the antibacterial activity and ability of the biofilm removal of the prepared NPs that have never been revealed were visualized at a nanoscale level. Moreover, a combination of several types of electron microscopy observations enables to reveal different antibacterial mechanism of respectively PLGA NPs and Sol micelle NPs. CS-modified Sol micelle NPs can intrude into the bacterial cells within a short time of the treatment and exert high antibacterial activity by the induction of abnormal cell division and inhibition of cell division. The results of antibacterial assay using the LIVE/DEAD BacLight bacterial viability kit supported the electron microscopy studies. Based on the information obtained from the electron microscopy measurements, NPs can be suitably designed for the inhibition of biofilm formation and treatment against biofilm infections. The developed methodology can contribute to the nanoscale visualization of the antibacterial activity and other deformable composite materials.We expect this technique to be applicable to various fields such as pharmacy, engineering, biology, and medical science.

ACKNOWLEDGMENT

This study was partially supported by Grants-in-Aid for Scientific Research on Innovative Areas "Nano Informatics" Number 25106004, JSPS KAKENHI Grant Number 50574448. A part of this work was conducted in Nagoya University, supported by Nanotechnology Platform Program (Molecule and Material Synthesis) of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan. The authors are grateful to Prof. M. Tanemura of Nagoya Institute of Technology, Japan for useful discussion regarding TEM measurement.

 


Chisato TAKAHASHI (Nagoya, Japan), Noriko OGAWA, Shunsuke MUTO, Yoshiaki KAWASHIMA, Hiromitsu YAMAMOTO
08:00 - 18:15 #5847 - LS08-092 The Effect of Vitamin E on Ovarian Damage Caused by Nicotine Administration.
LS08-092 The Effect of Vitamin E on Ovarian Damage Caused by Nicotine Administration.

Nicotine causes the formation of free radicals and oxidative damage. Vitamin E which is required in reproduction is a potent antioxidant found in nature. In our study, due to increasing tobacco consumption in women in especially recent years it was aimed to examine the nicotine induced damage in ovary, its mechanisms and the curative effects of vitamin E on these damages.

In our study, rats (12 week old- Wistar female rats) were treated with nicotine (1 mg/kg/day, intraperitoneally (ip)) and vitamin E (α-tocopherol) (200 mg/kg/day, ip) alone or in combination in experimental groups. Levels of 17ß-estradiol, LPO (Lipid peroxidation) and MDA (Malondialdehyde) were measured in serum of the animals. Hematoxylin and eosin (H+E) staining and labeling of Ki-67 (a cellular marker for proliferation), 4-HNE (4-Hydroxynonenal; produced by lipid peroxidation in cells) and TUNEL (Terminal deoxynucleotidyl transferase (TdT)-mediated dUTP nick end labeling; Apoptosis Detection)  in paraffin sections of the ovaries was performed, immunohistochemical changes were assessed by scoring system. Ultrastructural changes in araldite sections were evaluated with the electron microscopy. The data were compared statistically.

Decreased estrogen level and increased levels of LPO and MDA in serum; decreased the number of ovarian follicles and Ki-67-labeling in granulosa cells of follicles; increased 4-HNE immunoreactivity and TUNEL-labeling were observed in nicotine-treated rats. In these animals, nicotine co-treatment with vitamin E significantly reduced the increased levels of LPO and MDA in serum and 4-HNE immunoreactivity and TUNEL-labeling in ovary sections; significantly increased serum estrogen level, the number of ovarian follicles and Ki-67-labeling in granulosa cells of follicles. Vitamin E demonstrated positive and curative effect on biochemical and histological parameters compared to the control group. Ultrastructurally, frequent apoptotic profiles were observed in granulosa cells in follicles in nicotine group and vitamin E co-administration led to ultrastructural alleviation of apoptotic process.

In conclusion, our biochemical, immunohistochemical and ultrastructural level findings demonstrated that oxidative stress-induced adverse effects caused by nicotine in folliculogenesis and streoidogenesis occur via lipid peroxidation in granulosa cells. Our data suggest that vitamin E may represent an alternative of pharmacologic treatment for preserving fertility owing to its beneficial effects on the nicotine induced damages occurred in the granulosa cells.


Zehra SEZER (Istanbul, Turkey), Tuğba EKIZ YILMAZ, Zeynep GÜNGÖR, Elif GUZEL
08:00 - 18:15 #5944 - LS08-093 Three-dimensional visualization of Tick-borne encephalitis virus-cell interactions.
LS08-093 Three-dimensional visualization of Tick-borne encephalitis virus-cell interactions.

Tick-borne encephalitis virus (TBEV) is the etiological agent of Tick-borne encephalitis, a serious neurological human infection. The endemic region is Europe and Asia with more than 10,000 clinical cases every year. We used electron tomography (ET) technique for visualization of neural cells infected with TBEV prepared by high-pressure freezing followed by freeze substitution and embedded into epoxy resin [1, 2].  Images of three dimensional volume of the section enables better to understand alterations of neural cells caused by TBEV than 2D Transmission electron microscopy (TEM) projection images, where the visibility of structures depends crucially on section thickness. Here, we showed how to 3D visualization influenced an interpretation of obtained TEM results. Next, we discuss our experience with settings of optimal imaging conditions, appropriate resolution given by Crowther criterion [3], elongation factor [4] and necessity of using of the single or dual tomography.  ET was done like a single/dual axis using JEOL 2100F equipped with high tilt stage and Gatan camera Orius SC 1000 controlled with Serial EM software. Tomograms were aligned and reconstructed using IMOD software package. 3D models were generated by manually masking of the area of interest by means of IMOD or Amira.

Our results depicted mainly changes in organisation of rough endoplasmic reticulum (RER) induced by TBEV and a formation of virus-induced sub-compartments of RER called smooth membrane structures including a presence of pores. We found that cisterns of RER are often arranged into two tightly apposed cisterns. Depending on the type of host cells, used TBEV strains and length of infection, we described proliferation of RER with harboured sites of replication (3 days post infection) which are reorganised during the extensive infection stress (12 days post infection) into whorls with central part having features of an autophagosome [2]. In primary neurons infected by TBE strain Neudoerfl, virus-induced tubule-like structures (18 – 22 nm in diameter) were frequently observed inside of reorganised RER. Most of these structures were connected to the TBEV and run either in parallel lines or in different directions. In several cases, these tubule-like structures were surrounded with other tubules of 43.8 ± 4.3 nm (N = 7) in diameter [2]. Finally, we imaged vacuoles containing individual virions with nucleocapsids associated with host microtubules [2].

The study was supported by the Technology Agency of the Czech Republic (TE01020118) and from the program for large research infrastructures of the Ministry of Education, Youth and Sports within the project „National Infrastructure for Biological and Medicinal Imaging  (Czech-BioImaging LM2015062)

1. M. Palus et al., J. Gen. Virol. (2014) Nov. 95(Pt 11):2411-26. doi: 10.1099/vir.0.068411-0
2. Bily et al., Sci Rep. (2015) Jun 15; 5:10745. doi: 10.1038/srep10745
3. R. A. Crowther et al., Proc. Roc. Soc. Lond. (1970). A 317.
4. M. Radermacher, J. of El. Micro. Tech. 9 (4) (1988). 359–394


Tomas BILY (Ceske Budejovice, Czech Republic), Martin PALUS, Marie VANCOVA, Daniel RUZEK, Jana NEBESAROVA
08:00 - 18:15 #6086 - LS08-095 Rotavirus double and triple layered viral particles: correlative characterization using electron microscopy, disc centrifuge and capillary electrophoresis.
LS08-095 Rotavirus double and triple layered viral particles: correlative characterization using electron microscopy, disc centrifuge and capillary electrophoresis.

Rotavirus (Reoviridae) viral particles consist of capsids with 3 concentric protein layers surrounding the virus genetic material. The outer layer is composed of the VP4 and VP7 proteins, which independently elicit neutralizing antibodies and induce protective immunity.

Rotarix™, GSK live attenuated Rotavirus vaccine, was characterized by EM. The observations show that the vaccine contains both triple-layered particles (TLPs) containing all 3 protein layers and double-layered particles (DLPs) which lack the outer capsid proteins VP4 and VP7.

As DLPs are non-infectious, it may be of importance to address the question of their abundance vs. TLPs in bulk preparations. Although such information can be obtained by EM, the method is relatively impractical for this purpose, particularly for routine analysis, as high number of particles should be observed and sized to get accurate relative abundances.

To determine the size and quantify the relative abundance of TLPs and DLPs on large populations of viral particles in bulk preparations, two size-based, orthogonal analytical techniques were applied to detect these particles: disc centrifuge (DC) and capillary electrophoresis (CE).
To confirm the capacity of both methods to distinguish clearly the two types of capsids, TLPs and DLPs were partially purified using CsCL gradient. They were characterized by EM negative staining (Fig. 1) and cryo-TEM (Fig. 2). Their apparent diameter difference of about 10 nm was well correlated in both techniques. The profiles obtained by DC and CE (Fig. 3) show the well-resolved identification.

In addition, further confirmation was obtained by incubation of the preparations with EDTA, to remove the calcium required for VP7 protein stabilisation and thus to convert TLPs into DLPs [1]. The shift from TLPs to DLPs is clearly visible with CE (not shown), DC and also EM (Fig. 4).
Dynamic Light Scattering (DLS) was also evaluated and works fine with the partially purified samples of either TLPs or DLPs. The shift from TLPs to DLPs by this method is clearly observable as well (not shown). However, DLS does not allow distinguishing clearly the two populations of capsids in real samples with mixed TLPs and DLPs.

These orthogonal structural and sizing analysis methods can therefore be combined to assess and measure accurately DLPs/TLPs ratio. They thus provide a tool to understand the possible link of this ratio with the immunological potency of vaccine preparations.

 

  1. Mathis PK, Ciarlet M, Campbell KM, Wang S, Einterz Owen K, Ranheim      TS (2010) Separation of rotavirus double-layered particles and      triple-layered particles by capillary zone electrophoresis. Journal of      Virological Methods 169: 13-21

Agnes MISEUR (Rixensart, Belgium), Astrid COPPENS, Céline CHAPELLE, Christine HENS, Philippe BLAIN, Ghislain DELPIERRE, Michel DESCHUYTENEER
08:00 - 18:15 #6157 - LS08-096 The Effect of Modified University of Wisconsin Solution on Kidney Preservation Time.
LS08-096 The Effect of Modified University of Wisconsin Solution on Kidney Preservation Time.

Protection of organ function is important factor for the success of organ transplantation. Protection activity and also protection time period are dependent on a large scale of  pre-transplant preservation solutions. Therefore, donor organs are being preserved in special preservation solutions such as University of Wisconsin (UW), Histidin-Triptophan-Ketogluterate (HTK) and Celcior solution. For that aim, UW is the most preferred solution, even so, this solution could not preserve the organs over 36 hours. In this study, the ingredients of the UW solution were changed to extend the preservation time and also to provide more effective protection. Rat model is used for investigation of time related morphological changes between UW (group I) and Modified UW (Mod UW) (group II) solutions during preservation time. Rat kidneys were perfused with respective solutions. Totally perfused kidneys were removed and placed either in UW or Mod UW solutions and also kept during 2, 10, 24 and 72 h at 4⁰ C. Kidney tissue samples were taken at given time intervals and fixed with 10% formaldehyde, and then these samples were prepared for paraffin sections. These tissue samples were also taken at 72nd hour, they were fixed in 2.5% glutaraldehyde and processed for epoxy resin embedding. For light microscopical evaluation, renal injury, based on tubular and glomerular degeneration, inflammatory cell infiltration, and vasocongestion has been scored with using a scale ranging from 0 to 3 (0: none; 1: mild; 2: moderate; and 3:severe) for each criterion. Liquid samples were also taken 2, 10, 24 and 72 h at 4⁰ C from the storage media and investigated for LDH activity which was measured using standard chemistry method (Siemens ADVIA 1800 chemistry System). Microscopical examinations showed that Mod UW solution provided good preservation for all time intervals than UW solution. These results are consistent with lactate dehydrogenase (LDH) levels. Vacuolated tubular cells, as well as decreased renal tubules and glomerular degeneration described a prominent tissue injury revealed at 72nd h of UW group.  Podocyte degeneration, formation of hump with GBM thickening revealed in 72nd h of UW group at transmission electron microscopical level. These degeneration parameters were observed less than in 72nd h of Mod UW group. It was concluded that Mod UW solution at low temperature is very effective and suitable for preservation up to 72 h.

References

1. Goktas C, Coskun A, Bicik Z, Horuz R, Unsal I, Serteser M, Albayrak S, Sarica K. Evaluating ESWL-induced renal injury based on urinary TNF-α, IL-1α, and IL-6 levels. Urol Res, 40: 569–73, 2012

2. Gunal O, Coskun A, Aslaner A, Yildirim U. Does melatonin alleviate cold preservation injury of the liver Turk J Med Sci, 40: 465–70, 2010

3. S Öner, F Ercan, S Arbak: time-dependent morphological alterations of cold-stored small bowel in Euro-Collins and Ringer’s lactate solutions. Acta Histochemica, 10: 207–217,2004

This study was financed by The Scientific and Technological Research Council of Turkey (TUBITAK), project number 113S847


Abdurrahman COSKUN, Cumhur YEGEN, Serap ARBAK, Wafi ATTAALLAH, Omer GUNAL, Ismail SECKIN, Banu CETINER, Zeynep YILDIRIM, Yigit ERDEMGIL, Merve ACIKEL ELMAS (Istanbul, Turkey), Sibel DEMIRCI, Ozge CAN, Mustafa SERTESER, Aysel OZPINAR, Gulcin BASDEMIR, Ahmet BELCE, Ibrahim UNSAL
08:00 - 18:15 #6441 - LS08-097 Modified University of Wisconsin Solution With Melatonin and the Its Efficacy of Kidney Preservation Time.
LS08-097 Modified University of Wisconsin Solution With Melatonin and the Its Efficacy of Kidney Preservation Time.

Organ transplantation solutions are used for protection of organ functions for a long time. In order to provide long lasting time period for organ preservation, donor organs are kept in special preservation solutions such as University of Wisconsin (UW), Histidine-Triptophane-Ketogluterate (HTK) and Celcior solutions. Although UW is the most preferred solution, preservation time even for the kidney tissue, has not exceeded over 36 hours. The aim of this study is to extend the preservation time and also provide more effective protection. In order to provide better preservation,  the ingredients of the UW solution were changed (Mod UW), as well as melatonin was included (Mod UW+M)  in the preservation medium. Time-related morphological changes of rat kidneys in UW (group I), Modified UW (group II) and Modified UW+Melatonin (Mod UW+M) (group III) were comparatively investigated within this study. Totally perfused kidneys were removed and placed in UW, Mod UW and Mod UW +M solutions and kept during 2, 10, 24 and 72 h at 4⁰ C. Kidney tissue samples were taken at all given time intervals and these samples were prepared for paraffin sections. Kidney tissue samples, taken at 72nd hour, were fixed in 2.5% glutaraldehyde and prepared for epoxy resin embedding. Histopathological scoring system were performed for light microscopical evaluation by using a scale ranging from 0 to 3 (0: none; 1: mild; 2: moderate; and 3:severe) for each criterion. Histopathological parameters were renal injury, based on tubular and glomerular degeneration, inflammatory cell infiltration and vasocongestion. Liquid samples, taken at 2, 10, 24 and 72 h at 4⁰ C from the storage media, investigated for lactate dehydrogenase (LDH) activity which was measured using standard chemistry method (Siemens ADVIA 1800 chemistry System). Comparative findings at light and transmission electron microscopical levels revealed that preservation in Mod UW+M solution was statistically much more prominent in all time intervals, significantly at 72nd hour of preservation.  In all groups, LDH levels were consistent with morphological results. We could conclude that Mod UW+M was the most effective solution among the  experimental groups, especially  suitable for preservation up to 72 h. In this study,  the important efficacies of UW solution, a better protectant and melatonin,  an effective agent to be used in such systems, were highlighted.

References

1. Goktas C, Coskun A, Bicik Z, Horuz R, Unsal I, Serteser M, Albayrak S, Sarica K. Evaluating ESWL-induced renal injury based on urinary TNF-α, IL-1α, and IL-6 levels. Urol Res, 40: 569–73, 2012

2. Gunal O, Coskun A, Aslaner A, Yildirim U. Does melatonin alleviate cold preservation injury of the liver Turk J Med Sci, 40: 465–70, 2010

3. S Öner, F Ercan, S Arbak: time-dependent morphological alterations of cold-stored small bowel in Euro-Collins and Ringer’s lactate solutions. Acta Histochemica, 10: 207–217,2004

This study was financed by The Scientific and Technological Research Council of Turkey (TUBITAK), project number 113S847


Abdurrahman COSKUN, Cumhur YEGEN, Serap ARBAK (Istanbul, Turkey), Omer GUNAL, Wafi ATTAALLAH, Ismail SECKIN, Banu CETINER, Zeynep YILDIRIM, Yigit ERDEMGIL, Merve ACIKEL ELMAS, Sibel DEMIRCI, Ozge CAN, Mustafa SERTESER, Aysel OZPINAR, Gulcin BASDEMIR, Ahmet BELCE, Ibrahim UNSAL
08:00 - 18:15 #6460 - LS08-098 Diagnostic molecular biology with whole genome sequencing versus diagnostic electron microsopy - a change of paradigm in diagnostic EM?
LS08-098 Diagnostic molecular biology with whole genome sequencing versus diagnostic electron microsopy - a change of paradigm in diagnostic EM?

Starting in the 1960ies, with a common availability of high resolution microscopes and the introduction of negative staining and ultrathin sectioning of microwave embedded infectious tissues, pathogen diagnosis on basis of electron microscopy (EM) has become increasingly important. An EM-based lab diagnosis turned out to be useful in a wide spectrum of indications like "rapid diagnosis in emerging diseases", "search for otherwise undetectable agents" ("open view"), the need for "catch-all-methods" and/or "rapid differential diagnosis". Since then, the use of transmission electron microscopy, and to a lesser extent scanning electron microscopy provide a multiplex platform for the detection and differentiation of a wide range of pathogens (Fig. 1-3). Examples will be given. In past, EM was involved with the detection and identification of broad range of viruses some of which have impacted on human, veterinary and wildlife health. Many of the diseases caused by viruses have emerged from anthropogenic based perturbations of the environment including altered habitat e.g. changes in the number of vector breeding sites and/or host reservoirs, niche invasions, changes in biodiversity, genetic changes of disease vectors or pathogens, and environmental contamination of infectious agents.

However, the use of diagnostic EM declines radically since the late decade of the 20th century which was characterized by a continuous shifting of research interests to molecular biology. With whole genome sequencing some of the indications mentioned above like "catch-all-method" or "search for undetectable pathogens - open view" seem to be on first sight no longer existing. Is it now a change of paradigm, a still going onward decline or may diagnostic EM play still an essential role in pathogen diagnosis? The future of diagnostic EM, its constraints and its welfare for the society is discussed. Be aware, since September 11th executive authorities have noticed that molecular biology and EM complement each other and most modern diagnostic centres of disease control still execute both techniques in their diagnostic programme; but for how long?. Additionally increased mobility, changes in life style, global trade and social unrest are supporting the spread of emerging or re-emerging infections. Anyway, we should be aware that molecular biology of today with whole genome sequencing as well as electron microscopy bear a lot of uncertainties in their technical procedure - technical sources of error which should be always be in mind during diagnostic procedure.


Susanne RICHTER (Mödling, Austria)
08:00 - 18:15 #6509 - LS08-099 Efficient motor neuron targeting in adult mice by a single lumbar intrathecal rAAV9-eGFP administration: application for motor neuron diseases.
LS08-099 Efficient motor neuron targeting in adult mice by a single lumbar intrathecal rAAV9-eGFP administration: application for motor neuron diseases.

Spinal muscular atrophy (SMA) the second most common autosomal recessive disorder causes of childhood mortality affecting between 1/6000 to 1/10000 live births. SMA is due to deletion/mutations in the Survival Motor Neuron 1 (SMN1) gene. The disease is characterized by degeneration of spinal motor neurons (MNs), atrophy of skeletal muscles, and generalized weakness. SMA is clinically classified into four main types (I, II, III and IV) based on the age of onset and clinical severity. Currently, no curative treatment exists for SMA type II/III SMA patients representing the majority currently awaiting treatment.

Gene therapy, restoring SMN1 activity in MNs, is a promising therapeutic strategy for SMA. In the moderate forms (type II/III) of the disease, no lesion is found in peripheral organs. Thus, a targeted therapy directly into the CNS should be more appropriate. We have, recently, demonstrated that a single administration of an rAAV9 vector into the cerebrospinal fluid leads to an efficient transduction of MNs in non-human primates.

In order to treat our mouse model that can mimick the human pathology of type II/III SMA, the first main challenge was to develop an efficient and safety route of delivery that can target whole spinal cord and brain. In this context, we develop the lumbar intrathecal delivery (itlumb), by single percutaneous lumbar puncture. We demonstrate that a single lumbar intrathecal injection of rAAV9-eGFP vector using specific neuronal promoter can efficiently and specifically target MNs from proximal to distal part of the spinal cord in adult mice, wherease, using rAAV9-eGFP ubiquitous promoter, we observe both glial cells and MNs targeting (figure a, b and c). Surprisingly, by lumbar administration, we efficiently reach the brain and target neurons and glial cells using rAAV9 ubiquitous promoter (figure g).

Then, we compared the serotypes 9 and 10 of AAV vector in order to demonstrate which serotype is the most efficient to target MNs after intrathecal delivery. We used the Synapsin 1 (SYN1) promoter, that lead to specific expression in neuron cells population, in adult mice, by lumbar intrathecal administration. We observed a spectacular and specific MNs expression with the serotype 9 around 50% and 10 % in the lumbar and cervical spinal cord respectively. Wherease the serotype 10 transduce less significantly MNs cells (30% and 5 % in the lumbar and cervical spinal cord respectively).

            This results, offer new perspectives for the treatment of motor neuron diseases such as moderate forms of spinal muscular atrophy.

Acknowledgments : We thank the vector core of the Atlantic Gene Therapies Institute (AGT) in Nantes for the preparation of the rAAV vectors, Véronique Blouin and Philippe Moullier (INSERM UMR1089) for vector production and the technical staff of Oniris rodent facility for animal care. This work was supported by a  grant from “Investissement d'Avenir - ANR-11-INBS-0011”  - NeurATRIS :  A Translational Research Infrastructure for Biotherapies in Neurosciences.


Karim BEY (Nantes), Johan DENIAUD, Ciron CARINE, Laurence DUBREIL, Patrick AUBOURG, Marie-Anne COLLE
08:00 - 18:15 #6603 - LS08-100 Gastric digestion of milk protein gels as assessed by time-lapse Synchrotron UV-microscopy.
LS08-100 Gastric digestion of milk protein gels as assessed by time-lapse Synchrotron UV-microscopy.

Gastric digestion is the result of physical disintegration, acidic hydrolysis and enzymatic reactions leading to the release of nutrients which are absorbed in the upper intestinal tract. Protein is one of the essential macro-nutrient and can be eaten in a great variety of forms (solubilized, cross-linked, in their native or denatured states). Controlling food protein gelation conditions result in the formation of particles with specific structural features. Several in vivo and in vitro studies have shown an influence of the macro- and microstructure on the kinetics of milk protein hydrolysis. Nevertheless, the mechanisms by which the structure of dairy gels can affect the digestion kinetics remain largely unknown.

The aim of the study was to assess the part play by HCl and gastric enzyme (i.e. pepsin) during gastric digestion using a dynamic and label-free imaging technique on the DISCO beamline of Synchrotron SOLEIL to visualize in situ the milk protein gels breakdown kinetics. The DISCO beamline uses the deep ultraviolet range to probe the intrinsic UV tryptophan fluorescence without the need of specific external probes. Two milk gels with the same protein concentration but different microstructures were prepared either by rennet or acid coagulation of non-fat milk. The disintegration of the different networks was monitored under digestion at body temperature in simulated gastric fluids and the effect of the acidic environment uncoupled from the enzyme effect. The evolution of particle area and mean fluorescence intensity has been determined, and used to estimate the kinetics of food particles breakdown. 

The kinetics of acid gel in vitro digestion was significantly reduced compared to rennet gel. Our data indicate that rennet gel has a two-step behavior during the acidification phase with a swelling followed by a contraction of the particle, not observed for acid gel. In addition, these microstructural modifications of rennet gel affect negatively the enzymatic breakdown kinetics of particles compared to acid gel.

This study leads to original methodological developments both from the point of view of the acquisition of data and their joint analysis. Getting in situ information about digestion kinetics, microstructural transformation and enzymatic reaction, allow further analysis of the digestion process.


Jonathan THÉVENOT (Rennes), Juliane FLOURY, Frédéric JAMME, Maud PANOUILLÉ, Evelyne LUTTON, François BOUÉ, Didier DUPONT, Steven LE FEUNTEUN
08:00 - 18:15 #6752 - LS08-101 Environmental Scanning Electron Microscopy applied to the identification of asbestos fibers in histological sections.
LS08-101 Environmental Scanning Electron Microscopy applied to the identification of asbestos fibers in histological sections.

The strong relation between inhaled asbestos fibers and development of important respiratory diseases (asbestosis, pulmonary carcinoma, mesothelioma) is now demonstrated by many researches and accepted by the international community. The peculiarity of the minerals defined by the law “asbestos” is their growth as long and thin fibers that, as a consequence of the crystal habit, reach the respiratory apparatus, where may lie during long times –decades- displaying their carcinogenic effects. The longer asbestos fibers may be coated by iron-proteins, forming the well-known “ferruginous bodies”, which represent a way to isolate the fiber in the biological system [1]. It must be remarked that the observation of fibers or ferruginous bodies allow to prove exposure, environmental or working, to asbestos. Nevertheless “ferruginous bodies” may be formed also around elongated minerals/crystals, not belonging to asbestos group. In order to determine surely exposure to asbestos it appears therefore very important to recognize the chemical composition of the fiber inside the coating and identify the mineral phase. A new methodology allowing the sure identification of the mineral phase of a fiber coated in a “ferruginous body” [2], using Environmental Scanning Electron Microscopy (E-SEM) coupled with Energy Dispersive Spectroscopy (EDS), will be presented.

Our University is placed near Casale Monferrato, a town of Piedmont, Italy, sadly famous for the high incidence of asbestos related diseases, in particular mesothelioma, as consequence of the presence of an Eternit factory working large contents of asbestos until 1985. In several patients suffering of mesothelioma also serious disorders of the biliary tract and/or of the gallbladder have been often diagnosed. Nevertheless, the seriousness of the damages to the respiratory system reduce the attention to other organs. In order to determine the presence of asbestos fibers in the gallbladder or in the biliary tract of patients suffering both of mesothelioma and of disorders in this gland, histological sections of gallbladder and of bile have been observed under E-SEM/EDS. All the inorganic phases observed have been characterized under their morphological and chemical aspects [3]. By this work it can be proved the presence of asbestos fibers or bundles of asbestos fibers, as shown in the figure, in particular of crocidolite and chrysotile, in almost all the examined sections. The results obtained during this work will be presented and discussed.

 

References

1. Rinaudo C, Croce A, Musa M, Fornero E, Allegrina M, Trivero P, Bellis D, Sferch D, Toffalorio F, Veronesi G, Pelosi G. Study of inorganic particles, fibers, and asbestos bodies by Variable Pressure Scanning Electron Microscopy with annexed Energy Dispersive Spectroscopy and micro-Raman spectroscopy in thin sections of lung and pleural plaque. Applied Spectroscopy, 2010, 64:571-577.

2. Croce A, Musa M, Allegrina M, Trivero P, Rinaudo C. Environmental scanning electron microscopy technique to identify asbestos phases inside ferruginous bodies. Microscopy and Microanalysis, 2013, 19:420–424.

3. Grosso F, Randi L, Croce A, Mirabelli D, Libener R, Magnani C, Bellis D, Allegrina M, Bertolotti M, Degiovanni D, Rinaudo C. Asbestos fibers in the gallbladder of patients affected by benign biliary tract diseases. European Journal of Gastroenterology and Hepatology, 2015, 27:860-864.


Caterina RINAUDO (Alessandria, Italy), Alessandro CROCE, Nicol Francesca TRINCHERI, Roberta LIBENER, Daniela DEGIOVANNI, Federica GROSSO
08:00 - 18:15 #6778 - LS08-102 Optically and magnetically active hybrid FePt/SiO2/Au nanoparticles are internalized into normal and cancer urothelial cells.
LS08-102 Optically and magnetically active hybrid FePt/SiO2/Au nanoparticles are internalized into normal and cancer urothelial cells.

Introduction

Nanomedical approaches in cancer treatment have the potential to enhance the effectiveness of localized therapy while minimizing side effects on the surrounding healthy tissue. The aim of our study was the development of a novel hybrid nanoparticles (hNPs) based on magnetic core (FePt) and photothermaly active shell (SiO2/Au) for targeting of cancer tissue. hNPs should enable controlled triggering of photothermic drug release, followed by extraction of hNPs from the body using an external magnetic field. We established biomimetic in vitro models of normal and cancer urothelial cells for testing proof-of-concept, biocompatibility, targeting, release, photothermic effects and extraction capabilities.

 

Materials, methods

Superparamagnetic SiO2-coated FePt nanoparticles have been used as seeds for the growth of the Au shells [1]. Au nanoshells were coated with polyethylene glycol (PEG), because of its known biocompatibility, and improved in vivo stability. Finally, for the sterilization of the final suspension the sterile filters were used (sterile Millex-GP syringe filter unit). Normal porcine urothelial cells – (NPU), low-grade (RT4) –  and high-grade (T24) cancer urothelial cells - were grown on plastic petri dishes in growth media with different basic ingredients (UroM or A-DMEM/F12) at 37 °C in CO2-incubator for up to 3 weeks [2]. To determine cytotoxic effects, hNPs were added to the culture media (100 µg/mL) for 2h in the presence and absence of the magnetic field (a Nd-Fe-B permanent magnet m0H=0.3 T measured right at the top of the magnet)). The viability was measured by counting trypan-blue stained cells. The cellular distribution of hNPs was determined by TEM. Cells were fixed with 4% FA + 2% GA in 0.1M cacodilate buffer for 3h at 4°C, post-fixed with 1% OsO4 for 1h at 4°C, dehydrated in ethanol and embedded in Epon. Ultrathin sections were observed under transmission electron microscope (TEM, Philips CM100) running at 80kV.

 

Results

Schematic representation and a TEM image of hNPs are shown in Figure 1. The survival of urothelial cells, which were exposed to hNPs, has been >85 % in the absence as well as presence of the magnetic field. TEM showed hNP on the apical plasma membrane and in endocytotic structures of urothelial cells. While hNPs were primarily distributed individually or in small clusters (>20 particles) on the apical surface of the urothelial cells, they were also found individually or accumulated in the endosomal compartments of the urothelial cells (Figure 2). High-grade cancer urothelial cells showed higher intensity of endocytosis compared to low-grade cancer and normal urothelial cells.

 

Discussion and Conclusion

We have (i) optimized the culture conditions for long-term growth and differentiation of normal and cancer urothelial cells and therefore established relevant biomimetic in vitro models of normal and cancer urothelial cells, (ii) shown that used hNPs are biocompatible in the presence and absence of magnetic field, and (iii) that hNPs could be internalized into the endosomal compartments of the cells. Our study confirmed proof-of-concept and provides a foundation for the next stage studies of hybrid nanomaterials, aiming at the development of smart diagnostic, targeted drug delivery and stimuli-responsive release system.

 

References

[1] Kostevšek N.,  Žužek Rožman K.,  Arshad M. S.,  Spreitzer M.,  Kobe S., Šturm S. Multimodal hybrid FePt/SiO2/Au nanoparticles for nanomedical applications: combining photothermal stimulation and manipulation with an external magnetic field. J Phy Chem C. 2015;119(28):16374−16382

[2] Imani R, Veranič P, Iglič A, Kreft ME, Pazoki M, Hudoklin S. Combined cytotoxic effect of UV-irradiation and TiO2 microbeads in normal urothelial cells, low-grade and high-grade urothelial cancer cells. Photochem Photobiol Sci. 2015 Mar;14(3):583-90


Samo HUDOKLIN (Ljubljana, Slovenia), Nina KOSTEVŠEK, Rok ROMIH, Kristina ŽUŽEK ROŽMAN, Sašo ŠTURM, Mateja Erdani KREFT
08:00 - 18:15 #5043 - LS09-103 Birch pollen – the key to unlock hidden cases of species hybridization.
LS09-103 Birch pollen – the key to unlock hidden cases of species hybridization.

Normal Betula pollen grains are triporate, i.e. having three pores, whereas genetically abnormal or deformed grains are usually not. We collected samples of pollen from 92 individual Betula trees/shrubs growing in natural birch woodlands in Iceland.  The trees were previously identified as being diploid (2n=28) dwarf birch Betula nana (31 plants) and tetraploid (2n=56) downy birch B. pubescens (39 plants), whereas 22 plants were found to be triploid (2n=42) hybrids of the two species [1]. The results [2] showed clearly that the two species mostly produced normal triporate pollen, whereas damaged and deformed grains were significantly more frequent among pollen samples from triploid hybrids. The most frequent type of deformity in pollen morphology was pollen with four pores instead of the normal three. Meiosis in the microspore mother cells was also examined and as expected the triploid plants had irregular meiotic figures and produced deformed microspores (unpublished). We therefore investigated the fertility of these triploid trees, by testing pollen viability and assessing seed germination. The results (unpublished) confirmed that the fertility of triploid hybrids was severely reduced. The good news is that triploid hybrids are not completely sterile, and a few individuals under study are even as fertile as the parental species can be. This discovery supports our botanical and molecular studies of introgressive hybridization in Betula [1, 3], whereby triploid hybrids serve as a bridge of gene flow across the two species via back-crossing.

The knowledge that triploid birch hybrids produce abnormal pollen has been utilized in our search for past hybridization events in the Holocene vegetation history of Iceland. Samples from peat were collected in three locations in Iceland: Eyjafjördur (N), Grímsnes (SW) and Thistilfjördur (E). In all three places, periods of elevated proportions of abnormal Betula pollen were detected [4 - 6]. By comparison to climate data from the Greenland Ice Core Project, the effect of climate on the birch woodlands can be seen. The hybridisation periods were found to be connected to the advance of woodland-forming downy birch over dwarf birch habitat in warming climate. Such hybridisation may have taken place in most parts of northern Europe when woodland expanded in the beginning of the Holocene. In Iceland the climate stayed near the lower limits of birch woodland tolerance for most of the Holocene, repeatedly creating conditions that facilitated hybridization. With the warming of climate in the last few decades a new wave of birch hybridisation has started.

 

References:

[1] Thórsson ÆTh, Pálsson S, Sigurgeirsson A, Anamthawat-Jónsson K (2007) Ann Bot 99: 1183-1193.  [2] Karlsdóttir L, Hallsdóttir M, Thórsson ÆTh, Anamthawat-Jónsson K (2008) Grana 47: 52-59.  [3] Thórsson ÆTh, Pálsson S, Lascoux M, Anamthawat-Jónsson K (2010) J Biogeogr 37: 2098-2110.  [4] Karlsdóttir L, Hallsdóttir M, Thórsson ÆTh, Anamthawat-Jónsson K (2009) Rev Palaeobot Palynol 156: 350-357.  [5] Karlsdóttir L, Hallsdóttir M, Thórsson ÆTh, Anamthawat-Jónsson K (2012) Rev Palaeobot Palynol 181: 1-10.  [6] Karlsdóttir L, Hallsdóttir M, Eggertsson Ó, Thórsson ÆTh, Anamthawat-Jónsson K (2014) Iceland Agric Sci 27: 95-109.


Kesara ANAMTHAWAT-JONSSON (Reykjavik, Iceland), Lilja KARLSDOTTIR
08:00 - 18:15 #5879 - LS09-104 Hydrophobins: self-assembly protein monolayers designed to reverse the hydrophobicity of a surface.
LS09-104 Hydrophobins: self-assembly protein monolayers designed to reverse the hydrophobicity of a surface.

Natural materials can inspire the production and development of materials that can be environmentally friendly, cheap and have a variety of applications. Fungal hydrophobin proteins, in particular, have several interesting traits that make them an ideal sample to investigate. These proteins are found only in the fungal kingdom and are known to play several distinct roles in the life and development of different fungi: acting as a biosurfactants to allow formation of aerial hyphae, protecting the spores from the environment, acting as an adhesive film during germination. This is all possible due to the hydrophobin protein’s unique amphiphile structure and the ability to self-assemble into an amphiphilic film at any hydrophobic:hydrophilic interface. At such an interface, the hydrophobins undergo a conformational change to form amphiphilic monolayers. With certain hydrophobins, known as class I, these monolayer films are very robust under acidic and basic conditions, and have been shown to be able to reverse the hydrophobicity of any surface.

This body of research has been investigating the structure of the amphiphilic films formed by the hydrophobin EAS∆15, a truncated version of the wild type hydrophobin EAS, found on the surface of spores of Neurospora crassa. Additionally, we have compared the ability of EAS∆15 and the hydrophobin RodA, which is found on spores produced by Aspergillus fumigatus, to form hydrophobin protein films with the ability to alter surface hydrophobicity.

By transmission electron microscopy (TEM), it was possible to visualise the morphology of the hydrophobin films formed by EAS∆15 at the hydrophobic:hydrophilic interface upon a holey carbon grid. Changes in the film morphology were observed when the film was formed from protein solutions with increasing amounts of alcohol, and hence exhibiting variation in surface tension. A TEM tomogram of the hydrophobin film was constructed from 168 TEM images tilted at ±60ᵒ. 3D topography information was collected from atomic force microscopy (AFM) to confirm the morphology visualised on TEM and compare the resulting models. Both imaging techniques revealed rodlet structures, which exhibit a “double track” structure and forms nanosized ridges.

Hydrophobin proteins can vary in sequence length and the amount of hydrophobic residues within the sequence; this provides a variety of functionalities for different fungi.  Two different class 1 hydrophobin proteins, RodA and EAS∆15, were used to compared the difference in their ability to alter the surface hydrophobicity of a) hydrophobic surfaces (OTS silicon wafer) and b) hydrophilic surfaces (StarFrost(R) Superclean hydrophilic glass slides). Hydrophobin proteins were solubilised in deionised water (5µg/mL) and a 50 µL droplet of the protein solution was allow dry down to form a film upon the OTS silicon and hydrophilic glass. The hydrophobin protein films were able to reduce the contact angle of water from 104±2 ᵒC on bare OTS silicon wafer to 73±4 ᵒC for EAS∆15 coated surface and 81±7 ᵒC for RodA coated surface. For the hydrophilic glass, the contact angle for water on the bare surface was increased from 31±3 ᵒC to 59±4 ᵒC for the EAS∆15 coated surface and the 58±8 ᵒC for RodA coated surface. AFM images indicates that even when protein films are formed from solutions with such low protein concentration, both surfaces were coated with enough hydrophobin protein to form a layer that effects the hydrophobicity of both the OTS silicon wafer and hydrophilic glass surfaces.


Victor LO (Sydney, Australia), Jennifer I-Chun LAI, Ann KWAN, Margaret SUNDE
08:00 - 18:15 #5977 - LS09-105 SEM and FTIR investigation of molecular composition changes in allergenic common mugwort (Artemisia vulgaris L.) and hazel (Corylus avellana) pollen induced by traffic pollution.
LS09-105 SEM and FTIR investigation of molecular composition changes in allergenic common mugwort (Artemisia vulgaris L.) and hazel (Corylus avellana) pollen induced by traffic pollution.

Nowadays pollen allergies become an increasing problem for human population. Mugwort (Artemisia vulgaris) and hazel (Corylus avellana ) are major herbaceous allergenic plants in Europe [1-3]. In this study the effect of vehicle pollutants on the structure and chemical composition of mugwort and hazel pollen were investigated. For this purpose pollen of the respective plants were collected from three sites with different vehicle pollution level. Scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR) and curve-fitting analysis of amide I profile was performed to assess the structural changes of mugwort and hazel pollen. SEM imaging did not reveal any differences in shape or any physical degradation of the hazel (Fig. 1a, b) and mugwort (Fig. 1c, d) pollen grains collected from the different sites. It was found that infrared spectra look the same for pollen collected at sites with high traffic pollution. Conversely, they differ a lot from spectra of respective pollen types collected from sites without pollution. Moreover, structural changes in proteins, observed in the second derivative of the FTIR spectra and in the curve-fitting analysis of amide I profile, are a consequence of mutations occurring in the genetic material of pollen, which can be caused inter alia by air pollutants [4]. The results suggest, that mugwort and hazel pollen chemical composition may be a good indicator of air quality and FTIR may be applied in biomonitoring.

Acknowledgements:

Grant n° UMO-2014/13/B/ST5/04497 is acknowledged for the financial support of the SEM Tescan Vega 3 instrument.

References:

1. Chu L.M., Cockcroft D.W., Pahwa P., Dosman J., Hagel L., Karunanavake C., Pickett W., Lawson J.A. 2014. Prevalence and determinants of atopy and allergic diseases among school-age children in rural Saskatchewan, Canada. Ann. Allergy Asthma Immunol. 113(4):430-439.

2. Sozańska B., Błaszczyk M., Pearce M., Cullinan P.  2014. Atopy and allergic respiratory disease in rural Poland before and after accession to the European Union. J. Allergy Clin. Immunol. 133(5):1347-1353.

3. Johansson, S.G.O. 2002. Milestones in understanding allergy and its diagnosis. Clinical and Experimental Allergy: Review, 2, 2–7.

4. Dell’Anna, R., Lazzeri, P., Frisanco, M., Monti, F., Malvezzi Campeggi, F., Gottardini, E., Bersani, M. 2009. Pollen discrimination and classification by Fourier transform infrared (FT-IR) microspectroscopy and machine learning. Analytical and Bioanalytical Chemistry, 394, 1443–1452.


Joanna DEPCIUCH (Krakow, Poland), Idalia KASPRZYK, Elzbieta ROGA, Magdalena PARLINSKA-WOJTAN
08:00 - 18:15 #6198 - LS09-106 Microscopic approach to reveal nanoparticles effects in fish.
LS09-106 Microscopic approach to reveal nanoparticles effects in fish.

According to the US National Nanotechnology Initiative, nanoparticles are a set of solid particles with a diameter ranged from 1 to 100 nm. Numerous domains employ nanoparticles (such as industry, cosmetic, construction, medicine…) due to their specific properties.

The significant arise of nanomaterials application leads to a boost of environmental discharges and especially in aquatic systems which represent an important pollutants receptacles. Nevertheless, the lack of knowledge about the toxicity of nanomaterials can be detrimental for the aquatic ecosystems sustainability. Trophic transfer is often referred as an important pathway of nanoparticles contamination in aquatic systems being reportedly the main exposure route to organisms. Among their great variety of nature and characteristics, gold nanoparticles (AuNPs, PEG coating, diameter 10nm) have been chosen as model contaminant due to their high stability in solution.

This work aims to characterize: (i) AuNPs transfer within food chain and (ii) a histological study of AuNPs damages in fish. Thereby natural river biofilms contaminated in laboratory for 48h at environmental AuNPs’ concentrations were grazed by the fish Hypostomus plecostomus during a 21-days laboratory experiment. Gold analyses (by atomic absorption spectroscopy) revealed that biofilms presented a high AuNPs retention capacity. Secondly, results point out that AuNPs were effectively transferred from natural biofilms to the grazer fish showing their ability to enter the food chain. Regarding AuNP fish distribution, organs involved in metabolism and excretion (i.e. liver and kidney) presented a significant bioaccumulation. Moreover, transmission electron microscopy observations showed tissue alterations indicating inflammatory responses for all organs studied. AuNPs appeared to be: (a) distributed by the circulatory system into fish organs without entering the erythrocytes and (b) not degraded once internalized by the fish.


Fanny PERRIER, Nathalie MESMER-DUDONS (Arcachon), Stéphane MORNET, Magalie BAUDRIMONT, Olivier SIMON, Agnès FEURTET-MAZEL
08:00 - 18:15 #6201 - LS09-107 Decontamination capacity of a fish after trophic contamination with gold nanoparticules: ultrastructural study.
LS09-107 Decontamination capacity of a fish after trophic contamination with gold nanoparticules: ultrastructural study.

Nanomaterials represent today a major economic and technological issue, because of their innovating properties rising from their nanometric size (1 to 100 nm) and in particular of their chemical compositions, sizes, specific surfaces and varied surface qualities. These nanomaterials are present in sectors as varied as building, car industry, chemistry, energy or health, and therefore can be found in natural ecosystems without knowing yet their potential impacts.

In this context, trophic transfer of gold nanoparticles (AuNPs) between periphytic biofilms and a periphytophage fish Hypostomus plecostomusas final consumer has been studied in laboratory. Histological analyses have been performed at the two trophic levels with a particular focus on transmission electronic microscopy (TEM) observations in fishes.

In upstream running waters, periphytic biofilms are constituted by the association of micro-organisms secreting an organic polymermatrix. Diatoms (brown microalgae) as a major component of these biofilms ensure a great part of the primary productionin the upstream running watersand are at the basis of their food web.

A contamination of these microorganisms by AuNPs could be vector of a trophic transfer of these nanomaterials along the trophic chain. Thus we determined if a trophic transfer of AuNPs was possible between natural periphytic biofilms and the fish Hypostomus plecostomus. H. Plecostomus is a tropical benthic fish with a ventral mouth modified into suction cup and adapted to graze the periphytic biofilms.

Analyses of gold bio-accumulation in fishes were performed after 7 days of contamination, followed by a period of depuration of 14 days. These analyses were supplemented by an observation of AuNPs localization in tissues and cells by TEM and the toxic effects of AuNPs were also observed in them.

The results showed a trophic transfer of AuNPs between biofilms and fish, with a significant gold bioaccumulation in several organs (heart, spleen, liver, muscles). TEM observations revealed also a concentration of AuNPs in the spleen of the fish, localized especially in the erythrocytes and an important destructuration of the muscle fibers. After depuration, AuNPs totally disappeared from the erythrocytes, but were concentrated in the melanomacrophages, along with a recuperation of the muscles fibers, suggesting an important capacity of this fish to detoxify this type of nanoparticles.


Nathalie MESMER-DUDONS (Arcachon), Aurore CHONGAUD, Stephane MORNET, Agnès FEURTET-MAZEL, Régine MAURY-BRACHET, Magalie BAUDRIMONT
Exhibition Hall
Monday 29 August
08:00

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08:00 - 18:15

Poster Session B
Display poster from Sunday 28, 2:00 pm to Tuesday 30, 6:00 pm

Poster sessions:
Monday 16.30 > 18.15
Tuesday 16.45 > 18.15
08:00 - 18:15 #5012 - IM01-126 STEM electron tomography of titanium oxide nanotubes surface functionalized by Pt nanoparticles.
IM01-126 STEM electron tomography of titanium oxide nanotubes surface functionalized by Pt nanoparticles.

Abstracts

The titanium oxide nanotubes have become a very attractive material with potential applications in biomedicine, photocatalysis, energy etc. Their properties depend mostly on morphology which is relatively easy to change by controlling the conditions of the anodization like the type of electrolyte used, the voltage and the time of anodization. There is a direct linear relation between the anodization voltage and the average diameter of the formed nanotubes, as the voltage increases the diameter of nanotubes also increases [1,2].  The possibility of the preparation of nanotubes with different size, shape and wall thickness leads to the control of their geometric surface area and specific surface area, which is an important parameter in the development of new substrates for example in heterogeneous catalysis. Nanotube surface functionalization with platinum nanoparticles is a way to fabricate active material for catalysis of oxidation reaction of methanol. Such nanostructured complex materials demand advanced methods for characterization and visualization of real structure, therefore application of TEM and electron tomography techniques is desired.

In this work titania nanotubes were obtained by electrochemical oxidation of pure titanium at voltage of 10 and 25 V, that resulted in creation of TiO2 nanotubes with 40 and 110 nm in diameter, respectively. After anodization the heat treatment was performed at 450oC for 1h to change amorphous structure of TiO2 nanotubes into crystalline anatase structure. A suitable amount of Pt - 0.2 mg/cm2 on the surface of the nanotubes was deposited using magnetron sputtering.  FIB prepared specimens were analyzed in a Hitachi HD-2700 dedicated STEM (Scanning Transmission Electron Microscopy).

Fig. 1 shows cross-section SEM images of TiO2 nanotubes with 0.2 mg/cm2 Pt deposit on the top. The platinum nanoparticles tend to choose the edges of TiO2 nanotubes and side walls. A high amount of Pt fills the interior of the nanotubes as shown in Fig. 1b. As nanotubes diameter increases from 40 to 110 nm the depth of deposition into nanotubes also increases (Fig. 1c). Morphology of prepared structures was characterized by scanning transmission electron microscopy tomography. This method provides three-dimensional structural information at nanoscale based on two dimensional projections acquired at different tilt angles. High angle annular dark field (HAADF) imaging was used for 2D projections. The results have shown distribution of platinum nanoparticles inside the nanotubes. The variations in platinum content introduced into different diameter nanotubes were also examined. Segmented volume of nanotubes was analyzed in terms of specific surface area and volume fraction.

 

References

[1] Roguska, A., Pisarek, M., Andrzejczuk, M., Dolata, M., Lewandowska, M., & Janik-Czachor, M. (2011) Materials Science and Engineering C, 31(5), 906-914

[2] M. Pisarek, A. Roguska, A. Kudelski, M. Andrzejczuk, M. Janik-Czachor, K.J. Kurzydłowski, Materials Chemistry and Physics, 139 (1), (2013) 55-65.

 

Acknowledgments

This work was supported by The National Science Centre through the research grant UMO-2014/13/D/ST8/03224


Mariusz ANDRZEJCZUK (Warsaw, Poland), Agata ROGUSKA, Marcin PISAREK, Małgorzata LEWANDOWSKA
08:00 - 18:15 #5209 - IM01-128 Compressed sensing tomography of inorganic and biological samples in the scanning electron microscope operated in the transmission mode.
IM01-128 Compressed sensing tomography of inorganic and biological samples in the scanning electron microscope operated in the transmission mode.

This paper summarizes the achievements in the 3D reconstruction of microscopic specimens through the tomographic algorithm applied to a set of projection\images obtained in the SEM. This approach is complementary to the serial-sectioning and the slice-and-view methods presently implemented in the SEM platform, and benefits from a compressed sensing approach to refine the reconstruction from a limited number of projections.

A Si-based electron detector has been specifically developed for the purpose of operating the microscope in the scanning-transmission imaging mode for the tomographic application, and the detection strategy has been tailored in order to maintain the projection requirement over the large tilt range, a requirement needed for the reconstruction workflow [1]. Either inorganic or biological samples have been investigated to demonstrate the adaptability of the compressed sensing refinement to the specimen characteristics: the former system is formed by cobalt particles within a carbon tube and the latter features collagen fibrils in dermal tissue.

Figure 1 shows a STEM image from the tilt series of Co nanoparticles inside a carbon tube. The contrast in the STEM image is determined by local specimen thickness and composition, the Co particles being visible with the highest contrast. The reconstruction has been obtained starting from 53 projections at 2°steps, and refined through compressive sensing with regularization parameters emphasizing sparsity in the gradient domain.

Figure 2 highlights the complex structure of the dermal tissue as revealed by the STEM imaging mode in the SEM. Cellular membranes and circular structures are mixed with bundles of collagen fibrils. The bundles were truncated by the fine sectioning and their disposition is clearly visible. A small bundle of collagen was selected as the region of interest for the tomographic reconstruction. Starting from 91 projections at 40.000× magnification and ranging between -50° to +40°. Compressed sensing was adapted to deal with the inherent complexity of biological images, and the final tomogram turned out to preserve the finest details of the fibrils. The known periodical striation (about 60 nm periodicity) of collagen was indeed recovered with adequate spatial resolution.

The proposed system exploits the capability of the STEM imaging mode, which can be applied for both biological and physical science for the 3D analysis of volumes below 100 mm3. The limit in resolution is posed by the probe size of the microscope, specimen composition and thickness, and the number of projections that can be acquired without significant beam damage of the sample. Compressed sensing is effective in improving the quality of the reconstruction. Owing to the flexibility of the SEM platform, cryo-preservation of the specimen as well as site-selective sample preparation could be pursued within the proposed approach for tomography in the SEM.

[1]  M Ferroni et al., Journal of Physics: Conference Series 644 (2015): 012012


Ferroni MATTEO (FERRARA, Italy), Alberto SIGNORONI, Andrea SANZOGNI, Andrea MIGLIORI, Luca ORTOLANI, Vittorio MORANDI
08:00 - 18:15 #5295 - IM01-130 Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM.
IM01-130 Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM.

Both transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) experiments profit from recording two-dimensional camera images at very high readout speeds. This includes, but is not limited to, tomography in TEM and ptychography in STEM. The pnCCD (S)TEM camera uses a direct detecting, radiation hard pnCCD with a minimum readout speed of 1 000 full frames per second (fps) with a size of 264x264 pixels [1]. It features binning and windowing modes, which allow to further increase the frame rate substantially. For example, 4-fold binning in one direction, i.e. 66x264 pixels, yields a readout speed of 4 000 fps. Up to 20 000 fps are possible in windowing modes. Further applications that benefit from the high readout speed range from imaging on the micro- and millisecond timescale to strain analysis or electric and magnetic field mapping.

Typical tomographic reconstructions use tilt series of fewer than 100 images which are recorded in 15 to 60 minutes with conventional cameras running at speeds below 40 fps. The series are recorded by stepwise rotation of the goniometer and taking a camera image after each rotation step. These long acquisition times restrict the acquisition of tomographic series for beam sensitive samples. We have recorded a tilt series containing 3 487 images of an inorganic nanotube in only 3.5 s with the pnCCD camera [2]. Due to the high readout speed it was possible to rotate the goniometer continuously over a tilt range of -70 ° to +30 ° in an FEI Titan 60-300, operated at 60 keV beam energy. The short acquisition time and the high sensitivity of the camera allowed to reduce the cumulative electron dose to about 8 electrons per Å2, i.e. about an order of magnitude lower than conventionally used for low dose tomography. A 3D reconstruction of the nanowire is shown in Figure 1. The acquisition time was not limited by the readout of the camera, but rather by the rotation speed of the goniometer.

Combining the high readout speed with the scanning mode makes 4D-STEM imaging feasible, a powerful imaging technique where a two-dimensional image is recorded for each probe position of a two-dimensional STEM diffraction pattern. With the pnCCD (S)TEM camera, a 4D data cube consisting of 256x256 (i.e. 65 536) probe positions with a 132x264 pixel detector image (using 2-fold binning) for each probe position can be recorded in about 35 s. Several measurements have been performed to prove the capability of the camera for 4D-STEM imaging, including strain analysis, magnetic domain mapping and electron ptychography. The latter is a 4D-STEM technique that was described theoretically already in 1993 [3] but was so far limited experimentally by the low readout speed of existing cameras. In electron ptychography, the intensity distribution in the bright field disk is recorded in 2D for each STEM probe position. In an electron wave-optical approach the phase and amplitude information is extracted from the recorded intensity images. The reconstructed phase image (Figure 2a) shows enhanced image contrast compared to the simultaneously acquired conventional annular dark field image (Figure 2b). Measurements with the pnCCD (S)TEM camera were carried out using a JEOL ARM200-CF to investigate different samples with the ptychographic phase reconstruction technique.

In conclusion, the pnCCD camera enables new techniques in TEM and STEM. Various fields of application benefit from recording two-dimensional detector images at high speeds. With its direct detection, high readout speed and radiation hardness the pnCCD (S)TEM camera permits the recording of  tomographic tilt series and large 4D-STEM data cubes in short times and thus paves the way for new science.

 

[1] H Ryll et al, Journal of Instrumentation (in press).

[2] V Migunov et al, Scientific Reports 5 (2015), 14516.

[3] JM Rodenburg, BC McCallum and PD Nellist, Ultramicroscopy 48 (1993), p.304–314.

[4] KJ Batenburg and J Sijbers, IEEE Trans. Image Process. 20 (2011), p.2542–2553.
[5] The authors acknowledge Xiaodong Zhuge, K. Joost Batenburg and Lothar Houben for their contributions to the tomography measurement.


Martin SIMSON (Munich, Germany), Rafal E. DUNIN-BORKOWSKI, Robert HARTMANN, Martin HUTH, Sebastian IHLE, Lewys JONES, Yukihito KONDO, Vadim MIGUNOV, Peter D. NELLIST, Robert RITZ, Henning RYLL, Ryusuke SAGAWA, Julia SCHMIDT, Heike SOLTAU, Lothar STRÜDER, Hao YANG
08:00 - 18:15 #5725 - IM01-132 Quantitative 3D analysis of huge nanoparticles assemblies.
IM01-132 Quantitative 3D analysis of huge nanoparticles assemblies.

Nanoparticle assemblies attract increasing interest because of the possibility of tuning their properties by adjusting the overall size and shape, the stacking of the individual nanoparticles, and the distances between them.[1]

Transmission electron microscopy is an important technique to characterize materials at the nanometer scale and below. However, it conventionally only allows for the acquisition of two-dimensional (2D) projections of three-dimensional (3D) objects, which is not sufficient for a quantitative characterization of complex 3D nanostructures. Electron tomography has therefore been developed to overcome this strict limitation, becoming a versatile and powerful tool, increasingly used in the field of materials science.[2]

For the characterization of nano-assemblies, electron tomography is nowadays a standard technique, yielding a 3D description of the morphology and inner structure.[3] Despite the valuable information that can be obtained, as the synthetized systems become more complex, an accurate characterization of the structure becomes more demanding. For example, 3D reconstructions based on classical algorithms, suffer from a number of restrictions that hamper an accurate characterization of closed-packed nanoparticles assemblies.

Here, we present a novel approach that enables us to determine the coordinates of each nanoparticle in an assembly, even when the assembly consists of up to 10,000 (spherical) particles.[4, 5] This technique will have a major impact as it enables a straightforward quantification of inter-particle distances and 3D symmetry of the stacking. Furthermore, the outcome of these measurements can be used as an input for modelling studies that predict the final 3D structure as a function of the parameters used during the synthesis.

 

[1]          N. A. Kotov, P. S. Weiss, ACS Nano 2014, 8, 3101.

[2]          P. Midgley, M. Weyland, Ultramicroscopy 2003, 96, 413.

[3]          A. Sánchez-Iglesias, M. Grzelczak, T. Altantzis, B. Goris, J. Perez-Juste, S. Bals, G. Van Tendeloo, S. H. Donaldson Jr, B. F. Chmelka, J. N. Israelachvili, ACS Nano 2012, 6, 11059.

[4]          B. de Nijs, S. Dussi, F. Smallenburg, J. D. Meeldijk, D. J. Groenendijk, L. Filion, A. Imhof, A. van Blaaderen, M. Dijkstra, Nature materials 2015, 14, 56.

[5]          D. Zanaga, F. Bleichrodt, T. Altantzis, N. N. Winckelmans, W. J. Palenstijn, J. Sijbers, B. van Nijs, M. van Huis, A. van Blaaderen, K. Joost Batenburg, Sara Bals, Gustaaf Van Tendeloo, Nanoscale 2015.

 

 

Acknowledgements

The authors acknowledge financial support from European Research Council (ERC Starting Grant # 335078-COLOURATOMS, ERC Advanced Grant # 291667 HierarSACol and ERC Advanced Grant 267867 – PLASMAQUO), the European Union under the FP7 (Integrated Infrastructure Initiative N. 262348 European Soft Matter Infrastructure, ESMI and N. 312483 ESTEEM2), and from the Netherlands Organisation for Scientific Research (NWO), project number 639.072.005 and NOW CW 700.57.026. Networking support was provided by COST Action MP1207.


Daniele ZANAGA (Antwerpen, Belgium), Folkert BLEICHRODT, Thomas ALTANTZIS, Naomi WINCKELMANSA, Willem Jan PALENSTIJN, Jan SIJBERS, Bart DE NIJS, Marijn A. VAN HUIS, Luis M. LIZ-MARZÁN, Alfons VAN BLAADEREN, K. Joost BATENBURG, Gustaaf VAN TENDELOO, Sara BALS
08:00 - 18:15 #5771 - IM01-134 Multi ADF detector tomography for 3D characterization of heterostructures.
IM01-134 Multi ADF detector tomography for 3D characterization of heterostructures.

Characterization of core-shell type nanoparticles in 3 dimensions (3D) by transmission electron microscopy (TEM) can be very challenging. Especially when both heavy and light elements co-exist within the same nanostructure, artefacts in the 3D reconstruction are often present. A representative example would be a particle comprising an anisotropic metallic (Au) nanoparticle coated with a (mesoporous) silica shell. To obtain a reliable 3D characterization of such an object, we collected high angle annular dark field scanning TEM (HAADF-STEM) and annular dark field tilt series (ADF-STEM) for tomography (Figure 1A and 1B respectively). Although the series acquired by ADF-STEM shows both the Au and the SiO2, artefacts are clearly present in the 3D reconstruction (Figure 2). Since the observed artefacts may cause loss of information or may lead to misinterpretation, it is extremely challenging to obtain reliable 3D results for core-shell hybrid materials using conventional electron tomography. When selecting an optimal value for the collection angle, a compromise is needed between optimal contrast, produced by the atomic number of coexisting elements, and the minimization of diffraction contrast.  

We here overcome this limitation by exploiting the flexibility of modern TEM instruments that enable one to collect multiple (HA)ADF-STEM series simultaneously, by using different (HA)ADF detectors at the same time. This multi-mode approach is very dose-efficient, as one is able to collect 2 images while keeping the necessary electron dose the same. Tilt series were simultaneously acquired using an ADF detector with inner and outer collection angles of 35 and 125 mrad and a HAADF-STEM detector using inner and outer collection angles of 150 and 220 mrad, respectively. To remove the artefacts that appear in the ADF-STEM tilt series, we removed the complete Au nanoparticle from the ADF-STEM projection images. Next, a technique known as inpainting was applied[1]. This approach replaces the absent information by a continuation of the texture of the surrounding area. This procedure was performed for each projection image of the tilt series separately (Figure 3A).  The processed tilt series was then used as an input for 3D reconstruction using the SIRT algorithm implemented in the ASTRA toolbox[2]. Finally, the 3D HAADF-STEM and ADF-STEM reconstructions are combined into one single visualization using the AMIRA software as illustrated in Figure 3B [3]. In this manner, we were able to reliably characterize the structure of mesoporous SiO2 Au nanoparticles. It must be noted that the methodology we propose here is generally applicable to a broad range of core shell hybrid nanostructures.

References

[1] G. Wang, D. Garcia, Y. Liu, R. de Jeu, A. J. Dolman, Environ. Modell. Softw. 2012 , 30 , 139.

[2] W. Van Aarle, W. J. Palenstijn, J. De Beenhouwer, T. Altantzis, S. Bals, K. J. Batenburg, J. Sijbers, Ultramicroscopy 2015 , 157 , 35

[3] D. Stalling, M. Westerhoff, H.-C. Hege, in The Visualization Handbook, (Eds: C. D. Hansen and C. R. Johnson), Academic Press, Elsevier, 2004 , pp. 749–767.


Kadir SENTOSUN (Antwerp, Belgium), Marta N. Sanz ORTIZ, K. Joost BATENBURG, Luis M. LIZ-MARZÁN, Sara BALS
08:00 - 18:15 #5868 - IM01-136 Effect on the SEM topography of different sample preparation methods for thin-film-composite membrane.
IM01-136 Effect on the SEM topography of different sample preparation methods for thin-film-composite membrane.

Thin-film-composite (TFC) membrane was prepared through interfacically polymerizing m-phenylene-diamine (MPD) and trimesoyl chloride (TMC) on top of a poly-sulfone substrate to form an ultrathin active polyamide layer, which is excellent in hydrophilicity, mechanical stability, thermal stability and hydrolytic stability. Scanning electron microscopy (SEM) is suitable for direct observation of TFC membrane structure, especially for superfine structure of ultrathin functional layer. The skin layer of TFC membrane is much denser than ultrafiltration membrane and its microstructure is more difficult to observe by SEM with regular way. At present, there are two common methods for fracturing membrane: brittle fracture of liquid nitrogen, embedded section. In addition, there are two less common methods with the help of precision instruments, like Focused Ion Beam cutting and Ion Milling technologies. We compare the advantages and disadvantages of four methods, and put forward a more convenient, practicable and effective method for SEM cross-sectional analysis.

(1)Embedded Section: This method will be finished after embedding in epoxy resin, solidifying in thermostat and slicing by microtome. It has strict technical requirements for the operator. The cross section is damaged badly in the Fig.1. 

(2)FIB cutting: We obtain the cross-sectional sample using Carl Zeiss AURIGA Cross Beam FIB/SEM. FIB probe is Ga ion beam. The operating voltage and current is 30kV and 50pA respectively. The ion beam intensity is too high to keep the integrity of film structure. The cortex is damaged in the Fig.2. So this method is not suitable for soft materials.

(3)Ion milling: The process is completed by IM4000 of HITACHI. We select the section grinding mode to reduce the damage of structure, with the help of liquid nitrogen cooling mode. Although this method is somewhat better than FIB cutting, we still can’t see the cortex distinctly.

(4)Brittle Fracture of Liquid Nitrogen: The cost of this method is very low. Although it’s easy to use without the aid of other equipment, the SEM microstructure is difficult to observe directly and clearly. Fig.4a shows the low and high magnification images. We can see the film cross section is distorted and the cortex sagged.

The above methods have many limitations, because the toughness of membrane is too big to fracture easily. We have developed an improved sample frozen and fractured technology: the TFC membrane has swollen in ethanol at room temperature for several minutes, and then we put the sample in liquid nitrogen and fracture it with a certain slope. The functional cortex can be observed directly and effectively in the Fig.4b below. 


Wenqing HUANG (Beijing, China), Xiaopei MIAO
08:00 - 18:15 #5940 - IM01-138 3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography.
IM01-138 3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography.

        Electron Tomography (ET) is a key technique to perform 3D characterization at the nanometer scale [1]. 2D projections at different tilt angles are first acquired in an electron microscope, then an inversion algorithm is used to reconstruct the 3D volume of the sample from the dataset. Classically, ET is performed in a HAADF STEM mode in materials science leading to 3D Z-contrast reconstructions. 3D elemental mapping based on EELS or EDS acquisitions is also possible in reconstruction theory [2]. Yet, reconstruction theory needs several hundreds of projections and 2D chemical mapping needs an important acquisition time and electron dose, therefore 3D elemental mapping is challenging. Nowadays, microscopes improvements limit the acquisition time of 2D chemical mapping. Moreover, powerful state-of-the-art reconstruction algorithms make possible the reconstruction from a limited dataset of a few dozens of projections only. As a consequence 3D elemental mapping is now possible with a reasonable acquisition time of a day or less.  

        New reconstruction algorithms add prior knowledge on the object to compensate for the lack of information due to limited number of available projections. The prior knowledge can be a limited number of possible grey levels in the reconstruction to perform discrete tomography [3]. This correspond to a limited number of known materials in the sample. In the case of Compressed Sensing (CS) algorithms [4], the prior knowledge is a sparsity of the object expressed in a particular basis. A special case of CS reconstruction is the use of the gradient sparsity of the object to perform Total Variation Minimization (TVM) algorithms [5]. In that case, objects constant by parts are preferably reconstructed.

        We propose a mixed approach suited for EDS acquisition. That mixed approach combines both projection denoising [6] and a TVM based algorithm that uses the reconstructions of each element all together. This new approach leads to higher reconstruction accuracy since a new kind of prior knowledge is used. Indeed, reconstructions of different elements should not be independent since a variation of an element is most of the time correlated to a variation of at least another element. The algorithm will be introduced. Simulations using projections with high Poisson noise and strong misalignment will be used to show the accuracy of our approach. Experimental results for a GaN - TiAl intermetallic sample in EDS tomography will also be presented.

        This work was supported by the French “Recherche Technologie de Base” (RTB) program. The authors acknowledge access to the nanocharacterization platform (PFNC) at the Minatec Campus in Grenoble. The authors thank Alphonse Torres from CEA Leti for providing the intermetallic specimen.

 

[1] P. A. Midgley and M. Weyland, “3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography.,” Ultramicroscopy, vol. 96, no. 3–4, pp. 413–31, Sep. 2003.

[2] G. Haberfehlner, A. Orthacker, M. Albu, J. Li, and G. Kothleitner, “Nanoscale voxel spectroscopy by simultaneous EELS and EDS tomography,” Nanoscale, vol. 6, no. 23, pp. 14563–14569, Oct. 2014.

[3] K. J. Batenburg and J. Sijbers, “DART: a practical reconstruction algorithm for discrete tomography.,” IEEE Trans. Image Process., vol. 20, no. 9, pp. 2542–53, 2011.

[4] R. Leary, Z. Saghi, P. A. Midgley, and D. Holland, “Compressed sensing electron tomography,” Ultramicroscopy, vol. 131, pp. 70–91, Aug. 2013.

[5] B. Goris, W. Van den Broek, K. J. Batenburg, H. Heidari Mezerji, and S. Bals, “Electron tomography based on a total variation minimization reconstruction technique,” Ultramicroscopy, vol. 113, pp. 120–130, Feb. 2012.

[6] T. Printemps, G. Mula, D. Sette, P. Bleuet, V. Delaye, N. Bernier, A. Grenier, G. Audoit, N. Gambacorti, and L. Hervé, “Self-adapting denoising, alignment and reconstruction in electron tomography in materials science,” Ultramicroscopy, vol. 160, pp. 23–34, 2016. 


Tony PRINTEMPS (GRENOBLE), Nicolas BERNIER, Eric ROBIN, Zineb SAGHI, Lionel HERVÉ
08:00 - 18:15 #5999 - IM01-140 Electron tomography: influence of defocus on the determination of reconstructed soot aggregates’ surface and volume.
IM01-140 Electron tomography: influence of defocus on the determination of reconstructed soot aggregates’ surface and volume.

Aerosols affect the climate system through various physical processes as they can scatter and absorb solar radiation, emit thermal radiation, or act as cloud condensation nuclei that modify the cloudiness coverage, changing then its albedo. Carbonaceous solid aerosols resulting either from anthropogenic processes or biomass burning are one of the most significant contributors to global climate change [1] with respect to their impact on radiative forcing. They are constituted by tiny primary spherules having a diameter typically ranging from a few nanometers to dozens nanometers. These spherules are aggregated to form particles of larger sizes (0.1 to 1 micrometre) showing a complex morphology (Figure 1) that plays an important role on their radiative and transport properties. These soot aggregates are commonly characterized from 2D transmission electron microscopy (TEM) images and their 3D shape is then deduced from TEM projections assuming geometrical models of spheres, cylinders or spheroids. In order to check the validity of the 2D to 3D transition of these geometrical models we investigated bright field (BF) TEM tomography and directly determine 3D soot morphological characteristics.

            To be suitable for tomographic reconstruction, images of the tilt series must fulfill the projection requirement and BF TEM images of amorphous specimen, which are dominated by mass-thickness contrast, can satisfy this assumption. We show in this work that attention must be paid on the influence of defocus, responsible of the appearance of Fresnel fringes, which do not answer the projection requirement and can lead to artefacts that do not ensure a realistic reconstruction of soot aggregates.

            To do so, we analyse the effect of defocus both on real and numerical soot particles. Thus the same real soot aggregate is reconstructed (with the SIRT algorithm) from different tilt series obtained at different defocus values. Its surface area and volume are determined by using the Amira software suite after a segmentation step based on the method of Adachi et al [2]. The same procedure (reconstruction, segmentation, surface area measurement) is then applied on an amorphous numerical particle, which is generated using a tight binding model [3] processed with the Nanofabric software developed by Y.Lebouar. Projection series are simulated with the EMS software based on the multislice method [4]. Both experimental and numerical approaches show that defocus drastically modifies the intensity profile of primary particles along their diameter and subsequently affects the shape of the reconstructed aggregate (Figure 2) and leads to overestimated values of their surface area and volume.

 

 

Acknowledgments:

 Y. LeBouar is greatly acknowledged for the generation of the amorphous numerical particle with the Nanofabric software he developed.

 

[1] U. Lohmann and J. Feichter, Atmos. Chem. Phys. 5, 715-737 (2005)

[2] K. Adachi, SH. Chung, H. Friedrich, and PR. Buseck, J. Geophys. Res. 112, D14202 (2007)

[3]  C. Ricolleau, Y. Le Bouar, H. Amara, O. Landon-Cardinal, and D. Alloyeau, J. Appl. Phys.114, 213504 (2013)

[4]  P.A. Stadelmann, Ultramicroscopy21, 131 (1987).


Martiane CABIÉ (Marseille), Marc GAILHANOU, Daniel FERRY
08:00 - 18:15 #6005 - IM01-142 How precise can atoms of a nanocluster be positioned in 3D from a tilt series of scanning transmission electron microscopy images?
IM01-142 How precise can atoms of a nanocluster be positioned in 3D from a tilt series of scanning transmission electron microscopy images?

Nanoclusters play key roles in a wide range of materials and devices because of their unique physical and chemical properties. These properties are determined by the specific three-dimensional (3D) morphology, structure and composition. It is well known that extremely small changes in their local structure may result in significant changes of their properties. Therefore, development of techniques to measure the atomic arrangement of individual atoms down to (sub)-picometer precision is important. This allows one to fully understand and greatly enhance the properties of the resulting materials, increasing the number of applications.

Electron tomography using aberration-corrected scanning transmission electron microscopy (STEM) is considered as one of the most promising techniques to achieve atomic resolution in 3D. Although this is not yet a standard possibility for all structures, significant progress has recently been achieved using different approaches [1,2]. Once the atoms can be resolved in 3D, the next challenge is to refine the atom positions in order to locate them as precisely as possible. However, the answer to the question how precise these measurements are, is still open. Here, we investigate the theoretical limits with which atoms of a nanocluster can be located in 3D based on the acquisition of a tilt series of annular dark field (ADF) STEM images.

A parametric model, describing the expectations of the intensities observed when recording a tilt series of ADF STEM images, is needed in order to derive an expression for the highest attainable precision [3,4]. Although the multislice method is more accurate to describe the electron-object interaction, it is very time-consuming, especially when simulating a tilt series of images. Therefore, a Gaussian approximation model has been used as well in order to perform fast, albeit approximate simulations that allow us to get insight into the precision that can be attained to locate atoms in 3D. The precision has been computed for locating the central atom of four gold nanoclusters of different sizes with a Mackay icosahedral morphology. A cross-section of such a nanoparticle is shown in Fig. 1(a) indicating the x-, y-, and z-axis.

In Fig. 1(b), the attainable precision is shown for the x-, y- and z-coordinate of the central atom computed taking  all the atoms into account, the atoms of the central plane (orange atoms and red atom in Fig. 1), or the central atom only (red atom in Fig. 1(a)) based on simulations using the Gaussian approximation model. From this figure, it can be seen that the precision is not significantly affected by neighbouring atoms, and therefore, it is allowed to use only the central atom to evaluate the attainable precision. In figure 2(a), 2(b) and 2(c) the attainable precision is illustrated as a function of the number of projections, the tilt range, and the incident electron dose. The precision increases with increasing number of projections, tilt range, and incident electron dose. Using optimal parameters for the number of projections, the tilt range and electron dose determined based on the calculation of the precision using the Gaussian approximation model, realistic STEM simulations have been performed using the multislice method. The precision has been evaluated for a dose of 8680 e-2 as a function of the inner detector radius of the annular STEM detector (Fig. 3(a)). The optimal inner angle equals the semi-convergence angle. Next, the precision to locate the central atom is determined for the different cluster sizes using all optimised settings (Fig. 3(b)). Here, it is shown that theoretically, a precision of a few picometers can be attained for locating atoms in 3D using a tilt series of ADF STEM images.

In conclusion, it is shown that the attainable precision for locating atoms in 3D can be optimized as a function of the number of projections, tilt range, electron dose, and inner radius of the STEM detector. It is demonstrated that a precision in the picometer range for positioning atoms in 3D is feasible.

 

References 

[1] S. Van Aert, et al., Nature 470, 374–377 (2011)

[2] B. Goris, et al., Nano Letters 15, 6996-7001 (2015)

[3] A. van den Bos, Parameter estimation for scientists and engineers, John Wiley & Sons, 2007.

[4] Van Aert, et al., Journal of Structural Biology 138, 21-33 (2002)

[5] The authors acknowledge financial support from the Research Foundation Flanders (FWO,Belgium) through project fundings (G.0374.13N, G.0369.15N and G.0368.15N) and a post-doctoral grant to A. De Backer.


Marcos ALANIA (Antwerp, Belgium), Annick DE BACKER, Ivan LOBATO, Florian F. KRAUSE, Dirk VAN DYCK, Andreas ROSENAUER, Sandra VAN AERT
08:00 - 18:15 #6061 - IM01-144 New Approaches to Multi-Dimensional Experiments in S/TEM: Application of High Speed Cameras.
IM01-144 New Approaches to Multi-Dimensional Experiments in S/TEM: Application of High Speed Cameras.

Since the first experimental charge coupled device was reported in 1982 [1], there have been a series of major developments in digital imaging techniques for transmission electron microscopy (TEM). These include use of complementary metal-oxide semiconductor (CMOS) devices, which resulted in improvements in camera sensitivity, detective quantum efficiency (DQE) and speed. Here we will present how such developments can benefit some common TEM based experiments, such as electron tomography (ET) and four dimensional scanning TEM (4D-STEM) diffraction.

ET consists of acquisition of a series of images of the specimen in different viewing directions and is used for three dimensional (3D) studies of nanoscale materials in a TEM. The tilt range and tilt increment in an ET experiment directly affects the resolution of the 3D reconstruction.  In cases where the specimen is electron sensitive, the number of projections that can be recorded is typically limited as the sample is repeatedly exposed to the beam. Leveraging the advantages of a high speed camera can also benefit low dose ET and 3D time-resolved studies of dynamic processes in a TEM. Here high speed ET datasets will be presented that were collected using a high speed CMOS camera while the TEM goniometer was continuously tilting. Such an approach improves the resolution of 3D reconstruction for thicker specimens by reducing the tilt increment from several degrees to a small fraction of a degree, and reduces the data acquisition time from several tens of minutes to a few minutes, simultaneously improving angular resolution and potentially reducing beam damage to the specimen.

STEM diffraction imaging is a common analytical method to collect specimen structure, strain and texture. Here either a convergent or parallel electron beam is used to produce diffraction patterns, which can be used to characterize defects, interfaces and small nanostructures and allow accurate measurements of strain and crystal orientation. 4D-STEM diffraction is done by collecting a diffraction pattern pixel by pixel, as the electron beam is scanned on the specimen. Limited data collection speed (i.e., frame rate of the sensor) has been one of the main challenges of this technique. Conventional CCD cameras were limited to up to 30 frames per second (fps), which restricted the number of diffraction patterns collected in a given amount of time. This can be even more challenging in the cases of beam sensitive specimens, or when drift exists. We will present 4D-STEM datasets collected with high speed CMOS cameras and will show how these new systems with superior DQE and speed can benefit STEM diffraction imaging experiments.

Figure 1a below shows 2 images from a high speed tomography experiment on an array of Au nanoparticles. These two images are approximately 60 degrees apart and it was collected in 120 degree tilt range in 110 seconds. The reduction of such a data stream as a tomogram will be presented. And, Figure 1b shows CBED patterns from inside and outside of a vacancy dislocation loop in a Cu specimen.

Reference:

[1] PTE Roberts, JN Chapman and AM MacLeod, Ultramicroscopy 8 (1982), p. 385.


Anahita PAKZAD (Pleasanton, USA), Cory CZARNIK, Roy GEISS, David MASTRONARDE
08:00 - 18:15 #6137 - IM01-146 Atomic resolution HAADF STEM tomography using prior physical knowledge and simulated annealing.
IM01-146 Atomic resolution HAADF STEM tomography using prior physical knowledge and simulated annealing.

Atomic resolution electron tomography using HAADF STEM has become a key tool to get 3D atomic-scale structural information about the sample under study [1-3]. Different reconstruction algorithms exist including filtered back projection, simultaneous iterative reconstruction (SIRT), discrete tomography [4, 5] and total variation minimization [2]. However, most of these reconstruction techniques do not include prior knowledge concerning the atomistic building blocks of the specimen and the electron specimen interaction. A successful attempt to use atomistic prior knowledge of the specimen in the reconstruction was realized by Goris et al. [3] in which each atom is modeled by a 3D Gaussian function. However, the physical knowledge about the electron specimen interaction was not included. In order to partially overcome these problems, we modelled the specimen as a linear combination of spherical symmetric real functions, which are obtained from HAADF STEM simulations of a single atom. Furthermore, a distance constraint is included which guarantees that the distance between atoms is kept above a physical lower bound. The minimization of the cost function is performed using the simulated annealing technique [6]. The cost function is defined as the sum of the squared differences between the forward model and the projection images plus a Tikhonov regularization term. The advantage of using simulated annealing over other methods is that it statistically guarantees to find (an approximation of) the global optimum and that it allows one to process cost functions with a high degree of nonlinearity, arbitrary boundary conditions, and constraints imposed on the solution [7].

The proposed simulated annealing algorithm was demonstrated on a simulated tomography tilt series consisting of 9 projection images with a limited angular tilt range of 120 degrees of a Au nanoparticle consisting of 6525 atoms. Images were generated using the frozen lattice approach with the MULTEM software [8] with a numerical real space grid of 2048x2048 pixels and the following microscope settings: acceleration voltage (300keV), spherical aberration (0.001mm), defocus (14.03Å) and aperture objective radius (21mrad). The frozen atom simulation is performed by using the Einstein model with 20 configurations, slice thickness of 1Å and the three-dimensional rms displacements of all the atoms are set to 0.085Å. An ideal detector sensitivity is used with 40mrad and 95mrad for the inner and outer circular detector angles, respectively. An area which covers the whole nanoparticle was scanned with a pixel size of 15pm. This image was later convoluted with a Gaussian low pass filter (source broadening) with full width at half maximum of 0.8Å. Poisson noise was generated such that the signal-to-noise ratio (SNR) in the resulting images equals 7.  The SNR is defined as the ratio of the standard deviation of the image to the standard deviation of the noise. An example of such a simulated image is shown in Figure 1a.

The result of the simulated annealing based reconstruction method is shown in Figure 1b. The evolution of the cost function during the minimization process is shown in Fig. 2. When comparing position coordinates of all atoms in the reconstructed particle with the input parameters, it has been found that the average distance is less than 8 pm, demonstrating subpixel accuracy.

References

1. S. Van Aert et al., Nature 470 (2011) 374.

2. B. Goris et al., Nature Materials 11 (2012) 930.       

3. B. Goris et al., Nano Letters 15 (2015) 6996.

4. K. J. Batenburg et al. Ultramicroscopy 109 (2009) 730.

5. T. Roelandts et al. Ultramicroscopy 114 (2012) 96.

6. S. Kirkpatrick, C.D.Jr. Gelatt and M.P. Vecchi. Science 220 (1983) 671.

7. L. Ingber. Mathematical and Computer Modelling 18 (1993) 29.

8. I. Lobato and D. Van Dyck.  Ultramicroscopy 156 (2015) 9.

 Acknowledgement

The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0369.15N and G.0368.15N).The research leading to these results has also received funding from the European Union Seventh Framework Programme [FP7/2007- 2013] under Grant agreement no. 312483 (ESTEEM2).


Ivan LOBATO (Antwerpen, Belgium), Jan DE BEENHOUWER, Dirk VAN DYCK, Sandra VAN AERT, Jan SIJBERS
08:00 - 18:15 #6144 - IM01-148 FeCrMg composite and porous FeCr obtained by dealloying in metallic melt bath by Xray tomography and SEM.
IM01-148 FeCrMg composite and porous FeCr obtained by dealloying in metallic melt bath by Xray tomography and SEM.

Nanoporous metals have attracted considerable attention for their excellent functional properties [Snyder, 2010]. The most promising technique used to prepare such nanoporous metals is dealloying in aqueous solution. Nanoporous noble metals including Au have been prepared from binary alloy precursors [Forty, 1979]. The less noble metals, unstable in aqueous solution, are oxidized immediately when they contact water at a given potential so this process is only possible for noble metals. Porous structures with less noble metals such as Ti or Fe are highly desired for various applications including energy-harvesting devices [Sivula, 2010]. To overcome this limitation, a new dealloying method using a metallic melt instead of aqueous solution was developed [Wada, 2011]. Dealloying in the metallic melt is a selective dissolution phenomenon of a mono-phase alloy solid precursor: one component (referred as soluble component) being soluble in the metallic melt while the other (referred as targeted component) is not. When the solid precursor contacts the metallic melt, only atoms of the soluble component dissolve into the melt inducing a spontaneously organized bi-continuous structure (targeted+sacrificial phases), at a microstructure level. This sacrificial phase can finally be removed by chemical etching to obtain the final nanoporous materials. Because this is a water-free process, it has enabled the preparation of nanoporous structures in less noble metals such as Ti, Si, Fe, Nb, Co and Cr.

In this study, nanoporous FeCr samples were prepared using Ni as the soluble component, in a metallic melt bath of Mg. To introduce structural and mechanical anisotropy, some samples were cold-rolled before etching. The influence on the microstructure of the precursor composition, the dealloying conditions and the rolling process were investigated along the different steps by SEM-EBSD and Xray tomography to correlate the process with the microsctructure. Xray tomography (cf. Fig. 2 and 4)enables us to characterize qualitatively and quantitatively the volume while SEM (cf. Fig. 1 and 3) enables us to analyze larger areas with higher resolution 2D images. To confirm the validity of Xray tomography results, SEM-FIB analysis were also performed.

References :

[Snyder, 2010] J. Snyder, T. Fujita, M. Chen, J. Erlebacher. Nat. Mater., 9 (2010), p. 904

[Forty, 1979] A.J. Forty. Nature, 282 (1979), p. 597

[Sivula, 2010] K. Sivula, R. Zboril, F.L. Formal, R. Robert, A. Weidenkaff, J. Tucek, J. Frydrych, M. Grätzel. J. Am. Chem. Soc., 137 (2010), p. 132

[Wada, 2011] T. Wada, K. Yubuta, A. Inoue, H. Kato. Mater. Lett., 65(2011), p. 1076


Morgane MOKHTARI (Villeurbanne), Eric MAIRE, Christophe LE BOURLOT, Takeshi WADA, Hidemi KATO, Anne BONNIN, Jannick DUCHET-RUMEAU
08:00 - 18:15 #6166 - IM01-150 Large volume 3D SEM for reconstruction of inner structure of soft materials.
IM01-150 Large volume 3D SEM for reconstruction of inner structure of soft materials.

Serial Block-Face Scanning Electron Microscopy (SBFSEM) is one the technique which provides true insight into the composition of the volume of different materials. The volume imaging method helps to understand not only the structure but the function as well. SBFSEM is based on the combination of an in situ ultramicrotomy and electron microscopy which can be turned into the powerful tool for high resolution imaging of large volumes. Tissue and cell biology represents the traditional domain of the method but its application within materials sciences is becoming more apparent. It has been successfully employed in the observation of polymers, composite materials, membranes, metals etc. [1].

Integration and automation of the complete process of the data acquisition; and subsequent data processing represent the challenging task. The method is destructive in its very nature and there are potentially many factors which can influence the cutting and imaging properties. Teneo VSTM is based on refined SBFSEM and designed for fully automatic data acquisition on stained resin embedded biological samples [2]. It combines hardware and software components into one integrated system. The in situ ultramicrotome, placed on the SEM stage, cuts the specimens into thin slices. The exposed block-face is scanned with the electron beam and the backscatter signal collected. Alternate slicing and imaging end up with a series of two dimensional images which come from different depth of the sample. Generally the depth resolution is limited by the thinnest slice thickness which can be cut by a diamond knife. To overcome this limitation virtual slicing was introduced [3]. A series of images at different accelerating voltages is acquired and processed. By their proper selection different depth emission profiles are created. Combination of both approaches allows shifting of the in-depth resolution towards nanometer level and to achieve isotropic voxel size. By using these methods in combination with thicker physical slices means more reliable section thickness and artefact control. 

Imaging of the stained, resin embedded samples is challenging. Both cutting properties and electrical conductivity have to be considered. To neutralize the charge built up on the sample surface low vacuum option is available including the dedicated backscatter detector. Nevertheless clever management of the signal can extend the applicability of the high vacuum mode to a broader range of samples. For Teneo VS such a unique dedicated extension is available to suppress the noise of a charging sample in image formation.

Fig. 1 shows the application of Teneo VS system to volume reconstruction of a polymer blend (isotactic polypropylene/ethylene propylene rubber particles) after a tensile test. Part of the fracture zone was visualized to trace the propagation of cracks through the bulk. Three dimensional field of micro-cracks and a distribution, structure of the filler particles can be studied at high resolution. The crack has been enhanced by RuO4 vapor staining.

As it can be seen here the advancements despite having been engineered for life sciences can be applied directly to other materials. It is hoped that the advances and enhancements which are enjoyed by life sciences with this technique can be fully realized by other sectors interested in volume microscopy.

 

Acknowledgement

We would like to thank to Dr. Armin Zankel (FELMI-ZFE Graz, Austria) who kindly provided us with samples; Technology Agency of the Czech Republic, project TE01020118 for funding.

 

References

[1] Zankel A. et al., Journal of Microscopy, vol. 233(1), pp. 140-148 (2009).

[2] Hovorka M. et al., MC 2015 – Microscopy Conference 2015, Göttingen, Germany.

[3] F. Boughorbel et al., SEM Imaging Method, Patent US 8,232,523 B2, 31st July 2012.


Milos HOVORKA (Brno, Czech Republic), Tomas JANOCKO, John MITCHELS, Libor STRAKOS, Tomas VYSTAVEL
08:00 - 18:15 #6233 - IM01-152 SAMFire – a smart adaptive fitting algorithm for multi-dimensional microscopy.
IM01-152 SAMFire – a smart adaptive fitting algorithm for multi-dimensional microscopy.

   The large amounts of high-quality “multi-dimensional” data generated by modern microscopes open new avenues for quantitative nano-characterization. Quantitative analysis of spectra and images often involve fitting a model to experimental data and, indeed, the literature is rich in applications; examples include atom counting [1], time resolved microscopy [2], electron energy loss [3] and cathodoluminescence [4] spectroscopy. However, using conventional methods to fit large datasets is challenging and when applied to multi-dimensional models, they may become ill-suited. The dominant and most common problem is that conventional methods struggle with any non-linearity in the model and often require an estimate of the starting parameters that are close to the true values. Here we present a Smart Adaptive Multi-dimensional Fitting algorithm (SAMFire) designed to ease the task of fitting such data by automatically generating best estimates for the parameters as the fitting progresses. SAMFire can fit multi-dimensional spectra, images and data of higher dimensionality and will be available in open-source software package HyperSpy v1.0.0 [5].

   SAMFire enables quantitative analysis of large multi-dimensional datasets that would be very challenging—if not impossible—to analyse by other means. It provides multiple fitting strategies that consist of pixel selection and parameter estimation, each tailored to different data structures. Example pixel selection orders are shown in Figure 1(a) for conventional fitting algorithms and in Figure 1(b) for one of the SAMFire strategies. The “raster” order is only viable for unusually stable and constrained models. In contrast, SAMFire follows the “path of least resistance”, learned from already fitted parts of the data and hence is applicable to a much broader range of problems.

   As an example of a complex electron microscopy data analysis problem that can be easily addressed with SAMFire, Figure 2 shows a single spectrum and the result of EELS elemental and bonding quantification by curve fitting from a tilt-series of spectrum-images of a mixed phase nanoparticle. The model consists of eleven components to accurately describe the five elements and a background. Due to the complexity of the model, the geometry of the particle and the low signal-to-noise-ratio, the outcome of fitting individual pixels was highly dependent on the starting parameters, making the analysis very challenging using conventional fitting routines. In contrast, SAMFire was able to fit the whole tilt-series with minimal user input.

   Since SAMFire enables highly sophisticated models to be fitted to large multi-dimensional datasets significantly faster and more easily than previous algorithms, we anticipate it will become standard analysis practice, especially when quantitative analysis is required. Examples that we are currently considering include tracking motion in a time series and quantification of both light and trace elements in multiple-domain structures.

   We acknowledge the support received from the European Union Seventh Framework Program under Grant Agreement 312483 – ESTEEM2 (Integrated Infrastructure Initiative – I3) and under Grant Agreement 291522-3DIMAGE. We thank Raul Arenal and Rowan Leary for providing the raw data shown in Figure 2.

   

[1] Van Aert, S., et al. Nature 470.7334 (2011): 374-377.

[2] Yurtsever, A., van der Veen, R. M., & Zewail, A. H. (2012). Science, 335(6064), 59-64.

[3] Verbeeck, J., and Van Aert, S. Ultramicroscopy 101.2 (2004): 207-224.

[4] Zagonel, L. F., et al. Nano Letters 11.2 (2010): 568-573.

[5] www.hyperspy.org


Tomas OSTAŠEVIČIUS (Cambridge, United Kingdom), Francisco DE LA PEÑA, Paul MIDGLEY
08:00 - 18:15 #6339 - IM01-156 Discrete STEM/EDX tomography for quantitative 3D reconstructions of chemical nanostructures.
IM01-156 Discrete STEM/EDX tomography for quantitative 3D reconstructions of chemical nanostructures.

We report here on the quantitative 3D reconstruction of core-shell nanostructures by STEM/EDX using two X-ray maps acquired at two different tilt angles perpendicular to each other (Rueda et al., 2016; fig. 1). The method is based on the modelling of the NW cross-section using a series of imbricated ellipses whose dimensions are defined by their major and minor diameters (fig. 2). The number of ellipse depends on the number of chemical phases which are identified from the concentration profiles. The position and orientation of each ellipse are determined by the coordinates of their respective centers and the overall tilt of the nanowire, respectively. More sophisticated models, using hexagons or rectangles instead of ellipses, have been developed in order to take into account the crystal structure of nanowires exhibiting facetted sidewalls. These models are based on the elliptical model, by constructing the tangents to an ellipse, and hence, are defined by the same parameters, which is useful when comparing models. Considering a system of a number of K ellipses with ξk,j the local concentration of element j for the kth ellipse (k=1 for the largest ellipse), then the average concentration Ci,j of element j for the ith pixel along the x-axis must satisfy the following equations (equations 1):

                                                       Ci,jt1,i = ξK,jtK,i  for K=1

                                                       Ci,jt1,i = ΣKk=2 ξk-1,j(tk-1,i - tk,i) + ξK,jtK,i  for K≥2

With t1,i and tk,i, the local thickness at pixel i of the first and kth ellipse, respectively. The local thickness of the first ellipse (= the total thickness of the cross-section) and the average concentration Ci,j of element j present along the beam axis is determined using the zeta-factor method (Watanabe and Williams, 2006):

                                                        t1,i = Σmj=1Ii,jζjAi,j/Ibρ                (equation 2)

                                                        Ci,j = Ii,jζjAi,jmj=1Ii,jζjAi,j                  (equation 3)

With: m the total number of element, Ib the beam current; ρ the sample density; ζj the zeta-factor of element j determined using reference samples of known composition and thickness (Lopez-Haro et al., 2014); Ii,j and Ai,j the net X-ray intensity and the absorption correction term for element j at pixel i, respectively. The absorption correction term is estimated from a simple model that takes into account the direction of the X-ray emission relative to the position of the detectors, knowing the thickness, density, and mass absorption coefficient of the material through which the radiation travels (Rueda et al., 2016).

The method for reconstructing the cross-section can be divided into three steps: 1) the appropriate cross-sectional model is selected by comparing the thickness profile calculated from equation [2] with the thickness profile simulated for elliptical, hexagonal, and rectangular cross-sections (figure 3); 2) the number of ellipses is determined, and their dimensions are evaluated, from the concentration profiles; 3) the local concentrations ξk,j are determined and the dimensions of the ellipses are adjusted by minimizing the compositional differences between profiles calculated from equation [3] and simulated by equation [1].

This method was applied for reconstructing core-shell nanostructures on (Mg, Mn, Cd, Zn)(Te,Se) and (Al, Cu)Ge nanowires and (Pt, Co) nanoparticles. Advantages and limitations of the method will be presented and discussed at the conference.

References: P. Rueda-Fonseca, E. Robin, E. Bellet-Amalric, M. Lopez-Haro, M. Den Hertog, Y. Genuist, R. Andre, A. Artioli, S. Tatarenko, D. Ferrand, and J. Cibert (2016) Quantitative Reconstructions of 3D Chemical Nanostructures in Nanowires, Nanoletters, DOI: 10.1021/acs.nanolett.5b04489.

M. Watanabe & D. B. Williams (2006) The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new ζ-factor methods, Journal of Microscopy 221, 89–109.

M. Lopez-Haro, P. Bayle-Guillemaud, N. Mollard, F. Saint-Antonin, C. Van Vilsteren, B. Freitag and E. Robin (2014) Obtaining an accurate quantification of light elements by EDX: K-factors vs. Zeta-factors, 18th International Microscopy Congress, Czechoslovak Microscopy Society: Prague.


Eric ROBIN (GRENOBLE), Miguel LOPEZ-HARO, Nicolas MOLLARD, Pamela RUEDA-FONSECA, Marta ORRU, Edith BELLET-AMALRIC, Yann GENUIST, Regis ANDRE, Alberto ARTIOLI, Serge TATARENKO, David FERRAND, Joel CIBERT, Khalil EL HAJRAOUI, Martien DEN HERTOG, Thibault CREMEL, Kuntheak KHENG, Laure GUETAZ
08:00 - 18:15 #4443 - IM02-158 Understanding the enhanced ductility of TiAl alloys using a hybrid study of in-situ TEM experiment and molecular dynamics.
IM02-158 Understanding the enhanced ductility of TiAl alloys using a hybrid study of in-situ TEM experiment and molecular dynamics.

An in-situ transmission electron microscopy study was conducted at room temperature in order to understand an underlying mechanism on room temperature ductility of TiAl alloys. Also, melecular dynamics simulation was conducted to calculate the stacking fault energy of TiAl alloys and to show which deformation mode is dominant. From in-situ straining transmission electron microscopy experiments, it was revealed that the crack path and deformation mode is different between the TiAl alloys with/without room temperature ductility. The crack in TiAl alloys having room temperature ductility interacted with lamellae by forming bridging ligaments between the two α2 lamellae and the γ lamellae. In contrast, the cracks in TiAl alloys without room temperature ductility propagated along grain (colony) boundaries showing brittle intergranular fracture. From the quantitative in-situ TEM experiements, it was found that the γ lamellar of TiAl alloys having room temperature ductility was deformed by slip (Fig. 1). However, the γ lamellar of TiAl alloys without room temperature ductility was deformed by deformation twin (Fig. 2). The difference in deformation mode was explained by stacking fault energy of the TiAl alloys which was calculated by molecular dynamics. The TiAl alloy with low stacking fault energy was deformed by deformation twin (Fig. 2) whereas the TiAl alloy with high stacking fault energy was deformed by dislocation slip (Fig. 1). Furthermore, the role of lamellar orientation of tensile direction on deformation behavior was examined using Schmid factor of each orientation.

Finally, we proposed the important microstructural factors to have room temperature ductility of TiAl alloys.


Seong-Woong KIM (Changwon, Republic of Korea), Seung-Hwa RYU, Young-Sang NA, Seung-Eon KIM
08:00 - 18:15 #5162 - IM02-160 Imaging of Electron Beam Triggered Phase Transformations and Chemical Reactions of Organic Molecules by Aberration-Corrected Low-Voltage Transmission Electron Microscopy.
IM02-160 Imaging of Electron Beam Triggered Phase Transformations and Chemical Reactions of Organic Molecules by Aberration-Corrected Low-Voltage Transmission Electron Microscopy.

Direct observation of organic single-molecules in their pristine state using transmission electron microscopy (TEM) is a challenging task because the electron irradiation during high-resolution imaging can modify the structure under investigation. However, recent advances in low-voltage aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) allow atomic resolution even at accelerating voltages as low as 20kV [1] allowing atomic-resolution imaging even for light-element materials with knock-on damage thresholds below 80kV [3]. However knock-on damage is not the only damaging process. A reduction of the electron beam-induced charging and radiolysis effects can be obtained by dedicated sample preparation such as embedding the sensitive material into a chemically inert, conducting, and one-atom thick container such as a carbon nanotube [3] or in between two layers of graphene [4]. By combining dedicated low-voltage TEM instrumentation with sophisticated sample preparation, electron irradiation-induced damage mechanisms slow down or can even be completely turned off which even allows imaging of molecules containing hydrogen-carbon bonds [5].

In this work we apply low voltage AC-HRTEM not only to image but also to trigger a previously unknown chemical reaction – the polycondensation of perchlorocoronene (PCC), which leads to the formation of graphene nanoribbons, an exciting polymeric structure with significant potential for electronic applications. The multi-step mechanism of this reaction was determined by AC-HRTEM and is both complex and difficult to postulate a priori or from macroscopic observations.  However our time-series imaging at the single-molecule level reveals the nature of key intermediates and follows the pathways of their transformations, thus providing the most direct experience of chemical reactions and demonstrating the physical reality of the elusive steric factor in real space. Figure 1a shows a time series of PCC molecules stacked in single walled carbon nanotube and their electron beam induced changes over time as a product of the accumulated electron dose. A close examination of the experimental images (Figure 1b) indicates that intermolecular reactions are possible only when a PCC molecule can change its orientations with respect to the neighbouring molecules: two non-parallel molecules are able to join together to form angular species which gradually transform into planar species approximately twice the length of the original PCC molecules.

 

References

[1] Kaiser U, Biskupek J, Meyer JC, Leschner J, Lechner L, Rose H, Stöger-Pollach M,  Khlobystov AN, Hartel P, Müller H, Haider M, Eyhusen S, Benner G, Ultramicroscopy 111 (2011), 1239-1246

[2] Chamberlain TW, Zoberbier T, Biskupek J, Botos A, Kaiser U, Khlobystov AN, Chemical Science 3 (2012), 1919-1924

[3 ]Meyer JC,  Eder F, Kurasch S, Skakalova V, Kotakoski J, Park HJ, Roth S, Chuvilin A, Eyhusen S, Benner G, Krasheninnikov AV, Kaiser U, PRL 108 (2012), 196102

[4] Algara-Siller G, Kurasch D, Sedighi M, Lehtinen O, Kaiser U, Appl. Phys. Lett. 103 (2013) 203107

[5] Chamberlain TW, Biskupek J, Skowron ST, Bayliss PA, Bichoutskaia E, Kaiser U, Khlobystov AN, Small 11 (2015) 622-629

Acknowledgement

We acknowledge the financial support of the German Research Foundation (DFG) and the Ministry of Research, Science and the Arts of Baden-Württemberg within the SALVE project.


Johannes BISKUPEK (Ulm, Germany), Thomas CHAMBERLAIN, Stephen SKOWRON, Elena BESLEY, Andrei KHLOBYSTOV, Ute KAISER
08:00 - 18:15 #5163 - IM02-162 Time resolved HREM of Al crystal surface.
IM02-162 Time resolved HREM of Al crystal surface.

The crystallization of Ge:Al amorphous films was studied by time resolve TEM intensively in previous years and reported[1]. These studies included the geometry and the dynamics of Al-amorphous interface with time resolution of 40 milliseconds by conventional bright-field (BF) and dark-field (DF) TEM imaging of films of 50 nm thickness and by conventional high resolution (HR) TEM of films of 25nm thickness. The propagation of the Al interface is diffusion controlled, i.e. the velocity is temperature dependent [1]. The Al-amorphous interface was found to be rough with a fractal dimension of 1.2 for the projected image [2]. However, the quantitative analysis of the interface propagation indicates a long range interaction in the Al-amorphous phase interface [3]. These interactions were attributed to existence of ramified clusters of Al in the Ge:Al amorphous phase [4].

Here we will report on quantitative measurements that were obtained with 5 nm thick films heated locally by the electron beam resulting in the modification of the surface. The quantitative measurements will be based on observations that include aberration corrected HRTEM with low time resolution (1 sec) and by conventional HRTEM with high time resolution (few milliseconds). The later will be used also for evaluating the stability of the interface toward its 3D construction. 

 

References:

  1. Y. Lereah, E. Grunbaum and G. Deutscher, Physical Review A 44 8316 (1991)

  2. Y. Lereah, J.M. Penisson and A. Bourret, Applied Physics Letters 60 1682 (1992)

  3. Y. Lereah, A. Gladckikh, S. Buldyrev and H.E. Stanley, Physical Review Letters 83, 784 (1999)

  4. Y. Lereah, S. Buldyrev and H.E. Stanley, Materials Science Forum Vols. 294-296 (1999) p. 525-528

 


Yossi LEREAH (Tel aviv, Israel), Johannes BISKUPEK, Ute KAISER
08:00 - 18:15 #5241 - IM02-164 Dynamic oxidation and reduction of catalytic nickel nanoparticles using E(S)TEM.
IM02-164 Dynamic oxidation and reduction of catalytic nickel nanoparticles using E(S)TEM.

For many materials, nanoparticles show enhanced catalytic activity and selectivity compared to their bulk state [1]. While catalytic nanoparticles have many industrial, economic and environmental benefits, they also present new challenges, the most significant of which is to characterise the intermediate phases and structural changes to the active catalyst species under reaction conditions. TEM is uniquely suited to the study of solid-state heterogeneous catalysis as it allows us to directly characterise the catalyst with regard to its nanostructure on the atomic scale. Complementary spectroscopy techniques such as EDS and EELS can be used in tandem with imaging to add chemical data to the structural observations. The in-situ capabilities of the E(S)TEM allow for intermediate catalyst phases and transformations to be observed, some of which are only present under reaction conditions and would be lost using ex-situ methodologies [2].

Here we present a study of the dynamic nature of Ni based catalysts under redox conditions relevant to industrial processes [3, 4]. The increased activity of finely divided Ni means that it is important to directly observe the Ni nanoparticles rather than interpreting models based on bulk or ex-situ techniques. Many chemical processes that rely on Ni catalysts involve exposure to both oxidising and reducing gas in the reaction environment. Under reducing and oxidising conditions the structure of Ni nanoparticles is dynamic and involves transitions between single crystal Ni, core-shell Ni/NiO and hollowed Kirkendall-like structures [5, 6]. These changes are dependent on the material properties (size, shape and support interaction) and reaction parameters (temperature, gas type and pressure). Furthermore, these dynamic structure/shape changes influence the stability of the catalyst, which in turn is controlled by the reaction environment. As such, this area of research is crucial for understanding the conditions necessary for attaining and maintaining a particular catalytic species and designing the reaction routes required to reactivate spent Ni catalysts.

Environmental TEM/STEM has been used to probe the dynamic oxidation of Ni nanoparticles. The particle size, reaction time and temperature dependencies of the oxidation process have been investigated using both model and industrial Ni catalysts. Furthermore, we have applied the same in-situ techniques to reveal the conditions needed for complete reformation/reactivation of the original Ni species.

[1] B.R. Cuenya, Thin Solid Films, 518 (2010) 3127-3150.

[2] E.D. Boyes, M.R. Ward, L. Lari, P.L. Gai, Annalen der Physik, 525 (2013) 423-429.

[3] P.M. Mortensen, J.-D. Grunwaldt, P.A. Jensen, A.D. Jensen, Catalysis Today, 259 (2016) 277-284.

[4] S. Hu, M. Xue, H. Chen, Y. Sun, J. Shen, Chinese Journal of Catalysis, 32 (2011) 917-925.

[5] S. Chenna, P.A. Crozier, Micron, 43 (2012) 1188-1194.

[6] R. Nakamura, J.G. Lee, H. Mori, H. Nakajima, Philosophical Magazine, 88 (2008) 257-264.

Acknowledgements: The EPSRC (UK) is supporting the AC ESTEM development and continuing applications at York under strategic research grant EP/J018058/1.


David LLOYD (North Shields, United Kingdom), Alec LAGROW, Edward BOYES, Pratibha GAI
08:00 - 18:15 #5275 - IM02-166 A NanoWorkshop Toolkit for in situ Nanoassembly and Nanocharacterization.
IM02-166 A NanoWorkshop Toolkit for in situ Nanoassembly and Nanocharacterization.

Fitting a Focussed Ion Beam / Scanning Electron Microscope (FIB/SEM) with a micromanipulators as well as a range of plug-in tools transforms the microscope from a device purely used for observation to a workstation where materials can be manipulated, assembled, characterized, etc. - at the micron, sub-micron, and nano scale.

Typical applications include harvesting, arranging, and mechanically testing nanowires, nano tubes, and CNTs. It is also often of great interest to characterize nanowires, nanotubes, CNTs, etc. electrically.

Electrical and mechanical tests as well as structural investigations on MEMS devices are also commonly performed tasks.

This work will present a number of different experiments performed inside SEM or FIB/SEM tools. Among these are pick and place operations on sub-micron sized particles, mechanical testing of nanowires and CNTs as well as in situ thermal experiments.

One of the described experiments entails mounting a strand of CNTs to a force measurement cantilever inside an SEM and subsequently performing a tensile experiment on the strand of CNTs. The CNTs are mounted to the force measurement cantilever using a special vacuum compatible adhesive. The adhesive can be applied in situ using a fine tip on the end of a micromanipulator. The tip is dipped into a small droplet of the adhesive in order to wet it. Next, some adhesive is transferred to the force measurement cantilever. In an additional step, some adhesive is used to extract a strand of CNTs from a large bundle. The extracted CNTs are brought into contact to the wetted force measurement cantilever and the adhesive is cured using the electron beam. Finally, the a force measurement is performed revealing the CNTs tensile strength.


Andrew Jonathan SMITH, Andreas RUMMEL, Klaus SCHOCK, Stephan KLEINDIEK (Reutlingen, Germany)
08:00 - 18:15 #5286 - IM02-168 In situ and cryo (S)TEM imaging of internal microgel architectures.
IM02-168 In situ and cryo (S)TEM imaging of internal microgel architectures.

More than ever polymer science focuses on complex molecular structures and supramolecular assemblies. Microgels are responsive polymer materials and structures, which can be manipulated in e.g. charge or size  by external parameters like pH or temperature variation. The investigated microgels are soft particulate polymer networks that can be dispersed in an aqueos medium. They reveal unique features providing new opportunities to develop smart bio-inspired materials. In contrast to rigid colloidal particles, which lack the possibility to adapt their size and shape to enviromental requirements, microgels have switchable properties of form and function that make them very useful in a wide range of e.g. biological sciences and medical applications. They combine properties of dissolved macromolecules with those of colloidal particles.

The direct visualization of the internal structure of materials is very important to analyse the spatial distribution of different compartments and, thus, to design novel materials with tailored properties. Microgels can be prepared with various morphologies and functions in different compartments. Careful analysis of the correlation between architecture and function requires powerful methods to visualize inner structure and compartmentalization in the nanometer range.

Here, the direct visualization of different compartments within microgels using a combination of in situ and cryo transmission electron microscopy methods is shown. In particular, the challenge of determing the radial distribution of appropriately labeled compartments within single microgels and particles from 2D projections is adressed.

Microgels with core-shell architecture were obtained by precipitation polymerization. First a particle was synthesized and purified before a shell was synthesized on top by the seed and feed method. Core and shell have oppositely charged copolymers to create a two compartment amphoteric microgel system, that is alternately stained with gold and magnetite nanoparticles. [1], [2]

For in situ liquid cell experiments, a thin layer of liquid was embedded between two hermetically sealed, electron transparent Si3N4-windows. The used holder is an in situ-liquid cell holder manufactured by Hummingbird Company and the microscope is a Zeiss Libra 200FE with an acceleration voltage of 200 kV. The resolution is mainly limited by the thickness of the liquid.

Figure 1 shows a comparison between cryo TEM and in situ STEM. Due to the liquid layer thickness the resolution is limited in (b). Also the Brown emotion leads to a defocused and smudged image.

Figure 2 shows the comparison of the radial distribution of nanoparticles according to the two images above calculated by a MATLAB routine. For the cryo TEM image in (b) the relative particle density as a function of the relative particle radius is plotted. (c) shows a 3D reconstruction of the model.

References:

1. J, Dockendorff, M. Gauthier, A. Mourran, M. Moller, Macromolecules (Washington, DC, US), 41 (2008) 6621.

2. A. Pich, S. Bhattacharya, Y. Lu, V. Boyko, H.-J. P. Adler, Langmuir 20 (2004) 10706.

 

Acknowledgement:

The authors kindly acknowledge the financial support by the DFG through the SFB 985 "Functional Microgels and Microgel Systems".

 


Tobias CAUMANNS (Aachen, Germany), Arjan GELISSEN, Alexander OPPERMANN, Pascal HEBBEKER, Rahul TIWARI, Sarah TURNHOFF, Dominik WÖLL, Andreas WALTHER, Joachim MAYER, Walter RICHTERING
08:00 - 18:15 #5355 - IM02-170 In situ observation of heat-induced degradation of perovskite solar cells.
IM02-170 In situ observation of heat-induced degradation of perovskite solar cells.

The use of perovskite materials (particularly methylammonium lead iodide) in solar cells has become very attractive due to the fast increase in reported power conversion efficiencies over the last few years, leading to values above 20%. While this value is competitive with established photovoltaic technologies, the stability of perovskite-based solar cells is still insufficient for commercial applications. In particular, it is very well known that some components, including the perovskite layer and the hole transporter, can degrade when exposed to a combination of heat and moisture. In situ TEM is an ideal tool for investigating such degradation and understanding the phenomena underpinning it.

In this work [1,2] we prepare methylammonium lead iodide cells using different approaches from the literature (with the perovskite conversion carried out in single- and double-step in glovebox, in air or in vacuum); we prepare TEM cross-sectional samples using focused ion beam milling.

For each cell, we carry out scanning TEM imaging and EDX elemental mapping (shown in Figure 1) as they are heated in situ in the TEM. This is a procedure that requires careful control over the temperature and the electron dose. To that aim we exploit recent advances in TEM-related technology, such as Silicon Drift Detectors (SDD) for EDX, which collect energy-dispersed X-ray spectra with a good yield, and stable MEMS heaters, enabling the temperature to be cycled quickly and reproducibly. Moreover, we employ multivariate analysis (principal component analysis, PCA) to increase the signal-to-noise ratio of the spectral maps.

Cross-sectional views acquired after heating are reported in Figure 2. We do not observe changes in the morphology or the elemental distribution in the perovskite layer for heating up to 150°C for short times (employing a heating ramp with 30’ steps every 25°C). Since the ex-situ heating of the same samples above 90°C causes a significant decay in cell performance, we attribute such decay to the degradation of the charge transport properties of the hole transporter (spiro-OMeTAD in this case). Increasing the temperature further, different decomposition patterns emerge for the perovskite layer. In samples that had not been exposed to air, elemental migration of lead and iodine results in the formation of aggregates, which EDX suggests might be PbI2, clustering on the FTO electrode. In the sample exposed to air, a different phenomenon occurs – instead of forming aggregates, the elemental species diffuse from the perovskite into the hole transporter. This is visible both as an increased contrast in the high-angle annular dark field images (HAADF) and as features in the EDX spectra; we hypothesise that the trapped moisture within the cell might be hindering the formation of PbI2 and make elemental diffusion more favourable.

[1] Divitini, G. et al. – Nature Energy 201512 (2016)

[2] Matteocci, F. et al. – ACS Applied Materials & Interfaces 7, 26176 (2015)


Giorgio DIVITINI (Cambridge, United Kingdom), Stefania CACOVICH, Fabio MATTEOCCI, Lucio CINA', Aldo DI CARLO, Paul MIDGLEY, Caterina DUCATI
08:00 - 18:15 #5443 - IM02-172 In situ STEM observation of the impact of surface oxidation on the crystallization of GeTe Phase Change Material thin films.
IM02-172 In situ STEM observation of the impact of surface oxidation on the crystallization of GeTe Phase Change Material thin films.

Chalcogenide phase change materials (PCMs) such as Ge-Sb-Te and GeTe alloys exhibit outstanding properties, which has led to their successful use as non-volatile resistive memories in Phase Change Random Access Memories (PCRAM). PCRAM using PCMs can be switched reversibly between their crystalline and amorphous phases with different optical and electrical properties offering a unique set of features such as fast programming, good cyclability, high scalability, multi-level storage capability and good data retention. Controlling the crystallization is a challenge and numerous studies have been conducted to probe interface and size effects on the PCM crystallization. Surface engineering has a crucial role on the crystallization temperature and mechanisms[1,2]. Temperature resolved reflectometry experiments have shown that the crystallization temperature of GeTe films (in the thickness range 30-100 nm) change drastically depending on its surface state (Fig.2). For a better understanding of this phenomenon, we performed in situ STEM experiments to observe the complete crystallization mechanisms at a nanometer scale of GeTe films with various surface states.

Amorphous GeTe films were deposited by magnetron sputtering in an industrial cluster tool and were protected either by in situ deposition of a 10nm thick SiN capping layer or left uncapped before being exposed to air. For STEM analysis, a specifically adapted preparation method using focused ion beam (FIB) milling has been developed in order to perform in situ annealing and crystallization of the GeTe films directly in the microscope (Fig.1). In particular, a specific positioning of the FIB foil enables low energy cleaning despite the sample holder configuration. We will show that this new sample preparation method, combined with the precise temperature control and negligible spatial drift when using the Protochips Aduro sample holder, allows atomic resolution and quantitative analysis to be obtained during in situ annealing.

Results show that the uncapped (i.e. surface oxidized) GeTe film exhibits a two-step crystallization mechanism. First, the crystallization spreads across the sample over the top 20 nm of the initial amorphous layer. If the temperature ramp is allowed to continue, the nucleation-growth of the remaining amorphous part of the GeTe film is triggered at 50°C above the temperature corresponding to surface crystallization (Fig.3b,d,f).

We will give evidence that the GeTe film capped by a 10nm SiN layer prior to air exposure exhibits a very different crystallization temperature and mechanism. Indeed, in that sample a single-step crystallization occurs through a one-step nucleation- growth in the whole layer at a temperature corresponding to the second crystallization step of the uncapped GeTe film. By quenching before complete crystallization, crystalline nuclei were imaged at high resolution and we observed that crystallization occurred by volume nucleation within the amorphous layer (Fig.3a,c,e).

We will show that if protected from oxidation, the GeTe crystallization mechanism can be a pure nucleation-growth process happening about 50°C above previously reported values [2]. An interpretation of this crystallization mechanism will be proposed based on the elemental segregation obtained by EDS and live recording of the crystallization obtained using multiple STEM detectors. This information will be invaluable to improve reliability and data storage capability of GeTe based devices. By adapting our in situ procedure for electrical biasing, it will be possible to perform real time TEM observation of GeTe switching between ON and OFF states. Then by comparing both electrical and thermal induced crystallization, we will be able to obtain important information about GeTe switching at an atomic scale to provide better devices.

References

1.            R. Pandian, B.J Kooi,  J. De Hosson and A. Pauza, Journal of Applied Physics, 100, 123511 (2006).

2.            P. Noe et al, In press, Acta Materialia (2016).


Rémy BERTHIER (GRENOBLE), Nicolas BERNIER, David COOPER, Chiara SABBIONE, Francoise HIPPERT, Pierre NOÉ
08:00 - 18:15 #5568 - IM02-174 Microstructural and mechanical properties of hyper-deformed surfaces: In-situ micro-pillar compression and EBSD investigations in α-iron.
IM02-174 Microstructural and mechanical properties of hyper-deformed surfaces: In-situ micro-pillar compression and EBSD investigations in α-iron.

The mechanical surface treatments confer better local mechanical properties against wear or fatigue service conditions. In the case of impact-based treatments, a local microstructure refinement in the near surface is produced by a severe plastic deformation of the material, leading to a progressive reduction of the grain size over a few tens of microns, and consequently an increase of the hardness and mechanical properties. These zones are commonly known as Tribologically Transformed Surfaces (TTS). In this project, the micro-structural transformation in the near surface is produced on pure α-iron samples using a repetitive impact-based procedure: Micro-percussion treatment. In this technique, every impact is effectuated on the same position with a rigid conical indenter (tungsten carbide), controlling the number, angle and velocity of impacts. The resulting imprint (figure 1) is characterized by a significant grain size refinement and consequently a graded strengthening as a function of distance to the impacted surface. Moreover, several in-situ micro-pillar compression tests are carried out in the cross-section of the hyper-deformed surface (figure 2) in order to quantify this mechanical property gradient in-depth. However, the yield strength increment observed with this technique does not reveal the different micro-structural contributions (grain size effect, dislocation hardening, etc…) on the increase of mechanical properties. Indeed, the main purpose of this work is to correlate the mechanical properties gradient with the local microstructural evolution produced by the impact-based severe plastic deformation. For these purpose, EBSD mapping (figure 1) is used to determine the grain size distribution and the local “Kernel Average Misorientation” (KAM) in the cross section. A qualitative estimation of the geometry necessary dislocation density could be done from this latter estimation. With this analysis, the Hall-Petch and dislocation strengthening contributions could be correlated and compared with the experimental results from micro-pillar compressions (figure 2).


David TUMBAJOY-SPINEL, Sergio SAO JOAO (LYON CEDEX 7), Xavier MAEDER, Sylvie DESCARTES, Jean Michel BERGHEAU, Johann MICHLER, Guillaume KERMOUCHE
08:00 - 18:15 #5573 - IM02-176 Measurement of mechanical properties gradient on impact-based transformed surfaces: Nano-mechanical testing in graded micro-structured α-iron.
IM02-176 Measurement of mechanical properties gradient on impact-based transformed surfaces: Nano-mechanical testing in graded micro-structured α-iron.

In the industry, there are several techniques which improve the service lifetime of materials by increasing the local mechanical properties in the near-surface. In the case of mechanical surface treatments (such as impact-based), the material is exposed to repeated mechanical loadings, producing a severe plastic deformation in the surface, and then leading to a local refinement of the microstructure into the affected zone (Tribologically Transformed Surfaces - TTS). The microstructure’s transformation is characterized by a progressive increment of the grain size from the surface until the bulk material. Consequently, very interesting physical properties such as high hardness and better tribological properties are exhibit in these mechanically-induced transformed surfaces. Nowadays, it is well-known that the grain size gradient generated provokes an evolution on the mechanical properties in the impacted zone over a few tens of microns. However, a simple micro-hardness test is not quite enough to quantify precisely the engendered variation of mechanical properties due to the heterogeneity of the transformed surface. The main issue of this work is to assess and describe precisely the elastic-plastic behavior and the distribution of mechanical properties on deformed zones of a model material (pure α-iron). In our project, a characterization of the transformed microstructure, as well as a statistics measurement of the grain size distribution on the cross-section of the sample is presented firstly. Afterwards a methodology based on nano-indentation tests (Figure 1) and in-situ micro-pillars compression tests (Figure 2) is implemented to quantify the evolution of mechanical properties starting from the near-surface. A relation between the hardness gradient and the microstructure evolution is established, as well as a comparison between the properties measured by both techniques is discussed.


David TUMBAJOY-SPINEL (LYON CEDEX 7), Sylvie DESCARTES, Jean Michel BERGHEAU, Sergio SAO JOAO, Gaylord GUILLONNEAU, Johann MICHLER, Guillaume KERMOUCHE
08:00 - 18:15 #5579 - IM02-178 In-Situ ESTEM Observations of Asymmetric Oxidation and Reduction in Copper Nanoparticles.
IM02-178 In-Situ ESTEM Observations of Asymmetric Oxidation and Reduction in Copper Nanoparticles.

A fundamental understanding of the oxidation and corrosion mechanisms of metals is of critical importance to improving their performance in catalysis, and other industrial applications.1 For applications in nanocatalysis a metals oxidation pathway and subsequent reduction can lead to the rearrangement of catalytically active surface facets2 as well as deactivation through sintering and Ostwald ripening.3 In particular we are studying copper which can readily oxidize at room temperature and has two native oxides, cuprous oxide (Cu2O) and cupric oxide (CuO). The oxidation of copper has been previously reported to be dependent on its crystallography4 as well as the interaction between the copper and the substrate.5

In this talk we will discuss the use of environmental scanning transmission electron microscopy (ESTEM)6 to study the in-situ oxidation of copper. Environmental STEM was carried out in a modified JEOL 2200 which allowed for the introduction of gases into the microscope and using a DENSsolutions holder to control the reaction temperature. The copper is studied in the form of nanoparticles of 2 - 50 nm in size. With high angle annular dark field (HAADF) STEM we use conditions that are ideal to track the oxidation front as it progresses across the copper nanoparticles by following the changes in Z-contrast with time. In the case of copper, the oxidation occurred via the heterogeneous nucleation of the oxide phase (Cu2O) from the smallest point on the nanoparticle (Figure 1a and 1b). When the process is reversed, via reducing the particles with hydrogen, it was also observed that the reduction was initially nucleated from the smallest part of the nanoparticle and then spread across the particle. Preliminary analysis of the data suggests that once the oxidized or reduced phase is nucleated the reaction is mediated by the Cu/Cu2O interface.

References:

(1) Gattinoni, C.; Michaelides, A. Surf. Sci. Rep. 2015, 70, 424.

(2) Cabie, M.; Giorgio, S.; Henry, C. R.; Axet, M. R.; Philippot, K.; Chaudret, B. J. Phys. Chem. C 2010, 114, 2160.

(3) Martin, T. E.; Gai, P. L.; Boyes, E. D. ChemCatChem 2015, 7, 3705.

(4) Luo, L.; Kang, Y.; Yang, J. C.; Zhou, G. Surf. Sci. 2012, 606, 1790.

(5) Gai, P. L. and Boyes, E.D., Electron Microscopy in Heterogeneous Catalysis: IOPP (2003).
(6)  Boyes, E. D.  and Gai, P.L.,  C.R. Physique 2014, 15, 200.  

The ESPRC (UK) is supporting the AC ESTEM development and continuing applications at York under strategic research grant EP/J018058/1.


Alec LAGROW (York, United Kingdom), Michael WARD, David LLOYD, Edward BOYES, Pratibha GAI
08:00 - 18:15 #5585 - IM02-180 In situ TEM observation of electromigration in Ni nanobridges.
IM02-180 In situ TEM observation of electromigration in Ni nanobridges.

Using in situ scanning transmission electron microscopy (STEM) (FEI Titan microscope operating at 300 keV), a microelectromechanical system (MEMS) chip and a dedicated biasing and heating sample holders, built in-house, we investigated electrical and thermal properties of 15-nm-thick Ni nanobridges. These techniques allow to visualize nanobridge morphology transformations down to atomic scale while electrical current is passed. If thin metallic wire is subjected to high current density, the material transfer can start which results in the wire break. This phenomenon is called electromigration 1.

Ni nanobridges with a length of 500 – 1000 nm and a width 200 – 500 nm were produced by e-beam metal evaporation onto a 100-nm-thick freestanding silicon nitride membrane and patterned using electron beam lithography (Fig. 1a). Contacts to the nanobridges were made with a 100-nm-thick layer of Au and a 3-nm-thick adhesion layer of Cr. Initial resistance of the structures, including bridge, contact pads and leads, is in the range of 160 – 250 Ohm. More details of the sample preparation can be found elsewhere 2. Using electrical setup 3, I–V measurements were performed in bias-ramping mode. Voltage is gradually increased (with a speed of 15 mV/s) from 0 V to a predefined value of 500–600 mV, followed by a decrease back to 0 V, after which a new cycle with higher maximum voltage was performed (Fig. 1f).

Fig.1 shows STEM images of Ni nanobridge with 10-nm-thick Al2O3 oxidation-protective layer on top taken before electromigration and after each bias-ramping cycle with maximum voltages 500 mV, 520 mV, 540 mV and 580 mV. Fig. 2f shows corresponding I–V curves for four voltage cycles applied in a row. Sample temperature prior to voltage apply was 100 K. During electromigration experiments in Ni material transfer was shown to be voltage polarity dependent: Voids initially form near the cathode contact pad of the bridge, as in the majority of metals due to electron-wind force, but at the end bridge breaks near the anode side.

Also, we visualised morphological transformations in polycrystalline Ni film (deposited on top of the heater with 20-nm-thick windows in Si3N4 membrane) during substrate heating up to 400°C (Fig. 2) and estimated the bridge temperature achieved in electromigration experiments due to the Joule heating to be around the Curie point. In order to enhance the contrast between grains, annular dark-field STEM imaging was used 4.

Enriched with oxygen bubbles formation was found due to Ni nanobridges oxidation after a month of their storage at atmospheric pressure. In order to prevent samples oxidation, 10-nm-thick Al2O3 layer was used as a protective layer. The place of bridge break near the anode side was shown to be independent on the ambient pressure and substrate temperature.

Acknowledgement: The authors gratefully acknowledge STW UPON and ERC project 267922 for support.

 

1.         Ho, P. S.; Kwok, T. Rep Prog Phys 1989, 52, (3), 301-348.

2.         Kozlova, T.; Rudneva, M.; Zandbergen, H. Nanotechnology 2013, 24, 505708.

3.         Martin, C. A., et al. Rev Sci Instrum 2011, 82, 053907.

4.         Rudneva, M., Kozlova, T. & Zandbergen, H. Ultramicroscopy 2013, 134, 155-159. 


Tatiana KOZLOVA (Delft, The Netherlands), Henny W. ZANDBERGEN
08:00 - 18:15 #5629 - IM02-182 In situ SEM dynamic investigation of charging kinetics in insulating materials.
IM02-182 In situ SEM dynamic investigation of charging kinetics in insulating materials.

Dielectric breakdown constitute an important limitation in the use of insulating materials since it causes its damage. This catastrophic phenomenon (Figure 1) is obviously an important failure in the levels of equipment requiring some insulation safety or ensuring their proper functioning. This causes some technological problems associated with the manufacture and use of insulating materials in several industrial sectors like in microelectronics, high voltage electric energy transport and spacecraft. The choice of insulating material for those applications is related to the corresponding breakdown voltage value which limits their use. To improve the resistance to dielectric breakdown, it is imperative to understand and control the cause of this damage process reducing the reliability of some instrumentation. It is well known that breakdown is correlated with the presence of space charge within the insulators. Indeed, breakdown is related to a fast relaxation (detrapping) of trapped charge. Commonly, this space charge can be determined by the SEMME method (Scanning Electron Microscope Mirror Effect) which quantifies the final trapped charge amount. The purpose of this work is to develop a technique using a specific arrangement in the SEM chamber (Figure 2) in order to characterize the trapped charge dynamic by ICM (Induced Current Method).  This technique allows enhancing the understanding of trapping phenomenon, spreading and stability of trapped charges

The experiments were carried out in a FESEM (Field Emission Scanning Electron Microscope) Carl Zeiss SUPRA 55 VP using a specific configuration in the SEM sample holder (Figure 3). It permits to measure separately and simultaneously the influence current and the conduction current and tracing back to the trapped charge temporal evolution during (charging) and after (charge decay) electrons irradiation (Figure 4). Thereafter, the used technique of two injections separated by a pause time was a powerful method for monitoring and understanding the dynamics of the trapped and released charges in insulating materials. These results open the way for the establishment of a conventional characterization procedure, which will be useful in different contexts of use of insulating materials. The studied materials are α-alumina and Yttria Stabilized Zirconia (YSZ) polycrystalline ceramics.  Since the dielectric and electrical properties of an insulating material are highly dependent on its microstructure, the grain size effect and MgO doping effect are then studied and discussed. Via the developed technique, the microstructure - dielectric rigidity correlations could be well justified.


Sergio SAO JOAO (LYON CEDEX 7), Omar MEKNI, Dominique GOEURIOT, Gilles DAMAMME
08:00 - 18:15 #5702 - IM02-184 In situ electrical testing across nano-scale contact interfaces in the transmission electron microscope.
IM02-184 In situ electrical testing across nano-scale contact interfaces in the transmission electron microscope.

Understanding the electrical properties of nanoscale contacts is paramount in small-scale devices,  including probe-based microscopies [1], nanomanufacturing techniques [2] and  micro/nano-electromechanical systems (M/NEMS) [3]. In many cases, the electrical transport properties of the contact determines the device’s functionality, and yet the behavior of the contact conductance is multi-faceted and not easily characterized. There has been extensive characterization of the electrical properties of ultra-small contacts using mechanically controllable break junctions and scanning probe techniques [4]. However, in these techniques the shape, size, and atomic structure of the contacting bodies and the contact itself are typically unknown. Thus, confounding factors such as the presence of oxide films and contaminants; the evolving shapes of the bodies due to inelastic deformation; and inaccurate estimation of contact sizes causes uncertainty in experimental measurements based on contact properties. In situ transmission electron microscopy (TEM) measurements of electrical contacts can overcome these limitations. While investigations have been performed using in situ electrical measurements inside a TEM before – including on single-atom-width nanocontacts in gold [5] – these methods typically require specially prepared contacts and are limited to a range of materials and geometries. In this study we show initial results obtained with a new in situ TEM electrical characterization tool that contains a movable probe, which allows to make site-specific electrical contact measurements to study device-related nanoscale electrical contacts (Fig. 1). The flexibility of the present in situ tool rests in its unique removable sample cartridge that enables simple, repeatable and accurate probe positioning, high-resolution imaging, and accommodates a wide range of nanoscale contact samples.

Two contact configurations that are common to conductive scanning probe microscopy were recreated in situ in the TEM. Namely, a W substrate was contacted by a sharp nanoscale tip that is composed either of Pt/Ir or of doped Si. We demonstrate that current-voltage sweeps can be performed while real-time images of the nanoscale contact are acquired. As shown in Fig. 2(a), the metal/metal contact is ohmic (resistance 730 ohms). By contrast, the metal/semiconductor contact of Fig. 2(b) has a highly asymmetrical IV curve, displaying Schottky-type behavior – as commonly seen in conductive probe microscopy with doped-silicon tips [6].

As an example of the benefits of in situ imaging we compute the contact resistivity of the metal/metal contact. From the images of the contact we estimate a contact radius of 9.8 nm. The resistivity can be calculated using the classical (Maxwell), ballistic (Sharvin), or intermediate (Knudsen) limits [7]. The mean free path for W (estimated from the Fermi velocity and the bulk conductivity [8]) is close to 15 nm. Because this value is on the order of the contact radius, the intermediate resistivity limit is appropriate, leading to a value of rKnudsen = 620 mW-cm. By having a direct measure of the contact area – obviating the reliance on continuum contact models – we can compute the contact’s resistivity directly. It should be noted that this value is much larger than the bulk resistivity of W which is 4.82 mW-cm [9]. This is attributable to the presence of insulating surface films (such as oxide or contamination). 

References:

[1]JY Park et al, Materials today, 38 (2010), p. 38.

[2] C Cen et al, Nature Materials, 7 (2008), p. 298.

[3] OY Loh, HD Espinosa, Nature Nanotechnology, 7 (2012), p. 283.

[4] N Agrait, AL, Yeyati, JM van Ruitenbeek, Physics Reports, 377 (2003), p. 81.

[5] H Ohnishi, Y Kondo, K Takayanagi, Nature 395 (1998), p. 780.

[6] MA Lantz, SJ O’Shea, ME Welland, Review of scientific instruments 69 (1998), p. 1757.

[7] Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge U. Press (1994).

[8] Ashcroft & Mermin, Solid State Physics, Brooks Cole (1976).

[9] WM Haynes, ed. CRC handbook of chemistry and physics, CRC press (2014).

[10] The authors thank Julio A. Rodríguez-Manzo for his input and review of the abstract. T.D.B.J. acknowledges support from National Science Foundation under award

No. #CMMI-1536800. 


Daan Hein ALSEM (Lacey, USA), Siddharth SOOD, Norman SALMON, Tevis JACOBS
08:00 - 18:15 #5739 - IM02-186 The value of in situ transmission electron microscopy in studding ferroelectric materials.
IM02-186 The value of in situ transmission electron microscopy in studding ferroelectric materials.

Ferroelectrics play an important role in today’s modern life. A large variety of applications including piezoelectric actuators, sensors, dielectric capacitors, memory devices, etc. are based on these materials. Recently, scientific interest has been given to the Ba(Zr0.2Ti0.8)O3-x(Ba0.7Ca0.3)TiO3 (BZT-xBCT) perovskite ferroelectric, that exhibits superior electrical and mechanical properties. It is known that domain morphology plays a significant role in electromechanical properties of ferroelectrics. As the external electric field induces domain wall motion or domain switching, it is important to perform direct observations of domain structure evolution under electric field.

In the present study in situ transmission electron microscopy (TEM) was employed to reveal the evolution of ferroelectric domains under electric field and temperature in BZT-xBCT. It is shown that in situ TEM is an extremely powerful tool in order to visualize the real-time microstructural evolution in these materials. During the in situ electric field TEM experiments, a multiple-domain state (A) → nanodomain state → single-domain state transformation occurred during the poling process. With further increase in the applied field a multiple-domain state (B) appeared. This state could be associated with strain incompatibility between neighbouring grains under the electric field. The displacement of the domain walls and changes in the domain configuration during electrical poling indicated a high extrinsic contribution to the piezoelectric response in lead-free BZT – xBCT. The temperature induced ferroelectric → paraelectric phase transition in the BZT – xBCT is also investigated. On heating and cooling a microstructure evolution in BZT – xBCT system was observed. Irregular domains with curved walls appeared in BZT – xBCT due to internal stresses associated with coexistence of rhombohedral and tetragonal domains within one grain.


Marina ZAKHOZHEVA (Delft, The Netherlands), Ljubomira Ana SCHMITT, Yevheniy PIVAK, Matias ACOSTA, Kun ZUO, Qiang XU, Hans-Joachim KLEEBE
08:00 - 18:15 #5746 - IM02-188 Gas TEM holder for in-situ biasing and heating experiments.
IM02-188 Gas TEM holder for in-situ biasing and heating experiments.

We present our custom designed Gas Transmission Electron Microscopy (TEM) holder for in-situ electrical, gas and heating experiments. The holder is currently compatible with FEI machines, but it can be easily redesigned for other transmission electron microscopes. The holder has a sliding cassette at the sample position (Figure 1, left side), which can be manually opened and closed through a rotating knob, located at the opposite end of the TEM holder. Closing the cassette will ensure complete gas sealing around the sample, up to a pressure difference of 1 atm (respect to the microscope vacuum). One gas line is used for both inlet and outlet.

The beam is blocked when the cassette is closed, meaning that it is not possible to acquire live imaging during the gas flow. However, this configuration is very practical from the point of view of sample loading and unloading, as it only takes a few minutes to replace the sample, without any O-rings or complicated sealing mechanisms. Moreover, the sample does not need to be exposed to air after the gas reaction, which gives a relevant advantage over ex-situ measurements.

The TEM holder also has 10 electrical feedthroughs, which can be used for in-situ electrical biasing experiments. Four of these electrical contacts can be used for in-situ heating, in combination with our custom made MEMS heaters [1] (Figure 1, right side), capable of reaching 1000 K in vacuum and 700 K in 1 atm Argon environment.

As a first application of our gas TEM holder, we exposed freestanding multilayer graphene to 1 atm of Hydrogen and simultaneously heated the sample at 550 K for a few minutes. As we can see from Figure 2, this high-pressure hydrogen annealing resulted in isotropic etching of graphene, with formation of round holes, approximately 80 nm in diameter. Further experiments will be performed to evaluate the etching rate and the isotropicity/anisotropicity as function of temperature, pressure and gas composition.

Acknowledgments: This work was supported by ERC funding,  project 267922 - NEMinTEM

References:

[1]  Sairam Malladi,   et al.   Chem. Commun., 2013,49, 10859-108


Leonardo VICARELLI (Delft, The Netherlands), Henny ZANDBERGEN
08:00 - 18:15 #5748 - IM02-190 In situ study of CeO2 microspheres sintering using HT-ESEM.
IM02-190 In situ study of CeO2 microspheres sintering using HT-ESEM.

Sintering could be defined as the transformation of a powdered compact into a cohesive material under heating at high temperature. It appears as a key-step in the preparation of ceramic materials such as UOx and MOx nuclear fuels. The sintering is usually described through three different stages. The initial stage involves the elaboration of necks between the grains and leads to the cohesion of material while the intermediate and final stages are dedicated to the elimination of porosity between the grains by the means of grain growth mechanisms [1]. Presently, only few experimental works are devoted to the kinetics of necks elaboration (i.e. first stage of sintering), and this stage is mainly described through numerical simulation of 2 to 4 spherical grains in contact [2]

 

In the present study, we report the first experimental observations of the initial stage of sintering of CeO2 microspheres using an Environmental Scanning Electron Microscopy at high temperature (HT-ESEM). Actually, the use of HT-ESEM allowed the in situ observation of the samples during long term heat treatments up to 1400°C under various atmospheres [3]. In a first step, CeO2 spherical grains were synthesized to investigate similar systems to those modeled. Then, the HT-ESEM was used to investigate the first stage of sintering. In this aim, three different systems (single grain, two and three grains in contact) were investigated between 900°C and 1200°C:

  • Monitoring of a single grain led to the evolution of the number of crystallites included in the sphere. From the micrographs series, the time necessary to reach a spherical single crystal through the growth of crystallites was determined, as well as the mechanisms involved and the associated activation energies. (Figure 1) [4]
  • The observation of the morphological modifications of two and three grains arrangements then led to assess the evolution of several parameters of interest such as neck size, dihedral angles between the spheres or distance between the grain centers. From the micrographs series, it was possible, for the first time, to identify experimentally the mechanisms of necks growth between the grains and to compare the behaviour of near ideal single-crystal systems with polycrystalline samples (Figure 2 and 3). [5]

 

The use of HT-ESEM observations appears of a great interest for the study of sintering phenomena. Image processing allows determining original and fundamental experimental data, such as the mechanisms of necks growth, characteristics of the processes occurring during the initial stage of sintering.

 

References:

 

[1] D. Bernache-Assolant, Chimie-physique du frottage, Hermes Eds, 348p.

[2] F. Wakai, Modeling and simulation of elementary process in ideal sintering. J. Am. Ceram. Soc., 89(5), 1471-1484 (2006).

[3] R. Podor, N. Clavier, J. Ravaux, L. Claparède, N. Dacheux and D. Bernache-Assollant, Dynamic aspects of cerium dioxide sintering: HT-ESEM study of grain growth and pore elimination, J. Eur. Ceram. Soc., 32, 353-362 (2012).

[4] G. Nkou Bouala, R. Podor, N. Clavier, J. Léchelle, A. Mesbah and N. Dacheux, In situ HT-ESEM study of CeO2 nano-ripening : toward a control of nanostructure. Ceram. Intern. (2015) 41 14703-14711

[5] G.I. Nkou Bouala, N. Clavier, J. Léchelle, S. Martin, N. Dacheux, J. Favrichon, H. P. Brau and R. Podor, From in situ HT-ESEM observations to simulation: how does polycristallinity affects the sintering of CeO2 microspheres? J. Phys. Chem. C (2016) 120 386-395


Galy Ingrid NKOU BOUALA, Renaud PODOR (ICSM, Marcoule), Jacques LECHELLE, Nicolas DACHEUX, Nicolas CLAVIER
08:00 - 18:15 #5766 - IM02-192 CelDi: Development of an advanced solid / fluid reaction stage for SEM.
IM02-192 CelDi: Development of an advanced solid / fluid reaction stage for SEM.

In numerous scientific fields such as life, materials and Earth sciences, or quality controls of industrial processes, there is a growing interest for the direct observation - at the submicroscopic scale - of processes occurring at solid / liquid and solid / gas interfaces. So far, only few experimental cells were designed to address this challenging issue. Most of them are devoted to a specific use in Transmission Electron Microscopy (TEM) and are not suitable for observation of large (or thick) samples and the other cells designed to be used in a Scanning Electron Microscope (SEM) chamber do not allow fluid flow.

To address this issue, a dedicated device was developed according to the following requirements: 1) The sample holder must be suitable for large samples. 2) The device must allow the renewal of the fluid through a continuous flow. 3) The device should be sufficiently efficient and secure to be used in any type of conventional SEM. 4) The device should be easy to implement and user friendly. A first prototype (Fig. 1) was recently tested  and patented [1].

 For the proof of concept, it was used to perform in situ experiments during which series of images was recorded with a SEM, using the back scattered electron detector,  high vacuum in the SEM chamber and e-beam acceleration voltage of 30kV. Fig. 2. presents several images of the growth of NaCl crystals obtained from a supersaturated solution. The image resolution is good enough to see details of a size of 50 nm. The liquid system that is inside the stage remained isolated from the SEM chamber during the complete experiment.

The CelDi project aims at the development of the second generation of this tool, integrating more safety protections, increasing the resolution of the images, finding solutions to achieve an easy and friendly use of the device. It will be possible to integrate a specific and fast BSE detector in combination with the stage, and work is under progress to develop automatized image processing through dedicated software.

In parallel, several tests will be carried out for different scientific applications in material science (corrosion) and life science (observation of live cells) to demonstrate the capabilities of the CelDi device.

[1]. R. Podor, S. Szenknect, H. P. Brau, J. Ravaux, J. Salacroup. Cellule de suivi de réaction solide-liquide ou solide-gaz pour microscope électronique à balayage. Patent n° FR 15 59465 (05/10/2015)


Johan SALACROUP, Gautier GONNET, Antoine CANDEIAS, Henri-Pierre BRAU, Stéphanie SZENKNECT, Paul IVALDI, Renaud PODOR (ICSM, Marcoule)
08:00 - 18:15 #5841 - IM02-194 In situ investigation of high temperature corrosion of Co-based alloys in the ESEM – the very first stages.
IM02-194 In situ investigation of high temperature corrosion of Co-based alloys in the ESEM – the very first stages.

In 2006 Sato et al. [1] discovered the existence of a ternary γ′-Co3 (Al, W) intermetallic phase with L12 structure in the system Co-Al-W, a structure similar to that of Ni-base superalloys. The high melting point of Co-alloys makes this class of materials a promising alternative for high-temperature applications. Nevertheless, their poor corrosion resistance remains a challenging and still open problem.

 

In the environmental scanning electron microscope the start of oxidation / corrosion processes and the progress of scale formation can be continuously monitored at high magnification. This enables a rather easy determination of the temperature where oxidation starts. Corrosion in hot steam was realized by use of water vapor as reaction gas. Besides the usage of different other gases, such as air, the temperature ramp can be varied as well. With respect to the diffusion velocities of the different elements in the alloy as a function of temperature the latter could be a critical factor. Nevertheless, the relative humidity / oxygen activity that can be used during in situ experiments cannot exceed certain limits, since otherwise the signal/noise ratio strongly decreases, which causes likewise a deterioration of the image quality.

 

For the investigations Co-based alloys with a nominal composition of Co-9Al-9W were used. To get a stress-free surface, mechanical polishing with diamond paste was followed by polishing with colloidal silica. Finally OIM (orientation imaging microscopy) maps were recorded to get information about the crystal orientation of the grains. The high-temperature oxidation experiments were performed by use of a heating stage mounted in the specimen chamber of an environmental scanning electron microscope ESEM Quanta 600 FEG (FEI, Eindhoven, The Netherlands). The experiments were carried out at a pressure of 133 Pa, which corresponds to a relative humidity of approximately 5% at room temperature (24 °C). Temperature ramps of 2 °C/min and 20 °C/min were used; the maximum temperature was around 800 °C.

 

 All results reveal that at the start of scale formation lattice diffusion and not grain boundary diffusion dominates. Fig. 1 shows that oxidation starts with the evolution of nodules scattered across the grains. Both, the onset temperatures of nodule growth, as well as the density of nodules per unit area are dependent on grain orientation. Fig. 1 also demonstrates that some of the grain boundaries are completely free of such corrosion structures (see arrow in the image), whereas others are nicely decorated by them. However, a clear correlation between scale formation and grain orientation or grain boundary structure could not be found. In case of rough surfaces an orientation dependence could no longer be observed, roughness dominated the oxidation behavior. It became also apparent, that oxidation started earlier at the slower temperature ramp.

 

To effectively slow down oxidation, the formation of a dense, protective oxide layer like Al2O3 would be necessary. The formation of such a dense looking alumina layer could be found occasionally, but only at individual grains [2]. Also the parameters governing the formation of such layers remain still unknown.

 

References

[1] Sato, J., Omori, T., Oikawa, K., Ohnuma, I., Kainuma, R., Ishida, K. (2006), Cobalt-base high-temperature alloys, Science 312, 90-91

[2] Weiser, M., Reichmann, A., Albu, M., Virtanen, S., Poelt P. (2015), In situ investigation of the oxidation of Cobalt-base superalloys in the environmental scanning electron microscope, Adv. Eng. Mat. 17 (8), 1158-1167


Angelika REICHMANN, Martin WEISER, Sannakaisa VIRTANEN, Peter POELT (Graz, Austria)
08:00 - 18:15 #5843 - IM02-196 In-situ thermal measurements with high spatial resolution in the TEM.
IM02-196 In-situ thermal measurements with high spatial resolution in the TEM.

        With the constant miniaturization of electronics, the thermal management issue is becoming the main limiting factor in dictating device performance [1]. Therefore, the study of thermodynamics is of practical interest as well as fundamental scientific interest. However, measuring temperature at these dimensions is difficult due to the increasing influence of the employed measurement tools and therefore new techniques need to be developed. One such technique, Electron Thermal Microscopy (EThM), has been previously used to study heat dissipation in nanowires and carbon nanotubes supported on SiN substrate [3, 4].

        EThM is an in-situ thermal imaging technique using the Transmission Electron Microscope (TEM) and relies on the observation of the solid to liquid phase transition of indium islands and provides a binary temperature map with 50nm spatial resolution[2]. The indium islands, thermally evaporated on the back of the substrate, as seen in the bright-field TEM image in Figure 1a, melt once heated to 429K. This solid to liquid phase transition is easily observed in the TEM, when operating in the appropriate dark-field conditions (Figure 1b), at which the molten islands appear bright compared to the solid ones. In addition, the presence of a high melting point thin oxide layer on the indium preserves the structure of the islands and allows the thermometry technique to be used repeatedly over a large experimental range.

        Two factors contribute to the observed temperature of the system; the heat source and the efficiency of the heat transfer mechanism to the lower temperature reservoir. Here we present the work on joule heated Pd nanowires supported on SiN substrate and use the EThM technique to evaluate the thermal properties of the device. The measured temperature and the efficiency of the heat transfer mechanism can be quantified in terms of the thermal conductivity of the different materials within the device and their thermal boundary resistances. Conventionally, the thermal transport in dielectrics, such as SiN, is phonon mediated. However, as the dimensions approach the mean free path of the phonons, new modasses of heat dissipation may dominate. Combining our experimental thermal measurements (Figure 1c) with simulations (Figure 1d), based on finite element analysis, we have explored different modes of thermal transport and show that the conventional phonon mediated thermal transport is not sufficient to explain the observed temperature gradient across the SiN, indicating that an additional mode is active.   

1.         Pop, E., Energy Dissipation and Transport in Nanoscale Devices. Nano Research, 2010. 3(3): p. 147-169.

2.         Brintlinger, T., et al., Electron thermal microscopy. Nano Letters, 2008. 8(2): p. 582-585.

3.         Baloch, K.H., et al., Remote Joule heating by a carbon nanotube. Nature Nanotechnology, 2012. 7(5): p. 315-318.

4.         Baloch, K.H., N. Voskanian, and J. Cumings, Controlling the thermal contact resistance of a carbon nanotube heat spreader. Applied Physics Letters, 2010. 97(6).


Norvik VOSKANIAN (Göteborg, Sweden), John CUMINGS, Eva OLSSON
08:00 - 18:15 #5846 - IM02-198 A simple shortcut for observing unroofed cells by either TEM or SEM.
IM02-198 A simple shortcut for observing unroofed cells by either TEM or SEM.

The “unroofing” technique has been successfully used to observe the cytoplasmic side of the plasma membrane (PM) using either light or electron microscopy. Combined to transmission electron microscopy (TEM), it is an invaluable method to reveal the composition of the PM and to directly observe macromolecular complexes including the cytoskeleton and endocytic membrane invaginations. This method has been optimized over decades to preserve membranes close to their native states by the combination of quick freezing of exposed membranes, followed by deep etching and rotary replication (the so-called “QF-DE-RR” technique). However, a serious setback in implementing unroofing combined with QF-DE-RR stems from the necessity to use complicated apparatus, such as quick freezing and freeze-fracturing devices, along with strong expertise to handle them. Moreover, the technical complexity renders these techniques time consuming and reduces the number of samples that can be processed simultaneously.

Here, we present a simple and straightforward protocol for observation of the cytoplasmic side of plasma membrane which only requires chemical treatment of samples prior to replication This method has been optimized towards sample preparation at room temperature, chemical fixation, dehydration, solvent drying and sequential metal coating. Moreover, this technique is easily amenable to higher throughput. We compared either TEM or high resolution SEM analysis of unroofed membranes from adherent cells and show the advantages and disadvantages of each technique towards visualization of the cytoskeleton and different endocytic structures such as clathrin coated pits and caveolae.


Agathe FRANCK, Jeanne LAINÉ, Marc BITOUN, Ghislaine FRÉBOURG, Michaël TRICHET (Paris), Stéphane VASSILOPOULOS
08:00 - 18:15 #5896 - IM02-202 In situ TEM nanocompression of MgO nanocubes and mechanical analysis.
IM02-202 In situ TEM nanocompression of MgO nanocubes and mechanical analysis.

In this study, we propose an innovative mechanical observation protocol of nanoparticles in the 100 nm size range. It consists of in situTEM nano-compression tests of isolated nanoparticles. Load–real displacements curves, obtained by Digital Image Correlation, TEM images (BF, DF and WBDF) are analyzed and these analyses are correlated with Molecular Dynamics simulations. Elementary process that governs the deformation mechanism of nanoparticles can be identified. A constitutive law with the mechanical parameters (Young modulus, Yield stress...) of the studied material at the nano-scale can be obtained.

In situ TEM nano-compression tests were performed on ceramic MgO nanocubes. Magnesium oxide is a model material and its plasticity is very well known at bulk. The MgO nanocubes show large plastic deformation, more than 50% of plastic strain without any fracture. Calculations of Schmid factors of possible slip systems in MgO under solicitation direction coupled with analysis of WBDF images, performed in situ in TEM nanocompression tests, contribute to full characterizations for dislocations in MgO nanocubes under uniaxial compression. Correlation of TEM images and stress-strain curves, obtained by DIC, allows the observation and description of dislocations activities and processes along the compression test. Coupling these analyses with MD simulations, the elementary process that governs the deformation mechanism of single crystal MgO nanocubes under uniaxial compression could be identified. In Figure 1, contrast appears in the cube when a change on the curve is observed. This contrast band may be attributed to a ½ dislocation that nucleate at surface and slip along {110} plan as obtained by MD calculations and by TEM analysis on possible dislocations in active slip systems near the diffraction condition in these TEM observations (as we are always near [001] zone axis) as shown in Figure 2.

Size-effect on dislocation processes could be obtained in MD simulations and in experiments. MD results show that in MgO nanocubes smaller than 8 nm, the deformation occurs through dislocation nucleation at surfaces and edges/corners and dislocation starvation process is observed simultaneously with stress drop, as shown in Figure 3 (snaps 1, 2 & 3). However larger nanocubes show dislocation interactions and junctions formation rather than dislocation starvation as shown in Figure 3 (snaps 4 & 5). Experimental results show that these two processes co-exist in MgO nanocubes in the size range [60-450] nm. However, TEM images and stress-strain curves show that there is predominance of dislocation starvation mechanism in smaller nanocubes (Figure 4 show a WBDF of a large nanocube after compression where persistent dislocations and dislocations networks assume that dislocation interactions process predominate in larger nanocubes rather dislocation starvation. 

 

The authors thank the Centre LYonnais de Microscopie (CLYM) for financial support and access to the JEOL 2010F microscope. Financial support from the Région Rhône-Alpes is also acknowledged.

 

Keywords: In situ TEM, plastic deformation, dislocations, ceramic nanoparticles, MgO nanocubes


Inas ISSA, Jonathan AMODEO, Lucile JOLY-POTTUZ (MATEIS / INSA, Lyon), Julien RÉTHORÉ, Claude ESNOUF, Vincent GARNIER, Julien MORTHOMAS, Karine MASENELLI-VARLOT
08:00 - 18:15 #5922 - IM02-204 In Situ TEM Characterization of Asphaltene Formation in Crude Oil.
IM02-204 In Situ TEM Characterization of Asphaltene Formation in Crude Oil.

Asphaltenes are aromatic hydrocarbons and defined as a solubility class as the n-heptane-insoluble, toluene-soluble fraction of a crude oil or carbonaceous material. They are always present in crude oils and influence the oil properties. Phase changes, viscosity, and interfacial properties of crude oils are strongly affected by asphaltenes. Problems arise when asphaltenes are exposed to changes in temperatures, pressure, or composition, and they become insoluble in the oil. When asphaltenes precipitate, they can deposit onto the walls of the pipe, inhibiting the flow of oil and can end up blocking the pipe entirely. Although, the negative impact of asphaltenes to the oil industries is well known, however, the exact mechanism by which asphaltene flocculation and aggregation occurs is still not fully understood.   

         Over the last decade methods have been developed to characterize and model the mechanisms of asphaltene flocculation, aggregation and precipitation. [1, and references listed therein].  To date, there have been TEM analyses of asphaltenes that have impacted petrochemical research activities [2].  However, the disadvantage is that the asphaltene sample may be altered as a consequence of sample preparation.  With the development of commercially available liquid cell holders for in situ TEM there is now the opportunity of direct observations of the oil emulsion system at the nm scale in their natural environment.

         Initial in situ TEM experiments of asphaltene formation and aggregation were conducted in a FEI Talos F200X TEM operated at 200 keV using the Protochips Poseidon P210 analytical liquid cell holder.  A light crude oil with a nominal asphaltene content of 3.7% was mixed with heptane to initiate flocculation of the asphaltenes in the liquid in situ TEM cell. Our first results indicate that the aggregation process is driven by the initial formation of 10-20 nm spherical colloids. These colloids cluster to flocculates in a range of several tens to hundreds of nanometers in the oil-heptane emulsion (Figure 1). The flocculation sequence is in good agreement with the proposed Yen model [1]. Further asphaltene flocculation experiments from different crude oils and their morphology evolution will be compared and discussed. In addition, opportunities and limitations for using in situ liquid cell holders for studying asphaltene flocculation in an analytical TEM will be described.

 

References:

[1] O.C. Mullins, Energy & Fuels, 24, (2010), p. 2179-2207.

[2] L. Goual et al, Langmuir, 30, (2014), p. 5394-5403.

 

Acknowledgement:

The authors would like to acknowledge the funding and technical support from BP through the BP International Centre for Advanced Materials (BP-ICAM), which made this research possible.


Arne JANSSEN (Manchester, United Kingdom), Nestor ZALUZEC, Matthew KULZICK, Greg MCMAHON, M.g. BURKE
08:00 - 18:15 #5932 - IM02-206 In Situ Study of Internal Structure of Spherical Polyelectrolyte Complex Capsules Using ESEM.
IM02-206 In Situ Study of Internal Structure of Spherical Polyelectrolyte Complex Capsules Using ESEM.

Polyelectrolyte complex (PEC) capsules/beads are very important for biotechnological applications such as drug delivery and bacterial whole-cell biocatalyst development. The very beam-sensitive bio-polymer capsules are laboratory produced as a uniform with a controlled shape, size, membrane thickness, permeability and mechanical resistance [1]. PEC capsules are very sensitive to any treatment and samples could be inspected in their fully native and functional state to prevent any misinterpretation. Characterization and study of PEC capsules properties is possible using thermodynamically stabile and fully wet state, precisely reached after very slow changing of conditions in the specimen chamber of ESEM. The morphological study using low current ESEM was already presented [2]. The internal structure can be in solvent, semisolid or solid state, depend on capsule type and manufacturing process [3], nevertheless it was not described in its native state yet. Study of inner part as well as surface morphology of PEC capsules using classical SEM or cryo-SEM can be misleading due to requirement of dry resp. freeze sample. The aim of this work is in-situ study of internal structure of PEC capsules in fully wet state and demonstration of state of matter of PEC capsules core.

PEC capsules has been produced by air-stripping nozzle via polyelectrolyte complexation (20 min) of sodium alginate and cellulose sulphate (CS) as polyanions, poly(methylene-co-guanidine) as a polycation, CaCl2 as a gelling agent and NaCl as an antigelling agent [1] without the use of a multiloop reactor. Due to the high beam sensitivity of samples and its relatively big size (800 μm in diameter), a combination of our published method [4] and special improvement of our ionization detector of SE were used. The gentle and slow sample chamber pumping procedure [4] and our ionization detector of SEs [2] (beam current up to 40 pA) enhanced for larger field of view (850 μm) were combined Samples were observed in conditions of vapor pressure 684 Pa, stage temperature 2°C, humidity 97%, acc. voltage 20 kV and probe current 35 pA.

Fully wet and well preserved PEC capsule with visible surface microstructure is presented in Fig. 1A. PEC capsules are very sensitive to beam impact which was used to in-situ disruption of outer shell. Afterwards the liquid core slowly rose by capillary action on the PEC capsules wall simultaneously with capsule collapsing due to its emptying, see Fig. 1B. Due to different temperatures between the sample and the Peltier cooling stage, the liquid core was dried and crystalized on the PEC capsule surface, see Fig. 1C. First results provide promising information leading to statement that the inner structure of this type of PEC capsules is viscous liquid.

 

[1] A Schenkmayerová et al., Applied Biochemistry and Biotechnology 174 (5) (2014), p. 1834.

[2] V Neděla, et al., Nuclear Instrumentation and Methodology A 645 (2011), p. 79.

[3] Q-X Wu et al., Mar. Drugs 12 (2014), p. 6236.

[4] E Tihlaříková, V Neděla and M Shiojiri, Microscopy and Microanalysis 19 (2013), p. 914.

This work was supported by the Grant Agency of the Czech Republic: grant No. GA 14-22777S and LO1212 together with the European Commission (ALISI No. CZ.1.05/2.1.00/01.0017).


Vilem NEDELA (Brno, Czech Republic), Marek BUCKO, Eva TIHLARIKOVA, Tomas KRAJCOVIC, Peter GEMEINER, Eva NAVRATILOVA, Jiri HUDEC
08:00 - 18:15 #5955 - IM02-208 Using the Deben Enhanced Coolstage for in-situ (E)SEM freeze-drying & high resolution imaging of polymer latices.
IM02-208 Using the Deben Enhanced Coolstage for in-situ (E)SEM freeze-drying & high resolution imaging of polymer latices.

A ‘simple’ methodology, combining the use of Environmental Scanning Electron Microscopy (ESEM) and the recently introduced DEBEN Enhanced Coolstage was successfully developed and not only used to study dynamic processes, e.g. different stages of latex film formation, but also for high resolution imaging of ‘freeze-dried’ structures. By using the extended temperature capability of the DEBEN Enhanced Coolstage (-50 to +160oC) it is possible to easily convert any (E)SEM chamber into what essentially can be described as a freeze-drying facility. By using this method it is also possible to preserve the structure and features of the studied system with minimum shrinkage and distortion and in the case of polymer latices at a desired stage of film formation. Moreover, specimens can then be readily imaged, without the need of conductive coatings and at much lower chamber gas pressures, thus minimising the beam skirting effects and allowing higher resolutions to be achieved. In this study this is clearly demonstrated (Figure 1 & 2) using a model poly-methyl methacrylate based latex dispersion; under ‘wet’ (partially dehydrating) conditions, whilst the individual particles can be seen it is difficult to distinguish them and any associated boundaries and/or arrangements, whether cubic or hexagonal; better images, as shown can be obtained from air-dried specimens, but this limits the time-frame of possible observations. However, subsequent freeze drying, as expected, resulted in the observation of a well-defined and more stable (in imaging terms) structure; it was also possible to image individual particles and their interactions at much higher resolutions. It is strongly believed that the methodology can be applied to other material systems, including biologicals and pharmaceuticals. 


Marzena TKACZYK (Oxford, United Kingdom), Kalin DRAGNEVSKI, Gary EDWARDS
08:00 - 18:15 #5962 - IM02-210 In-liquid TEM to visualize multimerization and self-assembly of DNA functionalized gold nanoparticles.
IM02-210 In-liquid TEM to visualize multimerization and self-assembly of DNA functionalized gold nanoparticles.

Base-pairing stability in DNA-gold nanoparticle (DNA-AuNP) multimers along with their dynamics under different electron beam intensities was investigated with in-liquid transmission electron microscopy (in-liquid TEM) using custom developed silicon nitride based liquid cells. Multimer formation was triggered by hybridization of DNA oligonucleotides to another DNA strand (Hyb-DNA) related to the concept of DNA origami. We analyzed the degree of multimer formation for a number of samples and a series of control samples to determine the specificity of the multimerization during the TEM imaging. DNA-AuNPs with Hyb-DNA showed an interactive motion and assembly into 1D structures once the electron beam intensity exceeds a threshold value. These findings indicate that DNA base pairing interactions are the driving force for in situ multimerization and DNA-metallic NP conjugates provide excellent models to understand structure-function correlation in biological systems with nanometer spatial resolution (Keskin et al., 2015, 10.1021/acs.jpclett.5b02075).

Acknowledgements:

This work was funded by the Max Planck Society and supported by the cluster of excellence “The Hamburg Centre of Ultrafast Imaging” (CUI). We thank, in particular, Josef Gonschior for the design of the liquid specimen holder. Furthermore, we thank the Centre for Applied Nanotechnologies (CAN), Hamburg, Germany (in particular, Katja Werner and Christian Supej) for generously providing the gold nanoparticles and technical assistance in coupling.


Sercan KESKIN (Hamburg, Germany), Stephanie BESZTEJAN, Guenther KASSIER, Stephanie MANZ, Robert BUECKER, Svenja RIEKEBERG, Hoc Khiem TRIEU, Andrea RENTMEISTER, Dwayne MILLER
08:00 - 18:15 #6007 - IM02-212 Structural evolution of strontium titanate nanocuboids under in-situ electron irradiation and heating.
IM02-212 Structural evolution of strontium titanate nanocuboids under in-situ electron irradiation and heating.

   Annealing thermal treatments are routinely used in the synthesis of nanoparticles to tailor their size and shape. To control particle growth at elevated temperatures, understanding the dynamics behind surface evolution is of primary importance. Time-resolved, in-situ, aberration-corrected high-resolution transmission electron microscopy (HRTEM) has been successfully used to image structural modifications of nanoparticles in response to thermal annealing, including, for example, surface faceting and sintering [1].

   This study reports the structural evolution of SrTiO3 nanocuboids [2] in response to thermal annealing at high temperature (≥ 500 °C) using HRTEM imaging. In-situ experiments were performed using a dedicated heating holder, in a JEOL 2200MCO microscope, operating at 200 keV, under low (4 x 106 e/nm2) and high (1010 e/nm2) electron dose conditions. Imaging at low electron doses reveals structural modifications to the nanoparticles that can be ascribed to heating only. At low dose, the effect of beam irradiation on the surface structure is negligible even for direct exposure times longer than 30 min. An example is illustrated in Figure 1, where a typical flat {001} facet remains unchanged after 2 min of direct beam exposure. By comparison, electron irradiation at high electron dose triggers the growth of TiO islands within a few seconds, consistent with previous observations by Lin and co-workers [3]. Figure 2 illustrates the formation of TiO islands after 3 s exposure at high electron dose (a), and the subsequent sputtering of surface atoms after 1 h 20 min of direct irradiation (b).

   Following in-situ thermal treatment at 800 C, surface faceting is observed at low dose (arrows in figure 3 (b)). The formation of the new facets is triggered by diffusion of the surface atoms, driven by the elevated temperature. Furthermore, atomic migration induces sintering of the particle (Ostwald ripening). For longer annealing times at higher temperatures, phase transformation of the facets is expected to take place, and TiOx islands will eventually start to grow [4]. In-situ thermal annealing of the particles at higher temperatures is currently under investigation, and the results will be also reported.  

 

References

[1] M. Chi et al., Nat. Comm. 6 (2015) 8925.

[2] Y. Lin et al., Phy. Rev. Lett. 111 (2013) 156101.

[3] Y. Lin et al., Micron 68 (2014) 152 - 157.

[4] S. Bo Lee et al., Ultramic. 104 (2005) 30 – 38.

[5] The authors acknowledge funding from the European Union Seventh Framework Programme under Grant agreement 312483-ESTEEM2, Prof. Laurence Marks, Prof. Kenneth Poeppelmeier and Dr. Yuyuan Lin for kindly providing the specimens. 


Emanuela LIBERTI (Oxford, United Kingdom), Judy KIM, Yuyuan LIN, Angus KIRKLAND
08:00 - 18:15 #6069 - IM02-214 Cathodoluminescence for in situ plasmonic sensing of beam effects.
IM02-214 Cathodoluminescence for in situ plasmonic sensing of beam effects.

In transmission electron microscopy (TEM), various in situ measurement in different environmental conditions, such as high temperature, gas atmosphere and aqueous solution, have become more popular. However, electron beam damage complicates the measurement. The true dynamics, which is to be observed, is no longer distinguishable from the continuously increasing damage caused by electron beam irradiation. To properly extract the real phenomenon, excluding the electron beam effect, it is important to know the electron beam damage quantitatively and consider the possible influences. Quantitative evaluation of the electron beam damage is also necessary to find the best measurement condition, such as beam dose and acceleration. Although the electron beam damage has been estimated either empirically or theoretically, experimental quantitative analysis has not been much performed due to the lack of local measurement methods in such a small scale as well as due to the limited accessibility in the TEM objective lens.

Here in this research, we propose to measure the electron beam damage effect using nanoplasmonic sensors. In plasmonic sensing the optical properties of metal nanostructures are utilized to sense, locally, changes occurring at the nanoscale either to the metal nanostructure itself or to its surrounding environment. We apply these nanosensors to monitor the electron beam induced environmental change and quantitatively evaluate the electron beam effect. We take advantage of cathodoluminescence technique to simultaneously measure the plasmonic response while the electron beam is irradiated on the sample.

One structure we introduce to measure the environmental change is a nanosized water container that we call the nanocuvette. The structure consists of a plasmonically active nanohole gold film caped by thin carbon films, see Figure 1. This structure allows for the inclusion of the system of interest into the nanoholes which are then sealed by the carbon layers. The system can successively be studied inside the TEM and, because of the plasmonically active gold film, it is also possible to detect changes happening to the specimen contained in the hole by following the plasmonic signal. Inside the TEM this would be achieved by cathodoluminescence. Accelerated electrons excite plasmons through transition radiation and the light radiation by the plasmon resonance can be simultaneously detected. In the work presented here we show the production of the proposed structure, and verify its plasmonic properties through ex situ measurements, combined with modelling. In particular we study the possibility to use the structures to optically detect temperature changes to the sample. This is, in this first step, done ex situ by heating a sensor structure inside a vacuum cell. The plasmonic response upon this heat treatment is studied by recording the optical transmission of the sample. We find that it is indeed possible to detect temperature changes to the sensor structure by studying its plasmon resonances. 

Another structure studied is a plasmonic nanoparticle. Compared to nanopore/hole structures, which are based on continuous metal films with high thermal conductivity, the temperature increase by electron beam irradiation should be more localized inside the particle. The cathodoluminescence signals of some gold particles are shown in Figure 2. As is evident from the figure, the signal vary greatly from particle to particle. It is therefore necessary to tune the particle size and structure in order to achieve enough sensitivity and signal to noise.


Carl WADELL (Yokohama, Japan), Satoshi INAGAKI, Hiroki OHNISHI, Takumi SANNOMIYA
08:00 - 18:15 #6180 - IM02-216 Stability and reactivity of anisotropic cobalt nanostructures under inert and reactive environments investigated by in-situ TEM.
IM02-216 Stability and reactivity of anisotropic cobalt nanostructures under inert and reactive environments investigated by in-situ TEM.

The use of Environmental TEM (ETEM) for investigating the materials evolution in terms of morphological, microstructural and chemical characteristics is of absolute need in catalysis. Owing to the high pressures and temperatures reached within the sealed environmental cells (E-cell), they are suitable to mimic reaction conditions similar to the ones encountered in practice. In addition, the set-up of a mass spectrometer at the cell exit would allow for evaluation of the reaction products and therefore the development of the “operando” methodology. This is crucial for understanding the relationship between the catalysts characteristics and their properties during its activation/operation and for accessing the mechanisms involved in its deactivation process.

The present work reports on the thermal stability and the reduction/oxidation behaviour of nanostructured metallic cobalt-based structures with “urchin-like” morphology  synthesized by reduction of a cobalt complex in the presence of ligands.1 These Co structures with high metallic surface area are foreseen as active phase for the Fischer-Tropsch synthesis, in which syngas, a mixture of CO and H2, is converted into hydrocarbons and water.2 The key-question of catalysts stability under reaction is addressed in this study by using the ETEM approach. The Co structures are submitted to different atmospheres and temperatures in an effort to gather a complete knowledge of the system stability under reaction. To this end, the system is exposed to thermal constraints under vacuum/inert atmosphere, pure hydrogen and oxygen followed by hydrogen atmosphere.

Under vacuum (Figure 1) and argon, the cobalt from the “urchin” branches migrates towards the center with increasing temperature in a direction dictated by the shape of the radial needle-like features. The Co migration is accompanied by the dissolution and subsequent rejection of the carbon atoms from the ligands on the metal surface, mechanism similar to the growth of carbon nanotubes (CNTs), but this time from an organic C-rich precursor. Moreover, in the high temperature range, i.e. 900°C, the ligands already converted in carbon become graphitic leading to the formation of tubular structures with graphitic walls radially disposed around the Co center. This richness of this finding relies not only on the thermal stability of Co-based urchin-like structures, but opens a new perspective for the synthesis of graphitic structures with well-defined tubular shapes.

Under pure hydrogen flow, the diffusion of metal atoms occurs up to 400°C as the ligands are converted into methane in this temperature range, reaction catalyzed by the Co. The “urchin”-like microstructure collapse during the gradual temperature increment from 280°C up to 400°C (Figure 2). This morphological instability can be seen as first evidence of such nanostructures inefficiency in reactions developed at more than 350°C.

In the presence of oxygen, the ligands decompose into CO and CO2 and the metal oxidizes according to the Kirkendall mechanism.3 As effect, part of the Co migrates from the branches centers to the rims, recombines with the oxygen and generates tubular structures connected to the Co-rich core and arranged in the initial configuration. The question arising is whether this structure stays stable under reactive conditions. In this sense, the oxidized system is submitted to an H2 flow (figure 3c-d) and progressive temperature increment. At 200°C, the Co oxide from the outer surface of “spines” reduces and migrates towards the tubes centers, leading after few hours to the formation of a metallic Co nanowire encapsulated surrounded by voids but encapsulated in a shell constituted in both Co and carbon. Obviously the mechanisms of Co oxide reduction into metallic Co upon H2 treatment are different from the initial system to the one submitted to prior oxidation, but the latter solution is suitable to conserve the morphology of such complex system up to 700°C. From a fundamental perspective, this investigation identifies the impact of specifically reactive environments on the thermally activated diffusion and stability of nanosystems with complex geometries. From a more general perspective, this investigation explores the potential of using the E-cell under a TEM to address complex dynamic thematic such as the mechanisms of metals reduction and oxidation under well-defined/controlled conditions.

1.             Liakakos, N. et al. J. Am. Chem. Soc. 134, 17922–17931 (2012).

2.             Andrei Y. Khodakov et al., Chem. Rev. 107, 1692−1744  (2007).

3.             Wang, W., Dahl, M. & Yin, Chem. Mater. 25, 1179–1189 (2013).


K. DEMBÉLÉ (Illkirch), S. MOLDOVAN, J. HARMEL, K. SOULANTICA, P. SERP, B. CHAUDRET, A-S GAY, S. MAURY, A. BERLIET, O. ERSEN
08:00 - 18:15 #6262 - IM02-218 Development of a novel straining holder for TEM compatible with electron tomography.
IM02-218 Development of a novel straining holder for TEM compatible with electron tomography.

   Electron tomography (ET) has been introduced in materials science in the past decade and it has opened a new prospect: the technique can retrieve three-dimensional (3D) structural information [1]. However, a major roadblock exists to combine the in-situ experiments with electron tomography, which is expected to reveal real time 3D structural changes [2]. Towards dynamic 3D (i.e., “4D-ET”) visualization of material’s microstructures under various straining conditions with a time scale of a few minutes or less, we designed and developed a new specimen holder compatible with tensile test and high-angle tilting, termed as “straining and tomography (SATO)” holder [3].

   Figure 1 shows a schematic illustration of a newly designed specimen holder (a) and a cartridge-type blade on which a specimen is glued (b). The area of gluing is marked by gray. The basic concept of this development is a single tilt-axis holder with a tensile mechanism and also being capable of electron tomography. To achieve straining and high-angle tilting simultaneously, we developed a novel mechanism as shown in Fig. 1(a). A linear motion actuator deforms a newly designed cartridge-type blade on which a specimen is glued. Deformation velocity of the blade is designed as 1/3 of that of the actuator. Figure 1(b) explains the motion of blade. The trajectory (dotted line) is an arc but the radius of curvature (R) is so large (3 mm) that the tensile axis is perpendicular to the holder for a nanometer- scale object whose center is located at O.

   Figure 2 shows (a) an appearance of the developed specimen holder and (b) a magnified photo of the cartridge-type blade. The holder motion is fully computer-controlled via graphical user interface developed for this system. We measured the deformation velocity of the blade and deduced the strain rate. The minimum and the maximum values obtained were 1.5×10-6 and 5.2×10-3 s-1. The blade as well as the holder is robust and multiple acquisitions raise no technical problem at all. This result demonstrates stability and reliability of the holder as a novel in-situ experimental instrument for 4D-ET. We also confirmed that the maximum tilt angle of the specimen holder reaches ±60o with a rectangular shape aluminum specimen.

   Figure 3 shows an example of in-situ tensile test using the newly developed holder. The material is an Al-Mg-Si alloy with a conventional 3 mm diameter disk shape prepared by electropolishing (Fig. 3(a)). When the actuator moved 9.87 μm from the initial position, slip bands were suddenly introduced (Fig. 3(b)). With increasing the tensile stress, slip bands were discontinuously but incrementally introduced in several parts of the field of view until a crack was introduced elsewhere. It should be mentioned that the drift of a field of view was negligible throughout the in-situ tensile experiment. The new specimen holder will have wide range potential applications in materials science.

 

References

[1] S. Hata, H. Miyazaki, S. Miyazaki et al., Ultramicrosc. 111, 1168 (2011).

[2] J. Kacher, G. S. Liu, and I. M. Robertson, Micron 43, 1099 (2012).

[3] K. Sato, H. Miyazaki, T. Gondo, S. Miyazaki, M. Murayama and S. Hata, Microscopy 64, 369 (2015).

[4] This study was supported by the Grant-in-Aid for Scientific Research on Innovative Area, "Bulk Nanostructured Metals" (Grant No. 25102703) from the Ministry of Education, Culture, Sports, Science and Technology, Japan. K. S. and S. H. acknowledge the financial support from the Japan Science Technology Agency (JST) “Development of systems and technology for advanced measurement and analysis” program.


Kazuhisa SATO (Ibaraki, Japan), Hiroya MIYAZAKI, Takashi GONDO, Shinsuke MIYAZAKI, Mitsuhiro MURAYAMA, Satoshi HATA
08:00 - 18:15 #6300 - IM02-220 In situ mechanical quenching of nanoscale silica spheres in the TEM.
IM02-220 In situ mechanical quenching of nanoscale silica spheres in the TEM.

The physical and mechanical properties of glasses strongly depend on their bonding configuration and topology, which includes near, intermediate and long range order [1]. It is well-known that controlled application of mechanical load during cooling of glass melts can lead to topologically modified network structures [2,3]. Also uniaxial compression experiments can be used to introduce structural anisotropy into various glasses [4,5]. Moreover, moderate electron beam (e-beam) irradiation in the transmission electron microscope (TEM) [6,7] and scanning electron microscope (SEM) [8] can be exploited to induce enormous ductility in nanoscale silica spheres under mechanical load. However, still the question remains whether e-beam irradiation in combination with compression can lead to anisotropic glasses and how this affects their mechanical properties.

Here we present a novel approach to perform athermal mechanical quenching experiments in the TEM and evidence its impact on mechanical properties of nanoscale silica spheres [9]. Nanoscale silica spheres are compressed in the TEM under different e-beam conditions and loading scenarios by using the Hysitron PI95 TEM PicoindenterTM (Fig. 1). Prior to compression the silica spheres are irradiated with an e-beam current density of 0.09 A/cm2, leading to a shrinkage of 15-18% [7]. In experiment 1 the silica sphere is compressed at beam-off conditions and exhibits an elastic-plastic deformation behavior without fracture [7]. In experiment 2 the silica sphere is quenched under load. To achieve this the compression is started under e-beam irradiation (which we use to mimic temperature) and the e-beam is switched off during compression. The sudden absence of the e-beam quenches-in the modified silica network structure. Surprisingly, starting from the quenching point the slope of the force-displacement curve increases drastically, while a completely elastic loading-unloading behavior is obtained. In case of experiment 3 directly after the beam-on compression a holding segment is used, allowing for relaxation of stresses. During the following deformation at beam-off conditions the silica sphere shows a completely elastic loading-unloading behavior. Interestingly, complementary finite element method simulations reveal that the Young’s moduli (E) of silica spheres are altered: E values of 45 GPa, 38 GPa and 29 GPa are obtained for silica spheres from experiments 1, 2 and 3, respectively. As a direct reason for this observation structural anisotropy is proposed (Fig. 2) [9]. Quenching of silica spheres under load leads to a partially anisotropic silica network, while quenching after relaxation generates an even more anisotropic structure. During the relaxation period the silica sphere is in a compressed and confined state, during which structural re-organization is restricted along the compression direction [9]. This mechanism is further favored by residual tensile stresses acting perpendicular to the loading direction [10,11], which maintains the development of structural anisotropy reported here [9].

[1] L. Wondraczek et al., Adv. Mater. 2011, 23, 4578.
[2] T. Takamori, M. Tomozawa, In: Treatise Mater. Sci. Technol. 1977, 123-152, 152a, 153-155.
[3] R. Brückner, Glas. Berichte Glas. Sci. Technol. 1996, 69, 396.
[4] J. Wu et al., J. Chem. Phys. 2009, 131, 104504.
[5] A. Concustell et al., Scr. Mater. 2011, 64, 1091.
[6] K. Zheng et al., Nat. Commun. 2010, 1, 24.
[7] M. Mačković et al., Acta Mater. 2014, 79, 363.
[8] S. Romeis et al., Rev. Sci. Instrum. 2012, 83, 95105.
[9] M. Mačković et al., submitted.
[10] T.R. Simes et al., J. Strain Anal. 1984, 19, 135.
[11] J.G. Swadener et al., J. Mater. Res. 2001, 16, 2091.
Financial support by the DFG through the SPP1594 “Topological Engineering of Ultra-Strong Glasses”, Cluster of Excellence EXC 315 “Engineering of Advanced Materials” and GRK1896 “In situ microscopy with electrons, X-rays and scanning probes” is gratefully acknowledged. We thank R. Klupp-Taylor and M. Hanisch for providing the silica spheres and S. Romeis for valuable discussions.


Mirza MAČKOVIĆ (Erlangen, Germany), Florian NIEKIEL, Lothar WONDRACZEK, Erik BITZEK, Erdmann SPIECKER
08:00 - 18:15 #6309 - IM02-222 In situ compression experiments of fused silica pillars in the TEM and SEM.
IM02-222 In situ compression experiments of fused silica pillars in the TEM and SEM.

While fused silica is known for its brittleness on macroscopic scale [1], it exhibits an amount of plasticity on microscale [2]. Thermally-treated Stöber-Fink-Bohn (SFB)-type silica spheres are known to approach the structure of vitreous silica and show size-dependent mechanical properties [3,4]. Adequate electron-beam (e-beam) irradiation can be used to induce enormous ductility during compression of nanoscale silica spheres [5-7], and to alter their Young’s modulus (E) [7]. While a controlled introduction of structural anisotropy by cooling of glass melts under load [8-10] was shown to enhance the mechanical properties of glass fibers [11], we recently showed that e-beam-assisted quenching under load (turning off the e-beam during compression) inside the transmission electron microscope (TEM) may also lead to structural anisotropy and affects the mechanical properties of nanoscale silica spheres [12]. Here we prove the potential of e-beam-assisted quenching under load on fused silica pillars and further investigate their size-dependent mechanical behavior.

Fused silica pillars are prepared by two different methods from bulk fused silica, namely (1) reactive ion etching (RIE) and (2) focused ion beam (FIB) milling in combination with a charge neutralizer system (FEI Company). Mechanical testing was performed with the Hysitron PI95 TEM PicoindenterTM in the TEM and a custom-built indenter in the scanning electron microscope (SEM) [6]. Both, RIE and FIB milling lead to pillar structures with reproducible geometry and suitable for in situ mechanical experiments in TEM and SEM (Fig. 1). In situ compression of RIE pillars to high strains in the SEM eventually results in fracture with characteristic star-like fracture pattern (Fig. 2). In situ compression experiments at smaller strains carried out on FIB-prepared pillars in the TEM at beam-off conditions reveal a fully elastic deformation behavior, as exemplarily shown in Fig. 3. Thereby, an E = 78 GPa and compressive strength of ≥ 8 GPa are achieved. While E is slightly higher, the compressive strength clearly exceeds the one known for bulk fused silica [1], and the one of microscale fused silica pillars [2]. Further compression experiments on pillars in the TEM and SEM are planned, with the aim to explore their overall size-dependent mechanical behavior in direct relation to our work on nanoscale glass spheres [4,7]. Finally, we expand our recently reported e-beam-assisted quenching under load approach [12] also on fused silica pillars, with the aim to get a generalized picture of the mechanical properties of nanoscale glasses upon quenching under load in the TEM.

 

[1] R.F. Cook, G.M. Pharr, J. Am. Ceram. Soc. 1990, 73, 787.
[2] R. Lacroix et al., Acta Mater. 2012, 60, 5555.
[3] S. Romeis et al., Part. Part. Syst. Charact. 2014, 31, 664.
[4] J. Paul et al., Powder Techn. 2015, 270, 337.
[5] K. Zheng et al., Nat. Commun. 2010, 1, 24.
[6] S. Romeis et al., Rev. Sci. Instrum. 2012, 83, 95105.
[7] M. Mačković et al., Acta Mater. 2014, 79, 363.
[8] T. Takamori, M. Tomozawa, J. Am. Ceram. Soc. 1976, 59, 377.
[9] R. Brückner, Glas. Berichte Glas. Sci. Technol. 1996, 69, 396.
[10] J. Wu et al., J. Chem. Phys. 2009, 131, 104504.
[11] J. Endo et al., J. Am. Ceram. Soc. 2015, 1-5, 1.
[12] M. Mačković et al., submitted.
Financial support by the Deutsche Forschungsgemeinschaft (DFG) through the SPP1594 “Topological Engineering of Ultra-Strong Glasses”, Cluster of Excellence EXC 315 “Engineering of Advanced Materials” and GRK1896 “In situ microscopy with electrons, X-rays and scanning probes” is gratefully acknowledged.


Mirza MAČKOVIĆ (Erlangen, Germany), Thomas PRZYBILLA, Patrick HERRE, Stefan ROMEIS, Jonas PAUL, Etienne BARTHEL, Jeremie TEISSEIRE, Nadine SCHRENKER, Wolfgang PEUKERT, Erdmann SPIECKER
08:00 - 18:15 #8447 - IM02-223b In situ study of the electromechanical behaviour of Ti-Ag coated polymers for bio-sensing applications.
IM02-223b In situ study of the electromechanical behaviour of Ti-Ag coated polymers for bio-sensing applications.

Recent investigations in biosensors showed the advantages in the use of polymeric substrates, coated with conductive and biocompatible thin films such as Ti as bio-interfaces. Furthermore, Ag is widely known for its ductility and excellent electrical behavior. In addition, the bactericide effect of Ag allied to the Ti biocompatibility, have shown very interesting biological, electrical and mechanical properties [1].

In order to correlate the functional response of bio-sensors with the particular structure of Ti-Ag intermetallic phases, a fine TEM-scale investigation is performed. Moreover, the electric signal evolution as a function of the film’s deformation needs to be better understood. This microscale characterization is followed in realtime in situ using a tailored micro-tensile test machine implemented into a SEM chamber. For a local deformation quantification purpose, we proposed an original approach involving the Digital Image Correlation [3].

TiAgx thin films, with different amounts of Ag, were prepared by magnetron sputtering, using a titanium target with Ag pellets placed on its erosion zone. Submicrometer Ti-Ag thin films were deposited on specific 100µm-thick bone-shape polyethylene terephthalate (PET) substrates and on NaCl crystals for preparing the TEM thin foil. The electromechanical behavior of the coated polymers was evaluated under uniaxial stretching using a DEBEN machine.

HR-TEM examination clearly shows the nano-metric structure of films. Three different microstructures can be distinguished, explaining the three different functional response determined by electrical measurements. For different strain values depending on the film’s nature, a cracks network perpendicular to tensile direction appear. Initiation of cracks is strongly influenced by the growth microdefects.

 

[1] Lopes C, Gonçalves C, Pedrosa P, Macedo F, Alves E, Barradas NP, et al. TiAgx thin films for lower limb prosthesis pressure sensors: effect of composition and structural changes on the electrical and thermal response of the films. Appl Surf Sci 2013; 285: 10-8.

[2] Lopes C., Vieira M., Borges J., Fernandes J., Rodrigues M.S., E. Alves, N.P. Barradas, M. Apreutesei, P. Steyer, C.J. Tavares, L. Cunha, F. Vaz. Multifunctional TieMe (Me = Al, Cu) thin film systems for biomedical sensing devices. Vacuum 122 (2015) 353-359.

[3] Réthoré J, Morestin F, Lafarge L, Valverde P. 3D displacement measurements using a single camera. Optics and Lasers in Engineering, 57 (2014) 20-27


Aurelien ETIEMBLE, Claudia LOPES, Lucian ROIBAN, Beatriz FREITAS, Marco Sampaio RODRIGUES, Julien RETHORE, Filipe VAZ, Philippe STEYER (VILLEURBANNE CEDEX)
08:00 - 18:15 #4499 - IM03-224 THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes.
IM03-224 THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes.

The Nanoworkbench is the first system substituting eye-hand coordination effectively with nano-precision in a SEM/FIB-system. It can be imagined how technology could evolve, when tools within a SEM/FIB can be used as easily as tools used under optical microscopes.

Many every day developments would not exist today without preparation, handling and assembly of materials under optical microscopes. There would be no wristwatch, no in vitro fertilization, no mini-gearbox, just to mention a few. These products depend on using toolsets like tweezers, knives, hooks, probes and several different measurement tools in combination with optical microscopes. But material properties and functionalities also depend on structure dimensions that are smaller than the wavelength of light.
The operators of SEM, FIB or Dual Beam systems generally work without toolsets. One reason for this is the disconnected closed loop operation between human eyes and hands that enable complex operations under optical microscopes without even thinking about it

The two main aspects of the new Nanoworkbech by Klocke Nanotechnik GmbH, the development of its Nanorobotics technology and the applications enabled by it, are described in this paper.

Aspect 1, development of the technology: In general the success of in-SEM/FIB Nanorobotics depends on the co-operation of several important modules in one global system. The main developments include:

  • Nanomanipulators in automation, for movement of end-effectors and sample handling,
  • Different end-effectors for nano- probing, cutting, cleaning, force distance or wear measurements, gripping, sorting or material preparation and processing,
  • Automatic in-situ tip cleaning process
  • Automatic 3D position detection of all tools and SEM/FIB
  • A control of all tool and SEM/FIB sample stage positions in a common global coordinate system,
  • SEM picture assisted haptic interface by “Live Image Positioning”,
  • Modular design for fast configuration & teaching of nano-analytical or nano-handling processes.

With instantiating these technical demands the Nanoworkbench enables secure and easy usage of toolsets within SEM/FIB systems, for manual operation, for non-professional users and in high level of automation, e.g. for high throughput industrial processes, even as job-shop [1].

Aspect 2, development of a series of new applications in one system: Expanding the SEM/FIB to a material processing system and a nano-analytical workbench opens the door to many applications in all fields of research and development up to industrial production [5]. Several examples of these new interdisciplinary research and development fields will be described during the presentation.

A few examples of Nanoworkbench applications are highlighted in Figure 1. Although these examples may raise the impression of a review about different machines and their usage, this is not the case. Described is the development of the Nanoworkbench.

References

[1]   D. Morrant, EIEx Magazine of European Innovation Exchange, 1 (2009)

[2]   G. Schmid, M. Noyong, Colloid Polym Sci., (2008)

[3]   C.-H. Ke1, H.D. Espinosa, Journal of the Mechanics and Physics of solids, 53 (2005)

[4]   Seong Chu Lim, Keun Soo Kim, Kay Hyeok An, Dept. of Phys., Sungkyunkwan University, Korea (2002)

Supported by European Commission, IST and Ziel2.NRW


Ivo BURKART, Eva BURKART, Volker KLOCKE, David PETERS (Aachen, Germany)
08:00 - 18:15 #4770 - IM03-226 3D Fourier transform analysis and Diffractogram analysis to evaluate a high-performance TEM.
IM03-226 3D Fourier transform analysis and Diffractogram analysis to evaluate a high-performance TEM.

The resolution of HRTEM has been improved down to sub-angstrom by correcting the spherical aberration (Cs) of the objective lens, and the information limit is thus determined mainly by partial temporal coherence. Thus, a method to measure the partial temporal coherence becomes important more than ever. Since a traditional Young’s fringe test does not reveal the true information limit for an ultra-high resolution electron microscope, new methods to evaluate the focus spread, and thus temporal coherence have been proposed based on a tilted-beam diffractogram [1,2]. However, in order to observe literally an actual information transfer during the image formation down to a few ten pm, we need the strong scattering amorphous object, which will inevitably introduce pronounced non-linear contribution. Since the diffractogram analysis cannot be applied when the non-linear contribution becomes significant, we have proposed the method based on the three-dimensional (3D) Fourier transform (FT) of through-focus TEM images, and evaluated the performances of some Cs-corrected TEMs at lower-voltages [3,4]. In this report we generalize the 3D FT analysis and derive the 3D transmission cross coefficient (TCC). Then, we compare the 3D FT analysis with the tilted-beam diffractogram analysis (2D FT analysis), and clarify the necessity to use the 3D FT analysis to evaluate a high-performance TEM.

     The Fourier transform of the image intensity with a tilted-beam illumination may be written as Eq. (1) in Figure 1 with the (2D) TCC, where E/t and E/s are the temporal and spatial envelopes, respectively [5]. You may note that the 2D FT of the tilted-beam image intensity depends on z only through the 2D TCC. Thus, the 3D FT of the image stack may be written as Eq. (2) in Figure 1 with the 3D TCC, which is a Fourier transform of the 2D TCC along the z-direction, where E/Ewald is a normalized Gaussian, and may be called Ewald sphere envelope. Here, w/E represents the Ewald sphere, and w-w/E is a distance measured from the Ewald sphere along the w-axis to the spatial frequency g2 on the uv-plane.

     Figure 2 illustrates temporal damping of tilted-beam diffractogram, which is a power spectrum (an intensity of the 2D FT) of the image intensity. Here, we show the temporal damping for low-pass filtered diffractograms [1] and diffractogram envelopes [2]. We have to note that the diffractogram analysis cannot extract linear image information out from the image intensity. Furthermore, we have to make use of a weak scattering approximation, since the diffractogram cannot separate two linear image contributions. Moreover, the tilted-beam diffractogram becomes broad for the case of a small defocus spread as shown in Figure 2 (b). Thus, the diffractogram analysis may have difficulty for a Cc-corrected microscope or a microscope with a monocromator.

     Figure 3 shows an example of the Ewald sphere envelopes. Using the Ewald sphere envelopes we can extract linear image information from the image intensity. Thus, we can evaluate the temporal envelope on the sharp Ewald spheres, even when the temporal envelopes become broad for the case of a small defocus spread as shown in Fig. 2. Another profound difference of the 3D FT analysis from the diffractogram analysis is its capability to evaluate two linear image contributions separately on the Ewald sphere envelopes. Therefore, we can use a thick sample or a sample made from strong scattering elements, even when the dynamical/multiple scattering becomes significant. This is the necessary condition if we want to directly observe the linear image transfer down to a few ten pm. Furthermore, our method using 3D FT of the through-focus images gives a possibility to directly observe the distribution of the focus spread via a Fourier transform of the measured temporal envelope for a high-performance microscope.

References:

[1] J. Barthel, A. Thust, Physical Review Letters 101 (2008) p.200801. 

[2] M. Haider, et al, Micros. Microanal. 16 (2010) p.393. 

[3] K Kimoto, et al, Ultramicroscopy 121 (2012) p.31.  

[4] K Kimoto, et al, Ultramicroscopy 134 (2013) p.86. 

[5] K. Ishizuka, Ultramicroscopy 5 (1980) p.55.  

Acknowledgements

This study was partly supported by the JST Research Acceleration Program and the Nano Platform Program of MEXT, Japan.


Kazuo ISHIZUKA, Koji KIMOTO (Tsukuba, Japan)
08:00 - 18:15 #5026 - IM03-228 Backscattered-electron SEM contrast of SiO2 nanoparticles.
IM03-228 Backscattered-electron SEM contrast of SiO2 nanoparticles.

Scanning electron microscopy (SEM) is frequently used for the characterization of nanoparticles (NPs) and imaging with backscattered electrons (BSEs) is particularly interesting to reveal, e.g., contamination NPs in a NP-ensemble. However, the SEM contrast of samples with complex geometries, compared to flat bulk samples, cannot be quantitatively described by common theoretical models [1]. In this work we will show that a) the BSE SEM contrast of SiO2 NPs on a complex substrate strongly depends on the primary electron energy E0, working distance WD and the used substrate and b) that Monte Carlo (MC) simulations are well suited to model and optimize the NP-contrast.

For this purpose SiO2 NPs with diameters from 50 nm to 110 nm were deposited on two different substrates. The first substrate is interesting for correlative SEM and light microscopy imaging and consists of glass slides coated by electrically conducting indium-tin-oxide (ITO) with 180 nm thickness [2]. The second substrate type consists of amorphous (glassy) carbon, which is covered by only 20 nm ITO. A FEI Quanta 650 FEG equipped with an annular semiconductor BSE detector mounted below the objective pole piece was used. E0 between 3 and 17 keV and WDs between 4 and 12 mm were chosen. MC-simulations were performed with a modified version of NISTMonte program [3] employing screened Rutherford and Mott cross-sections (CSs) for comparison with the measured data. The baseline intensity Iblack was recorded with blanked electron beam. The NP-contrast was calculated by C=(INP-Isub) / (Isub-Iblack), where INP is the NP-intensity and Isub the substrate intensity.

Figs. 1a,b show 5 keV BSE SEM images of SiO2 NPs on the 180 nm ITO/glass substrate taken at WDs of 10 mm (Fig. 1a) and 4 mm (Fig. 1b). Although the same object is imaged, contrast inversion of SiO2 NPs is observed. Fig. 1c shows a 5 keV BSE SEM image (WD = 10 mm) of SiO2 NPs on the 20 nm ITO/carbon substrate where NP-contrast inversion can be observed compared to the 180 nm ITO/glass substrate (Fig. 1a). The images in Fig. 1 indicate that simple interpretation of BSE SEM images in terms of material contrast is not adequate for complex sample structures.

The experimental and simulated NP-contrast is in detail studied by systematically varying the WD for E0 = 5 keV (cf. Fig. 2). While the NP-contrast for the 20 nm ITO/carbon substrate approaches zero with increasing WD, there is a contrast inversion for the 180 nm ITO/glass substrate at WD ~ 6 mm. We attribute this contrast inversion to the anisotropic angular BSE scattering characteristics, whereby the scattering angle range of collected BSEs is controlled by the WD.

The dependence of the NP-contrast on E0 for a constant WD = 10 mm is presented in Fig. 3. Contrast reversal occurs at ~4.5 keV for SiO2 NPs on 20 nm ITO/carbon and at ~10 keV for NPs on 180 nm ITO/glass. The NP-contrast for larger E0 is in general higher on the ITO/carbon substrate due to the small ITO thickness and low BSE intensity from the carbon substrate below. Converging C-values for low E0 indicate a) that the primary electrons do not even penetrate through the 20 nm ITO-layer anymore and b) that contrast inversion for the different substrates is related to the ITO-thickness. Another contrast inversion stands out, if both substrates are compared directly as highlighted in Fig. 3 by a red arrow at 5 keV. Additional MC-simulations are included in Fig. 3 assuming hypothetical substrates with 20 nm ITO on glass (dashed light-blue line) and 180 nm ITO on carbon (dashed purple line). The additional simulations demonstrate that the contrast inversion is also ITO-thickness dependent and not substrate-material dependent, because contrast inversion does not occur for ITO-layers with the same thickness on different substrates. MC-simulations with screened Rutherford CSs describe the NP-contrast well while simulations with Mott CSs (not shown here) show larger deviations from the experimental data.
To summarize, two unexpected effects were observed for BSE SEM contrast of SiO2 NPs: a strong dependence on the used substrate, in our case especially the ITO layer thickness, and a “geometrical” contrast inversion which can be controlled by the WD. Optimum NP contrast is obtained for small E0 and WD-values.

 

References

[1] H. Niedrig, J. Appl. Phys., 53 (1982), pp. R15-R49.

[2] H. Pluk, et al., J. Microsc, 233 (2009), pp. 353–363.

[3] N.W.M Ritchie, Surf. Interface Anal., 37 (2005), pp. 1006–1011.


Thomas KOWOLL (Karlsruhe, Germany), Erich MUELLER, Dagmar GERTHSEN
08:00 - 18:15 #5205 - IM03-230 Site-specific 35-minute TEM-lamella preparation by FIB-SEM.
IM03-230 Site-specific 35-minute TEM-lamella preparation by FIB-SEM.

Sample preparation by DualBeam (FIB-SEM) allows site specific TEM lamella to be prepared and is the number one use case for such instruments worldwide. This technique is quite complicated and the variety of different materials and site specific orientation can complicate the process such that a great deal of knowledge and experience is usually required to achieve top results. Improvements in the robustness of various hardware components combined with technology advances are enabling automation of best known methodologies for lamella preparation such that novice users can obtain consistent results. This results in a shorter time to prepare a lamella and a more consistent quality result.

Automation for different materials presents challenges due to differences in milling rates, hardness, structural differences and intended orientation. With semiconductor materials the similarity of materials makes it possible for fully automated process development due to the consistency of sample types, though often the end-pointing on today’s small structures can be quite demanding. In such cases the final thinning is often still done manually. For materials science, FEI has chosen to segment three phases of the preparation process.  The distinct three routines allow the most flexibility for different sample types: chunk milling, lift-out and thinning to electron transparency. Any of these steps can be run manually if desired or required for a particular application.

Chunk milling is the process of defining the area of interest, laying protective layers of the correct thickness, and making fiducials to be used throughout the process for ion beam placement. Bulk milling is done at relatively high currents to make the process fast and then an undercut and cleanup produces a lift-out ready thick lamella.

Lift-out has been semi-automated with the user identifying the tip of the lift-out probe and the sample or grid edge and the software making the required moves. Attaching and releasing the sample/probe/grid is controlled by user placed patterns for milling or deposition when requested by the guided workflow. The EasyLift manipulator with rotation and high stability is essential. Scripts exist for the rotating EasyLift EX manipulator that allow 90 dedgree or 180 degree lamella attachment to further improve TEM lamella quality. Once attached to the grid, the final script for thinning can be used.

Currently final polishing scripts can be tweaked for hard or soft materials and finishing can be specified to the desired lamella thickness with 5kV surface cleaning. On the newer Helios systems the 0.5kV image looks as good as the 2kV from previous FIB sources and thus the lower currents can very effectively be used for automated final polishing.

The presentation will demonstrate an interactive guided TEM Sample preparation process on the Helios DualBeam. This method shortens the TEM lamella preparation process for expert users and enables novice users to obtain routine, high quality results. The method proposed can be used on almost any material to prepare lamellas from soft and hard materials and examples are shown in Figure 1. Guided TEM Sample preparation is available on the newest FEI DualBeams and can help meet TEM lamella preparation challenges in materials science.


Daniel PHIFER (Eindhoven, The Netherlands), Remco GEURTS
08:00 - 18:15 #5236 - IM03-232 Multicomponent garnet film scintillators for SEM electron detectors.
IM03-232 Multicomponent garnet film scintillators for SEM electron detectors.

With an Everhart-Thornley (ET) scintillation detector in SEM, an image is formed by signal electrons emerged after an interaction of focused scanning electron beam with the specimen surface. In such a case a scintillator plays an important role as a fast electron-photon signal conversion element. A selection of fast scintillation materials is very limited, because the only mechanism for scintillators applicable in SEM ET detectors consists in allowed 5d-4f transitions in lanthanide ions. Unfortunately, the widely used Czochralski grown single crystal YAG:Ce scintillators suffer from an afterglow, which deteriorate the ability to transfer high image contrast. The mentioned afterglow in the bulk single crystal is caused by inevitable structural defects, such as antisite defects. These trap states are responsible not only for delayed radiative recombination causing the afterglow, but also for a degradation of the light yield. The aim of this study is to introduce new multicomponent garnet film scintillators for SEM electron detectors that due to the substitution of Al by Ga in the Gd3Al5O12:Ce garnet extensively supress the shallow traps resulting in a significant increase of the cathodoluminescence (CL) efficiency and in improvement of the afterglow characteristics.

To avoid the defective bulk scintillators, isothermal dipping liquid phase epitaxy was chosen as a method for garnet single crystalline film preparation [1]. The high purity Ce activated GAGG (Gd3Al1.7Ga3.3O12:Ce) film of the thickness of 11 µm, grown on the single crystal YGG (Y3Ga5O12) substrate, was chosen to assess its applicability as the scintillator in the scintillation detector in SEM. Results of Monte Carlo (MC) simulation of electron interaction [2] in the GAGG:Ce film as well as in the YAG:Ce bulk scintillator in different depth of the scintillator are shown in Fig. 1. It is evident from the MC simulation that electron interaction active layers of the garnet scintillators are much thinner than 10 µm for standard signal electron energy. Furthermore, it is seen that the GAGG:Ce scintillators may be even thinner than the YAG:Ce ones. Comparison of optical absorption coefficients of the GAGG:Ce film,  YAG:Ce crystal and YGG substrate is in Fig. 2, and CL emission spectra of these scintillators obtained using the apparatus for the cathodoluminescence study [3] are shown in Fig. 3. The optical self-absorption together with the refractive index and the emission spectra of the scintillators are very important quantities for an assessment of the signal photon transport in the both examined scintillators. Although the GAGG:Ce film exhibits higher optical absorption, it has a higher collection efficiency of signal photons, since the path of photons in this film is much shorter than the path of photons in the bulk YAG:Ce scintillator, which was verified by MC simulation of a light transport [4] in the scintillation detector for SEM. As seen in Fig. 3, the CL efficiency of both scintillators is approximately the same. However, the GAGG:Ce film do not suffer from parasitic UV host emission. Regarding the scintillator-PMT matching, for both scintillators the photocathode S20 should be used. CL decay characteristics of both examined scintillators, measured using the CL apparatus [3], are shown in Fig. 4. The decay time as low as 22 ns and the afterglow of only 0.043 % at 0.5 µs after the end of excitation predetermines the GAGG:Ce film scintillators for extremely fast and efficient electron detectors in SEMs.

Acknowledgement
The research was supported by Czech Science Foundation (GA16-05631S and GA16-15569S), by Technology Agency of the Czech Republic (TE01020118), by Ministry of Education, Youth and Sports of the Czech Republic (LO1212), and by European Commission and Ministry of Education, Youth and Sports of the Czech Republic (CZ.1.05/2.1.00/01.0017).

References

[1] Bok, J.; Lalinský, O.; Hanuš, M.; Onderišinová, Z.; Kelar, J.; Kučera, M.: GAGG:Ce single crystalline films: New perspective scintillators for electron detection in SEM, Ultramicroscopy 163 (2016), 1‑5.

[2] Schauer, P.; Bok, J.: Study of spatial resolution of YAG:Ce cathodoluminescent imaging screens, Nucl. Instr. Meth. B 308 (2013), 68‑73.

[3] Bok, J.; Schauer, P.: LabVIEW-based control and data acquisition system for cathodoluminescence experiments, Rev. Sci. Instrum. 82 (2011), 113109.

[4] Schauer, P. Extended Algorithm for Simulation of Light Transport in Single Crystal Scintillation Detectors for S(T)EM, Scanning, 29 (2007), 249-253.


Petr SCHAUER (Brno, Czech Republic), Ondřej LALINSKÝ, Zuzana LUČENIČOVÁ, Miroslav KUČERA
08:00 - 18:15 #5318 - IM03-234 Spin polarisation with electron Bessel beams?
IM03-234 Spin polarisation with electron Bessel beams?

Despite the statement of Bohr and Pauli that Stern-Gerlach based spin separation for electrons cannot work [1], it has been argued that spin separation or filtering of electrons is possible in particular geometries [2,3]. The argument has been debated, see e.g. [4], and it seems that the effect exists but is too small to be exploited with present day technology. As of now, no Stern-Gerlach design of a spin polarizer for free electrons was successful. On the other hand, an unexpected intrinsic spin-orbit coupling (SOC) in relativistic vortex electrons was discovered, and it was proposed to use this effect to construct a spin filter for free electrons [5]. Recently, it has been shown [6] that crossed electric and magnetic quadrupole fields correspond to so-called q-plates which are used in laser optics for spin-to-orbital moment conversion (STOC).  In combination with electron vortex beams, this opens the possibility to couple the spin of free electrons to the spatial degree of freedom, and so design a spin filter [7]. However, the realisation of such devices is hampered by severe geometric constraints.

Here, we propose a different approach exploiting the magnetic fields created by the lenses already present in conventional TEMs. The vector potential of a round magnetic lens in the TEM has cylindrical symmetry over the propagation axis. This  is equivalent to an optical q-plate. Such a field can be used as a STOC device quite similar to the optics case because the total angular momentum J= L + S is a constant of motion. Thus, it seems that electron microscopes are intrinsic spin polarizers. Basic considerations show that a vortex beam of order one passing a standard magnetic round lens (the objective lens in the present case)  is intrinsically spin polarized. As shown in Fig. 1, the vortex in plane A can be seen as a continuous line of point sources (red dot) on the ring aperture, each of which results in a tilted plane wave in B. Classically, the momentum p of the particle in A is tilted by the Lorentz force to p’ at B (grey arrows). The spin vector (red arrows) performs a precession in the magnetic field when going from A to B. Conservation of the total angular momentum J=L+S creates small contributions of Bessel beams J0 or J2, depending on the original spin polarisation in plane A, which are superimposed onto the dominant J1 beam in plane B.  This spin-to-orbit coupling allows spin filtering because J0 and J have different radial profiles.

In the limit of infinitely small detectors on axis, the spin polarisation tends to 100 %. Increasing the detector size, the polarisation decreases rapidly, dropping below 10-5 for standard settings of medium voltage microscopes. For extremely low voltages, the figure of merit increases by two orders of magnitude, approaching that of existing Mott detectors (Fig. 2).

Our findings may lead to new desings of spin filters, an attractive option in view of its inherent combination with the electron microscope, especially at low voltage.

 

Acknowledgements: The financial support by the Austrian Science Fund (I543-N20 and J3732-N27) and by the European research council (ERC-StG-306447) are gratefully acknowledged.

 

[1] W. Pauli, Collected Scientific Papers,  2 (1964) 544.

[2] H. Batelaan et al., Physical Review Letters 79 (1997) 4517.

[3] B. Garraway, S. Stenholm, Physical Review A 60 (1999) 63.

[4] G. Rutherford, R. Grobe, Journal of Physics A 31 (1998) 9331.

[5] K.Y.Bliokh et al. Physical Review Letters 107 (2011) 174802.

[6] E. Karimi et al. Physical Review Letters 108 (2012) 044801.

[7] V. Grillo et al. New Journal of Physics 15 (2013) 093026.


Peter SCHATTSCHNEIDER (Wien, Austria), Vincenzo GRILLO, Thomas SCHACHINGER, Stefan LÖFFLER
08:00 - 18:15 #5428 - IM03-236 A Variable-Temperature Continuous-Flow Liquid-Helium Cryostat Inside a (Scanning) Transmission Electron Microscope.
IM03-236 A Variable-Temperature Continuous-Flow Liquid-Helium Cryostat Inside a (Scanning) Transmission Electron Microscope.

The progress in (scanning) transmission electron microscopy development had led to an unprecedented knowledge of the microscopic structure of functional materials at the atomic level. Additionally, although not widely used yet, electron holography is capable to map the electric and magnetic potential distributions at the sub-nanometer scale. This opens a route to investigate the phase structures of electronic and magnetic phenomena in condensed matter at a microscopic level. Many of the most interesting solid state phenomena occur at low temperatures only. Nevertheless, low temperature studies inside a (scanning) transmission electron microscope ((S)TEM) are extremely challenging because of the much restricted size and accessibility of the sample space. Up to date, there are no cryo-(S)TEMs or special sample holders that are capable to cool a sample controllably to any but its base temperature below room temperature.

Recently, we introduced a concept for a dedicated in-situ (S)TEM for flexible multi-stimuli experimental setups with the capabilities of holographic recording and scanning electron microscopy type imaging. A central part was a large sample chamber with multiple ports. With a prototype instrument, we demonstrated a maximum resolving power of about 1 nm in conventional imaging mode and substantially better than 5 nm in scanning mode while providing an effectively usable pole piece gap of 70 mm [1].

Here, we report about the state of the first major plug-in fitted into the prototype in-situ (S)TEM: A variable-temperature liquid-helium continuous-flow cryostat for nanometer resolved imaging and diffraction at controlled temperatures between 10 K and 300 K. Arbitrary temperatures in the offered range can be installed and held stable by a heating in the sample mount with the help of a PID controller. The cryostat has two operation modes, one with two cooled radiation shields for temperatures below 10 K and one without the shields for free sample access from outside the cryostat at temperatures down to 20 K. Sample drift due to negative thermal expansion is reduced by a circular cooled sample mount and a flexible copper strand to the cold finger. The design of a continuous flow cryostat with a low consumption rate offers a long working time at low temperature while sucking helium from a 100 l vessel. Additionally, the cryostat offers four cooled terminals for fixed electrical contacts and is prepared for a future incorporation of two mobile electrical probes.

Examples of experiments now possible with this new setup are the mapping of the phase structure of different electronic and magnetic phenomena, like charge density waves and Skyrmions.

Acknowledgements

The authors thank S. Leger for technical assistance.

[1] F Börrnert et al, Ultramicroscopy 151 (2015), p. 31.


Felix BÖRRNERT (Ulm, Germany), Alexander HORST, Michael A. KRZYZOWSKI, Bernd BÜCHNER
08:00 - 18:15 #5696 - IM03-238 Novel Linkage Technology of the Shared Alignment Sample Holder for Same Area Observations with Electron Microscopy and Scanning Probe Microscopy.
IM03-238 Novel Linkage Technology of the Shared Alignment Sample Holder for Same Area Observations with Electron Microscopy and Scanning Probe Microscopy.

    We developed an innovative air protection sample holder enabling a hermeneutically sealed sample transfer from Hitachi’s ion milling instrument to the Field Emission Scanning Electron Microscopes (FE-SEM) and the environment control high-vacuum Scanning Probe Microscope (SPM) AFM5300E for a correlative microscopy (Figure 1). In a previous study, we explained the advantages of this sample holder with regard to the analysis of cathode materials in a lithium-ion battery [1].

 

    Our novel SEM-SPM linkage system with the shared alignment sample holder enables a software-based alignment of the same measurement area for a comprehensive analysis of sample surfaces with Hitachi’s FE-SEM SU8200 Series and the new midsize-sample SPM AFM5500M, characterized by the automation of the cantilever exchange, laser alignment, feedback parameter tuning and data processing (Figure 2). As the XY-stage of both microscopes drives with high accuracy to the desired area by only registering three specified coordinates of the sample stage, this linkage system facilitates a correlative microscopy of samples that are difficult to align optically. In this study, we used this technology to analyse a multilayer graphene on a SiO2 substrate. For an observation of graphene, FE-SEM is one method to explain the relationship between SE contrasts and the thickness of graphene layers. Another method is the Kelvin force microscopy (KFM) explaining the quantitative relationship between surface potentials and topographic heights. Thus, a linkage of both observation methods enables a correlative analysis of SE contrasts, topography and surface potentials.

 

   Figure 3 shows the SE image obtained at a accelerating voltage of 0.5 kV, topography and the KFM image of a multilayer graphene on a SiO2 substrate measured with the linkage system. The grey island structure with two different contrasts and several lines in the SE image are well aligned with the topography and KFM images. Analysing the topography, we confirmed that SE contrast differences result from single graphene step heights. Furthermore, we have learned that the surface potential of a bilayer graphene is 15-20 mV higher than that of a monolayer graphene.

 

    In conclusion, the linkage system is a tool for a comprehensive analysis of a sample’s composition, structure, 3D topography, mechanic and electro-magnetic properties with the SEM and SPM instruments without any constraints in regard to their performances.

 

References:

[1]    T. Yamaoka, et al., The 34th Annual NANO Testing Symposium, 3 (2014), p.13-18.


Ulrich DIESTELHORST (Kawasaki-shi, Japan), Takehiro YAMAOKA, Kazunori ANDO, Yoichiro HASHIMOTO
08:00 - 18:15 #5721 - IM03-240 Electron beam lithography for the realization of electron beam vortices with large topological charge ( L=1000ħ).
IM03-240 Electron beam lithography for the realization of electron beam vortices with large topological charge ( L=1000ħ).

Electron vortex beams (EVBs) are an appealing topic, both in fundamental science and for practical applications in electron microscopy [1, 2]. Some of the most promising applications require beams that have large orbital angular momentum (OAM) [2, 3, 4]. Here, we demonstrate the largest (L=1000 ħ) high quality EVB by using electron beam lithography (EBL) to fabricate a phase hologram. EBL provides superior fabrication quality and a larger number of addressable points when compared with focused ion beam (FIB) milling. We measure the OAM of the generated EVB through propagation after a hard aperture cut [5]. Comparisons with simulations confirm an average OAM of (960±120)ħ , which is consistent  with the intended value.
A clear improvement when compared with a FIB-nanofabricated hologram is demonstrated in terms of 1) the maximum OAM that can be reached; 2) the minimum feature size (33 nm in the present study); 3) the improved uniformity of the frequency response; 4) the better suppression of higher order diffraction due to a nearly perfect rectangular groove profile.
We believe that EBL will be the fabrication technique of choice for most new diffractive optics with electrons in the future, permitting more complex holograms and new applications in material science.

[1] J. Verbeeck, H. Tian  P. Schattschneider Nature 467 (2010) 301
[2] B. J. McMorran,  A. Agrawal  et al. Science 331 (2011) 192
[3] V. Grillo et al .  Phys Rev Lett 114, 034801 (2015)
[4] I. P. Ivanov and D. V. Karlovets, Phys. Rev. A 88, 043840(2013).
[5] P. Schattschneider, T. Schachinger, et al. Nature Comm. 5, 4586 (2014).




Erfan MAFAKHERI, Amir TAVABI, Penghan LU, Roberto BALBONI, Federico VENTURI, Claudia MENOZZI, Gian Carlo GAZZADI, Stefano FRABBONI, Robert BOYD, Rafal DUNIN-BORKOWSKI, Ebrahim KARIMI, Vincenzo GRILLO (Modena, Italy)
08:00 - 18:15 #5737 - IM03-242 Transmission imaging of biological tissue with the Delft multi-beam SEM.
IM03-242 Transmission imaging of biological tissue with the Delft multi-beam SEM.

A major bottleneck for large-scale and volume EM is the imaging speed. The total acquisition time needed for a single sample can easily take days, or even weeks using standard single-beam SEM’s. Multi-beam microscopes have been developed to increase imaging speed[1,2], but it remains a challenge to achieve electron detection similar to a regular SEM in terms of signal type, contrast and resolution.

We have developed a SEM employing 196 electron beams using a standard column of a FEI Nova NanoSEM 200. The 196 electron beams are generated from a single high-brightness Schottky electron source, making use of a square aperture lens array grid of 14 by 14 holes. Modified source optics allows focusing of all beams in the sample plane, with the same probe current and probe size as in a single-beam SEM.  Both secondary and transmission electron signals can be detected in the system, of which an overview is shown in figure 1. For the detection of the transmitted electrons, the sample of interest is placed on a scintillating screen and the light generated by each beam is collected through an optical objective lens.  This light is focused on a CMOS camera placed outside the SEM chamber and the image is produced through online processing of the intensity of each beam. An example of rat pancreas tissue imaged by this method is shown in figure 2.  The secondary electrons are focused on a scintillating screen in the variable aperture plane, making use of a retarding lens and the electron optics used for the focusing of the primary beams.  This signal is again focused on a CMOS camera and the same process for imaging is performed as for the transmitted electrons.

We present proof-of-principle results showing that sub-10nm resolution can be obtained for transmission imaging of stained rat pancreas tissue. We will discuss our efforts towards improving the detection methods  and the data processing speed.  Furthermore, work will be shown on quantifying and comparing the signals obtained from secondary, transmitted and backscattered electrons on stained tissue sections, as imaged by a conventional SEM.

This work is part of the research programme of the Foundation for Fundamental Research on Matter (FOM), which is part of the Netherlands Organisation for Scientific Research (NWO).

 

[1] Mohammadi-Gheidari, A., C. W. Hagen, and P. Kruit. Journal of Vacuum Science & Technology B 28.6 (2010): C6G5-C6G10.

[2]  Lena Eberle, A., Schalek, R., Lichtman, J. W., Malloy, M., Thiel, B., & Zeidler, D. (2015). Multiple-Beam Scanning Electron Microscopy. Microscopy Today, 23(02), 12-19.

 

 

 

 

 

 

 

 

 


Wilco ZUIDEMA (Delft, The Netherlands), Yan REN, Jacob HOOGENBOOM, Cees HAGEN, Pieter KRUIT
08:00 - 18:15 #5761 - IM03-244 Ultrafast nano-fabrication and analysis using Xe plasma-FIB-SEM microscope and its applications for Cu milling using the Rocking-stage.
IM03-244 Ultrafast nano-fabrication and analysis using Xe plasma-FIB-SEM microscope and its applications for Cu milling using the Rocking-stage.

Conventional Ga FIB has a reasonable resolution (typically up to 2.5 nm). However, these instruments present some limitations, including Ga ion implantation and contamination, and slow sputtering rate. New liquid metal alloy ion sources (LMAIS) have been developed to overcome these limits[1]. However, none of the proposed LMAIS sources is suitable for rapid milling because they can only deliver probe current up to few tens of nA. Contrary, emerging Xe plasma FIB systems promise faster removal rates[2],[3].

Homogenous copper FIB milling arises from the need to perform various circuit edit operations below the dielectric layer following the copper layer.  If the layer beneath the dielectric is affected by inhomogeneous milling, it can lead to short-circuit and eventual device breakdown. Failure analysis on an integrated circuit was performed using rocking stage with 6-axes piezo movement capabilities together with the novel approach of the combined Xe-plasma ion source FIB and SEM system (XEIA). The new Xe plasma FIB offers sputtering speed up to 50 times faster than the most powerful Ga FIBs. Compared to conventional Ga ion sources, the Xe plasma ion source reduces dramatically the time for cross-sectioning from tens of hours or even days to a matter of hours[4],[5].

Site-specific milling of copper with different milling strategies were tested to optimize time and homogeneity of the milling across the target surface and to overcome the channeling effect posed by polycrystalline copper. Only during the last few nanometers of copper layer the water vapor is used to protect the dielectric layer. The complete removal of copper was followed with XeF2 assisted milling of the dielectric layer to observe the unharmed circuitry. Channeling effect was reduced by regulating the sputtering rates across different grains keeping the underlying dielectric layer safe. Ultra-high-resolution scanning electron microscopy (UHR-SEM) imaging was used for constant monitoring of the removed material to help modulate the process for highest throughput in the least possible amount of time[6].


[1] A. Benkouider et al, Thin Solid Films 543 (2013) 69-73

[2] T. Hrnčíř et al, 38th ISTFA Proceedings (2012) 26

[3] J. Jiruše et al, Microsc. and Microanal. 21 (2015) 1995

[4] A. Delobbe et al, Microsc. and Microanal. 20 (2014) 298

[5] T. Hrnčíř et al, 40th ISTFA Proceedings (2014) 136

[6] The authors would like to acknowledge that this work is performed within the European Commission Initial Training Network, STEEP (Grant no. 316560).


Abdelmalek BENKOUIDER (Brno, Czech Republic), Sharang SHARANG, Tomaš HRNČÍŘ, Jozef Vincenc OBOŇA, Jaroslav JIRUŠE, Edward PRINCIPE
08:00 - 18:15 #5763 - IM03-246 Quasi-Nanofluidic liquid cell for in situ liquid Trasmission Electron Microscopy.
IM03-246 Quasi-Nanofluidic liquid cell for in situ liquid Trasmission Electron Microscopy.

In this work we present a new microfabricated nanochannel device for in situ liquid TEM based on wafer bonding (Fig.1a). A schematic depiction of the chip cross section is presented in Fig.1b. The cell system was fabricated with a new direct bonding technique linking the adhesion properties of Silicon Rich Nitride (SiNx)/Stoichiometric Silicon Nitride (Si3N4) within atomic layer deposition (ALD) of Al2O3 tuned for this application to provide low temperature bonding. The liquid vessel is designed with multiple nanochannels on a suspended membrane area, with tunable liquid layer thickness ~100 nm and silicon nitride windows ~ 50 nm. The channel design of the system improves the control of the top and bottom membrane bulging compared to commercial liquid cell devices and is hence expected to improve the area with high spatial resolution achievable in liquid TEM imaging.  Our nanofluidic system together with a custom-made flow holder will give further control of liquid conditions dynamically varying experimental conditions.

 

The liquid cell was first tested by optical fluorescence microscopy using a solution of 10 nm quantum dots (QD) and as depicted in Fig.2. Flow and diffusive motion of the QDs could be followed. In a Tecnai TEM at 200 kV, a solution of 30 mM HAuCl4 was sealed in the channel with epoxy glue and upon TEM irradiation gold particles in average size between 5 and 15 nm were nucleated along the channels (Fig.3a). Sometimes rocking particle motion was observed, confirming their enclosure within the liquid layer (Fig.3b). In our design membranes are inner bending on each other and plastically deformed due to the extremely high (>12 bar) capillary force. Thus, a thin layer of water < 100 nm is trapped among the membranes. In contrast with other  recent liquid vessels [1], our nanofluidic system points toward higher resolution since liquid thickness  [2], biomineralization synthesis [3] , liquid phase displacement and in liquid holography.

 

References

  

1.                  Tanase, M. et al. Microsc. Microanal. 21, 1629–1638 (2015).

2.                  Nielsen, M. H. et al. Microsc. Microanal. 20, 425–436 (2014).

3.                  Smeets, P. J. M., Cho, K. R., Kempen, R. G. E., Sommerdijk, N. a J. M. & De Yoreo, J. J. Nat. Mater. 1–6 (2015). doi:10.1038/nmat4193

 


Simone LAGANA (Kgs. Lungby, Denmark), Esben KIRK MIKKELSEN, Hongyu SUN, Rodolphe MARIE, Kristian MØLHAVE
08:00 - 18:15 #5773 - IM03-248 Laser triggered microfabricated ultrafast electron beam blanker.
IM03-248 Laser triggered microfabricated ultrafast electron beam blanker.

Femtosecond electron pulses are typically created by illuminating a flat photocathode  with femtosecond laser pulses. [1] However, flat photocathodes have a low reduced brightness,  2 orders of magnitude lower than a Schottky electron source. A higher brightness can be achieved using a cold field emitter illuminated with femtosecond laser pulses. [2] Using a cold field emitter illuminated with UV pulses the group of Zewail has realized an ultrafast SEM. [3] However, such an USEM cannot easily be switched back to continuous beam operation. In addition, the pulse has to be accelerated from the tip onwards which leads to a broadened pulse at the sample.

 Here, we propose a beam blanker for use in regular EMs that allows switching between continuous-beam and ultrafast modes of operation. Previous approaches to ultrafast beam blanking were based on beam blankers using GHz magnetic or electric fields. [4,5] These GHz cavities are still relatively large and can’t be inserted directly in a standard commercial SEM.

 We use a miniaturized beam blanker controlled by a photoconductive switch, illuminated with femtosecond laser pulses, as schematically depicted in Figure 1. Hence, the blanker is locked jitter-free to the laser. We show that such a beam blanker needs to have micrometer scale dimensions for ultrafast operation. COMSOL simulation results, including the full 3D blanker design, are used to evaluate the time response of the system.

 We fabricated and integrated the deflector plates and the photoconductive switch in a one micrometer-scale device, see Figure 2. We will show fabrication results of the ultrafast blanker and its incorporation on an insert for a FEI Quanta FEG 200 SEM. We will also show alignment of both laser and electron beam on the ultrafast beam blanker. Also results will be presented showing laser triggered deflection of the electron beam.

 

 

References:

[1] A. H. Zewail, “Four-dimensional electron microscopy.” Science 328, 5975,  187–93 (2010).

[2] P. Hommelhoff, Y. Sortais, A. Aghajani-Talesh, and M. a. Kasevich, “Field Emission Tip as a Nanometer Source of Free Electron Femtosecond Pulses,” Phys. Rev. Lett., 96 (7), 077401 (2006).

[3] D.-S. Yang, O. F. Mohammed, and A. H. Zewail, “Scanning ultrafast electron microscopy.,” Proc. Natl. Acad. Sci. U. S. A., 107 (34), 14993–8, (2010).

[4] K. Ura, H. Fujioka, and T. Hosokawa, “Picosecond Pulse Stroboscopic Scanning Electron Microscope,” J. Electron Microsc., 27 (4), 247–252 (1978).

[5] A. Lassise, P. H. A. Mutsaers, and O. J. Luiten, “Compact, low power radio frequency cavity for femtosecond electron microscopy.,” Rev. Sci. Instrum., 83 (4), 043705 (2012).


Gerward WEPPELMAN, Robert MOERLAND, Ruud VAN TOL, Carel HEERKENS, Jacob HOOGENBOOM (Delft, The Netherlands), Pieter KRUIT
08:00 - 18:15 #5788 - IM03-250 Spin-multislice simulation of an electron inside the objective lens of a TEM.
IM03-250 Spin-multislice simulation of an electron inside the objective lens of a TEM.

Spin filtering of an unpolarized beam in a TEM is a fascinating field of research. Bohr conjectured that it is impossible to spin filter an electron beam or, using Bohr words, “to observe the spin of the electron, separated fully from its orbital momentum, by means of experiments based on the concept of classical particle trajectories”[1].
However, the principle seems to be violated by theoretical calculations [2,3]. One of the most convincing proposals for free electron polarization is a multipolar Wien filter. But the fields involved are typically very large [2] while multipolar Wien filters in microscopy are still rare. The device, together with the diffractive elements, is called as “q-filter” where q hints at the topologic charge of the field.
The objective lens of the microscope provides a very large field with the potentiality of introducing a spin-orbit coupling, we performed spin-multislice simulations [4], where a Bessel beam was propagated through the objective lens (modeled as a Glaser field) in order to quantify the degree of spin polarization.
We will discuss in particular that the spin-orbit conversion in the pre- and post-field can be understood in terms of the q-filter.
Fig 1 a shows on the left a scheme of the objective lens and of the electron wavefunction (blue) passing through it. A schematic “Bohmian” trajectory is indicated by a curve.  The image also features arrows indicating the classical spin orientation along the curve for an initial state with spin |↑> along the optic axis.
The fig 1b indicates the multislice calculated evolution of the wavefunction. While the expectation value of the spin operator S  has components < Sx >=< Sy > =0 we can track the expectation of the x,y vector P=(S.r,S.t) (with r being the in plane position versor and t its orthogonal in plane versor). The result is shown in fig 2. P represents a sort of local in plane projection of the spin operator. To a good degree of approximation here |P| is equal to the rate of conversion from |↑> to |↓>.

The results indicates a net, typically weak , increase of P as an effect of the objective lens .
The overall final wavefunction is described in Fig 3 as a non-separable  spin-orbital angular momentum state.
The multislice results are in quantitative agreement with ray tracing calculations, confirming the reliability of both methods in this case. However, the multislice approach enables us to use less classical states like Laguerre Gauss beams, to explore possible advantages and more quantum physical effects.
Acknowledgements: The financial support by the Austrian Science Fund (I543-N20) and by the European research council, project ERC-StG-306447 is gratefully acknowledged.

.
[1] Darrigol O 1984 Historical studies in the physical sciences 15 (1984) 39
[2] E. Karimi,  L. Marrucci et al. Physical Review Letters 108 (2012) 044801
[3] H. Batelaan et al. Physical Review Letters 79 (1997) 4517
[4] V. Grillo , L. Marrucci et al. New Journal Physics 15 (2013) 093026


Vincenzo GRILLO (Modena, Italy), Thomas SCHACHINGER, Ebrahim KARIMI, Peter SCHATTSCHNEIDER
08:00 - 18:15 #5830 - IM03-252 Development of low noise quantitative EBAC imaging in FEG SEM.
IM03-252 Development of low noise quantitative EBAC imaging in FEG SEM.

Electron Beam Absorbed Current (EBAC) is a specimen current imaging technique that has been established in the earliest stages of Scanning Electron Microscopy (SEM), but which has been somewhat overlooked for last few decades [1], with the exception of nanoprobing for failure analysis [2]. Whilst the technique has been noted for its uncomplicated electron collection geometry, it has not found use in routine microscopy because of the slow and noisy electronics of the time. This work revisits the design and application of EBAC to general SEM and demonstrates that modern low-noise and high-speed amplification entirely overcome the traditional limitation of the technique, whilst adding full quantification and unprecedented imaging flexibility.

Traditional limitations of EBAC amplification were linked to the very low signal intensity, as only a fraction of the primary electron current was passed outside the SEM chamber. In contrast with Everhart-Thornley or solid-state detectors, no amplification could be provided inside the chamber as traditional amplifiers could not be placed in situ. This is no longer the case with modern electronics, and a miniature pre-amplifier was designed and placed on the sample stage. A further amplifier was placed ex situ to control the gain further, and the signal was recorded with full quantification alongside the conventional Secondary Electron (SE) and In-Lens (IL) signals. A Tungsten wire test sample was loaded on a custom electrical holder for EBAC, and is used here to compare SE, IL and EBAC signals recorded simultaneously on a PE upgraded ZEISS DSM982 FEG SEM. EBAC electronics have sufficient bandwith for live monitoring, alignment and focus, and was used as the main signal throughout this work.

As illustrated in Figure 1, it is first found that resolution of the EBAC signal far exceeds that of SE at all accelerating voltages and working distances. Since at all points on the sample the sum of all electron currents must be constant, it follows that the higher resolution of IL signal must be present in EBAC signal. Indeed, the IL images (not shown in this abstract) and EBIC images are highly correlated. As reported by [1], it is found that EBAC imaging is largely independent from working distance, whilst the IL signal is limited to very short working distances in order to maintain good solid angle collection efficiency (not shown in this abstract).

Further differences arise from the direct nature of absorbed signal, which is not convoluted with information arising from the trajectories of emitted electrons as they leave the surface. This is observable in Figure 1 and explained more clearly with low magnification data of the W wire (Figure 2). SE signal presents very pronounced shadowing as the low energy electrons are attracted towards the detector, and thus the opposing side of the cylindrical wire appears darker. Such effects are less visible in the IL signal because of the collection geometry, whereas the EBAC signal is completely free of such shadowing.

Contrast of sub-micron grains is readily found in both IL and EBAC signals, albeit of different relative intensities (not shown in this abstract) and is attributed to orientation contrast (OC). As illustrated in Figures 1 and 3, grains with strong OC are presents in all images, but with the highest noise in SE and lowest noise in EBAC. The uncomplicated geometry and calibrated property of EBAC signal, presents the opportunity to quantify values of OC independent from imaging conditions (Figure 3). Whilst physical origin of OC in both IL and EBAC signals is thought to be the same, it is proposed that differences in relative intensities arise from the different collection geometries.

Further new observations are enabled by quantitative imaging, including the discovery that the EBAC signal can change polarity. It is found that for a range of conditions, the total sum of emitted electrons can exceed the sum of absorbed electrons. Examples include protruding nanoscale features (Fig. 1), grains of strong orientation contrast (Fig. 3), or locations of high electron beam incidence angle, as observed at the edges of the W wire (Fig. 2).

[1] Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R., Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, 2003, Springer US.

[2] K. Dickson, G. Lange, K. Erington and J. Ybarra, Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14–18, 2010, Addison, Texas, USA.


Grigore MOLDOVAN (Halle (Saale), Germany), Uwe GRAUEL, Wolfgang JOACHIMI
08:00 - 18:15 #5854 - IM03-254 Crystallite orientation maps of starch granules from polarized Raman spectroscopy and synchrotron X-ray microdiffraction data.
IM03-254 Crystallite orientation maps of starch granules from polarized Raman spectroscopy and synchrotron X-ray microdiffraction data.

Polarized Raman spectroscopy (PRS) and synchrotron X-ray microdiffraction were used to determine the local orientation of crystalline regions in giant starch granules extracted from bulbs of tulip and the orchid Phajus grandifolius. Starch granules can be described as distorted spherulites composed of concentric growth rings in which molecules are radially oriented.

As previously validated on starch specimens [Galvis et al. J. Cereal Sci. 62 (2015), 73], the molecular orientation in the native granules was determined by measuring the anisotropic Raman response of certain chemical bonds at different polarization directions of the incident laser radiation. Wellner et al. [Starch-Stärke 63 (2011), 128] had shown that the response of the Raman band at 865 cm-1 assigned to the stretching of the glycosidic bonds C–O–C and ring breathing of glucose units exhibited a high spatial variation that could not only be explained by variations in the degree of crystallinity but also by the local molecular orientation in ordered structures. First, we have evaluated the response of the band at 865 cm-1 using model acicular "A-type" single crystals prepared from a fraction of short-chain amylose biosynthesized in vitro [Montesanti et al., Biomacromolecules 11 (2010), 3049]. The A-amylose crystals oriented "in plane" showed a maximal intensity when the polarization of the laser was along the chain axis of the crystal, i.e., parallel to the axis of the amylose double helices, and minimal when perpendicular. In addition, the Raman band at 1343 cm-1, assigned to C–O–H bending, showed only a small variation and was used as "internal standard" to calculate the intensity ratio of bands 865 / 1343. In parallel, hydrated single starch granules have been probed with 3-5 µm synchrotron X-ray beams and a raster step of 5 µm, at the ID13 microfocus beamline of ESRF. The collected fiber microdiffraction patterns were analyzed to deduce the local average orientation of the crystallites and produce maps over the whole granules.

PRS orientation maps of tulip (Figure 1a) and P. grandifolius starch granules revealed regions with an isotropic response close to the eccentred hilum (origin of the growth) and others with a high anisotropic response at the distal end (Figure 1b) [Galvis et al., in preparation]. The orientation maps of P. grandifolius granules were compared to those previously determined from synchrotron X-ray microdiffraction data [Chanzy et al., J. Struct. Biol. 154 (2006), 100] and those from tulip granules, to the data newly collected at ESRF (Figure 2a). Again, the diffraction patterns showed that the crystallite orientation was very high far from the hilum, in regions where the curvature of the growth rings is low (Figure 2b). Around the hilum, the crystallinity remained high and therefore, the lower orientation was likely due to the high curvature of the growth rings and the resulting 3D distribution of crystallites within the probed volume. The spatial resolution of the orientation maps is limited by the size/volume of the region over which the signal is collected and thus averaged, which, in particular, results in a lack of information along the incident laser (for PRS) or X-ray beam (for microdiffraction). However, both techniques are complementary and provide unique pictures of the local molecular organization in single objects.

Acknowledgement: We thank Laboratoire d'Ingénierie des Systèmes Biologiques des Procédés (Toulouse, France, P.-C. Escalier, G. Véronèse) where the amylose biosynthesized in vitro was prepared, the NanoBio-ICMG Electron Microscopy Platform (Grenoble, France) and ESRF (Grenoble, France).


Leonardo GALVIS, Carlo BERTINETTO, Britta WEINHAUSEN, Nicole MONTESANTI, Christine LANCELON-PIN, Tapani VUORINEN, Manfred BURGHAMMER, Jean-Luc PUTAUX (Grenoble Cedex 9)
08:00 - 18:15 #5862 - IM03-256 Development of new stage system for modern electron microscopes.
IM03-256 Development of new stage system for modern electron microscopes.

Analytical systems for high spatial resolution, such as transmission electron microscopes (TEM) and scanning transmission electron microscopes (STEM), are getting popular, since a target sample for modern science and industry is getting smaller. Thus, higher resolution and efficiency are required for modern microscope systems, along with further improved ease of use since a lot of functions are installed to a microscope and it makes its operations complicated. JEM-F200 has been developed as an easy-to-use electron microscope for high resolution imaging and analysis for the requirements of those mentioned above. Among the components of the microscope, specimen system is one of the most important hardware to be developed because the all users must use the system frequently, and all users need to be careful for treating a sample.  In this paper, we explain the features of a newly developed specimen system, which has three new features.

The first element of the new stage system is a redesigned specimen drive mechanism, that is called as "Pico Stage Drive". The specimen stage drive is fast and highly-precise. The new ultra-fast specimen drive enables the stage to move in approximately 7 seconds over a wide area of 2 mm diameter (highest speed: 0.3 mm / s). And the new ultrahigh-precision drive allows a specimen (on the stage) to move in steps of sub-nanometers (0.2 nm / step). The specimen stage can be driven with piezo device (0.05 nm / step) simultaneously.

The second element of the new stage system is an auto insertion/extraction mechanism for specimen holder, which is called as “SPECPORTER”. Insertion or extraction of a specimen holder has been considered to be an operation where human error might occur, especially for novice users. To avoid the error, a new automated loading/extracting system for specimen holders, which needs no human operations, has been developed. With the SPECPORTER, the operator sets a specimen holder at a designated position and activates the SPECPORTER by simply clicking a switch, and then the holder is automatically inserted or extracted safely as shown in Figure 1. The operations of evacuation and opening a valve for sample holder are programmed and installed. The sample maintains its attitude to be horizontal during the procedure. If the SPECPORTER were applied to cooling holders, no liq. N2 spilt is realized in the procedure of sample insertion. The system maintains the feature of JEOL double O-ring holder, and therefore users can insert a old sample  holder compatibly by manual loading and unloading. Furthermore, a conventionally-used specimen holder can be modified so that the holder is inserted or extracted automatically using the SPECPORTR.

The third element is a new clam shell, which covers a goniometer. The clam shell withstands pressure variation of the installation room to protect a sample. However, a few electrical feed through was prepared in old system. In the new system, more feed through are prepared for a variety of specimen holder (e.g. heating holder, see Figure 2).

In conclusion, the new specimen system provides the easy, safe and smooth operation of samples, which gives a high throughput to users. Especially, the ultra fine specimen drive system enables accurate positioning of the sample with large travel (2 mm), which is requested by all kinds of target functions such as high resolution imaging and high resolution analysis.


Kazuya YAMAZAKI (Akishima, Japan), Shuichi YUASA, Yuuta IKEDA, Masaaki KOBAYASHI, Kazunori SOMEHARA
08:00 - 18:15 #5865 - IM03-258 Benefits of angular and energy separation of slow signal electrons in SEM.
IM03-258 Benefits of angular and energy separation of slow signal electrons in SEM.

Recently developed scanning electron microscopes (SEM) are equipped by sophisticated detection systems, which offer very effective energy and angular separation of the signal electrons and extraordinary detection flexibility. The signal electrons can be collected by various types of detectors and character of the detected signal is possible to affect by many parameters (e. g. optical configuration of the column, detection geometry, presence of the specimen bias, etc.). Understanding of the detected signal origin and correct interpretation of the micrographs become very difficult, which hampers utilizing of full potential of modern SEMs.

Experiments have been performed with a novel Trinity detection system (Scios, FEI Comp.) consisting of three in-lens detectors:  the T1 and the T2 detectors located inside the final lens and the T3 detector situated inside the column just below the aperture strip (Fig. 1). The instrument is also equipped by a standard E-T detector (ETD) situated in conventional position. There is a possibility of simultaneous detection of all 4 images (i.e. T1, T2, T3 and ETD) and different type of information about the specimen can be achieved at the same time.

Oxide inclusions embedded in a conventional steel was used as an experimental material, which secures presence of the topographic, material and crystal orientation contrast in the micrographs. Moreover, the inclusions become charged by the electron beam irradiation and the influence of charging on the micrographs collected by the Trinity detectors can be observed.

There are many possibilities how to affect the detected signal origin. Fig. 2 demonstrates effect of the specimen bias on detected signal. The SEs are shared by the T3 and T2 detectors and are not detected by the ETD when the specimen bias of -4kV is applied. Strong collimation of the signal electrons towards the optical axis is evident. The high-angle BSEs are collimated towards the optical axis and the T1 detector shows topographical contrast.

Significant effect of a working distance (WD) on the signal collected by the Trinity detectors and the ETD is shown in Fig. 3. For a short WD, the T3 detector collects mainly the slow secondary electrons (SEs) and positive charging of the spinel inclusions is clearly visible. For a long WD, the electrons originally detected by the T3 detector are shifted towards the T2. The T1 detector collects the backscattered electrons (BSEs) and the channeling and topographical contrast are superimposed on the material (“Z”) contrast at short WD. Inversely, the material contrast intensifies with increasing WD. Obviously, increasing WD leads to less effective collimation of the slow signal electrons into the final lens (by the A-tube electrostatic field) and the ETD detection efficiency was improved.

Insight into an extraordinary detection flexibility of the Trinity system enables us more effective characterization of material microstructure. Accurate knowledge about the signal received at each detector and possibility of its modification can be successfully used for tuning of desired contrast or suppression of undesirable information.

The presentation is based on results obtained from pioneering project commissioned by the New Energy and industrial Technology Development Organization (NEDO).


Sarka MIKMEKOVA (Kawasaki, Japan), Haruo NAKAMICHI, Masayasu NAGOSHI
08:00 - 18:15 #5874 - IM03-260 Development of a new electrostatic Cs-corrector consisted of annular and circular electrodes.
IM03-260 Development of a new electrostatic Cs-corrector consisted of annular and circular electrodes.

For improving spatial resolution in electron microscopy, as is well known, the spherical aberration (Cs) has to be compensated. Currently, the Cs-correction devices consisted of multi-pole lenses have successfully realized sub-angstrom resolution in the scanning / transmission electron microscopes (S/TEMs) [1-3]. These correctors, however, require complex control of multiple optical components with high accuracy and stability. In addition, the microscope columns should be reconfigurated to insert additionally rather large corrector components, resulting in huge cost. In order to solve these problems, one of the coauthor Ikuta had newly proposed the very simple and compact Cs-corrector with axially-symmetric electrostatic-filed formed between annular and circular electrodes [4], as schematically shown in Fig. 1(a). We called it “ACE corrector”, meaning the Cs-corrector using Annular and Circular Electrodes. In the present paper, we report preliminary results of the ACE corrector installed in 200kV-STEM apparatus.

It can be simply explained how the ACE corrector compensates the Cs, as follows. In the electrostatic field formed around the circular electrode, the electrons going through the field are a little focused. In contrast, around the annular electrode, the electron trajectories are spread. They indicate that the field between the electrodes provides the compound lens effect of the convex and concave lenses arising from the circular and annular electrodes, respectively. Totally, as schematically shown in Fig. 1(b), the ACE corrector has the negative Cs value, while the effective area is restricted to be in the off-axis by the annular slit.

Fig. 2(a) is a cross-sectional illustration of the electrodes with typical sizes. The circular electrode can be easily obtained by the photolithography as well as the conventional apertures for the electron microscopes. Since the annular electrodes contain complicated structures, we have employed the focused ion beam (FIB) technique for their fabrication. Fig. 2(b) shows a SEM image of the annular slit corresponding to that in Fig. 2(a). This structure was processed at the center of the base tantalum plate having the size of 3mm in diameter and 10m in thickness. Two electrodes were assembled in the small device, as shown in Fig. 2(c), by sandwiching the insulator film between them. This device was installed in the STEM (Hitachi HD-2300S; 200kV) by attaching to the tip of the conventional aperture holder instrument, which were connected to the voltage supply. The constant negative voltage was applied to the circular electrode, and the annular electrode was grounded, via two lines attached to the device as in Fig. 2(c).

Figs. 3(a) show annular dark-field (ADF) images of CeO2 particles taken at different Cs conditions, i.e. the voltage applied to the ACE corrector varied from 0 V to 15 V. They indicate that the image obtained at 10 V show most clear contrast, which is consistent with the appropriate value predicted in advance by the simulation. In high-resolution condition, as shown in Figs. 3(b), a Cs corrected image taken at 10V can clearly exhibit atomic columns. These results demonstrate that our developed electrostatic device can effectively correct the intrinsic spherical-aberration of the objective lens.

References
[1] H. Rose, Optik 85 (1990) 19
[2] M. Haider, et al., Optik 99 (1995) 167    
[3] O. L. Krivanek, et al., Inst. Phys. Conf., 153 (1997) 35
[4] T. Kawasaki, et al., Proc. ALC, 27p-P-58, (2015)


Tadahiro KAWASAKI (Nagoya, Japan), Takafumi ISHIDA, Masahiro TOMITA, Tetsuji KODAMA, Takaomi MATSUTANI, Takashi IKUTA
08:00 - 18:15 #5875 - IM03-262 Development of New Generation Cryo TEM.
IM03-262 Development of New Generation Cryo TEM.

Cryo transmission electron microscopy (TEM) provides structural information of a specimen close to its natural state without any disturbance, due to the specimen preparation process, which exclude chemical reactions and physical stimulations. Recently, cryo TEM produces very exciting results of structural biology in combination with single particle analysis and electron tomography, since application field of the method expand to non crystalline samples or huge molecules.

We developed a new generation cryo TEM, which achieves high throughput and high usability. This microscope equips 200 kV field emission gun (FEG). Users can choose it from a Schottky-type (TFEG) or a cold FEG (CFEG). Since the energy spread of the emitted electrons from the CFEG is about 50% of TFEG and the size of the virtual source is less than 10 nm, the electron beam has a high coherences. With such beam, cryo TEM image has high contrast due to its high spatial coherence and is less affected by chromatic aberration due to its high temporal coherence. In low dose imaging, where the image resolution is mainly determined with dose density for the image. In the low dose density, S/N of image mostly determined by a statistical noise of electrons, since dose density in cryo TEM is typically several tens of electrons for angstrome square. Namely, the resolution is determined with the competition between the statiscal noise and image contrast. It means CFEG has posibility to have higher resolution for cryo TEM works.

Since this microscope also has dedicated cryo stage, cryo TEM observation can be performed at low temperature < 100 K  and with low grow ratio of ice contamination. In addition, this cryo stage is compatible for multi-specimen auto-loader, so users can exchange specimens automatically. It also has some automation functions, such as liquid nitrogen auto-refill system and auto acquisition software (JEOL Automated Data Acquisition System: JADAS). These automation functions will help users to perform high throughput works. On another front, the electron gun chamber and the TEM column are evacuated with sputter ion pump and turbo-molecular pump, because of this, a sample is kept in oil-free environment.

In addition, this microscope is compatible with omega-type energy filter and Zernike or hole-free phase plate. The cryo specimens exhibit low contrast in TEM images even using large defocus phase contrast imaging. The Cryo TEM is more advantageous when it is combined with these techniques of contrast enhancement.


Naoki HOSOGI (Tokyo, Japan), Takeshi KANEKO, Isamu ISHIKAWA, Syuuiti YUASA, Kimitaka HIYAMA, Naoki FUJIMOTO, Izuru CHIYO, Akihito KAMOSHITA, Yoshihiro OHKURA
08:00 - 18:15 #5942 - IM03-264 Precession-assisted Quasi-Parallel Illumination STEM on three condenser lenses TEMs.
IM03-264 Precession-assisted Quasi-Parallel Illumination STEM on three condenser lenses TEMs.

The analytical mapping applications for which the STEM illumination mode in TEM columns is mostly used imply a high convergence angle of the electron beam focused onto a nanometric probe on the specimen, so that high electron doses are obtained. This design then enables high lateral resolution for energy dispersive or electron energy loss spectrum maps [1]. In view of the recent fast growth of quantitative electron diffraction work [2] the natural extension of STEM illumination mode in “TEM/STEM columns” would be towards diffractive recording for either low dose work or electron diffraction tomography because of the stable condition of the projector system, which stays solely in diffraction mode. The main problem for these applications is that even when using small condenser apertures of 10 μm, the obtained diffraction patterns consist of large discs of 3-4 mrad spread instead of small spots of only 0.5-1 mrad, the latter values being required for structure determination from crystals with large unit cells, such as zeolites. Expanding the approach used in multifunctional dedicated “STEM columns” [3], we have developed a stable method for working under Precessed Quasi-Parallel illumination condition in TEM/STEM columns, using their internal scanning unit. The pre-requisites – usually found in modern microscopes - are that the column should be digitally controllable, equipped with a 3-lens condenser system and a condenser aperture of 10 μm, and have at least a set of deflecting coils past the objective lens, as well as the usual double set above the specimen plane. The key factor for enabling the Quasi-Parallel illumination lays in decreasing the excitation of precisely the condenser lens which controls beam convergence, the second one in the 3 lens condenser system. Naturally, a refocusing of the beam is needed and an accurate curve of beam spread versus convergence angle must be produced, but, once calibrated, the resulting desired configurations are conveniently stored in computer memory for later recall and use. In this work, we have furthermore added to such Quasi-Parallel Illumination STEM mode, the precession of the beam at 100 Hz, in order to obtain quasi-kinematical diffraction patterns. The challenge has been to adjust the Precessed Quasi-Parallel STEM HAADF image [4] [5] and a specific alignment method has proved to be specially suited, at least up to 0.6 degrees, providing almost non-distorted scanned images (see images bellow, which include Precessed Diffracion Patterns with and without the de-scanning below the sample, as well as Quasi-Parallell STEM HAADF image with and without precession).

Using this electron microscope configuration, we are able to obtain images of organic materials without an excessive degradation compared to the static NBD-TEM mode of the microscope. Moreover, the Precession-assisted Quasi-Parallel illumination STEM mode is suitable for electron diffraction tomography of both inorganic and organic structures, since sample drift and eucentricity at each tilting step may be controlled without changing the selected operative values in the projector system, usually corresponding to 12 cm for a 200KV high voltage. It also reduces the total time to obtain the whole data for the structure determination. Finally, the use of a precessed beam avoids the main dynamical effects on the diffraction patterns being able to solve structures with kinematical approximations.

Acknowledgements:

We acknowledge the financial support from NanoMEGAS. We also acknowledge the TEM facilities at the Scientific and Technological Center of the University of Barcelona (CCiT-UB).

References:

[1] - A. V. Crewe et al., (1969). Rev. Sci. Inst. 40 (2), 241-246.

[2] - L. Palatinus et al., (2013). Acta cryst. A69, 171-188.

[3] - H. Inada et al., (2009). Journal of Electron Microscopy 58(3), 111-122.

[4] - U. Kolb et al., (2007). Ultramicroscopy, 107, 507-513.

[5] - E. Mugnaioli et al., (2009). Ultramicroscopy, 109, 758-765.


Sergi PLANA (Barcelona, Spain), Joaquim PORTILLO, Sònia ESTRADÉ, Joan MENDOZA, Francesca PEIRÓ
08:00 - 18:15 #5973 - IM03-266 Optimisation of TEM preparation in metallic materials using low voltage ions.
IM03-266 Optimisation of TEM preparation in metallic materials using low voltage ions.

TEM samples of metallic materials can be prepared by mainly two ways: Electrothinning and ion thinning either by ion milling systems or Focused Ion Beam (FIB). In both cases, very thin lamellae can be obtained but residual artefacts are always present on their surfaces. Depending on which information is needed, those artefacts can limit and even prevent us from observing the samples properly. In the general case, electrothinning induces a residual oxide layer, mostly amorphous, that can evolve during TEM observations (Fig.1). On the other side, ions milling and FIB induce amorphous layers, irradiation defects and ions implantations although new FIB systems give the possibility to clean the specimens at low kV.

In this study, we show that ion polishing systems with low acceleration voltage can greatly improve the quality of electrothinned and FIB lamellae. Various cleaning conditions were tested using Precise Ion Polisher (PIPS I from GATAN) and with the new Precise Ion Polisher (PIPS II GATAN2012). Compared to PIPS I, PIPS II provides a better control of the ion beam at an acceleration voltage down to 100V. The sputtering kinetic was measured on various alloys (316L, Ni based alloy 600, oxidized and quenched Zr alloy). To do so, thickness maps were acquired with a FEI TECNAI OSIRIS equipped with an energy filtered imaging system (GIF Quantum from GATAN). Even though macroscopic dusts can be removed after Ar+ cleaning at 500V, thinning and decrease of amorphous layer is only slightly effective in PIPS I. To get a significant thinning rate in PIPS I, an accelerating voltage higher than 1kV has to be used but evidences of irradiation defects were seen on 316L. PIPS II experiments were conducted on various alloys with various ion thinning conditions, on both electrothinned and FIB lamellae. The kinetic rates measured are plotted on Fig.2 showing an effective thinning of lamellae even at 100V. When comparing the lamellae as-electrothinned and as-cut at 30kV by FIB to PIPS II cleaned lamella, a clear decrease of amorphous layer is observed and the quality of the lamellae is greatly improved. To be sure that no irradiation defects are induced by such thinning, we studied PIPS II cleaning on an Au+ pre-implanted 316L. Cross sectioned lamellae were prepared at 30kV in a Helios Nanolab Dual Beam from FEI. The effect of low voltage cleaning on  the lamellae  is showed on Fig.3. No irradiation defects were seen in non Au+ implanted area. However, a few nanometres thick layer of amorphous is still present on both surfaces. These results show that the thickness and the quality of metallic TEM samples (either prepared by electrothinning or by FIB) can be easily improved by using a complementary thinning/cleaning with low voltage Ar+ ions in PIPS II.

Experiments on 316L received a financial support from the French National Research Agency through the project CoIrrHeSim ANR-11-BS09-006.


Laurent LEGRAS (Moret sur loing), Marie Laure LESCOAT, Stephanie JUBLOT-LECLERC, Aurélie GENTILS
08:00 - 18:15 #6006 - IM03-268 Ultrafast transmission electron microscopy reveals electron dynamics and trajectories in a thermionic gun setup.
IM03-268 Ultrafast transmission electron microscopy reveals electron dynamics and trajectories in a thermionic gun setup.

Many efforts in the past decade have been made to improve the temporal resolution of in-situ TEM in order to reveal the dynamics of processes at the nanoscale. However, most processes occur at time scales in the micro- to femtosecond domain which is beyond the acquisition frequency of the TEM cameras (down to few milliseconds). Thus the salient details of sample dynamics such as defect formation, phase transformations, nucleation phenomena etc. are often inaccessible.

For time-resolved studies, a much higher temporal resolution is therefore required. This can be achieved by using short electron pulses in a pump-probe approach. Ultrafast TEM (UTEM) consists of a TEM combined with a pulsed laser (figure 1). A photo cathode in the electron gun is illuminated by a fs-laser to produce a photoelectron pulse with a duration of 2-10 ps. After laser excitation of the object (pump pulse), the photoelectron pulses serve as probes with a variable time delay after the excitation. Repeating this process at different pump-probe delays allows time-resolved studies.

In contrast to conventional TEM, the electron-electron interaction in one pulse is not negligible in UTEM and has to be studied in detail. The energy width (ΔE), temporal length (Δt) and different arrival times (t0) of the electron pulses on the specimen depend on many effects related to electron-electron interactions such as space charge limited current, Boersch effect, emission angles and trajectories, or filtering effects due to chromatic aberration of lenses. It is crucial to understand these as a function of the relevant experimental parameters (position and shape of the photocathode, laser power, Wehnelt bias) in order to optimize spatial and temporal resolution while preserving reasonable acquisition times.

Our experimental setup consists of a JEOL 2100 with a thermionic gun and Wehnelt electrode, combined with a femtosecond fiber laser. Measurements are based on the PINEM effect (photon-induced near-field electron microscopy), which occurs when pump and probe pulses are synchronized at the sample. It results in a change of the electron energy distribution due to inelastic electron scattering by the photonic near field around a sample that can be observed by EELS.

The ability of the pump-probe setup to precisely measure the arrival time of the electrons allows a deeper understanding of the emission pattern. A conical tantalum cathode with flattened tip positioned close to the opening of the Wehnelt shows two electron populations, i.e., an intense big halo and a central spot (figure 2). The arrival time of electrons from the outer halo is shifted with respect to the central spot; the time difference changes with the applied Wehnelt bias. These measurements enable us to decipher the emission areas and electron trajectories. The halo is attributed to shank emission from the side wall of the cone where electrons leave at larger angles. The central spot are electrons emitted from the flattened tip. Larger Wehnelt gaps cut shank emission so that only electrons from the tip reach the specimen. Here the emission resembles the one from a Ta disc where all electrons are emitted from the flat surface at any Wehnelt gap.

Furthermore, PINEM scans were measured at different pump-probe delays, giving the temporal evolution of the electron pulse. Repeating these scans at different experimental settings (UV intensity, Wehnelt bias) allows to extract Δt and ΔE (figure 3). For instance, an increasing UV power allows to shorten the acquisition time but increases space charge and Boersch effect. At high Wehnelt bias the energy width (ΔE) is narrow, allowing good spatial and energy but lower temporal resolution. A low bias gives the opposite: good temporal but lower energy resolution.

Such understanding of the electron dynamics allows us to define optimal settings for time-resolved experiments, which are always a compromise between temporal, spatial, and energy resolution as well as acquisition times. The detailed beam characteristics will be presented.


Kerstin BÜCKER (Strasbourg), Matthieu PICHER, Olivier CRÉGUT, Thomas LAGRANGE, Bryan REED, Sang Tae PARK, Dan MASIEL, Florian BANHART
08:00 - 18:15 #6009 - IM03-270 Manufacturing and application of a 2 µm dark field aperture in TEM.
IM03-270 Manufacturing and application of a 2 µm dark field aperture in TEM.

For an entire TEM characterization of many materials, it is necessary to achieve selected area electron diffraction (SAED) patterns of smallest regions with assigning the reflexions to their origins in the real image. In a previous work we showed that we were able to successfully reduce the field of view by a customized SAED aperture to a 15 nm range [1]. Though it gives us very local information about the samples structure, in daily work it is not always satisfying, since the real image is as important to understand the correlation between certain Bragg spots and the real structure, e.g. given by a series of dark field images. Especially for closely neighboured reflexions, commercial objective apertures are too large and do not allow the separated selection of these spots. Since our conventional TECNAI is equipped with the standard aperture-stripe, we are limited to a smallest size of 10 µm (12 µm in reality) which delivers a field of view of ca. 7.5 mrad inside the back focal plane. The smallest commercially available aperture has a diameter of 5 µm.

Figure 1a  displays a section of a polycrystalline fcc diffraction pattern. The marked large circle represents the standard 10 µm objective aperture, while the smaller one represents our custom made aperture with a diameter of 2 µm or 1.5 mrad inside the back focal plane. This example shows, with standard apertures it is impossible to select the (311) reflexions without overlap of their neighboured (220) or (222).

                Therefore, we reworked the present PtIr aperture-stripe by focused ion beam (FIB) in two steps [2]. At first an existing hole of the stripe - there are 2 rows of holes, one provides smaller and the other one larger diameters, which are seldom used - was closed by ion beam-induced Pt-deposition. As a second step, a centred opening was sputtered into that layer by using of circular masks up to 2-µm in diameter. To minimize a conical shape of the opening, at low ion beam current (280 pA) with a high aspect ratio is used and the hole is successively milled from both sides. If the Pt-deposition is too thin, there is a high risk that scattered electrons in the TEM will not be entirely blocked by the new aperture and create artefacts and distortions in the images. Therefore, it has a thickness of around 6.5 µm. First investigations with TEM proved that the deposited layer is not transparent for 200 kV electrons anymore and thermally stable as well.

                Figure 1b-d shows an application of the new objective aperture on a multi-twinned system of polycrystalline diamonds. Although the twinned areas are in the range of 5-10 nm it becomes possible to correlate the chosen diffraction spots with their origins in the real image. The adjustment of the new objective aperture has to be done very carefully, it can easily outshine the observation screen or the CCD camera, so one can easily lose the designated position, but the selection of certain diffraction spots requires a very accurate positioning. Other than at larger apertures where slight drifts are not critical because of the visibility of the selected area and therefore easier readjustments, slightest drifts must be avoided.

      In conclusion, the new 2-µm objective aperture can be very helpful for the understanding and structural characterization of samples according their crystallinity, their growth behaviour or even defect studies.

 

  1. S. Selve, D. Berger, Ch. Frey, L. Lachmann: Manufacturing and application of individually adapted SAD apertures for a conventional Tecnai G²20 TEM. In: Conference Proceedings MC2011 Kiel
  2. We kindly acknowledge EFRE founding of the project “Nano Werkbank” including a FEI Helios 600.
  3. We kindly acknowledge the Exzellenzcluster “UniCat” for the financial support of the TEM.

Sören SELVE (Berlin, Germany), Dirk BERGER
08:00 - 18:15 #6024 - IM03-272 An in-situ Low Energy Argon Ion Source for Local Surface Modification.
IM03-272 An in-situ Low Energy Argon Ion Source for Local Surface Modification.

A new in-situ low energy ion source for SEM and DualBeam has been designed. The static beam of low energy gaseous ions such as Ar+, O+ or Xe+ can be used for a local modification of the sample surface. Typical energies are in the range 5 - 500 V, covering the interaction types from chemical reaction to reactive ion etching and to ion milling, for energies above the milling threshold. The source is based on the following principle: electrons from the SEM’s electron beam partially convert an atomic or molecular gas flow into a beam of ions directed towards a biased sample. A schematic set up is shown in figure 1. A small nozzle delivers the gas and the electron beam enters this nozzle through a slotted hole. The beam is scanned in this slotted hole, penetrates the gas flow and generates thermal ions both by direct ionization and by ionization from beam interactions with the wall of the nozzle. The ions are pulled out of the nozzle by the protruding fields from the biased sample which is located at a short distance from the nozzle: the ions are accelerated in this electrostatic fieldand directed towards the sample. The slotted entry hole is roughly located at half the inner nozzle diameter from the edge.

 

The source produces a static beam of ions with selectable energy. The direction and width of the beam depend on the geometry and not on the applied bias voltage, because the electric fields define both the acceleration and the trajectories. With a typical SEM excitation condition of 2kV, 26nA and a nozzle to sample distance of 100 um, it is possible to generate a 100 eV Ar+ beam current of 5 nA and a full width half maximum (FWHM) of 8.2 um. This corresponds to a central average ion current density of 0.095 nA/um2, which is very similar to the current density at 500 V of a Ga+ beam produced by a regular FIB column. The FWHM is easily adjustable by changing the nozzle-to-sample distance, allowing for example a broader beam with a wider peak. The source is slightly focusing as shown in figure 2, so the beam diameter does not expend too rapidly with the sample to nozzle distance. In this way, the sample area that is affected by the low energy ions can be more or less defined.

 

Thanks to the low energy, the new source can be used for polishing the top surface of a sample such as the Ga doped layer after FIB operation (removal of Ga and reduction of damage layer thickness) or it can be used to clean a sample from residual hydrocarbons. The first application can be useful for improvement of the quality of a TEM lamella produced by FIB, or improvement of and EBSD surface prepared by FIB. An example of the interaction with the beam is shown in Figure 3, where a native oxide on Si has been removed in 6 seconds, using 200 V Ar+ ions.  Finally it should be noted that in case of using O2 gas, the source behavior (size, energy, field distribution) is the same, allowing cleaning of a sample chemically, below the milling threshold. Primary gas switching to other noble gases is straightforward, because the primary principle (ionization by electron impact) and ion trajectory formation and acceleration remain the same.  

 

 

 

 


Johannes MULDERS (Eindhoven, The Netherlands), Piet TROMPENAARS
08:00 - 18:15 #6026 - IM03-274 Pushing the limits of environmental scanning electron microscopy.
IM03-274 Pushing the limits of environmental scanning electron microscopy.

In environmental scanning electron microscopy (ESEM) electrical insulating, wet and biological samples can be investigated without additional sample preparation. The imaging gas inside the chamber suppresses charging and outgassing of the sample but it also decreases the signal to noise ratio (SNR) [1]. Especially applications in the kPa regime are limited by poor image quality (e.g. wetting experiments).

Recent publications on high pressure capabilities of state of the art microscopes have shown that they are working far away from physical limits and that there is plenty of room for improvements [2].

The key to high image quality at high pressures is to reduce scattering of the primary beam electrons inside the imaging gas as far as possible while maintaining ideal operation conditions for the SE-detector [3].

In the FEI Quanta 600 ESEM the gaseous environment in the sample chamber is separated by a differential pumping system and two pressure limiting apertures (PLA) from the high vacuum inside the electron column. Nevertheless, a lot of gas streams through the PLA upwards and a significant amount of scattering takes place even before the electron beam is entering the sample chamber [2].

Based on the insights of Monte Carlo and finite element simulations a new aperture holder was designed that significantly reduces this gas flow and therefore also the primary beam scattering. The PLAs are exchangeable and smaller diameters further increase the SNR at the expense of a smaller field of view.

In a conventional ESEM the secondary electron detector is a positively biased electrode which attracts and accelerates the secondary electrons. On their way to the detector the secondary electrons undergo collision ionization which amplifies the signal and generates positively biased gas ions. With increasing chamber pressure this SE signal amplification strongly decreases because the electron mean free path decreases and the SEs do not gain enough energy between collisions to ionize the imaging gas anymore.

By replacing the position and modifying the shape of the detector it can be optimized for high pressure applications. Nearby a needle detector with very small tip radius (R < 10 µm) the electric field is strong enough for SE amplification and by positioning the needle on the sample table it operates at ideal conditions regardless of pressure and working distance. The distance sample to PLA and sample to detector is no longer coupled. A by-product of this design is that the conventional position of the backscatter electron detector (BSE) at the end of the column is no longer blocked by the SE detector.

With this outstanding signal to noise ratio at high chamber pressures the limits of conventional ESEM technology can be crossed. Wetting experiments at low acceleration voltages and low dwell times are possible as well as imaging liquid samples without cooling (see figure 1,2). In figure 3 a BSE image of gold nanoparticle in oil at 10 kPa chamber pressure can be seen and the overall improvements are shown in figure 4.

1. Danilatos, G.D, Foundations of environmental scanning electron microscopy, Advances in Electronics and Electron Physics Vol. 71, 109-250, 1988

2. Danilatos, G.D., Rattenberger, J., Dracopoulos, V., Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM, Journal of Microscopy Vol. 242, 166-180, 2011

3. Fitzek H., Schroettner H., Wagner J., Hofer F., Rattenberger J., High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM, Journal of Microscopy, Vol. 262, 85-91, 2015


Johannes RATTENBERGER, Harald FITZEK (Graz, Austria), Hartmuth SCHROETTNER, Julian WAGNER, Ferdinand HOFER
08:00 - 18:15 #6065 - IM03-276 Exploration of non-radioactive alternative stains to uranyl acetate.
IM03-276 Exploration of non-radioactive alternative stains to uranyl acetate.

Uranyl acetate (UAc) has been generally used as a useful and stable staining reagent for ultrathin sections of biological materials in transmission electron microscopy. In Japan, however, the use and purchase of radioactive UAc is regulated by the government due to the safety problem. Therefore it is urgently necessary to find some non-isotopic and non-hazardous alternative electron stains. Taking into account the staining mechanism of UAc at the binding sites of biological tissues (Hayat, 2000), from among the heavy metals belonging to the lanthanoid group (non-radioactive) we selected 3 reagents such as hafnium chloride (HfCl4), samarium chloride (SmCl3) and acetic acid gadolinium (GdAc) as the candidate alternative electron stains.

In order to evaluate precise stainability for these reagents, samples were prepared as follows: the resin blocks which embedded rat liver and rat small intestine mucosal were cut with ultramicrotome and a diamond knife. Serial ultrathin sections were mounted on copper grids coated with 0.5% Neoprene W in toluene. The sections were stained with 4% aqueous UAc and then with Sato’s Pb. As to the candidate alternative electron stains, preparation processing was carried out in the same way. These stained serial sections were observed with a transmission electron microscope (TEM). For determination of relative TEM contrast ratios of organelles in the specimens, each of photo images from sections was given a numerical value of illumination intensity (black-to-white ratio) of average of 30 points for each target structure by using Photoshop software. The relative contrast ratio was expressed as density value of the target structure against a ratio of the value for the plain resin alone.   

TEM observation showed that neither stain generated harmful effects such as uneven staining, contamination and cell disruption. The relative TEM contrast ratio analysis was indicated that HfCl4 have a good staining effect for each biomembranes (nuclear membrane, cell membrane, organelle membrane), nucleolus, mitochondria, rough endoplasmic reticulum, glycogen and heterochromatin at the same level as UAc. Superior stainability of ribosome and mitochondria was obtained on SmCl3 staining. GdAc exhibited good stainability for cytoskeletal filament such as actin filament in addition to organelles, biomembranes and cell components. From these results, GdAc could be excellent substitute for UAc for thin section staining. Furthermore, HfCl4 was helpful for carbohydrate staining, and SmCl3 was for protein substance, which indicated that these stains have different staining mechanism. Moreover, we examined the stain permeability because we frequently analysis semi-thin section samples with ultra-high voltage electron microscope. As the results, good stainability were obtained in the sections treated with HfCl4 and GdAc, respectively. To provide a stain reagent properly depending on the purpose, further development would be required from now on. Additionally, to assess general versatility, we should test the stainability with various samples such as plant, fungi and also material samples.     

 

Hayat MA. 2000a. Positive staining. In: Hayat MA, editor. Principles and techniques of electron microscopy (biological applications), 4th ed. Cambridge, UK: Cambridge University Press. pp. 242–366.  

 

This study was supported by ‘Nanotechnology Platform Project (Nanotechnology Open Facilities in Osaka University)’ of Ministry of Education, Culture, Sports, Science and Technology, Japan [No.: A-15-OS-0009].        


Kanako INOUE (Ibaraki, Japan), Yoshinori MURANAKA, Pyoyun PARK, Hidehiro YASUDA
08:00 - 18:15 #6072 - IM03-278 Grain size determination in nanocrystalline materials using the TKD technique.
IM03-278 Grain size determination in nanocrystalline materials using the TKD technique.

Nanocrystalline (nc) materials, i.e. polycrystalline structures with grain sizes below 100 nm exhibit extraordinary properties strength. As a first assumption, such property derives from the short paradigm “smaller is stronger”. For grain sizes below 50 nm deformation mechanisms usually involve a quasi-stationary balance between dislocation slip and grain boundary mediated mechanisms. But there is still an ongoing debate, which one of these mechanisms governs the deformation behavior of nc metals [1,2].

Therefore determination of grain size, analysis of the local texture and characterization of grain boundaries in nanocrystalline materials are crucial. Different techniques have been tested, such as automated crystal orientation mapping in Transmission Electron Microscopes (TEM) [3]. But they suffer a lack of accuracy due to the nanocrystalline nature of tested specimen. Grain overlapping, for instance, trends to observe smaller grains. By x-ray diffraction, it is also possible to determine grain size, but measurements provide size of coherent domains only that we consider equal to grains.

In this framework, a new technique based of Transmission Kikuchi Diffraction (TKD) has been been recently introduced as a Scanning Electron Microscope (SEM) based method capable of giving orientation maps as the EBSD method but with a spatial resolution improved by up to one order of magnitude [4]. The technique requires a specimen thin enough to be transparent to the electron beam. In the current configuration, it uses hardware and software developed for the EBSD technique. We proposed a new configuration of the TKD where the detector is disposed horizontally on the axis of the microscope instead of being vertically positioned as in the conventional configuration (see Figure). This achieves better spatial resolution and angular resolution than the ones of the current TKD configuration [5]. Moreover, acquisition times are shorter than in the conventional technique, because the intensity of the forward scattered electrons is much higher than that of the large angle scattered electrons.

Firstly, technological challenges such as technique design will be presented. Secondly first results on electrodeposited nanocrystalline nickel will be discussed and they clearly show the full potentialities of this original characterization set-up.

References

[1] Z. Sun, S. Van Petegem, A Cervellino, K. Durst, W. Blum and H. Van Swygenhoven Dynamic recovery in nanocrystalline Ni, Acta Materialia, 91, (2015) p. 91-100

[2] T. Shanmugasundaram, E. Bouzy, A.H. Chokshi Strengthening and weakening by repeated dynamic impact in microcrystals and nanocrystals Materials Science and Engineering A, 639, (2015), p. 97-102.

[3] J. Lohmiller, M. Grewer, C. Braun, A. Kobler, C. Kübel, K. Schüler, V. Honkimäki, H. Hahn, O. Kraft, R. Birringer and P. Gruber, Untangling dislocation and grain boundary mediated plasticity in nanocrystalline nickel, Acta Materialia, 65 (2014) p.295-307

[4] R.R. Keller, R.H. Geiss, Transmission EBSD from 10 nm domains in a scanning electron microscope J. Microsc. 245 (2012) 245-251.

[5] J.J. Fundenberger, E. Bouzy, D. Goran, J. Guyon, H. Yuan, A. Morawiec. Orientation mapping by transmission-SEM with an on-axis detector Ultramicroscopy 161 (2016) 17-22


Antoine GUITTON (METZ CEDEX 1), Julien GUYON, Yudong ZHANG, Emmanuel BOUZY
08:00 - 18:15 #6079 - IM03-280 Transmission Mode in the SEM: Direct measurement of charge load up, secondary electron yield and backscattering coefficient in dependence on the energy of the incident electrons.
IM03-280 Transmission Mode in the SEM: Direct measurement of charge load up, secondary electron yield and backscattering coefficient in dependence on the energy of the incident electrons.

One essential precondition for a successful characterization of material by using electron microscopy is a sufficient electronic conductivity. Insulating or non sufficient conductive specimens becomes negatively or positively charged beside the balance points E1,2,3 where the same amount of backscattered and secondary electrons leave the sample than primary electrons remain in the sample [1]. This charging effects are additionally an important factor for microscopy accessories like phase, monochromator plates etc [2]. We have implemented a modified transmission unit [3,4] in a SEM/FIB NVISION 40 SEM, which allows to measure the adsorbed and transmitted current simultaneously with the BioLogic SP-200 Potentiostat and the specimen current monitor of the SEM respectively. Four different free supporting films were investigated: formvar (C5H8O2), leaf gold, amorphous carbon and amorphous PCS (Pd77.5Cu6.0Si16.5) alloy. Fig. 1 shows the studied formvar film at a) 3 kV and b) 20 kV without and with charging effects. The measurement of the transmitted current delivers the electron range and the application of the formula of Fitting [5], the film thickness of the investigated samples. Fig 1 c) show the normalized transmitted currents It/Ip (It= transmitted current, Ip =probe current) in dependence on the accelerating voltage for two objective aperture sizes of 30 and 120 µm. The electron range is given as the point where the first time transmitted electrons can be detected. The results show the expected independence of the electron range on the aperture size and therefore on the beam current, except for formvar where the differences are caused by charging effects. The obtained thicknesses for gold (157±16 nm) and , Formvar (209±21nm ) agree well with Monte Carlo simulations and those obtained for  amorphous carbon (56±6 nm ) and   amorphous PCS (20±2 nm ) with the expected film thicknesses of 50 nm and 20 nm respectively [2]. With the knowledge of sample thickness, scan speed and adsorbed current, the implemented charge per volume N can be calculated. Fig 1 d) present N in dependence on the energy of the incident electrons exemplary for formvar and gold with the 30 µm aperture. The obtained E3 points are 2,0±0,3 keV and 4,3±0.3 keV. In a second step the adsorbed and transmitted current was measured with and without an additional potential of 50 eV on the sample for two different working distances. With the experimentally obtained currents,this enables to calculate the secondary electron yield δ and the backscattered coefficient η in dependence on the energy of the incident electrons. The results are shown for the amorphous carbon film in Fig.1 e) and f).

[1] Reimer L., Golla U., Böngeler R., Kässens M., Schindler B., Senkel R. Charging of bulk specimens, insulating layers and free-supporting films in scanning electron microscopy. (1992) Optik 92 14-22

[2] Dries, M., Janzen, R., Schulze, T.,  Schundelmeier, J.,  Hettler, S., Golla-Schindler,U.,  Jaud, B.,  Kaiser, U., Gerthsen, D.: The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates (2016) Conference Proceeding Microscopy and Microanalysis Ohio; submitted

 [3] Inventor of the Patent of Carl Zeiss SMT GmbH, Entwicklung und Prototypenbau eines STEM Detektors für ein Rasterelektronenmikroskop: Patentnr.: DE       10211977, EP 1347490,US 2003/0230713 A1

[4] Golla U., Schindler B. and Reimer L. Contrast in the transmission mode of a low-voltage scanning electron microscope. (1994)  Journal of Microscopy 173 219-    225

 [5] Fitting, H.-J.: Transmission, energy distribution, and SE excitation of fast electrons in thin solid films. In: physica status solidi (a) 26 (1974), Nr. 2, 525–535.

[6] We kindly acknowledge M. Dries and R. Janzen of the KIT Karlsruhe for the amorphous carbon and PCS sample, the BMBF “Li-EcoSafe” joint research project  (FKZ: 03X4636A) and the Ministry of Science, Research and the Arts (MWK) of Baden-Wuerttemberg in the frame of the SALVE (Sub Angstrom Low-Voltage Electron microscopy and spectroscopy project) for financial support.


Bianca JAUD, Jörg BERNHARD, Ute KAISER, Ute GOLLA-SCHINDLER (Ulm, Germany)
08:00 - 18:15 #6106 - IM03-282 Improvement of a 40-120 kV analytical TEM system for electron beam irradiation sensitive nano materials.
IM03-282 Improvement of a 40-120 kV analytical TEM system for electron beam irradiation sensitive nano materials.

The performance of advanced nanomaterials such as the electrode catalysts of fuel cells is closely related to their composition, morphology and crystal structure. At the nanoscale, high resolution TEM is essential to understand the relationship between structure and electrochemical properties. In case of TEM characterization of chemically synthesized nanomaterials, highest attention should be paid to electron irradiation damage. If the observation conditions, especially accelerating voltage and electron beam density, are not optimized, an initial structure will be changed. For example, different from general inorganic materials, some materials such as chemically synthesized amorphous metal nano particles are quickly crystallized by the electron irradiation and it often mislead the characterization. Therefore, careful control of illumination conditions and irradiation time are essential for the analysis of those composites. The selection of an optimal accelerating voltage based on composition is one option to reduce irradiation damage.  In addition, sample observation with lower accelerating voltages is advantageous to generate higher image contrast.

Since standard 120 kV TEMs are optimized for applications at lower magnification with higher contrast requirements, we have developed an ultra high resolution objective lens (UHRLENS) to extend the application in nanomaterial field of a 40-120 kV HT7700 analytical TEM [1,2]. It mounted with the UHRLENS which provides lattice resolution of 0.2 nm with on-axis illumination at 120 kV and accommodates a high solid angle silicon drift detector of an energy dispersive X-ray (EDX) analyzer. Figure 1 shows an example of high resolution and high contrast observation of the fuel cell electrode catalyst by the newly developed TEM. Lattice images of platinum nanoparticles (lattice spacing: 0.23 nm) and the carbon support (lattice spacing: 0.34 nm) were observed clearly at an acceleration voltage of 120 kV.  The binder is clearly observed with sufficient contrast.

To analyze the crystal structure of nanomaterials, we have used a selected-area electron beam diffraction (SAED) technique with a micro-fabricated SA aperture hole rather than nano-probe diffraction [3]. Because the damage caused by the electron beam irradiation was much less than that of the nano-probe electron diffraction technique. An FIB fabricated apertures with the diameter of 1mm are equipped for structural analysis of individual nanomaterial. The smallest selected area diameter on the specimen is calculated to be 18nm. In case of characterization of  nano materials, the spatial error in SAED pattern due to a spherical aberration is not serious because;

1) No high-order diffraction spots available from nano-materials such as nano particles

2) High order diffraction  spots are not used in practice

To improve operability for acquirements of the SAED, a new automatic operation function, called “nano analysis function”, is produced. This function enables automatic acquirements of SAED at plural analysis positions pre-designated by a user. The analysis position of the SAED is precisely controlled by an image shift coil mounted just below the objective lens. The minimum diameter of SA aperture is 1 um, which corresponds to the diameter of the selected area of 18 nm on the specimen. Figure 2 shows a TEM image (a) of an asbestos specimen with the corresponding SAED patterns (b) acquired by the nano analysis function. The selected area of each analysis position is displayed by a circle on the TEM image.  The diffraction patterns of the acquired SAED images can be analyzed with an optional function of Hitachi EMIP software called “diffraction analysis function”. This function enables automatic measurement of diffraction spot intervals and assumption of elements contained in the selected area of the specimen from the database.

The conventional 40-120kV analytical TEM has been improved for characterization of electron beam sensitive nanomaterial by high-resolution TEM with high contrast. The improved functions made it possible to identify the crystal structure by selected nano area electron diffraction technique.

References:

[1] Kubo, T., et al, 2013.  Microsc.Microanal. 19 (Suppl 2), 1328.

[2] Yaguchi, T., et al, 2015.  Microsc.Microanal. 21 (Suppl 3), 1817.

[3] Kamino T., et al, Proc.of IMC 18, Prague, Czech Republic (2014) IT-6-P-1552.


Toshie YAGUCHI (Hitachinaka-shi, Japan), Keiji TAMURA, Takashi KUBO, Masaki KONDO, Hiromi MISE, Hiroaki MATSUMOTO
08:00 - 18:15 #6127 - IM03-284 An absolute sample position referencing solution for convenient cross-platform observations; application to the assessment of microscope stability and translation stage reproducibility.
IM03-284 An absolute sample position referencing solution for convenient cross-platform observations; application to the assessment of microscope stability and translation stage reproducibility.

We present the prototype of an instrument add-on that tracks the absolute position and orientation of a sample, and that can be implemented on several microscopes in order to provide virtual coupling between the platforms. It is aimed at avoiding wasting observation time at finding the same regions of interest indentified in former observations. It is also believed to improve the throughput of characterization platforms by providing an easy way for researchers to resume observations initiated at different availability slots of a microscope.

While fiducial markers and shuttle systems offer some solution for localizing regions of interests, they come along with a number of limitations, including requirement for tedious calibration, inadequate accuracy, and limitation to proprietary hardware. Another approach consists in attaching to the sample a plane with coded markers [1], and deduce the sample position from the observation of these markers. We have improved this concept by introducing the possibility to perform real-time determination of the sample position [2] during normal microscopy observations. The system consists in a coded plane substrate holder, an add-on to the microscope that allows the observation of the coded plane, a software module that deciphers the coded substrate, and a user interface.

The precision of the position and angular orientation measurements have been investigated. It is found that the standard deviation is less than 1nm in position, and less than 10µrad in orientation. Such precision values obtained with an image-recognition based approach establish that our position recognition system works in a superresolution regime, corresponding to localization microscopy. While this exceeds the usual requirements of optical microscopy, in practice, it is useful to assess the mechanical drifts of the microscope that degrade the precision, and check that theses drifts are acceptable, as discussed further. Fig. 1 gives an example of a sample map that has been produced with a succession of observations performed on two different microscopes and with different magnifications. The red rectangle outlines the real-time observation region on the sample map. Such cross-plateform absolute referencing system is believed to make it easier for communities who have some definite microscopy modalities as gold standard, to add the benefits of other modalities such as Raman microscopy.

Another interesting application of our approach is the assessment of the drift of microscopy apparatus and the reproducibility of moving stages. In this “stage patroller” configuration, the coded plane is observed through the main camera of the microscope and the obtained images are interpreted into position and orientation information. The drift of the platform is measured by recording the position as a function of time, with no intentional movement. Fig. 2 shows the drift on an Olympus BX41 equipped with a Marzhauser stage.

The stage patroller configuration has also been used in order to assess the accuracy of a moving stage. This is of particular importance for a number of microscopy modalities. While long distance accuracy of moving stages is generally not so crucial in microscopy, the capability to return at a same exact position is very important. Any departure from positioning reproducibility may result in misleading images due to distortion or shifts, when microscopy information is obtained by sweeping the stage around the position of interest. Our “stage patroller” configuration provides an easy way to observe the reproducibility accuracy of a moving stage. In an experiment, we instructed the moving stage to move repeatedly between 4 corners of a 500µm square. Figure 3 shows a close view around one of the square corner of the measured trajectory map. It can be observed that there is a significant scattering of the corner position, which may blur even normal resolution optical microscopy images. As a consequence, real-time absolute sample position referencing add-on may prove very useful to avoid such hard-to-detect blurs and shifts. The stage patroller may also be used to improve the reproducibility of a moving stage, by adjusting some rather cryptic user-defined stage settings, through a trial and error approach.

[1] P. Sandozn R. Zeggari, L. Froehly, J. Prétet, C. Mougin, J. Microsc., 225, 293–303 (2007)

[2] O. Acher, A. Podzorov, PCT Pat. Appl. WO2014016526.


Olivier ACHER (PALAISEAU), Alexander PODZOROV, Alexandre GRIGORIEV
08:00 - 18:15 #6143 - IM03-286 ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images.
IM03-286 ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images.

Quantitative scanning or conventional TEM, as well as electron diffraction techniques usually require the processing of raw data, the comparison with simulated counterparts and a meaningful visualisation of results. Here we present ImageEval, a Matlab-based software which contains established techniques in a modularised manner with a graphical user interface. This enables the efficient, reproducible application of established techniques and assures both the access to and the transparent exchange of know-how among different groups after a pioneer methodical development. In the following we summarise central ImageEval features.

The concept. ImageEval currently hosts 13 evaluation methods as separate modules. All modules can be used independently of each other but share a common data structure, so that results of one module can be further evaluated in another. Intermediate results, simulated reference or structural data are stored as meta data that is available for comparison or evaluation in all modules. The program reads Gatan (dm3) and FEI (emi/ser) file formats as well as common image formats. Large image series, e.g., 4-dimensional STEM data which often contain ~106 images and more, can be handled by pointers to files so as to load images into workspace only when to be processed. ImageEval is available as a standalone executable Version for Windows/Unix or as the Matlab source code directly, the latter option enabling the adaptation of evaluations for individual tasks.

STEM Z-contrast. This module allows for the quantitative composition and/or thickness mapping based on (High-resolution, HR-) STEM images either on the atomic lattice or on a regular user-defined grid. To this end, STEM intensities extracted from a Voronoi segmentation are compared with simulations to be loaded as reference data [Ultram. 109, 1171 (2009)]. For complex unit cells, the comparison can be distinguished with respect to an arbitrary number of sublattices for the different atomic sites, and intensities extracted from different images (e.g. bright & dark field acquired simultaneously) may be used simultaneously.

High-resolution strain state analysis. HR(S)TEM images can be evaluated by detecting atomic column positions (intensity maxima or minima) or lattice fringes with subpixel accuracy, e.g., by parabolian or Gaussian fits. Various filtering options are available, namely a Wiener noise filter which preserves the contrast of the high-resolution image. The vector field of the displacement from a regular lattice, its projection along a given direction and the local strain can be calculated [Optik 102, 63 (1996)].

Strain analysis by nano-beam electron diffraction (SANBED). Series of parallel- or convergent-beam electron diffraction patterns (CBED) are evaluated as to the positions of the reflections using centre of gravity computation (spot pattern) as well as radial gradient maximisation, edge detection or cross correlation methods [Micr. Microanal. 18, 995 (2012)]. Typically these are 3D or 4D data sets, corresponding to the acquisition of diffraction patterns on a STEM scan line or area.

Differential Phase Contrast (DPC). This module calculates the centre of gravity (average momentum [Nat. Comm. 5, 5653 (2014)]), the signals of a segmented quadrant detector, bright- and annular bright field signals from a 3D or 4D data set, i.e. ronchigrams recorded at each position of the STEM probe. Tools for angle calibration and calculating the charge density are also available.

COM interface. ImageEval can communicate with the common object model (COM) of the Microscope and the acquisition software. This enables the efficient implementation of individual experimental procedures such as acquiring a STEM image series while automically changing imaging parameters subsequently (e.g. acceptance angles of the ADF detector).

Basic Tools. Routinely needed tools such as cross-correlation of images to correct for relative shifts, (inverse) Fourier transform, line profiling, calculation of rotational average/sum, applying circular, annular or polygon masks, binning and image rotation are collected here.

Further methods include the analysis of angle-resolved STEM data, composition evaluation by lattice fringe analysis (CELFA, [Ultram. 72, 121 (1998)]) exploiting chemically sensitive imaging, geometric phase analysis (GPA (Ultram. 74, 131 (1998)]), data reduction in spot diffraction patterns, parametric fits ("atom counting" [Nature 470, 374 (2011)]), and processing of simulation results from the STEMsim software [Spr. Proc. Phys. 120, 169 (2007)] .

[1] K. M-C. was supported by the Deutsche Forschungsgemeinschaft (DFG) under contract No MU 3660/1-1.


Knut MÜLLER-CASPARY (Bremen, Germany), Thorsten MEHRTENS, Marco SCHOWALTER, Tim GRIEB, Andreas ROSENAUER, Florian F. KRAUSE, Christoph MAHR, Pavel POTAPOV
08:00 - 18:15 #6167 - IM03-288 ‘Slice & View’ nano-tomography of porous media using FIB-SEM.
IM03-288 ‘Slice & View’ nano-tomography of porous media using FIB-SEM.

Research on porous media is of major importance to many fields varying from catalysis to Earth science. Characterizing such media in 3D is expected to provide information on surface and volume rendering, which is required for understanding fluid transport. In the present study, electron tomography performed in the FIB-SEM (Focused Ion Beam - Scanning Electron Microscope) [1] is applied to a highly porous Diatomaceous Earth material. Representative volumes (Figure 1) have been obtained and treated in Fiji and Avizo software, the pore volume and pore connections are studied and quantified to generate the pore network [2-5]. Next, the data is used for fluid simulation through Computational Fluid Dynamics (CFD) methods, in order to study and analyze flow and diffusion properties in the obtained pore network (Figure 2). The geometry of pores is also evaluated to study how it influences transport properties in the sample. Furthermore, the effects of image correction and segmentation on the simulation are also examined. 

 

 

[1] L. Holzer et al, Journal of Microscopy, 216 (2004), 84–95.

[2] P.S. Jørgensen et al, Utramicroscopy, 110 (2010), 216-228.

[3] T. Prill et al, Journal of Microscopy, 250 (2013), 77–87.

[4] M. Salzer et al, Journal of Microscopy, 257 (2015), 23–30.

[5] K.R. Mangipudi et al, Utramicroscopy, 163(2016), 38-47. 


Yang LIU (Utrecht, The Netherlands), Pierre LE FUR, Marijn VAN HUIS, Oliver PLÜMPER
08:00 - 18:15 #6175 - IM03-290 3D surface reconstruction with segmented BSE detector: New improvements and application for fracture analysis in SEM.
IM03-290 3D surface reconstruction with segmented BSE detector: New improvements and application for fracture analysis in SEM.

Using the signals of four backscattered electron (BSE) detectors with different detection angles in the scanning electron microscope (SEM) the three-dimensional surface topography of various samples, i.e. catalysts, fractured surfaces and micro-devices can be derived and analyzed [1], [2]. An efficient shape from shading reconstruction algorithm is applied to these signals to extract high resolution height and texture information. The surface reconstruction is very fast and needs no sample tilting since the surface topography is calculated from the four simultaneous recorded backscattered electron images.

While the 3D reconstruction of the surface topography works very well, the calculation of quantitative height differences depends on different imaging and geometric parameters and requires a calibration of the used BSE detectors. This includes the adjustment of gain and offset of the signals as well as the checking of the geometrical properties of the detector, i.e. detector radius, height, detection area and the horizontal angle to the scan rotation. Especially the height determination, which also depends on the adjustment of the working distance, is hard to determine. Therefore, a spatial calibration is applied with the help of 3D calibration standards [3]. As a result, not only lateral scaling factors, but also z-scale and shearing effects are estimated. Furthermore, nonlinear deviations are calculated and allow an evaluation of the local and overall accuracy of topographic data, which is achieved applying 3D reconstruction using a calibrated 4Q-BSE detector.

For better accuracy, the reconstruction algorithm was improved by applying refined geometry for the primary and the backscattered electron beam. At low magnifications, the electron beam is not perpendicular to a horizontal specimen surface and the distribution of the backscattered electrons is not isotropic. In addition, the distance between the specimen and the detector is not constant for all image points. Without consideration and correction, this yields to spherical distorted surfaces. The advanced 3D reconstruction algorithm includes geometrical improvements, allowing a distortion-free mapping of the surface topography over a large magnification range.

As an example for application of 3D reconstruction in material sciences, fracture surfaces of a copper base alloy were analyzed. The applied SEM (Hitachi S-520) is equipped with a complete digital imaging system and in particular with a 4-quadrant BSE detector (point electronic GmbH) and was geometrically calibrated using a 3D calibration standard. Thus, the spatial scale factors were determined for a magnification of 1000x to cx = 1.013, cy = 1.024, cz = 1.198. While the remaining maximum geometrical deviations after application of these calibration parameters were evaluated with dx = 60 nm, dy = 41 nm and dz = 57 nm the spatial mean deviations for the whole measurement volume is 16 nm.

The figures present some results of the investigation. The upper row of pictures shows the dimpled surface microstructure of a forced fracture where the material mostly cracks in a ductile trans-crystalline manner. The pictures of the bottom row show some crystallographically oriented facets of a fatigue fracture of the same material. On the left for both cases the secondary electron (SE) images are shown, on the right side pictures of the 3D reconstructions of the BSE images are presented. Height differences can be visualised immediately whereas more complex data will be derived from the 3D datasets.

The improved 3D reconstruction algorithm is available as standalone software version as well as integrated solution for SEM. Integration into a SEM system allows not only on-line 3D visualisation, but also easier calibration and especially more reliable application, because full control over all relevant physical and imaging parameters is guaranteed. The integrated topographic 3D reconstruction was developed in cooperation with point electronic GmbH and is now available within their SEM control hard- and software DISS. Therefore we like to thank point electronic GmbH for the fruitful cooperation.

[1] Beil, W., Carlsen, I. C.: Surface Reconstruction from Stereoscopy and “Shape from Shading” in SEM images. Machine Vision and Applications (1991) 4:271-285.

[2] Paluszynski, J., Slowko, W.: Surface reconstruction with the photometric method in SEM. Vacuum 78 (2005) 533-537.

[3] Berger, D., Ritter, M., Hemmleb, M., Dai, G., Dziomba, T.: A new quantitative height standard for the routine calibration of a 4-quadrant-large-angles BSE-detector. EMC (2009) 533-534.


Matthias HEMMLEB, Dirk BETTGE, Iryna DRIEHORST, Dirk BERGER (Berlin, Germany)
08:00 - 18:15 #4960 - IM05-292 Characterization of the splitting ratio of bi-component spunlaced fabric via pixel classification.
IM05-292 Characterization of the splitting ratio of bi-component spunlaced fabric via pixel classification.

As a consequence of air pollution deterioration worldwide, the global filtration industry is constantly searching for cost-effective solutions with extremely high separation efficiency and remarkably high air flow at low energy consumption for various applications. To answer these market needs, SABIC is developing new nonwoven bi-component spunlaced filer media technology. Studies indicate that an increase in splitting ratio of bi-component fibers enhances the absorption and filtration efficiency, and the mechanical properties of the nonwoven fabric [1]. Currently, fiber splitting ratio is characterized by visual inspection of the Scanning Electron Microscopy (SEM) images, or determined indirectly by measuring filtration properties. There is little information available in literature for quantifying the splitting ratio via image analysis [2].

A novel method has been developed to quantitatively characterize the splitting ratio of bi-component fibers based on SEM images. The workflow for the proposed method is given in Figure 1. As there is no intensity differences between the split and un-split fibers, the thresholding methods for image segmentation are not applicable for this purpose. Alternatively, texture information offers a description of spatially extended patterns of intensity distributions within a neighborhood. The split fibers have smaller diameters, which makes the frequency of edges high. Besides, the changes in orientation are also very frequent because of the entanglement of the twisted fibers. Both texture patterns can be captured by Log-Gabor filter bank [3]. The extracted Gabor texture features are then treated as input to Expectation-Maximization clustering (EM-clustering) to discriminate the two different texture patterns from the two types of fibers. Originally, EM-Clustering is unsupervised machine learning method, which assumes there is a mixture of a definite number of Gaussians within a set of unlabeled data [3]. However, fibers entanglement and fibers depth-penetration make the variations in texture patterns too wide to converge the un-supervised EM-clustering. As such, semi-supervised EM-clustering is implemented instead, which includes a training step on a small set of labeled data to gain some prior knowledge on the targeted Gaussian Mixtures Model. For each image, around 10% of the pixels are randomly selected for training. Initiated with the trained model, pixels belonging to split and un-split fibers are classified further with EM-clustering on extracted Gabor texture features [3]. Post morphology processing follows to finalize the image segmentation. Based on the final image segmentation result, the fiber splitting ratio is then characterized in terms of area percentage of split fiber within the imaged web. Examples of stepwise image analysis results are illustrated in Figure 2. Furthermore, a correlation is established between the derived splitting rate and the permeability of the products. The results on the fiber splitting ratio give a proof of concept in understanding the correlation between filtration efficiency and splitting ratio. This method can also work with SEM images of the sample cross sections to gain an insight of the splitting ratio through the thickness of the sample.

[1]. Baker, B., Bicomponent fibers: A personal perspective, International Fiber Journal, 1998, 13(3), 26-35.

[2]. L. B. Suragani Venu, E. Shim, N. Anantharamaiah and B. Pourdeyhimi, 3D Structural Characterization of Nonwoven Fabrics. Microscopy and Microanalysis, 2012, 8, 1368-1379.

[3]. F. van der Heijden, R. Duin, D. de Ridder, D. M. J. Tax, Classification, Parameter Estimation and State Estimation: An Engineering Approach Using MATLAB, Wiley, 2004.


Chanjuan LIU (Bergen op Zoom, The Netherlands), Sebastien PIERRAT, François COURTECUISSE, Richard PETERS, Richard LUCAS
08:00 - 18:15 #5006 - IM05-294 Experimental determination of electron-beam broadening in low-energy STEM.
IM05-294 Experimental determination of electron-beam broadening in low-energy STEM.

The interest in scanning transmission electron microscopy (STEM) at low primary electron energies E ≤ 30 keV has steadily grown in the past. The benefits of low-keV STEM are high material contrast for low atomic number materials and prevention of knock-on damage. Moreover, low-keV STEM can be easily performed in a standard scanning electron microscope. However, the mean free path values decrease with lower E which substantially increases the number of scattering events and leads to plural and multiple scattering even at small specimen thicknesses. As a consequence, the beam is broadened within the sample which worsens the lateral resolution of the technique. Since single scattering events and the resulting beam broadening cannot be measured directly, we will present an approach to estimate beam broadening by using an amorphous carbon (aC) thin-film.

The aC-film was deposited by electron-beam evaporation onto a cleaved mica substrate. The film thickness of 10 nm was determined by TEM of a cross-section TEM-sample from a simultaneously coated Si-substrate. The aC-film is floated off the mica substrate on a distilled water surface and deposited on a copper grid. In this process, cracks are formed in the film which lead to multiple folding of the film at the crack edges. Such a crack edge is imaged with the bright-field (BF) detector in Figure 1. The film is folded in a way that regions are created where a discrete number of aC-layers are stacked. Some of these regions are marked with the number of stacked layers. Averaging the 16-bit gray-scale values in these areas gives intensity values for several discrete film thicknesses. The red dots in Figure 2 show the resulting intensities for the areas in Figure 1 after subtracting the black value (intensity with blanked electron beam) IB and normalization with the intensity of the incident electrons I0.

The used STEM detector is a semiconductor detector which is composed of a circular BF segment, four separately controllable annular dark-field (DF) segments and a large high-angle annular dark-field (HAADF) segment. Figure 3b shows a scheme of the detector rings and the corresponding outer detection angles for the used working distance of 6.3 mm. The region close to the crack edge (cf. Figure 1) was imaged with all detector segments. The accumulated normalized intensity values up to the indicated detector at E = 20 keV are plotted in Figure 2.

The radial intensity of an electron probe can be defined by the integration of a Gaussian intensity distribution [1]. We refer to the beam width b as the diameter of the circle that contains 68 % (1 σ of a Gaussian) of the total probe current which is marked by the dotted black line in Figure 2. The crossings of the dashed vertical lines in Figure 2 with the dotted line indicate the film thicknesses at which the intensity falls below 68 % for the different detector segments. At these thicknesses the beam is broadened to the outer detection angle of the indicated detector. Assuming the mean scattering position at half thickness of the film, the beam width at the bottom of the film can be calculated by b=t tanφ [2] (cf. Figure 3a). The red curve in Figure 4 shows the calculated beam widths as a function of the sample thickness for E = 20 keV derived from Figure 2. The same procedure was repeated for various electron energies from 10 to 30 keV and the resulting beam widths are plotted in Figure 4.

For all energies the beam width rises with increasing thickness. This behavior is expected due to the increasing scattering probability. Less pronounced broadening for higher E is expected for the same reason as well. The absolute values show that even for small thicknesses up to 90 nm, like in our experiment, and a low-density material like amorphous carbon, the beam width increases to a multiple of the original beam diameter. This points out that thin samples for high-resolution low-keV STEM are required.

 

References

[1]    L. Reimer, Scanning electron microscopy: Physics of image formation and microanalysis, 2nd ed., Springer, Berlin, London, 1998.

[2]    J.I. Goldstein, J.L. Costley, G.W. Lorimer, S.J. Reed, Scanning Electron Microscopy 1 (1977) 24.

[3]    We acknowledge funding by the German Research Foundation (DFG).


Holger DREES (Karlsruhe, Germany), Erich MÜLLER, Dagmar GERTHSEN
08:00 - 18:15 #5075 - IM05-296 Non-local averaging in EM: decreasing the required electron dose in crystal image reconstruction without losing spatial resolution.
IM05-296 Non-local averaging in EM: decreasing the required electron dose in crystal image reconstruction without losing spatial resolution.

Todays electron microscopes enable imaging of materials at atomic resolution. However, in many relevant applications, the resolution is not limited by the microscope's physical properties, but by the beam sensitivity of the material. The beam sensitivity limits the applicable electron dose before beam damage corrupts the measurement, which leads to low signal-to-noise ratios (SNR). The SNR in turn limits the effective resolution, or, in other words, the precision of any analysis performed on the measurement.

Typically, the SNR is improved either by local averaging or by averaging multiple aligned images of the same specimen. Unfortunately, the former reduces the effective spatial resolution of the image, while the latter increases the applied electron dose. We propose to circumvent these issues by combining the benefits of both approaches in a single method. The key observation is that most EM measurements (e.g. (S)TEM, EELS, EDX) of atomic resolution contain many self-similar regions: due to the crystal structure, any unit cell is typically pictured more than once. This is an ideal setting for non-local averaging methods, which have become very popular over the past few years due to their ability of substantially reducing noise without blurring the image.

The gold standard amongst modern non-local averaging algorithms in general digital photography is the Block-matching and 3D filtering algorithm (BM3D) [1]. However, due to its generality, BM3D does not make full use of the aforementioned rich self-similarity typically found in atomic scale micrographs. Thus, we propose a denoising strategy based on BM3D, but specially tailored to atomic scale electron micrographs [2]. The key feature is a new method for the automated analysis of the projected specimen geometry from the image, i.e. the detection of regions with different crystal structure [3] as well as their primitive unit cell dimensions [4]. This information allows us to predict the position of similar image parts, thus maximizing the potential of BM3D.

Most single image averaging techniques, including BM3D, are designed to remove Gaussian noise. However, aside from approximately Gaussian noise generated by the sensor itself, EM measurements typically contain contributions of Poisson noise as well due to the electron counting statistics. To address this issue, we developed an automated procedure for estimating the parameters of a mixed Poisson-Gaussian noise model directly from raw EM data, which allows the use of averaging techniques designed for Gaussian noise removal.

Compared to the commonly used local averaging techniques, our proposed method achieves significantly higher effective resolution. Furthermore, our method can be easily combined with the aforementioned alignment and averaging techniques for multiple images of the same specimen, thus significantly reducing the electron dose required for a useful reconstruction.

Figure 1 demonstrates the proposed method on an exemplary HAADF-STEM image with three crystal regions (SrTiO3, BaTiO3 and SrRuO3) [5]. Figure 1a shows the electron micrograph and indicates the detected region boundaries (green), as well as the lattice vectors of a primitive unit cell within each of the three crystals (red). The result of non-local averaging with the proposed method is shown in Figure 1b. A zoom into a region around the bottom crystal inferface is given (yellow) that simplifies the assessment of the increase in SNR. While in the original STEM image, the distinction between the SrTiO3 and BaTiO3 regions is hardly possible with the naked eye, the increased contrast of the denoised image makes it clearly visible.

In Figure 2a we show a few selected spectra of an EELS dataset with a low SNR especially in the last components of the spectrum [6]. Figure 2b shows the corresponding spectra after denoising with the proposed method. The result demonstrates that the proposed method also applies very well to hyper-spectral data and excels at significantly increasing the SNR of the spectra without introducing artifacts or blurring fine details.


The authors would like to thank Daesung Park for providing us with the experimental HAADF-STEM images, as well as Martial Duchamp for providing the EELS dataset.

[1] Dabov, K., Foi, A., Katkovnik, V. et al., IEEE Transactions on Image Processing 16, 2080-2095 (2007).
[2] Mevenkamp, N., Binev, P., Dahmen, W. et al., Advanced Structural and Chemical Imaging 1 (2015).
[3] Mevenkamp, N., Berkels, B., WACV Proceedings (2016).
[4] Mevenkamp, N., Berkels, B., GCPR Proceedings, pp. 105–116. (2015).
[5] Park, D., Herpers, A., Menke, T. et al., Microscopy and Microanalysis 20, 740-747 (2014).
[6] Duchamp, M., Lachmann, M., Boothroydet, C.B. et al., Applied Physics Letters 102.13, 133902 (2013).


Niklas MEVENKAMP (Aachen, Germany), Benjamin BERKELS
08:00 - 18:15 #5117 - IM05-298 Determination of the three particle structure factor from experimental images.
IM05-298 Determination of the three particle structure factor from experimental images.

The structure of amorphous materials can be described by their correlation functions gn(r1,...,rn) where gn(r1,...,rn) d3r1···d3rn gives the probability of finding particle i in the volume d3ri and so on [1]. The pair correlation function g2(r1, r2) is well known experimentally from scattering experiments. However, it describes only the distribution of atomic distances. Information about bond angles is lost. This would be accessible if the triple correlation function g3 (r1,r2,r3) could be measured.
The Fourier transform of the correlation functions are the so-called structure factors. These can be directly obtained from experimental images [2]. Previous attempts to implement this approach, however, have failed [3, 4].
A few years ago Huang et al. [5] made incredibly well defined images of a layer of amorphous silica where the resolution was high enough to resolve atomic spacings. As the atomic positions are directly visible in these images, we used them to obtain the three particle structure factor.

In a first approximation we assumed ideal imaging and determined the structure factor S(1) simply as the Fourier transform of the measured intensity. The two particle structure factor S(2) is then calculated as the square of its absolute value and finally the three particle structure factor is obtained as S(3) (q1,q2) = S(1)(q1) S(1)(q2) S(1)(−q1−q2) where q1 , q2are spatial frequencies in two dimensions [2].

Figure 1 shows the two particle structure factor of amorphous silica. There are two peaks. The first one at q ≈ 0.3 Å-1 is broader and we expect it to represent the atomic distances in the specimen. The second peak at q ≈ 0.5 Å-1 is sharper and due to the graphene substrate. Since amorphous matter is expected to be isotropic we average over one spatial angle and consider S(3) as a function of only three variables |q1|, |q2| and the angle φ between qand q2. To reduce the number of degrees of freedom even more, we took q1 = q2 =: q and chose q to be at the first peak in S(2)(q) and only varied φ. A first result is shown in figure 2.
In a crystal one has well-defined binding angles and thus expects S(3)(φ) to have sharp peaks at those angles. In our case we find peaks around 60° and 120° stemming from the approximate 6-fold symmetry of silica but compared to the case of crystals they are smeared out. For the first time we have been able to determine the three particle structure factor from TEM images. We are now undertaking a systematic study to obtain further insights into the amorphous structure of two-dimensional glasses.



Acknowledgements: We are grateful to Prof. Dr. Ute Kaiser (University of Ulm) for providing her image data to us.

                  

[1] J.M. Ziman. Models of Disorder: The Theoretical Physics of Homogeneously Disordered Systems. Cambridge University Press, 1979.
[2] M Hammel and H Kohl. Determination of the triple correlation-function of amorphous specimens from em micrographs. In Inst. Phys. Conf. Ser., number 93, pages 209–210, 1988.

[3] Michael Hammel. Bestimmung der abbildungsparameter und der korrelationsfunktion dritter ordnung amorpher objekte aus elektronenmikroskopischen phasenkontrastaufnahmen. Master’s thesis, TH Darmstadt, 1988.
[4] Ansgar Haking. Bestimmung des drei-teilchen-strukturfaktors amorpher stoffe aus hochaufgelösten elektronenmikroskopischen aufnahmen. Master’s thesis, WWU Münster, 1995.
[5] Pinshane Y. Huang, Simon Kurasch, Anchal Srivastava, Viera Skakalova, Jani Kotakoski, Arkady V. Krasheninnikov, Robert Hovden, Qingyun Mao, Jannik C. Meyer, Jurgen Smet, David A. Muller, and Ute Kaiser. Direct imaging of a two-dimensional silica glass on graphene. Nano Letters, 12(2):1081–1086, 2012.


Semir VRANA (Münster, Germany), Helmut KOHL
08:00 - 18:15 #5152 - IM05-300 Composition quantification of thin samples by backscattered electron imaging in scanning electron microscopy.
IM05-300 Composition quantification of thin samples by backscattered electron imaging in scanning electron microscopy.

The contrast of backscattered electron (BSE) images in scanning electron microscopy can be exploited for atomic number or material density determination [1]. However, BSE images suffer from limited spatial resolution for bulk specimens due to the large interaction volume of the primary electrons. This limitation can be overcome by using electron transparent samples as is demonstrated in this work.

Comparison of experimental BSE intensities with calculations is required for the quantification of material contrast. We apply here the electron diffusion model of Werner et al. [2] which considers single electron scattering and electron diffusion. To verify and adapt the diffusion model, the calculated results are compared with Monte-Carlo (MC) simulations [3]. The limited detection angle range of the used annular semiconductor detector from 2.3 rad to 2.77 rad must be taken into account in the calculations. It is also important to take into account the threshold energy of the semiconductor detector, because BSE below 2 keV are not detected by our BSE detector. Hence, the calculation of the energy loss of the BSE is necessary and was accomplished on the basis of an expression for the electron energy dissipation given in [4]. The validity of our procedure for composition analysis is verified by analyzing a sample with known composition and geometry.

The investigated sample contains four InxGa1-xAs layers of 25 nm thickness with In-concentrations of x = 0.1, 0.2, 0.3 and 0.4 which are embedded in GaAs-barrier layers with 35 nm thickness. Details on the growth and verification of the composition of the analyzed sample by alternative techniques are outlined by Volkenandt et al. [5]. Cross-section samples with wedge-shaped thickness profiles are prepared perpendicular to the layer system by focused-ion-beam (FIB) techniques. A FEI Quanta ESEM equipped with an annular BSE semiconductor detector is used for the measurements.

Fig. 1a shows a BSE cross-section image of a wedge sample with the brighter InxGa1-xAs layers separated by GaAs with lower intensity. A Pt-layer was deposited prior to FIB milling to protect the sample. The thickness of the wedge sample is determined in a region with known composition (here GaAs). For this purpose, an intensity line scan along the wedge with increasing thickness is performed in the GaAs substrate (green arrow in Fig. 1a) at different primary electron energies (Fig. 1b). The thickness-dependent BSE intensity is normalized with respect to intensity in the thickest part of the wedge, which corresponds in a good approximation to the bulk BSE intensity. By comparison with calculations of the thickness-dependent backscattering-coefficient ratio η(t)/η(bulk) (black lines) the offset thickness at the thin edge of the wedge and the local thickness along the line scan can be determined.

Subsequently a line scan perpendicular to the layer system (red arrow in Fig. 1a) is performed at a constant thickness of 200 nm. BSE intensity ratios of the InxGa1-xAs quantum wells with respect to the GaAs barrier layers are shown in Fig. 2a. Lines with different colors denote calculations for η(t)InGaAs/η(t)GaAs for different E0 and thicknesses of (200 ±  20) nm. The calculated intensity ratios agree well with the measurements. The accuracy of the technique improves for higher E0 values because the gradient of the intensity ratios increases. This allows to distinguish In-concentration differences of 10%.

Fig. 2b shows η(t)InGaAs/η(t)GaAs for 20 keV as a function of the sample thickness. Only a weak dependence on the local specimen thickness is observed between 50 and 250 nm giving the optimal range for composition quantifications. At lower thicknesses the BSE intensity is low, while at higher thicknesses the contrast blurs due to the electron beam broadening.

It is shown that contrast quantification of BSE images is possible with a high lateral resolution. The sample thickness and the material composition were determined within one single image. Quantifications are successfully performed by comparison of the experimental with calculated data from an analytical model.

References

[1] S. A. Reid, A. Boyde, J. Bone Miner. Res. 2, 13 (1987)

[2] U. Werner et al., Ultramicroscopy, 8, 417 (1982)

[3] N.W.M. Ritchie, Surf. Interface Anal., 37, 1006 (2005)

[4] L. Reimer, Scanning Electron Microscopy, Heidelberg, Germany: Springer, 105 (1998)

[5] T. Volkenandt et al., Microsc. Microanal. 16, 604 (2010)


Erich MÜLLER (Karlsruhe, Germany), Dagmar GERTHSEN
08:00 - 18:15 #5190 - IM05-302 Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures.
IM05-302 Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures.

Monolayers of 2D transition metal dichalcogenides (TMDCs) provide excellent semiconducting
counterparts to insulating hexagonal boron nitride (hBN) and conductive graphene.[1] Combining all
three materials in a Van der Waals vertical heterostructure allows the electronic, photovoltaic and
electroluminescent properties of the TMDCs to be studied.[2] Whilst transport and optoelectronic
measurements can probe the properties of exotic charge carriers, and ARPES can map the
bandstructure such systems, direct high resolution imaging of the buried interfaces is only possible
via high resolution cross sectional (S)TEM imaging.[3] The nature of these van der Waals interfaces
not only determines the carrier injection between components[4], but also affects the bandstructure
of the device and its ultimate functionality[5].


Here we present a novel strategy to denoise high resolution HAADF STEM images of cross sections
using principal component analysis (PCA).[6] Cross sections are fabricated in a dual-beam FIB-SEM
instrument using the in situ lift-out method and polished with low energy ions to achieve electron
transparency.[7] Cross sections were imaged in high resolution HAADF STEM using a probe-side
aberration corrected FEI Titan G2 80-200 kV with an X-FEG electron source. By treating each line
profile perpendicular to the fringes as a signal, components associated with noise and scattering can
be separated by their variance. Removing the noise components allows us to accurately determine
the separation between dissimilar crystals at these unique interfaces. More widely, the approach
developed here also has application in a variety of layered material systems.


[1] X. Duan, C. Wang, A. Pan, R. Yu, and X. Duan, ‘Two-dimensional transition metal dichalcogenides
as atomically thin semiconductors: opportunities and challenges’, Chem. Soc. Rev., vol. 44, no.
24, pp. 8859–8876, Nov. 2015.
[2] F. Withers, O. Del Pozo-Zamudio, A. Mishchenko, A. P. Rooney, A. Gholinia, K. Watanabe, T.
Taniguchi, S. J. Haigh, A. K. Geim, A. I. Tartakovskii, and K. S. Novoselov, ‘Light-emitting diodes by
band-structure engineering in van der Waals heterostructures’, Nat Mater, vol. 14, no. 3, pp.
301–306, 2015.
[3] S. J. Haigh, A. Gholinia, R. Jalil, S. Romani, L. Britnell, D. C. Elias, K. S. Novoselov, L. A.
Ponomarenko, A. K. Geim, and R. Gorbachev, ‘Cross-sectional imaging of individual layers and
buried interfaces of graphene-based heterostructures and superlattices’, Nat Mater, vol. 11, no.
9, pp. 764–767, 2012.
[4] L. Britnell, R. V. Gorbachev, R. Jalil, B. D. Belle, F. Schedin, M. I. Katsnelson, L. Eaves, S. V.
Morozov, A. S. Mayorov, N. M. R. Peres, A. H. Castro Neto, J. Leist, A. K. Geim, L. A.Ponomarenko, and K. S. Novoselov, ‘Electron Tunneling through Ultrathin Boron Nitride
Crystalline Barriers’, Nano Lett., vol. 12, no. 3, pp. 1707–1710, Mar. 2012.
[5] A. M. van der Zande, J. Kunstmann, A. Chernikov, D. A. Chenet, Y. You, X. Zhang, P. Y. Huang, T.
C. Berkelbach, L. Wang, F. Zhang, M. S. Hybertsen, D. A. Muller, D. R. Reichman, T. F. Heinz, and
J. C. Hone, ‘Tailoring the Electronic Structure in Bilayer Molybdenum Disulfide via Interlayer
Twist’, Nano Lett., vol. 14, no. 7, pp. 3869–3875, Jul. 2014.
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Midgley, ‘Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the
Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning’, Nano Lett., vol. 15, no.
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[7] M. Schaffer, B. Schaffer, and Q. Ramasse, ‘Sample preparation for atomic-resolution STEM at
low voltages by FIB’, Ultramicroscopy, vol. 114, no. 0, pp. 62–71, 2012.


Aidan ROONEY (Manchester, United Kingdom), Aleksey KOZIKOV, Eric PRESTAT, Freddie WITHERS, Andre GEIM, Konstantin NOVOSELOV, Sarah HAIGH
08:00 - 18:15 #5198 - IM05-304 Application of moiré pseudo atomic column elemental mapping to electron beam-sensitive crystal of mineral.
IM05-304 Application of moiré pseudo atomic column elemental mapping to electron beam-sensitive crystal of mineral.

Atomic column elemental mapping is getting popular, since elemental species and positions of atomic sites are determined simultaneously [1]. In this method, the chemical information is generally detected by electron energy loss spectrometry (EELS) and/or energy dispersive X-ray spectrometry (EDS). Allowable electron dosage for a sample limits the usage of the method, since more dosage is required for the chemical analyses than that for imaging, due to small ionization cross section of atoms. The sensitivity of EDS rises rapidly, since a silicon drift detector (SDD), which is a new type of EDS detector, has design flexibility of its shape and has quick processing time, resulting in predominantly use in recent years. And total solid angle of X-ray detection rises rapidly to be 1.5-2.0 sr by detection systems with multiple detectors.

The allowable electron dosage still limits the application of the method to battery, carbon and organic materials, which are strongly requested to be analyzed by the industries. Therefore, it is required to reduce the dosage or to increase critical dosage of these materials. Trials to increase the critical dosage have been succeeded by finding an appropriate accelerating voltage and sample cooling. On the other hand, not so many trials to reduce the dose density onto a sample have been done.  We first succeeded in showing a pseudo atomic column elemental map with a lower average dose density ( < 1 % of that used in the conventional atomic column elemental mapping), utilizing a two dimensional (2D) moiré pattern [2].  In this paper, we applied this method to a beam sensitive sample.

The sample for our experiment was selected to be beryl (Be3Al2Si6O18: Fe2+) (known as aquamarine, having hexagonal structure with a = b = 0.922 nm, c = 0.920 nm see Fig. 1), which is one of cyclosilicates and has channels along the c axis. An [001] oriented sample was made by Ar ion thinning. Carbon was evaporated on the sample surface to avoid sample charging. We used for the experiment an aberration corrected 300 kV microscope (JEOL, JEM-ARM300F) equipped with a cold FEG and dual SDD X-ray detector system (total solid angle = 1.63 sr). All image observations and analyses in this paper were obtained under conditions: acc. Volt. = 300 kV, probe current = 24 pA. It is noteworthy that no direct atomic column elemental mapping was succeeded due to the sample damage. A high resolution STEM image of the sample is shown in Fig. 2(b).

In the experiments, the number of pixels (n x n) for the maps was selected to be 64 x 64, and pixel intervals in the x and y directions( drx and dry ) were set to be acrx and bcry nm, where rx and ry are numbers of unit cells in a pixel intervals in x and y directions.  The widths of the unit cell (ac and bc) are 0.922 and 1.60 nm, since bc / ac = 31/2 (see 2D Cartesian unit cell in Fig. 1(a)). The Cartesian unit cell is required for a common STEM, because the pixel positions (the electron irradiation points)  of a scanning image are on the Cartesian grid. The moiré magnification (M = dmoire / dlattice) is determined from the following relations: Mx = 1 / | 1 – rx / N |, My = 1 / | 1 – ry / N |, where N is the closest integral number to rx and ry (see Fig. 1(b)).  Figures 2 (c) and (d-f) show a moiré HAADF image and moiré pseudo atomic column elemental maps by 102 cyclic acquisitions. The image width in the x direction (ndrx) and Mxac are measured to be 239.1 and 69.1 nm from the image, and the Mx is derived to be 78.2 by the relation mentioned above with N = 4, rx = drx / ac = 4.053. The image height (ndry) is calculated to be 412 nm with the derived relation ( ndry = 0.5nNbc(1 + [1 + 4/(Nnbc)]1/2), where nbc is number of pixels for Mybc in image). The ry is determined to be 4.029. The drx and dry is derived to be 3.73 and 6.43 nm. The total scanned area is estimated to be 9.82 x 104 nm2. The dose density on the sample was estimated to be 1.30 x 1010 electrons / nm2 with the total analysis time = 2089 sec and the probe current = 24 pA. The equivalent dose density, if the analysis were performed by the conventional direct method, is estimated to be 1.23 x 1014 electrons / nm2. Therefore, we could reduce the dose density to be < 10-4 in this experiment. The results in Fig. 2 (d-f) show the clear atomic column elemental maps for Al, Si and O due to the low dose acquisition. We proposed and demonstrate a method to reduce dose density for the analysis of a real fragile sample. The reduced rate was a one-ten-thousandth of one by the conventional method.  

 

References

 

[1] E Okunishi et al, Microsc. Microanal. 12(S2) (2006), p.1150.

[2] Y Kondo and E Okunishi, Microscopy. 63 (5) (2014), p. 391.


Yukihito KONDO (Tokyo, Japan), Keiichi FUKUNAGA, Eiji OKUNISHI, Ichiro ONISHI
08:00 - 18:15 #5211 - IM05-306 An artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy.
IM05-306 An artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy.

In [1] an algorithm was proposed, inverse dynamical photon scattering (IDPS), which uses as a forward model the propagation of the optical wave through the sample and the objective lens with the multislice method. By recasting the forward model as an artificial neural network (ANN), an error metric can be chosen, and the derivatives of this metric with respect to the unknown values of the discretized object become available at the low computational cost of one extra pass through the ANN. These gradients are deployed in a derivative-based optimization scheme to retrieve a three-dimensional reconstruction of the specimen; Polak-Ribière conjugate gradients (PRCG) and alternate directions augmented Lagrangian (ADAL) are opted for. IDPS is implemented on the graphics processing unit.

IDPS is verified using the open source data from [2,3], where two stacked 1995 US Air Force resolution test charts, 110 mm apart, were adopted as specimen. This dataset is acquired with a microscope with a numerical aperture (NA) of 0.1. An LED array is placed sufficiently far away to consider each individual LED to illuminate the specimen with a spatially coherent plane wave. Nine bright-field and 284 dark-field images are recorded with LEDs up to 0.44 illumination NA, providing an effective NA of 0.54. Since the central wavelength of the LEDs is 643 nm, the 0.54 NA corresponds to a lateral resolution of 1.20 µm. The resolution of the reconstructions is evaluated as the center-to-center distance of the bars in the smallest element in the resolution target that is still discernible: 2.76 µm for element 4 of group 8, and 1.38 µm for element 4 of group 9.

Given that results are obtained from an initial guess of zero, no preprocessing steps such as light field refocusing are necessary. The free choice of error metric is important as the standard choice of sum of squared differences (SSD) leads to a high amount of resolution-limiting noise, see Fig. 1, and to erratic behavior in the R-factor. The alternative sum of normalized absolute differences (SNAD) yields a better-behaved and lower R-factor, as well as a better resolution (see Fig. 2). This poses a problem for Gerchberg-Saxton-type algorithms since they can be thought of as implicitly minimizing SSD [1].

Estimation of certain nuisance parameters—the focal value and illumination angle in this case—together with the specimen itself, improves the result by decreasing the R-factor and diminishing cross-talk between layers. Combined with a total variation regularization of the object, achieved by the ADAL approach, a reconstruction with the same resolution and considerably smoother and strongly diminished spurious oscillations is obtained, as is shown in Fig. 3. [4]

[1] X. Jiang et al., “Inverse dynamical photon scattering (IDPS): an artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy,” Optics Express (2016), accepted.

[2] L. Tian, “3D FPM on LED array microscope,” (2015). https://sites.google.com/site/leitianoptics/open-source.

[3] L. Tian and L.Waller, “3D intensity and phase imaging from light field measurements in an LED array microscope,” Optica 2, 104–111 (2015).

[4] The Carl Zeiss Foundation is gratefully acknowledged by all authors. C.T. Koch also acknowledges the DFG (KO 2911/7-1). The authors acknowledge the helpful discussion and the open source data provided by L. Waller and L. Tian, University of California, Berkeley.


Wouter VAN DEN BROEK (Berlin, Germany), Xiaoming JIANG, Christoph T. KOCH
08:00 - 18:15 #5215 - IM05-308 Unravelling the structural and property changes in graphite under high dose electron beam irradiation.
IM05-308 Unravelling the structural and property changes in graphite under high dose electron beam irradiation.

Neutron radiation damage is a significant problem for graphite moderated nuclear reactors where graphite serves as both the neutron moderator and a key structural component. Exposure to neutron radiation introduces a variety of chemical and physical property changes, such as a reduction in the thermal conductivity, increase in Young’s modulus and dimensional change, creating cracks [1]. Understanding the damage processes experienced by irradiated nuclear graphite over a range of length scales is essential in predicting the lifetime of the material, which influences the overall lifetime of the reactor.

In this study, electron irradiation is used as a surrogate for neutron irradiation. A multi-faceted approach has been applied to transmission electron microscopy (TEM)/ electron energy loss spectroscopy (EELS) data obtained from nuclear grade graphite exposed to the electron beam for differing time periods.  This involved deriving initial 3D structural models from a series of 2D TEM images at differing stages of damage, these models were then used to derive theoretical TEM and EELS data which were then in-turn compared to back to the experimental data from the same sample; finally these models were used to predict mechanical and transport properties relevant to reactor operation. 

TEM, selected area electron diffraction (SAED) patterns and EEL spectra were collected periodically (along the graphite [100] orientation) during electron beam exposure at 200 kV for 13 minutes (total fluence = 2 × 108 e-nm-2). Electron micrographs were subject to 2D image analysis to measure the change in (002) fringe length and tortuosity, following the method outlined in [2]. The EELS series were analysed to extract information about bond length and ratio of non-planar to planar sp2 bonded carbon, following the method outlined in [3]. In recent years, a reconstruction procedure has been developed, called image guided atomistic reconstruction (IGAR), that allows large and realistic representations of disordered, yet anisotropic, graphite-based carbons to be built [4–6], from data inferred from their TEM images (Figure 1). The IGAR procedure was applied to the experimental TEM image series to produce 13 separate models at differing stages of electron beam induced damage.  These models provide information about the different atomic environments of the carbon atoms within the structure, e.g. whether they are 2, 3 or 4-fold, sp2 bonded or defective. They were used to produce simulated TEM lattice images, which were analysed in the same way as experimental TEM images; the analysis results were then compared.  EEL spectra were also calculated from the reconstructed models using the plane wave density functional theory [7,8] (DFT) code CASTEP [9]. These were analysed in the same way as the experimental spectra (Figure 2). Experimental and theoretical data were compared and showed a reasonable correlation (Figures 3 and 4): the proportion of non-planar to planar sp2 bonded carbon was observed to increase following a fluence of 2 × 108 e-nm-2 and the C-C bond length was also observed to increase.

These reconstructed models bridge the gap between the primary damage obtained in former molecular dynamics studies which can only cope with short timescales, and the severe damage observed in TEM images and EEL spectra after prolonged exposure to neutrons or electrons.

[1]        D.E. Baker, Nucl. Eng. Des. 14 (1970) 413–444.

[2]        P.I. Raynal et al., Carbon Conf., 2010, pp. 1–2.

[3]        B.E. Mironov et al., Carbon 83 (2015) 106–117.

[4]        J.-M. Leyssale et al., Appl. Phys. Lett. 95 (2009) 231912.

[5]        J.-M. Leyssale et al., Carbon 50 (2012) 4388–4400.

[6]        B. Farbos et al., Carbon 80 (2014) 472–489.

[7]        P. Hohenberg, W. Kohn, Phys. Rev 136 (1964).

[8]        W. Kohn, L.J. Sham, Phys. Rev 140 (1965).

[9]        S.J. Clark et al., Zeitschrift Für Krist. 220 (2005) 567–570. 


Helen FREEMAN (Leeds, United Kingdom), Trevor HARDCASTLE, Baptiste FARBOS, Jean-Pierre DA COSTA, Rik BRYDSON, Andrew SCOTT, Christian GERMAIN, Gérard VIGNOLES, Jean-Marc LEYSSALE
08:00 - 18:15 #5268 - IM05-310 Effect of electron dose density on silicon nitride compared between two different atomic column elemental maps by 2D moiré and conventional methods.
IM05-310 Effect of electron dose density on silicon nitride compared between two different atomic column elemental maps by 2D moiré and conventional methods.

A challenge to expand a variety of samples in atomic column elemental mapping [1] is to overcome the sample damage caused by electron beam irradiation, since the signal of this method is smaller than that of imaging, due to small probability to generate the signals for elemental identification, such as energy loss electrons or X-ray emission.On the other hands, scanning transmission microscopy (STEM) moiré method is useful for strain analysis in semiconductor industry [2], since the method allows us to observe larger field view than conventional geometrical phase analysis utilizing real lattice fringes. Concurrently, the electron dose density is greatly reduced in STEM moiré method, since a pixel interval to form the pseudo lattice fringe is sparser than that to form a direct lattice.

We have tried to apply the 2D STEM moiré method to obtain a pseudo atomic column map [3]. In the 2D STEM moiré method, the electron density is reduced to be < 1 % of one used for the conventional method. With a flat area of a sample, the pseudo image map show identical intensity distribution and chemical information compare to the conventional elemental map, because the electron probe profiles  identical positions from each atomic sites in both methods, The pixel are intervals drmoire = dlattice + Δmoire for the moiré method and drdirect = Δdirect for the conventional method when Δmoiré is similar to Δdirect, where drmoire, drdirect and dlattice are a pixel interval in moiré method, a pixel interval in conventional method and the width of unit cell of a sample. It is noted that Δmoire is identical to Δdirect in the two methods. Figure 1 show the scheme of the relation. In this paper, we compare the effect of average electron dose density on atomic elemental column maps obtained by the two methods.

For the experiment, we used an aberration corrected microscope (JEOL, JEM-ARM200F) equipped with a cold field emission gun and dual SDD X-ray detection system, whose total solid angle is 1.73 sr. The results in this paper were obtained under the conditions: acc. Volt. = 120 kV, probe current = 38 pA, and probe size = 0.2 nm.  The sample we selected to be Si3N4, which is more of a robust sample for electron beam irradiation, since the sample was more likely to survive under beam irradiation. The crystallographic parameters for the sample are listed as a = b = 0.7617 nm and c = 0.291 nm. The sample thickness was estimated to be 45 nm judging from the X-ray emission rate.

Figure 2 shows the results taken by the 2D moiré and conventional methods. The results were accumulated over 508 cyclic acquisitions. The dwell time for a pixel in both methods was 1 ms.  The peaks in the Si map coincident with the atomic sites of the sample crystal structure in both methods.  However, the peaks in the N map do not show the atomic site configuration of the crystal structure in the map by direct method, especially on the N-Si hexagonal ring. Figure 3(a) and (b) show intensity profiles of Si, N and HAADF image signals on the maps by the two methods. While the peaks in the profile on the map by the 2D moiré method shown in Fig. 3(a) correlate well with atomic sites of N and Si. However, those in profile on the map by conventional method do not correlate with atomic sites of N. The difference between these elemental maps comes from the dose density. The dose densities for maps by moiré method is derived to be 4.79 x 1011 electrons/nm2 from the measured na and nb, where na and nb are numbers of pixels inside the mignified unit cell in the 2D moiré HAADF image. The dose density for the map by the direct method is simply calculated to be 1.62 x 1015 electrons /nm2 from the experimental conditions. The reduced rate of the dose density by 2D moiré method was one three-thousandth to the direct method.

In conclusion, the results clearly show the effect of dose density on sample in atomic resolution elemental mapping with reduced dose density realized by the 2D moiré method. The method can be used for analysis of beam-sensitive samples, , which does not need high resolution but need to see the atomic sites in a unit cell such as ions in battery materials. And the method can be used to check the critical dose density for unanalyzed samples.

 

References

 

[1] E Okunishi et al, Microsc. Microanal. 12(S2) (2006), p.1150.

[2] N Endo and Y Kondo, Proc. 32th LSI Testing Symposium (Osaka) (2012), p. 73.

[3] Y Kondo and E Okunishi, Microscopy 63(5) (2014), p. 391.


Yukihito KONDO, Eiji OKUNISHI (Tokyo, Japan)
08:00 - 18:15 #5281 - IM05-312 Precise atomic column position measurements using ISTEM.
IM05-312 Precise atomic column position measurements using ISTEM.

Nowadays, high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) is one of the most popular materials’ characterisation techniques because of its ability to provide direct structural images at the atomic resolution [1]. Recently, Rosenauer et al. proposed a new imaging technique called imaging STEM (ISTEM) combining the conventional TEM imaging with STEM illumination [2]. This new, spatially incoherent imaging mode is particularly interesting as it provides direct structural images and visualisation of light elements, while it is robust towards chromatic aberrations. In this work, the ISTEM and STEM precision with which atomic column positions can be measured in a quantitative manner are compared.

In HAADF STEM imaging, statistical parameter estimation theory is an excellent tool to quantitatively extract structure parameters [3]. Here, an empirical model is fitted to an experimental image by optimising a criterion of goodness of fit. In this model, the shape of an atomic column is described by a Gaussian peak. The parameters of this empirical model can be linked to the unknown structure parameters of the material under study. The precision with which those parameters can be measured is mainly determined by the presence of shot noise and scan noise in the images. While post-processing techniques reduce both effects [4,5], scan noise errors and probe instabilities have no influence in the ISTEM imaging mode as images for all probe positions are integrated. Therefore, it is expected that without the use of post-processing techniques, atomic column positions can be measured more precisely for ISTEM imaging as compared to STEM imaging.

This assumption is tested on experimental images of PbTiO3. The ISTEM image in Fig. 1a clearly resolves the light oxygen columns, while in the HAADF STEM image, Fig. 2a, these columns cannot be resolved. In order to extract the atomic column positions, Gaussian models are fitted to both images, shown in Figs. 1b and 2b. The precision with which individual column positions can be estimated is determined by calculating the standard deviation on the distance between the columns (Fig. 3). These results confirm that atomic column positions are measured more precise for ISTEM as compared to ADF STEM imaging. Furthermore, it demonstrates that the position of individual light atomic columns, like oxygen columns in the present example, can be estimated with a precision in the picometer range.

In conclusion, it is shown that ISTEM is a very promising technique for precise measurements of atomic column positions.

 

References

[1] Pennycook and Jesson, Physical Review Letters 64 (1990), p. 938

[2] Rosenauer et al., Physical Review Letters 113 (2014), 096101

[3] Van Aert et al., Ultramicroscopy 109 (2009), p. 1236

[4] Sang and LeBeau, Ultramicroscopy 138 (2014), p. 28

[5] Jones et al., Advanced Structural and Chemical Imaging 1 (2015), 8

 

The authors acknowledge financial support from the Research Foundation Flanders (FWO,Belgium) through project fundings (G.0374.13N, G.0369.15N and G.0368.15N) and a PhD grant to K.H.W. van den Bos. The research leading to these results has also received funding from the European Union Seventh Framework Programme [FP7/2007- 2013] under Grant agreement no. 312483 (ESTEEM2).


Karel H W VAN DEN BOS (Antwerp, Belgium), Florian F KRAUSE, Armand BÉCHÉ, Johan VERBEECK, Andreas ROSENAUER, Sandra VAN AERT
08:00 - 18:15 #5339 - IM05-314 Measurement of Diffraction Pattern Distortions for Quantitative STEM.
IM05-314 Measurement of Diffraction Pattern Distortions for Quantitative STEM.

The shape and sensitivity distribution of the detector used for the acquisition of STEM micrographs is of the utmost importance for the accuracy of quantitative evaluation. This is especially the case for HAADF-STEM, which is frequently used for thickness measurement and chemical composition determination using Z-contrast. The roundness and uniformity of different available ring detectors and the influence of the exact centering on the optical axis has consequently been a central item of investigation in numerous publications [Ultramicroscopy 108, 1653 (2008); Ultramicroscopy 124, 50 (2015); J. Phys. Conf. Ser. 522, 012018 (2014)]. In those, the detector sensitivity is commonly characterised by scanning the focused electron probe over the detector without a specimen working in imaging mode to get a so-called detector scan. While this allows for a precise measurement of the shape and sensitivity of the physical detector itself, using the imaging mode for this detector scan completely neglects any effects that will occur exclusively in diffraction mode, in which the actual STEM acquisitions are done.

However, looking at a diffraction pattern in a microscope with an image aberration corrector quickly reveals that the diffraction pattern is indeed strongly distorted with a symmetry corresponding to the corrector architecture and also is limited by a visible cutoff at higher spatial frequencies, which can be seen in the diffraction pattern in Fig. 1. The distortion field responsible for the deformation can strongly change the shape of the effective detector sensitivity experienced by the scattered electrons: Electrons leaving the specimen under a certain angle may be deflected into a completely different area of the detector than expected without the distortions or may not even reach the detection plane at all due to the cutoff. Therefore even a perfectly round and uniform detector can result in an unfavourable anisotropic sensitivity.

To take all these effects of the diffraction pattern into account, an alternative detector scan procedure that is operated in diffraction mode is presented [Ultramicroscopy 161, 146 (2016)]. It allows direct determination of the effective sensitivity of the detector, which includes both the cutoff and all occurring distortions. This "tilt-based" detector scan method is easy to implement and automatable.

The effective detector sensitivity of a Fischione Model 3000 HAADF detector in an image corrected FEI Titan 80-300 microscope was characterised with the tilt-bases detector scan for various camera lengths and clear and significant differences to the conventionally determined sensitivities were found. The results are shown in Fig. 2: The effective sensitivity is not nearly as round as the almost perfectly annular form of the physical detector, which partially results in large deviations in the radial sensitivity curves. The quantitative influence of these deviations on the results of thickness and composition measurements was investigated.

In a further study, the tilt-based detector scan method was combined with an aperture in front of the detector plane to measure not only the effective sensitivity but also the radial position where specific scattering angles are detected in the detection plane. From this the radial distortion field can be extracted.


Florian F. KRAUSE (Bremen, Germany), Marco SCHOWALTER, Tim GRIEB, Knut MÜLLER-CASPARY, Thorsten MEHRTENS, Andreas ROSENAUER
08:00 - 18:15 #5448 - IM05-316 Engineering the Contrast Transfer through the Cc/Cs Corrected 20−80 kV SALVE Microscope.
IM05-316 Engineering the Contrast Transfer through the Cc/Cs Corrected 20−80 kV SALVE Microscope.

Modern aberration-corrected transmission electron microscopy (AC-TEM) is able to routinely image sample structures with true atomic resolution with a resolution better than 1 Å. Unfortunately, the energy of the electrons used for imaging accelerated with voltages of 200–300 kV damages the samples under observation. Especially, light elements suffer severe damage via the knock-on mechanism [1–3]. To avoid this kind of sample damage, imaging at lower acceleration voltages of 60–80 kV became popular recently to undercut the threshold for knock-on damage and thanks to geometrical aberration correction, an image resolution of below 2 Å can be maintained. One interest when performing atomic resolution microscopy of thin and/or light-element materials lies in interfaces and defects and there, the aforementioned damage threshold is significantly lowered calling for even lower imaging electron energies [4,5].

In TEM at acceleration voltages of 30 kV and lower, in addition to the spherical aberration, the chromatic aberration coefficient of the imaging lens limits the resolution. The chromatic aberration can be corrected by using a Cc/Cs corrector [5] or it can be minimized by employing a monochromator for the primary electrons [6].

In this contribution, we discuss the optimum imaging parameters for the contrast transfer through the 20−80 kV Cc/Cs corrected SALVE (sub angstrom low voltage electron microscope) instrument. This includes the influence of a partially adjustable positive fifth order spherical aberration. Positive and negative phase contrast transfer are compared with the help of graphene images taken at different electron acceleration voltages; in the example in Figure 1 imaging has been performed at 30 kV at positive and negative atom contrast; as can be seen from the Fourier transform inserted, frequencies up to (107 pm)-1 have been transferred [7].


Acknowledgements

Fruitful cooperation within the SALVE project and financial support by the DFG (German Research Foundation) and by the Ministry of Science, Research, and the Arts (MWK) of Baden-Württemberg are gratefully acknowledged.


[1] F Banhart, Reports on Progress in Physics 62 (1999), p. 1181.
[2] R F Egerton, P Li, and M Malac, Micron 35 (2004), p. 399.
[3] J C Meyer et al, Physical Review Letters 108 (2012), p. 196102.
[4] T Sasaki et al, Journal of Electron Microscopy 59 (2010), p. S7.
[5] U Kaiser et al, Ultramicroscopy 111 (2011), p. 1239.
[6] S Morishita et al, Applied Physics Letters 108 (2016), p. 013107.


Felix BÖRRNERT (Ulm, Germany), Johannes BISKUPEK, Zhongbo LEE, Martin LINCK, Peter HARTEL, Heiko MÜLLER, Maximilian HAIDER, Ute KAISER
08:00 - 18:15 #5701 - IM05-318 Aberration corrected HRTEM imaging of zeolitic nanocavities.
IM05-318 Aberration corrected HRTEM imaging of zeolitic nanocavities.

Zeolites composed of alumino-silicate frameworks have great potentials in various fields. Their covalent frameworks built from TO4-tetrahedra (T: Si or Al) produce various kinds of nano-cavities inside the crystals. These characteristic nanospaces play important roles in the various applications of zeolite. Non-framework species such as counter cations and adsorbed molecules are located within nanocavities. Structural information of such non-framework species is essential for understanding specific behavior of zeolites. High resolution imaging by an aberration corrected (scanning) transmission electron microscopy (AC-(S)TEM) has been a powerful technique for structural analyses of various materials. However, structural parameters of non-framework species within zeolitic nanocavities are too complex to analyze quantitatively with AC-(S)TEM observations. As the first step of qualitative analysis for non-framework species, it could be important to examine whether the nano-cavities are empty, in order that it is necessary to evaluate the image contrast of the empty cavities. In this study, we consider the AC-HRTEM image contrast of zeolitic nano-cavities by experimental observations and multi-slice image simulation depending on optical conditions and specimen thickness.

Commercially available high silica type MFI and FAU type zeolites with Si/Al ratios of 3760 and 1540 respectively were used in this study. In order to ignore the contribution of counter cations to AC-HRTEM image, counter cations of these materials had been substituted originally to H+. Crystalline samples were crushed in an agate mortal with ethanol and collected on a gold coated TEM microgrid. The observations were performed on a JEOL JEM2200FS (accelerating voltage of 200kV) attached with a CS corrector (CEOS CETCOR). In order to remove molecules adsorbed in zeolite, the specimens were held in a vacuum of microscopic column overnight prior to observation. The CS values were controlled to be +15 µm or –15 µm. All HRTEM images were taken by a slow scan CCD camera (14 µm × 14 µm of 2048 × 2048 pixels, Gatan UltraScan 1000). The images were magnified by ~ 200 thousand times on the camera. Simulation of AC-HRTEM images were executed on Total Resolution LLC MacTempas X based on a multi-slice method. Comparing an experimental AC-HRTEM image and a simulated through focus image series for various thickness of thin crystal, we find out an optimum focused area from one image. Pure silicalite composition was applied as a structural model for image simulations. So no counter cations were included in structural models for simulations.

Figure 1(a) shows structural models projected along [100] direction of the monoclinic MFI-type zeolite with the unit cell dimensions of a = 1.9879 nm, b = 2.0107 nm, c = 1.3369 nm and β = 90.67°. The straight cavities are consisted of 10 membered ring surrounded by eight 5 membered rings and two 6 membered rings. As shown in Fig. 1(b), the amplitudes of exit wave function (EXWF) were increased at atomic column positions by electron channeling, in exchanged for reduction at neighboring area. Especially, amplitudes of EXWF at small channels go out of unity due to the adjacent atomic columns. The amplitude and phase of EXWF are intricately converted into the phase and amplitude on image plane, according to Lichte’s diagram. For quantitative imaging of nanocavities as vacuum, it is necessary to make samples thinner to the utmost. Fig. 2 shows experimental AC-HRTEM images taken under negative CS imaging (NCSI) and positive CS imaging (PCSI) conditions. Even with high resolution imaging in atomic scale, the contrast modulation of the area surrounding atomic columns is not so small. So the image contrasts of small zeolitic cavities swerve from the intensity of vacuum region.

 

Acknowledgements

A part of this work was supported by CREST, JST. A part of this work was supported by Kyoto University Nano Technology Hub in "Nanotechnology Platform Project" sponsored by the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan.


Kaname YOSHIDA (Nagoya, Japan), Yukichi SASAKI, Hiroki KURATA
08:00 - 18:15 #5740 - IM05-320 Microscopy Image Browser: an open-source platform for segmentation and analysis of multidimensional datasets.
IM05-320 Microscopy Image Browser: an open-source platform for segmentation and analysis of multidimensional datasets.

Understanding the structure – function relationship of cells and cell organelles in their natural context requires multidimensional imaging. Recent technical advances especially in multimodal 3D-5D imaging techniques have enabled a new insight into the morphology of tissues, cells and organelles. As the performance and access to such techniques are improving, the amounts of collected data are growing exponentially posing a question about effective processing, visualization, and analysis of these large datasets. Quite often the detailed analysis of multidimensional data is impossible without segmentation of objects of interest out of the volume (creating of a model). Usually the segmentation is the most time consuming and challenging part of the image analysis routine. For example, it may take up to a month to properly segment a single electron tomogram. The slowness of the process is caused by two main factors: limited number of good software tools (even commercial ones) and segmentation algorithms that can be applied to facilitate the modeling. As a result, the real potential of the collected data is not completely realized.

Here, we present a free user-friendly software package (Microscopy Image Browser, MIB) for effective segmentation and image processing of multidimensional datasets that improves and facilitates the full utilization of acquired data and enables quantitative analysis of morphological features. MIB is written in Matlab language which is familiar to many researchers and available for main common operating systems (Windows, Mac and Linux); alternatively MIB is also distributed as a standalone package for both Windows and Mac OS. The access to the code and the open-source environment enables fine tuning and possibility of adding new plug-ins to customize MIB for specific needs of any research project.

Even though the focus of the program is 3D segmentation of electron microscopy datasets, MIB is rather universal and can be used to perform segmentation, analysis and visualization of 2D-4D datasets obtained by light microscopy.

We already utilized MIB in more than 10 scientific research projects, where it allowed us to facilitating the segmentation part of the image processing workflow significantly. Here we demonstrate its successful application by presenting results of segmentation and quantification of cells and different cellular organelles imaged using various electron and light microscopy techniques.


Ilya BELEVICH (Helsinki, Finland), Merja JOENSUU, Darshan KUMAR, Helena VIHINEN, Eija JOKITALO
08:00 - 18:15 #5757 - IM05-322 A morphological approach for texture detection, application to SEM stereo reconstruction.
IM05-322 A morphological approach for texture detection, application to SEM stereo reconstruction.

3D surface reconstruction from multiple SEM images has been widely addressed in the scientific literature. Different approaches exist, most of them use variants of Digital Image Correlation (DIC) [1][2].

 

DIC methods perform well on textured areas of images but provide limited results on uniform or flat zones. Approaches using segmentation techniques, that match discernible regions of images, provide a solution to solve this problem on low-textured regions [3]. However, these methods are more computationally expensive and are less accurate than DIC on textured areas. Our objective is therefore to combine these two methods. One preliminary step is to differentiate textured areas, where DIC can be used, from low-textured areas, where segmentation techniques are needed. This step will be addressed in this paper, and we propose a new approach using morphological operators to do that.

 

Our approach uses the watershed operator with morphological gradient and markers obtained with h-minima [4]. On each region, average gradient value is computed. Automatic thresholding and post processing using opening by criteria [5] is then performed to differentiate textured areas from low-textured ones.

 

Comparison of our approach with more standard methods of texture detection such as local entropy of local variance calculations [6] will be presented.

 

A major benefit of our approach is that transition between textured areas and low-textured ones strongly follow real contours of flat zones, limiting interpolation problems between DIC and methods using segmentation techniques.

 

We will illustrate our texture detection algorithm by applying it on 3D surface reconstruction with SEM images of crystals of zeolites and catalyst with alumina supports.

 

[1] J.V. Sharp (et al), 1965. Automatic Map Compilation Using Digital Techniques. Photogrammetric Engineering. Vol. 31, No 2, pp. 223-239.
[2] Accurate 3D Shape and Displacement Measurement using a Scanning Electron Microscope. PhD Thesis, University of South Carolina, Institut National des Sciences Appliquées de Toulouse, Juin 2005.
[3] Jean-Charles Bricola, Michel Bilodeau, and Serge Beucher. A top-down methodology to depth map estimation controlled by morphological segmentation.
[4] Serge Beucher. Segmentation d’images et Morphologie Mathématique. PhD thesis, Ecole Nationale Supérieure des Mines de Paris, Juin 1990.
[5] Thomas Walter. Application de la Morphologie Mathématique au diagnostic de la Rétinopathie Diabétique à partir d’images couleur. PhD thesis, Ecole Nationale Supérieure des Mines de Paris, 2003.
[6] K. Itoh, A. Hayashi, and Y. Ichioka, “Digitized optical microscopy with extended depth of field,” Appl. Opt., vol. 28, no. 15, pp. 3487–3493, 1989.

is that transition between textured areas and low-textured ones strongly follow


Sébastien DROUYER (Fontainebleau), Serge BEUCHER, Michel BILODEAU, Maxime MOREAUD, Loïc SORBIER
08:00 - 18:15 #5831 - IM05-324 MASDET2 – software for quantitative STEM imaging.
IM05-324 MASDET2 – software for quantitative STEM imaging.

The idea of mass determination using a TEM was first proposed by E. Zeitler and G. F. Bahr [1]. The principle based on the single electron scattering approach (approximately linear relationship between the fraction of incident electrons scattered by a thin proteinaceous specimen and its molecular mass) was realized experimentally later by dedicated scanning transmission electron microscopes (STEM) equipped by a field emission gun and an annular dark-field (ADF) detector (for actual review see [2]). Besides the aforementioned technical realization, several mass determination software packages for the data analysis were developed independently – IMPSYS [3] and PCMass [4]. This idea for mass determination was later applied to so-called low voltage STEM by extending a commercial SEM by a proper ADF detector [5] and dedicated software MASDET [6] that worked on the linear approximation like IMPSYS. Here, we report on extensions of MASDET program that uses nonlinear relations and significantly extends applicable range of thickness.

Typically, programs using the single electron scattering approach give only exact results for samples not thicker than a few percent of the mean-free-path-length (MFPL) of the impinging electrons. One improvement was introduced in MASDET, using a so-called linearization, where the applicable range of thickness was extended to approximately 2x MFPL [6]. Here, we present MASDET version 2 which avoids the limitations of the linear approximation by determining the nonlinear relation between signal and mass with the help of Monte Carlo simulation software packages like MONCA [7]. With this improvement we may reach thicknesses approximately 7x MFPL (note that this depends on the detection geometry of the STEM detector).

As the previous version, MASDET2 has a user-friendly graphical interface allowing almost all operations to be done by mouse. It relies on MATLAB (MathWorks), and therefore should run under all systems suitable for MATLAB. MASDET2 allows the mass of specified regions of interest (ROI) to be calculated conveniently and in a highly automated manner from the digital ADF micrographs and recording parameters. Three procedures are available allowing the calculation of the mass-per-area (MPA) of sheet-like structures, the mass-per-length (MPL) of filaments, and the mass-per-particle (MPP) of globular particles.

Note that all calculations are done as absolute measurements without any mass calibration standards. Figure 1 shows the proof-of-principle measurement. Here, Tobacco Mosaic Virus (TMV) was investigated. For the mass calculations the relation of the ADF signal vs thickness was simulated using MONCA (for comparison a relation for lipid is shown on Figure 1b; the used SEM is S-5000 (Hitachi) equipped by a home-made ADF detector, operating at 30 keV). With this relation, the recorded signal can be converted into a mass value which can be finally added up in each ROI. Figure 1c shows the final result of the MPL determination which is 126±4 kDa/nm. After correction of the beam-induced mass loss, see figure 1d, which can also be done within the new version of MASDET2 software, the MPL value of TMV was corrected to 131±6 kDa/nm which represents the theoretical MPL value of TMV, see also [8].

References:

1. Zeitler, E. and G.F. Bahr, Journal of Applied Physics 33 (1962), 847-853.

2. Hawkes, P.W., ed. Advances in Imaging and Electron Physics 159 (2009).

3. Müller, S.A., et al., Ultramicroscopy 46 (1992), 317-334.

4. Wall, J.S. and M.N. Simon, Methods in Molecular Biology 148 (2001), 589-601.

5. Krzyzanek, V., et al., Microscopy and Microanalysis 19(S2) (2013), 130-131.

6. Krzyzanek, V., et al., Journal of Structural Biology 165 (2009), 78-87.

7. Krzyzanek, V. and R. Reichelt, Microscopy and Microanalysis 9(S3) (2003), 110-111.

8. Tacke, S., et al., Biophysical Journal 110 (2016), 758-765.

9. This research was supported by the grants 14-20012S (GACR) and RE 782/11 (DFG).


Vladislav KRZYZANEK (Brno, Czech Republic), Sebastian TACKE
08:00 - 18:15 #5833 - IM05-326 Effects of instrument imperfections on quantitative scanning transmission electron microscopy.
IM05-326 Effects of instrument imperfections on quantitative scanning transmission electron microscopy.

Quantitative scanning transmission electron microscopy is widely used for structural and chemical analysis nowadays. Experimental data can be directly compared with simulations by normalizing raw intensities J with respect to the incoming beam intensity J1-Jo [1]. J1 is usually determined by scanning the electron beam in image mode over the detector. From the detector region the intensity J1 and from regions beside the detector an offset intensity J0det is determined that has to be subtracted from J and J1. The normalized intensity I can be derived by I=(J-J0det)/(J1-J0det). However, typical detector scans exhibit a non-circular shape and non-uniform sensitivity. These effects are usually taken into account by a radial sensitivity curve in simulations [1,2].

In this contribution we present several further instrumental imperfections and characterize how they affect quantitative STEM using the example of measurement of specimen thickness:

1. The effect of centering of the diffration pattern and the anisotropy of the ADF detector was studied as follows: A 2-D sensitivity map was generated from a detector scan and then used to derive the average ADF intensity in a unit cell of GaAs. The sensitivity map was rotated or shifted with respect to simulated diffraction patterns. Then the relative intensity to the perfectly centered case was calculated. The error in the ADF intensity caused by different rotations was found to be only 0.5 %, whereas a decentering of only 7 mrad causes an error of about 6 %.

2. A cut-off and distortions of the diffraction pattern due to an image corrector have been found (Fig. 1a). These effects can be taken into account by a detector scan procedure, where the beam is scanned over the detector in diffraction mode by tilting the incoming electron beam. The advantage of this procedure is that cut-off and distortions are directly embedded in an effective sensitivity (Fig. 1b). We found the most severe deviation of the sensitivity map for a camera length of 102 mm. The respective radial sensitivity is compared in Fig. 1c with the conventional one. At this camera length an error of about 15 nm specimen thickness for 50 nm GaAs would be found, if cut-off and distortions would be neglected by using a conventional detector scan procedure.

3. Intense illumination, as e.g. a zero beam positioned accidentally on the detector, might cause a local sensitivity enhancement as shown in the inset of Fig. 2a. This results in a modification of the sensitivity curve (Fig. 2a). The modification of the sensitivity may cause an error of about 1 nm for thickness measurement of 50 nm GaAs.

4. We found that the measured incoming beam intensity J1 depends on the dwell time and is overestimated for long dwell times (Fig. 2b), independently on the previous history of the detector. This effect can lead to a thickness underestimation of about 4 nm for 50 nm thick GaAs.

5. An afterglow of the detector with a typical decay time of about 260 μs was found (Fig. 3a). This afterglow results in an overestimation of the bias of the amplifier from a detector scan, if J0det is determined by averaging over a region beside the detector. This overestimation leads to negative normalized intensities in an image from a vacuum region. Histograms of detector scans (Fig. 3c) reveal a sharp peak at an intensity J0amp that is attributed to the bias level of the amplifier, suggesting the usage of J0amp.

6. The usage of J0amp results in a positive normalized intensity in vacuum regions. Histograms of such regions revealed that accidental electrons hit the detector (Fig. 3b) [3,4] and therefore the mean value of the intensity in a vacuum image J0vac must be used for J0det. Effects 5 and 6 together may result in an error of about 2.3 nm for a 5 nm thick Si specimen, which is a significant error in an atom counting experiment.

The reported instrumental imperfection have been investigated using our FEI Titan80-300 ST microscope equipped with an corrector for the aberrations of the imaging lens and a Fischione HAADF detector. 

[1] J.M. LeBeau, S. Stemmer, Ultramicroscopy 108 (2008) 1653.

[2 ] A. Rosenauer, et al., Ultramicroscopy 111 (2011), 1316.

[3] R. Ishikawa, et al., Microsc. Microanal. 20 (2014) 99.

[4] F.F. Krause, M. Schowalter et al., Ultramicroscopy 161 (2016), 146.


Marco SCHOWALTER (Bremen, Germany), Florian Fritz KRAUSE, Tim GRIEB, Knut MÜLLER-CASPARY, Thorsten MEHRTENS, Andreas ROSENAUER
08:00 - 18:15 #5994 - IM05-330 Denoising and compensation of the missing wedge in cryo electron tomography.
IM05-330 Denoising and compensation of the missing wedge in cryo electron tomography.

In this study, we have addressed two important issues in cryo electron tomography images: the low signal-to-noise ratio and the presence of a missing wedge (MW) of information in the spectral domain. Indeed, according to the Fourier slice theorem, limited angle tomography results into an incomplete sampling of the Fourier domain. Therefore, the Fourier domain is separated into two regions: the known spectrum (KS) and the unknown spectrum, the latter having the shape of a missing wedge (see Figure). The proposed method tackles both issues jointly, by iteratively applying a denoising algorithm in order to fill up the MW, and proceeds as follows: 

[1] Excitation step: Add noise into the MW

[2] Denoising step: Apply a patch-based denoising algorithm

[3] Repeat steps 1 and 2, by keeping KS constant through the iterations

The excitation step is used to randomly initialize the coefficients of the MW, whereas the denoising step acts as a spatial regularization. The employed denoising algorithm, which exploits the self-similarity of the image, filters out coefficient values which are dissimilar to KS, thereby keeping similar ones. By iterating these steps, we are able to diffuse the information contained in KS into the MW.

An application example on experimental data can be seen on the Figure, which shows the data in both spectral and spatial domain. The data contains a spherical gold particle, deformed by MW induced artifacts: elongation of the object, side- and ray-artifacts. From the residue image it can be seen that noise and MW artifacts have been reduced, while preserving the details of the image. Experiments are being performed to verify if particle detection and alignment are enhanced by using the method as a pre-processing step. 


Emmanuel MOEBEL (RENNES), Charles KERVRANN
08:00 - 18:15 #5995 - IM05-332 Plasma cleaning effect on the stability of the Epon resin sections.
IM05-332 Plasma cleaning effect on the stability of the Epon resin sections.

Low voltage TEM and STEM (transmission and scanning transmission electron microscope) can be regarded as the method of choice for many structural studies of very thin biological samples like ultrathin sections, viruses etc. [1]. Unfortunately, the specimen contamination increases with electron flux and therefore a specimen cleanliness is an important factor in obtaining of valuable data especially in STEM [2]. An important parameter for imaging of those samples is a sensitivity of the sample to degradation by electron beam. The mass loss indicates a degree of the radiation damage. We investigated the mass loss of embedding medium (Epon resin of middle hardness) in combination of different thickness of the sections (60 nm and 150 nm) with using or not-using of plasma cleaning which is often used to removing of contamination from the sample.

The repeated imaging was performed by SEM Magellan 400L (FEI) at the acceleration voltage of 30 kV and the lowest possible probe current of 1.6 pA in the bright field (BF) using the commercial STEM3 detector (FEI). An electron dose for each scan was about 60 e-/nm2. The measurement was performed at the eighth day after their preparation by the ultramicrotome Leica Ultracut UCT. Some slices were cleaned by Plasma Cleaner (FEI) installed at the Magellan SEM for 20 seconds just before imaging, so they did not leave high vacuum. For each experiment, three different places on each sample were imaged for downgrading space dependency of the measurement. The mass loss was obtained from the normalized BF signals using the Monte Carlo simulation of electron scattering MONCA [3] using the methodology of mass measurements by STEM [4]. All data processing was programmed in MATLAB (Mathworks).

As seen on Fig. 1a, the normalized BF signal (showing the fraction of scattered electron to the BF detector) has similar shape in both thicknesses of the slices without plasma cleaning; the curves are shifted only by the different thickness. However, slices treated with the plasma cleaner show higher sensitivity to incident electron beam with rapidly increasing BF signal; Fig. 1b) shows the remaining mass. At the total irradiation dose of 3000 e-/nm2 there still remains 89% of initial mass for the 150 nm slice and 70% for the 60 nm slice, respectively. However, the slices cleaned by plasma cleaning are much more sensitive to the electron beam, with remaining 55% for the 150 nm slice and local destruction for the 60 nm slice. We observed higher sensitivity of cleaned Epon thin sections under incident electron beam. This limits the usable dose for imaging by the low voltage STEM (for 30 kV) because cleaned sections are more susceptible to burn-out than non-cleaned ones.

References:

[1] H. Schatten, J. W. Jan, A. Litwin, Scanning Electron Microscopy for the Life Sciences, New York: Cambridge University Press (2013) ISBN 9780521195997.

[2] D. R. G. Mitchell, Micron, 73 (1993), 36-46.

[3] V. Krzyzanek, R. Reichelt, Microscopy and Microanalysis, 9 (2003), 110-111.

[4] V. Krzyzanek, S. A. Muller, A. Engel, Journal of Structural Biology, 165 (2009), 78-87.

[5] The research was supported by the Czech Science Foundation (GA14-20012S), Technology Agency of the Czech Republic (TE01020118), Ministry of Education, Youth and Sports of the Czech Republic (LO1212). The research infrastructure was funded by Ministry of Education, Youth and Sports of the Czech Republic and European Commission (CZ.1.05/2.1.00/01.0017).


Radim SKOUPÝ (Brno, Czech Republic), Vladislav KRZYZANEK, Jana NEBESAROVA
08:00 - 18:15 #6010 - IM05-334 Atom-counting in a non-probe corrected STEM.
IM05-334 Atom-counting in a non-probe corrected STEM.

In recent years scanning transmission electron microscopy (STEM) has attracted great attention due to its high sensitivity with respect to atomic number and specimen thickness. The great advantage of this technique is to determine the number of atoms in single atomic columns in the specimen [1,2]. For instance, the reconstruction of the atomic structure of Ag nanoparticles was realized by acquiring a small series of high resolution STEM images in different zone axis orientations. Such a reconstruction enables to study facets of nanoparticles.

Basically two different atom counting techniques exist: (1) In simulation-based techniques typically the mean intensity in a well-known material within a certain region around each atom column position, such as a Voronoi cell [3] is measured and compared with appropriate simulations. (2) Statistics-based techniques, as introduced by Van Aert et al. [2] fit a parametric model consisting of Gaussians at the positions of the atom columns to the image intensities. Then volumes below the Gaussians are computed. Gaussian mixture models are fitted to the distribution of the volumes using the expectation maximization algorithm (see e.g. Fig. 1a) as a function of the number of Gaussian components. For each fit an order selection criterion is computed and plotted as shown in Fig. 1b. The minimum of the order selection criterion then determines the number of components in the applicable mixture model [2,4]. Finally, the number of atoms (Fig. 1c) in each column is determined by maximizing the probability that a column's intensity volume belongs to a certain component of the selected mixture model. The component with smallest volume is assumed to belong to a column with one atom.

Usually, atom counting is performed using probe corrected STEM. We performed a simulation test, whether atom counting is possible in a non-probe corrected STEM on a hypothetical Au wedge used by De Backer et al. [4]. In the respective model the number of atoms increases from 1 to 7 and then decreases again from 7 to one. From Fig. 1 it becomes clear that atoms were correctly counted from the simulated image.

In general it can be expected that the column with mimimum number of atoms in an image does not necessarily contain only one atom. We studied the effect of an offset in the number of atoms on the counting result by adding additional layers of Au on top of the model. In order to account for the offset in the statistics-based measurement positions of the Gaussian components were linearly fitted and the respective offset was derived from the parameters of the fit. We found that for small offsets the method worked reasonable, however for an offset of 7 atoms the number of atoms was overestimated by one atom, due to small deviations from the linear behaviour of the volumes. For a larger offset of 13 atoms severe errors were observed and a combination with simulations is needed to retrieve the offset value [5].

In a further test we added an amorphous carbon layer to an InAs cleavage wedge (Fig. 2a). Fig. 2b shows that the statistics-based method well identifies the number of atoms despite the amorphous carbon layer. Errors can be observed for simulation-based atom counting due to the additional intensity arising in the amorphous carbon layers.

Fig. 3a shows an experimental HRSTEM image of a twinned Pt nanoparticle taken in our non-probe corrected Titan 80-300ST. Atoms have been counted in one of the twins using the simulation-based atom counting technique (Fig 3b). For a statistics-based atom counting evaluation the same limits have been found. For the evaluations instrumental imperfections such as reported in ref. [6] were taken care.

[1] J. M. LeBeau, S. D. Findlay, L.J. Allen and S. Stemmer, Nano Letters 10 (2010), 4405.

[2] S. Van Aert, K.J. Batenburg, M.D. Rossell, R. Erni and G. Van Tendeloo, Nature. 470 (2011) 374.

[3] A. Rosenauer et al. Ultramicroscopy 109 (2009), 1171.

[4] A. De Backer, G.T. Martinez, A. Rosenauer and S. Van Aert, Ultramicroscopy 134 (2013) 23.

[5] S. Van Aert, et al. Phys. Rev. B 87 (2013), 064107

[6] F.F. Krause, M. Schowalter et al., Ultramicroscopy 161 (2016), 146.


Marco SCHOWALTER, Beeke GERKEN (28359 Bremen, Germany), Florian Fritz KRAUSE, Tim GRIEB, Knut MÜLLER-CASPARY, Christoph MAHR, Thorsten MEHRTENS, Mehtap ÖZASLAN, Annick DE BACKER, Sandra VAN AERT, Andreas ROSENAUER
08:00 - 18:15 #6056 - IM05-336 Focal series reconstruction of bismuth telluride using a conventional transmission electron microscopy.
IM05-336 Focal series reconstruction of bismuth telluride using a conventional transmission electron microscopy.

High Resolution Transmission Electron Microscopy allows the determination of the crystalline structure of materials through various methods of electron diffraction or direct imaging. However, the interpretation and quantification of the high-resolution images are complex, because of the strong interaction between the electron beam and the material [1]. Besides, the material’s exit wave function is modified by the components of the microscope [2]. As the high-resolution microscopy images are a convolution between the exit wave function of the sample and the function of the microscope, the interference fringes can be modified changing the condition of defocus [3]. The aim of the research is to understand the focal series reconstruction routines and use them in the study of bismuth telluride and its alloys, in order to identify their crystalline structure.

Through focal series reconstruction is a technique consisting in obtaining high-resolution image series with different values of defocus, generating different conditions of constructive and destructive interference fringes. At the same time, high-resolution images are simulated from a theoretical model of the crystal convoluted with the transfer function of the microscope, considering several types of aberration of the microscope, where the spherical aberration of the objective lens and the chromatic aberration are dominant. The simulated images are compared with the experimental images and through the correlation between them the theoretical model is optimized. There are several software packages which can be used to simulate the structure and/or generate a focal series: JEMS, True Image, FTSR, IWFR and REW. The present work shows the first results on focal series reconstruction routine using REW [4].

Bismuth telluride, Bi2Te3, is a thermoelectric material with high coefficients at room temperature [5] and has recently been identified as a topological insulator [6], with rhombohedral crystal structure and space group R(-3)m with five atoms per unit cell. When aligned in the [2,-1,-1,0] direction is possible to visualize the quintuple layer structure of Te-Bi-Te-Bi-Te. Studies related to the doping of Bi2Te3, in which some elements are intercalated among their quintuple layers [7], have been conducted in order to determine the variations of their basic properties. The focal series reconstruction will be used to verify the quality of the intercalation experiment.

A through focal series of 20 high resolution images was taken of a Bi2Te3 sample prepared via ultramicrotomy, approximately 20-30 nm thick, using a Tecnai G-20 LaB6 S-Twin (Cs = 1.2 mm) at 200 keV. A magnification of 490kx was used over a range of focus of -180.09 nm to 9.09 nm, with a focus variation of approximately of 10 nm. The HRTEM image at the Scherzer focus is shown in Figure 1, and the image of amplitude and phase resulting from the exit wave reconstruction of the sample using the software REW are shown in Figure 2 and Figure 3.

It is possible to identify the atomic position of bismuth and tellurium in the quintuple layers of the phase image obtained from the focal series reconstruction, as shown in Figure 4, using a conventional transmission electron microscope.

References

[1] L. Reimer, H. Kohl, Transmission Electron Microscopy: The Physics of Image Formation, Springer, 5ª ed.

[2] L.J. Allen, et. al., Ultramicroscopy 100 (2004) 91.

[3] A. Thust, Microscopy and Microanalysis 11 (2005) Suppl 2.

[4] Lin, F; Chen, Q.; Peng, L.M. Journal of Applied Crystallography 40 (2007) 614.

[5] H.J. Goldsmid, Materials 7 (2014) 2577.

[6] C. Kane, J. Moore, Physics World, February (2011) 32.

[7] Zhitinskaya, M.K.; Nemov, S.A.; Svechnikova, T.E. Materials Science in Semiconductor Processing 6 (2003) 449.

[8] Acknowledgments: We are grateful for the financial support of FAPEMIG, CAPES and the graduate program of the Physics Department of UFMG. Experiments and analysis involving electron microscopy were performed at the Center of Microscopy of UFMG (http://www.microscopia.ufmg.br).


Thais MILAGRES DE OLIVEIRA, Karla BALZUWEIT (Belo Horizonte, Brazil), Von Braun NASCIMENTO, Luís Orlando LADEIRA, Edmar AVELLAR SOARES, Vagner EUSTÁQUIO DE CARVALHO
08:00 - 18:15 #6128 - IM05-338 Understanding the use of scattering cross-sections in quantitative ADF STEM.
IM05-338 Understanding the use of scattering cross-sections in quantitative ADF STEM.

Quantitative scanning transmission electron microscopy (STEM) using an annular dark field (ADF) detector has become a widely used technique for the characterization of materials at the atomic level. The quantification process involves the comparison of experimental data with image simulations, the use of statistical tools in a parameter estimation framework or a combination of both [1]. These methods have been developed using different measures for comparison, like peak intensities at the atom column position [2], image contrast variations [3] or so-called scattering cross-sections [4, 5]. The latter correspond to the total scattered intensity integrated over the atom column area. They have been shown to be very sensitive to the number of atoms in a column and its composition [1, 4, 6, 7]. Figure 1a shows the increase in peak intensity (green axis) and cross-section (black axis) versus increase in number of atoms for a Pt column in [110] zone axis. As it can be observed, the peak intensity saturates after around 8 atoms meanwhile the cross-section monotonically increases. In this work, we perform an analysis of how the electron wave propagates inside the crystal for the probe positions that conform the scattering cross-section. With this, we analyse how the signal is generated for different detector collection angle regimes. Then, the analysis allows to identify the origin of the scattered signal and why scattering cross-sections are more sensitive for composition and number of atoms as compared to peak intensities. In Figure 1b, we show a simulated image of a unit cell of a Pt crystal in [110] zone axis with a color-edited version indicating the labels of the probe positions that form the scattering cross-section and their respective distance to the atom column position. Figure 2 shows the probability amplitude of the electron wave as it propagates through the crystal for probe position r0 (a), which corresponds to the peak intensity, and for the sum of all the probe positions that conform the scattering cross-section (b). From this, we observe that the atom column is excited deeper in the column when analyzing the cross-sections. The off-column probe positions carry more rich information about the scattering process for different thickness and collection regimes, which explains the increased sensitivity of this measure to the number of atoms and its composition. We then discuss the contribution to the scattered intensity for different detector collection angle regimes, such as LAADF, MAADF and HAADF.

[1] S. Van Aert, et al., Physical Review B 87 (2013) 064107.

[2] S. D. Findlay and J. M. LeBeau, Ultramicroscopy 124 (2013) 52 - 60.

[3] D. O. Klenov and S. Stemmer, Ultramicroscopy 106 (2006) 889 - 901.

[4] S. Van Aert, et al., Ultramicroscopy 109 (2009) 1236 - 1244.

[5] H. E, et al., Ultramicroscopy 133 (2013) 109 - 119.

[6] A. De Backer, et al., Ultramicroscopy 134 (2013) 23 - 33.

[7] G. T. Martinez, et al., Ultramicroscopy 137 (2014) 12 - 19.

Acknowledgement

The research leading to these results has received funding from Research Foundation Flanders (FWO, Belgium) through projects G.0374.13N, G.0368.15N, G.0369.15N and a PhD grant to K.H.W. van den Bos and from the European Union 7th Framework Programme under Grant Agreement 312483 - ESTEEM2. The authors are grateful to A. Rosenauer for providing the StemSim program.


Gerardo T MARTINEZ (Oxford, United Kingdom), Karel H.w. VAN DEN BOS, Marcos ALANIA, Peter D NELLIST, Sandra VAN AERT
08:00 - 18:15 #5125 - IM06-340 A new method to orient samples by STEM in a scanning electron microscope.
IM06-340 A new method to orient samples by STEM in a scanning electron microscope.

 Transmission electron microscopy is a widely used technique for dislocation characterization. To determine, e.g. dislocation Burgers vectors, the specimen must be oriented in a two-beam condition where only one Bragg reflection is strongly excited [1]. Similar diffraction information can be in principle obtained by scanning transmission electron microscopy (STEM) in a scanning electron microscope at low electron energies E0 up to 30 keV. Low-energy STEM has been shown to be a promising technique [2, 3], which is particularly interesting for the investigation of radiation-sensitive materials. However, diffraction patterns cannot be taken in a scanning electron microscope without additional instrumental attachments. Some groups already succeeded in obtaining electron channeling patterns by rocking the electron beam on a small sample area while recording backscattered electrons [4]. Here we will present an orientation technique by using the STEM detector in a scanning electron microscope. We will describe the underlying principle and present the orientation procedure for a 100 nmspecimen area by using the six-segment high-angle annular dark-field (HAADF) and bright-field (BF) STEM detectors (cf. Fig. 2). All studies were performed with E0 = 30 keV. An electron transparent cross-section specimen of a 500 nm InN layer on a Si-substrate is shown in Fig. 1, which was used as a test object.

  Diffraction information at low E0 can be obtained even at moderate sample thickness and high scattering angles as demonstrated in previous work [5]. The procedure described in the following is suited to orient the electron beam precisely along a zone-axis orientation. The single crystalline sample was prepared roughly along the [210] InN zone-axis and the main Kikuchi bands are indicated in Fig. 2 by green, black and grey lines. By tilting the sample, the Kikuchi pattern of the inspected sample region moves across the HAADF detector leading to image intensity changes. The intensity of segments A-C and D-F is normalized by the intensity of the incident electron beam on the respective HAADF segments to take into account different possible amplification characteristics. The difference of the normalized intensities between segments A-C and D-F is plotted in Fig. 3. After a 2.5o tilt the intensity difference between A-C and D-F is zero and the green Kikuchi band is oriented along the dashed red line “a” in Fig. 2. To reach a [210] zone-axis orientation the sample was then tilted around the perpendicular tilt axis. By recording a tilt series around the second tilt axis, the intensity differences in the corresponding segments are compared. In analogy to the first tilt series, the intensity difference for opposite HAADF segments becomes zero for an 8° tilt. The black Kikuchi band in Fig. 2 is then aligned along the dashed red line “b”, and the zone-axis is reached. A final check can be made by comparing the intensity differences between all opposite HAADF segments, which should be zero in all cases.

  By tilting the sample around one axis, we can scan the intensity across one Kikuchi line by using the BF detector. Fig. 4 shows the intensity of BF images as a function of the tilt angle. Since the width of the Kikuchi band yields information about the Bragg angle, it can be used to determine the lattice parameter. With the half width of the intensity curve in Fig. 4, the Bragg angle of the green Kikuchi band in Fig. 2 was determined to be ~ 1.25° and 0.6° for the black Kikuchi band. Both values agree well with Bragg angles of 1.14° and 0.704° for the (002) and (1-20) planes. Based on the analysis of the intensity curves, two-beam conditions for the inspected area can be obtained if the sample is tilted at angles, which are marked by dashed red lines in Fig. 4. This means that the technique can be applied in low-energy STEM to characterize dislocations in the future.

1. D.B. Williams, C.B. Carter, Transmission electron microscopy, Springer, 2nd edition, 2009, p.441-479.

2. T. Klein, E. Buhr, Frase, C.G. Frase, Advances in Imaging and Electron Physics. 171, 297 (2012).

3. T. Volkenandt, E. Müller, D. Gerthsen, Microsc. Microanal. 20, 111 (2014).

4. D.C. Joy et al., J. Appl. Phys. 53, R81 (1982).

5. T. Volkenandt et al., High-angle transmission electron diffraction in a scanning electron microscope, 15th European Microscopy Congress (EMC2012), Manchester, 2012.

6. This work is funded by the German Research Foundation (DFG).


Cheng SUN (Karlsruhe, Germany), Erich MÜLLER, Dagmar GERTHSEN
08:00 - 18:15 #5224 - IM06-342 Scanning electron diffraction using the pnCCD (S)TEM Camera.
IM06-342 Scanning electron diffraction using the pnCCD (S)TEM Camera.

Scanning electron diffraction (SED), performed in a (S)TEM, is a powerful technique combining information in reciprocal space and real space to achieve nanoscale crystal cartography of materials structure. SED involves scanning a focused electron beam across a specimen and recording an electron diffraction pattern at each position to yield a 4D dataset comprising a 2D diffraction pattern at every position in the 2D scan region. Obtaining high quality data depends on fast acquisition, large dynamic range, and accurate recording of the location and intensity of diffraction spots. Here, we present SED measurements using the pnCCD (S)TEM camera taking a Ti-Fe-Mo alloy for demonstration. The large number of pixels and high readout speed of this camera enables the recording of high quality diffraction patterns in a short acquisition time. Further, using the various camera operation modes, position and intensity of diffraction spots can be determined precisely.

 

The pnCCD (S)TEM camera provides fast acquisition of 2D camera images using a direct detecting, radiation hard pnCCD with 264x264 pixels [1]. Routinely, the readout speed is 1000 frames per second (fps) and can be further increased by binning and windowing. For example, with the pnCCD (S)TEM camera, a 256x256 STEM dataset -- where a camera image is recorded at each of the 65 536 probe positions -- can be recorded in less than 70 s. The camera properties can be changed by modifying the voltages applied to the pnCCD and thus adjusted to the experimental needs [2]. Considering scanning electron diffraction experiments, which are performed at high electron beam intensities, the combination of data recorded in two different camera operation modes allows a comprehensive diffraction pattern analysis with quantitative and spatial information. In the high-charge-handling-capacity (HCHC) mode, up to 16 000 incident electrons per pixel per second can be processed for a primary electron energy of 80 keV and a readout speed of 1000 fps. In the case of higher electron rates where the amount of signal exceeds the charge handling capacity of the affected detector pixels, signal spills over into neighboring pixels. Although diffraction spots broaden, the quantitative information is preserved. In the anti-blooming (AB) mode, the amount of signal exceeding the charge handling capacity is drained from the detector preventing an overflowing of pixels. Thus, the spatial information is preserved. The data can be analysed in a number of ways [3], most simply by plotting the intensity of a subset of pixels as a function of probe position in flexible post-experiment schemes to obtain ‘virtual diffraction images’ or to perform differential phase contrast analysis.

 

Results are shown (Figure 1) from a Ti(40 at.%)-Fe(20 at.%)-Mo(40 at.%) alloy from which SED data was acquired in an FEI Titan G2 80-200 ChemiSTEM microscope, operated at 200 keV. A diffraction pattern was recorded for each of the 512x512 probe positions using both HCHC and AB modes of the pnCCD (S)TEM camera at a readout speed of 1000 fps. Each dataset was thus acquired with a total acquisition time of less than 5 minutes per STEM dataset. Virtual diffraction images using the AB-mode data were then formed to discriminate the two phases existing in an ultra-fine lamellar microstructure [4] in this Ti-Fe-Mo alloy.

 

[1] H. Ryll et al, Journal of Instrumentation, in press.

[2] J. Schmidt et al, Journal of Instrumentation 11  (2016), p. P01012

[3] P. Meock et al, Crystal Research and Technology 46 (2011), p.589-606

[4] A.J. Knowles et al, Ti-2015, proceedings of the 13th World Conference on Titanium, in press.

 

DNJ, RKL & PAM acknowledge: ERC grant 291522-3DIMAGE and EU grant 312483-ESTEEM2.


Robert RITZ, Martin HUTH (Muenchen, Germany), Sebastian IHLE, Julia SCHMIDT, Martin SIMSON, Heike SOLTAU, Duncan N. JOHNSTONE, Rowan K. LEARY, Paul A. MIDGLEY, Martial DUCHAMP, Vadim MIGUNOV, Rafal E. DUNIN-BORKOWSKI, Henning RYLL, Lothar STRÜDER
08:00 - 18:15 #5231 - IM06-344 Atomic-level elastic strain measurement of amorphous materials by quantification of local selected area electron diffraction patterns.
IM06-344 Atomic-level elastic strain measurement of amorphous materials by quantification of local selected area electron diffraction patterns.

Metallic glasses have been promising materials for application as structural materials. Therefore, intense research has been carried out to understand their mechanical properties and the underlying physical phenomena [1]. An important aspect of this research is measuring the response of metallic glasses to external and/or internal stresses and the resulting atomic displacements. These atomic level strains can be measured by quantification of the peak shifts in synchrotron diffraction experiments as demonstrated by Poulsen et. al. [2].

 

Here, we present a novel TEM method for measuring the atomic level strains on a local scale by means of electron diffraction. A series of selected area electron diffraction (SAD) patterns of amorphous TiAl tensile test samples are recorded in a CM200 electron microscope equipped with a Gatan Orion CCD camera. External stress is applied in-situ and the evolution of the 2D strain tensor is calculated from the distortion of the characteristic amorphous diffraction halo. The full evaluation is carried out automatically by a plugin written for the Digital MicrographTM platform: The peak maxima positions are extracted with sub-pixel accuracy from azimuthal integrated sectors of 1° (cf. Fig.1(a)). This is achieved by a non-linear least squares fit using a pseudo-Voigt model function (cf. Fig.1(b)). By fitting an ellipse to the maxima positions also the center is determined with sub-pixel accuracy. By iteration the data is refined and the polar form of the maxima positions is obtained. Using an unstrained SAD pattern as reference, the 2D strain tensor can be calculated from the difference of the peak maxima positions. By fitting the polar form of the strain tensor finally the principal strain magnitude and direction can be obtained relative to the SAD patterns coordinate system (cf. Fig. 2).

 

Simulated diffraction patterns with known parameters and different levels of noise are used to check the strain accuracy of the method. The relative error is calculated with respect to the known input parameters. The method has an accuracy of about 1x10-4 in determination of the parameters, the relative error in principal stress is below 3% even at principal strain below 0.5% (cf. Fig. 3).

 

In addition to measure the atomic-level strain response to an applied external stress the method allows also to map the strains on a local scale, limited in principle only by selected aperture size and intensity fluctuations of the diffraction data for small sampling volumes. An example for such mapping capabilities is given in Fig. 4, where the strain distribution over the width of a strained specimen is given. In this case the strain distribution is non-uniform and varies between 1.3% at center and 1.35% at edge regions.

 

[1] A.L. Greer, Metallic glasses... on the threshold, Mater. Today. 12 (2009)14-22. doi:10.1016/S1369-7021(09)77037-9.

[2] H.F. Poulsen, J. a. Wert, J. Neuefeind, V. Honkimäki, M. Daymond, Measuring strain distributions in amorphous materials, Nat. Mater. 4 (2005) 33–36. doi:10.1038/nmat1266.

 

C. E. and C. R. acknowledge financial support by the Austrian Science Fund FWF: [I1309]. R. S. and J. R. acknowledge funding from the National Science Foundation (NSF) grants CMMI 1400505 and DMR 1454109.


Christian EBNER (Vienna, Austria), Rohit SARKAR, Jagannathan RAJAGOPALAN, Christian RENTENBERGER
08:00 - 18:15 #5300 - IM06-346 Structural Verification of Magnetite Nanocrystals in PVDF-fibers by Scanning Electron Nano Diffraction (SEND).
IM06-346 Structural Verification of Magnetite Nanocrystals in PVDF-fibers by Scanning Electron Nano Diffraction (SEND).

Incorporation of inorganic nanocrystals in polymer fibers is always a challenging process with two major requirements, i.e. the particles should be homogenously distributed in the polymer matrix and the nanomaterial properties must be kept during the processing of the fibers. These criteria become even more demanding if the final product is intended for later medical application, where the material must comply with the high safety standards. However, the incorporated total nanoparticle concentration in polymer fibers is usually very low, which implies that certification of the unaltered crystal structure of the nanomaterial cannot be achieved by conventional XRD methods. Within the present study we demonstrate that Scanning Electron Nano Diffraction (SEND) [1] in a STEM is a suitable alternative technique to XRD for handling this issue. Thus the SEND method was applied on magnetite (Fe3O4) nanocrystals incorporated in melt spinned polyvinylidene fluoride (PVDF) fibers for verifying the inverse spinel structure of the iron oxide particles. The diffraction experiments were carried out in a FEI Titan S/TEM @ 300 kV using ultrathin cross section samples received from ultramicrotomy on resin embedded nano magnetite loaded PVDF-fibers. Within one measuring campaign a total number of 100 diffraction patterns were recorded from sample regions ranging from 21x21 nm2 to 34x41 nm2 in size. Interplanar spacings and angles between the diffraction spots were determined from 12 unambiguous indexed zone axis patterns and used for verifying the structure of magnetite and for calculation of the cubic lattice parameter. Hence evaluation of 90 unique indexed interplanar spacings in the range between 4.8 Å and 1.0 Å yielded a lattice parameter of a = 8.36(9) Å for the cubic unit cell with Fd-3m symmetry. 

 

 

References:

[1] J.M. Zou and J. Tao, Scanning Electron Nanodiffraction and Diffraction Imaging in Scanning Transmission Electron Microscopy – Imaging and Analysis, Springer Science+Buisness Media, pp. 393–427, 2011.


Nelly WIRCH (Aachen, Germany), Ioana SLABU, Ralf THEISSMANN, Maria KRÜGER, Thomas E. WEIRICH
08:00 - 18:15 #5404 - IM06-348 Interpretation of phase structures using the program "e;DiffraCalc"e; and EDX-spectrometry.
IM06-348 Interpretation of phase structures using the program "e;DiffraCalc"e; and EDX-spectrometry.

The micro-diffraction method in transmission electron microscopy allows to determine the crystalline types of phase components in alloys, that is necessary to calculate the effect on mechanical properties of the materials.

The analysis of chemical composition of the selection has to be done to determine the crystalline type of phase inclusion within the micro-diffraction method. The method of EDX-spectrometry is usually used in case of steel researches, because this method is more sensitive to heavy elements which are defining in the formation of phase components in iron-based alloys. When the elemental composition of the inclusion obtained from containing sample site is taken into account, decoding of the diffraction pattern can be made. This procedure helps to determine the crystallographic structure of the considered phase.

This paper presents a modified program for indexing electron diffraction patterns «DiffraCalc», which allows to decode the diffraction patterns obtained from the phase inclusions, considering the chemical composition. This work is based on a well-known method of diffraction patterns indexing - a method of paired reflexes [1]. Diffraction patterns indexing manually using this method has several disadvantages. Usage of this modified program has solved most of the indexing problems and has led to significant work acceleration and has improved the quality of indexing results.

The program includes: automatic indexing algorithm, the connection to the extensive database of crystalline substances, compatibility with standard CIF (Crystallografic information file) [2] files, the availability to choose three reflexes pairs at the same time and the ability to work simultaneously with several phases within one-time setting scale. Indexing mode in the modified program allows to provide automatic calculations that are held simultaneously in several prospective phases, and moreover to analyze the phase matching for diffraction pattern without user intervention. The developed program has also implemented simulation mode of the diffraction pattern of a single crystal. This mode is intended to check the indexing results.

Verification of the diffraction patterns simulation mode was carried out under the program Single Crystall [3] for a number of substances (Fe, Fe7C3, Fe3C, etc.) with all types of crystal systems and has shown good compatibility between the calculated diffraction patterns of the Single Crystall results and the one obtained in the modified program «DiffraCalc». The examples of diffraction patterns simulation from a variety of substances is shown on Figure 1.

Analysis with the proposed program does not require multiple downloads of the experimental image of diffraction pattern, has the advantage of automatic conformity assessment estimated the experimental diffraction pattern based on an assessment of conformity of interplanar distances and angles between the reciprocal lattice vectors. Thus, the program «DiffraCalc» has broad capabilities to simulate the calculated diffraction patterns and indexing of experimental one.

Also, the paper contains investigations of low-alloyed reactor pressure vessel (RPV) steels phase composition. Studies of the chemical composition of phase components were carried out by EDX-method, the crystal structure of the phase components investigations were carried out by the micro-diffraction method with subsequent analysis of the experimental diffraction patterns using the «DiffraCalc» program. An example of the automatic indexing of one of the electron diffraction patterns is shown on Figure 2, 3. This phase inclusion into the RPV steel is carbide of type Cr21Fe2C6. Experimental reflexes positions have shown good compatibility of reflexes positions, calculated in the program, with considering small deviation of the zone axis [111] from the direction of the electron beam.

 

References

 

  1. Williams D., Carter A. Transmission electron microscopy. New York.: Springer. 2009. 760 р.
  2. Hall, S. R., Allen, F. H. and Brown, I. D. (1991). "The Crystallographic Information File (CIF): A New Standard Archive File for Crystallography", Acta Cryst., A47, 655-685.
  3. CrystalMaker Software Limited. SingleCrystal 2. http://www.crystalmaker.com/singlecrystal/index.html

Evgenia KULESHOVA, Alexey FROLOV, Ekaterina KRIKUN (Moscow, Russia)
08:00 - 18:15 #5605 - IM06-350 Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis.
IM06-350 Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis.

Many solid-state properties leave characteristic fingerprints in the angular dependence of electron scattering. STEM is dedicated to probe scattered intensity at atomic resolution, but it drastically lacks angular resolution due to detectors integrating over broad solid angles. By developing a setup which is capable of recording STEM images for dedicated acceptance angles of annular detectors, we firstly report the simultaneous measurement of specimen thickness, chemical composition and strain in a GaNxAs1-x/GaAs layer at atomic resolution. Our analysis exploits two angle ranges, namely A: 42-66 and B: 82-141mrad which exhibit different dependencies on nitrogen content x and specimen thickness as shown by the simulation in Fig.1a. To acquire images for dedicated angle settings, we developed a motorised, software-controlled iris aperture (Fig.2a) mounted above the Fischione 3000 ring detector in a Titan 80/300 (S)TEM, which is used to control the outer acceptance angle of the detector as depicted by the detector scans in the inset. Consequently, a STEM image formed by electrons scattered to the angular interval [α,β] is obtained by the difference I(β)-I(α) between 2 images taken at iris radii α and β.

For GaNAs, we recorded four 2Kx2K high-resolution STEM (HRSTEM) images with iris radii 42, 66, 82 and 141 mrad, performed a Voronoi segmentation with respect to atomic columns and averaged the intensity within the Voronoi cells. By mapping the Voronoi intensity with respect to their cell index and correlating the images, specimen drift was compensated for. Subtracting respective images yields the data in Fig.1b,c for the desired angular ranges. The GaNAs layer is imaged with high contrast for the angular range of 42-66 mrad whereas it is invisible for a detector acceptance of 82-141 mrad. By simultaneously comparing Fig.1b,c with simulations [1], the local nitrogen content and specimen thickness were obtained as shown in Fig.1d,e. Hence our method overcomes the common problem to interpolate thickness from regions with known composition. Finally, profiles across the GaNAs layer (not shown) reveal an average N content of x=2.5% and a mean thickness of 186nm. The nitrogen content is verified by X-ray studies and strain state analysis in one of the HRSTEM images. The total acquisition took 5:40min here whereas a 1kHz camera would have needed 70min to obtain this data.

Secondly, we imaged a GexSi1-x/Si field effect transistor using a dense sampling of the scattering angles between 16 and 255 mrad at two specimen thicknesses of 50 and 150 nm. Two different camera lengths with each 16 outer acceptance angles were used as shown in the radial sensitivity curves in Fig.2b, obtained by scanning the beam over the detector with iris aperture. Fig.2c exemplarily shows several images recorded at the larger camera length. The first image for the range [16,22 mrad] completely lacks chemical contrast in favour of strain-dominated intensity modulations in the vicinity of the Ge-containing source S and drain D stressors. Towards image 4 for [16,34 mrad] strain and the onset of Z-contrast determine the image contrast comparably, the latter caused by the 2 times larger atomic number of Ge compared to Si. In subsequent images Z-contrast dominates the signal revealing the two composition regimes of Ge with x=22% and x=37% which we determined using EDX with the chemiSTEM system.

By subsequently subtracting the images we obtain the explicit angular dependence of scattered intensity for pure Si and the two Ge regimes in Fig.3a-c. Obviously the scattered intensity increases with both thickness and Ge content over the broad angle range covered here. Particular attention is to be drawn at the theoretical models included for comparison in Fig.3: δ denotes the exponent obtained for assuming the Rutherford model where intensity is proportional to Zδ. The variety of δ values shows that there is no consistent trend as to a composition, thickness and angle-dependence, so that the Rutherford theory is inapplicable to our STEM data. Moreover, frozen-lattice multislice simulations for strain-relaxed (alloy) supercells are shown by the dashed lines. Although perfect agreement is found for angles above 35mrad, significant deviations are observed at smaller angles. This mismatch of contemporary simulations, which are fully elastic except for phonon scattering, is discussed in detail with respect to further inelastic scattering on the basis of the angular dependence measured from energy-filtered diffraction patterns.

[1] Rosenauer and Schowalter: Springer Proceedings in Physics, Springer, 2007, 120, 169-172.

[2] K. M.-C. is supported by the DFG under contract MU3660/1-1.


Knut MÜLLER-CASPARY (Bremen, Germany), Oliver OPPERMANN, Tim GRIEB, Andreas ROSENAUER, Marco SCHOWALTER, Florian F. KRAUSE, Thorsten MEHRTENS, Pavel POTAPOV, Andreas BEYER, Kerstin VOLZ
08:00 - 18:15 #5920 - IM06-352 Measurement of strain in nanoporous gold using nano-beam electron diffraction.
IM06-352 Measurement of strain in nanoporous gold using nano-beam electron diffraction.

Nanoporous gold (npAu) has attracted a lot of attention during the last decade as it has interesting applications particularly in the field of catalysis [1]. It is prepared by corrosion of a suitable gold master alloy, e.g. gold/silver. The remaining material forms a sponge-like structure built of ligaments and pores still preserving a crystalline structure over several tens of nanometres. A high surface to volume ratio, open porosity making it permeable for gases and liquids and a strongly curved ligament surface providing surface atoms of different coordination are only some properties which qualify npAu as catalytic material with well adjustable and reproducible structure.

One important structural property that is expected to have strong influence on the catalytic activity is lattice strain, because strain affects the electronic states [2]. Here we present measurements of strain in npAu. A measurement of lattice strain by means of high-resolution TEM for example by the analysis of lattice plane distances is possible only in a very small field of view for npAu. As the positions of intensity maxima in the images depend on several experimental parameters, such as defocus, orientation, composition, lens aberrations and especially specimen thickness, maxima detection in TEM micrographs succeeds only in small parts of the sample, because thickness is varying strongly. This can be seen in Fig. 1. Close to the surface intensity maxima can be detected and thus strain can be measured, in this case tensile strain up to 5% has been found. But as the ligament gets thicker and defects become visible, contrast changes and strain analysis fails.

A method that overcomes these problems is strain analysis using nano-beam electron diffraction (NBED) [3]. Here a focussed electron probe is scanned across the sample and at each position of the scanning beam the corresponding diffraction pattern is recorded. As distances between the non-overlapping diffraction discs depend basically on the local lattice parameter according to Bragg’s law, strain can be measured by comparing distances between diffraction discs at different positions of the scanning beam. By an analysis of distances between diffraction discs in two linearly independent directions strain as well as shear-strain and rotation can be measured.

A further advantage of strain analysis by NBED is its large field of view, because at first sight it is limited only by the size of the scanned part of the sample. Hence strain and rotation of neighbouring ligaments in npAu can be measured. On the other hand a large field of view requires the acquisition of a large number of diffraction patterns in a short time to avoid effects of sample drift, beam induced sample damage and contamination. Here we present strain and rotation maps of npAu measured using a delay-line detector for the acquisition of the diffraction patterns. With this detector strain maps at a scanning raster of e.g. 100x100 pixels can be recorded, allowing measurements in a field of view of several hundreds of nanometers (Fig. 2) still preserving a sampling limited spatial resolution of about 1.6 nm [4].

Furthermore we show by evaluation of simulations that two important aspects concerning the precision of the measurement have to be taken into account. As the precision of the measurement suffers from noise in the diffraction pattern, the precision degrades for shorter image integration times. On the other hand the precision can be increased using a precessing [5, 6] electron beam, as the diffraction discs are illuminated more homogeneously and hence their positions can be detected more precisely. In this way a compromise between precision and speed / size of the measurement has to be found.

 

[1] A. Wittstock et al., Science 327 (2010), p.319.

[2] M. Mavrikakis et al., Physical Review Letters 81 (1998), p.2819.

[3] K. Müller, A. Rosenauer et al., Microscopy and Microanalysis 18 (2012), p.995.

[4] K. Müller-Caspary et al., Applied Physics Letters 107 (2015), p.072110.

[5] J.-L. Rouviere et al., Applied Physics Letters 103 (2013), p.241913.

[6] C. Mahr et al., Ultramicroscopy 158 (2015), p.38.

This work was supported by the Deutsche Forschungsgemeinschaft (DFG) under contracts no. RO 2057/12-1, RO2057/11-1 and MU3660/1-1


Christoph MAHR (Bremen, Germany), Knut MÜLLER-CASPARY, Tim GRIEB, Florian F. KRAUSE, Marco SCHOWALTER, Anastasia LACKMANN, Arne WITTSTOCK, Andreas ROSENAUER
08:00 - 18:15 #6012 - IM06-354 Large area orientation mapping on nanoscale materials using SEM.
IM06-354 Large area orientation mapping on nanoscale materials using SEM.

The increasing interest in nanostructured materials has raised the need for high spatial resolution orientation mapping and large-scale quantitative characterisation of such microstructures. Because Electron Back Scatter Diffraction (EBSD) does not achieve such high spatial resolution on bulk samples, these kind of studies are often done using a Transmission Electron Microscope (TEM). However, TEM-based orientation mapping techniques suffer from small field of view. As a result, Transmission Kikuchi Diffraction (TKD) in Scanning Electron Microscope (SEM) was developed as a technique capable of delivering the same type of results as EBSD but with a spatial resolution improved by up to one order of magnitude [1,2]. TKD analysis is conducted on an electron transparent sample using the same hardware and software as for EBSD system.  But when using conventional EBSD geometry, the transmitted patterns (TKP) are captured by a vertical phosphor screen with a considerable loss of signal and with strong distortions induced by gnomonic projection. Also, with standard TKD detector configuration, most of the transmitted signal does not reach the phosphor screen and results in lower quality patterns which can have negative effect in the measurement quality.

The limitations of such non-optimal sample-detector geometry can be overcome by an on-axis detection system. With a horizontal phosphor screen placed underneath the sample, the transmitted signal is captured where it is the strongest and TKPs will have minimal distortions. Using low probe currents, the spatial resolution can be increased and the beam-induced specimen drift reduced as compared to standard TKD detector configuration [3]. The improved stability and high spatial resolution allow the user to conduct large-area TKD orientation mapping.

Using a partially recrystallized ultrafine stainless steel sample, we will demonstrate that statistical data can be obtained for the quantitative characterisation of nanostructured materials in the SEM (figure 1).

 

 

References:

[1] R.R. Keller and R.H. Geiss, Journal of Microscopy, Vol. 245, Pt. 3, pp. 245-251, 2012.

[2] P. W. Trimby, Ultramicroscopy, 120, 16-24, 2012.

[3] M. Abbasi et al., ACS Nano, vol.9, no.11, 10991- 1002, 2015.


Laurie PALASSE (Berlin, Germany), Daniel GORAN
08:00 - 18:15 #6039 - IM06-356 Investigation of structural changes of ZnO:Ti thin films prepared by RF sputtering.
IM06-356 Investigation of structural changes of ZnO:Ti thin films prepared by RF sputtering.

ZnO is a wide used ferroelectric material with a variety of applications. This study investigates ZnO thin films doped by Ti as showing structure change from ZnO wurtzite up to ZnTiO3 perovskite.

ZnO:Ti thin films were prepared by RF reactive magnetron co-sputtering in Ar/O2 atmosphere from pure Zinc and Titanium targets (99.99%). Changes of amount of Ti in films were documented by EDS and EELS measurements, structure changes were measured by electron diffraction from thin film cross section (XTEM ED) and two geometries of XRD together with measurement of material optical properties.

Pure ZnO wurtzite structure show with increasing amount of Ti texture change from 8 degrees for 2.4 at % Ti to the 39 degrees for 8.7 at % Ti as it can be seen on electron diffraction patterns on figure 1a together with figure 1b. Structure measured by XRD appear to be more amorphous with Ti increasing as intensity of diffraction lines decreases and interatomic distances change from wurtzite to perovskite ZnTiO3 structure (fig. 2).

Diffraction measurement is by the Voight function method also capable to measure from single diffraction line size and lattice distortions of the diffracted particles. In our case results for 2.4 at % Ti ZnO line 002 is 52 nm and for 7.8 at % Ti ZnTiO3 line 104 is 19 nm, both with dualism indicates two regions of low and highly distorted part of particles. This correspond to relaxed core and distorted surface of the grains as it can be seen on figure 1c and d for Ti content 2.4 at % Ti or 8.7 at % Ti respectively.

Electron diffraction pattern from cross section is also capable to show and compare information from XRD measurements in two different geometries; situation is illustrated on figure 3. Circle integration of ED by ProcessDiffraction program [1] is capable to compare JCPDS diffraction database with electron diffraction pattern, however, this procedure do not take into consideration texture of investigated materials. Different geometries of XRD measurement takes in case of textured material different places indicated on XTEM electron diffraction pattern on Fig.3. Comparing of both results have to be carefully considered.

Direct comparation of measured interplanar distances is illustrated in Fig.4.

[1]       J.L. Lábár: Consistent indexing of a (set of) SAED pattern(s) with the Process Diffraction program, Ultramicroscopy, 103 (2005) 237-249.


Rostislav MEDLÍN (Pilsen, Czech Republic), Pavol SUTTA, Marie NETRVALOVA, Petr NOVAK
08:00 - 18:15 #6091 - IM06-358 Indexation of diffraction patterns for overlapping crystals in TEM thin foils – Application to orientation mappings.
IM06-358 Indexation of diffraction patterns for overlapping crystals in TEM thin foils – Application to orientation mappings.

The indexing of Precession Electron Diffraction (PED) patterns in TEMs for crystals orientation and phase determination as operated by the ACOM-TEM technique [1] tends to become a standard procedure. However, analyzing transmitted signals requires to deal with significant effects related to the lamella thickness. Indexing limitations emerge as soon as grain size is smaller than the sample thickness. In contrast with TKD patterns [2], information in PED patterns comes from all of the overlapping grains crossed by the electron beam. Analyzing such a mixture of Bragg reflections prevents the safe recognition of the orientations and phases and leads to two specific outcomes. First, the grains appearing in the resulting maps are not necessarily located on a same exact layer of the sample thickness. Second, the probability of mis-indexing is increased as reflections from every crystal may be taken for template matching. While it remains unclear which of the overlapping crystals is selected by template matching, it is necessary to understand if and in what means the Bragg spots number and related intensity of each crystal can differ from each other in the acquired patterns. In the present work, the influence of volume fraction and arrangement of grains with respect to the illumination direction are examined.

A sample composed of two overlaid copper plates was considered for the present purpose. ACOM-TEM characterizations were realized on a planar section of the stacked plates for different lamella orientations: at zero tilt, zero tilt after a 180° flip of the grid in the sample holder, and a 15° tilt. Seven cross sections were then cut to determine the respective microstructures and thicknesses of the superimposed plates. Using TEM images of the cross views, the overall thickness of the stacked plates was found to evolve from 330 nm to 470 nm from one side to the other, with one plate being 1.4 to 2 times thicker than the other. The crystallographic orientations were determined using the NanoMEGAS ASTARTM system implemented on a FEI Tecnai G2 F20 S-Twin FEG (S)TEM operating at 200 keV. A precession angle of 0.5° was systematically applied to a quasi-parallel probe of 4 nm at HMFW and 0.4 mrad semi-angle of convergence. TEM lamellae were prepared using a FEI HELIOS FIB.

No significant differences are observed when the orientation maps related to the non-tilted sample and its 180° flip are compared (Fig. 1c-d). In other terms, the intensity distribution of Bragg reflections in diffraction patterns is not governed by the illumination direction. The comparison between the planar orientation maps and the cross cuts (Fig. 2) shows that the detected grains are mostly related to the thickest plate. At the light of this, it seems reasonable to expect the Bragg reflections related to the thickest plate to be the most intense and, consequently, the ones mainly detected in the acquired diffraction patterns. Nevertheless, a few grains related to the thinnest plate are indexed in the planar cuts. This means that the pattern selection is not solely sensitive to the volume fraction of the diffracting crystals. The last finding is confirmed with the sample tilted at 15°. With such tilt, the number of Bragg spots and their related intensities vary as different crystal planes are excited by the electron beam. It can be seen in Fig. 1b that some variations are detected in the grains orientation. The main conclusion of this study is that, although volume fraction of each plate is here the dominant factor that determines the template matching orientation selection, the correlation index appears to be also dependent on crystals orientation and potentially related dynamical effects. More details on the effects of volume fraction with respect to crystal favorable orientations will be discussed.

 

1.         E. F. Rauch and M. Véron, Mater. Charact. 98 (2014), p. 1.

2.         R. R. Keller and  R.H. Geiss, J. Microsc. 245 (2011), p. 245.


Alexia VALERY (Grenoble), Frederic LORUT, Laurent CLÉMENT, Edgar RAUCH
08:00 - 18:15 #4667 - IM07-360 The role of secondary electron emission in the charging of thin-film phase plates.
IM07-360 The role of secondary electron emission in the charging of thin-film phase plates.

In the past few years, physical phase plates (PP) emerged as an interesting tool to achieve phase contrast of weak-phase objects in transmission electron microscopy (TEM). Research has focused on thin-film PPs, which are typically fabricated from amorphous carbon (aC)-films [1]. However, the illumination with high-energy electrons initiates an irreversible degeneration of the aC-film, which causes electrostatic charging and affects the phase-shifting properties.

Electrostatic charging is a limiting factor in the application of thin-film PPs. However, the mechanisms of charging are not well-understood. This work shows that charging predominantly occurs due to secondary electron (SE) emission. For this purpose, Hilbert PPs were fabricated from different materials to study their charging behavior under electron beam illumination. Besides aC, thin films of the metallic glass alloy Pd77.5Cu6.0Si16.5 (PCS) were used for PP fabrication. The amorphous PCS-alloy is characterized by a high electrical conductivity and a strong resistance towards oxidation [2], which at first sight suggests minor charging of PCS-films. For use as a Hilbert PP, the film thickness was adjusted to a phase shift of π. At 200 keV electron energy, this corresponds to a film thickness of 49 nm for aC and 19 nm for the PCS-alloy.

Fig. 1 shows phase-contrast TEM images and corresponding power spectra of an aC test-object, which were acquired using a Hilbert PP fabricated from an aC- (Fig. 1a) or a PCS-film (Fig. 1b). Despite its excellent electrical properties, charging occurs for the PCS Hilbert PP as can be deduced from the strong distortion of the Thon-ring system in Fig. 1b. However, charging is significantly reduced if the PCS Hilbert PP is coated on both sides with a thin aC-layer of 6 nm thickness as shown in Fig. 1c. It is noted, that for smaller cut-on frequencies charging also occurs for the aC (Fig. 1a) and the aC/PCS (Fig. 1c) Hilbert PP. In contrast to pure aC-films, the carbon content is drastically reduced for the aC/PCS Hilbert PP, which improves its stability under electron beam illumination.

The reduced amount of charging in Figs. 1a,c is attributed to the low SE emission of aC compared to the PCS-alloy. The emission of secondary and backscattered electrons was investigated in a Zeiss NVision 40 scanning electron microscope. The Hilbert PPs were mounted on a specific device, where the absorbed and transmitted current can be measured separately. The absorbed current to ground I_S was measured for different primary electron energies E from 0.5 keV to 20 keV. Fig. 2 shows the absorbed current normalized with respect to the current of the incident electron beam I_PE for aC and the PCS-alloy. Between 1 keV and 3 keV aC is negatively charged. Above 3 keV the aC-film only shows a small tendency for charging. Although the blue curve is close to zero, I_S/I_PE takes finite values below the measurement accuracy. The PCS-alloy has a negative charge below 5 keV, but is positively charged for electron energies up to 20 keV. The low tendency for charging of aC and the positive charging of the PCS-alloy are consistent with the observations made in Fig. 1. It is noted, that electron energies are much higher in TEM. However, the curves in Fig. 2 show trends, which might continue towards higher energies.

Electrostatic charging implies poor electrical conductivity. Otherwise, any positive (negative) charge balance would be immediately compensated by an electrical current from (to) ground. We assume that our Hilbert PPs are properly grounded and that aC as well as the PCS-alloy have a sufficient electrical conductivity for the small beam currents used in TEM. A possible reason for poor electrical conductivity is beam-induced contamination. Low energy SEs, which get trapped in the highly insulating contamination layer, cause the formation of an electrical dipole layer at the interface between the contamination and the PP film.

 

References

[1] R. Danev and K. Nagayama, J. Phys. Soc. Jpn. 73 (2004), p. 2718.
[2] B. Chelluri and R. Kirchheim, J. Non-Cryst. Solids 54 (1983), p. 107.

 

Acknowledgement

Financial support by the Deutsche Forschungsgemeinschaft (DFG).


Manuel DRIES (Karlsruhe, Germany), Roland JANZEN, Tina SCHULZE, Jonas SCHUNDELMEIER, Simon HETTLER, Ute GOLLA-SCHINDLER, Bianca JAUD, Ute KAISER, Dagmar GERTHSEN
08:00 - 18:15 #4914 - IM07-362 Generation with phase-and-amplitude electron holograms of Laguerre-Gauss beams with orbital angular momentum up to 200ħ.
IM07-362 Generation with phase-and-amplitude electron holograms of Laguerre-Gauss beams with orbital angular momentum up to 200ħ.

Phase-and-amplitude electron holograms provide a flexible way to encode an arbitrary wavefunction by modulating only the hologram phase [1] [2]. This is an innovative step in the direction of novel experiments with structured electron waves [3]. The most interesting application example is the generation of Laguerre-Gaussian (LG) beams as they can be used to match exactly a single Landau state of electrons inside the objective lens of a transmission electron microscope (TEM). LG beams are a solution of the paraxial Schrödinger equation. They are mainly characterised by two indexes: l, the azimuthal index, representing the orbital angular momentum (OAM), and p, the radial index, where p+1 is the number of intensity radial nodes. They will be referred to with the contract notation LG(l,p). Landau states, on the other hand, are the quantized eigenstates of a charged particle with OAM in a magnetic field. Remarkably, LG beams have, at a given plane, the same form of quantized Landau states [4]. They only differ in the z evolution: while in a magnetic field Landau states are non-diffractive, LG beams in vacuum expand with defocus but maintain the same intensity shape.

We fabricated the holograms with Focused Ion Beam (FIB) on Si3N4 membranes. As a first check of fabrication accuracy, the Energy Filtered-TEM thickness map is taken. Thickness maps can be considered as a measure of the phase of the electron wavefunction after the hologram. In the first row of figure 1 thickness maps of the holograms LG(0,10), LG(10,0) and LG(10,10) are shown. The second row shows on top the experimentally acquired intensity at the Fraunhofer plane, and at the bottom the intensity and phase (represented by the colour hue) calculated with the software STEM_CELL starting from the thickness maps. The beams with l=10 show indeed the well-known azimuthal phase ramp of vortex beams while the beams with p=10 show 11 intensity nodes in radial direction with alternating phase as prescribed for LG beams. This allows us to say that we were able to produce LG beams with arbitrary l, p indexes. If the LG beam was generated inside the magnetic field of the objective lens of a TEM, this would permit the visualization of exact Landau states.

A more direct test of the LG character of these beams is obtained by visualising their shape invariance after propagation. To this aim, we investigated the propagation behaviour of the beam LG(10,0) with simulations, with w0 is the beam waist and zR = π W02/λ is the Rayleigh range for electrons with wavelength λ. Simulations are shown in the first row of figure 2, reporting the beam intensity shape propagated over Δz distance. When propagating, the beam width increases but the circular intensity shape remains the same. This is not true in general for all vortex beams. In order to make a comparison, we generated a vortex beam with 10ħ OAM (named L=10). The second row of figure 2 shows the experimental intensity of the beam L=10, acquired at the Fraunhofer plane (Δz = 0), and with different defocuses. The external intensity ripples are due to the abrupt intensity profile of the hologram (which in this case was not made with the phase-and-amplitude technique) and have the same character at all defocuses. The shape of the vortex, which is the circle with maximum intensity, with increasing defocus develops some internal ripples: this beam is therefore not shape invariant after propagation. As a further instance of the improvements due to the phase-and-amplitude scheme with respect to the previous ones, in figure 3 a phase-and-amplitude LG(200,0) beam (a) and its radial profile (b) is compared with an ordinary hypergeometric-Gauss beam with L=200ħ (c) and its profile (d). The striking feature is the transverse confinement of the intensity in the LG beam, with respect to L=200 that shows many external ripples.

Generating beams with phase-and-amplitude holograms shows clear advantages, from the suppression of the unwanted beam intensity ripples to the control of radial and azimuthal degrees of freedom of LG beams, and is of great importance in order to generate shape-invariant LG beams that can match exactly a single Landau state.

[1] E. Bolduc, N. Bent, E. Santamato, E. Karimi, and R. W. Boyd, Optics Letters 38 (2013)
[2] V. Grillo, E. Karimi et al. Microscopy and Microanalysis 21(S3) (2015)
[3] J. Harris, V. Grillo, E. Mafakheri, G. C. Gazzadi, S. Frabboni, R. W. Boyd, and E. Karimi, Nat. Phys. 11 (2015)
[4] K. Y. Bliokh, P. Schattschneider, J. Verbeeck, and Franco Nori, Phys. Rev. X 2 (2012)


Federico VENTURI (Modena, Italy), Roberto BALBONI, Gian Carlo GAZZADI, Marco CAMPANINI, Ebrahim KARIMI, Vincenzo GRILLO, Stefano FRABBONI, Robert W BOYD
08:00 - 18:15 #5140 - IM07-364 Double crystal interference experiments.
IM07-364 Double crystal interference experiments.

In 1978, Rackham and co-workers observed remarkable and unusual diffraction patterns from an object that consisted of two perfectly aligned, simultaneously reflecting crystals that were separated by a gap [1]. They reported that they could obtain such double crystals routinely by ion bombardment. However, their specimen preparation method did not allow the the gap between the crystals to be controlled and the maximum gap that they achieved was on the order of 1-2 μm. A subsequent realization of a double crystal interferometer (DCI) was achieved using voids in spinel [2], again with a crystal spacing of below 1 μm. In 1995, Zhou and co-workers [3] presented new results by combining a Si double-crystal interferometer with convergent beam electron diffraction (CBED), taking advantage of a special structure formed at the broken edge of a Si [111] crystal. The gap was still on the order of 1 μm or below.

.

Here, we use focused ion beam (FIB) milling to build DCIs that have gaps of up to 8 μm and to provide better control over results that were previously obtained by chance. Figure 1 shows a top view scanning electron micrograph of such an interferometer. The gap separation is 800 nm. Both single crystal and double crystal areas have been patterned. Superimposed on the image is a sketch of the ray path of a convergent beam that illuminates the upper crystal, generating a transmitted beam and a diffracted beam. These beams, in turn, impinge on the second crystal, generating further transmitted and diffracted beams that overlap in the diffraction plane, resulting in the formation of interference fringes.

.

Figure 2 shows a comparison of diffraction patterns recorded from a single crystal (left) and two overlapped crystals (right). The spacing of the interference fringes depends on the electron wavelength, the excited Bragg reflection and the camera length. More impressive results are obtained when the orientation of the crystal is close to a zone axis. Figure 3 shows a comparison of a standard CBED pattern (left) with a complicated system of interference fringes arising from overlap of many diffracted beams (right). The interference phenomena in these patterns encode information about the crystal structure. The fringe spacing is inversely propotional to the gap width. Therefore, for an 8 μm gap, ten times more fringes are present in the overlapped discs and the interferogram can be considered as a hologram, as showsn in Fig. 4.

.

As suggested by the first experimenters [1], accurate lattice parameter measurements can be made using a DCI when one crystal is the specimen of interest. If, instead, a specimen in inserted between the crystals or deposited onto the lower crystal, then it will be possible to obtain an off-axis Fresnel hologram with a reduced exposure time that is not affected by Fresnel

diffraction from the edges of a biprism wire, as is the case when an electron biprism is used as an interferometric device. Moreover, the reduced exposure time due to amplitude division beam splitting could open the way to dynamic recording and processing of holograms.

.

[1] G.M. Rackham, J.E. Loveluck and J.W. Steeds. Journal of Physics: Conference Series, 41 (1977) 435.

[2] C.B. DeCooman and C.B. Carter. Ultramicroscopy, 13 (1984) 233.

[3] F. Zhou, E. Plies and G. Möllenstedt. Optik,98 (1995) 95.

.

We acknowledge financial support from the European Union under the Seventh Framework Programme under a contract for an Integrated Infrastructure Initiative (Reference 312483 ESTEEM2) and the European Research Council for an Advanced Grant (Reference 320832 IMAGINE).


Amir H. TAVABI, Martial DUCHAMP (Jülich, Germany), Rafal E. DUNIN-BORKOWSKI, Giulio POZZI
08:00 - 18:15 #5812 - IM07-366 Diffraction holography for the phase retrieval of vortex beams.
IM07-366 Diffraction holography for the phase retrieval of vortex beams.

The problem of phase retrieval in electron microscopy is generally related to the characterization of electric and magnetic fields in materials, to the retrieval of crystallographic structure or to the imaging of very weakly scattering objects. Recently, increasing attention is payed to the phase retrieval of electron vortex beams (EVB) i.e. beams carrying orbital angular momentum (OAM) [1] [2] [3]. The difficulty in this case arises due to the presence of an inherent phase singularity. There exist various kinds of phase retrieval schemes, and they mainly divide into off- and on-axis, whether the electron beam is displaced from the electro-optical axis or not. Furthermore, they can be computational (iterative or deterministic) or interferential. In this work, we use interferometry with synthetic beam shaping [4] to retrieve the phase of an EVB. In particular, we use an off-axis interferential method, where a reference beam interferes with a vortex beam in the diffraction plane. From the interference pattern it is then possible to retrieve the phase with Fourier methods. This method overcomes the difficulties on in-line methods and can be applied to the diffraction of many nanometer-sized features.

 

For this experiment, two holograms have been closely spaced and imprinted with focused ion beam (FIB) on a Si3N4 membrane [5]. The two holograms are fabricated close to each other in the same membrane window, and their diffraction patterns superimpose in the diffraction plane. The first produces the aimed EVB in the form of a Laguerre Gauss with topological charge 10, and the other one is a hologram with a parabolic modulation that produces the reference wave.

 

A scanning electron microscope (SEM) image of the two holograms can be observed in figure 1a (the parabolic hologram is on top and the LG hologram is at the bottom). Their separate diffractions are shown in figure 1b and 1c.The EVB shows the expected circular symmetry and the dark region in the central region. Conversely, the parabolic beam is characterized by a fully circular diffraction. The visible set of fringes here come from the interference with the 0th order background. An image of superposition diffraction pattern is shown in figure 2. The parabolic wave hologram has the effect of adding a uniform phase ramp to the phase of the LG hologram, resulting in a pitchfork pattern typical of the superposition of beams with an azimuthal and linear phase ramp.

 

The phase reconstruction then proceeds as in conventional holography: the interference (figure 3a) is Fourier transformed (figure 3b), a sideband is isolated and back Fourier transformed to obtain the phase shift as in figure 3c. Here the spiralling phase is visible, winding up by 10 x 2π in a cycle as expected for this EVB. The parabolic phase effect can be easily removed but does not alter the topologic charge consideration.

 

This case study opens the way to a reliable solution of the phase problem in low angle electron diffraction.

References

[1] M. Uchida, A. Tonomura, Nature 464, 737-739 (2010)

[2] J. Verbeeck, H. Tian, and P. Schattschneider, Nature 467, 301 (2010)

[3] J. McMorran, A. Agrawal, I. M. Anderson, A. A. Herzing, H. J. Lezec, J. J. McClelland, and J. Unguris, Science 331, 192 (2011)

[4] J. Harris, V. Grillo, E. Mafakheri, G. C. Gazzadi, S. Frabboni, R. W. Boyd, E. Karimi, Nature Phys. 11, 629-633 (2015)

[5] V. Grillo, G. C. Gazzadi, E. Karimi, E. Mafakheri, R. W. Boyd, and S. Frabboni, Appl. Phys. Lett. 104, 043109 (2014)


Federico VENTURI (Modena, Italy), Vincenzo GRILLO, Ebrahim KARIMI, Roberto BALBONI, Gian Carlo GAZZADI, Marco CAMPANINI, Stefano FRABBONI, Robert W BOYD
08:00 - 18:15 #5909 - IM07-368 STEM phase retrieval method for thick specimen by using quasi-Bessel beam.
IM07-368 STEM phase retrieval method for thick specimen by using quasi-Bessel beam.

Segmented detectors in scanning transmission electron microscopy (STEM) have been rapidly progressed, and recently have reached to the pixel array detectors (PADs) enabling to obtain whole information in reciprocal space during probe scanning [1]. One of the coauthor Ikuta also had developed a squarely arranged PAD for STEM, which consists of 8x8 detection portions [2]. As an application using the PAD in STEM is phase retrieval such as the ptychographic microscopy [3]. This iterative technique is capable to represent phase images, however, in which specimen thickness has to be enough thin to be as the weak phase objects. In order to overcome this restriction, we have proposed the novel STEM phase retrieval technique using annularly-shaped pixel array detector (A-PAD) combined with quasi-Bessel beam [4]. In this paper, we demonstrate applicability of our method, called Phase Retrieval for Thick Specimens (PRETS), by using a SrTiO3 [100] single crystal.

Figure 1 shows a schematic illustration of the proposed phase retrieval method in STEM. By using an annular aperture to form hollow-cone-shaped probe, its intensity distribution is elongated along the optical axis [4], as well as in Bessel beam [5], resulting in applicability to thick specimens. In this case, however, the depth of focus (DOF) is limited finitely due to the finite width of the annular slit. This means that such probe does not correspond to the Bessel beam providing infinite DOF but should be called as the quasi-Bessel beam. The annular aperture has the other effects to restrict the distribution of the electrons going forward to the detection plane, as shown in Fig. 1. This leads to that, for bright-field (BF) imaging, the pixelated detectors are permitted to be located just at the annular-shaped region where the direct beam illuminated. This is the reason why we have adopted the annularly arrayed pixel detectors. Each detectors in the A-PAD yields BF-STEM images containing different information of specimen. From these components, the phase information can be extracted and reconstructed by a dedicated Fourier filter having an acentric annular shape and a summation of the filtered components.

Figure 2 shows the developed A-PAD apparatus. As shown in Fig. 2(a), this system contains 31 detectors in which 24 channels (#0-23) are used for the phase retrieval and the others for normal BF imaging. Each channel consists of a bare optical fiber, one end of which is coated directly by fluorescent P-47 powders (Fig. 2(b)). The other ends of the fibers are connected to a multianode photomultiplier tube (PMT). These fibers transfer the photons converted from electrons on the detectors. Eventually, output signals from the PMT are fed into an image processing computer. The detector is mounted on the x-y position adjustable stage, as shown in Fig. 2(d), which was assembled in the STEM column.

Figure 3 shows phase maps of a SrTiO3 [100] single crystal, for comparison in terms of thickness effect, obtained by means of the multi-slice simulations. The phase in the TEM corresponding to imaginary part of the exit wave is strongly affected by increment of specimen thickness, as shown in Fig. 3(b). In contrast, phase retrieved by the proposed method can represent directly atomic structures without the contrast reversal even at 15 nm in thickness. This clearly proves the effectiveness of our novel technique PRETS.

References
[1] H. Yang, et al., Ultramicrosc. 151 (2015) 232  
[2] M. Taya, et al., Rev. Sci. Inst. 78 (2007) 083705
[3] M. J. Jumphry, et al., Nat. Comm., 3 (2012) 730
[4] T. Kawasaki, et al., Ultramicrosc. 110 (2010) 1332
[5] V. Grillo, et al., Phys. Rev. X, 4 (2014) 011013


Tadahiro KAWASAKI (Nagoya, Japan), Takafumi ISHIDA, Tetsuji KODAMA, Takayoshi TANJI, Takashi IKUTA
08:00 - 18:15 #5917 - IM07-370 Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies.
IM07-370 Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies.

Holographic masks (HMs) with dislocation gratings placed in the condenser system of a TEM have been proven to be a reliable and robust method to impart quantized orbital angular momentum (OAM), as well as quantized magnetic moment onto the imaging electrons [1]. These so-called electron vortex beams (EVBs) gathered a lot of attention due to some unusual properties like topological protection [2], peculiar rotation dynamics in magnetic fields [3] and intrinsic chirality. It has been suggested to use a holographic vortex mask as a vorticity filter after the specimen, in the selected area aperture holder, in order to detect spin polarized or other chiral transitions. This would bring up the unique chance to study magnetic properties of amorphous or nanocrystalline materials because the specimen’s role as a crystal beam splitter – necessary in the standard energy-loss magnetic chiral dichroism (EMCD) geometry - is obsolete in this setup.

High fidelity HMs are needed for such experiments. Also, in order to achieve high vortex order separation, the grating periodicity should be very fine. To improve the signal-to-noise ratio of the EMCD measurements, the dimensions of the HMs need to be large. FIB milling proved to be a robust and reliable technique to produce HMs, but with ever-increasing demands on structure size and fidelity, the ordinary milling strategy using raster- or serpentine scanning showed limited success. Therefore, we developed a new threefold milling strategy. The first step is to employ a so called “vector scan” technique, where “stream”-files provide the possibility to fully control the position and dwell time of the ion beam to generate spiral milling paths for every hole in the HM structure (see Fig. 1). The next step is to reverse the milling order and -direction after each pass [4]. Inspired by [5], the last part consists of a position-dependent dwell time reduction in the proximity of the hole edges to enhance the HM bar edge fidelity. Fig. 2 shows an exemplary 30 µm vortex mask with a grating periodicity of 500 nm and a thickness of roughly 700 nm.

One challenge encountered with this new strategy is limited digital-to-analog-converter resolution as well as memory issues for large “stream”-files. Using a state of the art FIB, it was possible to cut 50 µm HMs and to compare the ordinary raster scanning technique to the one proposed here, see Figs. 3 and 4. These results indicate that our new threefold scanning ansatz enhances the edge quality. Howerver, issues like sample- and beam drift as well as the crystallinity of the mask material have to be addressed in order to further improve the fidelity of the HMs’ edges.

 

Acknowledgements: The authors are indebted to Tina Sturm for the production of HMs. The financial support by the Austrian Science Fund (I543-N20, J3732-N27) and the European research council (ERC-StG-306447) is gratefully acknowledged.

 

References:

[1] J. Verbeeck et al., Nature 467 (2010): 301-304

[2] A. Lubk et al., Physical Review A 87 (2013): 033834

[3] T. Schachinger et al., Ultramicroscopy 158 (2015): 17–25

[4] T. R. Harvey et al., New Journal of Physics 16 (2014): 093039

[5] R. Winkler et al., ACS Applied Materials and Interfaces 7, 5 (2015): 3289–3297


Thomas SCHACHINGER (Vienna, Austria), Andreas STEIGER-THIRSFELD, Stefan LÖFFLER, Michael STÖGER-POLLACH, Sebastian SCHNEIDER, Darius POHL, Bernd RELLINGHAUS, Peter SCHATTSCHNEIDER
08:00 - 18:15 #5939 - IM07-372 Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM.
IM07-372 Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM.

 In order to develop and manufacture semiconductor devices which are key components of the optical telecommunication products, such as the semiconductor laser diode, it is essential to confirm whether it is manufactured as designed. Electric potential distributions of the semiconductor devices are designed in nanoscale, so two dimensional methods to evaluate the electrical potential in the semiconductors with a high spatial resolution are necessary for product management. The observation of the gallium arsenide (GaAs) model specimen was carried out by using the electron holography and Lorentz microscopy [1].

 Lorentz images and intensity profiles are shown in FIG 1 (a)-(f). The p-n junctions are clearly seen in both the 0.6 mm under-focused and over-focused images, but hardly any interfaces of different dopant concentration can be observed in the images. FIG 2 shows the electron holographic reconstructed phase image. The p- and n-type regions are clearly seen as areas of dark and bright contrast, and some differences in the changing dopant concentrations can also be seen.

 A phase image of semiconductor laser diode by the electron holography is shown in FIG 3 [2]. In FIG 3(a), the interface region is approximately 5 μm. And the spacing between interface fringes is approximately 30 nm. Next, in order to observe the pn junction near the active layer in a high spatial resolution, the photograph was taken by changing the interference fringes conditions. The expanded phase image of a part of FIG 3(a), surrounded by a dotted line, is shown in FIG 3(b). Since the interference region is approximately 1.5 μm, and the interference fringe spacing is 5 nm, the spatial resolution is approximately 15 nm. As can be recognized from the phase image, we can understand that more detailed structure can be observed in the higher spatial resolution in comparison with the phase image in FIG 3(a). Here, the designed location of the pn junction was positioned at the dotted line, but it was found from the electron holography observation results that the pn junction did not exist in the original position. This semiconductor laser diode could not have the expected output characteristics. The structural defect of the pn junction, found out in this observation, is considered to be the cause.

 For other semiconductor electric voltage evaluation methods by TEM, electron diffraction microscopy [3] which is one method of phase reconstruction method, differential phase contrast [4] (DPC) which is one method of STEM are also effective and possible to be utilized complementarily with the electron holography. We will discuss about these methods applied for semiconductor in this presentation.

 

References

[1] H. Sasaki, et al., Microscopy, 63(2014) 235.

[2] H. Sasaki, et al., Furukawa Review, 46 (2015) 19.

[3] J. Yamasaki, et al., Appl. Phys. Lett. 101 (2012) 234105.

[4] N. Shibata, et al., Scientific Reports, 5 (2015), 10040.


Hirokazu SASAKI (Yokohama, Japan), Shinya OTOMO, Ryuichiro MINATO, Kazuo YAMAMOTO, Tsukasa HIRAYAMA, Jun YAMASAKI, Naoya SHIBATA
08:00 - 18:15 #5972 - IM07-374 Charge transfer sensitivity and dose efficiency with pixilated detectors and ptychographic phase contrast imaging in STEM.
IM07-374 Charge transfer sensitivity and dose efficiency with pixilated detectors and ptychographic phase contrast imaging in STEM.

 Ptychography provides a sophisticated means of retrieving the complex object function via coherent diffractive imaging. It has become successfully established in the x-ray and visible light communities as a means of lensless imaging and for its super-resolution capability. Super-resolution was also the original use of the method in electron microscopy [1]. However the technique did not become popular in the high resolution electron microscopy community due to the difficulty of acquiring and processing the four dimensional datasets required. Recent advances in detector technology however have resulted in a resurgence of interest in the method. As aberration correction now provides atomic resolution in hardware without the need for super-resolution techniques, interest in ptychography in scanning transmission electron microscopy (STEM) has shifted towards achieving efficient phase contrast imaging.

 STEM provides sensitivity to atomic number via Z-contrast annular dark field (ADF) imaging. The approximately quadratic variation of the intensity in ADF images with atomic number provides relatively facile compositional interpretability as compared to phase contrast imaging. However a relatively small proportion of the beam current is scattered out to the high angles sampled by ADF detectors, particularly for thin samples composed of light elements. Most of the transmitted electrons are contained within the bright field (BF) disk. Ptychography has recently been shown to be more efficient than other phase contrast imaging methods used in STEM, including conventional BF, annular bright field (ABF), and differential phase contrast (DPC) [2,3]. It has also proven superior to these modes at revealing the positions of light elements hidden by the scattering of heavy elements in the ADF signal [4]. Furthermore, ptychographic phase imaging requires no aberrations to achieve contrast, meaning the electron probe can be tuned to maximum capability of the aberration corrector.

 Here we investigate the sensitivity of STEM ptychography for two different applications. The first makes use of the sensitivity of phase contrast imaging to electromagnetic fields to detect charge transfer. Such charge transfer sensitivity was demonstrated in conventional TEM by Meyer et. al. by making use of lens aberrations to reveal contrast changes in N-doped graphene and hexagonal boron nitride (hBN) that only matched with simulations based on potentials including the effects of charge transfer produced by density functional theory (DFT) and not the neutral atom potentials. We will present the results of testing charge transfer sensitivity in STEM with ptychography and various low dimensional materials. Figure 1 compares the projected potentials of (hBN) simulated with and without charge transfer. Figure 2 shows an example of simultaneously acquired ADF and ptychographic phase images of a region of single layer hBN surrounded by a double layer taken with the microscope fully tuned with the aberration corrector. As residual aberrations can affect phase images, we will also investigate the use of post acquisition aberration quantification and correction applied to ptychographic datasets of samples with the relatively subtle contrast effects of charge transfer.

 The second application of the sensitivity of STEM ptychography is its use for beam sensitive samples. We will assess the dose effectiveness of the method through simulations of varies samples, including biological samples frozen in amorphous ice, and compare to conventional TEM imaging. Consideration will be made of the pixelated detector technologies currently available, as the sensitivity and speed of the detector directly influence the dose effectiveness of the ptychographic phase images. 

[1] P.D. Nellist, B.C. McCallum and J.M. Rodenburg, Nature 374 (1995) 630-632.

[2] T.J. Pennycook et al., Ultramicroscopy 151 (2015) 160-167.

[3] H. Yang et al., Ultramicroscopy 151 (2015) 232-239.

[4] H. Yang et al., J. Phys.: Conf. Ser. 644 (2015) 012032.

[5] J.C. Meyer et al., Nature Materials 10 (2011) 209-215.

[6] The authors acknowledge support from the Austrian Science Fund (FWF) under grant number P25721-N20 and the European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No. 655760 – DIGIPHASE.


Timothy PENNYCOOK (Vienna, Austria), Hao YANG, Clemens MANGLER, Stefen HUMMEL, Bernhard BAYER, Jani KOTAKOSKI, Peter NELLIST, Jannik MEYER
08:00 - 18:15 #6055 - IM07-376 Efficient generation of electron Bessel beams using generic magnetic vortex structures.
IM07-376 Efficient generation of electron Bessel beams using generic magnetic vortex structures.

As espoused by Montgomery1 and later by Durnin et al.2, the Helmholtz equation admits solutions which are invariant with respect to free space propagation, known as non-diffractive waves. Perhaps the simplest such solution is a scalar wave function where the amplitude of the wave function is in the form of a Bessel function of the first kind and is independent of the propagation distance z. Thus the intensity of the beam will not disperse laterally during propagation. In addition to this propagation-invariant property, Bessel beams can also reform after scattering from an object; the so-called “self-healing” property.  With such unique features, electron Bessel beams has potential applications in transmission electron microscopy (TEM). For example, in electron tomography, which requires electron probe intensity distributions to be invariant with sample depth; or in particle trapping, in analogy with optical tweezers.

How can one efficiently generate an electron Bessel beam for TEM? A simple method is to use a thin annular aperture to obtain a Bessel beam in the far-field diffraction plane3. This is based on the fact that the Hankel transform of a one dimensional delta function is a Bessel function. However, this method has extremely low efficiency since most of the beam is blocked by the aperture. A different approach has been taken by Grillo et al.4, who used a nanoscale-manufactured kinoform as a binary electron phase grating to create substantial depth of focus, utilising the intrinsic diffraction free property to demonstrate the suitability for electron tomography.

In this work, we present a simple, alternative approach to generate an electron Bessel beam, which is analogous to the axicon lens used in light optics.

In light optics, an axicon lens has circular symmetry and a thickness which varies linearly along the radial direction, so that a linear phase shift is imparted to the incident light along the radial direction (see fig.1), (in contrast to the usual quadratic phase shift from a thin lens). The incident beam is tilted due to the linear phase ramp, thereby forming a cone structure which generates the Bessel beam in the near field.

Can an axicon lens be fabricated for electrons? One could potentially use a conical nanostructure. The electron phase shift would be linearly modified by the varied thickness for a homogenous material of constant mean inner potential, for a sufficiently thin nanostructure. Alternatively, to reduce the size, the phase plate could be modulated with periodically varying thickness but this would then be even more challenging to fabricate.

In the present work, we introduce a natural and generic approach to efficiently create electron Bessel beams using magnetic vortex structures. For these ubiquitous dipole moment configurations, the magnetic vector potential imparts a linear phase shift upon incident electron waves, for specimens of constant thickness, such as thin films, resulting in a conical wavefront deformation centred about the vortex core. Thus magnetic vortex structures naturally behave as effective axicon lenses in the absence of electrostatic potential variations.

We prove this experimentally here, in a TEM using thin films of FeCo based nanocrystalline alloys (Fig 2). An electron Bessel beam was observed in the near field using Lorentz microscopy. The propagation-invariant property was verified using a through focal series. The coherent exit wave was recorded using off-axis electron holography, and the maximal non-diffractive distance was measured.  Utilising reciprocity to provide a further cross-check, a narrow annulus donut beam was also observed in the far field diffraction plane.

1. W. D. Montgomery, J. Opt. Soc. Am. 58(8), 1112–1124 (1968).

2. J. Durnin, J. J. Miceli, Jr., and J. H. Eberly, Phys. Rev. Lett. 58, 1499 (1987).

3. K. Saitoh, K. Hirakawa, H. Nambu, N. Tanaka, and M. Uchida, J. Phys. Soc. Jpn. 85, 043501 (2016).

4. V. Grillo, E. Karimi, G.C. Gazzadi, S. Frabboni, M.R. Dennis and R.W. Boyd, Phys. Rev X, 4(1), p.011013 (2014).

 


Changlin ZHENG (Melbourne, Australia), Timothy C PETERSEN, Holm KIRMSE, Wolfgang NEUMANN, Joanne ETHERIDGE
08:00 - 18:15 #6092 - IM07-378 Optical quantitative phase imaging by focal series reconstruction with partially coherent illumination.
IM07-378 Optical quantitative phase imaging by focal series reconstruction with partially coherent illumination.

Optical phase imaging has many applications, it allows to image transparent objects like cells without staining, which is a huge benefit in biology, and also allows to measure the phase from reflecting objects to determine their topography. Furthermore, there are many applications in life science, material science, healthcare and industry for optical phase imaging.

There exist different methods to image phases, phase contrast microscopy converts the phase information into amplitude contrast, but is difficult to interpret quantitatively, quantitative phase microscopy (QPM) on the other hand tries to determine the phase information quantitatively. Several full-field QPM methods exist, they can be divided in off-axis approaches and inline approaches. Off-axis approaches need a special microscope due to the reference beam and suffer from the high coherence of the illumination resulting in phase noise. Inline approaches could be divided in phase-shifting methods, common-path methods, digital inline holography, ptychography, Shack–Hartmann wave front sensors and focal series reconstruction, e.g. from the transport of intensity equation (TIE). Some of these approaches need special equipment, like laser illumination, gratings or spatial light modulators, which makes them expensive or introduces artefacts from the experimental setup or from the reconstruction algorithm.

Focal series reconstruction has the advantage, that it only needs a standard optical microscope plus a computer and no additional equipment, this makes quantitative phase imaging from focal series reconstruction both an easy and a low-cost method.

Figs. 1 & 2 present results obtained by our current approach to optical quantitative phase imaging, where we use focal series reconstruction with partially coherent illumination (a green LED source). The images were aquired using a Zeiss Axiovert 200M microscope and a pco edge sCMOS camera by varying the object height (z = 0µm is the focal plane). We apply our flux-preserving iterative reconstruction algorithm [1] and combine it with a TIE-like approach [2]. It aligns the images during reconstruction and applies gradient-flipping regularization [3]. This full-resolution inline holography (FRIH) algorithm [2] was originally developed for electron microscopy, but here we apply it to optical microscopy. We will discuss the validity of the reconstruction, especially with respect to artefacts and present the algorithm and the results in more detail.

 

[1] C.T. Koch, A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electrons. Ultramicroscopy 108 (2008),141–150. DOI: 10.1016/j.ultramic.2007.03.007

[2] C.T. Koch, Towards full-resolution inline electron holography. Micron 63 (2014) 69-75. DOI: 10.1016/j.micron.2013.10.009

[3] A. Parvizi, W. Van den Broek, C.T. Koch, Recovering low spatial frequencies in wave front sensing based on intensity measurements. Advanced Structural and Chemical Imaging (2016) in press


Johannes MUELLER (Berlin, Germany), Katharina BLESSING, Christoph KOCH
08:00 - 18:15 #6161 - IM07-380 Can quantum wave filters outperform image processing?
IM07-380 Can quantum wave filters outperform image processing?

As electron microscopists, we are often limited by both low contrast, and high-noise levels for
beam-sensitive materials. The contrast is a function of the imaging technique, and the sample under
study. The noise level of the image is a fundamental property of the finite electron dose, which must
remain limited, to avoid damaging the sample.


As a result of these, one route to improving microscopy images lies in developments of novel
imaging techniques. Image post processing techniques are commonly used for example, to remove
noise in images or increase the contrast of specific features of interest. These methods perform well
in specific cases, but one can wonder whether this post processing approach is the most optimal in
terms of electron dose efficiency.


The primary source of noise in electron micrographs is Poisson noise due to the electron counting
process occurring at the point of detection.
However, if we can manipulate the coherent electron wave prior to its detection, implementing a
specific operator acting on the wave, noise will occur on the detected processed image rather than
prior to the processing.


Such a setup can be obtained by using phase plates in the diffraction plane. Ideally, these phase
plates affect the phase of the passing electron wave without invoking a detection process,
effectively acting as a quantum filter.


We discuss and compare three primary examples of such quantum wave filtering, and the results
they have on the noise behaviour of the resulting images: vortex filtering as an edge enhancement
filter [1], wave background removal [2], and tuneable wave background reduction. We find each
method improves the image signal-to-noise ratio compared to image post processing implementing
a similar filter. We show that each quantum wave filter has different advantages which may be used
to enhance certain image features of interest.


Removal of the background in the wave decreases noise specifically in image regions of low
intensity, reducing the variance of the noise in the image, allowing more precise measurements.
Reduction rather than removal of the background however, enables a noise decrease, while avoiding
contrast reversals due to sign changes in the wave, improving direct interpretability. The vortex-
filtering method provides robust directional, or isotropic edge detection, with high contrast possible.


We demonstrate each of these options on a selection of different model samples, and discuss their
noise properties, required dose levels and their possible implementation.

References

[1] Blackburn, A. M., and J. C. Loudon, Ultramicroscopy, 136, (2014), 127-143.
[2] Zhang, Chao, et al., Ultramicroscopy, 134 (2013): 200-206.


Acknowledgements
LC and JV acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant No. 278510-VORTEX. JV acknowledges financial support from the European Union under the 7th Framework Program (FP7) under a contract for an Integrated Infrastructure Initiative (Reference No. 312483 ESTEEM2).


Laura CLARK (Antwerp, Belgium), Jo VERBEECK
08:00 - 18:15 #6205 - IM07-382 Concepts for an electrostatic phase shifting device.
IM07-382 Concepts for an electrostatic phase shifting device.

The advantage of providing amplitude and phase information of an object exit-wave makes off-axis electron holography a powerful tool for analyzing field and potential distributions up to an atomic scale. The ability to selectively manipulate the phase of the incoming electron wave additionally opens doors to new possibilities and  microscopic methods, such as the direct interferometric measurement of the coherence length of an electron wave packet [1, 2] or energy-loss magnetic chiral dichroism (EMCD) based investigations [3].

 

In principle, a selective phase shifting device is realized by directing one of two coherent electron beams through an electrostatic potential surrounded by a grounded electrode to shield stray fields, while the other beam propagates undisturbed in the vacuum. We present two different concepts to create such a device.

 

The first one is a variation of an experiment G. Moellenstedt suggested in 1980 [1] and was first realized in 1985 by H. Schmid [2]. Instead of using two concentric tubes, we realized a setup with two separated and electrically isolated 1 mm long micro tubes on an especially developed modular carrier chip (M1) to electrify them (figure 1).

 

The second concept includes two perforated metallic plates (20 µm X 20 µm X 3 µm) in a distance of 3 µm to each other. The micro device shown in figure 2 was produced with focussed ion beam (FIB) allowing both a selective phase shift as well as the investigation of influences of stray fields.

 

We performed first in-situ biasing TEM experiments with the phase shifting micro tubes. A big and necessary achievement was the enlargement of the hologram width from 2 µm to more than 25 µm. This was realized by using solely the TL22 lens of the image Cs corrector as objective lens of the FEI Titan 80-300 Berlin Holography Special TEM. However, the micrographs in figure 3 show strong artefacts which we attribute to beam tilting due to charging effects of the tube surfaces. These artefacts manifest in a bending-like projection of a biprism beneath the micro tubes.

 

 

 

 

 

 

 

1.    G. Möllenstedt, G. Wohland, Seventh European Congress on Electron Microscopy, the Hague (1980).

2.    H. Schmid, Dissertation (1985).

3.    P. Schattschneider  et al., Nature 441, 486–488 (2006).

4.   The authors kindly acknowledge the support from the Backend and Packaging Group of the HHI during the development of the M1.


Tolga WAGNER (Berlin, Germany), Tore NIERMANN, Dirk BERGER, Michael LEHMANN
08:00 - 18:15 #6221 - IM07-384 Generation of super-oscillatory electron beams beyond the diffraction limit.
IM07-384 Generation of super-oscillatory electron beams beyond the diffraction limit.

In 1873, Ernst Abbe discovered that the imaging resolution of conventional lenses is fundamentally limited by diffraction, which, since then, has been overcome using a variety of different approaches in optical microscopy. In electron microscopy, thanks to remarkable developments in aberration corrected electron optics, the resolution of transmission electron microscopes (TEMs) and scanning TEMs (STEMs) has reached the sub-Ångström regime. However, it is still limited by instrumental stability, residual higher-order aberrations and the diffraction limit of the electron-optical system. Recently, a concept termed super-oscillation, which is analogous to the idea of super-directive antennas in the microwave community [1], was proposed [2, 3] and applied in light optics for far field imaging of sub-wavelength, barely-resolved objects beyond the diffraction limit [4]. A super-oscillating function is a band-limited function that is able to oscillate faster locally than its highest Fourier component and thereby produce an arbitrarily small spot in the far field.

Here, we demonstrate experimentally for the first time a super-oscillatory electron beam whose characteristic probe size is much smaller than the Abbe diffraction limit. Figure 1(a) shows scanning electron microscopy (SEM) images of a conventional grating mask (left) and a super-oscillation off-axis hologram (right) that have the same outer diameters (10 µm). The masks were fabricated by focused ion beam milling 200-nm-thick SiN membranes coated with 150 nm Au. The masks were inserted into the C2 aperture plane of a probe-corrected  FEI Titan 80-300 (S)TEM. Owing to the probe aberration corrector and relatively small numerical aperture (convergence semi-angle), diffraction-limited spots could be easily obtained from the conventional grating (Fig. 1, left), while a super-oscillatory electron probe, which was generated at the first diffraction order (Fig. 1, right), produced a much smaller hot-spot in the center. The size of the super oscillation hot-spot is approximately one third of that of the diffraction-limited spot. It could theoretically be decreased further, even below the de-Broglie wavelength of the electrons, by varying the ratio between the inner and outer radii.

Further applications of such super-oscillatory electron wave functions, e.g. enhanced STEM imaging, will be presented.

 

References

1.   G. Di Francia, Super-gain antennas and optical resolving power, Nuovo Cim. 9, 426 (1952).

2.   Y. Aharonov, J. Anandan, S. Popescu and L. Vaidman, Superpositions of time evolutions of a quantum system and a quantum time-translation machine, Phys. Rev. Lett. 64, 2965-2968 (1990).

3.   M. Berry, Faster than Fourier, in Quantum Coherence and Reality, Celebration of the 60th Birthday of Yakir Aharonov, J. S. Anandan and J. L. Safko, eds. (World Scientific, 1994), pp. 55-65.

4.   E. T. F. Rogers, J. Lindberg, T. Roy, S. Savo, J. E. Chad, M. R. Dennis and N. I. Zheludev, A super-oscillatory lens optical microscope for subwavelength imaging, Nat. Mater. 11, 432-435 (2012).

 

Acknowledgments

This work was supported by the German-Israeli Project Cooperation (DIP) program from the German Research Foundation (DFG) and the Israel Science Foundation, Grant No. 1310/13. RDB thanks the European Research Council for an Advanced Grant.


Roei REMEZ, Yuval TSUR, Peng-Han LU (Jülich, Germany), Amir H. TAVABI, Rafal E. DUNIN-BORKOWSKI, Ady ARIE
08:00 - 18:15 #6235 - IM07-386 Calculation of phase contrast in Cc/Cs-corrected STEM.
IM07-386 Calculation of phase contrast in Cc/Cs-corrected STEM.

For STEM imaging, the pattern on the detector is a result of interference between elastically scattered wave and the incident wave. By recording the constructive interference and destructive interference with separate detectors, as well as by subtracting the two parts of intensity from each other, one can remove the background intensity as well as nonlinear information. As result, the remaining signal is enhanced phase contrast [1]. A recent  experimental demonstration of differential contrast in STEM achieved by matching the detector geometry and the physical phase plates in STEM mode has been reported in [2].

On an aberration-corrected STEM, an optimized differential phase contrast can be obtained by well designing the PCTF of the objective lens, and detector geometry accordant with the designed phase plate. The integrated spatial frequencies corresponding to positive contrast transfer is equal to those corresponding to negative contrast transfer. This ensures that nonlinear information cancels when the two parts of detector signals subtract each other.

Our calculation in Fig. 1 for Cc/Cs-corrected STEM without damping factors illustrates the advantage of differential contrast compared with the conventional bright-field imaging in STEM. The differential contrasts of single-layer graphene are dominantly stronger than the contrasts achieved in STEM-BF mode equipped with the same corrector. The differential contrast can reach 12, 18 and 26 times of the bright-field contrast at 20kV, 50kV and 80kV, respectively! This demonstrates that in STEM mode equipped with an aberration corrector and a detector, matching the geometry of the phase plate, phase objects can be imaged with descent contrast.  

With further improvement of the corrected state of the microscope, our calculation show that phase contrast imaging in STEM offers even more exciting possibilities. When the 5th-order spherical aberration is corrected, the illumination angle dependent on the largest usable aperture, also increases, resulting in a shallow depth of field. This allows accurate focus at certain thickness of the sample, as shown in Fig. 2. At the 8th layer of a total 16-layer (28nm) thick sample of Si, one silicon atom is replaced by a Germanium atom. A focal series through the sample shows that the layer marked by a substituted Ge atom is in focus at ∆f=-12Å. 

As a summary, the method of obtaining differential contrast in an aberration-corrected STEM can be powerful for investigating weak scattering objects. Under a further improved corrected state of the Cc/Cs corrector, the differential contrast realized with this technique is extremely thickness-sensitive, and focussing through atomic planes may come into reach. 

References
[1] H. Rose. Ultramicroscopy 2(1977), p. 251-267.
[2] C. Ophus, J. Ciston, J. Pierce et al. Nature Communications 7(2016), p. 10719.
[3] The authors greatly acknowledge funding from the German Research Foundation (DFG) and the Ministry of Science, Research and the Arts (MWK) of the federal state Baden-Württemberg, Germany in the frame of the SALVE project.


Zhongbo LEE (Ulm, Germany), Ute KAISER, Harald ROSE
08:00 - 18:15 #6246 - IM07-388 Developing new electron interferometry configurations in I2TEM thanks to electron optics simulations.
IM07-388 Developing new electron interferometry configurations in I2TEM thanks to electron optics simulations.

The In situ Interferometry Transmission Electron Microscope (I2TEM), is a microscope designed to easily performed new electron interferometry experiment [1,2,3]. The microscope is equipped with a 300kV cold field emission source, one electrostatic Möllenstedt biprism (BP) installed before the three condenser lenses, two goniometer stages situated respectively above and inside the objective lens pole piece (namely high resolution stage and Lorentz stage) and finally three BPs placed between the intermediate lenses. The strength of this microscope lies in its wide optical flexibility, which can be used to develop new configurations very difficult to obtain using standard TEM. On the other hand, this flexibility increases the optical complexity of the operation and implies being able to simulate the electrons trajectories as a function of the various optical conditions (lenses excitations, High voltage, gun lens ratio, …) to predict  “a priori” the hologram properties which will be obtained (width, interference fringes, …).

To perform such simulations, all lenses strengths have been calculated using finite element modelling software COMSOL multiphysics (see figure 1) [4], as a function of their ampere-turns excitations. These results are then used in SIMION software (see figure 2) [5] to compute the complete electron trajectories starting from the FE tip through the biprism to finish in the detector plane.

The simulations are finally compared to experimental data in order to calibrate the model.

 

[1]  T Denneulin et al, Ultramicroscopy  160 (2016), 98–109.

[2]  F Röder et al, Ultramicroscopy 161 (2016), 23–40.

[3]  F Houdellier et al, Ultramicroscopy 159, Part 1 (2015), 59–66.

[4] https://www.comsol.fr

[5] http://simion.com


Yudai KUBO (Toulouse), Christophe GATEL, Yoshifumi TANIGUCHI, Etienne SNOECK, Florent HOUDELLIER
08:00 - 18:15 #6252 - IM07-390 Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography.
IM07-390 Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography.

Off-axis electron holography can be used to measure the electron-optical phase shift associated with a charge density distribution in the transmission electron microscope (TEM). The charge density can then be recovered either by integrating the Laplacian of the reconstructed phase1 or, equivalently, by applying a loop integral2.  Whichever approach is used, the perturbed reference wave3 does not affect the measurement of the projected charge density inside the specimen so long as it does not itself contain any charges. Here, we study a W nanotip, in which the charge density distribution is of interest for applications in field emission and atom probe tomography. We assess artefacts and noise in the measurements.

Figure 1(a) shows an off-axis electron hologram of a W nanotip recorded at 300 kV using an FEI Titan 60-300 TEM.  The interference fringe spacing is 0.318 nm, the nominal magnification is 140 000 and the voltage applied to the electrostatic biprism is 90 V. The apex of the nanotip has a diameter of approximately 5 nm and is covered with a layer of tungsten oxide.  A voltage of 50 V was applied between the nanotip and a flat electrode positioned approximately 3 µm away from it. In order to remove the contribution to the phase shift from the mean inner potential, two holograms with and without a voltage applied to the nanotip were recorded. The difference between the two phase images was then evaluated after sub-pixel alignment. Figures 1(b) and (c) show the resulting unwrapped phase before and after adding phase contours of spacing 2π/3 radians. Figure 1(d) shows the charge distribution calculated by applying a Laplacian operator to a median-filtered version of the phase image. Figure 1(e) shows cumulative charge profiles along the nanotip determined both using a loop integral and by applying a Laplacian operator to either an unwrapped phase image or the original complex image wave. The integration region is marked by a green dashed rectangle in Fig. 1 (b). The measured charge profile is consistent between the three approaches. Figure 1(f) shows an evaluation of noise in the measurement obtained by performing a similar integration in a region of vacuum indicated by the red dashed rectangle in Fig. 1(b). Results such as those shown in Figs. 1(d) and (e) can be used to infer the electric field and electrostatic potential around the tip. Future work will involve comparing the present approaches with using a model-based technique for determining the charge density from a recorded phase image.

Acknowledgements: We acknowledge the European Union for funding through the Marie Curie Initial Training Network SIMDALEE2 and the European Research council for an Advanced Grant.

References:

1.         Gatel, C., Lubk, A., Pozzi, G., Snoeck, E. & Hÿtch, M. Counting Elementary Charges on Nanoparticles by Electron Holography. Phys. Rev. Lett. 111, (2013).

2.         Beleggia, M., Kasama, T., Dunin-Borkowski, R. E., Hofmann, S. & Pozzi, G. Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography. Appl. Phys. Lett. 98, 243101 (2011).

3.         Matteucci, G., Missiroli, G. F., Muccini, M. & Pozzi, G. Electron holography in the study of the electrostatic fields: the case of charged microtips. Ultramicroscopy 45, 77–83 (1992).


Fengshan ZHENG (Juelich, Germany), Vadim MIGUNOV, Urs RAMSPERGER, Danilo PESCIA, Rafal E.DUNIN-BORKOWSKI
08:00 - 18:15 #4513 - IM08-392 Electron microscopy characterization of yttrium-doped barium zirconate electrolytes prepared with Ni additive: Influence of hydrogen treatment.
IM08-392 Electron microscopy characterization of yttrium-doped barium zirconate electrolytes prepared with Ni additive: Influence of hydrogen treatment.

Proton-conducting Fuel or Electrolysis Cells (PCFCs) are thought to be a promising alternative to Solid Oxide Fuel/Electrolysis Cells [1-2]. The most interesting proton conducting materials for electrolytes include doped barium zirconate, doped barium cerate or their solid solution. Recently, an innovative approach was proposed which allowed obtaining dense ceramics with grain size of typically 2-4 µm. This new process is based on the reactive sintering of all oxide precursors with the use of NiO as sintering aid [2-4]. Besides being dense, the samples obtained, such as yttrium-doped barium zirconate (BZY), show a very high proton conduction with little influence of Ni-species on conduction properties.

We tested the mechanical properties of this BZY material for application as PCFCs electrolyte and we showed that materials made from this process present a fast degradation of mechanical properties when put in hydrogen-rich conditions.

The objective of the present work was thus to understand the atomic-scale origin of this fast degradation. For this purpose, different electron microscopy techniques have used such as Scanning Transmission Electron Microscopy (STEM-HAADF), Energy dispersive spectroscopy (EDS), Electron Energy Loss spectroscopy (EELS). Structural and chemical microscopy analysis show that the sample failure is due to the reduction of NiO nanoparticles at grain boundaries (Figure 1, 2).

 

Acknowledgments : The microscopy work was carried out within the MATMECA consortium supported by the ANR under contract number ANR-10-EQUIPEX-37.

 

*paul.haghi-ashtiani@centralesupelec.fr, *Guilhem.dezanneau@centralesupelec.fr

 

References:

1    F. Lefebvre-Joud, G. Gauthier, J. Mougin, J. Applied Electrochem., 2009, 39(4), 535

2    E. Ruiz-Trejo, J.T.S. Irvine, Solid State Ionics, 2012, 216, 36–40

3    S. Nikodemski, J. Tong, R. O'Hayre, Solid State Ionics, 2013, 253, 201

4    J.H. Tong, D. Clarck, L. Bernau, M Sanders, R. O'Hayre, J. Materials Chem., 2010, 20(30), 6333


Paul HAGHI-ASHTIANI (CHATENAY-MALABRY), Mohamed BEN HASSINE, Desiree CIRIA, Manuel JIMENEZ-MELENDO, Veronique AUBIN, Guilhem DEZANNEAU
08:00 - 18:15 #4540 - IM08-394 Quantifying transition radiation by employing CL and EELS.
IM08-394 Quantifying transition radiation by employing CL and EELS.

The excitation probability per incoming electron for transition radiation (TR) is measured by employing electron energy losses spectrometry (EELS) and cathodoluminescence (CL) in a transmission electron microscope (TEM) using beam energies varying from 20 – 200 keV. We further demonstrate that TR is excited only at the sample surfaces, because the emitted intensity and the respective energy loss are independent of the sample thickness. As specimen we use an aluminum single crystal, because TR is known to be strongest on metals.

For the CL experiments we use a GATAN VULCAN system with upper and lower mirror. The recorded light spectra are corrected for the system response of the spectrometer and glass fiber cables. Then the spectra were integrated over the whole visible range (400-900 nm) and finally the conversion coefficient of counts to emission probability was done for the 20 keV spectra as described in [1]. Once the conversion coefficient was found, this unique value (depending on the collection efficiency of the optical mirrors in the VULCAN system) was applied to all other spectra thus giving a beam energy dependent emission probability (Fig 1 right). The behavior is perfectly in agreement with the Ginzburg-Frank theory [2]. The experiment was performed also with varying sample thicknesses in order to demonstrate that TR excitation is a surface effect only (Fig 1 left).

Using EELS we perform three different experiments: (i) an angle resolved measurement where we see the angular distribution of the transition radiation losses (TRLs) having an angular resolution of 7.5 µrad (see Fig 2), (ii) a thickness dependent experiment using 40 keV electrons showing the surface loss character of the TRLs (Fig 3 left), and (iii) an energy dependent experiment for determining the TR emission probability (Fig 3 right). The TR emission probability is the ratio between the TRL intensity and the total electron intensity.

For the angular resolved experiment we are raising the specimen out of the eucentric position by 278 µm and are choosing the largest possible magnification. Thus we achieve an effective camera length in the diffraction pattern of 288 m. The angular resolution of the electron beam is measured to be 7.5 µrad. Subsequently we move the beam 400 µrad across the spectrometer entrance aperture while recording a set of 200 single spectra, all of them 2 µrad apart (Fig 2 center).

For the experiments determining the emission probability per incoming electron we simply divide the integrated intensity of the TRLs after subtraction of the zero loss peak and the intraband transition intensities by the total spectral intensity. At the respective experimental conditions (collection semi-angle of 0.6 mrad) only appr. 70% of the angular distribution of the EELS spectrum falls into the spectrometer entrance aperture, whereas all of the TRL intensity is collected. This is because the angular distribution is extremely narrow (see Fig 2). Consequently we have to correct for the not collected intensity, too. Finally we find that the integrated emission probabilities measured with CL and EELS are consistent to each other. The results are given in Fig 3 (right hand side).

As expected from theory and from the CL experiment, a thickness dependence cannot be observed in EELS, too.

Summing up it is the first time that within a TEM transition radiation of aluminum was studied by means of EELS and CL. We proved experimentally that the angular dispersion of the TRLs is within the light cone, that TR is emitted from the surfaces only, and we determined the photon emission probability with respect to the beam energy. Due to the fact, that the probability for the emission of TR is very low, even for aluminum, it is even smaller in the case of semiconductors, where low loss EELS is used for determining the local dielectric behavior.

[1]       BJM Brenny, T Coenen and A Polman, J. Appl. Phys. 115 (2014) 244307
[2]       VL Ginzburg and IM Frank, JETP 16 (1946) 1 - 15


Michael STÖGER-POLLACH (Vienna, Austria)
08:00 - 18:15 #4568 - IM08-396 Atomic plane resolution EMCD measurement by STEM-EELS under 3-beam diffraction condition.
IM08-396 Atomic plane resolution EMCD measurement by STEM-EELS under 3-beam diffraction condition.

    Electron magnetic circular dichroism (EMCD) in the transmission electron microscope (TEM) is a relatively immature experimental technique, though it has already demonstrated quantitative results with a spatial resolution superior to what can be achieved with X-rays [1]. The main obstacles for widely sharing the method for routine use are (i) low SNR because of off-axis EELS detection, (ii) necessity of a very thin sample (a few nanometers) for quantitative analysis and (iii) unstable pre- and post-edge backgrounds by subsequent measurements in changing the aperture positions. There have been a number of attempts to overcome those difficulties, such as collecting a large quantity of data and applying statistical/information data processing methods [2,3]. In the present study we found a novel experimental condition that allowed us to solve almost all these issues and even applicable to atomic resolution EMCD measurements.

     Consider the symmetrical 3-beam diffraction condition with an appropriate convergence angle, where the diffraction discs are partially overlapped, as shown in Fig. 1. In this configuration the magnetic signals included in a core-loss spectrum (e.g.,  Fe-L2,3 white-line) is expressed in a simplified form of Eq. (1), where TG is the transmittance of the Bragg disc of G, the argument of the sine function is the phase difference between the electron wavefunctions at a point of the disc overlapping regions, and S(q, q - G, E) is the mixed dynamical form factor [4]. The first term stands for the classical EMCD signal. The second term is a new ‘phase-dependent EMCD’, which can be further simplified within the dipole approximation as in Eq. (2), where Mz is the net magnetization in the direction of the optic axis and Δx is the spatial coordinate in real space, measured perpendicular to the lattice planes with respect to the arbitrary atomic plane. Eq. (2) implies that a quite large fraction of chiral ± magnetic signals appear in an alternating manner in scanning the sub-nanometer electron probe on the sample perpendicular to the lattice fringes with the EELS entrance aperture covering an extended area over the either side of the diffraction discs with respect to the x axis in Fig. 1.

     The above proposed scheme was tested on the symmetrical 3-beam [110] diffraction condition in a 20 nm thick Fe film for STEM mode with the EELS aperture placed slightly off-axis on either side of the systematic row of the reflections. A focused electron probe with the convergence semi-angle of 10 mrad is scanned across the sample surface to find 1-dimensional lattice fringes as the ADF-STEM image, as shown in Figs. 2(a) and (b). The chiral ± EMCD signals should appear at the 1/4 of the lattice interval on both sides from the exact atomic column fringes, with the EMCD signal of the opposite sign appearing on the opposite sides of a lattice fringe, as shown in Fig. 2(c). Finally we applied a set of statistical treatments [5] to efficiently extract the EMCD signal. The extracted EMCD signal and its spatial localization map are shown in Fig. 3. Although the spatial distribution of the magnetic signal was quite noisy, the experimental intensity profiles of the non-magnetic and magnetic (EMCD) signals averaged over the direction parallel to the lattice planes showed the expected localization patterns, as shown in Fig. 4.

     This method requires only a single scan to obtain the chiral ± EMCD signals and also exhibits stable signal fractions with the change in sample thickness. The present scheme solves most of the existing experimental difficulties and is a novel breakthrough for quantitative atomic scale EMCD measurements.

 

References

[1] Hebert and Schattschneider, Ultramicrosc. 96 (2003) 463-468.

[2] Muto, Tatsumi and Rusz, Ultramicrosc. 135 (2013) 89-96.

[3] Muto et al, Nature Commun. 5 (2014) 3138-1-5.

[4] J. Rusz, J. C. Idrobo, and S. Bhowmick, Phys. Rev. Lett. 113, 145501 (2014).

[5] C. Andersson, R. Bro, Chem. Int. Lab. Sys. 52, 1 (2000).

[6]  This work was in part supported by Grant-in-Aid for Scientific Research of JSPS and Japan-Sweden Joint Research Program by JSPS and STINT.


Jan RUSZ, Shunsuke MUTO (Nagoya, Japan), Jakob SPIEGELBERG, Roman ADAM, Daniel E. BÜRGLER, Claus M. SCHNEIDER
08:00 - 18:15 #5116 - IM08-398 Transition potentials for inelastic scattering of relativistic electrons.
IM08-398 Transition potentials for inelastic scattering of relativistic electrons.

For acceleration voltages routinely used in the Transmission Electron Microscope (TEM), the kinetic energies of the beam electrons encompass a significant portion of their rest energies. Consequently relativistic corrections can become important for image calculation, as seen for example in relativistic calculations of electron energy loss images [1,2]. Therefore one has to describe the scattering process between a beam electron and an electron in the specimen using a completely relativistic formalism.
However, since the electrons in the specimen are usually non-relativistic, the question arises which relativistic corrections are important for a non-relativistic specimen electron excited by a relativistic beam electron. To examine this problem, one can describe the excitation of a specimen electron using a transition potential, as is often done in multislice simulations of inelastic scattering [3,4]. We derive a relativistic generalization of the transition potential to elucidate which relativistic corrections are important for the specimen electron.


In first order perturbation theory, an excitation event can be described by eq. (1), where He is the Hamiltonian of the beam electron and Hi is the Hamiltonian of the interaction between beam electron Ψ and specimen atom χ. The last term in eq. (1) can be used to define the transition potential, which in this case describes the transition of the specimen atom from the ground state 0 to the excited state m≠0.
Inserting non-relativistic quantities for He, Hi, χ and Ψ yields the well known Yoshioka equations [5]. Using relativistic quantities in eq. (1), we obtain the Dirac equation (2). Here, Aμ is the electromagnetic four-potential of the specimen, while {Am0}μ is the relativistic transition potential and γμ=(γ0, γ1, γ2, γ3) are the Dirac matrices. Since the relativistic transition potential has to satisfy an inhomogeneous wave equation, one way to obtain it is to solve eq. (3), for example with the help of the Green's formalism. This leads to eq. (4) (see also [6]), where φ is the four-spinor of an electron in the specimen and ΔEm0 is the energy difference between the states 0 and m divided by hc.


To calculate the matrix element Iμ(q) (see eq. (6)), the four-spinors of the excited specimen electron before and after the excitation by the beam electron are required. We describe the specimen electrons using Darwin wavefunctions [7]. These wavefunctions, shown in eq. (5) for the spin up and the spin down case, are an approximation of the four-component spinor in the non-relativistic limit. They relate the (relativistic) four-spinor φ to the (non-relativistic) Schrödinger wavefunction Φ.
One can now insert, for example, the spin up Darwin wavefunction into Iμ(q), obtaining eq. (6). Here, I0 is a matrix element also occurring in the non-relativistic calculation, while the other terms are relativistic corrections. To assess which correction terms are important, we will evaluate the integrals I0 ,Ix , Iy ,IZ and IΔ. The resulting transition potentials can be used for relativistic multislice simulations.



[1] R. Knippelmeyer et al., J. Microsc. 194 (1999) 30
[2] C. Dwyer, Phys. Rev. B 72 (2005) 144102
[3] C. Dwyer, Ultramicroscopy 104 (2005) 141
[4] L. J. Allen et al., Ultramicroscopy 151 (2015) 11
[5] H. Yoshioka, J. Phys. Soc. Jpn. 12 (1957) 618
[6] A. Lubk, PhD thesis, TU Dresden (2010)
[7] C. G. Darwin, Proc. Roy. Soc. A 118 (1928) 654


Stephan MAJERT (Münster, Germany), Helmut KOHL
08:00 - 18:15 #5124 - IM08-400 Real-space mapping of electronic orbitals.
IM08-400 Real-space mapping of electronic orbitals.

The world as we know it is shaped by electronic states. Be it optical, electrical, or magnetic properties, thermal conductivity, or chemical bonding: almost all macroscopic properties can be traced back to the electronic states on the nanoscale. It is all the more surprising that they remained mostly elusive from an experimental perspective so far.

In this work, we show that the mapping of transitions between electronic states in real space with Ångström resolution is indeed possible using state-of-the-art TEM and EELS [1]. As a model system, we used a 20 nm thick rutile sample oriented in [0 0 1] direction. In this system, the Ti L2,3 edge splits into contributions from states with eg and t2g symmetry, respectively. Fig. 1 shows the experimental L2-eg map extracted from the dataset acquired on a double Cs-corrected FEI Titan cubed microscope operated at 80 keV after drift-correction and averaging over 12 unit cells. An asymmetry that is rotated by 90° for nearest neighbors is clearly visible that is caused by the peculiar shape of the eg states as shown in the charge density distribution. Furthermore, simulations using the multislice [2] and mixed dynamic form factor [3] approaches were performed. As is evident from fig. 1, the simulations are in excellent agreement with the experimental data.

One crucial prerequisite for such asymmetries to appear lies in the local environment of the atom that is being probed [4]. If the atomic site is invariant under a high symmetry point group, many states will be degenerate and their contributions to the scattered intensity will add up to a circularly symmetric map according to Unsöld's theorem [5]. A prototypical example of this for p-states is shown in fig. 2. Only if the point group symmetry is low enough, the degeneracy is lifted and transitions to individual states can be mapped by selecting a suitable energy window.

This work shows that the mapping of individual electronic states is possible with widely used tools such as TEM and EELS. Thus, it paves the way for exciting new applications such as probing defect states at surfaces and interfaces that could revolutionize material science, as well as our experimental grasp on electronic properties and bonds on the atomic scale.

 

Acknowledgements: Support by the Austrian Science Fund (FWF), grant nrs. I543-N20, SFB F45 FOXSI, J3732-N27, the ERC under the EU's 7th Framework, grant nr. 306447, and the Natural Sciences and Engineering Research Council of Canada (NSERC) is acknowledged.

 

[1] Löffler et al., submitted
[2] Kirkland, “Electron Energy-Loss Spectroscopy in the Electron Microscope”, Plenum Press 1996
[3] Löffler et al., Ultramicroscopy 131 (2013) 39
[4] Löffler et al., in preparation
[5] Tinkham, “Group Theory and Quantum Mechanics”, Dover Publications 2003


Stefan LÖFFLER (Wien, Austria), Matthieu BUGNET, Nicolas GAUQUELIN, Sorin LAZAR, Elias ASSMANN, Karsten HELD, Gianluigi A. BOTTON, Peter SCHATTSCHNEIDER
08:00 - 18:15 #5357 - IM08-402 Minimising the Change of Collection Angle with Energy Loss in STEM-EELS.
IM08-402 Minimising the Change of Collection Angle with Energy Loss in STEM-EELS.

STEM-EELS is a powerful tool for investigating materials systems. With aberration corrected columns, the probe is large, requiring a large collection angle and hence a small camera length. The probe angle and the collection angles are normally measured using electrons that have lost no energy. For the electrons that lose energy in the specimen, each lens after the specimen increases in strength. Thus the camera length, the pattern distortion and the position of the final cross-over change.

With the four projector lenses in a modern TEM, many lens configurations can give a specific camera length. Some configurations lead to zero 3rd order distortions, and Craven and Buggy (1981) showed some configurations give no chromatic change of camera length. A lens can either create a real image of the probe after the lens (α mode) or a virtual image before it (β mode). These have opposite chromatic effects on the camera length and so can be used to null the change. If the four lenses are used in a  β, α, β, α arrangement, the camera length and the final axial cross-over position (the object for the spectrometer) can be set while maintaining no chromatic change of camera length.

Lens calculations were used to identify a series of configurations with the desired camera length and crossover position. These were then investigated experimentally and the two giving the best performance were identified for further electron optical investigation. This paper compares one, (S-9), with the original best configuration (S-1), which was based on a β, α, α, α arrangement.

Figure 1 shows the post-spectrometer camera output when using a Si specimen in a JEOL ARM 200F equipped with a Gatan QUANTUM DualEELS system, operated at 200kV.   The width corresponds to an energy loss range of 2048eV. The upper four parts are for S-1 and have offsets of 0, 1000, 2000 and 3000eV. The lower four parts are the equivalent results for the S-9. The narrowing of the intensity band with energy loss seen with S-1 is no longer present with S-9.

The upper part of Figure 2 shows the Si K-edge recorded with the two configurations while the lower part shows the peak from stray scattering within the gun. In both cases, the features are sharper with S-9.

To investigate the chromatic change of camera length, the microscope EHT was reduced in steps of 500V while leaving the lens excitations unchanged.   The STEM image was refocused after each change using the condenser mini-lens.   In this way, the electrons in the lower column behave as though they had lost the equivalent energy.   Diffraction patterns from a low index pole of Si were recorded at each offset using the pre-spectrometer camera. The chromatic change of camera length was measured using the width of the Kikuchi bands. The first order Laue zone was used to determine the 3rd order radial distortion.   The diameter of the pattern cut-off was also measured.

The upper part of Figure 3 shows the corresponding change in the acceptance angle of the 2.5mm spectrometer aperture. This confirms the reduced chromatic change of camera length for S-9. Quantification based on the 0V acceptance angle would give significant errors when using S-1, particularly for higher losses.

S-1 had zero 3rd order radial distortion at 0V offset but it became steadily more negative with increasing loss.   S-9 had approximately constant positive 3rd order radial distortion.

The lower part of Figure 3 shows the cut-off diameters for the two configurations in camera pixels.   Both shrink steadily with energy loss but the S-9 diameters are much bigger.   At 3000V, the cut-off of S-1 is close to the 5mm spectrometer aperture diameter.   To determine the scattering angles corresponding to these cut-offs needs a more detailed understanding of the higher order aberrations which cause them.

In conclusion, careful choice of the configuration of the projector lenses can minimise the chromatic effects on the collection angle in EELS and so avoid errors in quantification, particularly for higher energy losses. 

REFERENCES:  Craven AJ and Buggy TW Ultramicroscopy 7 21 (1981)

ACKNOWLEDGEMENTS:  The authors would like to thank SUPA and the University of Glasgow for funding.


Alan J. CRAVEN, Ian MACLAREN (Glasgow, United Kingdom), Sam MCFADZEAN, Hidetaka SAWADA
08:00 - 18:15 #5487 - IM08-404 Raman-spectroscopic imaging of intracellular bacteria.
IM08-404 Raman-spectroscopic imaging of intracellular bacteria.

Several bacteria are adapted to colonize and live together with multicellular organisms. There are some pathogenic bacteria that are even able to invade eukaryotic cells for different purposes, usually to escape the immune response or antibiotic treatment, but also to take advantage of growth in the nutrient rich host cell environment. Intracellular bacteria commonly are associated with chronic infections and difficult to treat. Studying intracellular bacteria in order to gain more knowledge about their pathogenesis requires sophisticated methods that deliver specific information from the bacteria while residing in the host cell environment. In this regard imaging methods are superior to follow both, the bacteria and host cell, at the same time without the necessity of extracting the bacteria.

Confocal Raman micro spectroscopy is a powerful tool that allows to make hyperspectral false-color images after scanning of a biological sample in a non-destructive and label-free way. We demonstrate that it is possible to obtain such images of endothelial cells containing Staphylococcus aureus (1), a prominent hospital-related pathogen that is assumed to use intracellular lifestyle to persist in the body. Raman spectroscopic scans using a 532 nm laser and a low step size of 0.25 µm for scanning were generated and bacteria could be specifically detected using the spectral unmixing algorithm N-FINDR (2). Additionally, it was possible to visualize host cell organelles and particles such as lipid droplets, the nucleus of the host cell or peri-nuclear region. Host cell organelles that appear similar to bacteria through their size and shape could be well discriminated from the bacteria through the specific Raman spectrum. False-color images revealed the morphology and different location of the bacteria in the host cell even in three dimensions by confocal scanning in Z. The detection was verified through immunofluorescence labelling and fluorescence microscopy afterwards.

The Raman spectra extracted from the images further could be used to analyze growth changes based on the chemical information delivered by the spectra such as a relative change in the nucleic acid and protein amount. This information helps to follow the intracellular bacteria in their growth behavior and detect changes due to changing host cell conditions.

Additionally, it is shown that Raman-based imaging can be extended from single host cells in vitro to in situ tissue samples as we demonstrate for symbiotic bacteria detected in special pockets near to the hindgut of larvae of the forest cockchafer. Through this approach production of poly-3-hydroxybutyrate, an important bacterial storage compound, could be detected and located to different areas and bacterial populations in the Raman image.

We conclude that confocal Raman spectroscopy has the potential to become a valuable imaging tool for studying pathogenic bacteria in host cells and tissues because of the label-free and specific detection capacity that allows to analyse even living samples. Further, both bacteria and host cells can be studied at the same time. A combination with other imaging methods such as fluorescence microscopy allows to study the bacteria in more detail, i.g. the role of specific proteins in overall changes of the bacteria growth.

Acknowledgements go to the financial support by the BMBF (FKZ 01EO1002 and FKZ 01EO1502) and the EU within the Framework Program 7 (P4L, Grant agreement no.: 224014), and C. Beleites for help with “R”.

The authors declare no conflict of interests.

References:

(1)    Große, C., Bergner N., Dellith, J., Heller, R., Bauer, M., Mellmann, A., Popp, J., Neugebauer, U. Anal. Chem. 2015, 87, 2137-2142.

(2)    Winter, M. E. Proc. SPIE 1999, 3753, 266


Christina GROSSE (Jena, Germany), Pol ALONSO, Erika ARIAS CORDERO, Jan DELLITH, Regine HELLER, Wilhelm BOLAND, Alexander MELLMANN, Michael BAUER, Jürgen POPP, Ute NEUGEBAUER
08:00 - 18:15 #5762 - IM08-406 X-ray absorption in pillar shaped TEM specimens.
IM08-406 X-ray absorption in pillar shaped TEM specimens.

In thin TEM specimens quantification of X-ray analysis is generally done with the Cliff-Lorimer method neglecting X-ray absorption in the specimen.  This assumption is valid for X-ray transitions with similar energies but can, even for specimens thinner than 100 nm, lead to appreciable error when low and high energy peaks are combined for the quantification.  These considerations become more important for 360º X-ray tomography for which pillar shaped specimens are used with larger diameter than the thickness of normal plan-parallel TEM specimens.

In this work the absorption effects are compared for pillar and 2º wedge shaped specimens prepared for a Si75Ge25 layer on Si and capped for the TEM specimen preparation with a 150 nm SiO2 layer and ion deposited Pt in the FIB.  The EDS analysis is made in a Titan3 60-300 instrument with SuperX EDS detector at 120 kV.  Quantification is done with linescans extracted from EDS maps using the Bruker Esprit software. The considered X-ray peaks are SiK at 1.739 keV, GeL at 1.188 keV and GeK at 9.885 keV. The orientation of the specimens relative to the 4 detectors is shown in Fig. 1. 

The quantitative linescan across the radius of the pillar is shown on Fig. 2a vs specimen thickness as calculated based on the diameter of the pillar.  The outer layer is oxidized due to air exposure of the specimen after the FIB preparation.  Next an amorphous SiGe layer is present due to the 30kV FIB preparation.  The Ge concentration calculated with GeK & SiK and GeL & SiK differs slightly which can be attributed to absorption of the low energy X-rays.  But in both cases the Ge concentrations are nearly constant through the full diameter of the pillar (except in the oxide which is Si-rich), i.e. it can be concluded that even for transitions with large difference of energy, the absorption is not dependent on the specimen thickness.  This is a result of the shape of the pillar as is illustrated on Fig. 3a which shows a section through the pillar in the plane across the electron beam direction and 2 opposite detectors.  In the center of the pillar, i.e. for maximum specimen thickness, the path lengths of the X-rays through the specimen vary with depth along the beam axis.  On average the depth dependence can be approximated by the lengths at half thickness, i.e. in total for the 4 detectors it is 4*lc. At the thinnest edge of the pillar the X-rays travel a longer distance le through the pillar, i.e. in total for all detectors 2*le.  Both total lengths are nearly equal and this holds also for positions between center and edge, i.e. for intermediate thickness. Therefore, as observed on Fig. 2a, the strength of the absorption is independent of thickness. 

In a plan-parallel specimen with thickness equal to the diameter of the pillar the path lengths of the X-rays are much longer (Fig. 3b).  Taking half depth as the average length, the total length is 4*lp, which is more than 2 times larger than the total lengths in the pillar case.  Due to the wedge shape of the specimen the length to the detectors on left and right side slightly differ (not shown on the figure).  Moreover, for the plan parallel specimen the total absorption path length is directly proportional to the specimen thickness.  Therefore the absorption increases with specimen thickness and the Ge concentration increases with thickness when using transitions with large energy difference (GeK & SiK) and decreases in the case of GeL combined with SiK (Fig. 2b).  Extrapolated to zero thickness the concentrations coincide, i.e. the difference of the calculated concentrations with GeK and GeL is due to absorption.  The calculated concentrations in the pillar with diameter 320 nm are similar to the concentrations in the wedge specimen near 150 nm thickness as can be expected based on the ratio of the absorption path lengths in the two cases.

Exact calculation of the path lengths in the pillars requires an integration over the thickness along the electron beam direction.  The strength of the absorption in the direction of the different detectors also depends on the different layers that are crossed, i.e. the capping stack above the SiGe or the Si substrate below the SiGe.  Therefore a full quantitative estimate of the absorption is not easily possible. 

It can be concluded that absorption effects are constant throughout the diameter of a pillar specimen and are about a factor of 2 weaker than for plan-parallel specimens with thickness equal to the diameter of the pillar.

1. Y. Qiu, V.H. Nguyen, A. Dobbie, M. Myronov, T. Walther, J. Phys. Conf. Ser. 471, 012031 (2013).


Hugo BENDER (Leuven, Belgium), Paola FAVIA, Yang QIU, Olivier RICHARD
08:00 - 18:15 #5838 - IM08-408 Chemical state analysis using Soft X-ray Emission Spectrometry in low voltage FE-SEM.
IM08-408 Chemical state analysis using Soft X-ray Emission Spectrometry in low voltage FE-SEM.

The development of low voltage (LV) FE-SEMs has been in progress, and spatial resolution for observation of less than 1.0 nm can now be achieved even at 1 kV. On the other hand, recent advanced nano materials are getting more complex and micronized. Therefore to understand details of nano materials precisely, it is necessary to utilize high spatial resolution images. However, chemical state analysis in FE-SEM is also important as well as the high spatial resolution imaging. Recently, it becomes possible to analyse both elemental and chemical states in FE-SEM by using newly developed Soft X-ray Emission Spectrometer (SXES). The advantages of SEM-SXES are high energy resolution spectra, analytical spatial resolution and applicability to bulk samples.  In this report, we focus on high resolution imaging and chemical state analysis using SXES in low voltage FE-SEM.

                                     

The first commercial type SXES has been developed by Prof. M.Terauchi group of Tohoku University in collaboration with JEOL1). The SXES is possible to analyse chemical bonding states because it has high energy resolution at X-ray energy of about 200 eV or even below such as 0.3 eV at the Al Fermi edge. In addition, this technique can detect X-rays in an energy range from 50 to 210 eV, of which characteristic X-ray energy range includes the emission spectra based on the valance band transitions in many elements2).

 

The SXES is installed in the low voltage (LV) FE-SEM JSM-7800F Prime. This LVFE-SEM can achieve large probe current even under low voltage condition such as 20 nA at 2 kV with a 30 μm diameter objective aperture, which is due to new design of high brightness Schottky emitter electron gun so called In lens Schottky plus. In addition, there is the decelerating method in the JSM-7800F prime, called Gentle Beam Super High resolution (GBSH) mode. A negative voltage is applied to a sample in the GBSH mode. Therefore the incident voltage is reduced at low voltage to keep smaller probe size. Combination of the in-lens Schottky plus electron gun and the GBSH mode is suitable for the SXES analysis.

 

Usually the SXES is used at low kV to reduce background of continuous X-rays. Figure 1 shows SEM images and spectra taken by SXES for the comparison between the incident electron energies of 2 keV and 15 keV. Sample is Prussian blue (PB, FeIII4[FeII(CN)6]3) and these images were acquired by Everhart-Thornley detector. The results show that the spectrum taken at 2 keV has less background than at 15 keV due to small electron interaction volume in the sample at 2 keV.

 

Figure 2 shows SXES spectra of PB and Prussian white (PW: K4FeII4[FeII(CN)6]3) , in which the PW sample was reduced chemically from PB sample. The incident electron energy was 2 keV and the probe current was 22 nA. The PW is well known in that the CN bonding state is different from PB. The result shows that the peak energy and spectral shape are different between the N Kα spectra of PW and PB because of different chemical bonding states.

 

References:

[1] M. Terauchi, H. Yamamoto and M. Tanaka, Journal of Electron Microscopy, 50, 101, (2001).

[2] M. Takakura, T. Murano, and H. Takahashi, JEOL News volume50, July (2015)

[3] S. Asahina, M. Suga, H. Takahashi, H. Y. Jeong, C. Galeano, F. Schüth, and O. Terasaki,. APL Materials 2, 113317; doi: 10.1063/1.4902435, (2014)


Yusuke SAKUDA (Tokyo, Japan), Manabu ISHIZAKI, Takanari TOGASHI, Shunsuke ASAHINA, Masaru TAKAKURA, Hideyuki TAKAHASHI, Masato KURIHARA
08:00 - 18:15 #5844 - IM08-410 Using EELS analysis in STEM to investigate the helium content in irradiated materials.
IM08-410 Using EELS analysis in STEM to investigate the helium content in irradiated materials.

Helium very often is forming inside the reactor structural materials during neutron irradiation due to different nuclear reactions. Because of the helium-vacancy interaction effect the later may be stabilized by this elements. The temperature vacancy mobility leads to formation of the pores inside the materials that take part in the swelling effect. It is very important for steels under high fluence fast neutron applications, internal parts of pressure vessel nuclear reactors and also for fusion reactors. Nowadays researchers are performing experiments at accelerators to simulate under ion irradiation the materials atomic damage production and understand the possible radiation stability of the new designed materials. He ions irradiation can be used also to simulate above mentioned helium production.

Pores inside irradiated steels were visible for many years because of the typical uderfocus/overfocus TEM contrast changing. Many pores were characterized by the faceting shape that means the vacancy nature of these objects, but the presence of helium inside can be proved using analytical energy loss technique only. In this work, we show the implementation of EELS technique in STEM mode to find out the helium content inside the pores in the 40 keV He ion beam irradiated up to 5*1020m-2 at 650oC Eurofer ODS steel. Because of the low value of projected range of these ions the best way was to make cross-section samples using FIB technique.

Figure 1 shows the STEM dark field image of the steel cross-section sample under irradiation at the ions projected range region. The thickness of the sample at interesting area was about 0.7*λ. We can see that pores with different sizes and shapes were formed under high temperature irradiation. Some of pores were faceting type that indicates the vacancy nature of their structure.

To understand the helium content inside the pore we took low energy EELS spectra from the center of the pore (probe position was indicated at figure 1) in STEM and the corresponding spectra from matrix close to the pore position. After background subtraction we normalized the intensities of two spectra by fitting the intensities of the second peak (after plasmon peak) at 57.7 eV position (see figure 2). As was shown at figure 2, the difference between these normalized spectra appeared to identify the He core-loss line with maximum position at 22.8 eV. Experimental measuring of the He peak intensity (I) together with the measuring of elastic peak intensity (Io) allowed us to calculate the amount of helium atoms in the pore [1]:

N=I/(Io*σ*d), where σ is the He cross section and d is the pore diameter.

It is known [1], that the value of energy shift between the positions of the He core-edge in the pore inside the solids and for free molecular gas (21.218 eV) is correlated with the pressure of the gas inside the pore and its He density. We have got densities of ~19 at.He/nm3 for pores with 20nm diameter and ~70 at.He/nm3 for 3.4nm pores respectively that is close to the literature data [2]. Thus, ELLS technique is very useful for irradiated materials helium content analysis.

Literature

[1] C.A. Walsh, J. Yuan, L.M. Brown, Philos. Mag. A 80 (2000) 1507.

[2] S. Fréchard, M. Walls, M. Kociak, J.P. Chevalier, J. Henry, D. Gorse, Journal of Nuclear Materials 393 (2009) 102–107


Kirill PRIKHODKO (Moscow, Russia), Olga EMELYANOVA
08:00 - 18:15 #5853 - IM08-412 EELS Probing of lithium based 2-D battery compounds processed by liquid phase exfoliation.
IM08-412 EELS Probing of lithium based 2-D battery compounds processed by liquid phase exfoliation.

Two-dimensional lithiated nanosheets usually show excellent electrochemical performance due to an increase in surface area and shorter diffusion paths. However, processing techniques, such as shear mixing or liquid phase exfoliation could induce phase changes or knock out some of the structural lithium (Li) ions, what in turn might result in poor electrochemical performance. Here different lithiated layered compounds mainly LiCoO2, LiMn2O4, and Li5Ti4O12 were chemically exfoliated and investigated using electron energy loss spectroscopy (EELS) for their Li-K edge. Further analyses were carried out, looking at the oxygen (O) K edge with their respective transition metal core loss peak (Mn, Co and Ti) which revealed changes in the Energy loss near edge structures (ELNES) when compared to the unlithiated compounds. STEM-EELS analyses confirmed uneven distribution of lithium within the lithiated layered materials. In this work, EELS was used for the first time to detect and to probe the chemical environment of the lithium in liquid phase exfoliated material. 


Anuj POKLE (Dublin, Ireland), João COELHO, Eva MACGUIRE, Clive DOWNING, Patrick CASEY, Cormac MCGUINNESS, Valeria NICOLOSI
08:00 - 18:15 #5855 - IM08-414 HRTEM and EELS investigations in superconductive NbN films modified under ion beam irradiation.
IM08-414 HRTEM and EELS investigations in superconductive NbN films modified under ion beam irradiation.

HRTEM and EELS investigations in superconductive NbN films modified under ion beam irradiation.

M.M. Dementyeva1, K.E. Prikhodko1

NATIONAL RESEARCH CENTRE «KURCHATOV INSTITUTE»,

Dementyeva_mm@nrcki.ru

 In this work we investigated superconductive NbN thin films. Interest in the latter is caused by demand for high quality new devices. Cryoelectronic devices is nanoscale functional elements, for instance SSPD, SQUID, THz HEB, based on ultra-thin films with high limiting characteristics. One of the techniques of creating such devices was developed in Russia in the NRC "Kurchatov Institute". The developed technique was named radiation-induced method. This method allows to realize a control manner selectively changes in the atomic structure of thin-film materials and modifications of the physical properties under irradiation with low-energy beams with different composition [1, 2].

 Samples containing niobium and nitrogen (NbN) were deposited on a single crystal silicon substrate coated with a 0,15 microns layer of amorphous oxide SiO2. The thickness of the initial film was 5 nm.

 The NbN ultrathin films were irradiated by ion beams extracted from a high-frequency discharge plasma. Ion beams consist of protons and OH ions with energies (0,1-1) keV in a dosage range (1,6-4) d. p. a. for nitrogen.

 To study the chemical composition of the origin and irradiated samples were applied electron energy-loss spectroscopy (EELS). Spectra were recorded with a Titan 80-300 electron microscope equipped with a GIF-2001 energy loss spectrometer. Data were transferred into TEM Imaging & Analysis Software (TIA). EELS spectra were collected in the STEM mode at 200 keV beam energy. The collection semi-angle at the sample, as defined by the objective aperture and camera length, was 5,6 mrad. Typically acquisition times were ~200 s. Cross sections samples NbN/SiO2/Si were prepared by FIB Helios Nanolab 650 at 30 keV accelerating voltage of ion gun and 2,5 nA current and the final thinning was done at 2-5 keV and 0,12 nA current.

 Quantitative analysis was carried out with equation (1): NA/NB=[IA(β,Δ)*σB(β,Δ)]/[IB(β,Δ)*σA(β,Δ)], where IA, IB - integrated intensities of the peaks after background subtracting, and σA and σB - ionization cross section [3]. Determination of the phase composition in the initial and irradiated samples was performed by the Fourier - transform diffraction pattern obtained from the corresponding HRTEM image.

 Diffraction analysis showed that grains of non-irradiated material correspond to NbN cubic crystal system (Fm-3m) with lattice parameter a=0,4394 nm. Phase composition changes were observed when the irradiation dose was 2 d. p. a. for nitrogen. Figure 1 presents the diffraction pattern analysis from individual grains. The formation NbN0,64O1,36 monoclinic system phase (P21/c(14)) with cell parameters a=0.49808 nm, b=0.50250 nm, c=0.52097 nm, α=γ=90о, β=100оwas defined. These data were confirmed by the electron energy loss spectroscopy (figure 2).

 Quantitative analysis demonstrated that films irradiated at different doses consist of two regions: region with modified atomic composition and region of the initial NbN film. According to the results of the profile spectra, asymptotic functions were calculated for nitrogen, niobium and oxygen (fig.3, 4). Using asymptotic function, we concluded following. First, with increasing ion irradiated dose, nitrogen atomic concentration decreased to zero in the region close to the surface and the ratio of atomic concentrations for oxygen and niobium correspond to niobium oxide. Secondly, the thickness of the oxidized upper layer increased with increasing irradiation dose, due to the volume changes accompanying the niobium oxide formation from the niobium nitride phase. Thirdly, the nitrogen atomic concentration decreased in the region adjoined to the substrate, but wasn’t decreased to zero, and oxygen atomic concentration was increased, i.e. there was a partial replacement of the nitrogen atoms to the oxygen atoms as a result of the selective displacement of nitrogen atoms by oxygen atoms.

[1] B.A. Gurovich, K.E. Prikhodko, E.A. Kuleshova, et all. JETP, 2013, 143, 1062-1076.

[2] B.A. Gurovich, M.A. Tarkhov, K.E. Prikhodko, ,et all. Nanotechnologies in Russia, 2014,9,7–8,16-20.

[3] D. Williams, A. Carter. Electron microscopy. New York: Springer, 2009.


Maria DEMENTYEVA (Moscow, Russia), Kirill PRIKHODKO
08:00 - 18:15 #5859 - IM08-416 Elastic delocalization in EELS.
IM08-416 Elastic delocalization in EELS.

Inelastic delocalization – caused by the long-ranged Coulomb interaction – is a well-known phenomenon in EELS that limits the achievable spatial resolution [1]. For low-loss EELS, it can lead to a spatial resolution of worse than several nanometers. For core-loss EELS with energy transfers > ~100 eV, on the other hand, it is generally of the order of 1 Ångström and, therefore, generally does not prevent the acquisition of atomically resolved elemental maps.

Another aspect that is often overlooked, however, is the elastic delocalization caused by the extent and the elastic scattering of the electron beam itself inside the crystal [2]. With the ever-improving aberration correctors and, consequently, ever-increasing convergence angles, this becomes more and more of an issue. Especially when dealing with samples that are not ideal single crystals, e.g., due to inhomogeneities, embedded nanoparticles, or interfaces, the elastic delocalization can become a severe challenge for atomic-resolution EELS.

In fig. 1, the case of a NdGaO3/LaMnO3 interface is shown for different convergence angles. The propagation was calculated using the multislice approach [3] for an incident beam energy of 300 keV and no spherical aberration. It is clear that even when the beam is nominally positioned well inside one material, parts of it still extend across the interface into the other material [4]. Therefore, in this situation, one will pick up EELS intensity coming from both sides of the interface (assuming a sufficiently large collection angle; for small collection angles, the situation will be complicated further by the elastic scattering of the beam after the inelastic excitation, which may lead to scattering outside the aperture). In addition, elastic scattering complicates the z sensitivity.

There are several ways to circumvent the problem of elastic delocalization. On the one hand, it is possible to use very thin samples for which elastic scattering and beam broadening are less severe. For large convergence angles, however, this limits the thickness to below ~10 nm which, in turn, decreases the total EELS signal due to the reduced number of atoms. On the other hand, as is evident from fig. 1, the influence of the elastic delocalization can also be decreased by decreasing the convergence angle. While this may seem counter-intuitive at first, it can significantly decrease the beam broadening, thus reducing spurious signals coming from adjacent columns. In addition, electron-vortex beams [5] are also a promising candidate for reducing elastic delocalization due to topological protection [6,7,8]. In addition, the vorticity causes their intensity to vanish in the center, giving them their typical donut shape. While this can make ADF images more difficult to interpret as the elastic scattering likelihood has its maximum when the beam is not actually centered on an atomic column, it does not pose a problem for core-loss EELS for which the probe beam scatters off the sample electrons: as the electron cloud surrounds the nuclei, the inelastic scattering likelihood has its maximum when the donut-shaped beam is on the atomic column.

Elastic delocalization is unavoidable. This work shows possible ways to mitigate its detrimental effects on core-loss EELS and thereby paves the way for a better interpretation and quantification of atomic-resolution mapping, especially in the practically relevant cases of non-homogeneous samples and interfaces.

 

Acknowledgements: Financial support by the Austrian Sciences Fund (FWF) under grant nr. J3732-N27 is gratefully acknowledged.

 

[1] Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope”, Plenum Press 1996
[2] Dwyer & Etheridge, Ultramicroscopy 96 (2003) 343
[3] Kirkland, “Advanced computing in electron microscopy Plenum Press”, 1998
[4] Löffler, in preparation
[5] Verbeeck et al., Nature 467 (2010) 301
[6] Lubk et al., Phys. Rev. A. 87 (2013) 033834
[7] Löffler & Schattschneider, Acta. Cryst. A. 68 (2012) 443
[8] Xin & Zheng, Microsc. Microanal. 18 (2012) 711


Stefan LÖFFLER (Wien, Austria)
08:00 - 18:15 #5864 - IM08-418 Application of statistical beam-rocking TEM-EDX analysis to quantitative occupation site determination of Zn substituted for multiple Fe sites in W-type hexagonal ferrite.
IM08-418 Application of statistical beam-rocking TEM-EDX analysis to quantitative occupation site determination of Zn substituted for multiple Fe sites in W-type hexagonal ferrite.

    W-type strontium hexagonal ferrite, SrMe2+2Fe3+16O27 (Me2+: divalent cation), is a hard magnetic material that exhibits strong magneto-crystalline anisotropy (MCA), showing saturation magnetization, Ms, approximately 10% higher than that of M-type ferrite, one of the current mainstream materials. It is known that partial substitution of a divalent magnetic, nonmagnetic cations or a combination of both for Me2+ occupying appropriate Fe sites improves MCA and Ms, and it is thus important to investigate which Fe site and how much fraction in each site the dopant atoms are actually substituted for in order to find a guiding principle for further improvements of MCA and Ms.

    In this study, we have quantitatively determined the occupation sites of Zn2+ in Zn-doped W-type ferrite, SrZn2Fe16O27, using a suite of beam-rocking transmission electron microscopy (TEM), energy-dispersive X-ray spectroscopy (EDX), theoretical dynamical elastic/inelastic electron scattering simulation and statistical analysis, an extended version of high-angular resolution electron channeling X-ray spectroscopy (HARECXS) [1]. The sintered specimen includes small amounts of hetero-phases which hamper the application of more macroscopic methods, such as neutron diffraction and synchrotron radiation. In this statistical beam-rocking TEM-EDX analysis, the intensity variations of characteristic X-ray peaks (incoherent channeling patterns (ICPs)) as functions of the incident beam direction with respect to a crystalline specimen reflect the occupation sites of the elements of interest, applicable to a small crystal grain, and the multivariate linear regression between the ICPs from the trace dopants and host elements allows us to quantitatively evaluate the dopant concentrations and their occupancies on different crystallographic sites [2]. The present material, however, has seven crystallographically inequivalent sites (the 2c as the hexagonal site, the 4e and 4fIV as the tetrahedral sites, and the 4f, 4fVI, 6g and 12k as the octahedral sites in the Wyckoff notation) for Fe, and accordingly the site-specific ICPs of the seven sites cannot be obtained separately. We have developed a scheme combining theoretical prediction of the site-specific ICPs, based on dynamical electron diffraction theory and the statistical atom-location by channeling-enhanced microanalysis (ALCHEMI) method [2] to overcome this difficulty, which was successfully applied to Co-doped M-type ferrite [3]. We have thus applied the scheme to present analysis.

    Figure 1 shows X-ray ICPs of the Sr-L, Fe-K, O-K and Zn-K lines obtained around the [1-20] zone axis, in which seven Fe sites are definitely separated in the projected atomic structure. The Zn-K ICP looks apparently different from some of the Fe-K ICPs, which qualitatively implies that Zn preferentially occupies some of the specific Fe sites, rather than all of them uniformly. Figure 2(a) shows the theoretical Fe-K ICP of the non-doped SrFe18O27, corresponding to Fig. 1(b), showing sufficiently good agreement with each other. The experimental site-specific Fe-K ICPs for the 12k, 6g, 4fVI, 4fIV, 4f, 4e and 2c sites can be thus obtained by the proportional distribution scheme of the experimental Fe-K ICP, as shown in Figs. 2(b-h), then followed by applying the statistical ALCHEMI method to Zn-K ICP (Fig. 1(d)) and site-specific Fe-K ICPs. Table 1 shows the derived parameters. This quantified result suggests that Zn mainly occupies 4e and 4fIV sites. The estimated Zn concentration of 3.1 atom% is slightly lower than the stoichiometric concentration, which is attributable to a grain-to-grain variation of impurity concentration. Ms arises due to a spontaneous molecular magnetic moment M0, the vector sum of the magnetic moments of Fe3+, Fe2+ and Zn2+ cations of 5μB, 4μB and 0μB, respectively, with the spin orientation considered. M0 was estimated to be 36.0μB and 37.6μB for the cases assuming the estimated Zn concentration and the stoichiometric Zn concentration, respectively. These values are close to the magnetization saturations of 35.0μB [4] and 38.2μB [5] previously reported for a similar W-type ferrite BaZn2Fe16O27.

 

References

[1] Yasuda et al., Nucl. Instr. Meth., B250, 238-244 (2006). [2] Rossouw et al., Philos. Mag. Lett., 60, 225-232 (1989). [3] Ohtsuka et al., Microscopy, doi:10.1093/jmicro/dfv356 (2015). [4] Albanese et al., Appl. Phys., 11, 81-88 (1976). [5] Lotgering et al., J. Phys. Chem. Solids, 41, 481-487 (1980).


Masahiro OHTSUKA (Aichi-ken, Japan), Shunsuke MUTO, Yoshihiro ANAN, Yoshinori KOBAYASHI
08:00 - 18:15 #5884 - IM08-420 Spatially Mapping the Plasmon Resonances of Hollow 1D Nanostructures: Hybrid AuAg Nanotubes.
IM08-420 Spatially Mapping the Plasmon Resonances of Hollow 1D Nanostructures: Hybrid AuAg Nanotubes.

Morphological control at the nanoscale paves the way to fabricate nanostructures with desired plasmonic properties. We present the nanoengineering of plasmon resonances in 1D hollow nanostructures of two different AuAg nanotubes; completely hollow nanotubes (Figure 1) and hybrid nanotubes comprising the sequential formation of solid Ag parts and hollow AuAg parts (Figure 2). Spatially resolved plasmon mapping by electron energy loss spectroscopy (EELS) revealed the presence of high order resonator-like modes and localized surface plasmon resonance (LSPR) modes in both nanotubes. Experimental findings are accurately correlated with the boundary element method (BEM) simulations, where both experiments and simulations revealed that the plasmon resonances are intensely present inside the nanotubes. Based on the experimental and simulated results obtained in the present study, we show that the novel hybrid AuAg nanotubes possess two significant features: (i) LSPRs have been generated distinctively from the hollow and solid parts of the hybrid AuAg nanotubes which opens the way to control a broad range of plasmon resonances with one single nanostructure and (ii) the periodicity of the high order modes are disrupted due to the interaction of solid and hollow parts. 

KEYWORDS: metal nanotubes, electron energy-loss spectroscopy, AuAg, localized surface plasmon resonances, boundary element method

 

We acknowledge the funding from Generalitat de Catalunya 2014 SGR 1638, 2014 SGR 797 and MINECO coordinated projects between IREC and ICN2 TNT-FUELS and e-TNT (MAT2014-59961-C2-2-R). J.P., N.G.B. and V.P. acknowledge financial support from the Generalitat de Catalunya 2014-SGR-612, Spanish MICINN (MAT2012-33330) and European Community (EU-FP7) through the FutureNanoNeeds project. N.G.B. thanks the Spanish MICINN for the financial support through the Juan de la Cierva program and European Commission for the Career Integration Grant (CIG)-Marie Curie Action. Some of the research leading to these results has received funding from the European Union Seventh Framework Program under Grant Agreement 312483 - ESTEEM2 (Integrated Infrastructure Initiative – I3).


Aziz GENÇ (Bartin, Turkey), Javier PATARROYO, Jordi SANCHO-PARRAMON, Raul ARENAL, Neus G. BASTUS, Victor PUNTES, Jordi ARBIOL
08:00 - 18:15 #5893 - IM08-422 Towards EMCD with an electron vortex filter.
IM08-422 Towards EMCD with an electron vortex filter.

The electrons’ wavefront can be arbitrarily shaped by placing holographic masks (HMs) in the condenser system of a TEM. Using HMs with dislocation gratings, it is possible to impart quantized orbital angular momentum (OAM), as well as quantized magnetic moment onto the imaging electrons [1]. Due to their OAM, some peculiar effects can be observed for these so-called vortex electrons or electron vortex beams (EVBs), e.g. topological protection [2], peculiar rotation dynamics in magnetic fields [3] and intrinsic chirality. Owing to the latter of these properties EVBs have become a promising candidate for atomic scale energy-loss magnetic chiral dichroism (EMCD) measurements. However, it soon became clear that atom-sized EVBs are needed to achieve this goal [4,5].

In magnetic materials, the outgoing inelastically scattered probe electrons carry OAM, so they are EVBs. This fact can be utilised to detect spin polarized transitions in an alternative manner by placing a HM in the selected-area-aperture (SAA) holder and using it as a vorticity filter after the specimen, see Fig. 1. This approach does not rely on the standard EMCD geometry and the specimen’s role as a beam splitter and thus would not need a precise alignment of the crystal. The scattering geometry is chosen such that the SAA HM is in the far-field of the scattering centres, which is realized by lifting the specimen in the z-direction. Additionally, the electron probe is focused onto the lifted specimen in order to reduce the effective source size the SAA HM eventually “sees”. Nevertheless, the incident electron wave has a flat phase surface (i.e., behaves similar to a plane wave) all over the illuminated area, provided that the Rayleigh range of the probe beam is much larger than the sample thickness. Therefore, all the scattering ”light cones” point in the same direction towards the vortex filter HM. As the scattered probe electrons are of atomic-size their focused image could not be resolved, thus the imaging plane is defocused by 4 µm to observe broader vortices. A proof-of-principle experiment is shown in Fig. 2a. The azimuthally averaged radial intensity profiles of the upper and lower vortex orders (red and green full dots in Fig. 2b) are in good agreement with the simulation (blue and orange full lines in Fig. 2b). Curiously, the experimental radial profiles show stronger differences in the central region than is expected from the simulation, compare the experimental EMCD signal (magenta open circles) to the theoretical one (green dot-dashed curve) in Fig. 2b. This is probably due to skew optic axes giving rise to slight differences in apparent defocus for the positive and negative vortex orders. Also, artefacts from the mask production and OAM impurities could deteriorate the signal.

The experiment shows that the RMS error (magenta shaded region in Fig.2b) is still too high, such that the faint EMCD signal cannot be discerned under present experimental conditions. To improve the SNR we propose to incorporate larger SAA HMs, e.g. at least 30 to 50 µm in diameter, as the collected signal scales with the mask area, lowering the acquisition times. Also, increasing the coherence of the probe while still keeping the probe current high, which is possible in state-of-the-art aberration corrected microscopes, would enhance the EMCD signal strength by an order of magnitude. If successful, this technique could be applied to study magnetic properties of amorphous or nanocrystalline materials.

 

Acknowledgements: The financial support by the Austrian Science Fund (I543-N20, J3732-N27) and the European research council (ERC-StG-306447) is gratefully acknowledged.

 

References:

[1] J. Verbeeck et al., Nature 467 (2010): 301-304

[2] A. Lubk et al., Physical Review A 87 (2013): 033834

[3] T. Schachinger et al., Ultramicroscopy 158 (2015): 17–25

[4] J. Rusz and S. Bhowmick, Physical Review Letters 111 (2013): 105504

[5] P. Schattschneider et al., Ultramicroscopy 136 (2014): 81–85


Thomas SCHACHINGER (Vienna, Austria), Andreas STEIGER-THIRSFELD, Stefan LÖFFLER, Michael STÖGER-POLLACH, Sebastian SCHNEIDER, Darius POHL, Bernd RELLINGHAUS, Peter SCHATTSCHNEIDER
08:00 - 18:15 #5900 - IM08-424 High energy resolution EELS of copper phthalocyanine crystals.
IM08-424 High energy resolution EELS of copper phthalocyanine crystals.

Recent developments of a monochromator for transmission electron microscopy provide a new tool for chemical analysis in local area of materials. Owing to the improved energy resolution, the energy range probed by electron energy-loss spectroscopy (EELS) has been extended to visible or infrared region, allowing vibrational spectroscopy in the electron microscope [1, 2]. Moreover, one can also measure the fine energy-loss near-edge structure (ELNES) by exciting electrons in relative shallow inner-shells like a carbon K-edge, being an advantage in the analysis of organic compounds. In the present work, we demonstrate the high energy resolution EELS study of copper phthalocyanine (Fig. 1) crystals performed by a JEM-ARM200F equipped with a double Wien filter [3] and spherical aberration correctors.

Figure 2 shows the carbon K-edge ELNES measured from the thin film crystals of copper phthalocyanine (CuPc) and chlorinated one (Cl16CuPc). Since the radiation damage is serious for the CuPc crystal compared to the Cl16CuPc one, its ELNES is rather noisy due to the limited electron dosage (0.5 C/cm2). However, the chlorination effects are clearly observed in the change of ELNES, which is attributed to the chemical shift of 1s level of carbon atoms because the molecule has four independent carbon atoms with a different 1s binding energy. From the orientation dependence of ELNES intensity, the peaks (a) to (d) can be assigned to the transitions from 1s to π* unoccupied molecular orbitals. The peak (a) is related to the excitations of the carbon atoms forming a benzene ring in CuPc, while the peak (c) in the spectrum of Cl16CuPc is assigned to the excitations of carbon atoms bonding to chlorine atoms having a large electronegativity. The intensity of peak (a) in the spectrum of CuPc rapidly decreased with the increase of electron dosage as shown in Fig. 3. This means that the primary damage process is C-H bond scission. Figure 4 shows the low-loss spectra of CuPc extended to the infrared region, in which the C-H stretch excitation is observed at 376 meV as a shoulder peak. This peak also disappeared when an electron dosage increased. The low-loss spectra obtained from these crystals will also be presented and compared to the optical measurements.

 

References

1. O. L. Krivanek, T. C. Lovejoy, N. Dellby, T. Aoki, R. W. Carpenter, P. Rez, E. Soignard, P. E. Batson, M. J. Lagos, R. F. Egerton and P. A. Crozier, Nature 514, 209-212 (2014).

2. T. Miyata, M. Fukuyama, A. Hibata, E. Okunishi, M. Mukai and T. Mizoguchi, Microscopy 63, 377-382 (2014).

3. M. Mukai, E. Okunishi, M. Ashino, K. Omoto, T. Fukuda, A. Ikeda, K. Somehara, T. Kaneyama, T. Saitoh, T. Hirayama and Y. Ikuhara, Microscopy 64, 151-158 (2015).


Hiroki KURATA (Uji, Japan), Yoshifumi FUJIYOSHI, Yuriko TOMISAKI, Takashi NEMOTO, Mitsutaka HARUTA
08:00 - 18:15 #5903 - IM08-426 Charging kinetics features of different modifications of the Al2O3-dielectrics (sapphire, polycrystalline and ceramics) under electron-beam irradiation.
IM08-426 Charging kinetics features of different modifications of the Al2O3-dielectrics (sapphire, polycrystalline and ceramics) under electron-beam irradiation.

The phenomenon of charging dielectrics via the electron-beam irradiation has been studied very intensively. However, published in recent years the results of experimental and theoretical studies of dielectrics charged under electron irradiation gives contradictory description of this phenomenon [1-6]. These contradictions arise mainly due to the differences in the approaches and fragmentation of experimental studies and differences in used physical models of charging mechanisms.

In this report on the basis of extensive experimental data of simultaneous measurement of key charging parameters we are given a balanced assessment of the multiple factors influencing on the charging process. We present the new features of this process and given its interpretation.

Based on comprehensive methodology [7, 8], we measure simultaneously the main charging parameters of different modification Al2O3, such as surface potential VS, electron-emission current Iσ, displacement current ID, and accumulated charge Q versus time of electron irradiation. The experimental setup that allows simultaneously measure the basic charging parameters published in the [9].

The experimental results of complex research of the key charging parameters for sapphire and ceramics Al2O3 are presented in Fig. 1, Fig. 2, Fig. 3 and Fig 4. The main conclusion of these investigations is that although charging processes of dielectric targets are self-consistent and mutually dependent, the accumulation of the negative charge and, correspondingly, an increase in the charging potential, is the dominant (leading) effect, while the variation in the secondary electron emission coefficient, which depends on the surface potential, is a driven adjusting process. For this reason, a delay occurs in the time for attaining the equilibrium of two fundamental charging parameters, viz., the emission current (a short-time process) and charging potential (a long-time process). In other words, for all modifications Al2O3 coefficient of secondary electron emission σ reaches an equilibrium value for used doses of electron irradiation significantly faster than the surface potential.

This work was funded thanks to the support of RFBR (grant 15-02-01557).

 

References

1. L. Reimer, U. Golla, R. Bongeler, M. Kassens, B. Schindler, R. Senkel, Optik, 90 (1992) 14-22.

2. A. Melchinger, S. Hofmann, J. Appl. Phys., 78 (1995) 6224-6232.

3. J. Cazaux, J. Electr. Spectrosc. Rel. Phenom., 176 (2010) 58-79.

4. M. Belhaj, T. Tondu, V. Inguimbert, J. Phys. D. Appl. Phys., 42 (2009) 145306.

5. T. Thome, D. Braga, G. Blaise, J. Appl. Phys., 95 (2004) 2619-2624.

6. M. Touzin, D. Goeuriot, C. Guerret-Piecourt, D. Juve, D. Treheux, H.-J. Fitting, J. Appl. Phys., 99 (2006) 114110.

7. S. Fakhfakh, O. Jbara, M. Belhaj, Z. Fakhfakh, A. Kallel, E.I. Rau, Nucl. Instr. Methods B., 197 (2002) 114-127.

8. E. N. Evstaf’eva, E. I. Rau, A. A. Tatarintsev. MoscowUniversity Physics Bulletin. 68(2) (2013) 34-37.

9. E.I. Rau, A.A. Tatarintsev, V.V. Khvostov, V.E. Yurasova. Vacuum. (2016) http://dx.doi.org/10.1016/j.vacuum.2016.02.002


Eduard RAU (Moscow, Russia), Andrey TATARINTSEV, A KHAIDAROV, Stepan KUPREENKO
08:00 - 18:15 #5914 - IM08-428 HRTEM, HREELS analyses and modelling of nanometric oxide layers formed on 316L in simulated Pressurized Water Reactor (PWR) conditions.
IM08-428 HRTEM, HREELS analyses and modelling of nanometric oxide layers formed on 316L in simulated Pressurized Water Reactor (PWR) conditions.

The development of a passivation layer on stainless steels in Pressurized Water Reactor (PWR) environment is a key phenomenon in Stress Corrosion Cracking (SCC) behavior. Although several works pointed out the presence of a duplex oxide layers, the contribution of the oxide layers themselves is still poorly explored and appears as a crucial factor in the understanding of SCC in PWR medium. The present work studies the oxides growth during short time corrosion tests (0h up to 24h) in a specific corrosion loop running in PWR conditions. Post mortem investigations are carried out using various characterization techniques ranging from macroscopic to atomic scale1. HRTEM images, acquired on an objective lens aberrations corrected TITAN at Marseille IM2NP2, are analyzed using ASTAR software3 in order to investigate the crystallographic structure of oxides and the evolutions as a function of oxidation time (Fig 1&2). The outer oxide crystallites present a spinel crystal structure. Their size increases with oxidation time. The inner oxide layer is amorphous during the first stages of growth and becomes fully crystalline after 10 mn leading to mono-crystalline domains on every metal grains. These mono crystals have a FCC spinel structure in epitaxy with the underlying metal grains. EELS analyses showed that the Cr/Fe ratio in the outer layer decreases and becomes close to pure magnetite after 10mn whereas the Cr/Fe ratio in the inner layer is increasing up to 1 showing a Cr enrichment. Depending on the ratio of Cr/Fe, the structure of the monocrystals in the inner oxide layer might be either normal or inversed spinel4. In order to investigate this question, the evolution of the Fe-L2,3 Near Edge Structures (NES) were followed using condensor lens aberrations corrected TITAN with a mono-chromated gun (∆E<200mV) equipped with Gatan Quantum HR (EDF R&D). The experimental Fe edges were reconstructed using linear combination method5 of spectra obtained on pure FeO, Fe2O3 and Fe3O4 (Fig3) as standards. Whereas a good match is obtained for the outer oxide layer, the reconstruction method fails for the inner layer. Thus, ab initio simulations were performed in order to understand the influence of the Fe substitution by Cr on Fe3O4 crystal structure and electronic properties. A hybrid functional, combining PBE exchange-correlation functional with Hartree-Fock exchange, was parameterized in order to reproduce the various magnetic phases of this spinel, first of all the spinel inverse phase of Fe3O4 which is the ground state of this oxide. Then, the crystal structure and electronic properties of Fe(3-x)CrxO4 were determined (Fig 4). For each ratio, the spin repartition was determined in order to minimize the total energy of the system. A semi-metal to insulating phase transition was found for 0 < x < 0.05. All the obtained data are discussed in terms of lattice parameters, band structures, DOS and mulliken charges evolutions.


Laurent LEGRAS (Moret sur loing), Jean-Louis MANSOT, Philippe BARANEK, Romain SOULAS
08:00 - 18:15 #5918 - IM08-430 Quantifying magnetism on the nanometer scale: EMCD on individual FePt nanoparticles.
IM08-430 Quantifying magnetism on the nanometer scale: EMCD on individual FePt nanoparticles.

Electron energy-loss magnetic chiral dichroism (EMCD), which is the electron wave analogue of X-ray magnetic circular dichroism (XMCD), offers the possibility to study magnetic properties at the nanoscale in a TEM. The relatively young method of EMCD [1] was already refined to such an extent that it is possible to probe magnetic moments of thin films of a variety of ferromagnets [2, 3, 4]. By now, these measurements already surpass the resolution of XMCD experiments. However, quantitative EMCD measurements are so far only reported on thin films rather than on nanoparticles, which are expected to reveal distinct magnetic properties due to their reduced dimensions and enhanced surface to volume ratio.

We report on EMCD measurements on a single FePt nanoparticle (cf. Figure 1) and compare our experimental findings with simulations. L10 ordered FePt is a particularly interesting material since it offers the highest magneto-crystalline anisotropy among the oxidation-resistant hard magnets [5]. It is therefore a promising material for future high density magnetic data storage media. The L10 ordered FePt nanoparticles on a STO substrate were prepared by sputtering. Prior to the spectroscopic measurements, samples in plan view geometry were subjected to mechanical thinning and grazing incidence Ar+ ion milling in order to obtain 10 nm thick substrate-free nanoparticles.

The experiments were performed on a FEI Titan3 80-300 microscope equipped with an image CS corrector. The sample was oriented in three beam condition with the [001] easy axis of L10 FePt oriented (close to) parallel to the electron beam. Binned-gain acquisition of the EEL spectra was used to optimize the S/N ratio [6]. Particular attention was paid to the analysis of the EEL spectra. A measurement route is presented that allows for the extraction of a dichroic signal from spectra that still suffer from non-optimal S/N ratio. Our experiments are supported by simulations of EEL spectra utilizing the WIEN2k program package [7] in combination with Bloch-wave (BW) methods. These simulations are used to (pre-)determine optimal experimental parameters, that provide for the highest EMCD signals [8, 9]. The experiments reveal a small but reproducible dichroic signal (cf. Figure 2) that agrees well with the results of the theoretical calculations. From these experimental spectra, a ratio of angular to spin magnetic moment ml/ms = 0.08 ± 0.08 is for the first time quantitatively derived for individual FePt nanoparticles [10], which agrees well with the XMCD result ml/ms = 0.09 for a large ensemble of L10 ordered FePt nanoparticles [11].

 

[1] P. Schattschneider et al, Nature 441 (2006), p. 486.

[2] T. Thersleff et al, Scientific Reports 5 (2015), 13012.

[3] X. Fu et al, Appl. Phys. Lett. 107 (2015), 062402.

[4] D. Song et al, Appl. Phys. Lett. 107 (2015), 042401.

[5] J. Lyubina et al, Handbook of Magnetic Materials 19 (2011), p. 291.

[6] M. Bosman and V. J. Keast, Ultramicroscopy 108 (2008), p. 837.

[7] K. Schwarz and P. Blaha, Computational Materials Science 28 (2003), p. 259.

[8] S. Löffler and P. Schattschneider, Ultramicroscopy 110 (2010), p. 831.

[9] J. Rusz, S. Muto and K. Tatsumi, Ultramicroscopy 125 (2013), p. 81.

[10] S.Schneider et al, in preparation.

[11] C. Antoniak et al, Phys. Rev. Lett. 97 (2006), 117201.

P. Schattschneider  acknowledges financial support by the Austrian Science Fund (FWF) under grant nr. I543-N20. S. Löffler acknowledges financial support by the Austrian Science Fund (FWF) under grant nr. J3732-N27.


Sebastian SCHNEIDER (Dresden, Germany), Darius POHL, Stefan LÖFFLER, Deepa KASINATHAN, Jan RUSZ, Peter SCHATTSCHNEIDER, Ludwig SCHULTZ, Bernd RELLINGHAUS
08:00 - 18:15 #5931 - IM08-432 The method of the ELNES theoretical calculation with van der Waals interaction.
IM08-432 The method of the ELNES theoretical calculation with van der Waals interaction.

In recent year, the investigation of the local electronic and atomic structure of materials has been attracting attention due to their importance on the macroscopic properties. The electron energy-loss near edge structure (ELNES) in the electron energy-loss spectrum (EELS) reflects partial electronic state of the material. Therefore, ELNES becomes one of the most powerful method to analyze the local electronic and atomic structure because it is observed with a transmission electron microscopy (TEM) and scanning TEM (STEM), which accomplishes an atomic resolution [1]. The TEM/STEM-ELNES method can determine detailed electronic and atomic structures and detect their small but important changes in the interpretation of the ELNES spectra.

In order to interpret the experimental ELNES and acquire the information of electronic and atomic structures, such as the bonding state, coordination environment and valence state, a theoretical calculation of the ELNES is essential. The ELNES simulation with the first-principles calculation is almost established and can reproduce the experimental spectrum with high accuracy. Although, there is still room for improvement, for example, the effect of the van der Waals (vdW) interaction. In this study, we focused on that of vdW interaction on the ELNES calculation. The power of the vdW interaction was much smaller interaction than that of the ionic and covalent bonding. However, this interaction is acted on the all materials, and the ELNES provides a great benefit to investigate the vdW interaction at a local region.

Therefore, in this study, we investigated the effects of vdW interaction in the theoretical calculation of ELNES. The vdW effect differs depending on the state, the solid, liquid and gaseous states were systematically investigated to influence of the vdW interaction on the ELNES calculation.

We composed the solid, liquid and gaseous models, and calculated their ELNES spectra. These structural models are shown in FIG.1 (1-6). The ELNES spectra of these structures were calculated using the first-principles plane-wave basis pseudopotential method. To introduce the vdW interaction into the ELNES calculation, we applied the semi-empirical vdW-TS approach of Tkatchenko and Scheffler [2]. This method is reported to be able to calculate vdW interaction accurately.

In the case of solid and liquid, due to the influence of the vdW interaction, the transition energies decreased by approximately 0.1 eV in FIG.2 (1-2). The energy shift implies that the vdW interaction exerts more influence on the excited state than the ground state. It is for this reason that the excited state has more electrons at the delocalized unoccupied bands. Furthermore, the relationships between the vdW interaction and local electronic structure and molecular configuration were discussed in Fig. 3. In contrast to the case of the solid and liquid structures, the gaseous models are little dependent of the vdW interaction owing to the large intermolecular distance in FIG.2 (3) [3]. We are going to talk about detailed results in my presentation.

References

[1] M. Varela et al., Phys. Rev. Lett. 92 (2004) 095502.

[2]A. Tkatchenko et al., Phys. Rev. Lett. 102 (2009) 073005.

[3] H. Katsukura et al., submitted.


Hirotaka KATSUKURA (Tokyo, Japan), Tomohiro MIYATA, Teruyasu MIZOGUCHI
08:00 - 18:15 #5950 - IM08-434 Bandgap measurement of high refractive index materials by EELS.
IM08-434 Bandgap measurement of high refractive index materials by EELS.

The determination of bandgaps and optical properties using valence electron energy loss spectroscopy (VEELS) has gained attracted interest since monochromated transmission electron microscopes (TEMs) with excellent spatial resolution and high energy resolution­ have become available. However, to measure and interpret the bandgap of many semi-conductors has turned out to be more challenging than expected – in particular the precise measurement of bandgaps of high refractive index materials, such as Si and GaAs, has proven especially difficult. The reasons for these difficulties are not related to any energy resolution constraints, but due to that relativistic losses, surface plasmons and waveguide modes dominate the spectrum signal in the low energy loss region of the bandgap [1-3]. For such high refractive index materials the Cerenkov limit, i.e. the acceleration voltage one needs to stay below in order to avoid relativistic losses, is below the available voltage range of most TEMs.

In this work, we present a set-up in scanning transmission electron microscopy (STEM) mode where we do not allow Cerenkov losses, surface plasmons or waveguide modes to come onto the EEL spectrometer. We exploit that the relativistic losses, surface modes and bulk waveguide modes all are extremely forward scattered and exist only inside a narrow solid angle that extends out to a few tens of µradians. We have a set-up where the semi-convergence and –collection angles both are in the range below 200 µrad. This set-up gives a nearly parallel electron beam which combined with off-axis/dark field EELS allows for detection of an energy loss signal from a region of reciprocal space that is still very close to the center of the first Brillouin zone. The off-axis conditions are such that we are outside the narrow angular range where the unwanted signals from relativistic losses etc. compromise the EEL spectra, but still close enough to the center of the first Brillouin zone to detect bandgap excitations of almost direct bandgap transitions. Furthermore, such a set-up is not restricted to low acceleration voltages, but can be used over a very broad range of voltages.

Our experiments were performed with a double corrected, monochromated Titan microscope, operated at 80 kV. In Fig. 1 we show two EEL spectra: One with an on-axis set-up and where the semi-convergence and –collection angles are both in the milliradian range. From this spectrum it is more or less impossible to extract any reliable bandgap information. The other spectrum was acquired with semi-convergence and collection angles of 200 and 50 µrad, respectively. Even though the energy resolution is "only" 230 meV, a bandgap of 1.42 eV± 0.02 is measured directly from the raw, un-subtracted spectrum. This value is very close to the direct bandgap of 1.42 eV for GaAs. We will further show that the present off-axis set-up can be used to determine the bandgap of several GaAs-based compositions in a sample with multiple layers of III-V materials.

 

References

 

[1] M Horak and M.S Pollach, Ultramicroscopy, 157(2015) 73-78

[2] M.S Pollach and P. Schattschneider, Ultramicroscopy, 107(2007) 1178-1185

[3] R Erni and N D. Browning, Ultramicroscopy, 108 (2008) 84-99

 

Acknowledgments

The authors would like to acknowledge ESTEEM2 for financially supporting this work. The Norwegian Research Council is acknowledged for funding the HighQ-IB project under contract no. 10415201.


Maryam VATANPARAST (Trondheim, Norway), Per Erik VULLUM, Johan VERBEECK, Ricardo EGOAVIL, Turid W. REENAAS, Randi HOLMESTAD
08:00 - 18:15 #5984 - IM08-436 An approach towards solving 3D information by combining quantitative ADF STEM and EDX.
IM08-436 An approach towards solving 3D information by combining quantitative ADF STEM and EDX.

Annular dark-field scanning transmission electron microscopy (ADF STEM) is an invaluable tool for materials characterisation, providing atomic scale information of materials structure and defects. ADF STEM in particular produces images where the intensity contains both composition and thickness information. In fact, through careful quantification of the intensity itself it becomes possible to extract quantitative information and even atom counting. Typically this is either done through comparison with careful standards, comparison with simulations or via statistical methods. For single element nanoparticles it becomes possible to estimate their 3D structure from atom counting and then applying an energy minimisation [1].

  

Silicon drift detectors (SDDs) have opened up a new era in energy dispersive x-ray (EDX) microanalysis at the nanometre and even sub-nanometre scales. The improved detector design allows for larger devices and therefore increased solid angles for x-ray collection. This provides a significant improvement in x-ray count rates such that atomic resolution maps and x-ray tomography are both now possible. In addition, aberration correction in the STEM allows the use of larger probe-forming apertures to produce increased beam currents in much smaller probes. The combined result provides huge improvements in x-ray counts from small volumes leading to the potential for improved quantitative analysis at the nanometre scale and below.

In the same way that the scattering cross section, σ, can be calculated from ADF image intensity [2] and for ionisation edges in EELS [3], it is possible to calculate an EDX partial cross section using an approach that demonstrates similarities with the ζ-factor method [4]. This quantification method was applied to PtCo alloy nanoparticles that have been acid-leached to provide platinum enrichment (or rather cobalt depletion) at the particle surface. It is possible to quantify the levels of cobalt depletion in the first few atomic layers of the particle, showing that the leaching produces a localised surface depletion that can only be determined by this high resolution EDX quantification [5], [6].

Both of these methods of quantification can be used to yield a range of information about the structure of our material when used individual. Here we look at the potential information which can be achieved through combining the information from each technique. In particular we look at extracting 3D information of bimetallic fuel cell catalysts.

[1]         L. Jones, K. E. MacArthur et al. Nano. Lett 14 (2014) 6336

[2]         H. E, K. E. MacArthur et al. Ultramicroscopy 133 (2013) 109-119

[3]         R. F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope New York 2011

[4]         M. Watanabe, Z. Horita, M. Nemoto, Ultramicroscopy 65 (1996) 187;

[5]         K. E. MacArthur, T. J. A. Slater et al. Microsc. & Microanal.  22 (1) (2016) 71-81

[6]         K. E. MacArthur, T. J. A. Slater et al. Mater. Sci. Technol. In press


Katherine MACARTHUR (Juelich, Germany), Dogan OZKAYA, Sergio LOZANO-PEREZ, Peter NELLIST
08:00 - 18:15 #6078 - IM08-438 EELS analysis of the interaction betweeen frozen acqueous samples and incident electrons in TEM.
IM08-438 EELS analysis of the interaction betweeen frozen acqueous samples and incident electrons in TEM.

Radiation damage is a major limiting factor in obtaining high resolution images in cryo-electron microscopy. Quantifying and understanding those radiation damages are considerable challenges. While it seems commonly admitted that the major part of the damages comes from radiolysis[1], local charging within the ice or the sample has been mentioned several time as a source of damage[2].

Due to the isolator behavior of frozen H2O, samples undergo electrostatic charging. While it has never been directly measured, this charging effect is often observable in cryo-electron microscopy in the form of beam deflection or Coulomb-explosion (as shown in Figure 1).

Aranova et al. showed that Electron Energy Loss Spectroscopy (EELS) could be used to measure the production of H2 and O2 associated to “bubbles” often observed in cryo-EM when damages start to occurs [3]. A very interesting finding in their report is that no bubbles were observed in pure frozen water (without sample in it). One possible explanation is that radicals recombine more quickly in H2O than in frozen hydrated specimens in a Transmission Electron Microsocope.

During this presentation, we will study with mono-chromated EELS the effects of the incident electron beam on frozen H2O as well as on frozen aqueous samples. Both the radiolysis and the electrostatic aspects of the beam/matter interaction can be measured with EELS using Kramer-Kronig formula (through dielectric formalism) and Valence EELS (to look at chemical structure changes and bubbles production). We will show that depending on the type of electron illumination (STEM or TEM), the nature and intensity of those damages can vary. We will, then, look at several possible solutions to reduce such damages.

References:

[1] C. Laffon, S. Lacombe, F. Bournel, P. Parent., 2006. Radiation effects in water ice:a near-edge X-ray absorption fine structure study. Journal of Chemical Physics 125 (20), 204714.

[2] Egerton R.F. 2014. Choice of operating voltage for a transmission electron microscope. Ultramicroscopy 145, 85-93.

[3]M.A. Aronova, A.A. Sousa, R.D. Leapman 2011. EELS characterization of radiolytic products in frozen samples. Micron 42, 252-256


Alan MAIGNE (Tancha, Japan), Matthias WOLF
08:00 - 18:15 #6098 - IM08-440 Focused Ion Beam fabrication of defined scalable roughness structures.
IM08-440 Focused Ion Beam fabrication of defined scalable roughness structures.

Focused ion beam (FIB) technology is a reliable tool for the defined local surface modification on the nanoscale and therefore a promising technique to “write” a predefined texture on a point-by-point basis. FIB applications allow flexible scaling of surface patterns both laterally as well as in their height and have therefore the potential to become a versatile tool for purpose-tailored roughness standards.

For surface texture creation by FIB, both real measurement data of actual surfaces and artificially defined surface models can be used. Before FIB is applied to create the desired surface roughness, the input topography data needs to be converted into control commands of the FIB instrument. For this purpose, an automated procedure has been developed. This includes the conversion of the resolution of the given surface topography data into the resolution of the FIB patterning engine and the vertical segmentation of this surface topography into equidistant height layers that are later written by FIB milling (subtractive) or deposition (additive). In addition, this software allows the projection of the data on parametric surfaces (i.e. cylindrical surfaces or spheres). Finally, all data are integrated together with supporting tasks, like orientation marks, finder grid and identifier into a patterning script, which allows the automated “writing” of the structure by FIB. While FIB deposition is not material-dependent, the milling rate strongly depends on the specimen material. The correct milling dose has therefore to be determined experimentally before the creation of the roughness fields. In addition, the pixel size of the FIB patterning layers has to be chosen with respect to the diameter of the used focused ion beam.

In the initial tests, the actual roughness data used as input data for replication by FIB were real AFM (Atomic Force Microscopy) measurements with a nearly symmetric distribution of height values; Sq (root-mean-square roughness) values around 100 nm and Sz (peak-to-peak) values around 1000 nm. The FIB reproductions were then investigated by AFM in the same way, thus allowing best possible high-resolution comparison of input and result. Tests were successfully performed both with a higher-frequency and a lower-frequency roughness to check the FIB limits. While in the beginning, both deposition and milling were tested with success, milling was chosen in the following, as it can be applied faster and thereby reduces machine hours and thus costs.

The figures show a polished Si-specimen with a FIB-milled roughness area of about 180 µm x 180 µm. The similarity of the FIB-created roughness and the model data is apparent, while a closer look reveals that the highest frequency components are not reproduced by FIB. As these frequencies of rather small amplitudes are only on top of the dominating surface texture, their absence does not alter the key roughness values significantly, that agree with those of the model data within 10 % in this case.

The AFM investigations showed that FIB structuring allows the reproduction of a given surface texture on different substrates, resulting in a homogeneous, isotropic roughness. Tests with a more precise milling depth calibration proved that amplitudes are reproduced with only 1 % to 3 % deviation from the chosen model data.

Furthermore, these works prove that FIB is a unique tool to rescale a given roughness in all three directions, opening a wide range of applications, both to the smaller and to the larger sizes, over a rather broad range of dimensions: Towards lower vertical scales, tests with amplitudes downscaled down to 1/30 (i.e. Sq ~ 3 nm) were performed successfully. In the opposite direction, lateral scales were enlarged by a factor of 5 so the roughness is composed of spatial frequencies that can well be measured by most optical surface measurement techniques. Larger roughness fields require the application of advanced stitching techniques; roughness structures with a size up to 290 µm x 290 µm were already created successfully. For many practical applications, the performance of topography measurement techniques on curved surface needs to be characterized. In order to address this issue, defined roughness fields again of 290 µm x 290 µm were transferred successfully onto cylinders and spheres (both with a diameter of about 1 mm) by FIB and applied for characterization of a broad scope of instruments, including AFM, WLI (White Light Interferometry) and optical 3D microscopes.

The authors like to thank André Felgner and Peter Krebs (both PTB) for extensive AFM and CLSM measurements. This work is partly supported by the EMRP JRP IND59 “Microparts” jointly funded by the EMRP participating countries within EURAMET and the European Union.


Matthias HEMMLEB, Dirk BERGER (Berlin, Germany), Thorsten DZIOMBA
08:00 - 18:15 #6116 - IM08-442 3-D reconstruction of surface topography in SEM by means of energy filtered SE and BSE.
IM08-442 3-D reconstruction of surface topography in SEM by means of energy filtered SE and BSE.

The reconstruction of surface topography based on the detection of backscattered or secondary electrons in SEM has found increasing interest during long time [1-5].

For more accurate reconstruction one should know angular dependecies of secondary electron emission (SE) coefficient δ and backscattered electron (BSE) coefficient η, which, in general, are quite well investigated and defined [6]. But for increasing sensitivity in determination of local surface slopes it is offered to detect BSE and SE not integrally, as in previous works, but differentially by energy, i. e. by value of signal detected in narrow energy range of emitted electrons. As it was shown in our experiments, sensitivity increases in times in such formulation of experiment. Experiments were carried out in LEO-1455VP (Zeiss) equipped with a two-channel toroidal electron spectrometer [7]. We measured energy spectra of SE and BSE for various angles of incidence α (Fig. 1). SE spectra are slightly deformed because of applying negative bias Vs=-33 V to stage (electrons leave surface nonisotropically). Comparison of integral and differential coefficients is depicted on Fig. 2. Values of integral coefficients δ and η were calculated by formulas from [8] (by substituting R to Rcosα [9]) and [10] respectively. Values of integral coefficient at fixed angle of detection θ were obtained by simple integration of measured spectra. LineScans of Ti-ball, obtained as difference signal between two symetrically mounted detectors at fixed energy of electrons, are depicted on Fig. 3.

Obtained results allow us to conclude that secondary electrons are best suited for proplem of surface relief reconstruction than backscattered electrons.

This work was funded thanks to the support of RFBR (grant 15-02-01557)

References

1. L. Reimer, R. Böngeler, V. Desai. Scanning microscopy, 1987, 1, 3, pp. 963-973

2. T. Czepkowski, W. Slowko. Scanning, 1996, 18, pp. 433-446

3. D. Kaczmarek. Optica Applicata, 1997, XXVII, 3

4. T. Suganuma. Journal of Electron Microscopy, 1985, 34, 4, 328-337

5. J. Lebiedzik. Scanning, 1979, 2, pp. 230-237

6. L. Reimer. Scanning Electron Microscopy (Physics of Image Formation and Microanalysis), Springer-Verlag Berlin Heidelberg, 1998, pp. 135-169

7. A.V. Gostev, N.A. Orlikovskii, E.I. Rau, A.A. Trubitsyn. Technical Physics, 2013, 58(3), pp. 447-454

8. Y. Lin, D.C. Joy. Surf. Interface Anal., 2005, 37, pp. 895-900

9. N. Bundaleski, M. Belhaj, T. Gineste, O.M.N.D. Teodoro. Vacuum, 2015, 122, pp. 255-259

10. P.-F. Staub. J. Phys. D: Appl. Phys., 1994, 27, pp. 1533-1537


Stepan KUPREENKO, Eduard RAU (Moscow, Russia), Andrey TATARINTSEV, Sergey ZAYTSEV
08:00 - 18:15 #6129 - IM08-444 Characterization of intergranular corrosion defects in a 2024 T351 aluminium alloy.
IM08-444 Characterization of intergranular corrosion defects in a 2024 T351 aluminium alloy.

In the 2xxx series alloys, intergranular corrosion is generally related to the strong reactivity of copper-rich intergranular precipitates leading to a copper enrichment of these particles. While the nature of the oxides formed inside the intergranular corrosion defects was assumed to strongly influence the intergranular corrosion propagation rate, it was not clearly identified due to the thickness of the oxide layer formed which required to use high resolution analytical techniques. The present work aims to characterize the intergranular corrosion defects formed for a 2024-T351 aluminium alloy after a 24 hours continuous immersion in a 1 M NaCl solution and compares the results to literature data concerning the oxide layers formed on copper-rich model alloys. An intergranular defect obtain after cyclic immersion (8 hours continuous immersion, 16 hours emersion) was also observed and characterised. In order to obtain a thin sample in a localized region, i.e. in an intergranular corrosion defect, a Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) FEI HELIOS 600i equipped with a field emission gun (FEG) was used. The thin sample preparation was done using conventional lift out procedure; it is summarized in Fig. 1. Location of interest (intergranular corrosion defect) was chosen (Fig. 1a) and a platinum coating was deposited using electron beam prior to using ion beam to protect the area beneath from being contaminated by the Gallium (Ga ions) (Fig. 1b). Using a large beam current for fast ion milling, two tranches were milled on either side of the Pt coating. The sample of size (10x10x7 µm3), so prepared, was then mounted on a TEM sample holder. A cross-section view of the intergranular corrosion defect was therefore obtained (Fig. 1c). It was then polished using successive lower beam current. Finally, the sample was thinned to 100 nm or less using 1 keV ion beam to minimize the artefacts from sample preparation (Fig. 1d). A transparent section was obtained. Some intermetallic precipitates were visible inside and all around the intergranular corrosion defect.

Then, a combination of transmission electron microscopy (TEM) observations (Fig. 2) and electron energy loss spectroscopy (EELS) analyses was used to accurately characterize both the morphology and chemical composition of the intergranular corrosion defects. Results evidenced the dissolution of intergranular copper-rich particles, the formation of a 10-200 nm-thin metallic copper-rich layer at the oxide/metal interface and the incorporation of copper inside the amorphous alumina oxide film leading to the formation of structural defects of the oxide film.

Acknowledgment

This work is supported by ANR-14-CE07-0027-01 – M-SCOT: Multi Scale COrrosion Testing.


Marie-Laetitia DE BONFILS-LAHOVARY, Lydia LAFFONT (Toulouse), Christine BLANC
08:00 - 18:15 #6222 - IM08-446 Charge, strain and polarization profiling in Ferroelectric/Ferromagnetic epitaxial heterostructures.
IM08-446 Charge, strain and polarization profiling in Ferroelectric/Ferromagnetic epitaxial heterostructures.

The heterostructures consisting of different perovskite ABO3 oxides provide a remarkable rich platform for creating new physical state and functionalities, as it can tailor the degree of the coupling between lattices, charge, orbital and spins. The multiferroic heterostructures showing a strong coupling between electric and magnetic orders draw extensive interest because of their promising applications in the modern spintronic devices. The magnetic order is coupled with the ferroelectric order at the interface, thereby permitting reversible electric field tuning of local spin and transport properties. Current understandings of this interfacial coupling effects are still limited, pioneering works found experimental evidences for different interface-mediated magnetization models, such as charge-transfer screening effect and local strain fluctuations. [1-3]. To address current disputes, the main challenge is to map directly the local change of the ferroelectric polarization, the interfacial electronic (charge, orbital polarization) and magnetic behavior at atomic scale. In principle, all these aspects might be map using combination of STEM and EELS technique.  

Our preliminary work has been conducted on a model multiferroic system consisting of epitaxial La1-xSrxMnO3/Pb(Zr,Ti)O3 (LSMO/PZT) heterostructures grown onto STO (100) substrates (Fig.1 (a)).  The LSMO oxide shows a strong interplay between transport and magnetic properties, which can be tuned via ferroelectric polarization reversal of the PZT layer. Two focused-ion-beam (FIB) TEM lamella samples at [100] zone axis has been prepared with the two opposite polarization states of the PZT, i.e. pointing toward or away from the LSMO layer, respectively. Microstructure and charge analyses were done by using atomic resolved high angle annular dark field (HAADF) imaging, annular bright field (ABF) imaging and high energy resolved electron energy loss spectroscopy (EELS) in a Cs-corrected scanning transmission electron microscope (NION USTEM200). The recent developed ABF technique allows the simultaneous visualization of both light and heavy elements, which is ideal to precisely determine the oxygen positions and therefore the BO6 octahedra distortions. In Fig.1(b) and (c), two ABF images of the PZT are obtained respectively from the two differently polarized lamellas, and their ferroelectric polarization were determined by the relative displacement between the position of B-site Zr/Ti cation and the center of oxygen octahedra. Two opposite polarization directions are found which confirm the well preservation of PZT polar state during the FIB preparation. The EELS spectrum extracted from the atomic planes in the vicinity of the LSMO/PZT interface are shown in Fig.2, focusing on the fine structure of the O-K and Mn-L2,3 edges, which are sensitive to the local bonding environment. We found that in the LSMO layer, even in the middle of the layer which is 5 u.c. far away from the interface, the pre-peak of O-K edge shows differences for the two polar states, indicating a relative hole doping when the polarization is pointing toward LSMO and a relative electron doping when it is pointing away. It is also coincident with the chemical shift of Mn edges where a higher valence is found in the hole doping configuration, and vice versa. Moreover, when approaching toward the LSMO/PZT interface, an apparent reduction of the Mn valence is found in the polar down state starting from the LSMO layer 2 u.c. away from the interface and continually into the diffusion region at PZT side. At the meantime, the Mn valence in the polar up state is well maintained until the interface where a slightly reduction appears, indicating a stronger resistance for the interfacial charge transfer.

                Our preliminary results suggest a clear link between the ferroelectric polarization direction and the change of charge configuration in the interface and the LSMO layer, indicating an efficient tuning of carrier injection by the ferroelectric field, which may play an important role in the magnetization modulation. Further study in the quantitative analysis on the amount of charge transfer and local interfacial magnetization change will be carried out for a thorough understanding of the magnetoelectric coupling.

[1] Spurgeon, S.R., et al., Nat Commun, 2015. 6: p. 6735.

[2] Spurgeon, S.R., et al., ACSNano, 2014. 8(1): p. 894-903.

[3] Lu, H., et al., 2012. 100(23): p. 232904.


Xiaoyan LI (Orsay), Alexandre GLOTER, Daniele PREZIOSI
08:00 - 18:15 #6229 - IM08-448 Lateral resolution of quantitative element analysis of low-Z elements.
IM08-448 Lateral resolution of quantitative element analysis of low-Z elements.

This work is a continuation of the investigation of the lateral resolution for quantitative analysis in a field emission electron probe microanalyser (FE-EPMA) [1]. Now, these studies are extended from sputtered gold layer to low-Z elements like aluminium. The aim is to determine the minimum thickness of an aluminium layer, for which a precise element quantification is still possible at a given accelerating voltage. For this purpose, Al-layers with different thicknesses are deposited on silicon substrates (Fig. 1) by evaporation of thin pure aluminium rods from a tungsten coil. Cross-section preparation is made by cleaving and subsequent surface polishing by use of a focused Ga-ion beam (FIB, FEI Helios NanoLab 600). The material of the substrate and the FIB-protection layer are chosen for minimum fluorescence by Al-Kα. The X-ray emitting volume is estimated by Monte Carlo (MC) simulations (Casino v2.48) of the electron scattering in Al for electron energies between the primary energy (15, 8, 7, 5, 4 and 3 keV respectively) and the critical ionization energy of Al-Kα at 1.559 keV. The density of Al used for the simulation is measured to be (2.68 +/- 0.02) g/cm3, which is confirmed by thin film measurements evaluated by the software package STRATAGEM. For determination of the lateral resolution, 99% of the simulated electron trajectories were taken into account. Fig. 2 shows the MC simulation for 7 keV and 4 keV primary electron energy indicating a lateral resolution of 790 nm and 285 nm, respectively. For the quantitative WDS analysis, a 3820 nm Al-layer is used as reference standard measured with a TAP-crystal and a measurement time of 20 s for the peak and 10 s for the background.

Table 1 summarized the results of the quantitative measurements of the cross-sectional aluminium layers, so far, and the lateral resolutions appraised from the MC simulation. A quantification result of (100.0 +/-0.5) wt% Al and a content of silicon and platinum equal to 0 wt% indicates that the source volume of the emitted X-rays is completely inside the Al-layer. So far, a layer thickness of about 465 nm can be resolved quantitatively using an accelerating voltage of 4 kV. At 5 keV we found a discrepancy between measurement and simulation, since the latter predicts a better resolution. All measurements with different layer thicknesses will be presented on the poster.

 

 

[1] Berger D and Nissen J  2016  IOP Conf. Ser.: Mater. Sci. Engng. 109 012001.


Jörg NISSEN (Berlin, Germany), Dirk BERGER
08:00 - 18:15 #6232 - IM08-450 Investigation of Plasmonic Modes of Gold Tapers by EELS.
IM08-450 Investigation of Plasmonic Modes of Gold Tapers by EELS.

Plasmonic tapers have been studied intensively due to the ability of adiabatically coupling the propagating surface plasmon polaritons along their shaft to the nanolocalized plasmons at their apex. Therefore, they can find applications in the fields of sub-diffraction-limit nanofocusing, ultrafast photoemission, and near-field optical microscopy.

We investigate the plasmonic modes of three-dimensional single crystalline gold tapers by means of EELS (electron energy loss spectroscopy) and FDTD (finite-difference time-domain) numerical calculation. We observe a broadband excitation in the proximity of the apex and discrete higher-order azimuthal plasmonic modes along the taper shaft in the gold taper with an opening angle of ~45°. Interestingly, the energy dispersions of these higher-order plasmonic modes are roughly proportional to the inverse local radius. The importance of phase-matching between electron field and radiative taper modes in mesoscopic structure is demonstrated [1]. The role of an alternative mechanism suggested by Schröder et al. [2] was analyzed by systematically studying changes in the dispersion of higher-order plasmonic modes of gold tapers for different opening angles.

[1] N. Talebi, W. Sigle, R. Vogelgesang, M. Esmann, S. F. Becker, C. Lienau, P. A. van Aken. ACS Nano, 2015, 9 (7), 7641–7648.

[2] B. Schröder, T. Weber, S. V. Yalunin, T. Kiel, C. Matyssek, M. Sivis, S. Schäfer, F. v. Cube, S. Irsen, K. Busch, C. Ropers, S. Linden, Phys. Rev. B 2015, 92, 085411.


Surong GUO (Stuttgart, Germany), Nahid TALEBI, Wilfried SIGLE, Ralf VOGELGESANG, Martin ESMANN, Simon F. BECKER, Christoph LIENAU, Peter VAN AKEN
08:00 - 18:15 #6237 - IM08-452 Influence of background subtraction and deconvolution on calculation of EELS core-loss intensities.
IM08-452 Influence of background subtraction and deconvolution on calculation of EELS core-loss intensities.

Quantitative analysis of electron energy-loss spectra (EELS) can be highly influenced by plural scattering for large thicknesses (t/λ>0.5) and background modelling. For quantification by integration [1], plural scattering can be accounted for by choosing large integration ranges or by deconvolving with the low-loss function. Richardson-Lucy (maximum likelihood) or Fourier-Ratio deconvolution are state-of-the-art techniques. Fourier-Ratio deconvolution enhances noise which can be partially compensated by re-convolving with a Gaussian kernel. The height of the edge onset of the deconvolved core-loss will usually be lower than the actual onset, see figure 1. Richardson-Lucy (RL) deconvolution is frequently used to improve astronomical observations, de-blur images and resolve near edge structures from monochromated EELS in transmission electron microscopy (TEM) [2]. The iterative RL method produces ringing artefacts which are studied in figure 1. The amplitude and position of the artefacts changes depending on the number of iterations as shown in figure 2 for a simulated hydrogenic line without background. The deconvolved core-loss is sharper and the onset is almost at the precise location it should be. The other effect that influences quantification is background subtraction. Background subtraction is usually done by fitting an inverse power-law (AE-r) function to the pre-edge region. The errors associated with background fit and extrapolation have been discussed by Egerton in terms of so-called h-parameters. Other methods such as multiple linear least-squares fits have been implemented in software packages such as Hyperspy [3], EELSMODEL [4] and Digital Micrograph [5]. In background subtraction, there is always a trade-off between systematic and statistical errors in quantification of core-losses. In some cases, due to noise, near edge or extended fine structures in preceding edges, the extrapolated background can cross the spectrum, which leads to large systematic under-estimate of the net core-loss intensity. Background subtraction techniques with exponential fitting can be explored more systematically and a new approach on how quantification can be improved by choosing different functions to fit in pre-edge regions will be discussed. In particular, modelled pre-edge backgrounds can be forced to not cross the spectrum by introducing a linear offset function, thereby minimizing the under-estimate of the core-loss. Modelling the background can also be explored more extensively by fitting an inverse power-law or exponential fit to the post-ionisation range and shifting the fitted curve downwards to pass though the edge onset. This leads to an overestimate of the core-loss intensity. The possible best background fit and its reliability can be calculated from the error bars associated with the under and over-estimated intensities as described in figure 3. The histograms in figure 4 show that the over- and under-estimate of the As-L edge intensity influences the quantification while optimal fitting provides quantification in better agreement with Ga/As ratio of unity for GaAs.

 

[1] R. F. Egerton. (2011). EELS in the Electron Microscope, 3rd ed, Springer, New York.

[2] A. Gloter et al. (2003). Ultramicroscopy 69, 385–400.

[3] F. de la Peña et al. (2016). HyperSpy 0.8.4.  http://hyperspy.org/.

[4] J. Verbeeck. (2015). EELSModel 4.1. http://www.eelsmodel.ua.ac.be/.

[5] Gatan. (2015). http://www.gatan.com/products/tem-analysis/gatan-microscopy-suite-software.

[6] V. C. Angadi, C. Abhayaratne, T. Walther. (2016), J.Microscopy, in print, doi:10.1111/jmi.12397


Veerendra C ANGADI (Sheffield, United Kingdom), Thomas WALTHER
08:00 - 18:15 #6238 - IM08-454 Joint plasmon and core-loss fitting for electron energy loss spectroscopy of InGaN.
IM08-454 Joint plasmon and core-loss fitting for electron energy loss spectroscopy of InGaN.

We demonstrate a method to fit electron energy-loss spectra (EELS) of InGaN thin film samples by fitting both plasmon and core losses over the energy range of 13-30eV. The main plasmon peak is relatively strong and broad. In our previous research, we have suppressed noise by using Lorentz fitting for the plasmon peaks of InGaN. Pure core-loss spectra of Ga (Ga 3d transitions yield M4,5 peaks at 23.8 and 28.5eV) and In (In 4d transitions yield N4,5 peaks at 20.0 and 25.9eV) can be artificially constructed from EELS of binary compounds by subtracting the GaN plasmon peak (19.35eV) or the InN plasmon peak (15.5eV), see figure 1. Then the Ga 3d and In 4d reference spectra can be obtained by further smoothing the core-loss spectra. Multiple linear regression is applied to experimental GaN and InN spectra of different relative thicknesses (t/λ), and the fitting quality is defined by adjusted R2, which lies higher than 0.998. In order to fit spectra from InGaN with different indium concentrations, InGaN core-loss reference spectra were constructed by using artificial InN and GaN core-loss spectra with linear compositional weightings, simultaneously, the chemical shift and broadening of the plasmon loss is considered in the MLLS fitting. For plasmon peak shifts we have applied our previous research results on the relationship between indium concentration and plasmon peak position [1]. The core-loss chemical shift was assumed to follow the plasmon loss chemical shift, as depicted in figure 2. Finally, the MLLS regression can be performed to fit experimental spectra from InGaN as weighted superpositions of reference plasmon and core-loss spectra corresponding to GaN, InN and a specific ternary InGaN alloy.

InGaN samples grown at high temperatures as typically applied in metal organic chemical vapour phase deposition are prone to phase separation, which was first predicted by Ho and Stringfellow [2]. The experimental spectra were recorded in TEM mode with a conventional Schottky field-emission transmission electron microscope (FEG-TEM). By using the joint plasmon and core-loss spectra fitting of GaN, InN and InGaN, we have studied InGaN spectra with nominal indium concentrations of x=0.54 and x=0.62, where energy dispersive x-ray spectroscopy suggests the indium concentrations are close to x=0.59 and x=0.68 respectively. The fitted spectrum in figure 3 indicates a strong evidence of phase separation in the nominal x=0.62 InGaN sample. 

References:

[1]. X. Wang, M.P. Chauvat, P. Ruterana and T. Walther, Semicond.Sci.Technol.30(11), 114011 (2015).

[2]. I. Ho and G.B. Stringfellow , Appl. Phys. Lett. 69, 2701 (1996)


Xiaoyi WANG (sheffield, United Kingdom), Thomas WALTHER
08:00 - 18:15 #6250 - IM08-456 HAADF-STEM and EDS tilt-series simulations of 25x25x25 nm semiconductors.
IM08-456 HAADF-STEM and EDS tilt-series simulations of 25x25x25 nm semiconductors.

In recent years significant progress has been made in moving towards a more quantitative analysis
of electron microscope images. Computational simulations have played a large part in this
evolution, allowing insights into the image formation process and informing the optimization of
experimental acquisitions [1-3].
Recent innovations in X-ray detector technology have prompted a renewal of interest in EDS
mapping by substantially improving signal to noise ratios and offering commensurate reductions in
acquisition times [4]. To continue the trend in quantitative analysis, it is vital for computational
simulations to incorporate this resurging modality.
Here, a new simulation program is introduced which extends the well-founded multislice protocol
to include the ionization of atoms by the electron beam, and the subsequent generation of
characteristic X-rays. In addition to describing the formulation of the multislice simulation program,
this presentation will describe how the program is being used on the Dutch national supercomputer
to address challenges faced by the semiconductor fabrication industry.
The ongoing miniaturisation of computer chips is putting an increasing strain on fabrication
techniques, resulting in greater occurrences of manufacturing defects. In order to increase yields, a
technique is needed which is capable of identifying and characterizing these defects. Typically, the
defects have dimensions on the order of a nanometre, making HAADF-STEM one of the few viable
options. Whilst the atomic number sensitivity of HAADF-STEM can be used to differentiate some
elements, modern semiconductor devices make use of electronically disparate elements with similar
atomic numbers that cannot be readily distinguished by HAADF-STEM alone. For example, the
chemical sensitivity of EDS is required in cases such as the substitution of the high dielectric
constant element hafnium (Z=72), with a typical gate metal, tantalum (Z=73).
Modern finFET transistors have complex 3-dimensional structures, so defect detection must be
performed in the framework of tilt-series tomography. To meet the needs of industry, the multi-
modal reconstruction and analysis procedure must be accurate, robust, and fast. The starting point is
to develop an algorithm that accurately reconstructs the non-linear images produced using HAADF-
STEM+EDS. To achieve this, a tomographic dataset is required for which the true nature of the
specimen is well defined. This can only be achieved through simulation, and requires substantial
computational cost.
This presentation will describe how two such datasets have been produced, in which tilt series simulations of a 30x30x30 nm region of
a finFET device have been calculated. The finFET device consists of a crystalline silicon fin with a
thin oxide layer at the surface, coated with a 20 nm thick amorphous hafnium dioxide layer. On top of
this is a gate metal layer of 20 nm of amorphous tantalum. The remaining volume is filled by
polycrystalline titanium aluminium nitride. The first tilt-series features an ideal device, whilst the
second includes roughening at interfaces, pinhole defects in the dielectric layer, and a 7 nm carbon
nanoparticle contaminant. Each dataset consists of 179 projections in 2 degree increments (no
missing wedge) with 8 elemental maps and a number of annular detector geometries. This large
calculation was made possible through the use of both multiple CPUs and multiple GPUs. The
construction of the model shown in figure 1 will be described as will the computational techniques
that were employed to simulate the tomographic projections. An example of a HAADF-STEM
image and EDS maps from one projection can be seen in figures 2-4.

REFERENCES
[1] Lebeau, J. M., Findlay, S. D., Allen, L. J., & Stemmer, S. (2010). Nano Letters, 10(4405), 4405–
4408.
[2] Aveyard, R., Ferrando, R., Johnston, R. L., & Yuan, J. (2014). Physical Review Letters, 113(7),
075501.
[3] De Backer, A., De Wael, A., Gonnissen, J., & Van Aert, S. (2014). Ultramicroscopy, 151, 46–55.
[4] Pantel, R. (2011). Ultramicroscopy, 111(11), 1607-1618.


Richard AVEYARD (Delft, The Netherlands), Bernd RIEGER
08:00 - 18:15 #6267 - IM08-458 Characterisation of ordering in the A-site deficient perovskite Ca1-xLa2x/3TiO3 using STEM / EELS.
IM08-458 Characterisation of ordering in the A-site deficient perovskite Ca1-xLa2x/3TiO3 using STEM / EELS.

Perovskite structures based on the formulation Ca1-xLa2x/3TiO3 have been extensively studied across a wide range of possible applications, such as anodes for solid oxide fuel cells [1], dielectric resonators [2], high density memory storage devices [4], and as host matrices for inert matrix nuclear fuels and as containment media for high-level nuclear waste forms [5–6]. Understanding the crystallographic ordering at the atomic scale and the nature of present defects is essential in order to successfully utilize this class of perovskites across the multitude of applications.

 

We have studied the vacancy ordering behaviour of the A-site deficient perovskite system, Ca1-xLa2x/3TiO3, using atomic resolution scanning transmission electron microscopy (STEM) in conjunction with electron energy-loss spectroscopy (EELS), with the aim of determining the role of A-site composition changes. At low La content (x = 0.2), this system adopts Pbnm symmetry, with no indication of long-range ordering. Atomic resolution high-angle annular dark-field (HAADF) STEM image, acquired along [010]p pseudo-cubic zone axis, Figure 1(a), shows varying intensities indicating changes in La3+ / Ca2+ ratio across the field of view. Elemental intensity maps from characteristic core-loss edges, shown in Figure 1(b), demonstrate anti-correlated Ca versus La intensities. Domains, with clear boundaries, were observed in bright-field (BF) imaging, but were not immediately visible in the corresponding high-angle annular dark-field (HAADF) image. These boundaries, with the aid of polarisation maps from A-site cations in the HAADF signal, are shown to be tilt boundaries.

 

At the La-rich end of the composition (x = 0.9), adopting Cmmm symmetry, long-range ordering of vacancies and La3+ ions was observed, with alternating La-rich and La-poor layers on (001)p planes, creating a double perovskite lattice along the c axis. One such ordered region is imaged in Figure 2(a) along the [100]p zone axis, in conjunction with EELS elemental maps shown in panel (b), showing the alternating La-rich and La-poor atomic planes. These highly-ordered domains can be found isolated within a random distribution of vacancies / La3+, or within a large population, encompassing a large volume. In regions with a high number density of double perovskite domains, e.g. the area imaged in Figure 3, these highly-ordered domains were separated by twin boundaries, with 90° or 180° lattice rotations across boundaries, as shown in panels (a) and (b), respectively. The occurrence and characteristics of these ordered structures will be discussed and compared with similar perovskite systems.

 

Acknowledgements

Funding is acknowledged from the UK’s Engineering and Physical Sciences Research Council (EPSRC) under grants EP/K029770/1 and EP/L005581/1. SuperSTEM is the UK National Facility for Aberration-Corrected STEM, supported by EPSRC.

References

[1] V Vashook et al., J. Alloys Compd. 2003, 354 (1-2), 13–23.

[2] I-S Kim et al., Mater. Res. Bull. 1995, 30 (3), 307–316.

[3] EKH Salje et al., ChemPhysChem 2010, 11 (5), 940–950.

[4] E Salje et al., Phase Transit. 2009, 82 (6), 452–469.

[5] Z Zhang et al., J. Solid State Chem. 2007, 180 (3), 1083–1092.

[6] AE Ringwood et al., Nature 1979, 278 (5701), 219–223.


Mohsen DANAIE (Oxford, United Kingdom), Demie KEPAPTSOGLOU, Quentin RAMASSE, Colin OPHUS, Karl WHITTLE, Sebastian LAWSON, Stella PEDRAZZINI, Neil YOUNG, Paul BAGOT, Philip EDMONDSON
08:00 - 18:15 #6272 - IM08-460 Quantitative use of EELS Mo-M2,3 edges for the study of molybdenum oxides: elemental quantification and determination of Mo valence state.
IM08-460 Quantitative use of EELS Mo-M2,3 edges for the study of molybdenum oxides: elemental quantification and determination of Mo valence state.

Intro There is currently a strong revival in the study of molybdenum oxides triggered by the recent developments following their nanostructuration.1,2,3 This should open the way for an emerging field of research aiming at the characterization and optimization of Mo-based nanodevices. EELS performed in a TEM is an unrivaled tool for such analyses even though EELS analyses of Mo oxides can be  tricky. Since Mo-L2,3 white lines are situated around 2500 eV, they cannot be used with confidence, such high-energies implying excessively long dwell times and therefore unavoidable irradiation beam damages. Furthermore, these lines are located too far away from the O-K edge to allow Mo valence determination and Mo/O elemental quantification from the same spectra. On the other hand, Mo-M2,3 white lines are located at lower energies and are closer to the O-K edge. The main issue in using these edges is however the delayed maxima of the Mo-M4,5 edges (Fig. 1a) that hinders the background subtraction with the usual inverse power low function.

         In this contribution, we use a combination of EELS experiments, multiplet and density functional theory (DFT) calculations to establish that elemental quantification and Mo valence states can indeed be reliably derived from Mo-M2,3 edges.

 

Material & Methods EELS spectra were acquired on commercial MoO3 (MoVI) and MoO2 (MoIV) powders using a Hitachi HF2000 TEM (100 kV) equipped with a cold FEG and a modified Gatan PEELS 666 spectrometer. The energy resolution was 1.5 eV and the energy dispersion 0.20 eV/pixel. EELS spectra were acquired at magic angle condition for the Mo-M2,3 edges to avoid anisotropy effects playing a role in the M2,3 intensity ratio determination. Experiments were performed at liquid nitrogen temperature to minimize carbon contamination and irradiation beam damage. Background subtraction for the M2,3 edges is based on the determination of post-edge parameter (Fig.1b) to avoid the detrimental effect of the Mo-M4,5 edges on the background subtraction. After removal of the multiple-inelastic scattering effects, M3/M2 intensity ratios were determined by subtracting a two steps function followed by area integration. Theoretical intensity ratios were also derived from multiplet calculations by using the CTM4XAS program,4 the crystal field splitting parameter being determined from DFT calculations with the Wien2K code.5

 

Results To determine the feasibility of elemental quantification, the k-factors (Fig. 2a) and the corresponding standard errors (Fig. 2b) were determined as a function of the width of the energy window used for the integration. The standard errors reach a minimum close to 2% for energy windows of 15 and 20 eV for MoO2 and MoO3 respectively. The relative difference to the mean value presents also strong variations depending on the energy window and the best accuracy (2%) is found for a width of 10 eV. The precision and the accuracy of these results validate the method we used to subtract the background. In addition, theoretical M3/M2 ratios were also determined from multiplet calculated spectra (Fig. 3a) and compared to experimental ratios (Fig. 3b). The agreement between experiences and calculations is excellent and strengthens our experimental methodology.

         All these results will be detailed together with the possibility to discriminate the two oxides thanks to chemical shifts and energy-loss near-edge structures. This work provides thus a complete picture on the ability to obtain a wealth of precise and accurate chemical information on Mo oxides from the conjugated analyzes of O-K and Mo-M2,3 edges. It will also open interesting opportunities for the EELS studies of a large variety of materials as it is directly transposable to the whole family of 4d transition metal oxides.6

 

1. Le Xin Song et al., CrystEngComm 14 (8):2675–2682, (2012)

2. L. Lajaunie et al., Phys. Rev. B 88 (11):115141 (2013)

3. M.M.Y.A. Alsaif et al., Advanced Functional Materials 26 (1), 91-100 (2016)

4. E.Stavitski and F.M.F. de Groot, Micron 41 (7), 687–694, (2010)

5. Wien2k,  P. Blaha et al., Techn. Universitat Wien, Austria (2001)

6. L. Lajaunie et al., Ultramicroscopy 149, 1–8 (2015)


Luc LAJAUNIE (Zaragoza, Spain), Florent BOUCHER, Rémi DESSAPT, Philippe MOREAU
08:00 - 18:15 #6280 - IM08-462 Dynamic spectro-microscopy of nanoparticle growth and corrosion.
IM08-462 Dynamic spectro-microscopy of nanoparticle growth and corrosion.

X-ray spectro-microscopy provides quantitative chemical information similar to electron energy-loss spectroscopy (EELS), but at different spatial and spectral resolutions and penetration length into the sample. The relaxed thickness constraint of X-ray microscopy also offers exciting opportunities for spectro-microscopy of samples in liquids. Here we present X-ray microscopy (XM) studies of in situ nanoparticle growth and corrosion. Dynamic X-ray experiments are correlated with electron microscopy analysis of ex situ samples to provide structural and/or chemical information at higher spatial resolution.

Figure 1 shows a custom-built electrochemical cell which has been developed to allow real-time imaging of the growth of ZnO nanostructures [1]. This method allows us to directly observe transient events which occur during electrodeposition such as instantaneous versus delayed nucleation, providing insights into the growth mechanisms of electrodeposited ZnO. The X-ray microscope provides information with ~30 nm spatial resolution; this data is then correlated to subsequent ex situ morphological analysis in the scanning electron microscope.

These techniques have then been applied to the corrosion of nanoscale wear debris from cobalt-chromium-molybdenum metal-on-metal (MOM) hip prostheses. The wear debris has been implicated in the eventual failure of MOM hips. EELS and XM analysis of explanted tissue from patients with failed hip prostheses reveals debris that is rich in octahedrally coordinated Cr3+ and Co-deficient. However, the mechanism for cobalt loss is not understood. Using adapted electrochemical cells to simulate oxidative biological environments, the response of CoCrMo nanoparticles is investigated by in situ XM, revealing the conditions under which Co is leached from the wear debris.

[1] SER Tay et al, Nanoscale 8 (2016)  p1849


Angela GOODE (London, United Kingdom), Mohamed KORONFEL, Johanna NELSON WEKER, Stephen TAY, Amy CRUICKSHANK, Sandrine HEUTZ, Alister HART, Alexandra PORTER, Michael TONEY, Mary RYAN
08:00 - 18:15 #8313 - LS02-042b The effect of tau hyperphosphorylation on Pin1 expression in primary cortical neurons: in okadaic acid induced AD model.
LS02-042b The effect of tau hyperphosphorylation on Pin1 expression in primary cortical neurons: in okadaic acid induced AD model.

Hyperphosphorylation of tau leading to neurofibrillary tangles (NFT) is a key pathological hallmarks in neurodegenerative disorders such as Alzheimer’s disease (AD) (1). Peptidyl-prolyl cis-trans isomerase (Pin1) regulates the phosphorylation of Ser/Thr sites of tau protein, and promote microtubule assembly (2). In this study, we aimed to determine the interaction between Pin1 expression and tau hyperphosphorylation in primary cortical neurons using okadaic acid (OKA) model (3) utilized to study AD.

Cortical neurons were obtained from embryonic day 16(E16) Sprague Dawley rat embryos. The neurons were treated with 25 nM OKA on day 7 of culture. Then at 4, 8 and 24 hours after treatment OKA, tau phosphorylation was analyzed by western blot using anti-tau antibodies including Thr231 and Tau-1. Immunocytochemistry was used for Pin1 protein expression and localization.  Pin1 mRNA expression was determined by qRT-PCR at 4, 8 and 24 hours. For cytotoxicity LDH analysis was performed by ELISA. At 8 hours with OKA, tau phosphorylation at Thr231 was increased and non-phosphorylated Tau-1 was decreased compared with the untreated control. Pin1 mRNA expression levels at both 4 and 8 hours post-OKA treatment were lower than the control group.  No significant differences at Pin1 mRNA and protein expression levels were observed between the OKA-treated group and the untreated control group at 24 hours of treatment. Pin1 was mainly localized in the nucleus of control groups, whereas was found in cytoplasm of OKA-treated group. Apoptotic nuclear morphology in OKA-treated group was detected more than the control neurons. In OKA-treated group the LDH release was not significantly different than the other groups at 4 and 8 hours, whereas it significantly increased at 24 hours.

Our study indicates that OKA induces the tau-hyperphosphorylation, affects Pin-1 expression, and causes to translocation of Pin-1 proteins into cytoplasm from nucleus. This study will provide a new approach for AD molecular pathophysiology of in OKA- induced AD model.

References:

1-Iqbal K et al:  Curr Alzheimer Res 2010,7(8):656–664

2-Lu KP, Zhou XZ: Nat Rev Mol Cell Biol 2007,8(11):904–916

3-Martin L, Page G, Terro F: Neurochem Int 2011,59(2):235-250

 


Derya METIN, Duygu GEZEN AK, Erdinç DURSUN, İrem ATASOY, Selma YILMAZER, Arzu KARABAY KORKMAZ, Melek OZTURK (Istanbul, Turkey)
08:00 - 18:15 #4464 - MS00-464 PH and concentration effect on the optical absorption properties of porphyrin nanorods functionalized graphene oxide.
MS00-464 PH and concentration effect on the optical absorption properties of porphyrin nanorods functionalized graphene oxide.

Graphene oxide (FGO) decorated with  nanostructured porphyrin (PN) was synthesized and the interfacial interaction between these two components were investigated by using Scanning electron microscopy (SEM), Transmission electron microscopy (TEM), Raman scattering, Fourier transform infrared (FT-IR), X-ray, and Uv-visible.  SEM and TEM showed good dispersion of GO and PN. FT- IR and Raman results revealed a π-π intermolecular interaction confirming the energy/charge transfer. Moreover, X-ray diffraction study confirmed the intercalation of PN in GO and their disaggregation. The Uv-visible results showed an important interaction between GO and porphyrin nanorods under pH values and different concentrations resulting an effect on the optical absorption of GO-PN. The findings presented here are important to achieve the functionalization of graphene oxide with PN for various optoelectronic applications.


Omar BAJJOU (Taounate, Morocco), Malik MAAZA, Mohammed KHENFOUCH, B MOTHUDI, M LEKALA, Mimouna BAITOUL
08:00 - 18:15 #4470 - MS00-466 Synthesis and characterization of dandelion-like ZnS with high antibacterial activity.
MS00-466 Synthesis and characterization of dandelion-like ZnS with high antibacterial activity.

    Nanostructure materials have been the subject of widespread research over the past couple of decades. Recent experiments on nanostructure materials have revealed a host of novel physical and chemical properties, which are significantly different from that of the conventional materials. Many workers are devoted to developing new synthesis methods to fabricate materials with novel nanostructures. ZnS, as a vital wide-gap semiconductor, has been extensively investigated due to its outstanding photoelectric effect, high catalytic activity and wide applications. Recently, ZnS nanomaterials with various geometrical shapes such as 1D wire, rod, or 2D sheet, belt and so on, have been prepared using variety of physical or chemical methods [1-2]. Dandelion-like ZnS materials assembled by 2D nanosheets or 1D nanowires are of great interest as they provide extremely large specific surface areas and unique porous microstructure [3]. However, research into the 3D nanostructure ZnS assembled by 1D ZnS nanowires is still less dealt with. What’s more, majority researchers were devoted to photoluminescence and photocatalytic, few of them pay enough attention to the antibacterial activity of ZnS.

    Microbial contamination has become increasing difficult to control owing to the resistance offered by microbes against conventional antimicrobial agents. It is well-know that inorganic nanomaterials, such as TiO2, AgPO3, ZnO, reveal high antibacterial activities [4-5]. To date, only scant information about antibacterial ability of the ZnS has been recorded. In this work, dandelion-like ZnS has been prepared via the method of facile one-pot hydrothermal synthesis. The dandelion-like ZnS was characterized by transmission electron microscope, scanning electron microscope, energy dispersive spectrometer and X-ray diffraction. The results reveal that the surface topographies of the 3D dandelion-like ZnS particles are actually assembled by plenty of interlaced 1D ZnS nanowires. The influence of reaction time, reaction temperature, Zn/S mole ratio and different zinc and sulfur sources to the dandelion-like structure were investigated. The dandelion-like ZnS exhibits superior ability in inhibiting the growth of Escherichia coli, which makes it promising candidate for biological materials. The large specific surface area, porous surface morphology and the releasing of the Zn2+ ions are considered probable causes for the high antibiotic activity of the dandelion-like ZnS.

References

1. W. Bai, L. Cai, C. Wu, X. Xiao, X. Fan, K. Chen and J. Lin: Alcohothermal synthesis of flower-like ZnS nano-microstructures with high visible light photocatalytic activity. Mater. Lett. 124, 177 (2014).

2. X.H. Guan, L. Yang, X. Guan and G.-S. Wang: Synthesis of a flower-like CuS/ZnS nanocomposite decorated on reduced graphene oxide and its photocatalytic performance. RSC Adv. 5(46), 36185 (2015).

3. B.D. Liu, B. Yang, B. Dierre, T. Sekiguchi and X. Jiang: Local defect-induced red-shift of cathodoluminescence in individual ZnS nanobelts. Nanoscale 6(21), 12414 (2014).

4. M. Li, L. Zhu and D. Lin: Toxicity of ZnO nanoparticles to Escherichia coli: mechanism and the influence of medium components. Environ. Sci. Technol. 45(5), 1977 (2011).

5. K.R. Raghupathi, R.T. Koodali and A.C. Manna: Size-dependent bacterial growth inhibition and mechanism of antibacterial activity of zinc oxide nanoparticles. Langmuir 27(7), 4020 (2011).


Fangwang MING, Zhoucheng WANG (Xiamen, China)
08:00 - 18:15 #4486 - MS00-468 Image processing tools for morphological analysis of nanoscale objects.
MS00-468 Image processing tools for morphological analysis of nanoscale objects.

In this work, we have developed a fast, reliable and unbias algorithm to analyze size distributions and morphological properties of nanoscale images taken by Transmission Electron Microscopy. As the physicochemical properties of nanostructures strongly depend on their size, shape and surface characteristics, it is of great importance to have access to a set of reliable tools to quantify them. Our image processing process is subdivided into three major subroutines: image preprocessing, image analysis and results interpretation. Several algorithms are used to adjust the image contrast as the adapthisteq function based on the contrast-limited adaptive histogram equalization (CLAHE) method.  A segmentation procedure, based on watershed transformation, has been implemented and tested. Introducing a simple geometrical criteria the software is able to distinguish between spherical, triangular and hexagonal shapes. The sphericity, roundness and roughness are also quantified. Figure 1 and 2 show the application of the software for different examples. We demonstrate that it is possible to distinguish between alive and dead bacteria by looking at the roundness, surface roughness and the ratio between the 2D projection area of the bacteria and the bounding box area enclosing the bacteria. For the case of nanoparticles, using the fractal dimension, we can predict the reactivity of iron nanoparticles used for environmental remediation.


Carlos ARROYO, Alexis DEBUT (Sangolquí, Ecuador), Andrea VACA, Brajesh KUMAR, Luis CUMBAL
08:00 - 18:15 #4489 - MS00-470 Diamond Shape Formation by Spontaneous Aggregation of Silver Clusters in Gels.
MS00-470 Diamond Shape Formation by Spontaneous Aggregation of Silver Clusters in Gels.

Particles aggregations in liquid are of great interest because the random collisions of particles are sometimes accompanied with directional assembly, leading to the formation of highly ordered structures. In this work, we find a easy method to synthesize diamond-shaped silver nano particles in gels solution. The time dependent structure characterization indicates that these diamond shape particles were assembled by the spontaneous aggregation of tiny primary Ag clusters. Since the diffusion of Ag clusters are limited in viscous gels solution, Each cluster approaching to the aggregates has more sufficient time and space to optimize its location. The minimization of surface free energy leads to a selective binding of two approaching nuclei. The high energy facets of each nuclei have priority to be the receiving surface for aggregation, while the low energy facets are largely exposed in the aggregation, which led to a oriented self-assembling of Ag clusters. The findings in this paper indicate that the diffusion of building blocks plays an important role in the shape development of materials.


Lin QIANG, Li JINBING, Han YONGSHENG, Lin WEI, Lin QIANG (Beijing, China)
08:00 - 18:15 #4497 - MS00-472 Structural and electrical characterization of SnO2/CeO2 composite films.
MS00-472 Structural and electrical characterization of SnO2/CeO2 composite films.

 Pure SnO2 films and  CeO2/SnO2 composite films were prepared via sol-gel technique.The deposited films have film thicknesses range from 90 to 450 nm. the CeO2 added to SnO 2 with the amounts range from 2 mol% to 10 mol%. Polycrystalline structures of the prepared composites powder and films were characterized by x-ray diffraction analysis. The microstructure of the prepared films was investigated by SEM and TEM respectively. The electrical properties such as the electrical conductivity has been studied. The electrical conductivity was measured as a function of temperature at film thickness 450 nm in case of air and vacuum. The results showed that the SnO2 films are absorptive in case of air. The sensing properties for the prepared films CeO2/SnO2 were  characterized and compared with pure SnO2 towards the H2S, CO and LPG gases at room temperature. The sensitivity measured at different film thickness, showed that the film thickness and the film microstructure had noticeable effect on the value of sensitivity. The sensitivity of CeO 2/SnO2 films to CO gas is 0.990 % at a response time for the sample 6 mol% while is 0.995 at 50 sec for sample 6mol%. Through all the previous studies, it was found that there is a capability to improve the gas sensing properties of pure SnO2 by controlling the amount of additive and the good choice of the proper catalytic.


Gehan EL KOMY, Gehan EL KOMY (Cairo, Egypt), Zainab EL MANDOUH
08:00 - 18:15 #5127 - MS00-474 HAADF-STEM observation of twinned structure formed in gold nanorods by near-infrared pulsed laser irradiation.
MS00-474 HAADF-STEM observation of twinned structure formed in gold nanorods by near-infrared pulsed laser irradiation.

     Gold nanorods have been drawing much interests widely in various science and engineering fields because of their characteristic optical properties [1]. Due to their anisotropic rod shape, gold nanorods generally absorb visible and near-infrared light by localized surface plasmon resonances. Absorbed light more or less heats up the nanorods through electron-phonon coupling. This heating due to photo-thermal conversion sometimes causes deformation of gold nanorods under light illumination. Actually, it has been reported that gold nanorods suspended in an aqueous solution changes their shape into sphere, singular Φ-shape or elongated rod when irradiated with pulsed laser light [2]. Recently our group set up a pulsed laser light illumination system attached to a high voltage electron microscope (HVEM) and performed in-situ observation of deformation process under pulsed laser light illumination [3]. In the present study, we carried out HAADF-STEM characterization of atomic structural change in a gold nanorod due to pulsed laser illumination.

     Gold nanorods used in the present study were produced in CTAB micelle solution by a photochemical method and synthesized to be about 50 nm in length and 10 nm in diameter (products of Dai Nihon Toryo Co. Ltd in Japan). The Au nanorods show two optical absorption peaks around 520 and 980 nm in wavelength. QuantifoilTM carbon films were used for sample supporting mesh. Laser illumination to the samples was performed in a JEM-1300NEF HVEM equipped with an optical guide path of laser pulses into its specimen chamber [3]. The wavelength of laser pulses was 1064 nm, and the pulse duration was 6 to 8 ns. The averaged intensity was 7.3×103 J/m2pulse. HAADF-STEM atomic-resolution observation was carried out with a JEM-ARM200CF operated at an acceleration voltage of 120 kV. In order to suppress the influence due to sample drift during STEM operation, the observation was performed on a drift compensating operation, where rapidly scanned plural images of an interesting area were overlaid with autocorrelation. 

     Figure A shows an atomic resolution image of an original gold nanorod before irradiation with pulsed laser light. Here the incident electrons were illuminated along the [110] zone axis. We are convinced that the drift compensation operation is quite powerful to obtain an atomic structure HAADF image of the whole of a nanorod without any serious distortion. It is clearly shown that the virgin nanorod is a single crystal oriented to [001] along its longer axis. One may confirm faceting tendencies of surfaces; {100} for top and bottom ends and {111} in the tip sides. The main side surfaces are quite smooth and flat {110}.

     Figure B gives a HAADF image of the same nanorod but after experiencing one shot illumination of a laser pulse. The outer shape has been significantly deformed to be nearly spherical. The particle interior also has been complexly changed in atom configuration, and has been divided into tiny blocks in different crystal orientations. The surface is surrounded with mixture of {111} and {100} facets, and {110} surface has disappeared. A rectangle region in Fig. B is further magnified in Fig. C. One may clearly recognize in the close-up view that the particle interior consists of blocks with twinned orientation relationships. The five orientations rotating on a common [110] axis are classified with different colors in Fig. C. The blocks are separated by single layer twin boundaries with {111} mirror symmetry and double layered twin or stacking faults. One can find multiple twin junctions in squared areas in Fig. C. As the rotating angle between two twined orientations is 70.53 degree, five-fold decagonal junction of twins results in a solid-angle deficiency of 7.35 degree [4]. The angle deficiency due to five-fold junction in the left squared region is mostly accommodated with insertion of double layered stacking faults in the right-hand side blocks. At junctions of four blocks recognized in the right square, on the other hand, blue and yellow ones are not in twined relationship any longer, and are separated by a wide angle grain boundary. One may notice that atom columns close to the junction in the yellow block are significantly displaced from their regular positions.

 

This study was partly supported by JSPS Grant-in-Aid for Scientific Research B (# 25289221).

 

[1]  X. Huang, et al., Adv. Mater., 21, 4880 (2009).

[2]  S. Link, Z. L. Wang, and M. A. El-Sayed, J. Phys. Chem. B 104, 7867 (2000).

[3]  N. Sumimoto, et al, Microscopy 63, 261 (2014).

[4]  C. L. Johnson, et al., Nat. Mater. 7, 120 (2008).


Kohei ASO (Fukuoka, Japan), Koji SHIGEMATSU, Tomokazu YAMAMOTO, Syo MATSUMURA
08:00 - 18:15 #5223 - MS00-476 Comparison of sample preparations for TEM observations of lipid nanoparticles (Lipidots®).
MS00-476 Comparison of sample preparations for TEM observations of lipid nanoparticles (Lipidots®).

            Lipid nanoparticles (lipidots or liposomes for example) can be used in medicine as drug nanocarriers. Their core-shell structure allows the functionalization of these nanoparticles using antibodies, peptides or proteins. The main aim of this targeting is to reduce the drug toxicity occurring during treatment. Such nanoparticles are currently used to treat breast cancer [1]. Further applications as fluorescent agent carriers for in-vitro and in-vivo diagnostics are also considered [2]. To have a better understanding of the effectiveness of these nanoparticles, characterization of these objects is required. Classical imaging in TEM mode leads to many issues as dehydrating, agglomeration and lack of contrast. Thus, optimal sample preparation is mandatory.

            In this study, several preparation methods have been tested to determine the most appropriate one for TEM observations and 3D electron tomography acquisition. F80-Lipidots (expected diameter 80nm) have been synthetized at CEA-Grenoble using ultrasound or high pressure homogenization technologies [3]. TEM micrographs were taken using a FEI Tecnai Osiris having a cryo operating mode and working at 200kV. It is also equipped with four EDX detectors and a GIF for chemical analysis.

            These particles were firstly observed by classical imaging (droplet drying) with and without negative staining. It appeared that the staining remarkably improved the contrast of the nano-objects which appeared to have a circular shape. Nevertheless, Lipidot size determination was difficult due to aggregation phenomena during drying procedure. This method needed to be complemented by cryo-microscopy.

            Cryo-techniques were used to ensure the preservation of the samples in their native state. Rapid freezing in ethane on C-Flat grids after blotting was performed thanks to a FEI Vitrobot. Its settings (blot force and blot time) were adjusted to obtain vitrified films with a controlled thickness.Ice thickness was firstly determined thanks to EELS and EFTEM [4]. It showed that the ice is thinner in the center of the grid holes (Fig. 1). This could be a problem if this thickness is thinner than the particle size. Indeed, in that case, the particles tend to concentrate next to the carbon film of the grid (Fig. 2) and make it difficult to record tomography images. To avoid these artifacts, high pressure freezing (EM PACT2, LEICA) was also performed. It was then followed by cryo-substitution, polymer resin embedding (EM AFS2, LEICA) and ultramicrotomy; or cryo-ultramicrotomy (EM-FC7, LEICA) directly after freezing (CEMOVIS). The constant thickness of the slices is thus an asset for tomogram acquisition. The main difficulty lies in maintaining the “cold chain” from the preparation to the observation.

            The pros and cons of different sample methods (simplicity, reproducibility and reliability) will be discussed and results in what concerns the shape and the size of the particles will be compared. These results will be correlated with other techniques for size measurement at the nanometric scale such as DLS.

REFERENCES

[1] Ranson, M. R. et al. (1997). Journal of Clinical Oncology, 15(10), 3185-3191.

[2] Gravier, J. et al. (2011). Journal of biomedical optics, 16(9), 096013-096013.

[3] Delmas, T. et al. (2011). Journal of colloid and interface science, 360(2), 471-481.

[4] Malis, T., Cheng, S. C., & Egerton, R. F. (1988). Journal of electron microscopy technique, 8(2), 193-200.


Amandine ARNOULD (GRENOBLE), Maria BACIA, Fanny CAPUTO, Anne-Claude COUFFIN, Benoit GALLET, Constantin MATEI, Romain SOULAS, Jean-François DAMLENCOURT
08:00 - 18:15 #5277 - MS00-478 Primary particle size distribution measurement of aggregated nanoparticles.
MS00-478 Primary particle size distribution measurement of aggregated nanoparticles.

     Industrial applications of nanomaterials have recently been reported in many fields. The European Union (EU) announced their definition of nanomaterial in 2012. According to the EU definition, nanomaterial means a natural, incidental or manufactured material containing particles, in an unbound state or as an aggregate or as agglomerate and where, for 50 % or more of the particles in the number size distribution, one or more external dimensions is in the size range 1 nm - 100 nm. They also announced that the particle size of the primary particles in agglomerates or aggregates should be considered. For regulatory purposes, it is necessary to measure the size distribution of nanoparticles based on the particle number concentration. The European Food Safety Authority (EFSA) recommended using at least two different analytical methods to identify nanomaterials for the EU regulation, one of which should be electron microscopy [1]. Transmission electron microscope (TEM) is a most useful technique that can provide precise information on the shape and size of the primary nanoparticles. Standardization on particle size measurement is performed Technical Committee (TC) 229 of International Organization for Standardization (ISO). Scope of ISO/TC229 is standardization in the field of nanotechnologies. We have performed interlobratry comparison (ILC) test of particle size distribution measurement of titania (TiO2) nanoparticles. In this study, details and results of this ILC is introduced.   

     Participants of this ILC were 6 national research institutes including 4 national metrology instututes, and 3 companies producing nanomaterials. TEM sample preparation is very important because nanoparticles are easy to aggregate in preparation. In this ILC test, chairperson (KY) prepared TEM specimens and distributed to participants of ILC. TiO2 nanoparticle was dispersed in the 1mg/ml of sodium hexametaphosphate (NaPO3)6) aqueous solution. TiO2 content was 25mg/ml. Ultrasonic irradiation to TiO2 nanoparticle dispersion was performed for 1 hour, and stable TiO2 nanoparticle dispersion was obtained. TEM image and aggregate size by laser diffraction are shown in Figure 1(a)-(b). Average size of aggregate was 200nm, and TiO2 nanoparticles was well dispersed. Copper metal TEM grid with amorphous carbon support membrane was used. The support membrane surface of a TEM grid was made hydrophilic using a hydrophilic treatment device. Filter paper was placed on a hot plate that has been warmed at 100℃, and the TEM grid with the hydrophilized support membrane was placed on the top of this. 15μL of the TiO2 dispersion liquid was collected using a micropipette, and dripped onto the support membrane on the hot plate. The TEM grid with support membrane was dried on a hot plate.

     Protocol of ILC was basis on the manual tracing of primary particle shapes in aggregate, which has clear contrast and distinguishable. At least 500 particles should be counted with the image resolution more better than 0.5 nm/pixel. Max./min. Feret and  area-equivalent circle diameters (ECD) of each particle should be measured using image software. One example data of ECD distribution obtained in ILC test is shown in Figure 2. In this data, 1033 particles were counted. Median diameter (D50) is 37.5nm, and standard deviation is 12.1nm. Cumulative distribution data of ECD reported from all participants are shown in Figure 3. 5 data in 9 data agree well. We examined the measurement conditions of TEM, image pixel size, and scale calibration methods of TEM. For TEM measurements, the focusing condition or the z-position of specimen influences strongly to size measurement. We summarize how to measure particle size correctly are; 1) the same z-position of specimen in measurement and in calibration, 2) the same focusing condition in measurement and in calibration, and 3) using the same sized calibration standard to measured particles.  

References

[1] E.A.J. Bleeker et al, RIVM Letter report 601358001(2012).


Kazuhiro YAMAMOTO (Tsukuba, Japan), Toshiyuki FUJIMOTO, Eric A. GRULKE
08:00 - 18:15 #5316 - MS00-480 Optical and structural characterization of Copper Indium Sulphide Quantum Dots.
MS00-480 Optical and structural characterization of Copper Indium Sulphide Quantum Dots.

Copper indium sulfide (CIS) quantum dots (QDs) have been synthesized according to a simple heat up method starting from In(OAc)3 and three different copper precursors: CuI, CuBr, or CuCl. The obtained nanoparticles (NPS) were  characterized for their optical properties, the CIS QDs prepared using different copper(I) salts show different behaviors depending on the nature of the chosen precursor salt. The absorption spectra show a shift of the absorption edge towards longer wavelengths with increasing reaction time. This is in accordance with the quantum confinement effect: bigger nanoparticles display a wider band-gap. The absorption spectra have been analyzed according to the Tauc interpretation in order to obtain information about the dimension of the nanosized semiconductors. The band gap energy (Eg) decreases with increasing reaction time. From the absorption analyses we observed a difference in the behavior of the nanoparticles synthesized in the presence of different anions. According to the Hofmeister interpretation, the three halogen ions possess different interacting properties with hydrophobic molecules. The charge distribution of the electronic cloud is rather diffuse in heavier halogen ions, the polarizability decreases according to the series I->Br->Cl-. The latter ion, having a high surface charge, interact weakly with hydrophobic surfaces. We tried to give an interpretation of the different behavior observed in the presence of different anions in the reaction environment. We can observe that when CuI is used the QDs obtained after 5 min of reaction have a smaller band gap than those obtained with CuBr or CuCl. Prolonging the reaction time the growth of the NPs continues and the absorption can be extended up above 800 nm. When copper salts with smaller counterions are used, this growth seems somehow inhibited. The same trend is confirmed by the photoluminescence analyses. The emission peak shifts upon increasing the reaction time: although not being excitonic in nature, the emission in this kind of QDs is known to be size-related. The actual emission mechanism is not fully understood, but defect states (mainly copper vacancies) and bound band states have been demonstrated to play a role. For this reason, as the diameter of the quantum dots increases, the emission experiences a bathochromic shift accordingly. We also noted that the emission intensity is dependent upon the copper source used in the synthesis. The sample synthesized from CuI has better optical properties than the ones of the samples synthesized from CuBr or CuCl. The structural characterization has been done by TEM & XPS: for  the analyses the NPs were washed using chloroform:methanol (1:1) to precipitate the QDs out from hexanes. From TEM observations, the NPs appear to have a good crystallinity after 2 hours of reaction. The morphology is polygonal, with a crystalline habitus typical of a tetragonal structure, supporting the attribution of the phase to the chalcopyrite polymorph. It is hard to determine the actual size of the NPs in each sample due to the rather irregular shape, from the FFT analysis the sample made starting from CuI shows smaller NPs. The EDX analysis returns the expected elements in the samples, with Cu, In, and S being the most abundant ones. Beside them, iodine and bromine lines can be observed in the spectra of the samples synthesized starting from CuI and CuBr, while no chlorine is detectable in the last sample. These results are in accordance with those coming from XPS analyses. The QDs are copper deficient, which is a characteristic beneficial from the point of view of the optical properties, since it has been demonstrated that the copper vacancies acts as defect levels involved in the electronic transitions responsible for the emission in this type of QDs. Sulfur vacancies are also supposed to give rise to intraband levels related to the emission mechanism. Our samples have a sulfur content slightly below the expected value. We observed the presence of halogen ions in the samples. It is also to be noted that the anion fraction in the sample increases in the order I->Br->Cl-. This trend is in accordance with the EDX analyses performed during the TEM observations. One of the mechanism affecting the properties of the QDs is the fact that the anions can be incorporated in the lattice, thus perturbing the chemical surrounding of the ions. The incorporation of higher amount of impurities should be also beneficial in terms of the optical quality of the NPs, according to the defect-related nature of the emission of these QDs. The identification of the process through which the anions influence the synthesis and the properties of the NPs remains challenging. It is undoubtful that the use of different precursors leads to QDs with diverse properties, and that the trend follows that of the polarizability (Hofmeister series) of the copper counterions.


Riccardo MARIN, Fiorenzo VETRONE, Tamie LOH, Daniel CHUA, Patrizia CANTON (Venezia-Mestre, Italy)
08:00 - 18:15 #5361 - MS00-482 TEM analysis of deformation induced dynamic nanocrystallization in an amorphous CoTi alloy.
MS00-482 TEM analysis of deformation induced dynamic nanocrystallization in an amorphous CoTi alloy.

Nano-sized crystals in an amorphous matrix are considered to change the mechanical properties of an amorphous alloy. Therefore, it is of special interest to manipulate and control both the size and structure of nanocrystals. In many cases, nanocrystals are formed by special heat treatments. Here, we show that nanocrystals can emerge out of the amorphous phase during severe plastic deformation. This can be revealed by studying the composition and the atomic structure of the crystals using different transmission electron microscopy (TEM) methods.

In our work pure components are used to make a Co3Ti alloy. Homogenisation at 950°C for 100 hours leads to a L12 long range ordered single phase alloy. The samples were deformed by high pressure torsion (HPT) using 4 GPa pressure and 80 rotations. After deformation TEM imaging with a Philips CM200 yields both crystalline and amorphous regions present in the samples. The situation is similar to that of Zr3Al, a L12 alloy, that can be made amorphous by severe plastic deformation [1]. The striking result of the present study is that in the amorphous regions nanocrystals of about 2-20 nm in size are embedded. Their average size is about 12 ± 0.5 nm and they exhibit a volume fraction of about 2 ± 1% (cf. Fig.1). From the analysis of bright field (BF) images taken from different sample sections it can be concluded that the nanocrystals have a spherical shape.

The chemical composition of the nanocrystals is analysed in a FEI Titan microscope by electron energy loss spectroscopy. The Ti atomic concentration for individual nanocrystals is 18 % higher than those of the surrounding amorphous matrix. This indicates that the nanocrystals are of the Laves phase Co2.1Ti0.9. Therefore we conclude that the nanocrystals are not retained crystalline material but rather formed during deformation by dynamic crystallisation.

For structural information high resolution transmission electron (HRTEM) images of the nanocrystals are acquired. The HRTEM images show lattice planes according to the Kagome layers of Laves phases (cf. Fig.2). Nevertheless, the analysis of the stacking sequence of the Kagome layers A, B and C does not reveal unambiguously the corresponding Laves phase due to a high density of faults. The structure can be described either by a faulted Co2Ti (stacking sequence ABC) or a faulted Co2.1Ti0.9 (stacking sequence ABAC). In order to have reference images of an unfaulted Laves phase the as-cast alloy containing the Co2.1Ti0.9 Laves phase (C36) was studied. Therefore HRTEM images are acquired with a CM30 microscope. By using the Kikuchi patterns the sample was tilted to a [100] pole of Co2.1Ti0.9. Fig.3 shows the corresponding HRTEM image of the Kagome layers with an unfaulted ABAC stacking order.

 

[1] D. Geist, S. Ii, K. Tsuchiya, H.P. Karnthaler, G. Stefanov, C. Rentenberger, Nanocrystalline Zr3Al made through amorphization by repeated cold rolling and followed by crystallization, J. Alloys Compd. 509 (2011) 1815–1818. doi:10.1016/j.jallcom.2010.10.050.

 

Acknowledgements

We kindly acknowledge financial support by the Austrian Science Fund (FWF):[I1309, P22440, J3397].


Stefan NOISTERNIG (Vienna, Austria), Christian EBNER, Christoph GAMMER, Christian RENTENBERGER, Christian GSPAN, Hans-Peter KARNTHALER
08:00 - 18:15 #5364 - MS00-484 Developments in unconventional dark field TEM for characterising nanocatalyst systems.
MS00-484 Developments in unconventional dark field TEM for characterising nanocatalyst systems.

Recent methods of dark field TEM are being explored to extent the information and frequency of data capture in dynamic in-situ experiments on nanocatalyst systems under reaction conditions (1).    The broad need is for a faster frame rate than can conveniently be achieved with HAADF STEM imaging, starting from the similarly expressed goals for tomography of Bals et al (2) and gentle high resolution by Zhang et al (3).   Beam stop spiders described in (2,3) and other geometries including displaced aperture arcs stopping the central beam have been explored.    FIB fabricated custom devices have been introduced into a custom mechanism using regular 3mm apertures for easier customisation.   This is primarily inserted into the high contrast (lower) objective aperture position on our modified JEOL 2200FS with aberration correctors for both TEM image and STEM probe.   The preliminary results with the new applications are encouraging with 0.2nm lattice images recorded from larger (~10nm) particles (Fig.1) and sensitivity down to a few atoms (Fig.2) recorded using 1 second exposures, rather than requiring 10x that for direct STEM methods.    The aim is to be able to track individual migrating atoms and nanoparticles with sufficient frequency to have confidence for each one in their source and endpoint to better inform our understanding of key coarsening mechanisms (4) which lead to catalyst inefficiencies, including in environmental emission controls (5).    This requires analysis at sufficient frequency that the mean atom/nanoparticle movement is significantly less than the spacing between sites.

References
1. E D Boyes, M R Ward, L Lari and P L Gai, Ann Phys (Berlin), 525 (2013) 423

2. S Bals, G V Tendeloo and C Kisielowski, Adv Mater, 18 (2006) 892

3. C Zhang, Q Xua, P J Peters and H Zandbergen, Ultramicroscopy, 134 (2013) 200

4. P Wynblatt and N A Gjostein, Prog Solid State Ch, 9 (1975) 21

5. M R Ward, T Hyde, E D Boyes and P L Gai, Chem Cat Chem, 4 (2012) 1622

Acknowledgement

The AC ESTEM catalysis project at York is supported primarily by EPSRC (UK) strategic grant EP/J018058/1


Gnanavel THIRUNAVUKKARASU (York, United Kingdom), Michael R WARD, Pratibha L GAI, Edward D BOYES
08:00 - 18:15 #5735 - MS00-486 Characterizing the protein corona of polystyrene nanoparticles.
MS00-486 Characterizing the protein corona of polystyrene nanoparticles.

Nanoparticles are of great interest for their use in biomedical applications like imaging and drug delivery. They are used as delivery vesicles to carry drugs to cells, while protecting them from degradation and allowing a targeted delivery. It is important to understand the interaction of nanoparticles with the biological systems, in order to make these processes more efficient. Upon injection of nanoparticles inside the blood, there is a competition of different biological molecules to adsorb on the surface of the nanoparticles. Numerous proteins are present in the plasma at high concentrations and interact with the nanomaterial surface forming a cloud of proteins known as the “protein corona”. The protein corona alters the size and composition of a nanomaterial, giving it an identity which is not the same as its synthetic identity [1]. The physical parameters of nanoparticles could affect the composition of protein corona, which is dynamic as the proteins are exchanging and the composition is evolving. This interface can be divided into the “hard” and the “soft” corona, depending on the binding strength and exchange rates of the proteins associated with the nanomaterial surface. The proteins with high binding affinities that are tightly bound to the nanoparticles form the “hard” protein corona and the ones that are loosely bound, have high exchange rates and can be easily replaced, form the “soft” corona. The cell or organ sees the nanoparticle-protein complexes when interacting with a nanoparticle dispersed in a biological medium. That means that the corona defines the biological identity of nanoparticles and influences the cytotoxicity and endocytosis. Due to the complexity of the protein corona, it has been challenging to characterize. Approaching the project with microscopy techniques will answer critical questions about the structure of nanoparticles and their interactions with the biological systems, which can be used to make biomedical applications more efficient.


[1]: Chem. Soc. Rev., 2012, 41, 2780-2799


Maria KOKKINOPOULOU (Mainz, Germany), Johanna SIMON, Volker MAILAENDER, Ingo LIEBERWIRTH, Katharina LANDFESTER
08:00 - 18:15 #5744 - MS00-488 In situ TEM study of nanoalloys in solution.
MS00-488 In situ TEM study of nanoalloys in solution.

1. Introduction

Different Pt-Pd nanoalloys were prepared from organic precursors in solution. Their nucleation and growth in the liquid was in situ studied in a graphene oxide liquid cell by the direct reduction in the electron beam [1-3].

Then, the morphological evolution of the nanoalloys under gas pressure was in situ studied in an environmental sample holder [4] by standard TEM.

2.Pt@Pd core shell NPs

Increasing amounts of Pt could be deposited on Pd nanocubes cubes by sequential reduction, with a resulting concave shape as seen in fig. 1.

Fig.2 is a set of images during the Pt growth around the same Pd cube, during 20 mn. The operating conditions (magnification 800 K, electron density 3. 105 A/m2) corresponds to an increasing electron dose.  During this time, the variation of liquid quantity in the drop was not visible. From the set of images, it seems that the Pt layer has an homogeneous thickness during the growth, so that the final concave shape results from other steps in the preparation process.

Then, the morphology of Pt@Pd nanocubes was in situ observed during oxido reduction cycles in a few mbar of pure O2 and H2.

Fig. 3 clearly shows that the Pd@Pt nanocubes have concave shapes in pure H2. In pure O2, they are much rounded at the corners and the (110) facets are extended compared to the same samples in H2, as the anisotropy ratio between the surface free energies of  (001) and (110) faces,  increases from 0.7 in H2 to 0.8 in O2.

3. Properties

A maximal reactivity in gas has been found for an equivalent thickness of 0.4 atomic Pt layers on the Pd nanocubes. For this thickness the core-shell particles are more active than pure Pd cubes or similar Pt cubes reported in literature. This behavior is explained by a decrease of the adsorption energy of molecules, due a compressive strain, induced by the misfit between the two metal bulk lattices and by a ligand effect due to the modification of the electronic structure of Pt atoms in contact with Pd atoms. A similar qualitative evolution as a function of thickness of the Pt layer was already observed in electrocatalysis and was also explained by the decrease of the strength of adsorbed species.

 

References

[1]  Yuk M. et al.,Science , 336,  61  (2012)

[2]  De Clercq A. et al., J. Phys Chem. Letters, 5,  2126-2130  (2014)

[3]  Alloyeau D. et al. Nanoletters (2015)

[4]  Giorgio S. et al., Ultramicroscopy 106 -6, 503 (2006)  


Astrid DE CLERCQ, Olivier MARGEAT, Claude R HENRY, Suzanne GIORGIO (Marseille)
08:00 - 18:15 #5753 - MS00-490 In-situ atomic scale studies of ammonia synthesis over ruthenium nanocatalysts.
MS00-490 In-situ atomic scale studies of ammonia synthesis over ruthenium nanocatalysts.

Ammonia is an important chemical for the production of fertilisers and in chemical synthesis. Catalyst materials are employed to improve the rate of formation of ammonia from diatomic gas precursors. Historically, the industrial catalyst most widely used for this process is based on the magnetite phase of iron oxide, often promoted by alumina and other additives.1 More recently, graphitic carbon supported ruthenium based catalysts have been developed, which can operate more efficiently and at lower pressures than iron catalysts.2, 3 In this work, the sintering of Ru/C catalysts under ammonia synthesis conditions was studied by Environmental Scanning Transmission Electron Microscopy (ESTEM).4

Samples were prepared by incipient wetness impregnation of Ru(NO)(NO3)3 on graphitic carbon. After drying at 150 °C, powdered samples were deposited onto 5 nm amorphous carbon coated MEMS chips supplied by DENS solutions. Additionally, model Ru samples were prepared by direct deposition of Ru precursor onto amorphous carbon MEMS chips. Ru nanoparticles were formed in the microscope by in-situ reduction in H2 gas. Suitable regions were identified and treated at 300 – 450 °C in H2, N2, or a mixed H2/N2 gas atmosphere. Images were taken before and after treatment to study nanoparticle sintering. To limit beam exposure, the beam was blanked between images and during heating steps.

Typical images of the Ru/C samples are shown in Figure 1, showing Ru particles around 1 – 5 nm in size in addition to smaller clusters. After initial reduction, electron diffraction patterns from particles on both supports can be assigned to hexagonal phase Ru metal, space group P63/mmc. An example heating series for Ru on amorphous carbon is shown in Figure 2. Particle migration and coalescence is observed following treatments at both 300 °C for 2 h and 450 °C for 1 h. For this image series the particle size distribution increased from 1.5 ± 0.38 nm before H2/N2 treatment, to 1.57 ± 0.33 nm and 1.64 ± 0.4 nm after 300 °C/450 °C treatments respectively. The sintering behaviour of Ru nanoparticles will be investigated as a function of support, gas atmosphere and temperature.

The authors would like to thank Mr Ian Wright and Dr Leonardo Lari for technical support, and the EPSRC (UK) for the strategic research grant EP/J018058/1.

References:

1.            L. Lloyd, Handbook of Industrial Catalysts, Springer, New York, 2011

2.            D. E. Brown, T. Edmonds, R. W. Joyner, J. J. McCarroll and S. R. Tennison, Catal. Lett., 2014, 144, 545

3.            Z. Kowalczyk, S. Jodzis, W. Raróg, J. Zieliński, J. Pielaszek and A. Presz, Applied Catalysis A: General, 1999, 184, 95

4.            E. D. Boyes, M. R. Ward, L. Lari and P. L. Gai, Ann. Phys., 2013, 525, 423


Robert MITCHELL (York, United Kingdom), Edward BOYES, Pratibha GAI
08:00 - 18:15 #5770 - MS00-492 Cost effective implementation of nanoparticle size measurement for regulation purposes.
MS00-492 Cost effective implementation of nanoparticle size measurement for regulation purposes.

While nano-scaled intermediate and consumer products are omnipresent in many industries, a huge challenge consists in the development of methods that reliably identify, characterize and quantify nanomaterials both as a substance and in various matrices. For product registration purposes, the European Commission proposed a definition of nanomaterial [1] which requires a quantitative size determination of the primary particles of a sample down to sizes of 1 nm. According to [1] a material is defined as nano if 50% of the primary particles are observed to comprise a smallest dimension <100 nm.  The NanoDefine project [5] was set up to develop and validate a robust, readily implementable and cost-effective measurement approach to obtain a quantitative particle size distribution and to distinguish between nano and non-nano materials according to the definition [1].

In the present study the mean particle size derived from Brunauer, Emmet, Teller (BET) surface measurement by gas adsorption is systematically compared with the particle size derived from TEM images by manual and automated image evaluation. A correlation between mean particle diameters of 10 different organic pigments is given in figure 1. Automated and manual image evaluation lead to consistent results for the D50 particle size (red and blue bars). Automated TEM image evaluation was accomplished by a software package developed within the NanoDefine project which will soon be available as public ImageJ-Plugin [2,3]. Samples were carefully selected to represent typical organic pigment particles of different grinding degrees. Figure 2 shows TEM images of such a series of pigment grades. The red ellipses mark the result of the automated particle detection using direct ellipse fitting. The length of the minor axis of each ellipsis was taken as approximation for the particles minimum feret diameter.

In the present study a tiered approach for particle classification is proposed. BET measurements can be used for a coarse classification of the material including a categorization into nano/non-nano [4]. The presented data help to define the thresholds for this surface-based classification. Automated evaluation of TEM images improves this classification with reliable results for the number-based particle distribution within some remaining constraints. The according limitations are elaborated in the present study by comparison with the D50 size values determined by manually evaluation of TEM images.

 

References:

[1] European Commission, Commission Recommendation of 18 October 2011 on the definition of nanomaterial, Official Journal of the European Union. 2011/696/EU (2011) p.38.

[2] Schneider, C. A.; Rasband, W. S. & Eliceiri, K. W. (2012) Nature methods 9(7): p. 671.

[3] Wagner, T., Wiemann M., Lipinski H.-G., Kaegi, R., (2015), Symposium on Frontier Researches in Sustainable Humanosphere 2015, Kyoto, Japan

[4] NanoDefine Public Deliverable D3.5; peer reviewed publication in preparation

[5] The research leading to these results has received funding from the European Union’s Seventh

Framework Programme (FP7/2007-2013) under grant agreement n° 604347 – NanoDefine (www.nanodefine.eu).


Philipp MÜLLER (Ludwigshafen am Rhein, Germany), Wendel WOHLLEBEN, Thorsten WIECZOREK, Thorsten WAGNER
08:00 - 18:15 #5772 - MS00-494 Behaviour of platinum nanoparticles under reducing and oxidising conditions using ESTEM.
MS00-494 Behaviour of platinum nanoparticles under reducing and oxidising conditions using ESTEM.

Platinum nanoparticles are well-known to be catalytically active in a wide variety of important chemical processes including hydrogen fuel cells 1 and diesel oxidation catalysts 2. Platinum, as well as other nanoparticle catalysts are known to reduce their efficiency over time under operating conditions due to several mechanisms. The first method is via particle migration and coalescence where nanoparticles become mobile, collide and eventually form larger structures. Alternatively, the nanoparticles may undergo Ostwald ripening where large nanoparticles grow at the expense of smaller ones due to diffusion of less stable atoms across the support or in a gaseous phase. In either case, valuable catalytically active sites such as edge, corner and adatom sites may be lost as larger more stable facets take their place. As nanoparticles coalesce, more of the precious metal is locked away beneath the surface of the nanoparticles resulting in loss of active surface area and ultimately wasted metal.

These processes have been studied with the help of atomic resolution transmission electron microscopy where heat combined with gas can be used to replicate real world operating conditions inside the microscope 3,4. HAADF-STEM with its Z contrast imaging capability is ideal for studying these nanoparticle growth mechanisms, particularly Ostwald ripening where small clusters/atoms are generally not visible in TEM. To further this important field of research, we investigate the differences in nanoparticle dispersion on two different supports before and after being exposed to a range of gases at different temperatures. We utilised the York JEOL 2200FS featuring double aberration correction and  environmental TEM/STEM capability which has previously demonstrated single atom resolution in gas 5. A MEMs chip holder from DENSsolutions was used for heating.

To produce a simple model system to infer nanoparticle aging mechanisms on more complex industrial catalysts, we deposited platinum via magnetron sputtering onto a SiNX MEMs chip upon which graphite had previously been deposited (from ethanol suspension of graphite powder). Figure 1 shows an example of a graphite sheet loaded onto the SiNx MEMs chip. Figure 2 shows an example of the differences in dispersion before and after exposure to O2 at elevated temperature for 6 hours. The image in Figure 2 is taken near a graphite sheet edge. The nanoparticles on the graphite are slightly larger than those on the SiNx on the freshly deposited sample but after the heat treatment in O2, the nanoparticles on the graphite are much larger. These results and environmental (S)TEM in general open new avenues into nanoparticle research using electron microscopy and have wide applications in chemical production, exhaust catalyst and future fuel cell design.

Acknowledgements

We acknowledge the EPSRC (UK) for the critical mass research grant EP/J018058/1 for funding and Ian Wright of the York Nanocentre for assistance.

References

1. Wang, Y.J., et al., Carbon-Supported Pt-Based Alloy Electrocatalysts for the Oxygen Reduction Reaction in Polymer Electrolyte Membrane Fuel Cells: Particle Size, Shape, and Composition Manipulation and Their Impact to Activity. Chemical Reviews, 2015. 115(9): p. 3433-3467.

2. Russell, A. and W.S. Epling, Diesel Oxidation Catalysts. Catalysis Reviews-Science and Engineering, 2011. 53(4): p. 337-423.

3. Gai, P.L. and E.D. Boyes, Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy. Microscopy Research and Technique, 2009. 72(3): p. 153-164.

4. Simonsen, S.B., et al., Direct Observations of Oxygen-induced Platinum Nanoparticle Ripening Studied by In Situ TEM. Journal of the American Chemical Society, 2010. 132(23): p. 7968-7975.

5. Boyes, E.D., et al., ESTEM imaging of single atoms under controlled temperature and gas environment conditions in catalyst reaction studies. Annalen Der Physik, 2013. 525(6): p. 423-429.


Michael WARD (York, United Kingdom), Ed BOYES, Pratibha GAI
08:00 - 18:15 #5774 - MS00-496 Element partitioning and atom location of alloying elements in Co‐base superalloys.
MS00-496 Element partitioning and atom location of alloying elements in Co‐base superalloys.

    The discovery of an ordered L12 precipitate (Co3(Al, W)) phase in the ternary Co-Al-W system in 2006 which is stable up to temperatures of 950 °C attracts significant research on microstructure design for a new class of load-bearing Co-base high-temperature alloys. The low mismatch between the fcc γ-Co solid-solution phase and the L12 γ’-Co3(Al, W) phase helps to establish a microstructure with coherent cuboidal γ’ precipitates embedded in a continuous γ matrix, analogous to Ni-base superalloys. These new Co-base superalloys have the potential to exhibit excellent high-temperature mechanical properties and are considered to be ideal turbine blade materials.

    In the ternary Co-Al-W system, it is reported that the L12 phase is in equilibrium with the B2-CoAl and D019-Co3W phases and transforms into those after extended annealing[1]. In order to increase the temperature capability and stabilize the γ’-L12 phase, additional alloying elements are added to the Co-Al-W system. With additions of Cr, Mo, Ni, Re, Ta and V, the solidus and liquidus temperatures of Co-Al-W alloys are 100-150 °C higher than those of advanced Ni-base single-crystal alloys strengthened by the L12 phase[2]. It is speculated in literature that Mo, V, Nb, Ta and Ti increase the γ’ solvus temperature of Co-Al-W superalloys because they occupy B-sites in the A3B ordered γ’ phase and thereby increase its volume fraction, while Fe, Mn and Cr tend to distribute to the γ phase and decrease the amount of γ’ phase[3]. Because the distribution of additional elements will influence the morphology and amount of the γ’ phase, it is important to investigate their partitioning behavior and atomic site occupation in the Co-Al-W system. Therefore the high-temperature strength and thermal stability of Co-base superalloys are optimized.

    In this study, alloy samples with nominal compositions Co-9Al-9W-2X (X=Ti, Nb, V, Ta, Cr and Mo, at.%) were produced. The partitioning behavior of the alloying elements between γ and γ’ phases were investigated by energy-dispersive X-ray spectroscopy (EDS) in the transmission electron microscope (TEM). In order to analyze the element occupation at atomic sites, atom location by channeling enhanced microanalysis (ALCHEMI) technique was applied.

    The details about the partitioning behavior and the atomic site occupation of alloying elements will be discussed in the presentation.

References

[1] S. Kobayashi, Tsukamoto, Y., Takasugi, T., Chinen, H., Omori, T., Ishida, K., Zaefferer, S., Intermetallics, 17 (2009) 1085-1089.

[2] T.M. Pollock, Dibbern, J., Tsunekane, M., Zhu, J., Suzuki, A., JOM, 62 (2010) 58-63.

[3] S. Meher, Yan, H. Y., Nag, S., Dye, D., Banerjee, R., Scripta Mater, 67 (2012) 850-853.


Li WANG (Geesthacht, Germany), Michael OEHRING, Uwe LORENZ, Florian PYCZAK
08:00 - 18:15 #5848 - MS00-498 Mapping the plasmonic modes of silver nanoparticle aggregates.
MS00-498 Mapping the plasmonic modes of silver nanoparticle aggregates.

The optical properties of the noble metal nanoparticles (NPs) are dominated by localized surface plasmon resonances (LSPR) [1]. A spherical NP suspended in vacuum would present a LSPR mode that can be modelled as a dipole, hence called dipolar mode. When NPs are close enough to each other, they couple splitting the plasmonic modes of the same order and creating two new modes, the bonding dipolar plasmonic mode (BDP), and the antibonding dipolar plasmonic mode (ADP) [2]. The BDP is a low-energy mode while the ADP resonates at a value slightly higher than the dipolar mode of a sphere. The exact energy value for both modes depends on the inter-particle distance, being smaller as they are closer to each other [3]. It also depends on the aspect ratio of the group with lower energy values as the aspect ratio gets larger [4]. The third conditioning factor is the geometric shape of the cluster. In the same way that triangular NPs have plasmonic modes at lower energies than a sphere [5], a triangular or rhomboidal shaped group of NPs shows plasmonic modes at smaller energies than a spherical one [6].

In this work, silver NPs were created and were forced to cluster. Samples were taken at different stages of the aggregation process. They were analyzed at a large scale by UV-Vis spectroscopy (UV-Vis) and at nanometre scale by energy-filtering transmission electron microscopy (EFTEM). The individual, dipolar mode was clearly identified for isolated NPs corresponding to the early stages of the clustering process. As bigger clusters are created, the collective modes become more apparent.

This work was supported by the Spanish MINECO (projects TEC2014-53727-C2-1-R, 2-R and CONSOLIDER INGENIO 2010 CSD2009-00013), Generalitat Valenciana (PROMETEOII/2014/059) and Junta de Andalucía (PAI research group TEP-946).  The research leading to these results has received funding from the European Union Seventh Framework Program [FP/2007/2013] under Grant Agreement No. 312483 (ESTEEM2) and H2020 Program (PROMIS ITN European network).

References

1.             Maier, S.A., Plasmonics: Fundamentals and Applications. 1st ed. 2007: Springer: New York.

2.             Halas, N.J., et al., Plasmons in Strongly Coupled Metallic Nanostructures. Chemical Reviews, 2011. 111(6): p. 3913-3961.

3.             Duan, H.G., et al., Nanoplasmonics: Classical down to the Nanometer Scale. Nano Letters, 2012. 12(3): p. 1683-1689.

4.             Barrow, S.J., et al., Surface Plasmon Resonances in Strongly Coupled Gold Nanosphere Chains from Monomer to Hexamer. Nano Letters, 2011. 11(10): p. 4180-4187.

5.             Koh, A.L., et al., High-Resolution Mapping of Electron-Beam-Excited Plasmon Modes in Lithographically Defined Gold Nanostructures. Nano Letters, 2011. 11(3): p. 1323-1330.

6.             Diaz-Egea, C., et al., High spatial resolution mapping of surface plasmon resonance modes in single and aggregated gold nanoparticles assembled on DNA strands. Nanoscale Research Letters, 2013. 8(1): p. 337.


Carlos DIAZ-EGEA (Puerto Real, Cadiz, Spain), Rafael ABARGUES, Juan P MARTÍNEZ-PASTOR, Wilfried SIGLE, Peter A. VAN AKEN, Sergio I MOLINA
08:00 - 18:15 #5863 - MS00-500 In-situ HREM observation and adsorbed gas imaging of ceramics supported fine metal particle catalysts under reaction gas atmosphere.
MS00-500 In-situ HREM observation and adsorbed gas imaging of ceramics supported fine metal particle catalysts under reaction gas atmosphere.

   Three-way catalysts used for purifying automotive exhaust gas usually take a form of noble metal (platinum group metals) fine particles supported on a heat-resistant metal oxide, which converts NOx, CO, HC to N2, CO2, H2O. Incessant efforts have been made to improve the catalytic performance because the governmental regulations for exhausted gas emissions has been continuously updated in a more strict direction, while the price of those rare metals are unstable, because of the uneven distribution of the resources. Technical issues of compatibility between the high catalytic activity and material costs by reducing rare metals or by development of alternative catalysts without them have not yet been fully solved. It is thus important to design an appropriate catalyst without relying on a rule of thumb by unraveling the mechanism of catalytic activities. In the present study we observed in situ catalytic reactions of fine metal particles under gas atmosphere at atomic level resolution and also tried to visualize the catalytic active site by imaging gas molecules adsorbed on the particle surface, using electron energy-loss spectroscopy (EELS).
   We selected Rh/ZrO2, Pt/ZrO2 system, where the particle-supporting ceramics interaction is suppose2d to be relatively weak, to examine the structural changes and adsorption behaviors of reactive gas molecules. The sample powders were dispersed in an organic solvent and a drop of the solution was painted by a brush on a tungsten wire of the single-tilt specimen heating holder. The observation was done between RT and 600 degrees Celsius under vacuum, under O2, NO or CO atmosphere (diluted by Ne), using the Reaction Science Ultra-High Voltage S/TEM, JEM1000K RS of Nagoya University, operated at 1000 kV, equipped with a GIF quantum equivalent post-column EELS and with a differential pumping environmental cell which allows us to introduce a gas to the specimen chamber up to the pressure of 10,000 Pa [1]. Dynamical structural changes were observed at the HRTEM mode and energy-filtered TEM spectral imaging (EFTEM-SI) was applied to the plasmon-loss region. A multivariate analysis method was applied to the obtained datacubes to isolate the spectral features specific to volume and surface plasmon of the metal particles and gas molecules [2].
   The reference plasmon spectra of Rh2O3, ZrO2 and L2,3 ELNES of the gas molecules to identify the resolved spectra from the SI datacubes are shown in Fig. 1. Before observing catalytic reactions, the sample was heated up to remove the organic solvent, though it should be noted that fast heating brought about surface precipitates covering Rh particles under O2 atmosphere, which was found to come from ZrO2 support. This phenomenon was already reported as the strong metal support interaction (SMSI) [3], as shown in Fig.2. Under a mixture gas atmosphere of NO and CO at 300 degrees Celsius carbon layers covering the surfaces of ZrO2 support and partly Rh particles were observed, presumably due to the reduction of CO, though it is unclear whether it is caused by a catalytic reaction. On the other hand, it was observed in case of the Pt/ZrO2 system that reversible solution/precipitation of Pt particles into/from the ZrO2 support by heating/cooling between RT and 300 degrees Celsius, which could be also SMSI.
   Considering that the strong core-loss spectra of the gas molecules appear in the low-loss region, we attempted to detect and image adsorbed gas molecules on metallic particles, using the EFTEM-SI technique and multivariate analysis. Unfortunately no gas molecule-related spectrum was found at Rh/ZrO2 under O2 atmosphere because of SMSI, whereas under a mixture gas atmosphere of NO and CO the spectral component having a peak around 12 eV (Component 3 in Fig. 3), different from that of ZrO2, Rh, or Rh2O3 was separated, which is presumably originated from NO and/or CO, as shown in Fig. 3. We have also conducted the EFTEM-SI experiments under the conditions where SMSI is carefully avoided. Detailed results and argument are presented in the poster.

References

[1] N. Tanaka et al, Microscopy, 62 (2013) 205-215. [2] S. Muto, T. Yoshida and K. Tatsumi, Mater. Trans. 50 (2009) 964-969. [3] S. Bernal et al, Catalysis Letters, 76 (2001) 131-137. [4] A part of this works was supported by Nagoya University microstructural characterization platform as a program of "Nanotechnology Platform" of the Ministry oEducation,Culture,Sports,Science and Technology (MEXT), Japan.


Yuuki ARAKAWA (Tajimi, Japan), Hiromochi TANAKA, Shunsuke MUTO, Keisuke KISHITA, Yasumori SAKURABAYASHI, Hirohito HIRATA
08:00 - 18:15 #5930 - MS00-502 Structural and chemical characterization and 3D modelling of metal oxide core-shell nanoparticles with complex morphology.
MS00-502 Structural and chemical characterization and 3D modelling of metal oxide core-shell nanoparticles with complex morphology.

A wide variety of metal oxide manganite and ferrite core-shell nanoparticles (NPs) with adjustable composition were characterized by means of Transmission Electron Microscopy related tools in order to precisely understand their composition, the arrangement of the different chemical species and cation valence state variation along the nanoparticles.

 

The nanoparticles were produced at low temperature and ambient atmosphere using a one-pot two-step synthesis protocol involving the cation exchange of Mn or Fe by Co or Ni in preformed Mn3O4 or Fe3O4 NPs, allowing the formation of a core shell structure. These nanoparticle systems present a complex 3D structure, which has been modelled with Rhodius software [1] and simulated with the STEM-CELL packages [2], giving rise to a fine determination of the studied systems.

Special attention has been paid on manganite – cobalt systems. By selecting the proper cobalt precursor, CoO crystallites could be simultaneously nucleated on the NP surface to form Mn3O4@CoMn2O4–CoO (Figure 1). In this latest case,  heterostructured NPs exhibited improved performance and durability as bifunctional catalysts for the oxygen reduction and evolution reactions (ORR, OER) over commercial Pt and IrO2-based catalysts and over previously reported spinel electrocatalysts in alkaline solution.

 

Acknowledgements:

SM acknowledges funding from "Programa Internacional de Becas "la Caixa"-Severo Ochoa”, from Generalitat de Catalunya 2014 SGR 1638, the Spanish MINECO MAT2014-51480-ERC (e-ATOM), Severo Ochoa Excellence Program and coordinated projects between IREC and ICN2, TNT-FUELS and e-TNT (MAT2014-59961-C2-2-R). Part of the present work has been performed in the framework of Universitat Autònoma de Barcelona Materials Science PhD program.

 

[1] S. Bernal, et al., Ultramicroscopy 72, 135−164 (1998)

[2] V. Grillo, E. Rotunno, Ultramicroscopy 125, 97–111 (2013)


Sara MARTÍ-SÁNCHEZ (Bellaterra, Spain), Aziz GENÇ, Zhishan LUO, Maria IBÁÑEZ, María DE LA MATA, Andreu CABOT, Jordi ARBIOL
08:00 - 18:15 #5963 - MS00-504 In situ study of Au-Rh nanoalloys.
MS00-504 In situ study of Au-Rh nanoalloys.

1. Introduction

Au-Rh nanoalloys were prepared from colloidal solution [1]. The growth mechanism was studied in situ by TEM in a graphene liquid cell [2-3]. Then, in an environmental sample holder [4],the influence of oxygen or hydrogen adsorption on the structure of AuRh/TiO2 catalysts was observed at a pressure of a few mbar and at room temperature.

2. Growth mechanism

The colloidal solution was encapsulated in a graphene oxide liquid cell and directly observed in a standard electron microscope. The particle growth was initiated under the electron beam.

The same area was observed during about 80 s and images were recorded every 5 s. The average particle size increases until 4 nm. The density number plotted in fig. 1, indicates a maximal density after 25 s, then a drop after 50 s, corresponding to a growth mechanism by direct adsorption of the monomers. This process is followed by coalescence of the  particles, as directly seen in fig. 2.

3. Segregation in hydrogen

Au-Rh nanoparticles with an homogeneous structure, and supported on rutile TiO2 nanorods powders, were observed during oxidation- reduction cycles in an environmental sample holder. In the largest NPs, core- shell formation was clearly observed during hydrogen adsorption, as seen in figure 3. On the other hand, the observation of Au-Rh NPs annealed ex situ in H2 at 400 °C, also shows the core- shell contrast which was not visible before H2 treatment.

The strong interaction between hydrogen and Rh is certainly responsible for the surface segregation of Rh.

Acknowledgments:

We thank the ANR DINAMIC  -11-BS10-009 for financial support and Région PACA for a grant given for the PhD thesis of A. De Clercq.

References

  1. Konuspayeva et al., PCCP 17 (2015) 28122
  2. J.M. Yuk et al., Science, 336 (2012) 61
  3. De Clercq, et al., The Journal of Physical Chemistry Letters, 5 (2014) 2126-2130
  4. S. Giorgio et al., Ultramicroscopy. 106 (2006) 503     

Astrid DE CLERCQ, Laurent PICCOLO, Suzanne GIORGIO (Marseille)
08:00 - 18:15 #5986 - MS00-506 Investigating the Nucleation and Growth of Quaternary Cu2ZnSnS4 Nanocrystals.
MS00-506 Investigating the Nucleation and Growth of Quaternary Cu2ZnSnS4 Nanocrystals.

Among inorganic semiconductors, ternary and quaternary chalcogenides have attracted interest as light absorbers in photovoltaic applications. Cu2ZnSnS4 (CZTS) has drown considerable attention as it has band-gap suitable for solar-harvesting applications, it shows p-type conductivity and a high absorption coefficient. Moreover it only consists of inexpensive, non-toxic and earth-abundant materials. Synthesis by wet-chemical methods are promising alternatives to physical deposition processes, as more easily implemented and cheaper. One of the challenges in the synthesis of colloidal CZTS nanocrystals is the control of internal structure and composition, which influence significantly their optoelectronic properties [1]. In this presentation we show the evidence of cation ordering in CZTS structure thanks to STEM HAADF imaging and we analyze nanocrystals homogeneity and composition by STEM EDX.

CZTS nanocrystals were syntesized following an heating-up method [2]. The first stage of the synthesis consists in a 30 minutes pre-heating at 110°C of the organometallic precursors mixed in oleylamine. Then, CZTS nCs are obtained by increasing the mixing temperature up to 280°C and keeping it constant for one hour. The presence of long-chained organic ligands passivating the surface of nanocrystals is fundamental for avoiding agglomeration in solution phase, it allows a slow and controlled growth; nevertheless it is detrimental for application in devices and for electron microscopy studies, in particular in spectroscopy (where contamination is critical). By drop-casting the sample on graphene membranes, we could test the influence of several purification strategies. Thanks to the low-contrast support we could image the unwanted parasitic residuals. In particular we proved the efficiency of solvent/antisolvent chloroform/aceton + acetic acid dispersion cycles [3]. HRTEM characterization was performed ex-situ. HRTEM and STEM-HAADF images were used to measure size dispersion of the nanocrystals. HRSTEM-HAADF is sensible to chemical contrast, the signal being dependent on the atomic number Z; it is then possible to observe the sites occupied by the heavier atoms (Sn) in the structure, and distinguish then between kesterite (space group I-4) or stannite (space group I-42m) and pre-mixed Cu-Au (PMCA, space group P-42m) structures, which show different characteristic “bright” motifs. The latter (PCMA) structure was the one found when nanocrystals were showing the good direction for phase identification (111). HRSTEM-HAADF experimental images were compared with simulated ones obtained by multislice method and thermal diffusion scattering approximation [4]. STEM-EDX was carried out on a dedicated FEI Themis with SuperX detector, in order to ensure chemical homogeneity between nanocrystals and inside a single crystal. Spectra were analyzed and quantified using Bruker Esprit 1.9 software.An overview of the nucleation and growing process was obtained by in-situ Wide-Angle X-ray Scattering (WAXS) and Small-Angle X-ray Scattering (SAXS), performed on the ID01 beamline at the European Synchrotron Radiation Facility.

 

[1] Chen, Physical Review B 79, 1665211 (2009)

[2] Steinhagen, JACS 131, 12554 (2009)

[3] Akdas, J. Colloid Interface Sci. 445, 337 (2015)

[4] Kirkland, “Advanced Computing in Electron Microscopy”, ed. Springer, (New York)


Fabio AGNESE (Grenoble), Aurelie LEFRANÇOIS, Stephanie POUGET, Louis VAURE, Ourania MAKRYGENNI, Fréderic CHANDEZON, Pascale BAYLE-GUILLEMAUD, Hanako OKUNO, Peter REISS, Jean-Luc ROUVIERE
08:00 - 18:15 #5998 - MS00-508 Analytical electron microscopy of barium titanate and barium-strontium titanate nanoparticles for second-harmonic biomarkers.
MS00-508 Analytical electron microscopy of barium titanate and barium-strontium titanate nanoparticles for second-harmonic biomarkers.

Nanoparticles with non-centrosymmetric crystal structures exhibit second harmonic generation (SHG) of light when illuminated by a femtosecond pulsed laser. Such nanoparticles can be used as optical biomarkers to circumvent the drawbacks associated with fluorescent proteins and semiconductor quantum dots, such as photobleaching and fluorescent intermittency (blinking). Bulk barium titanate has a tetragonal crystal structure at room temperature however, reduction in particle sizes generally correlates with an increasing phase fraction of cubic material which does not exhibit SHG [1].

 

In this study we have produced barium titanate (BaTiO3) and barium-strontium titanate (Ba1-xSrxTiO3) nanoparticles by the hydrothermal method. These nanoparticles appear predominantly cubic by laboratory-XRD but Rietveld refinement on synchrotron X-Ray powder diffraction data suggests a mixture of tetragonal and cubic phases. Transmission electron microscopy (TEM) analysis techniques such as electron energy loss spectroscopy (EELS) and energy-dispersive X-ray (EDX) spectroscopy have been used to determine the inter- and intra-particle phase and composition of BaTiO3 and Ba1-xSrxTiO3 nanoparticles. Prior STEM-EELS work, suggests an intra-particle phase distribution of cubic and tetragonal phases [2]. STEM-EEL linescans by aberration corrected scanning transmission electron microscopy (SuperSTEM) confirm that these hydrothermal samples exhibit intra-particle phase distribution of a tetragonal core and a cubic shell (Figure 1 & 2).

 

Multi-photon microscopy correlated with SEM demonstrates the SHG signals from the BaTiO3 and Ba1-xSrxTiO3 nanoparticles [3]. The cellular uptake and biocompatibility of the BaTiO3 and Ba1-xSrxTiO3 nanoparticles have been determined by cell viability (MTT) and genotoxicity (Comet) assays. Uptake was confirmed by backscattered Z-contrast imaging by SEM and EDX (Figure 3), along with bright field TEM and HAADF-STEM of resin embedded cell sections. Direct correlation between electron microscopy (SEM & TEM) and multi-photon microscopy will be used to determine SHG characteristics at the individual particle level when taken up by cells.


    

[1]        E. Kim, A. Steinbrück, M. T. Buscaglia, V. Buscaglia, T. Pertsch, R. Grange, et al., Second-Harmonic Generation of Single BaTiO3 Nanoparticles down to 22 nm Diameter, ACS Nano. 7 (2013) 5343–5349.

[2]      S M Moon, X Wang, N.H. Cho, Identification of Local Phase of Nanoscale BaTiO3 Powders by High-Resolution Electron Energy Loss Spectroscopy, Microsc. Microanal. 19 (2013) 123.

[3]      O. Matar, O.M. Posada, N.S. Hondow, C. Wälti, M. Saunders, C.A. Murray, et al., Barium Titanate Nanoparticles for Biomarker Applications, J. Phys. Conf. Ser. 644 (2015). 012037


Omar MATAR (Cockermouth, United Kingdom), Nicole HONDOW, Olga POSADA, Michael ROUTLEDGE, David HERNANDEZ-MALDONADO, Christoph WÄLTI, Claire MURRAY, Rik BRYDSON, Steve MILNE, Andy BROWN
08:00 - 18:15 #6014 - MS00-510 Morphology and composition tailoring of cobalt ferrite nanoparticles.
MS00-510 Morphology and composition tailoring of cobalt ferrite nanoparticles.

Cobalt ferrite nanoparticles have scientific and technological interest due to their magnetic properties, good chemical stability and low cost, combined with catalytic properties. These factors allow their use in various applications, such as ferrofluid technology [1], catalysts [2] and gas sensors [3].  One way to improve the catalytic properties of the cobalt ferrite is to control the size and the morphology of the nanoparticles. Studies show that crystallites which expose only a particular family of crystallographic planes have enhanced catalytic activity [4].We already obtained nanooctahedron exposing only {111} facets, 20 nm in size, by  a solvothermal method [5]. Another way to enhance catalytic properties is to control the composition of cobalt ferrites; previous studies showed that high amount of cobalt favors the catalytic conversion of methane [2]. The aim of this study is to synthesize cobalt ferrite nanoparticles with different compositions (CoFe2O4 and Co1.8Fe1.2O4) and morphologies, in order to control and optimize the catalytic properties.

The powders were obtained by solvothermal synthesis using different solvents and precursors. The control of the shape was realised using different surfactants. For cobalt ferrite Co1.8Fe1.2O4 cobalt nitrate and iron nitrate were used as precursors,water and ethylene glycol as solvents. The experiments showed that the solvent has a significant influence on the powder composition.  When water or a mixture of water and ethylene glycol were used as solvents, two phases were identified in the final product: Co(OH)2 and Co1.5Fe1.5O4 (fig. 1). When only ethylene glycol was used, a pure phase with homogeneous composition was obtained: Co1.8Fe1.2O4 with the spinel structure and size around 8 nm (fig. 2).

In order to obtain different morphologies of CoFe2O4, cobalt acetylacetonate and iron acetylacetonate with benzyl alcohol as solvent were used with different amount of oleic acid and oleylamine as surfactants. The cobalt ferrite powder produced by both oleic acid and oleylamine has a heterogeneous composition containing some crystals with cubic shape (fig. 3). Using only acid oleic as surfactant led to a CoFe2O4 powder with homogeneous composition. The shapes of the particles are nearly cubic or octahedral (fig.4). These preliminary results indicate that shape of the nanoparticles is controled by the amount and nature of surfactant.

 

[1]      J. Li, D. Dai, X. Liu, Y. Lin, Y. Huang, L. Bai, J. Mater. Res. 22 (2007) 886-892.

[2]      L. Ajroudi, S. Villain, V. Madigou, N. Mliki, Ch. Leroux, J. Cryst. Growth 312 (2010) 2465–2471.

[3]      C. Xiangfeng, J. Dongli, G. Yu, Z. Chenmou, Sensors Actuators B Chem. 120 (2006) 177–181.

[4]      N. Ballarini, F. Cavani, S. Passeri, L. Pesaresi, A.F. Lee, K. Wilson, 366 (2009) 184–192.

[5]      A.L. Lopes-Moriyama, V. Madigou, C.P. de Souza, Ch. Leroux, Powder Technol. 256 (2014) 482–489.

 

Acknowledgments

This work was done in the general framework of the CAPES COFECUB Ph-C 777-13 french – brazilian cooperation project.


Indira Aritana FERNANDES DE MEDEIROS (La Garde), André Luís LOPES-MORIYAMA, Véronique MADIGOU, Carlson PEREIRA DE SOUZA, Christine LEROUX
08:00 - 18:15 #6021 - MS00-512 Preparation and structural characterization of Au nanoparticles supported on metal oxide nanoplatelets for catalysis by a new two-step method.
MS00-512 Preparation and structural characterization of Au nanoparticles supported on metal oxide nanoplatelets for catalysis by a new two-step method.

While gold has long been regarded as a poorly active catalyst, it is now widely investigated in the field of catalysis and gas sensing. Indeed, it exhibits surprisingly high catalytic activity when deposited as nanoparticles (NPs) on base metal oxides, carbon materials or organic polymers. Especially, gold nanoparticles catalysts with 2 to 10 nm diameters are active for many reactions, such as CO oxidation at a temperature as low as - 70°C. The catalytic performance of supported gold NPs depends on the kind of support materials, the size of gold NPs, and the gold/metal oxide interface structure[1].

 

A variety of preparation methods (more than 10) have been developed to obtain gold NPs with homogeneous dispersions on supports. Classical chemical methods need a calcination step in order to (i) reduce Au3+ ions deposited from a precursor (HAuCl4 is the most popular one) by means of impregnation or deposition–precipitation techniques; (ii) remove organic ligands such as polyvinyl pyrrolidone or polyvinyl alcohol, which prevent the aggregation of gold NPs in the sol-immobilisation method;(iii) crystallize the metal oxide support in coprecipitation method. During the calcination step, the deposited gold particles generally grow to larger ones, so a precise control of the NPs size is difficult with these methods. On the other side, physical methods (PVD, Cathodic Arc Plasma Deposition) are cleaner and allow precise size distribution of the gold NPs on supporting materials, but they needs specific and expansive devices.

 

In this work, an original chemical method to prepare gold NPs deposited on a metal oxide is presented. No calcination is required. The gold precursor is HAuCl4. The oxide used as supporting material must have a lamellar structure. In this work, we choose an Aurivillius phase (Bi3.25La0.75Ti3O12).The preparation consists in two steps. First, lithium is intercalated in the oxide structure, using n-butyl-lithium. After washing and drying at room temperature, a stable lithiated compound is obtained, in which some metallic cations have been reduced at a lower oxidation state [2]. Then, the lithiated powder is mixed with a gold precursor in aqueous solution. Gold ions are directly reduced near the support surfaces, without any other reducing agent. and the nanoparticles are formed only atthe oxide surface and they are well dispersed (figure 1). In addition, the NPs formation is accompanied by a partial delamination of the oxide grains which are separated in nanoplatelets (figures 2 and 3).

 

The materials have been characterized by electronic microscopies (HRSEM, TEM) at each step of the preparation process. The effect of the gold concentration has been investigated and the kinetics of the NPs deposition has been studied by UV-VIS spectroscopy (figure 4), using the gold NPs localized plasmon surface resonance property.

 

[1] Takei, T. et al; Heterogeneous Catalysis by Gold, in Advances In Catalysis, 55, 1-126, 2012, doi: 10.1016/B978-0-12-385516-9.00001-6

[2] Chevallier, V. et al., Exfoliated nanoplatelets of an Aurivillius phase, Bi3.25La0.75Ti3O12: Characterisation by X-ray diffraction and by high-resolution electron microscopy, J. of Solid State Chemistry, 181, 439–449, 2008   doi:10.1016/j.jssc.2007.12.012


Virginie CHEVALLIER, Véronique MADIGOU (LA GARDE)
08:00 - 18:15 #6035 - MS00-514 Synthesis and Structural Control of Bimetallic Pt-Ni nanoparticles.
MS00-514 Synthesis and Structural Control of Bimetallic Pt-Ni nanoparticles.

Noble metals nanoparticles (e.g. platinum, palladium) are commonly used as catalysts in alcohol oxidation reactions [1]. Catalytic efficiency of the nanoparticles may be greatly increased by a partial replacement of one of the precious metals with  d-block transition metals (e.g. iron, cobalt, nickel) [2]. One of many examples of such combinations are bimetallic Pt-Ni nanoparticles, which have a higher catalytic performance in the oxidation of methanol than pure platinum nanoparticles [3]. However, the design and synthesis of nanoparticles, which will have the appropriate size, shape and composition, is challenging. Due to the rapid course of the synthesis reaction and the possibility of changing a variety of parameters such as temperature, reactant concentration, reaction time or even the rapidity of reactants addition, it is possible obtaining nanoparticles significantly different from each other in shape and size. Appropriate selection of the reaction conditions allows to obtain nanoparticles of various shapes, ranging from simple shapes (e.g. circular, cubic, polyhedral) [4] to more complicated 3D structures (e.g. stars [2] or dendritic structures [5]). Changing the reaction conditions affects on the structure of the nanoparticles, thus it is possible to achieve bimetallic nanoalloys, in which the atoms of two metals are randomly mixed. It is also possible to obtain an ordered structure of core-shell type, in which the atoms of one metal form the core of nanoparticle and the atoms of the second surround this core [6].

The aim of this study was to synthesize 3D nanoparticles having a rhombic dodecahedron shape, composed of a Pt frame around a Ni core. For this purpose, a number of syntheses was performed in order to investigate the influence of various reaction parameters on the obtained bimetallic nanoparticles. The following parameters were changed: concentration of metal precursors, temperature in which the metal precursors were added to the solution and the duration of the reaction. The obtained nanoparticles were characterized using transmission electron microscopy (TEM) technique. The morphology of the nanoparticles and their size distribution was imaged by HAADF STEM. Energy-dispersive X-ray spectroscopy (EDX) was used to examine the distribution of chemical elements in the sample.

The HAADF STEM structural analysis showed that in all syntheses bimetallic nanoparticles in different shape were obtained. Dendritic rhombic dodecahedron shapes, regular rhombic dodecahedron and approximately spherical shapes were observed, HAADF images in Fig. 1. All samples had a crystalline structure, which was confirmed by HRTEM images. The size of the nanoparticles varied from 20 to 50 nm, depending on the synthesis method. EDS analysis of all samples confirmed the presence of platinum in the frame and nickel in the core of the nanoparticles (Fig. 1). The obtained results allow to conclude that even a small change of a single parameter during the synthesis procedure, leads to a different structure of the 3D nanoparticles.

 

[1] B. Corain, G. Schmid, N. Toshima, Metal Nanoclusters in Catalysis and Materials Science: The Issue of Size Control, Elsevier B.V. (2008).

[2] L. Han, P. Cui, H. He, H. Liu, Z. Peng, J. Yang, Journal of Power Sources 286 (2015).

[3] Y. Wu, D. Wang, Z. Niu, P. Chen, . Zhou, Y. Li, Angew. Chem. Int. Ed. 51 (2012).

[4] B. Lim, M. Jiang, J. Tao, P. Camargo, Y. Zhu, Y. Xia, Adv. Funct. Mater. 19 (2009).

[5] S. Wang, N. Kristian, S. Jiang, X. Wang, Nanotechnology 20 (2009).

[6] A. Mendez-Vilas, Materials and processes for energy: communicating current research and technological development, Formatex Research Center, 2013.

 

ACKNOWLEDGMENTS

We thank the Center for Innovation and Transfer of Natural Sciences and Engineering Knowledge of the University of Rzeszow, Poland for using the TEM instrument. Financial support from the Polish National Science Centre (NCN), grant UMO-2014/13/B/ST5/04497 is acknowledged


Grzegorz GRUZEL (Kraków, Poland), Andrzej KOWAL, Magdalena PARLINSKA-WOJTAN
08:00 - 18:15 #6089 - MS00-516 Gas sensing properties of cobalt ferrite nanooctahedra and nanocubes.
MS00-516 Gas sensing properties of cobalt ferrite nanooctahedra and nanocubes.

            The detection function of a sensing material is dependant of a high surface to volume ratio, but also to the exposed crystallographic facets. It should then be possible to tailor the reactivity and sensitivity of the sensing materials by controlling their shape and size, for a given composition [1]. We already showed that the composition of the cobalt ferrite CoxFe3-xO4 influences their catalytic properties [2]. In order to understand and control the gas sensing properties as well as the catalytic properties, we synthesized cobalt ferrites as nanoparticles with various shapes and sizes. Nanoparticles with specific shapes allow to study the influence of the cristallographic facets, hence the cation distribution at the surface, in the gas interaction with the particles.

            By solvothermal methods, we synthesised CoFe2O4 nanooctahedra (Fig. 1) and nanocubes (Fig. 2). Conventional TEM coupled with EDS, high resolution TEM, environmental TEM, were carried out in order to understand the mechanisms involved in the growth of the grains and their reaction under gas. Octahedron-like nanoparticles of CoFe2O4 were submitted to H2 -O2 cycles, at ambient temperature, under 1mbar gas pressure in an TEM 300 kV. The {100} facets extended which led to truncated octahedra and the {111} facets became more rounded under oxygen. The phenomenon was reversible and rounded particles under O2 became facetted under H2 (Figure 3). These CoFe2O4 nanooctahedra exhibit a high sensibility to oxidative gases like NO2  at low gas concentration, and the shape effect on sensibility was clearly demonstrated.The study of nanocubes under oxydo reduction cycles is under progress.

[1] C. Wang, L. Yin , L. Zhang, D. Xiang and R. Gao, Sensors 2010, 10, 2088-2106

[2] L. Ajroudi,S. Villain,V. Madigou,N. Mliki,Ch. Leroux, J. Cryst. Growth 312 (2010) 2465–2471.

[3] A. L. Lopes-Moriyama, V. Madigou, C. Pereira de Souza, Ch. Leroux Powder Tech., 256,482-489 , 2014

 

Acknowledgments :

This work was done in the general framework of the CAPES COFECUB Ph-C 777-13 french – brazilian cooperation project.


Andre-Luis LOPES-MORIYAMA, Indira Aritana FERNANDES DE MEDEIROS, Veronique MADIGOU, Madjid ARAB, Carlson PEREIRA DE SOUZA, Suzanne GIORGIO, Christine LEROUX (IM2NP, Toulon)
08:00 - 18:15 #6099 - MS00-518 Atomic structures of interfacial complexions between gold nanoparticles and nominally stable spinel-substrate.
MS00-518 Atomic structures of interfacial complexions between gold nanoparticles and nominally stable spinel-substrate.

The interfacial complexions, with distinct structures, are considered as quasi-two-dimensional phases, which undergo the structural and chemical changes associated with thermodynamic parameters [1-2]. We recently discovered the formation of gold-spinel interfacial complexions, with well-defined atomic structures, and the related growth of nominally stable spinel lattice underneath the gold nanoparticles after annealing [3-5]. As shown in Figure 1, the necking structure, which is tens of nanometers high, is detected under dewetted gold nanoparticles. Such necking structure has the same contrast with spinel substrate, maintains the spinel composition confirmed by the energy dispersive X-ray spectroscopy, and keeps an ideal epitaxial relationship with the substrate. In associated with the substrate growth, an interfacial bilayer with distinct crystalline structure forms between gold nanoparticles and the substrate. Further studies reveal that the formation and migration of the interfacial complexions are related to the defects at the interfaces, such as, the intersections of gold twinned planes and the interface (see details in Figure 2). In spite of their importance in synthesizing nanostructures, the atomic structures of interfacial complexions have not been fully elucidated yet.

 

Herein, in this paper, we investigated the detailed atomic models of such interfacial complexions in combination of atomic-resolution experimental images and first-principle computations. Experimentally, we synthesized a series of Au-MgAl2O4 samples within different annealing profiles and proposed the initial atomic models based on atomic-resolution scanning transmission electron microscopy (STEM) - high-angle annular dark-field (HAADF) images in Figure 3. Experimental images with two orthogonal crystallographic directions were selected to provide the three-dimensional structural information. A few possible atomic models, with different oxygen vacancies, were built through our MATLAB codes, and inputted into the density functional theory (DFT) computation. The relaxed atomic models, carried out with generalized gradient approximation (GGA) and Perdew-Burker-Ernzerhof (PBE) exchange-correlation density functional [6], were applied to simulate the HAADF images [7] in order to further verify the validity of the structures. Our results provide a new clue to the field of interfacial complexions, particularly to the structural origins of the abnormal phenomenon of self-assembled growth of oxide substrates underneath dewetted gold nanoparticles.

 

References:

[1] S. J. Dillon, et al, JOM 61(2009), p. 38-44.

[2] P. R. Cantwell, et al, Acta Materialia 62(2014), p. 1-48.

[3] G.-z. Zhu, et al, Applied Physics Letters 105(2014), p. 231607.

[4] F. Liu, et al, Materials Characterization 113(2016), p. 67-70.

[5] T. Majdi, et al, Applied Physics Letters 107(2015), p. 241601.

[6] J. P. Perdew, et al, Physical Review Letters 77(1996), p. 3865.

[7] E. J. Kirkland, Advanced Computing in Electron Microscopy, second ed. Springer Scieence & Business Media, 2010.

 

Acknowledgments

We acknowledge the financial support from the National Science Foundation of China (No. 51401124). 


Fang LIU (Shanghai, China), Dong Yue XIE, Yong-Sheng FU, Guo-Zhen ZHU
08:00 - 18:15 #6104 - MS00-520 Synthesis and characterization of nanocatalysts for ethanol oxidation.
MS00-520 Synthesis and characterization of nanocatalysts for ethanol oxidation.

Nowadays limited resources of fossil fuels and environmental concerns increase interest in alternative sources of energy [1]. Recently, fuel cells became very popular and interesting as a good solution for this problem. However, it should be remembered that the oxidation reaction between the catalyst and the fuel (ethanol) occurring in fuel cells is complex and generates a lot of by-products. This whole process does not promote a better efficiency of the cell, on the contrary, it leads to poisoning of the catalyst, decreasing the efficiency of the device. Therefore the key challenge for this branch of science is primarily the development of the appropriate type of catalysts [1]. Recently promising technology seem to be ternary nanocatalysts containing platinum, rhodium, and tin oxide (IV) [2].

The motivation for our work is a better understanding of the synergistic effect between these three components in nanocatalysts, replacing the rhodium by rhenium and determining their selectivity for total oxidation of ethanol to CO2.In the present study we used three methods of synthesis: polyol [3], citrate [4] and microwave assisted [5].

The obtained nanoparticles were characterized by Photon Correlation Spectroscopy (PCS), Transmission Electron Microscopy (TEM) and Fourier Transform Infrared Spectroscopy (FTIR).

The HAADF STEM structural analysis showed that the nanoparticles obtained by all three methods have similar dimensions - about 2 nm. In the case of the citrate and polyol methods the nanoparticles were strongly agglomerated, which was visible not only in the TEM images, but also confirmed by the results obtained by the PCS. On the other hand, nanoparticles obtained by the microwave assisted synthesis did not show such a strong agglomeration as those obtained by the two other methods. All SnO2 samples had a crystalline structure, which was confirmed by HRSTEM images (Fig. 1). Additionally fourier transform infrared spectroscopy (FTIR) was applied to determined the structure of tin oxide obtained in the two differences synthesis (microwave and polyol assisted). It was found, that in the infrared spectrum of Sn oxide synthesized by polyol methods, a stretching modes of Sn-O from Sn(OH)4 was not observed. Moreover, in this samples, more stretching modes of O-Sn-O (Sn4+) was noticed, whereas the samples synthesized by microwave methods, characterized by larger amounts of Sn-O (Sn2+) stretching modes (Fig. 2). The size of the nanoparticles varied from 2 to 12 nm, depending on the synthesis parameters.

The next step is the synthesis of PtRh and PtRe nanoparticles on the obtained SnO2 supports.

Our research confirmed that the crystalline structure, particle size and shape, and surface properties are highly dependent on the chosen method of synthesis.

 

[1] M. Li, W.-P. Zhou, N. S. Marinkovic, K. Sasaki and R. R. Adzic, Electrochimica Acta 104 (2013)

[2] A. Kowal, M. Li, M. Shao, K. Sasaki, M.B. Vukmirovic, J. Zhang, N.S. Marinkovic, P. Liu, A.I. Frenkel and R.R. Adzic, Nat Mater. 8(2009)

[3] L. Jiang, G. Sun, Z. Zhou, S. Sun, Q. Wang, S. Yan, H. Li, J. Tian, J. Guo, B. Zhou and Q Xin, J. Phys. Chem. B 109 (2005)

[4] L.M. Sikhwivhilu, S.K. Pillai and T.K. Hillie, J Nanosci Nanotechnol 11(2011)

[5] V. Subramanian,W.W. Burke, Z. Hongwei and W. Bingqing, J. Phys. Chem. C 112 (2008)

ACKNOWLEDGMENTS

We thank the Institute of Engineering Materials and Biomaterials of the Technical University of Gliwice, Poland for using the TEM instrument and the Department of Materials Science and Ceramics of the AGH University of Science and Technology of Cracow for using PCS instrument. We also thank the Center for Innovation and Transfer of Natural Sciences and Engineering Knowledge of the University of Rzeszow, Poland for using FTIR instrument.  Financial support from the Polish National Science Centre (NCN), grant UMO-2014/13/B/ST5/04497 is acknowledged.


Elzbieta ROGA (Kraków, Poland), Grzegorz GRUZEL, Joanna DEPCIUCH, Andrzej KOWAL, Magdalena PARLINSKA-WOJTAN
08:00 - 18:15 #6114 - MS00-522 In situ UHVEM observation of atomic ordering in magnetic nanoparticles using a direct detection camera.
MS00-522 In situ UHVEM observation of atomic ordering in magnetic nanoparticles using a direct detection camera.

   Recent demands for ultrahigh density magnetic storage technology require the development of recording media with higher magnetocrystalline anisotropy energy in order to ensure thermal stability of magnetization as well as ultrahigh recording density. For such a purpose, equiatomic CoPt alloy nanoparticles (NPs) are one of the candidate materials [1]. The hard magnetic property of this alloy is attributed to the tetragonal L10-type ordered structure; the anisotropy energy is dependent on the degree of order of the ordered phase. Therefore, formation of the L10 ordered phase is the key issue for practical applications. In this study, we hence intend to observe atomic ordering of CoPt NPs by ultra-high voltage electron microscopy (UHVEM) equipped with a direct detection camera.

   Thin films of disordered CoPt alloy NPs were synthesized by co-deposition of Co and Pt targets using rf-magnetron sputtering onto NaCl(001) substrates kept at 620 K. After the deposition of Co and Pt, surface of the NPs were coated by an amorphous carbon (a-C) thin film. The specimen films were removed from the NaCl substrate by immersing the substrate in distilled water, and then floating films were mounted onto microgrids for electron transparency. Structure and composition of the NPs were characterized using a JEOL JEM-ARM200F TEM (200 kV). Electron irradiation experiments and the simultaneous in situ heating observation were carried out using a JEOL JEM-1000EES UHVEM (1 MV) equipped with a Gatan K2-IS electron direct detection CMOS camera newly installed at the Research Center for UHVEM, Osaka University [2].

   Figure 1 shows a selected area electron diffraction (SAED) pattern and a TEM image of as-sputtered CoPt alloy NPs with disordered fcc structure. As seen, (100)-oriented CoPt alloy NPs with sizes of ~15 nm are dispersed. Average alloy composition was Co-45at%Pt as determined by EDX analysis (Fig. 1(c)).

   Figure 2 shows two successive TEM images of a CoPt NP acquired in situ with a frame rate of 1/400 s. The observation was made at 583 K under electron irradiation at 1 MV with a dose rate of 1.5 × 1025 e/m2s. In Fig. 2(a), disordered phase with the fcc structure is seen. After 2.5 ms, the ordered fringes suddenly appeared as shown in the middle of the NP surrounded by the square (Fig. 2(b)). The atomic ordering can also be confirmed by appearance of weak 001 superlattice reflection in the attached Fast Fourier Transform (FFT) pattern. The observed kinetic ordering temperature of 583 K for binary CoPt NPs is lower than that reported in the previous study (> 800 K) [3]. The low temperature atomic ordering can be attributed to the enhancement of atom migration by high-energy electron irradiation [4].

 

References

[1] P. Andreazza V. Pierron-Bohnes, F. Tournus et al., Surf. Sci. Rep. 70, 188 (2015).

[2] H. Yasuda, Microscopy 64 (S1), i27 (2015).

[3] K. Sato, T. Kosaka, and T. J. Konno, J. Ceramic Soc. Jpn. 122, 317 (2014).

[4] S. Banerjee and K. Urban, Phys. Stat. Sol. (a) 81, 145 (1984).

[5] This study was partially supported by the Grant-in-Aid for Scientific Research (B) (Grant No.26286021) from the Ministry of Education, Culture, Sports, Science and Technology, Japan.


Kazuhisa SATO (Ibaraki, Japan), Hidehiro YASUDA
08:00 - 18:15 #6120 - MS00-524 Recognition and measurements of nanoparticles in TEM/STEM images by fitting the model grayscale distribution to the real one: new approach for automated statistical analysis.
MS00-524 Recognition and measurements of nanoparticles in TEM/STEM images by fitting the model grayscale distribution to the real one: new approach for automated statistical analysis.

The main challenge to manufacture nanoparticles for applications in catalysis, medicine and pharmaceuticals is a mass production of stable nanoparticles with a narrow size distribution to target and control specific effects. Therefore reliable and fast statistical analysis of (nano)particles is of great interest especially for the particle size less than 10 nm due to strong chemical and biological activity associated with high penetrating capabilities through cell membranes. We would like to see these particles, to know their structure and composition, and to measure sizes. The intelligent, fast and reliable program can be a very useful tool for image analysis of “small” nanoparticles in TEM/STEM images.

In our work, we show that fitting of the calculated grayscale distribution to the real distribution in (S)TEM images is able to provide the maximum accuracy in measurements of the particle diameters in opposite to algorithms based on image binarization.

We apply such fitting to the truth in the vicinity of a nanoparticle image revealing the mass-thickness, diffraction, and Z-contrast. In order to describe the dependence of grayscale from thickness of nanoparticles the polynomial g(t)=g0+g1t+g2t2+... with sufficiently high power (≥2) and uncertain coefficients was chosen. The high-degree polynomial is required to take into account the possible non-monotonic dependence of the grayscale from particle thickness due to the presence of diffraction contrast (in opposite to pure mass-thickness contrast). Monotonic dependence of the grayscales from specimen thickness is the characteristic of mass-thickness contrast of particles (amorphous or crystalline particles positioned out of Bragg conditions) in TEM images and Z-contrast in STEM images. The transfer function of CCD cameras determined the grayscale in the given point of the micrograph through the intensity of the incident wave has also monotonic character. Only the presence of diffraction contrast in the images breaks the monotonic dependence. Thickness of the spherical nanoparticle in a point having (x,y)-coordinates can be expressed as t(x,y)=((d/2)2-(x-xc)2-(y-yc)2)^(1/2). During fitting, the uncertain coefficients gi, coordinates of the particle center (xc,yc), and the particle diameter d are computing. Our algorithm for particle recognition and measuring sizes is proposed and realized in the program ANN (Automatic Nanoparticle Numerator).

Our algorithm for particle recognition and measuring sizes out of thresholding approach is proposed and realized in the program ANN (Automatic Nanoparticle Numerator). The comparative study of distributions of silver nanoparticle synthesized in different polymer-water solutions determined manually (about 1000 particles), using ImageJ and ANN was performed (Fig.1 and Fig.2). It shoved a good agreement between results obtained manually and with ANN.


Dmitry SHVEDCHENKO (Moscow, Russia), Elena SUVOROVA
08:00 - 18:15 #6155 - MS00-528 In-situ and cryogenic electron microscopic study of genesis and dynamics of cobalt nanoparticle formation.
MS00-528 In-situ and cryogenic electron microscopic study of genesis and dynamics of cobalt nanoparticle formation.

Cobalt nanoparticles have a high potential as catalysts for the Fischer-Tropsch synthesis, i.e. to convert hydrogen and carbon monoxide, which can be derived from a variety of renewable feedstocks, into industrially useful hydrocarbons. The cobalt nanoparticles are commonly created via a deposition precipitation (DP) process In the DP process, catalyst supports such as silica and titania are suspended in solutions of cobalt precursor salts, which upon increasing/decreasing the pH precipitated a cobalt intermediates e.g. cobalt hydroxides and cobalt carbonates on the liquid-solid interface.  At present how and where the precursor salts in solution are nucleated and how they crystallize as cobalt intermediates is still unknown. In this contribution  the morphological and structural development of the cobalt intermediates with and without support materials during the DP process has been investigated using advanced cryo-EM and in situ liquid cell TEM.

First, cryo-TEM was employed to study Co nanoparticle formation during an decreasing pH induced by out-gassing ammonia from the synthesis solution. At the early stage of the nucleation and growth, particles with a diameter of 1 to 2 nm were found. It is difficult to image these 1~ 2 nm particles through a 100 to 200 nm thick vitrified ice layer due to significant scattering of electrons in the embedding medium. Hence, we vitrified our sample on graphene oxide (GOx) supports which cover a normal TEM holy grid (figure 1a). Because of the very low background and high hydrophilicity of GOx, we generate ultra-thin aqueous layers for high contrast  cryo-TEM imaging (figure 1b). In addition, the presence of GOx makes it possible to focus more accurately to acquire high contrast and resolution cryo images at only a few hundred nanometers of defocus.

Second, liquid cell TEM was employed to study in-situ particle formation by exposing a solution of Co2+ ions to the vapor -NH3 and CO2. Here Co(NO3)2 solution is flown through the liquid cell to fill the system, after which wet N2 is then flown in to remove the Co(NO3)2 solution in the tube (fig 2a, 2b). Because the chips are cleaned by O2 plasma before mounting, the surface of two chips is highly hydrophilic. So that liquid between the two chips is not removed by the wet N2. This way a thin liquid layer containing Co2+ ions is generated between two chips (fig 2b). Subsequently, a syringe containing (NH4)2COpowder is connected to the other port and NH3 and CO2 vapor is released from the decomposition of solid (NH4)2CO3 (figure 2c). In this way, we could generate a thin liquid layer with a thickness of 250 ~ 600 nm in the center in a repeatable manner (figure 3), making the edge of viewing area to be good position for (S)TEM imaging of particle nucleation and growth.

 

Acknowledgements: the authors would like to thank Shell Global Solutions, Netherlands Organization for Scientific Research (NWO) and Eindhoven University of Technology for financial support.


Hao SU (Eindhoven, The Netherlands), Paul BOMANS, Heiner FRIEDRICH, Nico SOMMERDIJK
08:00 - 18:15 #6171 - MS00-530 Self-assembled Supraparticles by Spherical Confinement.
MS00-530 Self-assembled Supraparticles by Spherical Confinement.

Colloidal supraparticles [1,2] which are assembled from size- and morphology- controlled nanoparticles, combine multi scale properties of the single particles such as quantum confinement and localized plasmon resonances with collective effects resulting from being arranged in near proximity on a 3D lattice. In addition, properties on longer length scales, e.g. photonic, are affected by the supraparticle size and its effective refractive index [3] and additionally can be controlled by a subsequent self-assembly step. One way to realize such colloidal supraparticles is by suspending nanocrystals in emulsion droplets of a low boiling point solvent in water and slowly evaporating the solvent [3,4] (or vice versa for particles dispersible in a polar solvent). In this way the nanocrystals are forced to self-assemble into supraballs and surprises already were found in the structure of hard spherical particles crystallized in a spherical confinement where icosahedral crystals were found for supraparticles containing several thousands of spheres or less [4]. By tuning the concentrations and types of nanocrystals, supraballs and differently shaped supraparticles with different structures and sizes can be obtained.

The goal of this research is to extend the spherical confinement method to binary particles systems and anisotropic particles systems. For instance, spherical 8 nm sized (including stabilizer) PbSe nanocrystals and 10 nm PbSe nanocrystals were used to synthesize binary crystalline supraballs with a bulk AB2 binary colloidal crystal phase [5]. We further found 17.5 nm sized Ag/10.7 nm sized Fe3O4 and 8 nm PbSe/11 nm Au binary systems will self-assemble into Janus/patchy shape binary supraballs (where segregation into the two pure components was found) or core-shell binary supraballs where one of the components ends exclusively in a shell on the outside, respectively. From computer simulations between hard particles we infer that the core-shell morphology is most likely caused by the presence of attractions, but this preliminary conclusion needs further study. EuF3 round platelets nanocrystals were also found to self-assemble into highly ordered supraballs with a liquid-crystal-like interior structure. In addition, crystalline supraparticles were successfully assembled by using rounded edged FeO/CoFe2O4 nanocubes as building blocks. After freeze drying, the structure of the supraballs was studied with high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) tomography and secondary electron scanning transmission electron microscopy (SE-STEM). By coating the supraballs with a thin (~50 nm) layer of (meso)porous or non-porous silica, the particles become more robust and do not deform by drying on a substrate. To study how the structure of the more complex supraballs is affected by the spherical confinement, work is in progress by advanced electron microscopy [6,7] and 3D particle fitting techniques [8,9]

[1] T. Wang et al. Chemical Society Reviews 42, 2804-2823 (2013).

[2] Z. Lu et al. Chemical Society Reviews 41, 6874-6887 (2012).

[3] D. Vanmaekelbergh et al. ACS Nano 9, 3942-3950 (2015).

[4] B. de Nijs et al. Nature Materials 14, 56-60 (2015).

[5] A. Dong et al. Nature 466, 474-477 (2010).

[6] H. Friedrich et al. Nano Letters 9, 2719-2724 (2009).

[7] S. Bals et al. Angewandte Chemie Int. Ed. 53, 10600-10610 (2014).

[8] D. Zanaga et al. Nanoscale 8, 292-299 (2015).

[9] T. H. Besseling et al. Journal of Physics: Condensed Matter 27, 194109 (2015).


Da WANG, Bart DE NIJS, Nick TASIOS, Simone DUSSI, Frank SMALLENBURG, Laura FILION, Yang LIU (Utrecht, The Netherlands), Thomas ALTANTZIS, Daniele ZANAGA, Yaoting WU, Stan NAJMR, E. Ashley GAULDING, Johannes D. MEELDIJK, Dirk GROENENDIJK, Christopher B. MURRAY, Sara BALS, Marijn A. VAN HUIS, Arnout IMHOF, Marjolein DIJKSTRA, Alfons VAN BLAADEREN
08:00 - 18:15 #4556 - MS01-532 HREM observation and elucidation of edge-bonding MoS2 on {101}-facet exposing surface of anatase TiO2 support.
MS01-532 HREM observation and elucidation of edge-bonding MoS2 on {101}-facet exposing surface of anatase TiO2 support.

An urgent demand for clean fraction oil makes a great pressure on the hydrotreating (HDT) technology due to progressively stringent environmental regulations.  Conventional HDT catalysts supported g-Al2O3 has been used for near 100 years. An alternative of taking anatase-type TiO2 (A-TiO2) as support other than g-Al2O3 could greatly improve the performance of the catalyst. The superior performance of Mo/TiO2 originates from the increasing of type II active sites numbers because of the presence of new MoS2-TiO2 interaction in an edge-bondingway3. However, the interaction was never reported from specific crystallography. The sulfidation process of Mo/TiO2 catalyst could be partly regarded as epitaxial growth of MoS2 on TiO2 support. And thus, the crystallographic orientation relationship (OR) between MoS2 and TiO2 is very important for understanding the active sites of the catalyst.

The TiO2 support was obtained by pressing anatase TiO2 powder, synthesized by hydrothermal method, into disc under 5 MPa pressure and breaking up into 20~40 mesh grains. Mo/TiO2 (10wt%) was synthesized by impregnating ammonium molybdate solution onto TiO2 support followed by dryness and calcination. Sulfiding experiments were carried out on a fixed-bed micro-reactor at 350°C under 10%H2S/H2 atmosphere. The catalysts were observed by HREM on a JEOL 2200FS microscope operated at 200kV.

HREM image in Figure 1A shows the interface relationship between MoS2 and TiO2 in sulfided Mo/TiO2 catalyst. MoS2 slab is anchored on (101) facet-exposing surface of A-TiO2 in edge-bonding way. The angle between (001)MoS2 and (101) A-TiO2 is 66°. The interface relationship could be elucidated by Coincidence Reciprocal Lattice Points (CRLP)4 theory, expressed by a scheme in Figure 2. The intersecting volume function of reciprocal lattice points of two crystals (hexagonal MoS2 and tetrahedral TiO2 shown in Figure 3A) could be computed from home-made program. The OR of two crystals at the initial orientation is (001)MoS2//(001)A-TiO2 and [100]MoS2//[100] A-TiO2 (Figure 3B).The intersecting volume function V(a,b) is computed and plotted versus a and b angle. Figure 3C shows the corresponding 3D drawing. The same peak value presents at (0,15), (0,45) and (0,75) points, which reflects optimum OR presents at the orientations. At initial orientation, the deduced angle between (001)MoS2 and (101) A-TiO2 is 68 degree. At (0,15), (0,45) and (0,75) orientation, the values are 83°, 66°and 36°, respectively. The 66° angle between (001)MoS2 and (101) A-TiO2 at (0, 45) is highly consistent with that value observed by HREM. As a result, the conclusion could be drawn that CRLP theory could well predict interface relationship in MoS2/TiO2 HDT catalyst.

Acknowledgement
We thank the financial support of SINOPEC Project (115048)

References

1.M.Signorile, A. Damin, A. Budnyk, et al. J. cata. 2015, 328:225-235.

2. Edisson Morgado Jr,Jose′L. Zotin,Marco A.S. de Abreu,et al. Appl. Catal: A Gen. 2009,357 : 142–149.

3. SakashitaY, Araki Y,Honna k,et al. Appl. Catal, 1993, 105:69-75.

4. Susanne Stemmer, Pirouz Pirouz, Yuichi Ikuhara et al.Phy. Rev. Lett.,1996,77(9):1797-1800.

 


Changyou GUO (Fushun, China), Zhiqi SHEN, Shaojun WANG, Fengxiang LING
08:00 - 18:15 #4557 - MS01-534 Influence of Hydrogenation on Microstructure of Ti3Al Alloy.
MS01-534 Influence of Hydrogenation on Microstructure of Ti3Al Alloy.

The hydrogenation technology with different parameters of Ti3Al alloy was studied in this paper, and the effect of hydrogen on microstructure of Ti3Al alloy was analyzied. The results showed that the higher the hydrogenation temperature and the larger specific surface area of sample, the hydrogen content of Ti3Al alloy increased. With hydrogen content increasing, the proportion of α2 phase diminishes greatly and disappears finally, B2 phase laths become narrow and the O phase laths become wider. When the hydrogen content reached 0.3wt%, the plate-like hydrides, ε phase, precipitated from O phase, and with increasing hydrogen content the plate-like hydrides grew and the dislocation density inreased. The orientation relationship between ε phase and O phase possibly exists as following : [111][212]Oε,(101)(223)Oε. The results of hot compression test showed that the reduction of peak stress of Ti3Al alloy could be attributed to the hydrogen. In addition, the hydrogen may accelerate the dynamic recrystallization and dynamic recovery process of Ti3Al alloy during the deformation.


Qing WANG (HARBIN, China), Qiongyang ZHAO, Yueqi SUN, Dongli SUN
08:00 - 18:15 #4590 - MS01-536 The study on interface structure of SiC/Ti joint diffusion bonded under pulse electric field.
MS01-536 The study on interface structure of SiC/Ti joint diffusion bonded under pulse electric field.

The pulse electric field applied during the diffusion bonding process can impact the diffusion of the atoms and defects in materials and improve the structure and properties. The diffusion bonding process, interface structure and mechanical properties of SiC/Ti joint bonded under pulse electric field have been studied. The results show that the interface reaction layer thickness increases with increasing the pulse amplitude and the duty ratio, whereas it is effected barely by the pulse frequency. The shear strength of SiC/Ti joint increases firstly and then decreases with increasing the pulse amplitude, duty ratio, pulse frequency, that is, there is an optimum value of shear strength. At low pulse frequency, a small amount of TiC phase formed can reduce the residual stress at the interface between SiC and Ti. When the pulse frequency or amplitude is too high, some large TiC particles were produced near the interface, and they induced the micro-cracks at the interface, so the joint performance was deteriorative. The TEM analysis of SiC/Ti diffusion bonding interface reveals that from SiC to Ti side, the interface structure is SiC/fine grain region(phase structure unknown)/ (TiC + Ti5Si3) / TiC / Ti.


Dongli SUN (Harbin, China)
08:00 - 18:15 #4600 - MS01-538 Ferromagnetic Nanocrystalline Coatings over Steel trough Laser Cladding of Fe and Ni-based Glass Former Alloys.
MS01-538 Ferromagnetic Nanocrystalline Coatings over Steel trough Laser Cladding of Fe and Ni-based Glass Former Alloys.

Fe-based bulk glassy alloy properties indicates that coatings can represent good applications opportunities for metallic glasses. The Fe72Nb4Si10B14 (at%) bulk metallic glassy (BMG) alloy in order to produce coatings over AISI 1020 mild steel substrate using spray forming and laser cladding processing routes. For the spray forming process an additional Ni brazing alloy was applied on the substrate before the deposition to improve adhesion. For the laser cladding process, different laser parameters, power (W) and scanning speed (mm/s), were tested, using a Yb fiber laser (up to 2kW), to verified the best condition for to obtained the coatings [1]. The coatings was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and differential scanning calorimetry (DCS). The Fe72Nb4Si10B14 and Ni59Nb35Sn6 (at%) coatings obtained by spray forming presented high fraction of amorphous phase when produced with thickness up to 1 mm), some porosity and low oxidation level. XRD analysis showed Fe-α, Fe23B6 and halo of amorphous phase, depending on thickness. In addition, these coatings presenting partial or complete glassy structure with high hardness around 1150 HV. The amorphous overspray powder of the BMG alloy obtained by spray forming, grain size < 45 µm, was used in order to produce coatings on AISI 1020 mild steel substrate by laser cladding of the pre-placed powder. SEM micrographs of the clad tracks showed that at 200 W and 100 mm/s, no crystalline phases were observed, indicating maintenance of glassy phase due to high glass forming ability (GFA) of this alloy. XRD analysis showed only halo of amorphous phases in this condition. Moreover, for higher powers and same scanning speed, the diffractograms showed halo of amorphous phases and the Fe-α and FeNbB crystalline phases. The coatings showed hardness ranging from 340-1180HV, depending on laser parameters. These results suggesting that processing routes are promising to fabricate coatings for industrial applications.


Conrado Ramos Moreira AFONSO (São Carlos - SP, Brazil), Marcos Fernandes DE CARVALHO, Fausto Lopes CATTO, Walter José BOTTA FILHO, Claudio Shyinti KIMINAMI
08:00 - 18:15 #4639 - MS01-540 Microstructural evolution and thermal stability of nitride-based metal/semiconductor superlattices for thermoelectric and hard-coating applications.
MS01-540 Microstructural evolution and thermal stability of nitride-based metal/semiconductor superlattices for thermoelectric and hard-coating applications.

A detailed analysis on the quality and microstructure of various metal/semiconductor superlattices employing HR(S)/TEM (high-resolution (scanning)/transmission electron microscopy) imaging and energy dispersive x-ray spectroscopy (EDX) mapping on as-deposited and annealed samples is presented.

Epitaxial metal/semiconductor superlattices are known to be promising candidates for compounds in electronic, photonic, and plasmonic devices, but are also of interest for applications as hard coatings, and in thermoelectric materials [1]. The crystalline quality of the superlattices, in terms of their defect density, phase purity, interface roughness, and stoichiometry of the individual layers, plays a crucial role with respect to the physical properties and thus the applicability of such superlattice stacks. It was recently shown that metal/semiconductor superlattices based on (Al,Sc)N as the semiconductor component can be grown epitaxially with low-defect densities by magnetron sputtering on [001]MgO substrates [2].

Phase formation and thermal stability studies of as-deposited and long-time annealed cubic TiN/(Al,Sc)N superlattices employing a combination of HR(S)/TEM and EDX mapping revealed intermixing of the TiN and (Al,Sc)N layers by interdiffusion of the metal atoms with increased annealing time [3].

Improved (Ti,W)N/(Al,Sc)N [4] and (Hf,Zr)N/ScN [5] superlattices were grown by magnetron sputtering and analyzed with various TEM methods, and their microstructural evolution as well as thermal stability becomes presented here. An example is show in Figure 1, which shows an overview of an improved cubic (Ti,W)N/(Al,Sc)N superlattice stack in cross-section STEM (a), and a typical HRTEM micrograph of the metal/semiconductor interface region, demonstrating the high epitaxial quality of the growth [4].

Figure 2 demonstrates the superior thermal stability of the (Zr,Hf)N- based systems as compared to previous TiN- based superlattices. EDX mapping at high-resolution before and after annealing at 950 °C for 120 hours reveals diffusion of the metal atoms in the TiN/AlScN system (b), while the Hf0.5Zr0.5N/ScN superlattice stays intact (d).

All experiments were conducted at Linköping’s image- and probe-corrected and monochromated FEI Titan3 60-300 microscope equipped with a Gatan Quantum ERS GIF, high-brightness XFEG source, and Super-X EDX detector, operated at 300 kV [6].

 

References:

 

1. T. D. Sands, C.J. Palmstrøm, J.P. Harbison, V.G. Keramidas, N. Tabatabaie, T.L. Cheeks, Y. Silberberg, Stable and epitaxial Metal/III-V semiconductor heterostructures, Mater. Sci. Rep. 5: 98–170, 1990.

2. B. Saha, S. Saber, G.V. Naik, A. Boltasseva, E.A. Stach, E.P. Kvam, T.D. Sands, Development of epitaxial AlxSc1-xN for artificially structured metal/semiconductor superlattice metamaterials, Phys. Status Solidi B, 252, 2, 251-259, 2015.

3. J. L. Schroeder, B. Saha, M. Garbrecht, N. Schell, T. D. Sands, and J. Birch, Thermal stability of epitaxial cubic-TiN/(Al,Sc)N metal/semiconductor superlattices, J. of Mater. Sci., 50: 3200-3206, (2015).

4. B. Saha, Y. R. Koh, J. Comparan,  S. Sadasivam, J. L. Schroeder, M.  Garbrecht, J. Birch, D. Cahill, T. Fisher, A. Shakouri, and T. D. Sands, Cross-plane thermal conductivity of (Ti,W)N/(Al,Sc)N metal/semiconductor superlattices, Phys. Rev. B, 93, 045311, 2016.

5. M. Garbrecht, J. L. Schroeder,L. Hultman, J. Birch, T. D. Sands, and B. Saha, Microstructural evolution and thermal stability of ZrxHf1-xN/ScN (x = 0, 0.5, 1) metal/semiconductor superlattices. submitted, 2016.

6. We acknowledge the Knut and Alice Wallenberg (KAW) Foundation for the Electron Microscope Laboratory in Linköping.


Magnus GARBRECHT (Linköping, Sweden), Jeremy L. SCHROEDER, Lars HULTMAN, Jens BIRCH, Timothy D. SANDS, Bivas SAHA
08:00 - 18:15 #4866 - MS01-542 Diamond-hexagonal silicon ribbons in silicon fins.
MS01-542 Diamond-hexagonal silicon ribbons in silicon fins.

The formation of diamond-hexagonal silicon [1-3] or Ge [4] is recently reported under different experimental conditions.  The dh-phase has potential for application in optoelectronic devices.  A transformation of diamond-cubic (dc) to diamond-hexagonal (dh) Si can occur during the wet oxidation treatment applied to densify the oxide fillings between silicon fins in nano-electronic devices [3]. The phase change is induced by the compressive stress due to the expanding oxide. A similar transformation is reported in Ge nanowires [4] under non-oxidizing conditions and related to tensile stress of the shrinking oxide filling. 

In the finfet structures, the transformation occurs at the base of the outer fins where the lateral stress is the largest and unbalanced between the wide and narrow oxide spacings (Fig. 1).  The outer fin moves outward and typically a step and bulge are formed at inner and outer side respectively.  In about half of the fins a thin dh-Si ribbon is formed across the full or partial width of the fin.  In the other cases only steps/bulges are present with defect-free dc-silicon in between.

To increase the volume of the dh-Si, in this work the oxidation time is doubled compared to the conditions in [3].  The phase transformation is investigated by high resolution HAADF-STEM at 120 kV in order to minimize the beam damage during the observations.  The longer treatment results in larger steps/bulges (Fig. 1b vs 1a). They are also formed for fins with larger spacings which are not modified in case of the standard oxidation time.  The average thickness of the dh-Si in the outer fins increases by a factor 2-3 while the transformed material in the outer fins generally becomes a mixture of several Si-polytypes (Fig. 2b).  Additionally the transformation also occurs in the second outer fins with thinner transformed slabs that are pure dh-Si phase (Fig. 2a).  The dh-Si is epitaxial to the silicon substrate with its c-axis horizontally across the fins i.e. (110)dc//(0001)dh and [-110]dc//[2-1-10]dhBoth (001)dc-Si and (115)dc-Si interfaces are present which are characterized by stepped (Fig. 3a) and flat (Fig. 3b) interfaces.  In the latter case the dh-lattice is ~4º rotated. The doubling of the oxidation time does not result in further consumption of the silicon on the fin sidewalls (Fig. 1), i.e. the oxidation rate is reduced by the stress which is therefore also not further increasing. The continued transformation of dc to dh-phase during the prolonged oxidation is therefore a time related phenomenon and indicates a relatively slow process.  Stress-retarded oxidation of Si sidewalls is previously reported in [5].  Although dh-Si is a metastable phase, once present, it remains stable during subsequent high temperature treatments even up to 1050ºC.  As the dh-Si is situated at the base of the fins it does not affect the transistor structures.

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Yang QIU, Hugo BENDER (Leuven, Belgium), Els VAN BESIEN, Min-Soo KIM, Olivier RICHARD, Wilfried VANDERVORST
08:00 - 18:15 #5004 - MS01-544 Transmission electron microscopy investigation of Mg-Zn alloy processed by severe plastic deformation.
MS01-544 Transmission electron microscopy investigation of Mg-Zn alloy processed by severe plastic deformation.

Magnesium alloys possess great potential owing to advantageous properties in various fields such as structural applications, electronic devices or hydrogen and thermal energy storage. Use of Mg alloys for biomedical implants also attracted enormous attention recently. Properties of Mg and its alloys can be significantly improved via design of alloys with precipitation hardening effect and grain refinement using severe plastic deformation (SPD) techniques. Mg-Zn based alloys are among the most important Mg alloys and have been investigated for more than a hundred years. With a most recent development of various SPD techniques, there is a number of processing routes which may significantly improve the alloys properties. However, fundamental knowledge about an impact of SPD on microstructure of these alloys at nanoscale is insufficient or missing in many cases.
In this work, deformation behaviour of an α-Mg matrix and Mg-Zn intermetallic particles in the Mg-12wt.% Zn alloy subjected to equal-channel angular pressing with applied back pressure (ECAP-BP) is characterized using transmission electron microscopy (TEM) techniques at nanoscale. Magnesium with 99.9% purity and an appropriate amount of high-grade Zinc were melted in a graphite crucible under an Ar atmosphere. The subsequent thermal treatment consisted of annealing at 320°C for 20 hours and quenching into warm water. The material was then processed by ECAP (4 passes via Bc route) with applied BP of ~400 MPa to prevent cracking during processing. The processing temperature was gradually decreasing from 200 °C to 185 °C, 170 °C and 155 °C for 1st, 2nd, 3rd and 4th ECAP-BP pass, respectively, to obtain ultra-fine grained structure.
Following TEM techniques are employed for micro- and nano- structural analysis: Bright-field (BF) imaging; selected area electron diffraction (SAED); high-resolution transmission electron microscopy (HRTEM); high-angle annular dark field - scanning transmission electron microscopy (HAADF-STEM) imaging; and electron energy-loss spectroscopy (EELS). All techniques were performed using an FEI Tecnai TF20 X-twin, which operated at 200 kV.

Acknowledgements

Financial support offered by CVUT SGS16/151/OHK3/2T/13 and GACR GBP108/12/G043 is greatly appreciated.


Martin NĚMEC (Prague 6, Czech Republic), Viera GÄRTNEROVÁ
08:00 - 18:15 #5020 - MS01-546 HRTEM investigation of dislocation/hydrogen interaction mechanisms in hydrided nanocrystalline palladium films.
MS01-546 HRTEM investigation of dislocation/hydrogen interaction mechanisms in hydrided nanocrystalline palladium films.

Thin Pd membranes constitute an enabling material in hydrogen permeation and sensing applications. During hydriding of Pd, as long as the H/Pd (atomic ratio) stays below αSSmax≈0.02, the α-Pd with face centered cubic (fcc) lattice will expand from 3.889 Å to 3.895 Å. When the ratio reaches 0.02 a β-phase, again fcc based, having a lattice constant near 4.025 Å appears. The initial volume of the Pd structure thus expands by about 10% due to α→β phase transformation which induces a large plastic deformation within the material. In the present study, we have performed detailed HRTEM characterizations of defect/hydrogen interactions on nc Pd thin films hydrided at low and high pressures for α-phase and β-phase transformations, respectively. The in-situ measurement of the evolution of the internal stress during hydriding of the nc Pd films shows that this internal stress increases rapidly in the compressive direction, and gradually reaches a constant value of 120 MPa tensile stress for α-phase transformation and 920 MPa compressive stress for β-phase transformation which affect the microstructure of the Pd film.

Figures 1a and 1b show HRTEM images of ∑3 {111} coherent twin boundaries (TBs) in Pd films before and after hydriding to α-phase, respectively. In contrast with Pd films hydrated to β-phase (see below), intrinsic or extrinsic stacking faults (SFs), dissociation of incoherent TB to form 9R and distortion of CTBs have not been observed in Pd films after hydriding to α- phase (Figure 1c). Surprisingly, an fcc→9R phase transformation at Σ3 {112} incoherent TBs as well as a high density of SFs (Figure 2a) have been observed after hydriding to β-phase indicating a clear effect of hydrogen on the stacking fault energy (SFE) of Pd. Ab-initio calculations of the effect of hydrogen on the intrinsic stable and unstable SFEs of Pd confirm the experimental observations. The experimental results confirm that hydrogen induced plasticity is mainly controlled by dislocation activity at higher hydrogen pressures. Shear type faulted loops rarely reported in nc materials were also observed within the Pd grains after hydriding to β-phase (Figure 2b). In order to investigate the stability of this shear type loops, different internal stress fields originating from the neighboring dislocation (dislocation "d3") and surface effects (image forces) have been computed using a Finite Element method (Figure 2c). Such calculations confirm that high attractive forces exist between the dislocation “d2” and “d3” forming the dipole. On the other hand, although the Peach Koehler force on the dislocation “d1” tends to extend the SF, the force magnitude is much smaller than the force induced by the fault on the partial segments. Therefore, an extra shear stress of +385MPa (τdis.) acting on the glide plane of the dislocation “d1” is required in order to counter balance the attractive force of the SF which thus explains the stability of this dislocation in the TEM thin foil after dehydriding. This shear stress can not be compensated by the negligible image force in such a thin foil. Moreover, no residual hydrides were detected using high resolution EELS. Therefore, the stability of glissile intrinsic SF loops in nc Pd films after dehydriding can thus be attributed to the presence of large internal stress heterogeneities typical of nc materials. Since the 9R phase and SFs are unexpected at high SFE Pd and considered as unstable phases, the stability of these defects was also investigated using in-situ HRTEM heating experiments at different temperatures and the critical temperature for removing these unstable SFs in the hydrided Pd film was determined.


Behnam AMINAHMADI, Gunnar LUMBEECK, Hosni IDRISSI, Renaud DELMELLE, Marc FIVEL, Thomas PARDOEN, Joris PROOST, Dominique SCHRYVERS (Antwerpen, Belgium)
08:00 - 18:15 #5166 - MS01-548 SEM-TEM study of low carbon steel subjected to conventional and severe plastic deformation.
MS01-548 SEM-TEM study of low carbon steel subjected to conventional and severe plastic deformation.

It is well known that plastic deformation induced by different conventional metal forming methods can significantly increase the strength of a metal. This increase of strength, at the same time, is always accompanied by a loss of ductility. However, a better combination of high strength and ductility can be obtained by severe plastic deformation (SPD) [1].

In the present work, both methods of plastic deformation are concerned. One is the Rastegaev upsetting method (conventional method) where cylindrical samples of Ø20x20 mm were compressed between parallel plates with imposed plastic strain  φR=0.4; 0.8; 1.2; 1.6; 1.91 (~2.0). The other is the discontinuous SPD method, which our lab developed, for upsetting square shaped billet by V-shape dies. In fact, the V-shape dies compression is a multistage process in which the sample is removed from the die after the first compression turn, rotated for 90° in an anti-clockwise direction, and then is returned into the dies [2]. The samples of 14x14x70 mm were compressed in eighteen turns with imposed strain from φSPD1=0.39 up to φSPD18=3.38. Maximum plastic strain of the conventional upsetting method (φR=1.91) is achieved after 4 turns in case of a discontinuous SPD method (φSPD4=2). The experimental compression tests for both of the methods were done on a hydraulic press using a normalized low carbon rod steel C15E with 0.14%C. The influence of the processing parameters on the microstructure was evaluated by SEM (JEOL JSM-6460LV) and by TEM (FEI Tecnai F20). The TEM sample (cross-sections) were prepared by FIB (Quanta 3D FEG) and in situ lift-out technique.

Fig. 1 shows the starting SEM microstructure of the undeformed low carbon steel C15E in a longitudinal and transversal direction. The microstructure consists of 85% ferrite and 15% pearlite. The starting average grain size of the ferrite was 19.1 µm. After upsetting by the Rastegaev method the microstructure is highly deformed in the direction normal to the applied compression, Fig. 2a. The deformation is a homogeneous trough the sample. On the other hand, during SPD the microstructure is deformed only in the central part of the sample (Fig. 2b), while in the region further from the center (about 6 mm) the deformation appearance of the microstructure is hardly visible. Furthermore, while the effective plastic strain is similar for both upsetting methods (Rastegaev φR=1.91 and SPD φSPD4=2) the microstructure of the SPD samples appears less deformed when compared to the Rastegaev sample. However, the TEM observation of the SPD samples reveals that the microstructure consists of elongated ferrite sub-grains having a width 0.2-0.3 µm, Fig. 3. The band boundaries are mostly in the low-angle misorientation and in the bands an interior dislocation cell boundaries are present. Additionally, beside a low-angle boundaries, the formation of grains with the high-angle boundaries could be noticed (indicated with arrows in Fig. 3). The presence of the newly formed equiaxed grains is confirmed by the diffraction ring pattern.

References:

[1] R. Z. Valiev, R.K. Islamgaliev, I.V. Alexandrov, Progr. Mat. Sci., 45, (2000), 103-189

[2] M. Vilotic, Doctoral thesis, University of Novi Sad, (2015)


Marko VILOTIC, Leposava SIDJANIN, Dragan RAJNOVIC (Novi Sad, Serbia), Milorad NOVOVIC
08:00 - 18:15 #5169 - MS01-550 Microstructure and fracture mode of ballistic perforated plates made of unalloyed ADI material.
MS01-550 Microstructure and fracture mode of ballistic perforated plates made of unalloyed ADI material.

Austempered Ductile Iron (ADI) is an advance engineering material produced from ductile cast iron by austempering heat treatment, through which a unique microstructure - ausferrite is obtained. Consequently, an excellent combination of mechanical properties could be achieved [1]. In this paper, ADI material has been evaluated as an alternative to steel for perforated plates applied in the ballistic protection of military vehicles [2].

The ADI materials were produced from an unalloyed ductile iron by austenitization at 900°C/2h, followed by 1 hour austempering at 275°C (ADI-275) or 400°C (ADI 400). The microstructure was observed on Leitz Orthoplan light microscope while fracture mode was studied by SEM JEOL JSM-6460LV, 20 kV equipped with EDS Oxford Instruments INCA system. To evaluate ballistic properties, perforated plates of the ADI materials, having thicknesses of 7 and 9 mm, were mounted in front of basic armour and 12.7x99 mm M8 API ammunition was fired from 100 m.

The microstructure of the ADI-275 and ADI-400 was fully ausferritic consisting of a mixture of ausferritic ferrite and retained austenite (9.8 and 26%, respectively). The ADI‑275 has an acicular morphology of ausferrite, while the ADI-400 had a more plate like morphology. Due to difference in ausferrite morphology and retained austenite amount the ADI-275 posses higher strength while ADI-400 is more ductile. After impact, intensive cracking occurs near the impact point, Fig. 1a and 2a. The size of the fractured fragments is considerably larger in the less ductile ADI-275, while ADI-400 is more plastically deformed. The microstructure after impact is shown in Fig. 1b and 2b. In ADI-400 martensite occurs in the area of the intensive plastic deformation, Fig. 2b. The martensite is formed through SITRAM effect (Strain Induced Transformation) [3]. In contrast, the SITRAM does not occur in ADI-275, where austenite carbon enrichment is higher, Fig 1b. The ADI-275 have a typical ductile fracture, with the dimpled surface covered with a layer in the form of drops, Fig. 1c. However, in ADI-400 a mixed fracture mode can be observed, a ductile fracture near the nodules and in other areas brittle, quasi – cleavage fracture, Fig. 2c. This brittle behaviour of ADI-400 is the result of the presence of martensite. The results of debris EDX analysis reveal a mixture of Cu, Ba, Mg and Al, i.e. material of the projectile jacket and products of the IM-11 incendiary mixture, Fig. 3.

Perforated plate made of the ADI-275, with a higher hardness and a lower ductility, were proved to be superior to the softer and more ductile ADI-400. The ballistic testing causes a SITRAM effect to occur in the ADI-400, causing a partial brittle fracture and thus lowering ballistic performance [4]. The perforated plates made of the ADI material have a larger damaged area, a lower cost of fabrication and a similar mass effectiveness than steel perforated plates [2, 4].

Acknowledgments:

The authors gratefully acknowledge research funding from the Ministry of Education, Science and Technological Development of the Republic of Serbia under grant number TR34015.

References:

[1] L. Sidjanin, D. Rajnovic, O. Eric, R.E. Smallman, Mater Sci Tech-Lond, 26/5, (2010), 567-571

[2] S. Balos, V. Grabulov, L. Sidjanin, M. Pantic, I. Radisavljevic, Mater Design, 31, (2010), 2916-2924

[3] J.L. Garin, R.L. Mannheim, J. Mater. Process. Tech, 143-144, (2003), 347–351

[4] S. Balos, I. Radisavljevic, D. Rajnovic, M. Dramicanin, S. Tabakovic, O. Eric-Cekic, L. Sidjanin, Mater Design, 83, (2015), 66-74


Dragan RAJNOVIC (Novi Sad, Serbia), Sebastian BALOS, Petar JANJATOVIC, Miroslav DRAMICANIN, Danka LABUS ZLATANOVIC, Olivera ERIC CEKIC, Leposava SIDJANIN
08:00 - 18:15 #5180 - MS01-552 The microstructure influence on abrasive wear behaviour of ductile irons.
MS01-552 The microstructure influence on abrasive wear behaviour of ductile irons.

In this paper, the wear rate of ferritic and pearlitic ductile iron, as well as three unalloyed ADI (Austempered Ductile Iron) materials with different ausferritic microstructure morphologies, was studied. Due to excellent combination of properties, the ductile irons and the ADIs are used for a number of applications, some of them relating to equipment exposed to abrasive wear in mining and agricultural industries.

The metal matrix microstructure of un-alloyed ductile iron (DI-F) was fully ferritic (Fig. 1a), while alloyed ductile iron (DI-P), as result of alloying with of Cu and Ni, had fully pearlitic microstructure (Fig. 1b). The ADI materials were obtained by austempering of unalloyed ductile iron at 300, 350 or 400°C for 1 hour (ADI-300, ADI-350, ADI-400, respectively). The microstructure of all ADI materials was fully ausferritic with 16, 24.9 and 31.4% of retained austenite. The ausferrite morphology changes from needle-like (acicular) at lower austempering temperatures to a more plate-like (feathery) at higher temperatures. Furthermore, due to microstructure the hardness of ADI-300 was highest, while ADI-400 was lowest. In order to determine an abrasive wear behaviour, the pin on disc wear tests were performed by SiC grinding paper with grit size P240, P500 and P800, and under 0.5, 1.3 and 2 kg loads. For microstructural characterization a “Leitz-Orthoplan” metallographic microscope was used.

After the wear test, in all cases, larger or smaller degree of plastic flow and tongue formation i.e. metal overlapping nodules is observed, Fig. 1c. As graphite nodules are very soft, they are easily covered by plastically deform material. The microstructure of ADI-300 and ADI-350 has not change after wear test, Fig 2a,b. In the case of the ADI-400 after wear testing at 2 kg loading and P240 grit paper a martensite is present in the microstructure, Fig 2c. The martensite was formed as a result of local pressure induced by the coarsest grit abrasive particles and maximal loading through stress assisted phase transformation (SATRAM) [2]. The results of wear rate represented by average weight loss of different material tested, as a function of grinding paper grit and loading are shown in Fig. 3a-c. The highest wear rate was obtained with the ferrite ductile iron (DI-F), while the lowest was for hardest ADI-300. However, ADI-400, in case when martensite form, exhibits better wear resistance.

It was found that the wear resistance primarily depends on materials’ microstructure, corresponding hardness and transformation during wear. In case of ADI materials, the SATRAM phenomenon play a major role in wear behaviour. However, the SATRAM phenomenon occurs only if appropriate conditions are fulfilled, namely: presence of metastable, low carbon-enriched, retained austenite; and local pressure on the metal matrix is sufficient, i.e. the SATRAM was detected only for ADI-400 at loads of 1.3 and 2 kg and at the coarsest abrasive grain size (P240). As a consequence, the wear rate of ADI austmpered at 400°C (the softest ADI tested) is equivalent to ADI austempered at 300°C (the hardest) [3].

Acknowledgment:

The authors gratefully acknowledge research funding from The Ministry of Education, Science and Technological Development of The Republic of Serbia under grant number TR34015.    

References:

[1] L. Sidjanin, D. Rajnovic, O. Eric and R. E. Smallman, Mater. Sci. Tech.-Lond., 26/5, (2010), 567-571

[2] C.Z. Wu, Y.J. Chen and T.S. Shih, Mater. Charact. 48, (2002) 43–54

[3] S. Balos, D. Rajnovic, M. Dramicanin, D. Labus, O. Eric-Cekic, J. Grbovic-Novakovic, L. Sidjanin, International Journal of Cast Metals Research, published online, doi: 10.1080/13640461.2015.1125982


Miroslav DRAMICANIN, Sebastian BALOS, Dragan RAJNOVIC (Novi Sad, Serbia), Danka LABUS ZLATANOVIC, Petar JANJATOVIC, Olivera ERIC CEKIC, Leposava SIDJANIN
08:00 - 18:15 #5182 - MS01-554 Superstructures In The Scheelite-Type Rare Earth Doped Tungstate Phases.
MS01-554 Superstructures In The Scheelite-Type Rare Earth Doped Tungstate Phases.

Introduction

The aim of the present work deals with the TEM study of scheelite related AWO4 compounds [1] showing modulated microstructures not revealed with synchrotron XRD investigations. These materials have potential applications in many fields such as photoluminescence, microwave, scintillator materials, humidity sensors and catalysis. Rare earth (RE) tungstate RE2(WO4)3 crystal phases are based on a cation-deficient superstructure of CaWO4. Cation substitution of RE are investigated in order to correlate the microstructure to physical properties especially for new potential applications in white-LEDs and lasers. In our study, a two-phase powder containing the monoclinic Ce2(WO4)3 and orthorhombic Ce10W22O81 structures [2], was obtained by complexing method using EDTA and citrate ions. In the latter phase, PED and HRTEM investigations showed a C2/c superspace group (SSG) doubling the smallest a cell parameter [3]. Additionally, another cerium tungstate structure substituted with strontium cations was also investigated revealing a (3+2)D incommensurately modulated structure.

 

Results

Ce10W22O81: polymorphism

ED patterns of highest symmetry (Fig. 1) showed reflection positions paired by a two-fold axis and indexed in the Pbnm SG (a = 3.6, b = 36 and c = 22.2 Å). A superposition of rows of weak reflections along [010] and present in the Fourier transforms obtained from HRTEM images, led to a doubling of the cell parameter a. With PED acquisitions, the superstructure reflections appeared linked together by an inversion center and were related to a C2/c SSG (Fig. 2). The structure was also identified from FFT analyzes of experimental HRTEM projections. The amplitude and phase error values were calculated using the symmetry rules of each plane group. The reconstructed density maps, after imposing the appropriate symmetry projections were used to extract reduced atomic coordinates of Ce atoms, WO5, WO6 and WO7 groups (Fig. 3). For similar structures, weak satellite reflections, were attributed to partial oxidation of RE elements, short-range order among the cations and slight changes in the oxygen positions [4-5]. Synthesized in air, the oxidization of Ce3+ precursor into Ce4+ limited to the grain surface, explains the contribution of both structures to the ED patterns.

Sr2+ substitution in Ce2(WO4)3: (3+2)D incommensurately modulated structure

ED patterns of Ce0.25Sr0.25WO4 along main zone axes were indexed in the scheelite tetragonal I41/a unit cell (as = bs = 5.44 Å and cs = 11.88 Å ≈ 2as). However, lower intensity reflections along [001] (Fig. 4), indicating a partially ordered distribution of vacancies and cations, needed the use of a supercell with 5 digit indices hk0mn corresponding to the diffraction wave vector H = ha* + kb* + lc* + mq1 + nq2, q1 ≈ 0.57a* + 0.80 b* and q2 ≈ -0.80a* + 0.57b* [6].

 

References

[1] Taoufyq, A.; Patout, L.; Guinneton, F.; Benlhachemi, A.; Bakiz, B.; Villain, S.; Lyoussi, A.; Nolibe, G. &

Gavarri J.-R. (2015). Journ. Of Mic. 00, 1-13

[2] Barker, R.S. & Radosavljevic Evans, I. (2008). Acta Cryst. B64, 708-712

[3] Patout, L.; Jacob, D. ; Arab, M. ; Pereira de Souza, C., & Leroux C. (2014). Acta Cryst., B70, 268–274

[4] Thompson, J. G.; Rae, A. D.; Bliznyuk, N. & Withers, R. L. (1999). J. Solid State Chem. 144,

240–246

[5] Marinder, B.-O. & Sundberg, M. (1984). Acta Cryst. C40, 1303–1306

[6] Arakcheeva, A. & Chapuis, G. (2008). Acta Cryst. B64, 12-25.


Loïc PATOUT (Marseille Cedex 20), Abdelali HALLAOUI, Aziz TAOUFYQ, Christian DOMINICI, Andrea PORTO CARREIRO CAMPOS, Claude ALFONSO, Ahmed CHARAI
08:00 - 18:15 #5216 - MS01-556 Study of strain fields induced by welding in nickel alloy 600 using in situ mechanical tensile test approach and standard EBSD.
MS01-556 Study of strain fields induced by welding in nickel alloy 600 using in situ mechanical tensile test approach and standard EBSD.

To evaluate the susceptibility to stress corrosion cracking (SCC) of stainless steel and nickel based alloy components, it is important to know the degree of plastic strain. Indeed, SCC is enhanced by the strain hardening induced by manufacturing and welding. We evaluate the residual plastic strain in a thick tube made of Ni-based alloy 600, generated by the welding operation with alloy 182 deposited metal. By using these data we can predict the crack growth rate and improve structural integrity assessments of components.

 

Hardness measurements or numerical stress analysis are usually applied to approximate plastic strain. Here, we use an innovative method by correlating deformation with mechanical characteristics from Electron Backscattered Diffraction (EBSD) [1] acquired during in-situ tensile test. We use a reference sample to calibrate and quantify the equivalent plastic deformation as a function of the average macroscopic deformation. Then, measurements are done on a sample after a welding operation and compared to the calibration data. The reference sample and the mock-up were manufactured with the same alloy 600. Tensile test specimen was prepared using Electrical Discharge Machining (EDM) and mechanical polishing to obtain an EBSD-quality finish. Micro-lithography was done to deposit markers on the surface.

In-situ experiment was done using a Tescan Mira 3 Scanning Electron Microscope (SEM) and a Micromecha tensile test machine allowing uniaxial loading at EBSD position.

Regarding [2], a preliminary work was done to optimize acquisition parameters and to check the statistical representativeness of the data (500 x 500 µm areas, step size = 250 nm). Data treatment consists in calculating for each point of the EBSD map the Kernel Average Misorientation (KAM). KAM gives local information about the plastic deformation [3]. In order to make the data quantitative, the KAM distribution is plotted. The shape of the distribution is very sensitive to the microstructure.

Results of the in-situ mechanical test are presented in figure 1. We found a logical and monotonic evolution of the misorientation distribution: the average, the position of the maximum and the width of the distribution are going up with the increase of the deformation (measured using markers), in accordance with [1]. We use those data to calibrate equivalent plastic deformation for the mock-up.

 

Fifteen measurements were performed on a weld mock-up with exactly the same SEM and EBSD acquisition parameters as used for the calibration experiment [2]. Location of the measurements were chosen in order to draw vertical and horizontal profiles regarding the welding interface.

We found least square fit method with a degree of freedom on the abscissa (up to 0,04°) as the best way to compare data from the mock-up and from the calibrated distributions. An example of a fit is given in figure 2. A map of the sample with the deduced values of equivalent plastic deformation is presented in figure 3.

 

From a material point of view, results show low levels of equivalent deformation. The maximum is 6,8%. Logical and monotonic decrease is observed going away from the front of the heat affected zone (HAZ, defined by the limit between large and small grains), the equivalent strain is 0 at 3 mm from the HAZ. Areas 4 mm away from the HAZ show an equivalent strain lower than the tensile test specimen in its initial state. This may be due to stress relief during heating by the welding operation, a problem of representativeness of the uniaxial tensile test compared to the welding operation or unexpected deformation of the reference test piece.

 

 

[1] Kamaya M. et al. (2015) Nucl. Eng. Des. 235, 173.

[2] Wright S. et al. (2011) Microsc. Microanal. 17, 316.

[3] Britton T. B. et al. (2010) Scripta Mater. 62, 639.


Julien STODOLNA (Moret sur Loing), Nicolas BRYNAERT, Thierry COUVANT
08:00 - 18:15 #5248 - MS01-558 Phase mapping of 2xxx-series aluminium alloys by scanning precession electron diffraction.
MS01-558 Phase mapping of 2xxx-series aluminium alloys by scanning precession electron diffraction.

2xxx-series Al alloys are Cu containing age-hardenable alloys, which are strengthened by numerous metastable precipitates formed during heat treatment. Many different precipitates exist, some of which are not well defined crystallographically. However, phases known to contribute particularly to strengthening and that exist in the over-aged condition are: θ’ and T1 in Al-Cu-Li alloys [1], and Ω and S in Al-Mg-Cu-Ag alloys [1]. These precipitates have various morphologies, ranging from long needles to thin plates, and coexist with inclusion particles as well as with dispersoids. The resulting microstructure is complex both in terms of coexistence and by precipitates deviating from simply defined phases. This makes complete characterization a demanding task for which techniques are required to enable statistical treatment of precipitate distributions in terms of their atomic structure. Here, we apply scanning precession electron diffraction (SPED) to heat-treated Al-Cu-Li and Al-Mg-Cu-Ag alloys, shedding light on the distribution of phases present and the complex interplay between these microstructural features.
    SPED involves scanning the electron beam across the specimen and recording a PED pattern at each point by rocking a focused probe in a hollow cone above the specimen, and de-rocking it below. In this way, integrated diffraction intensities are recorded in the geometry of a conventional electron diffraction pattern [2]. A 4D dataset is obtained comprising a 2D PED pattern at each position in the 2D scan region. Combined with subsequent data processing, this constitutes a powerful method for extracting valuable crystallographic information and orientation relationships in complex multiphase materials [3]. In this work, SPED was performed using a NanoMEGAS DigiSTAR scan generator fitted to a JEOL 2100F FEG-(S)TEM operated at 200 kV, with a precession angle of 1º and a step size of 4.5 nm. Typical datasets comprised 90 000 diffraction patterns (DPs), which were analysed using the open source platform HyperSpy [4] as described below.
    Obtained results from an Al-Cu-Li alloy are shown here as an example. All DPs in the SPED dataset were first summed (Fig. 1) and compared to a simulated DP, including the Al-matrix in the [001] orientation and the aforementioned θ’- and T1 precipitates (Fig. 2). This allowed identification of reflections associated with these particular phases. These phases are then visualised in ‘virtual dark-field’ (VDF) images, formed by plotting the intensity in pixels around selected reflections as a function of probe position (Fig. 3 and 4). For example, the thin T1-precipitate plates are seen on {111}Al planes inclined relative to [001]Al, and it is noted that even overlapping plates can still be discerned and visualized. The obtained VDF images exhibit a sharper, more consistent contrast between precipitate phases and the Al matrix as compared conventional imaging techniques, such as dark-field TEM. More sophisticated analysis applies machine learning in order to identify the main component patterns in the data, as well as their spatial localisation referred to as ‘loading maps’. These ‘loading maps’ look similar to VDF images but are obtained by an automated and objective approach, requiring little or no prior knowledge. This opens the possibility of identifying features with unexpected crystallographic structures. The analysis approaches demonstrated in this work offer important insight into the complex microstructures of these Al alloys.

[1] S.C. Wang and M. J. Starink, Int. Mater. Rev., 50:193-215, 2005. doi: 10.1179/174328005X14357
[2] R. Vincent and P.A. Midgley, Ultramicroscopy, 53:271-282, 1994. doi: 10.1016/0304-3991(94)90039-6
[3] P. Moeck et al, Cryst. Res. Technol., 46:589–606, 2011. doi: 10.1002/crat.201000676
[4] F. de la Peña et al, HyperSpy - 0.8.4, 2016. doi: 105231/zenodo.46897

RH and SW acknowledge funding from the Research Council of Norway 221714-FRINATEK. PAM and DNJ acknowledge the ERC 291522-3DIMAGE and an associateship from the Cambridge NanoDTC. The (S)TEM work was carried out on the NORTEM infrastructure at the TEM Gemini Centre, NTNU, Norway.


Jonas Kristoffer SUNDE (Trondheim, Norway), Sigurd WENNER, Antonius T.j. VAN HELVOORT, Duncan N. JOHNSTONE, Paul A. MIDGLEY, Randi HOLMESTAD
08:00 - 18:15 #5310 - MS01-562 Kinetics of precipitation in new generation of cobalt-based superalloys.
MS01-562 Kinetics of precipitation in new generation of cobalt-based superalloys.

Kinetics of precipitation in new generation of

cobalt-based superalloys

 

A. Azzam, T. Philippe, F. Danoix, A. Hauet, D. Blavette

Normandie Université, Groupe de Physique des Matériaux, UMR CNRS 6634,

Avenue de l’université BP 12, 76801 Saint Etienne du Rouvray, France

 

Keywords: Co-Al-W, Atom Probe Tomography, Transmission Electron Microscopy

Superalloys are key materials in aircraft engines and power generation systems. They are subjected to very high stress under temperatures in the range of 700-1000ᵒC. Currently Ni-based superalloys are the most widely used materials for high temperature applications. These alloys owe their excellent mechanical proprieties to their microstructure characterized by the presence of a high volume fraction (up to 70%) of thermodynamically stable,  coherent L12 ordered γ’ precipitates (Ni3Al or Ni3Nb type) embedded in a disordered fcc γ matrix. Compared to Ni based superalloys, conventional Co based alloys exhibit hot corrosion, oxidation and wear resistance but their applications are restricted to temperatures below 750ᵒC due to their instability at high temperatures.  In 2006 J. Sato et al. [1] discovered a new stable L12 ordered, Co3(Al,W) phase embedded in the disordered γ-Co solid-solution matrix. Mechanical properties (creep and plastic deformation, elastic property, structural stability) of Co-based alloy have been widely investigated but the precipitation process have been the subject of very few studies [2,3].

The aim of this work is to study precipitation kinetics in model CoAlW superalloys at the atomic scale. This work is focused on the kinetics transformation paths during precipitation. The temporal evolution of average size, volume fraction and number density of γ’ precipitates as well as that of phase composition has been studied as a function of aging time at 900°C employing three dimensional Atom Probe Tomography (APT). In addition Transmission and Scanning Electron Microscopy (TEM, SEM) have been used to complement APT studies. Different alloy compositions will be studied in this work, figures 1 and 2 show respectively bright field transmission electron micrographs of Co-9.7Al-10.8W (atomic %) alloy and dark field image of Co-9.1Al-7W alloy after annealing at 900°C for 10h. The microstructures reveal precipitates of cuboidal shape, respectively 100 nm (Fig 1) and 50 nm (Fig 2) in size, homogeneously distributed in the parent γ phase. The γ and γ'  phase compositions are major parameters controlling the properties of superalloys, that have been measured by APT. Figure 2 shows 3D reconstruction in the Co-7Al-9W aged at 900°C for 10h, showing γ' precipitates delineated by a 12 at.% W isoconcentration surface. Composition profile across γ/γ' interface reveals that W shows a very strong tendency to partition to the γ' phase unlike Al that exhibit a very weak tendency to partition between γ and γ' phases. The summation of Al content and W content in the γ’ phase is close to 25 atomic % that is to the expected stoichiometry of the γ' Co3(Al,W) ordered phase. It can this suggests that Al and W occupy preferentially the corner sites of the same sub-lattice in the ordered L12 structure. This presentation will come in more details on the temporal evolution of both the microstructure and phase composition.

References

[1] J. sato, T. Ohnuma, R. Kainuma, and K. Ishida, Science 2006, 312, p.90-91

[2] Peter J. Bocchini, Eric A. Lass, Kil-Won Moon, Maureen E. Williams, Carelyn E. Campbell, Ursula R. Kattner, David C. Dunand and David N. Seidman ., Scripta Materialia 2013, 68, p.563-566

[3] S. Meher, S. Nag, J. Tiley, A. Goel, Ultramicroscopy 2015, 148, p. 67-74


Ahmad AZZAM (Rouen), Didier BLAVETTE, Annie HAUET, Thomas PHILIPPE, Frederic DANOIX
08:00 - 18:15 #5330 - MS01-566 Interface formation between steels and alumina coatings in corrosive atmospheres.
MS01-566 Interface formation between steels and alumina coatings in corrosive atmospheres.

A way to increase application range and lifetime of metallic substrates is their protection by coatings. Here the effect of alumina coatings on common steel substrates having different Chromium content is examined. The background of the investigations is to expand the application possibilities of mechanically good steels to higher temperatures and corrosive atmospheres in the framework of the European project POEMA (“Production of Coatings for New Efficient and Clean Coal Power Plant Materials”) which was introduced to identify materials that can withstand the aggressive conditions arising during the oxyfuel process in modern coal power plants. This process is one possibility to reduce the CO2 emission by firing the coal in oxygen and recirculated flue gas.

Substrate materials were two steels of the POEMA project: P92 (9% Cr), and HR3C (25% Cr), and the steel K44X (19% Cr), not used in POEMA. It is interesting to examine the protection effect of the coating in this case, because this steel is developed to be used in air up to 1000° C. The alumina coatings were deposited by a sol-gel-process using boehmite, this is relatively simple and offers application possibilities for a wide technical range without special surface preparations. All samples were heat treated for 30 min at 650° C to remove the organic components and to start the crystallization process of the alumina. For P92 and HR3C, the following conditions simulated the oxyfuel process: 650° C in wet flue gas for 300 hrs for the steel P92, the same conditions for 2000 hrs for the steel HR3C. K44X was tested at 900° C in laboratory air for 500 hrs. After the first heat treatment of 30 min as well as after long-term testing, TEM characterizations were performed. The microstructure of the interfaces between steel and coating is of special interest to detect failure mechanisms, and identify diffusion and crystallization processes with the aim to understand the principle of action of the alumina coating.

The TEM samples were prepared by the lift-out-technique using a FIB Quanta 3D and were investigated in a STEM JEM2200FS at 200kV.

After the first heat treating process all steels show chromium oxide layers directly at the steel surface, they vary in thickness and are island-shaped in the case of the steel K44X. Chromium depletion arose more or less in the superficial zones of all samples. After the long-term tests, only P92 presents an intact interface, while K44X and HR3C showed breakaway oxidation. One can conclude: The positive impact of the coating and a high chromium content of a substrate are essential for the formation of protective chromium oxide layers. For long service times a renewal effect of the Cr-oxide layers is necessary, originated by the possibility of continuous Cr diffusion to the interface without forming Cr depletion. In this context the interaction with the other alloying elements of the particular steel is of importance.

 

This work was initiated and financially supported by the European project „Production of Coatings for New Efficient and Clean Coal Power Plant Materials“ (POEMA/FP7-NMP, 310436).


Ilona DÖRFEL (Berlin, Germany), Marianne NOFZ, Regine SOJREF, Maria MOSQUERA FEIJOO, Wencke SCHULZ, Nicole WOLLSCHLÄGER, Rene HESSE, Axel KRANZMANN
08:00 - 18:15 #5372 - MS01-570 Transmission electron microscopy of deformed Laves phase NbFe2.
MS01-570 Transmission electron microscopy of deformed Laves phase NbFe2.

Laves phases are the largest class of intermetallic phases, showing very high strength up to temperatures above 1000 °C, but being very brittle at room temperature. The mechanical behavior and the deformation mechanism of these phases is very much different from that of pure metals and is still not well understood [1, 2].

The unit layer of a Laves phase AB2 does not consist of only one plane but a slab of four planes, each of which is composed of either only A- or B-atoms. This package of four atomic planes can be sub-divided in one single B-atom layer and a triple layer of successive A-, B- and A-atom planes [3].

The present work summarizes results obtained from transmission electron microscopy on single-phase NbFe2 before and after compression tests at high temperatures. The material was produced by levitation melting and has hexagonal C14-type structure (hP12, P63mmc). The compressive stress-strain curves are characterized by a pronounced stress peak in the stress-strain curves at lower temperatures (up to 1200 °C) and by steady state flow at higher temperatures (above 1200 °C) [4].

Undeformed NbFe2 is almost free of dislocations. It is assumed that the lack of dislocations in the as-cast condition leads to the pronounced yield stress maximum observed during compression testing at lower deformation temperatures.

After deformation at 1200 °C new dislocations are introduced into the material. Widely-extended stacking faults on the basal plane dominate the microstructure. They are bounded either by partial dislocations or terminate at low angle grain boundaries (Fig. 1).

Material deformed at 1300 °C shows a high density of dislocations, which are split into pairs of partial dislocations that bound stacking faults on the basal plane (Fig. 2). The observation that most dislocations are split up into Shockley partial dislocations could indicate deformation by the synchroshear process [5], as the occurrence of such partial dislocations is essential for this mechanism. Synchroshear is based on the idea of a synchronous shear motion of two adjacent planes within the triple layer.

Dislocation networks (Fig. 3 and 4) indicate the activation of dislocation climb. The improvement of dislocation mobility at higher deformation temperatures leads to the absence of a pronounced stress maximum in the stress-strain curves.

The observed perfect dislocations are of (0001) 1/3<11-20> type, the dissociated Shockley partials are (0001) 1/3<10-10> type. The main deformation mechanism in the NbFe2 C14 Laves phase is basal slip.

 

[1] N. Takata et al., Intemetallics 70, 2016, 7-16

[2] W. Zhang et al., Physical Review Letters 106, 2011, 165505

[3] P. Hazzledine et al., Scripta Metallurgica et Materialia 28, 1993, 1277-1282

[4] S. Voss et al., Mater. Res. Soc. Symp. Proc.  1295, 2011, 311-316

[5] M. Chisholm et al., Science 307, 2005, 701-703


Michaela ŠLAPÁKOVÁ (Düsseldorf, Germany), Simon VOSS, Sharvan KUMAR, Christian LIEBSCHER, Frank STEIN
08:00 - 18:15 #5396 - MS01-572 Phase contrast transmission electron microscopy with hole-free phase plate for material analysis.
MS01-572 Phase contrast transmission electron microscopy with hole-free phase plate for material analysis.

In an analysis of material structures, transmission electron microscopy (TEM) stands out as an essential tool. A wide variety of information can be obtained from a sample by appropriately using TEM. Recently, phase contrast transmission electron microscopy (PC-TEM) with a hole-free phase plate (HFPP) has been established [1-4]. The HFPP is placed at the back focal plane of the objective lens. The incident beam passing through the thin film of HFPP generates secondary electrons, and they in turn lead to an electrostatic charging (potential). As the intensity distribution of electron beam on the HFPP has sharp peak at the center of optical axis, the charging occurs only at region of the beam crossover.  This causes an additional phase shift for the direct beam, resulting in high contrast images of samples. The difference of phase shift between scattered electrons and direct electrons, made by the charging, enhance the image contrast as the common phase microscopy. Thus, the contrast of materials made of light elements, e.g., polymer samples and biological samples, can be significantly enhanced by HFPP. Furthermore, we expect that it may be possible to derive phase, i.e., the mean inner potential, from the images obtainable from the PC-TEM with HFPP.  In this study, we demonstrate a couple of experimental results of PC-TEM with HFPP.

First example is an observation of nano-scale periodic structures of block copolymer (BCP). BCPs consist of light elements and thus often require “staining” of one of the phases for contrast enhancement under TEM observations. Because the staining might change nano-structures, it would be better not to use this method for increasing contrast. We used a field emission TEM (JEM-2200FS) operated at 200 kV with the PC-TEM with HFPP in this experiments. Figure.1 shows TEM images of a unstained block copolymer (poly(styrene-b-isoprene)) obtained with and without HFPP. The lamellar structure was hardly seen in the TEM images without HFPP at in-focus, i.e., Figures 1a. Under-focusing slightly enhanced the contrast between the polystyrene (PS) and polyisoprene (PI) phases in Figure 1b. In contrast, it was obvious that the use of HFPP significantly increased contrast of the two phases in lamellar structure.

Next, we explore the possibility of HFPP imaging for phase retrieval. As a first trial we selected the simple case of nanoparticles, for which we can assume a weak phase object approximation. As far as the phase values is small (typically <0.5 rad), we propose to retrieve the phase from two images with and without HFPP at the same defocus condition. The knowledge of the two images allows then for a simple inversion of the contrast transfer function that directly leads to a phase image of the area. Figure 2a and 2b show images of platinum nanoparticles with and without HFPP. Figure 2c is the phase image retrieved from the two images using the simple inversion. Phase images have been also retrieved for sets of images taken at different defocus (0, -40nm, -80 nm): the same phase images were obtained (though with a better signal/noise ratio at zero defocus). For comparison, an in line holography processing earlier validated on gold nanoparticles [5] has been applied: a good agreement on the phase value has been observed when comparing to the phase image of the same area obtained with and without HFPP. The measured phase values are close to 0.3 rd for 2-nm particles as expected from simple calculation based on the mean inner potential (VPt = 25 V). The advantage of the PC-TEM with HFPP is easier usability than conventional phase retrieving methods, such as off axis electron holography.

From these applications, we emphasize that PC-TEM with HFPP would be one of prospective analysis tools for materials characterization.

References

[1] M. Malac et al, Ultramicroscopy 118 (2012), p.77.

[2] Y. Konyuba et al, Microscopy and Microanalysis, 21.s3 (2015), p.1573.

[3] N. Hosogi et al, Microscopy 64.s1 (2015), p.126.

[4] M. Malac et al, U.S. Patent US 8,785,850.

[5] P. Donnadieu et al, Applied Physics Letters 94.26 (2009), p.3116.


Yuji KONYUBA (Tokyo, Japan), Hirofumi IIJIMA, Patricia DONNADIEU, Takeshi HIGUCHI, Hiroshi JINNAI, Naoki HOSOGI
08:00 - 18:15 #5593 - MS01-574 Delayering of 14 nm Node Technology IC with Xe Plasma FIB.
MS01-574 Delayering of 14 nm Node Technology IC with Xe Plasma FIB.

The burgeoning generation of electronic data and the growing need for fast processing is driving the development of unique architectures in microelectronic devices. High device performance, along with low energy consumption, decreasing device area and optimal production costs are the four basic tenets of operation in the microelectronics industry [1]. These rules have led to increasing area density of the elements in electronic devices and consequently to shrinkage of the elements to the nanometer scale.

 

State-of-the-art commercial electronic devices are based on 22 nm and 14 nm node technology and the next generation of 10 nm and 7 nm nodes are under development [1]. Mechanical polishing as a standard tool in the failure analysis of the devices does not meet the very strict requirements of these nodes. The thickness of metal interconnects and dielectric separating layers just above the transistors has shrunk to less than 100 nm. Therefore it is a challenge to stop the polishing process in a particular layer with the expected quality, accuracy and repeatability. Moreover, mechanical polishing is usually accompanied by surface artefacts like material chipping-off and site-specific fault excavation is usually impossible. Focused Ion Beam (FIB) technology has proven to overcome these restrictions. It offers the possibility to target a failure with nanometer accuracy in depth and the lateral direction. Therefore cross-sectioning, site-specific layer-by-layer excavation (delayering) and direct extraction of a Transmission Electron Microscopy (TEM) lamella containing the particular fault of interest have become standard methods in failure analysis.

 

We present delayering of an Intel Skylake processor (G4400) based on 14 nm node technology [2]. The delayering is performed with a Xe plasma FIB. Beam currents of Xe FIB up to 2 µA has extended the dimensions of the analyzed volume of interest to several hundred micrometers in general [3] while simultaneously enabling homogeneous delayering with nanometer accuracy. Xe FIB is advantageous also because interaction of inert Xe atoms with the material surface does not significantly alter its properties and surface contamination is negligible. Moreover Xe ions considerably reduce surface amorphisation when compared to Ga ions [4].  

 

Processor architecture is based on alternating metal and dielectric layers (Fig. 1). These layers have different sputtering rates when FIB delayering is applied. Uneven sputtering can be substantially suppressed by chemical means. In our experiments, water vapor was delivered to the point of patterning via a Gas Injection System (GIS) in order to equalize sputtering of metal interconnects and insulators. The result of processor delayering down to the first metal layer, just above the transistors is shown in Fig. 2. The damage-free surface of the transistor contact layer is ready for electrical probing.

 

Nanometer-sized elements in state-of-the-art electronics have posed a challenge also for imaging technologies. Clear observation of the very thin individual layers means suppressing the acceleration voltage of primary electrons to the sub-1 kV range, ideally to 500 V. At higher energies, the electron signals from different layers would intermix as they are generated in a volume comparable to the thickness of those layers. However, sub-nm resolution at low electron energies is a necessary condition due to the size of the observed features. High resolution pictures captured at 500 V are shown in Fig. 2. Low-kV imaging has verified highly homogeneous delayering of the processor as can be seen by the absence of large contrast changes in the delayered region.

 

[1] http://www.itrs2.net/

[2] http://www.intel.com/content/www/us/en/silicon-innovations/intel-14nm-technology.html

[3] T Hrnčíř et al, 38th ISTFA Conf. Proc. (2012), p. 26.

[4] T Hrnčíř et al., 41th ISTFA Conf. Proc. (2015), p. 60.


Jozef VINCENC OBOŇA, Tomáš HRNČÍŘ, Sharang SHARANG, Marek ŠIKULA, Andrey DENISYUK, Jiří DLUHOŠ (Brno, Czech Republic)
08:00 - 18:15 #5705 - MS01-576 Influence of metal additive Nb on the morphology of Vanadium Phosphorus Oxide Catalysts.
MS01-576 Influence of metal additive Nb on the morphology of Vanadium Phosphorus Oxide Catalysts.

Vanadium phosphorus oxide (VPO) catalysts have been considered as the most effective industrial catalysts for the oxidation of n-butane to maleic anhydride. The preparation methods of the catalyst, and reaction conditions and other factors will have different effects on the catalyst properties. In order to improve the performance of VPO catalyst, we often add co-catalyst: metal additives can not only improve the activity and selectivity of the catalysts to some extent, but also play important roles in reducing reaction conditions and prolonging the reaction time. The VPO catalyst precursors have been prepared through reducing pentavalent vanadium in organic phase, and then introducing the Nb element whose radius is similar to V4 + ionic by  the co-precipitation method. The effect of Nb additive on the morphology of VPO catalyst was studied by SEM and TEM, and the morphology of the catalyst was compared with that of the VPO catalyst without additive in the figure below.

SEM and TEM images of VPO catalyst precursor showed sheet structure with irregular size, and the transmission diffraction pattern suggested amorphous structure in Fig.1a-a’. Although there was a small amount of hexahedral structure for the VPO activated catalyst, the main morphology was granular structure different in size. After the addition of Nb additive, configuration of VPO precursor was regular diamond-shaped as shown in Fig.1c-c’. This kind of crystal takes the thickness of about 200nm, but the crystal size is reduced to 40nm for the Nb-VPO activated catalyst. It suggests that: the broken of tabular crystal is helpful to improve the specific surface area, thus to provide more active sites for the catalytic reaction and increase the catalytic activity. In addition, the catalyst will expose more crystal defects after fragmentation, and provide necessary conditions for the separation of the catalyst active site. Therefore, crushing effect by adding Nb into the organic phase is beneficial to improve the selectivity of maleic anhydride. On the basis of the previous work, a comparative analysis on the morphology VPO catalyst before and after the addition of Nb, we can draw a conclusion: the crystal phase of VPO precursor containing the Nb additive is VOHPO4∙0.5H2O, which is preferred to grow along the (001) crystal face. So the rhombic structure is more regular. For the Nb-VPO activated catalyst, phase composition is still (VO) 2P2O7, but there has been little VOPO4 phase. The synergy of V+4 and V+5 species in two crystal phases is the key to improve catalytic activity of VPO catalyst. The catalytic selectivity has been greatly increased after the addition of Nb.


Xiaopei MIAO (Beijing, China), Wenqing HUANG
08:00 - 18:15 #5730 - MS01-578 Effect of trace elements on the material properties of an aluminium casting alloy.
MS01-578 Effect of trace elements on the material properties of an aluminium casting alloy.

The aim of the project is to determine the fundamentally effects of impurities and individual micro-alloying elements (eg. as vanadium V, titanium Ti, calcium Ca, zirconium Zr, potassium K, phosphorus P and others) or combinations of these trace elements in aluminum alloys and their impact on the quality of aluminum castings.

As a result, limit values and tolerances for individual impurities (trace elements) should be defined and determined. Further on practical study methods should be developed that support on the one hand a reliable series production of high-quality alloys and castings and on the other hand the procurement of aluminum alloys by the foundries.

 

The casting trials in industry-related standards were performed on the base of a high purity alloy AlSi7Mg0,3 with systematic addition (30ppm, 300ppm, 3000ppm) of micro-alloying elements, controlled by chemical analysis with an emission spectrometer.

Technological properties as flowability, hot crack susceptibility and shrinkage cavity formation were evaluated. Static and dynamic material testing, like tensile tests, hardness measurements and Woehler curves was implemented. The thermo-physical properties as specific heat capacity, thermal expansion, temperature conductivity, density and heat conductivity were measured.

Phase calculations by ThermoCalc-Software, to simulate the formation of intermetallic phases and their impact on the microstructure are compared to classical metallography and additional SEM/TEM-investigations.

SEM/EDXS/EBSD-measurements for the micro-characterization of the structure and the composition of the intermetallic phases are made on cross sections (figures 1-4).

Out from regions/phases of interest TEM-lamellas are prepared with the FIB-technique and transferred to TEM for using EDXS/EELS/EFTEM and diffraction methods for the nano-characterization of these phases.

 

The authors want to thank the Austrian Research Promotion Agency (FFG) for financial support (PN845411).


Hartmuth SCHROETTNER (Graz, Austria), Thomas PABEL, Tose PETKOV, Sabrina MERTSCHNIGG, Anita ROSSMANN-PERNER
08:00 - 18:15 #5747 - MS01-582 Electron diffuse scattering in BNT-BKT-BT ternary compound.
MS01-582 Electron diffuse scattering in BNT-BKT-BT ternary compound.

Local structure of crystalline materials has been increasingly recognized to play a crucial role in understanding their functional properties. One important example is perovskite ferroelectrics where the structure often involves the presence of chemical short-range order, correlated atomic displacements and/or oxygen octahedral tilting disorder. In this case electron diffraction can prove to be a suitable technique for probing the local structure. The strong electron-matter interaction makes it possible to easily record weak superlattice reflections and diffuse scattering with good signal-to-noise ratio.

The ternary system xBi0.5Na0.5TiO3yBi0.5K0.5TiO3zBaTiO3 (BNT-BKT-BT) is a potential candidate for replacing Pb-based materials in piezoelectric applications1. Even though it is one of the most extensively studied lead-free piezoelectric systems, structural information about local distortions in this material is scarce. In this study Transmission Electron Microscopy (TEM) was employed in order to investigate the long- and short-range structure of this system in both real and reciprocal space. Two and three dimensional electron diffraction data was recorded. The true features of diffuse electron scattering in 3D as well as Bragg reflections were obtained by Rotation Electron Diffraction (RED) method2.

A projection of the three-dimensional reconstructed reciprocal space volume along <001>pc, is shown in Fig. 1(a). Superlattice reflections of both ½ooo and ½ooe type can be observed indicating the coexistence of two different octahedral tilting systems, anti-phase a-a-a- and in-phase a0a0c+ respectively (in Glazer notation3). The anti-phase a-a-a- tilting system is consistent with the long-range order space group, namely R3c. But, the in-phase a0a0c+ tilting system is consistent with P4bm space group indicating local deviations from the average space group. Furthermore two types of diffuse scattering features could be observed: (i) “asymmetric L-shaped” features around Bragg peaks extending along <100>pc directions clearly visible for Bragg peaks close to the direct beam, Fig. 1(b) and (ii) linear {h00}*, {0k0}* and {00l}* diffuse scattering ’rods’ that pass through the superlattice reflections as highlighted in Fig. 1(c). A possible explanation for the observed diffuse features is correlated displacements of the A- and B-cations along <111>pc and <100>pc chains coupled with disordered (in-phase/anti-phase) rotations of the oxygen octahedral4.

References

1 J. Shieh, K.C. Wu, and C.S. Chen, Acta Materialia 55, 3081–3087 (2007)

2 W. Wan, J. Sun, J. Su, S. Hovmöller and X. Zou, J. Appl. Crystallogr. 46, 1863-1873 (2013).

3 A. M. Glazer, Acta Cryst. B28, 3384 (1972).

4 J. Kreisel, P. Bouvier, B. Dkhil, P. A. Thomas, A. M. Glazer, T. R. Welberry, B. Chaabane and M. Mezouar, Physical Review B 68, 014113 (2003)

Acknowledgments

The Knut and Alice Wallenberg (KAW) Foundation is acknowledged for providing the electron microscopy facilities and financial support under the project 3DEM-NATUR


Alexandra NEAGU (Stockholm, Sweden), Cheuk-Wai TAI
08:00 - 18:15 #5786 - MS01-584 Structural characterization of the high thermoelectric performance PbTe - PbSnS2 system and implications of its structural complexity in low lattice thermal conductivity.
MS01-584 Structural characterization of the high thermoelectric performance PbTe - PbSnS2 system and implications of its structural complexity in low lattice thermal conductivity.

Thermoelectric materials are promising alternative energy sources, suitable for applications in thermoelectric generators and refrigerators, due to their low cost and environmentally friendly heat-to-power generation. Their wide-scale utilization is limited because of their low efficiency; however, nanoscale inclusions can improve it by suppressing the lattice thermal conductivity.

The high performance PbTe-SnTe-PbS thermoelectric system forms a new PbTe - PbSnS2 composite with high n-type figure of merit. Electron Diffraction (ED) through tilting and Precession Electron Diffraction (PED) experiments as well as High Resolution Transmission Electron Microscopy (HRTEM) characterization of the thermoelectric composite PbTe + 25% PbSnS2 reveal that the system is nanostructured in a unique way, with PbSnS2 nanocrystals in the range of 80 to 500 nm in size. In most of the cases, they are endotaxially grown within the PbTe matrix (Figure 1).

Three independent crystal superstructures were observed for the PbSnS2 inclusions, originating from the same parent SnS-type structure. Specifically, the PbSnS2 inclusions appear with all three known structural modifications within the same matrix and often within the same nanocrystal. HRTEM images were qualitatively improved by Fast Fourier Transform (FFT) and inverse FFT (IFFT) processing, as well as by averaging of selected parts of the images. We then compared the processed images with computer image simulations and a very good resemblance between them was found. Figure 3 depicts a HRTEM image taken with the electron beam parallel to [110]PbSnS2 direction and is a part of a nanocrystal of about 300 nm in size. Two types of FFT patterns were observed and are shown as insets in Figure 3. Modified structural models for two of the superstructures observed in the PbSnS2 precipitates are proposed (one of them is presented in Figure 2).

Finally, evidence was also found for the growth process of the nanocrystals. The presence of some PbS nanocrystals implies that the growth process of the minor PbSnS2 phase starts from PbS crystals where SnS is gradually dissolved to eventually form PbSnS2 crystals.

Our findings suggest that this nanostructured thermoelectric composite exhibits unique structural complexity, which contributes to the low lattice thermal conductivity reported previously for these nanocomposite materials, by introducing extra scattering mechanisms. Phonon scattering can occur not only at the interfaces between the nanocrystals and the matrix, but also within the nanocrystals, due to their structural heterogeneity.

Acknowledgements

This work was supported by “IKY Fellowships of Excellence for Postgraduate Studies in Greece – SIEMENS Program”. Work at Northwestern is supported by the Department of Energy, Office of Science Basic Energy Sciences under grant DE-SC0014520.


Chrysoula IOANNIDOU, Christos LIOUTAS, Nikolaos FRANGIS (Thessaloniki, Greece), Steven GIRARD, Mercouri KANATZIDIS
08:00 - 18:15 #5819 - MS01-586 Severely plastically deformed Ti-Ni-Pd high-temperature shape memory alloys studied by TEM.
MS01-586 Severely plastically deformed Ti-Ni-Pd high-temperature shape memory alloys studied by TEM.

High-temperature shape memory alloys (HTSMA) have a broad range of prospective applications [1]. Grain refinement can substantially improve the material strenght and cyclic transformation stability [2]. It is the aim of the present work to study the structural evolution and phase transformations of a Ti50Ni25Pd25 HTSMA severely plastically deformed by high pressure torsion (HPT) using transmission electron microscopy (TEM) methods.

A Ti50Ni25Pd25 alloy prepared by arc melting was homogenized, solution treated, and water quenched. Disc shaped samples taken from the alloy were subjected to HPT (using a pressure of 6 GPa and 40 turns) carried out at room temperature (RT). HPT deformed samples were also subjected to isochronal heating (IH) to a temperature of 460°C followed by cooling to RT. TEM specimens were prepared by ion polishing (Gatan PIPS II) and analyzed in a Philips CM 200 transmission electron microscope.

 

The initial coarse grained TiNiPd HTSMA is fully martensitic since the thermally induced transformation from the cubic B2 austenite to orthorhombic B19 martensite occurs well above RT (the martensite finish temperature is ~ 130°C). Therefore, the HPT is applied to the martensitic state of the initial sample that is showing a self-accommodated morphology of twinned martensite (cf. Fig. 1).

 

After the HPT, a complex mixture of elongated crystals and amorphous bands has formed that have an average width of 40 and 15 nm, respectively. The thinnest amorphous bands have a width of about 5 nm only. While TEM bright field images hardly facilitate analysis of the deformation microstructure (cf. Fig. 2a), strong differences in scattering of the crystalline and amorphous phase (cf. the selected area diffraction pattern (SADP) of Fig. 2b) can be used to separately image these phases in dark field images: Fig. 2c was taken with strong diffraction spots (cf. C in Fig. 2b) of crystallites closely orientated to a Bragg-condition. In this case, the dark field intensity strongly depends on the specimen tilt and the position of the objective aperture. Since the lattice reflections form arc shaped segments in the SADP, it is concluded that the most of the crystals have rather similar orientation with respect to each other (the average rotational misorientation is about 20°). Most of the reflections correspond to B19 martensite. Weak reflections of the B2 austenite also arise. Fig. 2d was taken by allowing diffusely diffracted intensity of the amorphous phase to pass the objective aperture that is not superimposed by strong crystalline diffraction spots (cf. A in Fig. 2b; the maximum of the diffusely diffracted intensity was used occurring on a diffraction ring with a radius of about 4.6 nm-1). As expected, the dark field contrast of the amorphous bands is rather uniform and hardly depends on both the tilt of the specimen and the position of the objective aperture along the amorphous diffraction ring (as long as it is not superimposed by crystalline reflections). The present observations of a lamellar structure of elongated crystallites separated by thin amorphous bands indicates that the amorphization might preferentially occur at martensitic twin boundaries (cf. Fig. 1a) [3,4].

 

In samples subjected to IH after HPT, an ultrafine grained structure is formed by crystallization of the amorphous phase, as well as by recovery and grain growth that occurs in the austenitic state. During cooling to RT, the forward B2 to B19 transformation occurs in the ultrafine grains that frequently contain a twinned morphology of the martensite (cf. Fig. 3a and b). However, as compared to the case of coarse grains, the forward transformation is hindered (i.e. shifted to lower temperatures and incomplete) yielding retained austenite in some of the grains (cf. Fig. 3c).

 

[1] J.V. Humbeeck, Mater. Res. Bulletin 47 (2012) 2966-2988.

[2] K.C. Atli, I. Karaman, R.D. Noebe, A. Garg, Y.I. Chumlyakov, I.V. Kireeva, Acta Mater. 59 (2011) 4747-4760.

[3] M. Peterlechner, T. Waitz, H.P. Karnthaler, Scripta Mater. 60 (2009) 1137–1140.

[4] J.Y. Huang, Y.T. Zhuz, X.Z. Liao, R.Z. Valiev, Phil. Mag. Lett. 84 (2004) 183–190.

Financial support by the Austrian Federal Government within the framework of the COMET Funding Programme is gratefully acknowledged.

 


Semir TULIĆ, Michael KERBER, Mitsuhiro MATSUDA, Thomas WAITZ (Vienna, Austria)
08:00 - 18:15 #5820 - MS01-588 On the influence of the elemental addition Au on the semi-coherent interfaces in an Al-Cu alloy.
MS01-588 On the influence of the elemental addition Au on the semi-coherent interfaces in an Al-Cu alloy.

Aluminium light alloys are employed in commercial automotive and aerospace applications due to their high specific strength and corrosion resistance [1]. Precipitation hardening is one of the most important ways to improve the alloy performance. By tailoring precipitate size, aspect ratio, and distribution, the precipitation hardening can be significantly enhanced. The interfacial structure between precipitates and matrix is the critical factor being thought to manipulate the precipitate growth, but the fundamental understanding of these interfaces remains poor due to both limitations in atomic-resolution compositional characterisation techniques and computational capacity of first principle calculations. 

Al-Cu is a textbook binary alloy having precipitate strengthener θ′ (Al2Cu) phase, but recent work showed its semi-coherent interfaces is not as simple as previously thought [2]. In fact, a complex metastable θ′t phase is sandwiched in-between θ′′ and θ′ precipitates, indicating a non-intuitive energetically favourable phenomenon. Gold (Au) has strong negative solute formation enthalpy with aluminium and thereby its precipitation is directly linked to η′ and η phases without precursor Guinier–Preston (GP) zone [3]. How such element affects the interfacial structure is still unclear. In this work, we have used atomic-resolution high angle annular dark-field (HAADF) via aberration-corrected scanning transmission electron microscopy (AC-STEM) for detailed investigations of the influence of Au on the heterophase interfacial structure in an Al-Cu alloy. 

We have experimentally determined the effect of Au and ageing temperature on the complex interfacial structure between solid solution (α) and θ′ (Al2Cu). We have observed the sandwiched interfacial structure in Al-Cu-Au alloys aged at 200°C (See Fig. 1a) as discovered in Ref. [2], while in comparison some partially direct θ′-α interface was found (see Fig. 1b) in rare probability. However, Au addition was observed to clearly destabilise the complex interfaces (see fig. 1c) at higher temperature ageing (350°C), whereas the corresponding binary Al-Cu alloy still somehow displays complex interfacial structures (Fig. 1d). The complex interface was also proved to provide the first solution to the four-decades-old mystery where experimental precipitate coarsening rate was found to be hundreds of times that of theoretical predictions based on the direct θ′-α interface in the Ref. [4].

References:

[1] Williams JC et al. Acta Materialia 51(2003):5775-5799.

[2] Bourgeois L, et al. Physical Review Letters 111 (2013): 046102.

[3] Bourgeois, L et al. Acta Materialia 105 (2016): 284-293.

[4] Boyd JD et al. Acta Metallurgica 19.12 (1971): 1379-1391.


Yiqiang CHEN (Melbourne, Australia), Zezhong ZHANG, Chen ZHEN, Amalia TSALANIDIS, Matthew WEYLAND, Findlay SCOTT, Allen LES, Jiehua LI, Laure BOURGEOIS
08:00 - 18:15 #5821 - MS01-590 On the diffusion-mediated cyclic coarsening and reversal coarsening in an advanced Ni-based superalloy.
MS01-590 On the diffusion-mediated cyclic coarsening and reversal coarsening in an advanced Ni-based superalloy.

Polycrystalline nickel-based superalloys for turbine disc applications typically employ complex alloy chemistry in order to produce a high volume fraction of gamma-prime (γ′) precipitates for the optimisation of mechanical properties [1]. The precipitate coarsening causes a gradual loss of coherency between γ′ precipitates and γ matrix when materials serving elevated temperatures, therefore resulting in the degradation of its mechanical performance [2]. In this work, we report new experimental observations for diffusion-mediated secondary γʹ precipitate coarsening (See Fig. 1) within a near-zero misfit alloy RR1000 in a cyclic manner that these precipitates coarsen and split periodically [3].

Using absorption-corrected energy-dispersive X-ray (EDX) spectroscopy within the scanning transmission electron microscope (STEM) [4], compositional variations for secondary γ′ precipitates as a function of coarsening behaviour under have been investigated. We have observed clear cyclic variations in the elemental concentrations of Co, Ti and Al within the secondary γ′ as a function of ageing time. STEM/EDX spectrum imaging and electron tomography on individual secondary γ′ have revealed local enrichment of Co within the core of secondary γ′ (See Fig. 2). STEM-EDX analysis of the γ-γ′ interface revealed nanoscale enrichment of Co and Cr and a depletion of Al and Ti within the γ matrix region near the γ-γ′ interface (See Fig. 3). Our experimental results, coupled with complementary modelling and synchrotron X-ray diffraction analysis, demonstrate the importance of elastic strain energy resulting from local compositional variations for influencing precipitate morphology. In particular, we show that elemental inhomogeneities, produced within both matrix and precipitates, are induced by complex interactions between thermodynamics and diffusion kinetics. These elemental inhomogeneities will likely affect the kinetics of coarsening and therefore must be taken into account when predicting the microstructure likely to be produced when the material is exposed to different heat treatment regimes. More generally, our findings suggest the importance of considering diffusion kinetics when attempting to understand the microstructural evolution of advanced superalloys. Our discovery renders the potential to retain the overall γ-γ′ coherence in nickel-based superalloys when exposed to elevated temperatures, and therefore to improve its creep properties.

 References:

[1] Reed, RC. Cambridge University Press, 2008.

[2] Acharya, MV et al. Materials Science and Engineering: A 381 (2004): 143-153.

[3] Chen YQ et al. Acta Materialia, (accepted) 2016.

[4] Chen, YQ, et al. Ultramicroscopy 144 (2014): 1-8.


Yiqiang CHEN (Melbourne, Australia), Rajan Prasath BABU, Thomas SLATER, Robert MITCHELL, Octav CIUCA, Michael PREUSS
08:00 - 18:15 #5835 - MS01-592 Study of disorders in zeolite ITQ-39 using structure projection reconstruction from through-focus series of HRTEM images.
MS01-592 Study of disorders in zeolite ITQ-39 using structure projection reconstruction from through-focus series of HRTEM images.

The structure of an aluminosilicate ITQ-39 has been determined by electron crystallography, it is one of the most complex zeolite ever solved [1]. ITQ-39 has a 3-dimensional channel system with intersecting 10- and pairwise 12-ring channels. It has a highly faulted structure and contains stacking disorder along [100], twinning along [010] and point defects. High-resolution transmission electron microscope (HRTEM) images were chosen to study these disorders. In order to improve HRTEM data quality, a through-focus series of 20 HRTEM images were collected and a structure projection image was reconstructed (see Fig. 1) by a contrast transfer function (CTF) correction algorithm using the software QFocus [2]. The through-focus series was acquired with a constant focus step (-53.3 Å) and the two-fold astigmatism was the same through the series. Defocus values and the two-fold astigmatism were then determined for all the images. CTF correction was performed on each image and the final reconstructed image was obtained by averaging all 20 CTF-corrected images (see Fig. 1b). Defocus determination revealed that the image series passed through the Scherzer focus condition and contained at least one image close to the Scherzer condition (Fig. 1a). By using structure projection reconstruction the noise in the images was significantly reduced and the structure and pore system were more obvious after the reconstruction. One big advantage is that there is no need to spend time to adjust to a certain focus (e.g. close to Scherzer focus), therefore the acquisition of HRTEM images can be done much faster which is very useful for beam sensitive samples.

References

[1] Willhammar, T. et al. Structure and catalytic properties of the most complex intergrown zeolite ITQ-39 determined by electron crystallography. 2012, Nature Chemistry, 4 (188-194).

[2] Wan W. et al. Structure projection reconstruction from through-focus series of high-resolution transmission electron microscopy images. 2012, Ultramicroscopy, 115 (50-60).

Acknowledgements

The project is supported by the Swedish Research Council (VR), the Swedish Governmental Agency for Innovation Systems (VINNOVA) and the Knut & Alice Wallenberg Foundation through the project grant 3DEM-NATUR and a grant for purchasing the TEM.  


Elina KAPACA (Stockholm, Sweden), Tom WILLHAMMAR, Wei WAN, Xiaodong ZOU, Manuel MOLINER, Cristina MARTINEZ, Fernando REY, Avelino CORMA
08:00 - 18:15 #5840 - MS01-594 UHVEM observation for the dual structure in spheroidal graphite of cast irons.
MS01-594 UHVEM observation for the dual structure in spheroidal graphite of cast irons.

The phenomenon that spheroidal graphite cast iron was formed by adding magnesium (Mg) was discovered in 1949 [1][2]. Since then, a number of researches have been made on this subject. Due partly to increase in research on the graphite-spheroidizing, there are various theories such as interfacial energy theory, nuclear theory, bubble theory,,, etc. Among them interfacial energy theory is becoming dominant as of now [3]. However the role of Mg as the graphite-spheroidizing agent has not been yet identified. And Mg particle is often observed inside of spheroidal graphite experimentally. In order to get the information on the internal structure of spheroidal graphite in cast iron, Ultra-High Voltage Electron Microscopy (UHVEM) observation was carried out.

The composition of the cast iron in this experiment was FCD450 (Fe:Bal., C:3.645, Si:2.533, Mg:0.0464, Mn:0.368, P:0.018, S:0.0114, Cu:0.176 (wt%), Yodoshi Co.). The position of Mg in spheroidal graphite was predicted from a surface observation result by EPMA. Focused ion beam (FIB) cut out into approximately rectangular parallelepiped shape carbon sample from a spheroidal graphite of FCD450. This sample was observed by UHVEM in Osaka Univ. at 2.0MeV.

Figure 1 shows a bright field image (BFI) of the internal structure of spheroidal graphite. The electron beam in acceleration voltage of 2MeV was transmitted approximately 8μm thickness of graphite (inclination of the incident beam: 30°). Figure 1 indicated that whole area was graphite including the internal structure of spheroidal graphite roughly composed of a core region surrounded by annual rings of a layered intermediate region (central domain) and a layered outer region with some radial factors (covering domain).

Only the covering domain has the radial and superimposed contrast. This radial factor originates from the metal inclusion that grew radially from the central domain. The shape of the external region of the central domain (without superimposed contrast) could be regarded as the almost truth sphere, which might become core for growing graphite crystal spherically. Primary crystal of graphite might be spheroidized by the solidification in liquid state, and crystal growth of graphite reaches the eutectic point at the external region of the central domain. After that, the covering domain formed by the cooperation growth between graphite and austenite.

The spheroidal graphite in cast iron has the dual structure consisting of a spherical central domain and a covering domain. This obtained data using by UHVEM has provided new knowledge of the internal structure of spheroidal graphite in cast iron. And this study might provide important visual data to identify a role of the Mg in the graphite-spheroidizing of cast iron.

 

 This work was supported by “Advanced Characterization Nanotechnology Platform, Nanotechnology Platform Program of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan” at the Research Center for Ultra-High Voltage Electron Microscopy (Nanotechnology Open Facilities) in Osaka University.

 

[1] A. P. Gagnebin, K. D. Millis and N. B. Pilling: The Iron Age, Feb. (1949) 77

[2] A. P. Gagnebin, K. D. Millis and N. B. Pilling: The Iron Age, Feb. (1949) 97

[3] S. Jung and H. Nakae: J.JFS, Vol.79-10 (2007) pp.605-615


Hidefumi MAEDA (Shiga, Japan), Kanako INOUE, Akira SUGIYAMA, Hidehiro YASUDA
08:00 - 18:15 #5887 - MS01-596 Quantitative analysis of AlN/SiC interfaces in AlGaN/GaN heterostructures grown on SiC.
MS01-596 Quantitative analysis of AlN/SiC interfaces in AlGaN/GaN heterostructures grown on SiC.

Wide band gap semiconductors, such as SiC and GaN, exhibit many attractive properties: a unique combination of the wide band gap, high breakdown field, high saturation velocity and the ability to form high quality AlGaN/GaN heterostructures with good transport properties make them ideal candidates for high power and high frequency applications. Hexagonal silicon carbide materials (SiC) are considered to be promising candidates for electronic devices as the third generation key materials for transistors. A typical example of a high performance device is the AlxGa1-xN/GaN heterostructure used as a high electron mobility transistor (HEMT) [1-2].

As 6-inch SiC wafers are being introduced into the market, a decrease of the substrate off-cut for SiC heteroepitaxy is desirable to reduce the manufacturing costs [3-4]. Therefore, multilayer (5 layers) and multicomponent structures (based on GaN and related materials) were grown on 6H-SiC (with a misorientation of 1 deg. off from the (0001) plane) substrates using the MOVPE method, for high power applications. The layers were grown epitaxially, as it was confirmed from the corresponding electron diffraction patterns. Several types of interfaces were observed between the layers that either ran parallel to the interface or formed V-shaped defects (e.g. the SiC/AlN, GaN/AlN, GaN/AlGaN interfaces etc.). Moreover, High Resolution TEM (HRTEM) images showed the existence of steps in the 6H-SiC/AlN interface. A typical HRTEM image where an atomic scale step is observed is shown in Fig. 1.

In this study, quantitative analysis of the 6H-SiC/AlN interface is presented based on experimental HRTEM micrographs, showing and proving the steps sites, the layers’ sequence and any strain relaxation situation existing. A structural model based on this analysis is proposed and simulated HRTEM images are also obtained.  The corresponding atomic models proposed are found to describe well the 6H-SiC/AlN interface, with the corresponding computer simulation images coinciding with the experimental HRTEM images. An example is shown in Fig. 2, illustrating the monolayer step observed in the 6H-SiC/AlN interface. In Fig. 3, a characteristic plot shows the phase shift of the fitting of the intensity’s distribution along a line that corresponds to the projection of a close-packing layer revealing the stacking sequence and therefore the starting position of the AlN epilayer. Moreover, the comparison of the sequence clearly shows the height of the step and any alteration on the stacking sequence between the two parts of the image. Finally, the computer simulated image, as shown in Fig. 4, coincides well with the HRTEM image shown in Fig. 1.

Acknowledgements

Supported by IKY Fellowships of Excellence for Postgraduate Studies in Greece-Siemens Program, the JU ENIAC Project Last Power Grant agreement no. 120218 and the Greek G.S.R.Τ., contract SAE 013/8 - 2009SE 01380012.

 

References

 [1] F. A. Ponce, C. G. Van de Walle, and J. E. Northrup, Physical Review B 53 (1996) 7473.

 [2] J.A. del Alamo, J. Joh , Microelectronics Reliability 49 (2009) 1200.

 [3] Leszczynski Mike, Prystawko Pawel, Kruszewski Piotr, Sarzynski Marcin, Plesiewicz Jerzy, Domagala Jarek, Gkanatsiou Alexandra, Lioutas Christos, Frangis Nicolaos, Polychroniadis Efstathios, Materials Science Forum 806 (2015) 73.


Alexandra GKANATSIOU (Thessaloniki, Greece), Christos B. LIOUTAS, Nikolaos FRANGIS
08:00 - 18:15 #5894 - MS01-598 Comparison of TEM and positron annihilation lifetime spectroscopy on tungsten exposed to mixed D plasmas.
MS01-598 Comparison of TEM and positron annihilation lifetime spectroscopy on tungsten exposed to mixed D plasmas.

Tungsten is currently a main candidate as a divertor plasma facing material in fusion devices. Even tungsten, however, will not be able to withstand excessive heat fluxes during off normal events such as ELM’s without significant erosion or other damages (e.g. melting or cracking) in the future fusion devices. One of the options to mitigate excessive power loads is by divertor impurity plasma seeding to dissipate the energy. Gases like Ar, Ne or N2 can be used for that purpose. Moreover, the presence of He as a reaction product from DT fusion reaction is also unavoidable. All these impurities will have an effect on tungsten behavior under plasma exposure. The expected impact of impurities on the surface morphology will change the tungsten erosion behavior. The presence of different subsurface defects (dislocation loops, voids) will influence the retention of hydrogen isotopes, which is of prime importance for the operation of a fusion device. The main focus of this work is to compare TEM analysis with positron annihilation lifetime spectroscopy to investigate the near-surface defects created by the impact of different plasmas.

Tungsten samples were mechanically polished to obtain mirror like surface and recrystallized at 1800°C for 1 h. Such prepared specimens were exposed in the linear plasma generator PSI-2 with an incident ion flux of about 1022 m-2s-1 and at an incident ion fluence of 5*1025 m-2, at a sample temperature of 500 K. Samples were biased to a potential of - 100 V resulting in incident ion energy of 70 eV. Pure D plasma (reference sample) and D plasma with additional impurities of He (3%), Ar (7%), Ne (10%) or N (~5%) were applied. The impurity concentration was controlled by spectroscopy, except for N for which it was estimated from the puffing rates.

The analysis covers the detection of subsurface defects and their density. TEM observation combined with positron annihilation techniques are employed to determine the thickness of the damaged zone and the presence and density of defects such as voids, dislocation loops and vacancies clusters.

After the plasma exposure, the surface morphology was investigated using scanning electron microscope (SEM) combined with a focused ion beam (FIB) utilized for cross-sectioning and thin lamella preparation for the transmission electron microscope (TEM) analysis. The reference sample exposed to a pure D plasma reveals at the surface the presence of two groups of blisters with a size of few mm and a few 100 nm. The presence of blisters is strongly correlated with the tungsten grain orientation. The addition of Ar and Ne results in surface erosion with different yields depending on grain orientation, confirmed also by electron backscattered diffraction (EBSD). Large blisters are present but show signatures of erosion. Less pronounced erosion is visible when adding N2. The presence of N in the plasma causes also blisters with cone-like shapes. The addition of He leads to the formation of flatter blisters and very fine nano-porosity on the surface.


Marcin RASIŃSKI (Jülich, Germany), Arkadi KRETER, Yuji TORIKAI, Grzegorz KARWASZ, Christian LINSMEIER
08:00 - 18:15 #5908 - MS01-602 Probing localized strain in solution-derived YBCO nanocomposite films.
MS01-602 Probing localized strain in solution-derived YBCO nanocomposite films.

The investigation of the atomic structure of individual defects is critical to the understanding and
precise controlling of the physical properties of materials. And although defects are sometimes
detrimental to functionality, in high temperature superconductors (HTS) are necessary for
providing pinning of magnetic flux and allowing high currents to be carried. Moreover, a strong
enhancement on the vortex pinning in HTS YBa2Cu3O7 (YBCO) films is also found to be
controlled by nanostrain [1], which is attributed to elastic distortions of the crystal lattice at the
nanoscale level. Using aberration-corrected Scanning Transmission Electron Microscopy
(STEM) we explore the complex defect landscape of YBCO nanocomposite thin films.
Combining High Angle Annular Dark Field (HADDF) with Low Angle Annular Dark Field
(LAADF) and local strain analyses we are able to map and quantify the lattice deformations
associated to the defects, which will ultimately determine their self-assembling behavior as well
as their mutual interaction. Our atomic scale investigation shows that the presence of mainly
randomly oriented nanoparticles generates incoherent interfaces within the epitaxial YBCO
matrix, which drastically increases the density of defects, yielding a ramified network of
inhomogeneously distributed nanostrained regions where the crystalline perfection of the
superconductor is perturbed.
Finally, we will compare the microstructure of conventional high-quality solution-derived
trifluoroacetate-YBCO nanocomposites with new fluorine-free films based on a novel transientliquid
assisted growth method (TLAG), which provides ultra-high growth rates with a consequent
influence on the defects landscape. Accordingly, TLAG envisages an enormous potential for lowcost
and high-performance coated conductors.


We acknowledge funding from EU-FP7 NMP-LA-2012-280432 EUROTAPES, ERC-AdG-
2014-669504 ULTRASUPERTAPE and MINECO MAT2014-51778-C2-1-R.


References
[1] Llordés at al., Nanoscale strain-induced pair suppression as a vortex-pinning mechanism in
high-temperature superconductors. Nature Materials, 11, 329 (2012).


Roger GUZMAN (Bellaterra, Spain), Jaume GAZQUEZ, Bernat MUNDET, Pablo CALLADO, Laia SOLER, Julia JAREÑO, Mariona COLL, Xavier OBRADORS, Teresa PUIG
08:00 - 18:15 #5946 - MS01-604 The comparison of grain boundaries in a nanostructured austenitic stainless steel annealed conventionally and under high hydrostatic pressure.
MS01-604 The comparison of grain boundaries in a nanostructured austenitic stainless steel annealed conventionally and under high hydrostatic pressure.

Abstract

Nanostructured metals and alloys are known to behave differently during annealing comparing to their micrograined counterparts. They exhibit lower thermal stability and often abnormal grain growth occurs. In the present work, the combination of severe plastic deformation processing  followed by subsequent conventional annealing and annealing under high hydrostatic pressure was applied. Samples were subjected to the heat treatment at 700°C for 10 minutes either under atmospheric or hydrostatic pressures of 2 or 6 GPa. The recrystallization process is investigated in TEM observations using HD2700 Hitachi. In samples after deformation one can notice a high density of nanotwins inside nanograins (Fig 1 and 2). In samples after annealing nanograins appear, the smallest of about 50 nm in the diameter (Fig 1 and 3). The main question refers to the differences in the microstructure after conventional annealing and annealing under high pressure. At this stage, one can predict that diffusion processes are suppressed by high pressure. The question arises as to what information about the grain boundary migration mechanisms can be drawn from high pressure studies. There are only a few papers where influence of high pressure on the grain growth [1] and migration of individual grain boundaries [2] was studied. It was found, that the activation energy and activation volume for grain boundary migration in aluminium bicrystals are larger than that for grain growth in aluminium polycrystals and depend on the grain boundary crystallography. Moreover, the high pressure had greater impact on the movement of high-angle grain boundaries than low-angle grain boundaries [3]. These theories refer to microstructural materials and they will be verified in the case of nanostructured materials.

 

References

[1] Hahn, H. and Gleiter, H. (1979). Scripta Metall., 14, 3-6.

[2] Molodov, D.A., Swiderski, J., Gottstein, G., Lojkowski, W. and Shvindlerman, L.S. (1994). Acta Metall. Mater., 42, 3397.

[3] Sursaeva V., Protasova S., Lojkowski W., Jun J. (1999). Textures an Microstruct., 32, 175-185

 

Acknowledgements

This work was supported by Polish NSC project No.UMO-2014/15/D/ST8/00532


Agnieszka KRAWCZYNSKA (Warsaw, Poland), Stanisław GIERLOTKA, Bogdan PALOSZ, Malgorzta LEWANDOWSKA
08:00 - 18:15 #5961 - MS01-606 Misfit of coherent precipitate phases in Al alloys measured by scanning transmission electron microscopy.
MS01-606 Misfit of coherent precipitate phases in Al alloys measured by scanning transmission electron microscopy.

The age-hardenable Al–Mg–Si alloy system is strengthened by needle-shaped β” phase precipitates that develop during heat treatment. The phase is fully coherent with the Al matrix, and induces a considerable strain field in the Al matrix, which is key to its hardening property. The lattice parameters of β” have been measured as an average over many precipitates using electron diffraction [1], but never systematically for specific precipitate shapes. Transmission electron microscopy is ideal for this task, although one must take care to avoid image distortions when accurate distances are to be measured. Multi-exposure scanning transmission electron microscopy (STEM) image series were processed to correct drift and scan distortions [2]. With such datasets, we can investigate the detailed atomic structure and ensure the precipitates to be defect-free, and at the same time measure relative atomic distances accurately. This enables the measurement of the misfit between the β” phase and the Al matrix, for which we employ the geometric phase analysis (GPA) technique [3]. As the misfit in the long direction of the particles is negligible, we concentrate on the a ([100]β’’) and b ([001]β’’) directions, which lie in the cross-sectional plane.

            24 precipitates with 15 distinct geometries were investigated [4]. Fig. 1 shows images of representative particles together with the average measured misfits for each geometry. The misfit is found to vary significantly between particles, in the range 1–7%. The misfit in either direction is inversely proportional to the particle width in that direction, as seen in Fig. 2(a). This works as an energy minimization mechanism, as the strain in the Al matrix is distributed evenly in its cross-sectional plane. The elasticity of the β” phase is similar to that of the Al matrix, which is in accordance with related literature [5]. The relative β”–Al misfit area is independent on particle shape, as shown in Fig. 2(b), and has a value of about 7%. A particle will grow during heat treatment until the strain from these extra 7% becomes too much to handle, and the particles loses coherency.

            The measured misfits give a good match to reported density functional theory (DFT) simulations for a β” phase with composition Mg5Al2Si4 within a range of precipitate geometries [6,7]. Two other likely compositions were tested, but were found not to fit with the shape-misfit relationship of the experimental data. The conclusions in this study will contribute to improving models for precipitation hardening from atomic to macroscopic scales.

 

[1] H.W. Zandbergen, S.J. Andersen, J. Jansen, Science 277 (1997) 1221–1225.

[2] L. Jones, H. Yang, T.J. Pennycook, M.S.J. Marshall, S. van Aert, N.D. Browning, M.R. Castell, P.D. Nellist, Adv. Struct. Chem. Imaging 1 (2015) 8.

[3] M.J. Hÿtch, E. Snoeck, R. Kilaas, Ultramicroscopy 74 (1998) 131–146.

[4] S. Wenner, R. Holmestad, Scripta Mater. 118 (2016) 5–8.

[5] A.G. Frøseth, R. Høier, P.M. Derlet, S.J. Andersen, C.D. Marioara, Phys. Rev. B, 67 (2003) 224106.

[6] F.J.H. Ehlers, S. Dumoulin, K. Marthinsen, R. Holmestad, Mater. Sci. Forum 794–796 (2014) 640–645.

[7] P.H. Ninive, O.M. Løvvik, A. Strandlie, Metall. Mater. Trans. A 45 (2014) 2916.

 

The authors would like to thank the Research Council of Norway (RCN) for funding of the FRINATEK project “Fundamental investigations of precipitation in the solid state with focus on Al-based alloys”. The TEM work was carried out on the NORTEM instrument JEOL ARM-200F, TEM Gemini Centre, Norwegian University of Science and Technology (NTNU), Norway. Acknowledgements are due to Dr. Lewys Jones for assistance with image processing.


Sigurd WENNER, Randi HOLMESTAD (Trondheim, Norway)
08:00 - 18:15 #6008 - MS01-608 Mechanical twinning and microstructure refinement in metastable titanium alloys.
MS01-608 Mechanical twinning and microstructure refinement in metastable titanium alloys.

Metastable beta titanium alloys gain increasing interest due to their unique properties such as high strength, good hardenability, high fracture toughness and excellent corrosion resistance. In this study two different metastable beta titanium alloys, Ti-15Mo and Ti-6.8Mo-4.5Fe-1.5Al (TIMETAL LCB) were subjected to severe plastic deformation (SPD) by high pressure torsion (HPT) technique. The main purpose of SPD methods is the insertion of large plastic deformation to the material without a change of the original shape of the material. The decreasing grain size and increasing the number of high-angle grain boundaries results in changes of mechanical and other physical properties. The main aim of this work is to analyse the effect of deformation on the microstructure and lattice defects. The initial stages of microstructure refinement were examined by electron backscatter diffraction (EBSD). The inverse pole map figure of Ti-15Mo alloy after N = ¼ HPT turns is depicted in the Figure 1.  It was shown that initial stages of deformation include misorientation within grains (see changing ‘colour’ along black line) and formation of low-angle sub-grain boundaries (black arrows). Moreover, it was proven that multiple twinning occurs in the material (Figure 2) which notably contributes notably to the microstructure refinement. Further microstructure refinement by HPT observed by transmission electron microscopy (TEM) and automated crystal orientation mapping (ACOM-TEM) will be also presented. 


Kristína VÁCLAVOVÁ (Prague 2, Czech Republic), Josef STRÁSKÝ, Petr HARCUBA, Jitka STRÁSKÁ, Josef VESELÝ, Veronika POLYAKOVA, Irina SEMENOVA
08:00 - 18:15 #6032 - MS01-610 EBSD Analysis of the Microstructural Evolution of Ni-Superalloys.
MS01-610 EBSD Analysis of the Microstructural Evolution of Ni-Superalloys.

Ni-superalloys are well known for their high strength, outstanding corrosion resistance and their resistance to both fatigue and creep, As a result, they are frequently used in gas-turbine and aero-engine applications. Inconel 625 also has a high resistance to chloride-ion stress-corrosion and is used in very aggressive environments. The strength of Inconel 625 is derived from the stiffening effect of molybdenum and niobium on its nickel-chromium matrix; thus precipitation-hardening treatments are not required. Control of the microstructure is very important with respect to the mechanical properties of the material. The microstructure changes during the hot rolling of the Inconel nickel-chromium superalloy 625 were investigated using FEG SEM. A detailed insight into the recrystallization behaviour during hot rolling was provided by an EBSD analysis (Figure 1). During the hot rolling the recrystallization starts on the grain boundaries, followed by the twin grain boundaries and, at even higher stresses, the recrystallization occurs on the (TiNb)CN phases inside the crystal grains. The EDS and EBSD results were able to explain the complex nature of the (TiNb)CN phases.


Matjaž GODEC (Ljublajna, Slovenia), Jaka BURJA, Bojan PODGORNIK, Franc TEHOVNIK
08:00 - 18:15 #6062 - MS01-612 Hexagonal patterning of 1-nm Gd nano-fibers based on dislocation templates in Mg-Gd alloys.
MS01-612 Hexagonal patterning of 1-nm Gd nano-fibers based on dislocation templates in Mg-Gd alloys.

Mg alloys, the lightest structural metal, generally suffer from low strength and poor deformability, and therefore severely restrict their widespread applications in automotive, aircraft, and aerospace industries. [1] The underlying reason for such mechanical behaviors is the anisotropic response inherent in the hexagonal close-packed (hcp) lattice of Mg. [2-3] Therefore, the key of advancing their applications is reducing the anisotropic behavior of different deformation modes, through regulating the relative activities of (easy) basal slips, (hard) non-basal slips, and twinning.

 

Herein, we demonstrate the new microstructure, the self-assembled hexagonal 1-nm Gd nano-fibers pattern within binary Mg-Gd alloys. [4] As shown in Fig.1, such hexagonal patterns are typically a few hundred nanometers in width and a few microns in length. These patterns are associated with dislocation templates. Such patterns include Gd-segregated dislocations with approximately 1 nm in diameter, which have a c-rod shape, and these in turn become effective inhibitors for basal slips since they have to cut these nano-fibers. On the other hand, non-basal slips suffer much less effect because the glide of non-basal dislocations has much less chances of cutting these Gd-segregations. Thus, these patterns can strengthen Mg alloys mainly through pinning basal dislocations; more importantly, tune the relative activities of basal and non-basal slips, and thus improve the deformability of Mg alloys. It is also worth mentioning that such patterning structure can be synthesized through a generally economical hot extrusion approach.

 

In summary, 1-nm Gd nano-fibers, with c-rod shape, are self-assembled into hexagonal patterns in Mg matrix, which can tune the relative activities of deformation modes and thus improve mechanical properties of Mg alloys. Our results open up a new path of engineering advanced Mg alloys though manipulating their microstructure.

 

 

References:

 

[1] I. J. Polmear, Light Alloys, 4th ed., Elsevier/Butterworth-Heinemann, Oxford, U.K., 2006.

[2] J. Koike, Acta. Mater. 51(2003), p. 2055-2065.

[3] J.-F. Nie, Metall. Mater. Trans. A 43(2012), p. 3891-3939.

[4] Y.X. Li, et al, (submitted).

 

Acknowledgments

 

We acknowledge the financial support from 1000Plan Professorship for Young Talents Program and the National Science Foundation of China (No. 51401124). We are grateful for the TEM specimens prepared by M. Shao and L. Jin. 


Guo-Zhen ZHU (Shanghai, China), Yangxin LI
08:00 - 18:15 #6073 - MS01-614 Graphite-to-diamond (13C) direct transition in a diamond anvil high-pressure cell.
MS01-614 Graphite-to-diamond (13C) direct transition in a diamond anvil high-pressure cell.

                 As the hardest material in nature, diamond is of great importance and interest for scientific studies. However, formation of a diamond is complicated process and requires extreme conditions. Bundy and Kasper (1967) for the first time synthesized a new form of carbon—hexagonal diamond – under conditions of static pressure exceeding about 13 GPa and temperature greater than about 1000°C [1]. At room temperature the crystal structure of graphite is stable up to pressure 15 GPa and loses some of the graphite features at higher pressure, forming metastable graphitic or amorphous phases [2]. Transition of polycrystalline graphite to diamond occurs after hydrostatic pressure treatment near 70 GPa [3]. The development of solid-state phase transitions, including those at the stage of nucleation and development of a new phase practically always is connected with the relaxation of elastic stress [4], and in case of graphite-diamond transformation the latter can play main role.

                The goal of the present work is the formation of diamond from graphite in direct phase transition in a diamond anvil high-pressure cell, where the relaxation of elastic stress can be realized by means of plastic deformation of the sample. The experiment was performed at room temperature without a catalyst.13С was subjected to the shear deformation under pressure of 25 GPa. The structure studies of the obtained material were made by transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). In order to prevent the confusion of the diamond obtained in the experiment with one of the diamond anvils we used graphite composed of 13C carbon isotope atoms as a precursor. The diamond anvils consisted of conventional 12C diamond. Before TEM examination of each sample a Raman spectroscopy was used to verify that it contains only 13C (diamond) and no 12C. TEM and EELS were carried out using JEOL JEM-2010 high-resolution transmission electron microscope.

TEM analysis has shown that the samples obtained in the series of our experiments contain several phases of carbon simultaneously. After the high pressure treatment in shear diamond anvil cell (SDAC) there were observed some fragments of the sample, which contained both hexagonal and rhombohedral graphite (significant amounts of the last one), and also diamond and lonsdaleite. Fig. 1 shows the fragment, where the rhombohedral graphite presents.

             Fig. 2a shows the diamond structure fragment with {111}-planes composing 70º. Interplanar distances are 0.206 nm. Fig. 2b shows the EELS-spectrum which can be unambiguously attributed to a diamond.

           Thus, it was shown that 13С-graphite directly transforms into 13С-diamond (at least particularly) without a catalyst at room temperature after treatment in SDAC under pressure of 25 GPa.

1 - Bundy, F.P., Kasper, J.S. (1967) ‘Hexagonal diamond – A New Form of Carbon’, The Journal of Chemical Physics, Vol. 46 No.9, pp.3437-3446.

2- Bundy, F.P., Bassett, W.A., Weathers, M.S., Hemley, R.J., Mao, H.K. and Goncharov, A.F. (1996) ‘The pressure-temperature phase and transformation diagram for carbon’, Carbon, Vol. 34 No.2, pp. 141-153.

3- Schindler, T.L., Vohra, Y.K. (1996) ‘A micro-Raman investigation of high-pressure quenched graphite’, Journal of Physics: Condensed Matter, Vol. 8 No.21, pp. 3963-3963.

4 - Christian, J.W., (2002) The Theory of Transformations in Metals and Alloys, 2nd ed., Pergamon Press, Oxford.


Elizaveta TYUKALOVA (Moscow,Troitsk, Russia), Boris KULNITSKIY, Igor PEREZHOGIN, Alexey KIRICHENKO, Vladimir BLANK
08:00 - 18:15 #5051 - MS02-616 Measuring the number of layers in 2D materials with SEM and AFM.
MS02-616 Measuring the number of layers in 2D materials with SEM and AFM.

2D transition metal chalcogenides enable exciting new applications in electronic devices and show great promise to replace traditional silicon technology as functional building blocks [1]. However, in order to realize this potential there is a range of fabrication and integration challenges that have to be overcome and suitable, non-destructive characterization techniques are needed. Due to their high resolution, electron optical characterization in scanning electron microscopes (SEMs) and atomic force microscope is ideally suited. We show how a full structural and compositional characterization can be obtained by combining EDS, EBSD and AFM analysis.

 

The number of layers present in a 2D material is critical to its performance. As figures 1 and 2 show, we can obtain data of sufficiently high quality to non-destructively measure the number of layers in 2D MoS2 and WSe2 as well as from heterostructures containing both materials by processing EDS data obtained in the SEM. Figure 1 shows an SEM image of a flake of MoS2 with two regions, one with two layers of MoS2 and one with one layer as verified by step height measurements in the AFM and by Raman spectroscopy. EDS spectra acquired from the two different regions show a clear difference in the peak height of the overlapping Mo L-lines and S-K lines. The difference can be quantified by processing the data in a special software designed to calculate the thickness of thin films on substrates (AZtec LayerProbe) [2]. For the calculation, a density of 5.06 g/cm3 was assumes for MoS2. The resulting values shown in figure 1 correspond well to a theoretical interlayer distance of 0.65nm.

 

In order to test whether this method is also suitable for heterostructures of 2D materials, we obtained measurements from a sample where a flake of MoS2 had been transferred onto a flake of WSe2. In the region of where the two flakes overlap, Raman spectroscopy showed that while there is only a single layer of WSe2 present, MoS2 occurs in one layer and two layers. Figure 2 indicates the different regions of interest on the sample. As the W-M line overlaps closely with the Si-K line, the Se-K line was used for the layer thickness measurement. The results in figure 2b show that both the WSe2 layer and the MoS2 layer thickness can be accurately determined.

 

We also show that Kelvin Probe force measurements (KPFM) can be used to image the contrast between different layer thicknesses in both single layers and heterostructures (figure 2c). Further work is necessary to determine whether the work function measured by KPFM can be quantified.

 

In order to add crystallographic data revealing misalignment between flakes, we can use EBSD. IPF maps of an area that contains several flakes of exfoliated MoS2 clearly indicate significant misalignment between some of the flakes (figure 3). This may aid the understanding of the exfoliation process which is still widely used to produce 2D materials for research purposes.

 

Our results indicate the great potential of SEM and AFM for the characterization of devices based on 2D materials and indicate avenues of further work to establish them as means for failure analysis and production quality control.

 

References:

 

[1] S.Z. Butler et al., ACS Nano 7 (2013), p. 2898.

[2] C. Lang et al., Microscopy and Microanalysis 19 (2013), p. 1872.


Christian LANG (High Wycombe, United Kingdom), Matthew HISCOCK, Ravi SUNDARAM, Jonathan MOFFAT, Kim LARSEN
08:00 - 18:15 #5069 - MS02-618 Observation of thermal behavior of black phosphorus as a 2D material.
MS02-618 Observation of thermal behavior of black phosphorus as a 2D material.

 Recent works have focused on a black phosphorus (black P) joined as a family of 2D materials, because of its tunable band gap depended on a thickness from 0.3eV in a bulk to more than 1.0eV in a few layers black P. Very recently, the successful fabrication of a single layer black P from the bulk has been reported. Additionally, unique properties of atomic layers of black P have been demonstrated such as high mobility, large on-off rations, and anisotropic properties and so on. With these results, the black P as a 2D material is extremely attractive in electronic and optoelectronic applications. However, there is a lack of characterization of the few layers black P and the reported properties are still in theory. Especially, the basic parameters concerned with the thermal stability are not determined, though the most thermodynamically stable phosphorus allotrope is the black P. Therefore, it is important to investigate the thermal phenomena of the black P in a various temperature condition within an atomic scale. In this study, we studied the reaction behavior of a single crystal black P under in situ heating conditions. In addition, the microstructure of black P at different temperatures was analyzed using high-resolution TEM (HRTEM).

ACKNOWLEDGMENTS

This work was supported by KBSI (Korea Basic Science Institute) grants to J.-G. Kim (T36210)


Seung Jo YOO, Ji-Hyun LEE, Sang-Gil LEE, Jin-Gyu KIM (Daejeon, Republic of Korea)
08:00 - 18:15 #5107 - MS02-620 Characterizing periodic lattice distortions accompanying commensurate charge density waves in single-layer and few-layer 1T-TaSe2.
MS02-620 Characterizing periodic lattice distortions accompanying commensurate charge density waves in single-layer and few-layer 1T-TaSe2.

Due to the discovery of the exceptional electronic and physical properties of graphene, and thanks to hard-ware aberration correction in TEM, a new research area on the atomic structure of other two-dimensional (2D) layered materials has emerged such as transition metal dichalcogenides (TMDs) whose properties differ strongly from those of the semimetallic character of graphene. The diverse properties of TMDs depend on their composition. These materials can be semiconductors, semimetals or true metals, and superconductors. Metallic TMDs like 1T/2H-TaSe2, 1T/2H-TaS2 or 2H-NbSe2 can produce ―depending on temperature, doping and pressure ― so-called charge density waves (CDWs) [1]. These waves are periodic modulations of the charge density in a material accompanied by periodic lattice distortions (PLDs), forming a superstructure in the material. They can occur during a metal-insulator transition due to electron-phonon coupling. CDWs/PLDs in TMDs are of great interest, because they are a model system to understand phenomena like superconductivity, spin density waves, and metal-insulator transitions. Already since the 1970s it is known that bulk 1T-TaSe2 shows a commensurate CDW (CCDW)/PLD at temperatures below 473 K [1] and the CCDW/PLD is characterized by a  superstructure with a lattice parameter of a0 = 3.48 Å. Owing to the layered structure of the TMD materials, nowadays single layers of these materials can be mechanical exfoliated. However, so far neither much is known about the stability and the characteristics of CDWs/PLDs in single- layer TMDs, nor whether they do exist at all in single-layers and/or few-layers due to confinement effects.

Here we present the experimental characterization of PLDs in single-layer and few-layer 1T-TaSe2 as well as in 1T-TaSe2-graphene heterostructures using aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) and selected area electron diffraction (SAED). Experimental observations of PLDs in single-layer 1T-TaSe2 are a challenge due to difficulties in sample preparation and due to electron beam damage occurring during the TEM experiment. In 1T-TaSe2 / graphene heterostructures, graphene is used as a support material for imaging a few micrometer large exfoliated 1T-TaSe2 monolayer. Moreover, graphene sandwiching is used to reduce radiation damage effects [2].  We perform our TEM experiments at a low accelerating voltage of 80 kV, however, the material is not stable under the electron beam and low-dose operation is required. Figure 1 -shows that PLDs can be found in few-layer-thick 1T-TaSe2 graphene heterostructures, Figure 1(a) shows an AC-HRTEM image of this heterostructure and Figure 1(b) the corresponding fast Fourier transformation (FFT). We will also present a method to analyze PLDs in single-layer 1T-TaSe2 using atomic scale mapping. In addition we shall show our first experiments obtained with the new spherical and chromatic aberration-corrected SALVE instrument operating in the range between 20kV and 80kV at exceptionally high-resolution. Results proving better understanding of electron-sample interaction will be also discussed. [3]

References

[1] J. A. Wilson, F. J. Di Salvo, and S. Mahajan, Advances in Physics 24.2 (1975): 117-201.

[2] G. Algara-Siller, S. Kurasch, M. Sedighi, O. Lehtinen, & U. Kaiser, Applied Physics Letters 103.20 (2013): 203107.

[3] The authors acknowledge funding from the German Research Foundation (DFG) and the Ministry of Science, Research and the Arts (MWK) of the federal state Baden-Württemberg, Germany in the frame of the SALVE (Sub-Angstroem Low-Voltage) project.


Pia BÖRNER (Ulm, Germany), Michael KINYANJUI, Tibor LEHNERT, Janis KÖSTER, Ute KAISER
08:00 - 18:15 #5129 - MS02-622 Time-resolved imaging and analysis of single atom diffusion on graphene oxide.
MS02-622 Time-resolved imaging and analysis of single atom diffusion on graphene oxide.

Single atoms and small atomic clusters offer a range of novel, tunable properties for a number of applications such as selective catalysis [1]. Achieving precise control of the desired properties of these systems first requires an understanding of the interaction between the cluster and its support. Advances in aberration-corrected scanning transmission electron microscopy (STEM) mean that atomic resolution imaging and characterisation is now achievable for many materials. Observing individual atoms and small clusters remains difficult, however, due to low signal-to-noise ratio and beam-induced motions causing blurring during image acquisition. One route around these problems is to acquire rapid image sequences in an effort to reduce the electron dose and also to capture any dynamic behaviour of the atoms. Making use of the spatial and temporal correlations between frames, and using a novel processing method based on singular value thresholding [2], we have developed robust approaches to recover individual atomic positions, including STEM acquisition rates of 10 frames per second or better [3].

We have applied the approach to the study of catalytically-important copper atoms on few-layer graphene oxide (GO), where the presence of functional groups on GO may aid the control of deposited clusters by acting as preferential pinning sites. Processing and analysis of an annular dark-field STEM image sequence reveals a range of behaviours, with some strongly-pinned atoms and other more mobile atoms undertaking random walks on the surface (Figure 1b). Further investigation of the jump distances (Figure 1c) and mean-squared displacements (Figure 1d) reveals that the diffusion of adatoms on GO is anomalous. We combine this information with ab-initio DFT calculations to provide new insight into the formation and behaviour of small atom clusters under an electron beam, and the interactions between few-atom catalysts and high surface area supports.

References

[1] Tyo, EC, Vajda, S. (2015). Nat. Nanotechnol. 10, 577-588.

[2] Candes EJ, Sing-Long CA, Trzasko JD. (2013). IEEE Trans. Signal Process. 61, 4643-4657.

[3] Furnival T, Leary R, Midgley PA. (2016). Manuscript submitted.

The research leading to these results has received funding from the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013)/ERC grant agreement 291522-3DIMAGE.


Tom FURNIVAL (Cambridge, United Kingdom), Rowan LEARY, Eric C TYO, Stefan VAJDA, John Meurig THOMAS, Paul D BRISTOWE, Paul A MIDGLEY
08:00 - 18:15 #5456 - MS02-624 3D Investigation of InGaN Nanodisks in GaN Nanowires.
MS02-624 3D Investigation of InGaN Nanodisks in GaN Nanowires.

Nanoscaled structures like nanowires (NWs) can influence device characteristics (e.g. higher internal efficiency [1]), making them very suitable for the application in optoelectronic devices. Complex structures like InGaN nanodisks (NDs) embedded in GaN NWs can for example be used as active regions of tunable color and white light LEDs [2,3].

The GaN NWs investigated in this work have been grown via plasma-assisted molecular-beam epitaxy on n-type Si (111) substrates and contain 10x InGaN NDs. The growth direction was [000-1] and the NWs exhibit a hexagonal base with (1-100) planes (m-plane) forming the side facets. The TEM analysis of InGaN/GaN NWs grown under comparable growth parameters is reported in [4]. There it was shown that the ~4nm thick InGaN NDs exhibit a truncated pyramidal shape consisting of a (0001) central facet that is delimited by declining sixfold {10-1l} facets, where l can be -1, -2 or -3. In addition to this declined facets a continuation of the (0001) central facet towards the m-plane sidewalls of the NWs could be observed but is not described in the published STEM images [4]. Since these images contain projected information they do not deliver knowledge on the real shape of the NDs.

To obtain a deeper insight into the three dimensional geometry of the embedded InGaN NDs electron tomography is the method of choice.

Conventional sample preparation (spread NWs over a carbon film lying on a TEM grid) just allows tilting in a range of approximately +/-70° leading to a strong missing wedge effect [5]. The concomitant reduction of the resolution makes a meaningful reconstruction of the InGaN NDs impossible.  

To overcome this problem the sample needs to be prepared in such a way that a sample tilt of +/-90° is permitted. For this procedure we used a SEM (JIB 4601F, JEOL) with an integrated manipulator needle (Kleindiek). First of all a conventional FIB-lift-out-grid (Pelco, Ted Pella) with four narrow posts was trimmed with a scalpel in such a way, that the grid width was reduced from 3mm to less than 1.5mm and that just one post was left. On top of this post an electron beam induced, turret shaped tungsten structure was deposited in the SEM to create an exposed position on which the NW could be attached without any risk of shadowing effects during the tilt series in TEM. Using the manipulator needle a few NWs have been detached from the Si substrate and transferred to the FIB-lift-out-grid (cf Figure 1a). The NW that is most suitable oriented was brought closer to the top of the tungsten deposition. Since the attractive force between needle-NW and tungsten deposition-NW, respectively, are strong a deposition for connection is not necessarily required (cf Figure 1b).

Electron tomography measurements were performed in STEM mode (JEM 2200FS, JEOL using a model 2030, Fischione tomography holder) with a tilt range of -90° until +82° (the tilt angle limitation is due to a restriction of the TEM stage and not related to the sample geometry) and a tilt step of 2°. For reconstruction of the data the software IMOD [6] was used.

Figure 2 shows a section through the middle of a NW running parallel to the (11-20) plane (a-plane). Within this image two features can be observed. First the faceting of the InGaN NDs with an increased steepness of the inclination angle of the side facets for higher lying NDs can be seen. The inclination angle fits well to the above mentioned {10-1l} planes. Second the yellow circle marks a region where the afore-noted split of NDs appears. This is particularly interesting since this structure could be easily attributed to projection artifacts in conventional STEM images.

This example shows, that selecting a sample geometry which allows a tilt angle range as high as possible, is essential for obtaining the required resolution.

[1] D.J. Sirbuly et al., J. Phys. Chem. B 109 (2005) 15190-15213

[2] R. Armitage and K. Tsubaki, Nanotechnology 21 (2010) 195202-1-195202-7

[3] W. Guo et al., Appl. Phys. Lett. 98 (2011) 193102-1-193102-3

[4] Th. Kehagias et al., Nanotechnology 24 (2013) 435702-1-435702-14

[5] I. Arslan et al., Ultramicroscopy 106(11-12) (2006) 994-1000

[6] J.R. Kremer et al., J. Struct. Biol. 116 (1996) 71-76

[7] We acknowledge support of the German Science Foundation (DFG) in the framework of the Collaborative Research Centre “Structure and Dynamics of Internal Interfaces” (SFB 1083)


Katharina I. GRIES (Marburg, Germany), Julian SCHLECHTWEG, Andreas BEYER, Pascal HILLE, Jörg SCHÖRMANN, Martin EICKHOFF, Kerstin VOLZ
08:00 - 18:15 #5670 - MS02-626 Ultra-thin epitaxial selenide films: Structure and two-dimensional properties.
MS02-626 Ultra-thin epitaxial selenide films: Structure and two-dimensional properties.

Ultra-thin films of selenide compound epilayers were deposited epitaxially by molecular beam epitaxy (MBE) on AlN(0001) / Si(111) templates and were studied structurally using high resolution transmission electron microscopy (HRTEM), image simulations, and geometrical phase analysis (GPA). The films comprised Bi2Se3, MoSe2, and HfSe2 epilayers, as well as composite heterostructures of these materials.  Wurtzite AlN is a wide band gap semiconductor that strongly favors an excellent interfacial quality with the selenides under the employed growth conditions contrary to direct deposition on silicon that leads to interfacial amorphization and extended defects in the film. The structural observations were combined with angle-resolved photoelectron spectroscopy measurements.

Bi2Se3 is a topological insulator (TI), and the deposited films exhibited a surface Dirac cone making them promising for novel spintronics and quantum computing applications. HRTEM, combined with GPA, showed an epitaxial well-ordered interface with (0001) AlN. The interfacial periodicity was manifested by a 3:4 plane matching. No interdiffusion or chemical reaction was observed at the interface. High quality and large scale 2D films with thicknesses of 3 and 5 quintuple layers (QLs) were deposited [1]. The films contained only vertical and in-plane 180o rotational domain boundaries, as shown in Fig. 1.

In addition, high quality films of a few monolayers (MLs) of MoSe2 and HfSe2 compound semiconductors were deposited in extended scale by MBE directly on AlN(0001), showing promise for nanoelectronic device applications mediated by the van der Waals bonding [2]. In an alternative approach, Bi2Se3 was employed as buffer layer in order to maintain low growth temperatures that favor large scale manufacture. Furthermore, various combinations of alternating selenide layers were achieved, signifying a versatility towards advanced nanodevice possibilities and prospects for combined 2D semiconductor/TI applications. Cross sectional HRTEM, in conjunction with image simulations elucidated the interfaces between dissimilar materials. Variations in lattice spacings were obtained by GPA. Such a heterostructure is illustrated in Fig. 2.

 

[1] P. Tsipas, E. Xenogiannopoulou, S. Kassavetis, D. Tsoutsou, E. Golias, C. Bazioti, G. P. Dimitrakopulos, Ph. Komninou, H. Liang, M. Caymax, A. Dimoulas, ACS Nano, 8, 6614 (2014).

[2] E. Xenogiannopoulou, P. Tsipas, K. E. Aretouli, D. Tsoutsou, S. A. Giamini, C. Bazioti, G.P. Dimitrakopulos, Ph. Komninou, S. Brems, C. Hughebaert, I. P. Radu, A. Dimoulas, Nanoscale, 7, 7896 (2015).

 

Acknowledgement: Work partially supported by the ERC Advanced Grant SMARTGATE-291260- and the National program of excellence (ARISTEIA-745) through the project TOP-ELECTRONICS.


Calliope BAZIOTI, George DIMITRAKOPULOS, Polychronis TSIPAS, Evangelia XENOGIANNOPOULOU, Athanasios DIMOULAS, Philomela KOMNINOU (Thessaloniki, Greece)
08:00 - 18:15 #5738 - MS02-628 Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures.
MS02-628 Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures.

Sub-Angstrom resolution at medium accelerating voltages of 200-300 kV is routinely achieved in standard transmission electron microscopes by hardware correction of the spherical aberration of the imaging lenses [1, 2]. At such voltages, defective, very thin and/or light-element materials very often suffer from knock-on damage, demanding experiments at the lower voltage ends of the microscopes, which are by default 80kV resp. 60kV with a resolution limited to approximately 2Å. Often, however, the achievable resolution at these voltages is not sufficient to understand the electron beam-matter interactions. Consequently, there is a demand for instrumentation that allows atomic-resolution at much lower voltages [3]. Using a standard field-emission electron source, the resolution is strongly limited by the chromatic aberration of the imaging lens requesting hardware aberration corrector that corrects for both, spherical and chromatic aberrations of the objective lens [4, 5].

Here, we report results towards understanding voltage-dependent electron beam-sample interaction for single-layer MoS2 and MoS2-graphene heterostructures using our newly developed Cc/Cs – corrected Sub-Angstrom Low-Voltage Electron Microscope (SALVE) operating at voltages between 20-80kV [6]. Damage cross-sections are determined by directly counting the vacancies produced during the high-resolution TEM experiments obtained at defined voltages and with defined electron doses. As the vacancies are created by different damage mechanisms as knock-on damage, radiolysis, ionization, and chemical etching, we discuss our results in the light of these mechanisms, with the aim to separate their contributions. Similar 80kV Cs-corrected HRTEM studies have been performed earlier albeit with much lower resolution [7]: in this case the resolution is about half the resolution obtained at 30kV (Cc/Cs) (see for comparison Figure 1).  As the knock-on threshold energy for sulfur atoms in MoS2 has been calculated to be about 90 keV [8], the measured increase in the damage rates from 80 to 30 kV is attributed to radiolysis and ionization effects because of increased scattering cross-sections [9].

References

[1] M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius & K. Urban, Nature 392, 768-769 (1998)

[2] O.L. Krivanek, N. Dellby, M.F. Murfitt, M.F. Chisholm, T.J. Pennycook, K. Suenaga, V. Nicolosi; Ultramicroscopy 110(8), 935 – 945 (2010)

[3] P. Hartel, M. Linck, H. Müller, S. Uhlemann, J. Biskupek, U. Kaiser, M. Niestadt and M. Haider, Microscopy and Microanalysis July 2016

[4] M. Haider, P. Hartel, H. Müller, S. Uhlemann, & J. Zach, (2010) Microscopy and Microanalysis, 16(04), 393-408.

[5] U. Kaiser, J. Biskupek, J. Mayer, J. Leschner, L. Lechner, H. Rose, M. Stöger-Pollach, A. Khlobystov, P. Hartel, H. Müller, M. Haider, S. Eyhusen, G. Benner; Ultramicroscopy 111 (8), 1239 – 1246 (2011)

[6] www.salve-projcet.de

[7] G. Algara-Siller, S. Kurasch, M. Sedighi, O. Lehtinen, U. Kaiser, Appl. Phys. Lett. 103(20) , (2013)

[8] H.P. Komsa, J. Kotakoski, S. Kurasch, O. Lehtinen, U. Kaiser, A.V. Krasheninnikov, Phys. Rev. Lett. 109, 035503 (2012)

[9] The authors acknowledge funding from the German Research Foundation (DFG) and the Ministry of Science, Research and the Arts (MWK) of the federal state Baden-Württemberg, Germany in the frame of the SALVE (Sub-Angstrom Low-Voltage) project


Tibor LEHNERT (Ulm, Germany), Johannes BISKUPEK, Janis KÖSTER, Martin LINCK, Ute KAISER
08:00 - 18:15 #5756 - MS02-630 In situ High Temperature ESEM study of carbon nanotubes reactivity under oxidative conditions.
MS02-630 In situ High Temperature ESEM study of carbon nanotubes reactivity under oxidative conditions.

Due to their extraordinary mechanical, electrical, optical, thermal … properties, single wall carbon nanotubes (SWCNTs) have attracted tremendous studies in the last 20 years. However, most of these properties are closely related with the defects present in the carbon layer and with the chirality of the SWNCTs. Two specific studies have been performed in order to better understand the high temperature behavior of SWCNTs, using the high temperature device attached with the environmental scanning electron microscope (HT-ESEM mode).

 

SWCNTs imaging (Fig. 1): Isolated SWCNTs cannot be observed directly in the HT-ESEM due to the relatively poor resolution of this technique. The SWCNTs are deposited on an insulating substrate and low voltage (1-3kV) charge contrast imaging is used to directly observe the CNTs. While the ESEM is not supposed to operate in such high voltage conditions at high temperature, aligned CNTs images have been recorded under various gas compositions and pressures using the gaseous secondary electron detector. These images have demonstrated the possibility to observe the SWCNTs at high temperature in the ESEM and have opened the path for further in situ experiments in the microscope chamber.

 

We studied the chemical reactivity of individual single-walled carbon nanotubes on oxide substrates toward oxygen etching using HT-ESEM (Fig. 2) coupled with AFM observations. Our in situ observations show that the reactivity of carbon nanotubes on substrates is different from that of free-standing ones. In particular, semiconducting nanotubes appear as or slightly more reactive than metallic ones, showing that the nanotube type has a secondary influence compared with that of the substrate. In addition, carbon nanotubes are not progressively etched from their ends as frequently assumed but disappear segment by segment. Atomic force microscopy before and after oxidation reveals that nanotube oxidation proceeds first by a local cutting leading to two separate nanotube segments, which is then followed by a rapid etching of the segment that has been electrically disconnected from others. In addition, our study shows that exposure to electron and laser beams can strongly increase the chemical reactivity of single-walled carbon nanotubes on substrates. These results are rationalized by considering i) the effect of substrate-trapped charges on the nanotube density of states close to the Fermi level, and ii) the effect of electron and laser beams on the density of these surface charges.

 

[1] H. A. Mehedi, J. Ravaux, Y. Khadija, T. Michel, S. Taïr, M. Odorico, R. Podor, V. Jourdain Oxidation Mechanism of Individual Single-Walled Carbon Nanotubes on Substrate Monitored by in situ Scanning Electron Microscopy. Nano Research (2016) 9 519-527


Hassan-Al MEHEDI, Renaud PODOR (ICSM, Marcoule), Johann RAVAUX, Thierry MICHEL, Said TAHIR, Khadija YAZDA, Michael ODORICO, Vincent JOURDAIN
08:00 - 18:15 #5780 - MS02-632 Precise STEM measurement of defocus and aberration in monolayer graphene.
MS02-632 Precise STEM measurement of defocus and aberration in monolayer graphene.

 Improvements to the Z height resolution in a scanning transmission / transmission electron microscope (S/TEM) are important for 3D reconstruction of local specimen topography and for quantitative image analysis using comparisons of experimental images to simulations.  The lateral position perpendicular to the direction of the electron trajectory in aberration corrected S/TEM instruments has a sensitivity comparable to most atomic spacing which can be directly determined in experimental images to an accuracy of a few pm.  However, the resolution in the Z direction parallel to the electron trajectory is of the order of only a few nm as determined by direct experimental measurement using confocal electron microscopy of extended objects [1] or in HAADF STEM images of point like objects [2].  This resolution is an order of magnitude larger most atomic spacing and therefore to accurately determine Z height information at atomic resolution, a method for precise measurement of the specimen height is required.

Toward obtain better accuracy for Z direction measurements, we have used the lateral magnification change of an ideal specimen of monolayer graphene, where in reciprocal space with a probe forming mode, the magnification of the lattice depends on the value of the defocus.  Ronchigrams have been recorded with a focused STEM probe of atomic dimensions at a large camera length of 80 cm at 80 kV [Fig. 1(a)].  The Ronchigram was divided into local angular areas to analyze the local magnification dependent on the probe-forming aberrations.  Importantly the lattice parameter of graphene is accurately known and changes in the lattice pattern with beam tilt or specimen tilt are smaller than for other, thicker crystalline specimens.  The local magnification in each local area was analyzed using an auto-correlation function [Fig.1(b)] [3].  Six peaks surrounding the center peak of the auto-correlation function from a graphene image were identified and were fitted with an oval [Fig.1(c)].  Using the fitted parameters describing the oval shapes at local angular areas, the distance between the probe and the graphene monolayer (defocus) was measured precisely to be - 58.52 nm.  Since the lattice parameter of a specimen is known, only one Ronchigram pattern is required to derive the value of defocus. Other aberration coefficients for the probe forming lens also can be calculated using this method [Table. 1].

[1] P. Wang, et. al. Physical Review Letters, 104, 200801 (2010).

[2] K .Benthema, et. al. Applied Physics Letters 87, 034104 (2005).

[3] H. Sawada, et al, Ultramicroscopy 108, 1467 (2008).


Hidetaka SAWADA (Oxford, United Kingdom), Angus KIRKLAND
08:00 - 18:15 #5800 - MS02-634 Revealing Formation Mechanism of Self-Induced InAlN Core-Shell Nanorods by Aberration-Corrected TEM.
MS02-634 Revealing Formation Mechanism of Self-Induced InAlN Core-Shell Nanorods by Aberration-Corrected TEM.

The interest in nanoscale structures has gained immense momentum due to their scientific and technological potentials. Among accessible nanostructures, semiconductor materials fabricated as one-dimensional nanorods (NRs) offer fascinating physical properties and engineering capabilities for active components in present and future nanoscale functional devices [1]. In particular, group-III nitride semiconductor NRs based on AlN, GaN, InN and their ternary alloys are attractive due to the widely tunable direct bandgap (0.64-6.2 eV), high crystal quality and improved light extraction efficiency. Recently, self-induced core-shell ternary nitride NRs have been demonstrated [2-5]. However, the understanding of the formation mechanism and self-induced separation remains debated. In this work we investigated the formation mechanism of self-induced core-shell InAlN NRs growth on an amorphous C substrate.

A number of InAlN samples were grown by magnetron sputtering epitaxy directly onto TEM grids which supports amorphous C films (substrates) with varying growth time. Apart from the otherwise identical growth conditions, the growth time (t) was varied in the steps of t=1, 2, 3, 5, and 20 min for the different samples. The obtained samples were subsequently investigated in plan-view projection using the doubly-corrected Linköping FEI Titan3 60-300. The microscope is equipped with a monochromated X-FEG high-brightness gun, efficient high solid angle Super-X EDX detector and ultrafast Gatan GIF Quantum ERS post-column imaging filter.

A time series of InAlN NR formation, at different nucleation and growth stage, imaged by plan-view STEM-HAADF together with corresponding SAED patterns, is shown in Fig. 1. The imaging conditions strongly promote image contrast dependence on the mass (Z number) and sample thickness with reduced diffraction contrast contributions. The bright features exhibit high mass and indicate that they are In-enriched. Al and In elemental distribution in the grown samples were examined using EDX elemental mapping as shown in Fig. 2. The elemental maps corroborate that the bright features (in Fig. 1) are In-enriched (InAlN) islands, while less bright areas represent Al-rich (InAlN) islands in the 1 and 2 min samples. The situation is somewhat more complex for the samples with extended growth time (3, 5, and 20 min), where the thickness contribution to the STEM-HAADF and EDX intensities must also be considered. Additionally, we performed EDX quantification, SAED pattern analysis, high-resolution TEM and STEM-HAADF imaging as well as statistical STEM-HAADF image contrast analysis.

By investigating different InAlN sample at different growth time we were able to follow NRs evolution process: from initial In-rich InAlN seed nucleation to final NR core-shell formation. This enabled us to derive NR formation scenario as a function of the growth time, see Fig. 3. The NR formation process can be divided into two distinct regimes. I) the nucleation and coalescence phase where In-enriched islands are surrounded by Al-rich, and II) the growth phase during which the In-enriched islands develop into cores and the surrounding Al-rich environment develop into shells around the cores, and the core-shell structure eventually reach a steady state NR growth. To account for the present observations we consider a number of factors affecting the NRs formation, including: adatom (In, Al, and N) surface kinetics (adsorption, desorption and surface diffusion), chemical potential, surface energy, thermal stability, and incoming flux (shadowing effect) during dual magnetron sputter epitaxy.

 

References:

[1] C. R. Eddy Jr., et al., J. Vac. Sci. Technol. A 31, 058501 (2013).

[2] C.-L. Hsiao, et al., Appl. Phys. Exp. 4, 115002 (2011).

[3] M. Gómez-Gómez, et al., Nanotechnology. 25, 075705 (2014).

[4] R. F. Webster, et al., Phys. Status Solidi C 11, 417–420 (2014).

[5] C.-L. Hsiao, et al., Nano Letters 15(1), 294-300 (2015).


Justinas PALISAITIS (Linköping, Sweden), Ching-Lien HSIAO, Lars HULTMAN, Jens BIRCH, Per O. Å. PERSSON
08:00 - 18:15 #5837 - MS02-636 EELS Investigation of the Work Function Reduction in Au decorated ZnO Nanotapers.
MS02-636 EELS Investigation of the Work Function Reduction in Au decorated ZnO Nanotapers.

The study of field emission (FE) from one dimensional (1D) nanostructures is emerging as a promising technology that can make a considerable contribution in the development of next generation devices such as electron microscopes, x-ray sources, flat panel displays and microwave devices. Generally, FE from carbon nanotubes has been extensively studied, although these have high work function (~5.2 eV) and low electron emission. The electron emission is also influenced by the density of state (DOS) of the emission site. The DOS can be increased by either some doping or by coating the surface with a much higher DOS material. Owing to the low work function, enhanced currents have been demonstrated in several ZnO systems, for example nanowires, nanopins, nanorods, tetrapod like, nitrogen implanted nanowires, Au coated ZnO nanowires etc. The Au-coated ZnO nanowires show low turn-on potential and excellent stability. The work function of ZnO can be altered either by hybridization with a donor organometallic, or inorganic molecule / polymer by the attachment of dipolar self-assembled monolayers perpendicular to the surface of ZnO, which induces charge transfer between the adsorbate molecule and substrate surface. The incorporation of Au ions on the surface modifies the surface morphology and that influences the enhanced field emission by lowering the Φ. The possibility of tuning the band gap by coating the ZnO surface with Au nanoparticles is very important because of its potential application in light emission devices in the ultraviolet (UV) region.

 

For this work, ZnO nanotapers samples have been coated using different Au particles size and analyzed using means of local conductive atomic force microscopy (CAFM) to measure the local conductance and also electron energy loss spectroscopy (EELS) in a STEM microscope to investigate the chemistry across the Au-ZnO interface as function of the Au particles size. The surface modification of the ZnO due to the Au decoration can alter the bandgap which might lead to potential applications for light emitting devices.  The bandgap was measured using high-energy resolution EELS analysis and appears to be dependent upon the Au particles size on the ZnO surface.

 

Figure 1 shows the ADF STEM image of the ZnO rod with some Au particles decorating the surface. EELS STEM was carried out across the Au-ZnO interface along the line shown in Figure 1. Figure 2 shows the O K-edge EELS spectra extracted from across the Au-ZnO interface and away in the ZnO region. The two spectra are clearly different. In particular, the peaks labeled as 2 and 3 in Figure 2 are much more defined than those in the spectrum extracted across the Au-ZnO interface. This is the clear sign that the incorporation of Au particles onto the surface modify the surface morphology and as result the Zn-O bonding. The same EELS STEM analysis was repeated across the Au-ZnO interfaces from samples decorated with different Au particles size and we have observed different features in the O K-edge in the EELS spectrum. This is evidence that the interaction with the Au particles modifies the ZnO surface and the effect is Au particle size dependent.


Avanendra SINGH, Paolo LONGO (Pleasanton, USA), Kartik SENAPATI, Ray TWESTEN, Pratap SAHOO
08:00 - 18:15 #5866 - MS02-638 Spontaneous formation of core–shell GaAsP nanowires with enhanced electrical conductivity.
MS02-638 Spontaneous formation of core–shell GaAsP nanowires with enhanced electrical conductivity.

The growth of GaAsP nanowires on GaAs (111)B substrates exhibit a core-shell heterosturture with P-enriched cores, which is attributed to Au catalysts enhancement of the local decomposition of PH3. These core–shell GaAsP nanowires exhibit enhanced electrical conductivity when compared with uniform GaAsP nanowires. This study provides an approach to enhance the electrical conductivity of III–V semiconductor nanowires.

Introduction: Ternary III-V epitaxial nanowires allow a continuous tuning of the bandgap, and they are also are required for fabricating complex radial/axial heterostructures devices.1 During the Au-catalyzed growth of III–V nanowires, group III and group V elements take different pathways to incorporate into the nanowires: group III elements through alloying with the Au catalyst, while group V elements through the triple phase line.2 In this study, the composition distribution between two group V elements was studied, and the electrical properties of these core–shell ternary GaAsP nanowires were investigated.

Experiment: GaAsP nanowires were epitaxially grown on the GaAs (111)B substrates using a horizontal flow MOCVD reactor at the pressure of 100 mbar with ultrahigh purity H2 as the carrier gas. Trimethylgallium (TMG) and was used as the group-III source, while PH3 and AsH3 were used as the group-V sources. Nanowires were grown at 500 °C and 420 °C for 30 min with a V/III ratio of 39.3 and a PH3/( PH3 + AsH3) ratio of 0.98. Electron microscopies were used to investigate the characteristics and transport measurements of grown nanowires.3

Results and discussion: SEM study showed that most nanowires synthesized at 500 °C grew vertically on the GaAs {111}B substrate with a tapered morphology. The nanowire quantitative analyses of EDS spectra taken from different sections indicate that the compositional distribution along the nanowire is uneven. The As/(P + As) ratio increases from 19 at% at the top to 22 at% at the middle and to 25 at% at the bottom of the nanowire. The tapered nanowire morphology suggests that lateral growth took place during the nanowire growth at 500 °C,3 which would lead to the formation of a shell. To clarify whether our tapered nanowires have a core–shell structure, TEM investigations were carried out on cross-sections of individual nanowires sliced from the tip, the middle and the bottom regions. Fig. 1(a) is a typical example of cross-section obtained from the bottom region of a nanowire, and shows a truncated-triangular shaped cross-section. Fig. 1(b) is a corresponding SAED. It should be noted that the As concentration in the centre (Fig. 1c) is similar to that of tip region of nanowire, indicating that the As concentration in the nanowire core is uniform along the nanowires. The EDS maps in Fig. 1(f, g) clearly identify the enriched P core and the enriched As shell. The formation of the core-shell GaAsP nanowires was attributed to two facts: (1) Since Au catalysts can enhance the decomposition of PH3.4 the P concentration around the nanowire catalysts should be higher than the general environment, leading to a relatively higher P concentration in the nanowire core; (2) the sticking coefficient of As adatoms is higher than that of P adatoms,5 and therefore, it is possible that As is preferentially incorporated on the sidewall of the formally formed core, leading to the higher concentration of As in the nanowire shells.

Vertically grown GaAsP nanowires at a temperature of 420 °C are uniform in their lateral dimension, as shown in Fig. 2(a). The compositional distribution along the nanowire is uniform with an As/(P + As) ratio of approximately 48 at% at the top (Fig. 2(c)) and approximately 47 at% at the bottom (Fig. 2(d)) of the nanowire. EDS maps in Fig. 2(f) and (g) shows the evenly distributed As and P across the nanowire cross-section, indicating that the GaAsP nanowires grown at 420 °C are homogeneous nanowires. Fig. 3 shows the I–V characteristics of the GaAsP nanowires synthesis at different temperatures. The homogeneous GaAsP nanowire grown at 420 °C show no electrical conductivity, while the core–shell GaAsP nanowires are capable of enhanced conductivity. It is likely that the band offset6 in core–shell nanowires could lead to the accumulation of carrier gas at core–shell interfaces, and in turn, the enhanced conductivity in undoped nanowires.

References:

1Y. Kim, H. J. Joyce, and et al, Nano Letters 6, 599 (2006).

2K. A. Dick, K. Deppert, and et al, Adv. Funct. Mater., 15, 1603 (2005).

3J. Zou, M. Paladugu, and et al, Small, 3, 389 (2007).

4M. A. Verheijen, G. Immink, and et al, J. Am. Chem. Soc., 128, 1353 (2006).

5Y. Y. Zhang, M. Aagesen, and et al, Nano Lett., 13, 3897 (2013).

6E. Dimakis, U. Jahn, and et al, Nano Lett., 14, 2604 (2014).


Wen SUN (Beijing, China), Yang HUANG, Yanan GUO, Zhiming LIAO, Qiang GAO, Hark Hoe TAN, Chennupati JAGADISH, Xiaozhou LIAO, Jin ZOU
08:00 - 18:15 #5902 - MS02-640 Nanoscale Chemical Mapping of GdX3@WS2 Nanotubes by EDS-STEM Tomography.
MS02-640 Nanoscale Chemical Mapping of GdX3@WS2 Nanotubes by EDS-STEM Tomography.

The hollow interiors of nanotubes could host the growth or filling of foreign elements/compounds to obtain hetero-structures. The growth of these materials in the confined one dimensional space lead to novel properties. Capillary filling serves as a method to enable filling of carbon nanotubes and inorganic nanotubes including those of BN and WS2.1, 2 In this work, considering the biocompatibility of WS2 and paramagnetic property of gadolinium (III) compounds, capillary filling is employed to obtain GdX3@WS2 nanotubes (X=Cl, Br, I).  The precise determination of the structure and composition is detrimental in its further application. Thus in the present study the morphology, structure and chemical composition of the synthesized GdI3 filled WS2 is investigated using aberration corrected scanning/transmission electron microscopy and associated spectroscopic techniques (EELS and EDS). The three-dimensional morphology is investigated using HAADF-STEM tomography but obtaining three dimensional composition information is non-trivial due to the presence of multiple high atomic number elements. Therefore, EDS-STEM tomography is employed in the present study to map the chemical composition in three dimensions.3 In order to reduce the beam induced effects on the specimen, tomography experiments were carried out at 80 kV in the present case. In view of the long duration of electron beam exposure necessary to perform EDS-STEM tomography, additional electron irradiation studies were carried out to optimize the EDS-STEM tomography conditions.

References

 [1]. Ronen Kreizman, Andrey N. Enyashin, Francis Leonard Deepak, Ana Albu-Yaron, Ronit Popovitz-Biro, Gotthard Seifert, and Reshef Tenne,  Adv. Funct. Mater., 20 (2010) 2459–2468 

[2].  Elok Fidiani, Pedro M. F. J. Costa, Anja U. B. Wolter, Diana Maier, Bernd Buechner, and Silke Hampel, J. Phys. Chem. C, 117 (2013) 16725−16733

[3]. Georg Haberfehlner, Angelina Orthacker, Mihaela Albu, Jiehua Li and Gerald Kothleitner, Nanoscale, 6 (2014) 14563–14569


Anumol E. A. (Braga, Portugal), Francis LEONARD DEEPAK
08:00 - 18:15 #5960 - MS02-642 Characterization of Branched Carbon Nanostructures.
MS02-642 Characterization of Branched Carbon Nanostructures.

Branched carbon nanostructures such as branched-Multi-Walled Carbon Nanotubes (b-MWCNTs, Fig. 1) are exotic types of carbon nanostructures whose technological potential have not yet been fully explored. Although MWCNTs have been used to improve the properties of composite materials, there are currently still two main problems remaining to be solved before MWCNT/composite materials can realize their full potential:-

(1) adequate dispersion of the nanotube-reinforcement material, and

(2) strong enough interfacial bonding between the nanotube-reinforcement elements and the composite matrix.

These problems can be addressed by utilizing branched-carbon nanostructures as it is known (from theory and simulation experiments) that branched fibres greatly enhance interfacial bonding e.g. the ancient process of adding straw to mud to make stronger bricks. It is well known that, in the case of carbon nanotube networks, junction resistance is the dominant limiting factor and so, a network of branched-carbon nanostructures would significantly reduce this network resistance. . Therefore, in addition to potential improvements in composite applications, the electrical properties of networks made of branched-carbon nanostructures could have major benefits to the existing commercial application of CNT/CNF reinforced composites in Conductive Static Dissipation (ESD) as well as potential use in Supercapacitors, Solar Cells and Li-Ion batteries.

Acknowledgements: S. M. acknowledges the continuing support of Prof Dr M. M. Kappes. This work was partly supported by World Premier International Research Center Initiative (WPI Initiative) from MEXT, Japan and we thank Dr Daisuke Fuijita and Dr Kiyotaka Iiayma for their support. We acknowledge Dr. Tony D. Keene, Southampton University for his support. We also thank Bayer Material Science A.G. for supply of MWCNT. The authors would like to acknowledge the contribution of COST Action CA15107.


Sharali MALIK (Karlsruhe, Germany), Yoshihiro NEMOTO, Guo HONGXUAN, Ariga KATSUHIKO, Jonathan HILL
08:00 - 18:15 #5997 - MS02-644 Covalent functionalization of Single-Wall Carbon Nanotube by ferrocene derivatives : localisation and identification of a single molecule.
MS02-644 Covalent functionalization of Single-Wall Carbon Nanotube by ferrocene derivatives : localisation and identification of a single molecule.

Depending on the rolling vector, single-wall carbon nanotubes (SWCNTs) can present metallic or semi-conducting properties, which is of strong interest for potential applications in electronic devices and sensors. Consequently, SWCNTs have been recognized as interesting candidates for developing electrochemical biosensors for several years. They are described as promoters of electron transfer between electrode and target molecules, increasing reaction rate and decreasing electrode response time [1,2]. To realise efficient bio-electrochemical sensor of D-glucose, ferrocene derivatives were covalently grafted on purified SWCNTs. Ferrocene active electrochemical center was separated from carbon nanotube by polyethylene glycol linkers of different chain length (3 to 5 etoxy links).

The functionalized SWCNTs were studied using an aberration-corrected STEM working at accelerating voltage of 80 kV (Jeol ARM200) to assess the efficiency of the functionalization and explore the selectivity of the grafting.

High-resolution HAADF and BF images were simultaneously recorded to determine the structure of the SWCNTs. By analysing the Fourier-transform of the images the chiral indices of a SWCNT can be determined using the same method than for ED pattern [3]. The comparison of information obtained from HAADF and BF images at different focus and simulations using QSTEM [4] shows that the chiral indices of a SWCNT can be assigned by measuring the tube diameter on HAADF and the chiral angle from BF images, for a focus range of a few nm. The simultaneous use of both detectors may allow for a lowering the dose of electrons for the recording of relevant data and so limit the irradiation damages, especially for small-diameter SWCNTs.

On HAADF, the strong signature of atoms heavier than carbon, at the end of a tiny over-contrast of about 1.4 nm long can be seen on some SWCNTs, as it is shown in the figure, in the red square. The structure of this SWCNT of 1.1 nm in diameter was determined as a chiral tube with (11,6) indices. QSTEM simulation of a single ferrocene-polyethylene-glycol molecule grafted on (11,6) CNT shows contrasts that match well with that of the experimental image. EELS spectrum images were realised to track oxygen K and iron L2-3 signals. As it can be seen in the figure, two iron atoms were detected in the area of analysis. Their localisation corresponds to that of the two strong contrasts in the HAADF image. In the EELS spectra the energy of the Fe L2-3 edges (close to 708 eV and 721 eV) is consistent to that usually recorded with XPS for Fe (II) in ferrocene groups [5]. Oxygen signal was also detected along the chain that links the iron atom to the SWCNT. The analysis of about thirty SWCNTs shows that the functionalization method affects both semiconducting and metallic tubes.

 

References :

[1] S. K. Vashist, D. Zhen, K. Al-Rubeaan, J. H. T. Luong, F. S. Sheu, Biotechnology Adv.

29 (2011) 169-88.

[2] F. Tasca, W. Harreither, R. Ludwig, J. J. Gooding, L. Gorton, Anal. Chem. 83 (2011)

3042-9

[3] H. Jiang, A. G. Nasibulin, D. P. Brown, E. I. Kauppinen, Carbon 45 (2007) 662–7

[4] C. Koch, PhD thesis, Arizona State University, May 2002

[5] T. Kitagawa, H. Matsubara, K.Komatsu, K. Hirai, T. Okazaki, T. Hase, Langmuir 29 (2013) 4275-81


Xavier DEVAUX (NANCY), Naoual ALLALI, Victor MAMANE, Manuel DOSSOT
08:00 - 18:15 #6040 - MS02-646 Details on the TiO2 nanotubes wall structure revealed by HRTEM.
MS02-646 Details on the TiO2 nanotubes wall structure revealed by HRTEM.

Details on the TiO2 nanotubes wall structure revealed by HRTEM

Valentin S. Teodorescu1, Leona C. Nistor1, Silviu Preda2, Maria Zaharescu2,

Marie-Genevieve Blanchin3

1.National Institute of Materials Physics, 077125 Magurele, Ilfov, Romania

2.Institute of Physical Chemistry“Ilie Murgulescu”, Romanian Academy

060021 Bucharest, Romania

3. ILM- Universite Claude-Bernard Lyon 1,  69622 Villeurbanne, France

 

Titanium oxide nanotubes were previously obtained by hydrothermal treatment using a crystalline precursor [1].  We have prepared titania nanotubes by the hydrothermal method starting with amorphous and crystalline sol-gel TiO2 precursors [2]. The hydrothermal treatment was realized in the presence of a 10 M NaOH solution at 140°C for various periods of time, from 24 to72 hours. The reaction yield was separated by centrifugation and washed alternately with distilled water and 0.1N HCl solution, down to pH ~6. The sample was dried at 110°C, for 12 h, in air. The HRTEM study was performed on specimens prepared on holey carbon grids.

 

Figure 1 show a low magnification image of an aggregate of TiO2 nanotubes obtained from an amorphous sol-gel precursor. The Na content, determined by the EDX, is about 3% for large aggregates, but is less than 1% in the case of small, transparent, nanotubes aggregates.

 

The high resolution study of the resulted TiO2 nanotubes, evidenced some interesting details about the nanotube formation. One is the presence of unrolled TiO2 foils. Figure 2 shows the presence of a TiO2 unrolled foil in the nanotubes aggregate. It is remarkable that the foil structure is much resistant to the electron beam irradiation compared to nanotubes . The most interesting is the spacing variation between the layers forming the nanotube wall, depending of the number of the layers in the wall.

The HRTEM study reveals the presence of TiO2 nanotubes with different number of layers in the wall, from 2 to 5, the majority having 3 layers in the wall. A comparative analyze of the wall details in the HRTEM images, evidenced clearly this variation of the spacing between the layers in the wall, depending on the number of layers: the higher the number of layers in the wall the smaller the spacing as revealed in figures 2 and 3a., On the other hand, the inner diameter of the nanotube becomes smaller as the number of layers grows. These measurements are shown in figure 3b.

We can explain these details supposing that the TiO2 foils formed from the amorphous precursor, are quite defected hindering the foil rolling. This effect explains the massive presence of unrolled TiO2 foils. On the other hand, the spacings in the rolling foils are also controlled by the foil defects, i.e. they become larger as the foil has more defects. Moreover, the rolling force between the TiO2 layers is more effective in the case of successive rolling of the foils, reducing the spacing between layers and leading to a smaller inner diameter of the nanotube.

References:

1. G.H. Du, Q. Chen, R.C. Che, Z.Y. Yuan, L.-M. Peng: Preparation and Structure Analysis of

Titanium Oxide Nanotubes. Appl. Phys. Lett. 79, 3702 (2001).

 

2. S.Preda, V.S.Teodorescu, A.M.Musuc, C.Andronescu, M.Zaharescu,  Influence of the TiO2 precursors on the thermal and structural stability of titanate-based nanotubes, , J.Mater. Res. Vol 28(3),294-303,2013


Valentin Serban TEODORESCU, Leona Cristina NISTOR, Silviu PREDA, Maria ZAHARESCU, Marie-Genevieve BLANCHIN, Valentin Serban TEODORESCU (Bucharest-Magurele, Romania)
08:00 - 18:15 #6052 - MS02-650 Structure and topology of chemical vapour deposited graphene by scanning electron diffraction.
MS02-650 Structure and topology of chemical vapour deposited graphene by scanning electron diffraction.

Structural and topological features of graphene have been investigated widely in the (scanning) transmission electron microscope and include: grain structure [1], layer number and mis-stacking [2], dislocations [3] and out of plane buckling [4, 5]. Here we explore new insights offered by scanning electron diffraction (SED), including quantitative analysis of crystal orientation and local strain. SED involves scanning the electron beam across a specimen and recording a diffraction pattern at each point. This provides a four-dimensional (4d) dataset combining real and reciprocal space information with nanoscale spatial resolution [6]. SED can be performed over areas of a few square micrometres, and the rich 4d data can be analysed using a number of versatile schemes, as described below. This automated analysis enables numerous regions to be considered, an example of which is shown (Fig.1) from a graphene sample grown by chemical vapour deposition on copper [7].

  

‘Diffraction images’ can be formed by plotting the intensity of a particular sub-set of pixels in each diffraction pattern as a function of probe position to elucidate any variations in the diffraction condition. In Fig.1a, integration windows are selected around a particular set of first-order ((1,0)-type) and second-order ((1,1)-type) reflections to yield the ‘virtual’ dark field images in Fig.1b. These images reveal the local grain structure, in this case a grain in the lower right area of the map. They also show light/dark fringes associated with a small island (arrowed) as well as a fold (starred). This contrast can be attributed to deviation from perfect stacking between the island and the underlying graphene grain, or between layers in the fold. The contrast is understood in terms of variations in the interference condition for electrons scattered from atoms in each of the layers as their relative position varies spatially [5]. The most notable benefits of SED lie in further computational analysis. Orientation images can be produced by matching each diffraction pattern to a library of simulated patterns to automatically map the grain structure and determine the local orientation. All grains are then revealed, and the disorientation across grain boundaries can be determined (Fig. 1c). Strain and small orientation variations are also of considerable importance, and can be mapped with SED by comparing each pattern to an unstrained reference. Fig.1d shows up to 3% strain around the fold, as well as the rotation associated with the ~2º small angle grain boundary. Our approach can thus provide a comprehensive 'crystal cartography' of layered materials, paving the way for thorough understanding and exploitation of their unique structure and topology.

  

[1] Huang, P. et al., Nature, 2011, 496, 389-392

[2] Brown, L. et al., Nano Lett., 2012, 12, 1609-161

[3] Butz, B. et al., Nature 2014, 505, 533-537

[4] Yazyev, O. V., et al, Nature Nanotechnology, 2014, 9, 755-767

[5] Ovid’ko, I.A., Rev. Adv. Mater. Sci., 2012, 30, 201-224

[6] Moeck, P. et al., Cryst. Res. Technol., 2011, 46, 589-606

[7] Bae, S. et al., Nature Nanotechnology, 2010, 5, 574-578

  

We acknowledge funding from the EU Graphene flagship, the ERC (291522-3DIMAGE), ERC Hetero2D, the EC (312483-ESTEEM2), a Vice Chancellor’s award from the University of Cambridge, a Junior Research Fellowship at Clare College, a Royal Society University Research Fellowship, the Cambridge NanoDTC and GrapheneCDT.


Duncan N. JOHNSTONE (Cambridge, United Kingdom), Rowan K. LEARY, Alexander S. EGGEMAN, Stephen HODGE, Ugo SASSI, Domenico DE FAZIO, Andrea C. FERARRI, Paul A. MIDGLEY
08:00 - 18:15 #6090 - MS02-652 Optical and structural properties of facetted boron nitrides nanotubes.
MS02-652 Optical and structural properties of facetted boron nitrides nanotubes.

Luminescent devices operating at sub-250nm wavelength present a strong commercial interest. Applications such as antibacterial properties, high density optical storage or nanofabrication possibilies require reliable, portable and efficient devices. Actual Deep UltraViolet (DUV) sources are based on gaz active regions which are difficult to integrate in mobile devices, exhibit poor efficiencies and are harmful for environment. Thus, the development of solid state based DUV emitters is getting more and more relevant.

 

Hexagonal boron nitride is a wide band gap semiconductor (~ 6.5 eV), which meets a growing interest for DUV applications. In contrast to carbon nanotubes, Boron Nitride Nanotubes (BNNTs) are all semiconductors whatever their diameter and chirality and their luminescence emission occurs between 200 nm and 250 nm and is governed by strong excitonic effects. Until recently, the optical properties were poorly known due to both the scarcity of samples and suitable investigation tools. This situation has changed thanks to the development of dedicated photoluminescence (PL) and cathodoluminescence (CL) experiments running at 4K and adapted to the detection in the far UV range [1, 2, 3].

These previous studies on boron nitride nanotubes have mainly dealt with multi-wall BNNTs with a large number of walls (20-120 walls). These tubes luminesce between 226 and 234nm and this spectral range has been assigned, in hBN, to transitions involving defects. A critical point to further study the confinement effect on the excitonic transitions is therefore to elucidate the luminescence origin of these multiwalls. Furthermore it is important to investigate the luminescence of small diameter BNNTs (with a reduced number of walls), which actually appears to be very challenging.

 

Cathodoluminescence from a single BNNT with a large number of walls have been measured with a spatial resolution of about ten nanometers, thanks to an UV dedicated SEM system. Different areas along the tube were investigated, from which luminescence is detected at few wavelengths. From 224 to 228 nm, monochromatic cathodoluminescence images exhibit features, which can be linked to defects in the crystallographic structure, separately observed by Transmission Electron Microscopy (TEM) on the same tube.HRTEM observations and tomography experiments revealed that the BNNTs exhibit a peculiar shape. The section of the tube is polygonal with a number of facets between 6 and 9 (Fig 1). These facets forms an helix along the axis of the nanotube. An important consequence of this facetting is the formation of a large number of dislocations along the tube.

 

We will discuss the relations between these structural properties and the luminescence as shown on fig 2.

 

References

[1] P. Jaffrennou el al., J. Appl. Phys. 102  (2007) 116102

[2] P. Jaffrennou and al., Phys. Rev. B, 77 (2008), 235422.

[3] K. Watanabe and al., Phys. Rev. B, 79 (2009), 193104.


Aurélie PIERRET, Léonard SCHUÉ, Frédéric FOSSARD (CNRS-ONERA), Julien BARJON, Ovidiu ERSEN, Simona MOLDOVAN, François DUCASTELLE, Annick LOISEAU
08:00 - 18:15 #6100 - MS02-654 Spectroscopy on Black Phosphorus exfoliated down to the monolayer.
MS02-654 Spectroscopy on Black Phosphorus exfoliated down to the monolayer.

Black Phosphorus (P(black)) is a 2D semiconductor characterized by a direct band gap associated to high carriers mobility. The crystal is composed by tetravalent P atoms stacked by weak van der Waals interactions that can be exfoliated down to the monolayer using similar procedures than for graphene.  Studying pristine thin layers of P(black) is however challenging due to its strong degradation upon exposure to visible light in air.

 

In this study, we have investigated the chemistry of degradation using in-situ Raman spectroscopy, Transmission Electron Microscopy imaging and Electron Energy core-Loss spectroscopy (EELS) of mechanically exfoliated layers prepared in their pristine state in a glove box. The results highlight a thickness dependent photo-assisted oxidation reaction by adsorbed oxygen in water [1]. Using EELS, we have inspected the O K-edge and P L2,3 edge which gets shifted from 130.2 eV in pristine phosphorus to 136 eV in oxidized phosphorus. As shown in Fig.1, the thickness dependence to oxidation has been clearly revealed by comparing layers of different thicknesses before and after a 30s exposure to ambient air and light. On the basis of such experiments, we have proposed an oxidation mechanism involving electron transfer processes based on quantum confinement and found appropriate manipulation procedures opening a route to first Raman measurements on 1 to 5 pristine layers of P(black)[1].

 

We use also low-loss-EELS spectroscopy to investigate the angular dependence in the Brillouin zone of the dielectric response of exfoliated P(black) in the range [2-40 eV], taking advantages of the TEM-STEM Libra 200 machine at LEM. This machine is equipped with an electrostatic monochromator operating at 80 kV and makes possible the investigation of the angular dependence of the dielectric function at a nm scale and with an energy resolution below 100 meV. To this aim we applied the technique developed in [2] and fully adapted to the machine. Using this technique we have studied the onset of electronic excitations and the dispersion of the plasmons as a function of the q momentum for different crystallographic in plane orientations in mechanically exfoliated P(black) down to 2-3 layers. An example of w - q mapping recorded along the [002] q-direction is displayed in Fig.2 and reveals a large dispersion of the plasmon peak occurring at 19 eV at q= 0. The quantification of this dispersion is obtained by extracting the q dependence of this plasmon peak from the map as shown in Fig.3.  Q dependences along two different in plane directions of the layers, namely [200] and [002], are compared in Fig.4 and clearly reveal high anisotropy effects, which will be discussed with the help of suitable ab initio calaculations.

 

 

 

[1] A. Favron, E. Gaufrès et al, Nature Materials, 14,  (2015)

[2] P. Wachsmuth et.al., Phys.Rev.B (88), 075433 (2013)


Etienne GAUFRÈS (Châtillon), Alexandre FAVRON, Frédéric FOSSARD, Pierre LÉVESQUE, Anne-Laurence PHANEUF-L'HEUREUX, Sébastien FRANCOEUR, Richard MARTEL, Annick LOISEAU
08:00 - 18:15 #6105 - MS02-656 Structure and Energetics of Double-Wall Carbon Nanotubes.
MS02-656 Structure and Energetics of Double-Wall Carbon Nanotubes.

Single-walled carbon nanotubes (SWNTs) have shown oustanding capabilities in the realization of new functional devices but are extremely sensitive to any slight changes in their environment, altering their physical properties. A strategy to overcome this difficulty is to use double-walled carbon nanotubes (DWNTs), consisting of two concentric tubes. In order to better know the basic properties of this kind of tubes in linkage with their structure, we have developed a systematic and robust procedure using acHR-TEM (aberration corrected Transmitting High Resolution Electron Microscopy) to determine the atomic structure over one hundred DWNTs [1]. This procedure includes several steps which are summarized in Fig.1. Statistical analyses of their diameters and twist angle between inner and outer tubes shown in Fig.2 and Fig.3, reveal that some configurations are strongly favored whereas some others are never observed. These results reveal the existence of strong coupling between the two concentric tubes in a DWNT for the smaller diameters lower than 2 nm. To complete this analysis, we performed Monte Carlo calculations with an empirical energetic model in order to understand the nature of the coupling and explain the selectivity of observed patterns [2].

 

[1] M. Kociak, K. Hirahara, K. Suenaga, and S. Iijima, How accurate can the determination of chiral indices of carbon nanotubes be ? , Eur. Phys. J. B. 32 , 457, 2003.

[2] A. Ghedjatti, F. Fossard, E. Flahaut, J.-S. Lauret, A. Loiseau, Structural Configurations of Double-Walled Carbon Nanotubes Investigated by Transmitting Electron Microscopy  submitted


Ahmed GHEDJATTI, Frédéric FOSSARD, Guillaume WANG, Emmanuel FLAHAUT, Hakim AMARA, Jean-Sébastien LAURET, Annick LOISEAU (Chatillon)
08:00 - 18:15 #6159 - MS02-658 Revisiting Graphene Oxide Structure via Spatially-Resolved Electron Energy Loss Spectroscopy.
MS02-658 Revisiting Graphene Oxide Structure via Spatially-Resolved Electron Energy Loss Spectroscopy.

Graphene oxide (GO) is obtained by chemical oxidation and exfoliation of natural graphite. In the last decade, it has attracted a widespread interest for its mechanical strength, tunable optoelectrical properties, simple processability and its potential as precursor for a low-cost and large-scale production of graphene. Indeed, chemical and thermal treatments allow to almost completely remove the oxygen, yielding reduced graphene oxide (RGO). Nevertheless, after about 150 years, the atomic structure of GO and RGO is still greatly debated. At present, the most acknowledged model for GO considers a random functionalization of the carbon basal plane with epoxide and hydroxyl groups, forming graphitic and partially oxidized domains. However, no definitive evidence of this model has been reported due to the lack of chemical analysis at the proper scale. For these reasons, nanometrically spatially-resolved spectroscopy of GO and RGO is highly suitable.
In this work we provide the first chemical characterization of GO and RGO thin flakes at the scale of few nanometres, thanks to core Electron Energy Loss Spectroscopy (EELS) in a STEM microscope. A major issue is represented by the extreme sensitivity of these materials to illumination and the use of this technique on GO and RGO has been so far very restricted. A new experimental set up combining a liquid nitrogen cooling system at the sample stage, a low accelerated electron beam (60 keV) and a liquid nitrogen cooled CCD camera with a low read-out noise of three counts r.m.s. and a negligible dark count noise has allowed us to overcome this limitation. Optimal illumination conditions have been defined by monitoring the evolution of the sample under continuous illumination, defining a maximal electron dose before substantial chemical modification of the order of 103 e-Å-2 and hence a 3 nm lower limit on the hyperspectral spatial resolution. Chemical maps of the atomic oxygen content of few layers GO and RGO show well separated domains on the scale of tens of nanometres. Overall, the oxygen amount has been observed to vary within 10-50 at.% in GO and 5-20 at.% in RGO. Energy-Loss Near-Edge Structures (ELNES) at the carbon K-edge exhibit well-defined features related to C-O bonding, previously not reported. Moreover different oxidation levels in GO and RGO are characterized by specific ELNES profiles. The highly oxidized regions in GO (~50 oxygen at.%, i.e. 1:1 C/O ratio) correspond to a full functionalization of the carbon network. With the support of complementary DFT numerical calculations, we suggest a model for the highly oxidized regions consisting in a full functionalization with hydroxyls, forming a 2D-sp3 system.


Anna TARARAN (Orsay), Alberto ZOBELLI, Ana M BENITO, Wolfgang K MASER, Odile STÉPHAN
08:00 - 18:15 #6160 - MS02-660 EELS Observation on Spontaneously Grown Ag@Titanium Oxide Core Shell Nanowires.
MS02-660 EELS Observation on Spontaneously Grown Ag@Titanium Oxide Core Shell Nanowires.

To enhance functionality and usability of 1-D nanomaterials, the synthesis of composite nanowires such as core-shell nanowires is a good solution.  Ag-TiO2 core-shell nanowires have attracted much attraction, because Ag nanowires have unique properties of high surface plasmon resonance as well as good electrical conductivity, while TiO2 is an ideal material as photocatalysts.  In the absence of oxide precursors, templates, inoculants and surfactants, this study successfully prepared vertical Ag nanowires with a spontaneous ultra-thin TiO2 shell (~0.5 nm) on TiO2 substrate using a one step process.  STEM/EELS results demonstrate that this oxygen-deficient TiO2 layer is formed through the oxidation of Ti which is released from the substrate and segregated to the nanowire surface simultaneously with crystal growth of the nanowires (Fig. 1).  The EELS spectra suggest that the valence of Ti ions in this spontaneous oxide layer is between Ti3+ and Ti4+.


Jenn-Ming SONG (Taichung, Taiwan), Chi-Hang TSAI, Shih-Yun CHEN, Alexandre GLOTER
08:00 - 18:15 #6200 - MS02-662 3D structure and growth of inversion domain boundaries in nanowires of InRO3(ZnO)m (R = Al, Fe, Ga, In) - an electron microscopy study.
MS02-662 3D structure and growth of inversion domain boundaries in nanowires of InRO3(ZnO)m (R = Al, Fe, Ga, In) - an electron microscopy study.

Materials based on zinc oxide with additions of other transition and main group metal oxides offer a broad range of applications such as varistors, transparent conducting oxides (TCOs), gas sensors and dye-sensitized solar cells. They have good semiconducting and optical properties at low costs and easy availability.[1] The prime example is IGZO (indium gallium zinc oxide, InGaZnO4), which has garnered widespread attention for its use in flat-panel TFT displays. While the structure of these materials has been studied extensively for close to 50 years,[2] a model comprehensively describing the formation and growth of its unique structural features has not been proposed thus far. It is crucial to gain an understanding of the atomic arrangement and the growth mechanisms of basal and pyramidal inversion domain boundaries (IDBs).

ZnO nanowires (NWs) were grown on fused silica substrates via a thermal evaporation method and a metal-seeded growth mechanism.[3] Conversion of said NWs to IAZO, IGZO or IFZO NWs was performed by spin-coating with solutions of indium nitrate and aluminium nitrate, gallium nitrate or iron(III) acetylacetonate, respectively, in 2-methoxyethanol. For thermal decomposition of the solution droplets and subsequent reaction of the various oxide particles with ZnO at the NW surface, specimens were then annealed in a furnace in ambient air at 1000 °C.

High-angle annular dark field (HAADF) and BF/ABF STEM imaging at high resolution as well as spectroscopic analyses were performed using an advanced analytical TEM/STEM system (JEOL JEM-ARM 200CF equipped with a cold FEG, probe Cs corrector, X-ray (JEOL Centurio) and electron spectrometer (GATAN GIF Quantum ERS) attachments).[4]

The aforementioned synthesis method yields faceted ZnO NWs of various growth directions including [10-1 0] and [10-1 1]. Due to their distinct morphology, they offer two preferential sites for the reaction with R2O3 particles: large, planar {2-1-1 0} surfaces and kinks between {0001} and {10-1 1} facets. This allows to image the initial formation of basal and pyramidal IDBs and their growth into the bulk of the NW with the viewing direction either perpendicular or parallel to the direction of growth (see figure 1). In perpendicular direction, the location where the basal IDB and two ZnO {0002} lattice planes meet (dotted line, fig. 1a) appears sharp. Adjacent ZnO layers are displaced in direction of the polar c axis by up to 0.9 Å at the boundary. In parallel direction, the IDB appears to be sandwiched tightly between two ZnO planes, its image contrast gradually fading towards the outer edges. The surrounding atomic columns of ZnO appear slightly distorted. In a three-dimensional representation, it is visualized that both phenomena are the result of projections from different depth regions in the NW (see figure 2).

Elemental distributions of cations were mapped by X-ray spectroscopic imaging. From spatially resolved EDS analyses, we conclude that both trivalent cations (In and R) occupy exclusively those sites most energetically suitable for them. R-decorated pyramidal IDBs originate as a flat defect parallel to and adjoining the In-decorated basal IDB, while the surrounding wurtzite-structured ZnO domains are unaffected. From there, the flat defect grows into a dome-shaped and, finally, a pyramid-shaped defect. This process requires a displacement of R cations via cation vacancies and entails a considerable distortion of all surrounding tetrahedral cation sites (see figure 3).

References:

[1] D. P. Norton et al., Mater. Today 6 (2004), 34-40.

[2] I. Keller, W. Mader, Z. Anorg. Allg. Chem. 636 (2010), 1045-1049.

[3] H. Simon, T. Krekeler, G. Schaan, W. Mader, Cryst. Growth Des. 13 (2013), 572-580.

[4] H. Schmid, E. Okunishi, W. Mader, Ultramicrosc. 127 (2013), 76-84.


Gunnar SCHAAN (Bonn, Germany), Herbert SCHMID, Werner MADER
08:00 - 18:15 #6203 - MS02-664 TEM characterisation of diamond-hexagonal silicon nanowires.
MS02-664 TEM characterisation of diamond-hexagonal silicon nanowires.

The diamond-hexagonal phase (lonsdaleite) does not appear in the equilibrium pressure-temperature phase diagram of silicon. However, it has been observed in several cases (see review in1), especially  in samples that had undergone a stress treatment.2, 3 Its presence in semiconductor nanowires does not make consensus. In such objects, the occurrence of  the parent phase of wurtzite has been observed and explained in the case of (normally cubic) III-V semiconductors,4 but lonsdaleite has been ascertained in only very few cases: in Ge nanowires prepared under stress5 or after epitaxy of Si on GaP nanowires.6 In most cases of silicon nanowires grown by the vapour-liquid-solid (VLS) method, the proof of existence of that phase, given under the form of a transmission electron microscopy (TEM) high-resolution image or diffraction pattern, was disputable.1 This is due to the fact that, in most zone axes, hexagonal close packing (hcp) is very difficult to differentiate from face centred cubic (fcc) multiple twinning.1, 7 Even in the [110] cubic axis where hexagonal stacking can easily be recognised, the superposition of twinned orientations in the beam direction can lead to erroneous conclusion.1

 

Here, we present TEM recordings in the [110]C/[11-20]H zone axis of VLS silicon nanowires that cannot be interpreted in terms of cubic stacking. Those are the first unambiguous TEM observations of the lonsdaleite phase in VLS SiNWs to our knowledge. These nanowires differ from those usually studied by (i) their small size, as we find the phase in nanowires with diameters around 5 nm, (ii) the plasma-enhanced chemical vapour deposition technique (PECVD) we use for bringing gas radicals to the catalyst particles and (iii) the liquid tin we use as catalyst. Their small diameters, in particular, make it very unlikely that several different twin orientations be superimposed in the beam direction.

 

The figures present silicon nanowires (SiNWs) obtained after 2 min of growth. The SiNW in Fig. 1 has several polytypes, including 2H (lonsdaleite) and 6H silicon. The simulated images8 superimposed to the two regions of hexagonal symmetry confirm the structure. The amorphous contrast at the NW surface indicates the presence of oxide. Figure 2 shows the Fourier transform of the experimental image in Fig. 1(top-right) and diffraction patterns: (i) with a 10-nm beam centred on 6H (middle-right) and (ii) with a 20-nm beam encompassing both polytypes (bottom-right). These experimental diffractograms exhibit reflections characteristic of the 6H and 2H phases, as shown in the simulated diffractograms of the 6H (top-left) and 2H (bottom-left) geometries. Figure 3 exhibits the structure of a pure 2H silicon nanowire. The 90° bend is performed with no defect: the growth axis just changes from [0001] to [10-10]. The image at the bottom-left is in a slightly different orientation, giving a Fourier transform (bottom-right) that demonstrates that the structure is pure 2H. The nanowire in Fig. 4 presents the interesting feature of having started with a (twinned) cubic phase and having then switched to hexagonal phase, as if the latter were energetically favoured in the dynamic conditions of the growth.

 

1.         C. Cayron, et al., J. Appl. Crystallogr. 42, 242-252 (2009).

2.         R. H. Wentorf and J. S. Kasper, Science 139, 338-339 (1963).

3.         P. Pirouz, et al., Acta Metall. Mater. 38, 313-322 (1990).

4.         F. Glas, et al., Phys. Rev. Lett. 99, 146101 (2007).

5.         L. Vincent, et al., Nano Lett. 14, 4828-4836 (2014).

6.         H. I. T. Hauge, et al., Nano Lett. 15, 5855-5860 (2015).

7.         D. W. Pashley, et al., Phys. Stat. Sol. b 10, 153-163 (1965).

8.         P. Stadelmann, JEMS-Saas, http://www.jems-saas.ch/

 

Acknowledgements: jlm acknowledges fruitful discussions with Gilles Patriarche and Frank Glas, CNRS Marcoussis, France, and Olivier Hardouin Duparc, CNRS Ecole polytechnique, Palaiseau France.


Jean-Luc MAURICE (Palaiseau), Jian TANG, Ileana FLOREA, Frédéric FOSSARD, Pere ROCA I CABARROCAS, Erik V. JOHNSON, Martin FOLDYNA
08:00 - 18:15 #6218 - MS02-666 HAADF HRSTEM of one dimensional CuI crystals inside SWCNTs.
MS02-666 HAADF HRSTEM of one dimensional CuI crystals inside SWCNTs.

Reduced coordination in 1D crystals is obviously a consequence of the sterically confined space in which the encapsulated crystals have to grow. It was interesting to investigate the differences of the one dimensional crystals in comparison with  their three-dimensional unit cell.

In our previous investigations of 1DCuI@SWCNT HRTEM revealed hexagonal, monoclinic [1] and cubic [2] modifications of copper iodide. In cases of HRTEM investigations in order to obtain the 1D crystal structure it was necessary to get sets of micrographs (about hundreds) while HAADF HRSTEM method allows to determine 1D crystal structure with a help of a few micrographs, owing to an ability to designate various atoms according to their atomic numbers. Within a framework of this study the perspectives of HRSTEM method combined with local EELS for determination of atomic and electron structure of individual nanocrystals are shown. These analytical electron microscopy methods applied together have allowed to reveal a new type of 1DCuI@SWCNT nanocomposite structure and to identify a space group of 1D CuI unit cell in the nanotube channel which appeared to be Pmmm. The results of our investigation bear evidence of the necessity of using HRSTEM in both bright field and dark field modes simultaneously (Fig. 1). A formation of chemical bond between Cu3d and C2dz orbitals of the intercalated nanocrystal and the nanotube wall is accompanied by electron density transfer of ~ 0.09 e/atom towards C. Electron microscopy is performed in JEOL ARM 200F at 80 kV in HAADF HRSTEM mode. 

Acknowledgements

The work was supported by the Ministry of Education and Science of the Russian Federation within a framework of the program “Investigation and development on priory direction of scientific-technical complex of Russia for 2014-2020” (agreement № 14.585.21.0004, unique project identification number RFMEFI58514X0004).

1. Kiselev N.A., Kumskov A.S., Zakalyukin R.M., Vasiliev A.L., Chernisheva M.V., Eliseev A.A., Krestinin A.V.,  Freitag B., Hutchison J.L. // Journal of Microscopy. 2012. V. 246. P. 3. P. 309.

2. Kumskov A.S., Zhigalina V.G., Chuvilin A.L., Verbitskiy N.I., Ryabenko A.G., Zaytsev D.D., Eliseev A.A., Kiselev N.A. // Carbon. 2012. V. 50. № 12. P. 4696.


Andrey KUMSKOV (Moscow, Russia), Victoria ZHIGALINA, Nikolay KISELEV, Andrey ELISEEV, Nikolay VERBITSKIY, Alexander VASILIEV
08:00 - 18:15 #5172 - MS03-668 Sample preparation for in-situ biasing TEM experiments.
MS03-668 Sample preparation for in-situ biasing TEM experiments.

Knowledge about the potential distribution of semiconductor devices at the nanometer scale is important for the development of new device structures. Electron holography is a technique sensitive to the electrostatic potential with a high spatial resolution up to the sub nanometer scale [1, 2]. The potential especially in semiconductors is highly sensitive to  the generation of electron-hole pairs, damage caused by the electron and ion beam during investigation and preparation [3], and the biasing of the sample. In-situ Biasing of specimen within the transmission electron microscope (TEM) provides an external stimuli allowing to differentiate between various effects influencing the hologram. A possible investigation is the influence of reverse and forward bias on the width of the depletion region and on the potential difference between p- and n-sides of the diode [4, 5]. For the comparison between the the bulk device and the TEM- specimen we monitored the influence of the sample preparation on the electrical behavior.

 

For these investigations a silicon solar cell was chosen [6]. The used sample geometry is inspired by the experiments of A.C. Twitchett [7]. The first steps are cleaving and grinding of a wedge out of the wafer. Afterwards two copper clamps are bonded with conductive silver on the front and back contacts of the specimen. This is followed by the preparation of a TEM lamella with a focused ion beam (FIB). A sketch of the FIB prepared lamella is shown in Figure 1. The preparation of the biasing sample is finished by bonding of the clamped specimen on a custom build carrier chip with conductive silver. Figure 2 shows the finished sample.

 

After each preparation step, an IV measurement was performed and the corresponding curves are shown in Figure 3. As result, the influence of the FIB preparation on the whole sample is negligible (solid red and dashed blue). The measurements are not significantly changed before and after inserting the sample holder into the vacuum of the TEM (solid green and dashed orange). In reverse bias direction however a change of the slope after each bonding step is visible. Before bonding the parallel resistance is 70.1 kΩ. After bonding the slope of the current increases. This corresponds to  the presence of a parallel resistance. Conductive silver or residues from its solvent might shortcut the device and build a parallel resistance. This parallel resistance decreases from 10.3 kΩ to 1.95 kΩ after the bonding steps.

 

During investigations within the TEM an influence of the electron beam on the measured shortcut current was recognizable. Illuminating the FIB-cut lamella portion of the specimen (and partially the thicker parts below it (left of the lamella in Fig. 1) produced a current of -2.1 μA, while illuminating the hole near the specimen only produced an current of -8.8 nA.

 

1.    M. McCartney et al., Applied Physics Letters 65 (1994) 2603.

2.    K. Harada et al., Journal of Applied Physics 96 (2004) 6097.

3.    J.B. Park er al., Applied Physics Letters 105 (2014) 094102.

4.    A.C. Twitchett et al., Journal of Microscopy 214 (2004) 287.

5.    L.Z.-Y. Liu et al., Physica Status Solidi C 9 (2012) 704-707

6.    M. Mews et al., Energy Procedia 38 (2013) 855

7.    A.C. Twitchett et al., Physical Review Letters 88 (2002) 238302.

8.    We thank the Institute Silicon Photovoltaics of the HZB for providing us with a sample 

9.    We kindly acknowledge the support from the DFG within the Collaborative Research Center 787, project A4


Udo HÖMPLER (Berlin, Germany), Tolga WAGNER, Tore NIERMANN, Michael LEHMANN
08:00 - 18:15 #5274 - MS03-670 Combining Current Imaging and Electrical Probing for fast and reliable in situ Electrical Fault Isolation.
MS03-670 Combining Current Imaging and Electrical Probing for fast and reliable in situ Electrical Fault Isolation.

Within the last decades, the feature widths of semiconductor devices have become too small to be resolved by state-of the art optical microscopes, and other imaging techniques like Scanning Electron Microscopes (SEM) or Scanning Probe Microscopes (SPM) have become indispensable. For some analyses of device failures a combination of imaging and electrical measurements is required. Nowadays, one can find nanoprobers that are either based on SPM or SEM imaging techniques. For the SPM based nanoprobers, each probe consists of an Atomic Force Microscope (AFM) equipped with a conductive tip. For the SEM based systems, nanopositioners without force feedback are placed within a SEM.

Both approaches described above have advantages and disadvantages. Landing probes on a desired device is much easier for the SEM prober, as the SEM image gives immediate visual feedback. In contrast, the AFM prober requires many subsequent AFM images by each probe in order to align the probes with respect to each other and with respect to the device, which can be very time consuming. One advantage of the conductive AFM probing is the combination of topography images with electrical transport properties, i.e. images of local resistance (analogue to Scanning Tunneling Microscope (STM)). This allows easy identification of leakages or shorts on the chip.

In this work we present a very compact nanoprober that combines the advantages of SEM and SPM nanoprobers in one system.

The setup consists of a nanoprober with eight probes and an xyz substage mounted on the stage of an SEM (Zeiss Supra 40). Positioning the probes and the sample with nanometer precision as well as the controls for all electrical measurements are provided by a unified software interface. These can be used to quickly and easily probe contacts on technologies with line widths down to 10 nm and less. The probing experiments can include transistor characterization, electron beam induced current (EBIC) imaging, among others.

In order to locate leakages or shorts as described above, a voltage biased probe is scanned at constant height over the sample surface. The resulting current flow to a second probe or to the bulk contact can be simultaneously monitored with sub-pA resolution. A typical current image can be acquired in a few seconds in a scan range of up to 1.5 µm x 1.5 um.

Each probe (or the substage) can be selected as the “scanning” voltage source or the “stationary” current sink, which allows for a very flexible definition of the expected current path enabling a powerful method for the visualization of faults in the integrated circuits.

The combination of the SEM image (the probes can be observed while the scan takes place) and the resulting current images enables correlative microscopy. Figure 2 shows an overlay image of the SEM image with current images on a 22 nm chip. Depending on the polarity (+/- 1V) of the voltage biased tip, n-MOS or p-MOS contacts become visible in the current image.


Stephan KLEINDIEK (Reutlingen, Germany), Andreas RUMMEL, Klaus SCHOCK, Matthias KEMMLER
08:00 - 18:15 #5322 - MS03-672 Using a simplified in line holography method as a qualitative tool to detect local heterogeneities in HfO2 layers.
MS03-672 Using a simplified in line holography method as a qualitative tool to detect local heterogeneities in HfO2 layers.

Oxygen vacancies in high-k oxides are foreseen to have detrimental effects in devices like high-k metal gate MOS transistors [1] and beneficial ones in RRAM [2]. In this context techniques capable to characterize defects in ultra-thin (2 thin films and revealed the impact of the grain nanostructure on the electronic structures [4]. When traversing the sample electron waves experience a phase shift related to the local inner potential created by atoms. The reference technique to retrieve this phase shift is off axis electron holography. However as it is a delicate technique, the alternative in line holography based on the acquisition of a focal series can be of interest. The advantage of in line holography is to be easy to carry out in the course of a classical TEM study and to provide phase image on a large scale (up to several microns). The present work aims at examining the capabilities of a simplified approach of in line electron holography to evidence heterogeneities in a polycrystalline HfO2 layer.

The in line holography method consists first in acquiring images at different defocus (-D, 0, D) and then deriving the phase image using a post treatment that realizes the inversion of the phase transfer function. Various numerical treatments are possible, however a simple inversion process based on a small angle approximation can be achieved [5]. As a consequence of the approximation, the phase map has a limited spatial resolution, typically 1 nm for a 100 nm defocus. Also the inversion leads to a singularity at q = 0 that can be dealt with using a Gaussian edge filtering or more efficiently a Tikhonov regularisation (i.e. a q2/(q2+a2)2 filter) [6]. Depending on the parameter a, long range fluctuations can be amplified or cancelled out which have a significant impact on the value of the phase output. However if only a qualitative information on the phase map is desired, this simplified in line holography can be used as a tool to point out chemical or charge fluctuations within the sample.

Figure 1 shows a HRTEM image of a FIB lamella from an HfO2 layer grown by atomic layer deposition (ALD). A detailed analysis and FFT treatments have allowed to identify nanograins within the HfO2 layer as illustrated by Figure 1b: the grain size is in the 5-20 nm range. Focal series corresponding to the image in Figure 1 have been recorded. Using images at defocus of ±50 nm, the simplified in line holography treatment gives the phase images shown in Figure 2 (spatial resolution ~0.7 nm). Figure 2a and Figure 2b correspond to a parameter a equal to 0.07 nm-1 and 0.21 nm-1 respectively. As illustrated out by the marked areas in these figures, the phase images exhibit features independent from the numerical parameter a: here grain and grain boundary regions correspond to positive (blue and violet) or negative phase shift (green and red).

If diffraction effects are not involved, phase shifts of opposite sign should indicate effect of different nature on the local potential as can be expected from vacancies and chemical segregation. Of course, these defects will need further investigation by advanced TEM techniques to be identified. However the phase maps derived from the simplified in line holography approach can constitute a simple tool to evidence local heterogeneities in a complex microstructure.

  1. K. Shiraishi, et al., in: "Proc. of SISPAD", 306–313 (2006).
  2. P. Calka, et al., Nanotechnology 24, 085706 (2013).
  3. R. Krause-Rehberg. and H.S. Leipner, Positron Annihilation in Semiconductors: Defect Studies, Springer-Verlag. 1999.
  4. T. Mizoguchi et al. Journal of Physics Condensed Matter 21, 104212 (2009).
  5. P. Donnadieu et al, Applied Physics Letters 94, 263116, 2009
  6. P. Donnadieu et al, Journal of Nanoscience and Nanotechnology  11-10 (2011) p.9208.

Mathias ALEMANY, Patricia DONNADIEU (ST MARTIN D'HERES CEDEX), Amal CHABLI, Edgar RAUCH, Ben MAYALL, Nicolas BERNIER, Mickael GROS-JEAN, Marie-France BARTHE
08:00 - 18:15 #5371 - MS03-674 Quantitative observation of low energy electron channeling contrast from sub-nanometer thick surface layers using hexagonal Silicon Carbide single crystal.
MS03-674 Quantitative observation of low energy electron channeling contrast from sub-nanometer thick surface layers using hexagonal Silicon Carbide single crystal.

              A potential of low energy (< 1keV) electron channeling contrast imaging (LE-ECCI) by scanning electron microscopy (SEM) is demonstrated to characterize the crystallographic stacking sequence of hexagonal 4H-SiC single crystal within the first unit cell thickness from the topmost surface (< 1nm). It is also revealed that the LE-SEM signal intensity associated with the crystallographic orientation has enough sensitivity to even the change in Si-atom and C-atom (i.e. the change in surface polarity) at a primary electron energy of 0.4keV. The obtained data can be explained by an electron multiple scattering cluster (EMSC) theory where the interference of both incident and diffracted electron waves is considered within a finite size (a few nanometers) of an atomic cluster.

              So far, for characterizing local crystallographic orientation of bulk crystals using SEM, ECCI with a higher energy (> 10keV) of primary electron beam has been utilized in order to obtain larger interaction volume due to its deeper penetration depth [1]. The electron channeling contrast (ECC) from only a shallower surface region with lower energy has not been applied yet because of the consideration attributed to the lack of enough interaction volume in the lower energy regime. In fact, to our knowledge, the critical smallest volume (specimen minimum thickness) has not been investigated yet associated with ECC. In our previous study [2], a crystallographic orientation contrast from two bilayers thick surface layers of 4H-SiC single crystal was observed by changing an incident LE (< 1keV) EB direction with respect to the orientation of an atomically flattered 4H-SiC surface (Figs. 1). This contrast is considered to be the ECC in an extremely low electron energy regime. This result brings about the assumption that even the two bilayers thick interaction volume can contribute to the formation of ECC. In order to verify this assumption, in this study, crystallographic orientation dependence of SEM signal intensity was quantitatively measured on an atomically flat 4H-SiC surface. Furthermore, in order to exploit the Z-information, different polar faces, Si-terminated (0001) Si-face, and C-terminated (000-1) C-face were compared, where atomic sites of Si- and C-atoms are switched in the crystal. The obtained results were compared with the EMSC theory in which the concept of short-range periodicity is included [3]. This theoretical model is more applicable to reproduce the effect of shallower information depth of the LE-EB, compared with a Bloch-wave model utilized in the conventional ECCI in the higher electron energy regime.

              Fig.2 shows the representative SEM signal intensity from 4H-SiC Si-face and C-face as a function of the sample tilting angle obtained at a primary electron energy of 0.4 keV. Although the profile shapes seem to be different at a glance, peak positions are almost the same. Considering the fact that the atomic arrangement below the surface is identical both in Si-face and C-face SiC, except Si- /C-atomic sites in the crystal, the difference in the profile shape is ascribed to the contrast of backscattered electron yield [4]. The similar trend was also reproduced by the EMSC calculation.

 

Acknowledgement

Some of this work was financially supported by the New Energy and industrial Technology Development Organization (NEDO). The authors would like to thank Toyo Corp. for their experimental supports. The authors are grateful to Dr. Tomohiro Matsushita (Japan Synchrotron Radiation Research Institute) for his theoretical support.

 

References

[1] D. C. Joy, D. E. Newbury, and D. L. Davidson, J. Appl. Phys. 53, R81 (1982).

[2] K. Ashida, T. Kajino, Y. Kutsuma, N. Ohtani, and T. Kaneko, J. Vac. Sci. Technol. B, 33 (4) 04E104-1 (2015).

[3] T. Matsushita, F. Matsui, H. Daimon, and K. Hayashi, J. Elec. Spectrosc. Phenom., 178-179, 195-220 (2010).

[4] J. Cazaux, J. Appl. Phys. 112, 084905 (2012).


Koji ASHIDA (Sanda, Japan), Yasunori KUTSUMA, Tadaaki KANEKO
08:00 - 18:15 #5389 - MS03-676 Nanoscale quantitative characterization of 22nm CMOS transistor using Scanning Transmission Electron Microscopy (STEM).
MS03-676 Nanoscale quantitative characterization of 22nm CMOS transistor using Scanning Transmission Electron Microscopy (STEM).

    22nm Silicon-On-Insulator (SOI) complementary metal-oxide semiconductor (CMOS) technology has a number of performance boosters, such as third generation embedded DRAM, embedded stressor technology and 15 levels of copper interconnect.[1] In addition to geometric scaling, strain engineering in CMOS transistors has provided another enabler for device performance improvement. A compressive strain in PMOS channel can increase the hole mobility, and a tensile strain in NMOS channel can increase the electron mobility. In PMOS of 22nm SOI technology, epitaxial SiGe source/drain (S/D) is used to introduce compressive strain in the channel, and SiGe layer in the channel is used to control threshold voltage of device. Hence obtaining the nanoscale chemical composition and strain information of them is vital during the semiconductor development.

    In this work, energy-dispersive X-ray spectroscopy (EDX) in STEM is used to determine the Ge atomic concentration (%Ge) based on the Cliff-Lorimer ratio method.[2] The Cliff-Lorimer factor is calibrated by measuring a standard Si0.664Ge0.336 blanket sample with a relative error smaller than 1%. An improved high angle annular dark field (HAADF) STEM image is obtained by STEM with Drift Corrected Frame Integration (DCFI). DCFI technique integrates successive STEM images via calculating and correcting the drift from cross correlation. The produced STEM image has minimal drift and a high signal-to-noise ratio. It is analyzed by Geometrical Phase Analysis (GPA) to extract strain information.[3]      

    Figure 1(a) shows a typical PMOS transistor with <110> in-plane direction and <001> out-of-plane direction. SiGe channel and dual-layer embedded SiGe source/drain (S/D) can be clearly observed in HAADF-STEM mode. Since HAADF image intensity is proportional to atomic number Z1.7,[4] SiGe layers with different %Ge are clearly seen, and can be further related to %Ge measured from EDX. In Figure 1(b), EDX map shows that channel SiGe has around 22% Ge. In S/D the buffer layer has 20-21% Ge, and the main layer has 25 - 30% Ge. HAADF micrograph and the corresponding deformation maps are shown in Figure 2. A compressive strain of 0.3% in the <110> direction is observed in the channel Si. There is no deformation between channel SiGe and channel Si in the <110> direction, suggesting that channel SiGe is compressed in this direction to match underneath Si lattice. This agrees with the finding that a deformation as high as 1.9% in channel SiGe is observed in the <001> direction. In addition the channel Si shows a tensile strain of 0.3% in the <001> direction. Results show that a combination of STEM-based techniques, including HAADF-STEM, STEM-GPA and STEM-EDX, can reveal the nanoscale chemical composition and strain distribution of a transistor. These information are used to monitor and control the process.

 

References

[1] S. Narasimha et al., IEDM (2012) p. 331.

[2] W. Weng et al., Microscopy and Microanalysis 21(S3) (2015) p. 1087.

[3] J.-L. Rouvière et al., Ultramicroscopy 106 (2006) p. 1.

[4] O.L. Krivanek et al., Nature 464 (2010) p. 571.

[5] Acknowledgements: The authors thank Joshua Bell (GlobalFoundries) for providing samples, and John Miller (GlobalFoundries) for preparing TEM lamellae. The authors also thank John Bruley (IBM), Yun-Yu Wang (GlobalFoundries), Frieder Baumann (GlobalFoundries) and Michael Gribelyuk (GlobalFoundries) for valuable discussions.


Weihao WENG (Hopewell Junction, USA), Claude ORTOLLAND
08:00 - 18:15 #5454 - MS03-678 Evidence of metastable zinc blende phase and its influence in nanocrystalline ZnO film growth.
MS03-678 Evidence of metastable zinc blende phase and its influence in nanocrystalline ZnO film growth.

ZnO is a wide band gap semiconductor used in a broad range of technological applications such as gas sensing, piezoelectronics or transparent conductive oxides. Many II-VI compounds typically crystallize in a rock salt (RS), a wurtzite (WZ) or a zinc blende (ZB) phase. For ZnO it is well known that the most stable form under ambient conditions is the WZ crystal structure. The WZ structure can be described as an AaBbAaBb stacking sequence of close-packed Zn and O planes along the [0 0 0 1] axis, where the upper-case letters stand for Zn planes and the lower-case letters for O planes. The metastable RS phase forms under large hydrostatic pressure, while so far ZB has only been found during hetero-epitaxial growth on cubic substrates or in some free-standing nanostructures [1,2]. Here, using a combination of transmission electron microscopy (TEM) based automated crystal orientation mapping (ACOM) and high-resolution TEM (HRTEM), we present evidence of a metastable zinc blende phase in chemical vapor deposited (CVD) nanocrystalline ZnO films. We further show how this ZB significantly affects the growth in these films.

 

The vapor deposition growth of polycrystalline films usually begins with the formation of densely spaced nuclei on the substrate. During further film growth neighboring nuclei impinge on each other, leading to a growth competition between grains. Grains with their fastest growth direction normal to the substrate (i.e. [0 0 0 1]) overgrow otherwise oriented grains, resulting in a classical columnar growth morphology, as shown in Figure 1 a. Unexpected for such columnar film growth, however, is the observation that the growth of many columnar grains appears to stop, followed by a renucleation to form smaller grains as marked by circles in Figure 1 a. We investigated this behavior by ACOM (Figure 1 b), revealing a special epitaxial relationship of the new renucleating grains with the underlying columnar grains. The orientation data shows that the renucleating grains share a common [2 -1 -1 0] axis with their neighboring grains (Figure 1 c & d) and that the misorientation between the grains is close to 70°. This epitaxial relation has been further investigated by HRTEM, which reveals that the origin of this epitaxial orientation relationship can be attributed to a few nm sized core of ZB phase (Figure 2 a-d). This ZB region can form on top of the columnar grains by a simple change in stacking sequence to AaBbCcAaBbCc (Figure 2 e). We believe that the new WZ grains then nucleate on the {1 1 1} facets of this ZB core, producing the orientation relationship observed by ACOM. Furthermore, our analysis of the fast growth direction of the renucleating WZ grains using ACOM, proves that, unlike the initial columnar grains, the fast growth direction is no longer parallel to the [0 0 0 1] axis. We argue that this is due to a change from having a Zn-terminated (0 0 0 1) polar facet (as for WZ1 in Figure 2 e) to having an O-terminated (0 0 0 -1) facet (as for WZ2 in Figure 2 e) exposed to new adatoms. Polarity determination of the columnar and renucleating grains by convergent beam electron diffraction (CBED) confirms this hypothesis.

 

This nucleation of WZ on top of {1 1 1} ZB facets bears a strong resemblance with the formation free-standing ZnO tetrapod nanostructures [1]; indeed it is remarkable how a similar mechanism appears to play an important role in these compact thin films, even if the driving force for the formation of ZB on top of WZ ZnO remains still unclear [2]. We have further investigated [2 -1 -1 0] fiber textured CVD ZnO films, for which the same growth mechanism appears to be active and could explain the abundance of (1 0 -1 3) twin boundaries previously found in these films [3].

 

References and Acknowledgements

 

[1] Y. Ding et al., Applied Physics Letters 90 (2007), 153510

[2] L. Lazzarini et al, ACS Nano, 3, (2009), 3158-3164

[3] A. Aebersld et al., Ultramicroscopy 159 (2015), 112-123

The authors acknowledge funding from the SNSF, Grant Number 137833 (ZONEMproject). L Fanni, Dr A Hessler-Wyser and Dr Christophe Ballif of the IMT PV-lab, EPFL and Dr S Nicolay from CSEM, Neuchâtel are thanked for the samples and discussions. 


Arthur Brian AEBERSOLD (Lausanne, Switzerland), Duncan ALEXANDER, Cécile HÉBERT
08:00 - 18:15 #5706 - MS03-680 Quantitative evaluation of the (211)B GaAs/InAs quantum dot heterostructure.
MS03-680 Quantitative evaluation of the (211)B GaAs/InAs quantum dot heterostructure.

InAs QDs grown on high-index GaAs(h11) surfaces seem to exhibit superior optical properties compared to the usual QD growth on GaAs(001), due to their prominent piezoelectric field, which can be functional in nano-photonics and quantum computing. However, the morphology of the QDs, as well as their strain state and chemical composition, influence significantly the light emission and absorption, the lasing efficiency, and other optoelectronic properties of QD-based devices. In order to shed light to these effects, we have explored the nanostructure, the strain properties, and the related chemical composition of buried InAs QDs grown on (211)B GaAs surface employing quantitative HRTEM techniques.

The InAs QD layer was grown by MBE under the Stranski-Krastanow (S-K) regime at 480oC with a growth rate of 0.9 ML/s for 2s, over a 20 nm GaAs layer grown at 620oC. The corresponding BEP was 8.5x10-7 mbar. The QD layer was then overgrown by a 30 nm-thick GaAs cap layer, without growth interruption, by ramping up the temperature back to 620oC.

The QDs adopted an anisotropic pyramidal shape, elongated along the <111> direction and were delimited by the {110}, {100}, and {213} or {214} crystal facets [Fig. 1(a)], as clearly evidenced by the equivalent larger uncapped InAs QDs grown on (211)B GaAs surface under similar growth conditions [1]. Local strain measurements by the geometric phase analysis (GPA) method [2] showed that buried dots were pseudomorphically grown on GaAs without the presence of any interfacial or extended defects [Figs. 1(a) and 1(b)]. Assuming a plane stress state of the QDs, following the transformation of the elastic stiffness tensor in order to comply with growth along the [211] direction [3], we found a systematic increase of the local strain from the base area to their apex region [Figs. 1(c) and 1(d)]. Then, applying Vegard’s law, we calculated the chemical composition of the QDs that was found to exhibit an indium composition gradient along the growth direction, obviously suggesting gallium segregation inside the dots (Fig. 2). Even though the gradual increase of indium concentration is a common trend for all QDs, various In-content maxima (0.50 to 0.92) were measured at the apex area of different QDs. This variation can be attributed to the corrugated form of the (211) surface [4], resulting in local compositional fluctuations of the wetting layer at the nucleation sites of the QDs. Therefore, gallium segregation is already involved at the onset of the S-K growth. Furthermore, photoluminescence (PL) and μ-PL experiments, as well as simulations of the QDs’ transition energies, showed variations in the emission energy of the QDs, which is in line with a graded In-content along the growth direction instead of pure InAs, thus verifying the chemical composition profile of the QDs revealed by quantitative strain measurements.

 

[1] N. Florini, G. P. Dimitrakopulos, J. Kioseoglou, S. Germanis, C. Katsidis, Z. Hatzopoulos, N. T. Pelekanos, and Th. Kehagias, J. Appl. Phys. 119, 034304 (2016).

[2] M. J. Hÿtch, E. Snoeck, R. Kilaas, Ultramicroscopy 74, 131 (1998).

[3] T. Hammerschmidt, P. Kratzer, and M. Scheffler, Phys. Rev. B 75, 235328 (2007).

[4] R. Nötzel, L. Däweritz, and K. Ploog, Phys. Rev. B 46, 4736 (1992).

 

Acknowledgements

Work supported by the European Union (ESF) and Greek national funds - Research Funding Program: THALES, project "NANOPHOS".


Thomas KEHAGIAS (Thessaloniki, Greece), Nikoletta FLORINI, Joseph KIOSEOGLOU, George DIMITRAKOPULOS, Savvas GERMANIS, Charalambos KATSIDIS, Zacharias HATZOPOULOS, Nikolaos PELEKANOS
08:00 - 18:15 #5765 - MS03-682 TEM study of defect reduction in the growth of semipolar GaN grown on patterned substrates.
MS03-682 TEM study of defect reduction in the growth of semipolar GaN grown on patterned substrates.

III-nitride heteroepitaxial thin films and heterostructures suffer from the presence of large densities of structural defects, which are detrimental for the development of efficient devices. These defects result from differences between III-nitride films and foreign substrates (structure, chemistry, lattice parameters). Transmission electron microscopy (TEM) is the technique of choice for studying such crystalline defects. The understanding of the origin and behavior of structural defects may allow their tailoring and the development of low defect density materials.

III-nitrides are classically grown along the polar c-direction. In this case, internal electric fields play a major role in the properties of heterostructures. In order to eliminate or at least to reduce the influence of internal electric fields, growth along alternative directions with the c-direction in the growth plane (nonpolar) or inclined to it (semipolar) have been developed. Heteroepitaxial nonpolar and semipolar films contain large densities of basal plane stacking faults (BSF) and related partial dislocations together with prismatic stacking faults.

In this presentation, results of TEM studies of semipolar GaN films deposited on patterned substrates will be presented. Different TEM techniques from diffraction contrast classical imaging, high resolution TEM and scanning TEM to analytical techniques as energy dispersive X-ray spectroscopy (EDS) have been employed to obtain a complete view of semipolar GaN microstructures. The understanding of the nucleation and propagation of defects allowed us to develop several growth processes resulting in a drastic reduction of the defect density:

  • A 3-step growth process for (11-22) GaN deposited on patterned r-sapphire leads to high quality GaN films with dislocation densities as low as 7x107 cm-2 and BSF densities below 102 cm-1 (figure 1)1,2.
  • A method based on the introduction of Si at an intermediate stage of the growth (before coalescence of nucleation islands) allows, in the case of (10-11) GaN on patterned (001) 7° off-axis Si, blocking the propagation of dislocations (figure 2). A 4nm thick Si-rich (5% Si from EDS analysis) layer is revealed by HRSTEM (figure 3). This layer has the wurtzite structure of the surrounding GaN and does not introduce significant strain (as revealed by GPA analysis).
  • Selective growth on deeply grooved sapphire substrate results in GaN (11-22) bands with a dislocation density in the mid 106 cm-2 on 100µm-wide regions compatible with the fabrication of laser diodes.

Besides presenting results on the improvement of material quality through innovative growth processes, this presentation emphasizes the importance of TEM studies for the developments of heteroepitaxial semiconductors structures.

The authors acknowledge the support from GANEX (ANR-11- LABX-0014).GANEX belongs to the public funded “Investissements d'Avenir” program managed by the French ANR agency.

1 F. Tendille, P.De Mierry, P. Vennéguès, S. Chenot, M. Teisseire, J. Cryst. Growth 404 (2014) 177

2 P. Vennéguès, F. Tendille and P. De Mierry, J. Phys. D: Appl. Phys. 48 (2015) 325103


Philippe VENNÉGUÈS (CRHEA, Valbonne), Florian TENDILLE, Michel KHOURY, Philippe DE MIERRY, Nicolas MANTE, Jesus ZUNIGA PEREZ, Guy FEUILLET, Vincent DELAYE, Denis MARTIN, Nicolas GRANDJEAN
08:00 - 18:15 #5782 - MS03-684 Structure of short period In(Ga)N/GaN superlattices comprising ultra-thin quantum wells.
MS03-684 Structure of short period In(Ga)N/GaN superlattices comprising ultra-thin quantum wells.

InGaN quantum wells (QWs) grown along the polar c-axis are currently the principal structural elements of III-nitride optoelectronic device active regions. Further advancement of their operational wavelength range with high internal quantum efficiency in the green part of the spectrum may be facilitated through the use of short period In(Ga)N/GaN superlattices comprising QWs with a minimal number of monolayers (MLs). At the same time, ultra-thin InN/GaN QWs have recently generated considerable interest, due to the theoretical prediction that they may exhibit topological insulator properties [1], thus opening up new prospects for applications in quantum computing and spintronics. In recent work, two-dimensional electron gas properties were demonstrated in ML-thick, nominally InN QWs, as well as a temperature-independent behavior in the diagonal resistance, indicating the topological nature of the 2DES [2].

We have studied a series of In(Ga)N/GaN short period superlattice (SPS) heterostructures deposited at low growth temperatures. The examined samples comprised SPS with nominally 1, 2, and 4 ML QW thicknesses grown by molecular beam epitaxy (MBE) on (0001) GaN/sapphire MOVPE templates. High resolution transmission electron microscopy (HRTEM), and high resolution high-angle annular dark field imaging in scanning TEM mode (HRSTEM) have been employed in order to ascertain the compositional homogeneity due to issues such as the desorption, clustering, and diffusion of indium into the GaN barriers. Such issues may be aggravated by the large elastic strain associated with the pseudomorphic growth of the ultrathin QWs. On the other hand, it is also possible that the stress due to the misfit may in fact stabilize the growth of InN at unusually high temperatures. Fig. 1 illustrates HRTEM and HRSTEM images of a 1 ML InN / 10 ML GaN SPS and of a 4 ML-thick QW. Strain and compositional mappings were implemented by using peak finding with the peak-pairs method, and geometrical phase analysis. Z-contrast image calibration was performed using reference samples and image simulations.

The results were compared with energetic calculations of pertinent supercells using both molecular dynamics with a modified Tersoff interatomic potential, and ab initio density functional theory. In both cases, deviation from the biaxial stress state of InN was identified for these QWs in agreement with the experimental observations. 

 

[1] M. S. Miao Q. Yan, C. G. Van de Walle, W. K. Lou, L. L. Li, and K. Chang, Phys. Rev. Lett. 109, 186803 (2012).

[2] W. Pan, E. Dimakis, G. T. Wang, T. D. Moustakas, and D. C. Tsui, Appl. Phys. Lett. 105, 213503 (2014)

Acknowledgement: Work partially supported by the Sonata 8 (2014/15/D/ST3/03808) project  of the Polish National Science Centre.


George DIMITRAKOPULOS, Calliope BAZIOTI, Theodoros KARAKOSTAS, Joseph KIOSEOGLOU, Theodoros PAVLOUDIS, Slawomir KRET, Julita KOZIOROWSKA, Tadek SUSKI, Emmanouil DIMAKIS, Theodore MOUSTAKAS, Philomela KOMNINOU (Thessaloniki, Greece)
08:00 - 18:15 #5858 - MS03-686 Artefact-free top-down TEM lamella preparation from a 14 nm technology IC.
MS03-686 Artefact-free top-down TEM lamella preparation from a 14 nm technology IC.

Semiconductor industry continues to shrink sizes of the electronic devices. Currently commercial state-of-the-art technology node for integrated circuits is 14 nm, while 10 and 7 nm technology nodes are in the development stage [1]. Those integrated circuits are based on multigate transistors, where source-drain channel (“fin”) is surrounded by a 3D gate. Failure analysis process of such integrated circuits typically involves inspection of TEM lamellae prepared by FIB-SEM machines from a single transistor layer. One difficulty in preparation of such lamellae is different ion milling rates of materials of the integrated circuits. In case of conventional top-down FIB polishing this causes unwanted curtaining artefacts resulted mainly from the metal contacts above the transistor layer. One way to eliminate curtaining is so called backside (or inverted) polishing technique which involves lamella extraction, flipping and polishing by FIB through the silicon layer [2]. However, this technique is too much time consuming for a daily semiconductor industry process.

In this talk we present a new technique of curtaining-free lamella preparation. This technique allows for normal top-down FIB polishing through upper metal contacts while curtaining artefacts are eliminated due changing the incident angle of ion milling by rocking of the sample on a special stage.

In order to demonstrate this technique, we took the latest commercially available processor based on 14 nm technology node [3] (Intel Pentium G4400). The processor wafer was decapsulated and mechanically polished to remove the top metal contacts. Further delayering was performed by means of a specially developed technique of water-assisted Xe Plasma FIB etching. The later technique allows uniform damage-free delayering down to the first metal layer which is just above the transistor layer (Fig. 1a). The delayered sample was transferred to a FIB-SEM machine which was equipped with a Ga FIB column, an SEM column with immersion optics and a Rocking stage [4].

Initial steps of a lamella preparation involved a standard routine of Pt protection layer deposition, FIB trench milling, undercut and lamella transfer by a nanomanipulator to a TEM half-grid for the final thinning. Lamella thinning was performed by Ga FIB at 30 kV till reaching the lamella thickness of 150 nm. The last step of thinning down to the thickness of less than 20 nm was performed by 5 and 2 kV FIB polishing (see perpendicular “fin-cut” for illustration on Fig. 1b). The final lamella was prepared just in the middle of a single fin (so called “gate-cut”). Importantly that during the last steps of FIB thinning the lamella was milled from two directions on the Rocking stage (Fig. 2a). So due to continuous change of Ga beam incident angle (±15º) curtaining artefacts were eliminated.

Finally, the prepared lamella was transferred to a TEM microscope for observation. The observation demonstrated that even though the lamella was polished by Ga FIB by top-down technique through upper metal contacts it does not show evidence of any significant curtaining artefacts (Fig. 2b). The demonstrated result proved the potential of the technique of top-down lamella thinning on a Rocking stage.

References:

[1] http://www.itrs2.net/

[2] O. Ugurlu, M. Strauss, G. Dutrow, J. Blackwood, B. Routh, C. Senowitz, P. Plachinda, and R. Alvis, Proc. of SPIE 8681 (2013), p. 868107.

[3] http://www.intel.com/content/www/us/en/silicon-innovations/intel-14nm-technology.html

[4] T. Hrnčíř, J. Dluhoš, L. Hladík, E. Moyal, J. Teshima, and J. Kopeček, 40th ISTFA Conf. Proc. (2014), p. 136.


Andrey DENISYUK (Brno, Czech Republic), Tomáš HRNČÍŘ, Jozef Vincenc OBOŇA, Martin PETRENEC, Jan MICHALIČKA
08:00 - 18:15 #5915 - MS03-688 InAs/InSb: From Nanowires to Nanomembranes.
MS03-688 InAs/InSb: From Nanowires to Nanomembranes.

The control over crystalline defects is of extreme importance when growing functional materials, since their presence may alter the final behavior (opto-electronic properties) and evolution of the growing system (orientation and shape). In the present work we address both phenomena in the particular case of InSb related nanostructures.

On one hand, heterostructured architectures may show interfacial dislocations if reaching the coherency limit, which is dependent on geometrical constrictions of the systems in addition to the mismatch between phases. In this context, it is usually assumed that the mismatch strain in axial heterostructured nanowires is mainly relaxed by elastic distortion of the lattice, although theoretical calculations predict the formation of misfit dislocations[1]. It is remarkably important unveiling whether the partial/total lattice relaxation takes place through elastic and/or plastic mechanisms since both will affect the material performance. Interestingly, the location and shape of the heterointerfaces, as well as possible diffusion phenomena involved, may hinder the understanding of the actual relaxation mechanism, as we show in the case of axial InAs/InSb nanowires[2]. Contrary to most reported works, we find out the presence of misfit dislocations at the core of the system while there is a huge plane bending through the edges of the nanowires. 

On the other hand, we correlate the systematic observation of a lateral twin boundary with the morphological transition from nanowires to membrane-like systems, called nanosails. Based on the experimental data gathered, consisting on SEM and aberration-corrected STEM measurements, including polarity determination[3], we are able to establish the underlying defect-driving growth mechanism leading to the formation of membrane-like structures growing aside InAs/InSb nanowires[4], showing excellent transport properties. Possible instabilities during the growth may promote the sinking of the catalytic droplet to wet one sidewall, leading to the nucleation of the lateral twin that opens the way for the broadening of the system.

Acknowledgements: We acknowledge funding from Generalitat de Catalunya 2014 SGR 1638 and the Spanish MINECO MAT2014-51480-ERC (e-ATOM) and Spanish MINECO Severo Ochoa Excellence Program.

[1] F Glass, Physical Review B 74 (2006), p. 121302(R).

[2] M de la Mata et al., Nano Letters 14 (2014), p. 6614.

[3] M de la Mata et al., Nano Letters 12 (2012), p. 2579.

[4] M de la Mata et al., Nano Letters 16 (2016), p. 825

[5] S Bernal et al., Ultramicroscopy 72 (1998), p.135


María DE LA MATA (Bellaterra, Spain), Renaud LETURCQ, Sébastien R. PLISSARD, Chloé ROLLAND, César MAGÉN, Philippe CAROFF, Jordi ARBIOL
08:00 - 18:15 #5934 - MS03-690 Nano-characterization of switching mechanism in HfO2-based oxide resistive memories by TEM-EELS-EDS.
MS03-690 Nano-characterization of switching mechanism in HfO2-based oxide resistive memories by TEM-EELS-EDS.

Introduction: To answer the increasing need for data storage, several forms of memory called random access memories (RAM) have been developed. Oxide resistive RAM (OxRRAM), based on switching between a low and high conductive state, are considered as one of the most promising candidates for replacing FLASH technology in the next memory generation. Forming and breaking a nanometer-sized conductive area is commonly accepted as the physical phenomenon involved in the switching mechanism of OxRRAM [1]. Nevertheless, the nature of this filament is still highly debated because oxygen vacancies [2] on one side and and metallic migrations from the electrode on the other side [3] have been evidenced.By combining high spatial resolution and local chemical analyses coupling TEM with EELS and EDS, we propose to investigate and compare two approaches for confining and analyzing the filament of a state of the art OxRRAM device: (i) ex-situ polarization using a conductive atomic force microscopy (C-AFM) followed by FIB preparation and (ii) FIB preparation followed by in-situ polarization within the TEM. We will show the advantages and disadvantages of each approach, the principal challenge remaining the preparation of a TEM lamella which contain the nanometer-sized filament.

Ex-situ forming approach: This first approach consists to block the memory resistance in an operation state, then prepare a thin lamella by FIB before placing it in a TEM for analysis. Experiments are performed on small structures (< 100nm) with patterned top electrode to confine the filament in a sample whose size is suitable for TEM analysis. The resistance switching is realized with a C-AFM which allows both to localize the structure and to locally inject current in the memory (Fig. 1. a)). The I(V) curve of the forming operation (transition of a high resistance virgin state to a low resistance state) is shown in figure 1. a). A STEM image of the structure and the corresponding STEM-EELS map of the extracted Titanium signal are shown in figures 1. b) and 1. c), respectively. A Ti-rich region with a conical shape is clearly observed in the HfO2 layer (see the blue area inside the white dotted rectangle). This conical filament seems to connect the top electrode to the bottom electrode like previously reported [3]. We will discuss the limits of this method. How can we rigorously compare two states of the device in many lamellae with different thicknesses? Is the memory state stable over time or during the FIB preparation?

In-situ forming approach: In the second approach, the thin lamella is prepared from the memory. It is then loaded on a Nanofactory in-situ holder where a tip is used for contacting the device (Fig. 2 a)), applying a voltage and simultaneously monitoring the current. A protocol was developed to optimize sample preparation and electrical contacts with the probe and avoid mechanical stress and heating phenomena which can generate measurements artifacts or simply destroy the sample.  Figure 2. b) presents the I(V) curve of the forming operation obtained within the TEM. Clearly, the forming step of the memory has been completed with 100µA compliance. No Titanium migration in the HfO2 layer has been observed by EDS (Fig. 3 a) and b)). EELS measurements before and after in-situ forming are on-going to investigate the fine structure of the Oxygen K edge in HfO2 and explain the change of resistance.

Conclusion: Two complementary polarization protocols have been developed in this work. Using C-AFM to electrically test memories is relatively easy to setup but does raise questions about external contamination and analysis of commercially available devices. With the in-situ approach, the associated experimental work is much heavier but allows complex electrical testing without any external contamination. Ti migration in the HfO2 layer was observed with the first approach, which suggests that the memory operates as a CBRAM (conductive bridge random access memory). A different behavior seems to occur with the in-situ approach. On-going studies of the Oxygen K edge fine structures will probably help to explain the observed behavior. The reproducibility of these first results will also be checked.

References

1. Waser, R., et al., Advanced Materials, 2009. 21(25-26): p. 2632-2663.

2. Calka, P., et al., Nanotechnology, 2013. 24(8).

3. Privitera, S., et al., Microelectronic Engineering, 2013. 109(0): p. 75-78.


Tristan DEWOLF (GRENOBLE), Vincent DELAYE, Nicolas BERNIER, David COOPER, Nicolas CHEVALIER, Helen GRAMPEIX, Christelle CHARPIN, Eric JALAGUIER, Martin KOGELSCHATZ, Sylvie SCHAMM-CHARDON, Guillaume AUDOIT
08:00 - 18:15 #6011 - MS03-692 Mechanisms of polarity inversion during the MOVPE growth of III-nitrides on sapphire investigated by high resolution transmission electron microscopy.
MS03-692 Mechanisms of polarity inversion during the MOVPE growth of III-nitrides on sapphire investigated by high resolution transmission electron microscopy.

The most important compound semiconductors for applications in optoelectronics crystallize in the sphalerite or wurtzite structure, which contain polar axes. Though the polarity is of crucial importance, existing concepts of polarity control in wurtzite III-N films, grown on nonpolar substrates, are based on empiricism and a basic understanding of the elementary mechanisms behind is still missing.

A common concept is deposition of a buffer layer between the polar layer and the nonpolar substrate. In metalorganic vapor phase epitaxy (MOVPE) growth of III-nitrides such buffer layers are formed in three steps: first the surface of the sapphire is exposed to ammonia, commonly known as nitridation; then a thin layer of AlN or GaN is deposited onto the nitridated surface at relatively low growth temperatures, which is subsequently annealed at high temperatures. This classical process will result in high quality metal-polar films.

N-polar growth is achieved by nitridation of sapphire surface followed by layer deposition at high temperature. As opposed to metal-polar films, the resulting N-polar films are characterized by their rough surface morphologies, which is attributed to the presence of metal-polar inversion domains.

The importance of the nitridation step in improving structural and optical properties has been pointed out in numerous reports. While the chemical processes of the nitridation step were studied in detail, very little and contradictory work was presented on structural aspects that mediate polarity. This concerns the crystalline structure of the nitridation layer and the interface between the nitridation layer and the sapphire substrate. The event of aberration corrected transmission electron microscopes (TEM) now open new possibilities to resolve even single oxygen atomic column with high spatial resolution and thus to study this .

We performed a detailed study on the structure of nitridation layer and different buffer layers with respect to the polarity control by aberration corrected high resolution TEM as well as scanning TEM. We showed that sapphire nitridation results in a rhombohedral AlON-layer that converts the initially N-polar nucleated AlN to Al polarity. We performed contrast simulations for phase contrast imaging as well as for Z-contrast STEM imaging. The result of these simulations and the corresponding experimental images are shown in Fig.2.

The AlON layer, however, dissolves under high temperature growth conditions typical for III-nitrides, the initially N-polar AlN is reestablished and acts as a N-polar template. Therefore, we suggest that the role of the low temperature buffer is to protect the unstable AlON layer upon further growth.

The deeper understanding of the processes, governing the polarity inversion in III-N films, will allow optimizing growth conditions and improving the quality of N-polar thin films, therefore opening an access to the novel device concepts based on polarity engineering.

 Acknowledgments: N.Stolyarchuk acknowledge support from GANEX (ANR-11-LABX-0014). GANEX belongs to the public funded ‘Investissements d’Avenir’ program managed by the French ANR agency


Natalia STOLYARCHUK, Stefan MOHN, Toni MARKURT, Aimeric COURVILLE, Rosa DI FELICE, Philippe VENNÉGUÈS (CRHEA, Valbonne), Martin ALBRECHT
08:00 - 18:15 #6015 - MS03-694 Quantifying Mg doping in AlGaN layers.
MS03-694 Quantifying Mg doping in AlGaN layers.

     Gallium nitride and its alloys, AlGaN and InGaN, are essential but also challenging materials for the development of optoelectronic devices, such as visible or UV LEDs. The optical and electric properties of nano-objects such as 2D layers, quantum dots or nanowires are indeed directly affected by the concentration and the distribution of dopants. Mg is the most used p-type dopant for nitrides, however its impact on structural and optical properties is still not fully understood. In particular it is of the upmost importance to determine if it is homogeneously distributed or not. In metal organic chemical vapor deposition or hydride vapour phase epitaxy grown layers, for concentrations higher than 1018 cm-3, Mg has been observed to segregate into a variety of defects, inversion polarity, and pyramidal inversion domains [1][2][3]. In molecular beam epitaxy (MBE) grown layers, the question is not solved for such low concentrations. However, higher concentration of Mg causes clustering or incorporation in interstitial sites [4]. For this purpose, we have used atom probe tomography (APT), EDX both in SEM and TEM, and EELS with the aim to compare and determine which one is the most appropriate technique for providing qualitative and quantitative information on Mg low doping. The obtained results will be presented.

 

     Mg-doped Al0.2Ga0.8N 2D layers grown by MBE have been studied with a concentration around 3x1019 at.cm-3 according to SIMS measurements. The sample has been prepared by FIB either as a thin layer for EELS and EDX investigations, or as a sharp needle for APT experiments.

    

     For EDX as well as for EELS experiments, the main difficulty arises from the position of the emission line (Kα) or respectively absorption line of Mg (Mg K-edge), very close to that of Ga which is the main element of the sample. Adding to this, it has not been possible to observe Mg on TEM-EDX elemental maps.

 

     Thanks to the use of a Bruker FlatQUAD detector in SEM-EDX mode with a very large solid angle data collection which ensures a very high counting rate[5], it has been possible to detect Mg and its concentration has been estimated around 3.8 ±1.4 x1019 at.cm-3 (Figure [1]). This is in very good agreement with SIMS experiments.  

    

     Finally, we have performed APT analyses on the same samples. The mass spectrum clearly shows the presence of Mg, its isotopes and also its alloys (Figure [2]). The concentration has been estimated around 3.2 ±2.5 x1019 at.cm-3 after data treatment. The 3D reconstruction of Mg (Figure [3]) shows a homogenous distribution of Mg. Statistical analyses are currently performed using first and k-nearest neighbor method in order to determine if the distribution is actually homogenous or not at small scale, and to try to have a more accurate measurement of the Mg content according to the method developed by Thomas Philippe et al[6].

 

 

[1] S.E.Bennet et al. Study of Mg-doped AlGaN/GaN superlattices using TEM coupled to APT - Ultramicroscopy 111 (2011) 207-211)

[2] P.Vennéguès et al. Atomic structure of pyramidal defects in Mg-doped GaN – Phy.Rev.B, 68, 235214 (2003)

[3] N.Grandjean et al. Control of the polarity of GaN films using an Mg adsorption layer – J.Cryst.Growth 251 (2003) 460

[4] S.Pezzagna et al. Polarity inversion of GaN (0001) – J.Cryst.Growth 269,249 (2004)

[5] E. Robin et al., this conference proceedings

[6] T.Philippe et al. Clustering and nearest neighbour distances in atom probe tomography – Ultramicroscopy 109 (2009) 1304-1309


Lynda AMICHI (GRENOBLE), Isabelle MOUTON, Eric ROBIN, Vincent DELAYE, Nicolas MOLLARD, Philippe VENNÉGUÈS, Samuel MATTA, Julien BRAULT, Adeline GRENIER, Pierre-Henri JOUNEAU, Catherine BOUGEROL
08:00 - 18:15 #6019 - MS03-696 Structural quality of CH3NH3PbI3 perovskites for photovoltaic applications analyzed by electron microscopy techniques.
MS03-696 Structural quality of CH3NH3PbI3 perovskites for photovoltaic applications analyzed by electron microscopy techniques.

 

Hybrid Halide Perovskites (HPVK) are novel materials that have attracted attention in the last few years as promising materials in the photovoltaic field,[1, 2] as efficiencies higher than 20% have been reported[3].The HPVK can have different compositions, which allows the control of lattice parameters[4] and bandgap values in the visible to near infrared region[5]. In particular, CH3NH3PbI3 presents optimal electronic and optical properties such as direct optical band gap of 1.55 eV or long electron/hole diffusion length (100 nm)[6].

In this communication, we have analysed the structural quality of two CH3NH3PbI3samples by electron microscopy techniques. The samples have been grown using spin coating solution processing method. The details of the process can be found in[7]. The structure of the samples consists of a substrate of SiO2 (2µm), a TiO2 layer (40 nm), an active layer of HPVK and a poly-methyl methacrylate (PMMA) capping layer (1µm) in order to protect the sample from oxidation. The two samples studied (S500 and S100) have different HPVK thicknesses, 500 and 100 nm respectively, obtained by changing the speed in the spin-coating process [7]. The first analyses have been carried out by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), which is sensitive to the atomic number of the atoms in the material. Fig. 1 a shows a HAADF-STEM image of the first sample, where the different layers of the structure can be observed. These layers have been studied by energy dispersive X-ray analysis (EDX) as exhibited in Fig. 1 b, and the layers sequence (SiO2, TiO2 and HPVK) has been confirmed. Thus, spectrum 3 in Fig. 1 b shows the presence of Pb and I, indicating that this layer corresponds to the HPVK, despite it shows a reduced size due to the ion bombardment during the sample preparation process for TEM. Electron diffraction patterns have been taken from the HPVK layer and, surprisingly, some areas have shown to be polycrystalline but others are amorphous. Previous analysis of the functional properties of these samples suggests that they are crystalline. Sample preparation to obtain the electron transparent specimen may cause a detrimental effect in the HPVK layer, producing the amorphization of a material. Because of this, the procedure of sample preparation is being optimized in order to analyse in detail the structural properties of this material.

References:

[1] H.J. Snaith, The Journal of Physical Chemistry Letters, 4 (2013) 3623-3630.

[2] H.-S. Kim, J.-W. Lee, N. Yantara, P.P. Boix, S.A. Kulkarni, S. Mhaisalkar, M. Grätzel, N.-G. Park, Nano Letters, 13 (2013) 2412-2417.

[3] M.A. Green, K. Emery, Y. Hishikawa, W. Warta, E.D. Dunlop, Progress in Photovoltaics: Research and Applications, 23 (2015) 1-9.

[4] A. Sadhanala, S. Ahmad, B. Zhao, N. Giesbrecht, P.M. Pearce, F. Deschler, R.L.Z. Hoye, K.C. Gödel, T. Bein, P. Docampo, S.E. Dutton, M.F.L. De Volder, R.H. Friend, Nano Letters, 15 (2015) 6095-6101.

[5] Y.H. Kim, H. Cho, J.H. Heo, T.S. Kim, N. Myoung, C.L. Lee, S.H. Im, T.W. Lee, Advanced Materials, 27 (2015) 1248-1254.

[6] G. Xing, N. Mathews, S. Sun, S.S. Lim, Y.M. Lam, M. Grätzel, S. Mhaisalkar, T.C. Sum, Science, 342 (2013) 344-347.

[7] I. Suárez, E.J. Juárez-Pérez, J. Bisquert, I. Mora-Serõ, J.P. Martínez-Pastor, Advanced Materials, 27 (2015) 6157-6162.

Acknowledgements: This work was supported by the Spanish MINECO (projects TEC2014-53727-C2-1-R, -2-R and CONSOLIDER INGENIO 2010 CSD2009-00013) and Junta de Andalucía (PAI research group TEP-946). The research leading to these results has received co-funding from the European Union.

 


Natalia FERNÁNDEZ-DELGADO (Cádiz, Spain), Miriam HERRERA-COLLADO, Francisco DELGADO-GONZÁLEZ, Emilio JUÁREZ-PÉREZ, Iván MORA-SERO, Isaac SUÁREZ, Juan MARTÍNEZ-PASTOR, Sergio MOLINA
08:00 - 18:15 #6033 - MS03-698 Structural analysis of GaSb/GaAs quantum rings for Solar Cells.
MS03-698 Structural analysis of GaSb/GaAs quantum rings for Solar Cells.

A type-II GaSb/GaAs quantum dot (QD)/quantum ring (QR) solar cell (SC) achieves higher photo-response than its type-I counterpart [1], as it supports an enhanced carrier recombination rate due to a larger separation between the electron and hole confinements [2]. This behavior leads to greater valence band offset [2] and, eventually, the solar cell is also able to function well into the near infrared (NIR) regions [3]. The stacking of several GaSb/GaAs QDs layers within the SC is essential to increase the photon absorption, however these heterostructures face a large lattice mismatch (7.8%) that causes a high local strain [4]. Because of this, sometimes QDs tend to relax by diffusing Sb from its center, followed by As/Sb exchange, giving place to nanostructures in the form of quantum rings (QR). [5].

In this communication, we analyze a GaSb/GaAs structure grown at 480ºC by molecular beam epitaxy (MBE) on a GaAs substrate. The GaSb layers (2.1 ML) are capped by two consecutive GaAs layers (10nm at 480ºC and 30nm at 580ºC), and this whole segment is repeated 10 times. The structural properties of this sample have been analyzed by diffraction contrast Transmission Electron Microscopy (TEM) in a JEOL 2100 LaB6 microscope, working at 200 kV. 220 bright field (BF) images of the GaSb layers have shown that no dislocations or other type of defects appear in the structure, and only some strain contrasts due to the lattice mismatch are observed. Fig. 1 shows a 002 dark field (DF) image of the sample that clearly shows two-lobe shaped nanostructures corresponding to the presence of QR. We have found that the average diameter of the QR is 14 ± 5 nm, with average diameter of the individual lobes of 4±2 nm and an average height of 3±2 nm. Also, it is worth highlighting that a vertical stacking of the QR is not observed which is a consequence of a reduced propagation of the strain to the subsequent QR layers because of the large thickness of the GaAs barrier layers. High angle annular dark field (HAADF) analyses using an aberration corrected electron microscope are in progress in order to obtain more detailed information about the composition and the strain in these heterostructures.    

References:

[1] Wei-Hsun Lin, Kai-Wei Wang, Yu-An Liao, Chun-Wei Pao and Shih-Yen Lin, Journal of Applied Physics, vol. 114, pp. 053509, 2013.

[2] A. Marent, M. Geller, A. Schliwa, D. Feise, K. Pötschke, D. Bimberg, N. Akçay and N. Öncan, Applied Physics Letters, vol. 91, pp. 242109, 2007.

[3] R. B. Laghumavarapu, A. Moscho, A. Khoshakhlagh, M. El-Emawy, L. F. Lester and D. L. Huffaker, Applied Physics Letters, vol. 90, pp. 173125, 2007.

[4] P. J. Carrington, R. J. Young, P. D. Hodgson, A. M. Sanchez, M. Hayne and A. Krier, Crystal Growth & Design, vol. 13, pp. 1226-1230, 2013.

[5] E. P. Smakman, J. K. Garleff, R. J. Young, M. Hayne, P. Rambabu and P. M. Koenraad, Applied Physics Letters, vol. 100, pp. 142116, 2012.

 

This work was supported by the Spanish MINECO (projects TEC2014-53727-C2-2-R and CONSOLIDER INGENIO 2010 CSD2009-00013) and Junta de Andalucía (PAI research group TEP-946). The research leading to these results has received funding from the European Union (PROMIS Marie Curie ITN network).


Atif Alam KHAN (Cádiz, Spain), Miriam HERRERA, Natalia FERNÁNDEZ-DELGADO, Denise MONTESDEOCA, Peter CARRINGTON, Hiromi FUJITA, Juanita Saroj JAMES ASIRVATHAN, Magnus WAGENER, Reinhardt BOTHA, Andrew MARSHALL, Anthony KRIER, Sergio MOLINA
08:00 - 18:15 #6037 - MS03-700 Analysis of semipolar InxGa1-xN/GaN heterostructures by WBDF and HRTEM imaging.
MS03-700 Analysis of semipolar InxGa1-xN/GaN heterostructures by WBDF and HRTEM imaging.

GaN-based optoelectronic structures have been successfully applied in the fabrication of blue light emitting diodes (LEDs) and laser diodes [1]. The fabrication of high-efficient green LEDs remains challenging which is referred to as the “green gap”. In GaN-based green LEDs, the active region consists of InxGa1-xN quantum wells (QWs) and GaN barrier layers (BLs) where the emitting wavelength is controlled by the In content (x).  However, In incorporation often results in inferior crystal quality due to the miscibility gap and lattice mismatch when the In content is increased [2]. Although conventional c-plane InxGa1-xN /GaN QWs have demonstrated the highest crystal quality,  the quantum efficiency remains low as a result of the polarization field along the c-axis which tilts the conduction and valence bands thus reducing the recombination probability (i.e., quantum confined Stark effect, QCSE). Semipolar InxGa1-xN/GaN structures, on the other hand, offer a good compromise between reduced QCSE and acceptable crystal quality [3].

In this study, we investigated the crystal quality of two sets of InxGa1-xN/GaN structures grown on (11-22) and (10-11)-semipolar planes. The samples were grown on sapphire by using metalorganic vapor phase epitaxy (MOVPE). The weak-beam dark-field technique (WBDF) was applied to investigate the distribution of the threading dislocations (TDs). Figure 1 shows the WBDF images of a (11-22)-semipolar sample. The GaN growth starts on the c-plane-like facets by MOVPE, forming triangular shaped stripes. The stripes subsequently coalesce forming a closed {11-22}-semipolar surface. TDs originate from the inclined c-plane-like GaN/sapphire interface and propagate in c-direction and then bend 90° to the a-directions. Most of the dislocations accumulate around the coalescence area and penetrate the QWs. The bending phenomenon is related to the triangular shape of the original GaN stripes and the SiNx interlayers deposited during the growth of GaN.

By using high-resolution TEM, we characterized the local structures of the QWs. Figure 2 shows the experimental HRTEM images of a (10-11)-semipolar sample acquired from the active region. Structural factors, such as the thickness of the QWs, the interfacial sharpness between the QWs and the BLs and the stacking faults formed with in the active region, can be analyzed with atomic resolution. Stacking faults are observed and confirmed to be the I2 intrinsic type. [4]

References

[1] Shuji Nakamura and Gerhard Fasol. The Blue Laser Diode-GaN Based Light Emitter and Lasers. Springer Berlin Heidelberg, 2000.

[2] F Scholz. Semipolar GaN grown on foreign substrates: a review. Semiconductor Science and Technology, 27(2):024002, 2012.

[3] J. S. Speck and S. F. Chichibu. Nonpolar and semipolar group III nitride-based materials. MRS Bulletin, 34:304312, 5 2009.

[4] We gratefully acknowledge financial support by the DFG (KA1295/22-1) and technical support by Sabine Grözinger in cross-section TEM sample preparation. 


Xiaodan CHEN (Ulm, Germany), Haoyuan QI, Yueliang LI, Tobias MEISCH, Ferdinand SCHOLZ, Ute KAISER
08:00 - 18:15 #6070 - MS03-702 Electron beam drilling rates of silicon crystal measured on various accelerating voltages and probe currents.
MS03-702 Electron beam drilling rates of silicon crystal measured on various accelerating voltages and probe currents.

 The design rule of the semiconductor device has been miniaturized to be 22/20 nm or 16/14 nm recently. When we analyze a structure of these miniaturized devices by scanning transmission electron microscopy (STEM), it is necessary to prepare a lamella with a thickness less than 20 nm. And the thin lamella is analyzed by energy dispersive x-ray spectroscopy (EDS) and/or electron energy-loss spectroscopy (EELS), which require longer dwell time than that of imaging due to small signal intensity. This lamella may receive the electron beam damage if a STEM probe is not optimized. The damage could be categorized to be two types, one is structure deformation of sample and the other is etching and/or migration of sample atoms, resulting in beam drilling of sample [1]. The latter is crucial for elemental analysis, since it significantly affect to results of quantitative analysis. Such phenomena were proposed, since the field emission STEM was commercialized [2,3]. In this paper, we report beam drilling of Si crystal depending on electron probe currents and accelerating voltages.

 We used a field emission electron microscope (JEOL, JEM-2800) equipped with a X-ray detection system, which include two large-sized silicon drift detectors (dual SDD, 100 mm2). A lamella of a silicon device was prepared with Ar ion milling (JEOL, Ion Slicer). The thickness of the lamella was measured to be approximately 15 nm by the EELS ratio method. To measure electron beam etching rate, we measured a decay of Si X-ray (Kα) count rates using a point analysis mode.

 Figure 1 shows the decay profiles on Si count rates for various probe currents at 200 kV. The decay rate (R) is express as R = R0*exp(-at), where R0 is initial decay rate, exp(-a) is decay coefficient at a certain probe current and an accelerating voltage, and t is elapsed time. Thus, we estimate the decay coefficient by fitting the decay profiles. Si X-ray count rates are decreased with the decay coefficients of 22.74 %/sec, 16.72 %/sec, 8.41 %/sec and 3.03 %/sec for probe currents of 1.50 nA, 0.96 nA, 0.50 nA and 0.22 nA. The measured decay coefficients are approximately proportional to probe current, through the electron densities under these probes are approximately constant to be 2.0 nA/nm2. We need to care to use a large probe current for analysis or imaging with long dwell time, since this result implies that the drilling rate is promoted when we uses larger current. Therefore, it is preferable to analyze with small current as possible for less damage of sample at 200 kV.

 Figure 2 plots decay of Si count rates for various accelerating voltages with probe current of 3.72 nA. The decay rates for 200 kV, 100 kV and 60 kV are measured to be 32.3 %/sec, 0.26 %/sec and 0.0 %/sec. The rates are not proportional to accelerating voltage. The drilling rate on accelerating voltage is related to threshold energy of sputtering of Si atoms. In addition to the low sputtering probability, the ionization cross section increases at lower energy, resulting in higher count rate at lower voltage. The initial count rates at 3.72 nA for 200, 100 and 60 kV were measured to be 12.7 kcounts/sec, 18.3 kcounts /sec, 29.0 kcounts /sec.

 In conclusion, we found out that elemental analysis in the low accelerating voltage is very effective for reduction of the electron beam damage as well as higher sensitivity due to larger ionization cross section of an element.

 

References

[1] RF Egerton, P Li and M Malac, Micron 35 (2004) p.399.

[2] LE Thomas, Ultramicroscopy 18 (1985) p.173.

[3] PA Crozier, MR McCartney and DJ Smith, Sur. Sci. 237 (1990) p.232.


Noriaki ENDO (Tokyo, Japan), Yukihito KONDO
08:00 - 18:15 #6077 - MS03-704 Holographic Measurement of Strain and Macroscopic Potentials in GaN Heterostrucutres.
MS03-704 Holographic Measurement of Strain and Macroscopic Potentials in GaN Heterostrucutres.

The phase of an electron wave transmitted through a sample can be measured with the transmission electron microscope (TEM) using electron holography. This phase information is used to determine electrostatic potential distributions within the specimen, e.g. a semiconductor device [1]. Increasing the resolution towards anatomic scale makes it further possible to measure the lattice constants and the strain state of the crystalline specimen.

In this contribution we present a simulation study on the obtainable phase information using the crystal structure, the macroscopic electrostatic potential, and the strain-state as input parameters. This input is used to compute the potential distribution within the specimen. Then, we use the multislice-algorithm to propagate the electron wave through the sample. The output of the simulation, i.e. the actual amplitude and phase of the exit-wave, is analyzed by Fourier filtering of selected reflections. Figure 1 illustrates this approach.

We apply this approach to simulate the measurement of the polarization induced electrostatic fields in a strained Al0.2Ga0.8N thin-layer, embedded in a GaN matrix. Figure 2a shows the scheme of the specific simulation setup described in this contribution. This material system is of particular interest, because of its applications to optoelectronics. The actual field-strengths in this material system are still a matter of scientific discussion.

For a holographic measurement in a TEM, a sample thickness of 200-300 nm is normally used. This has the advantage, that a large phase signal can be expected. But the thick samples lead to strong dynamic diffraction conditions and thus a complicated material contrast. Hence, sample-tilt and local thickness variations have a significant impact on the measurement result.

Figure 2b shows a typical simulation result in the case of a 10 nm Al0.2Ga0.8N thin-layer, grown on a c-plane of the Wurzite GaN matrix. The strain of the layer is set to 1% and the polarization induced field to 1.5 MV/cm, according to the order of magnitude expected from literature [2]. The polarization induced field corresponds to an interface charge density of ±7.7 *1012 cm-2.

The simulation results were filtered around the (0000)-beam and the ±(0002)-reflections (figure 3a). Typical results are shown in figure 3b. The phase profiles of the (0000)-beam and diffracted ±(0002)-beams show a slope within the Al0.2Ga0.8N - layer. This slopes contain information about the actual polarization field and strain of the layer. We show that, despite the dynamic diffraction conditions, the slope can be evaluated with the standard approach from kinematic diffraction theory yielding precisely the strain and field strength, as given as input to the model.

Nevertheless, one has to consider the dynamical diffraction conditions because they define the material contrast at the hetero interface and the actual signal amplitude within the Al0.2Ga0.8N - layer. By adjusting the sample thickness and sample tilt the conditions can be optimized with respect to the signal amplitude. We suggest to use wedge shaped samples in order to obtain more experimental flexibility.



[1] H. Lichte, M. Lehmann, Annu. Rev. Modern Physics 71 (2008) 016102

[2] O. Ambacher, J Majewski, J. Phys: Condens. Matter 14 (2002) 3399-3434

[3] We kindly acknowledge support from the DFG within the Collaborative Research Center 787, project A4.


Michael NARODOVITCH (Berlin, Germany), Tore NIERMANN, Michael LEHMANN
08:00 - 18:15 #6140 - MS03-706 In-situ observation of structural transition, ferromagnetic order breaking and magnetocrystalline anisotropy by EMCD in MnAs/GaAs(001).
MS03-706 In-situ observation of structural transition, ferromagnetic order breaking and magnetocrystalline anisotropy by EMCD in MnAs/GaAs(001).

        

        EMCD (Energy-Loss Magnetic Chiral Dichoism), an emerging technique based on energy-loss spectroscopy (EELS) in a transmission electron microscopy (TEM) [1-2], aims at measuring the element-specific local magnetic moment of solids at a nanometer scale. The signal of interest that brings the magnetic information comes from two chiral positions in the electron diffraction pattern, as sketched in figure 1(a).  

        In this work, EMCD is carried out to epitaxial MnAs thin films grown on a GaAs(001) substrate. As illustrated in figure 1(b-c), a breaking of the ferromagnetic order in MnAs thin film  is locally studied in-situ, together with the associated crystallographic transition from hexagonal α-MnAs to quasi-hexagonal β-MnAs, by modifying the temperature of the crystal inside the electron microscope. To achieve quantitative information, applying the sum rules [3] to the dichroic signal of magnetic anisotropic materials is accurately discussed [4].

       In addition, the orbital-to-spin moment ratio of -MnAs along the easy, hard, and intermediate magnetic axes is estimated by EMCD and compared to implemented density functional theory (DFT) calculations, as illustrated in table 1. The influence of the magnetocrystalline anisotropy is locally demonstrated [5]. This work in particular illustrates the feasibility of the EMCD technique for in-situ experiments, and proves its potential to explore the anisotropy of magnetic materials.

[1]. Schattschneider, P. et al. Nature 441, 486–488 (2006).

[2]. Warot-Fonrose, B. et al. Ultramicroscopy 108, 393–398 (2008).

[3] Calmels, L. et al. Phys. Rev. B 76, 060409 (2007).

[4] Fu, X. et al. Applied Physics Letters 107, 062402 (2015).

[5] Fu. X, et al. Phys. Rev. B 00, 004400 (2016).

Acknowledgement: This work is supported by the French national project EMMA (ANR12 BS10 013 01) and by the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative Reference 312483-ESTEEM2.


Xiaoxiao FU (Toulouse), Bénédicte WAROT-FONROSE, Rémi ARRAS, Dominique DEMAILLE, Mahmoud EDDRIEF, Virginie SERIN
08:00 - 18:15 #6154 - MS03-708 EDX-STEM phase mapping of semiconductor devices using multivariate statistical analysis tools.
MS03-708 EDX-STEM phase mapping of semiconductor devices using multivariate statistical analysis tools.

With the increasing miniaturization of electronic devices, high resolution structural and analytical characterization tools are necessary for the optimization of fabrication processes. Scanning transmission electron microscopy energy dispersive X-ray (EDX-STEM) spectroscopy is a well-established technique that has recently gained momentum thanks to the introduction of high-brightness electron sources and the Super-X EDX system (4 SDD detectors), allowing fast EDX mapping with high collection efficiency. While the traditional EDX data analysis consists in extracting the elemental map of each element present in the sample [1], it is often the case that the aim of the analysis is to investigate the spatial distribution, shape and thickness of the different chemical phases present in the sample.


Multivariate statistical analysis tools, such as non-negative matrix factorization (NMF) and independent component analysis (ICA), were shown to yield simplified interpretation of spectral datasets by rapid identification of phases (e.g. [2,3]). In this work, we applied NMF to the EDX analysis of Si/SiGe multilayers to validate the Sidewall Image Transfer (SIT) process developed for their patterning [4]. A FIB-prepared lamella was characterized in an FEI Titan Themis operating at 200kV and equipped with a probe corrector and 4 SDD EDX detectors. An EDX-STEM map was acquired with TIA, using a pixel size of 1nm and a dwell time of 20ms/pixel, and exported to hyperspy, a python-based software for hyperspectral data processing [5].


Spectral unmixing using NMF led to the identification of five chemical phases in the sample: Si, SiGe, SiO2, TiN and C (see the component spectra in Figure 1 and the corresponding loadings in Figure 2(a-e)). More specifically, NMF succeeded in: (1) separating the Si signal emanating from pure Si, SiGe and SiO2 layers; and (2) deconvoluting the C, N and O peaks. This greatly simplified the compositional analysis (Figure 2(f)), and allowed a more straightforward estimation of the thickness of the different layers, as shown in Figure 2(g).


NMF combined to EDX-STEM tomography was recently applied to superalloy systems for aerospace applications [6,7]. We will show that this approach has also the potential to address materials characterization challenges currently facing the semiconductor industry, such as the chemical analysis of dopants and impurities [8].

References

1. K. Lepinay et al. Micron 47 (2013), p. 43. 2. F. de la Pena et al. Ultramicroscopy 111 (2011), p. 169.
3. G. Lucas et al. Micron 52-53 (2013), p. 49.
4. S.Barnola et al. Proc. of SPIE 9054 (2014), 90540E-1.
5. www.hyperspy.org

6. D. Rossouw et al. Acta Materialia 107 (2016), p. 229.

7. S. Ikeshita et al. Micron 82 (2016), p.1

8. We thank Pierre Burdet and Francisco de la Pena for their help with hyperspy. The experiments were performed on the Nanocharacterisation platform at MINATEC.


Zineb SAGHI (Grenoble), Patricia PIMENTA-BARROS, Gael GORET, Tony PRINTEMPS, Nicolas BERNIER, Sylvain BARRAUD, Vincent DELAYE
08:00 - 18:15 #6177 - MS03-710 Radial and Axial Interfaces in III-V Heterostructured Nanowires.
MS03-710 Radial and Axial Interfaces in III-V Heterostructured Nanowires.

Nanoscale heterostructures are promising candidates with potential in several applications such as optoelectronics and electronics. III-V nanowires, in this context, are excellent examples as they offer an ample range of possibilities for modulating the properties.1 In addition, their morphology allows accommodation of different compounds with larger lattice mismatch compared to bulk.2 In this work, we study a heterostructured GaSb-InAs system in which InAs grows both radially and axially on the GaSb.

Nanowires are grown by metal organic vapor phase epitaxy (MOVPE) using size-selected Au aerosol particles,3 as catalysts, which were deposited onto B-oriented GaAs wafers. The nanowire growth was carried out in an AIXTRON 3x2” close coupled showerhead MOVPE growth reactor at set temperatures of 510°C for GaAs and GaSb and 460°C for InAs, respectively. Firstly GaAs stems were synthesized. Then GaSb axial segments were grown on GaAs stems followed by an InAs growth step which led to formation of a radial shell on the GaSb segments as well as an axial segment on top of GaSb.

The axial and radial heterointerfaces are thoroughly studied by means of aberration-corrected scanning electron microscopy (STEM) and atomic-resolution electron energy loss spectroscopy (EELS). We demonstrate that the sharpness of the interfaces is different and hence they exhibit different charge transport properties in axial and radial directions. In Figure 1, the atomic-resolution EELS maps at the radial interface are shown.4

Moreover, the polarity of the nanowires is determined by means of medium-/high-angle annular dark-field (MAADF/HAADF-STEM) imaging. It is shown that each accommodating material inherits the polarity from its base. An As-polar GaAs segment grows on the GaAs (111)B substrate. Then GaSb accommodates with Sb polarity, the heavier element is on top in the dumbbell units; and the InAs shell grows with As polarity (lighter element on top). Therefore, as shown in Figure 2, a switch in the intensity along the dumbbell units is observed along the diameter of the nanowires caused by the change in the chemical composition (from GaSb core to InAs shell). The EELS compositional maps also confirm this change.4

 

References

1 M.T. Bjork et al., Appl. Phys. Lett. 80, 1058 (2002).

2 F. Glas et al., Phys. Rev. B 74, 121302 (2006).

3 M.H. Magnusson et al, Nanostructured Mater. 12, 45 (1999).

4 R.R. Zamani et al, submitted (2016)

 

Acknowledgements

The authors acknowledge the financial support from the U.K. Engineering and Physical Sciences Research Council (EPSRC) for supporting at the SuperSTEM Laboratory, the National Facility for Aberration-Corrected STEM. Additionally, RRZ and KAD acknowledge the European Research Council (ERC) for funding the “NEWIRES” project under grant agreement number 336126.


Reza R. ZAMANI (Lund, Sweden), Sebastian LEHMANN, Fredrik S. HAGE, Quentin M. RAMASSE, Kimberly A. DICK
08:00 - 18:15 #6187 - MS03-712 Protecting copper TEM specimens against corrosion via e-beam induced carbon deposition.
MS03-712 Protecting copper TEM specimens against corrosion via e-beam induced carbon deposition.

Copper containing Transmission Electron Microscopy (TEM) specimens are vulnerable to corrosion during transfer from Focused Ion Beam (FIB) to TEM vacuum. The corrosion is an attack of the copper surface by sulfur from ambient laboratory air (present at ppb level). The sulfur attack leads to a CuS tarnish layer covering the specimen sidewalls, and holes are formed in the copper layers [1]. Hence the specimen has to be discarded for TEM analysis. Naturally, the native oxide of copper is protecting against sulfur attacks, but this oxide is removed during the specimen preparation by FIB. In this work, the protection efficiency of a carbon layer deposited in the FIB subsequently to the TEM specimen preparation, is studied.

The carbon layers are e-beam deposited in a FEI Helios460 dual beam FIB on a thinned copper specimen (Fig. 1). Sufficiently thin layers are achieved with a 15 pA, 5kV e-beam scanning for 60 s/120 s/180 s in an area of 2x5 µm2 with 300ns dwell time. For a full protection it is necessary to deposit carbon on both sidewalls of the specimen, which is done by rotating the FIB sample stage by 180 degree. The electron beam is incident to the TEM lamellae at an angle of 38º. The carbon layer quality and thickness are studied in a FEI Titan3 60-300 instrument on the sidewalls of a HfO2 layer in a cone shaped specimen prepared through a Si/100 nm HfO2 stack (Fig. 2). The HfO2 cones give suitable contrast to the carbon layer and exhibit little ion beam sidewall damage from ion beam thinning. A small layer of redeposited material is covering the cone sidewall with a maximum thickness of 1nm. As the corrosion from the ambient laboratory air is not very reproducible from day to day and varies in strength from no corrosion to severe damage to the specimen, we designed a better controlled experiment by simulating the corrosion via a forced sulfur attack. This is done by storing the copper specimens after the ion beam milling and carbon deposition with a sulfur flake for 10 min in a gelatin capsule, which creates a sulfur enriched ambient.

The effectiveness of the protection layer is shown on Fig. 1. The copper specimen has two areas where carbon was deposited on both sidewalls for 120 s and 60 s respectively. After the preparation, the specimen was stored for 10 min with sulfur and then immediately transferred to the TEM. This treatment resulted in complete corrosion of the uncapped areas, whereas the carbon protected regions remained in perfect condition for the 120 s deposition time. The 60 s deposition time shows little corrosion at the edge and thus does not offer a complete protection. The same carbon deposition conditions were used on the HfO2 cones to measure the carbon layer thickness  at the sidewall of the cones and to see the influence of an enduring beam interaction. The above mentioned deposition conditions lead to a thickness of 3/4/4.5 nm on the sidewall of the cones for a 60s/120s/180s deposition time, respectively (Fig. 3). A series of TEM images over 5 minutes did not show any increase of carbon layer thickness at the sample sidewall (Fig. 4). Henceforth the sample is suitable for enduring beam interactions in TEM mode. A 60s 25 % O2/75 % Ar plasma cleaning in a Fischione Instruments “Nanoclean 1070” system can remove the deposited carbon layer on the copper.

It can be concluded that 4 nm of carbon can protect the surface sufficiently against sulfur attack from ambient laboratory air. The e-beam deposition is done with low beam currents as used for SEM imaging during the specimen preparation and is suitable for e-beam sensitive materials .

Felix Seidel acknowledges the Institute for Promotion of Innovation by Science and Technology in Flanders (IWT) for his Ph.D. fellowship.

[1] Felix Seidel, Olivier Richard, Hugo Bender, Wilfried Vandervorst, “Post-ion beam induced degradation of copper layers in transmission electron microscopy specimens”, Semiconductor Science and Technology, Volume 30, Issue 11, article id. 114016 (2015)


Felix SEIDEL, Olivier RICHARD, Hugo BENDER (Leuven, Belgium), Wilfried VANDERVORST
08:00 - 18:15 #6193 - MS03-714 A mechanism for the introduction of threading dislocations in III-nitride epitaxial layers from closed basal stacking fault domains.
MS03-714 A mechanism for the introduction of threading dislocations in III-nitride epitaxial layers from closed basal stacking fault domains.

The crucial issue of extensive threading dislocation (TD) introduction in III-nitride compound semiconductor epitaxial layers remains unresolved so far since their densities cannot be justified on the basis of operation of Matthews-Blakeslee dislocation glide on pyramidal planes. This concerns primarily the TDs with a-type 1/3<11-20> Burgers vectors which constitute the principal TD population. Mosaicity is another reason for TD introduction due to the need for accommodation of small misorientations between nucleated islands. However, high TD densities have persisted despite the advancements in mosaicity suppression through growth involving two-dimensional step flow.

Based on transmission electron microscopy (TEM) observations, we propose a mechanism for the nucleation of a-type TD half loops from closed domains bounded by two superimposed intrinsic basal (0002) stacking faults (BSFs) of I1 type [1]. We have employed both diffraction contrast TEM and high resolution TEM (HRTEM) in cross sectional and plan-view geometries in order to verify the generality of the proposed mechanism by experimental observations on InGaN, AlGaN, and InAlGaN epilayers, as well as on multi-quantum wells (MQWs) grown by the MBE and MOVPE methods. Defect characterization was performed by the circuit mapping [2] and geometrical phase analysis (GPA) methods.

We have found that depending on the relative orientation of the sphalerite structural units that comprise the I1 BSFs, the BSF closed domain may be dislocation-free (Fig. 1) or may be surrounded by a 1/3<10-10> partial dislocation loop (Fig. 2). In the former case the structural units are mirror related, whereas in the latter they are oriented in parallel as shown in Figs. 1(a) and 2(a) respectively. Such closed domains are hexagonally-shaped with sides along the m-type <10-10> directions. When defected, they become unstable in response to the strain environment caused by the interfacial misfit or by the compositional grading. As a result they re-arrange in order to contribute to the strain relief through a Burgers vector reaction, so that the total in-plane Burgers vector of the loop is not zero, but corresponds instead to a misfit dislocation segment.  Such a reaction requires a concurrent emanation of an inverse TD half loop from nodes localized at two of the hexagon’s vertices, in agreement with the experimental observations. The I1 BSF superposition eliminates any Burgers vector component along the [0001] growth direction thus resulting in pure a-type TDs. The emanation of such TD half loops has been thoroughly verified by extensive observations.

 

[1] J. Smalc-Koziorowska, C. Bazioti, M. Albrecht, and G. P. Dimitrakopulos, Appl. Phys. Lett. 108, 051901 (2016).

[2] G. P. Dimitrakopulos, Ph. Komninou, and R. C. Pond, Phys. Status Solidi B 227, 45 (2001).

 

Acknowledgements

Work performed under the framework of the project BRIDGE: “Elimination of structural defects in nitride semiconductor layers (InGaN and InAlGaN) used as active layers in semiconductor lasers” funded by the Foundation for Polish Science in the frame of the EU operating program Innovative Economy, and in the framework of the Research Funding Program: THALES, project NitPhoto, performed under the Operational Program "Education and Lifelong Learning" of the National Strategic Reference Framework (NSRF) supported by the EU (ESF) and Greek national funds.


Julita SMALC-KOZIOROWSKA, Calliope BAZIOTI, Martin ALBRECHT, Georgios DIMITRAKOPULOS (Thessaloniki, Greece)
08:00 - 18:15 #6208 - MS03-716 Carrier Localization at Atomic-Scale Compositional Fluctuations in Single AlGaN Nanowires with Nano-Cathodoluminescence.
MS03-716 Carrier Localization at Atomic-Scale Compositional Fluctuations in Single AlGaN Nanowires with Nano-Cathodoluminescence.

Considerable interest has been generated to develop highly efficient deep ultraviolet (DUV) emitters using AlGaN-based alloys with direct bandgaps between 3.4 – 6.1 eV for a broad range of applications. Conventional planar AlGaN DUV devices, such as electrically injected solid-state lasers and light-emitting diodes, experience limited efficiencies due to the high dislocation density and inefficient p-doping with increasing Al-content using Mg. Nanowire (NW) structures can be a promising alternative to enhance strain relaxation and p-doping, both mediated by the additional free surfaces. Exceptionally high internal quantum efficiencies have been reported in high Al-content AlGaN NWs [1, 2], suggesting strong charge carrier confinement at nanoscale kinetically-driven alloy inhomogeneities [3] that behave optically as quantum dots [4]. Recently, atomic-scale compositional modulations have been reported in high Al-content AlGaN NWs and suggested to act as localization centers to enhance radiative recombination [1, 2]. Comprehensive understanding of emission characteristics in such spontaneously-formed compositional fluctuations in AlGaN NWs, from directly correlating the localized optical response to structural/chemical properties at relevant lengthscales is still lacking.

 

High and low Al-content AlxGa1-xN p-i-n homojunctions were grown on Si-doped GaN NW templates on Si(111) substrates by plasma-assisted molecular beam epitaxy. Characterization on single NWs using nanometer-scale cathodoluminescence (CL) spectral imaging at 150 K was performed [5], subsequently correlated to structural information obtained with aberration-corrected scanning transmission electron microscopy (STEM). The low-Al AlGaN NWs (Sample A, nominally x = 0.11) exhibit an Al-rich shell that can passivate the surface. A high degree of homogeneity within the AlGaN core region is observed from high-angle annular dark-field (HAADF) Z-contrast imaging, and is further confirmed with electron energy-loss spectroscopy (EELS) [2]. Individual NWs in Sample A show the presence of up to three emission peaks highly delocalized along the NW length (Fig. 1f–h), two peaks originate from the AlGaN region (sharp 336 nm band-edge peak, broad and asymmetric peak with 360 nm maximum), and one from the n-GaN base (~355 nm).

 

With increased Al concentration (Sample B, nominally x = 0.88), extensive atomic-scale HAADF intensity fluctuations are present in the AlGaN regions, and these are indicative of strong Ga-rich/Al-rich compositional modulations, as validated using EELS elemental mapping at atomic-resolution [2]. The nature of the laterally discontinuous compositional fluctuations varies between p-, i-, n-doped AlGaN regions (Fig. 2a–e): single atomic layers occurring on c-planes along the growth direction in p-AlGaN and on semi-polar {10-13} planes in i- and n-AlGaN. Other nm-sized modulations and segregation are also observed. NWs in Sample B display a spectrally dense series of narrow lines blue-shifted (230 – 300 nm), and are drastically more spatially localized within the AlGaN regions in the wavelength-filtered CL images, relative to Sample A. Subsequent high-resolution (HR)STEM on these NWs shows that the different spectral behaviors (emission energy) can be correlated to positions along the NW with different types of compositional fluctuations. Specifically, the shortest wavelength peaks (230 – 240 nm) originate from volumes with atomic-scale Ga-rich c-planes in p-AlGaN (Fig. 2c, ROI 1 circled in 2g), while high intensity sharp peaks (250 – 290 nm) can be assigned to regions with atomic-scale modulations on inclined {10-13} planes or other nm-sized segregation (Fig. 2b,d). The presence/absence of extended defects and its role as localization centers will also be discussed [6].

 

[1] S. Zhao, X. Liu, S.Y. Woo et al., Appl. Phys. Lett., 107(4), 043101 (2015)

[2] S. Zhao, S.Y. Woo et al., Nano Lett., 15(12), 7801–7807 (2015)

[3] A. Pierret et al., Phys. Status Solidi - Rapid Res. Lett., 7(10), 868–873 (2013)

[4] M. Belloeil et al., Nano Lett., 16(2), 960–966 (2016)

[5] L. Zagonel et al., Nano Lett., 11(2), 568–573 (2011); L. Tizei et al., Appl. Phys. Lett., 105(14), 143106 (2014)

[6] This work was supported by the Natural Sciences and Engineering Research Council of Canada (NSERC), with additional funding from the Michael Smith Foreign Study Supplement (MSFSS).


Steffi Y WOO (Hamilton, Canada), Luiz TIZEI, Matthieu BUGNET, Songrui ZHAO, Zetian MI, Mathieu KOCIAK, Gianluigi A BOTTON
08:00 - 18:15 #6215 - MS03-718 Microscopy of thin AlN layers grown by MBE on (111) silicon.
MS03-718 Microscopy of thin AlN layers grown by MBE on (111) silicon.

After the discovery of graphene many other materials were subject of research in a 2D form among them some of them showed bandgap at room temperature. There were a lot of theoretical papers which predicted the properties of the appropriate candidates.  

AlN layer is widely used as a buffer layer for the epitaxial growth of III-Nitrides on SiC, Si and Al2O3 substrates. In this work, the formation of a few monolayers thick graphene-like AlN (g-AlN) layer on a (111)-oriented silicon substrate in ammonia molecular beam epitaxy (MBE) has been studied using various transmission electron microscopy (TEM) techniques.

Flat, ultrathin layer of AlN was deposited on an ammonia treated (111) Si substrate (1). Two samples with thick (15-25 monolayer) and thin (3-4 monolayer) AlN were prepared. Cross sectional TEM specimens were prepared using the conventional mechanical polishing and low-energy (<1 keV) low-angle Ar ion milling. TEM images (not shown) used to measure the AlN layer thicknesses as X and Y nm in the two samples. The chemical composition of the interface structure between the AlN and Si substrate was studied by spectrum imaging; combining energy dispersive X-ray spectroscopy (EDXS) and scanning TEM (STEM) in an aberration-corrected FEI Titan 80-200 ChemiSTEM microscope. Figure 1 shows the Si and N map of the sample containing 15-25 AlN monolayers. The elements distribution across the interface extracted as linescans and shown in Fig. 1b suggests nitrogen enrichment between the Si and AlN. The interface structure was further studied by aberration-corrected TEM using an FEI Titan 80-300 kV TEM operated at 300 kV. Figure 2 shows the boundary structure very clearly, where - based on the measured distances (3.3 Å and 1.9 Å) - we suppose that two layers of Si3N4 phase were grown onto the silicon probably due to the ammonia treatment prior the AlN deposition. The first three sheets of AlN was measured to be as 2.86 Å and 2.60 Å that are higher than the wurtzite-type AlN (2.5 Å) suggesting that the AlN does not immediately follow the wurtzite-type stacking.

The results promise not only the formation of few layer AlN with different properties from the thick layers, but also their possible integration into the silicon device technology.

 

Acknowledgements

Authors thank the support of the Hungarian National Scientific Foundation (OTKA) through Grant No. K 108869 and NN118914. I. C. and B. P thanks to the European Commission for providing support to access the ER-C facility through the ESTEEM2 project.

 

(1) RV.Mansurov, T.Malin, Galitsyn, K.Zhuravlev Journal of Crystal Growth 428 (2015) 93–97.


Ildikó CORA (Budapest, Hungary), András KOVÁCS, V.g. MANSUROV, T.v. MALIN, Yu.g. GALITSYN, Kostya ZHURAVLEV, Béla PÉCZ
08:00 - 18:15 #6236 - MS03-720 Anomalous contrast behavior for STEM HAADF imaging of ordered In<sub>0.33</sub>Ga<sub>0.67</sub>N monolayers.
MS03-720 Anomalous contrast behavior for STEM HAADF imaging of ordered In<sub>0.33</sub>Ga<sub>0.67</sub>N monolayers.

2-dimensional nanostructures consisting only of a single layer of material have attracted great research interest in the past years. Among them are e.g. transition metal dichalcogenides like MoSe2, WS2 and their ternary alloys. But also InxGa1-xN/GaN short period superlattices (SPSL) built up of InxGa1-xN monolayer quantum wells belong to this material class [1].

For such kind of nanostructures relevant structural parameters, which determine material properties and thus device performance, are interface quality, alloy composition and possible ordering phenomena. Characterization of these quantities, at atomic scale, is commonly performed by high angle annular dark field imaging using a scanning transmission electron microscope (STEM HAADF). In the past years even quantitative composition analysis at atomic scale by STEM HAADF imaging has been demonstrated for various material systems, including InxGa1-xN quantum wells [2]. What makes STEM HAADF imaging so attractive for that purpose is the generally valid monotonic relationship between image intensity and the mean atomic number Z of the probed material (commonly expressed by the Z1.7 rule of thumb for the image intensity).

However, in our combined experimental and theoretical STEM HAADF analysis of In0.33Ga0.67N/GaN SPSL consisting of ordered In0.33Ga0.67N monolayers we have observed an anomalous contrast behavior. Within the ordered In0.33Ga0.67N monolayers In atoms are arranged in a periodic √3x√3R30° structure, resulting in pure In atomic columns in a GaN matrix along the cross-sectional viewing directions of the wurtzite lattice (see Fig. 1). This has been experimentally confirmed ex-situ by high resolution (S)TEM and in-situ by reflection high-energy electron diffraction (RHEED). Expecting intuitively a high contrast in high-resolution STEM HAADF images of the ordered In0.33Ga0.67N monolayers, the experimental contrast between pure In and Ga atomic columns, however, was far below the Z1.7 rule of thumb. To verify this result, we have performed frozen phonon simulations of a relaxed structure model consisting of a √3x√3R30° ordered In0.33Ga0.67N monolayer coherently embedded in a GaN matrix. Although the simulations agree with our experimental finding, even on a quantitative level, the explanation for the low contrast is far from intuitive. Even more surprisingly, for specimen thicknesses above 45 nm a contrast inversion occurs, i.e. the peak intensity of pure In atomic columns becomes lower than that of adjacent Ga atomic columns (see Fig. 2). Our frozen phonon simulations reveal that the origin for this anomalous contrast behavior lies in a strongly enhanced de-channeling of the electron probe if it is positioned on the In atomic column of the ordered In0.33Ga0.67N monolayer. This in turn is caused by a complex interplay of increased disorder in the direct vicinity of the In atomic column in terms of chemistry (In atomic column is surrounded by material with a different atomic potential) and lattice periodicity (stronger local distortions around the In column because of differences in the In-N vs. Ga-N bond length).

 

[1] Suski et al., Appl. Phys. Lett. 104, 182103 (2014)

[2] Rosenauer et al., Ultramicroscopy 111, 1316 (2011)


Toni MARKURT (Berlin, Germany), Tobias SCHULZ, Xin Qiang WANG, Xian Tong ZHENG, Ding Yu MA, Martin ALBRECHT
08:00 - 18:15 #5179 - MS04-722 Investigation of the behaviour of codeposited pentacene:perfluoropentacene blends with different mixing ratios by TEM techniques.
MS04-722 Investigation of the behaviour of codeposited pentacene:perfluoropentacene blends with different mixing ratios by TEM techniques.

Organic semiconductors (OSCs) have gained a great interest in the last years since they are a promising alternative to conventional inorganic semiconductors. There have been successful demonstrations of their applications in OFETs [1,2] , OLEDs [3,4] and photovoltaic devices [5,6]. Among other OSCs, pentacene (PEN, C22H14) and perfluoropentancene (PFP, C22F14) blends attract a special attention since they can form donor/acceptor systems (p-n junctions) and are expected to be structurally compatible due to their similar molecular geometry. However, for good optical and structural properties of these junctions, a coupling between PEN and PFP at a molecular level is needed. For this reason, the understanding of the behaviour of this PEN:PFP intermixture is of prime interest.

Previous studies by global characterization methods  (XRD, GIXRD, RSM and PL) have demonstrated the intermolecular coupling of codeposited PEN:PFP [7-11]. Moreover, Hinderhofer et al. [9] reported that the evidence for coupling in all PEN:PFP blends (with independence of mixing ratio) is based on the formation of a new “mixed crystal” phase with exclusively equimolecular concentrations of these compounds. Non-equimolecular blends lead to a phase separation between the new “mixed crystal” and the respective pure phases. Until now PEN:PFP blends have only been studied by averaging characterization methods, whose spatial resolution is no high enough to get a microstructural information on the films. In consequence, local methods are also demanded to give information about the local crystallinity and crystallographic phases. The most commonly used technique to elucidate the structure at nanoscale dimension is TEM.

Here, we present a study of codeposited PEN:PFP grown on SiO2 using different mixing ratios: [1:1] equimolecular PEN:PFP (Fig. 1), [2:1] with excess of PEN (Fig. 2) and [1:2] with excess of PFP (Fig. 3). The SiO2 is an amorphous substrate which minimizes the molecule-substrate interactions. The characterization of the structure and morphology of these blends were performed by AFM and TEM techniques (using SAED patterns, conventional dark field (DF) and bright field (BF) pictures and STEM analyses). The SAED patterns taken from large length scales show polycrystalline character and diffraction rings of a “common phase” that systematically appears for all blend ratios used. This phase can be assigned to the new “mixed crystal” previously observed [9]. In addition, SAED measurements performed at small length scales (Fig. 4), display the possible monocrystalline diffraction pattern of this new “mixed phase” for the first time. This SAED pattern is rather similar to pure PEN in the [001] expected orientation normal to SiO2 substrates, suggesting that the crystalline structures of both (the “mixed phase” and pure PEN) should be very similar. Additional DF-TEM pictures reveal that no single domains at large scale (in the range of µm) can be found for the different phases (“mixed phase” and respective pure phase) in the case of non-equimolecular mixed blends. However, a grainy structure is visible (order of 100 -200 nm), suggesting that a large and homogeneous crystal for this “mixed phase” is not formed.

TEM characterization manifests as an useful tool to understand local and extended crystal orientation by a combination of imaging and diffraction techniques. In this study, three different blends of PEN and PFP are compared using TEM tools. Hence, diffraction techniques are used to obtain information on the arrangement of the not yet well-understood phase (new “mixed phase”) formed as consequence of the favorable coupling between the PEN and PFP.

[1] Jung, B. J. et al. Chem. Mater. 2011, 23, (3), 568-582.

[2] Sirringhaus, H. Adv. Mater. 2014, 26, (9), 1319-1335.

[3] Jou, J.-H. et al. J. Mater. Chem. 2015, 3, (13), 2974-3002.

[4] Kalyani, N. T. et al. Renew. Sustainable Energy Rev. 2012, 16, (5), 2696-2723.

[5] Anthony, J. E. et al. Adv. Mater.  2010, 22, (34), 3876-3892.

[6] Cao, W. et al. Energy Environ. Sci. 2014, 7, (7), 2123-2144.

[7] Broch, K. et al. Phys. Rev. B 2011, 83, (24), 245307.

[8] Salzmann, I. et al. Langmuir 2008, 24, (14), 7294-7298.

[9] Hinderhofer, A. et al. J. Chem. Phys. 2011, 134, (10), 104702.

[10] Breuer, T. et al. J. Chem. Phys. 2013, 138, (11), 114901.

[11] Anger, F. et al. J. Chem. Phys. 2012, 136, (5), 054701.

The authors gratefully acknowledge funding from the SFB 1083.


Rocio FELIX (Marburg, Germany), Katharina I. GRIES, Tobias BREUER, Gregor WITTE, Kerstin VOLZ
08:00 - 18:15 #5189 - MS04-724 Study of anelastic behavior of amorphous TiAl by atomic-level elastic strain measurement during in-situ TEM straining.
MS04-724 Study of anelastic behavior of amorphous TiAl by atomic-level elastic strain measurement during in-situ TEM straining.

Metallic glasses exhibit a number of superior mechanical properties such as high strength and high elastic limit that are a consequence of the amorphous nature of the structure [1]. Therefore, high interest exists in the characterisation of the structure of amorphous materials and the correlation to the mechanical properties. Due to the lack of structural order metallic glasses show also a time-dependent elastic behaviour. It is the aim of the present study to investigate this anelastic behaviour of an amorphous TiAl thin film by comparing macroscopic and microscopic strain measurements during tensile deformation in-situ in the transmission electron microscope (TEM).


Ti45Al55 films (150 nm thick) were synthesized by co-deposition of Ti and Al on a Silicon waver by DC Magnetron Sputtering. Photolithography and reactive Ion etching techniques were used to co-fabricate MEMS based tensile testing stages with freestanding thin films [2]. The special design of the samples allows macroscopic strain and stress measurements. Figure 1 shows the TiAl thin film next to the stress and strain gauges. Tensile tests were carried out in a Philips CM200 microscope at an accelerating voltage of 200kV. The samples were uniaxially strained in steps of 150 nm and bright-field images and selected area diffraction (SAD) patterns were recorded using Gatan Orius CCD camera. Microscopic strain tensor on atomic level was obtained from electron scattering images by tracing the shift of the maximum of the first broad diffraction halo during tensile loading.


Figure 2 shows a characteristic diffraction pattern of amorphous TiAl from a selected area of 1.2 micrometer in diameter. The position of the first broad ring as a function of the angle χ is obtained by a Digital MicrographTM plug in. The evaluation procedure is described in detail in the contribution by C. Ebner et al [3]. The strain ε is calculated from the relative change of the maximum position q1(σ, χ) at a given stress with respect to the unloaded position q1(0,χ) by ε=(q1(0, χ)-q1(σ, χ))/q1(σ, χ). From a series of SAD patterns recorded from the same area at different stress levels during in-situ deformation the measured strain values and the corresponding fitted curve are plotted in Fig. 3. The maximum and minimum values of the curve increase with increasing stress; these values correspond to the principal strains e11 (parallel) and e22 (perpendicular to the loading direction), respectively. The macroscopic stresses parallel to the loading direction were calculated from the force gauges (cf. 2-3 in Fig. 1) of the MEMS device. Figure 4 shows the linear dependence of e11 and e22 on stress as expected from Hooke's law and reach 1% and -0.17% at the maximum stress, respectively. From the linear fit the Young's modulus E=185±2 GPa and the Poisson's ratio of ν=0.23±0.02 are obtained. The macroscopic strain values calculated from the gauges show the same trend but are systematically higher compared to the strain values obtained from reciprocal space measurements. Since the latter correlates with the modulus range of polycrystalline TiAl, the diffraction method traces the atomic-level strain and the difference to the macroscopic strain can be attributed to a non-affine and anelastic deformation resulting from topological rearrangements in metallic glasses. 


[1] A. L. Greer, Materials Today 12 (2009)14.
[2] W. Kang, J. Rajagopalan, M.T.A. Saif, Nanosc. and Nanotechn. Letters 2 (2010) 282.
[3] C. Ebner, R. Sarkar, J. Rajagopalan, C. Rentenberger, Proceedings of the EMC 2016, Lyon, France.

C. E. and C. R. acknowledge financial support by the Austrian Science Fund FWF: [I1309]. R. S. and J. R. acknowledge funding from the National Science Foundation (NSF) grants CMMI 1400505 and DMR 1454109.


Rohit SARKAR, Christian EBNER, Jagannathan RAJAGOPALAN, Christian RENTENBERGER (Vienna, Austria)
08:00 - 18:15 #5414 - MS04-726 Microscopic study of friction layer and the distribution of components in automotive brake pads.
MS04-726 Microscopic study of friction layer and the distribution of components in automotive brake pads.

Brake pad is a complex, multicomponent system consisting of reinforcing agents, abrasives, lubricants, binders, fillers and in some cases elemental metals. Numerous mechanical properties of this system are required and are related to the distribution of components in its volume. Friction layer is in contact with cast iron disc and distribution of single components there is crucial for the braking process. Due to high pressure and temperature achieved, various changes of chemistry and morphology during braking process occur. In this study commercially available automotive brake pads and newly developed brake pads modified with kaoline were investigated using light optical digital microscopy and scanning electron microscopy with EDS which enabled to create maps of elemental distribution. New unused brake pads and pads after AK master braking procedure were investigated. Combination of two microscopic techniques provided detailed information about the structure and its changes in such a complex system as brake pad is. This information will help to understand the process of friction layer formation and wear particles emissions.

Acknowledgement

The project has been financially supported by the European Union’s Horizon 2020 research and innovation programme under grant agreement No 636592.  


Katerina DEDKOVA (Ostrava-Poruba, Czech Republic), Pavlina PEIKERTOVA, Tamara WILHELMI, Marcus MORBACH, Jana KUKUTSCHOVA
08:00 - 18:15 #5635 - MS04-728 Microstructure of glass ceramics synthesized from chromium waste.
MS04-728 Microstructure of glass ceramics synthesized from chromium waste.

The microstructure of different glass ceramic materials, obtained by thermal processing of vitrified products synthesized from tannery waste, was investigated using electron microscopy (TEM) techniques. Preliminary structural characterization was conducted by X-Ray Diffraction (XRD) while morphologies and compositions of the materials at the mesoscopic scale were attained using Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDXS).  

A first series of materials were synthesized by sintering chromium rich ashes of tannery waste with low grade soda lime glass powder. Three different mixtures were prepared with proportions  30/70, 40/60 and 50/50 of Cr-ash over glass powder and sintered at 600°C, 800°C, 1000°C and 1200°C [1]. Depending on the temperature, crystalline phases with chromium and non-chromium content were solidified. At the low temperatures the resulting products were opaque ceramics with granular morphology and high porosity, as shown in Fig. 1. At the high temperatures they consisted of a vitreous matrix with dispersed crystalline phases having the morphology of typical glass-ceramics as those pointed by the white arrow in Fig. 2.

A second series of materials were synthesized using chromium ash (10wt%-20wt%) and SiO2, Na2O and CaO as vitrifying agents, in different relative proportions considering the low solubility of chromium inside the silicate melts [2]. Only the product with the lowest Cr-ash proportion was X-Ray amorphous with no indication of crystallites. HRTEM observations verified that the product retained the amorphous character even at the nanoscale since no nanostructured crystallites were detected. In all other vitrified products Eskolaite (Cr2O3) crystallites of hexagonal shape, shown in Figure 3, were grown in the melt. Devitrification of the as-casted products resulted to various crystalline phases dispersed within the vitreous matrix, depending on the initial batch composition. Eskolaite crystallites were not affected by the thermal processing and Devitrite (Na2Ca3Si6O16), Combeite (Na4Ca4Si6O18) and Wollastonite (CaSiO3) crystallites were grown. Figure 4 illustrates a HRTEM image showing a Wollastonite (CaSiO3) crystallite in the devitrified product with 13wt% Cr-ash, viewed along the [0 1 1] zone axis. This crystallite has the triclinic structure of 1A-CaSiO3.

[1] S. Varitis, P. Kavouras, G. Vourlias, E. Pavlidou,Th. Karakostas, Ph. Komninou, Production of Composite Materials by Mixing Chromium-Rich Ash and Soda-Lime Glass Powder: Mechanical properties and microstructure, Int Jour of Chem. Nucl. Mat. Metall. Eng. Vol:9, No:6, 2015

[2] S. Varitis, E. Pavlidou, P. Kavouras, G. Vourlias, K. Chrissafis, A. Xenidis,
Th. Karakostas, Devitrification routes of a vitrified chromium-loaded ash, Journal of Thermal Analysis and Calorimetry (2015) 121:203–208


Savvas VARITIS, Panagiotis KAVOURAS, George KAIMAKAMIS, Eleni PAVLIDOU, George VOURLIAS, Theodoros KARAKOSTAS (THESSALONIKI, Greece), Philomela KOMNINOU
08:00 - 18:15 #5729 - MS04-730 Effect of Ti addition in refinement of oxide dispersoids in Fe-Y2O3-Ti model ODS alloys during milling and subsequent annealing.
MS04-730 Effect of Ti addition in refinement of oxide dispersoids in Fe-Y2O3-Ti model ODS alloys during milling and subsequent annealing.

The oxide dispersion strengthened (ODS) steels have very high thermal stability and creep strength due to reinforcement of hard and stable nano-crystalline ceramic oxides in a metallic matrix which act as barriers to dislocation motion. These steels are candidate core structural materials for advanced fission and fusion reactors. The dispersoid size and their distribution in metal matrix play an important role in deciding physical and mechanical property of the steel. However understanding the formation mechanism and crystallographic structure of the nano-dispersoids is an ongoing activity of various research groups. The yttria based ODS steel, which contains 0.35wt% of yttria and 0.2 wt% of Ti amounting to ~ 0.56 vol % is very difficult to characterize by conventional XRD; TEM is possibly the only method to characterize the nano-sized (~2-5nm) dispersoids. But to understand the mechanism of formation of nano-dispersoid, crystallinity and structural changes one needs to employ both XRD and TEM. For this purpose, a Fe-15wt% Y2O3 –xwt%Ti (0, 5 and 15) type of concentrated alloy has been used. However, characterisation of samples prepared by conventional methods for TEM studies continues to be difficult owing to magnetic nature of ferritic steel. Hence FIB was employed to extract electron transparent samples which are of micrometer dimensions. The model ODS alloys were synthesized by ball milling for various time durations in inert atmosphere and with subsequent annealing at 1273K for 1h. The structural studies for the powders prior to milling as well as after milling and subsequent annealing were carried out using electron microscopy and XRD techniques. It was earlier reported by us [2] that yttria dispersoids gets refined and even amorphised during mechanical alloying (MA) and upon annealing yttria re-precipitates to micron size [2]. It is believed that Ti can inhibit the growth of nano-dispersoid during annealing by formation of Y-Ti-O complex oxides such as Y2Ti2O7 or Y2TiO5 or YTiO3 [3-5]. In this study XRD result revealed amorphisation of Y2O3/ Ti during milling for 60h in Ar atmosphere and evolution of Y2Ti2O7 andYTiO3 complex oxide upon annealing for 1h at 1273K, which is shown in figure-1. The scanning electron microscopy studies reveal the refinement of alloy powders from ~50 microns to sub micron level during milling, which is shown in figure 2. Figure 3(a) and (b) represent the Selected Area Diffraction pattern (SADP) of 60h milled powders of Fe-15wt% Y2O3 and Fe-15wt% Y2O3 -5wt%Ti respectively. Analysis of these patterns showed the 1st ring correspond to Y2O3 (411) was broader in case of the alloy without Ti as compared to alloy with Ti. Figure 3(c) and (d) represents the bright field (BF) TEM micrographs of Fe-15wt% Y2O3 -5wt%Ti model ODS after 60h of milling and subsequent annealing respectively, the corresponding SAD patterns are shown as inset. The analysis of BF-TEM micrograph showed the recrystallization of 100-200nm size crystallites upon annealing of milled powder, where as analysis of SADP reveal formation of Y-Ti-O complex oxides such as Y2Ti2O7, Y2TiO5 and YTiO3 in annealed alloy powder. EDS analysis from the 60h milled and annealed powder of Fe-15wt%Y2O3-5wt%Ti showed evolution of Y, Ti ,O rich complex oxide which is shown in figure 4. The results point towards a direct involvement of Ti in restricting amorphisation of yttria during milling, and formation of Y-Ti-O complex nano-dispersoid upon annealing. Details of these studies will be presented in the paper.

References

  1. L. Toualbi, M. Ratti, G. Andre, F. Onimus, Y. de Carlan, J. Nucl. Mater. 417 (2011) 225–228.
  2. Pradyumna Kumar Parida, Arup Dasgupta, K. Jayasankar, M. Kamruddin, S. Saroja, J. Nucl. Mater. 441 (2013) 331–336.
  3. A. Hirata, T. Fujita, Y.R. Wen, J.H. Schneibel, C.T. Liu, M.W. Chen, Nat. Mater. 10 (2011) 922.
  4. M.K. Miller, C.M. Parish, Q. Li, Mater. Sci. Technol. 29 (2013) 1174.
  5. H. Sakasegawa, L. Chaffron, F. Legendre, L. Boulanger, T. Cozzika, M. Brocq, Y. de Carlan, J. Nucl. Mater. 384 (2009) 115.

Pradyumna Kumar PARIDA (Kalpakkam, India), Arup DASGUPTA, K. G. RAGHAVENDRA, Sujay CHAKRAVARTY, K JAYASANKAR, Saroja SAIBABA
08:00 - 18:15 #5731 - MS04-732 Relationships between elaboration conditions, structural parameters and electrical properties in metal oxides nanometric periodic multilayers.
MS04-732 Relationships between elaboration conditions, structural parameters and electrical properties in metal oxides nanometric periodic multilayers.

Ti/TiOx and W/WOx multilayered thin films have been deposited by DC reactive sputtering using the reactive gas pulsing process (RGPP). It is implemented to produce regular alternations of metal-oxide compounds at the nanometric scale [1, 2]. Structure and growth have been investigated by High Resolution Transmission Electron Microscopy (HRTEM), Scanning Transmission Electron Microscopy (STEM) Energy Dispersive X-rays Spectroscopy (EDX) and Energy Electron Loss Spectroscopy (EELS). Regularity of titanium and tungsten based alternations, quality of interfaces as well as oxygen diffusion through the multilayered structure have been examined taking into account the reactivity of oxygen towards the metals. Electrical measurements have been also carried out with the van der Pauw method to determine resistivity changes with temperature.

CTEM has been performed to determine the thickness of the periodic metallic and oxide layers from 3 to 40 nm. HRTEM experiments have been carried out to study the atomic structure of the periodic layers. The study of HRTEM images has allowed determining a growth model with the following series: (rutile-)TiO2, fcc-TiO and α-Ti for Titanium system. This result has been confirmed by SAED experiments. Chemical information was obtained from the core-loss EELS and EDX spectra. Core-loss study was particularly performed for TiOx samples to quantify the elemental composition from the Ti-L2,3 and O-K edges (Fig. 1).  The systematic presence of oxygen has been pointed out in the rich-metal sub-layer, corresponding to the TiO phase already pointed out by HRTEM. Concerning tungsten system, the layers appear to be mainly amorphous. Therefore, low-loss EELS study was performed and has allowed determining a growth model with the following series: W/W3O/WO3/W3O (Fig. 2).

The knowledge of the structural parameters has allowed determining a first relation between the elaboration conditions (control of the pressure value) and the structural parameters. Electrical and structural results have also been related to propose a law linking the resistivity values ρ to the structural parameters as total thickness etot, metal λmet and oxide λox layers thickness and metal elemental composition Cmet (Fig. 3).

[1] A. Cacucci et al, Thin Solid Films, 553 (2014) 93-97

[2] A. Cacucci et al, Acta Mater., 61 (2013) 4215-4225

 

ACKNOWLEDGMENTS

 This research is supported by LABEX project ACTION.


Valérie POTIN (DIJON CEDEX), Arnaud CACUCCI, Nicolas MARTIN
08:00 - 18:15 #5745 - MS04-734 Cryo-TEM observations and Xray mapping of polyoxometalate / polystyrene hybrid nanoparticles with surface reactivity.
MS04-734 Cryo-TEM observations and Xray mapping of polyoxometalate / polystyrene hybrid nanoparticles with surface reactivity.

            Polyoxometalates (POMs) are metal-oxygen clusters which can store electrons without altering their structure, so they are suitable for application in catalysis and materials science. In this project, we wished to synthesize surface catalytically active polystyrene-polyoxometalate (PS-POM) composite latexes through radical emulsion polymerization of styrene in water in the presence of amphiphilic POMs.

We used TEM analyses to demonstrate that polystyrene nanoparticles were stabilized by the POMs cluster at their surface. First, cryo TEM was used in order to determine the nanoparticles’ shape and size. Secondly the photo-catalytic activity of the POMs was evaluated. Upon UV irradiation, POMs can be photo-reduced, in presence of organic molecules (acting as sacrificial electrons donors). According to the literature, the POMs attached to the PS surface should be able to transfer their captured electrons to metal ions, such as silver ions, to generate metals nanoparticles. We tested this benchmark reaction in the presence of our hybrid latexes. By Cryo TEM, we observed that nanoparticles were formed as expected in short reaction times, and that they were only present at the surface of PS-POM composite latexes. In addition, Xray mapping at room temperature confirmed the presumed structure of the hybrid particles: POM clusters were only located at the particle surface by the detection of W atoms present in the used POM.

ref : CHEMISTRY-A EUROPEAN JOURNAL 21(2015)2948-2953


Jennifer LESAGE DE LA HAYE, Jean-Michel GUIGNER (Paris Cedex 05), Bernold HASENKNOPF, Emmanuel LACÔTE, Jutta RIEGER
08:00 - 18:15 #5750 - MS04-736 Micro- and nanostructural characterization of melamine-formaldehyde microcapsule shells using electron microscopy.
MS04-736 Micro- and nanostructural characterization of melamine-formaldehyde microcapsule shells using electron microscopy.

A systematic study has been carried out to compare the surface morphology, shell thickness, mechanical properties and binding behavior of melamine formaldehyde microcapsules of 5 to 30 μm diameter size with various amounts of core content by using scanning and transmission electron microscopy including electron tomography, in-situ nanomechanical tensile testing and electron energy-loss spectroscopy. It is found that porosities are present at the outside surface of the capsule shell but not at the inner surface of the shell. Nano-mechanical tensile tests on the capsule shells reveal that the Young’s modulus of the shell material is higher than that of bulk melamine formaldehyde and that the shells exhibit a larger fracture strain compared to the bulk. Core-loss elemental analysis of microcapsules embedded in epoxy indicates that during the curing process, the microcapsule-matrix interface remains uniform and the epoxy matrix penetrates into the surface microporosities of the capsule shells.


Hamed HEIDARI (Antwerpen, Belgium), Guadalupe RIVERO, Hosni IDRISSI, Dhanya RAMACHANDRAN, Seda CAKIR, Ricardo EGOAVIL, Mert KURTTEPELI, Amandine CRABBÉ, Tom HAUFFMAN, Herman TERRYN, Filip DU PREZ, Nick SCHRYVERS
08:00 - 18:15 #5759 - MS04-738 Transmission Electron Microscopy of a Poorly Soluble Drug, Felodipine.
MS04-738 Transmission Electron Microscopy of a Poorly Soluble Drug, Felodipine.

Many drugs that are currently in development exhibit poor dissolution properties due to low solubility. To increase the solubility of these drugs different technologies have been developed including solid dispersions, nano-crystals and lipid formulations. Use of solid dispersions can increase solubility by dispersing a drug within an amorphous polymer matrix, inhibiting re-crystallisation from the amorphous phase. This can be achieved by hot-melt extrusion (HME), spray drying and co-precipitation [1].

 

Transmission electron microscopy can be used to analyse different phases and morphologies within a solid dispersion which may not be found using conventional bulk techniques such as powder X-ray diffraction, differential scanning calorimetry and Fourier transform infra-red spectroscopy [2]. However, organic compounds can be easily damaged when exposed to the electron beam causing structural change, so low dose exposure is necessary to limit any damage that occurs [3].

 

The research here investigates a model system involving the drug felodipine and the copolymer copovidone. Solid dispersions of 15% and 50% felodipine were prepared by HME and then milled to form a powder. This powder was then dispersed in water, 3-4 droplets were placed onto separate copper continuous carbon TEM grids and left to dry. These were then examined by TEM, operated at 200kV, equipped with a CCD camera. The electron flux was set between 0.007 - 0.040 e− Ås−1 to limit any damage which may be caused by the high energy electrons [3].

 

The results show that within the 50% solid dispersions different morphologies and phases can be found, most areas show near amorphous diffraction patterns (Figure 1) but some show single crystal patterns (Figure 2). This suggests that the felodipine and copovidone are not always molecularly mixed and that small amounts of the felodipine had recrystallised after the initial HME process. Similarly, the 15% mixture had areas with varied morphologies and showed some signs of phase separation. The next step will be to quantify the identified phase fractions (amorphous, single crystal and nano-crystalline) within these solid dispersions.

 

References

[1] Huang Y and Dai WG., Fundamental aspects of solid dispersion technology for poorly soluble drugs. Acta. Pharma. Sinica. B 4(1) 18-25, (2014)

 

[2] Song Y et. al., Physiochemical Characterization of Felodipine-Kollidon VA64 Amorphous Solid Dispersions Prepared by Hot-Melt Extrusion. J. Pharma. 102(6) 1915-1923, (2013).

 

[3] S’ari M et. al., Analysis of Electron Beam Damage of Crystalline Pharmaceutical Materials by Transmission Electron Microscopy. J. Phys. Conf. Ser. 644, (2015).

 

[4] Lou et. al., Polymorph Control of Felodipine Form II in an Attempted Cocrystallization. Cryst. Growth Des. 9(3) 1254-1257, (2009).


Mark S'ARI (Leeds, United Kingdom), James CATTLE, Andy BROWN, Brydson RIK, Nicole HONDOW, Helen BLADE, Steve COSGROVE, Les HUGHES
08:00 - 18:15 #5796 - MS04-740 Direct mapping of Li-enabled octahedral tilt ordering and associated strain in nanostructured perovskites.
MS04-740 Direct mapping of Li-enabled octahedral tilt ordering and associated strain in nanostructured perovskites.

      Self-assembled nanostructures are promising for creating 2D and 3D superlattices with exceptional functionalities. Understanding the mechanisms driving the superlattice formation demands the underlying structural information. However, nanoscale structural modulations intrinsic to these superlattices are difficult to be characterized by conventional diffraction-based structure determination. A real-space, direct imaging method is necessary to probe the local structure characteristics, providing essential information for theoretical understanding and subsequent design of structure-property correlations.

     Using the aberration-corrected scanning transmission electron microscopy (STEM), we developed an optimized atomic-level bright-field (BF) condition to image the oxygen octahedra in perovskite oxides. We used multislice calculations to determine detector collection angles that allow oxygen octahedra to be imaged sensitively and robustly over large specimen thicknesses. These calculations also provided a calibration by which the octahedral-tilt angle can be measured quantitatively from the image of each octahedron.

     Applying this real-space octahedral-tilt mapping on Li0.5–3xNd0.5+xTiO3, a promising solid electrolyte in Li-ion batteries, we directly revealed an unconventional superlattices with 2D modulated octahedral tilting. A mathematical description of the octahedral-tilt modulation was derived based on the quantitative tilt maps, which explicitly identified the high-order harmonic character of the modulation. Using simultaneous annular-dark-field (ADF) imaging, we also mapped the lattice parameters unit-cell by unit-cell, uncovering highly-localized strain associated with the tilt modulation. Furthermore, we demonstrate the tunability of the tilt modulation by changing Li stoichiometry. Fascinatingly, we observe a reversible annihilation/reconstruction of the tilt modulation correlated with delithiation/lithiation process, suggesting the structural transformation that is associated with Li-ion conduction in this promising Li-ion conductor.1

     The above observations are largely inaccessible from conventional diffraction analysis,2 and lead to an unprecedented mechanically-coupled tilting competition model to explain the superlattice formation.1 Our real-space approach to quantify local octahedral structure and correlate it with strain can be applied to other advanced oxide systems.

 

Acknowledgements

This work was supported by the Australian Research Council (ARC) grants DP110104734 and DP150104483 and a Monash University IDR grant. The FEI Titan3 80-300 S/TEM at Monash Centre for Electron Microscopy was funded by the ARC Grant LE0454166. 

 

References:

[1] Y. Zhu, R. L. Withers, L. Bourgeois, C. Dwyer & J. Etheridge Nature Materials 14, 1142-1149 (2015). 

[2] A. M. Abakumov, R. Erni, A. A. Tsirlin, M. D. Rossell, D. Batuk, G. Nénert & G. V. Tendeloo Chem. Mater. 25, 2670–2683 (2013).


Ye ZHU, Ray WITHERS, Laure BOURGEOIS (Victoria, Australia), Christian DWYER, Joanne ETHERIDGE
08:00 - 18:15 #5801 - MS04-742 From zirconia to yttria: sampling the crystallographic and electronic phase diagram using sputter-deposited YSZ thin films.
MS04-742 From zirconia to yttria: sampling the crystallographic and electronic phase diagram using sputter-deposited YSZ thin films.

Yttria-stabilized zirconia (YSZ) is one of the most extensively investigated materials with a large field of applications due do its chemical inertness and mechanical as well as thermal stability. Moreover, it features a high ionic conductivity at elevated temperatures; it is consequently an ideal candidate as electrolyte in chemical sensors and solid oxide fuel cells. While there is a large number of works on this topic, most only deal with a single composition and thicker films. Here, we present a systematic study regarding the influence of the amount of yttria on the crystallographic and electronic properties of YSZ thin films to elucidate the thin film phase diagram. These epitaxially-grown thin films with a nominal thickness of 25 nm and compositions of 3 mol%, 8 mol%, 20 mol% and 40 mol% Y2O3 (from now on called 3YSZ, 8YSZ, 20YSZ and 40YSZ, respectively) were prepared on NaCl single crystals using our home-built direct-current ion beam sputter source.[1] The films, which could be floated off the sodium chloride to yield unsupported thin films for TEM studies, were shown to be homogeneous and impurity-free.

Although the distinction between the tetragonal and cubic phase of zirconium oxides is impossible with only selected area electron diffraction, due to both featuring planes with the same lattice spacings (see Figure 1a-d), it is possible to determine that 3YSZ and 8YSZ are tetragonal and 20YSZ as well as 40YSZ are cubic. For this, an analysis of the lattice parameter c, which is calculated from multiple diffraction rings for both, the tetragonal and cubic polymorphs, was performed, showing a stagnation in this parameter between 8 to 20 mol% yttria (see Figure 1e). Because a higher concentration of the larger atom (Y) is present, the cell volume still has to increase, which can only be explained if the total unit cell volume is still increasing, which means that the cell is expanding in the other two directions (a and b) instead, i.e. a phase transformation to the cubic cell is occurring.[1]

In order to obtain the direct band gaps, valence EELS experiments have been conducted (using only the direct beam) at an acceleration voltage of 60 kV to avoid Čerenkov losses.[2]. If the resulting band gaps (after Richardson-Lucy convolution of the spectra), which agree nicely with UV-photoelectron data, are plotted as a function of the amount of yttria present in the sample, a similar trend to that of the lattice parameter (see above) can be observed, as seen in Figure 2. Going from 3YSZ to 8YSZ, the band gap decreases from 5.6 eV to 5.3 eV, respectively, only to then increase again to almost 5.8 eV in the case of 20YSZ, coinciding with the tetragonal-cubic phase transition. Finally, 40YSZ features a much lower band gap of about 5.2 eV. In additional EELS experiments, the crystal field splitting between the eg and t2g bands (investigated using the oxygen K-ELNES) is also shown to feature a dependency of the dopant level.

Furthermore, a Gatan Vulcan Cathodoluminescence system is used to spectroscopically measure the Čerenkov radiation emitted from the sample when exposed to a 200 kV  beam. Determining the absorption edge seems to yield the distance from the valence band maximum to the gap states (present due to the oxygen vacancies), as determined by comparison with DFT band structures.

[1] Götsch, T.; Wallisch, W.; Stöger-Pollach, M.; Klötzer, B.; Penner, S. AIP Adv. 2016, 6, 025119

[2] Stöger-Pollach, M. Micron 2008, 39, 1092–1110


Thomas GÖTSCH (Innsbruck, Austria), Michael STÖGER-POLLACH, Simon PENNER
08:00 - 18:15 #5937 - MS04-744 Correlative SEM techniques for resolving complex microstructure of CoCrFeNiZrx High Entropy Alloys.
MS04-744 Correlative SEM techniques for resolving complex microstructure of CoCrFeNiZrx High Entropy Alloys.

High-entropy alloys (HEAs) introduce a new concept of developing advanced metallic materials with properties that conventional alloys, based on one principal element, cannot achieve [1]. Other multi-component metallic systems are quasicrystals (QCs), complex metallic alloys (CMAs) and bulk metallic glasses (BMGs).

HEAs are multicomponent mixtures of 4 to 9, and occasionally up to 20 chemical elements, in similar concentrations, ranging from 5 to 35 at.% each, where the high entropy of mixing can stabilize disordered solid-solution phases with simple crystal structures like a body-centered cubic (bcc), a face-centered cubic (fcc) and a hexagonal close-packed (hcp), in competition with ordered intermetallic phases and phase-segregated mixtures [2]. Though the average crystal structure of a HEA is generally simple, microstructure might be highly complex, as will be shown later in this presentation.

In our research, the HEA series CoCrFeNiZrx (x = 0.40, 0.45, and 0.50) has been investigated. Various SEM techniques were employed, including backscattered-electron (BSE) imaging, EDS point analysis, chemical mapping and EBSD.

The results reveal high complexity of the HEAs’ microstructure and helped us to determine the grains’ composition. Brief outline is presented in the four figures shown below. Figs. 1 and 2 show BSE SEM images. The coarsest interpretation is that the samples are composed of two different types of microstructures: (1) rounded dark phases and (2) fine interweaving of the light and dark phases. Higher magnification of the image in Fig. 2 shows the “invisible borders”, where the fine microstructure changes its character. EBSD investigations at lower magnification (2.000x) revealed that the “invisible borders” correspond to grain boundaries of larger grains (see Fig. 3 – showing different area than Figs. 1 and 2.), whereas more detailed EBSD results at higher magnification of 10.000x (Fig. 4) explained the fine grain structure inside the main grains. Therefore, grains’ sizes at two different scales are present in these samples. The effect of Zr content on the HEA microstructure was thus traceable in great detail.

 

[1] Y. Zhang, et al., Prog. Mater. Sci. 61, 1-93 (2014).

[2] P. Koželj, S. Vrtnik, A. Jelen, S. Jazbec, Z. Jagličić, S. Maiti, M. Feuerbacher, W. Steurer, and J. Dolinšek, Phys. Rev. Lett. 113, 107001 (2014).


Andreja JELEN (Ljubljana, Slovenia), Hwanuk GUIM, Janez DOLINŠEK
08:00 - 18:15 #5956 - MS04-746 Single crystals of V-amylose complexed with fatty acids and ibuprofen.
MS04-746 Single crystals of V-amylose complexed with fatty acids and ibuprofen.

Amylose, a mostly linear homopolymer of α(1,4)-D-glucose extracted from native starch, has the ability to form crystalline inclusion compounds with a large variety of small molecules. In these crystallosolvates, the so-called "V-amylose" occurs in the form of single helices and the ligands can be located inside the helices, in-between or both [Lourdin et al., in "Starch - Metabolism and Structure", Springer Japan, 2015, p. 61]. In this study, we have crystallized fractions of native and in vitro-biosynthesized amylose in the presence of various fatty acids and ibuprofen, a widely used anti-inflammatory drug [Yang et al., Starch-Stärke 65 (2013), 593]. The morphology, structure and stoichiometry of the resulting lamellar single crystals were characterized using TEM imaging, electron and X-ray diffraction, and solid-state NMR.

Dilute aqueous solutions of amylose (0.1 wt%) and fatty acids were briefly heated at 160°C, then kept at 90 or 100°C for 24 h. Crystallization occurred during the slow cooling to room temperature. Depending on the type of fatty acid and crystallization conditions, hexagonal or rectangular crystals, or a combination of both, were observed. Figure 1 shows examples of such lamellar crystals prepared from native amylose in the presence of stearic acid (C18). The hexagonal platelets crystallized by cooling the solution maintained at 90°C (Figure 1a) correspond to the so-called "VH" structure, i.e., the compact hexagonal packing of 6-fold amylose single helices (Figure 1b). The aliphatic part of the fatty acid would be included inside the helices while the polar head would remain outside [Godet et al., Carbohydr. Polym. 21 (1993), 91]. When the amylose/fatty acid mixture was kept at 100°C, the lamellar crystals formed upon cooling were rectangular and generally occurred as twinned assemblies (Figure 1c). The corresponding diffraction pattern suggested an orthorhombic unit cell (Figure 1d). After drying, the rectangular crystals yielded the diffraction pattern of the VH allomorph and cracks appeared parallel to the long axis, suggesting that a loss of guest and/or water molecules by evaporation promoted an anisotropic reorganization of the helices. This effect was well documented for crystals of V-amylose complexed with n-butanol [Helbert et al., Int. J. Biol. Macromol. 16 (1994), 207]. The formation of these two types of morphology and structure could be reproduced with fatty acids with different chain lengths (C10-C18).

A solution of amylose was mixed with preheated ibuprofen at 90°C and Vibuprofen crystals formed upon slow cooling. The complex grew as flower-like aggregates of long rectangular platelets (Figure 2a). The base-plane electron diffraction pattern (Figure 2b) is identical to that recorded from complexes of V-amylose with isopropanol [Nishiyama et al., Macromolecules 43 (2010), 8628]. The unit cell is thus orthorhombic and would contain 7-fold amylose single helices. Ibuprofen would be located inside and between the helices, along with a number of water molecules. This tentative model should provide a better understanding of the interaction of ibuprofen with a starch matrix as well as its controlled release.

Acknowledgement: We thank LabEx Arcane for financial support, the NanoBio-ICMG Platform (Grenoble) for granting access to the Electron Microscopy and NMR facilities, as well as W. Helbert and H. Chanzy for stimulating discussions.


Cong Anh Khanh LE (Grenoble), Jean-Luc PUTAUX, Yu OGAWA, Shivalika TANWAR, Florent GRIMAUD, Gabrielle VERONESE, Luc CHOISNARD
08:00 - 18:15 #5990 - MS04-748 Advanced TEM study of homogeneous flow and size dependent mechanical behaviour in highly ductile Zr65Ni35 metallic glass films.
MS04-748 Advanced TEM study of homogeneous flow and size dependent mechanical behaviour in highly ductile Zr65Ni35 metallic glass films.

Metallic glasses (MGs) exhibit outstanding mechanical and functional properties for numerous applications. However, although intensive research on the deformation and fracture mechanisms has been performed on metallic glasses for more than 20 years, the fundamental mechanisms governing the mechanical behaviour as well as the recently observed mechanical size effects in this class of materials are still not fully understood. Recently, amorphous Zr65Ni35 (%at) freestanding thin film MGs (TFMGs) deposited by magnetron sputtering have been deformed using a ‘’lab-on-chip’’ technique based on MEMS technology [1]. The results have shown that the ductility of the films is highly enhanced compared to bulk MGs and other TFMGs in the literature, and the plastic deformation occurs homogenously, i.e., without the observation of mature shear bands until fracture. In order to unravel the origin of these remarkable mechanical properties, the films have been investigated in-depth using advanced transmission electron microscopy (TEM).

Quantitative nanobeam electron diffraction (NBED) was used to investigate the relationship between the local atomic order and the activation of ‘’shear transformation zones’’ (STZs) [2]. The basic principle of NBED is shown in Figure 1a, consisting of a coherent electron beam with diameter of around 0.4 nm in order to produce two-dimensional diffraction patterns from atomic clusters with comparable size. Figures 1b, 1c and 1d exhibit NBED patterns with strong Bragg reflections which is the signature of a locally ordered region (i.e., atomic clusters) while in the NBED pattern of Figure 1e, only a diffuse background with speckles without Bragg reflections can be observed. High resolution HAADF-HSTEM and EELS revealed a heterogeneous microstructure with Ni-rich and Zr-rich regions exhibiting different atomic densities with characteristic length of 2-3 nm (Figure 2). Such behaviour can be attributed to the sputter deposition process involving very high cooling rates compared to bulk MGs. The results raise several fundamental questions that will be addressed: Does the nucleation of the STZs occur preferentially in regions with specific enriched chemical composition and atomic density? How will this affect the interaction between the STZs? How such features can be used to explain the exceptional high plastic deformation levels, the absence of shear bands and the delay of fracture in the Zr65Ni35 TFMGs used in the present work?     

References

[1] H. Idrissi, B. Wang, M.S. Colla, J.P. Raskin, D. Schryvers, T. Pardoen. Advanced Materials. 23 (2011) 2119

[2] A.S. Argon, Acta Metallurgica. 27 (1979) 47.


Hosni IDRISSI (Antwerpen, Belgium), Matteo GHIDELLI, Sébastien GRAVIER, Jean-Jacques BLANDIN, Jean-Pierre RASKIN, Thomas PARDOEN, Dominique SCHRYVERS
08:00 - 18:15 #6020 - MS04-750 Characterization of nanometric-sized participates formed during heat treatment of aluminium alloy with antimony.
MS04-750 Characterization of nanometric-sized participates formed during heat treatment of aluminium alloy with antimony.

New requirements to be met by modern alloys requires changing the currently used materials. This is accomplished by the use of newer and newer generation of  production technologies, or by modifying the chemical composition of the alloys presently used. During our research we examined the casting aluminum alloy with the addition of antimony. The chemical composition of the investigated alloys was Mg 5.3-5.8%, Si 1.7-2.8%, Mn 0.5-1.0%, Cr 0.2-0.6%, antimony content ranged from 0.1 to 0.3%, 0.3-0.5% 0.5-0.9% 0.9-1.2%. Aluminium and antimony form an intermetallic phase AlSb, which serve as the nuclei for crystallization growth of other precipitates, with complex structure and chemical composition. The size of participates that grown on the surface of AlSb is about 10-15 nm in diameter. Their large concentration and equal, homogenous distribution give the chance to obtain high mechanical properties of investigated material. The aim of the article is characterization of participates formed during age hardening of aluminium alloy with the addition of antimony, as the intermetallic phase component. Structural characterisation of precipitates are made by using simultaneous HR-TEM and HR-STEM imaging and EDS analysis. Obtained results were compared with computer simulations.


Krzysztof MATUS (Zbrosławice, Poland), Klaudiusz GOŁOMBEK, Mirosława PAWLYTA
08:00 - 18:15 #6109 - MS04-752 ACOM-TEM analysis of the effect of heating on the mineral nanocrystals in bone.
MS04-752 ACOM-TEM analysis of the effect of heating on the mineral nanocrystals in bone.

The evolution of the crystalline structure of bone mineral nanoparticles upon heating is a topic of interest in archeology, paleo-anthropology and forensic science. Archaeological bone remains contain a considerable amount of information which can be altered by heating (e.g. radiocarbon dating). Traces of heating are often observed on bone fragments, but it becomes quite difficult to distinguish its’ effect, particularly at temperatures below 600°C. Below this temperature, macroscopic structural parameters become inadequate to characterize the effect of heating and the nanoscale composite structure needs to be considered [1]. At the nanoscale bone consist of two principal components: collagen fibrils of ~ 100 nm in diameter and platelet-shaped calcium phosphate mineral crystals of about 5 x 50 x 100 nm3 dimensions.

The closest crystallographic structure that describes the bone mineral phase is hydroxyapatite, as determined by x-ray diffraction. However, significant differences in crystal structure with respect to the ideal hydroxyapatite are generally observed. Those have been shown to be related to modifications in crystalline chemistry by spectroscopy, as well as nanocrystal size and strain by X-ray scattering.

Therefore, the main difficulty stands in the necessity of analyzing both the nanocrystals morphology and organization as well as crystal structure which, generally, requires using different methods. Electron microscopy is the most widely used technique to visualize the nanocrystals in real space, while X-ray diffraction is generally used to analyze the crystal structure in reciprocal space, thus giving information on the crystal-chemistry disorder. However, the ideal method should provide both insights. Automated Crystal Orientation Mapping at TEM (ACOM-TEM, also known as ASTARTM tool from NanoMEGAS) [2] allows such complex study.

The ACOM-TEM method operates in scanning mode and relies on the comparison between the electron diffraction patterns collected at every scan position and the simulated patterns calculated for a given crystal structure in all possible orientations. Maps of the structural parameters can therefore be reconstructed which allow analyzing the crystal size and shape distribution in real space as well as the crystalline orientation. Different model crystal structures can also be tested to access the crystal chemistry fluctuations.

Bovine bone samples in control state as well as heated in vacuum to 9 temperatures from 100°C to 1000°C for 10 min were studied. An increase in nanoparticle size occurs upon heating (fig. 1) as also observed by X-ray scattering [3]. In order to test the sensitivity of the method, we found that hydroxyapatite describes the structure well in comparison with other apatite minerals with elemental composition compatible with bone biochemistry (brushite, monetite, tuite). The structure is better described by hexagonal space group P63/m in all the temperature range, contrary to results pointing to a monoclinic to hexagonal phase transition. Furthermore, the type of carbonate substitutions which are known to occur in bone (up to 7%w) was investigated and could be discriminated within the limits of the method sensitivity. Additionally the probability of various ionic substitutions (F-, Na+, Sr2+ and Cl-) in bone tissue is discussed.

Improvement of reciprocal space resolution and accessible q-range could allow studying even more subtle crystal-chemistry disorder in such complex materials like bone tissue. Current results are part of larger project aiming to understand the nanostructural characteristics of bone tissue and to identify key structural markers of pathological human bone [4], providing possible development of new diagnostic and pharmaceutical tools.

References:

1. Chadefaux C., Reiche I. Journ of nano research 8, 157-172 (2009).

2. Portillo J. et al. Mater Sci Forum 644, 1-7 (2010).

3. Gourrier A. et al. Archeo Sciences 35, 191-199 (2011).

4. Gourrier A. et al. J Appl Crystallogr 43, 1385-1392 (2010).


Mariana VEREZHAK (Grenoble), Edgar F. RAUCH, Muriel VERON, Pierre BORDET, Marie PLAZANET, Aurélien GOURRIER
08:00 - 18:15 #6119 - MS04-754 3-D areal functional parameters extracted from AFM data of polished dental tooth-restorative nanocomposites.
MS04-754 3-D areal functional parameters extracted from AFM data of polished dental tooth-restorative nanocomposites.

The analysis of contemporary areal functional surface parameters of functional parts in any system of elements, that are in contact with each other, is essential for the understanding of their frictional behaviour. Oral environment is a specific tribological system where a tooth or a tooth-restoration is exposed to the cyclic mechanical, thermal, and pH changes. 3-D areal texture parameters of tooth replacing materials are of a great importance for prediction and understanding of the materials’ tribological properties during their functional use.

 

The aim of this study was to conduct a detailed AFM morphological analysis of contemporary dental nanocomposites and to calculate specific 3-D surface texture parameters, after four dental polishing protocols.

 

Two representative materials were chosen for testing: nanohybrid (Filtek Z550, 3M ESPE - FZ550) and nanofilled (Filtek Ultimate Body, 3M ESPE - FUB). The polymerized composite samples were polished by four different dental polishing procedures: multi-step (MSP), single-step (SSP), multi-step followed by diamond paste (MSP+D), and single-step followed by diamond paste (SSP+D). For the texture analysis the atomic force microscopy was used (Veeco di CP-II). Using the software packages: Mountains Map® 7 (Digital Surf, Besançon, France,  available from: http://www.digitalsurf.fr) and Gwyddion 2.28 (available from: http://gwyddion.net/), the depth histograms, volume surface parameters, peak count histograms, watershed segmentation algorithms, average power spectral density were calculated to describe the 3-D surface properties of tested specimens.

 

These parameters offered the possibility of a more profound understanding of the structure-related functional properties of the surfaces of tested materials. The MSP created a more favourable surface texture on both tested materials. It had narrower height distribution and volume surface parameters which indicated the lower wear probability of materials polished by MSP than the SSP. The number of motifs after the watershed segmentation was the highest on the samples polished by MSP, due to the presence of fine surface irregularities. SSP created lower number of motifs, by cutting the surface details and creating deep and wide grooves, plane aspects of dales or hills. MSP or MSP+D mostly created more isotropic surface texture, which indicates that the MSP can be considered as a reliable method for dental composites polishing in comparison with the SSP or SSP+D.

 

Supported by Project TR 035020 and Project III-45016 of the Ministry of Education, Science and Technological Development of Republic of Serbia; and 3M (East) AG company and Mikodental – Shofu, Japan for Serbia.


Tijana LAINOVIĆ (Novi Sad, Serbia), Ştefan ŢĂLU, Sebastian STACH, Marko VILOTIĆ, Larisa BLAŽIĆ
08:00 - 18:15 #6130 - MS04-756 A new high pressure form of Ba3NiSb2O9.
MS04-756 A new high pressure form of Ba3NiSb2O9.

Quantum spin liquids (QSL) are an interesting state of matter and have inspired a great number of investigations into materials showing triangular nets of magnetic ions. In this work we present evidence that one of the targeted phases has indeed a triangular order of Ni ions, but only on a range of about 10 nm.

The QSL state was proposed as the ground state for a system of spins on a triangular lattice that interact with their nearest neighbors via an antiferromagnetic interaction. Recently, candidates from the family of 6H-perovskites Ba3MSb2O9 (M= divalent transition metal) have retained attention as QSL materials. The case of Ba3NiSb2O9 seems particularly interesting since it could represent an experimental proof of a QSL with spin S = 1. Three different structure types were reported for this compound. All of them are built up by the stacking along the c axis of layers made of either NiO6 or SbO6 octahedra and differ by the way layers are stacked via either corner or face sharing of the octahedra.

We focus here on the 6H-B form of Ba3NiSb2O9 which can be obtained by applying a High Pressure - High Temperature (HP-HT) treatment in the range 3 to 6 GPa at 600°C. This compound was reported to present no magnetic order down to 0.35 K, suggesting that it could be an experimental realization of a gapless QSL. In order to investigate this behavior by both nuclear magnetic resonance (NMR) and muon spin resonance (µSR) we synthesized this phase in HP-HT conditions.

X-ray powder diffraction on a laboratory source (Bruker D8) and neutron powder diffraction on the D1B beamline of the ILL (Grenoble, France) have been performed. The refinement of the structure using these data showed disorder of Ni and Sb atoms on the sites of the triangular lattice. In that case, the absence of magnetic ordering could be simply related to the structural disorder of the magnetic cation framework, in which the triangular planes are not preserved. For a correct interpretation of physical properties of the samples, it is thus mandatory to clarify the nature of the disorder and confirm (or not) the existence of Ni triangular planes in the structure. Therefore, we have undertaken a thorough investigation of the structural properties of 6H-B Ba3NiSb2O9 using precession electron diffraction and Z-contrast imaging.

STEM-HAADF Z-contrast imaging (figure 1a) shows rows of bright contrasts that can be linked to the structural model of Ba3NiSb2O9 (figure 1b). Figures 1c and 1d show the intensity profiles in the green and pink boxed areas, respectively, with theoretical intensities based on the atomic numbers superimposed. As expected, the contrast corresponding to the Ba atoms (green) shows the highest intensities. The intensity in the center of the profiles corresponds well to a Sb atom (yellow). However, on the two remaining positions, where the 6H-B structure has either a Sb or a Ni atom (blue) the expected intensities differ from the observed ones. The observed intensities on the Ni/Sb sites can be interpreted as Sb and Ni being both present in the atomic columns.

Precession electron diffraction on a thin particle showed that the symmetry of the crystal isn’t compatible with the P63mc space group proposed for 6H-B. The [010] zone axis (figure 2a) shows no mirror symmetry perpendicular to the c* direction and the existence of the 003 reflection. This is incompatible with a 6-fold axis or a c glide plane in the crystal. The correct space group must therefore be trigonal.

Figure 2b shows a structure compatible with all our observations. Here the Ni and Sb atoms are on distinct sites, different from those reported for the 6H-A and 6H-B forms, thus breaking the mirror symmetry perpendicular to c and the c glide plane.

In conclusion, Ni-triangle planes can effectively be present in this structure but only in domains of up to 10 nm in size. At the larger scale seen by X-rays and neutrons, typically several 10s nm we observe an average of several domains and the average symmetry becomes hexagonal with a statistical Ni/Sb disorder on the cation sites of the face sharing octahedra.


Holger KLEIN (Grenoble), Céline DARIE, Christophe LEPOITTEVIN, Stéphanie KODJIKIAN, Pierre BORDET, Claire COLIN, Oleg LEBEDEV
08:00 - 18:15 #5053 - MS05-758 Advanced TEM of BiCu1-xOS oxysulfide: copper deficiency and electronic properties.
MS05-758 Advanced TEM of BiCu1-xOS oxysulfide: copper deficiency and electronic properties.

The BiCuOX (X=S, Se) oxychalcogenides have attracted much attention because of their properties which are performing thermoelectric material ( copper deficient BiCu1-xOSe phase) and along the BiCuOSe-BiCuOS solid solution, one of candidate for possible transparent conductor (BiCuOS) and also superconductivity for BiCu1-xOS structure.

An oxysulfide series of nominal compositions BiCu1-xOS with x<0.20 has been prepared and its structural properties characterized by combining XPRD and TEM techniques. It is found from XPRD that this oxysulfide is crystallized in the P4/nmm SG with a3.87Å, c8.6Å unit cell parameters.

In order to investigate the crystal structure and chemical nature of defect structure, such as dislocations and possible intergrowth at atomic level, which mightbe responsible for particular properties,  advanced TEM was carried out. The high resolution [100] HAADF-STEM images of BiCuOS perfect crystal are given in Fig. 1a.The careful inspection of the high resolution HAADF-STEM image reveals the presence of local variation in the intensity of the atomic columns in some of the weak brightness rows located in between two high brightness zig-zag rows (Fig1b) It is clear from the nature of HAADF-STEM contrast that the bright zig-zag dots correspond to Bi atomic columns whereas the less bright dots correspond to the Cu ones. The corresponding intensity plot profiles made along the Cu atom rows shows clear drop of the peak intensity with respect to the adjacent peaks. This is observed every two atomic columns (black arrow heads). The peaks of lower intensity definitely correspond to lower amount of Cu atoms in the column. Accordingly, the presence of Cu vacancies should also create re-arrangements of the S atoms in the structure.  The larger sensitivity to the light elements of ABF-STEM images evidences it (Fig. 1c, insert in bottom panel). In the latter, some of the S atoms are slightly displaced from original position. They also exhibit less contrast with respect to the other S atomic columns suggesting S-vacancies. Therefore, the presence of Cu vacancies was confirmed by HAADF-STEM studies and shows that BiCu1-xOS tends to adopt a constant amount of copper vacancy corresponding to x=0.05 and is general to all the BiCu1-xOS (x≤0.15) samples.

 Moreover, for larger Cu deficiencies (x>0.05 in the nominal composition), other types of structural nanodefects are evidenced from HAADF-STEM imaging such as oxysulfides of the “BiOS” ternary system which might explain the report of superconductivity for the BiCu1-xOS oxysulfide (Fig.2) Intergrowths between different structures can be evidenced at the nanoscale level, which are related to deficient Cu regions. Interestingly, the layers stacking in the “I” region shows a continuous phase transformation from tetragonal BiCuOS structure to the orthorhombic copper free BiOS oxysulfide and, finally, to the cubic Bi2O3 oxide (see structural mode in the left bottom panel). The structures are epitaxial intergrowth, showing that, by adding sulfur to the Bi2O3 oxide, and then Cu, the material can evolve from the oxide to BiCuOS oxysulfide in only few unit cells. The region noted II shows a nanoparticle (~15nm) without copper which can be identified as the Bi2O2S structure surrounded on both its left and right sides by Bi2O3 layers.

This is in contrast with the TEM investigation of  “nominal” BiCuOSe oxyselenide. TEM results evidence that layer stacking in the structure is very regular. Neither intergrowth nor dislocation can be observed. More importantly, neither Cu nor other vacancies, including oxygen or sulfur  were found in the case of BiCuOSe .

The lack of copper explains why Bi2O3 can play the role of buffer layer to epitaxially adapt BiCuOS to Bi2O2S. The presence of defects with Bi2O2S composition, very close to that of the Bi3O2S3 superconductor with TC=4.5K, also explains why superconductivity could have been observed in Cu deficient BiCuOS oxysulfide reported previously.

Finally, our study shows that the BiCuOS structure tends to adapt a limited amount of Cu deficiency corresponding to “BiCu0.95” through the partial occupancy of the Cu sites in the (ab) plane. For nominal contents of copper smaller than 0.95, other kind of defects are created implying nano-epitaxy between the “BiCuOS” phase and both “Bi2O2S” and “Bi2O3” phases. The origin of the BiCuOS lack of structural flexibility for Cu amounts deviating from ~5% could be related to a very rigid skeleton imposed by the epitaxial relation between the two types of structural layers in contrast to the isostructural selenides. Consequently, this limitation of doping via Cu vacancy in BiCuOS calls for other types of chemical control to inject carriers in the conduction [Cu2S2]2- layers.


Oleg LEBEDEV (Caen), David BERTHEBAUD, Emmanuel GUILMEAU, Antoine MAIGNAN
08:00 - 18:15 #5347 - MS05-760 Nanoscale characterization of Co and Co-B catalytic coatings before and after catalytic tests for the sodium borohydride hydrolysis.
MS05-760 Nanoscale characterization of Co and Co-B catalytic coatings before and after catalytic tests for the sodium borohydride hydrolysis.

The use of hydrogen as a potential future energy carrier is limited due to the problems of its storage. Hydrolysis of hydrogen storage materials such as sodium borohydride (NaBH4, SB) has been one of the most investigated approaches for hydrogen generation. SB is stable in dry air and combines lightweight with high hydrogen content (10.8 wt%).

NaBH4 + 2H2O   →   4H2 + NaBO2  (1)

Although spontaneous, the SB hydrolysis (reaction 1) needs catalysts to occur at appreciable rates. Co has demonstrated to be a good choice because its compromise between activity and cost.  However, its major drawback is related to stability: these materials deactivate upon cycling. Despite the great number of works reporting Co and Co-B based catalysts, the nature of the active phase and deactivation mechanisms are still under intense discussion. 

We have recently reported the preparation of supported Co metallic catalysts as thin films by magnetron sputtering for sodium borohydride hydrolysis [1]. Magnetron sputtering is a very versatile technique used in this work to fabricate Co and CoB catalytic coatings under different deposition conditions and supported on different substrates (i.e. silicon and polymeric membranes). In this work we have been able to study by electron microscopy the catalytic coatings as grown on the wires of the polymeric membranes. The structural and compositional characterization by SEM and (S)TEM techniques has been performed before and after the catalytic tests (19 wt% SB in NaOH 4 wt%, 90 min reaction time).  Fig. 1 and 2 show the SEM morphology of a Co thin film on the polymeric membrane before and after the catalytic test, respectively, showing the growth of a new layer onto the catalysts upon operation. Further nano-analysis of the structure and compositional distribution have been performed by (S)TEM techniques coupled to EELS. They also reveal the formation of fiber/nanoflake-like nanostructures onto the catalytic coatings (Fig. 3 and Fig. 4). Compositional analysis have pointed out the formation of Co-borates and most likely cobalt oxide/hydroxide nanoflakes (i.e. CoO(OH)) which could be the origin of the leaching and deactivation mechanisms of the Co-based catalysts for the investigated reaction.

 

References

[1] Paladini, M. et al. Applied Catalysis B-Environmental 2014, 158, 400-409.

 

Acknowledgements

This work was supported by the Spanish MINECO (project CTQ2012-32519 and CTQ2015-65918), CONSOLIDER FUNCOAT+ (MAT2015-69035-REDC), Junta de Andalucía (PE2012-TEP862) and CSIC (PIE201460E018). The authors also acknowledge the Laboratory for Nanoscopies and Spectroscopies (LANE) at the ICMS for the TEM facilities and I. Rosa for the TEM samples preparation. AMB thanks to Talent-Hub Program funded by the Junta de Andalucía and the European Commission under the Co-funding of the 7thFramework Program in the People Program (Marie Curie Special Action).


Ana M BELTRÁN (Sevilla, Spain), M PALADINI, V GODINHO, G.m. ARZAC, M.c. JIMENEZ DE HARO, A FERNÁNDEZ
08:00 - 18:15 #5445 - MS05-762 Characterizing blends of Zn/Pc-C60 for Organic Photovoltaic Cells using energy-filtered Backscattered Electron (BSE) imaging in combination with Low Voltage Scanning Electron Microscopy (LVSEM).
MS05-762 Characterizing blends of Zn/Pc-C60 for Organic Photovoltaic Cells using energy-filtered Backscattered Electron (BSE) imaging in combination with Low Voltage Scanning Electron Microscopy (LVSEM).

Blends of conjugated polymer zinc-phtalocyanine (ZnPc) and electron acceptor fullerene (C60) are used as an active layer of organic photovoltaic (OPV) cells in bulk heterojunction architectures. In this study, the morphology of co-evaporated small molecule blends of ZnPc (ZnC32H18N8) and C60 is investigated with Low Voltage Scanning Electron Microscopy (LVSEM). Compared to SEM studies carried out at standard conditions, these LVSEM studies present the advantages of a lower modification of the polymer structures during observation and of a better material contrast between the components which consist mainly on carbon. Energy-filtered SEM imaging in combination with low primary beam energies (Ep) allows to detect the low loss backscattered electrons (LLBSE). These LLBSEs undergo a small number of inelastic scattering events, and therefore, they lose only a small amount of energy. The material contrast between the blend components is detectable and enhanced for low Ep. These fine contrast differences obtained from the LLBSE are originated in the very shallow regions of the blend surface, and not from the volume where multiple inelastic scattered electrons, like the secondary electrons (SEs), are produced [1]. The blend morphology is imaged using a novel energy selective backscattered (EsB) electron detector whose grid voltage is set to high values in order to cut off the lower energy SEs, which are responsible for the topography information in the SEM images. This energy-filtering technique allows to detect uniquely the LLBSEs, which mainly carry material contrast information. High atomic number (Z) elements have a higher backscatter electron coefficient for Ep ≥ 1 kV [2]. Therefore, higher Z elements appear brighter due to a higher BSE emission. The material contrast is optimized and quantified as a function of the Ep, the EsB grid voltage and the working distance (WD) at low landing energies. Figure 1 illustrates how topography information dominates the images for EsB grid voltages below 300 V, due to influence of SEs. The material contrast is obtained for EsB grid voltages ≥ 500 V. In Figure 2, the in-lens SE image a) also shows the blend topography: long rods interlaced with each other and in between, cube-shaped particles. For the identical sample region, the image detected with the EsB detector b) shows the material contrast between rods and particles. The bright rods are identified as the ZnPc phase, while the darker cube-shaped component is assumed to correspond to C60. Depending on the SEM working conditions, the systematic study of the material contrast reveals that small differences in composition can be detected using the LLBSEs. Summarizing, it is possible to image the material contrast difference even for challenging materials like the ZnPc-C60 active layer in OPV cells by optimizing Ep, EsB grid voltage and WD values.

 

Acknowledgements: The authors kindly thank Carl Zeiss Microscopy GmbH, Oberkochen, Germany, for their collaboration. This study was supported in part by the German Science Council Center of Advancing Electronics Dresden, EXC1056, CFAED.

References

[1] H. Jaksch, European Microbeam Analysis Society (EMAS), France, 2011, 255-269.

[2] A. M. D. Assa’d, M. M. El Gomati, Scan. Micro. Mat., 1998, 12, 185-192.

[3] D. C. Bell, N. Erdman, Low Voltage Electron Microscopy: Principles and Applications, John Wiley & Sons, United Kingdom 2013.

[4] A. Garitagoitia Cid, R. Rosenkranz, E. Zschech, Adv. Eng. Mat., 2015, 10.1002/adem.201500161.

 


Aránzazu GARITAGOITIA CID (Dresden, Germany), Mona SEDIGHI, Markus LOEFFLER, Willem F. VAN DORP, Ehrenfried ZSCHECH
08:00 - 18:15 #5465 - MS05-764 Growth of novel Pt 3D networks on tungsten suboxide electrodes and their effect on the performance of fuel cells.
MS05-764 Growth of novel Pt 3D networks on tungsten suboxide electrodes and their effect on the performance of fuel cells.

Green energy gains in importance in the spotlight of current research activities. Solar, wind and water are promising energy sources and they are already in use in different ways. Their practical disadvantage – their dependence on daytime or seasonal conditions – requires an intermediate storage of the produced energy. A convenient carrier could be hydrogen (H2). Fuel cells (FCs) can then be used to convert the chemically bound energy in H2 into electrical power as well as heat. One of the most simple redox reactions, the oxidation of H2 and reduction of oxygen (O2) followed by the formation of water (H2O), is the basis of this promising route of energy conversion and electricity production. In our research work we develop and investigate novel electrode materials for improved and long-term stable FC performance. Tungsten suboxide (WO3-x) is chosen as support material due to its ability to minimize poisoning of the platinum (Pt) catalyst. For most efficient hydrogen spill over and electron transport, the interface between the catalyst and the support material is of great interest. In addition, the distribution and shape of the catalyst on its support are important. To address these questions we used various electron microscopy techniques. Via scanning electron microscopy (SEM) we obtained overview images of the Pt catalyst particles and their distribution on the WO3-x support. Detailed analysis regarding growth and architecture of the Pt catalyst was performed with the help of a transmission electron microscope (TEM) equipped with a monochromator and Cs-corrector for the condensor system (Titan Themis 60 – 300 kV). The preparation of electron transparent samples was performed by site specific focused ion beam (FIB) sectioning.

Pt is deposited on the WO3-x support by a wet chemical approach and the different growth stages were investigated after varied deposition times. SEM images revealed octahedral and truncated octahedral shaped 3D Pt catalyst morphologies on the WO3-x support with lateral dimensions of 2 – 4 µm. Depending on the deposition time of the Pt precursor (4 min, 20 min, 60 min) their appearance differs (Fig. 1). TEM and STEM images revealed highly porous 3D networks formed by Pt nanorods with a width of a few nanometers (Fig. 2a). These networks develop as a result of the reduction of the catalyst precursor in H2 atmosphere. High resolution TEM (HRTEM), HRSTEM and electron diffraction experiments revealed that the Pt rods have different orientations. The nanorods are connected to each other as visualized by TEM tomography (Fig. 2b). The formation of the Pt catalyst 3D network takes place in a 2-step procedure: firstly octahedral or truncated octahedral shaped compact crystals of the precursor are formed on the WO3-x support. These crystals are then reduced to metallic Pt with side products evaporating in the second step in the presence of H2. The corresponding redox reaction starts at the outside of the bulk crystal and penetrates to its inside while reducing the precursor step by step. This is shown in Fig. 3a where the outer area of the displayed 3D catalyst is formed by a network of Pt nanorods while its interior is still compact. Energy dispersive X-Ray (EDX) analysis and STEM reveal that small Pt particles are embedded in a reduced form of the amorphous precursor matrix (Fig. 3b). The long-term stability and performance continuity of the Pt/WO3-xsystem as an anode of high-temperature polymer-electrolyte-membrane FCs was demonstrated in accelerated and continuous FC operation times of up to 2000 h. Via SEM and different TEM based techniques the improved degradation behavior compared to standard carbon support material was shown.1

   

  

 (1)          Heinzl, C.; Hengge, K. A.; Perchthaler, M.; Hacker, V.; Scheu, C. Journal of The Electrochemical Society 2015, 162, F280.


Katharina HENGGE (Duesseldorf, Germany), Christoph HEINZL, Markus PERCHTHALER, Marina WELSCH, Christina SCHEU
08:00 - 18:15 #5715 - MS05-766 HRSTEM and EELS study of NMC aging mechanisms for renewable energy application.
MS05-766 HRSTEM and EELS study of NMC aging mechanisms for renewable energy application.

With the constant development of renewable energy, the associated energy storage devices need to improve their lifetime (15-20 years), security and be of low cost. Among the possible materials for such applications, Li[Ni1-x-yMnxCoy]O2 (NMC) is a good candidate due to its lower cost and better thermal stability than NCA for example. Obtaining a better understanding of the aging mechanisms of NMC is then critical to create reliable prototypes. In this aim, NMC materials have been investigated after drastic cycling.

 

To investigate the microstructural and chemical evolutions of the NMC before and after cycling, we performed combined SAED, HRSTEM-HAADF, EDS and EELS study using a TECNAI F20-STWIN and a JEOL ARM 200 CF Cs-corrected both equipped with an EDX and EELS. By compiling the different information, we were able to highlight several modifications:

  • a preferential dissolution1,2 of first manganese then nickel with the cycling,
  • A preferential dissolution of the material along the lithium diffusion path resulting in the creation of cracks,
  • Microstructural evolution from a layered structure to a spinel3 and a rock salt one (see figure 1),
  • Changes in the oxidation state of the manganese and cobalt (see figure 2).

These evolutions show a progressive degradation of the NMC during cycling until the apparition of phase (rock salt type) with limited cycling performance. Knowing this extreme behavior will help to adapt new generation (electrode formulation, …) of prototype cells.

Acknowledgement:

This work was funded by ANR (Agence Nationale de la Recherche) and was part of the VISION project.

 

Références

1.        Vetter, J. et al., J. Power Sources 147, 269–281 (2005).

2.        Pieczonka, N. P. W. et al., J. Phys. Chem. C 117, 15947–15957 (2013).

3.        Boulineau, A. et al., Nano Lett. 13, 3857–3863 (2013).


Carine DAVOISNE (Amiens), Mohamed BEN HASSINE, Cécile TESSIER, Goran DRAZIC, Loic DUPONT
08:00 - 18:15 #5720 - MS05-768 On the morphology of Li2S deposits in Li-S batteries.
MS05-768 On the morphology of Li2S deposits in Li-S batteries.

Lithium-Sulfur batteries are thought to be the future of Li-ion batteries thanks to their high theoretical specific capacity (1675 mAh.g-1) and low-cost. However, the real-life application of Lithium-Sulfur batteries is still hindered by limitations such as the formation of highly insulating and insoluble species at the cathode (e.g. Li2S), mechanical instability of the electrodes and capacity fading due to polysulfides shuttle effect [1]. It is crucial for the development of Lithium-Sulfur batteries to gain a better understanding on the chemical and microstructural changes which take place at the electrodes upon electrochemical cycling.

We will present the results of our SEM and (S)TEM investigation on the microstructural, crystallographic and chemical properties of the species formed at the cathode during galvanostatic cycling at different discharge rates. We have cycled a Carbon/Sulfur composite material using a Swagelok type cell with Li metal anode with 1M LiTFSI-TEGDME/DIOX electrolyte. All materials were handled in O2-free conditions.

The studied cathode is formed by carbon nanoparticles having 30 to 50 nm diameter and two types of morphology; regular solid and irregular core-shell-like. HR TEM imaging associated with spectroscopy techniques show that sulfur forms a uniform, amorphous coating on the carbon particles.

After full discharge at slow rate (C/20), a porous desert-rose-like deposit was observed, whereas at faster rate (1C) a particulate conglomerate discharge product was locally concentrated on the C/S composite (Fig. 1); we infer these discharge products to be Li2S deposits.

At the nanometric scale, both slow and fast cycling result in the deposition of a 1 to 2 nm thick Solid Electrolyte Interphase (SEI) onto the carbon particles. Moreover, slow cycling promotes the formation of cubic (Fm3m) Li2S nanocrystals up to 30 nm in size (Fig.2).

These observations suggest that fast and slow discharge rates promote the formation of amorphous and crystalline Li2S, respectively.

 

Acknowledgments

ALISTORE-ERI, HELiS and RS2E consortiums are gratefully acknowledged for their financial support.

 

References

[1]       Bruce et al., Nat Mater 11 (2012) 19.


Mattia GIANNINI, Afef MASTOURI, Arnaud DEMORTIÈRE, Goran DRAŽIĆ, Carine DAVOISNE (Amiens)
08:00 - 18:15 #5741 - MS05-770 HRTEM and STEM-EELS study of thin films Pt-CeOx nanocatalysts for on-chip fuel cell technology.
MS05-770 HRTEM and STEM-EELS study of thin films Pt-CeOx nanocatalysts for on-chip fuel cell technology.

Platinum (Pt) is a versatile element in catalysis that efficiently mediates a multitude of chemical reactions. Unfortunately, Pt is a rare noble metal and its high price exceeding that of gold, limits large-scale applications. Therefore, not surprisingly, reducing amount of Pt is the major driving force in catalysis research. There are two strategies to tackle this challenge: to replace noble metal by others, less expensive materials; and to use platinum as efficiently as possible. In this study, we handle both of them by growing extremely porous Pt-CeO2 structures prepared It was shown that sputtered thin cerium oxide films containing Pt, which had been deposited on the anode side of a fuel cell, exhibited a higher specific power compared to a conventional Pt−Ru catalyst [1]. Besides the large scale fuel cells, there is also an increasing interest in miniature fuel cells fabricated on silicon, which could be used as an on-chip power supply for portable electronic devices.

In this study, nanometric Pt-ceria thin films were characterized by TEM after elaboration by physical vapor deposition on various substrates (silicon, carbon foils, intermediate carbon films). The deposited layers exhibited different morphologies linked to the different substrates. It is shown that the roughness of the layers is dependent on the deposition conditions, the amount of deposited material and the type of the carbon substrate. The change of these parameters results in growth of flat, mushroom-like or noodle-like structures (Fig. 1). By the optimization and the suitable combination of materials we can tune the morphology of the catalysts. In addition to the substrate type, many effects as the formation of carbides or silicates at the interface, an interaction of ceria with platinum and the presence of the porosity influenced also the structure and the chemistry of the deposited layers [2,3].

In all samples, crystallites corresponding mainly to CeO2 and to a less extent to CeC2 crystallographic structures were observed (Fig. 1). STEM-EELS measurements have been carried out on layers grown on silicon with and without intermediate carbon layer. Data analysis of the M4,5 white lines of cerium have pointed out a variation of cerium oxidation state from Ce4+ to a mixture of Ce3+ and Ce4+ depending of the localization of the measurement (Fig. 2).

[1] V. Matolin et. al, Langmuir 26, 12824-12831 (2010)
[2] J. Lavkova et. al, Nanoscale 7, 4038-4047 (2015)
[3] M. Dubau et. al, ACS Appl. Mater. Interfaces 6, 1213-1218 (2014)

 Acknowledgement: This research is supported by EU within FP-7-NMP-2012 project chipCAT under Contract No. 310191.The authors acknowledge the support by the Czech Science Foundation under grant No.13-10396S and J.L. is grateful to the Conseil Regional de Bourgogne (PARI ONOV 2012).


Valérie POTIN (DIJON CEDEX), Jaroslava LAVKOVA, Martin DUBAU, Iva MATOLINOVA, Vladimir MATOLIN
08:00 - 18:15 #5758 - MS05-772 High temperature and in situ study of SrO surface precipitation on perovskite ceramics.
MS05-772 High temperature and in situ study of SrO surface precipitation on perovskite ceramics.

Solid oxide fuel cells (SOFC) convert gaseous fuels, e.g. H2, into electricity through an electrochemical process. Their conversion efficiencies are not limited by the Carnot cycle and pollution levels in the exhaust gas are significantly lower than that of traditional technologies. SOFC cathode materials require a very precise balance of material properties in order to function at operating temperatures (~600 – 800°C). A number of systems fulfil the requirements, but there are numerous challenges these materials face during manufacture and operation. Of particularly concern is the negative impact secondary phase formation at the surface has on the reduction of oxygen. In a large number of perovskite systems used for SOFC cathodes the A-site is occupied by lanthanum (La3+) and it is often doped with strontium (Sr2+) to introduce oxygen vacancies, which generates ionic conductivity, and electronic species leading to mixed conductivity, essential for operation as aN SOFC cathode. The crystal chemistry of these perovskite structures can be described as an alternated stacking of SrO and LaO2 layers.  It is believed that the charge difference between the lanthanum and strontium changes the state of the B transition metals (i.e. B2+/3+) to preserve charge neutrality and in turn creates dipole moments SrO and LaO2 layers. This creates an alternating electric field throughout the material, resulting in a large surface charge, which the system attempts to reduce by depleting the surface of lanthanum and segregating strontium [1].

Continuous surface precipitation was observed on polished La0.6Sr0.4Co0.2Fe0.8O3-δ (LSCF) ceramics using high temperature environmental scanning electron microscopy (HT-ESEM) up to 1000°C. Several experiments were performed under different atmospheres: vacuum, 300 Pa O2, H2O and air. A characteristic image series recorded under water vapor is reported on Figure 1. The surface precipitation phenomenon can be clearly observed. The composition of the precipitates determined from the X-ray maps recorded on samples cooled at room temperature is SrO (Fig. 2). The evolution of the surface occurs in three distinct stages: (1) rapid growth of precipitates on grain boundaries, at defect points as well as at the centre of the grains, (2) agglomeration of the precipitates due to surface transport phenomena and (3) Continuous coarsening during the heat treatment. It is clear that at the beginning the precipitation process, the SrO precipitates appear to grow with crystallographic direction as, within each grain, they tend to orientate themselves in a similar direction. It is also clear that the initiation of the SrO precipitation and the density of the precipitates depend on the LSCF grain orientations. When comparing the EBSD maps with the HT-ESEM images (Figure 3a), it is obvious that the precipitation process and grain growth are directly linked with the grain orientations and presence of twinning inside the grains (Fig. 3bcd). Twin planes exist in many grains. Average twin plane width measured across a particular grain (Fig. 3b) is very close to the average particle width (measured centre to centre), 0.6 and 0.5µm respectively. This result suggests that twin planes in this orientation are fast diffusion pathways. Other grains display homogenous precipitate growth across the grain surface and it is predicted that knowledge of the twin habit plane can be used to describe why these grain orientations display different behavior.

From these new data sets, a very precise and original description of the surface precipitation has been proposed.

[1] W. A. Harrison, Phys. Rev. B, 83, 155437 (2011)


Mathew NIANIA, Renaud PODOR (ICSM, Marcoule), Ben BRITTON, Stephen SKINNER, John KILNER
08:00 - 18:15 #5777 - MS05-774 Aluminum nanoflakes: relations between microstructure and reactivity.
MS05-774 Aluminum nanoflakes: relations between microstructure and reactivity.

Aluminum powders are used as a component in propellant formulations, explosives and pyrotechnics [1]. Their reactive and propulsive properties are linked to the exothermic reaction of aluminum with an oxidant. Powders with a high specific surface area (higher than 10 m2/g) i.e. aluminum nanopowders (Al-NPs) have a higher reactivity than micronic powders. Moreover, we have shown that shape and nanostructuration of the grains influence the reactivity [2]. The reactivity of the powders is characterized by thermogravimetric (TG) analyses. In this work, the powders which are obtained by high energy ball milling, show a flake like morphology (fig. 1). The influence of the milling parameters and additives on the morphology, structure and reactivity of the powder was  investigated. Among the milling parameters, we have changed the size of the balls, the atmosphere of the process and the post-treatment of the powder.

The nanoflakes are highly dispersed in lateral size and thickness;  the biggest ones have micronic lateral sizes (1-4 mm) and thickness less than 200 nm, and the smallest ones 100 nm in lateral size and 30 nm in thickness (fig. 2). The nanoflakes contain several crystallites with an orientation relationship; a [110] texture was observed (fig. 3). They are surrounded by an amorphous layer of aluminum oxide, whose thickness depends on the size of the crystallite. Small crystallites exhibit thicker amorphous layer at the edges than on basal planes (fig. 4), this could induce different oxidation rates of the powder. To remove the passivation agent used in the milling process, the powder is rinsed several times. This is a rather tedious process, so a simple annealing of the powder was tested as an alternative to remove paraffin. Heating the powder at 420°C led to an early crystallization of the Al2O3 amorphous layer, which is an unwanted effect. In-situ heating in a transmission electron microscope, under inert atmosphere, are in progress, in order to follow the crystallisation of the amorphous alumina layer and the different phase transitions, which are predicated to play an important role in the oxidation mechanism [3].

 

 

[1] E.L. Dreizin, Prog. Energy Combust.Sci. 35 141 (2009).

[2] B. André, M.V. Coulet, Ph. Esposito, B. Rufino, R. Denoyel , Mat. Lett110 108 (2013).

[3] M.A. Trunov et al. Combust. Flame 140 310 (2005).

 

Acknowledgments:

Authors acknowledge financial support from the Agence Nationale de la Recherche  (ANR) and the Direction Générale des Armées (DGA) (Grant No ANR-13-ASTR-0032).


Véronique MADIGOU (LA GARDE), Christine LEROUX, Pierre-Henri ESPOSITO, Renaud DENOYEL, Marie-Vanessa COULET
08:00 - 18:15 #5799 - MS05-776 Imaging of deformation of a polypropylene separator due to immersion in electrolyte or due to heating.
MS05-776 Imaging of deformation of a polypropylene separator due to immersion in electrolyte or due to heating.

Pore size of separators is one of the most important factors for Li-ion batteries. The separator must electrically isolate the anode and the cathode of the battery, but should allow Li ions to pass through easily. Large pores degrade the extent of isolation but small pores degrade the permeability; thus, a balance is needed for optimal performance. The pore size of the separator is determined well before its incorporation into the battery, but the pore size may not be maintained in the electrolyte. We, therefore, observed the structures of the separator before and after immersion in the electrolyte.

Figures 1(a) and 1(b) show atomic force microscopy (AFM) images of a 25-mm-thick single-layer polypropylene separator before and after immersion in the electrolyte, respectively. The figures clearly show the lamellar alignment and the the fibrillae between the lamellae. The spacing between the lamellar layers was around 0.8 mm before immersion, but expanded to 1.4 mm after immersion. The pores expanded like sponge when they immersed in the liquid electrolyte. Expansion of the separator occurs when it is bound tightly inside the battery. Thus, expansion of the pores of the separator must be considered while fabricating good batteries.

One of the most important abilities of the separator is a shutdown ability. When a large current flows between the electrodes, the resultant heating partially melts the separator, and fills the pores. As a result, Li ions cannot pass through the portion of the separator, and the large current is shut down. Thus, shutdown by melting of the separator is an important factor for safety. To investigate melting of the separator, we observed the separator while heating.

AFM images obtained at 398 K show the deformation of the separator. Expansion of the lamellar layers and the filled pores were imaged. The melting band normal to the lamellar layers was extended in the direction of the fibrillae. The melting bands should be formed by fusion of the fibrillae and lamellae, and by conjunction. Partial melting around 390 K is adequate for shutdown. These results prove the good performance of the separator.


Keiji TAKATA (Osaka, Japan)
08:00 - 18:15 #5882 - MS05-778 Quantitative compositional mapping on the nanoscale over large fields of view in thin film solar cells from earth abundant elements.
MS05-778 Quantitative compositional mapping on the nanoscale over large fields of view in thin film solar cells from earth abundant elements.

Solar power is projected to become the largest single global source of electricity generation by 2050, with photovoltaic devices constituting the majority of this market share [1].  Next generation materials based on material systems with direct band gaps fabricated in thin films are predicted to make considerable contributions to this market with the promise of significantly reducing materials costs and solar cell bulk.  At present, one of the most promising thin film absorber material is CuInxGa(1-x)Se2 (CIGS), which has been shown to achieve a solar conversion efficiency in the laboratory of 21.7% [2].  However, the high cost of the raw materials in this system has driven research to find more cost effective alternatives  [3].

One such alternative material system based on the crystallographic kesterite family Cu2ZnSn(S,Se)4 promises to be highly cost competitive due to the use of earth abundant elements.  However, this system is currently less mature than CIGS with a record solar conversion efficiencies of 12.6% [4] or 11.6% [5] if no sulphur is used.  The challenges impeding improvement are related to chemical and nanoscale structural inhomogenities that lead to a reduction in the open circuit voltage of the system [6].  A full understanding of these defects and, hence, progression in fabrication of these materials thus requires a characterization technique capable of spatially mapping out compositional, structural, and electronic trends with nanoscale spatial resolution.

In this contribution, we present our progress towards the development of a methodology that will allow researchers to directly address these challenges with nanometer spatial resolution over micron sized areas of sample.  We accomplish this through two stages.  First, a sample preparation methodology enabling a very large field of view while retaining a reasonable lamellae thickness utilizing the Focused Ion Beam is presented.  Preliminary results of this methodology are presented in figure 1, revealing a field of view of many microns over a sample that is under 80 nm thick in the absorber layer.  Second, we employ correlative EDX and EELS spectroscopic imaging techniques over large areas, focusing on features such as grain boundaries and pores. The simultaneous use of both spectroscopy techniques allows for two independent quantitative assessments of composition, reducing systematic errors. It also assists in the identification and elimination of artifacts that may arise through the data treatment.  The result is large area maps with optimized uncertainties from a materials system containing many difficult and overlapping spectroscopy edges. These techniques are then applied to state-of-the-art samples with very high efficiencies [7].

[1]          International Energy Agency: Technology Roadmap: Solar Photovoltaic Energy. 2014.

[2]          Jackson, P. et al.: Properties of Cu(In,Ga)Se2 solar cells with new record efficiencies up to 21.7%. Phys. Status Solidi RRL 9 (2015) 28.

[3]          European Comission: Report on critical raw materials for the EU. 2014.

[4]          Wang, W. et al.: Device Characteristics of CZTSSe Thin-Film Solar Cells with 12.6% Efficiency. Adv. Energy Mater. 4 (2014) 1301465.

[5]          Lee, Y.S. et al.: Cu2ZnSnSe4 Thin-Film Solar Cells by Thermal Co-evaporation with 11.6% Efficiency and Improved Minority Carrier Diffusion Length. Adv. Energy Mater. 5 (2015) 1401372.

[6]          Mitzi, D.B. et al.: Prospects and performance limitations for Cu–Zn–Sn–S–Se photovoltaic technology. Phil. T. Roy. Soc. A 371 (2013) 20110432.

[7]          Giraldo, S. et al.: Large Efficiency Improvement in Cu2ZnSnSe4 Solar Cells by Introducing a Superficial Ge Nanolayer. Adv. Energy Mater. (2015) 1501070.

[8]          Hubert, M. et al.: ROBPCA: A New Approach to Robust Principal Component Analysis. Technometrics 47 (2005) 64


Thomas THERSLEFF (Uppsala, Sweden), Sergio GIRALDO, Haibing XIE, Paul PISTOR, Edgardo SAUCEDO, Klaus LEIFER
08:00 - 18:15 #5975 - MS05-780 Combined TEM/STEM and In-situ c-AFM Characterization of 2D Nanoflake-like Heterostructures for Energy Storage and Conversion Applications.
MS05-780 Combined TEM/STEM and In-situ c-AFM Characterization of 2D Nanoflake-like Heterostructures for Energy Storage and Conversion Applications.

Honeycomb-like hematite nanoflakes/branched polypyrrole nanoleaves heterostructures with a 3D complex structure have been synthesized and employed as high-performance negative electrodes for asymmetric supercapacitors application. The detailed TEM-STEM characterization and deep EELS chemical analysis at the nanoscale has been combined to elucidate the mechanisms underlying the formation and morphology evolution of core-branch Fe2O3@PPy heterostructures.[1] In addition, we have studied the mechanism of converting MoO2 nanoflakes into 2D free-standing MoS2 electrode by sulfurization process for water splitting. In this way, the atomic resolution aberration corrected HAADF STEM reveals the sulfurization mechanism in an unprecedented detail, together with EELS chemical maps. Furthermore, in-situ electrical measurements have been performed by means of c-AFM on the MoO2/MoS2 nanoflakes surfaces in order to detect their electronic active sites.

 

Acknowledgments

We acknowledge the funding from Generalitat de Catalunya 2014 SGR 1638, 2014 SGR 797 and MINECO coordinated projects between IREC and ICN2 TNT-FUELS and e-TNT (MAT2014-59961-C2-2-R). Xuan Zhang is grateful for financial support from China Scholarship Council. Part of the present work has been performed in the framework of Universitat Autònoma de Barcelona Materials Science PhD program.

 

Reference:

 [1] Peng-Yi Tang, Li-Juan Han, Aziz Genç, Yong-Min He, Xuan Zhang, Lin Zhang, José Ramón Galán-Mascarós, Joan Ramon Morante, Jordi Arbiol, Nano Energy, 22, 189-201 (2016).


Peng-Yi TANG (Bellaterra, Spain), María DE LA MATA, Li-Juan HAN, Albert VERDAGUER, Aziz GENÇ, Yong-Min HE, Xuan ZHANG, Lin ZHANG, José Ramón GALÁN-MASCARÓS, Joan Ramon MORANTE, Jordi ARBIOL
08:00 - 18:15 #6023 - MS05-782 Analysis of the binder and carbon black distribution in graphite electrodes for lithium ion batteries using electron dispersive X-Ray spectroscopy and energy selective backscatter electrons.
MS05-782 Analysis of the binder and carbon black distribution in graphite electrodes for lithium ion batteries using electron dispersive X-Ray spectroscopy and energy selective backscatter electrons.

Lithium ion batteries (LIBs) as mobile storage systems become more important in the future. At the same time, the demands on LIBs, such as high capacity in combination with high dis-/charge rates, low weight, long life time and cycle stability, are rising. This presents great challenges to the internal structure of the LIB, especially to the electrodes. Here, graphite is the most common material, which is used within an anode. The anode itself consists also of carbon black for the electro conductivity and binder for cohesion (particle and carbon black) and adhesion (electrode on current collector). But both are electrochemical inactive. Hence the amount must be as small as possible. However, the distribution of the binder and the carbon black has not been discussed in detail in the literature, in particular for low amounts. Therefore the distribution of two different types of binder poly vinylidene fluoride (PVDF) and a mixture of styrene-butadiene rubber (SBR) and sodium salt of carboxymethylcellulose (Na-CMC), within graphite anodes is investigated by scanning electron microscopic (SEM) methods in this work. The investigated electrodes are about 350 µm in thickness. To facilitate analysis in the SEM smooth cross-sections were prepared by argon ion polishing.

In case of the PVDF binder the distribution can be visualized based on its fluorine content. Therefore electron dispersive X-Ray spectroscopy (EDXS) mapping was used and drying related gradients in the binder distribution could be identified (Figure 1b). High binder concentrations were usually found in areas of high carbon black concentration. However, the rather poor lateral resolution of EDXS (about 1 µm) impedes more detailed investigations. On the other hand the detection of energy selective backscattered electrons (ESB) can be used to obtain element specific information at lateral resolutions comparable to conventional secondary electron images. By optimizing the grid voltage of the ESB – detector and the electron energy, it was possible to obtain high resolution images, in which fluorine rich regions appears bright (Figure 1a). It can be shown that not only the binder but also the carbon black differs in contrast compared to the graphite particles (Figure 2b). The obtained ESB – images were evaluated with image manipulation software to mark the particles and the carbon black (Figure 2d). Due to an about 100 times faster acquisition compared to EDXS, images spanning a large part of the cross-sections could also be obtained in a rather short time, but the evaluation is not that simple and cannot be automated like EDXS - mappings.

Since the SBR – binder as such does not contain a suitable element for mapping, osmium tetroxide (OsO4) staining was used to selectively mark the double bonds of the SBR – binder. Thereafter, localization of the binder was possible by mapping the Os distribution with EDXS. Unfortunately the osmium concentration was too low to visualize the SBR – binder by ESB.


Lukas PFAFFMANN (Eggenstein-Leopoldshafen, Germany), Marcus MÜLLER, Werner BAUER, Frieder SCHEIBA, Stefan JAISER, Michael BAUNACH, Philip SCHARFER, Helmut EHRENBERG
08:00 - 18:15 #6029 - MS05-784 Atomic resolution HR(S)TEM and EDXS analyses of GaInAs/GaSb and GaInP/GaSb bond interfaces for high-efficiency solar cells.
MS05-784 Atomic resolution HR(S)TEM and EDXS analyses of GaInAs/GaSb and GaInP/GaSb bond interfaces for high-efficiency solar cells.

The use of direct wafer bonding to combine semiconductor materials that have a large lattice mismatch is especially beneficial for high efficiency multi-junction solar cells. Multi-junction solar cells that have been fabricated by wafer bonding are of particular interest since efficiencies of up to 46% have been obtained [1] and efficiencies of up to 50% are within reach for concentrator solar cells based on III-V compound semiconductors. Fast atom beam activation is used as a pre-treatment to remove oxides and contamination before bonding [2]. Aberration-corrected transmission electron microsocpy (TEM) analyses of GaAs/Si interfaces have previously been applied successfully to support the implementation of bonding concepts for the development of high-efficiency solar cells [3].

 

Here, we investigate cross-sectional specimens of GaInAs/GaSb and GaInP/GaSb bond interfaces in wafer-bonded multi-junction solar cells, in order to obtain an improved understanding of their interface structures and thermal stability, by combining aberration-corrected high-resolution TEM (HRTEM), high-angle annular dark-field scanning TEM (HAADF STEM), energy-dispersive X-ray spectroscopy (EDXS) in the STEM and in situ TEM heating experiments.

 

Figures 1a-e shows results obtained from the GaInP/GaSb bond interface. Fig.1a shows the interface at low magnification. Figure 1b shows an HRTEM image, which reveals an amorphous interface layer (~1 nm thick). Figure 1c shows an atomic resolution HAADF STEM image of the bond interface structure and a digital diffractogram (inset), revealing a nearly perfect structural orientation relationship between the two crystalline layers. When correctly positioned with respect to the HAADF image, elemental maps extracted from EDXS spectrum images (Figs 1d and 1e) reveal that a high level of Ga is present at the interface. The Ga can be attributed to the pre-treatment procedure and bonding conditions. I  situ thermal treatment of this interface results in pronounced interdiffusion for temperatures above 225°C (not shown here).

 

Figures 2a-c show the GaInAs/GaSb bond interface, which is decorated by pores and cavities that extend along the interface by more than 10 nm. As a result of the use of misoriented wafers for bonding, the crystal lattices are rotated with respect to each other by a few degrees (Figs 2b and 2c).

 

Our results confirm that the advanced imaging and spectroscopic methods of aberration-corrected (S)TEM are advantageous for characterizing the morphology, elemental distribution and structure of layers and bond interfaces for the monitoring, control and optimization of different concepts used for fabricating high-efficiency solar cells. Out results are also of interest for assessing electrical conductivity phenomena at these interfaces.

 

1. F. Dimroth et al., IEEE Journal of Photovoltaics, 6, 343 (2016).

2. E. Stephanie et al., J. Appl. Phys. 113, 203512 (2013).

3. D. Häussler et al., Ultramicroscopy, 134, 55 (2013).

 


András KOVÁCS (Juelich, Germany), Martial DUCHAMP, Felix PREDAN, Frank DIMROTH, Rafal DUNIN-BORKOWSKI, Wolfgang JÄGER
08:00 - 18:15 #6076 - MS05-788 Analysis of nanoscale band gap fluctuations in Cu(In,Ga)Se2 solar cells by VEELS.
MS05-788 Analysis of nanoscale band gap fluctuations in Cu(In,Ga)Se2 solar cells by VEELS.

Thin film solar cells based on CuInGaSe2 (CIGS) absorber layers have demonstrated conversion efficiencies of more than 22% and they manifest a promising potential for the development of highly efficient, flexible and low-cost solar cells [1]. However, even though such high efficiencies are reached, still many fundamental properties that govern the performance are not yet clearly understood. The interfacial regions of the thin film layer stack and also the bulk of the polycrystalline CIGS absorber layer contain a high variety of structural and chemical inhomogeneities which consequently affect the electronic properties of the photovoltaic device in various ways. In order to push the achievable efficiency in a targeted way further towards the theoretical limit, a better understanding of local electronic loss mechanisms related to compositional inhomogeneities is needed. Tools that allow for characterizing the electronic properties in CIGS in the nanometer range are therefore sought.

Valence electron energy loss spectroscopy (VEELS) provides access to electro-optical properties down to the nanometer scale which makes it a very promising technique for local electronic characterization of CIGS solar cells. Besides others, information about the band structure and in particular about the local band gap energy may be extracted from VEEL spectra. However, various artifacts may influence the measured VEEL spectra which complicates the data interpretation and requires careful consideration of the results. In case of CIGS, the average band gap energy is rather small, i.e. 1.1-1.4 eV for typically used CIGS compositions, which pushes the required energy resolution towards the achievable limits of state-of-the-art electron sources [2].

Within this work, the applicability of VEELS for probing local band gap fluctuations in CIGS is comprehensively assessed. Based on the results obtained on different microscopes we discuss the achievable precision and accuracy in correlation with the performance of the respective instrument as shown in Figure 1. This analysis suggests that a monochromator is required to reliably identify the small band gap variations in CIGS. Finally, we use a microscope equipped with a second generation monochromator to study the electronic properties in CIGS solar cells at specific sites such as grain boundaries and interfaces.

 

[1] K. Maraun, 2015. Solar Frontier Achieves World Record Thin-Film Solar Cell Efficiency: 22.3%, http://www.solar-frontier.com/eng/news/2015/C051171.html (accessed 12.15.15).

[2] D. Keller et al., Local Band Gap Measurements by VEELS of Thin Film Solar Cells. Microsc. Microanal. 20, 1246–1253 (2014). 


Debora KELLER (Duebendorf, Switzerland), Stephan BUECHELER, Patrick REINHARD, Fabian PIANEZZI, Marta D. ROSSELL, Darius POHL, Alexander SURREY, Bernd RELLINGHAUS, Fredrik HAGE, Quentin RAMASSE, Rolf ERNI, Ayodhya N. TIWARI
08:00 - 18:15 #6095 - MS05-790 Microstructural evolution of 9Cr-ODS steel during high temperature deformation.
MS05-790 Microstructural evolution of 9Cr-ODS steel during high temperature deformation.

Scanning and transmission electron microscopy (TEM) was applied to study the structure of oxide dispersion strengthened (ODS) martensitic 9Cr steel before and after mechanical deformation at elevated temperatures. The tensile tests were performed in the temperature range of 25°C to 800°C at a nominal strain rate of 10-3 s-1. High angle annular dark field (HAADF) scanning TEM (STEM) with energy-dispersive X-ray (EDX) spectroscopy for the determination of the composition and conventional TEM with selected area diffraction for the crystallographic investigations were applied.

Figure 1 shows an overview HAADF STEM image (a) with corresponded schematic (b) of the investigated steel in tempered conditions. Owning to the composition and heat treatments, the structure of the steel typically consists of tempered martensite with a high density of hierarchically organized internal interfaces. During quench, the prior austenite grains are sub-structured by martensitic laths and packets. This transformation causes a large local deformation of the matrix, resulting in a high dislocation density.

The following tempering process allows the recovery of the martensitic structure with transformation into a ferritic structure, precipitation of solute atoms and recovery of the dislocation cell structure into subgrain structure. Therefore, the final microstructure consists of some portions that are composed of typical laths (with several µm in length and 0.25 ± 0.06 µm in width) and others portions that are filled with subgrains (with size of 0.29 ± 0.13 µm). The non-regular shaped M23C6 carbides precipitate are arranged preferentially at prior austenite grain boundaries, packet and lath boundaries. HRTEM analysis of M23C6 (here not shown) reveals that many carbides have fcc structure. The relation between the carbide and ferrite is: M23C6 || Fe. The detail EDX analysis shows that carbide consist of Fe and Cr. The fine ODS particles are mostly revealed inside the boundaries of laths and subgrains, yet on them as well. Figure 2 shows HAADF STEM image of the ODS particle (a) with linescan EDX profiles across the particle (b). The detail EDX analysis of many ODS particles shows that they have composition of Y2Ti2-xO7-2x.

For investigation on the deformed state, TEM samples were prepared from the gauge section region near the fracture surface of the tempered martensitic state specimens. At room temperature, the deformed microstructure shows similar characteristics as those typically observed for an as-received state, but the dislocations are mostly pinned to the ODS particles. At elevated temperatures, structural evolution becomes prominent with the large decrease in dislocation density and the appearance of polygonal subgrains that replace the original lath structure. In addition, coarsening of M23C6 carbides was observed with increase of testing temperatures. Figure 3 presents TEM bright-field (a) and (110) dark-field (b) images from the same place of sample obtained after the tensile test at 800°C. The equiaxed α-Fe has high dislocation density at the grain boundaries (area 1) and dislocations that are pinned to the ODS particles at various locations (marked by arrows). The partially illuminated grain in Figure 3b confirms the presence of low-angle grain boundary LGB that appears to be undergoing recovery process.


Dimitri LITVINOV (Eggenstein-Leopoldshafen, Germany), Ankur CHAUCHAN, Jarir AKTAA
08:00 - 18:15 #6103 - MS05-792 EFTEM measurements of the sp2/sp3 ratio on SiC/SiC pyrolytic carbon interphases before and after irradiation.
MS05-792 EFTEM measurements of the sp2/sp3 ratio on SiC/SiC pyrolytic carbon interphases before and after irradiation.

We investigated the behaviour of a specific component of silicon carbide based ceramic matrix composites (SiC/SiC) under irradiation, namely the pyrolytic carbon (PyC) interphase linking the matrix and fibres together. SiC/SiC is studied for its potential as a new nuclear fuel cladding to replace the zirconium based alloys currently used. The hybridization of the carbon atoms found in this interface layer is studied using energy filtered TEM (EFTEM) to determine the ratio between sp2 and sp3 bonding states (R-ratio), before and after irradiation with ions and neutrons. Indeed, the initial state of the interphase is graphite-like PyC, in which the electrons occupy the π bonding states of the sp2 orbitals. The ratio between the π and σ occupied levels is different in each carbon allotropes, be it amorphous, graphite or diamond. Radiation damage is known to amorphise and open micro-cracks in nuclear graphite [1], [2]. In cases where the graphitic interphase would become completely amorphous, both the mechanical and thermal properties of the composite would be impacted.

In this work, TEM lamellae prepared from both pristine and neutron irradiated SiC/SiC have been examined. These samples are extracted from actual prototype cladding sections produced by General Atomics. In addition to this, the samples prepared from pristine material have been subsequently irradiated at the in-situ TEM JANNuS facility in Orsay, France [3]. Using the unique capabilities of this apparatus, self-ion irradiations with both Si+ and C+ were performed. Damage levels approaching one displacement per atom (dpa) were reached whilst observing the effects of said ions at the same time with a TECNAI G2 20 Twin TEM. The EFTEM measurements were carried out at EPFL, Lausanne, using a Schottky FEG JEOL 2200FS with an in-column omega filter. All of these measurements were carried out as close as technically possible to magic angle conditions [4]. The ratio between the peaks corresponding to the π* and σ* anti-bonding states can be quantified with different techniques, two of which are used in the present work: the two window (TWM) [5], whereby the absorption spectrum is numerically integrated over two energy ranges or windows are centered on the aforementioned peaks and spectrum fitting using Gaussian functions [6] is also used to ensure the robustness of the measurement.

The maps displayed in Figure 1 and 2 show an overall decrease of the R-ratio after irradiation of the samples, meaning that even sub-dpa damage levels are already inducing an amorphisation of the PyC interlayer. Additionally, the overall layer is homogeneously amorphised, as further shown with the histograms displayed in Figure 3.

The authors would like to thank Westinghouse and General Atomics for providing the prototype cladding tubes within the CARAT research program as well as JANNuS-Orsay part of the CSNSM, Orsay, France which is part of the EMIR French accelerators network, where the in-situ experiments were carried out.

References:

[1]     K. Wen, J. Marrow, et B. Marsden, « Microcracks in nuclear graphite and highly oriented pyrolytic graphite (HOPG) », J. Nucl. Mater., vol. 381, no 1‑2, p. 199‑203, oct. 2008.

[2]     W. Bollmann et G. R. Hennig, « Electron microscope observations of irradiated graphite single crystals », Carbon, vol. 1, no 4, p. 525‑533, juillet 1964.

[3]     M-O. Ruault, J-F. Dars, P. Stroppa/CEA, A.Gonin/CEA, « Plate-forme de multi-irradiation JANNuS Jumelage d’Accélérateurs pour les Nanosciences, le Nucléaire et la Simulation ». .

[4]     C. Hébert, P. Schattschneider, H. Franco, et B. Jouffrey, « ELNES at magic angle conditions », Ultramicroscopy, vol. 106, no 11‑12, p. 1139‑1143, oct. 2006.

[5]     J. Bruley, D. B. Williams, J. J. Cuomo, et D. P. Pappas, « Quantitative near-edge structure analysis of diamond-like carbon in the electron microscope using a two-window method », J. Microsc., vol. 180, no 1, p. 22‑32, oct. 1995.

[6]     Z. Zhang, R. Brydson, Z. Aslam, S. Reddy, A. Brown, A. Westwood, et B. Rand, « Investigating the structure of non-graphitising carbons using electron energy loss spectroscopy in the transmission electron microscope », Carbon, vol. 49, no 15, p. 5049‑5063, décembre 2011.


Loïc FAVE (Villigen PSI, Switzerland), Cécile HÉBERT, Manuel Alexandre POUCHON
08:00 - 18:15 #6124 - MS05-794 FIB-tomography of graphite anode particles for lithium ion batteries.
MS05-794 FIB-tomography of graphite anode particles for lithium ion batteries.

Graphite as anode material in lithium ion batteries (LIB) dominates with a share of 90%, whereby this share is divided in 55% for natural graphite and 45% for synthetic graphite. Before these material are used in a LIB, a spherodization process in a particle design mill is performed. This process is fully mechanical, using impact and shear forces. The raw material turned into the spherical graphite consists of comparably big flakes with diameters to about 300µm.

The motivation for the spherodization of the graphite flakes lies in the improvement of their performance for LIBs. Lithium ions intercalate into the anode material while charging the battery, but the ions penetrate the graphite through crystal defects. Is the anode made out of graphite flakes, intercalation only happens from the sides of the flakes where the crystal lattice is broken, ions cannot intercalate from the top. Spherodization breaks the crystal lattice and offers therefore many openings for intercalation. Furthermore, the spherodization helps to face the solid electrolyte interface (SEI) problem. The SEI forms in the first cyclization of a LIB and is a chemical reaction with the electrolyte and the anode material, its thickness is just a few nanometres. This process binds lithium ions which are therefore no longer available and the capacity of the LIB decreases. Spheroids have the best volume-to- surface ratio and therefore are helping to minimize the capacity decrease.

Due to this mechanical shaping process, about 50% of the initially introduced raw material will not be spherodized. The grade of the spherodization is controllable via the rotational speed of the mill, whereby a higher speed means higher mechanical forces as described above.

Fig. 1 shows the result of FIB investigations on natural graphite material regarding the porous nature of the particles. FIB cross sectioning revealed that the spherodization process is rather a folding of the raw graphite flakes (see Fig. 2). The arising pores are therefore of elongated shape. For the spherodized synthetic graphite almost no porosity was observed by cross sectioning in comparison to the sperodized natural graphite. To learn more about the porous properties of the spherical graphite, FIB-tomography was utilized. It was observed that the graphite spheres included two different types of pores. A “classical” pore type isolated to the outside named “closed pores”, and pores with a connection to the surface of the particle named “open pores”. With FIB-tomography the volume fractions of both porosities were determined following the relation Φ=VP/V, where Φ is the porosity, VP the volume of the pore (open or closed or the combined pore volume) and V the volume of the particle consisting of the graphite and the complete (open plus closed) pore volumes. The FIB-tomogram analyses were carried out both for commercial spherical graphite samples (Fig. 3) as well as for spherical graphite samples prepared by the authors (Fig. 4). The results for the various samples are compared and discussed.

 

Acknowledgement:

We thank the German Federal Ministry of Education and Research (BMBF) for financial support (Project: Li-EcoSafe, contract no. 03X4636).


Manuel MUNDSZINGER (Ulm, Germany), Manfred RAPP, Ute GOLLA-SCHINDLER, Mario WACHTLER, Ute KAISER
08:00 - 18:15 #6133 - MS05-796 Application of photoconductivity effect in BaTiO3/TiO2 hybrid heterostructure for solar cells.
MS05-796 Application of photoconductivity effect in BaTiO3/TiO2 hybrid heterostructure for solar cells.

TiO2 is known as material with excellent chemical and photochemical stability. It exists in three different crystalline phases: anatase, rutile  and brookite. It was found that anatase is photocatalytically more active than rutile due to its large surface area. This activity depends not only on the phase of TiO2 but also on the crystallite size and porosity. One of the most applied synthesis is electrochemical eteching of titanium foil to obtained thin TiO2 nanotubes array. The morphology parameters, e.g., nanotube length, diameter, smoothness, depend on the anodization conditions, such as voltage, electrolyte composition, temperature, and duration. After anodization, the amorphous nanotubes can be annealed to increase the electron mobility, sensitized with dyes or polymers to increase solar photon absorption, and doped or surface-functionalized to adjust the density of states. Because of these properties the titania nanostructures can be used for photo-catalysis, in solar cells (DSSC) and sensors. On the other hand BaTiO3 is a well known and widely investigated dielectric material. Barium titanate is also used for electronic devices in technological ceramic industry because of its ferroelectric, thermoelectric and piezoelectric properties when it assumes the tetragonal structure. As such it have application in production of capacitors, positive temperature coefficient resistors, dynamic random access memories, electro mechanics and nonlinear optics. In this research we will study effect on optical and electrical properties of hydrothermal growth of BaTiO3 nanoparticles at the surface of TiO2 nanotubes obtained by electrochemical etching of titanium foil and titanium film deposited on FTO glass. Due to ferroelectric effect of BaTiO3 we believed the charge separation in this type of heterostructure will be improved compared to pristine TiO2 nanotubes. The nanotubes will be synthesized by electrochemical oxidation of Ti-foil. The parameters of the TiO2 nanotubes will be finely tuned together with the size of BaTiO3 nanoparticle, with the aim to obtained highest photoconductivity effects and allowing the optimization of device fabrication for different types of solar cells hybrid solar cells. Preliminary results show that TiO2 nanotubes have diameter around 80 nm and grown BaTiO3 nanoparticles 30–50 nm (Fig. 1 and 2). AFM measurements confirmed the size of BaTiO3 nanoparticles and local measurements of piezoelectric effect shown that in ours system exists preferred polarization in the direction of applied external electrical field. This study will be performed with the aim to optimize the dimensions of TiO2 and BaTiO3 nanoparticles to increase the efficiency of solar cells. For the structural characterization of all the titanate nanostructures we will used conventional and analytical transmission electron microscopy (TEM) techniques, scanning electron microscopy (SEM), XRD and Raman spectroscopy, Impedance spectroscopy, SPM microscopy and UV-Vis spectroscopy.

Acknowledgments

Center of Excellence for Advanced Materials and Sensing Devices, Croatian Science Foundation (hrzz) and European Social Fond (ESF) for the financial support of this research.

 


Milivoj PLODINEC (Zagreb, Croatia), Iva ŠRUT-RAKIĆ, Andreja GAJOVIĆ, Ana ŠANTIĆ, Marc-Georg WILLINGER
08:00 - 18:15 #6134 - MS05-798 FIB-SEM tomography imaging and 3D structure quantification of supported metal catalysts with bi- and tri-modal meso-macroporosity.
MS05-798 FIB-SEM tomography imaging and 3D structure quantification of supported metal catalysts with bi- and tri-modal meso-macroporosity.

Materials with hierarchical porosities extending over several length scales, from the nanometer to the macrometer range, attract great attention as solid catalysis. They offer possibilities to enhance the rate of diffusional access of reactants to, and products from, the catalyst active sites. Even though several methodologies based on e.g. soft- and hard-templating, or spontaneous assembly, have been demonstrated to synthesize meso-macroporous catalysts [1], their structure is typically assessed on a qualitative basis and not much is known about how to deliberately control key structural features of their different porosity levels such as modality, pore size or spatial interconnectivity. Here we have applied FIB-SEM tomography, coupled to quantitative 3D image analysis, to visualize and quantify the internal architecture of high-surface area, multi-modal meso-macroporous RuCo/γ-Al2O3 catalysts, which are highly interesting in the production of synthetic liquid fuels from natural gas.[2] The spatial resolution offered by FIB-SEM tomography is particularly suitable to image macroporous networks, with pores ranging from 50 nm to several micrometer in size.

 Different series of gamma-Al2O3 support materials, displaying either highly interconnected, channel-like or mostly isolated, globule-like macroporous networks, and essentially identical specific surface areas and mesoporities, were synthesized via soft- and hard-templating from nanosized boehmite precursors. Next, highly dispersed RuCo nanoparticles (10-15 nm) were incorporated by incipient wetness impregnation with nitrate precursors in solution to obtain the supported catalysts. The overall texture (specific surface area, pore volume, mesopore size distribution) of the materials was assessed by means of N2 adsorption and Hg intrusion porosimetries. Volumes of ca. 400 µm2 of resin-embedded catalyst particles (400-600 µm) were imaged using a ETD(SE) detector (2kV, 0.17 nA) and Ar-FIB milling (30 kV, 21 nA) in a Helios Nanolab dual-beam microscope (FEI).

 3D reconstruction of the tomograms allowed a precise visualization of the internal macropore networks in the catalysts, overcoming limitations of alternative intrusion porosimetry methods which probe exclusively unconstrained macropores connected to the outer surface of the particles. Access to the internal structure of the materials made it possible to identify composition ranges for the synthesis gels suitable to prepare catalyst materials with either bi-modal meso-macroporous or tri-modal meso-macro-macroporous structures. In addition, several structural parameters of relevance for molecular diffusion could be quantified by image analysis after tomogram segmentation (Figure 1). The skeleton of the macropore system was computed through a morphology-preserving thinning algorithm. Macropore connectivities were quantified using an algorithm based on the Euler characteristic of the corresponding set of voxels, while a local trabecular thickness algorithm was applied on the set of voxels corresponding to the mesoporous Al2O3 phase to quantify the diffusion distances for primary reaction products through the mesoporous network towards the connected macropores.[3]

 Our imaging and structure quantification approach guided the synthesis of catalysts with similar macropore volumes and mesopore diffusion distances albeit notably different macropore connectivities (Figure 2), enabling a systematic investigation of the relative significance of these parameters for the catalytic performance under industrially relevant reaction conditions.

References:

[1] C.M.A. Parlett, et al., Chem. Soc. Rev. 42 (2013) 3876.

[2] A.Y. Khodakov, et al. Chem. Rev. 107 (2007) 1692.

[3] M. Doube, et al. Bone 47 (2010) 1076.


Nicolas DUYCKAERTS, Mathias BARTSCH, Axel LORKE, Ferdi SCHÜTH, Gonzalo PRIETO (Mülheim an der Ruhr, Germany)
08:00 - 18:15 #6147 - MS05-800 Calcination of pd nanocatalysts on alumina: ex-situ analysis versus in-situ environmental TEM.
MS05-800 Calcination of pd nanocatalysts on alumina: ex-situ analysis versus in-situ environmental TEM.

      

 

                                                                      

Sustainable chemistry, reduction of pollution, greenhouse gases control, oil refinery, liquid and solid waste management, are essential societal topics related to what is called Environmental catalysis [1], a sector which is booming rapidly for the past 10 years. So, developing innovative catalysts is a very important aspect ahead of us. To develop more advanced catalysts, we have to understand the catalysts genesis in all the stages of preparation (impregnation, drying, calcination and reduction of the active phase). Nowadays Environmental Transmission Electron Microscopy (ETEM) enables dynamic studies of the catalysts down to the nanometer and even atomic scale., at high temperatures and under gaseous environment.

               This contribution deals with the dynamic evolution of palladium nanoparticles (NP) supported on alumina during the catalyst preparation process. Here, the calcination step is studied in a FEI TITAN-ETEM microscope operated at 300 kV. A Pd/delta alumina catalyst was investigated at different temperatures and under different gas pressures in order to follow the particles size evolution. Owing to the small size of the Pd NPs in the range of 1-3 nm, we mainly used the STEM-ADF imaging mode. Preliminary observations during heating under high vacuum up to 600°C show that particles as well as the supporting media remain stable and apparently not damaged by the electron beam under nominal and atomic resolution imaging STEM conditions (see Fig. 1). Some EELS (Electron Energy-Loss Spectroscopy, Gatan Imaging Filter Tridiem Ers) analysis was performed in situ in order to ascertain the chemical nature of the observed particles. During this work it appeared essential to perform measurements systematically on the same areas at different temperatures. Fig. 2 is a typically illustration of the in situ evolution of palladium particles under oxygen partial pressure at different temperatures. From such micrographs, the NP size evolution was quantified and compared with post-mortem TEM observations after ex-situ experiments performed at same temperatures but atmospheric pressure in the course of the catalyst synthesis (Fig. 3).

This comparison shows that all measurements appear to be consistent except those performed in the bright field TEM imaging mode, where larger particles sizes are obtained, most probably due to irradiation effects which were further evidenced by a high-induced mobility of NPs on their supporting media. This ETEM study brings direct in situ information on the transient stages that cannot be followed by post mortem experiments after ex-situ treatments; in particular, we will also discuss about the crystallographic evolution of the Pd NPs during the calcination process [2,3].

 

 

[1] G. Centi, P. Ciambelli, S. Perathoner, and P. Russo, “Environmental catalysis: trends and outlook,” Catalysis Today, vol. 75, no. 1-4, pp. 3-15, July 2002.

[2] The CLYM (Consortium Lyon - St-Etienne de Microscopie, www.clym.fr) is acknowledged for its guidance in the ETEM project which was financially supported by the CNRS, the Région Rhône-Alpes, the ‘GrandLyon’ and the French Ministry of Research and Higher Education.

[3] thanks are due to DENS solutions for allowing experiments with the Wildfire MEMS-based heating holder.

 

 


Siddardha KONETI (VILLEURBANNE CEDEX), Lucian ROIBAN, Thierry EPICIER, Anne-Sophie GAY, Priscilla AVENIER, Amandine CABIAC, Florent DALMAS
08:00 - 18:15 #6173 - MS05-802 High resolution EDS study of Ba2Y1+xNb1-xO6-δ sintered compounds.
MS05-802 High resolution EDS study of Ba2Y1+xNb1-xO6-δ sintered compounds.

We present here the study of Ba2Y1+xNb1-xO6-δ (x = 0, 0.05, 0.1, 0.15, 0.2) compounds with potential application as ion-conducting materials in Solid Oxide Fuel Cells and/or Proton Conducting Fuel Cells. Yttrium is used here as an acceptor-doping element in substitution to niobium to create oxygen vacancies by charge compensation. Nanopowders have been prepared by a freeze-drying route and dense ceramics were obtained after shaping and treatment at high temperature. X-ray diffraction analysis shows that single phase compounds are obtained for x values equal or below 0.2. Transport properties indicate that, in spite of a significant concentration of oxygen vacancies, the ion conductivity remains low in oxidative atmosphere. A higher conductivity is observed in humidified hydrogen showing that the material gets partially reduced in such conditions.

High resolution STEM images and EDS chemical mapping show very well order of Y and Nb in Ba2YNbO6 compound (x = 0), however when x = 0.1 a pronounced cationic exchange is observed between Y and Nb (Figure 1). Based on these results and Molecular Dynamics calculations, we noticed that the Y on Nb site induce an oxygen vacancies created by Yttrium doping. When the doping level is low, a long range diffusion would suppose that oxygen vacancies also locate close to Niobium atoms which does not seem to be possible in this material. Thus, the only way for oxygen vacancies to participate to long range ion diffusion is to percolate from a site close to a Y dopant to another site close to a Y dopant.

These results were presented at an international conference EMRS Warsaw (2015) and gave rise to a publication that is being prepared.

 

Acknowledgments:

This work has benefited from the financial support of the LabeX LaSIPS (ANR-10-LABX-0040-LaSIPS) managed by the French National Research Agency under the "Investissements d'avenir" program (n°ANR-11-IDEX-0003-02). We acknowledge the French National Research Agency (MATMECA Equipex project) for microscope financial support.

 


Mohamed BEN HASSINE (Antony), Anastasia IAKOVLEVA, Paul HAGHI ASHTIANI, Guilhem DEZANNEAU
08:00 - 18:15 #6182 - MS05-804 Investigation of pristine Li1.2Ni0.13Mn0.56Co0.13O2 by advanced TEM.
MS05-804 Investigation of pristine Li1.2Ni0.13Mn0.56Co0.13O2 by advanced TEM.

Layered Li-transition metal (TM) oxides are very promising materials for new Li ion battery cathodes. Compounds with an increased content of Li and Mn are particularly interesting because they exhibit a high capacity of 200-300 mAhg‑1 even after an initial drop in capacity during the first charging cycle.[1] The structure of such compounds and their capacity degradation over multiple cycles is not fully understood due to the complexity of the crystallographic phases, the ambiguities in the diffraction data and the presence of additional phases.

The investigated compound Li1.2Ni0.13Mn0.56Co0.13O2 is derived from LiNi0.33Mn0.33Co0.33O2, (NMC). Due to the higher capacity of the Li-rich compound, it will be referred to as high energy NMC (HENMC).[2] The chemical formula of HENMC can be rewritten as Li2MnO3 · LiNi0.33Mn0.33Co0.33O2 which implies that this compound is a mixture of trigonal NMC and monoclinic Li2MnO3. In NMC, there are two different cation layers which are exclusively occupied by Li and TM respectively. In Li2MnO3 one third of the TM sites are occupied by Li. HENMC must be either a phase mixture with distinct domains of the two oxides or a solid solution of the two, with “Li rich” positions in the TM layers and an overall reduced, monoclinic symmetry (Figure 1).[3] The exact nature of HENMC and similar materials is crucial to understand the de‑lithiation processes during charging cycles.

The layered structure and its relation to other phases was investigated with a combination of electron diffraction in bright-field and scanning modes with high resolution transmission electron microscopy (HRTEM) and high-angle annular dark-field scanning TEM (HAADF-STEM) imaging. Due to the high structural similarity of NMC and Li2MnO3, all lattice distances which can be found for NMC can also be found for Li2MnO3; as seen in the respective electron diffraction patterns (Figure 2). HAADF-STEM imaging reveals the presence of Li-rich positions in the TM layers as indicated by a lower intensity of the related atom columns (Figure 3). Due to the stacking faults of the TM layers, the interpretation of contrast in any other orientation becomes by far less intuitive as we will demonstrate. A LiTM2O4 spinel phase is found on the surface quite frequently. Its relation to the bulk phase was derived from high resolution images. STEM-EELS revealed the presence of surface reduction due to oxygen depletion in HENMC.

This work thus provides structural information about the synthesized material in its pristine state to facilitate understanding the changes the material undergoes during the (de‑)lithiation segments  of electrochemical cycling. Further investigations on such effects are currently being carried out and will be discussed.

 

[1] B. L. Ellis, K. T. Lee, L. F. Nazar, Chem. Mater. 2010, 22, 691-714.

[2] C. S. Johnson, N. Li, C. Lefief, J. T. Vaughey, M. M. Thackeray, Chem. Mater. 2008, 20, 6095-6106.

[3] H. Yu, H. Zhou, J. Phys. Chem. Lett. 2013, 4, 1268−1280.


Christian WIKTOR (Hamilton, Canada), Hanshuo LIU, Meng JIANG, Yan WU, Xingyi Yang YANG, Gianluigi A. BOTTON
08:00 - 18:15 #6227 - MS05-806 The corrosion of Zr(Fe,Cr)2 Secondary Phase Particles within Zircaloy-4 under Simulated Nuclear Reactor Conditions.
MS05-806 The corrosion of Zr(Fe,Cr)2 Secondary Phase Particles within Zircaloy-4 under Simulated Nuclear Reactor Conditions.

Using Scanning Transmission Electron Microscopy (STEM) coupled with Dual Electron Energy Loss Spectroscopy (DualEELS), the corrosion and incorporation of Secondary Phase Particles (SPPs) into the oxide layer of Zircaloy-4 material has been investigated.

Primarily, this work has focussed on studying Zr(Fe,Cr)2 particles, and tracking their changes in morphology as they undergo oxidation.

It has been seen that these precipitates typically present themselves as very faceted structures within the α-Zr metal matrix, and exhibit the hexagonal Laves phase structure. At this point, the body of the SPP tends to contain more Cr than Fe, however, Fe is often seen to segregate to the outside rim of the particle, and occasionally also to sit preferentially in regions within the body of the particle, resulting in Fe enriched areas, as can be seen in Figure 1.

Upon oxidation of the SPP, an out-of-plane expansion is seen to occur due to the volume expansion on the formation of the oxide, often resulting in particles that are quite elliptical in cross section with the major axis in the out-of-plane direction, as depicted in Figure 2.  It can be seen that the elemental distribution does not remain homogeneous, as in the original SPP, and, at this point, three principal phases have been identified in the oxidised SPPs. The first thing to oxidise (i.e. the cap of the precipitate) is very Cr-rich and is probably mainly Cr2O3 with some Fe substitution – this must consume a reasonable proportion of the Cr in the SPP. Subsequently, the main body of the particle itself is found to oxidise to a Zr, Cr oxide with an approximate 3:2 ratio of Zr:Cr, and very little Fe content.  The result of the formation of this majority phase and the rejection of the Fe is the precipitation of veins of Fe-rich material.  Early in the process, this Fe remains at least partially metallic. Even when the SPP is well encapsulated in the oxide scale, Fe-rich veins have been observed to be very low in oxygen.

This nanoanalytical approach reveals the true complexity of the oxidation of these intermetallic compounds, and, understanding how these precipitates corrode in simulated nuclear reactor conditions prior to service is crucial in analysing how the addition of these alloying elements affects the macroscopic properties of the material to corrosion.

Acknowledgements

KJA is grateful to the EPSRC and AMEC Foster Wheeler for the provision of PhD studentship.


Ian MACLAREN (Glasgow, United Kingdom), Kirsty J. ANNAND, Mhairi GASS
08:00 - 18:15 #6234 - MS05-808 Interfacial properties of ceria films on yttria-stabilized zirconia.
MS05-808 Interfacial properties of ceria films on yttria-stabilized zirconia.

Ceria (CeO2) and yttria-stabilized zirconia (YSZ) are two promissing electrolyte materials used in solid oxide fuel cells due to their high ionic conductivities. Theory predicts that the formation energy of oxygen vacancies is decreased at free surfaces and internal interfaces. Oxygen vacancies are expected to segregate at interfaces and thus might provide an easy path for rapid ion conduction.1 Aims of the present work are: (i) to obtain insights into the structure and chemistry of interfaces between ceria films and YSZ substrates, and (ii) quantitative assessments of ceria/zirconia intermixing and oxidation state of Ce at interfaces. Analytical scanning transmission electron microscopy (STEM) is the method of choice for a comprehensive materials characterization in terms of structure and chemistry down to atomic levels.2 In the present study high-resolution electron spectroscopic imaging was performed in an advanced TEM/STEM system (JEOL JEM-ARM200CF) equipped with a cold field-emission gun, a probe Cs-corrector (DCOR, CEOS/Heidelberg), and X-ray and electron spectrometer attachments (JEOL Centurio SDD; GATAN GIF Quantum ERS). Electron energy-loss spectroscopy (EELS) in STEM enables to probe the local oxidation state of Ce ions in interface regions by utilizing valence sensitive features in the energy-loss near-edge fine structures of Ce-M4,5 edges.

Continuous epitaxial films of pure and 10 mol% Gd doped ceria were grown by pulsed laser deposition on (111) YSZ substrates (Fig. 1a). The film-substrate lattice mismatch is accommodated by misfit dislocations (extra atomic planes in the YSZ substrate).3 Atomic column-resolved EEL spectroscopic images (ESI) were acquired in selected regions of interest (ROI) across ceria-YSZ interfaces. ESI enables the visualization of Ce4+àCe3+ reduction in narrow interface regions using multiple linear least-square (MLLS) fitting methods (Fig. 1c). ESI setup parameters: ROI 134x39 pixels, pixel size 0.051nm, dwell time 0.02 s/pixel, probe current 140 pA, camera length 15 mm, collection angle 110 mrad, energy resolution 0.5 eV, total acquisition time 108 s. Chemical and valence changes across interfaces were quantitatively assessed by EELS line scans (Figs. 2,3) with acquisition parameters: probe size 0.1 nm, probe current 140 pA, convergence angle 28 mrad, collection angle 110 mrad, number of measured points 160, step width 45 pm, range 7 nm, dwell 1 s/pixel, acquisition time 163 s. Parallel recording of EELS and HAADF signals in STEM-EELS enables a precise correlation of EELS spectra and structural features at atomic levels regardless of eventual sample drift. Thus, atomically resolved EEL spectra were extracted column-by-column from line scans (integration windows 0.25 nm) and quantitatively evaluated for each individual (111) atom plane crossed by the line scan. The Ce-M5/M4 intensity ratios were measured by the second derivative method3 (Fig. 3a), from which the fraction of Ce3+ can be deduced (ratios of 0.95 and 1.26 correspond to Ce4+ and Ce3+ in CeO2 and CePO4 reference materials, respectively)3. Chemical profiles indicate a Ce/Zr intermixing zone extending over seven (111) lattice planes (Fig.3b).

No noticeable differences were observed between pure and Gd doped ceria films. In both doped and non-doped ceria films, Ce4+ is gradually reduced in a region of 7 to 9 (111) lattice planes wide with a maximum fraction of 0.9 to 1.0 for Ce3+ in a single atomic layer at the interface (Fig. 3a).  Assuming charge balance, the presence of Ce3+ ions is seen as evidence of oxygen vacancy formation in narrow interface regions.

In summary, it is concluded that advanced analytical TEM/STEM methods enable the elucidation of local non-stoichiometry, which is crucial not only for understanding charge transport mechanisms in these hetero-structured materials, but also for understanding the catalytic properties of ceria.3,4

References

  1. M. Fronzi et al.: Phys. Rev. B 86 (2012) 085407
  2. H. Schmid, E. Okunishi and W. Mader: Ultramicroscopy 127 (2013) 76
  3. K. Song et al.: APL Materials 2 (2014) 032104
  4. KS and PvA acknowledge funding from the PhD student exchange program between the Max Planck Society and the Chinese Academy of Sciences and the Natural Sciences Foundation of China (Grant No. 51221264). The research leading to these results has received funding from the European Union Seventh Framework Program [FP/2007-2013] under grant agreement no 312483 (ESTEEM2).

 


Herbert SCHMID, Kepeng SONG, Paolo LONGO, Elisa GILARDI, Giuliano GREGORI, Kui DU, Joachim MAIER, Peter VAN AKEN (Stuttgart, Germany)
08:00 - 18:15 #6253 - MS05-810 Effects and implications of photon reabsorption phenomena on confocal micro-photoluminescence measurements in crystalline Si.
MS05-810 Effects and implications of photon reabsorption phenomena on confocal micro-photoluminescence measurements in crystalline Si.

Confocal micro-photoluminescence (PL) spectroscopy has become during the last years one of the most important tools for carrying out novel studies of advanced solar cell concepts with micron resolution. This work presents a comprehensive study about the effect of photon reabsorption in confocal micro-PL spectroscopy measurements. First, supported by theoretical calculations, we study the dependence of reabsorption phenomena on the different setups and experimental parameters, i.e. excitation wavelength, pinhole aperture, numerical aperture (NA) of focusing lenses. Second, we analyze the effects of reabsorption on the emission line-shape of the resulting micro-PL spectra. Finally, in order to prove the importance and implications of this study, we present a current and relevant application, namely the estimation of doping densities in crystalline Si (c-Si) via micro-PL, where reabsorption processes must be taken into account to avoid the misinterpretation and misquantification of the obtained micro-PL data.

Figure 1(a) shows the normalized PL emission spectra calculated with our theoretical model (based on the generalized Plank's law) for photons spontaneously emitted at different X distances from the front surface (see inset diagram). The variation in the reabsorption level is evidenced by a decrease in the PL signal between 1000 and 1100 nm. This is correlated to the increase of Si absorption coefficient at lower wavelengths (see the black dashed curve). Figure 1(b) shows confocal micro-PL spectra recorded from a p-type c-Si wafer by changing the collection point distance from the front surface, i.e. 0 (on focus), 100 and 200 µm. The measured PL spectra of Figure 1(b) are qualitatively the same than the calculated spectra of Figure 1(a), proving the consistency of our theoretical model.

When the collection point is positioned at the surface (common conditions in micro-PL measurements), the reabsorption level is dependent on the selected experimental parameters, which define the extension of the collection volume, and hence, the available photon travelling distance. This is observed in Figure 2(a) for different NA values, and in Figure 2(b) for different pinhole apertures. The higher the confocality, the lower the reabsorption.

The effect of reabsorption on the PL spectra line-shape can have important implications in some type of applications. One of these examples is the estimation of doping densities in c-Si via micro-PL spectroscopy, where the band gap shift that takes place in heavily doped c-Si can be studied at room-temperature by monitoring the center of mass of the PL spectra. Figure 3 shows the study and quantification of doping densities in a laser-doped region (LDR) in c-Si. We present data for two lenses with different NA. A picture of the studied LDR is shown in Figure 3(a), and the change in the center of mass of the PL spectra recorded along the LDR is depicted in Figure 3(b). The large shift between the two curves is linked to a change in reabsorption level. As expected, the two curves are constant outside the LDR, but the center of mass increases remarkably inside the LDR, showing, apparently, an increase in doping density. By means of the calibration curves obtained from c-Si wafers with different doping densities (see Figure 3(c)), we can transform the center of mass profiles depicted in Figure 7(b) into the doping density profiles of the LDR under study (see Figure 7(d)). Now, the two curves show a very similar and reliable doping density profile across the LDR, reaching doping levels around 7x1019 cm-3 at the very center of the processed region. This example proves the importance of considering reabsorption effects in all those micro-PL studies that are based on the analysis of the PL spectra line-shape and position.

 

Acknowledgements

This work was supported by the project HERCULES that has received funding from the European Union's Seventh Programme for Research Technological Development and Demonstration under Grant agreement no. 608498.


Abel ROIGÉ (Gif-sur-Yvette), Alexandre JAFFRÉ, José ALVAREZ, Thibaut DESRUES, Delfina MUÑOZ, Isidro MARTÍN, Ramon ALCUBILLA, Jean-Paul KLEIDER
08:00 - 18:15 #6278 - MS05-812 Progress in analysing lithium ion battery materials in the SEM.
MS05-812 Progress in analysing lithium ion battery materials in the SEM.

New and existing materials for lithium ion batteries are being studied extensively with the aim of increasing their storage capacity and lifetime. While the SEM is an important tool in the study of these materials, progress is held back by lack of techniques for characterising the distribution of Li. Detection of Li-K X-rays from metallic Li with a special windowless EDS detector was first shown by Burgess et al. [1] and using a flat-field holographic grating WDS by Terauchi et al. [2] and of Li compounds by Hovington et al. [3]. Here we show the current progress in characterising Li-ion battery materials with EDS by exploring how lithiation can be studied on graphite anodes with a windowless detector and on lithium containing ceramics using a conventional detector.

 

Graphite anodes were measured using a 100 mm2 windowless EDS detector X-Max Extreme. After charging, the graphite particles contain intercalated lithium between graphene layers. Lithium compounds also form on the surface as solid-electrolyte interphase (SEI) and lithium dendrites after charge-discharge cycles. On some particles no Li signal was detected, whilst EDS spectra from others showed a significant Li peak. Fig. 1 shows the same lithiated graphite particle before and after prolonged exposure to the electron beam. The particulate matter formed during exposure to the electron beam is clearly visible on the surface of the particle in Fig. 1b. From the EDS spectrum we can conclude that significant amounts of Li are present close to the surface of the particle based on the information depth for graphite at 3 kV. The origin of this Li is being investigated, in particular whether it is formed from Li in the graphite samples, from the surface SEI layers or from Li dendrites deposited during cell cycling and whether Li diffusion depends on the grain orientation. Importantly, the results indicate that Li is highly mobile under the influence of the electron beam and therefore any quantitative measurements have to be interpreted with caution.

 

Without measuring Li X-rays directly, it is possible to estimate the thickness of a hypothetical surface layer of lithium. To show this, we studied a sintered pellet of Li1.4Al0.4Ge1.6(PO4)3 (LAGP), which is a solid electrolyte with an ionic conductivity of 0.3 mS/cm at room temperature. A part of the pellet was contacted with lithium foil for several days, after which the lithium foil was removed before the EDS measurement. We compared EDS spectra from the sample surfaces with and without exposure to lithium based on the assumption that Li has transferred from the Li foil to the sample, forming a Li rich surface layer. Comparing the EDS spectra from the regions with and without exposure to lithium shows a distinct attenuation of the O K, Ge L, Al K and P K lines in the region contacted with lithium (Fig. 2). The height of the carbon peak which can be attributed to surface contamination is of approximately equal height in both spectra, ruling out a geometric effect such as shadowing or surface tilt. AZtec LayerProbe calculates the thickness of a hypothetical layer of lithium on LAGP based on the attenuation of X-rays emitted from inside the sample. Assuming a layer of metallic lithium (ρ=0.53 g/cm3) covers the contacted part of the sample, LayerProbe calculates that a thickness of 100-150 nm of lithium would result in the observed attenuation of the X-ray signals from Li1.4Al0.4Ge1.6(PO4)3. In contrast, LayerProbe did not detect attenuation of the O K, Ge L, Al K and P K lines for the part of the sample which had not been contacted with lithium.

 

Our results indicate the great potential of SEM/EDS for the characterisation of lithium ion battery materials. They show that while it is possible to detect Li X-rays from those materials with a specially designed EDS detector, the results may be difficult to interpret due to the mobility of Li under the electron beam. However, it is also possible to study lithiation processes indirectly, by using the attenuation that a hypothetical surface layer of lithium exerts on the X-ray emissions of other elements in the sample.

 

References:

[1] Burgess S, Li X, Holland J. 2013 Micro Anal 27:S8–S13.

[2] Terauchi M, Takahashi H, Handa N et al. 2012. J Electron Microsc 61:1–8.

[3] Hovington P, Timoshevskii V, Burgess S. et al 2016, Scanning, in print. 


Christian LANG (High Wycombe, United Kingdom), Andy NAYLOR, Felix RICHTER, Christoph BIRKL, Stefanie ZEKOLL, Simon BURGESS, Gareth HUGHES, David HOWEY, Peter G. BRUCE
08:00 - 18:15 #6326 - MS05-814 Revealing phase separation and crystallinity in small molecule solar cells using 3D electron microscopy.
MS05-814 Revealing phase separation and crystallinity in small molecule solar cells using 3D electron microscopy.

Transmission Electron Microscopy (TEM) can be utilized to understand the morphology of organic bulk heterojunction (BHJ) solar cells and thus aid in improving device performance. We have previously shown that phase separation and formation of crystallinity is to be expected during co-evaporation of small molecule BHJ layers [1]. Using Electron Spectroscopic Imaging (ESI) [2] and electron diffraction, we found a significant influence of substrate and substrate temperature on the morphology of the photoactive layer during the fabrication of F4ZnPc:C60 BHJs. Whether or not the device is fabricated as inverted [3] or non-inverted cell influences crystal growth and, thus, phase separation during film formation. We have found that heating the substrate during BHJ film formation leads to an increase in efficiency for the inverted cell, whereas the non-inverted device shows no improvement. While the ESI measurements showed that substrate heating facilitates phase separation of the two materials, the difference in efficiency of the different device architectures could not be explained by this. Electron diffraction data indicated that crystallinity plays a role here.

Since conventional ESI and electron diffraction only provide information about material distribution and crystallinity in a two-dimensional projection of the BHJ layers, high-resolution electron tomography was performed to gain insight into the three-dimensional structure. F4ZnPc:C60 was co-evaporated onto layers of neat F4ZnPc and C60, respectively. The measurements were performed under low-dose and LN2-cryo conditions in an FEI Titan Krios. This was necessary to preserve the sample, and foremost its crystallinity, since carbon-based materials, like C60, are prone to severe damage by electron irradiation.

Figure 1 shows a bright-field TEM image of the BHJ on C60 (gold fiducials, seen in black, were used for tilt-series alignment). All images of the acquired tilt-series show crystalline areas such as the ones marked (A,B,C). The crystalline spacing seen here can be identified in the power spectra as characteristic for C60 (red: 0.85 nm, green: 0.5 nm and blue: 0.44 nm). As illustrated, such crystallinity can also be visualized in high-resolution electron tomograms, albeit only for smaller volumes at quite high magnification.

To obtain a statistically significant distribution of crystallinity for different cell architecture and cell fabrication, larger volumes need to be analysed. For a given detector size, one needs to apply lower magnifications which results in lower resolution. However, the signature of pure crystals at these imaging conditions are a low variance in 3D, i.e. crystal distributions can easily be obtained from segmented 3D variance maps. A slice through the tomographic reconstruction of such samples can be seen in figure 2. Here, a BHJ film on C60 substrate is compared with a similar section through a tomogram of the BHJ on F4ZnPc. The gold fiducial indicates the top of the BHJ film. The homogeneous, aka crystalline areas are highlighted (red overlay). From the distribution of crystallinity we deduce, that large C60 crystals are found in both device architectures causing a very rough film surface. In the inverted device, these crystals can extend throughout the whole film, using the polycrystalline C60 substrate as seed for crystal growth, whereas the non-inverted BHJ showed C60 crystals starting somewhere in the middle of the film. Correlating this data with device performance, we find that C60 crystals which have grown throughout the BHJ layer are crucial for efficient devices.

References:

[1] D. Nanova, Adv. Funct. Mater. 25, 6511–6518 (2015).
[2] M. Pfannmöller et al., Nano Letters 11, 3099–3107 (2011).
[3] J. Meiss et al., Adv. Funct. Mat. 22, 405-414 (2012).
[4] This work was supported by the German Ministry of Research and Education, collaborative project „LOTsE“, grants 03EK3505L (W.K.) and 03EK3505K (R.R.S).


Anne Katrin KAST (Heidelberg, Germany), Johan ZEELEN, Lars MÜLLER, Pirmin KÜKELHAN, Diana NANOVA, Robert LOVRINCIC, Wolfgang KOWALSKY, Rasmus R. SCHRÖDER
08:00 - 18:15 #6340 - MS05-816 GENESIS Rouen : An open platform for the study and nano analysis (Atom probe, SEM Cross beam station and TEM (in situ straining, temperature, tomography) of irradiation effects in radioactive materials for nuclear application.
MS05-816 GENESIS Rouen : An open platform for the study and nano analysis (Atom probe, SEM Cross beam station and TEM (in situ straining, temperature, tomography) of irradiation effects in radioactive materials for nuclear application.

Nuclear materials undergo degradations due to neutron/matter interaction. The degradation initially occurs at atomic scale. The French GENESIS platform, divided among three sites in France: GPM Rouen, CIMAP Caen and CEA Saclay, gathers experimental nanoanalysis tools devoted to irradiated and radioactive materials. Results allow understanding, modelling, and finally simulation of the long time behaviour of the nuclear materials.

In GPM Rouen, this platform will give access to tomographic atom probe, transmission electron microscopy with in-situ experiments (heating, in-situ straining tests, tomography) and a dual beam station for sample preparation in active materials irradiated in nuclear power plants. The samples may reach an activity of 200 MBq. These characterizations will allow the extraction of reliable data necessary to develop and validate the multi-scale numerical simulation of metal, oxide, ceramic or glass materials.

Facilities in GPM Rouen are open since March 2016. The study of irradiated and radioactive materials will begin in September 2016.

Characteristics of the techniques will be described with some results that may be achieved as well as the protocol access.

 

GENESIS is supported by the Région Haute-Normandie, the Métropole Rouen Normandie, the CNRS via LABEX EMC and the French National Research Agency as a part of the program “Investissements d’avenir” with the reference ANR-11-EQPX-0020.


Auriane ETIENNE (ST ETIENNE ROUVRAY CEDEX), Philippe PAREIGE, Bertrand RADIGUET, Cristelle PAREIGE, Fabien CUVILLY, Emmanuel CADEL
08:00 - 18:15 #6342 - MS05-818 Investigation of the cathode material Li9V3(P2O7)3(PO4)2 for Li-batteries using Cs-corrected HRTEM.
MS05-818 Investigation of the cathode material Li9V3(P2O7)3(PO4)2 for Li-batteries using Cs-corrected HRTEM.

New cathode materials for Li-ion batteries are investigated assiduously to achieve higher performance in terms of energy density life time and safety. In pursuit, a polyanion-based lithium vanadium monodiphosphate, Li9V3(P2O7)3(PO4)2 [LVPP] was identified. This layered material poses distinct advantages like higher energy density, thermal stability over the more commonly used metal oxides, owing to the strong binding of the phosphate anions. Theoretically the extraction of maximum 6 Li ions per unit cell is possible, thus giving out a theoretical capacity of 173mAhg-1 through complete oxidation of vanadium from its initial +3 to final +5 state. A facile synthesis method of LVPP has been designed. To comprehend the structure and its functionality, transmission electron microscopy (TEM) with image Cs-corrector was used (FEI Titan 80-300kV), allowing atomic resolution even at lower accelerating voltages [2] (in this case at 80kV), where lower knock-on damage is expected.

To preserve as good as possible the original quality of the synthesized powder material, the TEM specimen was prepared without additional grinding using three methods: simply spread of powder particles on the carbon foil, sonicate powder in alcohol and fishing particles on the carbon foil and spread of particles, which were crashed after cooling in liquid nitrogen, on the carbon foil.

The crystallographic structure of LVPP corresponds to the trigonal symmetry (space group P-3c1) with a = b = 90°, g = 120°, a = b = 9.724 Å, c = 13.596 Å [3]. VO6 octahedra and PO4 tetrahedra, connected to the Li atoms, are organized in two layers generating a 2D ionic conductivity. Fig.1d) shows the simulated structure in [0001]- and [-2021]-projections where V atoms are red, P atoms blue, O atoms light rosa and Li atoms yellow.

HRTEM images of thin particles edges at 80 kV and 300kV are shown in Fig. 1 a-c). To get interpretable TEM micrographs usually the crystalline specimen has to be aligned during imaging in a particular pre-selected crystal orientation. However LVPP is very sensitive to the electron beam with the result that practically the crystal could not be oriented. This behaviour was found independent of the accelerating voltage of 80kV or 300kV. Fortunately, some particles had by chance a favorable crystal orientations and qualitatively interpretable TEM images were obtained (see Fig. 1). We confirmed the expected crystallographic structure for the synthesized particles by corresponding image simulations using JEMS. Moreover we found no significant volume change of the structure during electron-beam driven delithiation.

 

[1] M. Haider et al., Ultramicroscopy75 (1998), p.53.

[2] U. Kaiser et al., Ultramicroscopy 111, (2011), p.1239.

[3] Xue Miao et al., RSC Adv., 2015, 5, p. 243.

 

Acknowledgement: This work was supported by the German Ministry for Education and Research (BMBF) in the frame of the joint research project "Li-EcoSafe - Development of economical and safe lithium ion batteries".

 


Dorin GEIGER (Ulm, Germany), Prasanth BALASUBRAMANIAN, Marilena MANCINI, Peter AXMANN, Margret WOHLFAHRT-MEHRENS, Ute KAISER
08:00 - 18:15 #6366 - MS05-820 TEM characterization of irradiated beryllium.
MS05-820 TEM characterization of irradiated beryllium.

It is suggested that beryllium will be used as a neutron multiplier material in the Helium-cooled Pebble Bed (HCPB) European concept of a breeding blanket of demonstration power reactor DEMO. Long-term irradiation tests in high-neutron-flux nuclear research reactors yield information about the evolution of the microstructure of beryllium pebbles under close-to-fusion conditions (temperature, damage dose, helium and tritium production) excluding 14 MeV neutrons which are not present in the neutron spectra of fission reactors. The previous microstructural characterisation of irradiated Be performed in the course of high dose irradiation program (HIDOBE I) show the temperature depended formation of cavities inside the materials [1,2]. In the recent study was investigated beryllium pebble which was irradiated at 750°C. The target preparation of TEM specimens was performed using focused ion beam (FIB) which enables TEM investigation of defined areas such as secondary phases or grain boundaries.

Fig 1 shows a TEM image which demonstrates preferable formation of voids with sizes up to 1µm along the grain boundary. The edges of the voids correspond with crystallographic planes of the Be matrix, but because both halves of the bubble grow in two differently oriented grains, their shape is more irregular. The areas with high density of 30-70 nm large voids are located on the distance of 0.5 µm - 1.3 µm on both sides of the grain boundary. The areas of 0.5-1.5 µm thickness close to the grain boundary without any visible void can be named as void denuded zone. These zones formed because grain boundaries act as a sink for vacancies and interstitials that form in the nearest area. On the other hand, this effect promotes also the formation of large voids direct on the grain boundary. The similar effect was already observed in polycrystalline neutron irradiated tungsten.

The voids in beryllium usually show shapes of flat discs which are located in the basalt plane of hexagonal Be [1]. In the Fig. 2 (a) and (b) the same area is imaged which was tilted to the angle of ≈60° (-29° till +30° alpha tilt of goniometer). It is clearly seen that shape of the voids changes from narrow strip at -29° to the hexagonal faceted void at +32° alphq tilt. These results enable determination of the void size and thickness distribution histogram. Imaging of lamella in an oxygen map (Fig. 3) reflects the topography of beryllium surface which has been oxidized by contact with air. The formation of this thin oxide layer enables imaging of voids which got contact to the foil surface during FIB preparation. In Fig. 3a HAADF image of an area with numerous voids is presented. Be is oriented with the c axis in the image plane as it marked in the image. The open voids got a surface decoration and are visible as narrow strips. The voids which do not have contact with a foil surface remain invisible in the oxygen map without any decoration of the void’s surface with oxygen or other impurity elements. This imaging allows correct calculations of the size distribution of radiation induced voids in irradiated beryllium.

Conclusion: Observation of preferable formation of voids on the grain boundary and a void-free zone in the area next to the grain boundary. TEM imaging of the voids depend on the orientation of the image plane that varies from a regular hexagon to an elongated shape as a line segment with an intermediate state as a rectangle.

References:

[1] M. Klimenkov, et. al Journal of Nuclear Materials 455 (2014) 660–664

[2] M. Klimenkov, et. al Journal of Nuclear Materials 443, (2013) 409-416

[3] A. Hasegawa, et al. Fusion Engineering and Design 89 (2014) 1568-1572


Michael KLIMENKOV (Eggenstein-Leopoldshafen, Germany), Jan HOFFMANN, Peter KURINSKY, Viacheslav KUKSENKO, Pavel VLADIMIROV, Vladimir CHAKIN, Anton MÖSLANG
08:00 - 18:15 #4463 - MS06-822 Adiabatic shear loading in thermal spray coatings studied by EBSD.
MS06-822 Adiabatic shear loading in thermal spray coatings studied by EBSD.

A basic principle during the formation of thermal spray coatings is the phenomenon of “adiabatic shear instability” which influences splat formation, bonding or oxidation of intersplat regions, grain refinement and dynamic recrystallization as result of thermal softening gaining over work hardening upon the impact of accelerated particles of the spray feedstock. Deposits of uniform composition, low porosity and suitable bonding to the substrate are obtained by proper adjusting the window of deposition parameters with respect to the occurrence of adiabatic shear instabilities. However, a lack of knowledge on how low-ductile intermetallic compounds and hard oxide particles behave at high strain rates obtained during the thermal spray process has to be stated.

The present work shows the interfacial features of several coatings obtained at typical spray parameters. The examples include coatings formed from combinations of ductile or hard particles on hard or ductile substrates [1-4]. Electron backscatter diffraction (EBSD) was used to show the influence of adiabatic loading on the microstructural evolution. Kikuchi pattern quality maps (Fig. 1a-d) provide information about dynamic recrystallization and the occurrence of unchanged spherical particles, fragmented shells as well as particles agglomerated by sintering. EBSD kernel average misorientation (KAM) is effective in resolving grain regions subjected to deformation. KAM maps of the next and next-next neighbor pixels (Fig. 2a-d) show shear bands and dynamic recrystallization to a different degree in high-ductile aluminium (a) and low-ductile iron aluminide (b); hard layers of zirconia (c) and alumina (d) confirm expectedly marginal misorientation, but clearly indicate that the impinging particles induce different alterations of the steel substrates subjected to different pretreatments. Shear bands have been formed on the hills of the laser-cut structure; dynamic recrystallization occurred on top of the highly disturbed sandblasted surface.

 

  1. R. Drehmann et al. (2014) Investigation of bonding mechanisms of cold gas-sprayed Al coatings on Al2O3. Mater. Sci. Eng. Techn. 45 (6): 476–485.

  2. N. Cinca et al. (2015) Influence of spraying parameters on cold gas spraying of iron aluminide intermetallics. Surf. Coat. Techn. 268: 99–107.

  3. P. Sokołowski et al. (2015) Advanced microscopic study of suspension plasma sprayed zirconia coatings with different microstructures. J. Therm. Spray Techn. DOI: 10.1007/s11666-015-0310-7.

  4. T. Lampke et al. (2011) Alumina coatings obtained by thermal spraying and plasma anodizing — a comparison. Surf. Coat. Techn. 206: 2012–2016.


Dagmar DIETRICH (Chemnitz, Germany), Nuria CINCA, Pawel SOKOLOWSKI, Lech PAWLOWSKI, Josep GUILEMANY, Thomas LAMPKE
08:00 - 18:15 #4503 - MS06-824 Microstructure characterization of bioinspired multilayer coatings on advanced polymer PEEK type materials as well as on Carbon Fiber Composites (CFC).
MS06-824 Microstructure characterization of bioinspired multilayer coatings on advanced polymer PEEK type materials as well as on Carbon Fiber Composites (CFC).

The ultimate goal for a materials engineer is to learn from the lessons of nature and to apply this knowledge to new materials and design. In nature materials are often optimized to manage any damage that could occur. The occurrence of damage is expected and accepted as a fact of life. Natural materials can cope with damage due to in- built healing abilities. The ability to heal damage is one of the remarkable properties of biological systems and living organisms. One recurring goal of material development was to emulate the materials of nature. In the frame of the presented research, the coatings design was inspired by nature. The first part of the paper deals with the microstructure characterization of a natural shell. The coatings design was based on the nacre structure. The design of materials and structures inspired by nature involves special challenges not encountered before. Traditional design has followed disciplinary lines. Bioinspired design required mulitidisciplinary teams of engineers (design and materials), and scientists (biology, molecular biology, tribology, and micro-/nano- structure characterization). Given the widespread interest in the structure and mechanical properties of abalone shell, there have been some attempts to fabricate nacre like multilayered structure. Advanced hard coating concepts like multilayer coatings, multicomponent solution hardened layer materials, new metastable layer materials, nanocrystalline layer materials or superlattice films became increasingly important for wear protection under extreme and complex loads. Among these advanced coatings, the multilayer concepts seems to be the most versatile and promising with respect to properties and performance in almost all the fields of application. The main objective of the research was to improve the bio- activity and tribological properties of advanced polymer PEEK type materials (Polyetherethkethone) as well as Carbon fiber Composites (CFC). It was performed through the development of biomimetic, self- healing polymeric and ceramic multilayer coatings. Bio- engineering tests considered cell material interaction. In the initial analysis, associated with cytotoxic effect, fibroblasts were applied. The selected materials were undertaken the hemocompatibility. The analysis were executed based on the rules described in ISO 10993-4, dynamic blood-material interaction. The final analysis were focused on induced stem cells. Coatings were also subjected to complex mechanical tests based on indentation, ball- on disc wear and scratch adhesion tests. The wear test revealed the friction coefficient in the range of 0.3 up to 0.4 under 5N and 2500 cycles.Before and after bio- tribological tests the detailed microstructure/ nanostructure analysis of the coatings was performed in order to determine the tribological behavior of the coatings under the influence of a mechanical load and under biological conditions. Microstructural diagnosis was carried out using a high resolution transmission microscopy technique (HRTEM). It showed that cracking was initiated at the coating/substrate interface and the energy of brittle cracking was reduced due to the plastic deformation at each Cr interlayer interface (Fig. 1).

Keywords: multilayer coatings, wear, TEM microstructure characterization

Acknowledging to the research project which was financed by the National Science Centre (Polish- Narodowe Centrum Nauki, abbr. NCN) No:

v  2012/06/M/ST8/00408

v  2014/15/B/ST8/00103


Lukasz MAJOR (Cracow, Poland), Juergen M. LACKNER, Marta JANUSZ, Marcin KOT, Boguslaw MAJOR
08:00 - 18:15 #4550 - MS06-826 Scanning Transmission Electron Microscopy Investigation of LaAlO3/SrTiO3 Bi-Interfaces.
MS06-826 Scanning Transmission Electron Microscopy Investigation of LaAlO3/SrTiO3 Bi-Interfaces.

The interfaces between complex oxides can generate fascinating properties that are not observed in the single compounds. A significant example is the high-mobility 2-dimensional electron liquid (2DEL) detected at the interface between two good band-gap insulators, a LaAlO(LAO) thin film grown epitaxially on (001) TiO2-terminated SrTiO3 (STO) single crystal [1]. The 2DEL formation is understood in the framework of the polar catastrophe scenario for which electrons are transferred at the interface in order to minimize the built-in potential generated by the contact between the polar planes of LAO and the neutral ones of STO. According this model a fraction of Ti3+, with 3d1 configuration, should be stabilized in proximity of the interface.

LaAlO3/SrTiO3 bi-Interfaces, here discussed, are multilayer structures with a STO film and a second LAO thin film subsequently grown on the top of the first LAO thin film. Such system displays three inequivalent interfaces - two of which are conducting: LAO / STO substrate and LAO / STO film, for STO thickness ≥ 8 nm [2,3]. Our work is driven by the effort to understand the 2DEL formation at the LAO / STO film interface. For this purpose bi-interfaces with thick (12 nm ≈ 30 unit cells (uc)) and thin (6 nm) STO film were investigated and discussed in parallel. High-angle annular dark-field (HAADF) imaging as well as electron energy-loss spectroscopy (EELS) were performed in an aberration corrected Nion UltraSTEMTM Scanning Transmission Electron Microscope (STEM). The possibility to combine HAADF, an incoherent and Z-sensible technique ideal to investigate distortions and defects, and EELS, a spectroscopy capable to probe valence states with atomic spatial resolution, makes STEM a powerful tool to understand interfaces. Specifically in STO the hybridization between the 3d band of Ti and the 2p of O results in a features-rich spectroscopy.

According the HAADF images collected in STO thick bi-Interfaces, coherent growth, with no obvious defects or dislocations, was observed at the bottom and the middle interface whereas a periodic network of edge dislocations were identified at the top interface pointing out to a relaxed LAO / STO film and to a strained LAO / STO substrate interface. Ti fine structure corroborates the HAADF observations since evidences of orbital reconstruction i.e. a shift of ≈ 60 meV towards higher energy of the orbital-field edge L3-eg, are observed at the LAO / STO substrate and not at the LAO / STO film interface. Generally Ti-L2,3 fine structure is known to be a spectroscopic fingerprint of the strain state of the interfaces. Besides strain, roughness and polarity of the interfaces are key features. In order to determine the termination plane sequences, a large energy range (1.9 keV) for the EELS data was used collecting simultaneously all the meaningful edges from Ti-L2,3 (at ca. 450 eV) to Sr-L2,3 (at ca. 1950 eV). These atomically resolved elemental maps show that the insulating interface(s) is(are) the sharpest, indicating that the cation intermixing may play a role in the response of the system to the occurrence of the 2DEL.

  1. Ohtomo et al, Nature 427 (2004).

  2. Danfeng Li et al., APL Materials 2 (2014).

  3. “A/B” indicates that the material “A” is grown on the top of the material “B”.


Giulio TIERI (ANTONY), Alexandre GLOTER, Danfeng LI, Stefano GARIGLIO, Jean-Marc TRISCONE, Odile STÉPHAN
08:00 - 18:15 #5046 - MS06-828 The complex structure of catalyst particles used in fluid catalytic cracking.
MS06-828 The complex structure of catalyst particles used in fluid catalytic cracking.

The refining of crude oil by conversion of its heavy fraction into gasoline and light olefins represents an important industrial process providing a valuable source for fuel and basic chemicals. The catalyst for this reaction, the so-called fluid catalytic cracking (FCC), is a complex composite of multiple components, including zeolites, clay, and various minor additives with certain catalytic or structural functions. The many reaction and regeneration cycles during long-term operation change the structure of the FCC particles, leading to a decrease of their catalytic activity. To understand this deactivation, it is essential to derive a three-dimensional model of an individual catalyst particle, to quantify the porosity, and to identify metal deposition and other structural changes happening during the process. In addition to 3D imaging with high resolution X-ray tomography [1], we here present the results obtained with different electron microscopy methods that were applied to gain information about the local structure and the elemental distribution with high resolution.

The commercially-deactivated FCC catalyst studied here is a mixture of a La-exchanged zeolite type Y, metakaolin clay, an aluminum silicate, and comprises almost spherical particles with diameters between ca. 50 and 100 micrometer (Fig. 1a). For the investigation of the particles’ internal structure, cross-sections were prepared. The spheres were embedded in a resin and the obtained cylindrical blocks cut into slices. For TEM and STEM investigations, these slices were mechanically thinned and finally ion-milled till a hole in the center was generated [2].

SEM images of these cross-sections reveal a porous and partly fibrous interior structure that is surrounded by a dense wall (Fig. 1b) which is iron rich according to EDXS mapping, (Fig. 1c). The HAADF-STEM image (Fig. 2a) was taken at the rim of such a particle. The outermost layer at the left appears bright, dense and two to five micrometer thick. It mainly consists of silicon oxide enriched with iron (Fig. 2b-d). The loss of porosity in the outermost layer during the catalytic operation originates from the formation of a dense phase there. Furthermore, the EDXS mappings reveal areas in the inner part of the particles that contain mainly Ti, Si and Al. This finding agrees with the results of x-ray diffraction studies that identified zeolite and titanium oxide in addition to a small amount of crystalline aluminum silicate.

It can be concluded that an equilibrated FCC particle as investigated here is covered by a dense newly-formed iron-enriched silicon oxide layer while a freshly prepared, catalytically more active FCC particle has a highly porous outermost shell [3].

[1] J. C. da Silva et al. ChemCatChem 2015, 7, 413–416.

[2] E. Müller and F. Krumeich, Ultramicr. 2000, 84, 143-147.

[3] Electron microscopy was performed at the Scientific Center for Optical and Electron Microscopy (ScopeM) of ETH Zurich.


Frank KRUMEICH (Zurich, Switzerland), Ana DIAZ, Andreas MENZEL, Mirko HOLLER, Manuel GUIZAR-SICAIROS, Dario FERREIRA SANCHEZ, Daniel GROLIMUND, Jeroen VAN BOKHOVEN, Yuying SHU, Wu-Cheng CHENG
08:00 - 18:15 #5049 - MS06-830 TEM investigations of Al/AlOx/Al Josephson junctions.
MS06-830 TEM investigations of Al/AlOx/Al Josephson junctions.

The development of fully-operational quantum computers is one of the major goals in information science. Quantum computers rely on the quantum-coherent evolution of their constituents, the quantum bits (qubits). For this purpose all sources of decoherence have to be identified, to eliminate them as far as possible, or to reduce their effect, e.g., by an optimized qubit design. Superconducting qubits based on Josephson junctions (JJs) provide the most advanced platform. Their coherence is limited by low-frequency charge fluctuations, flux noise, and critical current fluctuations (frequently with a 1/f spectrum) [1,2]. Much progress has been made in the last 15 years reducing their effect, leading to an increase of the coherence times by five orders of magnitude. Still a major source of decoherence appears to be environmental two-level systems (TLS) and other imperfections within the amorphous AlOx-layer [3,4] of Al/AlOx/Al-based JJs. Many properties of the TLS have been probed experimentally, however, identifying their true microscopic nature remains an open problem. Recent transmission electron microscopy (TEM) investigations showed the potential of these techniques for analyzing and improving the properties of JJs and qubits [5,6].

In this work Al/AlOx/Al-layer systems for JJs were analyzed in an FEI Titan³ 80-300. Different samples were fabricated by electron beam physical vapor deposition with varying oxidation parameters like, e.g., oxidation time to, oxygen pressure po, UV-enhanced oxidation and thermally enhanced oxidation. The morphology of the samples was analyzed by high-resolution TEM (HRTEM). Fig. 1 shows an AlOx-layer fabricated at room temperature with to = 12.5 min and po = 0.0145 mbar, resulting in an oxide layer with an average thickness of 1.9 nm. Fig. 1a shows a smooth oxide layer with homogenous thickness at an Al/AlOx interface of a single Al-grain. Fig. 1b shows the same layer at an Al-grain boundary in the lower electrode layer, where the oxide layer is bent illustrating the negative influence of grain boundaries. Thickness variations due to grain boundaries can also be found. Furthermore, the bonding characteristics between Al- and O-atoms were analyzed by electron energy loss spectroscopy (EELS). The electron loss near edge structure of the Al-L2,3 edge is shown in Fig. 2 for the AlOx-layer (green spectrum) and crystalline a- and g-Al2O3 reference samples (black and red spectra). The first maximum of the absorption edges is located at 77.3 eV and 80.2 eV which is characteristic for tetrahedral- and octahedral-coordinated Al-sites. By analysing the peak intensities [7] the fraction of tetrahedral-coordinated Al-sites can be determined to 40 at%. Although the AlOx-spectrum is similar to the expected spectra for amorphous Al2O3, there are some unexpected features which can be connected to medium range order (82 – 90 eV). By comparison of the data obtained from differently fabricated samples the influence of individual fabrication parameters can be analyzed to improve the qubit properties by optimization of the fabrication process.

 

References:

[1] J. Clarke, F. K. Wilhelm, Nature 453, 1031 (2008)

[2] J. Martinis et al., Phys. Rev. Lett. 95, 210503 (2005)

[3] C. Müller et al., Phys. Rev. B 80, 134517 (2009)

[4] M. Choi et al., J. Appl. Phys. 113, 044501 (2013)

[5] V. V. Roddatis et al., J. Appl. Phys. 110, 123903 (2011)

[6] L. J. Zeng et al., J. Phys. D: Appl. Phys. 48, 395308 (2015)

[7] J. Bruley et al., Microsc. Microanal. Micrustruct. 6, 1 (1995)


Stefan FRITZ (Karlsruhe, Germany), Reinhard SCHNEIDER, Lucas RADTKE, Martin WEIDES, Dagmar GERTHSEN
08:00 - 18:15 #5065 - MS06-832 Analysis of white-luminescent mesoporous carbonized silica under electron irradiation by TEM-CL system.
MS06-832 Analysis of white-luminescent mesoporous carbonized silica under electron irradiation by TEM-CL system.

     Mesoporous carbonized silica (MPCS) exhibits continuous white photoluminescence (PL) like the solar emission spectrum [Fig.1 (a)], which attracts attention as a new luminescent material, consisting of ubiquitous elements alone. The PL intensity of MPCS, however, is still insufficient for practical use and it is necessary to clarify the origin of the white luminescence to improve its emission intensity. Since MPCS has a nanoscale honeycomb structure and the emission intensity and its color rendering depend on the pore size, it was thought that the nanostructure is responsible for the light emission. In the present study we conducted TEM-cathodoluminescence (CL) experiments on MPCS in order to investigate relationship between luminescence properties and nanoscale honeycomb structure.

     An MPCS sample was ground and dispersed in ethanol, a drop of which was dripped on a microgrid. TEM-CL experiments were carried out by a Jeol JEM2100 STEM equipped with a Gatan Vulcan TEM-CL system, in which high efficiency light collecting mirrors are implemented, covering both upper and lower sides of the sample over the solid angle of as large as 7.3 steradian. Using this system, it was found that the CL spectral profile was different from that of PL, consisting of several primary peaks around 450 nm, 620 nm and 650 nm [Fig.1 (b)]. Several samples with different synthesis process and carbon content were examined at electron accelerating voltages of 200 kV and 100 kV to investigate the change in the CL spectrum by electron irradiation.

     It was found that the CL spectral profile changed with the structural change by electron irradiation at an accelerating voltage of 200 kV, as shown in Fig. 2. At the initial stage of irradiation the nano-structure of MPCS hardly changed, though the intensity of the 620-650 nm peak was quickly reduced. By prolonged irradiation, on the other hand, the spectral intensity of the intermediate wavelength region (500-600 nm) between the two primary peaks was increased, followed by the increased integrated intensity of overall spectrum as the honeycomb structure collapsed. It is thus concluded that the origin of the luminescence was attributable to generation and annihilation of point defects rather than nanoscale honeycomb structure itself.

     Electron irradiation is supposed to break chemical bonds by electronic excitations and/or displacement of host atoms through inelastic and elastic electron scattering, respectively. It is generally known that the inelastic scattering probability is increased and the knock-on damage probability is decreased with decreasing the accelerating voltage, where a threshold accelerating voltage exists for the displacement of an atom by elastic scattering (knock-on), depending on the atomic number of the displaced atom. At the accelerating voltages of 200kV and 100 kV, well above and below the threshold for Si and O (~150 kV) in SiO2 respectively, the intensity of 620-650 nm peak was decreased both in case of 100 kV 200 kV, though its rate was larger at 100 kV than that at 200 kV, as shown in Fig.3. This suggests that the defect specie giving rise to the 620-650 nm peak should collapse by an electronic excitation effect rather than knock-on damage. Besides, the increase in the intensity the intermediate wavelength region observed in Fig. 2 was not observed at 100 kV. It is hence presumed that the origin of the emission in the intermediate wavelength region should be the generation of a defect related to oxygen deficiency by knock-on damage.

     Moreover, in order to confirm how carbon incorporated affects the emission spectrum of MPCS, CL spectrum of a non-carbonized mesoporous silica (MPS), having the same honeycomb structure as MPCS was acquired, as shown in Fig.4. The CL spectral profile of MPS hardly differed from that of MPCS. It has not become clear how the carbon in MPCS affects the light emission.

     The generation and annihilation of point defects in MPCS by electron irradiation should be modeled by a set of reaction rate equations on the basis of the present observations, which is reported in further detail.

 

[1]K. Sato, Y. Ishikawa, Y. Ishii, S. Kawasaki, S. Muto, and Y. Yamamoto: Jpn. J. Appl. Phys. 51 (2012) 082402

[2]T. Yoshino, 1994. Irradiation Effect in Materials. (SHOKABO Tokyo, 1994), p. 25-26


Kazuki OGUNI (Nagoya, Japan), Shunsuke MUTO, Yukari ISHIKAWA, Koji SATO, Yosuke ISHII, Shinji KAWASAKI
08:00 - 18:15 #5090 - MS06-834 Convergent-Beam EMCD: Benefits, Pitfalls, and Applications.
MS06-834 Convergent-Beam EMCD: Benefits, Pitfalls, and Applications.

Energy-loss magnetic chiral dichroism (EMCD) [1] is a state-of-the-art technique to measure magnetic properties on the nanoscale using TEM and EELS. Since its first experimental realization a decade ago, it has seen tremendous progress and many applications, including the analysis of phase transitions [2] or of magnetic nanoparticles [3,4].

EMCD exploits the spin-orbit interaction in the sample that gives rise to different probabilities for the transfer of ±1 ħ of orbital angular momentum (OAM) to the probe beam. The net OAM of the probe beam is then measured interferometrically in the diffraction plane. The classical EMCD approach uses an incident plane wave and a “point-like” detector placed on the Thales circle through two diffraction spots. This, however, has two major shortcomings: on the one hand, it limits the best achievable spatial resolution to the size of the selected area aperture; on the other hand, it places the detector far off-axis where the intensity is very low. Thus, it is difficult or even impossible to use for many applications, including many application-relevant cases such as nanoparticles, interfaces, defects, or beam-sensitive materials where long exposure times are not possible.

Here, we investigate the benefits of using a convergent incident beam for EMCD [5,6] by simulating the EMCD effect using the multislice algorithm [7] together with the mixed dynamic form factor (MDFF) approach [8] for a 10 nm Fe sample oriented in a systematic row condition including the (2 0 0) diffraction spot and an incident beam energy of 300 kV. As shown in fig. 1 for an Fe model system, a visible EMCD signal occurs up to large convergence angles as used in contemporary, Cs-corrected STEMs. However, the region of large EMCD signal is “pushed out” away from the Thales circle towards the rim of the diffraction disks with increasing convergence angles. This is natural as the overall effect is expected to average out inside the diffraction disks. At the same time, it gives a good rule of thumb regarding the optimal position of the detector.

In addition, we investigate the signal-to-noise ratio (SNR) as a function of convergence and collection angles. For practical applications, the SNR actually plays a much more important role than the theoretical expected EMCD effect as even a high EMCD signal is useless if it is well below the noise level. As shown in fig. 2, the SNR is highest for medium convergence and collection angles of the order of the Bragg angle (~7 mrad for the present model system), while the EMCD effect under these conditions is only slightly smaller than for the “classical” case of small convergence and collection angles and a detector positioned on the Thales circle. Thus, it is not necessary (and, indeed, counter-productive) to use a “point-like” detector and parallel illumination which severely limits the recorded intensity as well as the spatial resolution.

Our analysis shows that convergent beam EMCD is not only possible, but actually is superior to classical EMCD in several aspects – most notably spatial resolution and SNR. This makes it the ideal tool for characterizing magnetic properties on the nanoscale, including the technologically relevant question of how the magnetic behavior changes at interfaces.

 

Acknowledgements: Financial support by the Austrian Science Fund (FWF) under grant nr. J3732‑N27 is gratefully acknowledged.

 

[1] Schattschneider et al., Nature 441 (2006) 486
[2] Rubino et al., J. Mater. Res. 23 (2008) 2582
[3] Schattschneider et al., J. Appl. Phys. 107 (2010) 09D311
[4] Stöger-Pollach et al., Micron 42 (2011) 456
[5] Schattschneider et al., Phys. Rev. B 78 (2008) 104413
[6] Löffler and Hetaba, submitted
[7] Kirkland, Plenum Press 1998
[8] Löffler et al., Ultramicroscopy 131 (2013) 39


Stefan LÖFFLER (Wien, Austria), Walid HETABA
08:00 - 18:15 #5226 - MS06-836 TEM/STEM investigation of the crystallization kinetics of GeTe and Ag4In3Sb67Te26.
MS06-836 TEM/STEM investigation of the crystallization kinetics of GeTe and Ag4In3Sb67Te26.

Phase-change materials are promising candidates for non-volatile electronic memory applications already successful established as rewritable optical data storage (Raoux, 2009; Meinders et al., 2006). The writing speed and the stability of the phase-change data storage is mainly defined by the crystallization kinetics. Therefore knowledge of the crystallization kinetics of phase-change materials is mandatory. Lee and coworkers have demonstrated by fluctuation electron microscopy (FEM) that the crystal nucleation of Ge2S2bTe5 and AgInSbTe is influenced by their medium range order (MRO) of the amorphous phase (Lee et al., 2014). In our work we measured the crystal growth velocities by brightfield transmission electron microscopy (TEM) and we measured the variance of the diffracted intensity as measure of the MRO by FEM to prove a relation between the MRO and the growth velocity of the investigated phase-change materials. The measurements of the growth velocities and the MRO were done for GeTe and Ag4In3Sb67Te26 (AIST) in the amorphous sputtered as‑deposited and in the amorphous melt‑quenched state (Figure 1 and Figure 2).

The 30 nm thick amorphous GeTe or AIST layer is embedded in a supporting layer stack on a 500 µm thick silicon substrate (Figure 2). The 100 nm thick ZnS‑SiO2 capping layer on top of the AIST layer prevents oxidation. The 10 nm thick ZnS‑SiO2 layer below the phase-change material layer decreases together with the capping layer the necessary power to melt the phase-change material layer by laser irradiation. The 50 nm thick Si3N4 layer is an etch stop needed to prepare the TEM specimens by etching. The silicon substrate delivers sufficient heat dissipation for melt quenching. The GeTe or AIST layer is either investigated in the amorphous as-deposited or in the amorphous melt‑quenched state. Melt-quenched amorphous marks are produced by cooling a laser molten area of the phase-change layer rapidly back to room temperature.

The growth velocities were measured by brightfield TEM in a FEI Tecnai F20 at 200 kV. Electron transparent specimens were prepared by mechanical grinding, dimple grinding and etching with KOH from the layer stack described above. In this process parts of the Si substrates were removed to leave few hundred µm in diameter wide homogenously thick electron transparent windows. The specimens were alternated between heating in a heating furnace of a differential scanning calorimeter or heating in an oil bath for higher temperatures and the TEM to measure the size of the imaged grains. The measured grains were fitted by a circle. From a linear fit of the increase in radius of the fitted circles the growth velocities were calculated.

FEM measurements were conducted in a FEI Titan dedicated to scanning transmission electron microscopy (STEM) at 300 kV (Heggen et al., 2016). A coherent almost parallel around 2 nm in diameter sized electron probe was used to generate the 500-1000 nano area electron diffraction patterns per specimen used for the FEM analysis. The measured TEM specimens of as‑deposited and melt‑quenched GeTe and AIST were prepared from the layer stack described above as cross section lamellas by focused ion beam (FIB). The lamellas were produced in a FEI Helios dual beam scanning electron microscope/FIB system.

 

References

Heggen, M., Luysberg, M. & Tillmann, K. 2016 Journal of large-scale research facilities JLSRF, 2.

Lee, B.-S., Shelby, R. M., Raoux, S., Retter, C. T., Burr, G. W., Bogle, S. N., Darmawikarta, K., Bishop, S. G. & Abelson, J. R. 2014 J Appl Phys, 115, 063506.

Meinders, E. R., Mijiritskii, A. V., Pieterson, L. & Wuttig, M. 2006 Optical data storage : phase-change media and recording, Dordrecht: Springer.

Raoux, S. 2009 Phase change materials : science and applications, New York, NY: Springer.

 

Acknowledgesments

We kindly acknowledge the funding from the DFG in the framework of the SFB 917 “Nanoswitches”.


Manuel BORNHÖFFT (Aachen, Germany), Julia BENKE, Julian PRIES, Paul M. VOYLES, Matthias WUTTIG, Joachim MAYER
08:00 - 18:15 #5363 - MS06-838 Hollow carbon spheres as ideal supports for hydrogen spillover studies using ruthenium and cobalt nanoparticles.
MS06-838 Hollow carbon spheres as ideal supports for hydrogen spillover studies using ruthenium and cobalt nanoparticles.

Introduction

Cobalt Fischer-Tropsch Synthesis catalysts are generally doped with small amounts of noble metals that serve as reduction promoters to enhance the catalytic activity of the cobalt active sites [1]. This is because the promoter metals are able to dissociate hydrogen gas at a low temperature which then also lowers the reduction temperature of the cobalt oxide to cobalt. This then prevents easy deactivation of the cobalt catalysts that can be induced by high temperature activation. Hydrogen spillover has been invoked to explain the observed effect of these metals as promoters on cobalt catalysts. Two types of hydrogen spillover processes can be envisaged; (1) primary hydrogen spillover, whereby the promoter [i.e., initiator] is in contact with the cobalt oxide [i.e, acceptor] and the dissociated hydrogen atoms can move from the initiator through the direct interface to interact with the acceptor and (2) secondary hydrogen spillover, in this process the initiator and the acceptor materials are separated by some distance and hydrogen spillover can only happen by the dissociation of the hydrogen molecule on the initiator followed by a migration of the atomic hydrogen on a carrier (or catalyst support) to the acceptor material [i.e., cobalt oxide] [2]. Few model catalysts exist that can provide direct evidence of the existence of a type of hydrogen spillover that is dominant on Fischer-Tropsch like catalysts. In this study mesoporous hollow carbon spheres (MHCS) were used as model supports to study whether both the primary and secondary hydrogen spillover were prominent during catalyst activation and Fischer-Tropsch synthesis.

Experimental

MHCS were prepared as shown in Fig 1 (a). Three Co catalysts (15% loading) were prepared (1) Ru@MHCS@Co, with Ru nanoparticles and Co nanoparticles separated by the carbon shell, (2) CoRu/MHCS, Ru and Co co-precipitated outside MHCS and (3) Co/MHCS, Co outside MHCS. Materials were thoroughly characterized using electron microscopy before being tested under Fischer-Tropsch conditions at 220 oC and 10 bar.

Results and Discussion

Scanning electron microscopy (SEM) analysis of the silica template and hollow carbon spheres gave respective average sizes of 340 nm and 290 nm, thus showing that the silica spheres shrunk as they were heated up to 900 oC before the carbonization process (Fig 1(b,c) and Fig 2 (a,b)). The resulting hollow carbon spheres retained their spherical nature hence showing no significant breakage of the MHCS. Transmission electron microscopy (TEM) analysis of the materials showed that indeed the spheres were hollow and they had Ru nanoparticles with an average size of 4.1 nm embedded on its walls (Fig 1(e) and Fig 2 (c)). The loaded Co nanoparticles had an average particles size of approximately 5.9 nm on all three catalysts (Fig 1(f) and Fig 2 (d)). MHCS show a distinct roughness under TEM imaging suggesting high porosity of the materials which is necessary to allow reactants to access the encapsulated Ru nanoparticles. TEM tilting over a single axis proved that all the Ru nanoparticles are encapsulated inside the MHCS. Loading of Co nanoparticles outside the MHCS allowed for decoupling of the spillover effects from those that require direct Ru and Co direct contact. Electron Probe Micro-Analysis (EPMA) large area mapping analysis proved that the metal nanoparticles are well dispersed on the MHCS and thus was ideal materials to study the spillover process (Fig 3). The Fischer-Tropsch catalytic reaction of the three catalysts was compared and gave a Co time yield in terms of carbon monoxide and hydrogen conversion to hydrocarbons as follows; CoRu/MHCS > Ru@MHCS@Co  Co/MHCS. Electron microscopy has therefore helped in following the preparation of a functional material where the promoter effects of Ru using MHCS could be evaluated. I was also observed that a close proximity of Ru and Co nanoparticles was vital for an improved catalytic performance when compared to the case where the Ru and Co nanoparticles were separated by a potential hydrogen transporting material.

References

[1] Beaumont, S.K.; Alayoglu, S; Specht, C; Michalak, W.D; Pushkarev, V.V; Guo, J; Kruse, N; and Somorjai, G.A. Journal of the American Chemical Society, 2014, 136:28, 9898-9901.

[2] Conner Jr, W.C; and John L. Falconer J.L. Chemical reviews, 1995, 95:3, 759-788.


Tumelo PHAAHLAMOHLAKA (Johannesburg, South Africa), Linda JEWELL, Neil COVILLE
08:00 - 18:15 #5394 - MS06-840 Visualization of 2-dimensional potential map in multilayer organic electroluminescence materials by phase-shifting electron holography.
MS06-840 Visualization of 2-dimensional potential map in multilayer organic electroluminescence materials by phase-shifting electron holography.

Electron holography (EH) is a TEM method which can quantitatively measure electromagnetic fields of various samples [1-3]. In this study, we tried observing a local two-dimensional electric distribution, formed in multilayer organic electroluminescence (OEL) quantitatively with phase-shifting EH [4-5] by HF-3300EH Cold-FE TEM operated at 300 kV equipped with multiple biprism system.
An OEL multilayer sample (CuPc/α-NPD/Rubrene/Alq3/LiF/Ag) was fabricated on a Si substrate using a vacuum evaporation method. Each layer’s thickness and the surface morphology of the OEL multilayer sample were evaluated by X-Ray Reflectometry (XRR) and Atomic Force Microscopy (AFM), respectively.
The sample for phase-shifting EH observation was fabricated by focused ion beam (FIB) technique. A part of the multilayer sample, which formed a multilayer structure on a Si substrate, was picked up by the microsampling technique and was fixed onto a W deposition on the mesh for TEM observation. Then, a thin film sample of thickness 450 nm was fabricated by FIB processing. Generally, the OEL sample is vulnerable to water, and the structure may change in quality in reaction to atmospheric water vapor, depending on the formed materials. Therefore, in this study, after thin film processing, contact with the atmosphere was prevented by using an air protection mesh holder.
Figure 1 shows a TEM image, and a hologram by double-biprism EH technique [6]. The model structure of an OEL multilayer is inserted in the TEM image. Sample thickness was about 450 nm. From the TEM image, some contrast is observed in the position of the CuPc layer, but we cannot confirm the image contrast corresponding to the other layers. 
Figure 2 shows the result of the visualization of the 2-dimensional potential map of an OEL multilayer. We can clearly observe the contrast of the OEL multilayer, as shown in the reconstruction image (Figure 2b). Because the inner potential of the materials in each layer is constant, we can consider phase shifts to be an electric potential change in the sample. In the future, we will investigate the accuracy of this experimental data by comparing our data with a simulation.

References

[1] Z. Wang et al., Appl. Phys. Lett., 80 (2002) 246.
[2] T. Hirayama et al., Appl. Phys. Lett., 63 (1993) 418.
[3] K. Yamamoto et al., Angewandte Chemie., 49 (2010) 4414.
[4] Q. Ru et al., Appl. Phys. Lett., 59 (1991) 2372.
[5] Q. Ru et al., Ultramicroscopy, 55 (1994) 209.
[6] K. Harada et al., Journal of Electron Microscopy, 54 (2005) 19.


Takeshi SATO (Hitachinaka-shi, Japan), Kazuo YAMAMOTO, Miki TSUCHIYA, Katsuji ITO, Noriyuki YOSHIMOTO, Yoshifumi TANIGUCHI
08:00 - 18:15 #5399 - MS06-842 Heterogeneous interfacial chemical nature and bonds in an Al matrix composite reinforced with W-coated diamond particles.
MS06-842 Heterogeneous interfacial chemical nature and bonds in an Al matrix composite reinforced with W-coated diamond particles.

Over the last decade, a diamond particle reinforced Al matrix, namely diamond/Al, composite has been developed for thermal management applications, mainly in the microelectronic industry. This composite has demonstrated an excellent combination of a Thermal Conductivity (TC) as high as 600 W/mK and a Coefficient of Thermal Expansion (CTE) lower than 10 ppm/K, being compatible with that of electronic components. However, considering the TC (~ 1800 W/mK) of the diamond particles incorporated, it is clear that the overall TC enhancement has not been completely exploited in the composite. One then points at the diamond/Al interface, which should provide good adhesion as well as maximal Interfacial Thermal Conductance (ITC) in order to facilitate thermal exchange across the diamond/Al interface.

Our analytical modelling has recently predicted that introduction of a W interface nanolayer is one of the most efficient ways to achieve high ITC, which provides a practical guide for interface engineering. Accordingly, a cost-effective sol-gel process has been tentatively used to deposit the W coating for diamond surface metallization. Compared with the diamond/Al counterpart, TC of the composite with such a W nanolayer improved more than 20 %. In this work, Scanning Transmission Electron Microscopy (STEM)/Energy-Dispersive X-ray spectroscopy (EDX) and Precession Electron Diffraction (PED) have been performed in order to investigate interface configurations of a W-coated diamond/Al composite. The aim is to study the effect of interface formation, reaction and diffusion on the ITC.

The results indicate that the deposited W coating is discontinuous, and consists of nanoparticles with a size in the range 30-400 nm and homogenously covering the surface of the diamond particle (Figs. 1a and 1b). The average coating thickness is estimated to be around 200 nm (Fig. 1c). A STEM/ADF image in Fig. 1d shows that the formed diamond/Al interface has a heterogeneous configuration at the nanoscale where Al grain contrasts and a particle with high Z contrast are revealed. STEM/EDX mapping in Fig. 2 displays a W and Al rich interfacial particle. Visible O traces can be related to fine microstructural features. Alternatively, a 'clean' diamond/Al interface is tightly-adhered and is not rich in O (Fig. 3). As shown in Fig. 4, PED zone-axis patterns recorded from the W and Al rich particles are indexed to be the Al12W phase (Cubic, I2/m-3, No. 204). Such different chemical nature of the bonds at the interface can have a pronounced effect on the local ITC [1,2].

References:

[1] Ji, G., Tan, Z.Q., Shabadi, R., Li, Z.Q., Grünewald, W., Addad, A., Schryvers, D., Zhang, D. Materials Characterization, 89, 132-137 (2014)

[2] Ji, G., Tan, Z.Q., Lu, Y.G., Schryvers, D., Li, Z.Q., Zhang, D. Materials Characterization, 112, 129-133 (2016)


Ji GANG (Villeneuve d'Ascq), Tan ZHANQIU, Lu YINGGANG, Schryvers DOMINIQUE, Li ZHIQIANG
08:00 - 18:15 #5503 - MS06-844 Novel MAX resembling Phase Mo2Ga2C.
MS06-844 Novel MAX resembling Phase Mo2Ga2C.

MAX phases are layered transition metal carbides/nitrides with specific properties e.g. electrical/heat conductivity and machinability as metals. The MAX phases have hexagonal structure with a general Mn+1AXn formula, where M is an early transition metal, A is an A-group element (mostly IIIA and IVA) and X is either C and/or N1,2. Their unit cells consist of M6X octahedral, interleaved by layers of A elements. The difference between them is in the number of M layers separated by the A element layers: 2 layers for 211 structure, 3 layers for 312 and 4 layers for 413. All MAX phases reported to date have only one A layer. So far more than 70 ternary Mn+1AXn phases were found2. The MAX family, however, is still being extended as new phases are discovered and/or by creating quaternary and higher, solid solutions. While challenges with their crystal structural determination are addressed,3,4 also exploration is made for phases that do not follow the traditional Mn+1AXn chemistry. In this work, we present a novel crystal structure: Mo2Ga2C.5

     EDX measurement revealed that the Mo/Ga ratio of the material is approximately 1, which implies a new phase. The detailed atomic structure of the new phase was characterized with analytical high resolution scanning electron microscopy. Both Z-contrast images and EDX mappings along [11-20] and [10-10] demonstrate that this phase is layered with two Ga layers separating each 2 Mo layers. Thus, a new structure is found, which has hexagonal structure with lattice parameters of a=3.034Å, c=18.081Å and space group of P63/mmc (194). The structure does not follow the MAX formula Mn+1AXn, but is related to Mo2GaC. It can be described as a Ga pair replacing Ga in Mo2GaC structure, shifted in opposite directions along the c axis, positioned exactly on top of each other and at 4f positions instead of 2c positions. The final detailed atomic coordinates are obtained by using XRD Rietveld refinement and are listed in Table 1. The highlight of the work is not only finding a new phase, but also giving directions for a potential new family of related structures, on par with the MAX phases.

 

Refs.

1. M. W. Barsoum and M. Radovic, Annu. Rev. Mater. Res. 41, 195 (2011).

2. P Eklund, M Beckers, U Jansson, H Högberg, and L Hultman, Thin Solid Films 518, 1851 (2010).

3. Z Liu, E Wu, J Wang, Y Qian, H Xiang, X Li, Q Jin, G Sun, X Chen, J Wang, and M Li, Acta Mater. 73, 186 (2014).

4. B Anasori, M Dahlqvist, J Halim, EJ Moon, J Lu, B. Hosler, EN Caspi, SJ May, L Hultman, P Eklund,

Johanna Rosen and MW Barsoum, J of Appl. Phys. 118 (2015) 094304.

5. C Hu, CC Lai, QZ Tao, J Lu, J Halim, L Sun, J Zhang, J Yang, B Anasori, J Wang, Y Sakka, L Hultman, P Eklund, J Rosen, and MW.Barsoum, Chem. Commun. 51, (2015) 6560.

 

We acknowledge support from the Swedish Research Council (project grants #621-2011-4420, 642-2013-8020, and 621-2014-4890), the Swedish Foundation for Strategic Research through the Synergy Grant FUNCASE Functional Carbides for Advanced Surface Engineering (CC L., J R., P E., MW B., J H.), the Future Research Leaders 5 Program (P E., J L.), and the ERC Grant agreement [no. 258509] (J R.). The Knut and Alice Wallenberg Foundation supported the Electron Microscopy Laboratory at Linköping University operated by the Thin Film Physics Division.


Jun LU (Linköping, Sweden), Chunfeng HU, Chung-Chuan LAI, Quanzheng TAO, Joseph HALIM, Lars HULTMAN, Per EKLUND, Johanna ROSEN, Michel BARSOUM
08:00 - 18:15 #5728 - MS06-846 Nanograins in polycrystalline ferroelectric Hf0.5Zr0.5O2 films on Si substrate.
MS06-846 Nanograins in polycrystalline ferroelectric Hf0.5Zr0.5O2 films on Si substrate.

Structure of ultrathin ferroelectric Hf0.5Zr0.5O2 films in composites TiN/Hf0.5Zr0.5O2/Si were investigated by TEM, HRTEM, electron diffraction and X-ray EDS in a FEI Tecnai Osiris microscope (200 kV X-FEG field emission gun, 1.2 mm spherical aberration, 1.2 mm chromatic aberration, 0.24 nm resolution at Scherzer defocus and 0.14 nm information limit) and a JEOL ARM 200 F Cold FEG (200 kV, CEOS hexapole type aberration corrector, 0.075 nm resolution at Scherzer defocus and 0.046 nm information limit, -2 mm spherical aberration). JEMS [1] simulation of HRTEM images, TED patterns and HRTEM diffractograms were performed for the phase analysis of the nanograins in the Hf0.5Zr0.5O2polycrystalline film.

Ultrathin Hf0.5Zr0.5O2 films (2.5-2.7 nm thick) were grown by the Atomic Layer Deposition (ALD) technique on the highly doped n-type Si (r=0.005 Ohm×cm) substrates and they possess ferroelectric properties [2]. SAED patterns showed that the polycrystalline film contains grains with monoclinic structure (sp.gr. P21/c) and orthorhombic structure (sp.gr. Pbc21). Ferroelectric behavior was assigned to the presence of the grains with the orthorhombic non- centrosymmetric space group Pbc21.

HRTEM and HRTEM image simulation was done in order to distinguish monoclinic grains from the orthorhombic non-centrosymmetric ones and to find possible mutual orientations for better understanding the growth mechanism. The lattice parameters of both phases are very close and the presence of the orthorhombic phase in the mixture can be revealed due to the 111 ring (d111o=0.296 nm) in the SAED pattern (Fig.1b) which locates between -111 and 111monoclinic reflections (d-111m= 0.316 nm, d111m=0.284 nm). High resolution JEOL ARM 200 F Cold FEG microscope with the Cs corrector allowed us to obtain good-quality HRTEM diffractograms and to find grains with different structures and orientations.

In ultrathin Hf0.5Zr0.5O2 films, adjacent grains of 15-25 nm in size (Fig.1c) with monoclinic and orthorhombic structures are overlapped and nevertheless reveal crystallographic relationships. The monoclinic grain has the zone axis close to [-11 52] which is parallel to the [112] zone axis of the orthorhombic grain (Fig.2) and the monoclinic (13-2) plane is parallel to the orthorhombic (-311) plane creating 6.5 % lattice misfit. The overlapped area of about 5 nm wide is between two grains where two crystals of approximately 1.0 – 1.5 nm thick are superimposed. The HRTEM simulation and structure modeling performed for the conditions used showed good agreement with the experimental HRTEM images (Fig.2).

[1] P.Stadelmann. Java Electron Microscopy Software (JEMS). http://www.jems-saas.ch/.

[2]A.Chernikova, et al.(2016) ACS Applied Materials & Interfaces, DOI: 10.1021/acsami.5b11653.


Elena SUVOROVA (Moscow, Russia), Anna CHERNIKOVA, Sergei ZARUBIN, Andrei ZENKEVICH, Christian RICOLLEAU
08:00 - 18:15 #5743 - MS06-848 Structural investigation, corrosion properties and adhesion behavior of magnetron-sputtered nanocomposite TiC/a:C thin film coatings.
MS06-848 Structural investigation, corrosion properties and adhesion behavior of magnetron-sputtered nanocomposite TiC/a:C thin film coatings.

Due to the continuous rise in living standards, the continued growth of the world population and the development of medical science an ever-increasing need for materials especially suited for bio-implant applications. In case of an implant material a wide variety of parameter (adhesion, corrosion, structural, biological and mechanical properties) to must be considered.  Thus, a TiC / amorphous C (TiC/a:C) nanocomposite thin film as bio-coating was developed by simultaneously depositing Ti and C on TiAl6V4 and Titanium wafers (blasted and unblasted) using DC magnetron sputtering system at room temperature to improve the aforementioned properties. Furthermore, in order to achieve the higher osseointegration, the TiC/a:C thin film was coated with ~500-600 nm thick biogenic HAp coating by electrospraying. The relationship between the structural, mechanical, adhesion and corrosion properties of TiC/a:C nanocomposite thin film was investigated. The film’s composition and morphology were studied by Transmission Electron Microscopy (TEM), X-ray Photoelectron Spectroscopy (XPS) and X-ray Diffraction (XRD). In all cases, combination of columnar TiC nanostructure and thin amorphous carbon was showed (Fig.1a). In the case of Ti content above ~ 18 at%, the presence of the fcc TiC nanocrystals were confirmed by electron diffraction (Fig. 1b.) and by XRD (Fig.2). The mechanical characteristics of the thin film were investigated by nanoindentation technique while the simulated body fluid (SBF) was developed initially to evaluate the surface structural changes of the film. The applied pH was 7.25. The potential changes in the surface structure of the thin film were investigated by Scanning Electron Microscope (SEM) which does not show special structure change in the film’s surface after the corrosion test and the calcination at 900 °C (Fig. 3). The highest hardness ~ 26 GPa and modulus of elasticity ~ 140 GPa was observed in case of the film prepared at ~ 40 at% Ti content which consisted of ~ 20 nm width TiC columns separated by 2-3 nm thin a:C layers. Overall, the results demonstrated that the best choice for a protective nanocomposite coating would be the TiC/a:C thin film with ~60 at% a:C and ~40 at% Ti contents which is sufficiently corrosion-resistant, hydrophobic, nontoxic, biocompatible and mechanically stable.

 

Acknowledgments

Nikolett Oláh thanks to Young Research Fellowship of Hungarian Academy of Sciences (FIKU) for the support. Authors thank to Levente Illés and Endre Zsolt Horváth from MTA EK for the SEM and XRD measurements.


Nikolett OLÁH (Budapest, Hungary), Zsolt FOGARASSY, Attila SULYOK, Eszter SÁFRÁN, Mónika FURKÓ, Tamás CSANÁDI, Katalin BALÁZSI
08:00 - 18:15 #5823 - MS06-850 Scanning electron microscopy study of platinum catalyst gauzes treated in air, ammonia and NH3 in air.
MS06-850 Scanning electron microscopy study of platinum catalyst gauzes treated in air, ammonia and NH3 in air.

     Ammonia oxidation with air on platinum catalyst gauzes is widely used in chemical industry for synthesis of nitric acid. It is well known that during this process the gauzes undergo deep structural rearrangement of surface layers (catalytic etching) leading to a loss of platinum and decrease of catalytic activity. To elucidate the contributions of individual reactions of О2 and NH3 with the platinum surface in the catalytic etching of platinum catalyst gauzes during the NH3 oxidation, we carried out detailed investigation of the surface microstructure of platinum catalyst gauzes treated in air, ammonia, and in the reaction medium (NH3+O2). The platinum catalyst gauzes used in the study were made from a polycrystalline wire with d ≈ 82 μm, with the chemical composition  (in wt.%) 81% Pt, 15% Pd, 3.5% Rh and 0.5% Ru. A laboratory flow reactor made of a quartz tube with the inner diameter of 11.2 mm was used at the feed (ca.10% NH3 in air) flow rate 880–890 l/h, the gauze temperature 860±5 °C and total pressure ca.3.6 bar. The surface microstructure was studied using a scanning electron microscope (SEM) JSM-6460 LV (Jeol) in the modes of secondary electrons (SE) and backscattered electrons (BSE) at beam energy 20 keV.

     Different microstructure of the polycrystalline catalyst wires was observed by SEM after the treatment of the platinum gauzes at T ≈ 860 °C for 50 h in air, ammonia and the reaction medium (ca.10% NH3 in air). A grid structure consisting of dark bands with the width 0.5–1.0 μm located along the grain boundaries separating the surface of bright grains was formed on the surface of the wires during the interaction of platinum gauzes with air (Fig. 1a,b). Increased concentrations of Rh, C and O (22.1, 31.6, 40.1 at.%, respectively) were observed in the dark areas. For comparison, the concentrations of these elements in the bright areas were 5.3, 0.3 and 13.7 at.%, respectively. The grid structure was registered on the wire surface by both the SE and BSE modes. This indicates that such the structure is spreading deep into the bulk of the wire because the depths of the analysis are significantly different in these modes, ≤10 and ~300–500 nm, correspondingly. The grid structure is formed during decomposition of the surface film including the graphite-like layer on the Rh2O3 oxide film covering the surface of the grains and grain boundaries in the bulk of the polycrystalline wire. The surface films are first removed from the surface of the grains and then from the grain boundaries as a result of carbon atom diffusion from these areas to the surface.

     A micrograin structure with 1–30 μm grains was formed on the wires surface during the reaction of NH3 with the platinum catalyst gauzes (Fig. 2a,b). No carbon was observed on the surface of this structure. Apparently, the reaction of ammonia with the carbon and oxide films is very fast leading to the destruction of the surface films on the grain surface and in the grain boundary areas. Fast destruction of the graphite-like and oxide films in the grain boundaries leads to growing the grains to ca.30 μm. A dramatic structural transformation of the surface layer of platinum catalyst gauzes (catalytic etching) with the formation of a rough layer containing microcrystals and porous aggregates with the size as large as 10–20 μm separated by extended voids with the width ca.1–10 μm occurs during the catalytic NH3 oxidation with air (Fig. 3a,b). At T ≈ 860 °C the reaction of gaseous NH3 molecules with Oads atoms at the grain boundaries and other surface defects with the formation of gaseous NO leads to a sufficient local overheating of the surface whith initiates the release of metal atoms on the surface. Pits, pores and facets grow on the surface due to these processes. An intense release of metal atoms from the grain boundaries results in the formation of extended voids between the grains, which are gradually reconstructed into faceted crystalline agglomerates with through pores formed during the growing and merging of pits. A prolonged occurrence of these processes leads to the formation a rough corrosion layer on the wire surface in the platinum catalyst gauzes (Fig. 3a,b).

Acknowledgement

This work was supported by Russian Academy of Sciences and Federal Agency of Scientific Organizations (project 44.1.17).


Aleksei SALANOV (Novosibirsk, Russia), Evgenii SUPRUN, Alexandra SERKOVA, Olga SIDELNIKOVA, Elena SUTORMINA, Lyubov ISUPOVA, Valentin PARMON
08:00 - 18:15 #5827 - MS06-852 Three-dimensional core-shell ferromagnetic nanowires fabricated by focused electron beam induced deposition.
MS06-852 Three-dimensional core-shell ferromagnetic nanowires fabricated by focused electron beam induced deposition.

Functional nanostructured materials often rely on the combination of more than one material to confer the desired functionality or an enhanced performance of the devices. One of the challenges for Focused Electron Beam Induced Deposition (FEBID) technology is the fabrication of three-dimensional (3D) heterogeneous nanostructures which can be applied in magnetic memories, logic and sensing [1]. A novel procedure to create nanoscale heterostructured materials in the form of 3D core-shell nanowires by FEBID technologies has been developed. This new approach has been applied to synthesize standing nanowires with cylindrical metallic ferromagnetic cores of Co- and Fe-FEBID (less than 100 nm thick) coated with a protective Pt-FEBID shell ranging 10-20 nm of uniform thickness, using Co2(CO)8, Fe2(CO)9 and CH3CpPt(CH3)3 precursor gases. This architecture aims at minimizing the degradation of magnetic properties caused by the natural surface oxidation of the core to a non-ferromagnetic material. This is a key issue in such thin ferromagnetic objects with a high surface-to-volume ratio [2].

The structure, chemistry and magnetism of FEBID nanowires with cores of Co and Fe have been characterized in Pt-coated and uncoated nanostructures. Scanning transmission electron microscopy (STEM) imaging and electron energy loss spectroscopy (EELS) experiments have revealed that the surface oxidation is suppressed from the magnetic cores and confined to the Pt layer, while keeping the cylindrical shape of the nanowire (Figure 1). Local magnetic states of uncoated and coated Co- and Fe-FEBID nanowires in remanence have been obtained by off-axis Electron Holography (EH). After substraction of the phase contribution of the mean inner potential and thanks to the cylindrical shape of the cores, quantitative magnetic induction maps have been obtained which demonstrates that the average magnetization of the ultrathin coated cores is strengthened up to 30% in the thinnest nanowires (50-nm-thick cores) with respect to unprotected ones (Figure 2).

 

References:

[1] A. Fernández-Pacheco, et. al. Sci. Rep., 2013, 3, 1492.

[2] L. A. Rodríguez, et. al. Beilstein J. Nanotechnol., 2015, 6, 1319-1331.

 

Acknowledgements:

J. P.-N. grant is funded by the Ayuda para Contratos Predoctorales para la Formación de DoctoresConvocatoria Res. 05/06/15 (BOE 12/06/15) of the Secretaría de Estado de Investigación, Desarrollo e Innovación in the Subprograma Estatal de Formación of the Spanish Ministry of Economy and Competitiveness (MINECO) with the participation of the European Social Fund. Financial support from MINECO through the project MAT2014-51982-C2 and from regional Gobierno de Aragón through project E26 with European Social Fund funding is acknowledged.


Javier PABLO-NAVARRO (Zaragoza, Spain), César MAGÉN, José María DE TERESA
08:00 - 18:15 #5850 - MS06-854 Electron-beam-induced structural phase transition related to oxygen vacancy ordering in epitaxial La2/3Sr1/3MnO3 films.
MS06-854 Electron-beam-induced structural phase transition related to oxygen vacancy ordering in epitaxial La2/3Sr1/3MnO3 films.

Functional oxides with a perovskite crystal lattice of type ABO3 may possess corresponding oxygen-deficient modulation structures, which can be used to tailor material properties including magnetism, ferroelectricity, and superconductivity. One prototypical example is the brownmillerite crystal structure of type ABO2.5 [1-5], which due to its high ionic conductivity could find applications in solid oxide fuel cells, oxygen-separation membranes, gas sensors and other devices requiring anion diffusion. Brownmillerites have been derived from perovskite materials using topotactic reduction [1], optimized film growth [2,3], and oxygen getters [4]. Here, we demonstrate that the evolution of the perovskite-brownmillerite phase transition can be fully controlled and monitored in epitaxial La2/3Sr1/3MnO3 (LSMO) films using electron-beam irradiation in a transmission electron microscope (TEM) [5].

Atomic-scale real-time TEM imaging reveals that the structural transition is driven by an incessant ordering of electron-beam induced oxygen vacancies in every second MnOx plane. This local depletion of oxygen reduces the coordination of Mn cations, causing a vertical displacement of the La/Sr ions. A map of the out-of-plane lattice spacing corroborates this point (Figure 1(b)). Over-irradiation of the brownmillerite phase induces a second transition to a perovskite-like structure with disordered oxygen vacancies and a significantly enhanced out-of-plane lattice compared to the original LSMO film (Figure 1(c)). Additional information on the distribution of oxygen vacancies in the three structural phases of LSMO is obtained by HRTEM under negative Cs imaging (NCSI) conditions [6]. Compared to the original perovskite LSMO (see Figure 2(a) and inset), the NCSI contrast from brownmillerite LSMO (Figure 2(b) and inset) manifests a depletion of oxygen and predominant tetrahedral coordination of Mn in every other MnOx layer. The modulation structure disappears when the LSMO crystal transforms into the oxygen-deficient perovskite-like structure with enhanced out-of-plane lattice parameter (Figure 2(c) and inset). In this case, the oxygen is randomly distributed, which is facilitated by oxygen diffusion from MnO6 octrahedra to MnO4 tetrahedra during the second structural phase transition. Electron energy loss spectroscopy and energy-dispersive x-ray spectroscopy further confirm our findings [5]. 

This work was supported by the Academy of Finland (Grant Nos. 260361 and 252301) and by the European Research Council (ERC-2012-StG 307502). 

     

[1] T. G. Parsons, H. D’Hondt, J. Hadermann, M. A. Hayward, Chem. Mater. 2009, 21, 5527.

[2] Y. M. Kim, J. He, M. D. Biegalski, H. Ambaye, V. Lauter, H. M. Christen, S. T. Pantelides, S. J. Pennycook, S. V. Kalinin, A. Y. Borisevich, Nat. Mater. 2012, 11, 888.

[3] H. Jeen, W. S. Choi, J. W. Freeland, H. Ohta, C. U. Jung, H. N. Lee, Adv. Mater. 2013, 25, 3651.

[4] J. D. Ferguson, Y. Kim, L. Fitting Kourkoutis, A. Vodnick, A. R. Woll, D. A. Muller, J. D. Brock, Adv. Mater. 2011, 23, 1226.

[5] L. D. Yao, S. Majumdar, L. Äkäslompolo, S. Inkinen, Q. H. Qin, and S. van Dijken, Adv. Mater. 2014, 26, 2789.

[6] C. L. Jia, M. Lentzen, K. Urban, Science 2003, 299, 870.


Lide YAO (Espoo, Finland), Sayani MAJUMDAR, Laura ÄKÄSLOMPOLO, Sampo INKINEN, Qi Hang QIN, Sebastiaan VAN DIJKEN
08:00 - 18:15 #5886 - MS06-856 In vivo visualizing the generation of hypochlorous acid using a novel selective fluorescent probe.
MS06-856 In vivo visualizing the generation of hypochlorous acid using a novel selective fluorescent probe.

Introduction Hypochlorous acid (HOCl) is one of the most important reactive oxygen species, and plays a vital role in physiological events and diseases. Many fluorescent probes have been synthesized to detect HOCl. However, most of them were difficult to be distinguished from endogenous fluorophores in biological samples in vivo and can only be employed under one-photon microscopy, often with drawbacks during further application. To enhance the sensing sensitivity and reduce photodamage, we developed a novel iridium(III) complex-based fluorescent probe for in vivo visualizing the generation of HOCl at the cellular level.

Methods A novel iridium(III) complex-based Fc (ferrocene) dual-signaling chemosensor (Ir-Fc) was designed and synthesized as a highly sensitive and selective fluorescent probe for the in vivo recognition and detection of HOCl. The absorption and fluorescent properties were investigated under simulative physiological conditions. It is well documented that during hepatic ischemia-reperfusion (I/R) injury, HOCl is generated by neutrophils and diffuses into hepatocytes, causing oxidant stress-mediated injury. Therefore, we used a BALB/c mouse hepatic I/R injury model to test this probe. DermaInspect system (JenLab GmbH, Jena, Germany) was used for in vivo multiphoton microscopy (MPM) imaging of the liver after injection of 0.2 mL Ir-Fc (50μM) from the portal vein. Systemic toxic effects were evaluated by examining the pathological changes of the major organs of mice.

Results Figure 1A shows the reaction mechanism of the fluorescent response of Ir-Fc toward HOCl. Ir-Fc exhibited a strong positive fluorescent response only in the presence of HOCl, whereas negligible fluorescent signals were observed upon the additions of other reactive oxygen/nitrogen species and metal ions (Figure 1B). The dose-dependent fluorescent enhancement followed a good linear relationship with HOCl concentration (Figure 2). In mouse liver with I/R injury, reduced autofluorescence was detected by MPM, indicating the hepatocyte necrosis (Figure 3D). As shown in Figure 3F, remarkable enhancement of the red fluorescence was observed in hepatocytes with decreased autofluorescence, indicating the reaction of Ir-Fc with endogenous HOCl molecules. No obvious toxic effects were observed in histological examination of major organs after Ir-Fc injection.

Conclusion Ir-Fc has good biocompatibility, low cytotoxicity, high specificity to HOCl, and rapid “off-on” fluorescence. This complex is suitable as an in vivo HOCl detection probeat the cellular level.

Acknowledgements This work was supported by grants from National Health and Medical Research Council (APP1049979).


Haolu WANG (Brisbane, Australia), Germain GRAVOT, Xiaowen LIANG, Camilla THORLING, Run ZHANG, Xin LIU, Michael ROBERTS
08:00 - 18:15 #5904 - MS06-858 MLLS fitting on plasmon pic for mapping hydrides in a Zr alloy with a complex αZr+βZr acicular microstructure obtained by water quenching.
MS06-858 MLLS fitting on plasmon pic for mapping hydrides in a Zr alloy with a complex αZr+βZr acicular microstructure obtained by water quenching.

Zr alloys are used to manufacture fuels claddings in nuclear plants. These tubes have to insure safety and prevent any fuel leak even in severe conditions such as Loss Of Coolant Accident. In such conditions the fuel cladding tubes are submitted to high temperature steam oxidation before core reflooding. This results in an oxidation, α-β phase transformations and partitioning of oxygen/hydrogen in a very complex microstructure (Fig. 1). At 1200°C, the hydrogen has low affinity for α-O and a high solubility in the β phase and most of the hydrogen moves towards the β-phase and is expected to remain in the prior β-phase after quenching. Macroscopic analysis (Elastic Recoil Detection Analysis-ERDA) evidenced hydrogen enrichment of the β-phase and depletion of the α-O. Because of the lack of spatial resolution of this technic, studying sub-micrometric hydrides needles in such complex mixture of α-O, β-Zr phases, highly strained needs to perform TEM (Fig.2). Furthermore, very thin specimens are needed to limit features overlapping in the lamella thickness. The multiphase sample cannot be thinned using electropolishing and has to be prepared using ions. In another hand, the high reactivity of zirconium with hydrogen implies accurate preparation conditions. Any additional hydrides formation during thinning is achievable with a very high vacuum in the thinning devices and with cold traps. This is achieved by a two steps specimen preparation combining Focused Ion bean and low kV Ar+ ions cleaning. A 100-150 nm thick lamella is first extracted using FEI Helios Nanolab Dual Beam at 30kV. We performed post FIB cleaning and thinning in PIPS II from GATAN with Ar ions at 500V during 60 min to eliminate the 20-30 nm amorphous and Ga+ implanted layer on both sides of the samples and to reach a thickness of about 40 nm (Fig.2). Diffraction studies are very complicated and time consuming even on such thin specimens. Based on the difference of plasmon energy of α-O, β-Zr in comparison with hydrides (ζ : 17,3-17,5 eV, γ : 18,3 eV, δ : 19,2 eV and ε : 19,6 eV reported in [1, 2 & 3]), hydrides are identified as the δ-ZrH2 and mapped using on MLLS fitting on plasmon pics. Since α-O and β-Zr phase have the same plasmon energy, the ambiguity between these two allotropic Zr compounds is solved using Fe and Cr mapping by EDXS with Super X detectors in a XFEG TECNAI OSIRIS. The high brightness of the XFEG gun and the high angle collection of the four EDXS detectors allows us to distinguish α-Zr from β-Zr based on their Fe and Cr solubility difference (few percent in β-Zr, and few hundred ppm in α-Zr [4, 5]). Correlation between all these analytical technics and microdiffraction patterns give us the possibility to confirm ERDA analysis concluding that sub-micrometric needles of hydrides, identified as δ-ZrH2, where mainly located at the interface between residual β-Zr and α-Zr (Fig. 3).


Laurent LEGRAS (Moret sur loing), Elodie TORRES, Marie Christine BAIETTO, Jean DESQUINE, Andréa CABRERA-SALCÉDO, Martine BLAT YRIEX
08:00 - 18:15 #5924 - MS06-860 FIB and TEM study of nanometric tribofilm formed on stainless steel during fretting-impact tribologic tests in simulated Pressurized Water Reactor conditions.
MS06-860 FIB and TEM study of nanometric tribofilm formed on stainless steel during fretting-impact tribologic tests in simulated Pressurized Water Reactor conditions.

Wear is one of the degradation mechanism observed on some component of PWR reactor. It was mainly studied based on wear tests in various conditions and SEM observations of wear surface. In this paper we present results obtained by TEM on wear scars observed on cross-sectioned samples. Tribologic tests were performed at two temperatures using a fretting impact tribometer on 304L stainless steel tubes in an aqueous solution similar to the primary circuit fluid presents in Pressurized Water Reactors (PWR). The evolution as a function of number of cycles of the surface of the wear scar at 25°C and 75°C was measured by SEM showing that wear kinetic saturated at 25°C and is higher at 75°C (Fig.1). By modifying acceleration voltage from 3kV to 15kV and by using different detectors in SEM, we showed that a scaling oxide with wear scratches is formed in both conditions covering a surface fraction higher at 25°C than at 75°C (darker areas on backscattered images in Fig.2). Cross sections were extracted from unworn surface and from the center of the wear scars obtained after 20000 cycles using a Helios Nanolab Dual Beam FIB .The tribofilm and underlying metal structure were studied by EELS in a XFEG TECNAI OSIRIS TEM equipped with a Gatan Quantum filtered imaging system. A cold work layer coming from the manufacturing process is observed at the surface of the unworn specimen. It consists in a 500 nm thick outer layer constituted of nanometric grains and inner highly strained grains. We observed that during tribologic tests this layer is evolving being recovered and recrystallized. Because of the initial heterogeneity of strain degree at the outer surface of the tube, it is difficult to conclude on a potential different evolution of the cold work layer as a function of temperature. On those cross sections, both scaling oxide layers, appearing amorphous, and stacks of multilayered compound forming bumps are observed. EDXS and EELS mapping were also performed to study the oxide observed by SEM on the wear scars (Fig. 3). At 25°C, the scaling oxide observed on the surface is found to be amorphous and Cr and Fe rich. Chemical shifts of Cr L2,3 edge and O K Near Edge Structures (NES) evolve from the surface and the interfaces to the centre of this oxide layer whereas Fe L2,3 edge remains unchanged and characteristic of oxidized Fe. This indicates that oxidation state of Cr is changing at interfaces where oxide is scaling. At 25°C, a continuous nanometric and polycrystalline almost composed of pure Ni metal film is also between this oxide areas and locally at Cr oxide/metal interface. Bumps at the wear scar surface observed by SEM are stacks of nanometric Ni metal and more or less oxidised 304L films. At 75°C, the growth of Cr/Fe amorphous oxide and Ni rich film is also observed, but the Cr/Fe rich oxide seems more porous and the Ni enrichment only reaches 40% and is found to be oxidised. Facing wear kinetics measured during tribologic tests, the modification of the tribofilms composition depending on temperature might be the reason of the difference of wear kinetics observed between 25°C and 75°C. This very new results should be implemented by a deeper analysis (via modelling and test samples) of fines structures of 0 and Cr edges to give a better understanding of the competition between oxidation and mechanical wear processes.


Laurent LEGRAS (Moret sur loing), Jean-Louis MANSOT, Guillaume PERILLAT, Andi MIKOSCH CUKA
08:00 - 18:15 #5925 - MS06-862 Deep investigation of antiphase-boundaries defects in rare-earth nickelates.
MS06-862 Deep investigation of antiphase-boundaries defects in rare-earth nickelates.

Transition metal oxides (TMO’s) are highly sensitive systems to external fields due to strong electron correlations and high polarizability of the metal-oxygen bond. This makes it possible to tune their macroscopic properties by inducing slight distortions at their unit cell structure. A paradigmatic example is the rare earth (RE) nickelates, which present a tunable metal-to-insulator transition (MIT) and resistive switching (RS) effect, placing them as a new plausible alternative for current non-volatile memories. Here, we use aberration-corrected Scanning Transmission Electron Microscopy (STEM) combined with Electron Energy Loss Spectroscopy (EELS) to correlate both structure and electrical properties as a function of the RE cation specie (La, Sm, or Nd), substrate mismatch and film thickness. Nanoscale investigations show that Nikelate thin films require chemical and structural reconstructions in the form of antiphase boundaries (APBs) to compensate the mismatch with the substrate. This 2D defect suppresses one Ni-O plane either in the in-plane or in the out-of-plane direction, changing locally the lattice spacing. The APBs landscape is evaluated on RE-nickelate epitaxial thin films grown by chemical solution deposition onto LaAl(LaAlO3)0.3-(Sr2AlTaO6)0.7 (LSAT), SrTiO3 (STO) or LaAlO3 (LAO) substrates with thicknesses that range from 6nm to 50nm, as shown in Figure 1 and 2. This structural study is also complemented with electrical and advanced XRD measurements that reveal a sharp MIT transition which is shifted when substrate, thickness or RE ionic radius is modified.

We acknowledge the financial support from MICINN (COACHSUPENERGY, MAT 2014-51778-C2-1-R, project co-financed by Fondo Europeo de Desarrollo Regional (FEDER).


Bernat MUNDET (Barcelona, Spain), Júlia JAREÑO, Jaume GÁZQUEZ, Juan Carlos GONZÁLEZ, Xavier OBRADORS, Teresa PUIG
08:00 - 18:15 #5943 - MS06-864 Structural, chemical and strain features of misfit dislocation cores in ultrathin La0.7Sr0.3MnO3 epitaxial films deposited on LaAlO3.
MS06-864 Structural, chemical and strain features of misfit dislocation cores in ultrathin La0.7Sr0.3MnO3 epitaxial films deposited on LaAlO3.

Heteroepitaxial interfaces in thin film complex oxides have attracted considerable attention in recent years due to their influence on the physical properties of these materials, in particular due to the possibility of tuning bulk functional properties [1]. The most common strain relaxation mechanism between lattice mismatched heterostructures is the formation of misfit dislocation arrays at the interface. These misfit dislocations play an interesting role as they can form self-organized patterns on the nanometre scale which can behave differently from bulk material [2]. An understanding of the structural and chemical consequences associated with the strain fields of dislocations at oxide interfaces is important as they may determine the functionality of these oxides in ultrathin films and multilayers.

In this work, misfit dislocations in epitaxial films of La0.7Sr0.3MnO3 (LSMO), a half-metal ferromagnet, grown on [001] LaAlO3 (LAO) single crystal substrates were investigated. A detailed study of atomic-scale structural and chemical changes associated with the strain field of dislocations was performed using aberration-corrected scanning transmission electron microscopy (STEM) combined with atomic resolution spectroscopy techniques; electron energy-loss (EELS) spectrum imaging and energy dispersive x-ray (EDS) spectral mapping. Special attention was paid to ultrathin films of only a few nanometers thickness where the strain field of the dislocations affects surface topography and current [3].

A STEM high angle annular dark field (HAADF) of a cross-section of a 7nm film exhibiting dislocated interface is shown in Figure 1a, where spacing between dislocations around 20 nm can be observed. A STEM-HAADF image of the dislocation core structure with the Burgers circuit yielding a Burgers vector bx = aLAO[100], parallel to the interface, is shown in Figure 1b. The lattice strain maps (Figure 1c), taken from the experimental images using the Geometrical Phase Analysis (GPA) method [4], show core splitting in two partials, along with compressive and tensile regions extending into the substrate and the film, respectively. Spectroscopy analyses of cross-sections reveal a chemically rough interface between the substrate and film and show that the dislocations are not located at the interface but one or two unit cells above the interface with the substrate. Analysis of the EELS spectrum images suggest that the lanthanum composition at the vicinity of the dislocation core is enhanced (Figure 2).

These results provide an insight into how the intrinsic strain associated with a defect, in this case misfit dislocations, may produce chemical changes which may be useful in the development of ordered functional patterns in complex oxide thin films.

 

Acknowledgements:

We acknowledge financial support from the Spanish MINECO (MAT2011-29081-C02, MAT2012-33207 and MAT2013-47869-C4-1-P). N. B. thanks to the Spanish MINECO for financial support through the FPI program.

 

References:

[1] D. G. Schlom, et al., J. Amer. Ceram. Soc., 91, 2429-2454 (2008)

[2] M, Arredondo, et al., Adv. Mater., 22, 2430–2434 (2010)

[3] F. Sandiumenge, et al., Advanced Materials Interfaces, under review

[4] M. J. Hÿtch, et al., Ultramicroscopy 74, 131–146 (1998)


Núria BAGUÉS (Manresa, Spain), José SANTISO, Bryan D. ESSER, Robert E. A. WILLIAMS, David W. MCCOMB, Zorica KONSTANTINOVIC, Alberto POMAR, Lluís BALCELLS, Felip SANDIUMENGE
08:00 - 18:15 #6013 - MS06-866 Nanoscale texture analysis of d-HDDR processed Nd-Fe-B powder particles.
MS06-866 Nanoscale texture analysis of d-HDDR processed Nd-Fe-B powder particles.

A strong texture in polycrystalline Nd-Fe-B powder particles processed by dynamic hydrogenation disproportionation desorption and recombination (d-HDDR) method is of importance for enhanced macroscopic magnetic properties [1]. This heavily depends on the processing parameters such as the hydrogen partial pressure [2]. The initial and the final step of the HDDR process has already been extensively studied by electron backscatter diffraction (EBSD) technique in the scanning electron microscope (SEM) [3]. However, for SEM-EBSD analyses, e.g. after the early and full disproportionation step, the spatial resolution as well as the signal of the Kikuchi patterns was not sufficient for a thorough local texture analysis. Therefore, analyses on the nanometer scale have been carried out in a transmission electron microscope (TEM) using orientation and phase mapping via ASTAR/DigiSTAR (“EBSD inside the TEM”). In this case, a spatial resolution of up to one nanometer can be achieved. Data evaluation was carried out using the Matlab® MTEX toolbox yielding, for example, pole figures. Using this technique it is possible to map the phase distribution of α-Fe, NdH2, and Fe2B as well as their texture in order to reveal an inter-phase textural relation during the different HDDR process steps. The current understanding is that solely the Fe2B phase is responsible for the texture transfer. The obtained results for the different process steps and parameters will be interpreted with respect to the existing models and the texture analysis results on α-Fe and NdH2 from ASTAR/DigiSTAR and EBSD will be compared to evaluate the statistical reliability.

[1] H. Sepehri-Amin, T. Ohkubo, K. Hono, K. Güth, and O. Gutfleisch, „Mechanism of the texture development in hydrogen-disproportionation–desorption-recombination (HDDR) processed Nd–Fe–B powders“, Acta Mater., Bd. 85, S. 42–52, Feb. 2015.

[2] K. Güth, J. Lyubina, B. Gebel, L. Schultz, and O. Gutfleisch, „Ultra-fine grained Nd–Fe–B by high pressure reactive milling and desorption“, J. Magn. Magn. Mater., Bd. 324, Nr. 18, S. 2731–2735, Sep. 2012.

[3] K. Güth, T. G. Woodcock, L. Schultz, and O. Gutfleisch, „Comparison of local and global texture in HDDR processed Nd–Fe–B magnets“, Acta Mater., Bd. 59, Nr. 5, S. 2029–2034, März 2011.

 Acknowledgements

The authors acknowledge financial support from the LOEWE research cluster RESPONSE (Hessen, Germany) and MagHem (Japan).


Michael DUERRSCHNABEL, Enrico BRUDER, Konrad GÜTH, Roland GAUSS, Oliver GUTFLEISCH, Leopoldo MOLINA-LUNA (Darmstadt, Germany)
08:00 - 18:15 #6018 - MS06-868 Study of ferroelectric-antiferroelectric phase coexistence in La-doped PZT ceramics.
MS06-868 Study of ferroelectric-antiferroelectric phase coexistence in La-doped PZT ceramics.

Due to their wide applications in microelectromechanical systems and energy storage devices lead zirconate titanate–based antiferroelectrics have a significant technological and commercial importance1,2. It has been already established that in the PbZrO3–PbTiO3 (PZT) solid solution at the Zr-rich end of the phase diagram, an antiferroelectric/ferroelectric (AFE/FE) phase boundary exists3. At this phase boundary, switching from the AFE to the FE state using an applied field or stress induces large effective strains or charges. In order to broaden the phase transition and reduce the free energy difference between the AFE and FE phases these Zr-rich PZT solid solutions are often doped with La, Nb or Sn. Generally doping with La was found to increase the stability range of the antiferroelectric orthorhombic phase. Moreover previous studies have shown that there is a region of coexistence of the AFE/FE phases for La-doped PZT where their functional properties are improved4.

In this study Transmission Electron Microscopy (TEM) was employed in order to investigate in detail the AFE/FE phase coexistence region for a number of Pb1-xLax(Zr0.9Ti0.1)1-x/4O3 (PLZT x/90/10) compositions prepared with the mixed oxide solid state reaction method, with x=0.025, 0.030, 0.032, 0.033, 0.035, 0.040. Previous studies5,6 based on XRD and anelastic and dielectric spectroscopy measurements have suggested for 0 ≤ x < 0.020 a rhombohedral FE phase, for 0.025 ≤ x < 0.035 a phase coexistence region of orthorhombic and rhombohedral phases and for x ≥ 0.035 an orthorhombic AFE phase. The TEM study revealed that all investigated compositions contained grains that in the SAED patterns showed satellite spots along <110>pc directions with a periodicity of 8-9 (110) spacings. These satellite spots are associated with a long-period ordered incommensurate antiferroelectric structure. The incommensurate modulations spots along the <110>pc shown in the SADPs can be expressed as ha* + kb* + lc* ± 1/n(a*+ b*). For lower La-content (x=0.025, 0.030) also grains that do not contain the incommensurate antiferroelectric phase at all have been found suggesting chemical inhomogeneity. On the other hand, for higher La-content (x > 0.030) all investigated grains presented the incommensurate modulated spots. For these compositions most grains presented a multi-domain configuration with alternating AFE-FE domains as shown in Fig. 1(a). Domains denoted with odd numbers (1, 3, 5) are AFE while domains denoted with even numbers (2, 4) are FE. The presence of satellites spots in the DP pattern of AFE domains is always accompanied by the presence of stripes in the BF and DF images, perpendicular to the direction of the spots as seen in Fig. 1(b) and (c). Based on these results for the investigated samples, La-dopant  impurities may only induce a competition between the antiferroelectric and ferroelectric ordering due to the disruption of long-range dipolar interactions.

References

1 G. H. Haertling, Ferroelectrics, 75, 25-55 (1987).

2 X. Hao, J. Zhai, L. B. Kong and Z. Xu, Progress in Materials Science, 63, 1–57 (2014).

3 T. Asada and Y. Koyama, Physical Review B 70, 104105 (2004).

4 J. Knudsen, D.I. Woodward and I. M. Reaney, J. Mater. Res., Vol. 18, No. 2, (2003).

5 F. Craciun, F. Cordero, I. V. Ciuchi, L. Mitoseriu, and C. Galassi, Journal of applied physics 117, 184103 (2015).

6 I.V. Ciuchi, F. Craciun, L. Mitoseriu, C. Galassi, Journal of Alloys and Compounds 646, 16-22 (2015).

Acknowledgments

The Knut and Alice Wallenberg (KAW) Foundation is acknowledged for providing the electron microscopy facilities and financial support under the project 3DEM-NATUR.


Alexandra NEAGU (Stockholm, Sweden), Ioana Veronica CIUCHI, Liliana MITOSERIU, Carmen GALASSI, Cheuk-Wai TAI
08:00 - 18:15 #6048 - MS06-870 Direct holographic depth- and lateral- imaging of nanoscale magnets generated by ion impact.
MS06-870 Direct holographic depth- and lateral- imaging of nanoscale magnets generated by ion impact.

The alloy Fe60Al40 is described by a paramagnetic B2 structure in its ordered phase, which transforms into a ferromagnetic A2 structure by chemical disordering that can be induced locally by ion irradiation [1,2]. This mechanism allows writing arbitrary magnetic nanostructures on paramagnetic thin films e.g. by means of a focused ion beam available in novel scanning ion microscopes. However, reproducible fabrication of nanoscale magnets requires knowledge about the depth and lateral distribution of the induced magnetization in dependence on irradiation parameters.

Off-Axis Electron Holography provides suitable insights by revealing the local distribution of the projected magnetic flux density with nanometer resolution [3]. By means of the coherent superposition of an electron wave passing through the object with one passing through vacuum, interference fringes can be formed at the detector plane encoding the amplitude and phase of the electron wave. The phase of an electron wave shifted by electric and magnetic fields of the object permits direct field mapping at the nanometer scale.

In cross-sectional samples of irradiated thin films, we studied the effect of the kinetic ion energy ranging from 5-30 keV on the depth distribution of the induced magnetization [4]. In agreement with irradiation damage simulations [2], we found a magnetized film adjacent to the ion entrance surface growing in depth with increasing kinetic ion energy. We conclude that a homogeneous magnetization depth distribution in a 40 nm thick film requires a kinetic Ne+ ion energy of at least 20 keV. The resolution of the ion beam nano-pattering is mainly limited by the effect of lateral ion scattering blurring the magnetization distribution at the pattern edges. To study this effect, we fabricated 500 nm wide magnetized stripes separated by non-ferromagnetic (i.e. non-irradiated) spacers (Fig. 1) using a focused Ne+ ion beam (2 nm probe size) at 25 keV in a helium ion microscope [5]. The flux distribution at the stripe facets is an indicator for the effect of lateral scattering but is difficult to directly interpret in terms of magnetization because of the superposition with stray fields. Therefore, we applied a magneto-static model for the field distribution around the nanoscale magnet as a function of the magnetization blurring, which returns a width of lateral scattering of about 20 nm fitting best to experimental results [4].

[1] J Fassbender et al, Phys. Rev. B 77 (2008) 174430.

[2] R Bali et al, Nanoletters 14 (2014) 435-441.

[3] H Lichte et al, Rep. Prog. Phys. 71 (2008) 016102.

[4] F Röder et al, Sci. Rep. 5 (2015) 16786.

[5] G Hlawacek et al,  J. Vac. Sci. Technol. B 32 (2014) 020801.

 

Acknowledgments

 

We thank the Ion Beam Center at Helmholtz-Zentrum Dresden-Rossendorf for providing the necessary facilities. The research leading to these results has received funding from the European Union Seventh Framework Programme under Grant Agreement 312483 - ESTEEM2 (Integrated Infrastructure Initiative- I3).


Falk RÖDER (Dresden, Germany), Gregor HLAWACEK, Sebastian WINTZ, René HÜBNER, Lothar BISCHOFF, Hannes LICHTE, Kay POTZGER, Jürgen LINDNER, Jürgen FASSBENDER, Rantej BALI
08:00 - 18:15 #6148 - MS06-872 Magnetic coupling of 4f and 3d moments by EMCD: application to DyFe2-based superlattices.
MS06-872 Magnetic coupling of 4f and 3d moments by EMCD: application to DyFe2-based superlattices.

            The emerging technique EMCD, Energy-Loss Magnetic Chiral Dichoism, aims to measure the element-specific magnetic moment of solids at a nanometer scale using electron energy-loss spectroscopy in a transmission electron microscope (TEM) [1-3]. The magnetic moment information is carried in the electron energy-loss spectra obtained from two specific positions of particular electron diffraction patterns. In the last few years, EMCD has been extensively applied to probe 3d moments in 3d transition metal. Our work explores its application to both 4f moment and 3d moment by investigating Dy-M4,5 edges and Fe-L2,3 edges respectively  in DyFe2/YFe2 superlattice.

            As illustrated in figure 1, DyFe2 and YFe2 layers appear alternatively to form a superlattice with a specific bilayer repeat distance. Both DyFe2 and YFe2 crystalize in the same structure, making the superlattice actually a single crystal. For EMCD experimental setup, a specific three-beam condition has been settled in the TEM to detect the signals of Fe-L2,3 edges and Dy-M4,5 edges in the same condition. Spectra and dichroic signals are shown in figure 2. The influence of the dynamic diffraction effect on the Fe-L3 and Dy-M5 EMCD signal amplitudes is precisely analyzed, and it will be shown in this presentation that the opposite sign of these two peaks unambiguously proves the antiparallel alignment of net Fe 3d and Dy 4f moments. In addition, EMCD sum rules specified for M4,5 edges have been derived and their application conditions to Dy-M4,5 edges will be discussed in detail.

            This work evidences that the EMCD technique is an effective tool to probe 4f moment and to study magnetic moment coupling in magnetic materials.

 

[1]. Schattschneider, P. et al. Nature 441, 486–488 (2006).

[2]. Warot-Fonrose, B. et al. Ultramicroscopy 108, 393–398 (2008).

[3]. Fu, X. et al. Phys. Rev. B, in Press, (2016)

 

Acknowledgement: This work is supported by the French national project EMMA (ANR12 BS10 013 01) and by the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative Reference 312483-ESTEEM2.


Xiaoxiao FU (Toulouse), Bénédicte WAROT-FONROSE, Karine DUMESNIL, Rémi ARRAS, Virginie SERIN
08:00 - 18:15 #6149 - MS06-874 Controlling the grain size of polycrystalline TiO2 films grown by atomic layer deposition.
MS06-874 Controlling the grain size of polycrystalline TiO2 films grown by atomic layer deposition.

Titanium dioxide (TiO2) is a widely used material for photocatalytic, optical, electrical and medical applications. Atomic layer deposition (ALD) represents an excellent technique for the synthesis of thin films due to its precise thickness control, simplicity, high conformity of obtained films and reproducible growth of defect-free films.

It was shown recently that photo-catalytic TiO2 films grown on cellulose-based and porous substrates can be used in water purification systems [1]. Its photo-catalytic activity strongly depends on the crystal structure and the grain size of the film, i.e. the TiO2 films must have a well-defined anatase phase with large polycrystalline grains [2]. It was recognized that plasma enhanced ALD (PEALD) growth of the TiO2 film can produce the anatase phase even at low deposition temperatures [3]. This result is important for the growth of thin polycrystalline films on temperature-sensitive materials, such as organic substrates. On the other hand, the grain size is shown to depend critically on the type and the morphology of substrates [4].

We have investigated the effects of thin intermediate layers, grown by ALD on silicon substrates, on the grain size of the TiO2 films, grown by thermal ALD and PEALD technique in a wide temperature range, from room temperature up to 300oC. Amorphous TiO2 films were obtained with thermal ALD for temperatures below 150oC, while the anatase phase with crystalline aggregates has been identified on films synthesised with PEALD at low temperatures. We show that the size of crystallites can be greatly enlarged if grown on an intermediate layer of amorphous Al2O3. The films were characterised by a range of analytical techniques, including scanning electron microscopy with energy dispersive x-ray spectroscopy, secondary ion mass spectrometry, x-ray photoelectron spectroscopy and x-ray diffraction.

References

[1] M. Knez, K. Nielsch, L. Niinistö, Adv. Mater. 19, 3425 (2007).

[2] J. G. Chen, Surf. Sci. Rep. 30, 1 (1997).

[3] S. Ratzsch, E.-B. Kley, A. Tünnermann, A. Szeghalmi, Nanotechnology 26, 024003, (2015).

[4] R. L. Pruurunen, et al., J. Nanosci. Nanotechnol. 11, 8101 (2011).


Ivna KAVRE PILTAVER (Rijeka, Croatia), Ivana JELOVICA BADOVINAC, Iva SARIC, Robert PETER, Gabriela AMBROZIC, Ales OMERZU, Mladen PETRAVIC
08:00 - 18:15 #6169 - MS06-876 Strain-structure-property relation in Co-super tetragonal BiFeO3 heterojunctions.
MS06-876 Strain-structure-property relation in Co-super tetragonal BiFeO3 heterojunctions.

Bismuth ferrite (BiFeO3) has received a lot of attention as a rare multiferroic material showing simultaneous ferroelectric and antiferromagnetic orders at room temperature. Strain engineering offers a new avenue to tune the coupling between various orders, and provides access to some new crystalline phases, which are not stable in bulk BiFeO3 (BFO). The super tetragonal phase (T-phase) with a giant axial ratio (c/a~1.27) is one such strain engineered phases, obtained through a biaxial compressive strain on BFO (>-4%) [1]. This phase exhibits a large polarization (~150 µC/cm2) that was exploited for applications such as ferroelectric tunnel junctions with colossal electroresistance [2]. The interface between ultrathin films of T-phase BFO and the bottom electrode of (Ca,Ce)MnO3 has been thoroughly investigated recently [Marinova et al. Nano Lett. 15, 2533-2541 (2015)]. However, the interface between the ferroelectric and the top electrode of Co used in devices remains to be investigated. 

In this context, we synthesized Co-BFO-CCMO heterostructures using pulsed laser deposition on the (001) surface of three different substrates (NdGaO3, LaSrGaO4, YAlO3). Structural details were probed and compared through high resolution STEM imaging in both annular bright field (ABF) modes to obtain information about lighter atoms, and in high angular annular dark-field modes. Furthermore, by correlating local chemical information obtained from STEM EELS, with ABF STEM images, we detect features that are consistent with the existence of oxygen vacancies in ultrathin T-phase BiFeO3. We also investigated the interface quality between Co and T-BFO using EELS and EDX, and correlate these observations with our transport measurements.

 

1. B.Dupe, I.C.Infante, et al., Phys. Rev. B, 81, pg: 144128 (2010)

2. H.Yamada, V.Garcia et al., ACS Nano, 7, pg: 5385 (2013)


Pavan NUKALA (Massy-Palaiseau), Anke SANDERS, Cecile CARRETERO, Stephane FUSIL, Agnes BARTHELEMY, Brahim DKHIL, Vincent GARCIA, Manuel BIBES
08:00 - 18:15 #6172 - MS06-878 Impact of high energy electrons on nitrides for nanocathodoluminescence.
MS06-878 Impact of high energy electrons on nitrides for nanocathodoluminescence.

Nitride quantum well (QW) light emitting diodes (LEDs) exhibit high efficiencies relative to traditional lighting sources. The quantum wells serve to confine carriers and lead to higher device efficiencies. To achieve the highest device efficiencies requires optimisation of the active quantum wells and hence experimental observations of the structural and optical characteristics. Recently, by imaging the cathodoluminescence (CL) in a scanning transmission electron microscope (STEM), the structural and optical properties were correlated with a spatial resolution of a few nanometres [1], an approach referred to as nanoCL. NanoCL has also been used to reveal quantum confinement in high brightness LEDs [2], and optimise the device structure to achieve the highest device efficiency.

 

Whilst the improved spatial resolution associated with nanoCL can reveal optical characteristics on the nanoscale, the higher electron energies can lead to structural damage. Here we investigate the effect of high energy electrons on the luminescent intensity. An exponential decline in the luminescent intensity is observed over time with exposure to the electron probe. Spectral time profiles are performed over a range of accelerating voltages from 80 to 200 keV to study the variation in the luminescence with the electron energy. We observe that the luminescent intensity is substantially more stable at lower accelerating voltages and predict a threshold for damage below which there is no damage. NanoCL can thus potentially provide a reliable approach to the study of functional optoelectronic devices.

[1] L.F. Zagonel, S. Mazzucco, M. Tencé, K. March, R. Bernard, B. Laslier, G. Jacopin, M. Tchernycheva, L. Rigutti, F.H. Julien, R. Songmuang, and M. Kociak, Nano Lett. 11, 568 (2011).

 [2] J.T. Griffiths, S. Zhang, B. Rouet-Leduc, W.Y. Fu, A. Bao, D. Zhu, D.J. Wallis, A. Howkins, I. Boyd, D. Stowe, M.J. Kappers, C.J. Humphreys, and R.A. Oliver, Nano Lett. 15, 7639 (2015).


James GRIFFITHS (Cambridge, United Kingdom), Siyuan ZHANG, Jeremy LHUILLIER, Dandan ZHU, David WALLIS, Ashley HOWKINS, Ian BOYD, David STOWE, Colin HUMPHREYS, Rachel OLIVER
08:00 - 18:15 #6207 - MS06-880 The influence of Yb and Bi doping on the thermoelectric properties of Mg2Si0.4Sn0.6 studied using transmission electron microscopy.
MS06-880 The influence of Yb and Bi doping on the thermoelectric properties of Mg2Si0.4Sn0.6 studied using transmission electron microscopy.

Current research in thermoelectric materials is focused on increasing the figure of merit ZT=(S2σ/κ)T (where S is the Seebeck coefficient and σ is the electrical conductivity) by maximizing the power factor PF (S2σ) and/or minimizing the thermal conductivity (κ). Attempts to maximize the PF include the development of new materials and optimization of existing materials by doping and nano-structuring. A reduction in thermal conductivity can be achieved by alloying, by producing disordered or complex unit cells or by nanostructuring. Here, we investigate a Bi-doped and a Bi- and Yb- doped Mg2Si0.4Sn0.6 alloy. We discuss the influence of composition, crystal structure and microstructure on the thermoelectric performance of the materials, in order to assess new opportunities for enhancing the performance of bulk nano-structured composite materials.

 Samples were produced by powder metallurgical processes, starting from a stoichiometric mixture of a melt-spun Mg or Mg-Yb pre-alloy and Si, Sn and Bi powders. After performing high energy milling to mix the components homogeneously under a protective Ar atmosphere, the material was simultaneously compacted and synthesized during a FAST process.

 Pure Mg2Si0.4Sn0.6 is an n-type semiconductor with a low value of  σ. S is negative between room temperature and 600 °C. σ increases approximately linearly with Bi concentration. An optimized doping content leads to a value for σ of 140000‑180000 S/m and a value for S of ‑150 µV/K at room temperature. Strong doping results in degeneracy of the semiconductor. Therefore, σ decreases with temperature, while S increases. The temperature dependence of κ shows two “branches”. In samples that have an optimized Bi doping concentration, κ decreases from room temperature to approximately 400 °C due to a dominant phonon-phonon scattering mechanism, with a minimum of 2 W/mK. At higher temperatures, thermal excitation of charge carriers across the band gap increases κ. Bi-Yb-doped Mg2Si0.4Sn0.6 shows a larger ZT than the Yb-free sample.

We prepared specimens for high-resolution transmission electron microscopy (HRTEM) using an FEI Helios Nanolab 400s focused ion beam (FIB) dual-beam system. HRTEM images were acquired at 300 kV using an FEI Titan 80-300 TEM equipped with a spherical aberration (Cs) corrector on the objective lens. High-angle annular dark-field (HAADF) scanning TEM (STEM) images and elemental maps were acquired at 200 kV on an FEI Titan G2 80-200 TEM equipped with a Cs corrector on the condenser lens system.

 An inspection of the microstructures of the materials by TEM reveals a homogeneous Mg2Si0.4Sn0.6 matrix and a similar grain size distribution in both samples. The average grain sizes are in the range 1‑3 μm, which shows that an improvement in the thermoelectric properties of the Bi- and Yb- doped alloy cannot be attributed to grain size. High spatial resolution energy-dispersive X-ray spectroscopy (EDXS) shows that the elemental distribution inside the grains differs from that at the grain boundaries. Our results show that Yb does not form a solid solution with Mg2Si0.4Sn0.6, but instead forms distinct grains by reacting with Bi and Sn. The formation of Bi-rich precipitates in Bi- and Yb- doped Mg2Si0.4Sn0.6 reduces the Bi content in the otherwise homogeneously doped matrix. Some oxygen enrichment in the region of the grain boundaries, associated with the formation of MgO and SiOx, was observed in both samples. Sn and Si nanoscale precipitates were detected in the Bi-doped sample.

Acknowledgment: The authors are grateful to the German Science Foundation (DFG) for funding through the collaborative project SPP 1386.[r1] 

 [r1]shall not exceed 4800 characters


Maryam BEIG MOHAMADI (Aachen, Germany), Amir Hossein TAVABI, Rafal Edward DUNIN-BORKOWSKI, Georg PÖHLE, Vicente PACHECO
08:00 - 18:15 #6216 - MS06-882 Towards Conductivity Measurements in Battery Materials Using Scanning Electron Microscopy.
MS06-882 Towards Conductivity Measurements in Battery Materials Using Scanning Electron Microscopy.

There are several ways of determining the conductivity of bulk materials, especially known in the field of solid state physics [1]. The most commonly used procedure is a four-point-probe measurement. By applying voltage on two of the probes, a current can be measured with the remaining two probes.

We introduce a new method for determining the conductivity of battery electrode materials such as graphite using an SEM. A constant current of electrons is injected into a specimen by the electron beam. A  Pt pad which is sputtered on the specimen surface is contacted with a micromanipulator. (cf. fig. 1). The specimen itself serves as a current divider (cf. fig. 2). The beam current is diminished by the secondary and backscattered electron current and is thus

Iin = I0 - ISE - IBSE (1)

The absorbed current, measured with a picoammeter via the micromanipulator, and the transmitted current, measured with a second picoammeter, sum up to the total effective injected current

Iin = Iabs + Itrans (2)

To spatially resolve the electrical conductivity [2] of the battery electrodes, the electron beam is scanned parallel to the rectangular Pt pad in various distances. The specimen itself is of constant thickness which allows us to assume the resistance R2 along the height axis of the specimen to be constant (cf. fig. 3). The absorbed current Iabs can be expressed in dependence of the distance d between the electron probe and the Pt pad as

Itrans(d) = IinR2*((ρd/A) + R2)-1 (3)

By varying the distance d we extrapolate the resistivity ρ and therefore the conductivity of the material. A is the contact area between the Pt pad and the specimen surface. It can either be measured directly or also extrapolated from eq. 3.

In a first step, it is necessary to measure the effective electron beam current  remaining in the sample (cf. eq. 1). Therefore it is crucial to quantitatively determine the secondary electron and backscattered electron current. The secondary electron yield is highly dependent of the sample topography. Thus, one of the preconditions is to observe samples with identical topography and measure experimentally the absorbed current. To obtain identical sample topographies, a Focused Ion Beam (FIB) system is used. This makes it possible to polish the sample surface and get plane topographies. The experimental results of ISE and IBSE can be cross-checked using Monte-Carlo simulations.

The use of a Gas Injection System (GIS) allows for sputtering platinum contacts on top of the specimen. We use these platinum pads as contact areas [3] for micromanipulators to read out absorbed currents.

We introduce the basic principle of measuring currents in an SEM using this new technique and show first results for state-of-the-art Li-Ion battery electrodes.

 

[1] Sun, Ling; Wang, Jianjun; Bonaccurso, Elmar (2013): „Conductivity of individual particles measured by a microscopic four-point-probe method“. In: Sci. Rep. 3.

[2] Park, Myounggu; Zhang, Xiangchun; Chung, Myoungdo u. a. (2010): „A review of conduction phenomena in Li-ion batteries“. In: Journal of Power Sources. 195 (24), S. 7904-7929.

[3] Marlow, Gregory S.; Das, Mukunda B. (1982): „The effects of contact size and non-zero metal resistance on the determination of specific contact resistance“. In: Solid-State Electronics. 25 (2), S. 91-94.


Sebastian STURN (Ulm, Germany), Ute GOLLA-SCHINDLER, Jörg BERNHARD, Manfred RAPP, Mario WACHTLER, Ute KAISER
08:00 - 18:15 #6270 - MS06-884 Analytical STEM Study of Dy-doped Bi2Te3 Thin Films.
MS06-884 Analytical STEM Study of Dy-doped Bi2Te3 Thin Films.

Breaking the time-reversal symmetry (TRS) in three-dimensional (3D) topological insulators (TIs) [1,2] is crucial for unlocking exotic physical states and exploring possible device application. Doping the prototypical 3D-TI Bi2Te3 with transition metal ions can lead to ferromagnetic ordering at low temperatures [3,4]. We present the study of incorporation of dysprosium (Dy) into Bi2Te3 with the intent to achieve higher ferromagnetic ordering temperatures and higher magnetic moments [5].

 

Dy-doped thin films were grown on c-plane sapphire substrates by molecular beam epitaxy (MBE) [6]. Samples with a Dy concentration of x ≤ 0.113 were selected for high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) and energy-dispersive X-ray spectroscopy (EDX-) STEM investigations [5]. A (Dy0.113Bi0.887)2Te3 film was carefully detached from the substrate using a droplet of glue, and thin TEM lamellae were cut in cross-sectional geometry using an ultramicrotome. Thin sections were obtained using an oscillating water-filled diamond knife to cut approximately 40 nm thick slices that were captured on Cu grids covered with a lacey carbon film.

 

A high crystallinity (Dy0.113Bi0.887)2Te3 thin film acquired at 60 kV is shown in an HAADF-STEM image in Figure 1. The characteristic crystal structure consisting of stacked quintuple layers separated by van der Waals gaps is clearly recognizable. A higher magnification HAADF-STEM image with the overlaid structural model is presented in Figure 2a. EDX line-scans were acquired traversing the van der Waals gap between the adjacent quintuple layers (see arrow in Fig. 2a). The corresponding intensity profiles of Bi-M, Te-L and Dy-L X-ray emission lines along the arrow (in Figure 2a) are presented in Figure 2b. The intensity of the Dy-L signal is precisely following the Bi-M signal, indicating the substitutional incorporation of Dy atoms on Bi sites and the absence of Dy in the van der Waals gaps. No evidence for cluster formation or local phase segregations could be detected [7].

 

References:      

[1] CL Kane and EJ Mele, Phys Rev Lett 95 (2005), 146802.

[2] BA Barnevig et al., Science 314 (2006), 1757.

[3] J Choi et al., Phys Stat Sol (b) 241 (2004), 1541.

[4] Y Chen et al., Science 329 (2010), 659.

[5] SE Harrison et al., Sci Rep 5 (2015), 15767.

[6] SE Harrison et al., J Phys: Condens Matter 27 (2015), 245602.

[7] The research leading to these results has received funding from the European Union Seventh Framework Program [FP/2007-2013] under grant agreement No. 312483 (ESTEEM2).


Vesna SROT (Stuttgart, Germany), Piet SCHÖNHERR, Birgit BUSSMANN, Sara E. HARRISON, Peter A. VAN AKEN, Thorsten HESJEDAL
08:00 - 18:15 #6286 - MS06-886 3D-TEM microstructure analyses of anisotropic and isotropic aerogels of TiO2 nanoparticles.
MS06-886 3D-TEM microstructure analyses of anisotropic and isotropic aerogels of TiO2 nanoparticles.

Aerogels are fascinating materials with low density and high surface area with great application potential in battery materials, fuel- and solar cells and many more.(1-3) These porous structures are conventionally prepared by sol-gel chemistry and subsequent supercritical drying.(4) In the case of TiO2 nanoparticles, the ability of the crystalline nanoparticles to undergo oriented attachment is fundamentally important for the self-assembly into three-dimensional interconnected networks. Such structures (Fig.1) are prepared by destabilizing highly concentrated dispersions of well-defined TiO2 nanocrystals. The gelation results in a percolating network of ultrafine structures which is preserved by supercritical drying. This processing technique allows for the preparation of crystalline, isotropic and translucent aerogels with broad pore size distributions and disordered pore arrangements (Fig.1).(5)

The aim of our study is to produce structures from destabilized dispersions and subsequent unidirectional freeze-drying. Compared to the aerogel route, this process results in a different macro- and microstructure consisting of about 3 µm large units of compacted aerogel structures. Here, the pores are of a more ordered nature due to the freeze drying procedure.

In this work, aerogels prepared by supercritical drying and structures made via freeze-drying were analyzed microstructurally. Using TEM tomography, we study the morphology of the 3D networks of the nanocrystals within both structures. Critical performance parameters like pore size, connectivity and tortuosity of those structures are analyzed.

 

  1. Lawrence W. Hrubesh, Journal of Non-Crystalline Solids, 1998, 225, 335.
  2. F. Rechberger, G. Ilari and M. Niederberger, Chem. Commun., 2014, 50, 13138.
  3. N. Gaponik, A.-K. Herrmann and A. Eychmüller, J. Phys. Chem. Lett., 2011, 3, 8.
  4. F. J. Heiligtag, M. D. Rossell, M.J. Süess and M. Niederberger, J. Mater. Chem, 2011, 21, 16893.
  5. F. J. Heiligtag, et al., Nanoscale, 2014, 6, 13213.

Fabian GRAMM (Zurich, Switzerland), Elena TERVOORT, Alla SOLOGUBENKO, Clara MINAS, Felix RECHBERGER, Florian BOUVILLE, Andre STUDART, Markus NIEDERBERGER
08:00 - 18:15 #5110 - MS07-888 Investigation of the near fields of sputtered Au thin films, used for surface enhanced Raman spectroscopy, using the AFM and DDA.
MS07-888 Investigation of the near fields of sputtered Au thin films, used for surface enhanced Raman spectroscopy, using the AFM and DDA.

Surface enhanced Raman spectroscopy (SERS) is a powerful technique that uses metal nanostructures (Au, Ag, Cu) to gain in the best case single molecule sensitivity [1], because these nanostructures give rise to a huge enhancement of the Raman signal of molecules in their immediate vicinity. Most of the enhancement is attributed to the enhancement of the electric field near the surface of the metal, because the Raman signal in this case scales approximately proportional to the fourth power of the electric filed strength [2]. Therefore a good knowledge of both the geometry of the metal nanostructure and the electric near field it causes is crucial for the understanding of a SERS-substrate.

 

A combination of AFM and the discrete dipole approximation (DDA) is a promising approach for a better understanding of solid SERS substrates. Using the AFM the geometry of a nanostructure on a flat substrate or a structured surface can be measured very accurately and the DDA is a well-established method for solving scattering problems for arbitrary shapes, which makes little assumptions about the sample other than the target geometry [3]. Furthermore, using the FFT-accelerated DDA a very large number of dipoles (>106) can be simulated on a desktop computer [4], allowing for a discretization of comparatively large scatters on a nm scale.

 

We have written a Matlab program that uses the DDA to calculate the near field from a given AFM image of a nanostructure composed of a single material. The incident field and dielectric constant of the material can be chosen arbitrarily. We have tested the program against Mie theory (fig. 1) and shown that the error of the electric field strength is reasonably small two discretization steps away from the surface (fig.2). The average error of the electric field strength two discretization steps away from the surface is smaller than 5 % (fig.2), with the maximum error being smaller than 10 % (fig.1; apart from the strip around x=0, where the relative error appears large due to |EMie|≈0, but the absolute error is actually very small).

 

This program is used to simulate SERS substrates, produced by sputtering thin Au-films on glass slides (fig. 3). These substrates give rise to small but regular (across the substrate) enhancement with enhancement factors of the order of 102 – 103. Our goal is to demonstrate the feasibility of using AFM based DDA simulations to study near field enhancement, by predicting the enhancement factors of several substrates.

 

Literature:

[1] Xu, H., Bjerneld, E.J., Käll, M. and Börjesson, L. (1999), Spectroscopy of Single Hemoglobin Molecules by Surface Enhanced Raman Scattering, Phys. Rev. Lett. 83, 4357

 

[2] Garcia-Vidal, F.J. and Pendry, J.B. (1996), Collective Theory for Surface Enhanced Raman Scattering, Phys. Rev. let. 77, 1163

 

[3] Yurking, M.A. and Hoekstra, A.G. (2007), The discrete dipole approximation: an overview and recent developments, Journal of Quantitative Spectroscopy and Radiative Transfer, 106(1), 558-589

 

[4] Goodman, J.J., Flatau, P.J. and Draine, B.T., Application of the fast-Fourier-transform techniques to the discrete-dipole approximation, Optics Letters 16(15), 1198-1200


Harald FITZEK (Graz, Austria), Jürgen SATTELKOW, Peter PÖLT
08:00 - 18:15 #5878 - MS07-890 Angle-resolved cathodoluminescence polarimetry on plasmonic nanostructures.
MS07-890 Angle-resolved cathodoluminescence polarimetry on plasmonic nanostructures.

Plasmonic metamaterials and metasurfaces have the ability to influence the propagation, confinement, and emission of light on a deep-subwavelength scale. Many of the optical properties of such materials are encoded in the spectrum, the angular intensity distribution, and the polarization of the far-field emission. Angle-resolved cathodoluminescence (CL) imaging spectroscopy (ARCIS) is a powerful platform for studying these properties, as it combines nanoscale excitation resolution, with the capability to measure both spectra and the angular emission intensity distribution. In particular, we use a 30 keV electron beam as a well-defined broad-band excitation source which is sensitive to the optical density of states. This method has been used to study the spectral and angular optical properties of a large variety of dielectric and plasmonic nanostructures. However, thus far we were only able to measure emission intensities and had to disregard the vectorial polarization nature of the light emission. The emission polarization contains valuable information, which can be used to identify multipoles, separate TM and TE modes in waveguides, characterize the coherence of an emission source etc.

Here, we demonstrate a novel CL polarimetry technique in which we retrieve the Stokes vector, i.e. the full polarization state of the far-field emission, as function of angle [1]. To that end, we extend our setup to include a quarter-wave plate (QWP) and a linear polarizer in the beam path (see Figure 1 for a schematic representation of the setup). By taking six measurements with the appropriate combinations of QWP and polarizer angle we retrieve the polarization distribution in the detection plane. By applying a correction for the aluminum parabolic mirror optic we then find the emission polarization distribution.

This approach is applied to gold plasmonic bull’s eye gratings  which were fabricated using focused-ion-beam milling in a single-crystal gold substrate (see Figure 2(a) for an SEM image). These bull’s eyes can coherently couple out the Surface Plasmon Polaritons (SPPs) that are excited by the electron beam. Because the electron beam can be positioned at will, we can study the effect of exciting the bull’s eye at different positions. For central excitation, the grating is driven in phase leading to an azimuthally symmetric pattern and a radial polarization distribution, as expected from symmetry (see Figure 2(b-c)). However, when we excite off-center the patterns become significantly more complex, showing multiple lobes and alternating regions in angular space in which the polarization goes from circular to linear. To demonstrate the applicability to chiral structures, we move to spiral bull’s eyes with different handedness, and show that their chirality is reflected in the field distributions. The validity of the polarimetry technique is verified by measuring transition radiation which has a characteristic radial polarization distribution, similar to a vertical dipole source. This work paves the way for polarimetry measurements on a myriad of metallic and semiconductor nanophotonic geometries for characterization and better understanding of their optical properties.

 [1] C. I. Osorio, T. Coenen, B. J. M. Brenny, A. Polman, and A. F. Koenderink, ACS Photonics 3, 147−154 (2016)

 


Toon COENEN (Delft, The Netherlands), Clara OSORIO, Benjamin BRENNY, Albert POLMAN, Femius KOENDERINK
08:00 - 18:15 #6088 - MS07-894 Plasmonic edge and breathing modes in aluminum nanotriangles.
MS07-894 Plasmonic edge and breathing modes in aluminum nanotriangles.

The optical properties of metallic particles at nanometric scale have raised a great interest in scientific community due to the high promising technological applications such as optical communication and storage or quantum optics1. It is well known that optical properties of metallic nanoparticles are dominated by surface plasmons that are collective electron oscillations at a metal-dielectric interface which can be exploited to manipulate light. In a metallic nanoparticle these oscillations are confined by the boundaries of the particles, resulting in discrete modes of oscillations (plasmon modes) which can be tuned by shaping the geometry of the nanoparticle. Recently, a detailed analysis of surface plasmons in flat structures1 has allowed classifying plasmon modes in two groups. The first group corresponds to the so-called edge modes which are localized at the periphery of the nanoparticle. These edge modes are well known in the literature and have been reported for several geometries, including nanorods and nanotriangles. On the other hand the second group of modes corresponds to the so-called breathing modes (or cavity modes) which are localized on the center of the nanoparticles. Nowadays breathing modes have just been reported and explained for simple structures as disks2 and squares3. More complex structures remain to be understood.

In this work we study aluminum nanotriangles (edge length size ranging from 125 to 622 nm) by electron energy loss spectroscopy (EELS) coupled with a transmission scanning electron microscope (STEM) in order to understand the complexity of plasmon modes in this kind of structures. Behind this geometry, a rich variety of edge and breathing modes are observed ranging from 1 to 5 eV (figure 1a). Thanks to the high spatial and energy resolution of STEM-EELS technique, we were able to generate with high level of precision, plasmon maps for all modes (figure 1b). In order to understand the breathing modes in triangular nanoparticles, we propose an analytical model considering the interference of reflected waves at the boundaries of triangular cavities which allowed us to explain the symmetry of lobes shown in maps of figure 1b. Furthermore, plasmon modes dependence with nanotriangles size will be shown and interpreted based on our analytical model and rigorous theoretical simulations.

 

References:

(1) Schmidt, F.-P.et al. Universal dispersion of surface plasmons in flat nanostructures. Nat. Commun. 5, 3604 (2014).

(2) Schmidt, F.-P.et al. Dark plasmonic breathing modes in silver nanodisks. Nano Lett. 12, 5780–5783 (2012)

(3) Edson P. Bellido. et al. Electron Energy-Loss Spectroscopy of Multipolar Edge and Cavity Modes in Silver Nanosquares. ACS photonics. DOI: 10.1021/acsphotonics.5b00594


Alfredo CAMPOS (Orsay), Davy GERARD, Jerome MARTIN, Jerome PLAIN, Julien PROUST, Arnaud ARBOUET, Mathieu KOCIAK
08:00 - 18:15 #6096 - MS07-896 Luminescence properties of hexagonal boron nitride layers.
MS07-896 Luminescence properties of hexagonal boron nitride layers.

Hexagonal boron nitride (hBN) is a wide band gap semiconductor (6.4 eV), which can be synthesized, as graphite, its carbon analog, as bulk crystallites, nanotubes and layers. These structures meet a growing interest for deep UV LED and graphene engineering [1]. Knowing better the intrinsic properties of this material is therefore highly desirable. We attempt to have a better comprehension of the optical and electronic properties of thin BN layers, in correlation with their structural properties and to better know, how these properties can be further exploited for the characterization of these nanostructures and how electronic properties of graphene can be impacted by underlying BN layers.

 

To this aim, we combined TEM structural analyses performed in a monochromated Libra 200 TEM and cathodoluminescence experiments at 4K using a dedicated set-up implemented in a JEOL FEG-SEM and adapted to the detection in the far UV range [2, 3]. Data recording is available in a spectroscopic mode or in a hyperspectral imaging mode thanks to the imaging capability of the microscope.

 

In this work, we have first investigated the luminescence properties of different hBN sources (HPHT [4], PDCs [5] and commercial samples) in the near band edge energy range (5 - 6 eV). In this energy range, luminescence properties are governed by strong excitonic effects and consist of D and S lines [2, 3]. Emission related to D lines (5.3 – 5.5 eV) has been proved to be due to structural defects, such as grain boundaries, as identified by TEM [3]. In defect free areas, D lines completely vanish and S lines (5.75 – 5.9 eV) only are observed. As shown in Fig.1, S lines display similar features whatever the sample source. S emission consists of four main lines S1 – S4. Although the exact nature of these lines is still a debated issue, their constant observation in various kinds of samples let to identify them as the intrinsic luminescence of the bulk material [6].

 

In a second step, we studied luminescence in thin layers, obtained by mechanically exfoliating small crystallites. Exfoliated flakes were reported on SiO2 substrates for AFM thickness measurements and luminescence experiments. We first have shown that the transfer procedure on the substrate can highly impact the luminescence. Indeed if reported flakes display folds or ripples, excitons get trapped on these defects. S line emission vanishes and emission is dominated by D lines and is highly localized at the defects [7]. We used this effect as a check of the structural quality of the flakes and in such a way we managed to prepare defect free flakes, that is with no D band in their emission spectrum, with various thicknesses from 100L to 6L from both an HPHT crystal and a commercial powder. As shown in Fig.2, their S-emission dramatically changes, when reducing the number of layers. The relative intensity of S3-4 lines progressively decreases whereas the one of S1-2 lines increases. This rise of the S1-2 line is accompanied by that of related phonon replica corresponding to the E2g mode [3] as outlined by the dashed lines in Fig.2. In the thinnest layers, emission is therefore restricted to the S1-2 line only, identified as a signature of the 2D confinement [6].

 

[1] C.R. Dean et al., Nature Nanotechnology, 5, 722-6 (2010)

[2] P. Jaffrennou el al.,  Phys. Rev. B 77  (2008)  235422

[3] A. Pierret et al, Phys. Rev. B, 89 (2014) 035414.

[4] Y. Kubota et al.. Science 317, (2007) 932

[5] S. Yuan et al, Scientific Reports 6 (2016) 203388

[6] L. Schué et al,  Nanoscale (2016)

[7] L. Schué et al in preparation (2016)


Léonard SCHUÉ, François DUCASTELLE, Frédéric FOSSARD (CNRS-ONERA), Julien BARJON, Annick LOISEAU
08:00 - 18:15 #4462 - MS08-898 EDS/EBSD studies and HR-EBSD pattern analysis on pre-Inca ceramic fragments recovered during San José de Moro Archaeology Program.
MS08-898 EDS/EBSD studies and HR-EBSD pattern analysis on pre-Inca ceramic fragments recovered during San José de Moro Archaeology Program.

Pre-Inca civilizations like the coastal cultures Moche and Nazca (Early Intermediate) and the inland culture Wari (Middle Horizon) were agrarian societies which supported indigenous elites of impressive wealth, power, and organization. With the expansion of the Wari Empire, the polychrome style and technique of Nazca propagated to the other cultures [1, 2]. High status burials, most of the Late Moche Fine Line ceramics and a large corpus of ceramics with Wari-derived decoration have been recovered in San José de Moro since 1991 [1]. The degree of transfer of procedures in this highly interactive scenario is of special interest: is there a limitation to decoration or is it adopted by the local potters also regarding the formulation of the ceramic bodies? In this context the relative amount, size and type of incorporated non-plastic inclusions as temper are important.

Two kinds of ceramic artefacts from Peru were compared: fragments of a baker in Wari Viñaque style (Wari, Ayacucho, Peru [3]) and a canteen in Mochica Polícromo style (San José de Moro, Jequetepeque valley, Peru [1]). Bulk composition and elemental distribution were analyzed by combined scanning electron microscopy and energy-dispersive X-ray spectroscopy on cross-sections (Fig. 1). Analyzing appropriate regions of interest in the element maps evidenced composition differences of the fired clay and the mineral inclusions (Fig. 1, 2). On principle, electron backscatter diffraction is appropriate for mineral phase analysis of the artifacts, but apart from quartz the crystallographic identification by automatic indexing commonly fails due to the micro granular aspect and the porosity of the body, weak diffraction patterns and varying composition of the feldspars. Image analysis of the Kikuchi pattern quality maps (Fig. 1) reveals the fractions of silty crystalline inclusions and of micro-pores in the clayey matrix. However, the clear crystallographic identification of non-plastic inclusions was possible by setting the electron beam at distinct crystals of interest, averaging accumulated patterns and comparing the resulting analysis with dynamical pattern simulation thereby identifying mostly quartz, ilmenite, magnetite, albite, epidote and kaersutite (Fig. 3), sanidine and apatite. Thus additional indications for the use as well as the provenience of the raw clays, the formulation of the ceramic material and the firing conditions can be provided.

We greatly acknowledge L.J. Castillo Butters, La Pontificia Universidad Católica del Perú and R. Chapoulie, Université Bordeaux Montaigne for giving the opportunity to contribute to the study and providing the artifacts.

  1. L. J. Castillo (2012) The multidimensional relations between the Wari and the Moche states of northern Peru. Boletin de Arqueologia PUCP 16: 53-77.

  2. D. Menzel (1964) Style and time in the Middle Horizon, Nawpa Pacha, 2: 1–105.

  3. D. Collier (1955) ARCHEOLOGY: Excavations at Wari, Ayacucho, Peru. Wendell C. Bennett. American Anthropologist, 57: 646–647.


Dagmar DIETRICH (Chemnitz, Germany), Gert NOLZE, Thomas MEHNER, Daniela NICKEL, Thomas LAMPKE
08:00 - 18:15 #4589 - MS08-900 Analysing Jan Steen's pigments using SEM-EDX quantitative X-ray mapping.
MS08-900 Analysing Jan Steen's pigments using SEM-EDX quantitative X-ray mapping.

The Seventeenth Century Dutch artist Jan Steen is famous for his humorous genre scenes in which he treats life as a vast comedy of manners. However, for such a renowned painter, there is surprisingly little technical information about his paintings. In an effort to correct this deficiency we have carried out a detailed technical examination of the paintings of Jan Steen held at the Mauritshuis as part of the Partnership in Science cooperation between Shell Nederlands B.V. and the Mauritshuis. An important part of this work was the characterisation of paint samples using SEM-EDX quantitative X-ray mapping. Compared to measuring individually selected pigment particles this approach has a number of advantages, namely: (i) all particles are measured; (ii) intra-particle details are discernible; and (iii) by using the spectral imaging method the complete data set is available for retrospective examination.

An example where this approach has proved particularly useful is in the study of Smalt. This is a cobalt containing potash glass that was used widely in Seventeenth Century European oil paintings as a blue pigment. The Smalt used in 12 Jan Steen paintings has been examined. Using quantitative X-ray mapping we are able to clearly identify the Smalt particles by using a Silicon/Potassium overlay, as shown in Figure 1. It is also possible to determine the composition of each Smalt particle by extracting the X-ray spectrum associated with each particle and quantifying using standardless methods. Using this approach made it possible to characterise the composition of over 350 Smalt particles. A summary of the results is shown in table I. These reveal that the composition of the Smalt used by  Jan Steen did not vary significantly over the course of his career. In addition, by using the mapping approach it is possible to discern differences in the Potassium distribution within individual particles.  For example, in Figure 1, a number of the larger Smalt  particles have a higher concentration of Potassium in their core which shows up as a region of yellow in the false colour map. To show this variation more clearly a linescan of the Potassium net counts has been extracted from the data which reveals that there is approximately twice as much Potassium in the centre of the particle. In addition, the concentration is constant across most of the centre region of the particle. This could prove helpful in obtaining a more reliable estimate of the original Potassium concentration in these particles so that a better comparison can be made between the degraded and non-degraded state of the Smalt. 

In conclusion, this work shows that quantitative X-ray mapping has a number of important advantages over measuring particles individually and, crucially,  it is now possible to use this approach routinely because with silicon drift detectors it is takes minutes to collect high quality data as compared to the many hours needed with the previous generation of detectors.

Acknowledgements

The analysis was possible due to the financial support of Shell Netherlands B.V.


Ralph HASWELL (Amsterdam, The Netherlands), Jesse WOUTERS, Sabrina MELONI
08:00 - 18:15 #5171 - MS08-902 Trapping of helium in nano-bubbles from 920 Ma euxenite crystals revealed by STEM-EELS analysis.
MS08-902 Trapping of helium in nano-bubbles from 920 Ma euxenite crystals revealed by STEM-EELS analysis.

The study of radiation damage resulting from alpha-decay from U and Th chains in radiocative U-Th minerals is of tremendous importance. Indeed, this damage critically affects the long term behavior of minerals. It is caused by both the ejection of recoil-nuclei and alpha-particles, leading to fundamental modifications in the physical and chemical properties of minerals. If the recoil-nuclei induced defects have been extensively studied, the consequences of the alpha-particles ejection have been less investigated. In particular, the (Y,REE,U,Th)-(Nb,Ta,Ti) oxides, like euxenite, fergusonite, pyrochlore, zirconolite, are known to contain nanometric spherical voids or bubbles, interpreted to contain radiogenic helium. However no direct evidence of the trapping of helium in these voids has been shown up to now. In this study, in-situ analyses by STEM EELS on individual nano-bubbles from an euxenite crystal, sampled in its host c. 920 Ma old pegmatite in Norway, deliver, for the first time, a positive identification of helium and an estimation of helium pressure in such bubbles. The chemically unaltered euxenite crystal proves amorphous and homogeneously speckled with bubbles ranging from 5 to 68 nm in diameter, around a log-normal distribution centred at 19 nm. The euxenite contains 9.87 wt% UO2 and 3.15 wt% ThO2. It accumulated a theoretical alpha-decay dose of 3.46 x 1020 α/g (i.e. 170 He/nm3), at a dose rate of 11926 α/g/s. This corresponds to production of 0.23 wt% He. The density of He inside the bubbles, estimated from EELS data, ranges from 2 to 45 He/nm3, leading to a pressure of 8 to 500 MPa. The proportion of produced He trapped in bubbles is about 10%. The bubbles, acting as traps, clearly influence He diffusion. They may contribute to the swelling of euxenite during amorphization and to the fracturing of the host rock. These results suggest that both dose and dose rate are key parameters for the nucleation, growth and coalescence of He bubbles. Simulation of the behaviour of high-level nuclear waste glasses by extrapolation from actinide doped glass or externally irradiated materials (very high dose rates) may not be predictive on the macroscopic effects (swelling, fracturing), the change of properties of material in which He accumulates, and the presence/size of He bubbles. Furthermore, because alteration is promoted by amorphization, fluid interaction with euxenite crystals saturated with He bubbles will mobilize and redistribute He through the entire rock. Helium may be infused in other minerals, e.g. zircon or apatite, the most utilized minerals for (U-Th)/He thermochronology, and may completely disturb (U-Th)/He dating.


Anne-Magali SEYDOUX-GUILLAUME (Saint Etienne Cedex 02), Marie-Laure DAVID, Kevin ALIX, Lucien DATAS, Bernard BINGEN
08:00 - 18:15 #5188 - MS08-904 Understanding Single-Crystal Paleomagnetism: A Multiscale Approach.
MS08-904 Understanding Single-Crystal Paleomagnetism: A Multiscale Approach.

The development of the single-crystal paleomagnetic approach has resulted in a new paradigm for paleomagnetism, enabling some of the most challenging paleomagnetic problems to be tackled for the first time: from measurements of the magnetic fields in the early solar system 1 to the search for evidence of Earth’s oldest magnetic field 2. Until now, characterization of the magnetic signal carriers in such unique samples has relied solely on two-dimensional cross sections of crystals measured using either TEM or SEM. This leaves many unanswered questions about the three-dimensional properties of the magnetic ensemble, without which single-crystal paleomagnetic measurements can be subject to uncertainties and errors caused by magnetic anisotropy or the presence of secondary magnetic minerals 3,4. We present a multi-scale paleomagnetic approach, which employs both nondestructive and destructive tomographic techniques combined with correlative magnetic measurements and micromagnetic modeling. This multi-scale approach addresses many of the shortcomings inherent in current single-crystal paleomagnetic studies by providing a sound physical framework for interpreting the magnetic behavior. We demonstrate this concept using results from focused ion beam nanotomography (FIB-nT) combined with finite element micromagnetic modeling to reconstruct the magnetic architecture of a single crystal from a chondritic meteorite 5 (Fig. 1A and B). Magnetic anisotropy in the grain arises from the sheet-like arrangement of Fe nanoparticles forming along sub grain boundaries (Fig. 1B).  Using individual particle geometries from the FIB nT volume micromagnetic modeling reveals new insights into the fundamental rock magnetic behaviour of particles with realistic shapes (Fig. 1C). We extend this methodology further by performing a correlative study of a zircon grain from the Bishop Tuff formation. The quantum diamond magnetometer (QDM) allows us to measure and map out localized magnetic sources in the zircon grain (Fig. 2A).  Correlative measurements of the sample using the SEM and EDS do not identify all the magnetic sources originating on the sample surface. Using high-resolution x-ray microscope (XRM) tomography we observe the presence of buried magnetic signal carriers in inclusions below the polished surface of the zircon grain (Fig 2B). Using our correlative workflow we can determine the relationship between magnetic signal carriers and the host zircon grain as well as other mineral inclusions. We demonstrate that understanding single-crystal paleomagnetism requires quantitative multiscale tomographic characterization in order to have confidence in the magnetic measurements reported.

 

References:

1 R.R. Fu, B.P. Weiss, E.A. Lima, R.J. Harrison, X.-N. Bai, S.J. Desch, D.S. Ebel, C. Suavet, H. Wang, D. Glenn, D. Le Sage, T. Kasama, R.L. Walsworth, and A.T. Kuan, Science. 346, 1089 (2014).

2 J.A. Tarduno, R.D. Cottrell, W.J. Davis, F. Nimmo, and R.K. Bono, Science. 349, 521 (2015).

3 T. Berndt, A.R. Muxworthy, and K. Fabian, J. Geophys. Res. Solid Earth 121, 15 (2015).

4 B.P. Weiss, A.C. Maloof, N. Tailby, J. Ramezani, R.R. Fu, V. Hanus, D. Trail, E.B. Watson, T.M. Harrison, S.A. Bowring, J.L. Kirschvink, N.L. Swanson-Hysell, and R.S. Coe, Earth Planet. Sci. Lett. 430, 115 (2015).

5 J.F. Einsle, R.J. Harrison, T. Kasama, P.Ó. Conbhuí, K. Fabian, W. Williams, L. Woodland, R.R. Fu, B.P. Weiss, and P.A. Midgley, Submitted (2016).

Acknowledgements:

J.F.E., P.A.M. and R.J.H. would like to acknowledge funding under ERC Advanced grant 320750- Nanopaleomagnetism. P.A.M. would also like to acknowledge funding under ERC Advanced grant 291522 - 3DIMAGE. This work was performed (in part) at the South Australian node of the Australian National Fabrication Facility under the National Collaborative Research Infrastructure Strategy to provide nano and microfabrication facilities for Australia’s researchers. 


Joshua Franz EINSLE (Cambridge, United Kingdom), Roger R. FU, Jeff GELB, Benjamin P. WEISS, Richard J. HARRISON, Paul A. MIDGLEY
08:00 - 18:15 #5816 - MS08-906 Soil traces in forensic practise.
MS08-906 Soil traces in forensic practise.

Introduction

Requirements for analysis of relicts of soils, abrasions, or contamination of clothing, footwear, human body, vehicle, tools, etc., are relatively frequently encountered in forensic practice. There are two basic types of tasks - We can compare these traces with reference samples of soils from places where the traces may have occurred, or a more complicated task -forecasting an unknown location of the origin of a pedological trace. In both cases, it is a relatively complex examination involving a wide range of individual investigations, whereas to a forensic lab can be submitted practically any material produced by activities of a human being and nature. Therefore, an organic part, pollen, relicts of soil microorganism shells, etc. are assessed separately within the analysis of pedological traces

Methodology

Basic techniques are optical light microscopy in transmitted and reflected light, polarization, fluorescence, next are utilised SEM/EDS (WDS), XRF, FTIR, Raman spektroscopy, XRD, micro XRD, etc.

Technique of cathode luminescence (CL) capable of distinguishing material based on its genesis, thus usually also according to a different place of occurrence, were introduced to differentiate mineralogical phases of practically identical chemical composition, optical characteristics, structure and similar inclusions.

Biological material frequently present in the traces is analysed separately, plant and animal relicts are analysed, including microscopic shells and relics.

Anthropogenic material (glass fragments, slag, construction materials, etc.) is analysed separately by other techniques and may increase the probability measure of a match (hit) between traces and reference samples.

For forecasting of unknown locations, where the contamination by soil may have occurred, systems of geographic information (GIS) are used, in which data are connected with detailed geological maps, both uncovered and covered, and with pedological maps.

The complex of methodologies is based on mineralogical and physical-chemical methods better embracing particularities of soil composition than some applied procedures arising from purely chemical base. Nevertheless, the introduced system at the same time is not omitting even biological and anthropogenic materials that usually represent a very important comparative material. Genetic methods that could compare both information from plant fragments and soil microorganisms are a big potential into the future.

Most of the analytical methods described yield quantitative data for data comparison. One of the possibilities bringing to soil analysis quantitative data that can be used e.g. for statistical comparison of traces and reference samples among each other are systems of automatic analysis of mineral grains (based on SEM/EDS). These systems have been available at the market for several years, nevertheless, to date samples of mineral grains recovered from soil traces have been prepared into casting compounds and then have been cut into polished section forms. Only then were samples analysed in systems of automatic mineralogical analysis. Our laboratory for the first time carried out in cooperation with the producer a number of detailed experiments with analysis of samples prepared directly from mineral grains of a soil trace, fixed at an adhesive stub with carbon target for SEM in diameter of 30mm. The experiments were at first conducted with model samples prepared from known mineral phases and then with samples from common soils. Several series of random samples were taken in a final stage from different places and the ability to determine differences among individual sampling points was tested. It was found that the differences are traceable also among sampling sites that were at a distance less than 20m. This technology, of course, is not a panacea, but appropriately compliments a complex analysis of soil phases.

Summary

The use of new methods considerably extends possibilities of typical microscopic procedures in a forensic field and allows to obtain the needed quantitative data in a forensic analysis of pedological phases, differentiation of analogous mineral phases, or the option of analysis of the organic phase directly in SEM chamber.

The technology described suitably supplements the complex analysis of soil phases.

 

Acknowledgements - microanalytical methods at ICP were supported by projects: VD20062008B10, VD20072010B15, VG20102015065, VF20112015016, VF20122015027, VI20152020035.


Marek KOTRLÝ (Praha, Czech Republic)
08:00 - 18:15 #6046 - MS08-908 Forensic microscopy - a basic method of microtraces examination.
MS08-908 Forensic microscopy - a basic method of microtraces examination.

Microscopy constitutes one of the pillars in forensic investigation of traces and samples from a crime scene. Currently, among classic methods of the examination of microtraces using particularly visible radiation is so-called optical microscopy, be it in the mode of incident light or transmitted light. Simple polarized microscopy can lead an experienced expert to identification of objects. In some cases, it is necessary for trace or sample identification to use also combination with fluorescent microscopy.

Electron microscopy and microanalysis belong to crucial applications in investigation traces from crime scene in forensic practise. SEM with EDS/WSD allow a rapid screening and gaining initial information for a wide range traces, including a view of their surface and evaluation of morphology.

Microscopic methods are widely employed to analyse of so-called “microtrases”, it means latent traces (latents), unperceivable by naked eye, but always related to a criminal case. They can involve gunshot residues (GSR) and post-blast residues (PBR), soils and mineral grains. Microscopy is further applied also in other fields - for example in examinations of handwriting strokes (intersecting lines), biology (morphological evaluation of bio objects), ballistics (composition of bullets), etc.

Investigation of paints and pigments is another important field. Each of these used microscopic methods have their advantages and disadvantages, a great asset of optical microscopy is a view and assessment of samples in their natural colours. By methods of optical microscopy we can not only observe morphology of the surface and possible visible marks, but we can also study stratigraphy in samples of paints and pigment in colours of individual layers, which are important features for comparison. Electron microscopy allows to image traces or samples in the shades of grey, however, its options to discriminate and at the same time possibilities of spectral microanalysis are essential for an analysis.

A further significant field of the use of microscopic and spectroscopic forensic methods is the detection of forgeries of works of art. Qualification of crimes includes a wide range of violations of the law, from an illegal export of works of art, determination of the ownership right, theft of an artwork, to a fraudulent production of forgeries of prominent authors and their introduction to sale. Thanks to a combined use of microscopic and spectral techniques, it is possible to collect key arguments for comparative analysis of the applied materials, assess morphological and structural marks of pigments, to identify bonding agents and judge painter´s technique of the work. In the Czech Republic, forgeries of outstanding Czech artists of the 20th century are encountered most frequently, such as those of Jan Zrzavý, Emil Filla, Josef Čapek and Pravoslav Kotík. In 2007, two paintings of Pravoslav Kotik with a similar theme appeared on the Czech market that sparked controversy over the authenticity of both artworks and subsequently the whole counterfeiting and with it associated trafficking  practices were revealed. The proposed contribution deals with comparative microscopic studies of pigments taken from of works of art.

From other microscopic applications, microscopic and spectroscopic forensic methods are important in assessing fragments of car paints found at a crime scene.

Acknowledgements: Microanalytical methods at Institute of Criminalistics Prague were supported by grant-aided projects of the Czech Republic Ministry of Interior RN 19961997008, RN 19982000005, RN 20012003007, RN 20052005001, VD20062008B10 a VD20072010B15, and the Project of Security Research – Development of selected methods for forensic identification of persons and objects” - VF2012201507.


Ivana TURKOVA (Prague, Czech Republic)
Exhibition Hall
Wednesday 31 August
08:00

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Poster Session C
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Poster sessions:
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08:00 - 18:15 #6442 - IM01-127 Electron tomography analysis of Pt/CeO2 catalyst powders synthesized by solution combustion.
IM01-127 Electron tomography analysis of Pt/CeO2 catalyst powders synthesized by solution combustion.

Transmission Electron Microscopy (TEM) or Scanning Transmission Electron Microscopy (STEM) can provide qualitative information on the distribution of metal nanoparticles over a support, as in the example of Fig 1 showing a STEM image of a Pt/CeO2 catalyst. Nevertheless, as the obtained electron microscopy images are simply 2D projections of the object, they do not provide information on the 3D distribution of the particles which is an essential parameter controlling the catalytic activity. In this particular system, nanopores exist at the surface and a 3D imaging technique such as electron tomography is necessary in order to determine whether metal nanoparticles are anchored on the support surface or, e.g., trapped inside the oxide nanopores.

A 1 wt% Pt-CeO2 catalyst was prepared by one-step solution combustion synthesis (SCS) [1], a fast and simple method favoring metal-support interaction. The sample was analyzed by electron STEM-HAADF tomography in a FEI environmental TEM (Fig. 2). The analysis was performed at two complementary scales: (i) at a relatively low resolution to gain insight into the ceria pore size and shape distributions, and (ii) at higher resolution to determine the Pt particle size distribution and location with respect to the support [2].

It is found that ceria has a bimodal pore size distribution, with small pores about 10 nm in size between the crystallites and bigger pores around 150 nm formed by winding up of ceria layers. It is highly probable that the synthesis route promotes this peculiar and usnusal microstructure. Noticeably, the present nano-tomography analysis further demonstrates that only ca. 50% of the 6 nm-sized Pt particles are located at the surface of the ceria, the other 50% being embedded in the support. This implies that only half the particles contribute to catalytic activity, which may have important consequences on the interpretation of catalytic data.

[1] F. Morfin, T.S. Nguyen, J. L. Rousset, L. Piccolo, Appl. Catal. B 2016, in press, doi: 10.1016/j.apcatb.2016.01.056.

[2] L. Roiban, S. Koneti, T.S. Nguyen, M. Aouine, F. Morfin, T. Epicier, L. Piccolo, in preparation.

Acknowledgements

Thanks are due to CLYM (Consortium Lyon - St-Etienne de Microscopie, www.clym.fr) for the access to the microscope funded by the Region Rhône-Alpes, the CNRS and the 'GrandLyon'.

Acknowledgments are also due to BQR project SEE3D granted by Insa-Lyon, ANR project 3DClean, Labex iMUST and IFP Energies Nouvelles for the financial support.


Lucian ROIBAN (MATEIS / INSA, Lyon), Siddardha KONETI, Thierry EPICIER, Thanh-Son NGUYEN, Mimoun AOUINE, Franck MORFIN, Laurent PICCOLO
08:00 - 18:15 #6467 - IM01-129 Multivariate-aided mapping of solute partitioning in a rare-earth magnesium alloy.
IM01-129 Multivariate-aided mapping of solute partitioning in a rare-earth magnesium alloy.

The addition of trace rare-earth alloying elements to wrought magnesium products can dramatically improve the formability of the base metal, leading to the development of the commercial Mg-Zn-Nd-Zr alloy ZEK100 for lightweight vehicular components [1]. Of particular importance in rare-earth alloy design is a greater understanding of the role of solute species to which the favourable texture and ductility are attributed [2,3]. Here we use an analytical transmission electron microscope, combined with electron tomography and multivariate statistical analysis (MSA), to study the microstructure and partitioning of the trace alloying elements in alloy ZEK100.

We observe three distinct precipitate populations in the matrix; large spherical neodymium rich precipitates decorate the microstructure at the micrometer length-scale (Fig. 1a), and at the nanometer length scale, a fine dispersion of smaller round zinc-rich and rod-shaped zirconium rich intermetallic precipitates populations are present, as revealed by energy dispersive x-ray analysis and electron energy loss spectroscopy (EELS). An electron tomographic reconstruction of a precipitate-rich region (b) enabled the distinction between round and rod-shaped precipitates and elucidation of the rod precipitate orientation distribution and preferred habit plane via principal component analysis (iii). By utilizing the high sensitivity of MSA when applied to EELS spectrum images, we interpret a weak component in the spectral dataset to represent the presence of zinc and neodymium rich shells, just a few monolayers thick, encapsulating the zirconium rich intermetallic precipitates (i,ii). This interpretation was supported by subsequent targeted analysis. An individual elongated precipitate was identified as a Zn2Zr3 structure by lattice-resolved HAADF-STEM imaging (Fig. 2a, i), and a few monolayer thick shell is observed at the precipitate/matrix interface (ii). The partitioning of neodymium and zinc at a precipitate interface was also observed in a needle specimen of the same alloy by atom probe tomography (b), providing strong evidence in support of the MSA zinc and neodymium rich shell component interpretation.

The combination of EDX, EELS, electron tomography and MSA techniques enabled an efficient and targeted analysis of the complex microstructure in alloy ZEK100. In particular, the use of MSA enabled the detection of a subtle, few monolayer thick solute rich shell around the small rod-shaped precipitates, which may have otherwise gone unnoticed using conventional data analysis techniques.  The tendency of the rare-earth solute Nd to encapsulate precipitates may affect its role as a texture-modifying element, and could therefore be of great significance in optimizing the chemistry and processing of rare-earth magnesium alloy systems.

Acknowledgements

GAB is grateful for funding from NSERC under a Collaborative Research and Development Grant.

References

[1] Robson, J. D. Metall. Mater. Trans. A Phys. Metall. Mater. Sci. 2014, 45, 3205–3212.

[2] Hantzsche, K.; Bohlen, J.; Wendt, J.; Kainer, K. U.; Yi, S. B.; Letzig, D. Scr. Mater. 2010, 63, 725–730.

[3] Al-Samman, T.; Li, X. Mater. Sci. Eng. A 2011, 528, 3809–3822.


David ROSSOUW (Dundas, Canada), Brian LANGELIER, Andrew SCULLION, Mohsen DANAIE, Gianluigi BOTTON
08:00 - 18:15 #6487 - IM01-131 Combined multidimensional microscopy as a histopathology imaging tool for the holistic evaluation of the hepatic microvascular and associated tissue cells.
IM01-131 Combined multidimensional microscopy as a histopathology imaging tool for the holistic evaluation of the hepatic microvascular and associated tissue cells.

          Background: Histological variations in the microanatomical organisation of the functional liver units or hepatic lobules adversely affect general body function. Typically, assessment of liver pathology is based on the examination of paraffin-embedded histological slides counterstained with dyes using bright-field light microscopy (BFLM). In some instances, further clinical electron microscopy is recommended to assess the extent of ultrastructural damage to the microvasculature, to determine the nature of hepatic inclusions, or to stage fibrosis, hepatitis, and malignancy in more detail.

          Methods: Unfortunately, the above histopathology practice lacks the ability to cross-correlate observations on the same tissue sample and within a large tissue volume. With the recent advent of smart tissue preparation methodologies and three-dimensional (3-D) imaging practices, this can be circumvented in a relatively swift manner, allowing the same tissue to be examined across different microscopy platforms. Herein, we outline the combined application of X-ray micro-computed tomography (Micro-CT), BFLM and 3-D backscattered electron microscopy (BSEM) on liver tissue as an alternative good practice multimodal imaging approach.

          Results: A workflow is presented facilitating the collection of combined structure-function 3-D data (i.e., X, Y & Z) on liver architecture from the micron down to the nanometre scale using the same tissue preparation protocol. We illustrated the strength of this combined microscopy methodology to characterise various aspects of the hepatic vasculature, ranging from such large vessels as branches of the hepatic portal vein and hepatic artery, down to the smallest sinusoidal capillaries. Moreover, we were able to further characterise the subcellular features of a range of hepatic sinusoidal cells including, liver sinusoidal endothelial cells, liver-associated natural liver cells and Kupffer cells. Above all, we demonstrate the capabilities of this specimen manipulation and microscopy workflow to generate quality microscopic detail and subsequently extract relevant quantitative 3-D information.

          Conclusions: This contribution illustrates the capability that advanced histology imaging can bring to the gastroenterologist and/or pathologist in the fine structure-function assessment of the liver unit, its associated microvasculature, and the individual make-up of parenchymal and non-parenchymal tissue cells. This good practice further allows the instant generation of combined quantitative data about size, shape and volume changes of key microanatomical structures across multiple length scales. 


Gerald SHAMI (Sydney, Australia), Delfine CHENG, Filip BRAET
08:00 - 18:15 #6529 - IM01-133 New approach for low dose electron diffraction tomography.
IM01-133 New approach for low dose electron diffraction tomography.

Due to strong interaction of electrons with matter, 3D electron diffraction tomography has been proven to be a reliable method to solve structures of very small crystals, compared to X-ray diffraction; even for small protein crystals [1].

Several procedures for automated acquisition of tomographic diffraction data sets have been described [2, 3], using precession technique or discrete beam tilt perpendicular to the goniometer tilt axis. However, those mentioned methods are mainly used for less beam sensitive materials and are not suitable for low dose applications.

Shi et al. [4-7] refined the collection of 3D data sets under low dose condition (less than 10 e-2). Here, the camera system is continuously acquiring diffraction data during a continuous tilt of the goniometer. This allows to completely scan the Fourier space. It turned out that the stability of the goniometer tilt speed and the limited flexibility of the tilt acquisition parameters are problematic.


 

Here, we present a newly developed automatic data acquisition system, combining real-time direct control of the TEM-deflection systems, the goniometer tilt and the acquisition of high-resolution diffraction patterns with a synchronized CMOS camera. This can be realized by the TVIPS Universal Scan Generator (USG), controlling eight TEM deflection coils, i. e. four beam deflection coils and four image deflection coils. For a static goniometer alpha, the total beam tilt range (±3° to ±5°, depending on the TEM) can be fragmented by a defined beam tilt range, e.g. 0.5° (see Fig. 1). During the camera exposure time the beam is continuously tilted for this defined range (e.g. 0.5°). The continuous beam sweep during exposure time ensures the complete sampling of the Fourier space.

Several crystal structures (Carbamazepin: C15H12N2O, bismuth oxychloride: BiOCl, Mayenite: Ca12Al14O33) have been successfully solved by this method. The total acquisition time for 190 high resolution (1Å resolution) diffraction patterns is about 15 minutes, with a total electron dose of about 10 e-2. The collected 3D electron diffraction data sets were processed using the EDT-PROCESS software [8].


 

References

1.       J. A. Rodriguez, M. I. Ivanova, M. R. Sawaya, D. Cascio, F. E. Reyes, D. Shi,S. Sangwan, E. L. Guenther, L. M. Johnson, M. Zhang, L. Jiang, M. A. Arbing, B. Nannenga, J. Hattne, J. Whitelegge, A. S. Brewster, M. Messerschmidt, S. Boutet, N. K. Sauter, T.Gonen and D. Eisenberg: Structure of the toxic core of α-synuclein from invisible crystals, Nature (2015);  525 (7570).

2.       U. Kolb, T. Gorelik, C. Kübel, M.T. Otten and D. Hubert: Towards automated diffraction Tomography: part I- data acquisition, Ultramicroscopy (2007) ; 107(6-7):507-13.

3.       D. Zhang, P. Oleynikov, S. Hovmoller and X. Zou:Collecting 3D electron diffraction data by the rotation method, Z. Kristallogr (2010); 225 94–102.

4.       D. Shi, B.L. Nannenga, M.G. Iadanza and T. Gonen: Three-dimensional electron crystallography of protein microcrystals, eLife (2013); 2:e01345.

5.       B.L. Nannenga, D. Shi, j. Hattne, F.E. Reyes and T. Gonen: Structure of catalase determined by MicroED, eLife (2014); 3:e03600.

6.       B.L. Nannenga and T. Gonen:Protein structure determination by MicroED, Current Opinion in Structural Biology (2014); Volume 27:24–31.

7.       B.L. Nannenga, D. Shi, A.G.W. Leslie and T. Gonen: High-resolution structure determination by continuous-rotation data collection in MicroED, Nature Methods 11(2014); 927–930.

8.       M. Gemmi, P. Oleynikov: Scanning reciprocal space for solving unknown structures: energy filtered diffraction tomography and rotation diffraction tomography methods. Z. für Krist. 228 (2013) 51-58.


Hans TIETZ, Peter SPARLINEK, Peter OLYENIKOV, Reza GHADIMI (Gauting, Germany)
08:00 - 18:15 #6595 - IM01-135 Direct estimation of 3D atom positions of simulated Au nanoparticles in HAADF STEM.
IM01-135 Direct estimation of 3D atom positions of simulated Au nanoparticles in HAADF STEM.

The most commonly used algorithms to reconstruct HAADF STEM data such as Filtered Back Projection (FBP) and iterative reconstruction algorithms such as ART, SART and SIRT assume a linear image formation model. However, the linearity assumption is only a crude approximation of the non-linear behaviour of the real image formation model. Moreover, the limited angular range results in smearing in the reconstruction along the missing wedge and the typically small amount of projections creates a largely undersampled problem. The reconstruction can therefore be regarded as a limited data problem for which a regular SIRT reconstruction was not designed. One way to solve this problem is to reduce the number of unknowns by adding prior knowledge to the reconstruction algorithm. We present a simulation study for the use of a 3D Gaussian atomic model as a prior in the iterative reconstruction method developed in [1] using the ASTRA toolbox [2]. Our algorithm starts from an initial SIRT reconstruction that typically does not reveal the crystal structure but does agree relatively well with the projection data. In the subsequent iterations of our algorithm we combine this initial reconstruction with a gradually refined estimation - both in image space and projection space - of the 3D atom grid. For a quantitative validation we simulated 26 projection images (pixel size 16 pm) for two Au nanoparticles consisting of 1415 and 6525 atoms respectively with a frozen phonon approach using the MULTEM software [3]. The angular range was limited to 100 degrees, resulting in a large missing wedge and Poisson noise was added to obtain a signal to noise ratio of 10. The average distance between atom positions in the phantom and the reconstruction was found to be less than 6 pm in the direction of the missing wedge for both particles and 3 to 5 pm in the other dimensions for the 1415 atom particle (Fig. 1) and the 6525 atom particle (Fig. 2) respectively, resulting in subpixel accuracy for the recovered atom positions (Fig. 3). The recovery of the 6525 atom positions took approximately 20 minutes.

 

References

1. B. Goris, J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters 2015, 15 (10), pp6996-7001. 

2. W. Van Aarle, W J. Palenstijn, J. De Beenhouwer, T. Altantzis, S. Bals, K. J. Batenburg, and J. Sijbers, "The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography", Ultramicroscopy, vol. 157, pp. 35–47, 2015.

3. I. Lobato, D. Van Dyck, MULTEM: a new multislice program to perform accu-

rate and fast electron diffraction and imaging simulations using Graphics

Processing Units with CUDA, Ultramicroscopy (2015) 9–17.


Jan DE BEENHOUWER (Antwerp, Belgium), Ivan LOBATO, Dirk VAN DYCK, Sandra VAN AERT, Jan SIJBERS
08:00 - 18:15 #6608 - IM01-137 Chemical tomography of nested-network nanoporous gold.
IM01-137 Chemical tomography of nested-network nanoporous gold.

Nanoporous gold (NPG) is the paradigm of the novel class of nanostructured metals consisting of a randomly interconnected solid and void structure. Due to the high surface area of these materials, there are numerous promising fields of application in catalysis, sensors or electronics. The most common synthesis method of NPG is electrochemical dealloying of Ag-Au alloys [1].

To enlarge the surface area of NPG even further, a two-step dealloying process on a Pt-doped Ag-Au master alloy has been developed [2]. In the first step of the dealloying process, a fair amount of silver is removed by electrochemical corrosion, leading to a porous structure with very small ligaments of about 20 nm diameter. After gentle annealing, resulting in a porous structure with a feature size of about 100 nm (NPG), a second dealloying process is performed. The residual silver is removed, generating a porous structure (ligament size smaller than 10 nm) inside the initial formed ligaments of the porous structure, forming a nested-network nanoporous gold (N³PG) (Figure 1).

The retention of silver in the first dealloying step is presumed to be the result of a passivation of the master-alloy surface during dealloying by successive accumulation of platinum on the electrolyte-solid interface during the electrochemical removal of silver. During the subsequent annealing, the platinum diffuses from the surface into the Ag/Au Ligaments, which is consistent with thermodynamic calculations [3] and spectroscopic measurements [4], exposing a fresh surface of Ag/Au for the second dealloying step, resulting in the hierarchical structure of N³PG. The proposed accumulation of Pt is plausible because of the lower mobility of platinum compared to silver and gold and has been proven by cyclic voltammetry [5]. However, cyclic voltammetry and other spectroscopic methods only give an averaged analysis of the surface. To further investigate this theory, localized information of the surface composition of the NPG ligaments is needed.

In this work, we present the electron microscopic examination of NPG by the means of electron tomography in combination with EDX. The complex material structure with a high void fraction, high element numbers, and low concentration of minor constituents (Ag, Pt), however, aggravates the specimen preparation and data collection. To obtain reasonably thin, artifact-free specimen of NPG, the voids have to be filled with epoxy and then cut by ultramicrotomy. The image and elemental maps (Figure 2) collection is performed on a modern TEM optimized for electron tomography, equipped with four EDX-Detectors covering a large solid angle and a high brightness gun for high probe currents. For data analysis HyperSpy [6] is used.

[1] Z. Qi , J. Weissmüller, ACS Nano 2013, 7, 5948.

[2] Z. Qi, U. Vainio, A. Kornowski, M. Ritter, H. Weller, H. Jin, J. Weissmüller,
Advanced Functional Materials 03/2015; 25(17).

[3] P. A. Dowben, A. H. Miller, R. W. Vook, Gold Bull., 1987, 20, 3.

[4] J. A. Schwarz, R. S. Polizzotti, J. J. Burton, J. Vac. Sci. Technol. 1977, 14, 457.

[5] A. A. Vega , R. C. Newman , J. Electrochem. Soc. 2014, 161, C1.

[6] HyperSpy Home Page. www.hyperspy.org (accessed Mar 2016)


Tobias KREKELER (Hamburg, Germany), Ke WANG, Lida WANG, Martin RITTER
08:00 - 18:15 #6657 - IM01-139 3D elemental analysis of the rod-shape alloy by using EDS tomography.
IM01-139 3D elemental analysis of the rod-shape alloy by using EDS tomography.

Energy dispersive X-ray spectroscopy (EDS) is widely used to obtain an elemental map of a sample. EDS tomography reconstructs a three-dimensional (3D) elemental map from a tilt series of two-dimensional (2D) EDS elemental maps by using the back projection theorem. The back projection theorem is applied to tilt series of transmission images. An EDS map is not transmission image but X-ray emission image. Therefore, the tilt series of EDS maps should not be applied to normal tomography in principle.

The basic signal types for reconstruction by tomography are categorized into two, that is, absorbance and emission. In the case of normal transmission image (BF-TEM or BF-STEM), we calculate the mass thickness from the absorbance ( -log[I/I0] ), where I: detected electron intensity after transmission, I0: incident intensity of electron, according to Lambert-Beer’s law. While, in case of the emission type, which includes ADF-STEM, X-ray fluorescence and etc., the emitted signal is proportional to mass thickness or number of atoms in a irradiated probe diameter. Thus, for X-ray elemental maps, we are able to reconstruct a 3D map of each element by measuring X-ray intensity of a certain element.

The X-ray intensity does not represent the number of atoms for the certain element, when the generated X-ray is absorbed in the sample itself. Therefore, only if the X-ray absorption is small enough to be ignored, we can apply the standard calculation procedure to EDS tomography. In practical calculation, the detection efficiency depending on the sample tiling angle is also considered. The efficiencies on sample tilt angles were measured using a known sample beforehand. This study reports how to obtain the 3D elemental maps in high magnification condition and to improve the accuracy of the EDS tomography using a sample of an alloy.

Figures 1(a) shows a DF-STEM image of an alloy composed of Mn, Ga and Ni. The instrumentation we use for this experiment was a field emission microscope (JEOL, JEM-2800) equipped with two SDD detectors whose sensor area is 100 mm2 each. A tilt series of EDS elemental maps for the region of sample shown in Fig. 1(a) was collected at tilt angles ranged  ±80 degree. And the tilt steps were 4 degree, resulting in 41 collected maps for an element. The number of pixels for each map was 256 x 256. Figures 1(b)-1(e) show a 3D DF-STEM and elemental maps of the alloy, reconstructed by simultaneous iterative reconstruction technique (SIRT), which can reconstruct a 3D tomogram faster from fewer number of images than one in conventional method. As a result, we found that the Ni and Ga made solid solution, but Mn was segregated into small particles. The 58 Mn particles were visible in the Mn map, and the average diameter of these particles was estimated to be 10.7 nm.

Next, we measured the X-ray self-absorption effect for improvement of the accuracy of 3D elemental maps. Figure 2(a) shows the DF-STEM image from the rod-shape NAND flash memory made by FIB.  The tilt series of EDS maps was obtained from the field of view shown in Fig. 2(a) by an electron microscope (JEOL, JEM-2100) with the single EDS detector. Then, we measured the X-ray counts from the small gold colloidal particle indicated by the arrow in Fig. 2(a). The X-ray counts are plotted on the stage tile angles (Fig. 2(e)). Since the X-ray from the particle was absorbed by the sample itself, X-ray counts were not constant. In order to analyze the 3D structure quantitatively, it is necessary to correct this effect. The effect of the absorption was estimated to be about 0.8 at maximum.

In conclusion, to make an accurate elemental map by EDS tomography, it is necessary to consider the effect of X-ray absorption, sample shape and sample thickness. It is complicated but we can correct these in principle.


Yoshitaka AOYAMA (Tokyo, Japan), Hideo NISHIOKA, Yukihito KONDO
08:00 - 18:15 #6663 - IM01-141 Cryo-Electron Tomography of Protein Nanocrystals.
IM01-141 Cryo-Electron Tomography of Protein Nanocrystals.

    Knowing the structure of biological molecules plays a key role in understanding their function. To date there is no single structure determination method that would always work for every biological molecule. Instead there exists a plethora of complementary methods each with their specific advantages and disadvantages. Small but difficult to crystallize proteins have proven to be a particularly hard target for many of the conventional methods. However, proteins that do not crystallize to large well-diffracting crystals, could still form tiny nanocrystals in many cases, which could be completely invisible under regular light microscope or mistaken for amorphous precipitate when inspecting a crystallization drop.

    Using cryo-electron tomography we demonstrate in this work that real space imaging can be successfully used for structural studies of proteins that have been crystallized to nanocrystals. In this proof of principle research we have used cryo-electron tomography to image lysozyme (molecular weight 14 kDa) nanocrystals in the size range of 100 nm. We show that by exploiting crystallographic symmetry inherent in the tomogram and taking advantage of other possibilities provided by real space imaging we can achieve resolution in the range of 15Å.

    To achieve this result we have used in-house software for 3D reconstruction and subsequent refinement of the reconstruction using maximum entropy regularization algorithm together with contrast transfer function deconvolution. For processing crystalline data we have developed a toolkit for necessary 3D image processing tasks, such as peak detection, crystallographic lattice parameter search and refinement, and 3D image averaging and space group symmetrization.

    Nano-crystal tomography could become an established method in structural biology complementing the existing methods by firstly being applicable on small and difficult to crystallize proteins, but secondly on any general 3D reconstruction that includes crystallographically related parts. On top of studying one single averaged molecule, this method can also be used to analyze the nano-crystal as a whole and study the distribution of disorder within the crystal.


Maert TOOTS (Onna-son, Japan), Ulf SKOGLUND
08:00 - 18:15 #6677 - IM01-143 Three-dimensional electron imaging of dislocations from a single sample tilt.
IM01-143 Three-dimensional electron imaging of dislocations from a single sample tilt.

Linear crystal defects called dislocations are one of the most fascinating concepts in materials science that govern mechanical and optoelectronic properties of many materials across a broad range of application [1-3]. Three-dimensional (3-D) study of dislocation network is in principle accessible by conventional tomographic and stereoscopic techniques in Transmission Electron Microscopy (TEM) [4,5]. In these techniques in general the need to tilt the specimen for acquiring image series over large tilt ranges remain however an intricate problem, in particular when diffraction contrast or sensitivity to electron beam are involved [6].

Here, a novel method in scanning TEM (STEM) is presented that provides a reliable and fast assessment of the 3-D configuration of dislocations using data acquired from just one sample tilt. This technique acquires a stereoscopic pair of images by selecting different ray paths of a convergent illumination in STEM mode. The resulting images are then treated with a dedicated stereovision reconstruction algorithm, yielding a full 3-D reconstruction of dislocations arrangement. The success of this method is demonstrated by measurement of dislocation arrangements in two experimental cases.

--------------

References

1- Mott, N. F. Dislocations and the Theory of Solids. Nature 171, 234-237 (1953).

2- Mohammad, S. N. & Morkoc, H. Progress and prospects of group-III nitride semiconductors. Progress in Quantum Electronics 20, 361-525 (1996).

3- Hua, G. C. et al. Microstructure study of a degraded pseudomorphic separate confinement heterostructure blue-green laser diode. Applied Physics Letters 65, 1331-1333 (1994).

4- Midgley, P. A. & Dunin-Borkowski, R. E. Electron tomography and holography in materials science. Nature Materials 8, 271-280 (2009).

5- Agudo Jácome, L., Eggeler, G. & Dlouhý, A. Advanced scanning transmission stereo electron microscopy of structural and functional engineering materials. Ultramicroscopy 122, 48-59, d (2012).

6- Barnard, J. S., Eggeman, A. S., Sharp, J., White, T. A. & Midgley, P. A. Dislocation electron tomography and precession electron diffraction - Minimising the effects of dynamical interactions in real and reciprocal space. Philosophical Magazine 90, 4711-4730 (2010).


Emad OVEISI (Lausanne, Switzerland), Letouzey ANTOINE, Fua PASCAL, Hebert CECILE
08:00 - 18:15 #6737 - IM01-145 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps.
IM01-145 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps.

Electron tomography (ET) is nowadays commonly used in materials science to obtain a three dimensional (3D) structural characterization of nanomaterials. Typically it is based on tomographic reconstruction from high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images yielding Z-contrast in final reconstructions. However, when investigating heteronanostructures with small differences in Z, spectroscopic techniques such as Electron Energy Loss Spectroscopy (EELS) and Energy Dispersive X-ray Spectroscopy (EDS) should be used. Here, we focus on EDS-STEM spectroscopic imaging. Recently, EDS in combination with electron tomography was demonstrated [1,2], but the quality of these reconstructions is limited because of the small signal-to-noise ratio (SNR) in the acquired elemental maps compared to HAADF-STEM projection images.
In this study, we propose to combine HAADF-STEM tomography with EDS-STEM tomography instead of processing both signals independently. This combination has not yet been completely explored except for using HAADF-STEM images for aligning EDS-STEM maps [3] and for estimating density to correct X-ray absorption [4]. Here, we introduce the concept of multi-modal tomography to ET by proposing a novel HAADF-EDS bimodal tomographic reconstruction technique. The technique is based on the physical model that both types of projection images are linearly related to the projections of chemical compositions. Based on this assumption, HAADF-STEM images can be approximated as a linear combination of EDS-STEM maps. By estimating the linear relation, we can scale EDS-STEM maps to the same physical unit as HAADF-STEM images. The two types of images are related and used together as the input data for one single reconstruction process. As a result, we are able to reconstruct 3D elemental distributions with reduced noise levels compared to conventional EDS-STEM tomography.
To evaluate the technique, it has been applied to two Au-Ag nanoparticles. The samples were imaged by an electron microscope (Tecnai Osiris, FEI) equipped with four silicon drift detectors (SuperX system, FEI). The first sample was tilted from -75° to 75° (from -70° to 70° for the second sample) with a step of 5°. At each tilt, a Z-contrast image was recorded by HAADF-STEM and two elemental maps for Au and Ag were generated from X-rays spectrum images acquired by EDS-STEM. Both the HAADF-STEM and the elemental maps were aligned using cross correlation algorithms.
The first sample that is investigated consists of a Ag nanoparticle with an embedded Au octahedral core. As indicated in Figure 1, Au and Ag are well separated in this sample. Consequently, a segmention based on the Z-contrast of a HAADF-STEM reconstruction can be considered as ground truth for the distributions of the chemical elements (Figure 1 (a)). As illustrated in Figure 1 (c), we are able to determine the 3D elemental distributions using our novel HAADF-EDS bimodal reconstruction technique. This figure indicates a significant improvement in comparison to conventional EDX tomography (Figure 1 (b)) where the raw elemental maps are used as input for a tomographic reconstruction.
The second sample that is investigated is an alloy of Au and Ag. Since no clear boundaries exist between the two compositions, we are not able to segment their 3D distributions based on the HAADF-STEM tomographic reconstructions. Although 3D compositional distributions can be reconstructed from EDS-STEM maps, the 3D image is very noisy and difficult to interpret (Figure 2 (b)). In comparison, the 3D compositional distributions reconstructed by HAADF-EDS bimodal tomography (Figure 2 (c)) provides more information on the concentration of the different elements while the outer shape of the nanoparticle agrees well with the 3D shape reconstructed from HAADF-STEM images (Figure 2 (a)).

References

[1] Z. Saghi, Applied Physics Letters, 91 (2007) p.251906.

[2] K. Lepinay et al, Micron, 47 (2013) p.43.

[3] B. Goris et al, Nano Letters, 14 (2014) p.3220.

[4] P. Burdet et al, Ultramicroscopy, 160 (2016) p.118. 


Zhichao ZHONG (Amsterdam, The Netherlands), Bart GORIS, Remco SCHOENMAKERS, Sara BALS, K. Joost BATENBURG
08:00 - 18:15 #6754 - IM01-147 Evaluation of feature-based registration algorithms for the improvement of tilt-series alignment in electron tomography.
IM01-147 Evaluation of feature-based registration algorithms for the improvement of tilt-series alignment in electron tomography.

Despite the high performance achieved in goniometers-control for tomographic tilt series recording, image alignment is mandatory to obtain accurate reconstructions. In addition, due to the high resolution currently expected from tomograms, the existing alignment methods (based on cross-correlation, fiducial-markers and landmarks) needs to be improved. Among the alternative methods presently proposed for general purpose image registration, Scale Invariant Feature Transform (SIFT) [1] has demonstrate its performance for the detection of common features occurring in several images. SIFT have been successfully used for panoramic stitching [2], object detection [1] and proposed as a method for image alignment in electron tomography [3].

We have implemented SIFT and two other feature-based registration algorithms porposed since the publication of SIFT (ORB [4], BRISK [5]) in TomoJ [6] and evaluated their respective performances on tilt series data from different transmission electron microscopy (TEM) acquisition methods (TEM, EFTEM, STEM, and Cryo-TEM). We will present here the results obtained validating the use of feature-based registration algorithms on tilt series from the different acquisition modes.

References:

[1] Lowe D.G. Distinctive Image Features from Scale-Invariant Keypoints. Int. J. Comput. Vision. 2004. 60:91-110

[2] Brown M. and Lowe D.G. Automatic Panoramic Image Stitching using Invariant Features. Int. J. Comput. Vision. 2007. 74:59-73

[3] Han R, Zhang F, Wan X, Fernández JJ, Sun F, Liu Z. A marker-free automatic alignment method based on scale-invariant features. J Struct Biol. 2014. 186:167-80.

[4] Leutenegger S, Chli M, Siegwart RY. BRISK: Binary robust invariant scalable keypoints. Computer Vision (ICCV), 2011 IEEE International Conference on, 2011, 2548-2555.

[5] Rublee E, Rabaud V, Konolige K, Bradski G. ORB: an efficient alternative to SIFT or SURF. Computer Vision (ICCV), 2011 IEEE International Conference on.  2011, p. 2564-2571.

[6] http://u759.curie.fr/fr/download/softwares/TomoJ


Amandine VERGUET (ORSAY CEDEX), Sylvain TREPOUT, Sergio MARCO, Cédric MESSAOUDI
08:00 - 18:15 #6842 - IM01-149 3D Reconstruction of Crack Formation in Austempered Ductile Cast Iron after an In-situ Tensile Test.
IM01-149 3D Reconstruction of Crack Formation in Austempered Ductile Cast Iron after an In-situ Tensile Test.

A 3D reconstruction has been performed on a flat specimen after an interrupted in-situ tensile tests. The sample consisted of austempered ductile cast iron (ADI) alloyed with 2.75% nickel. The analysis was performed by using a dual beam system (FIB-SEM).

The procedure of this analysis consisted in studying the elastic-plastic behaviour along with the nucleation and the growing of cracks in ADI at room temperature. For this purpose, a field emission scanning electron microscope (FE-SEM) equipped with a tensile stage was used.

A systematic observation at the same location on the sample surface was used to clarify the tensile curves which are in agreement with deformation mechanisms. During the testing, decohesion of graphite nodules from the matrix was observed. The cracks initiated mainly at the interface of graphite nodule and the austenitic matrix. The elastic-plastic region is connected with the plastic deformation of the matrix, growth and linking of microscopic cracks which are connected and finally leading to fracture of the sample.


Hana TESAŘOVÁ (Brno, Czech Republic), Jiří DLUHOŠ, Martin PETRENEC, Jaroslav POLÁK, Karel KRAHULA
08:00 - 18:15 #6879 - IM01-151 Ionic Liquids for biological SEM and FIB/SEM.
IM01-151 Ionic Liquids for biological SEM and FIB/SEM.

Ionic liquids are low-melting salts which are fluid at room temperature. They show a very low vapor pressure and are therefore persisting as liquids under the high vacuum conditions in an electron microscope.  They are electrical conductive as well. The ionic liquids tested are mixable with water, thus solutions can be easily diluted to suitable viscosities respectively concentrations.

In electron microscopy ionic liquids are used to coat surfaces and cavities to make samples conductive for SEM. This conductive treatment works on biological samples as well. In example, cell cultures or biofilms can be treated with ionic liquids. Preparation steps as heavy metal staining, dehydration and drying might be skipped. Cells get fixed for stopping life dynamics and structural stabilization and then directly treated with i.e. 10% Hitachi IL1000 before going into SEM without further coating.

Cells look adequate in SEM at lower magnification. At higher magnification structural collapse effects are visible. Occasionally charging phenomena can be observed. Additional block stain of the fixed sample with OsO4 before ionic liquid treatment might attenuate collapse phenomena. Additional sputter coating after ionic liquid treatment prevents residual charging.

In an FIB/SEM cells treated with ionic liquids show after exposure to the ion beam no charging effects anymore; furthermore the backscatter electron signal is strongly enhanced. Cross sections of ionic liquid treated cells show a dense solid cytoplasm, which enables also consecutive sectioning for FIB/SEM-tomography.  While structural details are at best foreshadowed after ionic liquid treatment alone, substructures are visible after block staining with heavy metals before the treatment.

To find the relevant region of interest, correlation with light microscopic data is an option. Ionic liquid treatment doesn't interfere with fluorescence detection in light microscopy. But also direct evaluation of characteristic topographic features of the sample surface can help to find the spot of interest for a FIB/SEM-tomogram.

Ionic liquid treatment makes biological samples vacuum resistant and conductive. The biofilm-substrate interface stays intact. These features are offered also by freeze-drying / critical-point-drying or thin-layer-plastification as well. Compared with other preparation techniques, ionic liquid treatment of biological specimen combines several advantages: preparation time is short, cell topography is clearly visible, cross sections show compact internal structures, fluorescence is preserved. But there are drawbacks as well: compared to freeze-drying or critical-point-drying, the surface is less well preserved; compared to thin-layer-plastification the internal structural is less clear exposed.

For FIB/SEM-studies, ionic liquid treatment is a compromise between critical-point-drying (excellent surface feature preservation, spongy aggregated structures inside the cells) and thin-layer-plastification (excellent internal structure preservation, poor topographic feature exposure). It is a quick SEM-preparation approach and the interface between cells and the substrate stays preserved.


Anne Greet BITTERMANN (Zurich, Switzerland), Simona RODIGHIERO, Roger WEPF
08:00 - 18:15 #6914 - IM01-153 Three-dimensional characterization of Ni-Sm0.2Ce0.8O2-δ cermet for SOFC anodes by high-resolution FIB-SEM Tomography.
IM01-153 Three-dimensional characterization of Ni-Sm0.2Ce0.8O2-δ cermet for SOFC anodes by high-resolution FIB-SEM Tomography.

A solid oxide fuel cells (SOFC) technology is one of the most promising energy conversion device due to its high conversion efficiency, low environmental pollution and high flexibility to various fuel types (1). To overcome all challenges concerning materials’ long term stability at operating temperatures, current research efforts are aimed at intermediate temperature SOFCs (IT-SOFCs) (2). From this point of view samaria-doped ceria (SDC) is a promising ceramic material, with superb ionic conductivity, which can be used as an anode material when combined with Ni in Ni-SDC cermet (2). To ensure electronic and ionic conductivity as well as gas permeability, anode cermet should exhibit carefully tailored microstructure where metallic Ni, ceramic SDC and pores form continuous phases. In an operating cell fuel gas is electrochemically oxidized at the Ni/SDC/fuel interface, called the triple phase boundary (TPB) region. Therefore, both the activity of Ni-SDC and their stability are strongly influenced by the cermet’s morphology and microstructures such as volume fractions, grain connectivity, grain size, pore size, pore distribution and TPB length (3).

For this purpose, exact and accurate microstructural determination is crucial in predicting material's performances in an operating cell. In such a cermet composite critical topological features such as connectivity and the tortuosity of transport pathways in the pores can only be established based on 3D microstructural information (4). In this work we present quantitative characterization of Ni-Sm0.2Ce0.8O2-δ cermets, sintered at 1400°C, using high-resolution FIB-SEM tomography. Initially, a layer of platinum was deposited ontop the region of interest to protect the surface and prevent rounding of top edges of cross section during milling. The volume of interest was separated using an optimised U-pattern pre-milling procedure to prevent material redeposition and shadowing of the signals used for imaging and microanalysis. The sample was then serial sectioned using an automated slicing procedure with drift correction algorithms to obtain a series of 2D images with narrow and reproducible spacing between the individual image planes (5). Experimental milling and imaging parameters have been optimised in order to obtain a high quality 3D reconstruction with phase contrast information. Individual phases were identified from EDXS elemental maps and further segmented according to their grey level. 3D reconstructed volume is a base for determination of: volume fractions of individual phases, grain connectivity, porosity, tortuosity and TPB length.

The presented analytical method will serve as a tool for quantitative characterization of primary microstructural parameters and complex topological features, during microstructure evolution of Ni-Sm0.2Ce0.8O2-δ anode cermets using various sintering procedure.

 

Literature:

[1] S.C. Singhal, K. Kendall, High Temperature Solid Oxide Fuel Cells, Elsevier, 2002

[2] Liu Q, Dong X, Yang C, Ma S, Chen F, J Power Sources 2010; 195: 1543-1550

[3] S.D. Kim, H. Moon, S.H. Hyun, J. Moon, J. Kim, H.W. Lee, J Power Sources, 163 (2006) 392-397

[4] Brus, G., Miyawaki, K., Iwai, H., Saito, M., & Yoshida, H., Solid State Ionics, 265(2014), 13–21

[5] M. Schaffer, J. Wagner, B. Schaffer and M. Schimed, Ultramicroscopy, 107, pp. 587-597 (2007)


Gregor KAPUN (Ljubljana, Slovenia), Sašo ŠTURM, Marjan MARINŠEK, Miran GABERŠČEK
08:00 - 18:15 #6973 - IM01-155 Image deconvolution for fast Tomography in Environmental Transmission Electron Microscopy.
IM01-155 Image deconvolution for fast Tomography in Environmental Transmission Electron Microscopy.

The development of environmental transmission electron microscopes (ETEM) as well as the environmental cells opens the way towards operando electron microscopy. In this respect, following the genesis of a catalyst or a chemical reaction in real time under gaseous environment and at high temperature becomes a possibly achievable goal. Performing such experiments in 2D has already been successful but reaching the 3D information in environmental mode is a challenge as it needs to acquire 2D projections fast enough in order to neglect the morphological evolution of the object during the chemical reaction, a required condition to reconstruct a 'correct' 3D object. Under environmental conditions, the motion and evolution of the objects might produce images corrupted by motion which will then exhibit possibly significant blurred features. These defaults might even be enhanced if one intends to acquire the image series rapidly. This contribution will address the possibility of using deconvolution methods to un-blur such environmental microscopy images. Here we mainly focus on the motion blur correction of corrupted images: g(x,y)=(f*h)(x,y)+n(x,y)

where * denotes the convolution product, f is the ground truth image, g is the observed corrupted image, h is the degradation function of the acquisition system and n is the noise.

The Minimum Square Error (MSE) and the Constrained Least Square (CLS) filtering are used as image restauration processes as shown in figure 1. Both of them require the degradation function h as input and the parameter k related to the noise level which has to be optimized. Denoting G the Fourier transform of the corruptedimage, the Fourier transform of the reconstructed image is then given by one of the following relations:

    FMSE(u,v)= G(u,v).H(u,v)c / (|H(u,v)|2+k) and   FCLS(u,v)= G(u,v).H(u,v)c / (|H(u,v)|2+k.|P(u,v)|2),

where H is the Fourier transform of the convolution filter h, Hc is its complex conjugate, P is the Fourier transform of the Laplacian filter and |.| denotes the complex modulus. However, the degradation function is not known in practice and has to be estimated from the experimental images. The estimation of a parametric degradation function h is performed by image comparison: so far we manually determine the unknown parameters by comparing the blurred image with a similar one not affected by the motion blur. We will present perspectives of this work in terms of running an automatic estimation of the convolution kernel for in-situ image processing of experimental micrographs.

 

Acknowledgements

Thanks are due to CLYM (Consortium Lyon - St-Etienne de Microscopie, www.clym.fr) for the access to the microscope funded by the Region Rhône-Alpes, the CNRS and the 'GrandLyon'. This work was supported by the BQR SPEE3D granted by INSA Lyon, ANR project 3D-CLEAN, Labex iMUST and IFP Energies nouvelles.


Yue-Meng FENG (VILLEURBANNE CEDEX), Khanh TRAN, Siddardha KONETI, Lucian ROIBAN, Anne-Sophie GAY, Cyril LANGLOIS, Thierry EPICIER, Thomas GRENIER, Voichita MAXIM
08:00 - 18:15 #7044 - IM01-157 3D investigation of a PS/ABS polymer using different microscopy techniques.
IM01-157 3D investigation of a PS/ABS polymer using different microscopy techniques.

This study is developed in the framework of RéCaMiA, a French regional (Rhône-Alpes / Auvergne) microscopy network, which offers facilities through a panel of microscopes such as SEM, TEM, FIB, AFM, Confocal.

The objective of the study is to compare results obtained with different microscopy techniques currently employed in three-dimensional imaging, but it focuses more specifically on polymers [1-3]. For the purpose a blend of polystyrene / acrylonitrile butadiene styrene (PS/ABS) is chosen. This material allows to obtain good contrast in SEM or TEM; microstructural features exist at the submicronic and nano scales; and its glass transition temperature Tg is above 50°C. Two samples are stained by contact with a 4% osmium tetraoxide (OsO4) water solution to reveal contrasts. 2 FIB–SEM (FEI Helios600, Zeiss NVisio40 dual beam), 2 TEM (JEOL JEM 1400, JEOL 2100F), 2 SEM (FEI ESEM XL30, FEI Quanta250) are used to study the 3D structure of the polymer. This study develops a multiscale approach. The tools used require 2 different procedures to get a 3D image: (a) to acquire a stack of individual imaging planes and to transform it into the corresponding 3D data volume or (b) to perform electron tomography. In the first case individual images are obtained through a slice and view approach in FIB, or through individual observations, in SEM or TEM, of several thin foils prepared by ultramicrotomy method at room temperature (serial sectioning). Backscattered electron images are collected. The 3D reconstructions of the polymer obtained by the different tools are compared each other. Whatever the approach used, the morphology “salami” shape is observed in the structure of the polymer. Structure parameters, such as size distribution of the nodules and the anisotropy coefficient, are extracted and compared. Different test parameters effects are investigated, the preparation of the sample (compression of the microstructure more or less), the voltage, the spacing between the individual imaging planes, etc. The balance between the reconstructed volume size, the voxel resolution, the total time to get the 3D data volume, the advantages and limitations of the methods used in this multiscale approach will also be discussed.


[1] M. Kato et al., Journal of Polymer Science: Part B: Polymer Physics, Vol. 45, 677–683 (2007)
[2] S. Sinha Ray, Polymer 51 (2010) 3966-3970
[3] P. Jornsanoh et al., Ultramicroscopy 111(2011)1247–1254

Acknowledgements            

Thanks are due to CNRS for its financial support. Thanks are due to CLYM (Consortium Lyon - St-Etienne de Microscopie, www.clym.fr) funded by the Region Rhône-Alpes, the CNRS and the 'GrandLyon', for the access to the Zeiss NVisio40 and XL30; and also to Manutech-USD for the access to the FEI Helios600.


X. JAURAND, E. ERRAZURIZ, S. REYNAUD, Th. DOUILLARD, F. DALMAS, S. DESCARTES (VILLEURBANNE), F. SIMONET, M. MONDON, I. ANSELME-BERTRAND
08:00 - 18:15 #6310 - IM02-159 In situ tensile testing of silica glass membranes in the TEM.
IM02-159 In situ tensile testing of silica glass membranes in the TEM.

Increasing research on strength of glasses, which was greatly influenced by Griffith [1], has spawn strengthening strategies such as topological engineering [2]. Pioneering works by Takamori and Tomozawa [3], and Brückner [4] on cooling of glass melts under load and introducing structural anisotropy into the glass structure have been followed by strengthening of glasses by targeted mechanically-induced structural anisotropy [5]. Moderate electron beam (e-beam) irradiation has been exploited to induce enormous ductility and superplasticity into nanoscale silica spheres and wires, and was shown to affect their mechanical response [6-8]. It is, however, not yet known whether e-beam irradiation in combination with tensile loading can lead to anisotropic glasses, and how this affects their mechanical properties.

Recently we have reported that e-beam-assisted quenching under load inside the transmission electron microscope (TEM) alters the mechanical properties of nanoscale silica spheres and attributed this to compression-induced structural anisotropy [9]. Here we transfer this approach to tensile loading of nanoscale silica membranes. Tensile specimens are prepared with the focused ion beam (FIB) from commercially available silica membranes (Plano GmbH) on push-to-pull (PTP) devices (Fig. 1). Raman spectroscopy was performed to investigate the structure of silica membranes and damage induced by FIB (Fig. 2). Raman spectra show that as-received membranes exhibit a structure of vitreous silica [10,11]. After Ga-irradiation in the FIB densification of the membranes occurs, while the membranes still maintain the character of vitreous silica. In situ tensile experiments are carried out with the Hysitron PI95 TEM PicoindenterTM inside of a Titan3 Themis 300. To achieve mechanical quenching inside the TEM moderate e-beam irradiation is used to mimic temperature, while the e-beam is switched off during elongation of the silica membrane. While the deformation of silica under e-beam irradiation is superplastic [6], the sudden absence of the e-beam during tension (quenching point) translates the deformation from superplastic to elastic (see Fig. 3a)), and finally leads to fracture. The Young’s modulus E = 73 GPa of the membrane drawn at beam-off conditions (Fig. 3b)) almost matches the value known for bulk fused silica [12], while the value of the membrane quenched under load (E = 78 GPa) is slightly increased. The tensile strength is in the range of values known from silica glass fibers with comparable dimensions [13], but clearly exceeds values known for microscale silica glass fibers [5]. Finally, we demonstrate how to directly track structural changes in silica glass during in situ tensile experiments in TEM by in situ electron diffraction. The unique combination of in situ electron diffraction with tensile experiments in TEM enables direct relation of structural changes in silica glass to quantitative nanomechanical data.

[1] A.A. Griffith, Phil. Trans. R. Soc. London 1921, 221, 163.
[2] L. Wondraczek et al., Adv. Mater. 2011, 23, 4578.
[3] T. Takamori, M. Tomozawa, J. Am. Ceram. Soc. 1976, 59, 377.
[4] R. Brückner, Glas. Berichte Glas. Sci. Technol. 1996, 69, 396.
[5] M.D. Lund, Y. Yue, J. Am. Ceram. Soc. 2010, 93, 3236.
[6] K. Zheng et al., Nat. Commun. 2010, 1, 24.
[7] S. Romeis et al., Rev. Sci. Instrum. 2012, 83, 95105.
[8] M. Mačković et al., Acta Mater. 2014, 79, 363.
[9] M. Mačković et al., submitted.
[10] A. Perriot et al., J. Am. Cer. Soc. 2006, 89, 596.
[11] S. Romeis et al., Scr. Mater. 2015, 108, 84.
[12] W.C. Oliver, G.M. Pharr, J. Mater. Res. 1992, 7, 1564.
[13] G. Brambilla, D.N. Payne, Nano Lett. 2009, 9, 831.
Financial support by the Deutsche Forschungsgemeinschaft (DFG) through the SPP1594 “Topological Engineering of Ultra-Strong Glasses”, Cluster of Excellence EXC 315 “Engineering of Advanced Materials” and GRK1896 “In situ microscopy with electrons, X-rays and scanning probes” is gratefully acknowledged.


Mirza MAČKOVIĆ (Erlangen, Germany), Hana STARA, Thomas PRZYBILLA, Christel DIEKER, Florian NIEKIEL, Patrick HERRE, Stefan ROMEIS, Nadine SCHRENKER, Wolfgang PEUKERT, Erdmann SPIECKER
08:00 - 18:15 #6320 - IM02-161 Environmental (S)TEM analysis of Fe nanoparticles under oxygen atmosphere.
IM02-161 Environmental (S)TEM analysis of Fe nanoparticles under oxygen atmosphere.

Fe and Fe-oxide nanoparticles (NPs) have a number of promising potential applications in physical and medical sciences. These include magnetic storage devices, catalysis, sensing, contrast enhancement in magnetic resonance imaging and magnetic hyperthermia [1-3]. Understanding of the metallic Fe NPs formation and the oxidation processes down to atomic scale is paramount for the control of the quality and the optimization of their applications. Although metals oxidation has been studied for decades on bulk and thin film materials [4], there is still a lack of studies on the oxidation of metallic iron at the nanoscale.  A recently modified double aberration corrected JEOL 2200FS (S)TEM [5] has demonstrated the possibility of the analysis of metallic nanoparticles in gas environment at temperature allowing single atom visualisation by HAADF STEM in controlled gas reaction environment [6]. In this study, thin films of Fe were deposited by sputtering ex-situ on C films supported by standard TEM Cu grids. Nanoparticles were produced by annealing in vacuum within the microscope column the pre-sputtered iron thin films (see Figure). Nanoparticle formation and size distribution was monitored in-situ as a function of time and temperature by HAADF STEM imaging. After annealing, nanoparticles were shown to consist of single crystal metallic Fe. The Fe nanoparticles interaction with the Oxygen atmosphere was studied in-situ at 300 °C with an Oxygen partial pressure at the specimen in the range of 2*10-2 Pa to 2 Pa. The interaction of the nanoparticles with the gas will be discussed in terms of the oxidation mechanism as well as the changes in nanoparticle geometry, composition, size distribution, and crystallinity.

References:

[1] B D Terris and T Thomson, J. Phys. D 38, R199–R222 (2005)

[2] H. Galvis et al. Science 335, 835–838 (2012)

[3] Q A Pankhurst, N T K Thanh, S K Jones, and J Dobson, J. Phys. D 42, 224001 (2009)

[4] N. Cabrera and N. F. Mott, Reports on Progress in Physics, Volume 12, Issue 1, pp. 163-184 (1949)

[5] P L Gai and E D Boyes, Microscopy Research and Technique 72, 153 (2009)

[6] E D Boyes, M R Ward, L Lari, and P L Gai, Annalen der Physik 525, 423 (2013)


Acknowledgement: We thank the EPSRC (UK) for research grants EP/J018058/1 and EP/K03278X/1


Leonardo LARI (York, United Kingdom), Robert CARPENTER, Vlado LAZAROV, Pratibha GAI, Ed BOYES
08:00 - 18:15 #6373 - IM02-163 Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments.
IM02-163 Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments.

Annular dark field scanning transmission electron microscopy (STEM) is capable of imaging thick specimens. The capability to image thick specimens is relevant, for example, for studying cells embedded in plastic section, polymeric materials in which nanoparticles are embedded, metallic samples containing several phases, and for research on liquid specimens.  However, at sample thicknesses larger than the mean free path length for elastic scattering in the materials under investigation, significant scattering of the beam occurs that leads to beam broadening. This beam broadening results in a reduction of the spatial resolution that becomes more pronounced the deeper the focus of the electron probe is within the sample. In addition, the spatial resolution even of objects focused at the top of the specimen (with respect to a downward traveling electron beam) is reduced by thick materials underneath as the contrast and hence the signal-to-noise ratio decreases in thicker specimen at a given electron dose in STEM experiments. The dependency of the spatial resolution on the specimen thickness was already determined experimentally, via simulation, and in various analytical models [1] for objects at the top and at the bottom of thick specimen. An initial theoretical model was developed about the effective resolution obtained for an object at a certain depth within a scattering matrix [2] but experimental verification is lacking. In this work, we examine the effect of beam broadening on nanoparticles at specific vertical positions within thick samples.

 

For our experiment, we chose to study gold nanoparticles embedded in a solid aluminum film as experimental model system. We deposited multiple layers of aluminum by physical vapor deposition on silicon chips featuring thin (50 nm), electron beam transparent silicon nitride windows in the center, through which the imaging was done. Gold nanospheres of 5-10 nm in diameter were placed between individual layers. By using solid aluminum as support material we benefit from immobilized gold nanoparticles at specific vertical positions in an electrically conducting and stable matrix. Gold nanorods were deposited on top and at the bottom of the aluminum film enabling us to determine the thickness of the aluminum film by tilting the specimen holder. The setup of our experiments is illustrated in Figure 1. The experiments were conducted using a CS-corrected STEM/TEM (ARM200f, JEOL, Japan) at 200 kV acceleration voltage.

 

Our experiments confirmed that the vertical position of the gold nanoparticles within the aluminum matrix determines the spatial resolution. Particles positioned deeper within the Al matrix were imaged with a lower spatial resolution than those closer to the top surface, where the electron beam entered the specimen. This observation is illustrated in the electron micrographs in Figure 2. The same particles are shown from the different sides of the silicon chip with respect to the direction of the electron beam. In a) the Au nanoparticles are in a depth of 0.48 µm, while in b) they are below only 0.18 µm of Al in. The total thickness of the Al matrix is 0.62 µm. The spatial resolution was determined by analyzing intensity profiles over the particles. Interestingly, the change in the spatial resolution was only reflected by the distance from 25% to 75% of the maximum intensity (d25-75), but not in the full widths at half maximum of the intensity profiles (see Figure 2c). Thus the scattering mainly led to increased beam tails.

 

[1] H Demers et al., Microsc Microanal 18 (2012), p. 582.

[2] T Schuh and N de Jonge, C R Phys 15 (2014), p. 214.

[3]   We thank E. Arzt for his support through INM. Research in part supported by the Leibniz Competition 2014.


Andreas VERCH (Saarbrücken), Niels DE JONGE
08:00 - 18:15 #6455 - IM02-165 Structural dynamics of copper and nickel substrates during redox reactions studied by in-situ SEM.
IM02-165 Structural dynamics of copper and nickel substrates during redox reactions studied by in-situ SEM.

Many efforts have been made in order to investigate catalyst under relevant working conditions. Indeed, the action of a chemical potential has to be considered when describing the state of a catalyst and recent studies have demonstrated that the catalyst surface evolves dynamically under reaction conditions.1,2 In order to complement in-situ spectroscopic tools, such as near-ambient X-ray photoelectron spectroscopy (NAP-XPS), with visual information about the active surface structure, we have implemented in-situ scanning electron microscopy (SEM) for the observation of dynamic processes at the µm to nm scale.3

By coupling in-situ SEM with mass spectroscopy measurements we are able to relate structural dynamics at the surface of metal catalysts to changes in the gas phase composition. Under specific conditions, oscillatory behavior of the catalyzed chemical reactions was observed for the case of polycrystalline nickel and copper foils. These self-sustained oscillations can be utilized to assist the identification of kinetic mechanisms4 and provide insight in the active and inactive state of the catalyst. Figure 1. demonstrates the dynamic behavior of the Ni foil surface during hydrogen oxidation reaction at 600°C. The active state in the oscillatory reaction is dominated by the presence of metallic Ni, while the formation of NiO coincides with a decrease in the catalytic activity. Overall, it will be outlined how the implementation of complementary in-situ SEM and mass spectroscopy techniques can enrich our understanding of the dynamic behavior of active catalyst and how it complements spatially integrated spectroscopic data that is recorded under similar conditions.

Figure 1. Self-sustained oscillations during hydrogen oxidation over a Ni foil at 0.3 mbar with a hydrogen/oxygen ratio of 7:1. The SEM images correspond to the different points in the oscillation as indicated in the mass spectrum profile. During the active state of an oscillation (A), the Ni foil exhibits a smooth metallic surface. In the low-active state (B), the surface of the Ni foil is covered by an oxide layer.

 

 

References

[1]T. Lunkenbein et al., Angew. Chem. Int. Ed. 2015, 127, 15, 4627-4631

[2] S. Piccinin et al., Phys. Rev. Lett. 2010, 104, 035503

[3] Z. J. Wang et al., ACS Nano., 2015, 9, 1506-1519

[4] V. V. Kaichev et al., Surf. Sci., 2013, 609, 113-118


Jing CAO, Jing CAO (Berlin, Germany), Ali RINALDI, Zhu-Jun WANG, Gisela WEINBERG, Marc WILLINGER, Robert SCHLÖGL
08:00 - 18:15 #6495 - IM02-167 Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation.
IM02-167 Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation.

In-situ indentation tests in FIB-SEMs are a powerful tool to characterize the mechanical deformation properties of matter at the micron scale [1,2]. FIB milling is used to produce micrometer sized – usually cylindrical – pillars from the bulk, while SEM imaging allows to determine the geometry of the pillars prior, during and after the load-displacement data acquisition. In this work, different automatic workflows were tested for the preparation of high aspect-ratio pillars with well-defined geometries, in particular with perfectly perpendicular side walls.

A state-of-the-art FIB-SEM instrument was used to fabricate the pillars. They were machined by milling a series of concentric rings with decreasing FIB currents into the sample. Hereby, the sample was at 54° tilt to ensure normal incidence of the FIB. The last and smallest ring was milled with a 3 nA probe, which yielded a slightly material dependent pillar wall angle of around 2° to the sample normal. After this pre-preparation step, the geometry of the pillars was refined further to achieve perfectly perpendicular pillar side walls using lathe milling [3]. The ideal cylindrical geometry is highly desirable, because it is easier to model for a reliable analysis of the load-displacement measurement.

Two different lathe milling techniques were implemented in this work and compared. They both involve a number of FIB milling steps each performed at different sample rotations to shape the pillar wall along its whole circumference. After each sample rotation the pillar needs to be repositioned accurately by means of SEM and FIB image recognition of fiducial marks on the sample.

The first approach, #1, is similar to the one described in [3]. The walls of the pillar are shaped from the side by FIB milling at zero degree stage tilt as shown in Figure 1(a). For sample repositioning a single fiducial is used which is placed – for symmetry reasons – exactly in the center of the pillar (see Figs. 1(b) and (c)). Approach #1 was automated using the application programming interface (API) of the FIB-SEM instrument. Including lathe milling the total preparation time per typical pillar adds up to about an hour. Because of the space needed for the fiducial mark only pillars with diameters, d>5 µm, can be fabricated automatically in this way.

The need to fabricate smaller pillars with d<5 µm motivated an alternative and new lathe milling workflow, #2 (see Figure 2). Here, the walls of the pillar are shaped from the pillar top (sample at 54° tilt), as it was done in the pre-preparation step, too. By slightly under-tilting the sample a few degrees an edge of the pillar was exposed to the FIB for machining (Fig 2(a)). The sample was then rotated and repositioned for the next milling step. This process was iterated to cover the full circumference of the pillar. In order to reduce the number of iterations the milling was done following the green boomerang type of shape depicted in Figure 2(b). Only eight iterations – as compared to at least 18 with approach #1 – were needed to obtain an almost perfectly circular pillar cross section (see Fig. 2(c)).

In summary, the new lathe milling process can be used to machine very small pillars. It can be combined easily with the pillar pre-preparation step for a fully automatic pillar preparation. Further, because it gets along with less iterations, it is faster than previous approaches.

References:

[1] J.R. Greer et al., Acta Materialia 53 (2005), p. 1821.

[2] D.M. Dimiduk et al, Acta Materialia 53 (2005), p. 4065.

[3] M.D. Uchic and D.M. Dimiduk, Mat Sci. Eng. A 400-401 (2005), p. 268.


Tobias VOLKENANDT (Oberkochen, Germany), Alexandre LAQUERRE, Michal POSTOLSKI, Fabián PÉREZ-WILLARD
08:00 - 18:15 #6523 - IM02-169 In situ liquid-cell transmission electron microscopy of Y-based precursor growth dynamics at elevated temperatures.
IM02-169 In situ liquid-cell transmission electron microscopy of Y-based precursor growth dynamics at elevated temperatures.

Yttrium oxide (Y2O3) nanoparticles (NPs) as a host for heavy rare earth elements (Yb3+, Eu3+) have
shown to be an efficient up-conversion phosphor material with a great potential ranging from therapy
and sensing for drug delivery to photovoltaic applications [1]. In order to achieve desired morphology
and size distribution of Y2O3 NPs the nucleation and growth pathways of Y-based precursors need to be
thoroughly understood. Unfortunately, the mechanism controlling the nucleation and growth of NPs are
often difficult to assess and are conventionally studied by indirect methods. On the contrary, in-situ
transmission electron microscopy (TEM) combined with the specialized liquid cell offers both,
unprecedented experimental and characterization tool for a direct study of nanoparticle’s nucelation and
growth phenomena from solutions.
To perform in-situ TEM experiments Jeol JEM 2100 TEM equipped with Protochips Poseidon 300
liquid flow cell with a heating capability was employed. The synthesis of Y-based precursor NPs was
performed from the solution of urea, yttrium acetate and minor amounts of HNO3 to facilitate efficient
dissolution of yttrium acetate. The solution was sealed between two specially designed chips forming a
close container with the viewing area of 40 x 50 m and the water layer thickness of 150 nm. The urea
precipitation method was selected because [2] it can be well controlled by the temperature of the
solution, triggering the homogenous decomposition of urea throughout the whole chamber volume and
consequently the uniform precipitation of Y-based precursor nuclei, typically Y(OH)(CO3).
To properly evaluate the electron beam effect during the in-situ observation the so prepared solution
was first observed for 30 minutes at room temperature and at dose rate of 5000 e-/nm2*s. No evident
precipitation occurred during that time. This initial experiment served as a confirmation that additional
chemical species that were created during the radiolysis of water (solvated e-, OH-, H0, OH0, H2, H2O2,
H3O+, HO2, …) under the influence of incoming electron beam did not have significant influence on the
nucleation of NPs at the room temperature [3]. The new feature of the in-situ holder setup, which adds
an extremely important thermodynamic variable in the experiment, temperature, allowed us to perform
in-situ heat-triggered nucleation of Y-based precursor NPs. Namely, the abrupt nucleation of NPs was
observed when the temperatures in the cell was raised above 90 °C. Although different morphologies of
nanoparticles could be observed during the nucleation and growth period, in this study we focused only
on NP’s with clear hexagonally shaped faces (Fig. 1). These particles grew with an average growth rate
of a 0.5 nm/s to an average size of 25 nm and remained stable during the whole experimental observation
period (Fig. 2). Selected area electron diffraction (SAED) patterns showed that these NPs were
crystalline already in the early stage of growth period.
The formation of well crystalline nanoparticles by urea precipitation method is unexpected since the
typical products of this reaction result in the formation of Y(OH)(CO3) amorphous precursor. The
formation of crystalline NPs can be explained by the fact that radiolytic decomposition of water provides
additional reactive species in the final solution [3]. One plausible explanation could be that the increase
of [(OH)-] concentration at elevated temperatures, a combined effect of water and urea decomposition,
will promote the precipitation of stable hexagonally shaped Y(OH)3 particles [4].
References:
1. Lojpur, V.M., et al. (2013). Nanoscale Res Lett, 8, 131-137.
2. Qin, H., (2015). Cermic International, 41, 11598-11604.
3. Schneider, N. M., et al. (2014). J. Phys. Chem. 118(38), 22373-22382.
4. Huang, S., et al. (2012). Mater. Chem., 22, 16136-16144.


Bojan AMBROŽIČ (Ljubljana, Slovenia), Nina KOSTEVŠEK, Kristina ŽUŽEK ROZMAN, Marjan BELE, Sašo ŠTURM
08:00 - 18:15 #6531 - IM02-171 Electrical transport-induced transformations in filled carbon nanotubes imaged in situ by scanning-transmission electron microscopy.
IM02-171 Electrical transport-induced transformations in filled carbon nanotubes imaged in situ by scanning-transmission electron microscopy.

Fe-filled CNTs have been proposed as perfect candidates for a large and varied number of applications, ranging from the biological to optoelectronics or memory storage devices 1. For any of these applications, it seems crucial to understand the interactions, possible phase changes or reactions that can take place as a consequence of exposure to their real working conditions.

Conventional bright-field transmission electron microscopy (BF-TEM) has been the tool traditionally employed to observe in-situ the dynamical effects that take place when individual CNTs are exposed to high electrical currents and Joule heating. Despite being a much more powerful technique, scanning TEM-annular dark field (STEM-ADF) imaging has been scarcely for this purpose 2. One of the main advantages of STEM-ADF over BF-TEM is that the intensity in the images is highly dependent on the atomic number of the species which are present and therefore the images show compositional in addition to structural information. This gives a much better understanding of current-induced migration effects, formation of intermediate phases or alloying, or phase separation phenomena, something that using BF-TEM alone would miss. In the STEM-ADF configuration it is also possible to perform complementary analytical spectroscopy simultaneously with imaging and with comparable spatial resolution.

Here we show the significant advantages of combining in-situ experiments with STEM-ADF and related analytical techniques to gain new insights into the electrical transport induced transformations in P, N doped Fe-filled carbon nanotubes. It has been possible to monitor in real time a multistage process (Figure 1) in which the Fe filling reacts with nitrogen to form an intermediate alloy phase, which then decomposes into smaller particles. The presence of N2 gas within the inner channel of the tube is found to be crucial to this process.

 

  1. S. Costa et al.,  Phys. Stat. Sol. B 2007, 244, 4315-4318.
  2. Y. Beyer et al., Micron 2012, 43, 428–434.

Juan G LOZANO (Oxford, United Kingdom), Zabeada ASLAM, Rebecca J NICHOLLS, Antal A KOOS, Frank DILLON, Michael SARAHAN, Peter D NELLIST, Nicole GROBERT
08:00 - 18:15 #6535 - IM02-173 Cobalt-cerium coating formation: from ESEM to TEM analyses.
IM02-173 Cobalt-cerium coating formation: from ESEM to TEM analyses.

 

Fuel cells are promising devices for clean energy conversion. In particular, Solid Oxide Fuel Cells (SOFC) convert natural gas and biogas into electricity and cogenerated heat with high efficiency. Their working temperature (700-800°C) may induce performance degradation in the cells and other components of the stack (series connection of cells). Chromium contamination of the cathode (oxygen electrode) is one of these degradation processes in SOFC. This chromium evaporates from the steel bipolar plates which act as cell-to-cell interconnections. To suppress the Cr evaporation, the steel plates must be coated. Understanding the degradation phenomena in the stack and their evolution helps to improve the device lifetime. Post test analyses are not always sufficient but already give good insight. On the other hand, the possibility to reach operating temperature (up to 900°C) and to mimic operating conditions of oxidising and reducing atmospheres (up to 30 Pa of O2 or H2) in environmental SEM allow to observe the evolution in near real condition. In this study, Sandvik Material Technology’s cerium-cobalt protective PVD coating on top of the Sandvik SSHT steel (FeCr-base) is analysed. Several movies were recorded during Cr-oxidation growth underneath the coating for 48 hours in an ESEM in oxidising conditions (900°C, 30Pa O2). Growth observation of the oxide layer allows a better understanding of the behaviour of the steel with this protective layer. Pore stability, elemental diffusion through layers and the probable formation of new phases were observed by SEM and EDX. FIB was used for cross section observations and will be used for TEM lamella preparation in future. TEM observation will allow to analyse the formed crystals by diffraction and establish a correlation with  the observations from the ESEM experiments. 

Acknowledgements

Max Planck Institute – EPFL centre for the funding of this project.
Dr Marco Cantoni(EPFL-CIME) for FIB preparation.


Stéphane POITEL (Lausanne, Switzerland), Jun ZHU, Cécile HÉBERT, Jan VAN HERLE, Marc WILLINGER
08:00 - 18:15 #6537 - IM02-175 Monitoring the Dynamics of Heterogeneous Catalysts by Electron Microscopy.
IM02-175 Monitoring the Dynamics of Heterogeneous Catalysts by Electron Microscopy.

It is known that the shape of metal catalysts adapts to the chemical potential of the surrounding atmosphere and that the active surface evolves dynamically under reaction conditions [1-3].
Different photon-based characterization techniques were improved and implemented to probe the active state of catalysts in situ. However, such techniques lack the spatial resolution as they provide information averaged over a macroscopic scale, which is much larger than the catalytic active nanostructures.

 

In situ Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) have proven to be powerful techniques for the study of atmosphere and temperature induced morphological or compositional changes of catalysts at micrometer- to atomic resolution scale [4,5]. Furthermore, in situ SEM and TEM can be used as complementary methods from the point view of applicable pressure range and the obtainable resolution. Hence, pressure gap impact on the catalyst’s activity can be assessed using these techniques. On the other hand, collective (SEM) and individual (TEM) phenomena on the surface of active catalysts in the micro- to nanometer scale can be compared and correlated to the reactivity.

In this contribution we present in situ TEM and SEM results of the catalytic oxidation of hydrogen on copper. Aside from the fundamental importance of this catalytic system, the investigation of copper redox chemistry is of great importance for decisive future energy related catalytic processes as methanol synthesis or water gas shift reaction.

In situ SEM experiments were conducted in the chamber of a modified commercial environmental scanning electron microscope. The instrument is equipped with a home-built heating stage and attached to a gas feeding system and a mass spectrometer for product analysis.

In situ TEM experiments were carried out using a Protochips, Inc. gas flow holder equipped with an environmental cell (a nanoreactor). The holder is combined with a home built gas feeding and a mass spectrometer for gas analysis. The environmental TEM cell allows monitoring gas-solid interactions under relevant catalytic conditions.

 

Metal catalysts were prepared in situ by decomposing the catalyst precursor in an oxidative atmosphere and subsequent reduction in hydrogen (figure 1). As the resulting metal catalysts were exposed to a reductive gas mixture (H2 in He) that contains a little amount of molecular oxygen, the catalytic reaction starts to proceed, as proved by the gas analysis of products which shows a concomitant increase of water and decrease of oxygen MS-signals (figure 2). The catalyst at work is very dynamic and shows continuous and erratic morphological changes, provided that the Wulff construction of crystals was preserved most often over time. The interpretation of this dynamic behavior of catalysts under working conditions needs much further elaborated studies that can control or slow down the kinetics of the reactions, and hence make it possible to exploit other TEM analysis techniques as in situ EELS and diffraction. Nevertheless, these results may evoke strong debates about the assumptions that were published in the catalysis literature on the basis of TEM observations made in vacuum.

In this contribution we will outline how the implementation of complementary in situ electron microscopy techniques can enrich our understanding of the dynamic behavior of the active catalysts.

 

References:

[1]   P.L. Hansen, et al., Science, 2002, 295, 5562, 2053-2055

[2]   T. Lunkenbein, et al., Angew. Chem.-Int. Ed. 2015, 54, 4544–4548.

[3]   J. R. Jinschek, Chem. Commun. 2014, 50, 2696–2706.

[4]   Z.-J. Wang, G., et al., ACS Nano 2015, 9, 1506–1519.

[5]   S. B. Vendelbo, et al., Nat. Mater. 2014, 13, 884–890.


Ramzi FARRA (Berlin, Germany), Ali RINALDI, Mark GREINER, Jing CAO, Robert SCHLÖGL, Marc-G WILLINGER
08:00 - 18:15 #6545 - IM02-177 In-situ propagation of Al in germanium nanowires observed by transmission electron microscopy.
IM02-177 In-situ propagation of Al in germanium nanowires observed by transmission electron microscopy.

Semiconductor nanowires (NWs) are promising candidates for many device applications ranging from electronics and optoelectronics to energy conversion and spintronics. However, typical NW devices are fabricated using electron beam lithography and therefore source, drain and channel length still depend on the spatial resolution of the lithography. In this work we show fabrication of NW devices in a transmission electron microscope (TEM) where we can obtain atomic resolution on the channel length using in-situ propagation of a metallic phase in the semiconducting NW. The corresponding channel length is independent on the lithography resolution. We show results on semiconducting NW devices fabricated on two different electron transparent Si3N4 membranes: a calibrated heater chip from DENs solution [1] and homemade membranes where the NW-metal contact is locally heated by Joule heating [2]. We demonstrate a real-time observation of the metal diffusion in the semiconducting NW. First we present results on in-situ propagation of aluminum metal in Ge NWs while monitoring the system temperature [3] and by Joule heating while measuring the current through the device. We study the kinetics and rate limiting step by monitoring the position of the reaction front as a function of time. Second we will show characterization of the formed phase at atomic length scales with different (S)TEM techniques (energy dispersive X-ray spectroscopy, HR(S)TEM) to understand how the metal atoms diffuse and incorporate into the Ge NW at the reaction front and how these parameters relate to the electrical properties of the same interface.
Using EDX analysis and comparing with 3D NW model calculations we show that the reacted NW part is pure Al, with a shell of Al2O3 with a low Ge content on both sides of the Al2Oshell see Fig.2. EDX analysis show that both Al and Ge are diffusing in opposite directions.

References

[1]  http://denssolutions.com/products/nano-chip

[2] M. Mongillo, P. Spathis, G. Katsaros, P. Gentile, M. Sanquer and S. De Franceschi, ACS Nano, 5, 7117-7123 (2011).

[3] S. Kral, C. Zeiner, M. Stöger-Pollach, E. Bertagnolli, M. I. den Hertog, M. Lopez-Haro, E. Robin, K. El Hajraoui, and A. Lugstein, Nano. Lett, 15, 4783-4787 (2015).

 

 

Acknowledgements

Financial support from the French ANR for the “COSMOS” project is acknowledged. We thank B. Fernadez and T. Fournier for their technical support.


Khalil EL HAJRAOUI (Grenoble), Eric ROBIN, Miguel LOPEZ-HARO, Clemens ZEINER, Florian BRUNBAUER, Sébastian KRAL, Alois LUGSTEIN, Jean-Luc ROUVIÈRE, Martien DEN HERTOG
08:00 - 18:15 #6612 - IM02-179 Graphene-supported microwell liquid cell for in situ studies in TEM and SEM.
IM02-179 Graphene-supported microwell liquid cell for in situ studies in TEM and SEM.

Liquid cell transmission electron microscopy (LCTEM) is used for in situ investigations of dynamic nanoparticulate processes in aqueous and nonaqueous solutions. In contrast to complementary techniques like conventional (S)TEM, cryo-TEM or SAXS, LCTEM ensures real-time high-resolution imaging and is used in various research fields like biology, electrochemistry and materials science [1]. For our approach we make use of a modified microwell liquid cell layout combining the benefits of the microwell liquid cell design used by Dukes et al. [2] and the graphene liquid cell shown by Yuk et al. [3] for in situ (S)TEM and SEM experiments. In this approach, the liquid specimen is confined between amorphous silicon nitride microwells and multilayer graphene (cf. fig. 1). This enables improved imaging conditions compared to other cell designs because the cell profits from the advantages of (i) a robust encasement combined with an ultrathin and electrically conducting low-Z material and (ii) a constant liquid film-thickness defined by the nitride wells. Furthermore, in this design window bulging is largely suppressed due to small microwell diameters on the order of 5 µm. The liquid cells are processed under clean room conditions via conventional semiconductor technology as well as bulk micromachining. In a first step a silicon nitride layer is deposited onto an oxidized thin silicon wafer via LPCVD followed by structuring the front and back-side by photolithography and reactive ion etching. For the simplified device layout no mask alignment is necessary which minimizes the failure probability and improves the yield of the fabrication process. Furthermore, the number of process steps could be considerably reduced compared to the fabrication process of conventional static liquid cells. Bulk micromachining of the silicon wafer is done by an anisotropic potassium hydroxide wet-etching process. The filling and vacuum tight sealing of the cell is conducted in one step by transferring the graphene directly onto a droplet of the specimen solution. When the liquid dries the graphene adheres to the silicon nitride and encloses small amounts of the fluid within the microwells. The compatibility to conventional specimen holders makes the liquid cells feasible for the use with various kinds of TEMs and SEMs.

As first application and test of this optimized liquid cell design electron beam induced growth and degradation phenomena of Au-nanoparticles in HAuCl4-solution have been studied. Figure 2 shows snapshots of an in situ TEM investigation monitoring the dissolution of a Au-nanoplatelet at a liquid-gas interface and the subsequent growth of smaller particles above (or below) the gas bubble. This redistribution of material is facilitated by the high mobility of gold-atoms in solution as well as by reactive species generated by electron beam irradiation of the aqueous solution. The experiment was carried out in TEM bright-field mode using a Philips CM-30 (S)TEM operated at 300 kV. In order to demonstrate that the cell can be equally used inside an SEM figure 3 shows snapshots of an in situ study of electron beam induced dendrite-growth of Au-nanostructures in a 1 mM HAuCl4-solution. Here, imaging was carried out in STEM mode using a FEI Helios Nanolab 660 operated at 29 keV primary electron energy.

References:

[1] N. de Jonge et al., Adv. Imag. Elect. Phys. 2014, 186, 1−37

[2] M. J. Dukes et al., Microsc. Microanal.  2014, 20, 338−345

[3] J. M. Yuk et al., Science 2012, 336, 61−64

 

Acknowledgment:

Financial support by the DFG via the Research Training Group GRK1896 "In situ microscopy with electrons, X-rays and scanning probes" is gratefully acknowledged.


Andreas HUTZLER (Erlangen, Germany), Robert BRANSCHEID, Michael P. M. JANK, Lothar FREY, Erdmann SPIECKER
08:00 - 18:15 #6628 - IM02-181 An in situ multiscale approach for the characterization of plasticity and damage in a TA6V alloy.
IM02-181 An in situ multiscale approach for the characterization of plasticity and damage in a TA6V alloy.

Due to its specific strength and  good biocompatibility, Ti-6Al-4V alloy find many applications in  medical and aeronautic industries.

At room temperature, the studied TA6V alloy presents a bi-modal microstructure consisting of hcp alpha phase together with bcc beta phase. When subjected to high cooling rates such as in welding processes, a lamellar hcp alpha’ phase appears, which modifies the plastic and damage behavior of the alloy.  In order to better understand the role of microstructure on failure of the material, a clear connection must be made between microstructural parameters such as interfaces, grain or lath orientation, grain boundaries, morphologies and failure initiation.  

The deformation behavior of both welds and base metals were characterized by in situ EBSD tensile tests.  Slip and twin systems were identified for bimodal and fully martensitic microstructure. Deformation paths were followed upon deformation, and related to original laths or grain orientation, see Figure 1. At higher deformation levels, damage starts and cavity appear equally at grain boundaries, phase boundaries, or inside grains. However, if a large number of information is available from these 2D observations, 3D characterization is required for a quantitative damage study as most of the cavities initiate in the volume and not at the surface. The same samples were then characterized by in situ tensile X Ray Tomography tests conducted at ESRF Grenoble.

For several deformation levels, a quantification of the cavity number and size was performed  and a clear description of the cavity initation, growth, and coalescence was obtained in 3D, as reported on Figure 2.

 

 

 

 

Thanks are due to Aymeric Migliarini, Lea Noirot Coisson and Cyril Lavogiez for their active implication during the project.


Sophie CAZOTTES (VILLEURBANNE CEDEX), Sylvain DANCETTE, Christophe LE BOURLOT, Eric MAIRE, Thomas PARIS
08:00 - 18:15 #6642 - IM02-183 The “Ocean” System: Microfluidic based system for in-situ analysis of liquid processes inside the TEM.
IM02-183 The “Ocean” System: Microfluidic based system for in-situ analysis of liquid processes inside the TEM.

Nanotechnology is driving scientists to better comprehend the real-time dynamics and structure-property relationship of various materials and biological samples under liquid conditions. Such understanding is crucial for a wide range of applications involving, for example, nanoparticle synthesis, self-assembly processes, (bio) molecular interactions, and biological activity in cells. In-situ transmission electron microscopy (TEM) observations in the liquid-phase is expected to lead to better scientific understanding, the discovery of phenomena at the nanoscale in liquid not visible before, and results in novel and innovative applications. Here we present the development of the “Ocean System”, which is an easy-to-use add-on that enables in-situ liquid studies inside the TEM (Figure 1). It consists of an optimized TEM holder that uses a microfluidic chamber as sample carrier, replacing the traditional copper grid. Such device, referred to as Nano-Cell, acts as a multi-functional and micro-sized laboratory that keeps the sample in a fully hydrated state. Furthermore, the system includes an external test station that guarantees the safe loading of the holder into the TEM. Each Nano-Cell consists of two chips (Figure 2) that are sandwiched together to form a sealed microfluidic compartment. Both chips are covered with silicon nitride providing an electron transparent window and ensuring their chemical inertness and biocompatibility. Samples are prepared directly onto the electron transparent windows, which allow for the electron beam to pass through for in-situ imaging. Biological cells can also be directly grown on the chips.

In order to control the liquid thickness to improve imaging resolution, the experiment can be customized by selecting the best-suited spacer based on sample size. Having direct access to the electron transparent windows enables local functionalization of the membrane´s surface, empowering the user to further control the microfluidic environment. The holder tip contains a precision slot with various alignment poles that ensure self-alignment of the top and bottom chips. Similarly, it contains a by-pass structure that prevents overpressures during liquid handling, and that allows rapid liquid exchange in the tubing, since the flow cross-section in this channel is much larger than that of the liquid path between the chips. The tip closure mechanism uses alignment balls, so that the tip correctly closes when screws are tightened independently on the applied force. The mechanism prevents over-compression of the O-rings and ensures that no shear stress will be transferred to the Nano-Cell, as these could damage fragile samples (i.e. biological cell). Additionally, the modular design ensures reliable results with easy replacement of all holder parts, such as tubing, holder tip and the Nano-Cell (Figure 3). This is particularly important, as it prevents cross-contamination between different experiments, and the tubing can be easily replaced by the user if these become clogged. In addition, the tip can be rotated by 180°, so that depending if one wants to use TEM or STEM, the optimal resolution can be achieved for the sample, i.e. TEM achieves the highest resolution for objects below a liquid layer for a downward traveling electron beam, while the opposite is true for STEM.

The Ocean System can be used to study dynamic processes of nanoparticles. E.g. gold nanoparticles can be loosely attached to a SiN membrane. Their detachment during the experiment can be triggered by increasing the induced electron dose. This can provide useful information such as the interaction of nanoobjects (e.g. agglomeration, self-assembly, sintering) in different liquids. Figure 4 shows Au nanoparticles being attached to the SiN membrane. Upon imaging at higher magnifications the nanoparticles start moving along the SiN membrane and start to form agglomerates. Particle tracking was applied to 4 selected Au nanoparticles to study their movement.


Héctor Hugo PÉREZ GARZA (Delft, The Netherlands), Diederik MORSINK, Jeff XU, Justus HERMANNSDÖRFER, Mariya SHOLKINA, Merijn PEN, Sander VAN WEPEREN, Niels DE JONGE
08:00 - 18:15 #6647 - IM02-185 In-situ deformation of Ti6Al4V in electron microscopes.
IM02-185 In-situ deformation of Ti6Al4V in electron microscopes.

Ti6Al4V is the most widely used titanium alloy [1] and comprises two phases, viz. a hexagonally closely packed α phase and a body centred cubic β phase. For the lifing prediction of the alloy components and also for the future alloy development, it is of interest to understand the role of various interfaces such as grain boundaries and inter-phase boundaries in the mechanical response of the alloy. The last ten years have seen the development of nano-mechanical testing within electron microscopes on samples prepared using focused ion beam, which has not only offered the quantitative mechanical properties but also the simultaneous imaging analysis of samples containing specific structural features [2, 3]. In this work, in-situ electron microscopy studies on miniaturised Ti6Al4V samples were used to achieve a better understanding of the plastic deformation micro-mechanisms involved. Micron-sized pillar samples were compressed in an SEM and the mechanical properties of both alpha and beta phases were evaluated, while sub-micron sized pillars were compressed in a TEM to observe the dislocation activities. The nucleation of dislocations, the yielding of the samples and the work hardening observed in the samples with different sizes will be discussed.

References:

  1. Lütjering, G. and J. C. Williams (2007). Titanium, Springer.
  2. Q. Yu, M. Legros, A.M. Minor, MRS Bulletin, 40.01 (2015): 62-70
  3. M.W. Kapp, C. Kirchlechner, R. Pippan, G. Dehm, Journal of Materials Research, 30.6 (2015): 791-797

Xinyu LU, Zhaoran LIU, Yu Lung CHIU (Birmingham, United Kingdom), Ian JONES
08:00 - 18:15 #6660 - IM02-187 Development of an in-situ specimen holder for high-voltage environmental electron microscopy of fuel cells.
IM02-187 Development of an in-situ specimen holder for high-voltage environmental electron microscopy of fuel cells.

Performance of Solid oxide fuel cells (SOFCs) is affected by microstructural changes and electrochemical reactions in interfacial regions between electrode and electrolyte during the operation. SOFCs are operated at high temperatures using a fuel gas and air. Therefore, an environmental electron microscope that allows for observation of specimens in the gas atmospheres is powerful analytical tool for nano-scale interfaces in SOFCs. The redox reaction in the cell has been reported by using in-site environmental electron microscopy and spectroscopy [1, 2]. The cell reaction, however, at interfacial regions between electrode and electrolyte has not completely been understood. In order to observe the interface in the cell reactions, we have developed an in-situ specimen holder, which can heat and apply the external voltage to the specimen. In this paper, we report details of the in-situ specimen holder and preliminary results of observation of a SOFC structure using this holder in a high-voltage environmental electron microscope.

Figure 1(a) shows the operation of SOFCs based on an oxide ion conducting in electrolyte. Supplying external voltage (Fig. 1(b)), we can make same situations as Fig. 1(a) in the cell. The developed in-situ specimen holder shown in Fig. 2(a) was optimized for the cell reaction in Fig. 1(b). The electrode terminal A is for the external voltage applying, and B and C are for the heating. Figure 2 (b) shows the heater with the electrode terminal consists of the nickel-chrome (NiCr) alloy. Between the heater and the electrode terminal is isolated electrically by insulators. We connect both electrodes of the specimen to the electrode terminal A and the center of the heater, respectively (see Fig. 2 (c)).

Figure 3(a) shows the scanning ion microscope (SIM) image of the full cell specimen prepared by a focused ion beam (FIB) instrument (Hitachi FB-2100). The bulk full cell was constructed by a pulsed laser deposition method on the platinum (Pt) substrate. The cell structure was composed of a gadolinium doped ceria (GDC) of 1 μm thick as electrolyte and a Pt layer of 100 nm thick as the electrode. The gold wire connects the electrode terminal A to the tungsten layer which was deposited on the specimen to protect the cell structure in the FIB thinning process. In-situ observation of the cell structure was performed using the reaction science high-voltage electron microscope [3] (JEOL JEM-1000K RS) at an acceleration voltage of 1 MV. The pressure in the specimen chamber was kept to 1 Pa of the oxygen gas.

Figures 3(b) and 3(c) show the cross-sectional annular dark-field scanning transmission electron microscope (ADF-STEM) images in the oxygen atmosphere at the room temperature (R.T.) and ~600 ℃, respectively. In the case of ~600℃, we applied a voltage of +1V to the electrode terminal A. Figure 3(b) clearly shows the cell structure that has the electrodes (Pt) and the electrolyte (GDC) with the protective (W) layers. We cannot, however, distinguish between Pt and W layers at the higher temperature, as shown in Fig.3(c). These results show Pt layer with W layer is unstable in high-temperature oxidizing environments and obstructs to observe the fuel cell reaction between the Pt electrode and the GDC electrolyte.

References

[1] A. H. Tavabi et al., J. Electron Microsc., 60 (2011) 307-314.

[2] A. H. Tavabi et al., Mirosc. Microanal., 20 (2014) 1817-1825.

[3] N. Tanaka et al., J. Electron Microsc., 62 (2103) 205-215.

Acknowledgements

This work was supported by JSPS KAKENHI Grant Number 25246001, and also partially supported by the program “Global Research Center for Environment and Energy based on Nanomaterials Science” of MEXT, Japan


Takafumi ISHIDA (Nagoya, Japan), Takayoshi TANJI, Masahiro TOMITA, Kimitaka HIGUCHI, Koh SAITOH
08:00 - 18:15 #6665 - IM02-189 Monitoring of Dynamic Live Brain Tumor Cells using SICM and its Future Applications.
IM02-189 Monitoring of Dynamic Live Brain Tumor Cells using SICM and its Future Applications.

Monitoring of Dynamic Live Brain Tumor Cells using SICM and its Future Applications

 

Myung-Hoon Choi1, Goo-Eun Jung1, Yong-Sung Cho1,Sang-Joon Cho1,

 

1Park Systems, Suwon, Korea

 

 

The high resolution monitoring of live cell membranes in physiological conditions has been the homework for centuries for biologists. Visualization and Understanding of cell membrane activities could give precious insight upon how cells interact with outer environment. Scanning ion conductance microscopy (SICM) can provide the surface morphology of biological soft materials in liquid directly. The SICM uses ionic current as feedback signal by detecting it through the nano-size opening of glass pipette. The dedicated SICM operating mode called approach and retract scanning (ARS) makes SICM imaging stable in liquid environment. The SICM three-dimensional topographical image is generated by composing the recorded height information at each pixels. The in-liquid imaging capability without physical contact allows using SICM for various cell study topics in live status such as cell division, fusion, and other fundamental physiological phenomena.

 

In this study, we examined cell-to-cell interaction and cell’s plasma membrane transformation. By imaging live brain tumor cell with SICM at the connective position between two cells, we successfully acquired the interactive morphological changes of cell’s adhesion molecule at the edge in sequence. From the series of non-invasive cell morphological images, acquired in three dimension, we also calculated and monitored the velocity of membrane transformation and membrane holes volume changes.


Choi MYUNG-HOON, Jung GOO-EUN, Yong-Sung CHO, Sang-Joon CHO (Suwon, Republic of Korea)
08:00 - 18:15 #6666 - IM02-191 Electron beam-induced etching of carbon nanotubes by environmental transmission electron microscope.
IM02-191 Electron beam-induced etching of carbon nanotubes by environmental transmission electron microscope.

   It is crucially needed to develop a novel process to cut and connect nanomaterials artificially for further progress in nanotechnology. Gas-mediated electron beam-induced etching (EBIE) is promising to carve nanomaterials via electron beam-induced chemical reactions between the nanomaterials and precursor gases. In this study, we have investigated the EBIE process of multi-walled carbon nanotubes (CNTs) in oxygen gas using environmental transmission electron microscopy (ETEM).

   Commercially available multi-walled CNTs (NanoIntegris Inc.) were supported on a Cu micro grid with a carbon supporting film of 3 mm in diameter. A grid with multi-walled CNTs was fixed on a specimen holder and transferred to an ETEM (FEI Tecnai F20 equipped with an environmental-cell [1]) operated at 200 kV. As a precursor gas for EBIE, oxygen gas (99.9999%) was introduced into the ETEM. To carry out the EBIE of multi-walled CNTs, a focused electron beam (about 0.2 nm in diameter) was repeatedly scanned across multi-walled CNTs in oxygen gas of 100 Pa at room temperature in scanning TEM (STEM) mode.

   Figure 1 shows the EBIE process of a multi-walled CNT in oxygen gas. A focused electron beam was scanned repeatedly along a white dotted line in Fig. 1(a) with the rate of 103 s-1. STEM images and TEM images of the multi-walled CNT were recorded after every 62 scans. The electron dose was estimated and shown in each image in Fig. 1. As the electron dose increases, the multi-walled CNT is etched gradually. Figures 1(b), 1(c), 1(f), and 1(g) clearly show that the etching proceeds from the outer walls to inner walls of the multi-walled CNT. Finally, the multi-walled CNT is cut completely along the scanning direction (Fig. 1(d), (h)). The cutting surface remains cylindrical. We confirmed that the areas that do not receive electron dose are not etched. On the other hand, multi-walled CNTs cannot be cut in a vacuum even after receiving the electron dose much higher to cut in oxygen gas. The scanning areas in multi-walled CNTs are amorphized. This means that both electron irradiation and oxygen gas are needed for EBIE of multi-walled CNTs. Oxygen atoms from dissociation of oxygen molecules by electron irradiation [2] react with carbon atoms in multi-walled CNTs to produce CO and/or CO2 which desorb from the surface of multi-walled CNTs. We have succeeded in cutting of multi-walled CNTs at desired positions at room temperature by EBIE in ETEM.

   In the presentation, we will show the dependence of EBIE of multi-walled CNTs on the pressure of oxygen gas, accelerating voltage of electrons, and gas species. The mechanism of EBIE of multi-walled CNTs will be discussed.

 

References

[1] S. Takeda, Y. Kuwauchi, H. Yoshida, Ultramicroscopy, 151 (2015) 178.

[2] H. Yoshida, H. Omote, S. Takeda, Nanoscale, 6 (2014) 13113.


Yuto TOMITA, Hideto YOSHIDA (Osaka, Japan), Seiji TAKEDA
08:00 - 18:15 #6710 - IM02-193 MEMS-based system for in-situ biasing and heating solutions inside the TEM.
IM02-193 MEMS-based system for in-situ biasing and heating solutions inside the TEM.

Understanding the thermo-electrical properties of different materials demands an in-depth analysis of their structure-property relationship. Therefore, monitoring their dynamic mechanisms in a real-world environment is crucial to better determine how to manipulate and optimize them for various applications. For example, the capability to perform current-voltage measurements while analyzing the corresponding structural changes during resistive switching process of the potential ReRAM materials in real time is crucial for improving the stability and scalability of the most promising next-generation non-volatile memory devices.

Here, we present the development of a system for in-situ biasing and heating manipulations inside the Transmission Electron Microscope (TEM), referred to as the Lightning System. The latter uses the latest Micro Electro Mechanical Systems (MEMS) based technology to scale down the experiment. Consequently, the stability and resolution can be considerably improved. The MEMS devices, known as the Nano-Chips, act as a functional and consumable sample carrier that supplies local stimuli to the sample size required for biasing and/or heating, allowing the users to manipulate and characterize their samples. Figure 1 shows the architecture of the Nano-Chips for simultaneous heating and biasing. As observed, it consists of eight electrical contacts, where half are used for heating and half are used for biasing purposes. As a result, the 4-point probe measurements are used to gain complete control of each parameter and ensure instant, controllable and reproducible responses. This results in high accuracy during the measurements. The unique design of the Nano-Chips ensures reduced specimen drift during heating, as well as a stable and chemically inert environment that enables compatibility with various types of samples (i.e. lamellas, nanowires and 2D materials). Furthermore, it empowers the user to do different types of analysis including I-V measurements as a function of temperature (up to 800 °C) and high electric field studies.

The Nano-Chip is mounted on a functionalized holder, shown in Figure 2, which contains the contact needles to supply the stimuli from the outside world. Such holder can supply up to 100V to the Nano-Chip for the electrical measurements and helps detecting currents in the pA regime. Furthermore, it enables tilting in alpha and beta. The complete “plug and play” system, shown in Figure 3, includes a source measurement unit and a heating control unit. Once the holder is connected to such biasing power supply and the heating controller, the voltage/current can be set and the temperature profile can be programmed for total control during the in-situ experiment.  

The Lightning System can be used to understand the microstructural origins for electric field induced changes in the ferroelectric materials. As a matter of fact, it is also known that the temperature rise of ferroelectric devices during utilization limits its practical application. Therefore, the system can also enable repeating the electric field measurements while working at an elevated temperature environment. Additionally, the Lightning System can be used to study low dimensional materials like nanowires, as their electrical properties and their temperature dependence differs with different growth directions. In-situ heating and biasing experiments of such samples can open a new application opportunity in nanoelectronics.


Héctor Hugo PÉREZ GARZA (Delft, The Netherlands), Kun ZUO, Yevheniy PIVAK, Diederik MORSINK, Marina ZAKHOZHEVA, Merijn PEN, Sander VAN WEPEREN, Qiang XU
08:00 - 18:15 #6739 - IM02-195 Correlating structure and mechanical properties for submicron amorphous silica spheres.
IM02-195 Correlating structure and mechanical properties for submicron amorphous silica spheres.

Spherical amorphous silica particles obtained from the well-known Stöber-Fink-Bohn (SFB) synthesis are frequently used as standards for size or shape and as proxy for the behavior of amorphous silica [1]. So far, several studies have dealt with the peculiarities of the internal structure of these particles (see e.g. references in [2–3]): particles from the SFB synthesis exhibit a highly hydroxylated weakly condensed silica network with a certain microporosity at least for water and ions. Larger particles which are generally obtained from a reseeded multi-step growth protocol show a ring like internal structure. Upon thermal treatment, the particles’ silica network can be condensed - the structure of vitreous silica is approached. Despite the abundant use of the particles, however, detailed investigations which correlate the mechanical properties and the internal structure of (heat-treated) SFB silica are absent. Within this account, the size dependent mechanical and structural properties of SFB silica and thermally derived vitreous silica spheres are assessed for particle diameters of 200 nm to 5 µm. For the mechanical characterization a scanning electron microscope (SEM) supported custom-made indenter [4] and the Hysitron PI95 TEM PicoindenterTM in a transmission electron microscope (TEM) are used to test a statically representative amount of particles (at least 50). Structural characterization is performed by nitrogen sorption, vibrational spectroscopy, colloid titration and solid-state nuclear magnetic resonance spectroscopy. For SFB spheres with a mean diameter of 500 nm it is shown that hardness, yield strength, and Young’s modulus of the SFB particles are significantly increased after thermal treatments at temperatures exceeding 400°C (Fig. 1). With an increasing treatment temperature the Young’s modulus of bulk fused silica is approached. However, hardness, yield strength and the sustained plastic deformation till catastrophic failure of the spheres occurs clearly exhibit bulk values. The underlying changes of the internal structure are in accordance: a slight shrinkage (~28 vol.%) is accompanied by an overall homogenization, densification, increased cross-linking and dehydroxylation of the particles (Fig. 2) [3]. The size-dependent characterization of the failure modes of SFB particles and corresponding derived vitreous silica spheres provides information on the underlying deformation modes and allows a classification of the different cracking types (Fig. 3 and Fig. 4). Independent of size, the untreated SFB particles exhibit only the formation of (presumably) ductile cracks; full fragmentation does not occur. For the derived vitreous silica spheres, however, a clear brittle-to-ductile transition is observed in the size range of 500 – 800 nm: particles above this size are fragmented into two or more individual parts. The latter behavior is also indicative for bulk fused silica which is known for its brittleness on the mesoscopic scale [5]. In contrast to bulk fused silica, the silica spheres still sustain high plastic deformations (in the order of 40%). By ex situ Raman spectroscopy on the single particle level the observed plasticity can be attributed to local densification of the vitreous silica spheres directly below the contacts of the sphere with the diamond flat punch and the substrate [6]. It is noteworthy that fine details of the contact zones and the role of molecules on the surface might be addressed by non-linear spectroscopy [7].

1              W. Stöber et al., J Colloid Interface Sci 26, 1968, 62–69.

2              J. Paul et al., Powder Technol. 270, 2015, 337–347.

3              S. Romeis et al., Part. Part. Syst. Char. 31, 2014, 664–674.

4              S. Romeis et al., Rev. Sci. Instrum. 83, 2012, 095105.

5              R.F. Cook et al., J. Am. Chem. Soc. 73, 1990, 787–817.

6              S. Romeis, et al., Scripta Mater., 2015, 84–87.

7              C. Meltzer et al., J. Am. Chem. Soc. 136, 2014, 10718–10727.

Financial support by the Deutsche Forschungsgemeinschaft (DFG) through the Cluster of Excellence “EAM” and GRK1896 “In situ microscopy with electrons, X-rays and scanning probes” is gratefully acknowledged.


Stefan ROMEIS (Erlangen, Germany), Patrick HERRE, Mirza MAČKOVIĆ, Jochen SCHMIDT, Jonas PAUL, Dominique DE LIGNY, Erdmann SPIECKER, Wolfgang PEUKERT
08:00 - 18:15 #6782 - IM02-197 Simultaneous Nanoplasmonic Sensing and Transmission Electron Microscopy Characterization.
IM02-197 Simultaneous Nanoplasmonic Sensing and Transmission Electron Microscopy Characterization.

We have developed a platform that allows for real time optical sensing based on localized surface plasmon resonance (LSPR) readout inside a transmission electron microscope (TEM). With the TEM, we obtain insight into the structure and composition of materials by performing imaging and spectroscopy with atomic resolution [1]. However, the probed volume is rather small, and the beam-specimen interaction is often non-negligible and needs to be taken into account, usually by performing additional experiments. Thus, there is an increasing effort towards enabling simultaneous TEM probing and characterization with complementary techniques. Thanks to the strongly enhanced electric fields generated around metallic nanoantennas, LSPR-based sensing is a proven tool to study processes at the nanoscale [2], and an ideal complement to TEM since it probes a much larger volume of the specimen.

 

We have fabricated a TEM specimen holder hosting a miniaturized optical bench [3] that allows for sample illumination and spectroscopic readout. Specimens can be heated up to 1300 ºC, and the holder is compatible with differentially pumped environmental TEM (ETEM), with no prior modification to the microscope required. Comparison between signals obtained simultaneously by TEM and LSPR provides indication of the relevance of electron beam-induced effects. Moreover, we enable for the first time direct correlation of the LSPR response with changes in physical properties of the specimen. We investigate thermally-induced sintering of metal nanoparticles, a crucial process in deactivation of catalysts [4]. We envision the combination of LSPR sensing with probing by ETEM to become a versatile tool to study processes at the nanoscale, especially taking place on (photo)catalysts.

 

References:

 

[1] J.-M. Herrmann Top. Catal., vol. 34, no. 1–4, pp. 49–65, May 2005.

[2] E. M. Larsson, C. Langhammer, I. Zorić, and B. Kasemo, Science, vol. 326, no. 5956, pp. 1091–4, Nov. 2009.

[3] F. Cavalca, A. B. Laursen, B. E. Kardynal, R. E. Dunin-Borkowski, S. Dahl, J. B. Wagner, and T. W. Hansen Nanotechnology, vol. 23, no. 7, 075705, Feb. 2012.

[4] C. H. Bartholomew, Appl. Cat. A, vol.  212, no. 1–2, pp. 17–60, Apr. 2001.

 

Acknowledgments: The research leading to these results has received funding from the People Programme (Marie Curie Actions) of the European Union’s Seventh Framework Programme (FP7/2007-2013) under REA Grant Agreement No. 609405 (COFUNDPostdocDTU).


Beniamino IANDOLO (Kgs. Lyngby, Denmark), Asger MOSS, Ferry NUGROHO, Christoph LANGHAMMER, Jakob WAGNER
08:00 - 18:15 #6785 - IM02-199 Tuning the surface termination of ceria under gaseous environments in a Cs-corrected Environmental TEM.
IM02-199 Tuning the surface termination of ceria under gaseous environments in a Cs-corrected Environmental TEM.

Surface termination of solids varies according to the environment to which they are submitted. This is very important in catalysis since surface modifications have a strong influence in the way thatadsorption at the surface followed by eventual dissociation, diffusion and recombination of the molecular occur. Gaining information at atomic level on the structural and chemical variations of the surface is thus essential  to understand the mechanisms of catalytic reactions and ultimately obtain a better control on the design of catalysts with specific controlled properties (activity, selectivity, stability). This information can only be obtained (at local level) by high resolution transmission electrom microscopy (HRTEM and thus requires the use of a Cs-corrected (image) Environmental TEM capable of very high resolution observations of the nanometric materials in presence of controlled gaseous environments. In this work we study, in a ETEM, ceria which is a catalytic material used generally in oxidation reactions both as support of active phases or as an active phase itself by taking advantage of its redox properties and oxygen mobility. We focused our interest on the surface atomic termination of ceria nanocubes under different controlled environments (high vacuum, oxygen, carbon dioxide) important for the understanding of CO2-valorization related reactions.

The studies were performed in the Ly-EtTEM (Lyon Environmental and tomographic Transmission Electron Microscope), a 80-300 kV TITAN objective lens Cs-corrected Environmental TEM from FEI equipped with a GATAN high resolution Imaging Filter (GIF) [1]. The analysis was carried out at room temperature varying the gas pressures from 10-6 mbar (vacuum) up to 2 mbar.

The HRTEM images in Figure 1 show the termination of a {100} facet of a ceria nanocube under high vacuum (HV) and in presence of molecular oxygen and carbon dioxyde. Under HV conditions (Figure 1 – left image) the incident electron beam induces a partial reduction of ceria [2]. As a consequence cerium surface atoms become highly mobile as it can be readily observed on {100} facets and electron energy-loss spectroscopy (EELS) shows that the characteristic features related with Ce4+ species rapidly decrease in intensity both on the O-K and Ce-M4,5 edges. In the presence of molecular oxygen (O2 pressure in the mbar range; Figure 1 – center image) this beam-induced reduction is “healed” and the surface of ceria NPs is stabilized as it can be confirmed by the absence of mobility of surface cerium atoms on {100} facets as well as by the in situ real-time dynamic monitoring of the O-K and C-M4,5 edges by EELS that now remain unaltered under irradiation. Finally, under CO2 pressure (10-2 - 1 mbar; Figure 1 – right image), the {100} facets become more stable from both structural (oxygen surface termination) and chemical (stable non-reduced state revealed by EELS) points of view.

We notice that the surface terminations of the ceria nanoparticles under vacuum are different from those observed under O2 or CO2 (Figure 2).  Under HV the terminal contrasts observed are strong and clearly correspond to the formation of a terminal cerium plane. A different contrast can be noted in the case of the sample exposed to O2 (Figure 2 – left image) where the presence of terminal oxygen in accordance with the ceria modelis imaged. Exposure to CO2 (Figure 2 – right image) yields a still different terminal contrast close to the expected position of termina oxygen hinting at the presence of stabilized species at these position of oxygen atoms at the surface termination; the stabilization of surface oxygen atoms is likely related to CO2 adsorption and the consequent formation of carbonate surface species.

References
[1] The authors thank the CLYM (Centre Lyon-St Etienne de Microscopie) for access to the Ly-EtTEM.

[2] L.A.J. Garvie and P.R. Buseck, J. Phys. Chem. Solids. 60 (1999) 1943-1947 


Francisco José CADETE SANTOS AIRES (VILLEURBANNE CEDEX), Mimoun AOUINE, Amanda K. P. MANN, Zili WU, Steven H. OVERBURY, Thierry EPICIER
08:00 - 18:15 #6847 - IM02-201 In situ environmental HRTEM study of the restructuration under reducing atmosphere of small oxidized silver-indium nanoparticles.
IM02-201 In situ environmental HRTEM study of the restructuration under reducing atmosphere of small oxidized silver-indium nanoparticles.

       In the form of alloyed or segregated structures, bimetallic nanoparticles (NPs) exhibit remarkable catalytic (activity, selectivity, stability) and optical (localized surface plasmon resonance, LSPR) properties, both depending on the morphology and the chemical configuration that they adopt. Moreover, the structure of these nanoparticles may evolve under specific environmental conditions (pressure, temperature, presence of reactants). It follows that structural and optical characterization techniques must be implemented in a controlled environment for probing these restructuring phenomena.

 

Here, we present an environmental TEM (ETEM) study on Ag-In nanoparticles. These particles exhibit a reversible shift of their LSPR, after exposition to oxidizing (air, 25°C) and reducing (H2+N2, 500°C) atmospheres [1]. The particles were synthesized by Low Energy Cluster Beam Deposition (at PLYRA in Lyon), which allows an independent control of their size and composition. The microscope used was a FEI Titan ETEM operating at 300 kV, with a Cs corrector of the objective lens. HRTEM images and movies of the bimetallic nanoparticles were recorded at up to 500°C and under 10 mbar H2 [2].

 

The starting chemical configuration of the particles is a core-shell structure, with an Ag or Ag-In alloyed core of 4-5 nm and an In2O3 amorphous shell with a thickness of 1-2 nm. The nanoparticles were exposed in the ETEM to successive (H2 pressure; temperature) couples, from (1 mbar H2; 25°C) to (10 mbar H2; 500°C). These particles were monitored both at the local (single nanoparticle tracking) and global (observations on large assemblies, under low magnification) scales. The structural changes observed at the atomic scale range from the almost complete extraction of the Ag-rich core from the In2O3 shell, leading to “Janus” nanoparticles, to the complete reduction of the indium oxide shell. In2O3 reductions which occur at higher temperature than the melting point of indium (156°C) induce the competition between two behaviours: i) the melting or evaporation of reduced indium, and thus the decreasing thickness of the shell until its complete disappearance, ii) the diffusion from the shell to the core of reduced indium atoms, leading to a core growth (figure 1). This last point may be closely related to the evolution of the shell thickness during reduction. From these results, we constructed a (pressure, temperature) diagram highlighting the relationship between temperature and H2 pressure in the reduction activation. These results provide new insights in both physical and chemical processes involved during reduction of oxidized metallic nanoparticles at the atomic scale.

 

The authors thank the technical staff of the CLYM facility for access to the Titan microscope, and the PLYRA cluster facility for the cluster synthesis. ARC Energie (Academic Research Community), Rhônes-Alpes regional council is acknowledged for thesis scholarship.

 

 

[1] E.Cottancin, C.Langlois, J.Lermé, M.Broyer, M.A Lebeault, M.Pellarin, Phys. Chem. Chem. Phys. 2014, 16, 5763

[2] J.R. Jinschek, Chem. Commun. 2014, 50, 2696


Julien RAMADE (VILLEURBANNE), Cyril LANGLOIS, Michel PELLARIN, Laurent PICCOLO, Emmanuel COTTANCIN
08:00 - 18:15 #6851 - IM02-203 In-Situ Formation of Carbon Nanotubes Encapsulated within Boron Nitride Nanotubes via Electron Irradiation.
IM02-203 In-Situ Formation of Carbon Nanotubes Encapsulated within Boron Nitride Nanotubes via Electron Irradiation.

The sensitivity to small changes in the electronic structure of carbon nanotubes (CNTs) from external perturbations limits their successful integration on electronic devices [1]. It is therefore necessary to develop experimental strategies for CNT synthesis that guarantee the formation of crystalline structures of carbon materials while ensuring a protection from the environment without affecting its electronic properties. Under this context, boron nitride nanotubes (BNNTs), due to their uniform electronic properties and their chemical inertness characteristics, is one of the most appropriated nanomaterials for achieving these goals. In fact, BNNTs are large band gap insulators exhibiting a resistivity to oxidation of up to 900 °C [2]. Here we report the synthesis and growth of crystalline carbon nanotubes inside a larger diameter BNNT via in-situ electron irradiation in a TEM [3].

Electron beam irradiation and HRTEM were performed using an imaging-side aberration-corrected FEI Titan-Cube microscope working at 80 kV, equipped with a Cs corrector. Complementary spatially-resolved EELS-STEM studies were also carried out using a FEI Titan Low-Base microscope, working at 80 kV, which is equipped with a Cs probe corrector. In both cases, particular attention was devoted to avoid contamination during acquisition. Single-walled (SW) BNNT were produced by laser vaporization technique [4]. Some of these BNNT can be partially filled by amorphous carbon [4]. Furthermore, density functional theory (DFT) simulations were conducted for determining the structural stability and electronic properties of such a hybrid system.

In Fig. 1, a six-frame HRTEM image sequence showing the evolution towards a nanotube structure of amorphous carbon enclosed within a BNNT. SR-EELS analyses confirm the presence of this amorphous carbon inside the NT, as displayed in Fig. 1 (g) where B-K, C-K and N-K edges are shown. In the HRTEM sequence defined by arrows, which occurs for a total cumulative dose of up to 1.8 107 e-2 and over a period of 380 seconds at room temperature, amorphous carbon is firstly observed in a straight BNNT and evolves over time to a crystalline structure. Simultaneously, a gradual shrinkage of the BNNT is observed. By the end of the process, the BNNT is broken and also disintegrated. We also observed the formation of an atomic-scale bridge between the tip of the carbon tube and the outer BN wall, and the subsequent reparation of the defect on both materials. Initially, a defect at the BNNT surface enhances the C-BN interaction by establishing a connection between both tubes.

These results show that the electron radiation stemming from the microscope supplies the energy required by the amorphous carbonaceous structures to crystallize in a tubular form in a catalyst-free procedure, at room temperature and high vacuum [3]. The structural defects resulting from the interaction of the shapeless carbon with the BN nanotube are corrected in a self-healing process throughout the crystallinization. Structural changes developed during the irradiation process such as defects formation and evolution, shrinkage, and shortness of the BN-NT were in situ monitored. The outer BN wall provides a protective and insulating shell against environmental perturbations to the inner C-NT without affecting their electronic properties, as demonstrated by first-principles calculations, see Fig. 1 (h)-(j).

[1] A. Jorio, G. Dresselhaus, M.S. Dresselhaus, Springer-Verlag: Berlin, 2008.

[2] R. Arenal, X. Blase, A. Loiseau, Advances in Physics 59, 101 (2010).

[3] R. Arenal and A. Lopez-Bezanilla, ACS Nano 8, 8419–8425 (2014).

[4] R. Arenal, O. Stephan, J.L. Cochon, and A. Loiseau, J. Am. Chem. Soc. 129, 16183 (2007).

[5] The research leading to these results has received funding from the EU under Grant Agreements 312483-ESTEEM2 and 604391 Graphene Flagship, from the Spanish Ministerio Economia y Competitividad (FIS2013-46159-C3-3-P) and from the EU under the Marie Curie Grant Agreement 642742 - Enabling Excellence.

 


Raul ARENAL (Zaragoza, Spain), Alejandro LOPEZ-BEZANILLA
08:00 - 18:15 #6852 - IM02-205 In situ TEM analysis of heating of gold nanoparticles on nanocarbon supports and implications for control of ripening.
IM02-205 In situ TEM analysis of heating of gold nanoparticles on nanocarbon supports and implications for control of ripening.

The outstanding structural and physical properties of carbon nanostructures can be extended by decoration with metallic nanoparticles (NPs) to offer a wide range of potential applications. However, such absorbed metal nanoparticles are generally metastable, and the functional properties of such NPs may be strongly affected by their size and shape. It is therefore necessary to obtain a full understanding of the thermal stability of supported nanoparticles, and how it is affected by the structure of the nanocarbon support.

In-situ TEM observations of thermally and electron beam activated transformations of preformed Au nanoparticles absorbed on a range of selected nanocarbon support structures can provide valuable insight into the NP growth mechanisms. Conventional TEM imaging with a high intensity beam can be used to induce ripening of NPs via beam energy only. Conversely, by using an in-situ heating holder and scanning TEM imaging, with the dwell time per pixel set to be less than the thermal equilibrium time, the effect of thermal heating can be studied. Subsequent to heating, HAADF-STEM combined with tilt-series acquisition enables the 3-dimensional distribution of the AuNPs to be determined in relation to the nanocarbon support without inducing further ripening.

A range of nanocarbon supports, providing differing surfaces environments for Au NPs, have been thus studied. Graphitised carbon nanofibres (GNF) offer two differing surfaces for NP growth. Internally, the surface is corrugated, with typical step-edge heights of ~3nm. Externally, the surface is a smooth graphitic layer. Secondly, multi-walled carbon nanotubes (MWNT) on few-layer graphene (FLG) or amorphous carbon support films provides model systems to appraise the relative importance of the effects of electrostatic interaction and structural factors on the nanoscale organisation of metallic NPs. In particular, the intersection between the convex surface of the nanocarbon exterior and the flat surface of the support film delineates a 1D channel along the nanotube growth axis, with the potential to stabilise NP growth as the proportion of the total surface area of the NP in contact with the carbon support is directly related to the nanoparticle size.

The growth mechanism of Au NPs is observed to be unaffected by the nature of the energy source, with beam induced and thermally induced ripening forming similar size distributions. However, different size distributions internally and externally for AuNPs on GNFs show that the structural influences of the carbon support control the growth mechanism, with growth of AuNPs limited on the corrugated internal surface. In addition, differing size distributions are observed between AuNPs on MWNTs on FLG, and AuNPs on MWNTs on amorphous carbon, with the FLG sample showing a highly ordered structure. Hence the growth mechanism is controlled by the structural and electrostatic influences of the carbon support.


Michael FAY (Nottingham, United Kingdom), Alessandro LA TORRE, Maria GIMENEZ-LOPEZ, Carlos HERREROS LUCAS, Paul BROWN, Andrei KHLOBYSTOV
08:00 - 18:15 #6856 - IM02-207 Aberration corrected CVD-TEM for in-situ growth of III-V semiconductors.
IM02-207 Aberration corrected CVD-TEM for in-situ growth of III-V semiconductors.

We will show the first results from a newly designed Environmental TEM with cold FEG emitter, aberration corrector, heating stage and a free choice of up to nine different gaseous reactants to produce heterostructures in-situ during  real-time observation and analysis.

 

Observing growth of semiconductors on an atomic scale, under MOCVD or CVD-like conditions, will bring valuable information and understanding of the possibilities and limitations for making devices, solar cells and LED:s from nanowires. We have constructed a 300 kV Environmental TEM, with cold FEG emitter, heating stage and a free choice of up to nine different gaseous reactants to produce heterostructures in-situ.

The use of an aplanatic  B-COR image corrector provides space in the objective lens polepiece for a heating stage reactor with gas inlets, while still achieving an 86 pm point resolution (in vacuum). The gas inlets are designed to give a total pressure of up to10 Pa, which is sufficient to grow nanowires at a reasonable speed. The gas handling system will allow switching between the different gases at will, or through programmed sequences.

Changes and defects in the crystal structure, and the effect on the outer shape of the nanowires can be followed  by combinations of conventional HREM imaging , STEM-DF and STEM-BF, as well as SE-imaging. Simultaneous analysis by XEDS will provide chemical changes along the growth path.

 


Reine WALLENBERG (Lund, Sweden), Daniel JACOBSSON, Kimberly DICK THELANDER, Joacim GUSTAFSSON, Stas DOGEL
08:00 - 18:15 #6876 - IM02-209 Structural transformations revealed by in-situ HRTEM observations.
IM02-209 Structural transformations revealed by in-situ HRTEM observations.

With the recent advance of TEM, in-situ observations have become a very essential technique to understand the structure - property relationship of materials. Here, a few examples are shown.  1) Metal silicides are widely used in microelectronics as ohmic contact due to their low resistivity and the existence of phases that are thermodynamically stable over a wide range of temperatures. The fundamental mechanisms about the silicide film formation remains unclear. The formation mechanism of Pd silicide is carefully explored by in–situ HRTEM/ STEM observations in a Cs-corrected TEM, and combined with atomic quantitative analysis (Figure 1).  By in-situ STEM imaging observations, it is found that Pd2Si is initially formed at the tripe junction at the interfaces, and the formation process is advanced by Pd atom intrusion into Si lattice leading to the Si lattice change. Pd2Si silicide phase transformation process also induces the strain changes. In addition, the Pd silicide phase transformation process is discussed by the thermodynamics analysis. 2) Simultaneous chemistry and structural transitions are also demonstrated in nanocrystalline materials. Bulk Cu-Cr nanostructures subjected to annealing are shown by in-situ tracking microstructural and compositions enabled with EELS analysis. It is found that the destabilization process of nanostructured materials can initiate at a very low temperature [1], and dynamic process can be well revealed once the composition information is in-situ tracked.

[1]. Acknowledgement: Gabriele Moser and Herwig Felber are gratefully acknowledged for their help with sample preparation. Thank are also given to Rostislav Daniel and Christian Mitterer in Montanuniversität Leoben, Austria for preparing nitride films, and to Olivier Thomas (Aix-Marseille Université) for Pd films. The author is also grateful to Gerhard Dehm (Max-Planck-Institut für Eisenforschung) for  helpful discussion.  


Zaoli ZHANG (Leoben, Austria)
08:00 - 18:15 #6890 - IM02-211 Tunable metal-semiconductor junction system deriving from thermal instability of high chalcocite Cu2S elongated nanocrystals.
IM02-211 Tunable metal-semiconductor junction system deriving from thermal instability of high chalcocite Cu2S elongated nanocrystals.

Copper sulfide (Cu2-xS) nanocrystals (NCs) gained significant attention during the past decade as functional materials for photovoltaics and photothermal applications owing to their high electrical conductivity, low cost and environmental friendliness. Phase transformations of Cu2-xS NCs upon chemical reactions have been extensively studied [1-2], while their thermal stability, crucial in view of their integration into devices, has not been carefully addressed so far. The main aim of the present study was to monitor thermally-induced transformations within colloidal Cu2-xS NCs of different aspect ratios, simple and decorated by noble metal NCs. The structural and compositional evolution undergone by NCs was carefully investigated at the nanoscale by transmission electron microscopy (TEM)-related techniques.

The Cu2-xS NCs were obtained via cation-exchange (Cd2+->Cu+) on colloidal CdS NCs synthesized according to previous reports [3-5]. This study focuses on two main types of NCs: nanorods (NRs, 20±5 nm diameter, 45±5 nm width) and nanowires (NWs, 20±2 nm width and several μm long). In-situ heating-up experiments were performed by a JEOL heating holder (maximum temperature 800°C) within an image-CS-corrected JEOL JEM-2200FS TEM. The ongoing processes were monitored via high-resolution TEM (HRTEM) and high-angle annular dark field scanning TEM (HAADF-STEM). The evolution of the chemical composition was followed ex-situ via energy-dispersive X-ray spectroscopy (EDS), carried out in STEM mode. Ex-situ heating experiments were carried out within an ultra-high vacuum furnace.

The set of experiments performed evidence the reproducible and homogeneous formation of crystalline copper domains on both NC systems in the temperature range 350°C-450°C. While in the case of NRs a single domain is formed, NWs exhibit Cu domains at a rather regular spacing along their length. As the initial composition and structure (Cu2S, high chalcocite) are kept in the remaining region of the NCs, the process seems to be induced by simultaneous oxidation and partial sublimation of sulfur in the NCs and reduction and outward diffusion of excess Cu, probably as an effect of thermal annealing of structural defects (stacking faults, twins) deriving from the CdS synthesis process. This process occurs only in case of relatively high heating rates (~25°C/min). In case of noble metal deposition (Au, Pt) on these Cu2S NCs, either by sputter-coating or by colloidal growth, the fast diffusion of the noble metal atoms on the NC surface (starting at about 100°C for Au) induces a regular arrangement of domains which acts as a template for the following Cu out-diffusion, making the deriving hetero-structure more robust. The observed reproducible production of metal-semiconductor heterostructures by a simple post-synthesis heating treatment of colloidal Cu2S NCs opens a path for the production of low cost materials for optoelectronics, as it can simply be extended to a huge range of material combination, for instance achievable by cation-exchange following the heating treatment, which will affect only the Cu2S segments of the obtained hybrid nanostructures and give rise to application-relevant structures.

[1] Y. Xie, A. Riedinger, M. Prato, A. Casu, A. Genovese, P. Guardia, S. Sottini, C. Sangregorio, K. Miszta, S. Ghosh, T. Pellegrino, L. Manna, J. Am. Chem. Soc. 135, 17630 (2013)

[2] V. Lesnyak, R. Brescia, G. C. Messina, L. Manna, J. Am. Chem. Soc. 137, 9315 (2015)

[3] K. Miszta, G. Gariano, R. Brescia, S. Marras, F. De Donato, S. Ghosh, L. De Trizio, L. Manna, J. Am. Chem. Soc. 137, 12195 (2015)

[4] J. Puthussery, T. H. Kosel, M. Kuno, Small 5, 1112 (2009).

[5] S. Naskar, A. Schlosser, J. F. Miethe, F. Steinbach, A. Feldhoff, N. C. Bigall, Chem. Mater. 27, 3159 (2015).

 

Acknowledgements: The authors acknowledge funding from the European Union under grant agreement n. 614897 (ERC Grant TRANS-NANO).


Muhammad IMRAN, Francesco DE DONATO, Liberato MANNA, Rosaria BRESCIA (Genova, Italy)
08:00 - 18:15 #6902 - IM02-213 10 bar nanoreactors for in situ transmission electron microscopy.
IM02-213 10 bar nanoreactors for in situ transmission electron microscopy.

Environmental transmission electron microscopy (ETEM) is becoming an increasingly important field of study as it is possible to investigate the material-environment interactions on a nanoscale, the scale at which most of these interactions initiate. In a TEM, this can be achieved by one of the following approaches: the opened type, using a differentially pumped vacuum system where the reactive gases are spread around the specimen area of the TEM; and the closed type, using a windowed environmental cell. In the first case the maximum achievable pressure around 1 bar [1] but it is limited to flat samples and for the second type (where two chips are often put on top of each to obtain a closed cell) the maximum pressure rarely exceeds 4 bars [2]. However the last configuration is much closer to what happens in industrial applications.

We present in this paper, a new MEMS nanoreactor fully integrated on a single die. It enables atomic-scale imaging of nanostructured materials under the high pressures and temperatures that are typical for many industrial applications (10 bar and 650°C). The reactor can therefore be used to study the behavior of e.g. catalysts in a transmission electron microscope (TEM). It has a channel of 5 μm (allowing therefore an efficient loading of the samples to study), which is made with surface micromachining techniques and contains pillars that prevent bulging. The channel high can be adjusted by adjusting the right layers in the devices processing. Integrated with the device are 22 very thin windows (20 nm) and a resistive heater. The material chosen for the heater is Molybdenum. It offers a very high stability at 650 C for up to 10 h. The reactor is very transparent and clean (the windows being etched in a such way that contamination/residues are prevented) enabling the imaging of atomic lattice fringes with a spacing down to at least 0.15 nm. The maximum working pressure measured over 50 devices is above 9 bars in 90% of the cases.

 

References

[1] A. K. Erdamar, S. Malladi, F.D. Tichelaar, H.W. Zandbergen,  Controlled Atmosphere Transmission Electron Microscopy, 165-210, Springer International Publishing Switzerland (2016).

[2] T. Yokosawa, T. Alan, G. Pandraud, B. Dam, H. Zandbergen, Ultramicroscopy 112 (1), 47–52, (2012)


Gregory PANDRAUD (delft, The Netherlands), Bruno MORANA, Jia WEI, Casper JUFFERMANS
08:00 - 18:15 #6903 - IM02-215 Surface Dynamics of Cu Oxidation.
IM02-215 Surface Dynamics of Cu Oxidation.

Much is known about oxygen interaction with metal surfaces and about the macroscopic growth of thermodynamically stable oxides. At present, however, the nanoscale stages of oxidation - from nucleation of the metal oxide to formation of the thermodynamically stable oxide - represent a scientifically challenging and technologically important terra incognito. As engineered materials approach the nanometer regime, control of their environmental stability at this scale becomes crucial.  As environmental stability is an essential property of most engineered materials, many oxidation theories exist to explain its mechanisms. However, most classical oxidation theories assume a uniform growing film, where structural changes are not considered due to the lack of traditional experimental procedure to visualize this non-uniform growth under conditions that allow highly controlled surfaces and impurities. Yet, in situ transmission electron microscopy studies reveal that the initial stages of Cu oxidation are due to surface diffusion of oxygen followed by nucleation and growth of oxide islands, and thereby challenge the common assumption of a uniform oxide formation [1]. Understanding this initial oxidation of the metal surface, from the atomic to mesoscale, is the fundamental challenge.

We have previously demonstrated that the formation of epitaxial Cu2O islands during the transient oxidation of Cu(100), (110) and (111) films bear a striking resemblance to heteroepitaxy, where the initial stages of growth are dominated by oxygen surface diffusion and strain impacts the evolution of the oxide morphologies. We are developing a kinetic Monte Carlo code, Thin Film Oxidation (TFOx), to simulate the nucleation and growth of Cu oxides (see Figure). We are currently investigating oxidation of stepped Cu surfaces as realistic surfaces have many defects such as step edges that can dictate the oxide nucleation and growth dynamics, and result in novel oxide nanostructures.  In situ ETEM studies are complemented with a systematic multiscale theoretical approach.  This approach includes density functional theory (DFT) of (100), (110) and (111) Cu surfaces to illustrate the thermodynamic and kinetic factors of initial oxygen-metal interactions, and molecular dynamics (MD) simulations to validate the DFT predictions and the oxidation process. Our DFT results show that the Ehrlich-Schwöbel (ES) barrier can favor either oxygen ascending or descending diffusion directions, or limited interlayer diffusion depending on the surface step morphology. These simulations are compared to ETEM investigations of stepped Cu surfaces in situ.  The potential and limitations of recent developments in theoretical simulations such as bridging the spatial and temporal gap to in situ ETEM results will be discussed. Correlating the experimental results with theoretical predictions is needed for rational design of oxidation-resistant coating materials and may lead to a paradigm shift in the fundamental understanding of oxidation where surfaces and defects control the early stages of oxidation.

References:

[1]. Q. Zhu, W. A. Saidi, and J. Yang, “ Early and transient stages of Cu oxidation: Atomistic insights from theoretical simulations and in situ experiments”, Surface Science, 2016, doi:10.1016/j.susc.2016.03.003.


Judith YANG (Pittsburgh. PA, USA), Qing ZHU, Lianfeng ZOU, Christopher ANDOLINA, Penghao XIAO, Eric STACH, Graeme HENKELMAN, Guangwen ZHOU, Wissam Abdo SAIDI
08:00 - 18:15 #6947 - IM02-217 In situ electro-chemical liquid TEM experiments to study LiFe0.5Mn0.5PO4 Nanoplatelets.
IM02-217 In situ electro-chemical liquid TEM experiments to study LiFe0.5Mn0.5PO4 Nanoplatelets.

Liquid cell electron microscopy is a developing technique that allows us to apply the powerful capabilities of the electron microscope to image and analyze materials immersed in liquid. We are thus able to examine liquid based processes in materials science and physics that are traditionally inaccessible with conventional TEM. The liquid/bias sealed cell (Protochips Poseidon 510) consists of two designed silicon echips having Si3N4 windows and microelectrodes fabricated by lithography technique (figure 1). Electrochemical echips separate the liquid from the microscope vacuum also confining it into a layer that is thin enough for imaging with transmitted electron. The importance of liquid cell TEM in electrochemistry is that liquid cell experiments enable direct imaging of key phenomena during battery operation and relate the structural and compositional changes [1] to electrochemical signature [2,3].

In this work, we carried out in situ liquid TEM studies of LiFe0.5Mn0.5PO4 (LMFP) nanoplatelets synthesized with a colloidal procedure [4], while are very promising nano-objects for high-rate batteries. The synthesized nanoplatelets LMFP were studied using advanced TEM: high angle annular dark field STEM (HAADF-STEM), EDX-STEM mapping, and EELS-STEM mapping to find crystal structure and atomic distributions. The figure 2 shows high-resolution HAADF-STEM image of single LMFP nanocrystal oriented along [010] direction in which Li/(Fe, Mn) anti-site defects is observed (see plot profile). EFTEM and EELS mapping show the coexistence and homogenous distribution of Fe, Mn, P elements in single nanoplatelets. For in situ liquid experiments, this cathode material was deposited onto glassy carbon (on silicon nitride membrane) of the top echip used to encapsulate conventional liquid electrolyte LP30 (LiFP6/EC/DMC). A gap of 500 nm between both echips and a flow mode introduction were used for the liquid medium. The assembly was followed with TEM/STEM imaging and spectroscopy (EELS, EDX) during electrochemical cycling so as to monitor in real time the delithiation process of LMFP single nanocrystals.

We succeed to follow by TEM imaging in real time the structural and chemical changes taking place on positive electrode materials during the electrochemical cycling. Figure 3 shows electrochemical cyclic voltammetry (25mV/s) corresponding to LFMP in LP30 measured in three-contact mode with silver as reference electrode. Using EELS, it was possible to follow the transition between LFMP and FMP during extraction and insertion of lithium from LiFe0.5Mn0.5PO4 showed by the appearance a peak at 5 eV (in figure 3), also confirmed by EFTEM. The structural changes due to the lithiation/delithiation processes during electrochemical cycling were imaged by high-resolution TEM showing local structural distortion.

[1] A. Demortière et al. Micro&Microanal 2014

[2] Frances M. Ross Science 2015

[3] Megan E. Holtz et al. Nano letters 2014

[4] Andrea Paolella et al. Nano letters 2014


Walid DACHRAOUI, Olesia KARAKULINA, Joke HADERMANN, Arnaud DEMORTIÈRE, Walid DACHRAOUI (Amiens)
08:00 - 18:15 #6948 - IM02-219 CO adsorption on Au(110) and Pd70Au30(110) : an in situ comparative study by environmental STM.
IM02-219 CO adsorption on Au(110) and Pd70Au30(110) : an in situ comparative study by environmental STM.

Surface structure and catalytic properties of metals are often intimately related. Well known surface structures (or reconstructions) in UHV conditions may evolve under gas pressure to yield new configurations. Scanning tunneling microscopy (STM) yields information on surface morphology and structure down to the atomic level. It is thus a well suited technique to follow in situ surface modifications due to gas environments at relatively high pressures [1].

In PdAu alloys, Au has a strong tendency to segregate to the surface at the thermodynamic equilibrium under UHV conditions. It is indeed the case for the Pd70Au30(110) surface for which the outmost layer is essentially formed by Au (85-90% as determined independently by LEIS, variable kinetic energy XPS and grazing incidence surface XRD). We can thus consider to have a Au surface-layer on top of a bimetallic bulk. In such conditions it is interesting to make a comparative study on how CO adsorption affects the surface structure and morphology both of this Au-terminated bimetallic surface and of a Au(110) surface. We have thus used an environmental STM that can be operated from UHV (<10-9 Torr) to 103 Torr of controlled environments (in this case CO); the study was donne at room temperature (~ 300K). This STM is an Omicron MicroLH slightly modified (gold plating of copper elements and magnets; coating of the piezoelectric tube) so that it is compatible with elevated pressure and variable temperature operation [2].

Under UHV conditions Au(110) presents a (1x2)-missing-row reconstruction whereas Pd70Au30(110) is unrecontructed with a measured surface parameter closer to Au than to Pd. CO only adsorbs on Au(110) for pressures above 10-3 Torr whereas CO adsorbs on Pd70Au30(110) at very low partial pressures (<10-6 Torr) as it was shown by NAP-XPS.

In the range of pressures studied (10-2 Torr – 5 102 Torr) the unreconstructued flat terraces on Pd70Au30(110) become rough at low pressure  and a “rice grain” morphology is observed with typical domain sizes (oriented in the [1 -1 0] direction) around 4 nm and 0.05 nm corrugation that prevails with no specific variation up to 5 102 Torr (Figure 1). Complementary studies performed by NAP-XPS clearly show the segregation of Pd the surface under CO pressure. So the roughening observed by STM (approximately one third of an atomic step in height) is essentiallydue to the diffusion of Pd atoms to the surface.

In the case of Au(110), the evolution of the surface structure and morphology with increasing CO pressure shows different surface structures [3] (Figure 2): under vacuum conditions, the Au(110) surface exhibits a (1x2) reconstruction which yields aligned terraces in the [1 -1 0] direction at a larger scale. CO chemisorption at 0.01 Torr on this surface induces a slow deconstruction of the (1x2) surface leading to a (1x4) structure under 0.1 Torr of CO.At higher pressure (0.5 to 30 Torr) a dramatic restructuring is observed where the terraces aligned in the [1 -1 0] direction under vacuum evolve to yield monoatomic-high islands. Their size subsequently increases with increasing CO pressure [4]. At 100 Torr of CO the surface exhibits a (1x1) structure prior to the new surface structure observed at 5 102 Torr of CO with ~0.05 nm deep holes arranged in a c(4x4) array. Intensity modulations around these holes were also observed.

CO chemisorption induces a strong restructuring of  both “Au” surfaces as it is evidenced by the high resolution in situ environmental STM images. However while the restructuring is limited to a roughning of the surface (due Pd segregation) for the bimetallic crystal, the structure and morphology of the Au-pure crystal surface evolve (through different configurations) as CO pressure increases showing that we have to take into account the dynamics of the surface and thus the evolution of the active sites during reaction.

References

[1] B.J. McIntyre, M. Salmeron, G.A. Somorjai, Rev. Sci. Instrum. 64 (1993) 687.

[2] F.J. Cadete Santos Aires, C. Deranlot, Proc. EUREM-XII. Volume III, P. Ciampor, L. Frank, P. Tománek, R. Kolarik (Eds), Brno 2000, p.I263 ;;

[3] M.A. Languille et al., Catal. Today 260 (2016) 39.

[4] Y. Jugnet et al., Surf. Sci. 521 (2002) L639.


Marie-Angélique LANGUILLE, Eric EHRET, Francisco José CADETE SANTOS AIRES (VILLEURBANNE CEDEX)
08:00 - 18:15 #6960 - IM02-221 Monitoring morphological evolution of Li-ion cathode secondary particles through In situ FIB/SEM electrochemical experiment.
IM02-221 Monitoring morphological evolution of Li-ion cathode secondary particles through In situ FIB/SEM electrochemical experiment.

This last decade, fundamental studies of electrochemical phenomena have been slowed down by a lack of effective in situ (and operando) experimental setup, which is able to clearly identify structural modifications inside and at the surface of electrode materials. The evolution of microstructures, the appearance of cracks and porosities and the transformation of crystalline phases have to be properly investigated in order to get a better insight into the influence of charge/discharge processes in battery materials and the reaction mechanisms implied in electrochemical storage. Improving our understanding of the microstructural changes and crack formation into Li-ion electrode materials during electrochemical cycling can provide new insight into battery behaviour. In order to monitor microstructural evolution dynamically during electrochemical cycling, we developed a micro-scale battery set-up implemented within a FIB/SEM instrument [1]. Secondary particles (figure 1a) are strongly used by industry for positive electrode fabrication. However, so far just a few works were focused on their morphological evolution during electrochemical cycling. Here, single secondary particles of cathode oxide (NCA and NMC) materials with a size of 5-10 μm are attached to the metal pin of the micromanipulator via a conductive carbon bridge formed using GIS (figure 1d/e). The micromanipulator allows moving the particle in the chamber and immersing into an ionic liquid electrolyte (low vapour pressure), which is deposited on a counter electrode, i.e. lithium metal. Electrochemical measurements are carried out using ultra low current instrument (biologic SP200) with two points connection configuration, external probe tip and SEM metal holder are respectively connected. After immersing into electrolyte, the single particle of active materials is cycled in galvanostatic mode with a steady current around 1 nA, which corresponds to a C-rate of about 1 based on the particle volume and the theoretical capacity [2].

We succeed to carry out in situ experiments inside the FIB/SEM chamber using ionic liquid electrode getting high quality electrochemical measurements in galvatostatic (figure 1f) and impedance modes for single secondary cathode particle. We studied structural modifications of individual particle after each in situ charge/discharge cycle by FIB slicing and SEM imaging. Using specific FIJI plugins and AMIRA software for reconstruction and segmentation steps, we quantified the formation of cracks as a function of cycle number and extracted 2D skeleton and tortuosity (figure 1g/h). Evolution of the discharge capacity was correlated with cracks and porosities appearance inside cathode materials. Impedance measurements suggested an increase of lithium diffusion inside the particle that is relied on the formation of cracks, which induces an enhancement of discharge capacity. On the other hand, the characterization of the 3D structure of these materials is crucial in order to gain a deeper insight into structural configuration and evolution of the discharge capacity. In this purpose, the reconstruction of 3D microstructures by FIB tomography methods was used [3] (figure 1i). The changes of structural parameters such as porosity, grain connectivity and crack propagation that are induced by cycling were extracted from 3D reconstruction and linked with electrochemical properties. Then, 3D structural data was compared to that obtained by 3D Transmission X- ray Microscopy (TXM) tomography [4], which is made in APS synchrotron at Argonne NL. Finally, a mechanical strain mode was used to get a better insight into crack formation and evolution into cathode particle.

References :
[1] Miller, D. J., Proff, C., Wen, J. G., Abraham, D. P., & Bareño, J. (2013). Observation of microstructural evolution in Li battery cathode

oxide particles by in situ electron microscopy. Advanced Energy Materials, 3(8), 1098-1103.
[2] Demortiere, Ando, J., A., Bettge, M., De Andrade, V., Amine, K. , Miller, D. (2016). Study of microstructural evolution in Li-ion battery cathode single particle by in situ FIB-SEM setup and TXM tomography. Advanced Energy Materials (in submission)
[3] Chen-Wiegart, Y. C. K., Liu, Z., Faber, K. T., Barnett, S. A., & Wang, J. (2013). 3D analysis of a LiCoO 2–Li (Ni 1/3 Mn 1/3 Co 1/3) O 2 Li-ion battery positive electrode using x-ray nano-tomography. Electrochemistry Communications, 28, 127-130.
[4] Tariq, F., Yufit, V., Kishimoto, M., Shearing, P. R., Menkin, S., Golodnitsky, D., ... & Brandon, N. P. (2014). Three-dimensional high resolution X-ray imaging and quantification of lithium ion battery mesocarbon microbead anodes. Journal of Power Sources, 248, 1014- 1020.


Arnaud DEMORTIERE (UPJV, Amiens), Jonathan ANDO, Martin BETTGE, Vincent DE ANDRADE, Khalil AMINE, Dean MILLER
08:00 - 18:15 #6967 - IM02-223 Real-time observation of the transformation of silver nanoparticles during carbon gasification.
IM02-223 Real-time observation of the transformation of silver nanoparticles during carbon gasification.

Gasification of carbon can be achieved, in the presence of metal catalysts supported on solid carbon materials, at high temperature in oxidative environments. Indeed, oxygen adsorbs and dissociates on the metal surface then interacts with the carbon at the interface with the metal leading to the formation of carbon dioxide; concurrently carbon is consumed and the metallic nanoparticle maintains the interface with the carbon and thus advances, forming in this way a trench on the surface of the carbon. On structured materials such as graphite or graphene these trenches tend to be rather 2D [1,2] at the surface of the material (hereafter named “pacman effect”). In this work we have studied the gasification of a non-structured material (amorphous carbon) by silver-based nanoparticles (NPs) in presence of oxygen and at variable temperatures. We were particularly interested on the dynamic structural evolution of the silver NPs observed in real-time within an environmental TEM and at atomic resolution as permitted by the imaging Cs-corrector.

The studies were performed in the Ly-EtTEM (Lyon Environmental and tomographic Transmission Electron Microscope), a 80-300 kV TITAN objective lens Cs-corrected Environmental TEM from FEI equipped with a GATAN high resolution Imaging Filter (GIF) [3]. Samples were prepared according to a synthesis method described in [4]; the silver based NPs stand on the supporting carbon film and gasification of this film is observed between 400 and 500°C under variable oxygen partial pressures (between 10-1 and 5 mbar).

We were able to follow in real-time the dynamics of carbon gasification and catalyst evolution by high resolution imaging (Figure 1) unlike previous studies. In situ EELS yields complementary information necessary to fully interpret the observed phenomena (structural changes, shrinking and coating of the catalyst, …). The mechanism deduced from our in situ study is schematically summarized in Figure 2 : (i) at the beginning of the gasification experiment the NP have surprisingly an hexagonal structure consistent with previously identified hexagonal forms of silver, either metallic or containing diluted oxygen (Figure 2a-c); (ii) at a given moment during gasification the NP transforms to fcc-Ag, gasification slows down, the particle begins to shrink (surface oxide formation that decomposes) while a coating forms around it (Figure 2d); (iii) once the particle is completely coated gasification stops and the NP shrinking stops (Figure 2e).

Gasification of amorphous carbon by Ag NPs was studied in situ (P oxygen, T variable) in an ETEM. Gasification rate slows when the Ag NPs transform from initial hexagonal structure to fcc; concurrently the Ag NPs shrink rapidly. The dynamic real-time high resolution images associated with local EELS measurements allowed to propose a mechanism for the observed phenomena.

References
[1] S.K. Shaikhutdinov and F.J. Cadete Santos Aires, Langmuir 14 (1998) 3501.

[2] T.J. Booth, F. Pizzocchero, H. Andersen, T.W. Hansen and J.B. Wagner, Nano Letters 11 (2011) 2689-2692.

[3] The authors thank the CLYM (Centre Lyon-St Etienne de Microscopie) for access to the Ly-EtTEM.

[4] S. Li, L. Burel, C. Aquino, A. Tuel, F. Morfin, J.L. Rousset and D. Farrusseng, Chem. Comm. 49 (2013) 8507-8509.


Francisco José CADETE SANTOS AIRES (VILLEURBANNE CEDEX), Mimoun AOUINE, Shiwen LI, Alain TUEL, David FARRUSSENG, Thierry EPICIER
08:00 - 18:15 #6188 - IM03-225 Optimizing electron channeling contrast imaging condition in scanning electron microscope.
IM03-225 Optimizing electron channeling contrast imaging condition in scanning electron microscope.

The electron channeling contrast imaging (ECCI) is a technique that makes use of the influence of back scattered electrons (BSE) by the relative orientation of crystalline lattice and incident electron beam [1]. The ECCI in scanning electron microscope (SEM) is especially useful to image the crystallographic defects such as dislocations, stacking faults and twin boundaries [2]. In this contribution the amount of channeling contrast in the total BSE signal is quantified and its dependence on different working conditions is explored.

An example of the ECCI on an epitaxial GaN thin film is shown in Figure 1. The sample is investigated using ZEISS GeminiSEM 500 FE-SEM with a PIN-diode BSE detector under the objective lens. By adjusting the strength of the scanning coil it is possible to move the pivot point of scanning electron down to the surface of the sample, forming the selected area channeling pattern (SACP) [1]. The intensity variation of BSE signal can be extracted by the line profile across the Kikuchi line, shown as the red dotted line in the figure. The relative variation of BSE signal in SACP with respect to average signal can thus be used as a quantification of channeling contrast.

The amount of channeling contrast is influenced by the properties of incident electron beam and the detector. In principle, the energy and convergence angle of the incident electron beam determines the channeling pattern itself, while the position and energy response of the detector influence the amount of channeling contrast. In this study a large parameter space is explored to optimize the channeling contrast, including electron beam energy, working distance, convergence angle and position of detectors. As an example, the influence of electron beam energy to channeling contrast is summarized in Figure 2. The SACPs are shown in the right part of the figure. The position of the lines as well as intensity variations within the pattern changes significantly between different energies. However, quantification of the channeling contrast shows a clear trend of increasing channeling contrast at lower electron beam energy.

Reference:

[1] L. Reimer, Scanning Electron Microscopy, 2nd. Edition (Springer) 359

[2] I. Gutierrez-Urrutia, et. al., Scripta Materialia 61 (2009) 737


Luyang HAN (Oberkochen, Germany), Bjoern GAMM
08:00 - 18:15 #6274 - IM03-227 Faster than 10 ns scintillator material based on YAP:Pr.
IM03-227 Faster than 10 ns scintillator material based on YAP:Pr.

YAP:Pr (praseodymium-doped YAlO3) is a promising scintillation material with fast response time around 10 ns and a photon yield up to 20 000  photons/MeV (depending on the preparation method) [1], about half of that of widely-used YAG:Ce (which has decay time about 70 ns). Nowadays, there is a growing demand on a scintillation materials with such a fast response times for use in high-speed electron microscopes.

The luminescence spectra of YAP:Pr has two-peak band in the UV range (230-300 nm), and a few more peaks in the green region (500-600 nm) [2]. Pr3+ radiative transitions from 5d1 orbitals are responsible for the fast, former ones. Appropriate colour filter can easily separate the fast and the slow components. Moreover, a modified growth method using co-dopants (patent pending) which we used, led to a decrease of the decay time by one third of the former value. The fastest sample we have obtained up to now has an exponential decay with main decay time 6 ns.

Since the transport of the emitted light can be ensured by a quartz lightguide and the photomultipliers are also available for this wavelength region, the main challenge for the use of YAP:Pr as a scintillator in the electron microscopes for secondary electrons or back-scattered electrons detectors is therefore improvement of light yield of the fast component and inhibition or even full suppression of the afterglow luminescence.

 

 

References

  1. T. Yanagida et al. / Nuclear Instruments and Methods in Physics Research A 623 (2010) 1020–1023
  2. M. Nikl et al., “Can Pr-doped YAP Scintillator Perform Better?”, IEEE Trans. Nucl. Sci., 41, pp.1168-1174, 2010

Martin POKORNÝ (Turnov, Czech Republic), Petr HORODYSKÝ, Martin NIKL, Jindřich HOUŽVIČKA
08:00 - 18:15 #6304 - IM03-229 EDF Project - FIB-SEM nuclearized for investigations in a hot cell on irradiated materials.
IM03-229 EDF Project - FIB-SEM nuclearized for investigations in a hot cell on irradiated materials.

Context : CEIDRE laboratory (Centre d’Expertise et d’Inspection dans les Domaines de la Réalisation et d’Exploitation) based at EDF Chinon Nuclear Power Plant, is in charge of expertising and monitoring. Results of analytical studies bring to better understand the rate of ageing phenomena on power production installations; in addition it is contributing in improving and making safely reliable the exploitation and maintenance strategies in the electricity production subject. Investigations are performed thanks of various analytical techniques as : Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM) or Castaing microprobe (EPMA). It allows to multi scale images and analyses the damages caused by material ageing during its service (ageing under radiations or under heating, corrosion under load, mechanical breaking). At the ultimate level, the use of a TEM is requesting a specific sample preparation, so called TEM lamella with manual bring to state techniques into hot cell preparation units. The manipulations of such radioactive materials are today outdated by the current regulation regarding safety rules and some new performances of thinning the samples are now needed.

In order to limit these risks, the CEIDRE lab has invested into a new system, a Focused Ion Beam (FIB) dedicated to extract thin TEM lamella from a bulk sample. The FIB is coupled with a SEM column, an Energy Dispersive Spectrometer (EDS) and a Time of Flight Spectrometer (TOF SIMS) for elementary analysis and chemical mappings. Complementary to conventional preparation techniques, this tool is also enlarging the previous SEM capacity with fractography, chemical and crystallography analysis. This modern technique is now installed into a hot activity cell and allows the capabilities to operate on active materials.

Specific conception is mandatory to make operational this tool in such severe conditions; however the system is based from standard components where challenging points must be considered: Sample loading and unloading via tele manipulators arms without damaging the FIB/SEM motorized stage and Remote operations of many (as much as possible) of driving units that cannot sit into the cell.

The entire project has been in trust to ELOÏSE sarl associated with NewTec Scientific companies, a TESCAN LYRA 3 GM. From 2013 to 2015, the system has been rebuilt under NewTec laboratories in Nîmes France, commissioned and finally installed in its final destination into a cell at LIDEC (Laboratoire Intégré d’Expertise du CEIDRE).

Modifications – Features : From the strong environmental conditions (gamma activity, acoustic, thermal and mechanical), the instrument plus its accessories have been totally deconstructed and rebuilt to fits the requested exigencies. Most of the electronics units dedicated to the control of the instrument and its accessories (micromanipulator, EDS and TOF spectrometers) are relocated in the so called front zone, 10 meters away from any radiation and outside the hot cell. Most of the cables have been rebuilt and requalified to over Giga Ohms range. In cell, sensitive components are now fitted with enhanced protection against radiation.

Based on feedback systemic studies have been proceed with various known critical scenarios, then new solutions came from that analysis.  The EDS spectrometer received a tungsten base shielding offering a deep protection against emissive rays coming from the samples. In case of major failure of the instrument, an emergency routine composed by a tele manipulate-able tool and a in chamber toboggan allows to collect the sample holder. Finally a semi-automatic loading station has been totally built around the original instrument. This work has been carefully study regarding the specific ergonomy and way of manipulating the samples entering the hot cell (remoted display and three buttons easy to use panel).

Résults & Perspectives : As far as today, the outside cell units escape is confirmed as the best strategy in retailoring an instrument to operate safely. This includes reconsidering signal to signal treatment (e.g. use of optical fibers for communications). However, and despite the massive modifications done, the system is keeping the original performances for both SEM & FIB capabilities. Beyond this points, the high speed networks available at EDF allows extreme safe and comfortable operations even on critical samples.

This tool is now fully operational, the next challenge is human. Training and transmit to operators the new way of tele-working the SEM/FIB.


Salem MILOUDI, Jean-Claude MENARD (Bois d'Arcy), Bernard JEAN, Antoine CANDEIAS
08:00 - 18:15 #6312 - IM03-231 SEM LEEM – new type of mirror microscope.
IM03-231 SEM LEEM – new type of mirror microscope.

LEEM is a well established method for the imaging of surfaces of materials using the impact of very slow electrons (down to zero energy - mirror microscopy). On the other hand, scanning electron microscopy has not consistently solved the detection of electrons in the mirror mode, i.e. in the incident energy range of 3 to 0 eV. In contrast to LEEM, which forms an integral image of the specimen surface and projects it onto an image screen, the scanning method relies on the detection of signals from individual pixels of the specimen. Since mirror microscopy can be realized only when using immersion lenses (either electrostatic, or combined with magnetic immersion), the detector has to capture the fast electrons with energies in principle of the same value as of the primary beam. Such “signal” electron beam moves back through the optical system very close to its optical axis and standard rotationally symmetric electron optics is in principle not able to provide their detection, and signal electrons return towards the source. The higher magnification is used, the more signal electrons are lost.

One solution is to use a rotationally asymmetric imaging and detection system that provides separate beam lines of primary and signal beams [1]. Any separation of these two beams requires their deviation from the optical axis. Given that the energy of signal electrons is high (close to the energy of the primary electrons) in the mirror microscopy mode, the deflection of signal electrons without influencing the primary beam quality is not a simple problem. One of possible solutions is to use a Wien filter, which does not change the trajectory of the primary beam, but only of the signal beam. However, only relatively small deflection angles of the signal beam are achievable for fast electrons. Larger deflection angles cause non-correctable defects of the primary beam. Another solution is to use magnetic prisms, which are able to compensate for any aberrations of the second order and also for energy dispersion in a symmetrical arrangement [2]. In the asymmetric arrangement, we can reach sufficiently large beam deflection angles (90°) having the energy dispersion on the order of units of micrometers per volt. By proper combination of homogeneous magnetic fields, the beam separator stigmatically transfers the primary beam back to the optical axis, while simultaneously allowing the detection of either energy non dispersed or dispersed signal electrons (for example of secondary or backscattered). Such a through-the-lens detector has zero optical power in the primary beam direction. In the “standard” operation mode with grounded specimen the through-the-lens detector can be (but does not have to be) switched off. The primary beam then passes through the detector rectilinearly. Signal electrons can be collected with any other standard detectors for SEM microscopy.

The first experiments verifying the correctness of the concept were made with the help of an assembly consisting of an (Schottky) electron source equipped with a magnetic gun lens followed by detector unit and electrostatic triode objective lens. The specimen is connected to a variable high voltage supply floating on the cathode potential. This arrangement allows to compensate the instability of the main high voltage supply in such a way that the incident energy remains well defined. Here we present the system with only electrostatic immersion objective lens. Experiments with a combination of electrostatic-magnetic immersion lens are under preparation. The results presented here are demonstrating the ability of the detector to distinguish between BSE and SE electrons for landing energies as low as 0.5 eV. The integral detector is mixing both signals and shows the mirror character of the image.

[1] P. Kruit, in Advances in Optical and Electron Microscopy, vol. 12, ed. by T. Mulvey (Academic, London, 1991), pp. 93-137

[2] V. Kolarik, M. Mankos, L. H. Veneklasen, Optik 87, No. 1 (1991) 1 - 12


Vladimir KOLARIK (Brno, Czech Republic), Pavel JANSKY, Martin MYNAR
08:00 - 18:15 #6328 - IM03-233 Imaging of Electric Fields with the pnCCD (S)TEM Camera.
IM03-233 Imaging of Electric Fields with the pnCCD (S)TEM Camera.

The imaging of electric fields on the nanometer scale is of great interest for modern materials research. Techniques providing a fast, direct and precise measurement of local fields are thus useful for materials science applications. We present microscopic measurements of electric fields with the 4D-STEM technique using the pnCCD (S)TEM camera. In 4D-STEM, a 2D camera image is recorded for each probe position of a 2D scan area, yielding a 4D dataset. With this technique, small shifts of the bright field disc (BFD) due to a deflection of the electron beam through electric and magnetic fields in the sample region can be detected. Hence, the magnitude and direction of the local field at each probe position can be determined. Given the large number of necessary probe positions, this technique requires a fast camera system providing short enough readout times so that instabilities in the microscope and sample drift or radiation damage do not deteriorate the final STEM image. Furthermore, a pixelated detector is required to record and account for the intensity distribution variations caused by interaction of the electron beam with the sample.

 

The pnCCD (S)TEM camera allows fast acquisition of 2D camera images with a direct detecting, radiation hard pnCCD with 264x264 pixels [1]. Routinely, the readout speed is 1000 frames per second (fps) and can be further increased through binning and windowing. For example, with the pnCCD (S)TEM camera a 256x256 STEM image -- where a camera image is recorded at each probe position -- can be recorded in less than 70 s. The 264x264 pixel camera image allows precise determination of the BFD position, yielding information about electric and magnetic fields in the sample. For data analysis, image subsets can be selected freely to obtain virtual diffraction images or perform differential phase contrast (DPC) analysis. A major advantage over conventional segmented DPC detectors is that, with the pnCCD (S)TEM camera, movements of the BFD can be discriminated from intensity variations inside the BFD which is of particular importance for analysis of electromagnetic fields inside specimens. Further 4D-STEM applications benefitting from the pnCCD (S)TEM camera include imaging on the micro- and millisecond timescale [2], strain analysis [3], magnetic domain mapping [1], and electron ptychography [4].

 

A demonstration of electric field mapping in vacuum with the pnCCD (S)TEM camera is shown in Figure 1. A voltage of 50 V was applied to a tungsten needle mounted in an FEI Titan G2 80-200 ChemiSTEM microscope, operated at 80 keV. For each of the 256x256 probe positions, a 2D camera image was recorded (Fig. 1a). From these camera images an incoherent bright field STEM image (Fig. 1b, background) as well as the position in the x- and y-directions of the BFD at each probe position was calculated. A comparison of the position of the BFD with and without an applied voltage yields information about the magnitude and direction of the local gradient of the projected electrostatic potential (Fig. 1b, indicated by coloring and arrows). In addition to this direct mapping of the electric field around a needle with rather well-shaped BFDs, the large number of pixels of the pnCCD (S)TEM camera allows the precise determination of the BFD position, even in cases when the BFD is weak and deformed through the interaction of the electron beam with the sample (Fig. 1c).

 

In conclusion, 4D-STEM techniques like electromagnetic field mapping benefit significantly from the capabilities of the pnCCD (S)TEM camera. The readout speeds of 1000 fps and above allow the fast acquisition of 4D datasets with 2D camera images at each probe position. Through the large number of pixels, position and intensity variations of BFDs can be precisely determined.

 

[1] H. Ryll et al, Journal of Instrumentation, in press.

[2] H. Ryll et al, Microscopy and Microanalysis 21 (Suppl. 3) (2015), p. 1585-1586.

[3] K. Müller et al, Appl. Phys. Lett. 101 (2012), p. 2121101-2121104.

[4] H. Yang et al, Microscopy and Microanalysis 21 (Suppl. 3) (2015), p. 2303-2304.


Robert RITZ, Martin HUTH (Muenchen, Germany), Sebastian IHLE, Martin SIMSON, Heike SOLTAU, Vadim MIGUNOV, Martial DUCHAMP, Rafal E. DUNIN-BORKOWSKI, Henning RYLL, Lothar STRÜDER
08:00 - 18:15 #6335 - IM03-235 Quantification of dopants in nanomaterial by SEM/EDS.
IM03-235 Quantification of dopants in nanomaterial by SEM/EDS.

It is long known that doping is a key element in the development of modern semiconductor technology for applications in electronic, nano-electronics, optoelectronics and photonics. Doping allows modifications in the electrical conductivity of semiconductors that depend on the type, quantity, distribution and activity of added dopants. Characterizing doping is therefore essential for the understanding and improvement of electrical and optical properties of semiconductors in order to produce reliable and performant electronic and optical devices. The increasingly reduced dimensions of semiconducting devices as well as the development of new nanomaterial-based devices require the characterization (dopant type and activity) and quantification (concentration and spatial distribution) of low-levels of dopants at the nano-scale. This represents a real challenge that is not fully achieved today by existing techniques which are globally expensive, time-consuming, difficult to implement in an industrial context (STEM, APT, electron holography), spatially unresolved (SIMS), not very sensitive/accurate as yet (EDS and EELS in TEM) and, for most of them, not fully quantitative.

To date, the state of the art for conventional TEM/EDS (Electron Dispersive Spectrometry in Transmission Electron Microscope) is limited to the detection of a few dopants (As, P) in a few materials (Si, SiGe) with detection limit around 1020 at/cm3 and precision of ±20-30% (Sevanton et al., 2009). We report here the detection and quantification by SEM/EDS (SEM: Scanning Electron Microscope) of dopant concentrations as low as 5 1018 at cm-3 with a precision and detection limit around 1018 at cm-3. Such a large improvement in detection sensitivity can be achieved at low voltage (< 8 kV) using the experimental Flat Quad 5060F annular detector from Bruker that equips the Ultra55 Zeiss SEM of the Minatec’s PFNC (INAC). This detector belongs to the new generation of silicon drift detectors (SDD) which are composed of four bean-shaped silicon diodes arranged in a ring around a central hole for the electron beam passage (Fig. a). It is positioned a few millimeters above the sample (Fig. b), a geometry which results in a much wider solid angle (up to 1.2 sr) compared to traditional detectors (<0.1 sr), allowing a higher counting rate at any operating conditions (up to 1000 kcps).

The major difficulty for quantifying low level concentrations by EDS (even at low voltage) remains to extract a low intensity signal from a relatively high background signal. This is particularly true for Mg in GaN, the K-line (1.25 keV) of this element being very close to the L-line (1.19 keV) of Ga (Figs. c-d). To overcome this problem, a new method has been developed which is based on two innovations: 1) the use of specific windows that act as X-ray filters, allowing a large enhancement of the signal to noise ratio in the energy range corresponding to the X-ray line of the analyzed dopants, and 2) the development of a new analytical procedure for removing background based on spectrum normalization to pure reference spectrum (Fig. e).

Results obtained on P-doped Ge 2D layers and Mg-, Si-doped GaN 2D layers show good consistency with SIMS analyses, even for the lowest concentrations of dopants (see Fig. f for Mg dopant in GaN). The technique was applied for quantifying low level of dopants (down to 1019 at/cm3) in various types of Ge, GaN, and AlGaN nanomaterials. Results will be presented and discussed at the conference.

Reference:

G. Servanton, R. Pantel, M. Juhel and F. Bertin (2009) Two-dimensional quantitative mapping of arsenic in nanometer-scale silicon devices using STEM EELS-EDX spectroscopy, micron 40, 543-551


Eric ROBIN (GRENOBLE), Nicolas MOLLARD, Kevin GUILLOY, Nicolas PAUC, Pascal GENTILE, Zhihua FANG, Bruno DAUDIN, Lynda AMICHI, Pierre-Henri JOUNEAU, Catherine BOUGEROL, Michael DELALANDE, Anne-Laure BAVENCOVE
08:00 - 18:15 #6353 - IM03-237 Generation of nondiffracting beams: beam shaping beyond holographic reconstruction.
IM03-237 Generation of nondiffracting beams: beam shaping beyond holographic reconstruction.

The last few years have seen a rapid acceleration in the field of beam manipulation [5].

Central to this expansion is the idea that the purposeful design of the beam's wavefunction can imbue the electron with new properties that potentially enable new measurements previously impossible.

Examples of this are the orbital angular momentum possessed by electron vortex beams [1], or the reduced diffraction of Airy and Bessel beams [2-4].

In these studies, holographic reconstruction remains the most widely used method to generate new wave types due to its generality and flexibility but presents several shortcomings, chiefly the production of multiple diffracted beams [1-3,5].

Here we showcase different approaches to the production of reduced diffraction beams.

We generate Airy waves by a careful tuning of the aberration function of an aberration corrected TEM, and produce a Bessel beam by limiting the angular spread of the electrons with an annular aperture.

We study the beam propagation to prove the limited diffraction, and give experimental proof of extended depth of focus in imaging with Bessel beams.

Acknowledgements:

GG, AB and JV acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant No. 278510-VORTEX.

References:

[1] J. Verbeeck et al. Nature 467, 301 (2010).

[2] N. Voloch-Bloch et al. Nature 494, 331 (2013).

[3] V. Grillo et al. Phys. Rev. X 4, 011013 (2014).

[4] R. Shiloh et al. Phys. Rev. Lett. 114, 1 (2015).

[5] G. Guzzinati et al. Ultramicroscopy 151, 85 (2015).


Giulio GUZZINATI (Antwerpen, Belgium), Armand BÉCHÉ, Jo VERBEECK
08:00 - 18:15 #6358 - IM03-239 Surface-sensitive investigation of semiconductor devices with a signal-selective SEM detection system.
IM03-239 Surface-sensitive investigation of semiconductor devices with a signal-selective SEM detection system.

The detection system of a scanning electron microscope (SEM) is just as important for image quality as the design of its electron optics [1]. Recent studies [2, 3] emphasize the importance of angle- and energy-filtering of backscattered electrons signal (BSE) to reveal details not usually observable in the integral BSE signal.

 

Here we introduce a novel detection system tested on a recently developed ultra-high resolution electron optical column [4, 5] that comprises three BSE detectors capable of angle- and energy-filtering. The system can be switched between a “high-signal” mode where no bias is applied to the filtering grid and an “energy-selective” mode where the filtering voltage can be tuned to achieve various degrees of signal separation.

High-pass energy filtering enables detection of BSEs which have undergone minimal energy loss. Their escape depth is limited and the resulting micrograph becomes surface sensitive. This is beneficial for samples with complex surface and sub-surface structure. Clear visualization of the topmost layer of the sample is critical e.g. for failure analysis of 3D semiconductor devices, given the continuously decreasing dimensions of the local structures in such devices.

  

Figure 1 shows a SEM micrograph of a semiconductor memory device cross-section acquired at 3 keV primary beam energy and 265 pA probe current. Contrast of the images decreases continuously with increasing bias of the filtering grid. With no bias applied the material contrast is highest, yet it contains information about both surface and subsurface area of the specimen. With increasing filtering bias only the electrons backscattered from the very surface of the sample are detected. This is in agreement with theoretical simulations for 3 keV primary beam in silicon that show an escape depth of 80 nm for the integral BSE signal and only 2 nm for the low-loss BSE signal.

 

References:

[1] B J Griffin et al, Proceedings of  the 18th International Microscopy Congress (2014).

[2] I Müllerová et al, Material Transactions 48 (2007), p. 940.

[3] H Jaksch, Proceedings of  EMAS 2011 (2011), p. 255.

[4] J Jiruše et al, Ultramicroscopy 146 (2014), p. 27-32.

[5] J Jiruše et al, Proceedings of Microscopy and Mircoanalysis 2014, (2014).


Jaroslav JIRUŠE (Brno, Czech Republic), Jolana KOLOŠOVÁ, Petr MAREŠ, Rostislav VÁŇA
08:00 - 18:15 #6393 - IM03-241 Depth Resolution and Surface Sensitivity with the Multiple Detection System of a HR-SEM.
IM03-241 Depth Resolution and Surface Sensitivity with the Multiple Detection System of a HR-SEM.

State-of-the-art high-resolution scanning electron microscopes (HR-SEMs) attain a lateral resolution of about 1 nm. To obtain this high resolution even at low landing energies, a deceleration voltage is applied to the sample while the beam has a higher energy inside the electron column to minimize aberrations. The excellent lateral resolution is one key property of HR-SEM images, but the quality of the obtained contrast and its relation to the sample properties have to be considered as well. It is obvious that an electric field above the specimen changes direction and energy of the detected electrons and thus the detected contrast. The purpose of this contribution is to investigate depth resolution and surface sensitivity obtained with the multiple detection system of the Hitachi SU8030 SEM. Fig. 1 illustrates a typical application requiring an excellent surface sensitivity to image the 50 nm thin wall of sheath forming bacteria at high lateral resolution.

As a test specimen to characterize the depth resolution we used glassy carbon, which was structured by an ion beam (FEI Helios NanoLab600). Three 5 µm x 15 µm trenches with a depth of 1 µm were milled and filled with platinum. On top of these structures and the contiguous glassy carbon, Pt-layers with thicknesses of 12, 25 and 50 nm were deposited [Fig. 2]. For the evaluation of the depth information the following detectors were used: The standard inlens detector (upper), a second inlens detector (top) that is positioned above the upper detector, and a retractable photo diode backscattered electron detector (PDBSE). All the detectors were used both, in the normal imaging mode (specimen grounded) and in the deceleration mode (specimen applied with variable potential). The traditional chamber detector has been left out, because there is no possibility to control the ratio of the SE- and BSE-signal with the Hitachi SU8030.

In normal mode, the upper detector receives a pure signal of secondary electrons [Fig. 2a]. The information depth depends on the accelerating voltage only. However, it is complicated to interpret the resulting contrast because topography, edge effects, charging, and potential differences affect the result. The top detector in normal mode [Fig. 2b,c] gives a high angle backscattered electron signal. Again, the information depth depends on the energy of the primary beam. As the amorphous test specimen did not produce channeling effects, the arising contrast is solely a result of the penetration depth of the primary electrons. If the annular control electrode located inside the objective lens is set to negative bias, the SE signal is filtered out and the upper detector also detects BSE. Because these are low angle BSE, the resulting contrast shows a mixture of topographic and depth information [Fig. 2d]. The PDBSE detector operated in the composition mode with the sum signal of four symmetric segments gives a pure BSE signal. Only the acceleration voltage is responsible for the information depth [Fig. 3a-d].

In the deceleration mode, the PDBSE and the upper detector deliver a proper depth information. However, the SE leaving the sample are accelerated towards the detector as well, and thus the result is a mixed SE-BSE signal, and the depth information is superimposed by topographic, edge effect, potential, and material contrast. The top detector in the deceleration mode provides a pure SE signal with an excellent surface sensitivity, but no depth information at all.

Therefore, the most suitable way to get surface and depth information is using the PDBSE detector in composition mode with the sample set to ground potential. At 1 kV acceleration voltage there is no difference in signal intensity between the Pt-area with 1 µm in thickness and the region with the 10 nm Pt-layer on carbon. This means that the information depth is not more than about 10 nm [Fig. 3a]. At 3 kV the 50 nm Pt-layer on carbon has the same contrast compared to bulk Pt, therefore the information depth is about 50 nm [Fig. 3b]. When using 4 and 5 kV there is a contrast visible even between the 1 µm thickness area of platinum and the 50 nm Pt-coating. In this case, the depth of the volume of emitted BSE exceeds the 50 nm Pt-layer [Fig. 3c,d].

In conclusion, it is recommended to use a low angle backscatter detector in composition mode and a grounded stage since other sample properties, like topography, edge effect, charging and potential do not affect the contrast and a pure and tunable depth information is obtained.


Ulrich GERNERT (Berlin, Germany), Dirk BERGER
08:00 - 18:15 #6394 - IM03-243 A magnetic electron energy analyser for use in an SEM.
IM03-243 A magnetic electron energy analyser for use in an SEM.

A new concept for an electron energy analyser is presented whereby a magnetic field is used to disperse the electrons on to an imaging detector. Although using magnetic fields to disperse electrons is not a new idea [1], we show that some of the previous difficulties with using magnetic fields as an electron energy analyser in a SEM can be overcome. Figure 1 shows a schematic of the basic principle. Electrons emitted from the sample pass through a narrow slit placed very close to the sample. Electrons are then dispersed on to an imaging detector. The principle is very close to the well known 180 degree magnetic spectrograph. However, in this case electrons are detected out of the dispersion plane. Using this very simple approach, one can perform Auger electron spectroscopy (AES) over a large energy range and a large angular range in parallel. The small red lines on the detector (see Fig. 1) show how electrons of the same energy but different azimuthal angle will land on the detector. Since the electrons on the red curves are spread quite far, this will create a poor energy resolution since different electrons of different energies and take off angles can land at the same location on the detector. We show that by increasing the angle of rotation (to greater than 180 degrees) that the electron undertake before striking the detector , we can improve the energy resolution and maintain a high transmission while retaining the parallel acquisition capability.

The major advantage of the analyser is that it can acquire electron energy spectra in parallel and over a large angular range with a much greater transmission than another parallel acquisition analyser the Hyperbolic Field Analyser (HFA). 

An Active Pixel Sensor (APS) was used to detect the electrons directly. No use of microchannel plates was made to detect the electron energy spectrum. Since the APS is not very sensitive to low energy electrons, this resulted in rather poor statistics. However, considerable improvement would be expected if a microchannel plate (MCP) were to be used. Figure 2 shows a schematic of the actual realisation of the analyser. Due to space constraints (largely due to the size of PCB board and the narrow space between the Helmholtz coils), the APS had to be placed below the sample as indicated.

Figure 3 shows an image acquired on the Active Pixel Sensor. The primary electrons were selected to have 900 eV electrons and the curved line shows elastic peak electrons acquired for many different polar take off angles. This is indicated by the line A. The image was integrated to form a spectrum. Lines B and C were used as the limits of integration.

Figure 4 shows the resultant electron energy loss spectrum (EELS) after the process of integration. The energy resolution can be seen to be about 4eV.

Further details of the analyser will be presented such as estimates of the energy reolution, an Auger electron spectrum and calculations of the Field of View.

Advantages of the analyser are:

(a) Acquisition of electron spectra over a large energy range and large angular range in parallel.

(b) The detector and plate containing the sperture have a small size and could be fitted between the sample and objective lens

(c) Simple construction

Disadvantages of the analyser are:

(a) Helmholtz coils needed to produce the magnetic field are quite bulky.

(b) The spectrum is sensitive to the distance between the location of the electron source (i.e. where the primary beam strikes the sample) and the aperture slit.

(c) The magnetic field of the Helmholtz coils changes the electron current needed to focus the objective lens (but does not affect the spatial resolution).

(d) Current detectors are too large to fit between sample and objective lens. A bespoke electron sensor is required.

References
1. J. K. Danycz, Le Radium 1913, 10, 4-6; E. Rutherford, H. Robinson, Phil. Mag. 1913, 26, 717-729.


Christopher WALKER, Mohamed EL GOMATI (York, United Kingdom), Xiaoping ZHA
08:00 - 18:15 #6445 - IM03-245 High Resolution and Variable Pressure Imaging of Pyramidal Nano-antennas in a SEM.
IM03-245 High Resolution and Variable Pressure Imaging of Pyramidal Nano-antennas in a SEM.

The photovoltaic (PV) market nowadays is dominated by 1st generation solar cells made of crystalline silicon. But silicon solar cells generate power from only a small portion of the electromagnetic spectrum and demonstrate efficiencies of about 25% in laboratory [1]. 2nd generation solar cells based on thin films have an efficiency theoretical upper limit of about 30% [2].

Nano-antennas coupled to rectifying diodes (known as rectennas) are developped for 3rd generation PV solar cells. They directly convert the electromagnetic waves into electricity from far infrared to visible wavelengths. With a theoretical conversion efficiency of 85% [3] and a technology compatible with low costs fabrication techniques on flexible substrates, rectennas appear to be promising candidates for next generation PV solar cells.

In the present study, pyramidal structures were nano-imprinted on a flexible substrate (polyethylene terephthalate: PE) and then covered by a thin metallic layer. We have investigated the morphology, structure and chemistry at each step of the fabrication process via SEM techniques, in order to highlight structural and/or chemical defects at nanometer scale which can affect the overall physical and electrical properties of the device. The results were obtained with a Zeiss GeminiSEM 500 ultra-high resolution FESEM. This system is equipped with In-lens SE and the Energy Selective Backscattered detector (EsB), as well as variable pressure (VP) SE and VPBSE detectors to observe non-conductive samples. For the chemical and crystallographic analyses, EDS, WDS, and EBSD accessories are additionally installed on this microscope achieving the full imaging linked to the analytical capabilities. The low voltage acquisition was suitable for surface studies since it increases topographic contrast and reduces specimen charging. The VP mode was also employed, which features not only a very restricted skirt effect under high gas pressures, but also enables the detection of pure secondary electron (SE) signal using all in-lens detectors [4].

Figure 1 shows a cross-section image of a pyramidal nano-antenna array, taken with the VP SE detector at 140 Pa and 5 kV. The charging effect on the PE polymer is completely eliminated with the use of the VP mode. The morphology and wetting of the silver metallic layer could be clearly observed. Figure 2 displays a top view of one nanopyramid. The image was taken with the in-lens SE detector at 1 kV and at a very short working distance (0.4 mm), which greatly improves the resolution. Low kV imaging allows the observation of the silver layer structure on the pyramid facets. Crystal grains and defects such as grain boundaries and twins are acutely visible.

This work highlights the use of SEM high resolution imaging, at low kV and even in variable pressure mode, to improve the understanding of structural and chemical properties of hybrid nanomaterials as plastic/metal pyramidal nano-antennas.

References

[1] M.A. Green, K. Emery, Y. Hishikawa, W. Warta and E. D. Dunlop, Prog. Photovolt: Res. Appl. 20:12–20 (2012)

[2] W. Shockley and H. J. Queisser, Journal of Applied Physics, Volume 32:. 510-519 (1961)

[3] D. K. Kotter, S. D. Novack, S. D. Slafer, P. Pinhero, Proceedings of the 2nd International Conference on Energy Sustainability, ES 2008, 2, 409 (2009)

[4] L. Han, C. Berger, M. Boese, A. Thesen, F. Zhou, S. Meyer, Erik Essers, Microsc. Microanal. 21, Suppl 3 (2015)

Acknowledgments

This study is part of "Energy Storage by Direct Conversion of Electromagnetic Radiation Captured within Nano-Antennas" (ETNA) project funded by the Amidex Fundation (PR2I projects)


Andrea P. C. CAMPOS (Marseille), Christian DOMINICI, Claude ALFONSO, Loic PATOUT, David DUCHÉ, Cécile GOURGON, Ludovic ESCOUBAS, Ahmed CHARAÏ
08:00 - 18:15 #6491 - IM03-247 Ultra-High Resolution SEM for Materials Analysis.
IM03-247 Ultra-High Resolution SEM for Materials Analysis.

The need for increased SEM resolution and the simultaneous demand for enhanced analytical capability have led to the development of increasingly sophisticated instruments. Here we describe the design of a novel SEM column where recently-developed high-resolution optics [1] is brought together with traditional analytical capabilities. Combined with FIB it greatly enlarges the capability for 3D tomography inspection of a specimen especially when used in combination with other analytical techniques like EDS or EBSD.

 

The SEM column comprises a triple objective lens design. The first objective lens is optimized to yield an image resolution of less than 1.1 nm at 1 kV. The design retains a single-pole lens [2] which creates a strong magnetic field around the sample, dramatically decreasing optical aberrations. However, the leaking magnetic field distorts ion trajectories of the FIB and causes beam splitting of ion-isotopes. To overcome this, FIB processing is performed in a magnetic-field-free mode, where the second objective lens of a conventional type with a resolution of 2.5 nm is used. The third objective lens enables a large field of view. A combination of all three objective lenses allows for multiple display modes, e.g. for enlarged field of view, greater depth of field or optimizing resolution at high probe currents. To prevent thermal instability due to changes of lens excitation when switching between the imaging, analytical and other modes, the column works in a regime where constant thermal power dissipation is maintained independent of lens excitation. It significantly reduces image drift and enables stable, long-term, automatic 3D analysis.

 

3D BSE tomography of an SERS-active structure of gold-coated, partially-etched polystyrene spheres (Figure 1) was performed maintaining stable operation over a 13 hour period [3]. The sample was sliced using FIB and each cross-section was automatically imaged at 2 kV using one of the three dedicated back-scattered electrons (BSE) detectors to obtain the gold distribution on the polystyrene surface. InBeam BSE detector placed in the column acquires high-angle BSE signal, whereas the two other detectors collect BSE with lower angles. The BSE detector triplet thus enables angle filtration. Furthermore, energy-filtering of the BSE signal enhances material contrast, (Figure 2), where low-loss 1.95-2 keV BSEs reveal details not observable in the integral BSE signal.

The redesigned electron gun further enhances the analytical capabilities of the column. It allows probe currents as high as 400 nA for structural analysis and ten times faster beam energy alternation compared to the previous generation. The sharp conus of the objective pole-piece enables FIB processing of large tilted samples, e.g. 8 inch wafers. The new SEM column will be used in the Mark II generation of the TESCAN MAIA electron microscope and the dual FIB-SEM instruments GAIA and XEIA [4].

 

References:

[1] J Jiruse et al, Microsc. Microanal. 19 (Suppl 2), 2013, p. 1302.
[2] Z Shao, PSD Lin, Rev. Sci. Instrum. 60(11), 1989, p. 3434.
[3] L Stolcova et al, Imaging & Microscopy, Issue 4, 2015, p. 34.
[4] The authors acknowledge support from the EU Initial Training Network STEEP (Grant no. 316560).


Jaroslav JIRUŠE (Brno, Czech Republic), Miloslav HAVELKA, Jan POLSTER
08:00 - 18:15 #6556 - IM03-249 Quasi in-situ catalytic studies using a TEM grid microreactor.
IM03-249 Quasi in-situ catalytic studies using a TEM grid microreactor.

Conventionally, catalysts are analyzed in the transmission electron microscope (TEM) under static conditions in the vacuum. However, catalysts surfaces dynamically response to the reaction conditions. In addition, comparing TEM images before and after the catalytic reaction may give conclusions that are difficult to verify, because of the inhomogeneous conditions along the catalyst in normal fixed bed reactors [1]. For obtaining relevant information it is advisable to study the material under catalytic relevant conditions (gas composition, pressure, temperature) which also includes the monitoring of conversion. Therefore, in-situ TEM approaches, such as environmental TEM (ETEM) or microelectromechanical systems (MEMS)-based gas cell TEM holders, were developed. They allow the direct observation of the dynamic changes of a catalyst during the prevailing time of a reaction [2]. However, drawbacks regarding the reaction pressure and fast dynamics give rise to pressure gaps and may limit the resolution, respectively.

To overcome these limitations we have developed a TEM grid microreactor that allows a decoupling of the catalytic reaction and the imaging process. This quasi in-situ method combines relevant and well-controlled conditions for all catalyst particles at ambient pressure with high resolution imaging of exactly the same particles. In order to avoid the exposure to ambient air, a secure transfer of the catalyst to and from the TEM can be guaranteed via the glovebox and vacuum transfer holders. Furthermore, the catalytic conversion can be followed by using an ultra-sensitive proton-transfer reaction mass spectrometer (PTR-MS).

Here, we present the utilization of this microreactor in the CO oxidation over metal catalysts. For instance, identical location imaging of active Pt nanoparticles (proven by PTR-MS measurements) reveals structural changes, which are induced by the catalytic process (Figure 1).

In conclusion, the microreactor complements the state of the art in-situ imaging, where one can study the structural dynamics, by delivering catalytic relevant kinetic information, which can be coupled to changes on the atomic scale.

 

References[1]

1.         Korup, O., et al., Catalytic partial oxidation of methane on platinum investigated by spatial reactor profiles, spatially resolved spectroscopy, and microkinetic modeling. Journal of Catalysis, 2013. 297: p. 1-16.

2.         Vendelbo, S.B., et al., Visualization of oscillatory behaviour of Pt nanoparticles catalysing CO oxidation. Nat Mater, 2014. 13(9): p. 884-890.

 


Liudmyla MASLIUK (Berlin, Germany), Marc G. WILLINGER, Darren DUNPHY, Robert SCHLÖGL, Thomas LUNKENBEIN
08:00 - 18:15 #6577 - IM03-251 A versatile high-vacuum cryo transfer system for cryo microscopy and analytics.
IM03-251 A versatile high-vacuum cryo transfer system for cryo microscopy and analytics.

The conservation of the native state during sample preparation is mandatory for a correct interpretation of any micrograph. Particularly for EM, the preservation of the pristine architecture is challenging. If not imaged in situ (1), two different strategies can be followed to prepare hydrated samples for electron microscopy: the conventional and the cryogenic routine. Conventional preparation protocols typically rely on the chemical fixation and staining of the sample material, whereby both steps are known to induce artefacts (2). The second preparation routine, introduced by Moor (3) and Dubochet (4), circumvents chemical artefacts. The basic principle of every cryogenic (cryo) preparation protocol is the physical immobilization of the sample in a frozen-hydrated solid state, by vitrifying the sample within milliseconds. Due to the excellent structural preservation cryo imaging techniques have gained increasing popularity (5, 6).

However, the handling of a vitrified sample becomes rather delicate. Two prerequisites must be fulfilled during the entire handling in order to maintain the artefact free conservation of the specimen: 1) the sample must be kept well below the de-vitrification temperature of water (approximately -137°C) in order to avoid structural rearrangements due to ice crystal growth (5). As a consequence of the permanent cooling, the sample material acts as a cold trap and is therefore prone to contamination. 2) Thus, the sample must be transferred within an anhydrous environment all the time. In the case of the latest preparation protocols or imaging strategies this has been proven to be particularly challenging, since these methods include several transfer steps, either due to their extensive post-processing or complex workflow (7).

In the past, several cryo-transfer concepts were introduced mainly for cryo SEM, with bulk add-ons and cryo-stages inside the microscope to allow e.g. high-vacuum cryo-transfer (8), which is not feasible for “in-lens” systems like S/TEM’s. Standard cryo-transfer systems for cryo-TEM, however, work under ambient pressure from liquid nitrogen direct into the load lock of cryo-TEM.

Here, we present a high-vacuum cryo-transfer system that overcomes the limitations of existing systems. The system includes four parts: 1) sample cartridge (Fig 1a), 2) storage device (Fig 1b), 3) high-vacuum cryo shuttle (Fig 1c) and 4) a side-entry TEM cryo-stage. Moreover, our solution offers connectivity between different kind of instruments not limited to post-lens systems (8), enabling new types of multimodal imaging approaches by transferring cryo-samples between different imaging and manipulation devices (Fig 1d). The performance of the developed system is demonstrated on an “in-lens” cryo-STEM. In order to determine the quality of the transfer process, the temperature and pressure level were recorded during the entire transfer. Moreover, prior and subsequent to the cryo-transfer, the mass of the TMV as well as the thickness of a carbon film were measured and compared. Here, any possible contamination would falsify the scattering characteristics of the sample material, and consequently cause an apparent increase in mass or thickness, see also (9).

REFERENCES

(1) M. J. Dukes et al, Microsc. Microanal. 20 (2014) p.338.

(2) M. Pilhofer et al, Environ. Microbiol.16 (2014) p.417.

(3) H. Moor, and K. Mühlethaler, J. Cell Biol. 17 (1963) p.609.

(4) J. Dubochet, and A.W. McDowall, J. Microsc. 124 (1983) p.3.

(5) A. Al-Amoudi et al, EMBO J., 23 (2004) p. 3583.

(6) W. Kühlbrandt, Science 6178 (2014) p. 1443.

(7) A. Rigort and J. M. Plitzko, Arch. Biochem. Biophys. 581 (2015), p. 122.

(8) M. Ritter et al, Microsc. Microanal. 5 Suppl. 2 (1999) p. 424.

(9) S.Tacke et al, Biophys. J. 110 (2016), p. 758.

(10) Rudolf Reichelt initiated this project. Unfortunately, he passed away on 2nd October 2010, too early to see the final results. This research was supported by the DFG Grant RE 782/11. V. Krzyzanek acknowledges the support by the grant 14-20012S (GACR).


Sebastian TACKE (Zürich, Switzerland), Vladislav KRZYZANEK, Harald NÜSSE, Alexander ROSENTHAL, Jürgen KLINGAUF, Roger Albert WEPF, Rudolf REICHELT
08:00 - 18:15 #6597 - IM03-253 Random scanning mode for the spectroscopy of sensitive materials.
IM03-253 Random scanning mode for the spectroscopy of sensitive materials.

Electron Energy Loss Spectroscopy (EELS) and Cathodoluminescence (CL) in a STEM microscope allow to characterize chemical composition and optical properties down to a subatomic scale. Nevertheless, a high electron dose is conveyed onto limited regions of the specimen and generates strong radiation damages in fragile materials. Spectroscopy of individual molecular systems remains therefore still highly challenging. Here we demonstrate how this traditional limit can be largely overcome by acquiring hyperspectral images through a non-standard random scanning mode. This is achieved by considering the pixels in the scanning array as a list that is shuffled and loaded into a dedicated scan generator. At the end of spectrum acquisition a signal from the detector triggers the next beam position.

The luminescence of high efficiency molecular dyes has been investigated through an original CL set up integrated within a STEM microscope, which allows a nanometric spatial resolution. Illumination damages have been reduced thanks to a liquid nitrogen cooling system at the sample stage and a 60 keV electron beam.

The dyes have been deposited at a very low concentration on hexagonal boron nitride (h-BN) flakes. This one represents the ideal substrate for luminescence, being chemically inert and displaying a wide energy band gap. Furthermore, it can actively participate in the luminescence processes: electron induced excitations in the h-BN substrate may recombine at the molecular sites. The luminescence of the molecules should appear therefore in CL-hyperspectral images as isotropic emission spots some tens of nanometres wide, corresponding to the excitation diffusion length in h-BN.

We show that a traditional sequential line-by-line scan leads to a rapid bleaching of the molecules, whose luminescence appears only in a short line of pixels. On the contrary, by using a random scan routine we were able to obtain the expected isotropic emission spots. Unlikely a sequential scan, in a random survey the energy deposited in an illuminated area can be evacuated before an adjacent pixel is illuminated. Even when the bleaching of the molecule cannot be avoided, this acquisition mode allows to collect a signal from a higher number of pixels with respect to the sequential scan.

Beside CL, EELS investigations could in principle derive great advantage from this random acquisition. More precisely, core EELS studies of fragile materials could benefit from a higher spatial resolution of the hyperspectra. Finally, the random scan opens also new perspectives in terms of compressed sensing techniques.


Anna TARARAN (Orsay), Marcel TENCÉ, Nathalie BRUN, Mathieu KOCIAK, Alberto ZOBELLI
08:00 - 18:15 #6661 - IM03-255 Proposal for an electron orbital angular momentum spectrometer.
IM03-255 Proposal for an electron orbital angular momentum spectrometer.

  Measurement of magnetization at atomic resolution via dichroic electron energy loss spectroscopy (EELS) with vortex beams remains a hotly-discussed and as-yet unproven goal for electron microscopy [1-5]. A satisfactory explanation for the lack of successful demonstrations of this technique has not yet emerged. However, a number of recent predictions [2,5,6] for dichroism include one common oversight: the efficiency of the dichroic measurement strongly depends on whether the outgoing phase distribution--or, equivalently, the outgoing orbital angular momentum (OAM) distribution--is measured.

  Dichroic absorption spectroscopy experiments with circularly polarized light are much simpler; the photon is absorbed, and necessarily transfers all angular momentum to the specimen. Electrons in a transmission electron microscope are not absorbed, and can carry non-zero linear and orbital angular momentum away from an interaction with a  specimen. Incident electron vortices with mħ OAM have a significant probability to scatter to an outgoing state with unchanged mħ OAM. Dichroic electron energy loss spectroscopy, then, can be made far more efficient by post-selecting for the component of the final state which has nonzero Δm. There exist qualitative methods to post-select for more of this component of the final state [7]. There are also some semi-quantitative interferometric methods [8] that do not work for the inelastically scattered final states that one must measure in a dichroic EELS experiment, as they cannot be coherently interfered with an incident reference wave. In order to accomplish practical, highly efficient dichroic EELS, a quantitative non-interferometric method to spatially separate OAM will be necessary.

  We propose a magnetic field-based mechanism for on-axis separation of electron OAM modes. We show that the vector potential of any cylindrically symmetric current distribution that flows azimuthally--a standard magnetic round lens--can produce an orbital angular momentum-dependent focal length, where the focal length is linear with the electron orbital angular momentum (see figure 1 for a cartoon visualization). Figure 2 shows multislice simulation [9] of the phase distribution acquired by a 20ħ electron vortex passed through a lens constructed to produce exaggerated OAM dispersion stronger than the normal lensing effect. Figure 3 shows the 20ħ and a -20ħ passed through the same strongly dispersive lens and propagated 10 millimeters. This shift in focal length can be used, in conjunction with a spectrometer entrance aperture to block out defocused modes, to produce a more efficient magnetic dichroism spectrum.

  As one might expect, this shift in focal length is very small in a standard magnetic round lens. We have explored the physical design and optical configurations that might allow for a practically realizable orbital angular momentum spectrometer. In particular, there are two stackable lens combinations that produce an OAM-dependent magnification. If successfully implemented, this OAM magnification system would allow for parallel, quantitative measurement of the full orbital angular momentum distribution of an electron beam without a coherent reference beam.

[1] J. Verbeeck et al., Nature 467 (2010) p.301.
[2] S. Lloyd et al., Phys. Rev. Lett. 108 (2012) p.074802.
[3] P. Schattschneider et al., Phys. Rev. Lett. 110 (2013) p.189501 .
[4] P. Schattschneider et al., Ultramicroscopy 136 (2014) p.81–85.
[5] J. Rusz and S. Bhowmick, Phys. Rev. Lett. 111 (2013) p.105504.
[6] J. Rusz et al., Phys. Rev. Lett. 113 (2014) p.145501.
[7] K. Saitoh et al., Phys. Rev. Lett. 111 (2013) p.074801.
[8] L. Clark et al., Phys. Rev. A 89 (2014) p.053818.
[9] V. Grillo et al., New Journal Phys 15 (2013) 093026.

This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, under Award # DE-SC0010466.


Tyler HARVEY (Eugene, USA), Vincenzo GRILLO, Benjamin MCMORRAN
08:00 - 18:15 #6674 - IM03-257 Transmission Kikuchi Diffraction: effective nano-scale analysis using conventional EBSD hardware.
IM03-257 Transmission Kikuchi Diffraction: effective nano-scale analysis using conventional EBSD hardware.

SEM-based Transmission Kikuchi Diffraction (SEM-TKD) [1,2] is an extension to the conventional  technique of reflection EBSD (using bulk samples) to transmision EBSD using thin samples.  The main advantage of SEM-TKD over the conventional method is a large improvement in spatial resolution of point-analysis from small particles and of mapping data from thin films.

 

This improvement is primarily a consequence of examining thin, electron-transparent TEM samples in transmission, which reduces the effective diffraction and escape volume, as well as the use of zero- to low sample tilts which reduces anisotropic beam-spreading effects.  The technique is used to produce 2D datasets from flat, thin sample areas.  This data is then used for microstructural analysis including crystallographic orientation, grain size, phase distribution, and grain boundary character and distribution.  It is especially useful in characterizing highly-strained materials and materials with grain sizes under 50nm.

 

A significant attraction of TKD is that these improvements can be realised using conventional EBSD hardware, in its conventional position on the SEM, without any modification.  However, for TKD the sample position, pattern centre (high up or above the detector screen) and sample tilt (close to horizontal) are very different to those required for conventional EBSD (just above the screen centre line, and 70° respectively).  Thus the TKD-mode imposes a more extreme case of the gnomonic projection which is already inherent to the capture of conventional electron backscatter patterns.

 

The most notable effects of the TKD projection geometry are that horizontal bands near to the bottom of the screen are imaged wider than normal, and that the non-symmetric intensity across these bands is highlighted (as illustrated in Figure 1).

 

Here we discuss how these distortions affect analysis using a conventional EBSP solving engine and some new technology developed to improve performance.

 

References:

[1] R.R. Keller, R.H. Geiss, Transmission EBSD from 10nm domains in a scanning electron microscope, Journal of Microsopy 245 (2012) 245-251

[2] Trimby, P.W., Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope, Ultramicrosopy 120 (2012) 16-24


Jenny GOULDEN, Haithem MANSOUR (Gometz la ville), Angus BEWICK
08:00 - 18:15 #6681 - IM03-259 A New Compound Lens Equipped UHR SEM.
IM03-259 A New Compound Lens Equipped UHR SEM.

The quality of a scanning electron micrograph is determined by both the resolution and the contrast: the size of the features that can be resolved and the type of information that the micrograph gives about them. Recent advances in SEM have improved both, for example using magnetic immersion or electrostatic lenses for ultra-high resolution, or by employing in-lens, angle-sensitive detection for tunable contrast. This paper introduces a further improvement in resolution and in contrast using a new FEI SEM equipped with a compound electrostatic-magnetic final lens.

The compound final lens SEM combines a magnetic final lens in the pole piece, a magnetic immersion final lens and an electrostatic lens formed by the potential at the bottom of the column. This new final lens design provides a resolution equal to 1.0 nm at 1 kV acceleration voltage. Figure 1 demonstrates the ultra-high resolution performance by imaging the SBA-15 sample at 500 V landing energy.

The contrast performance is based on the independent in-lens detection of secondary (SE) and backscattered (BSE) electrons. Secondary electrons are further separated and independently detected by in-lens (T2, higher SE energies) and in-column (T3, lowest SE energies) detectors. Separate collection of the lowest energy SEs delivers extremely surface sensitive imaging. Simultaneous detection of high energy SEs adds more freedom for imaging of non-conductive samples - high energy SEs are less sensitive to sample charging while still clearly showing the topography – see the high energy SE image of a hydroxyapatite nano-sheets grown on bioactive glass fiber [1] in Figure 2.

The backscattered electrons are detected by the T1 detector which is positioned at the very bottom of the pole piece. Thanks to that position it receives a high signal intensity which enables ultra-low beam current BSE imaging. This is important for beam sensitive samples, such as polymers, porous materials or other fragile samples, which require the maximum amount of signal to be acquired in the shortest amount of time with the smallest dose possible. With the T1 detector BSE imaging is possible during TV-rate navigation, so that material contrast is always available. Combined with the new compound final lens, it is possible to further energy filter the backscattered electrons detected on the T1 detector. When high-loss (low energy) BSEs are filtered out, T1 provides strong material contrast images formed by low-loss (high energy) BSEs only – see surface of the Pt activated carbon particle in Figure 3. The acquisition of topographical information is ensured by the SEs simultaneously collected by the T2 and T3 detectors. The T1 detector keeps providing low noise images even at probe currents down to few tens of pA. The low probe current operation together with the energy selective BSE detection enables charge-free material contrast imaging of non-conductive samples.

The SE and BSE filtering combined with excellent low dose performance (low kV and low current) and “smart” scanning strategies allow for high vacuum imaging of uncoated insulators that are otherwise susceptible to charging. The capabilities on these samples are completed with a low vacuum mode with chamber pressure up to 500 Pa, which is essential for analytical measurements where high acceleration voltages and probe currents are required.

In conclusion, the new SEM equipped with the compound final lens and the in-lens and in-column detectors improves both the imaging resolution and contrast performance. It allows researchers to capture the maximum amount of information from conductive as well as insulating samples, with the right detail and with the least amount of compromises.

 

Acknowledgements:

[1] Hydroxyapatite sample courtesy of Devin Wu, FEI China


Petr WANDROL (Brno, Czech Republic), Ernst Jan VESSEUR
08:00 - 18:15 #6690 - IM03-261 Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of gamma -TiAl with High Accuracy Band Detection.
IM03-261 Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of gamma -TiAl with High Accuracy Band Detection.

 Technological developments in EBSD has enabled great improvements in indexing reliability and accuracy [1].   However, some individual phases continue to pose challenges, especially those that present extremely similar Kikuchi patterns to the EBSD camera for different crystallographic orientations.  This phenomenon is called “pseudosymmetry”, as it commonly involves relatively high intensity bands in certain patterns with an apparent higher symmetry than the crystal structure actually possesses.  In many cases, only very slight differences in inter-band angle separate candidate solutions, and only robust and accurate band detection may identify the correct one among them. 

Conventional Hough-based band detection methods are sufficiently accurate for most indexing requirements.  High accuracy Hough transform settings improves band detection accuracy, and is useful in mitigating pseudosymmetric misindexing [2].  However, these settings result in reduced data acquisition speeds, and may not completely eliminate pseudosymmetry problems.

New band detection refinement methods improve EBSD indexing performance for some of the most chronic cases, at reasonable data acquisition speeds.  Higher accuracy band detection is achieved by iteratively comparing the positions of simulated bands with bands in the actual Kikuchi pattern image, using expected versus actual band widths and, accounting for the hyperbolic shape of bands.  In addition to delivering high precision crystallographic orientation data and helping discriminate different phases with similar Kikuchi patterns, this method is sufficiently sensitive to resolve fine differences in inter-band angle to nearly eliminate many cases of pseudosymmetric misindexing. 

An important application is γ-TiAl alloys, which are promising jet engine turbine materials, combining low density with good oxidation and creep resistance.  The high temperature deformation behaviour of these alloys must be better understood before they can widely replace the higher density Ni-base superalloys; For example, an improved knowledge of the fundamentals of crystallographic slip and its interaction with the γ/γ  lamellar variants could be critical.  Pseudosymmetry, however, is a major issue here (Fig. 1a), arising from γ-TiAl’s close tetragonal c:a unit cell parameter ratio of 1.018, giving the Kikuchi patterns it generates a pseudo-cubic configuration, resulting in indexing inaccuracies.  These mistakes show the same misorientations as boundaries between real γ-TiAl lamellae, causing problems in revealing the true microstructure.  Phase discrimination between coexisting γ(TiAl) andα2(Ti3Al) phases is also difficult (Fig. 2a).  Application of a new, automated band detection tool and system knowledge of the confronting pseudo-symmetry almost completely eliminate these issues (Fig.’s 1b and 2b) and are used in real-time during data collection, at normal acquisition speeds.

References:

[1] K. Thomsen et al., Royal Microscopy Society EBSD 2014 conference proceedings (2014)

[2] C. Zambaldi et al., J. Appl. Cryst. 42 (2009), p. 1092-1101


Niels-Henrik SCHMIDT, Haithem MANSOUR (Gometz la ville), Jenny GOULDEN, Alberto PALOMARES-GARCÍA, Rocio MUÑOZ-MORENO
08:00 - 18:15 #6725 - IM03-263 Time-resolved cathodoluminescence in a scanning electron microscope.
IM03-263 Time-resolved cathodoluminescence in a scanning electron microscope.

The past decade has witnessed enormous progress in the design and fabrication of nanostructured materials with unique optical properties. These tiny physical structures allow geometrical control over the electromagnetic shape of light well below its own wavelength. A large variety of applications for this field of subwavelength optics known as nanophotonics have already begun to emerge, including solar photovoltaics, chemical sensing, quantum cryptography, and LED lighting. Many fundamental optical interactions are hidden beneath the diffraction limit, however, which makes the retrieval of subwavelength optical behavior impossible with standard microscopy. An alternative approach, known as cathodoluminescence (CL) [1], is to probe nanostructures with an electron beam, which excites optical resonances and transitions and then collects the emitted light. It has recently been used to characterize plasmonic structure [2] or III-N heterostructures [3]. Thanks to a very efficient CL system, in a scanning electron microscope (SEM), working in free space, we can directly probed many key dimensions of light – including intensity, angle, polarization, and frequency - with ~10 nm resolution [4].

In this presentation we will show how we can use a blanker to modulate a continuous electron beam to generate electron pulses with a resolution of ~10 ns. This approach has several advantages compared to alternatives such as a laser driven pulsed electron gun [5]. It can be easily implemented in any SEM, it requires few experimental modifications, it does not require a dedicated microscope and the pulsed electron beam can be controlled at will (pulse duration and repetition rate). We will show how this pulsed electron gun can be used to explore the dynamics of a single photon emitter, such as a rare earth ion or the NV0 center of nano-diamond. An HBT interferometer allows recording of the autocorrelation function of the CL signal [6][7]. Combining secondary electron images with measurements of the CL spectra, emission polarizations, lifetimes and second order correlation function, we are able to fully characterize optically active systems at the nanometer scale.

 

[1] L. H. Robins, L. P. Cook, E. N. Farabaugh and A. Feldman. PRB 39 13367 (1989)

[2] E.J.R. Vesseur and A. Polman, Nano Lett. 11, 5524 (2011)

[3] L.F Zagonel et al, Nano Lett. 11, 568 (2011)

[4] C. Osorio, T. Coenen, B.J.M. Brenny, A. Polman, and A.F. Koenderink, ACS Photon. 3, 147 (2016)

[5] D-S. Yang, O. F. Mohammed and A. H. Zewail, PNAS 107, 14993 (2010)

[6] Mark Fox. Quantum Optics: An Introduction. Oxford Master Series in Physics, (2006).

[7] L. H. G. Tizei and M. Kociak, PRL 110  153604 (2013)


Sophie MEURET (CEMES, Toulouse), Hans ZEIJLEMAKER, Elke NEU, Patrick APPEL, Patrick MALETINSKY, Albert POLMAN
08:00 - 18:15 #6744 - IM03-265 ColorSTEM – A Novel STEM Detector for Advanced Materials Analysis in SEM.
IM03-265 ColorSTEM – A Novel STEM Detector for Advanced Materials Analysis in SEM.

Performing scanning transmission electron microscopy (STEM) in a scanning electron microscope (SEM) is a popular technique for laboratories without transmission electron microscopy (TEM) capabilities.

The new versatile STEM detector by TESCAN is optimized for both high-sensitivity orientation contrast as well as materials composition contrast imaging.

Transmitted electrons scattered in different angles represent different types of information that arises within a thin foil in scanning transmission electron microscopy. The new retractable STEM detector design allows maximum manipulation capabilities with the sample, including changes in working distance or eucentric tilt above the detector. Changing the working distance also changes the angular distribution of electrons detected by the detector segments. The sample can be therefore navigated to optimum contrast conditions easily, using changes in the working distance (see Fig. 1).

The redesigned electronics and signal processing apparatus of the detector allows simultaneous acquisition of multiple signals from transmitted and diffracted electrons including bright field (BF), dark field (DF) and high angle dark field (HADF) channels. The newly implemented ColorSTEM concept allows  simultaneous  acquisition of all channels as a live, color-coded image with no information loss in either compositional color coding (Fig. 2) or orientation contrast color mode (Fig. 3).

The STEM analysis can be further supplemented with high-resolution transmission-EDS or transmission-EBSD microanalysis. Higher resolution with these techniques is possible by reducing sample thickness thereby minimizing the interaction volume within the sample [1]. This combination takes advantage of the fact that these analytical techniques are already available in the SEM.

References:

[1] P.W. Trimby, Ultramicroscopy 120 (2012), 16-24


Jiří DLUHOŠ (Brno, Czech Republic), Michal BILÍK, Stanislav PETRÁŠ
08:00 - 18:15 #6758 - IM03-269 A protected inert-gas sample manipulation and transfer environment for cryo electron microscopy and analytics.
IM03-269 A protected inert-gas sample manipulation and transfer environment for cryo electron microscopy and analytics.

The preservation of the native sample state during manipulation and exchange between sample preparation and imaging devices is a prerequisite for artefact and contamination free structure investigation. In particular during cryo-transfer and (re-)mounting of frozen hydrated samples, which often in electron microscopy (EM), have a very large surface area compared to its volume, can be very challenging when samples have to be exchanged or remounted several times. Some of the main challenges are: 1. preventing the sample from warming up to the de-vitrification temperature of water (approximately -137°C), 2. Preventing the sample from being covered with ice or other contaminants condensing from the surrounding atmosphere and 3. Handling these samples without chemical or mechanical alteration of their native state.

Currently the handling and transfer of samples under vacuum and cryo conditions is solved by systems provided from different suppliers. However the transfer of frozen (vitrified) samples under environmental pressure (e.g. from a high-pressure-machine to a low temperature coater or cryo-EM) is still a challenge and a satisfactory practical solution is missing.

Here, we present an ambient pressure inert-gas sample mounting and exchange chamber (Glove-Box) (Fig. 1 &B) that addresses all the needs for structure and composition preservation during the manipulation, mounting and transfer of mainly frozen or hydration/oxygen sensitive samples. Once mounted these samples can be transferred and exchanged between different cryo-preparation and imaging systems (Fig. 1 E) under controlled inert-gas and temperature conditions. This controlled inert-gas “Glove-Box” includes a LN2 immersed sample mounting area with various interfaces to different inert-gas/cryo transfer systems for RT or low temperature TEM or FIB/SEM applications, Furthermore, monitoring of the environmental parameters (Fig. 1 C) during transfer (humidity, oxygen, carbon dioxide), on-screen imaging to support sample manipulation (Fig. 1 D), heating of tools and recording of all experimental parameters for documentation are included into this dedicated LN2 and inert-gas “Glove-Box”. The interface to other sample carrier devices is open and flexible and can be adapted upon individual laboratory needs. Finally such a “Glove-Box” can play an essential role in a dedicated modern cryo-EM & analytical environment as sketched in Fig. 1 E.


Georg Alexander ROSENTHAL (Eisenstadt, Austria), Sebastian TACKE, Falk LUCAS, Roger Albert WEPF
08:00 - 18:15 #6760 - IM03-271 SILICON CARBIDE 3C IDENTIFICATION BY THE NEW DEVELOPED NORDIF EBSD EXTRACTION SOFTWARE.
IM03-271 SILICON CARBIDE 3C IDENTIFICATION BY THE NEW DEVELOPED NORDIF EBSD EXTRACTION SOFTWARE.

    

    

Electron backscatter diffraction (EBSD) is a powerful tool to automatically and quantitatively characterize the orientation of grains and phases of ceramic and composite materials [1].  EBSD ultra-fast pattern acquisition, i.e., patterns streaming to hard disk (HD) and later pattern indexing, becomes an interesting technique to investigate a series of large-scale ceramic, which can quickly provide phase distribution information for further improving ceramic production. However at the same time, it becomes more and more important to handle the huge offline EBSD raw data efficiently and correctly.

    

In this project, we already reported the EBSD characterisation results of the polymorphs of a solid state sintered silicon carbide component based on Densitec 15, a ready to press powder-made by Saint Gobain Ceramic Materials AS [2].  The pre-sintered powder was produced using the Acheson process and would typically consist of the 4H- and 6H-polytypes, with small amounts of 3C and sometimes traces of 15R. The offline EBSD raw data collection was carried out in a Hitachi SU-6600 FESEM and the patterns were acquired by using NORDIF UF-1100 EBSD detector and written directly to HD. The previous results only identified 4H- and 6H-phases in the sample, consistent with the expected transformation of 3C-crystals that takes place at temperatures significantly lower than the sintering temperature of 2110°C. In this abstract further detailed phase identification of silicon carbide 3C by the new developed NORDIF EBSD Extraction Software is carried out.

    

Figure 1 is the overview for the new developed NORDIF EBSD Extraction Software, where the indexed phase map of the present silicon carbide sample shows partly on the right part of the figure. Offline EBSD indexing reveals that the content of the silicon carbide 3C phase is below 0.5% in the sample. By using the point analysis tool (+) in the program, the individual EBSD patterns from the silicon carbide 3C phase can be retrieved from HD with auto contrast and background subtraction corrections. Representative 3C-SiC EBSD patterns shown in Fig. 2 together with the corresponding internal coordinations (x,y), where the pattern (6,59) is exactly the same retrieved pattern shown that in Fig. 1. Further detailed 3C-SiC pattern indexing is performed. Under the system optimized calibration settings, the best confidence indexes (CIs) in Fig. 2 are all below 0.03, and the representative indexing result shows in Fig. 3. As checking back and comparing that in Fig. 1, it can be concluded that the indexed 0.5% 3C-SiC phases are mostly located at the boundaries among different grains, phases and pores, which resulted those EBSD patterns mis-indexed as 3C-SiC phase.

    

Offline EBSD together with its Extraction Software is hence an excellent tool to study not only the crystallographic texture and phase distribution, but also fully confirmed that the 3C-SiC recrystallisation and phase transformations processes taking place during sintering of ceramic materials. It also reveals that the present EBSD Extraction Software is good practice to carefully view the offline EBSD raw data before applying further processing algorithms.

    

     

[1] Koblischka-Veneva M, Muklich F and Koblischka M R  2002  Cryst. Engng. 5 411-418

[2] Yu, Y.D. et al EMAS 2016, 12th Regional Workshop on Electron Probe Microanalysis Today-Practical Aspects


Yingda YU, Torkjell BREIVIK, Paal RUNDE, Jarle HJELEN (Trondheim, Norway)
08:00 - 18:15 #6793 - IM03-273 En route to ion microprobe analysis of soluble compounds at the single cell level: The CryoNanoSIMS.
IM03-273 En route to ion microprobe analysis of soluble compounds at the single cell level: The CryoNanoSIMS.

The NanoSIMS 50L instrument is a magnetic-sector, multi-collecting ion probe. The physical basis for ion micro-probe analysis is the ability to perform mass-spectrometry on secondary ions sputtered from a solid target by the continuous impact of a beam of charged particles. This primary beam sputters ionized atoms and small molecules (as well as many neutral particles) from the upper few nanometers of the sample surface. These secondary ions from the sample are transferred with high transmission to a high mass-resolution, multi-collection mass-spectro­meter, where they are counted one-by-one in electron multiplier detectors, or as currents in Faraday cups.

The unique strength of the NanoSIMS ion microprobe is the ability to focus the primary beam (either Cs+ or O-) onto an extremely small spot on the sample surface, smaller than 100 nm in linear dimension. A controlled raster of this highly focused primary beam across the sample surface allows secondary ion images to be produced with a spatial resolution that can clearly resolve structures larger than a few hundred nanometers in linear dimension. For example, in recent studies we have been able to clearly resolve substructures of the cell nucleus, such as nucleolus and chromatin packages, along with individual clusters of glycogen in both liver and brain cells from mice (1, 2).

The conventional NanoSIMS instrument operates at room temperature and ultra-high vacuum (10-9-10-10 Torr). In order to preserve this vacuum, biological samples must be prepared to minimize volatilization or degassing. Classical sample preparation procedures developed for electron-beam imaging techniques (e.g. TEM and SEM) meet such constraints. However, these procedures involve steps such as fixation of the tissue with glutaraldehyde solutions, staining (e.g. with OsO4 or uranyl-acetate), dehydration in ethanol series, and finally embedding into epoxy resin. These procedures effectively remove soluble compounds originally present in the tissue. Left behind in the sample are macromolecular structures, such as proteins, lipids, RNA, and DNA. These macromolecular structures can, on the other hand, be isotopically imaged in great detail with a conventional NanoSIMS instrument at a spatial resolution down to 100-50 nm. This has already created vigorous research programs and important biological insights have been gained across an impressive range of organisms; reviewed in ref. (3).

However, a multitude of fundamental biological processes involve the action of soluble compounds (ions, metabolites, drugs, etc.) that cannot be imaged with the conventional NanoSIMS instrument because they are lost or significantly displaced during classical sample preparation. The only certain way to preserve and observe soluble molecular compounds and ions unperturbed in situ in a biological tissue is to create and maintain highly controlled cryo-conditions throughout the chain of preparative and observational procedures. Our method is based on state-of-the-art cryo-methods for sample preparation (starting with high-pressure freezing, followed by cryo-planing of the tissue in a cryo-ultramicrotome) and subsequent ultra-structural (i.e. sub-cellular) observations with cryo-scanning electron micro­scopy (4). What is missing from the currently existing observational chain is an instrument that can isotopically image cryo-prepared samples with ultra-high spatial resolution, permitting precise correlation with the structural information provided by electron microscopy. Our vision has been to develop a CryoNanoSIMS to achieve this goal. From an instrument development point of view, we have now succeeded in this and we will present our preliminary data.

 

1          Takado, Y. et al (2014). Nanomed Nanotech Biol Med, doi: 10.1016/j.nano.2014.09.007.

2          Takado, Y. et al (2015). J Chem Neuroanat 69, 7-15, doi:10.1016/j.jchemneu.2015.09.003.

3          Hoppe, P. et al (2013). Geostand Geoanal Res 37, 111-154, doi:10.1111/j.1751-908X.2013.00239.x.

4          Walther, P. & Müller, M. (1999). J Microsc 196, 279-287, doi: 10.1046/j.1365-2818.1999.00595.x.


Louise Helene Søgaard JENSEN (Lausanne, Switzerland), Tian CHENG, Florent Olivier Vivien PLANE, Stéphane ESCRIG, Arnaud COMMENT, Ben VAN DEN BRANDT, Bruno Martin HUMBEL, Anders MEIBOM
08:00 - 18:15 #6855 - IM03-275 Simulation of a Bessel box electron energy analyser for analysis of secondary electrons.
IM03-275 Simulation of a Bessel box electron energy analyser for analysis of secondary electrons.

Our understanding of the surface topography, texture, elemental composition etc. have not only improved the reliability of the fabrication procedure of micro circuits but also the working of the final device. Low-voltage scanning electron microscopes (LVSEM) have played a major role in the ever improving quality control of Si devices. ­The smaller interaction volume of the low-energy electrons with the specimen leads to the ability to observe finer details. Lowering the beam energy to a few hundred eV results in higher yield of secondary electrons (SE) relative to the number of backscattered electrons [1]. A conventional SEM uses the widely used Everhart-Thornley (ET) detector for detection of secondary electrons [2], however it acquires secondary electrons over a large angular and energy range. This means that information regarding angularly resolved and energy resolved data is lost. What is needed is a small scale device that is relatively little affected by ambient electric and magnetic fields that can access this information. Furthermore demands of low voltage SEM at short working distances require a device of small dimensions to be placed near to the sample.

In this study we propose the lesser known Bessel box Electron Energy Analyser (EEA) [3] to detect and energy analyse secondary electrons emanating from the specimen. The Bessel box is a very simple EEA with a cylindrical geometry. It comprises a hollow cylindrical electrode coupled with two input/output electrodes. The acceptance angle of the Bessel box is determined by the slit on the input cap electrode. Focusing/defocussing action of the Bessel EEA depends on the voltage difference applied to the cylindrical and i/o cap electrodes. The Bessel EEA is essentially a band pass filter with a retarding field effect on the electrons. We examine the properties of a Bessel box EEA by simulation over a range of take off angles with SIMION 8.1 and COMSOL 5.2 Multiphysics. Figure 1 demonstrates the working of such a Bessel filter, lower energy electrons lose energy as they travel through the Bessel EEA and are repelled back before they reach the output slit (fig. 1a). In contrast, higher energy electrons are not focussed by the Bessel EEA (fig. 1b) and only a narrow band of energies are allowed to pass through (fig. 1c). Its size can be much smaller than other EEAs and so could potentially be inserted into existing SEMs. Its small size also makes it less affected by the disturbing effects of external electric and magnetic fields.

The Bessel box was simulated using the conditions: Cylindrical and output electrodes set to -22.2V and input cap at ground. The transmission of the Bessel EEA for a range of incoming electron energies is shown in fig. 2. We have investigated a range of cylindrical and output cap electrode voltages and determined energy resolution and transmission for several geometries with the aim of optimising the design for use in a SEM. In addition the effects of magnetic fields from the objective lens of the SEM on the characteristics of the Bessel box are studied.

[1] Goldstein et. al. “Scanning Electron Microscopy and X-ray Microanalysis” , Springer Third edition, ISBN 9781461502159 (2003).
[2] Everhart, TE and Thornley, RFM. "Wide-band detector for micro-microampere low-energy electron currents". Journal of Scientific Instruments 37 246–248 (1960).
[3] G. Schiwietz, et al., “The retarding Bessel–Box—An electron-spectrometer designed for pump/probe experiments”, Journal of Electron Spectroscopy and Related Phenomena 203 51–59 (2015).


Ashish SURI (York, United Kingdom), Andrew PRATT, Steve TEAR, Christopher WALKER, Mohamed EL GOMATI
08:00 - 18:15 #6865 - IM03-277 Spatial resolution and compositional contrast in imaging using the low-loss electron signal in SEM.
IM03-277 Spatial resolution and compositional contrast in imaging using the low-loss electron signal in SEM.

Nanotechnology places increasing demands on techniques for sample characterisation on the sub-100 nm length scale. The scanning electron microscope (SEM) is one, widely used, technique for imaging and characterising nanomaterials using the intensity of secondary (SE) or backscattered electron (BSE) emission from a probed region of the nanomaterial to generate spatially resolved contrast in an image. The acquisition of the low-loss electron (LLE) signal [1] in the SEM provides an alternative method which may offer the advantage of improved spatial resolution compositional imaging.

Spatial resolution and contrast in compositional imaging of the LLE signal has been investigated by means of experimental measurements in a scanning electron microscope and Monte Carlo simulations for the case of a semiconductor superlattice structure comprising Si0.85Ge0.15 of 11.5 ± 0.4 nm separated by pure Si layers at a periodicity of 69.2 ± 0.2 nm. Both continuous slowing down approximation (CSDA) and discrete-loss based Monte Carlo models were considered (NISTMonte and PENELOPE) and it was found that the calculated contrast values were particularly sensitive to the choice of model in the low-loss regime. Experimental data were obtained using a purpose-built low-energy electron loss detector [2,3] comprising a retarding field analyser with an electron-optical input lens. The detector was attached to an FEI Sirion FEGSEM. Experimental data indicated that improved contrast was obtained as the maximum loss energy was lowered (fig 1a), and this trend was reproduced by the simulations (fig 1b). The results indicate that the LLE technique is a useful alternative to operating at low primary beam energies when performing compositional imaging on samples which have nanoscale compositional structure. Statistical noise considerations that affect the LLE signal are discussed.  In the case of spatial resolution, resolution metrics for compositional imaging are discussed. It was found that the LLE signal shows improved resolution compared with the backscattered electron signal (figs 2 & 3), however CSDA-based simulations predict better resolutions than simulations based on a discrete loss model. It is found that the energy-straggling has the most significant influence on the predicted resolution in the low-loss regime. The simulations suggest that a SEM with a high-quality small-diameter probe is required to fully appreciate the resolution benefits of the LLE signal. Experimental data indicates that certain samples (such as those with sub-surface compositional inhomogeneity or nanoscale topography) benefit from the LLE technique even when the SEM used has a more modest probe diameter.

[1] O C Wells. Appl. Phys. Lett. 19 232 (1971)

[2] I R Barkshire, R H Roberts, M Prutton. Appl. Surf. Sci. 120 129 (1997)

[3] C Bonet, A Pratt, M M El-Gomati, J A D Matthew, S P Tear. Microsc. Microanal. 14 439 (2008)

 


Chris BONET, Steven TEAR, Mohamed EL-GOMATI (York, United Kingdom)
08:00 - 18:15 #6889 - IM03-279 Temporally and spatially resolved local strain tracking microscopy.
IM03-279 Temporally and spatially resolved local strain tracking microscopy.

Abstract

             Cell-stretching is a key method to regulate deformation magnitude, cyclic strain levels, and frequencies, therefore elucidating the biological processes involved in activation of mechanosensitive pathways, cell patterning and morphological changes at physiologically relevant mechanical loads. Although several approaches and methods such as uniaxial or biaxial devices have been demonstrated to deform cells and usually compute ration cross-head displacement to original length of sample as an indicator of percentage stretch, however in-plane strain components may have a non-uniform spatial distribution due to heterogeneous extracellular matrix of connective tissue around cells. Therefore, the average value of the applied cross-head strain is expected to be different than local strain in the vicinity of cells. This limitation has prompted us to develop an alternative approaches.

            Here, we present a novel uniaxial cell-stretching device integrated into inverted fluorescence microscope that provides a high spatial resolution to determine the local strain changes around fluorescent and non-fluorescent cells (RSI, 2016, 87, 023905). Transparent and biocompatible polydimethylsiloxane PDMS elastomer modified with small fluorescent beads are used to deliver uniform strain at the physiologically relevant magnitude and cycles. The design of our device for acquisition of real-time spatiotemporal data and single-particle tracking methods to determine bead positions that was used for computation of strain fields at various sample geometries will be described (Fig. 1). Briefly, trajectory of beads is computed by comparing each registered location in consecutive frames and minimizing the square displacement of centroids. Displacement vector is obtained from displacements and later used to calculate longitudinal normal, traverse normal and shear components of strain with relevant deformation tensor (Fig. 2).  Lastly, we will discuss that HeLa S3 cells adhered to biocompatible and flexible collagen coated surface are stretched to determine simultaneously detection of morphological changes and local strains around the cells by tracking embedded fluorescent beads (Fig. 3). The method enables to measure local strain field and image adherent cells simultaneously, therefore provides accurate and time-resolved correlation between applied mechanical deformation and cell response.

Acknowledgements

This work is financially supported by the Scientific and Technological Research Council of Turkey (TUBITAK) under Grants 112E580 and 112T823. O.B.A. is supported by 2210 national scholarship predoctoral training program. 

 


Halil BAYRAKTAR (Turkey, Turkey), Onur AYDIN, Bekir AKSOY, Ozge Begum AKALIN, B. Erdem ALACA
08:00 - 18:15 #6905 - IM03-281 Imaging photon camera with high spatiotemporal resolution.
IM03-281 Imaging photon camera with high spatiotemporal resolution.

Photon counting detectors with high spatiotemporal resolution levels are key tools of new super-resolution imaging techniques, as required for time resolved single molecule imaging. PHOTONIS Imaging Photon Counter, IPC, is a wide field (18 mm active area) camera able to detect individual incoming photons with 2 dimensional spatial resolution < 40 µm FWHM and < 100 ps timing resolution. The IPC consists of a dual microchannel plate detector equipped with a cross strip anode and high speed electronics that allows global count rates up to 5 MHz. The PHOTONIS IPC comes with a user-friendly plug-and-play GUI for operation and data acquisition. The 1 Gbps Ethernet interface provides the connection to a computer for data storage and analysis.

The first PHOTONIS IPC was installed at the National Institute of Standards and Technology (NIST) in 2015; the IPC is being used in a new single-molecule super-resolution fluorescence lifetime imaging microscope at the Center for Nanoscale Science and Technology at NIST.

PHOTONIS launched in Q1 2016 a new low-noise and high quantum efficiency cathode technology that boosts the detection efficiency and dual resolution of the next IPC generation.


Rene GLAZENBORG, James MARR, Adrian MARTIN, Raquel ORTEGA (sturbridge, USA), Emile SCHYNS, Oswald SIEGMUND, John VALLERGA
08:00 - 18:15 #6916 - IM03-283 Defocus and probe-position coupling in electron ptychography.
IM03-283 Defocus and probe-position coupling in electron ptychography.

Defocus and probe-position coupling in electron ptychography

Shaohong Cao, Peng Li, Andrew M Maiden, John M Rodenburg

 Department of Electronic and Electrical Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, UK.

One of the most promising applications of electron ptychography is the possibility of converting a conventional SEM, with a relatively poor stability envelope, into a high-resolution TEM. This is simply achieved by placing a transmission specimen in stage and a CCD camera placed below the specimen [1]. SEM ptychography does not need any image-forming lenses: the objective lens is only used to generate a conical illumination. Defocusing this into a large area allows for a large ptychographical step size and a very large field of view. High resolution is obtained by solving the phase problem for the high-angle scattered intensity (lying outside the Ronchigram) via iterative algorithms such as ePIE [2] and DM [3]. See Fig. 2a, where gold atomic fringes in gold nano particles on a carbon support film are clearly visible in a ptychographic reconstruction obtained from a conventional SEM (an FEI Quanta 600 SFEG at 30keV, data from [1]). We also solve for the illumination function, which in the case of conical illumination has a uniform curvature dependent on defocus.

A complication of electron (as opposed to visible light and X-ray) ptychography is that is normally necessary to solve also for the illumination positions [4] because of errors in the scan coils resulting from magnification calibration inaccuracy and hysteresis. However curvature in the illumination and probe shift are coupled. Figure 1 shows a simplified ray diagram. For any two specimen planes where the ratio of the shift distance () and the ratio of the feature size in the object () equals the ratio of the defocus (), the resulting Ronchigrams will behave identically as the probe is shifted. In fact in the presence of wave interference the correct solution is unique, but for probe position-searching algorithms that are necessarily guided by the Fourier error metric, the bright intensity of the Ronchigram dominates. When partial coherence is present (so that Fresnel effects in the Ronchigram are supressed) the problem is exacerbated, generally resulting in a distorted probe position lattice (Fig. 3), a wrong estimate of the defocus, and an inconsistent reconstruction in which lattice fringes are strongly delocalised. Of course, delocalisation renders the reconstruction entirely invalid, like an out-of-focus conventional TEM image.

We explore the coupled position-defocus stagnation problem based on both experimental and simulated data. We report progress on various methods that can resolve this important issue.

Acknowledgment: SC gratefully acknowledges financial support from Phase Focus Ltd and for access to the SEM data.

References:

[1] Humphry MJ, Kraus B, Hurst AC, Maiden AM and Rodenburg JM, Nature Communications, vol. 1733, no. 10.1038, 2012

[2] Maiden AM and Rodenburg JM, Ultramicroscopy, 109, (2009) 1256-1262

[3] Pierre Thibault P, et. al., Ultramicroscopy, 109 (2009) 338-343, 2009

[4] Maiden AM, et. al., Ultramicroscopy, 120 (2012) 64-72


Shaohong CAO (sheffield, United Kingdom), Peng LI, Andrew MAIDEN, John RODENBURG
08:00 - 18:15 #6932 - IM03-285 Chiral electron sieves for electron vortex beam generation.
IM03-285 Chiral electron sieves for electron vortex beam generation.

The recent discovery of vortex electron beams [1-3] has generated many interests and the new understanding may lead to applications in material characterization [4]. The method of creating vortex electron beams using a forked aperture [2] is popular but has a drawback that electron vortex beams with different orders are produced side-by-side in the specimen plane. More recently a method of producing electron vortex using a spiral holographic aperture was demonstrated, with the advantage of being able to select a specific vortex beam in focus on the sample [5,6].  However, the spiral aperture is difficult to reproduce accurately because of many fine features and it is also mechanical fragile and the extra reinforcement bars were added in the mask for mechanical stability[5].

In this study, we propose and experimentally demonstrate a simple and versatile way of generating electron vortex beam carrying orbital angular momentum (OAM), using a chiral electron sieve illuminated by a plane electron wave.  Fig. 1 (a) shows an electron sieve mask as viewed using a scanning transmission electron microscope.  It consists of a number of spirals (5 in this case), each spiral consists of suitablly arranged holes in such a way that they produce a vortex beam approximate at a near field distance [7].  Fig. 1(b) shows the resultant beam intesnity profile as the designated distance.  This shows a characteristic donut shaped beam illumination characteristic of an electron vortex beam.  The is confirmed by direct comparison of the intensity profile with the simulated result using Fresnel diffraction theory (Fig. 1(c)).  The same simulation shows the phase structure at the center of the donut ring does contains a vortex structure of order 5.  

For this particular electron sieve mask, the mask pattern can be compared with the spiral diffractive holographic grating structure produced by interference between the vortex beam and that of a spherical reference waves [5], showing comparable efficiency.  However, it has the practical advantage of being much easier to produce and mechanically more robust than the normal binary diffractive grating.   We will show that this is a practical example of a much rich set of electron sieves that we can generate to shape electron beams, many of which has no counter part in conventional holographic diffractive grating theory [8].

[1]  M. Uchida, A. Tonomura, Nature 464, 737 (2010).

[2]  J. Verbeeck, H. Tian, P. Schattschneider, Nature 467, 301(2010).

[3] B. J. McMorran, et al, Science 331, 192 (2011).

[4] R. A. Herring, Science, 331, 155 (2011).

[5] J. Verbeeck, H.Tian, and A. Béché, Ultramicroscopy 113, 83 (2012).

[6] K. Saitoh1, Y. Hasegawa, N. Tanaka, and M. Uchida, J. Electron Microsc. 61, 171 (2012).

[7] Z. Li, M. Zhang, G. Liang, X. Li, X. Chen, and C. Cheng, Opt. Express 21, 15755 (2013).

[8] Y.J. Yang, G. Thirunavukkarasu, M. Babiker, J. Yuan, paper submitted.


Jun YUAN (York, United Kingdom), Yuanjie YANG, Gnanavel THIRUNAVUKKARASU, Mohamed BABIKER
08:00 - 18:15 #6952 - IM03-287 A micro-combinatorial TEM method for phase mapping of thin two-component films.
IM03-287 A micro-combinatorial TEM method for phase mapping of thin two-component films.

The aim is to introduce a new method to transmission electron microscopy (TEM) for the preparation and investigation of combinatorial samples. TEM is a very efficient analytical technique in materials science and technology in structural characterization of bulk and thin films that are determined by their composition. The equilibrium phase diagrams of the bulk are well explored (Binary Alloy Phase Diagrams), however, phases of thin films may remarkably differ and due to difficulties they are hardly studied. The common procedure to reveal the properties of concentration dependent phases is the preparation of numerous two-component samples, one for each CA/CB=1-A composition, and the investigation of these individuals. This is a low efficiency procedure, that costs enormous time of man and machine. For a study of high number of samples combinatorial methods are preferred i.e. instead of carrying out numerous individual experiments samples of varying composition are prepared in a single process. In materials science and especially, electron microscopy, however, due to technical difficulties, combinatorial methods are not widespread.

The first examples for combinatorial TEM investigations are published from the 90-ies. P. Schultz et al [1] and K.E. Roskov [2] These were partly efficient solutions since only the preparation of discrete samples was combinatorial the investigation was not. P. B. Barna, and later G. Radnóczi and F. Misják implemented an experimental arrangement [3] that was already micro-combinatorial, since samples with various compositions were both deposited and investigated in a single TEM grid: Two sources were facing the substrate through an aperture at inclined angles so that the thin film was deposited at two overlapping areas, where two-component film of Ag-Cu was grown. The drawback of that method [3] is that the region of changing concentration is very short (100-150 µm), due to the concentration gradient the phases are accumulated and the sample does not contain the entire (0-100%) composition range.

The idea for developing a really efficient micro-combinatorial method that eliminates the incompleteness of the above solutions means that the preparation and investigation have to be carried out in a single TEM grid within the whole 0-100% composition range (micro-combinatory) so that the formed binary phases and variants may be well separated. The method and device was patented by G. Sáfrán [4]. The present method is typically for the preparation of two-component combinatorial samples with a constant concentration gradient that are deposited on electron transparent film on microgrid suitable for TEM investigations, as well as SEM, EDS and Auger analysis, or nanoindentation. The micro-combinatorial device incorporates a cover plate with a narrow slit that is moved in fine steps above the substrate e.g. TEM grid, meanwhile the fluences of the magnetron sources “A” and “B” are regulated as synchronized to the path of the slit [4]. This new solution provides micro-combinatorial preparation and investigation, so that the length of the concentration transition region, compared to the former solution [3], increases with one order of magnitude to 1500 microns.

For a demonstration MnAl micro-combinatorial samples were DC magnetron sputter deposited on TEM grids covered with amorphous C  and SiOx films at various temperatures. The results of the phase analysis of the combinatorial samples are not discussed here.

A photo of a TEM grid with a deposited Mn-Al micro-combinatorial sample is shown in Fig. 1. Fig 2.(b) represents energy dispersive X-ray spectrometer (EDS) data that, aside from the edges, shows linear concentration distribution along the 1500 micrometer stripe. The gradient of a limited concentration range can be adjusted to arbitrarily low values for an enhanced separation of the formed thin film phases. In addition, the device is suitable for the study of the effects of parameters (residual gas pressure, temperature, etc.) changing with time.

References

[1] P.G. Schultz et al: Science (1995) Vol. 268 no. 5218 pp. 1738-1740

[2] K.E. Roskov: J. Comb. Chem. (2008) 10, 966–973

[3] F. Misják et al: Thin Solid Films 516 (2008) 3931–3934

[4] Hung. Patent No. P 15 00500 (2015)


György SÁFRÁN (Budapest, Hungary)
08:00 - 18:15 #6963 - IM03-289 Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation.
IM03-289 Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation.

Conventional Ga+ Focus Ion Beam (FIB) dual beam system has proven to be an important and popular tool for Transmission Electron Microscope (TEM) sample preparation [1]. It is especially useful for localized TEM sample preparation. However, it is commonly known that the process can fail due to the internal stress leading to crack. We propose two strategies and their methods are detailed here. One is to release the stress by milling away constraining materials and another is to prethe crack rowthby in-situ filling method [2]. The two strategies can be broadly applied to most stressed/cracked samples.  

In the first example, a chemical vapor deposition (CVD) diamond like carbon film with large internal compressive stress has failed in conventional TEM sample preparations. In order to release the internal stress, a ring is cut surrounding the area of interest, the ‘bump’. The cut could be performed by milling at large current (30-65nA) for efficient removal of the surrounding materials. Subsequent removal of the materials on the ‘bump’ is performed at progressively lower current until a 1um lamella remains for a conventional in-situ lift-out procedure. The results of TEM analysis showed the amorphous structure and columnar growth of the ‘bump’ area (Fig. 1).

To analyze the stress release of the local area using the cutting procedure, digital image correlation (DIC) was employed in this study. A cluster of small dots were deposited on the surface of the ‘bump’ area using carbon gas injection system (GIS) as shown in Fig. 2.  After milling the ring pattern to remove the material around the ‘bump’, secondary electron images were taken by electron column of this dual beam system (FEI Quanta3D), before and after the cutting respectively. These images were then imported to the DIC software (Davis) for calculation of the stress/strain release. It was measured by the displacements of the deposited dots. The result shows the stress around the ‘pump’ is released after material removal around the ‘bump’ which led to successful TEM sample preparation.

The second example is a hot isostatic pressing (HIP) processed Ti-SiC composite with internal thermal mechanical stress on the interface area which is however the area of interest. The broad ion beam preparation and conventional FIB preparation all failed due to stress concentration induced cracking at the interface region (Fig. 3). To increase the stability of the lamella, the sample was wedge polished in the parallel direction of the interface. This resulted in both ends of the lamella being held by the matrix material after rough milling process. An in-situ filling process by e-beam Pt deposition was then carried out to ‘fill’ the crack and strengthen the interface area. Caution was taken with the cut off step for both ends of the lamella. It is recommended to use parallel milling mode of the FIB in order to keep balance on the cutting speed of both ends so that it can better prevent failure during the cut off. E-beam Pt deposition at the free end of the lamella may enhance its stability. TEM results have shown the successfully prepared sample with filled crack at the interface and its deformed grains due to thermal mechanical stress induced by the HIP process.

Reference

[1] N. B. K. Scott, L. A. Giannuzzi, MRS Bulletin, 39(04)  p. 317-325

[2] X. L. Zhong, G. E. Thompson, Z. Liu, P. Skeldon, M. G. Burke (2014), mmc2014 Proceedings, Abstract No. 1062

[3] The authors thank Mr A. Broughton, Prof S. Lyon, and Mr Y. Fan for providing the samples.


Zhong X. L. (Manchester, United Kingdom), Mcdonald S. A., Withers P., Burke M.G.
08:00 - 18:15 #6987 - IM03-291 Device for the transport, storage as well as the chemical or physical treatments of AFM tip series.
IM03-291 Device for the transport, storage as well as the chemical or physical treatments of AFM tip series.

Atomic force microscope - AFM - is a scanning probe microscope used to probe surfaces with a high degree of accuracy. AFM is based on the measurement of forces of interaction between, on one hand, atoms of the surface of a sample and, one the other hand, the last atoms of an AFM tip or probe. AFM is also a tool to measure the local forces allowing access, through the acquisition of force spectra, to the nanomechanical properties of a sample (adhesion, deformation, elasticity, dissipation, etc.). An AFM probe consists of a tip positioned at the end of a lever, which is itself attached to a support ("chip" or "wafer"). An AFM probe is only a few millimeters long and is very fragile and expensive.

When new or unused AFM probes can be stored in plastic transport boxes or more rarely cassettes suitable for packaging and transporting dry these probes without risk of damaging them. The ground of these boxes is covered by a layer of adhesive polymer (gel) designed to maintain AFM probes on the surface of the wafer by adhesion. However, this direct contact with the gel may cause contamination of the tips and the presence of gel avoids the physical or chemical treatment of the probes in this box, as well as their conservation in liquid medium, which is required for any chemically grafted tip.

We introduce here a new generation of AFM device that has been specifically developed to provide both the transport and storage of AFM probes in air or in liquid (water, buffers, alcools,…). It is also well adapted for physical treatments (UV/ozone treatment, plasma, metal sputtering,…) and chemical application (tip chemistry). The device is mainly based on an originally way to hold a large series of AFM probes for all the applications, preventing them from any breakage or damage. [1]

By fixing a series of AFM probes in the box, the successive steps of UV/ozone for tip surface cleaning, piranha activation of SiN tip surface, chemical reactions, bio-functionalization, water and buffer washing and long term storage in buffer can be operated with keeping the AFM probes in their initial position. The liquid reactants, water and buffers are simply injected and removed using a (micro)syringe. Application of the AFM boxes was useful to prepare series of tips using rigorously the same experimental conditions. Antibodies functionalized tips may be prepared in one experiment to further analysis the nanomechanical properties of different substrates by AFM and force spectroscopy and mapping. Tips may also be prepared at a first place (for example, in a lab expert in chemistry of biomolecules) and be sent by mail to another place for analysis (for example, in a lab expert in AFM imaging and force measurements).

The figure 1 shows pictures of the device and an example of application to study the adhesive properties of lactalbumine milk proteins. This device takes the advantage to have internal containers that can be used independently from the outer lager container. This feature is very well adapted for chemical grafting of series of AFM tips according to different protocols.

 

Reference

Gaillard, C. and Sire A., Storage Box for AFM Probes, INRA Patent FR2011/051989, 2010/2011, WIPO Patent Application WO/2012/028822


Cédric GAILLARD (NANTES)
08:00 - 18:15 #7046 - IM03-293 Counter Electrode Design Considerations in Atom Probe Tomography Microscopes.
IM03-293 Counter Electrode Design Considerations in Atom Probe Tomography Microscopes.

In the development of atom probe tomography instruments, a variety of counter electrode designs have been considered.  Each design takes into account a wide variety of design criteria including;  complexity of manufacturing, undesired electron emission, stage motion, cryogenic cooling, vacuum performance, voltage and laser pulse introduction, geometry, serviceability, field enhancement, signal-to-noise, energy spread, field of view, and cost of ownership.  Examples of some designs are shown in Figure 1. 

The local electrode atom probe (LEAP®) puts a premium on a geometry and proximity to the specimen in order to enable faster voltage pulsing, minimization of energy spread, and the maximization of throughput with microtip geometries [1].  Such a design, with a small spot focused laser [2], maximizes field enhancement and minimizes the portion of the flight path exposed to field variations [3]. The design does however require a vibration isolated and flexible cryogenic path and a high precision stage with sophisticated alignment cameras. 

Prior to the proposal of a micro-extraction electrode by Nishikawa in 1993 and until the introduction of the LEAP in 2003 [4,5], atom probe field ion microscope systems used a simple counter electrode that was simply a wire ring or a copper disc with an opening of a few millimeters.  This design is simple to construct, and allows substantial flexibility in sample stage design, including the use of a goniometer stage.  Especially in early atom probe design, where the field of view was as much as 100 times smaller than is achievable today, the ability to rotate and tilt the specimen towards the TOF detector was key.  Alignment of the specimen with respect to the counter electrode is not critical and could be achieved by line of sight and the projection of the data to a phosphor screen or the TOF detector.  The simplicity and flexibility are countered by the limitation to wire geometry specimens, a flexible and lower conductance cryogenic cooling path, low field enhancement, and degradation of mass resolving power due to the ions being exposed to varying electric fields during larger portions of the flight path. 

Several atom probe systems have been proposed and constructed using a flat disk counter electrode with an aperture (or a metal TEM grid) with the specimen moved aligned in close proximity to, or even protruding through the plane [6-8].  Alignment to the electrode requires wire geometry specimens, a precision stage and long range microscopes, but substantial field enhancement is possible, even while using relatively large apertures (~ 1mm) which minimizes the chance of damage to the electrode during specimen fracture events.  For a ~ 1mm aperture in a disc electrode, the field enhancement is ~25% less than a local electrode and simulations show it is insensitive to specimen penetration distance (Figure 2) [9]. 

Achieving the highest data quality and highest throughput in an atom probe substantially complicates design requirements.  A variation of the flat disk counter electrode approach removes the requirements of a precision stage, flexible connection to the cryogenic system and sophisticated alignment microscopes by doing ex-situ alignment of a disk electrode with the specimen.  Although still requiring a wire geometry specimen, such a system could have a directly couple cryogenic system and could take advantage of the substantial field enhancement, wide field of view, and relatively high data quality when compared to previous generation atom probe microscopes.  This work presents our current advances in simplification of electrode geometries for atom probe and the performance associated with such designs.

[1]    T.F. Kelly, D.J. Larson, Mat. Char. 44 (2000), p. 85.
[2]    J. H. Bunton et al., Micro. Microanal. 13 (2007), p. 418.
[3]    D. J. Larson et al., Appl. Surf. Sci. 94/95 (1996) p. 434.
[4]    O. Nishikawa, M. Kimoto, Applied Surface Science 76/77 (1994), p. 424.
[5]    T. F. Kelly et al., Micro. Microanal. 10 (2004), p. 373.
[6]    S. S. Bajikar et al., Appl. Surf. Sci. 94/95 (1996) p. 464.
[7]    M. Huang et al., Ultramicroscopy 89 (2001), p. 163.
[8]    R. Schlesiger, et al., Review of Scientific Instruments, 81 (2010), p. 043703.
[9]    R. Gomer, in “Field Emission and Field Ionization” (AIP, New York) (1993), p. 45.

Acknowledgements

Thanks are due to the entire engineering team at CAMECA for assistance in preparing this abstract.  


Robert ULFIG (Madison, USA), Dan LENZ, Joseph BUNTON, Mike VANDYKE, David LARSON
08:00 - 18:15 #6132 - IM05-295 Including the effects of atomic bonding in TEM and STEM image simulations.
IM05-295 Including the effects of atomic bonding in TEM and STEM image simulations.

Most of the software used to simulate TEM/STEM images completely neglects interatomic interactions in the sample and thus leaves out the effects of charge transfer and chemical bonding. The effect of these interactions on the image is generally small compared to the total charge density, but essential to understanding many important properties of materials. These interactions are especially important for fully quantitative interpretations of TEM/STEM images of certain sample types such as bulk oxides because of the strong ionic bonds, and 2D materials composed of light elements since most of the electrons are involved in bonding. In order to accurately simulate TEM/STEM phase images of these and other such materials, we have employed the CASTEP [1] code to generate accurate projected potentials which take into account both intra- and interatomic electron interactions. CASTEP uses density functional theory (DFT) to calculate electron densities, which are directly related to the electrostatic potential via Poisson's equation. These potentials are then used to calculate the projected potentials for use in multislice algorithms to simulate TEM/STEM images. We have added to the functionality of CASTEP so that these projected potentials can be obtained directly from the software, thus allowing us easy and accurate simulation of images with bonding effects included which enables accurate interpretation of experimental images of materials, such as h-BN. Although a similar approach has been used by Kurasch et al. who obtained projected potentials by post-processing output from the WIEN2k software [2], no one, to our knowledge, has done this with a code which benefits from the use of pseudopotentials such as CASTEP.

[1]  S. J. Clark et al.  First principles methods using CASTEP. Zeitschrift fuer Kristallographie, 220(5-6):567-570, 2005.

[2] Simon Kurasch et al.  Beilstein J. Nanotechnol., 2:394-404, 2011.

[3] The authors gratefully acknowledge funding from the EPSRC under grant number EP/LO15722/1.


Timothy NAGINEY (Oxford, United Kingdom), Peter NELLIST, Rebecca NICHOLLS, Jonathan YATES
08:00 - 18:15 #6139 - IM05-297 Accurate and fast electron microscopy simulations using the open source MULTEM program.
IM05-297 Accurate and fast electron microscopy simulations using the open source MULTEM program.

The most practical method for TEM image simulations is the multislice method, which is known to be an accurate numerical procedure for solving the quantum mechanical electron-specimen interaction. Although most simulation codes treat the scattering process as purely elastic and coherent, inelastic scattering cannot be neglected and it has to be included in realistic simulations. Inelastic phonon scattering is often incorporated by using the frozen phonon model [1, 2] and the electronic excitations by using the density matrix approach [3, 4]. Nowadays, new computer technologies allow us to perform large TEM calculations with inclusion of accurate approximations of the electron-specimen interaction in an acceptable amount of time.

A general overview of the MULTEM program along with a number of examples has been reported in [5]. In this work we present a new version of the open source MULTEM program, which adds key features including a graphical user interface, tapering truncation of the atomic potential, CPU multithreading, single/double precision calculations, STEM simulations using experimental detector sensitivities, ISTEM simulations, EFTEM simulations, STEM-EELS simulations along with other improvements in the algorithms. A screenshot of the user interface is shown in Fig. 1. This figure shows the main available options of the program. In Fig. 2, a simulated HRTEM image and ED pattern of an isolated gold nanoparticle of 21127 atoms are shown. In these simulations, plane-wave illumination is assumed with the following electron microscope setting: acceleration voltage (300 keV), spherical aberration (0.002 mm), defocus (19.8 Å), defocus spread (30 Å) and beam divergence angle (0.1 mrad). A numerical real space grid of 4096x4096 pixels has been used. The frozen atom simulation is performed by using the Einstein model with 200 configurations, slice thickness of 0.5Å and the three-dimensional rms displacements of all the atoms are set to 0.085Å. For the HRTEM simulation, the spatial and temporal incoherences are included by applying the partially coherent microscope transfer function to each exit wave of the frozen atom. A multislice simulation of each frozen atom configuration only took 2.6 s on a Nvidia GeForce GTX TITAN GPU card.

The MULTEM's C++ classes, Matlab mex functions and the GUI are available in the GitHub repository https://github.com/Ivanlh20/MULTEM.

References

1. E.J. Kirkland. Springer, New York and London, (1998).

2. D. Van Dyck. Ultramicroscopy 109, 677(2009).

3. L.J. Allen and T.W. Josefsson. Physical Review B 52, 3184 (1995).

4. J. Verbeeck, P. Schattschneider, and A. Rosenauer. Ultramicroscopy 109, 350, (2009).

5. I. Lobato and D. Van Dyck.  Ultramicroscopy 156, 9 (2015).

 Acknowledgement

The authors acknowledge financial support from the Research Foundation Flanders (FWO,Belgium) through project fundings (G.0374.13N, G.0369.15N and G.0368.15N). The research leading to these results has also received funding from the European Union Seventh Framework Programme [FP7/2007- 2013] under Grant agreement no. 312483 (ESTEEM2).


Ivan LOBATO (Antwerpen, Belgium), Sandra VAN AERT, Johan VERBEECK
08:00 - 18:15 #6164 - IM05-301 Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM).
IM05-301 Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM).

The performance of catalyst nanoparticles is generally dependent on their size, shape, strain, composition and support. However, the relationship between these parameters and the catalyst performance is not well understood. In most instances, the catalyst design process involves several design and testing iterations until the desired performance is attained, and identifying the structure-property relationships would enable rational catalyst design. In order to relate the nanoparticle properties to catalytic activity, it is necessary to characterise them at atomic resolution.

With aberration corrected STEM it is now possible to image and perform spectroscopy on nanocatalysts at high resolution to obtain detailed structural and compositional information. Here we show how experiment design including detailed calibration of imaging and spectroscopy parameters can reveal the required information, using Ru, Pt and alloyed Pt-Co catalyst nanoparticles as examples.

As a first example, structural studies of Ru nanoparticles, using methods recently developed[1]–[3], indicated the formation of thin Ru rafts (Figure 1). The formation of Ru rafts has been controversial since their hypothesis[4]. These results demonstrate how quantitative ADF imaging can be used to resolve this question.

Using a new detector mapping technique developed at Oxford University, a range of Pt nanoparticles were characterised for their three dimensional structure (Figure 2). The models, created using an energy minimisation approach previously described in ref [3], indicate a Wulff-like structure. We will show how these models can be used as input for density functional theory simulations, thus unlocking the possibility to study the electronic structure of experimental catalyst nanoparticles.

It is important to increase analysis throughput by software automation [3] in order to gain statistically meaningful results.  In Figure 3 a rapid particle size measuring algorithm was used to measure the size distribution of Pt and Pt-alloy nanoparticle systems. The size distribution can then be used as a guide for the microscopist to selectively choose nanoparticles which represent the particle ensemble.

Finally, experiment design and preliminary EDX and EELS results at high resolution will be presented. This approach aims to decouple composition and thickness effects in order to obtain structural information of alloyed nanoparticles.

References

[1]         H. E, K.E. MacArthur, T.J. Pennycook, E. Okunishi,  A. J. D’Alfonso, N.R. Lugg, L.J. Allen, P.D. Nellist, Ultramicroscopy 2013, 133, 109.

[2]         S. Van Aert,  A. De Backer, G.T. Martinez, B. Goris, S. Bals, G. Van Tendeloo,  A. Rosenauer, Phys. Rev. B - Condens. Matter Mater. Phys. 2013, 87, 064107.

[3]         L. Jones, K.E. MacArthur, V.T. Fauske, A.T.J. Van Helvoort, P.D. Nellist, Nano Lett. 2014, 14, 6336.

[4]         E.B. Prestridge, G.H. Via, J.H. Sinfelt, J:Catal. 1977, 50, 115.


Aakash VARAMBHIA (Oxford, United Kingdom), Lewys JONES, Annick DE BACKER, Vidar FAUSKE, Sandra VAN AERT, Dogan OZKAYA, Sergio LOZANO-PEREZ, Peter NELLIST
08:00 - 18:15 #6168 - IM05-303 The inverse problem of quantitative emission electron microscopy with account of distribution of the electron energy.
IM05-303 The inverse problem of quantitative emission electron microscopy with account of distribution of the electron energy.

In emission electron microscope (ЕЕМ) energy distribution of emitted electrons can significantly affect the image contrast of microfields. This influence is the more the less energy of emitted electrons in volts differs from the residual of potentials of effective microfields. As usual it is accomplished in threshold photoelectron emission. Analytically this objective was solved for cases of contrast formation in EEM with using aperture or without that one. Determined from the obtained formulas and measurements built-in potential between Ag particles (thickness 30 nm, lateral size 20×20 µm2) and Si(100) substrate is 0.7 eV. Calculation shows that this value is two times higher without accounting of photoelectrons energy distribution (high pressure mercury lamp was used for excitation).

Remarkable that the expression for correction that appeared in energy distribution of electrons emitted from the sample coincides with contrast defocus formula. It means that some initial energy of emitted electrons is equivalent to image defocus and thus can be compensated by some refocusing of images.


Sergej NEPIJKO (Mainz, Germany), Gerd SCHÖNHENSE
08:00 - 18:15 #6217 - IM05-305 Molecular Salad: multi-slice simulation of particles for cryo-TEM.
IM05-305 Molecular Salad: multi-slice simulation of particles for cryo-TEM.

The combination of counting, direct electron detectors, such as the DE-20, Gatan K-2, and FEI Falcon 3 and Bayesian maximum-likelihood reconstruction tools embodied by Relion and Frealign, have revolutionized the technique of single particle analysis in cryo-TEM. Only a handful of years before, 10 Å results from film or scintillator-coupled CCDs represented the state-of-the-art. At present, many structures are being published with resolutions of 3 Å and the current world record stands at 2.2 Å.


However, many of the physics assumptions that are used throughout cryo-TEM are left-over from the previous, low-resolution era. In particular, the Weak-Phase Object (WPO) approximation is widely used, in that all reconstruction tools back-project 2D projections to a 3D map of electrostatic potential using the Central Projection Theorem (CPT). The WPO approximation is much poorer at higher spatial frequencies, in particular when resolution exceeds inter-atomic spacing and/or high electron wavefront curvature is present in the projection system optics. Thus to proceed to further improved resolution with confidence the accuracy of the underlying physics assumptions must be assessed.


Results will be presented from a plug-in for C. Koch’s QSTEM multislice simulation package, called Molecular Salad (MS). MS can take a structure from the Protein DataBank (PDB), randomly orientate it, merge the particle with a vitreous ice matrix, determine the exit-wave function by multi-slice, and then apply an aberration waveplate up to spherical aberration (C3). Many particle groups are generated by a multi-processed approach, which permits generation of thousands of synthetic particles that may be reconstructed by Relion or similar packages for independent verification of techniques. Multislice-simulated particles can also have simulated radiation damage using B-factors in the same code that is typically used for thermal diffuse scattering for phonon calculations. 


In Fig. 1 the Fourier Ring Correlation (FRC) is shown between the projected potential (i.e. WPO) and the multislice Exit Wave Function (EWF) averaged over many random orientations of protein 2QI9. The shaded area represents the range of correlations over different angles. The correlation between the WPO and the EWF rapidly drops, being approximately 0.6 at 2.0 Å and negatively correlated at 1.0 Å resolution. This suggests strongly that the current generation of CPT backprojection algorithms will not suffice for sub-2.0 Å resolution. Examples are shown in Fig. 2 of a 2QI9 particle, and in Fig. 3 the same particle with 1 µm defocus. Especially large defocus values require special treatment of aliasing that occurs when high curvature phase-plates are applied.


The limits to resolution in single particle analysis are also thought to include the uncertainty in defocus. The ensemble average defocus is estimated from entire micrographs, but particles are embedded at different heights in the ice block which can generate a per-particle defocus error of ± 50 nm. With simulated particles this effect can be tested. The introduction of reliable simulation into the field of single particle analysis would be a valuable addition to the field for validation of algorithms.


Robert MCLEOD (Basel, Switzerland)
08:00 - 18:15 #6248 - IM05-307 Optimal detectability combined with picometre range precision to position light atoms from HR STEM images.
IM05-307 Optimal detectability combined with picometre range precision to position light atoms from HR STEM images.

In the past few years a lot of research has been done to improve the imaging power to detect light atoms like oxygen, lithium, and hydrogen, since they play a key-role in interesting industrial applications such as lithium-batteries or hydrogen-storage materials. Since material properties crucially depend on the exact atomic arrangement, an estimation of the atomic column positions with picometre range precision is needed, which is feasible using HR STEM [1]. It is investigated if a single optimal design can be found to both detect and position light atoms. The principles of statistical detection theory [2] are used to quantify the so-called probability of error Pe, in a binary hypothesis test. Pe can be computed using realistic simulations to describe the experimental images [3] and can be used to optimise the experimental settings for the detection of light atoms from HR STEM images, as shown in [4]. To determine the optimal experiment design to position light atoms, use is made of the concept of Fisher information. The attainable precision with which unknown continuous structure parameters can be estimated is given by the lower bound on the variance with which an unknown parameter can be estimated from a set of observations, which is given by the so-called Cramér-Rao Lower Bound (CRLB) [5]. The optimal statistical experiment design of a HR STEM experiment for positioning light atoms is given by the microscope settings that minimise this CRLB. For both research questions, it will not only be investigated where in the detector plane the most sensitive region is located, but moreover, precise optimal inner and outer STEM detector angles can be derived quantitatively. The ultimate goal is then not to achieve optimal visual interpretability, but to obtain quantitatively the optimal experiment design for which the unknown structure parameters are obtained with the highest possible precision.

To illustrate the concept, the problem of suggesting optimal detector settings to detect and position the oxygen atoms in SrTiO3 is considered, as well as detecting and positioning the lithium atoms in LiV2O4. A 4.66nm thick LiV2O4 crystal is therefore simulated for an incoming electron dose of 105e-/Ų, and a 1.95nm thick SrTiO3 crystal is simulated, using an incoming electron dose of 104e-/Ų. For the detection problem, a binary hypothesis test is performed where both hypotheses correspond to either the presence or absence of the oxygen or lithium atoms in the crystal. Pe is computed as a function of the STEM inner and outer detector angles of which results are shown in Fig.1(a) for SrTiO3 and in Fig.1(b) for LiV2O4. For the positioning problem, the CRLB is computed as a function of the STEM inner and outer detector angles of which results are shown in Fig.2(a) for SrTiO3 and in Fig.2(b) for LiV2O4. The same optimal detector angles for the detection and positioning problem are found, which lie in the low angle ADF STEM regime for both applications, for a probe semi-convergence angle of 21mrad. To detect and position oxygen in SrTiO3, the optimal detector range is 21-100mrad, while for the detection and positioning of Li in LiV2O4 the optimal detector settings are 23-26mrad.

In conclusion, it is demonstrated that the experiment design can be optimised in order to detect and position light elements with the highest possible precision. Consistent optimal designs are found for both problems. It can be shown that picometre range precision is feasible for the estimation of the atom positions using an appropriate incoming electron dose at the optimal experimental settings to detect the light atoms.

 

[1] S. Van Aert, et al., Ultramicroscopy 90 (4) (2002) 273–289.

[2] S. M. Kay, Fundamentals of Statistical Signal Processing. Volume II Detection Theory, Prentice-Hall, Inc., New Jersey, (2009).

[3] A. Rosenauer and M. Schowalter, Springer Proc. Phys. 120 (2007) 169–172.

[4] J. Gonnissen, et al., Applied Physics Letters 105:6 (2014).

[5] A. J. den Dekker, et al., Ultramicroscopy 134 (2013) 34–43.

 

The authors gratefully acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0368.15N, G.0369.15N and G.0374.13N) and a post-doc grant to A.D.B. The research leading to these results has received funding from the European Union Seventh Framework Programme [FP7/2007-2013] under Grant agreement no. 312483 (ESTEEM2). 


Julie GONNISSEN, Annick DE BACKER, Arnold Jan DEN DEKKER, Jan SIJBERS, Sandra VAN AERT (Antwerp, Belgium)
08:00 - 18:15 #6260 - IM05-309 Quantitative Stage Mapping of a Zircon grain by WDS on an SEM.
IM05-309 Quantitative Stage Mapping of a Zircon grain by WDS on an SEM.

Because of the effects of Bragg defocusing, accurate quantitative analysis by WDS can only be done with the electron beam in “spot mode” and with samples at the proper analytical working distance. As a result, WDS X-ray mapping in the SEM has only achieved simple raw counts mapping of a single element by rastering the beam over the sample. More complicated WDS X-ray mapping (quantitative or otherwise) has been relegated to the electron microprobe. However, modern SEMs and WDS systems permit quantitative WDS mapping in which a complete WDS quantitative analysis, including background and Φ(ρz) corrections, is done at each pixel. Here, we use WDS quantitative analysis to map the concentration of Hf in a zoned zircon grain. Zircon has emerged as the most critical geochronological tool in the earth sciences. These tiny crystals are truly zircon-halfnon solid solutions and typically contain 10’s of thousands of ppm Hf. Zr/Hf ratios are used as an index of magma evolution and Hf isotopes in zircon are an important recent tool employed to explore magma sources and processes. The ability to map Hf concentrations in detail and to pair this data with geochronology and Hf isotopes will yield important insights into the interpretation of zircon geochronology and the magmas from which zircons crystallize.

Quantitative WDS maps were acquired using a Thermo Scientific™ MagnaRay™ Parallel beam WDS spectrometer and a JEOL JSM-7001F FE-SEM. Data were processed using the Thermo Scientific™ NORAN™ System 7 microanalysis system. The quantitative WDS map was acquired by automatically slewing the SEM stage over a 106×46 grid while keeping the beam at a fixed position. The resulting map is 106×46 pixels with a 2 µm resolution. All measurements were made using a 15 kV beam accelerating voltage and a focused electron beam that was set to 206 nA at the beginning of the run. The beam current was measured at the beginning of each analysis.

Standardization was done using a Hf-bearing zirconia (for Hf Mα and Zr Lα) and quartz (for Si Kα) on a commercially prepared (SPI), carbon coated mineral standards mount. The O concentration for each analysis was calculated by stoichiometry.

The zircon sample was picked from a granite from the Cretaceous Cadiz Valley Batholith in the central Mojave Desert. This grain was mounted in epoxy, polished, and carbon coated. SIMS geochronology and spot trace element analyses were previously conducted on two spots on the grain (Economos, pers. comm.) constraining absolute Hf concentrations and indicating that there are trace or minor concentrations of the REEs, Th, and U, which were not included in these analyses and explain the resulting somewhat low analytical totals.

For unknown and standard analyses, Si Kα and Zr Lα were each counted on-peak for 5 s and off-peak for 2.5 s (at both low and high positions). Hf Mα was counted until the error (background corrected) from counting statistics was better than 2%, which was typically achieved after ~11 s on-peak. Off-peak measurement positions were confirmed to be free of higher order reflections or trace element peaks by inspection of WDS energy scans.

4,876 analyses were acquired, from which Zr, Si, Hf, (Fig. 1) and O quantitative concentrations maps were extracted. The maps reveal that the zircon grain is strongly zoned with respect to the Hf concentration.

The full range of WDS mapping (raw counts, net counts, and quantitative) is now available to the SEM user. Additionally, an EDS spectrum could be concurrently acquired with the WDS measurements, meaning that any arrangement of EDS or WDS standards-based, quantitative stage maps could be extracted. For example, when mapping zircon, Zr and Si could be mapped with EDS and trace elements (e.g., Hf) could be mapped with WDS.

[1] PK Carpenter, SN North, BL Jolliff, and JJ Donovan, Lunar Planet. Sci. Conf. 44 (2013) p. 1827.


Steve SEDDIO, Keith THOMPSON (Madison, WI, USA)
08:00 - 18:15 #6261 - IM05-311 Analysis of Food Packaging Layered Polymers by SEM/EDS and Raman.
IM05-311 Analysis of Food Packaging Layered Polymers by SEM/EDS and Raman.

Food packaging can consist of many layers of materials each engineered for different purposes. The layers may be very thin, in some cases much less than one micron. Principally composed of polymers layers may be composed of inorganics and inorganic particles may be embedded by design or as artifacts. Analysis for quality assurance or failure analysis is difficult due to the complex nature of the sample.

Raman can easily identify the polymers used in these products. Raman mapping has a resolution of one micron or better. SEM imaging easily achieves a resolution of ten nanometers and can distinguish different polymers by their appearance in electron imaging. EDS achieves a spatial resolution of a few tens of nanometers. It can identify all elements present here except hydrogen.

Together these techniques provide complementary information. In addition imaging and elemental mapping with SEM/EDS may be faster than Raman mapping.

For this work a JEOL JSM-7610F FESEM equipped with a Thermo Scientific NS7 EDS analyzer and 60mm2 area Ultradry silicon drift detector were used for the SEM/EDS data. A Thermo Scientific DXRxi Raman spectrometer with optical microscope was used for the Raman spectroscopy.

The SEM conditions were 10 kV acceleration voltage and about 3 nA beam current.

The sample used here is a cross section of a commercially available potato chips bag. The sample was sectioned by a fresh razor blade. For SEM/EDS the sample was carbon coated.

Figure 1 compares the results from both SEM/EDS and Raman. In this view the interior of the package is towards the top of the image. The right image shows a Backscatter Electron (BSE) image of the cross

section overlaid by elemental maps for Al, Ti, Si and O. Twelve layers were identified by inspection ranging from about 25 microns to approximately 175 nm thick. Some are not visible at this low magnification view. An Al layer about 200 nm thick was seen. A 175 nm thick layer containing S and Cl was found (not shown in the figure). Several layers contained Ti rich particles. Some particles of silicon oxide, possibly artifacts, were seen. The live time for this map was 931 seconds.

The image at left in Figure 1 shows the results of the Raman mapping analysis. The identified polymers layers and their thicknesses are labeled. In general the two techniques agree well on the overall composition of the sample. The Raman analysis identifies the polymers making up each of the layers which was not possible by SEM/EDS. It also found the inorganic rutile particles embedded in some of the layers. It did not find any of the sub 200 nm layers seen in the SEM.


John KONOPKA, Keith THOMPSON (Madison, WI, USA)
08:00 - 18:15 #6334 - IM05-313 Characterization of the NiBe nanoprecipitates in CoCr superalloys.
IM05-313 Characterization of the NiBe nanoprecipitates in CoCr superalloys.

Cobalt based superalloys were developed for applications in high temperature, corrosive environments and for bio-implants such as orthodontic devices. CoCrNi alloys have an FCC structure and excellent mechanical properties and their high strength is obtained through a combination of solid-solution and precipitate strengthening. As such, these alloys are primarily Co with 15-20 wt.% Ni and 15-20 wt.% Cr and contain a cocktail of additives composing of Fe, Ti, W, Mo, and C. Some alloys contain a small amount of Be which is thought to improve mechanical properties via solid-solution strengthening mechanisms. In copper based alloys, Be additives are well-known to precipitate into GP zones and improve mechanical propertiesvia precipitate hardening mechanisms. Beryllium having a low solubility in most alloys and an affinity to form intermetallic compound, especially with Ni and Ti [1], and thus secondary precipitation of the Be intermetallics in cobalt superalloys is likely. So the question arises, whether the observed improved mechanical results from GP zone and precipitation hardening rather than the assumed solid-solution solute strengthening.

Using aberration corrected STEM and HR-STEM EDS, we have characterized wrought and overaged alloys and find that Be forms GP zones and Ni-Be B2 intermetallic precipitates. These alloys contain roughly 1 at. % Be, and thus detecting its presence in solid-solution or within precipitates, especially those containing Ni, is challenging. Beryllium cannot be detected with EDS X-ray analysis nor can it be detected with EELS if the precipitates contain large concentrations of Ni as the K edge of Be overlaps with the M edges of Ni. HAADF-STEM images (Fig. 1 A)) are indirect proof and suggest that Be forms intermetallic precipitates with Ni that have a much lower intensity compared to the matrix material, which is primarily Co, Ni and Cr. The EDS maps in Figure 1 confirm that the precipitates primarily contain Ni and thus should have similar Z contrast and intensity as the matrix, though it does not. The precipitates must have a high concentration of lighter Z element, the only one having an affinity to form compounds with Ni and Co is beryllium. Furthermore, we have directly confirmed the presence of beryllium using a special imaging technique, integrated differential phase contrast imaging (IDPC), that is shown in Figure 2 B) [2]. IDPC images are generated using a segmented ADF detector and by integrating the 2 components of the center of mass (COM) of the image given by the momentum transfer of electron probe to the specimen. The resulting image from the integration of the differential COM signals gives a direct map of the associated phase shift due to the interaction of the probe with the sample and thus maps both Be and Ni atoms. Using IDPC is an easy method for directly visualizing Be in the precipitates.

Crystallographic analysis of the precipitate’s orientation using aberration corrected (AC) STEM images (Figure 2 C) ) suggests that they have a Kurdjomov-Sach relationship ({110}BCC/{111}FCC). Though the precipitates differ in orientation relationship with those previously observed in Ni-Be alloys[1], their measured lattice constants (0.262 nm) and ordered B2 structure are the same. The coherency strain can be easily observed in the IDPC image in which the first two lattice planes are compressed by ~1% along the <211> direction. In the wrought alloys, we observe Guinier-Preston (GP) zones with similar orientation relationships as observed in the overaged material. The GP zones generate a large coherency strain along the <211> direction as seen in the ADF-STEM images (Figure 3 B). The GP zones grow along three <111> matrix directions, two that lie in the [110] Z.A. and one on an inclined plane. Using the strain contrast in the ADF images to locate the GP zones in a thin region of the foil, we can observe their size and structure in AC-HAADF STEM images. The GP zones are small being only 1 monolayer thick and are elliptically shaped with the major axis being 20-30 nm. The atomic column intensity of the GP zone is much lower than the matrix and similar to what was observed in the overaged precipitates. Though beryllium cannot be directly detected, it can be inferred that the GP zones contain Be from the analysis of the overaged precipitates. It can be speculated that the nanoprecipates form via the ripening of GP zones, and beryllium being observed in them is  the first direct link that the improved mechanical properties may result from precipitation hardening rather than the perceived solid-solution mechanism.

[1]        Z. Liu, Y. Y. Cao, and D. Feng, "The Microstructure of the Precipitates in a Ni-Be Alloy wiht Atom-Probe FIM," Journal de Physique Colloques, vol. 48, pp. C6-343-C6-348, 1987.

[2]        I. Lazić, E. G. T. Bosch, and S. Lazar, "Phase contrast STEM for thin samples: Integrated differential phase contrast," Ultramicroscopy, vol. 160, pp. 265-280, 1// 2016.


Thomas LAGRANGE (Lausanne, Switzerland), Raffaele COSIMATI, Sorin LAZAR, Daniele MARI
08:00 - 18:15 #6351 - IM05-315 Where does the FIB sputtered matter accumulate in the SEM chamber ?
IM05-315 Where does the FIB sputtered matter accumulate in the SEM chamber ?

Scanning electron microscopes (SEM) equipped with focused ion beam (FIB) column are nowadays dual platform instruments commonly used in various micro sample preparation processes. While the mainstream of FIB usage remains within the semiconductor industry, it has expanded to a wide range of materials in metallurgical research. In particular, FIB milling capabilities are today used in the area of advanced materials for nuclear applications, involving in most cases the manipulation of activated samples. Sputtering of radioactive materials is far from trivial and numerous questions remain still open to guarantee the user safety even if small volumes of matter are generated by FIB milling [1]. For instance, where does the FIB sputtered matter accumulate in the SEM chamber?

Angular distributions of FIB sputtered atoms have been investigated for 0°, 30° and 54° ion beam incidence. FIB patterns have been milled on a nanocrystalline Nickel alloy using a 30 keV Ga+ ion bombardment in a scanning electron microscope (Fig 1a). Sputtered matter is collected on a silicon planar collector. The thickness of the deposit on the collector is measured by means of Z-contrast imaging and two dimensional spatially resolved thickness maps are drawn (Fig 1b and Fig 1c). Angular distributions of sputtered atoms, in a plane containing the primary ion beam, are deduced from the maps (Fig 3). Our experimental data show that, at oblique incidence, sputtering matter is emitted in two main emission directions, normal to the target surface and towards the FIB column. For normal incidence, all the sputtered matter is projected towards the FIB column. The microstructure of the deposit, at normal incidence, has been studied by Transmission Electron Microscopy and Atom Probe Tomography (Fig 2).

[1] Contamination analysis of radioactive samples in focused ion beam instruments A.R. Evelan, Richard R. Brey, Health Phys. 104, 2 Suppl 1(2013) S23-30


Emmanuel CADEL (ST ETIENNE ROUVRAY CEDEX), Fabien CUVILLY, Charly VAUDOLON, Auriane ETIENNE
08:00 - 18:15 #6381 - IM05-317 Simulation of elastic and inelastic electron scattering in EF-HRTEM mode by back-propagation of electron beam.
IM05-317 Simulation of elastic and inelastic electron scattering in EF-HRTEM mode by back-propagation of electron beam.

In this work we present a new approach for simulation of energy-filtered HRTEM images by back-propagating the electron beam. Here, the back-propagation means that we consider the fast electrons going in the opposite way through the microscope: from a detector through a specimen, where they undergo an energy-gain process, and then they continue to the source. We show that this time-reversed approach is computationally feasible and can bring consistent results. In this new approach, real collection angle becomes a convergence angle of the simulated probe and the real convergence angle becomes the simulated collection angle, as shown in the scheme below. In this new simulation setup we use small collection angles in order to mimic nearly parallel illumination in HRTEM. The “probe”, on the contrary, has a large convergence angle, because for HRTEM image simulation wide objective apertures are used. The contrast transfer function of the imaging system is inverted by changing the sign of aberrations. This reciprocal approach is well suited to generalize the in-house code developed for energy-filtered STEM simulations using combined Multislice/Bloch-waves approach [1]. We can now switch between different simulation modes, e.g., energy-filtered TEM and STEM, by employing different sets of parameters in the code. It allows to avoid multiple multislice evaluations at each atom position, instead it requires separate calculation for each pixel of the desired EF-HRTEM image, which is often a smaller computational cost. The mathematical proof of the concept will be outlined. Simulated energy-filtered HRTEM images of selected materials, such as STO or LSMO based on this approach will be presented as well.

[1] J. Rusz, S. Bhowmick, M. Eriksson, N. Karlsson, Phys. Rev. B 89, 134428 (2014).


Dmitry TYUTYUNNIKOV (Uppsala, Sweden), Axel LUBK, Jan RUSZ
08:00 - 18:15 #6493 - IM05-319 Correlation of interface morphology and composition in GaInP/GaAs with growth conditions.
IM05-319 Correlation of interface morphology and composition in GaInP/GaAs with growth conditions.

Ternary (GaIn)P materials ststems grown on GaAs have attracted a lot of attention for laser applications, especially due to the low recombination velocities at the interface [1]. The physical properties of the interface are greatly influenced by the interface morphology, which can be controlled by either the growth temperature or growth interruptions or the introduction of interlayers, consisting e.g. of GaP. The interface morphologies of the semiconductor quantum wells can be characterized by the quantitative evaluation of high resolution high angle annular dark field (HAADF) images in scanning transmission electron microscopy (STEM). In the present work, quantitative evaluation of HAADF imaging in STEM is used to correlate the interface morphology and composition in (GaIn)P grown on GaAs with the growth conditions.

 

The (GaIn)P/GaAs QWs were grown with metal organic vapor phase epitaxy (MOVPE) on GaAs (001) substrate at temperatures of 525°C and 625 °C, respectively, with different growth interruption times with or without GaP interlayer. In order to be able to compare different samples, a carefully applied method to gain reliable results from high resolution STEM micrographs was used. Also, to derive the chemical composition maps, the chemical sensitive background intensity is subtracted after image normalization as shown in Figure 1. From the composition maps, the interface features are revealed and then correlated with the growth conditions. The growth interruptions can significantly affect the composition fluctuation and the interface morphology. At higher temperature of 625 °C, with the two GaP monolayers between (GaIn)P and GaAs substrate, shorter growth interruption time leads to intermixing at the interface while a longer growth interruption results in a sharp interface. Also, without the GaP buffer layer, platelet islands can be observed at the interface. At lower temperature of 525 °C the GaP buffer layer has less influence. Hence, the quantitative evaluation of HAADF STEM images can reveal the interface morphologies, which also have important influence on the optoelectronic properties.

Acknowledgement

We gratefully acknowledge financial support of the DFG in the frame work of SFB1083.

References

[1] J.M. Olson, R.K. Ahrenkiel, D.J. Dunlavy, B. Keyes and A.E. Kibbler, Appl. Phys. Letters 55 (1989)


Han HAN (Marburg, Germany), Andreas BEYER, Jürgen BELZ, Alexander KÖNIG, Wolfgang STOLZ, Kerstin VOLZ
08:00 - 18:15 #6600 - IM05-321 Direct imaging of hydrogen atomic columns in hydride phases in titanium grade 2.
IM05-321 Direct imaging of hydrogen atomic columns in hydride phases in titanium grade 2.

Despite diligent work on titanium hydrides the crystal structures of some titanium hydride phases are still not well established. Transmission electron microscopes (TEMs) can support crystallographic data by direct imaging of unknown structures with superior resolution. Direct imaging of hydrogen atomic columns is extremely challenging due to their weak scattering. However, an introduction of TEMs with corrected spherical aberration has made such experiments feasible. In this work, direct imaging of hydrogen atomic columns in titanium hydrides was performed in order to provide additional support to incomplete crystallographic data for titanium hydrides.

 

The commercially pure titanium grade 2 annealed at 900 °C for 1 h was examined in this work. Samples for transmission electron microscopy (TEM) were prepared by mechanical grinding of 3 mm discs and subsequent thinning by twin-jet electropolishing in perchloric acid solution using Struers TenuPol-5. The titanium grade 2 contains 0.24 at.% of hydrogen, which can create hydride phases. Face-centered tetragonal γ-hydride phase was found in a lentil-like shape in the α-Ti matrix and in a shape of long thin lamellae at either the α-Ti matrix/β-Ti phase interface or originating at α-Ti matrix grain boundaries. This phase introduces hydrogen-induced diffracted reflections that do not coincide with the diffracted reflections coming from Ti atoms. For that reason, the presence of the hydrogen can be observed even using the selected area electron diffraction (SAED) technique. The hydrogen-induced reflections translate also to a phase-contrast pattern (PCP). Compared to the titanium columns, the hydrogen columns produce much broader peaks/dips that enable us to differentiate between the positions filled with hydrogen and the vacant columns in the structure.

Annular bright-field scanning transmission electron microscopy (ABF-STEM) and high resolution transmission electron microscopy (HRTEM) techniques were employed. As both techniques rely on phase-contrast imaging, they can produce imaging artifacts that can be easily mistaken for genuine structural features caused by the presence of the hydrogen. To increase robustness of our results we support them with simulations based on theoretical models of the hydrides. Multislice method was used to simulate the dynamic scattering effects. This helped us to find optimal imaging conditions with regard to resolution, maximal contrast for the hydrogen positions and the absence of imaging artifacts for a wide range of thickness and defocus values.

 

Acknowledgements:

The project was supported by GACR GBP108/12/G043.


Kamil DANĚK (Prague, Czech Republic), Viera GÄRTNEROVÁ, Martin NĚMEC
08:00 - 18:15 #6616 - IM05-323 EBSD measurements on the weld seam area of differently extruded ME21 hollow profiles.
IM05-323 EBSD measurements on the weld seam area of differently extruded ME21 hollow profiles.

The production of hollow profiles using porthole dies is a widespread manufacturing process for aluminum alloys. However, the extrusion of magnesium and its alloys into hollow profiles has not yet been established due to several reasons. One thereof is the lack of knowledge about the interdependencies between process parameters, die design and the product quality (microstructure, texture, mechanical properties etc.). Therefore, different extrusion experiments were carried out using the magnesium alloy ME21 (2.1 wt% Mn, 0.7 wt% Cer, Mg balance). For the realization of hollow profiles with varying wall thickness and thus a varying extrusion ratio (ER) a modular porthole die (Fig. 1) has been used. It consists typically of a mandrel part and a die part. The die part defines the outer shape of the extrudates and includes the welding chamber. The mandrel part consists of a mandrel that forms the inner shape of the hollow profile while the mandrel itself is kept in place by three bridges. Through the usage of three differently dimensioned mandrel parts the variation of the wall thickness (and the ER) can be done while the outer dimensions are kept constant for each profile. Extrusion ratios of ER = 8:1, 16:1 and 30:1 were applied.

During the extrusion process the billet material is split up into three separate metal streams which flow around the bridges of the mandrel part and successively weld under solid-state conditions behind the bridges in the so-called welding chamber. These welds are called longitudinal weld seams. It is known that there is an additional amount of straining of the material that forms these weld seams due to the friction. Hence, these weld seams always pose a potential anomaly when compared to the weld free material.

First analysis using polarized light-optical microscopy indicated that both sides of the weld seam (representing each metal stream) have different textures. In order to quantify that observation EBSD is the appropriate technique to gather exact information of the weld line, which displays the separating line between the two visible parts of the weld seam and of the material in the vicinity. The EBSD measurements were performed on a ZEISS DSM 982 with Gemini optic and the EDAX Hikari camera. EDAX also supplied the necessary “OIM Data collection” and “OIM Data analysis” software. The resulting maps have the dimensions of 800 µm x 650 µm with a resolution of 0.5 µm. For better focusing at low magnification and the largest aperture the samples were tilted to 67° instead of 70°. Beforehand the samples were ground with SiC abrasive paper and then polish with 6 µm, 3 µm and 1 µm diamond-based suspension following a chemical polish with CP2 agent. The IPF maps were taken at half wall thickness on a plane parallel to the profile surface.

The first EBSD measurements reveal for all extrusion ratios a pronounced weld line dividing the weld seam in two parts featuring sub-textures whereby the orientation of the {0001}-planes of one metal stream is mirror-inverted to the other. The texture is also significantly different from that of the weld free material.

In future work the focus will be among others on the die design, especially the shape of the bridges, in order to modifiy the local weld seam texture and to optimize the overall properties of the hollow extrudates.


Christoph FAHRENSON (Berlin, Germany), Felix GENSCH, Sven GALL, Dirk BERGER
08:00 - 18:15 #6803 - IM05-325 Im2Cr: An efficient tool for crystallographic indexing of HR(S)TEM images.
IM05-325 Im2Cr: An efficient tool for crystallographic indexing of HR(S)TEM images.

      Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) have been widely used to characterize nanostructured materials with atomic resolution, and significant advances on their experimental setup greatly extended the current pool of analysis possibilities at the nanoscale. The exploration of advanced (S)TEM characterization capabilities and their reproducible application to reach a suitable sampling is often restricted by the extensive data analysis procedures required to reliably interpret experimental results and to extract quantitative information. Even routine tasks such as nanoparticles crystallographic indexing from electron diffraction patterns or from high resolution (S)TEM images are mostly carried out manually by the users, resulting in a reduced TEM characterization yield and significant user bias.

      This work presents Im2Cr, a new software tool to aid the crystallographic indexing of nanostructured materials using high resolution (S)TEM images. Im2Cr implementation aims for a minimal user interaction, supporting the detection of zone-axis oriented particles, and including an efficient peak detection process applied to the images Fourier Transform (FT). With basis on the FT peaks distances and relative angles, crystallographic indexation is carried out autonomously via comparison with a list of candidate structures named by the user, and a ranking of the best matching combinations of crystallographic structures and viewing zone axes is generated.

       Im2Cr was successfully tested for robustness and execution efficiency in a wide range of High Resolution (S)TEM images from crystalline nanomaterials, with domain size ranging from 4 to 100 nm. The autonomous indexation with preset parameters has a very high success rate, and runs in a small fraction of typical (S)TEM images acquisition time by taking advantage of the inherent hardware parallelism. Alternatively, the user can operate Im2Cr in a semi-autonomous mode and control relevant parameters related to the region of interest (ROI) selection on the (S)TEM image and on the FT peaks detection.  Im2Cr promising results point to the possibility of real-time image analysis with reduced user interaction, allowing for an increased (S)TEM characterization yield and also enabling the interpretation of complex images, such as those from nanocrystalline materials imaged in high-order zone axis orientations.


André SILVA (Braga, Portugal), Enrique CARBÓ-ARGIBAY, Alberto PROENÇA, Daniel STROPPA
08:00 - 18:15 #6804 - IM05-327 Ion imaging in a Focused Ion Beam microscope: modeling the channeling contrast to construct EBSD-like orientation maps.
IM05-327 Ion imaging in a Focused Ion Beam microscope: modeling the channeling contrast to construct EBSD-like orientation maps.

Electron backscatter diffraction (EBSD) is routinely employed as a characterization tool to obtain individual grain orientations, local texture and phase identification. Efforts are currently being made to optimize the compromise between speed of indexation, spatial and angular resolution, quality of phase recognition and dimensions of the field-of-view. In this context, any new technique that can lead to a better compromise would be welcome.

With this in mind, we proposed recently the iCHORD method (for ion CHanneling ORientation Determination), aiming at constructing orientation maps based on the well-known channeling contrast phenomenon observed in a rotation series of ionic images (see figure 1) [1]. The proof-of-concept of the iCHORD method was obtained by predicting the intensity loss received by a detector for specific orientations of a crystal thanks to crystallographic calculations. However, the number of parameters to adjust when applying the technique to different materials was quite high. In order to improve the method and make it more versatile, a new modelisation of the channeling contrast is proposed in the present study.

Experimentally and theoretically, an intensity loss is observed for a crystal when the ion beam arrives parallel to some low index crystallographic planes, and particularly when the sample is in a zone axis. Therefore, if the atomic structure of the crystal is projected onto a surface perpendicular to the ion beam, an intensity loss will corresponds to large “free spaces” between the atomic columns (see figure 2). In other words, the intensity loss for a specific crystal orientation is closely related to the sum of the grey levels of the pixels constituting the projection. More quantitatively, to avoid some projection artefacts, it is necessary to adjust the number and disposition of atoms to be considered, as well as their interactions with the ion beam as a function of their depth to obtain an efficient model of the channeling effect. As the atomic positions of atoms are used, only the structure file of the material under consideration has to be provided, without specific calculations for cubic or hexagonal structures for instance. Only the parameters regarding the ponderation function have to be adjusted, which is quite straightforward, hence meeting the versatility required. In this framework, theoretical intensity profiles obtained by varying the orientation of a crystal (see figure 3) fit quite well with experimental profiles obtained by varying the sample orientation in the same way.

This improvement in the modelisation of the channeling contrast has been embedded in the workflow aiming at obtaining orientation maps without the use of the EBSD technique. Together with new developments regarding the sampling of the orientation space and the indexation algorithm, a new version of the iCHORD method is released. The impact on the angular resolution as well as speed of indexing are discussed. The benefits of using the iCHORD method in place of the EBSD technique are also summarized.

 

References:

[1] Crystal Orientation Mapping via ion channeling: an alternative to EBSD

C. Langlois, T. Douillard, H. Yuan, N.P. Blanchard, A. Descamps-Mandine, B. Van de Moortèle, C. Rigotti, T. Epicier, Ultramicroscopy 157 65-72 (2015)


Cyril LANGLOIS (Villeurbanne Cedex), Thierry DOUILLARD, Sébastien DUBAIL
08:00 - 18:15 #6806 - IM05-329 Quantitative image analysis of binary microstructures: Application to the characterisation of dairy systems.
IM05-329 Quantitative image analysis of binary microstructures: Application to the characterisation of dairy systems.

Modern microscopy devices give the possibility to obtain images of high resolution at various scales and of a large variety of samples, organisms and materials. However, the quantitative analysis of these images remains a challenge. The reasons are both the difficulty to automatically identify the structures of interest within the images and the lack of appropriate tools or methods to quantitatively describe such structures. In particular, when the structure of interest does not appear as a set of individual particles but as an interconnected network, conventional shape or size distribution analyses are no longer adapted. Examples are numerous in materials science and can be also found in other areas such as molecular biology and food science. Figure 1 shows images of dairy gels observed by transmission electron microscopy (TEM), and the result of their segmentation into two phases: the protein (dark) and the void (white) phases.

The aim of this contribution was to explore several mathematical tools to describe TEM images that can be represented by binary microstructures, and to show how they can be applied to the characterisation of dairy systems. The application to other domains of application will also be discussed.

A first group of methods is based on intrinsic volumes, which gives access to morphometric features such as boundary density, volume ratio and Euler number density. The covariance function can describe the microstructure using probabilities of inclusion within the set, and can be related to global morphometric features. The computation of granulometric curves based on mathematical morphology provides size distributions that can be interpreted as thickness distribution or as the pore size distribution (Fig. 2). The tortuosity describes the ability to travel between two points within one binary phase, and quantifies long-range morphology (Fig. 3).

In the present work, the combination of different morphometric features could discriminate TEM images of dairy systems obtained from different technological processes. More advanced descriptive features have been explored, involving modelling of aggregated particles and of diffusivity properties in the void phase of the network. 


David LEGLAND (Nantes), Juliana V.c. SILVA, Chantal CAUTY, Kolotueva IRINA, Julianne FLOURY
08:00 - 18:15 #6836 - IM05-331 The interior of the rotavirus capsid.
IM05-331 The interior of the rotavirus capsid.

Rotavirus and other double-stranded RNA viruses confine and protect their genome inside the capsid even after cell entry, hiding viral ds-RNA from the cellular immune system. Thus, Rotavirus must be able to perform transcription and replication of its packed genome within a virus core formed by viral proteins by using a complex composed by the viral ds-RNA and the RNA-dependent RNA polymerase. For transcription, the resulting mRNAs has to exit the virus through channels in the capsid protein shells. For replication, viral mRNAs must enter the newly formed particles to be used by the polymerases as templates for dsRNA synthesis.

The symmetry mismatch between the symmetric capsid and the asymmetric complex formed by the polymerase and the ds-RNA was used to reconstruct in 3D the interior of the rotavirus capsid showing for the first time how the ds-RNA is organized and how it interacts with the polymerase.

Rotavirus has eleven different ds-RNA segments and 11 to 12 polymerases inside each viral particle. Each polymerase is located underneath each one of the 12 icosahedral vertices [ref1].

The 3D reconstruction with icosahedral symmetry imposed obtained from cryo-EM images of rotavirus was used to calculate synthetic 2D projections which were subtracted from the corresponding experimental images. This allowed the in-silico isolation of the asymmetric parts of the structure by signal subtraction (Fig.4). The geometrical relationship between symmetric and asymmetric parts is known (assuming stable relative positioning) and it was is used to convert each one of the views associated to the symmetric 3D reconstruction into 12 sets of 5 views corresponding to the isolated asymmetric parts (5 views per icosahedral vertex). These 5 views were tested by projection matching [ref2] against a low-resoltuion initial model and only the view giving the highest correlation coefficient was used to reconstruct an asymmetric structure by using the sub-images without imposing symmetry.

References:

1. Estrozi, L.F. et al. Location of the dsRNA-dependent polymerase, VP1, in rotavirus particles. J Mol Biol. 425(1):124-32. (2013).

2. Estrozi LF, Navaza J. Fast projection matching for cryo-electron microscopy image reconstruction. J Struct Biol. 162(2):324-34 (2008).


Leandro F. ESTROZI (Grenoble Cedex 9)
08:00 - 18:15 #6845 - IM05-333 High Resolution Scanning Electron Microscopy study of Au nanocrystals on Si nanowire surfaces.
IM05-333 High Resolution Scanning Electron Microscopy study of Au nanocrystals on Si nanowire surfaces.

Nanowires (NWs) are a typical example of nano-objects that can be functionalized in order to obtain multiple applications: transistors, solar cells, lasers, gas sensors ... Moreover, Park et al. [1] showed that silicon NWs coated by gold nanocrystals (NCs) may be used in photothermal therapy in vivo where cancer cells are captured and destroyed. By controlling the size and the density of the superficial gold NCs population one can obtain a sufficient plasmon coupling and thus achieve an even unprecedented efficiency. The development, control and optimization of these functional nanomaterials therefore require advanced characterization tools able to quantify these nano-object populations. In this context, TEM has remained for decades the only imaging technique with sub-nanometer resolution. But the small fraction of the analyzed region with respect to the sample size makes it difficult to obtain representative measurements from a statistical point of view. On the other hand the high resolution achieved by modern SEMs allows them to compete clearly with TEM.

 

In a previous work [2], we showed the first results obtained with a Zeiss Gemini 500 ultra-high resolution FESEM just installed in CP2M at the Aix-Marseille University. By combining low kV In-lens SE and Energy Selective Backscattered (EsB) imaging to EBSD and Annular BF-DF-HAADF-STEM, we demonstrated the possibility of obtaining, in the same instrument, topographical, chemical and structural information from the same NW with a resolution as good as the STEM-HAADF one [3].

 

Figures 1 and 2 show examples of In-Lens SE images obtained at 1kV on a MBE Si NW grown on Si(111) with Au as catalyst. The saw-tooth faceting of one over two faces of the NW is visible with high resolution. Furthermore, one can see that it is also possible to resolve nanometric gold nanocrystals and their non-homogeneous repartition onto the different surfaces.

 

The outstanding quality of this SE image, with a high signal to noise ratio, demonstrates not only the possibility to image these nano-objects but also to quantify them. Indeed, we will show that coupling low kV mode to image processing and analysis allows studying the nanometric object population with a resolution better than one nanometer, i.e. even better than the nominal resolution of this microscope at this acceleration voltage.

 

This methodology can be applied to perform a systematic study of the distribution of gold NCs on the substrate and on different facets of the nanowires, and can be extended to any problem involving nano-objects quantification.

 

 

References:

[1] G-S. Park et al., Full Surface Embedding of Gold Clusters on Silicon Nanowires for Efficient Capture and Photothermal Therapy of Circulating Tumor Cells, Nano Lett. 12, (2012) 1638−1642. DOI: 10.1021/nl2045759

[2] C. Alfonso et al., Low kV high resolution Scanning Electron Microscopy study of silicon nanowires surfaces

Microscopy and Microanalysis, 21 (Suppl.3) (2015) 1261-1262. DOI: 10.1017/S1431927615007096

[3] T. David et al., Gold coverage and faceting of MBE grown silicon nanowires, J. Cryst. Growth 383 (2013) 151-157. DOI: 10.1016/j.jcrysgro.2013.08.023


Claude ALFONSO (Marseille), Andrea P.c. CAMPOS, Christian DOMINICI, Sidnei PACIORNIK, Luc ROUSSEL, Loïc PATOUT, Lyuang HAN, Fang ZHOU, Ahmed CHARAÏ
08:00 - 18:15 #6864 - IM05-335 Nano-scale strain measurements from high-precision ADF STEM.
IM05-335 Nano-scale strain measurements from high-precision ADF STEM.

    High-resolution annular dark-field imaging in the scanning transmission electron microscope (ADF STEM) offers a powerful and readily interpretable mode for materials analysis at the atomic scale. However, like all serial (scanned) imaging techniques subtle disturbances in the instrument’s surroundings can lead to deleterious artefacts in the recorded data. Recent developments in non-rigid registration of multi-frame data allows a route to mitigate these scanning errors [1] and obtain accurate strain information in the STEM [2].

    Here we make use of these new multi-frame techniques, but go further and use experiment design to optimally fractionate an allotted total electron-budget to achieve maximum precision. For the conditions used this occurs at around 20-25 ADF frames. Using these optimised conditions we record data from two specimens as proof-of principle examples; a rod-like AlMgSi precipitate in an Al matrix and a Pt3Co dealloyed nanoparticle.

    In the case of the Al precipitate, Figure 1, the wide field-of-view allows geometric phase analysis (GPA) to be used to analyse the strain field [3]. At a 0.6nm resolution we achieve a strain precision of 0.3%. The accuracy of these results were confirmed through comparison with DFT simulation.

    For the Pt3Co nanoparticle GPA is no longer appropriate owing to its limited size and the need for atomic resolution detail. Here a real-space approach was used where atomic-column positions were compared to sites defined by a pair of base vectors. The offsets from these are shown in Figure 2. Here we see the last monolayer and a half exhibit an expanded lattice parameter consistent with a platinum enriched outer shell.

Acknowledgments

    The research leading to these results has received funding from the European Union Seventh Framework Programme under Grant Agreement 312483 - ESTEEM2 (Integrated Infrastructure Initiative–I3) and NORTEM (Grant 197405) within the programme INFRASTRUCTURE of the Research Council of Norway (RCN). NORTEM was co-funded by the RCN and the project partners NTNU, UiO and SINTEF. AV was financially supported by Johnson Matthey. Computational resources were provided by the Notur consortium. The authors acknowledge Eva Mørtsell for providing the Al alloy specimen.

References

[1]         L. Jones, H. Yang, T. J. Pennycook, M. S. J. Marshall, S. Van Aert, N. D. Browning, M. R. Castell, and P. D. Nellist, Adv. Struct. Chem. Imaging 1, 8 (2015).

[2]         L. Jones, S. Wenner, M. Nord, P. H. Ninive, O. M. Løvvik, R. Holmestad, and P. D. Nellist, [in press]. (2016).

[3]         M. J. Hÿtch, E. Snoeck, and R. Kilaas, Ultramicroscopy 74, 131 (1998).


Lewys JONES (Oxford, United Kingdom), Aakash VARAMBHIA, Sigurd WENNER, Magnus NORD, Per Harald NINIVE, Ole Martin LØVVIK, Randi HOLMESTAD, Peter NELLIST
08:00 - 18:15 #6891 - IM05-337 Quantitative STEM Atom Counting in Supported Metal Nanoparticles.
IM05-337 Quantitative STEM Atom Counting in Supported Metal Nanoparticles.

Transmission electron microscopy (TEM) has proven itself an invaluable tool for measuring composition, chemistry, and internal structure at the nanoscale and below. TEM micrographs, however, are inherently two-dimensional projections of the real three-dimensional object; important structural information can be lost and ambiguities introduced. Nanoparticles (NP) of different structures – which can possess dramatically different catalytic activity and effectiveness – can yield similar apparent projected sizes in micrographs [1]. The ability to distinguish between them – and, ideally, recover the 3D atomic structure – is necessary for continued improvement in catalyst design.

Quantitative STEM offers an approach for extracting this information contained in a single high-angle annular dark-field scanning TEM (HAADF-STEM) micrograph. First demonstrated nearly two decades ago by Singhal et al. [1], the recent advancements in aberration-correction for STEM spurred a resurgence in interest in quantitative STEM when it was shown the technique could be performed with atomic resolution by LeBeau et al. [2]. Through careful calibration of the microscope and image, the contrast (scattered intensity) in the micrographs can be explicitly related back to the number of atoms involved in the scattering through comparison with image simulation, yielding information about the 3D structure [3] and composition [4] of the specimens.

The current quantitative STEM work has been performed using microscopes equipped with Schottky field-emission gun (FEG) electron sources. The highest-performance analytical STEMs, however, are equipped with cold FEG (CFEG) sources, since CFEGs offer superior spatial and temporal coherences, yielding higher spatial and energy resolutions for imaging and spectroscopy. This performance gain comes at the cost of reduced stability of the emission current, which, in a CFEG, decays in a continuous, non-linear fashion even image-to-image. This poses a challenge for quantitative STEM, as one of the key calibrations requires knowledge of the incident beam current to normalize image intensities into units of fractional beam current for comparison with image simulations [2,5].  In this presentation we will discuss our method to overcome this issue by adapting the condenser aperture of a Hitachi HD-2700C STEM to act as a beam monitor to measure the incident probe current in real-time concurrent with STEM image acquisition. This method enables a more accurate calibration of intensity to be achieved on microscopes with CFEGs.

We are also adapting quantitative STEM to enable its use on a conventional, non-aberration-corrected TEM/STEM – a JEOL JEM2100F – without the need for any special modifications or attachments, as most university facilities do not possess such aberration-corrected instruments with corresponding expensive service contracts. The lower magnifications (2-4 MX) used in this approach means that a much larger number of nanoparticles can be present in each micrograph, such as in Figure 1a, enabling robust statistics about particle size, shape, and monodispersity to be gathered from hundreds to thousands of nanoparticles. We have developed a program for MATLAB to automatically perform the quantitative STEM analysis on batches of micrographs. For each nanoparticle, the optimal intensity integration cut-off radius is calculated via an iterative process that determines when the scattered intensity from the NP is fully enclosed, Figure 1b [6]. It should be noted that this approach can be paired with analysis of selected NP at atomic-resolution studies, to gain the benefit of both robust statistics and atom-level characterization.

References:

[1] A Singhal, et al., Ultramicroscopy 67 (1997), p. 191-206

[2] JM LeBeau, et al., Physical Review Letters 100 (2008), p. 20601

[3] L Jones, et al., Nano Letters 14 (2014), p. 6336-6341

[4] A Rosenauer, et al., Ultramicroscopy 109 (2009), p. 1171-1182

[5] H E, et al., Ultramicroscopy 133 (2013), p. 109-119

[6] This work was supported by DOE BES through grant DE FG02-03ER15476, and performed using the facilities at the Center for Functional Nanomaterials at Brookhaven National Laboratory, which is supported by DOE BES through contract DE-SC0012704.


Judith YANG (Pittsburgh. PA, USA), Stephen HOUSE, Yuxiang CHEN, Dong SU, Tom SCHAMP, Russell HENRY, Eric STACH, Rongchao JIN
08:00 - 18:15 #6977 - IM05-339 Effect of amorphous surface layers on HRTEM image evaluation.
IM05-339 Effect of amorphous surface layers on HRTEM image evaluation.

The possibility to image atomic columns with high contrast and minimum contrast delocalisation in aberration corrected transmission electron microscopes opened new perspectives to analyse the structural property relationships in crystalline solids. The analysis of composition in strained heterostructures, the structure of ferroelectric domains, or of extended defects are some recent examples. For all these applications the ultimate precision in analysis of atomic positions is required. To measure compositional fluctuations in InGaN quantum wells with a precision of 1% requires a measuring precision of atomic column positionss of 0.5 pm. While the influence of the electron detection system, has attracted attention in the last years and effects like the modulation transfer function and shot noise has been in the focus of some papers, e.g. [1], the effect of amorphous surface layers has attracted less attention. This is the more astonishing since TEM samples are needed to stay in the weak phase object approximation for direct imaging. For such a few nanometer thick samples amorphous surface layers influence the image contrast as they contribute noticeable to the overall phase of the exit wave. We study the influence of amorphous surface layers in detail based on the analysis of image series of thin GaN samples.

Amorphous layers are observable as a fluctuating contrast underneath the high-resolution lattice pattern. The analysis of the unit cell parameters shows that the unit cell parameter in the single image fluctuates by 4.5 pm. In image series we see that the unit cell parameters at a given location fluctuates statistically and gives the impression of 'jumping' atomic columns, i.e. a distortion of the unit cell parameter. The STD drops down to 1.5 pm when averaging about all N = 30 images although a reduction to 0.84 pm is expected for random errors ( figure 1). In simulations with shot noise and MTF the highest STD in single images is already smaller than 1 pm. This indicates that the amorphous layers remains the main source for the measurement error. 

To estimate the origin of the static error in the measurements caused by amorphous layers a systematic analysis was carried out with the aforementioned GaN structure. Using experimental amorphous contrast from the edge of a cross section sample (figure 2) as a model for the noise in image simulation the same reduced improvement in the STD as in the experiment can be observed (figure 1). One could suspect the non vanishing correlation in the amorphous contrast between successive images to be responsible for the static error in the measurement. Therefore uncorrelated patches of amorphous contrast pattern were used in a further image simulation. The result shows again the reduced improvement of the STD, thus we suspected that the source of the static error must lies in the radial distribution function of the amorphous layer. Looking at the frequency distribution in the power spectra of amorphous and crystalline areas it is noticeable that the broader distribution underlying the sharp peaks of the crystalline material is similar to the frequency distribution of the amorphous area. This broad frequency distribution is the result of the nearest neighbour distances in the amorphous network which are in the same range as the inter-atomic distances in crystalline material. But as the direction of the nearest neighbour bonds are irregular in the amorphous network the projected distances have a broader distribution. 

Using a random pseudo amorphous network neglecting nearest neighbour distances in a simulated series the STD of the c-lattice parameter measurement follows the random error rule. By adjusting the amorphous network to inter-atomic distances a reduced drop in the STD with increasing N is obtained again. In conclusion amorphous surface layers are the limiting factor of relative position measurements in HRTEM lattice patterns on local scale because of the similar nearest neighbour distances in amorphous and in crystalline material which lead to a static measurement error. As a consequence of the similar distances filtering in the frequency domain is not useful to improve local measurements. Instead improvements in the reduction of amorphous surface layers in the sample preparation has to be found. On the other hand measurements of longer distances well above nearest neighbour distances as for example in case of superstructures or ordering phenomena should not be affected by the static error caused by amorphous layers as the correlation is limited to nearest and next nearest neighbour distances.

[1] T. Niermann , J.B. Park, M. Lehmann, Ultramicroscopy 111 (2011) 1083–1092


Thilo REMMELE (Berlin, Germany), Tobias SCHULZ, Martin ALBRECHT
08:00 - 18:15 #6141 - IM06-341 Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phase Retrieval of Electron Rocking Curves.
IM06-341 Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phase Retrieval of Electron Rocking Curves.

Strain in materials is one of the important factors affecting physical properties of the materials such as carrier mobility, dielectric property, magnetism and so on. In semiconductor industry, strain engineering has been playing a primary role for the improvement of the device performance. Measurement of strain has also been very important as a key technique supporting the strain engineering. So far, the strain measurement by diffraction technique has been done mainly by measuring the positions of diffraction peaks and by fitting the experimental peak positions to simulated ones. This method implicitly assumes that strain in the volume contributing to diffraction intensities is uniform. Strain in real materials, however, is not always uniform and varies over the diffraction volume of the specimen. In the present study, we applied convergent-beam electron diffraction (CBED) to determine such non-uniform strain, whose lattice displacement vector varies along the incident direction of the electron beam.

Lattice scattering amplitude of reflection gφg, is given as a sum of scattered waves from each lattice point, which can be expressed by the Fourier transform of the lattice. If the lattice has a displacement field R(r), a phase factor of 2πg·R(r) has to be taken into account for φg, where r is a positional vector for a point in the crystal. In the case of convergent-beam electron diffraction, R(r) is unchanged in the direction perpendicular to the incident direction of the beam because the probe diameter is sufficiently small, and thus, R(r) can be written as R(z), where z indicate a coordinate along the incident direction. The Fourier transform of the phase factor of exp(2πig·R(z)) can be written as φg(s) with an excitation error s, which is a conjugate variable of z. We applied the Fourier iterative phase retrieval technique to restore the phase part of φg, and to determine the phase factor of the lattice displacement 2πg·R(z). In the present study, the modulus of φg(s) was measured from a rocking curve profile observed by a CBED pattern.

A Ge92.9Sn7.1 layer of 200 nm was deposited on a Ge (001) substrate by the chemical vapor deposition method in a ultra-high vacuum. Cross section samples for electron microscopy were prepared by mechanical polishing and ion-beam thining. Rocking curves were obtained by the CBED technique at an incidence inclined by about 10 degree from the [110] direction. CBED experiment was conducted by using a transmission electron microscope operated at an acceleration voltage of 200 kV. CBED patterns were taken by using Gatan imaging fileter with an energy window of 5 eV to remove inelastic scattering mainly by the plasmon loss.

Figure 1(a) shows a cross-section TEM image of the specimen. CBED patterns were taken from the positions indicated as 1 to 6 in the Ge substrate. Figure 1(b) shows a whole CBED pattern used in the phase retrieval. Figures 2(a), 2(b) and 2(c) show enlarged disks of the -26-8, -553 and -317 reflections and their rocking curve profiles, respectively. Figures 2(d), 2(e) and 2(f) respectively show phase profiles of 2πg·R(z) of the -26-8, -553 and -317 reflections as a function of the z-coordinate determined by the present study. From these phase profiles, the lattice displacements in the [001], [110] and [110] directions are determined as shown in Figures 3(a), 3(b) and 3(c), respectively. It is clearly seen that the displacement field in the [001] direction is of mirror symmetry about the center of the specimen, which is consistent to the elasticity theory. The displacements field determined by the present method is quantitatively compared to the simulated values obtained by the finite element method.


Saitoh KOH (Nagoya, Japan), Miura MASASHI, Tanaka NOBUO, Nakatsuka OSAMU, Zaima SHIGEAKI
08:00 - 18:15 #6283 - IM06-343 Structure resolution of the new phase Ba19Cr12O48.
IM06-343 Structure resolution of the new phase Ba19Cr12O48.

After nearly 30 years of research on the superconducting cuprates, the discovery of high Tc superconductivity in related iron based pnictides in 20081 has stimulated the search of new superconducting compounds. In particular, phases presenting 2D squared planes of 3d transition elements with antiferromagnetic interactions, like the famous cuprate YBa2Cu3O7-d, are of great interest. In that sense, the n=1 (Sr2CrO4 (Sr214)) and n=2 (Sr3Cr2O7 (Sr327)) members of the Srn+1CrnO3n+1 Ruddlesden-Popper (RP) series, synthesized by J.A. Kafalas and J.M. Longo under high pressure - high temperature for the first time in 1972 are interesting2. Only recently this Sr‑Cr‑O system has been revisited by Baikie et al. and E. Castillo-Martinez & M.A. Alario‑Franco3,4.

To explore new Cr-based systems where superconductivity could potentially be induced by changing doping and Cr-Cr interactions, we have synthesized new chromates by replacing Sr with other alkaline earth elements.

The replacement of Sr by a smaller Ca alkaline earth has given rise to a new Ca-based chromate Ca3Cr2O7 (Ca327) RP phase synthesized at 4 GPa and 1000°C5. When a bigger alkaline earth element, such as Ba, was used, a new unknown phase was isolated instead of the traditional RP-type phase in this conditions of synthesis; the low pressure Ba2CrO4 orthorhombic phase was first obtained from the solid state reaction of BaCO3 and Cr2O3 at 1000°C under Ar flow, then this Ba-based precursor was treated at 1000°C under 6 GPa for 30 minutes.

Since it was impossible to solve ab initio the crystallographic structure of this new phase from powder X-ray diffraction, electron diffraction (ED) appeared to be the most suitable method. First of all the selected area electron diffraction highlighted a big cubic cell with the cell parameter a = 13.6 Å, as illustrated by the two [110] and [111] zone axis electron diffraction patterns on figure 1. The extinction conditions are consistent with a body-centered lattice. Then an ED tomography was performed manually by executing a rotation of the sample holder from +50° to -50° and recording an ED pattern each 1° step, with the application of a 1° precession. The reflections picking, 3D reciprocal space reconstruction, cell determination and reflection intensities extraction were realized with the software PETS6, and the structure model was obtained using charge flipping on JANA20067. All the cations were properly determined as well as most of the oxygens, and the remaining oxygens were identified by fast Fourier transform difference. Then the structure was successfully refined from powder X-ray diffraction data using Rietveld method. On the final structure presented on figure 2, all Cr are situated in face-sharing octahedra.

 

1 Y. Kamihara, T. Watanabe, M. Hirano, and Hideo Hosono, J. Am. Chem. Soc. 130, 3296 (2008).

2 J.A. Kafalas and J.M. Longo, J. Sol. St. Chem. 4, 55-59 (1972).

3 T. Baikie et al. Journal of Solid State Chemistry 180, 1538-1546 (2007).

4 E. Castillo-Martinez, M.A. Alario-Franco, Solid State Sciences 9, 564-573 (2007).

5 J. Jeanneau, P.Toulemonde, M. Nunez-Reguerio et al., unpublished.

6 L. Palatinus, PETS-program for analysis of electron diffraction data; Institute of Physics of the AS CR:Prague, Czechia, (2011)

7 V. Petricek, M. Dusek, L. Palatinus, Jana2006 : Structure Determination Software Programs; Institute of Physics :Prague, Czechi Republic, (2006)


Christophe LEPOITTEVIN (Grenoble), Justin JEANNEAU, Pierre TOULEMONDE, Manuel NUNEZ-RUGUEIRO
08:00 - 18:15 #6284 - IM06-345 Pixelated STEM detectors: opportunities and challenges.
IM06-345 Pixelated STEM detectors: opportunities and challenges.

Conventionally, imaging in Scanning Transmission Electron Microscopy (STEM) has been performed using annular detectors that integrate up large fractions of the scattered electrons into a single value for each position in a scan, leading to a loss of information. Recently, advances in counting detection have enabled the development of fast 2-D pixelated detectors, such as the Medipix-3 detector used in this work.  These can be used to collect a large fraction of the scattered electrons in the back focal plane yielding a STEM diffraction pattern (Fig. 1a) for every scan position. The end result is a 4-D dataset, with two spatial sample positions and two reciprocal detector positions. This diffraction pattern contains a wealth of information, and being able acquire them at Ångström spatial resolutions enables many exciting applications, however there are many challenges in how to use and analyse these large datasets. In this presentation we focus on recent progress at University of Glasgow on pixelated STEM imaging, and how analysing different aspects of the diffraction images can yield information about the material properties. 

In standard STEM imaging, one usually gets information about the spatial dimensions orthogonal to the electron beam. By using a pixelated STEM detector, the lattice parameter parallel to the electron beam can also be extracted. This is achieved by looking using the higher order Laue zone rings (arrow in Fig. 1a). When this is combined with conventional atomic resolution STEM images, information of 3-D crystallography can be determined from just one projection. Examples will be given on how the 3-D structure of perovskite oxides has been determined.

The magnetic induction of a sample can be imaged in Lorentz mode, where the objective lens is usually turned off. In STEM mode, magnetic induction in the sample causes the electron beam to deflect through a typically small angle, 1-100μrads, which can be seen as a shift in the bright field disc. This has conventionally been mapped using the Differential Phase Contrast Technique with a split detector (e.g. into quadrants), but this suffers from additional contrast due to diffraction effects which affect intensity distribution within the bright field disc.  Pixelated detection allows an improved methodology accurate disc-shift measurements using edge-detection of the disc, which separates these disc shifts from diffraction contrast more robustly. The resulting imaged magnetic induction in a patterned FeAl film is shown in Fig. 1b, which visualizes ferromagnetic domains in a nanostructure created using focused ion beam nanopatterning.

Since the 4-D datasets contain the full diffraction patterns, it is possible to create virtual apertures in post-processing. This allows the construction of arbitrary shaped “detectors”. Making it possible to get HAADF, MAADF, LAADF, ABF and BF from the same dataset. Such a virtual ADF-aperture is shown in Fig. 1c, for gold deposited on a carbon film.

We will also describe how this detector can be used to determine ordering in amorphous materials using a fluctuation electron microscopy based method, and Figure 1d shows one diffraction pattern from a series of ~ 2000 diffraction patterns taken on a thin ~5 nm film of amorphous MoSix for use in a superconducting nanowire single-photon detector (SNSPD).  The use of the Medipix detector has significant advantages over earlier CCD detectors, due to the absence of electronic detection noise, meaning that the statistics are much cleaner and more interpretable at lower beam doses, and thus higher acquisition rates.  The resulting variance plots and conclusions about short- and medium-range ordering in the material will be briefly summarised.

In conclusion, we will demonstrate a range of new and interesting applications for pixelated detectors in STEM, which allow new or improved imaging modes and the improved extraction of information relevant to the understanding of the nanoscale or atomic scale structure of materials, nanostructures and devices.

Acknowledgements

This research has been supported by the EPSRC through the provision of a research grant (Fast Pixel Detectors: a paradigm shift in STEM imaging, EP/M009963/1) and the award of a CDT studentship to AD.  RHH acknowledges support via EPSRC grants EP/I036273/1, EP/L024020/1 and EP/M01326Z/1, and a European Research Council Consolidator Grant


Ian MACLAREN (Glasgow, United Kingdom), Magnus NORD, Andrew ROSS, Matus KRAJNAK, Martin HART, Alastair DOYE, Damien MCGROUTHER, Rantej BALI, Archan BANERJEE, Robert HADFIELD
08:00 - 18:15 #6369 - IM06-347 Reflection profile and angular resolution with Precession Electron Diffraction.
IM06-347 Reflection profile and angular resolution with Precession Electron Diffraction.

Template matching has proved to be an efficient numerical approach to identify orientation and/or  phase signatures in electron diffraction patterns [1]. With this technic, all patterns for all orientations and all phases considered are pre-calculated and compared to the experimental data by cross-correlation. The capacity of the approach to recognize the diffracting signal is substantially improved with precession electron diffraction (PED). This is because dynamic effects are partly swept out of the experimental signal. Of interest is the fact that, up to now, templates were always computed without including precession. In particular the specific reflection profile resulting from the beam rotation was never considered properly. The present work is an attempt to enhance the degree of matching by adapting the templates to precession in particular for large precession angles.

 

First, the Bragg spot profile is determined for Si single crystal by tilting progressively the sample. The pattern collection procedure is similar to the fast diffraction tomography setup of Gemmi et al [2]. The precession angle was monitored with the Nanomegas Digistar P1000 attachment to a JEOL 2100F TEM and set up to 0.3, 0.6 and 1.2°. The crystal orientation evolution is followed with the ASTAR system through template matching and compared to the quasi linear trend expected from the constant angular speed of 1°/min imposed by the TEM goniometer.

 

The change in reflection profile with increasing precession angle is illustrated in figure 1. The profile exhibits two maximums separated by twice the precession angle. This  shape, systematically recorded,  is modeled and introduced in the template generation routine. The improvement in angular resolution is characterized by comparing the misorientation measurements with respect to the expected linear trend (Fig 2).

 

The templates computed with the recorded PED profile, differ significantly from the standard ones (Fig 3). The resulting set of templates being closer to the diffraction patterns acquired with precession, the crystal orientation is determined with an increased accuracy (Fig. 2.b), at least at large precession angles. The standard deviation obtained without and with precession adaptation is nearly identical and equal to 0.17° for precession angles lower or equal to 0.6°.  By contrast, this value degrades down to 0.5° at the largest precession angle if no precession correction are included (Fig. 2) but remains equal to 0.17° with adapted templates.

Besides, the orientation resolution may be further refined by using the interpolating algorithm presented elsewhere [3]. With adapted templates and interpolation the  standard deviation decreases down to 0.13°, for the largest precession angle. A non-intuitive conclusion of the present work is that the angular resolution of the orientation determination is not bounded by the precession angle.   

 

Acknowledgements

 

The authors acknowledge TEM facilities of the CMTC characterization platform of Grenoble INP supported by the Centre of Excellence of Multifunctional Architectured Materials "CEMAM" n°AN-10-LABX-44-01 funded by the "Investments for the Future" Program.

 

[1] E.F. Rauch, M. Véron, Mater. Charact. 98 (2014) 1–9.

[2] M. Gemmi, M.G.I. LaPlaca, A.S. Galanis, E.F. Rauch, S. Nicolopoulos, J.Appl.Cryst. 48(2015)1-10.

[3] E. F. Rauch and M. Véron, Microscopy and Microanalysis 01/2010; 16:770-771.


Edgar RAUCH, Gilles RENOU (Grenoble), Muriel VERON
08:00 - 18:15 #6526 - IM06-349 3D characterization using transmission electron diffraction, neural network optimization, and density functional theory.
IM06-349 3D characterization using transmission electron diffraction, neural network optimization, and density functional theory.

Three-dimensional characterization using the transmission electron microscope (TEM) can reveal complex nanoscale structural and chemical properties. Because the TEM generates two-dimensional images and diffraction patterns, an inversion algorithm is necessary to retrieve the three-dimensional specimen. An inversion algorithm we have developed includes multiple scattering, and thus can provide three-dimensional nanoscale characterization of crystals from TEM diffraction data using artificial-neural-network optimization tools and GPU-accelerated matrix exponentials - we have previously reported retrieving strain and ferroelectric polarization on simulated data [1-2]. Some algorithms reconstruct individual atomic positions [3]; our algorithm retrieves crystal properties and is suitable for larger specimens and structures. Mapping ferroelectric polarization domains and strain state variations in arbitrary geometries as a function of specimen depth with nanometer-scale resolution can enable novel nanoscale analytical insights for a wide range of crystalline materials, including quantifying 3D structures and understanding surface-induced artifacts.

However, our algorithm requires accurately modeling a layered crystalline specimen for Bloch-wave-type calculations. The conventional approach - using isolated-atom scattering factors (IASF) - is fast, but neglects chemical bonding, while directly fitting the Ug structure-factors might result in accurate pattern replication, but with drawbacks for this three-dimensional application - direct-Ug-fitting greatly increases the number of free parameters, and thus likely decreases the precision of each individual parameter while simultaneously complicating analysis [4]. The specifics of this problem enable a third method - density functional theory (DFT) - which provides self-consistent ab-initio structure factors with chemical bonding effects, and has been previously used to precompute key low-order structure factors, comparing well with experiment [4-5]. Here, we use DFT to generate all the structure factors, because the GPAW DFT code, which we have used for mean inner potential calculations, can provide the all-electron density, which can then be processed to yield Ug structure factors [6-7]. With modern hardware, thousands of small-scale DFT simulations can be performed in a reasonable time, enabling DFT integration into our iterative inversion algorithm, which has been improved to be multi-CPU+multi-GPU parallelized.

Figures 1 and 2 show the results of combining DFT-computed self-consistent ab-initio structure factors with our depth-direction parameter retrieval algorithm on simulated data. Simulated SrTiO3 is our test material for simultaneous retrieval of ferroelectric atomic displacements (single-atom property) and oxygen octahedral rotation (multi-atom property); DFT is used both to generate the test data and during the retrieval routine. For perovskites, both of these specific parameters can be of interest for different systems; for other materials, the combination of single-atom and multi-atom parameters could be useful. For this noise-free data, the results cease improving because the DFT simulations use a user-selectable grid spacing; a finer grid can be used, at the cost of computational time.

In this work, we accurately retrieve ferroelectric atomic displacements and perovskite-style octahedral oxygen rotation for SrTiO3 from simulated composite-CBED-type data using ab-initio DFT structure factors [2]. Experimental applications of this technique to both 2D and 3D data will be discussed.

References
[1] R. S. Pennington, W. Van den Broek, and C. T. Koch, Phys. Rev. B 89, 205409 (2014).
[2] R. S. Pennington and C. T. Koch, Ultramicroscopy 155, 42 (2015).
[3] W. Van den Broek and C. T. Koch, Physical Review Letters 109, 245502 (2012).
[4] J. M. Zuo, M. Kim, M. O'Keeffe, and J. C. H. Spence, Nature 401, 49 (1999).
[5] A. Rosenauer, M. Schowalter, F. Glas, and D. Lamoen, Phys. Rev. B 72, 085326 (2005).
[6] R. S. Pennington, C. B. Boothroyd, and R. E. Dunin-Borkowski, Ultramicroscopy 159, 34 (2015).
[7] J. Enkovaara, C. Rostgaard, et al., J. Phys.: Cond. Mat 22, 253202 (2010).

Acknowledgements
The authors thank the German Research Foundation (DFG) for financial support via grants SFB 951 and PE2500/1-1 (PolaRIS-3D).


Robert S. PENNINGTON (Berlin, Germany), Christoph T. KOCH
08:00 - 18:15 #6751 - IM06-351 Clustering for scanning transmission electron diffraction data.
IM06-351 Clustering for scanning transmission electron diffraction data.

Modern scanning transmission electron microscopes (STEMs) routinely produce very large datasets with a variety of signals, ranging from conventional integrated scattering (annular bright- or dark-field), to X-ray spectroscopy, electron energy loss spectroscopy, and, of particular interest in this study, localised diffraction. While the signal efficiency can be very high in STEM, the available information can be lost or neglected when using traditional data analysis techniques. However, the ever-increasing interest in (and availability of) “big data” and data mining technologies has led to a wealth of techniques suitable for processing STEM data in more intelligent and meaningful ways.

Data clustering represents one such technique. Clusters are groups of data points which exhibit similar features, such as scan pixels which have similar diffraction patterns. However, clustering is not straightforwardly applicable to diffraction data, which typically has a very large number of features, meaning that the “distance” metrics used in most algorithms work poorly.1 Moreover, standard clustering methods are only suitable where data are well-distinguished, which is not the case for diffraction data which often exhibit considerable overlap.

The first problem is most readily solved by taking advantage of recent work focusing on applying dimensionality reduction methods, such as principal component analysis (PCA) and non-negative matrix factorisation (NMF), to diffraction data. Alone, these methods are are capable of extracting relevant features from STEM data, but only in fairly ideal cases.2 However, these methods do preserve the essential structure of the data, allowing clustering to find those features which are actually well-related. The results can then be reprojected into higher dimensions for interpretable results. The second problem can be solved using fuzzy clustering methods, which allow data points to belong to several clusters simultaneously, under algorithm-dependent constraints.3

In this study, clustering has been applied to a number of real experimental datasets, proving to be capable of (a) accurately extracting the spatial location of unique sample orientations/phases, and(b) separating the unique diffraction signals from those phases.

(a) is achieved via “direct” clustering – the diffraction patterns at each scan pixel are compared, and similar patterns brought together. Figure 1 shows an example of this from a part of a NiFe sample that contains a number of different superstructures of the conventional cubic Ni structure. On the left are component “diffraction patterns” derived from NMF alone. On the right are patterns determined from clustering. The latter do not exhibit the incomplete summation artefacts typical of the NMF patterns, such as sub-background intensity or “doughnut” profiles, and are therefore significantly easier to interpret and associate physical quantities – note, for example, the clear presence of superlattice peaks in cluster 0. This may have useful consequences in, for example, pattern matching, or automatic separation of constituent phases.

(b) can be thought of as “inverted” clustering. Each pixel in diffraction space is associated with some real-space signal, and using clustering to group these together distinguishes diffraction spots which produce unique signals, as well as finding unique regions of the sample. Figure 2 shows the result of this method applied to a dataset acquired from a GaAs nanowire containing twin defects. Clusters 0 and 5 represent diffracted beams corresponding uniquely to each twin, and cluster 4 represents diffraction spots that are the same in either orientation. This method also overcomes the effect of local bending and thickness effects in the dataset that made automatic identification of the twin phases difficult. Clusters 1, 2, and 3 represent variation in the direct beam and background intensity.

These techniques are relatively straightforward to implement, rapid, and scale well with the size of the datasets. Ongoing work is focused on new experimental data, as well as algorithmic work to reduce the computational overhead associated with decomposing the data.


1Kailing, K., Kriegel, H., & Kröger, P. (2004). Density-connected subspace clustering for high-dimensional data. Proc. SDM. Retrieved from http://epubs.siam.org/doi/abs/10.1137/1.9781611972740.23

2Lee, D. D., & Seung, H. S. (1999). Learning the parts of objects by non-negative matrix factorization. Nature, 401(6755), 788–91. doi:10.1038/44565

3Bezdek, J. C., Ehrlich, R., & Full, W. (1984). FCM: The fuzzy c-means clustering algorithm. Computers & Geosciences, 10(2-3), 191–203. http://doi.org/10.1016/0098-3004(84)90020-7


Ben MARTINEAU (Cambridge, United Kingdom), Alexander EGGEMAN
08:00 - 18:15 #6788 - IM06-353 Cations distribution in synthetic (MgFe2O4 and FeAl2O4) spinels by precession electron diffraction tomography.
IM06-353 Cations distribution in synthetic (MgFe2O4 and FeAl2O4) spinels by precession electron diffraction tomography.

Since recently, a method using precession electron diffraction tomography (PEDT) and dynamical calculations of the diffracted intensities has been developed, allowing the structure determination and refinement at the nanoscale in a TEM [1, 2]. We present the application of this method to the refinement of (MgFe2)O4 and (FeAl2)O4 spinels in order to determine the Fe, Mg and Al cations distributions on specific sites of the structure. This determination is essential for understanding the electrical or magnetic properties of spinels, their chemical reactivity or to retrieve their thermal history in the field of geosciences.

Studied samples were obtained by the flux growth method and for different chemical compositions [3]. Some samples have also been heat-treated (24 h at 1000°C followed by a rapid quench) in order to intentionally induce some structural disorder associated with Fe, Al and Mg occupancy variations on the tetrahedral and octahedral sites of the structures. Single crystals were large enough to be also studied and refined by X-ray diffraction. The structures thus deduced serve as model for comparison with the much more local results obtained using PEDT. Thin sections for TEM observations are extracted from the crystals previously studied by XRD via two methods: Focused Ion Beam (FIB) thinning and simple mechanical grinding.

The full refinement method is precisely described in [1]. It is based on the acquisition of a serie of precession (angle varying from 1 to 2°) diffraction patterns continuously acquired for various tilt angles of the sample (+/- 45 to 60°, by step of 1°) as currently done in tomography. The 3D reciprocal space of the structure is then reconstructed (Fig. 1) and experimental Ihkl intensities are integrated using the softwares PETS and JANA2006. From the Ihkl data set, the structure is solved, using conventional X-ray methods based on the kinematical approximation implemented in JANA2006, in order to obtain a first reliable structure model (Fig.2). The model is finally accurately refined (atomic position and occupancies) using least-squares methods based on the comparison of experimental intensities with calculated ones using the multi-beam dynamical theory, taking into account interactions between diffracted beams for a given thickness and orientation of the sample.

In this work, we will describe and discuss the influence of the various experimental and computational parameters on the accuracy and precision of the PEDT refinement results. These parameters are: i) thinning method (FIB / grinding), ii) precession angle, iii) refinement procedure (including thickness and/or orientation refinement). We will also discuss the need of constraining or not the chemical composition of the samples during the refinement procedure in order to obtain the most reliable results.

 

1. Palatinus et al. (2015). Acta Cryst. A, 71(2), 1-10.

2. Palatinus et al. (2015) Acta Cryst. B, 71(6), 740-751.

3. Andreozzi et al. (2001). Per. Mineral. 70(2), 193-204.


Ngassa Tankeu YVAN GEORGES (Villeneuve d'Ascq), Jacob DAMIEN, Roussel PASCAL, Roskosz MATHIEU, Andreozzi GIOVANNI B.
08:00 - 18:15 #6951 - IM06-355 Applying of Electron Backscatter Diffraction (EBSD) for Studying Structural and Phase Composition of Multilayer CrN/MoN Coatings Fabricated by Arc-PVD.
IM06-355 Applying of Electron Backscatter Diffraction (EBSD) for Studying Structural and Phase Composition of Multilayer CrN/MoN Coatings Fabricated by Arc-PVD.

Main proposes of produced CrN/MoN coatings in this research are protection of various tools, machines and materials. For this aim they need to have predicted properties and characteristics in hardness, elasticity and plasticity. Structural and phase composition of films play an important role in this case.

Electron Backscatter Diffraction (EBSD) is a powerful quantitative technique which has been significantly developed and spread over the last few decades. Nowadays it’s used both in R&D sector and industry. Usually in labs EBSD occurs as an additional option of scanning electron microscope (SEM): another detector embedded into the same chamber, as it is probably more common for energy-dispersive X-ray spectroscopy (EDS) devices. Also it is clear that limits of maximum potential for this technique haven’t been achieved yet.

The present paper is dedicated to investigation of structural and phase composition of multilayer metal nitride coatings by EBSD. Studied coatings are multilayer films based on nitrides of Cr and Mo metals. CrN/MoN coatings were deposited on steel substrate using Arc-PVD deposition. Total thickness of films is in range 8-13 µm. Samples have various numbers of layers in coatings: 11÷354, and, hence, they have different bilayers thickness from 100 nm up to 2 µm.

Coatings were studied by observing polished cross-sections of samples as well as side of top surface. The films thickness and bilayer thickness were measured using scanning electron microscope JEOL JSM-7001F and FEI Quanta 400FEG with EDAX EBSD Forward Scatter Detector System and high resolution DigiView III camera. This unit also was used for main part of reported research – EBSD studying of structure and phase composition. Crosschecking analysis of coatings structure was performed by X-ray Diffraction (XRD) using Panalytical X'Pert diffractometer.

Figure 1 shows the sample of CrN/MoN cross-section coating with layer thickness 300nm and 22 bilayers in total. Good interfaces and contrast between layers are present in films. Using EBSD and corresponding software Uniqe Grain Color Maps for samples were designed. Columnar structure and grains growth was observed (see Figure 2). It is should be noted that only CrN layers gave a good diffraction pattern, which probably corresponds to soft material of MoN layers, surface deformation or present of noncrystalline compounds.

Crystals orientation in films was studied and visualized by pole figures (Figure 3). Results of phase and orientation analysis were confirmed by cross-checking XRD measurements.

The relation between bilayer thickness and grain size of films was found. Figure 4 demonstrates grainsize distribution in films with different bilayer thickness. As thinner layers in coating as smaller grain size in proposed samples serial.

Decreasing of grain size in films may cause different mechanical properties due to higher amount of interfaces. It is an important characteristic for hardness, elasticity of material and in its turn wear resistance and other protective features.

Analysis of mechanical properties of considered coatings is a next step in subsequent research.


Bogdan POSTOLNYI (Sumy, Ukraine), João Pedro ARAÚJO, Alexander POGREBNJAK
08:00 - 18:15 #6959 - IM06-357 Virtual dark-field and Virtual high angle angular dark field images reconstructed from electron diffraction patterns.
IM06-357 Virtual dark-field and Virtual high angle angular dark field images reconstructed from electron diffraction patterns.

Dark-field images are routinely produced in transmission electron microscopy (TEM) by selecting a specific diffracted beam with the objective aperture while the incident beam illuminates a large area of the thin specimen. Similar pictures are produced in scanning-transmission electron microscopy (STEM) mode by scanning the focused beam over the region of interest and reconstructing the microstructure thanks to the signal collected with an annular detector. When using high angle annular dark field (HAADF) or low camera length, the signal is then sensitive to chemical composition, and the resulting image illustrates phase composition.

 

In both cases TEM or STEM, the information carried by the diffracted electron beam is filtered thanks to a given technical component that provides a limited range of possible settings. Typically, few apertures, which differ by their diameter, are available in conventional TEM. In STEM mode, the camera length is the only practical parameter that may be adapted for sorting the signals. In some cases it could be of interest to extend these capabilities to non-standard situations. For example, small precipitates that promote faint diffracting beams could be highlighted by collecting the intensities of not only one but several of them.

 

To that respect, acquiring the entire diffracted signal with a spatially resolved detector - e.g.: a CCD camera - and sorting numerically the information out of this complete set of signal may reveal refined features and produce uncommon views of the microstructural features. ACOM-TEM technique [1] allows such image treatment. It is this approach that is used to construct so-called virtual bright field (VBF) or dark field (VDF) images. The construction of such images has been described in [2].

The set of diffraction patterns (DP’s) collected during a scan is a digital data that may be post-processed in non-restricted way for sorting the relevant information about material’s microstructure. An example of the filtering capability of the present approach concerns materials in which phases were not easily recognise by template matching technique, because of their diffraction patterns being too similar. Such a case is illustrated with sintered Diamond/Colbalt material (fig 1 a). Indeed due to dynamical diffraction effects, diffraction patterns from Diamond (crystal structure fd3m, a=0.3566nm) and Cobalt (crystal structure fm3m, a=0.3544nm) are geometrically similar, and cannot be interpreted in terms of two different crystal structure. The resulting crystal orientation map is correct, but the Phase Map is irrelevant (fig 1. b). Limitation of template matching technique (TM) used by ACOM-TEM technique is illustrated figure 1.c) and d), when a Diamond’s DP can be better recognize using Cobalt templates (green) with index quality (IQ) of 1723 than diamond templates (red, IQ=1700). By contrast, the background of the diffraction patterns for both materials are different, depending essentially of the atomic number Z of the compound. Therefore, creating, as post data treatment, VDF using information’s contained in the background of DP will help to discriminate chemical composition (fig 2 a) and b)), and generate correct phase map (fig2.c)), without help of further complexed chemical analysis.

Acknowledgements

The authors acknowledge TEM facilities of the CMTC characterization platform of Grenoble INP supported by the Centre of Excellence of Multifunctional Architectured Materials "CEMAM" n°AN-10-LABX-44-01 funded by the "Investments for the Future" Program.

 

[1] E.F. Rauch, M. Véron, Mater. Charact. 98 (2014) 1–9.

[2] E.F Rauch, M. Véron, SFµ Nantes, (2013)

 


Muriel VERON (Saint Martin d'Hères), Johan WESTRAADT, Edgar RAUCH
08:00 - 18:15 #6276 - IM07-359 Magnetic imaging of skyrmions in FeGe using off-axis electron holography.
IM07-359 Magnetic imaging of skyrmions in FeGe using off-axis electron holography.

Magnetic skyrmions are topologically protected spin structures that have recently attracted considerable interest as a result of their physical properties and potential applications in energy-efficient spintronic devices for information technology [1]. Magnetic skyrmions were first observed in B20 compounds, whose non-centrosymmetric crystal structure gives rise to strong spin-orbit coupling. In these materials, the Dzaloshinskii-Moriya interaction results in the formation of a particle-like chiral spin structure in a regular hexagonal lattice. Transmission electron microscopy (TEM) offers a variety of methods for imaging the magnetic structure of skyrmions, including the Fresnel mode of Lorentz TEM combined with phase retrieval based on the transport of intensity equation, scanning TEM combined with differential phase contrast imaging and off-axis electron holography (EH). Here, we discuss recent advances in EH-based methods and related techniques for imaging skyrmion and helical spin structures in B20 FeGe single crystals as a function of temperature and applied magnetic field.

 Focused ion beam (FIB) milling was used to prepare TEM specimens of FeGe with a homogenous thickness of ~100 nm and a large surface area of ~50 µm2. FIB-induced damage was reduced by using low energy (<1 kV) ion milling. In order to form helical and skyrmion spin structures [2], the FeGe specimens were cooled below 280 K using a Gatan 636 liquid nitrogen cooling holder. Fresnel images and off-axis electron holograms were recorded using an FEI Titan 60-300 TEM operated at 300 kV in magnetic field free conditions (<0.5 mT) in aberration-corrected mode. The microscope was equipped with a conventional Gatan Ultrascan 2k x 2k charge-coupled device (CCD) camera and two biprisms, which were located in the first and second selected area aperture planes.

 Figure 1 shows experimental magnetic phase images and corresponding magnetic induction maps of skyrmion and helical spin structures in FeGe recorded using EH. The mean inner potential and magnetic contributions to the total phase shift were separated by taking differences between measurements recorded at low temperature and at room temperature (when the FeGe is non-magnetic). The phase resolution of the EH experiments was optimised by acquiring multiple series of electron holograms and combining them after cross-correlation, as well as by recording electron holograms with a direct electron detection (Gatan K2-IS) camera, which offers an improved detective quantum efficiency and modulation transfer function when compared with standard CCD cameras [3]. Skyrmions were studied as a function of both temperature and magnetic field, which was applied parallel to the electron beam direction using the objective lens of the microscope (in free lens control mode). The twin construction of the objective lens used allowed the strength and polarity of the magnetic field to be changed continuously, in order to study the magnetization reversal dynamics of the skyrmions in situ in the TEM. The recorded magnetic phase images were also used to calculate the projected in-plane magnetization distribution in the sample using a model-based iterative reconstruction technique. As the inverse problem of reconstructing the magnetization distribution is ill-posed, regularisation parameters were used to constrain the solution. Examples of the resulting magnetisation maps are shown in Fig. 2 for the helical and skyrmion structures.

 Acknowledgements. We are grateful to K. Shibata, Y. Tokura for providing the FeGe samples and for valuable discussions, as well as to the European Commission for an Advanced Grant.

 

[1] N.S. Kiselev, A.N. Bogdanov, R. Schäfer and U.K. Rössler. J. Phys. D: Appl. Phys. 44 (2011) 392001.

[2] X. Z. Yu et al. Nature Materials 10 (2011) 106.

[3] S. L. Y. Chang et al. Ultramicroscopy 161 (2016) 90.


András KOVÁCS (Juelich, Germany), Zi-An LI, Jan CARON, Rafal DUNIN-BORKOWSKI
08:00 - 18:15 #6291 - IM07-361 New design of Möllenstedt electrostatic biprism setup for off-axis electron holography.
IM07-361 New design of Möllenstedt electrostatic biprism setup for off-axis electron holography.

Many different forms of electron holography have been explored or imagined. The off-axis configuration that uses a post-specimen electrostatic Möllenstedt biprism (BP) is the most widespread. It can be easily set up in a modern transmission electron microscope (TEM) thanks to the general introduction of field emission guns. The In situ Interferometry Transmission Electron Microscope (I2TEM), is a microscope designed to easily performed electron holography experiment [1,2,3]. The microscope is equipped with a 300kV cold field emission source, one biprism (BP) installed before the three condenser lenses, and three biprisms placed between the intermediate lenses.

Regarding the high numbers of biprisms used in this microscope, their quality, their stability, and their easy servicing are one of the major concerns to maintain the performance of the machine. A wire surrounded with a ground anode basically constitutes commercial biprisms. The wire is, in most of case, produced by coating ultrasmall quartz fibers with noble metals. The resulting biprisms, although they are quite small by most fabrication standards (approximately 700 nm in diameter), can have various mechanical, electrical, structural ... properties. Furthermore, their preparation methods are, in general, not very reproducible.

We have developed a new method to produce biprism in a more reproducible way, maintaining the best mechanical and electrical performance of the wire. Regarding the H-bar shape of these new wires, due to the FIB preparation, the electric field that appears between the wire and the ground electrode, could be strongly affected by the system geometry. Finite element models using Comsol Multiphysics [4], have been used to better understand this effect which can, combining with the biprism holder shape, strongly influence the final hologram performance. We have then proposed a new biprism holder, which overcome all these drawbacks, and test these news holders, with new FIB prepared wires inside the I2TEM microscope.  

 

[1]  T Denneulin et al, Ultramicroscopy  160 (2016), 98–109.

[2]  F Röder et al, Ultramicroscopy 161 (2016), 23–40.

[3]  F Houdellier et al, Ultramicroscopy 159, Part 1 (2015), 59–66.

[4] https://www.comsol.fr


Robin COURS (CEMES, Toulouse), Cécile MARCELOT, Florent HOUDELLIER
08:00 - 18:15 #6298 - IM07-363 Mapping electrostatic potentials across the p-n junction in GaAs nanowires by off-axis electron holography.
IM07-363 Mapping electrostatic potentials across the p-n junction in GaAs nanowires by off-axis electron holography.

The development of III−V materials on Si platforms, with the aim of reducing production costs while achieving high conversion efficiency, has been a continuing area of photovoltaic research in the last decades [1,2]. This process is challenging due to large lattice mismatches, the polar non-polar interfaces and the differences in thermal expansion coefficients. The use of III–V nanowires (NWs) provides a novel method of integrating III-V materials with Si, which avoids dislocations [3]. However the control of other parameters, such as vertical yield in a patterned array, crystal phase, dopant concentrations and electrostatic potential distribution, become challenging.

The electrical performance of a semiconductor device relies strongly on how precisely the electrostatic potentials are distributed across the active region. An accurate measurement of this potential distribution is of vital interest to the semiconductor industry. The technique of off-axis electron holography in the transmission electron microscope (TEM) is a powerful tool for fulfilling the required accuracy in mapping electrostatic potentials [4]. Here, we present electron holography measurements from single GaAs core-shell nanowires with a p-n junction, grown on a Si (1 1 1) substrate.

The Ga-assisted vapor–liquid–solid (VLS) growth mechanism on a silicon substrate was used for the formation of a patterned array of radial p-i-n GaAs NWs encapsulated in AlInP passivation. A cross-sectional specimen for off-axis electron holography was prepared perpendicular to the growth direction of the NW using focused ion beam milling (FIB) and the in-situ lift-out technique in an FEI Helios Dualbeam FIB/SEM, equipped with a micromanipulator. Holograms were acquired at 120 kV using an FEI Titan 80-300ST TEM, equipped with a rotatable Möllenstedt biprism. The thickness of the specimen was measured to be around 280 nm by convergent beam electron diffraction (CBED).

Fig. 1 shows the reconstructed phase and amplitude from the hologram of the cross-sectional specimen. A core-shell structure is observed, with the core being p-type and the shell being n-type. The phase shift across the p-n junction is close to 1 radian, corresponding to a built-in potential of 0.4 V, as shown in Fig.2. The potential variation measured by holography is used to quantify the actual doping densities in the n-type layer and p-type layer of the NW. This holography measurement indicates that the active dopant concentrations are lower than nominal values, causing a low built-in potential. A greater control on the dopant concentration and distribution is required in order to achieve a higher efficiency of the NW solar cells.

 

 

[1] Bolkhovityanov, Y. B. and Pchelyakov, O.P., Physics-Uspekhi (2008), 51, 437-456.

 

[2] Jain N., and Hudait M. K., Energy Harvesting Syst. (2014), 1, 121–145.

 

[3] Kavanagh, K. L. Semicond. Sci. Techn. (2010), 25(2), 024006-024013.

 

[4] Yazdi, S., Berg, A., Borgström, M. T., Kasama, T., Beleggia, M., Samuelson, L., & Wagner, J. B. (2015) Small11(22), 2687-2695.


Elisabetta Maria FIORDALISO (Hedehusene, Denmark), Zoltan Imre BALOGH, Takeshi KASAMA, Ray LAPIERRE, Martin AAGESEN
08:00 - 18:15 #6362 - IM07-365 Wave front reconstruction vi the transport of intensity equation: Introduction of non-convex constraints.
IM07-365 Wave front reconstruction vi the transport of intensity equation: Introduction of non-convex constraints.

The transport of intensity equation (TIE) is an elliptical, second order partial differential equation which relates the intensity variation along the optical axis to Laplacian-like expression involving of the unknown phase. Due to its simple mathematical formulation and the straight forward procedure to acquire the experimental data, the TIE has attracted enormous attentions from various research communities such as transmission electron microscopy, X-ray microscopy, neutron imaging, etc.. The FFT approach to the TIE due to its deterministic nature and computational speed is widely used. However, periodic boundary condition inherent to the FFT approach results in low frequency artifacts in case of non-periodic objects. Alternatively, one can impose an additional constraint on the solution in order to overcome the problem of only weakly encoded low spatial frequency phase information and unknown boundary conditions. For example, by total variation minimization approach employs gradient based optimization techniques to minimize the convex l1-norm of the derivative of the phase is minimized, leading a solution which is preferentially flat. However, the TV-minimization approach should only be considered for piece-wise constant objects.
Here, we report on an iterative algorithm namely, the gradient flipping algorithm (GFA) [1,2], which imposes non-convex constraint on phase. The GFA assumes that the wavefront to be recovered is sparse in its gradient basis and therefore, combines the reciprocal space solution of the TIE with the principle of the charge flipping algorithm [3] by flipping the sign of phase gradients below a determined threshold. This leads to the sparsest solution in the gradient domain. In an iterative manner, the boundary conditions are updated in such a way that consistency of the recovered wavefront with the experimental data is assured and at the same time the solution is sparse. The algorithm iterates until the convergence criterion is fulfilled.
Figure 1(a) depicts the variation of the image intensity along the optical axis of images recorded of HeLa cells which was estimated from a focal series comprising 20 images with defocus step of 1 µm and laser illumination at a wavelength of λ = 520 nm. Figures 1(b), 1(c) and 1(d) show the phase reconstructed by a Tikhonov-regularized FFT-based solution of the TIE (q-2 -> (q2+α)-1, with q being the reciprocal space coordinate) for α =0.001 µm-2,α=0.01 µm-2 and α=0.1 µm-2 where α is the regularization parameter. The phase retrieved by employing the TVAL3 package [4], (convex TV-minimization) is shown in Fig. 1(e). Finally, Fig. 1(f) presents the phase map reconstructed by the proposed approach. This GFA-reconstruction provides a physically very reasonable solution while that of TV-minimization suffers from missing low frequency information, and the Tikhonov regularized FFT-based reconstruction suffers from low frequency artifacts when ααα is small and is not capable of recovering low frequency information when the regularization parameter is increased. 

References

1. A. Parvizi, W. V. den Broek, and C.T.Koch, “Recovering low spatial frequencies in wavefront sensing based on
intensity measurements,” Adv. Struct. Chem. Imag., DOI 10.1186/s40679-016-0017-y
2. A. Parvizi, W. Van den Broek, and C. T. Koch, “The gradient flipping algorithm: introducing non-convex con-
straints in wavefront reconstructions with the transport of intensity equation ,” Opt. Express accepted (2016).
3. G. Oszlányi and A. Süto, “The charge flipping algorithm,” Acta Crystallogr. Sect. A 64, 23–134 (2007).

4. C. Li, An efficient algorithm for total variation regularization with applications to the single pixel camera and

compressive sensing (Rice University, 2009).


Amin PARVIZI (Berlin, Germany), Wouter VAN DEN BROEK, Katharina BLESSING, Christoph T. KOCH
08:00 - 18:15 #6383 - IM07-367 Mapping electrostatic potentials and deformation in semiconductor devices by off-axis electron holography and other techniques.
IM07-367 Mapping electrostatic potentials and deformation in semiconductor devices by off-axis electron holography and other techniques.

Off-axis electron holography can be used to measure the electrostatic and magnetic potentials in semiconductor devices with high-sensitivity and nm-scale resolution [1]. In this presentation we will show experimental results that have been obtained using combinations of electron holography, precession diffraction and differential phase contrast (DPC) on a range of different semiconductor devices.

Deformation maps have been acquired using dark field electron holography on a variety of different device structures and these results have been compared to those obtained by precession electron diffraction (NPED). Figure 1 shows STEM images and results obtained by dark holography and NPED on a Si specimen containing 10-nm-thick SiGe layers with different Ge concentrations and also a recessed source and drain SiGe device. The deformation maps obtained by dark holography and shown here have a spatial resolution of 6 nm and a precision of 0.05 %. The maps obtained by precession electron diffraction have a spatial resolution of 2 nm and a precision of 0.02 %. In this presentation we will show the advantages and difficulties associated with the use of the different techniques [2].

We will also compare electron holography and DPC for dopant profiling on fully processed and electrically tested devices. Figure 2(a) and (b) shows STEM images that have been acquired from two different pMOS devices with different spacer widths. The spacers are used to prevent dopants from diffusing under the gate during the activation anneals. Figure 2(c) shows how the specimen is rotated to remove the top metal layers in the device, backside milling is then used to provide a high quality TEM specimen. Figures 2(d) and (e) show maps of the electrostatic potential in the devices that have been acquired using off-axis electron holography. The spatial resolution in these maps is 5 nm and the difference in the potential distribution under the gate can be clearly seen. Potential profiles have been obtained from across the device and the parameters such as the electrical gate width can be measured. From the analysis of these real devices, the advantages and problems that are associated with electron holography and DPC can be discussed.

Acknowledgements : This work has been funded by the ERC Starting Grant 306365 « Holoview ».

References
[1] A. Tonomura, Reviews of Modern Physics, 59 (1987) 1
[2] D. Cooper et al., Micron, 80 (2016) 145
[3] D. Cooper et al., Semicond. Sci. Tech., 28 (2013) 215013


Victor BOUREAU (Toulouse), David COOPER, Nicolas BERNIER, Jean-Luc ROUVIERE
08:00 - 18:15 #6470 - IM07-369 Quantitative measurements of nanoscale electrostatic and mean inner potentials in crystals by electron beam refraction using CBED and DPC.
IM07-369 Quantitative measurements of nanoscale electrostatic and mean inner potentials in crystals by electron beam refraction using CBED and DPC.

Probing nanometer scale electrostatic and mean inner potential (MIP) and establishing structure–properties relationship at this length scale in advanced functional materials are not only of fundamental interest but also of technological relevance and importance, especially for materials with application in the ever miniaturizing electronics. As pure phase object, these potentials can only be “seen” by phase of the wave of probing radiation/particle; and electron microscopy (EM) based phase contrast methods are the most suitable, if not the only, tool for this purpose. Here, MIP is, by definition, the local volume (or unit cell) average of the Coulomb potential of the sample, which can be theoretically calculated or accurately measured (cf. Ref [1]). While the measurable, the local scattering potential being probed by the high-energy electrons, can be considered (assuming homogeneous potential in projection) superposition of MIP and electrostatic potential, which is the deviation of local Coulomb potential from the MIP of bulk from the perspective of measurement.

Differential phase contrast (DPC) using electrons based on scanning transmission EM (STEM) has seen a renaissance of interest mainly due to the recent demonstration of probing electrostatic potential in real space at atomic resolution [3], beside its demonstrated robustness in studying magnetic properties in the past decades, e.g. Ref. [2]. The DPC-STEM signal composes the difference of intensity from opposite quadrants from a segmented annual bright field detector. In principle, a DPC-STEM experiment effectively records, under kinematic approximation, a two dimensional vector of electron beam deflection (i.e., phase gradient) and an absorption/amplitude contrast signal (i.e., sum intensity of all quadrants) simultaneously at each probing position/pixel which raster over the specimen at desired field of view (FOV). Therefore, DPC-STEM is expected to show advantages of 1) direct interpretability, 2) sharp features in focus, 3) flexible FOV and 4) simultaneous phase and amplitude contrast, compared to interference- (e.g. electron holography) and propagation- (e.g. Fresnel contrast) based phase contrast methods. Despite these simple descriptions, there are, however, very limited applications of DPC-STEM in the quantitative and systematic study of electrostatic potential and MIP in crystals. Moreover, as STEM based method using convergent illumination, convergent beam electron diffraction (CBED) patterns under identical condition are indispensable to evaluate the DPC-STEM results quantitatively. 

In this contribution, we focus on experimental studies of quantitative measurements of MIP from crystal wedges by compiling the results from DPC-STEM and CBED raster arrays under identical diffraction conditions. The experiments were performed on a Titan Themis3 TEM equipped with Cs correctors, working at 200 kV in μ-probe STEM mode. The camera length and probe convergence angle are carefully calibrated and chosen to balance resolution (to about 1 nm) and detection sensitivity. Figure 1 shows the representative results of measuring MIP from a cleaved 90° Si wedge. Under quasi-kinematic condition (cf. Fig. 1a), remarkable beam refraction is observed when the probe is moved from vacuum to inside sample and the refraction angle is constant to a considerablely large sample thickness. Meanwhile the total intensity decreases homogeneously within the beam disk and exponentially as a function of the local thickness, as expected. The refraction angle measured from a CBED raster array is quantified to sub-pixel accuracy, which corresponds to a MIP of Si to be 12.52±0.21 V. The calibrated DPC-STEM signals deliever very close mean value of the magnitude of refraction, but with much greater variance, due to the orders-of-magnitude shorter dwell time and thus noisier signal (Fig. 1g,h). The same measurements have been carried out with a 90° GaAs wedge, from which we derived the MIP of GaAs to be 14.10±0.33 V from CBED measurement and a very close mean value from DPC-STEM data. The MIP values agrees very well with previous measurements based on electron holography and theoretical calculations [1].

Further examples on the application of the method for mapping electrostatic potentials in semiconductor nanostructures, as well as attempts to map piezo-electric potentials will be presented at the conference. 

Acknowledgements: Financial support by the German Research Foundation (DFG) via research training group GRK 1896 “In-situ microscopy with electrons, X-rays and scanning probes” and cluster of excellence EXC 315 “Engineering of advanced materials” is gratefully acknowledged.

References:

[1] P. Kruse, et al., Ultramicroscopy 106, 105 (2006). 

[2] J. Chapman, J. Phys. D, 17, 623 (1984); T. Uhlig & J. Zweck, Phys. Rev. Lett. 93, 047203 (2004). 

[3] N. Shibata, et al., Nat. Phys. 8, 1 (2012); K. Müller, et al., Nat. Comm. 5 5653 (2014)


Mingjian WU (Erlangen, Germany), Erdmann SPIECKER
08:00 - 18:15 #6625 - IM07-371 Imaging by Zernike phase plates in the TEM.
IM07-371 Imaging by Zernike phase plates in the TEM.

Abbe lens theory can be used to calculate the images produced by a system made up of a simple phase object, a round lens and a Zernike phase plate.  When all these have rotational symmetry, 1D Fourier-Bessel transforms are suitable. 

 

Given a disc object producing a uniform phase shift over its diameter and a phase plate providing a simple step in phase by α at a defined spatial frequency q0, the resulting image intensity can be defined for any size of object phase change.  The distortion of the image by the central hole in the Zernike plate depends on a parameter B which is proportional to the product of the diameter of the object and q0 and also depends on the lens focal length; when B is less than 1, the distortion is small (Fig. 1).  The range of object phase that produces a monotonic variation of intensity is found to depend strongly on the phase change α introduced by the phase plate, being greatest when α is between π and 2π  (Fig. 2). 

 

For this object and plate, the weak phase approximation (WPA) is useful in giving an indication of the radial distribution of intensity.  It does not predict well the range of monotonic variation of intensity with object phase.

 

In the search to reduce the ‘ringing’ in the image produced by large objects with a stepped plate, we analysed also the behaviour when the phase change at the plate increases to its maximum value α over a range of radius (instead of a step).   When the phase change is proportional to radius for q < q0, we find that as object diameter increases, the intensity is reduced gracefully when α ~ π/2, but that contrast reversal can occur when α ~ 3π/2. 

 

The intensity has also been calculated in WPA for an object phase distribution typical of a spherical object.  With this object, the image intensity varies continuously with object radius, as expected, and is reduced as B increases above 1.  The behaviour when the phase profile of the plate is ramped is similar to that for the disc object with the same phase profile for the plate (Fig. 3).

 

The advantages for different kinds of objects offered by plates with phase shifts α either less than or greater than π suggest that in practical use it will be desirable for phase plate holders to be fitted with plates of both thicknesses.


Chris EDGCOMBE (Cambridge, United Kingdom)
08:00 - 18:15 #6634 - IM07-373 Effects of dose and image registration on exit wave reconstruction of low-dose focal series.
IM07-373 Effects of dose and image registration on exit wave reconstruction of low-dose focal series.

Dose effects are an important topic in electron microscopy (EM) due to the close connection to radiation damage and hence to quantitative image analysis [1]. Two main problems restricting the application of exit wave reconstruction to radiation-sensitive materials are the high noise level in low-dose images and the contrast reversals close to zero defocus. Both problems cause difficulty in correctly registering a focal series of images and a well-aligned image series is a prerequisite for valid wave restoration [2].

 

In this work, a simulation-assisted cross-correlation function (SA-XCF) registration scheme is proposed and tested with five focal series of the same cerium oxide (CeO2) nanoparticle taken under identical imaging conditions except for varying electron dose between different focal series. The registration results demonstrate the superiority of the new registration scheme over a simple neighboring-reference cross-correlation function (NR-XCF) registration (Figure 1). The impact of registration quality on exit wave reconstruction is explored by the comparing the IQ factor, an image quality measurement calculated from the power spectrum of an image of the phase restored from the same focal series aligned by two different registration methods. Better phase restoration results are obtained with the focal series registered by SA-XCF in comparison to NR-XCF.

 

With improved image alignment exit waves reconstructed from focal series data at variable dose were compared. The comparison result confirms the natural hypothesis that higher electron dose series give improved restored exit waves than lower dose series. However, this improvement with increased dose appears to plateau beyond a certain dose threshold. Exit wave reconstruction from focal series at very low dose tends to preserve more noise from the images and leads to worse IQ factor values (Figure 2).

 

It has also been observed that the restored exit waves from focal series at very low dose can be unreliable for quantitative interpretation (Figure 3) where the phase shift is noticeably attenuated. This leads to the question of how a critical dose can be determined in order to obtain a quantitatively interpretable exit wave subject to the most efficient use of an allowed electron dose budget. 

  
 
Reference
[1] M. Pan, Micron, Vol. 27, No. 3-4, pp. 219-238, 1996.
[2] W. O. Saxton, Journal of Microscopy, 174(2):61–68, 1994. 

Chen HUANG (Oxford, United Kingdom), Hidetaka SAWADA, Angus KIRKLAND
08:00 - 18:15 #6723 - IM07-375 Direct determination of calibration factors for quantitative DPC measurements.
IM07-375 Direct determination of calibration factors for quantitative DPC measurements.

Differential phase contrast microscopy (DPC) is a measurement technique which is utilized in a scanning transmission electron microscope (STEM) equipped with a special direction sensitive detector [1,2]. It is based on the deflection of the electron beam by an angle α due to either Lorentz or Coulomb force, when the electron probe is scanned over an area with intrinsic magnetic or electric fields. This deflection causes a shift of the diffraction disk (DD) in the detector plane of the microscope, which is proportional to strength and direction of the field within the specimen. By measuring this shift with a direction sensitive segmented ring detector one obtains information about the intrinsic fields.

In this work we present an approach to determine calibration factors relating the qualitative DPC signals to absolute magnetic and electric field strengths or deflection angles just by measuring the size of the DD on the DPC detector. For this we derived a formula for the calibration factor by considering geometrical properties of the annular DPC detector and the DD. With this we can for example describe the absolute electric field strength E(x,y) at a certain specimen position (x,y) by:

                                             E(x,y)[V/m] = ( SDPC(x,y) / Ssum(x,y)  ) · ( κel[V]  / t(x,y)[m] )     (1)

SDPC(x,y) being the DPC signal normalized with the sum signal Ssum(x,y) of all four detector segments, the specimen thickness t(x,y) and the calibration factor κel for electric fields. The latter can be described by:

                                             κel = [ (R2 - r2) / (R · C) ] · [ (mrel · vrel2) / e ]                             (2)

with R and r being the radii of the DD in the detector plane and the detector hole (see fig. 1) and C the used camera length of the microscope. The second term describes the energy of the accelerated electrons with their relativistic mass mrel, velocity vrel and elemental charge e.
Equation 2 shows us two important things. Firstly that the calibration factor is highly dependent on the radius R of the DD (see fig. 2 and 3). This means that even a small change of the DD radius due to beam broadening caused by the specimen can lead to significant different field values when they are quantified with a calibration factor determined for the same set of microscope parameters but with a slightly smaller disk radius.
The other one is, that it is possible to calculate κel just by the measurement of R, because all the other variables in eq. 2 are well known parameters of the DPC measurement. The disk size itself can be easily determined e.g. with a CCD camera. This is a convenient way to calibrate a DPC system for quantitative measurements. Further it is possible to obtain individual calibration factors for each DPC measurement performed. The latter allows to minimize the error of the quantification due to disk broadening.

In addition to the theoretical approach we will also present our first experimental results showing the validity of the statements made above.

[1] Rose H., Phase Contrast in Scanning Transmission Electron Microscopy, Optik 39, 4, 416-436, (1974)
[2] Chapman J.N., The Investigation of Magnetic Domain-structures In Thin Foils By Electron-microscopy, J. Phys. D: Appl. Phys. 17, 623-647 (1984)


Felix SCHWARZHUBER (Regensburg, Germany), Johannes WILD, Josef ZWECK
08:00 - 18:15 #6816 - IM07-377 Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.
IM07-377 Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.

In this presentation we will compare differential phase contrast (DPC) [1] and off-axis electron holography [2] for the measurement of electrostatic potentials in semiconductor devices. DPC uses the lateral shifts of a convergent electron beam to determine the field in the sample whereas for electron holography the changes in potential is encoded in interference fringes that are formed using a biprism [1]. To fairly assess the relative sensitivity of the different techniques on the same specimen, a symmetrically doped p-n junction with a dopant concentration of 1 x 1019 cm-3 has been measured as a function of reverse bias applied in situ in the TEM.  Figure 1(a) and (b) shows maps acquired by DPC of the p-n junction with 0V and 4V reverse bias applied. At 0V, it is difficult to see the presence of the junction whereas for a reverse bias of 4 V the space charge region is now visible. Profiles acquired from across the junction for various reverse bias voltages can be seen in Figure 1(c).  Electron holograms were acquired and Figure 1(d) and (e) show reconstructed phase images of the junction at zero bias and 4 V reverse bias. Even though a low magnification has been used to obtain a large field of view at the expense of sensitivity, the junction is clearly visible in both of the phase images. Corresponding electric field profiles that have been calculated from the potential maps are shown in Figure 1(f).  These results show that off-axis electron holography has a significantly better sensitivity than DPC. However  the advantages of using DPC is that a large field of view has been obtained and it is not necessary to examine a region close to vacuum.

These techniques have also been applied to an InGaN/GaN system. Figure 2(a) shows a HAADF STEM image of the specimen. Figure 2(b) shows a potential map and (c) profile acquired by off-axis electron holography with a spatial resolution of 5 nm.  When using DPC, sub-nanometer spatial resolution is expected and maps of the electric field in the InGaN layers can be observed in Figures 2(d) and (e). Here the specimen has been tilted onto and away from a zone axis and a large variation in the measured signal is observed which is visible in Figure 2(f). In this presentation will discuss the effects of diffracted beams on the measured DPC signal. We will also discuss the advantages and disadvantages of using DPC and electron holography for the measurement of electrostatic fields in a range of different doped and III/V semiconductor specimens and show improvements that have been applied.

 

Acknowledgements : This work has been funded by the ERC Starting Grant 306365 « Holoview ». The experiments have been performed on the platform nanocharacterisation at Minatec.

References

[1] N.H. Dekkers, Optik, 30 (1974) 452

[2] A. Tonomura, Reviews of Modern Physics, 59 (1987) 1


Benedikt HAAS (GRENOBLE CEDEX 9), David COOPER, Jean-Luc ROUVIERE
08:00 - 18:15 #6835 - IM07-379 Exotic Electron topologies - Knitting with electron vortices.
IM07-379 Exotic Electron topologies - Knitting with electron vortices.

Electron vortex studies have proliferated in the last few years, with many examples of their
production, measurement and some examples of application.
However, these studies focus on the more standard cylindrically-symmetric ideal electron vortex
beam. We have recently noted an abundance of exotic vortex behaviours, outwith cylindrical
symmetry [1]. Vortex-antivortex loops were formed and annihilated at many different positions
within the beam, with varying sizes. Other studies have shown how a vortex core can wend its way
through a crystal lattice, with the vortex always remaining conserved [2].
In the sister field of optical vortices, it has recently been discovered that it is possible, with
simultaneous manipulation of holography and careful limiting apertures, to produce 'knots' with the
vortex cores [3]. These knots are not knots as known to the layman, but specific forms of multiply
interlinked loops. These knots are unusual, and robust topological structures, and take the form of
knotted dark threads within the beam [4].
Here, we investigate the feasibility of producing these exotic structures in the rather more confined
space of a modern TEM, with finite aperture positioning and strict paraxial limitations. Adjusting
the phase hologram technique of Leach et al [3], we have produced a design for a TEM phase mask
(see figure 1 and 2). Such a design is more detailed and technologically challenging than those
produced so far in the electron vortex research field [5], but may just be within reach to enable the
study of these unusual topological electron structures for the first time.


References
[1] Clark, L., et al. "Symmetry-constrained electron vortex propagation." Under review, arXiv preprint
arXiv:1603.00687 (2016).
[2] Lubk, Axel, et al. "Topological analysis of paraxially scattered electron vortex beams." Physical Review A 87.3
(2013): 033834.
[3] Leach, J., et al. "Vortex knots in light." New Journal of Physics 7.1 (2005): 55.
[4] Leach, Jonathan, et al. "Laser beams: knotted threads of darkness." Nature 432.7014 (2004): 165.
[5] Shiloh, Roy, et al. "Sculpturing the electron wave function using nanoscale phase masks." Ultramicroscopy 144
(2014): 26-31.


Acknowledgements
LC and JV acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC
Starting Grant No. 278510-VORTEX. JV acknowledges financial support from the European Union under the 7th
Framework Program (FP7) under a contract for an Integrated Infrastructure Initiative (Reference No. 312483
ESTEEM2).


Laura CLARK (Antwerp, Belgium), Jo VERBEECK
08:00 - 18:15 #6848 - IM07-381 Remnant states and magnetic coupling in Co/Cu multilayered nanowires observed by electron holography.
IM07-381 Remnant states and magnetic coupling in Co/Cu multilayered nanowires observed by electron holography.

Magnetic nanowires (NWs) are of great interest due to their potential applications in technological devices and fundamental analysis in the spintronic field[1]–[3]. Among the wide diversity of NWs, the multilayered ones appear as good candidates for studying the spin torque phenomenon, and increasing the radio frequency (RF) output power by designing nano-oscilators connected in series[4], [5]. For this propose the fundamental study of the magnetic states and coupling in cylindrical multilayered NWs is required. The resulting remanent states in these one-dimensional multilayered systems will be the result of the competition between the shape anisotropy, crystal anisotropy, exchange interactions and the dipolar coupling that occurs due to the interlayer character.

 

In this work we have used electron holography (EH) technique to reveal the remnant states of Co/Cu multilayered NWs after applying a saturation magnetic field perpendicular (PP) and parallel (PL) to the wire axis. Cylindrical Co/Cu multilayered NWs were prepared by electrodeposition technique using the single bath method, and polycarbonate membrane to allow the wires growth. Local chemical analysis has been performed by energy-filtered TEM (EFTEM) to distinguish and measure the thickness of the Co(Cu) layers founding 42 nm (46 nm) as its average value. Figure 1 c shows a EFTEM map with the positions of cobalt and copper layers for a wire with 80nm of diameter. For elucidating the different local remnant states along the wire, magnetic phase shift images retrieved by EH experiments were compared with those calculated from micromagnetic simulations (See Figs 1 a and b). We found that the resulting remnant states present a strong dependence with the local morphology of the layers (Co and Cu thicknesses, NW diameter, Co/Cu interface tilting) and the magnetic coupling between consecutives Co layers. Surprisingly only a weak effect due to the applied magnetic field direction was observed. For the studied nanowires, the ferromagnetic layers can present either a monodomain state perpendicularly to the NW axis, or a vortex state where the core orientation is determined by the layer morphology and the magnetic interaction with neighbors Co layers. This latter state is the most observed magnetic state. Thus, the remnant magnetic state of the multilayered NW is formed by a mixture of monodomain and vortex states. Figure 1 d shows the 3D representation of the simulation, in which there are two vortices with different chirality and polarization, the cores of the vortices are tilted respect to the Z axis.

 

References

[1] S. Fukami, T. Iwabuchi, H. Sato, and H. Ohno, Jpn. J. Appl. Phys., vol. 55, no. 4S, p. 04EN01, Apr. 2016.

[2] C. Bran, E. Berganza, E. M. Palmero, J. A. Fernandez-Roldan, R. P. Del Real, L. Aballe, M. Foerster, A. Asenjo, A. Fraile Rodríguez, and M. Vazquez, J Mater Chem C, vol. 4, no. 5, pp. 978–984, 2016.

[3] A. Mourachkine, O. V. Yazyev, C. Ducati, and J.-P. Ansermet, Nano Lett., vol. 8, no. 11, pp. 3683–3687, Nov. 2008.

[4] J.-V. Kim, “Spin-Torque Oscillators,” in Solid State Physics, vol. 63, Elsevier, 2012, pp. 217–294.

[5] M. D. Stiles and J. Miltat, Springer, 2006, pp. 225–308.

 

Acknowledgments

This work was performed using HPC resources from CALMIP (Grant 2015-1428), the ANR EMMA 12-BS10-0013 and NASSICS 12-JS10-008 01 projects, and the French microscopy network METSA.


David REYES (Toulouse), Luis Alfredo RODRÍGUEZ, Bénédicte WAROT-FONROSE, Nicolas BIZIERE, Travis WADE, Christophe GATEL
08:00 - 18:15 #6854 - IM07-383 Inside a FeRh layer during the ferromagnetic/antiferromagnetic transition: a quantitative study by off-axis electron holography.
IM07-383 Inside a FeRh layer during the ferromagnetic/antiferromagnetic transition: a quantitative study by off-axis electron holography.

The ordered FeRh alloy presents very intriguing magnetic properties, among which a remarkable magnetic phase transition from an antiferromagnetic (AF) state at low temperature to a ferromagnetic (F) state just above room temperature accompanied by a 1% volume expansion upon entering the FM state [1-2]. In recent years, this alloy has encountered a huge regain of interest for its strong potential for future applications: its properties can be usefully exploited in new devices for microelectronics, heat-assisted magnetic recording [3-5] or magnetic random access memories based on AFM spintronics [6].

Many studies are devoted to the understanding of the ferromagnetic/antiferromagnetic transition mechanism in FeRh and several models have been proposed. In most of these studies, magnetic properties are measured through macroscopic measurements on the whole film. A local magnetic study could provide new insights regarding the transition process, by clarifying phenomena happening at a nanometer scale.

We propose to bring new details on the F-AF transition in a FeRh layer by acquiring quantitative magnetic mapping at the nanoscale on a cross section. The experimental technique that combines high sensitivity to the electromagnetic field up to nanometer resolution on a cross sectional sample with an in situ temperature control is the electron holography (EH) in a TEM. We have then achieved to get magnetic mapping of a 50 nm FeRh layer grown on a MgO substrate through the F-AF transition (Fig. 1a).

The evolution of the induction as a function of temperature has been recorded at a local scale and shows similar features than the one obtained by macroscopic measurements (Fig. 1b). However we observed heterogeneity of the transition in the film thickness: near the interfaces, the magnetic transition from the AF state to the F state starts much earlier and is spread over a wider range of temperature than in the middle of the layer (Fig. 2). The interfaces not only lower the transition temperature, but make this transition more difficult to achieve over a long distance. The presence of structural defects (dislocations, ...) at the interface with the substrate but also the breaking of symmetry significantly locally modifies the transition F / AF.

Various schemes of the transition have also been evidenced (Fig. 3). For instance, in the heating process (AF->F), "homogeneous" transition to the F state at interfaces starts first, following by a F domain nucleation in layer that begins even if the transition at interfaces is not completed, growth of the F domains within the AF matrix and then coalescence until the complete disappearance of the AF state. One of the most remarkable results during the F domain growth is the constant period of about 100 nm reflecting the regular alternation of the areas F and AF (Fig. 3). Note that the value of this period is comparable to the distance between dislocations to get a complete relaxation of a FeRh layer on MgO (80 to 100 nm) and could explain the nucleation F domain pinned by structural defects such as dislocations.

 

[1] M. Fallot, Ann. Phys. (Paris) 10, 291 (1938); M. Fallot and R. Hocart, Rev. Sci. 77, 498 (1939)

[2] M. R. Ibarra and P. A. Algarabel, Phys. Rev. B 50, 4196 (1994)

[3] J. U. Thiele, S. Maat, E.E. Fullerton, Appl. Phys. Lett. 82, 2859 (2003),

[4] J. U. Thiele, S. Maat, J. L. Robertson, E.E. Fullerton, IEEE Trans Mag.,40, 2537(2004)

[5] R. O. Cherifi et al., Nature Materials 13, 345 (2014).

[6] X. Marti et al., Nature Materials 13, 367 (2014). 


Christophe GATEL (CEMES, Toulouse), Bénédicte WAROT-FONROSE, Luis-Alfredo RODRIGUEZ, David REYES, Nicolas BIZIERE, Robin COURS, Marie-José CASANOVE
08:00 - 18:15 #6857 - IM07-385 DPC measurements on annealed cobalt thin films.
IM07-385 DPC measurements on annealed cobalt thin films.

In this work we present the results of differential phase contrast (DPC) [1,2] measurements of micro magnetic field distributions in annealed cobalt thin films. The polycrystalline specimens with a thickness of about 50 nm were produced by thermal boat evaporation under high vacuum conditions. After annealing the average size of individual cobalt crystals is increased and their magnetic properties are changed as shown by G. Herzer in [3] and [4]. Our goal was to determine, if DPC is a suitable technique to investigate how these changes in the crystallographic structure effect the magnetic properties of our specimen. Therefore we performed single DPC measurements as well as DPC tilting series to investigate if and how the magnetic behaviour of the annealed cobalt films is changed.

We investigated 5 different samples. One being the untempered thin film and the others were annealed over one hour with increasing temperatures ranging from 520 K to 820 K. To investigate the magnetic properties we performed a DPC tilt series for each sample. By tilting the specimen relative to the magnetic field of the objective lens we change the effective external in plane field on our samples. This leads to a change of the in plane induction in our cobalt thin films. We started each tilting series at large angles of α=20°, to be sure that all magnetic moments in our specimen are aligned in one direction. Figure 1 shows a DPC measurement of such a saturated state. The homogeneous green colour of the measurement confirms that the magnetic induction is saturated along the direction indicated by the colourwheel. Figures 2-4 show an excerpt of DPC measurements performed during the tilt series of the specimen annealed at 850 K. It can be seen, that the magnetic structure changes with decreasing α and it seems, that one of the magnetic ripples is pinned to the highlighted crystallites in the center of figures 2 and 3.

By calculating the average direction and strength of the beam deflection for each individual DPC measurement we get information about the dependency between the magnetic induction and the tilting angle respectively the external magnetic field applied. We will present the results of our measurements on the different annealed specimen showing hysteretic behaviour of the magnetic induction and discuss the differences between them.

During our experiments especially the tilt series, which take about 4 hours to obtain, we encountered some difficulties with the DPC technique. In this work we will present these shortcomings and show solutions to some of the problems occured.

[1] J. N. Chapman, The Investigation of Magnetic Domain-structures In Thin Foils By Electron-microscopy, J. Phys. D: Appl. Phys. 17, 623-647 (1984)
[2] H. Rose, Phase Contrast in Scanning Transmission Electron Microscopy, Optik 39, 4, 416-436, (1974)
[3] G. Herzer et al., Grain structure and magnetism of nanocrystalline ferromagnets,IEEE Transactions on Magnetics 25, 3327-3329, (1989)
[4] G. Herzer et al., Grain size dependence of coercivity and permeability in nanocrystalline ferromagnets,IEEE Transactions on Magnetics 26, 1397-1402, (1990)


Thomas BEER, Felix SCHWARZHUBER (Regensburg, Germany), Josef ZWECK
08:00 - 18:15 #6939 - IM07-387 Transport of Intensity Equation (TIE) without filtering and TIE videos.
IM07-387 Transport of Intensity Equation (TIE) without filtering and TIE videos.

In the transmission electron microscope (TEM) almost all specimens are very thin and create mainly phase shifts of the electron beam, hardly any absorption. The phase shift gives a lot of information about the specimen like e.g. thickness modulations, electric fields or magnetic fields. Measuring the phase by conventional imaging techniques is quite difficult as in general only changes in intensity are detected.

One way to get the phase difference between object wave and a reference wave is the transport of intensity equation (TIE) which was initially developed for light microscopes [1]. The most common use of the TIE is to input a linear approximation for the intensity changes which occur when the image is taken at different values of defocus along the z direction and then to solve the equation for the phase. Thus it is possible to calculate the phase in good approximation. From the phase it is e.g. possible to evaluate direction and strength of intrinsic magnetic and electric fields of the specimen.

Recent publications use mainly a commercially available software to perform TIE calculations [2-4]. This software uses different filter algorithms which are not all known to the user. Therefore it turns out to be difficult to interpret the TIE reconstructions as the the filtering may create measurement artifacts.

Here we present a home written TIE Matlab code to calculate the phase. Our aim was to create a transparent code where the user is aware of all parameters. We use as little filtering as possible to minimize the room for misinterpretations and clearly show where modifications have been made to the original data. We are even able to calculate useful TIE images without any filtering as shown in figure 1.

Our software is capable of calculating magnetic or electric field maps from focal series (in-focus, over-focus, under-focus). Further, it is possible to create automated multiple TIE images for videos to visualize e.g. the temporal development of a magnetic structure. We show one example of a fluctuating skyrmion lattice in Cu2OSeO3.

We will provide the code as a Matlab applet for everybody interested for free.

 

References


[1] Michael Reed Teague, Deterministic phase retrieval: a Green’s function solution, J. Opt. Soc. Am. 73, 1434-1441 (1983).

[2] Kazuo Ishizuka, and Brendan Allman, Phase Measurement in Electron Microscopy Using the Transport of Intensity Equation, Microscopy Today 13, 22-24 (2005).

[3] Yu, X. Z. et al. Real-space observation of a two-dimensional skyrmion crystal. Nature 465, 901–904 (2010).

[4] X. Z. Yu, N. Kanazawa, Y. Onose, K. Kimoto, W. Z. Zhang, S. Ishiwata, Y. Matsui, Y. Tokura, Near room-temperature formation of a skyrmion crystal in thin-films of the helimagnet FeGe, Nature Materials 10, 106–109 (2011).


Johannes WILD (Regensburg, Germany), Michael VOGEL, Felix SCHWARZHUBER, Christian BACK, Josef ZWECK
08:00 - 18:15 #6971 - IM07-389 Low dose electron holography using direct-electron detection camera.
IM07-389 Low dose electron holography using direct-electron detection camera.

The advent of commercially-available direct detection cameras (DDCs) for transmission electron microscopy (TEM) offers the opportunity to reduce noise in images and diffraction patterns as well as providing fast frame rates for image recording. For sufficiently low dose rates, their design can enable significant improvements in detective quantum efficiency (DQE) and modulation transfer function (MTF) when compared to conventional charge-coupled device (CCD) cameras. Existing literature on DDCs is focused predominantly on structural biological applications, where they provide clear advantages under low dose conditions, e.g., typically < 10 eÅ−2 .  Whereas the characteristics of DDCs at dose rates and spatial resolutions that are applicable to biological materials are already well established, in many other areas of TEM the dose rate can exceed 1000 eÅ−2, while the spatial resolution can vary from nanometers to better than 1 Å. In these contexts, the benefit of DDCs is less clear.

Here, we examine this question in the context of high-resolution phase contrast imaging and off-axis electron holography and demonstrate that the improved MTF and DQE of a DDC result in clear benefits over conventional CCD cameras. For electron holography, we find a significant improvement in the holographic interference fringe visibility and a reduction in statistical error in the phase of the reconstructed electron wavefunction.  In addition,  we show that at least three-fold improvement in optimum phase resolution using the counting mode provided by DDC with four time less dose rate compared that of a conventional CCD camera (with a fringe spacing of 83pm in this case). Further improvement in SNR could be obtained by correlation and averaging over a series of holograms. As a result of the low camera noise, the correlation of individual hologram is robust even at low dose rates, and the averaging leads to an improvement in SNR that is close to the ideal root-N behavior (N being the number of images). 

Using BiFeO3 on DyScO3 substrate as an example, we demonstrate that both specimen and birpism fringe drift can be successfully correlated over 100 frames of hologram (total exposure of 20 sec at a dose rate of 10 eper pixel per sec), as shown in Fig. 2.  Our results show that DDCs are highly beneficial for electron holography (and similarly to high-resolution TEM ) at low dose rates, thereby minimising potential specimen damage while maintaining an adequate SNR for analysis.


Shery CHANG (Tempe, USA), Lei JIN, Juri BARTHEL, Rafal DUNIN-BORKOWSKI, Christian DWYER
08:00 - 18:15 #6302 - IM08-391 Model calculations for low-loss EEL spectra of 2D multilayer systems.
IM08-391 Model calculations for low-loss EEL spectra of 2D multilayer systems.

Collective electronic excitations (plasmons) in single-layer and few-layer graphene have been studied extensively in the past few years. In particular, the dispersion and nature of the π plasmon peak in free-standing single-layer graphene was investigated by means of momentum-resolved electron energy-loss spectroscopy (MREELS) [1-3]. Besides, it was also studied how the transition from mono- to multilayer graphene changes the shape of EEL spectra. Within a layered electron-gas (LEG) model, this transition can be modeled very precisely [4,5].

For other 2D materials such as transition metal dichalcogenides (TMDs), however, this approach may be highly inaccurate. We therefore evaluate more precise model calculations for multilayer systems. Our calculations are based on time-dependent DFT calculations for the individual monolayers. The plane-wave pseudopotential DFT code abinit [6] is used to simulate the ground state within local density approximation (LDA). The linear response is then calculated within random-phase approximation (RPA) using the dp-code [7]. Compared to the LEG model where the monolayers are assumed to be perfectly 2-dimensional and homogeneous, we preserve the layers' microscopic structure in our calculations.

We demonstrate that only by taking the finite thickness of the constituent monolayers into account, the spectra of multilayer MoS2 can be modeled correctly (see the figure). Our calculations can be also applied to arbitrary van-der-Waals heterostructures. Our results are directly compared to MREEL spectra recorded with a Zeiss Libra 200 based TEM prototype (“SALVE I”, [8,2]) equipped with a monochromator and an Ω type in-column energy filter. This allows for the verification of our calculations over a large range of energy losses (0-40 eV) and different momentum transfers within the Brillouin zone. [9]

[1] Kinyanjui et al., EPL 97(5), 2012

[2] Wachsmuth et al., Phys. Rev. B 88, 2013

[3] Liou et al., Phys. Rev. B 91, 2015

[4] Jovanović et al., Phys. Rev. B 84, 2011

[5] Wachsmuth et al., Phys. Rev. B 90, 2014

[6] Gonze et al., Comput. Phys. Commun. 180(12), 2009

[7] Olevano et al., www.dp-code.org

[8] Kaiser et al., Ultramicroscopy 111(8), 2011

[9] We acknowledge financial support by the German Research Foundation (DFG) and the Ministry of Science, Research and Arts (MWK) of the state Baden-Württemberg within the Sub-Angstrom Low-Voltage Electron Microscopy project (SALVE).


Michael MOHN (Ulm, Germany), Ralf HAMBACH, Philipp WACHSMUTH, Ute KAISER
08:00 - 18:15 #6346 - IM08-393 Synchrotron Infrared Microspectroscopy, an innovative approach to investigate tissue chemical changes in mouse model of Pompe of disease (glycogenosis type II) and to assess efficiency in gene therapy.
IM08-393 Synchrotron Infrared Microspectroscopy, an innovative approach to investigate tissue chemical changes in mouse model of Pompe of disease (glycogenosis type II) and to assess efficiency in gene therapy.

Pompe disease is an autosomal recessive disorder caused by the deficiency of the lysosomal enzyme acid alpha-glucosidase (GAA). The disease is characterized by lysosomal glycogen storage in heart and muscles, and manifests as a fatal cardiomyopathy in infantile form. Cardiac correction by enzyme replacement therapy (ERT) has recently prolonged the lifespan of these patients, revealing a new natural history. The emergent neurologic phenotype and the poor correction of skeletal muscles in survivors are currently partly attributed to central nervous system (CNS) glycogen storage, uncorrected by ERT. A gene therapy strategy using AAV vectors delivered to cerebrospinal fluid has been set up to restore GAA activity into the CNS. We demonstrate the use of Infrared Micro spectroscopy with synchrotron light as an innovative tool to map glycogen at the subcellular level in motor neurons and cardiac fibers. Principal Component Analysis (PCA) of infrared spectral data from motor neurons and cardiac fibers show that both treated and wild-type animals are merged in the same cluster whereas infrared spectra obtained from untreated Pompe mice are characterized by increase of the bands assigned to the carbohydrates of glycogen.

This new analytical approach that allows an highly sensitive and resolutive direct probing of tissue glycogen is required to explore early biochemical change at a subcellular level and therefore to assess therapeutic efficiency for Pompe disease.

Acknowledgments : We thank the vector core of the Atlantic Gene Therapies Institute (AGT) in Nantes for the preparation of the rAAV vectors, Véronique Blouin and Philippe Moullier (INSERM UMR1089) for vector production and the technical staff of Oniris rodent facility for animal care. We acknowledge assistance from SOLEIL SMIS beamline staff for his help. This work was supported by a  grant from “Investissement d'Avenir - ANR-11-INBS-0011”  - NeurATRIS :  A Translational Research Infrastructure for Biotherapies in Neurosciences


Laurence DUBREIL (INRA/ONIRIS), Juliette HORDEAUX, Johan DENIAUD, Lydie LAGALICE, Karim BEY, Christophe SANDT, Frederic JAMME, Marie-Anne COLLE
08:00 - 18:15 #6347 - IM08-395 Towards atomic magnetic measurements with single electron vortex beams on FePt nanocubes.
IM08-395 Towards atomic magnetic measurements with single electron vortex beams on FePt nanocubes.

X-ray magnetic circular dichroism is a well-established method to study element specific magnetic properties of a material, while electron energy-loss magnetic chiral dichroism (EMCD), which is the electron wave analogue to XMCD, is scarcely used today. Recently discovered electron vortex beams, which carry quantized orbital angular momenta (OAM) L, promise to also reveal magnetic signals [1]. Since electron beams can be easily focused down to sub-nanometer diameters, this novel technique provides the possibility to quantitatively determine local magnetic properties with unrivalled lateral resolution. In order to generate the spiralling wave front of an electron vortex beam with an azimuthally growing phase shift of up to 2p and a phase singularity in its axial centre, specially designed apertures are needed [2,3]. Dichroic signals on the L2 and L3 edge are expected to be of the order of 5% [4,5].

 

The generation of EVBs in the double aberration-corrected FEI Titan3 80-300 transmission electron microscope (TEM) is achieved by the implementation of a dislocation-type apertures into the condenser lens system. The setup allows for scanning TEM investigations (STEM) with vortex beams, whose OAM is selected by means of an additional discriminator aperture. New FIB cutting strategies facilitate the production for 50 µm wide and 1 µm thick high quality vortex apertures (see fig. 1a).  However, in the case of a fork-type aperture, the EVB are dispersed in the x-y plane resulting in mixed probe that interacts with the magnetic sample.

 

We have recently devised an escape route to this problem by blocking any partial beams that carry other but the desired OAM prior to the interaction of the beam with the ferromagnetic sample. This is achieved by using a special condensor aperture in combination with a fork-type aperture to select a single partial beam with the chosen OAM (s. fig 1b). This approach allows to generate atom-sized EVB with angstrom-sized probes and a well-defined OAM by which atomic resolution HR-STEM is achieved (see. fig 2). Although this discretization results in an increased signal-to-noise ratio, this novel technique is capable of atomic resolution EELS measurements which is the prerequisite for atomic EMCD measurements. First experiments using this new optical setup show very promising EMCD results on ferromagnetic FePt nanoparticles.

 

[1] J. Verbeeck et al., Nature 467 (2010), p. 301-304.

[2] J. Verbeeck et al., Ultramicroscopy 113 (2012), p. 83-87.

[3] D. Pohl et al., Ultramicroscopy 150 (2015), 16-22.

[4] P. Schattschneider et al., Ultramicroscopy 136 (2014), p. 81-85.

[5] J. Rusz and S. Bhowmick, Phys. Rev. Lett. 111 (2013), 105504.


Darius POHL (Dresden, Germany), Jan RUSZ, Jakob SPIEGELBERG, Sebastian SCHNEIDER, Peter TIEMEIJER, Kornelius NIELSCH, Bernd RELLINGHAUS
08:00 - 18:15 #6391 - IM08-397 Measurement of energy-loss anisotropy along [001] in monoclinic hafnia and comparison with ab-initio simulations.
IM08-397 Measurement of energy-loss anisotropy along [001] in monoclinic hafnia and comparison with ab-initio simulations.

Abstract- Monochromated aberration-corrected STEM-VEELS (Valence Electron Energy-Loss Spectroscopy) measurements are performed on monoclinic hafnia. The maximum energy-loss anisotropy is observed for the [001] orientation, in agreement with ab-initio TDDFT simulations. From the fine structure of the energy loss spectra, the hypothesis of a possible Fano effect on the Hf 5p edge may be investigated.

  1. Introduction

Nanoscopy inside a transmission electron microscope opens a large field of applications, in particular in the semiconductor industry. VEELS has been developed to map the opto-electronic properties at a subnanometer scale inside a HR(S)TEM. A dielectric anisotropy in m-HfO2 has recently been observed1 by energy-filtered TEM. The agreement with ab initio simulations is nearly quantitative2 but the anisotropy along [001] and the finest structures of the spectra have not been published yet. The motivation of this presentation is to compare STEM-VEELS spectra recently recorded at high energy resolution with their ab initio simulations.

  1. Methodology 

STEM measurements are performed with the FEI Titan Ultimate aberration-corrected STEM in monochromated mode with an energy resolution of 0.17 eV. The convergence and collection angles are 15.6 and 20 mrad respectively. The 25 nm-thick samples are prepared with a dedicated3 FIB, following a procedure optimized for VEELS measurements. The time-dependent density-functional theory (TDDFT) simulations are generated with the DP4 code using the random phase approximation including local field effects.

  1. Results and discussion

The structure of monoclinic hafnia is usually complex because of the presence of small overlapping nanocrystals separated by intermixed defective interfaces. Therefore it is rather difficult to find an isolated HfO2 grain with the well-defined [001] orientation, as checked by HRTEM focal series and associated JEMS simulations (fig. 1). The agreement between experimental and simulated diffraction patterns is also nearly perfect. The highest anisotropy in EELS spectra, is observed for the [001] orientation around the plasmon peak position (~ 16 eV, see fig. 2), when compared to random orientation spectra and with the reference spectrum of Couillard et al.5[A1]  . The agreement with ab-initio simulations is also remarkable (fig. 3), especially in terms of predicted peak positions, although measurements realized on a perfect single crystal of m-HfO2 would improve the comparison. With the high energy resolution of our instrument, the Fano effect suggested to be responsible for the spectral dip associated with the excitation of the Hf 5p electrons in m-HfO2 can be more finely investigated. The associated asymmetric line shape can be identified around 42.3 eV, with a resonance width of 0.8 eV and a coupling factor of 0.6.  The optical absorption spectra deduced from a Kramers-Krönig analysis also confirm the occurrence of such an effect in m-HfO2.

  1. CONCLUSIONS

Monochromated STEM experiments demonstrate a clear anisotropy between [001] and other crystal orientations in m-HfO2. This anisotropy is mostly visible around the plasmon energy (16 eV).  The statistical analysis of thousands of EELS spectra confirms the existence of a Fano effect around 42.3 eV to be associated with the excitation of the Hf 5p electrons.

Acknowledgments: This work has been carried out in the nanocharacterisation platform (PFNC) of MINATEC.

[1] C. Guedj et al., Appl. Phys. Lett. 105, 222904 (2014)

[2] L. Hung et al., submitted to Phys. Rev. B (2016) 

[3] C. Guedj et al., submitted to IPFA conference (2016)

[4] http:\\www.dp-code.org

[5] M. Couillard et al., Phys. Rev. B 76, 165131 (2007)


Cyril GUEDJ (GRENOBLE CEDEX 9), Nicolas BERNIER, Christian COLLIEX, Valerio OLEVANO
08:00 - 18:15 #6396 - IM08-399 Some applications of analytical electron microscopy and high-resolution spectroscopy in the study of functional materials.
IM08-399 Some applications of analytical electron microscopy and high-resolution spectroscopy in the study of functional materials.

Electron microscopy has always played an important role in the development of new materials and for understanding properties of complex functional materials. The recent developments in instrumentation have significantly improved the insight that such techniques can provide, particularly for nanoscale materials and for fundamental studies related to bonding and electronic structure. In the area of functional materials, namely energy storage and conversion materials, plasmonic structures, and quantum materials, detailed microscopy is needed to optimize material properties and to understand their electronic properties. Here we highlight recent examples of work related to the study of functional materials, illustrating the crucial role of imaging and spectroscopy for the characterization and understanding of these materials.

 

Using an aberration-corrected TEM equipped with electron energy loss spectroscopy (EELS), we have studied the mechanism of cluster formation following atomic layer deposition on graphene nanosheets. We have also shown, with electron energy loss near-edge structures (ELNES), that it is possible to detect the presence of N dopant atoms at different atomic sites [1]. With high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and EELS, we have studied the evolution of alloy catalysts following in-situ and ex-situ annealing procedures. Starting with a disordered PtFe nanoparticle, we captured the ordering transformation, showing evidence of the formation of ordered Pt and Fe rich planes, and evidence of both Pt and Fe-rich shells over an ordered core (Figure 1) [2]. We also showed that the Pt surface segregation induces local strain and atomic displacements [2] (Figure 2) that can be further correlated to the enhanced activity of the material [3,4]. Using in-situ heating, it has also been possible to study the alloying phenomena of AuPt nanoparticles showing evidence of full miscibility starting at 200ºC (Figure 3), well below the thermodynamically expected temperature. At high-temperature, we have also detected the formation of unexpected ordered structures (Figure 4). Furthermore, we found that the annealing leads to mostly phase separation and monolayer surface segregation [5]. In a related catalyst system, we have been able to study the evolution of catalysts and hybrid supports, visualizing the presence of single atom dissolution of catalysts [6].

 

Similar approaches have been used to study the structure of LiNixMnyCo1-x-yO2 (known as “NMC”) and (Li rich) NMC compounds. In this work, using a combination of HAADF-STEM and EELS, together with multiple-linear least squares fitting, we have demonstrated the mechanisms of charge compensation, following electrochemical cycling and the presence of monolayer-like surface changes in the valence of transition metal ions. STEM imaging and ELNES demonstrate the presence of local heterogeneities in the Li and transition metal distribution and in the local carriers distribution. The same techniques are used to probe the localization of charges in a variety of high-temperature superconductors [7,8]. Finally, examples of plasmonic imaging of hybridization phenomena in metallic nanostructures, together with rigorous simulations of the optical response, will be shown [9]. These examples highlight the power and versatility of analytical techniques in the TEM to solve important materials science and fundamental physics problems.

 

[1] S. Stambula et al., Journal of Physical Chemistry C, 118, 3890-3900, (2014)

[2] S. Prabhudev et al., ChemCatChem, 7, 3655-3664, (2015)

[3] S. Prabhudev et al., ACS Nano 7, 6103-6110,  (2013)

[4] M.C.Y. Chan et al., Nanoscale, 4 (22), 7273-7279, (2012)

[5] S. Prabhudev, C. Chiang, M. Chatzidakis et al., In Communication

[6] L. Chinchilla-Reyes, D. Rossouw et al. In Preparation

[7] N. Gauquelin et al., Nature Communications 5,  4275.  (2014)

[8] M. Bugnet et al., Science Advances, 2, (3), e1501652, (2016)

[9] E.P. Bellido et al., ACS Photonics, 3 (3), 428–433, (2016)


Sagar PRABHUDEV, Samantha STAMBULA, Lidia CHINCILLA, Hanshuo LIU, Edson BELLIDO, Isobel Claire BICKET, Alexandre POFELSKI, Steffi Y WOO, Matthieu BUGNET, Stefan LOEFFLER, David ROSSOUW, Christian WIKTOR, Gianluigi A BOTTON (Hamilton, Canada)
08:00 - 18:15 #6426 - IM08-401 Great advantages of using low voltage HR-SEM in spatial resolution and sensitivity for low energy X-ray analyses.
IM08-401 Great advantages of using low voltage HR-SEM in spatial resolution and sensitivity for low energy X-ray analyses.

Understanding surface fine features, such as topological and compositional information, is essential for controlling synthesis conditions of these materials and for designing novel materials and utilizing their functions. The materials are becoming complicated composites composed of Nano crystals in order to have functions with better performance.  Therefore, higher spatial resolution, sensitivity and capability are required for characterization techniques are required now. The recent developments in compound type objective lens, electron beam deceleration method, high solid angle multi EDS system and Soft X-ray Emission Spectrometry (SXES) of high-resolution scanning electron microscopy (HR-SEM) show great advances for the study of structures, chemical information, and electron state of Nano structured materials (1). Here, we will discuss newly developed spectroscopy approaches in EDS and SXES, and show some of their examples using low voltage (LV) HR-SEM.

The electron beam deceleration method brings a lot benefits. Because it is improving size of electron beam diameter due to smaller aberration even at LV condition, high probe current condition and long working distance (2).  Fig. 1 shows high spatial resolution EDS map from Au@TiO2 Yolk-shell type sample where a gold nanoparticle with 15 nm in diameter is encapsulated in a TiO2 hollow sphere. The gold nanoparticles are well resolved within 3 min even at low electron landing-energy (see observation conditions in the Fig caption).

The low energy SXES spectra obtained from Al-B nano composites are shown in Fig. 2. SXES technique requires high probe current to acquire enough X-ray signals as it is based on wavelength dispersive spectrometry (WDS). The spectra from small area of aluminum alloy (a) and aluminum boride (b) show different peak top energy and shape for aluminum L-line at around 70 eV. In addition, the boron peak was also detected at around 67 eV. The spectra at this energy range, which corresponds to K-line from light elements including Lithium, was hard to observe by EDS and WDS before. So the SXES detector has high-energy resolution and can also detect extremely low energy X-ray. 

The electron beam deceleration method has advantages in SXES analysis.  We demonstrated SXES line profiles in between metal Aluminum and Aluminum boride in Fig. 3. Actually, there is deference between with beam deceleration method or not even at 5 keV with 30 nA. Compares to Line (b) and (c), Electron beam deceleration method of line (c) shows better sharpness and details of spectrum than line (b). Probably it is due to smaller probe size was created by electron beam deceleration method. Here we have also tired low voltage condition that is 1 keV with -5 keV sample bias in line (a).  The line (a) shows much higher spatial resolution line profile due to smaller interaction volume in sold than 5 keV.  

Reference

1) M. Terauchi, H. Yamamoto and M. tanaka, Journal of Electron Microscopy, 50, 101, (2001)

2) S. Asahina, M. Suga, H. Takahashi, H. Y. Jeong, C. Galeano, F. Schuth, and O. Terasaki,. APL Materials 2, 113317 (2014); doi: 10.1063/1.4902435


Asahina SHUNSUKE (Tokyo, Japan), Takahashi HIDEYUKI, Takakura MASARU, Ferdi SCHÜTH, Terasaki OSAMU
08:00 - 18:15 #6437 - IM08-403 Probing the directionality of local electronic states in SrTiO3 by momentum-selected STEM-EELS.
IM08-403 Probing the directionality of local electronic states in SrTiO3 by momentum-selected STEM-EELS.

  Electron energy-loss spectroscopy in the scanning transmission electron microscope (STEM-EELS) enable to investigate the local electronic states at the specific atomic column selected by an incident electron probe. Even though the same elements, crystallographically non-equivalent atoms give the different energy-loss near-edge structure (ELNES) [1]. Although SrTiO3 has a single oxygen atom in the unit cell, the chemical bonds between Ti and O have directionality as shown in Fig. 1(a), depicting the ligand field orbital with eg symmetry formed by Ti-dx2−y2 and O-p orbital. If the oxygen K-edge ELNES is acquired with an off-axis collection aperture to select a specific direction of momentum transfer, the intensity related to the transition to the unoccupied eg state should vary with O1 and O2 sites as predicted previously [2]. In this study, we show that the directionality of local electronic states at different oxygen sites can be detected by momentum-selected STEM-EELS.

  STEM-EELS measurements were performed using Cs-corrected STEM (JEM-9980TKP1 equipped with a cold-FEG and an omega filter) operated at 200 kV. Fig. 1(b) shows the setup of experiment. An electron probe with a convergence semi-angle (α) of 23 mrad incidents along the c-axis of SrTiO3 and EEL spectra are recorded with the spectrum collection aperture (β = 10 mrad) placed at the edge of the transmitted beam disc along θy direction. In order to simulate the experimental results, the electronic structure of SrTiO3 was calculated by WIEN2k [3] based on the density functional theory, and the O-K edge ELNESs were calculated by TELNES3 code incorporated in WIEN2k.

  Fig. 2(b) shows the experimental O-K edge ELNES obtained by scanning electrons along two different O-TiO-O lines shown in Fig. 2(a). It is found that the intensity of peak b which can be assigned to the transition to the eg state is different between the two spectra. Since these spectra are acquired with a collection aperture shifted in the θy direction, the partial density of state of O-py hybridized with Ti-dx2-y2 state should predominantly contribute to the spectrum. Actually, the spectrum acquiring from the oxygen atoms aligned in the y-direction has an enhanced peak b, which is indicated that the present method can detect the directionality of Ti-O bonding at a specific oxygen site.

  Fig. 3(b) shows the O-K edge ELNES calculated by adding the contribution from the two oxygen sites shown in Fig. 3(a). The features in the calculated spectra are in good agreement with that of the experimental one, which verifies the reliability of the experimental finding.

References

[1] M. Haruta, H. Kurata, H. Komatsu, Y. Shimakawa and S. Isoda, Phys. Rev. B, 80, 165123 (2009).

[2] T. Mizoguchi, J. P. Buban, K. Matsunaga, T. Yamamoto and Y. Ikuhara, Ultramicroscopy, 106, 92 (2006).

[3] P. Blaha, K. Schwarz, G. Madsen, D. Kvasnicka and J. Luitz, WIEN2k, An Augmented Plane Wave Plus Local Orbital Program for Calculating Crystal Properties, edited by K. Schwarz (Vienna University of Technology, Austria, 2001).


Atsushi YAMAGUCHI (Uji, Kyoto, Japan), Mitsutaka HARUTA, Takashi NEMOTO, Hiroki KURATA
08:00 - 18:15 #6447 - IM08-405 Combined stem-eels and stem-cl analysis of plasmonic coupling between chemically grown silver nanocubes.
IM08-405 Combined stem-eels and stem-cl analysis of plasmonic coupling between chemically grown silver nanocubes.

These recent years, study of surface plasmon resonances in transmission electron microscope has undergone an increasing interest. Indeed, low-loss EELS has proven its remarkable efficiency to probe plasmonic resonances at the nanometer scale while recent developments in cathodoluminescence (CL) spectroscopy brought a new insight into the coupling of plasmons and far field [1]. Several types of particles have already been numerically and experimentally studied ranging from nano-disk to nano-prism which plasmonic behaviors are now fairly understood [2,3]. However, despite this systematic effort to characterize the widest variety of plasmonic nano-particles, some structures still remain challenging e.g. the nano-cube. In the latest case, the difficulties encountered are plural. First, this structure being highly symmetric, plasmonic modes exhibit a significant number of natural degeneracies leading to superposition or hybridization of modes, which dramatically harden their understanding. Second, cube's plasmonic modes turned out to be very sensitive to the geometry of the underlying nano-structure (e.g. edge rounding [4]) and to be strongly affected by the presence of substrate [5]. Third, particularly because of the degeneracies mentioned above, the coupling between two nanocubes brings unexpected difficulties, which are enhanced when the inter-particle gap goes below 1nm. Although this coupling has been widely tackled recently, no definitive theory has been given and this question remains controversial [6,7].

In the present work, we experimentally and numerically investigated plasmonic silver nanocubes and their coupling using STEM-EEL and STEM-CL spectroscopies (see figures 1 and 2) aiming at giving a clear and complete understanding of these modes. The cube samples have been prepared by chemical growth, which provides them a high degree of crystallinity. This property dramatically enhance the CL signal and thus enable us to obtain remarkably relevant CL-maps (see figure 2). For studying the coupling, in order to get rid of the quantum charge transfer problem arising at very small gap regime (<0.5nm), we restricted ourselves to inter-particle separations larger than 5nm. Complementary BEM simulations [8] have been carried out to understand on a deeper level the observed plasmonic modes by computing the corresponding charge distributions. We observed a good agreement between computations and experiments, which strengthen our conclusion. In addition to be consistent with the earlier studies, our work bring an overall understanding of the nanocubes coupling.

References

[1] Kociak, Stephan, Chemical Society Reviews 43, 3865-3883, 2014.

[2] Schmidt and al, Nano Lett. 12 (11), 5780–5783, 2012.

[3] Nelayah and al, Nano Lett. 10 (3), 902–907, 2010.

[4] Grillet and al, ACS Nano 5 (12), 9450–9462, 2011.

[5] Mazzuco and al, Nano Lett. 12 (3), 1288–1294, 2012.

[6] Tan and al, Science 243 (6178), 1496-1499, 2014.

[7] Knebl and al, Phys. Rev. B. 93 (8), 081405(R), 2016.

[8] Hohenester, Trügler, Comput. Phys. Commun 183, 370, 2012.


Hugo LOURENÇO MARTINS (Palaiseau), Yih Hong LEE, Yejing LIU, Hiang Kwee LEE, Mathieu KOCIAK, Xing Yi LING
08:00 - 18:15 #6486 - IM08-407 New version of the EELS database: eelsdb.eu.
IM08-407 New version of the EELS database: eelsdb.eu.

     Since its creation at the end of the 1990’s, the EELS and X-ray Absorption Spectroscopy (XAS) database has gathered more than 220 spectra covering 37 elements of the periodic table, becoming the largest open-access electronic repository of spectra from EELS and XAS experiments. The EELS database is now a common tool used by spectroscopists, theoreticians, students and private firms as a reference catalog for fine structures and data-treatment analyzes2-4 and has been referenced by more than 30 papers. Much of this success is due to the open-access nature of the database. The database depends on voluntary user contributions; to encourage these contributions, we have performed a major update of the website.

 

     The EELS and XAS database has been completely rewritten, with an improved design, user interface and a number of new tools. The database is accessible at https://eelsdb.eu/ (Fig. 1) and can now be used without registration. The submission process has been streamlined to encourage spectrum submissions (Fig. 2) and the new design gives greater emphasis on contributors’ original work by highlighting their papers. With numerous new filters and a powerful search function, it is now simple to explore the database of several hundred of EELS and XAS spectra. Interactive plots allow spectra to be overlaid, facilitating online comparison. An application-programming interface has been created, allowing external tools and software to easily access the information held within the database. In addition to the database itself, users can post and manage job adverts and read the latest news and events regarding the EELS and XAS communities.  In accordance with the ongoing drive towards open access data increasingly demanded by funding bodies, the database will facilitate open access data sharing of EELS and XAS spectra.5

 

Acknowledgement: The authors would like to thank the IMN and CEMES laboratories, the European microscopy network ESTEEM 2, the French microscopy network METSA and the French microscopy society Sfµ, for the funding. The authors warmly acknowledge everyone who has contributed to the database.

 

1. T. Sikora and V. Serin, EMC 2008 14th European Microscopy Congress, pp-439-440, Springer-Verlag Berlin (2008)

2. N. Bernier et al., Materials Characterization, 86, pp-116-126 (2013)

3. L. Zhang et al., Physical Review B, 81, 035102 (2010)

4. R. Núñez-González et al., Computational Materials Science, 49,  pp-15-20 (2010)

5. P. Ewels, T. Sikora, V. Serin, C.P. Ewels and L. Lajaunie, Microscopy and Microanalysis, In Press. DOI: 10.1017/S1431927616000179


Philip EWELS, Thierry SIKORA, Virginie SERIN, Chris P. EWELS, Luc LAJAUNIE (Zaragoza, Spain)
08:00 - 18:15 #6512 - IM08-409 Spectroscopic and chemical characterization at sub-nanometer scale using EELS.
IM08-409 Spectroscopic and chemical characterization at sub-nanometer scale using EELS.

Advanced materials require control of the structural properties at the sub-nanometer or atomic scale. This is mandatory in the case of interfaces for electronic devices, or in nanostructures, where the surface/interface has a fundamental role in view of their applications (e.g. nanoparticles for catalysis, functionalized nanoparticles, etc…). To fully characterize these systems, the chemical information at high spatial resolution (even at atomic scale) has to be achieved. This is possible by using electron energy loss spectroscopy (EELS) in a scanning transmission microscope (STEM), taking advantage of probe aberration correction and high resolution spectrometers. In this contribution we will show some examples of the use of this technique for resolving the oxidation state (valence) of atoms and their electronic configuration in different nanosystems. The first case is a CeO2/Pt epitaxial heterostructure, in which EELS from the Ce-M4,5 ionization edge reveals a one atomic thick layer of reduced Ce3+ atoms at the interface [1] due to the charge transfer between CeO2 and Pt, as predicted by theory (see Figure 1a). The second case focuses on magnetic FeCoOx nanoparticles (NPs), in which EELS mapping of the oxidation state of the metal atoms can be used to resolve a core/shell structure between wustite and magnetite, and its evolution in the oxidation process. (Figure 1b). Finally, recent results are shown on mapping the extension of the plasmons and excitons states in a coupled system as Au functionalized ZnO nanostructures (Figure 2). After careful fitting of the spectra, a signal resembling the ZnO exciton (NBE) is seen to extend in the metal nanoparticle [2,3].

ACKNOWLEDGEMENTS

[1] Luches, P. et al. Atomic Scale Structure and Reduction of Cerium Oxide at the Interface with Platinum. Adv. Mater. Interfaces, 2. doi: 10.1002/admi.201500375 (2015)

[2] Bertoni, G. et al. Nanoscale mapping of plasmon and exciton in ZnO tetrapods coupled with Au nanoparticles. Sci. Rep. 6, 19168. doi: 10.1038/srep19168 (2016)

[3] European Union FP7 Grant Agreement n. 265073 ITN-Nanowiring, and FP7 Grant Agreement n. 312483 ESTEEM2 for Integrated Infrastructure Initiative – I3


Giovanni BERTONI (Parma, Italy), Stuart TURNER, Giancarlo SALVIATI
08:00 - 18:15 #6541 - IM08-411 Revealing the Morphology of Organic Bulk Heterojunction Solar Cells Using EFTEM and Low-Energy STEM.
IM08-411 Revealing the Morphology of Organic Bulk Heterojunction Solar Cells Using EFTEM and Low-Energy STEM.

The morphology of organic bulk heterojunction (BHJ) solar cells decisively influences the device performance and efficiency and therefore is an important factor that needs to be investigated to gain a better understanding and improvement of the devices. Especially the nanoscale morphology of the active layer plays an important role as it determines the charge separation at the interfaces and the percolation pathways to the electrodes. This nanoscale morphology depends not only on the involved materials but also on their molecular weight and their treatment like thermal annealing and solvent vapor annealing.

Transmission electron microscopy (TEM) is an approved technique to study the morphology of organic solar cells. Due to the similarity of the organic materials involved in the BHJ active layer regarding the chemical composition and the formation of homogeneously thin films, the contrast in TEM images is often uniform and no significant structures can be seen. Thus conventional imaging techniques are often not sufficient to identify and distinguish the polymers and the fullerene derivatives. Here we will demonstrate that energy-filtered TEM (EFTEM) is a powerful technique to visualize the material distribution in organic BHJ active layers. We present three concepts using different information gained in EFTEM investigations: i) the elemental information, ii) the plasmonic information, and iii) pre-carbon imaging. We demonstrate that the results of these three concepts are in good agreement and that the morphology can be reliably and consistently determined using EFTEM. To corroborate the reliability of these three concepts we present different material systems.

Figure 1 shows the results of the EFTEM investigation for a P3HT:PCBM BHJ film. Due to the different plasmon energies of the materials (PP3HT = 21.9 eV, PPCBM = 24.5 eV) the respective plasmonic energy regions represent P3HT and PCBM in the blend. The elemental maps of sulfur and carbon are used to represent P3HT and PCBM, respectively, due to the different elemental compositions (SP3HT = 4.0 at%, SPCBM = 0.0 at%, CP3HT = 40.0 at%, CPCBM = 81.8 at%). Additionally, the pre-carbon image represents P3HT as the carbon signal is suppressed and the sulfur signal enhanced. These EFTEM investigations clearly elucidate the morphology of this blend exhibiting P3HT fibers with diameters of 10 nm. Comparing the results of the three concepts clearly shows the good agreement of the determined morphology.

Furthermore, we demonstrate the capabilities of low-energy scanning transmission electron microscopy (STEM). STEM at low electron energies exhibits enhanced material contrast and can therefore be used to visualize the material distribution of polymers and fullerene derivatives in a BHJ film. Figure 2 shows a STEM BF image of the same P3HT:PCBM BHJ film at a high tension of 15 kV. The P3HT fibers are clearly visible and consistent with the EFTEM investigation. The origin of material contrast will be discussed. Low-energy STEM is a highly promising alternative for determination of the morphology of organic BHJ solar cells as it features a high throughput SEM based technique.

Using EFTEM and low-energy STEM the morphology of various organic BHJ solar cells can be elucidated, leading to a better understanding and improvement of the device performance.



Acknowledgements:

Financial support by the German Science Foundation (DFG) within the frameworks of the SFB 953 “Synthetic Carbon Allotropes”, the Cluster of Excellence EXC 315 “Engineering of Advanced Materials”, the Research Training Group GRK1896 as well as by the Marie Curie Initial Training Network (ITN) within the European Union’s Seventh Framework Programme (Grant agreement no. 607585, OSNIRO) is gratefully acknowledged.


Stefanie FLADISCHER (Erlangen, Germany), Peter SCHWEIZER, Tayebeh AMERI, Christoph BRABEC, Erdmann SPIECKER
08:00 - 18:15 #6559 - IM08-413 High Resolution Chemical Imaging on the Helium Ion Microscope.
IM08-413 High Resolution Chemical Imaging on the Helium Ion Microscope.

The ORION NanoFab helium ion microscope (HIM) has become an ideal tool for imaging and nano-patterning tool owing to its high lateral resolution [1]. Helium ions lead to resolutions of 0.5 nm for SE based imaging, while structures with sub 20 nm feature sizes may be rapidly patterned using Ne. Despite these advantages, the analysis capability of the machine is currently limited. At beam energies of 35 kV helium ions do not lead to the emission of characteristic X-rays from a sample. While some compositional information can be obtained from back scattered helium [2], identifying elemental information is more difficult. Secondary Ion Mass Spectrometry (SIMS) is a powerful ion beam based technique for analyzing surfaces with high sensitivity and high mass resolution. SIMS is based on the generation and identification of characteristic secondary ions by irradiation with a primary ion beam (in this case helium or neon). The typical interaction volume for SIMS is around 10 nm in the lateral direction. As the probe size in the HIM is substantially smaller (both for He and Ne) the lateral resolution is limited only by fundamental considerations and not, as is currently the case on commercial SIMS instruments, the probe size [3-4]. The prospect of adding SIMS to the HIM yields not just a powerful analytical capability, but opens the way for in-situ correlative imaging combining high resolution SE images with elemental maps from SIMS [5].

We have developed a prototype SIMS spectrometer specifically adapted to the HIM. Notably the instrument is capable of producing elemental SIMS maps with lateral resolution limited only by the fundamental interaction between the primary beam and the sample. All elements/isotopes and small clusters with masses up to 500 amu are detectable with a mass resolution M/ΔM greater than 400 and parallel detection of 4 mass channels.

In this presentation we will introduce the HIM-SIMS technique and present the latest application results in the field of materials science.

 

References

[1] L. Scipioni et al, J. Vac. Sci. Technol. B 27 (2009) 3250

[2] G. Hlawacek, V. Veligura, R. Van Gastel , B. Poelsema, J. Vac. Sci. Technol. B 32 (2014) 020801

[3] T. Wirtz, N. Vanhove, L. Pillatsch, D. Dowsett, S. Sijbrandij, J. Notte, Appl. Phys. Lett. 101 (2012) 041601

[4] L. Pillatsch, N. Vanhove, D. Dowsett, S. Sijbrandij, J. Notte, T. Wirtz, Appl. Surf. Sci. 282 (2013) 908

[5] T. Wirtz, P. Philipp, J.-N. Audinot, D. Dowsett, S. Eswara, Nanotechnology 26 (2015) 434001


David DOWSETT, Jean-Nicolas AUDINOT, Florian VOLLNHALS, Santhana ESWARA (Esch-sur-Alzette, Luxembourg), Tom WIRTZ
08:00 - 18:15 #6583 - IM08-415 Quantitative energy dispersive X-ray spectroscopy on thin SiGe layers.
IM08-415 Quantitative energy dispersive X-ray spectroscopy on thin SiGe layers.

The precise measurement of Ge content is of utmost importance in SiGe technology. Analytical methods like X-ray diffraction (XRD) or secondary ion mass spectrometry (SIMS) allow the SiGe stoichiometry measurement in structures larger than 100 µm. However, for SiGe heterojunction bipolar transistors (HBT), Ge profiles in areas of typical transistor dimensions of about 100 nm are of interest.  (Scanning) transmission electron microscopy ((S)TEM) in combination with energy dispersive X-Ray spectroscopy (EDX) or electron energy loss spectroscopy (EELS) is one of the very few suitable methods for this purpose.

Here, we present an approach for measuring Ge profiles in small areas with a lateral resolution of about 5 nm using the Cliff-Lorimer method for quantification of EDX data of thin TEM samples and a calibration of the Cliff-Lorimer factors to Ge profiles measured by XRD in large areas. We have investigated thin SiGe layers with thicknesses of about 20 nm and Ge content of about 30 at%. The Ge content was proofed by XRD as well. For EDX analysis, we have used a TEM FEI Tecnai Osiris operated at 200 kV in STEM mode. The EDX quantification was performed with Cliff-Lorimer method using Esprit-Software from Bruker.  Measurements were taken on TEM sample with different thicknesses. The sample thicknesses were evaluated by EELS log-ratio method in silicon area close to the SiGe-layer [1]. Using this method, the specimen thickness is given in inelastic mean free path (mfp) units. The Cliff-Lorimer method is widely used for quantification of EDX data of thin TEM samples. However, there is an uncertainty in the Cliff-Lorimer factors for standard free measurements and the Cliff-Lorimer method neglects any absorption effects which may become important for thicker TEM samples. Therefore it is necessary to proof the accuracy of quantification by using calibration samples with known Ge concentration.   

Figure 1 shows bright field STEM images of a Si1-xGex layer with x=0.305 (a) and a SiGe HBT (b). Figure 2 shows Ge line profiles of SiGe layer from figure 1a quantified using the K edges of Si and Ge measured at different TEM sample thicknesses. The obtained Ge concentration does not directly depend on sample thickness. However for very thick samples with a thickness of 2.73 mfp or 4.17 mfp, the apparent Ge concentration is clearly reduced. It is possible to explain the lowered concentration of very thick samples by stray radiation of surrounding Si and limited lateral resolution. Figure 3a shows the lateral resolution which was determined from line profiles using the method suggested by Williams and Carter in [2]. Points with concentration of 10 % and 90 % of the maximum concentration were measured and the distance between these points is multiplied by a factor of 1.8. The results from figure 3a and figure 2 clearly show that the sample thicknesses in the range 0.5 mfp to 1.0 mfp are a good compromise between lateral resolution and adequate signal-to-noise ratio. However, even for usual sample thicknesses of 0.45 mfp or 0.77 mfp, we have obtained a Ge concentration above 30.5 at% for the quantification with Ge K edge using a Cliff-Lorimer factor of 2.386 and a slightly lower concentration for the quantification with Ge L edge.  This suggests that an adjustment of Cliff-Lorimer factors of Ge K edge and L edge for accurate quantified results of Ge concentration in SiGe samples is necessary. By using an adjusted Cliff-Lorimer factor of 2.2 for Ge K edge and sample thickness below 1.0 mfp an error below ±10 % and a resolution of about 5 nm is achieved. Figure 3b shows a Ge line profile measured on SiGe HBT from figure 1b using EDX and quantified with adjusted Cliff-Lorimer factor.

 

1. T. Malis, S.C. Cheng, and R.F. Egerton, J. Electron. Microsc. Tech. 8, 193-200, 1988

2. D.B. Williams and C.B. Carter, Plenum Press 1996, page 626


Markus Andreas SCHUBERT (Frankfurt (Oder), Germany), Peter ZAUMSEIL, Ioan COSTINA, Holger RÜCKER
08:00 - 18:15 #6587 - IM08-417 Detection of magnetic circular dichroism in amorphous materials utilizing a single-crystalline overlayer.
IM08-417 Detection of magnetic circular dichroism in amorphous materials utilizing a single-crystalline overlayer.

   Electron energy-loss magnetic chiral dichroism (EMCD) in a transmission electron microscope allows the quantification of the magnetic structure of crystalline materials down to the nanometer scale [1-3]. However, restricted by a confined diffraction geometry applied in EMCD experiments [4], no experiments or theories have yet been performed to obtain EMCD signals for amorphous materials, due to their lack of long range ordering.

  In this work, we for the first time demonstrate it is possible to detect element-specific magnetic signals in amorphous materials utilizing a single-crystalline overlayer as an EMCD beam splitter. The approach is applied to a bilayer sample where a very thin amorphous magnetic FeOx layer is grown on a single-crystalline Yttrium-stabilized ZrO2 substrate. We found that both experimental results and theoretical calculations lead to unprecedented EMCD signals. The quantitative orbital to spin magnetic moment ratio of Fe in amorphous FeOx layer has been acheived.

  Our approach allows us to break through the constraint of crystal formats in EMCD spectra measurements, providing new prospects of detecting EMCD signals from amorphous and ultrathin materials at the nanometer scale. This approach might also be extended to the magnetic quantitative analysis of other heterogeneous materials at high spatial resolution.

  This work may open a door to meet the challenge of exploring magnetic states and behaviors of amorphous films, and have important consequences for revealing the magnetic structures of magnetic materials in various crystal forms at the nanoscale using transmission electron microscopy.

References

[1] Schattschneider, P., et al, Nature 441, 486 (2006).

[2] Rusz, J., et al, Phys. Rev. B 75, 214425 (2007).

[3] Wang, Z.Q., Zhong, X. Y., et al, Nat. Commun. 4, 1395 (2013).

[4] Lidbaum, H., et al, Phys. Rev. Lett. 102, 037201 (2009).

Acknowledgements

This work was financially supported by National 973 Project of China (2015CB921700, 2015CB654902), National Natural Science Foundation of China (51471096, 11374174, 51390471 and 51322101), Tsinghua University Initiative Scientific Research Program and National High Technology Research and Development Program of China (2014AA032904). This work made use of the resources of the National Center for Electron Microscopy in Beijing and Tsinghua National Laboratory for Information Science and Technology. J.R. acknowledges financial support of Swedish Research Council, STINT and Göran Gustafsson's Foundation. H.L. Xin. acknowledges support from the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DE-SC0012704. We are grateful to Prof. R. Yu, Dr. Y. Shao, Mrs. Z.Y. Cheng, Mr. D.S. Song for beneficial discussions, and Prof. P. Yu, Dr. Z.P. Li and Mr. Z.Y. Liao for providing the substrate and preparing the specimen.


Xiaoyan ZHONG (Beijing, China), Jie LIN, Song CHENG, Jan RUSZ, Huolin XIN, Bing CUI, Kocevski VANCHO, Lili HAN, Jing ZHU
08:00 - 18:15 #6599 - IM08-419 IR Nano-spectro-imaging: Characterization of polymeric nanoparticles and in vitro study of their interaction with cells.
IM08-419 IR Nano-spectro-imaging: Characterization of polymeric nanoparticles and in vitro study of their interaction with cells.

Recently near-field techniques play a fundamental role in Nanoscience microscopy. Two different ways exist to make infrared studies with near-field techniques: optical techniques measuring the transmitted signal coming from the nano-object or photothermal approachs using thermometer to link temperature to absorption measurements. Considering the limitations of the optical techniques, we have developed in our team an innovative photothermal technique called AFM-IR1. The AFM-IR technique is a user-friendly benchtop technique that enables infrared spectroscopy with a spatial resolution well below conventional optical diffraction limits. It acquires IR absorption imaging spectrally resolved with lateral resolution of tens of nanometer2.

First we will present the experimental set-up and some of the critical technical sides and then illustrate technological advances. Then we will show the result obtained on biodegradable polymeric nanoparticles. This work has been done in collaboration with the Institut of molecular science (ISMO). We have used this technique to characterize the composition of the nanoparticles (drug encapsulation, presence of lignad) and to localize them inside fixed macrophages at the subcellular scale.

[1] A.Dazzi, R.Prazeres, F.Glotin, J.M.Ortega, Opt. Lett., Vol. 30, Issue 18, 2388-2390 (2005).

[2] F. Lu, M. Jin, M.A. Belkin, Nat. Photon. 8, 307312 (2014).


Jérémie MATHURIN (Orsay), Elisabetta PANCANI, Ariane DENISET-BESSEAU, Ruxandra GREF, Alexandre DAZZI
08:00 - 18:15 #6614 - IM08-421 Probing the radiative and full electromagnetic local densities of states with electron energy loss spectroscopy and cathodoluminescence spectroscopy.
IM08-421 Probing the radiative and full electromagnetic local densities of states with electron energy loss spectroscopy and cathodoluminescence spectroscopy.

Electron Energy Loss Spectroscopy (EELS) and CathodoLuminescence spectroscopy (CL) map the surface plasmon modes of metallic nanoparticles at the nanometer scale [1]. Although they yield similar results, EELS and CL differ by nature. EELS measures the energy lost by fast electrons interacting with a sample whereas CL measures the energy of the light emitted from this interaction [2]. However, the consequence of this different nature has remained unexplored because combining EELS and CL on single nanoobjects could not be achieved.

We combined EELS and CL on single nanoobjects using a Scanning Transmission Electron Microscope (STEM) [3]. In a STEM, an electron beam is focused onto a nanometric probe that is scanned over the sample. At each point of the sample, the transmitted electrons are collected for EELS, while the emitted light is collected for CL; both a full EELS spectrum and a full CL spectrum are recorded. We studied small gold triangular nanoprisms as a model system (Fig. 1a). The combination of EELS and CL allows us to map the same surface plasmon modes using both techniques (Fig. 1b and c).

We showed that CL only probes the dipolar mode, contrary to EELS that probes both the dipolar and quadrupolar modes. Furthermore, the dipolar mode resonates at shifted resonances in EELS and CL for prisms with edge lengths larger than 100 nm relying on carbon substrate (Fig. 2a). The magnitude of the shift relates to the mode damping.

Having demonstrated that EELS and CL signals differ, we showed that the full and radiative ElectroMagnetic Local Densities Of States (EMLDOS) differ similarly (Fig. 2b) [4]. Whereas EELS measures a quantity close to the full EMLDOS projected along the electron direction [5], CL measures a quantity close to the radiative EMLDOS projected along the electron direction [4]. Contrary to EELS, CL probes only the radiative modes, which are not necessarily dipolar for object sizes beyond the quasistatic limit. The ratio of the CL resonance to the EELS resonance quantifies the radiative weight of the mode damping. If the modes are damped and induce interfering radiation, CL resonant line shapes are shifted and asymmetric compared to EELS.

This work demonstrates the great interest of combining EELS and CL for plasmonics [3, 4].

[1] M. Kociak and O. Stéphan, Chem. Soc. Rev. 43, 3865 (2014)

[2] F. J. García de Abajo, Rev. Mod. Phys. 82, 209 (2010)

[3] A. Losquin et al., Nano Lett. 15, 1229 (2015)

[4] A. Losquin and M. Kociak, ACS Photonics 2, 1619 (2015)

[5] F. J. García de Abajo and M. Kociak, Phys. Rev. Lett. 100, 106804 (2008)

The research leading to these results has received funding from the European Union Seventh Framework Programme [No. FP7/2007-2013] under Grant Agreement No. n312483 (ESTEEM2). We gratefully aknowledge the following collaborators who significantly contributed to this work : Luiz F. Zagonel, Viktor Myroshnychenko, Benito Rodríguez-González, Marcel Tencé, Leonardo Scarabelli, Jens Förstner, Luis M. Liz-Marzán, F. Javier García de Abajo and Odile Stéphan.


Arthur LOSQUIN (Lund, Sweden), Mathieu KOCIAK
08:00 - 18:15 #6645 - IM08-423 High energy-resolution EELS of ferroelectric and paraelectric BaTiO3 phases.
IM08-423 High energy-resolution EELS of ferroelectric and paraelectric BaTiO3 phases.

BaTiO3 (BTO) is a widely studied material with several potential applications as a result of its intrinsic ferroelectricity. It undergoes multiple structural phase transitions across a range of accessible temperatures, which have an effect on its ferroelectric properties. While BTO is ferroelectric in its low-temperature phases—rhombohedral below ∼183 K, orthorhombic in the range ∼183–273 K, and tetragonal in the range ∼273–393 K;  it becomes paraelectric above ∼393 K [1]. The ferroelectricity of BTO is directly related to the deviation of the TiO6 octahedra from perfectly undistorted units, which is linked to the off-centering of the Ti4+ cation within a octahedron constituted of six O atoms. Nevertheless, the phase transition mechanisms are still widely discussed, and the exact structure of the paraelectric phase remains unclear. Probing the structural distortion within TiO6 octahedra of the different BTO phases is therefore of particular interest, especially at the nanoscale for BTO thin films and nanostructures. Recently, it was shown that the O-K energy-loss near-edge structures (ELNES) permitted the probing of this subtle structural distortion [2]. The broadening of the ELNES at lower energy is directly related to the Ti4+ off-centering. The O-site symmetry affects the core-hole potential created during excitation, which then induces the broadening in the ELNES.

In this contribution, the structural distortion of BaTiO3 (BTO) is studied in its ferroelectric (rhombohedral and tetragonal), and paraelectric phases from the O-K and Ti-L23 near-edge structures in electron energy-loss spectroscopy [3]. The high energy-resolution O-K and Ti L23 ELNES of ferroelectric and paraelectric BTO are recorded in a monochromated scanning transmission electron microscope (STEM), using cooling and heating stages to reach the phase transitions in a single crystal thin foil. Modifications of the electronic structure are detected in the lowest energy fine structure of the O-K edge in the ferroelectric phases (Fig. 1a), and are interpreted by core-hole valence-electron screening geometry (Fig. 1c). The broader and more asymmetric lowest energy fine structure at low temperature, suggest that the magnitude of the Ti4+ off-centering along ⟨111⟩ increases in lower-temperature phases. Interestingly, the lowest energy fine structure of the paraelectric phase is comparable to the one obtained at room temperature, hence supporting reports in the literature that the paraelectric phase is actually not cubic [4]. First principles calculations support these experimental evidences: they confirm that the lowest energy fine structure of the O-K edge is broader for a lower O-site symmetry, but do not reproduce the asymmetry and the overall shape of this fine structure (Fig. 1b). These discrepancies are ascribed to the approximations inherent to the static core-hole used within the DFT framework.

Furthermore, while the Ti-L23 ELNES is commonly used to probe and interpret the structural distortions in titanates, we show that they are only as sensitive as the O-K ELNES to the structural distortions in BTO (Fig. 2). This finding indicates that the O-K edge can be used instead of, or complementary to, the Ti-L23 edge to probe the structural distortion, and therefore the ferroelectricity, in BTO. The sensitivity of the O-K edge to subtle structural distortions in BTO shows a new way to probe and better understand the ferroelectricity at the nanoscale, on defective or strained BTO thin films for example [5].

[1] G. H. Kwei et al., J. Phys. Chem. C 97, 2368 (1993).

[2] M. Bugnet et al., Physical Review B 88, 201107(R) (2013).

[3] M. Bugnet et al., Physical Review B 93, 020102(R) (2016).

[4]  R. Comes et al., Solid State Commun. 6, 715 (1968); B. Zalar et al., Phys. Rev. B 71, 064107 (2005).

[5] The EELS work was carried out at the Canadian Centre for Electron Microscopy, a National Facility supported by NSERC and McMaster University and the Canada Foundation for Innovation under MSI funding. G.R. acknowledges the Institut de Physique (INP) of Centre National de la Recherche Scientifique (CNRS) for financial support through an International Program for Scientific Cooperation (PICS).


Matthieu BUGNET (Ontario, Canada), Guillaume RADTKE, Steffi Y WOO, Guo-Zhen ZHU, Gianluigi A BOTTON
08:00 - 18:15 #6704 - IM08-425 Nanoscale phase separation and electronic structure of metastable bcc Cu-Cr alloy thin films.
IM08-425 Nanoscale phase separation and electronic structure of metastable bcc Cu-Cr alloy thin films.

The excellent electrical and thermal transport properties of copper (Cu) make it an attractive material for electronic applications. However, its poor intrinsic mechanical properties and oxidation resistance are strongly limiting the field of application. Alloying Cu with chromium (Cr) is an effective way of increasing the oxidation resistance of such alloys. However, under equilibrium conditions the solubility limit of Cr in Cu is far below 1 at.%. Supersaturated Cu-Cr alloys can be synthesized by non-equilibrium thin film deposition techniques. The high cooling rates bring another positive effect of grain refinement that leads to a strong increase of the mechanical properties. In a thin film with nominal composition of Cu67Cr33 (at.%) nanoscale phase separation is characterized by energy dispersive X-ray spectroscopy (EDS) in an aberration-corrected scanning transmission electron microscope (STEM). The electronic structure of Cu in body centered cubic (bcc) crystal structure is analyzed by localized electron energy loss spectroscopy (EELS) and experimental spectra are contrasted to spectra calculated by density functional theory (DFT).

 

Co-evaporation using molecular beam epitaxy (MBE) obtains metastable Cu-Cr alloy thin films with nominal thickness of 300 nm and composition of Cu67Cr33 (at.%). Selected area electron diffraction confirms the bcc crystal structure of the thin films with columnar grains of ~50 nm in diameter. Aberration-corrected STEM in combination with EDS establishes compositional fluctuations within the grains on the order of 1 – 5 nm. The domains adopt the bcc crystal structure shown in the HAADF(High Angle Annular Dark-Field)-STEM image of Fig. 1. The chemical phase separation in Cu- and Cr-rich domains with composition of Cu85Cr15 (at.%) and Cu42Cr58 (at.%) is illustrated in Fig. 2. The alignment of the interface between the Cu- and Cr-rich domains shows a preference for {110}-type habit plane. The electronic structure of the Cu-Cr thin films is investigated by EELS and is contrasted to an fcc-Cu reference sample given in Fig. 3. The main differences between bcc- and fcc-Cu are related to differences in van Hove singularities in the electron density of states. In Cu-Cr solid solutions with bcc crystal structure a single peak after the L3-edge, corresponding to a van Hove singularity at the N-point of the first Brillouin zone is observed. Spectra computed for pure bcc-Cu and random Cu-Cr solid solutions with 10 at.% Cr confirm the experimental observations. Changes in electronic structure of supersaturated solid solutions of Cu by alloying with Cr are discussed in detail.


Christian H. LIEBSCHER (Düsseldorf, Germany), Christoph FREYSOLDT, Teresa DENNENWALDT, Tristan HARZER, Gerhard DEHM
08:00 - 18:15 #6705 - IM08-427 Characterization of calcifications in human kidney by spectromicroscopy at the nanometer scale.
IM08-427 Characterization of calcifications in human kidney by spectromicroscopy at the nanometer scale.

Randall's plaques are calcium phosphate deposits, at the origin of kidney stones. To date, little is known about the mechanisms involved in their formation. µFTIR (µFourier Transformed InfraRed spectroscopy) on samples from different kidneys indicate the presence of carbo-apatite, whitlockite and their co-existence with amorphous calcium phosphate phases. In the present study, our aim was to localize Randall's plaques at the early stages of their formation and to characterize their composition and crystallinity as a function of their localization, at the nanometer scale.  Small pieces of papilla tip from healthy papillae of human kidneys were chemically fixed and embedded in epoxy resin.  Ultrathin sections were analyzed by Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy (EELS).  Nano-calcifications were identified within vesicles, in many cases in close contact with collagen bundles (figure 1). These vesicles whose role and nature is to be determine could be the first step toward plaque formation. Selected Area Electron Diffraction (SAED) evidence that microvesicles contained a few nanocrystals whose diffraction pattern is compatible with the presence of crystalline apatite or whitlockite. Basic maps of light elements of biological interest (Ca, P, N, O) confirm that dense deposits are mainly composed of CaP (figure 1). To go further, data were decomposed using the Hyperspy open source software for principal components analysis (PCA). The fine structure of the different EELS characteristic signals allows to investigate the composition of the nano-calcifications in order to try to discriminate between the various phases identified by µFTIR (carbo-apatite, whitlockite, amorphous calcium phosphate).


Marta DE FRUTOS (LPS, Orsay), Alexandre GLOTER, Dominique BAZIN, Marie-Christine VERPONT, Michel DAUDON, Emmanuel LETAVERNIER, Odile STEPHAN
08:00 - 18:15 #6714 - IM08-429 Momentum-resolved energy loss spectra from ultra-thin metal oxide layers obtained at high spatial resolution.
IM08-429 Momentum-resolved energy loss spectra from ultra-thin metal oxide layers obtained at high spatial resolution.

Momentum-resolved electron energy loss spectroscopy (MREELS) probes the momentum (q) dependence (dispersion) of energy losses from characteristic excitations such as excitons, plasmon, and interband excitations thus probing bandstructures, indirect excitations, and dipole-forbidden excitations.1 However, the ability to obtain momentum-resolved spectra both at high spatial and momentum resolutions has remained difficult. As such, layer-resolved momentum spectra from ultra-thin films, heterostructures as well as from nanostructures has not been widely reported.

We present an experimental approach that enables the acquisition of momentum resolved spectra at  high spatial resolution down to 2 nm using a nano-beam electron diffraction approach.2 Through this approach we have obtained momentum resolved spectra from individual, differently-oriented nano-domains in an ultra thin (12 nm) PrNiO3 layer as well as spectra from different positions in a LaNiO3 thin film (70 nm).

Figure 1(a) displays a Z-contrast image of the LaNiO3 thin layer grown on a LaSrAlO4 substrate. A nano-beam electron diffraction pattern from the LaNiO3 layer is shown in Figure 1(b). A slit is used to select the 200, -200 set of diffraction spots (shown by the red rectangle) allowing electrons that have been scattered to certain scattering angles into the spectrometer. This corresponds to the Г-X direction of the Brillouin zone in the pseudo-cubic symmetry of LaNiO3. The resulting image (ω-q map) shown in figure 1(c) displays energy losses as function of momentum transfer along the Г-X (q// [100] ) direction in the reciprocal space. The presented approach will enable the acquisition of momentum resolved spectra from nano-structured materials, thin films, interfaces, surfaces, and heterostructures at high spatial, energy, and momentum resolutions.

References & acknowledgements:

1. R. D. Bringans, and W. Y. Liang, J. Phys. C: Solid State Phys. 14, 1065 (1981). 

2. M. K. Kinyanjui, G. Benner, G. Pavia, F. Boucher, H.-U. Habermeier, B. Keimer, and U. Kaiser, Appl. Phys. Lett. 106, 203102 (2015) 

3. We gratefully acknowledge financial support by the German Research Foundation (DFG) and the Ministry of Science, Research and the Arts (MWK) of the state Baden-Württemberg within the DFG: KA 1295/17-1 project.


Michael KINYANJUI (Ulm, Germany), Gerd BENNER, Ute KAISER
08:00 - 18:15 #6733 - IM08-431 Experimental Determination of the Solid Angle of EDXS Detectors.
IM08-431 Experimental Determination of the Solid Angle of EDXS Detectors.

A limiting parameter in energy-dispersive X-ray spectrometry (EDXS) in a transmission electron microscope (TEM) is the magnitude of the solid angle of the EDXS detector: Characteristic X-rays are emitted equally distributed into the whole space, but only a small part within the detector solid angle is detected. A larger solid angle results in a larger collection efficiency of X-rays and a higher sensitivity of the detector.
A geometrical calculation of the solid angle is difficult since it is based on the knowledge of the detector geometry [1,2], which is not very well known. An experimental procedure was described by Egerton et. al.  [3], using NiO where density and composition are known, measuring the number of characteristic X-rays of the Ni-K line and applying values for the ionization cross section and fluorescence yield. This measurement was made using the Ni-K line only. In addition reliable values for ionization cross sections and fluorescence yields are hard to find and typically exhibit severe uncertainties. Therefore we did an extensive literature research to obtain the most accurate, state-of-the-art values.
 
We use the following experimental approach to determine the solid angle: The intensity of an X-ray line depends on several parameters which are related to the specimen, the measurement setup and to the detector including the solid angle (Fig.1). The latter can be determined via obtaining values for all these variables either through searching for databases and literature or experimentally. A literature research reveals the databases NIST 164 [4] for ionization cross sections, EADL [5] for fluorescence yields and relative X-rays line intensity ratios from Scofield [6] improved by values from Aßmann et. al. [7] and Wendt [8] as reliable sources. We use X-ray lines of six elements (Al, Si, Ti, Ga, As, Sr) via EDXS for the solid angle determination. In addition the measurement of the specimen thickness is necessary. Therefore we work with a special sample configuration using the focused ion beam instrument to produce a lamella with a rather uniform specimen thickness for the actual measurement and a conical, circular symmetric rod of each specimen. The latter is used for the experimental determination of the inelastic mean free path λ [9]. Due to the circular symmetric shape of the rod the mean free path can be measured by directly linking it to the absolute thickness/diameter of the rod (Fig. 2) and thus the thickness of the lamella can be calculated accurately using the t/λ method.

In our case we work with a FEI Titan³ 60‑300 equipped with the ChemiSTEM technology. Hence we have four windowless SDD detectors symmetrically placed around the optical axis (Fig. 3) and we are using the high visibility holder from FEI.

 

With the profound knowledge about the reliability of ionization cross sections, fluorescence yields and relative X-ray line intensity ratios were are able to determine the solid angle of our EDXS system properly. We show that the solid angle for each detector is between 0.15 to 0.17 sr, which roughly corresponds to the manufacturer value of 0.175 sr per detector.

 

 

[1]          Zaluzec, Microsc. Microanal. 2014, 20, 1318–1326, .

[2]          Conway, Nucl. Instrum. Methods 2010, 614, 17–27.

[3]          Egerton et al., Ultramicroscopy 1994, 55, 43–54.

[4]          Llovet et al., J. Phys. Chem. Ref. Data 2014, 43, 13-112.

[5]          Perkins et al., LLNL Report 1991, UCRL-50400, vol. 30.

[6]          Scofield, "Radiative Transitions" in: Ionization and transition probabilities, 1975, Acad. Press, New York.

[7]          Aßmann et al., Spectrochim Acta B 2003, 58, 711-716.

[8]          Wendt, Microchim Acta 2002, 139, 195-200.

[9]          Kothleitner et al., Microsc. Microanal. 2014, 20, 678-686 .

 

 

The authors acknowledge the Austrian Research Promotion Agency FFG (project 850220) for funding.


Judith LAMMER (Graz, Austria), Johanna KRAXNER, Werner GROGGER
08:00 - 18:15 #6746 - IM08-433 SIev: Implementation of an anisotropic binning strategy to optimize the chemical analysis of heterogeneous interfaces.
IM08-433 SIev: Implementation of an anisotropic binning strategy to optimize the chemical analysis of heterogeneous interfaces.

Outstanding properties emerge at the interfaces of heterogeneous materials, so that their engineering offers promising prospects for achieving novel functional structures. The design and realization of highly-controlled interfaces require reliable characterization techniques with high spatial resolution and chemical sensitivity, and X-rays Energy Dispersive Spectroscopy Spectrum Imaging (XEDS-SI) has been used qualitatively for this purpose with ample success. However, the extraction of quantitative features from XEDS-SI by the overall signal integration around the X-rays peaks location tends to be inaccurate for high spatial resolution analysis due to their typically reduced signal to noise ratio. 

This work presents a strategy for an improved and quantitative chemical analysis at the interface of heterostructures based on the processing of XEDS-SI datasets obtained by aberration-corrected Scanning Transmission Electron Microscopy (STEM). The successive XEDS-SI dataset breakdown with decreasing binning sizes is implemented in the SIev software tool, and its application results in the improved detection of X-rays peaks and estimation of local noise levels. This approach supports the actual chemical signal extraction from XEDS-SI with the maximum spatial resolution with respect to signal to noise ratio (SNR) significance limit.

Results of anisotropic XEDS-SI dataset breakdown obtained with aid of SIev software indicate that sub-nm precision, considering a 2σ confidence level, can be routinely attained on the determination of a projected intermixing layer at the interface of heterogeneous materials. Given that the SIev data processing is significantly faster than a high-SNR XEDS-SI dataset acquisition by the use of currently available high efficiency X-rays detectors, the perspective of an accurate and real-time profile across the interfaces of heterogeneous materials via chemical mapping is foreseen.


Carlos F. AFONSO (Braga, Portugal), Enrique CARBÓ-ARGIBAY, Marcel S. CLARO, Daniel G. STROPPA
08:00 - 18:15 #6792 - IM08-435 STEM EELS plasmon imaging (SEPI) for mixed phase silicon / silicon-oxides systems.
IM08-435 STEM EELS plasmon imaging (SEPI) for mixed phase silicon / silicon-oxides systems.

Plasmon imaging using energy filtered transmission electron microscopy (EFTEM) has been a well-established technique for investigating mixed phase silicon systems for more than a decade [1]. To image the silicon distribution typically an energy window of 4 eV centered at 17 eV is used. With this approach the signal contains significant contributions of the silicon monoxide and dioxide plasmons which deteriorates contrast and prohibits quantitative imaging.

As alternative approach we developed SEPI. A method, based on the combination of scanning transmission electron microscopy (STEM) with electron energy loss spectroscopy (EELS). SEPI allows to separate the contributions of Si, SiO and SiO2 (see Fig. 1(a)) and, thereby, to map them individually. This was achieved by a spectrum-by-spectrum evaluation routine of EELS data cubes including the extraction of the single scattering distribution (SSD) and the subsequent fitting with reference spectra of silicon monoxide and dioxide and the analytical Drude model for silicon.

In this work we present the successful application of SEPI for investigations of three silicon / silicon oxides systems. All measurements were performed on FEI Tecnai Osiris microscope equipped with a FS-1 electron energy spectrometer.

In Fig. 1(b) the silicon nanostructure of a nanocrystalline hydrogenated SiOx (nc-SiOx:H) layer deposited on a silicon wafer using PECVD is shown. During the last years nc-SiOx:H was under investigation for several applications in silicon thin film solar cells [2], as it offers high electronic conductivity compared to other silicon alloys. The electrical properties are commonly explained by the presence of silicon nanofilaments [3], which can be seen in Fig. 1(b).

In Fig. 2, a line scan across the interface of a 14.5 nm thick silicon oxide layer on a silicon wafer is shown. The oxide layer was thermally grown at 900 °C partially using HCl atmosphere. The distribution of the three components Si, SiO, and SiO2 demonstrate that between the silicon substrate and the SiO2 layer an intermediate SiO layer exists.

Fig. 3 (a) shows the oxygen distribution measured using energy dispersive X-ray spectroscopy (EDX) of an oxygen precipitate in silicon. Oxygen precipitates in silicon are generated by precipitation of the supersaturated interstitial oxygen during thermal processing. Their stoichiometry was under discussion for decades and the compositions found were ranging from SiO2 to SiO. Recently, it was shown that the center of the precipitate consists of SiO2 [4]. The SiO plasmon ratio distribution of the oxygen precipitate, shown in Fig. 3 (b), demonstrates that the oxygen precipitate is also surrounded by an SiO layer similar to the oxide layer.

 

1. G. Nicotra, S. Lombardo, C. Spinella, G. Ammendola, C. Gerardi and C. Demuro, Appl. Surf. Sci. 205, 304 (2003).

2. L.V. Mercaldo, I. Usatii and P.D. Veneri, Energies 9(3), 218 (2016).

3. M. Klingsporn, S. Kirner, C. Villringer, D. Abou-Ras, I. Costina, M. Lehmann and B. Stannowski, submitted (2016).

4. D. Kot, G. Kissinger, M. A. Schubert, M. Klingsporn, A. Huber, and A. Sattler, Phys. Status Solidi RRL 9, 405 (2015).


Max Johann KLINGSPORN, Markus Andreas SCHUBERT (Frankfurt (Oder), Germany), Simon KIRNER, Dawid KOT, Daniel ABOU-RAS, Bernd STANNOWSKI, Gudrun KISSINGER
08:00 - 18:15 #6820 - IM08-439 Plasmonic Resonance in Metallic Nanoparticles.
IM08-439 Plasmonic Resonance in Metallic Nanoparticles.

The optical properties of noble metal nanoparticles are dominated by the surface plasmons (SP), which are collective oscillations of the free electrons confined at the surface. Surface plasmons in noble-metal nanoparticles have received considerable attention for the wide range of applications, ranging from surface-enhanced Raman spectroscopy (SERS), biomolecule sensing, labeling of biomolecules, cancer therapy, plasmonic absorption enhancement in solar cells to nanophotonics.

Influence of particle size on the surface plasmons is of great interest. For large particles (> 10 nm), pure classical effects related to confinement of classical electromagnetic waves at the surface of the objects are well-known. For smaller sizes, the major effects are related to quantum physics. Optical techniques have been employed to study the optical properties of sub-10 nm nanoparticles1. However in these techniques the measurements are made for a set of particles. This implies an inhomogeneous broadening of the surface plasmon resonance which largely prevents observing the influence of quantum phenomena. In order to overcome these challenges, single particles measurements have been made in the past years by electron energy loss spectroscopy (EELS) in combination with a scanning transmission electron microscope (STEM). STEM-EELS measurements allow the study of individual particles on the atomic scale and with high spectral resolution2.    

Here we investigate the plasmonic response of individual silver and gold nanoparticles, ranging from 2 to 10 nm in diameter. We will first discuss the instrumental progresses made to improve signal to noise ratio allowing detection of surface plasmons in ultrasmall nanoparticles and data treatment to improve energy resolution. We will then illustrate how bulk and surface plasmons evolve as a function of particle size. Figure 1 shows plasmons resonances well defined for a 5 nm silver particle and weak plasmons resonances (but yet visibles after deconvolution treatment) in a 2 nm silver particle. Furthermore in this work different configurations of substrate-matrix will be shown in order to understand their influence on the plasmonic response.  

 

References:

(1) Jonathan A. Scholl et al. Quantum plasmon resonances of individual metallic nanoparticles. Nature, 483:421-427, 2012

(2) Soren Raza et al.Multipole plasmons and their disappearance in few-nanometre silver nanoparticles. NATURE COMMUNICATIONS | 6:8788 | DOI: 10.1038/ncomms9788 


Alfredo CAMPOS (Orsay), Troc NICOLAS, Hans-Christian WEISSKER, Odile STÉPHAN, Matthias HILLENKAMP, Mathieu KOCIAK
08:00 - 18:15 #6877 - IM08-443 Advances in FIB EDX-Nanotomography.
IM08-443 Advances in FIB EDX-Nanotomography.

FIB-tomography is used in materials science for 3D-analysis of nanostructured materials [1]and in life science for the analysis of complex structures like brain tissue [2]. This presentation summarizes recent technological improvements, which include advancements in detector technology for electron imaging and elemental analysis, scan generator technology for high throughput imaging, and automated drift correction for reliable 3D reconstruction. New in-column detectors have a higher sensitivity for low energy electrons, which is the basis for a very high resolution down to a few nm voxel size. The low kV imaging can be combined with energy filtering in order to detect a pure signal of backscattered electrons (BSE), which improves the reliability of phase segmentation and quantitative analysis. The quality of the 3D reconstructions can also be improved with refined procedures for drift correction based on reference marks. In addition, with the new scan generators image acquisition and ion milling can be performed synchronously. In this way the acquisition speed increases further. Finally, spectral and elemental mapping (XEDS) based on Silicon Drift Detectors (SDD) with higher collection solid angles provides higher X-ray count rates. These increased count rates open new possibilities in chemical analysis that provide larger data cubes with higher representativeness. As EDX Analysis requires higher beam energies in order to ionize the elements of interest the interaction volume increases and the resolution decreases. The latest development of acquisition software allows to switch high tensions in order to acquire data sets with small voxel sizes and high resolution using SE and BSE detectors with high efficiency at low voltages and to acquire a second data set under conditions that match the requirements for EDX Analysis (higher voltages and larger voxel sizes). The new possibilities of FIB EDX-Tomography are illustrated with the following examples:

  1. High throughput elemental analysis is performed of a NiTi stainless steel with a complicated multi-phase microstructure [3]. The examples document the recent advancements in resolution, contrast, stability and throughput, which are necessary for reliable and representative 3D-analysis. The segmentation of the different phases was done using the EDX-maps and further refined with the SE-images. Fig.1

  2. Representation of the complex chemistry of a diamond-anvil cell laser heated spot. The conditions used (50GPa, 4000K) resemble conditions at the earth core and reveal a complex microstructure with phases that are only formed under theses extreme conditions. Fig.2

References

1. L. Holzer, M. Cantoni, in Nanofabrication Using Focused Ion and Electron Beams—Principles and Applications, I. Utke, S. Moshkalev, P. Russell, Eds. (Oxford University Press, New York, 2012), pp. 410–435.

2. M. Cantoni, C. Genoud, C. Hébert and Graham Knott, Microsc. & Anal. 24(4): 13-16 (2010)2010.

3. P. Burdet, J. Vannod, A. Hessler-Wyser, M. Rappaz, M. Cantoni, Acta Mater. 61 (8), 3090 (2013).


Marco CANTONI (Lausanne, Switzerland), Farhang NABIEI, Pierre BURDET
08:00 - 18:15 #6887 - IM08-445 Separating Magnetic and Non-magnetic Signals at the Fe/MgO Interface.
IM08-445 Separating Magnetic and Non-magnetic Signals at the Fe/MgO Interface.

Despite various efforts, it remains an experimentally challenging task to access magnetic properties at
(sub) nanoscale. One route towards a direct measurement of magnetism is the measurement of electron
magnetic circular dichroism (EMCD) [1]. Being based on the measurement of electron energy loss
(EEL) spectra, EMCD can in principle be measured at atomic resolution and can open the door to study
exciting new area of physics such as magnetism in the vicinity of defects or interfaces. However, in
addition to general concerns of low signal to noise ratios of EMCD spectra measured at high
resolutions calling for a statistical data treatment, there might be other, non-magnetic contributions to
the signal which cause a change in the white line ratio of the L3/L2 edge peak of the magnetic species.
These white line changes might be related to the occurrence of a different chemical species of the same
element, e.g., due to in situ oxidation of the sample, or also to position dependent changes of the
electron wavefunction if the EMCD experiment is carried out at atomic resolution [2]. Such effects
may render the correct interpretation of EMCD signals impossible if they can not be clearly separated
from the true magnetic signal. The issue calls out for a statistical tool to separate the components.


We demonstrate how a canonical polyadic decomposition (CPD) [3],[4],[5] can be used to separate
magnetic and non-magnetic signals measured at the Fe/MgO interface. The system has recently
received a lot of attention as a candidate for magnetic tunnel junctions due to its large tunneling
magnetoresistance (e.g. [6],[7]), its magnetic properties, epecially at the interface are thus of interest.
Through the additional explanatory power of CPD, insight is gained on a perceived increase of orbital
to spin moment ratio at the interface [8]. Besides the spectral components and their spatial maps
(Fig.1), CPD also returns a vector containing the weight of the respective component in the data sets
measured with an aperture position such that the sign of the EMCD signal is positive, negative and
such that the magnetic component vanishes (Fig.2). The components shown below indicate a
significant non-magnetic white line branching towards the Fe/MgO interface.


CPD can not only be used as a technique to extract EMCD from noisy data and separate it from
potential non-magnetic signals, targeting both the aforementioned problems, but it can be generalized
to any problem of identifying different signal contributions in experiments where multiple data sets are
measured on the same sample area, such as momentum resolved EELS. It possesses desirable features
such as uniqueness while not constraining the components along either of the modes and comparatively
low computational costs. The assumptions on the tensor's structure match the physical model and thus
lead to directly interpretable components. Hence, CPD is a useful addition to the set of statistical tools
for the analysis of microscopy data.

References:

[1] P. Schattschneider et al, Nature 441 (2006) 486.
[2] A. Gulec et al., Appl. Phys. Lett. 107 (2015) 143111.
[3] J. Carroll, J.-J. Chang, Psychometrika 35 (1970) 3.
[4] A. Cichocki et al, IEEE Signal Processing Magazine 145 (2015).
[5] J. Spiegelberg et al, submitted.
[6] S. Gautam et al, J. Appl. Phys. 115 (2014) 17C109.
[7] V. Serin et al, Phys. Rev. B 79 (2009) 144413.
[8] T. Thersleff et al, Manuscript.


Jakob SPIEGELBERG (Uppsala, Sweden), Thomas THERSLEFF, Ján RUSZ
08:00 - 18:15 #6910 - IM08-447 Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope.
IM08-447 Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope.

Helium Ion Microscopy (HIM) (Hlawacek et al., 2014) is well known for its high resolution imaging and nano fabrication capabilities. However, in terms of analytic capabilities it lags behind comparable techniques such scanning electron microscopy (SEM) or transmission electron microscopy (TEM). Although several primary and secondary particles are available to date none of them has been exploited in practical way to obtain analytic information. While  electrons are used for imaging they are of limited use due to matrix effects which complicate the elemental analysis. The existing models are based on empirical data and can deliver useful results only for a selected number of materials (Ramachandra et al., 2009)⁠. Photons have been exploited in the past to obtain information on the sample composition but turned out to be of limited practical use due to the high sensitivity for damage induced by the ion beam (Veligura et al., 2015)⁠. In the past backscattered ions have been used to obtain materials contrast in a qualitative way. Recently, the successful use of sputtered particles for analytic purposes has been demonstrated by adding a sophisticated secondary ion mass spectrometer to the HIM (Wirtz et al., 2015)⁠.

Here, we present the first successful attempt to use t ime of flight ion backscatteringspectrometry (TOF-BS) for materials characterization in a HIM (Klingner et al., 2015)⁠. The start signal for the TOF measurements is created by chopping the primary beam of the ion microscope using the built—in blanker and a custom made electronics that allows pulse lengths of 10 ns to 250 ns. The stop signal is given by the arrival of the backscattered particles at a micro channel plate. The setup has the advantage of providing a high lateral resolution, a good energy resolution and at the same time is minimal invasive to the microscope and therefore not deteriorating the high resolution capabilities of the device when the BS setup is not in use.

TOF-BS spectra of HfO2 on Si are presented in fig. 1. The time resolution is limited by the physical length of the microscope blanker to approximately 17 ns or 5.4%. This value can be decreased to 2.7% by using a longer flight path. Thanks to a home built scan system to control the beam TOF-BS data can be recorded also in imaging mode. This allows an efficient post acquisition analysis by applying energy filters to extract the elemental distribution. An example is presented in fig. 2. The corresponding bulk BS spectra (fig. 3) are color coded to the extraction areas in the secondary electron (left in fig. 2) and total BS image (right in fig. 2). A lateral resolution of 54 nm has been determined. Although this is not comparable to the native resolution of the tool, the value is close to the physical limit and can be overcome by using correlative approaches in connection with the high resolution SE data available in the HIM. Modifying the sample holder slightly one can also perform TOF-SIMS. The sputtered particles are accelerated towards the stop detector of the TOF setup by means of a high voltage applied to the sample and a grounded grid. TOF-SIMS spectra obtained from the same sample shown in fig. 2 are presented in fig. 4. The usefulness of the combined TOF-SIMS and TOF-BS setup becomes evident by noting that the TOF-SIMS setup fails to detect the gold due to the low sputter and ionization yield of gold. This inherent weakness of SIMS is overcome in this combined setup.

References:

Hlawacek, G., Veligura, V., van Gastel, R. & Poelsema, B. (2014). Helium ion microscopy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 32, 020801.

Klingner, N., Heller, R., Hlawacek, G., Borany, J. von, Notte, J. A., Huang, J. & Facsko, S. (2015). Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry. Ultramicroscopy accepted.

Ramachandra, R., Griffin, B. J. & Joy, D. C. (2009). A model of secondary electron imaging in the helium ion scanning microscope. Ultramicroscopy 109, 748–757.

Veligura, V., Hlawacek, G., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B. (2015). Investigation of ionoluminescence of semiconductor materials using helium ion microscopy. Journal of Luminescence 157, 321–326.

Wirtz, T., Philipp, P., Audinot, J.-N., Dowsett, D. & Eswara, S. (2015). High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy. Nanotechnology 26, 434001.


Nico KLINGNER, Gregor HLAWACEK (Dresden, Germany), Rene HELLER, Johannes VON BORANY, Stefan FACSKO
08:00 - 18:15 #6926 - IM08-449 The analysis of Mo5SiB2 in the SEM with the use of EDS and WDS.
IM08-449 The analysis of Mo5SiB2 in the SEM with the use of EDS and WDS.

Refractory metals and their alloys show potential for high temperature applications due to their increased melting point and creep resistance. Mo-Si-B ternary alloys consisting of the phases Moss (molybdenum-based solid solution)-Mo3Si (A15)-Mo5SiB2 (T2), with melting points over 2000 °C, are particularly favorable for new high-temperature materials. However these alloys show a lack of oxidation resistance in the intermediate temperature range, 650-750 °C, and possess a relatively high density (9.6 g/cm3) compared to Nickel-Based Superalloys.

 

The characterization of the Mo5SiB2 phase with an SEM with X-ray microanalysis analytical capabilities presents a real challenge. The B-Kα X-ray has an energy of 183.3 eV, but might shift slightly due to its bonding with Mo. This X-ray line energy is very close to the Mo-Mζ line which is at 192.6 eV. In addition, the K-shell absorption edge of boron is at 192 eV, just below the Mo-Mζ line. Finally the absorption coefficient of B-Kα in Mo is very high, and is even more extreme in Si.

As a result, EDS microanalysis proved to be insufficient. The EDS spectrum of the Mo5SiB2 phase shows a very small peak at the B-Kα position, but without any separation from the Mo-Mζ line. The elemental distribution maps even showed a strong artifact: due to the higher Mo content in the Moss phase and the absence of a boron absorption edge the Mo-Mζ peak is considerably higher in that phase, resulting in an incorrect increase of intensity of boron in the Moss phase. See figure 1.

 

Alternatively, WDS spectrometers have a much better energy resolution and are capable of separating to a large extend the B-Kα and Mo-Mζ peaks. Modern parallel-beam WDS spectromers are also very sensitive to the low-energy part of the spectrum, and can detect small amounts of boron with very high efficiency. A careful energy scan over the B-Kα and Mo-Mζ peaks can be seen in figure 2. And of course creating an element distribution image for boron now indeed showed the correct boron distribution, as can be seen in figure 3.

 

The final challenge lies with the quantitative analysis: what exactly is the weight percentage of boron in the supposed Mo5SiB2 phase? The B-Kα and Mo-Mζ peaks still partially overlap even with WDS, and one has to be very careful in the selection of the background support points to correctly subtract the background X-ray intensity.  Using a stoichiometric Mo5SiB2 standard this can still be done, and an accurate quantification can be performed.

 

This case shows how vital it can be for certain applications to widen the range of available microanalysis tools with a parallel-beam WDS spectrometer to perform analyses beyond the performance limit of EDS.


Hans DIJKSTRA (Eindhoven, The Netherlands), Peter KELLNER, Werner REICHSTEIN, Uwe GLATZEL
08:00 - 18:15 #6934 - IM08-451 High Spatial Resolution Spectrum Imaging in the FEG-SEM at Low Voltages: A New Option for Materials Characterisation.
IM08-451 High Spatial Resolution Spectrum Imaging in the FEG-SEM at Low Voltages: A New Option for Materials Characterisation.

Analytical field emission gun scanning electron microscopes (FEG-SEMs) provide essential morphological and compositional data for the analysis of a broad range of materials.  However, the characterisation of certain materials can be problematic under “conventional” (i.e., > 10 kV) FEG-SEM imaging conditions.   In particular, complex multiphase materials, oxides and polymers can exhibit pronounced charging effects.   However, low voltage operating conditions (< 5 kV) precluded the generation of X-ray energy dispersive spectroscopy (XEDS) data for microchemical analysis.  The need to perform XEDS analysis at higher operating voltages made it difficult to acquire structural and compositional data from the same feature for materials that charge or degrade under the electron beam.  The ability to perform both high resolution imaging and XEDS spectrum imaging at low voltage in the FEG-SEM provides new opportunities for the evaluation of many materials.  In this study, we demonstrate how low voltage XED spectrum imaging in the FEG-SEM can rapidly provide data on two-layer oxides that form in the cracks present in an austenitic stainless steel corrosion specimen.

The Oxford Instruments X-MaxN 150 silicon drift detector (SDD) and an X-Max Extreme windowless SDD with the Oxford Instruments AZtecEnergy acquisition and XEDS analysis software were used for the XED spectrum imaging experiments in a Zeiss Merlin FEG-SEM with a Gemini-II column.  All SEM images were obtained with a parallel on-axis in-lens secondary electron (SE) detector with primary electron beam energy of 1.5 kV, 3 kV, 5 kV and 15 kV, respectively.  The SEM imaging conditions were fixed with the expection of the accelerating voltage and the working distance. All XED spectrum images were acquired with a spectrum image resolution of 512 x 512 pixel and a pixel dwell time of 1000 µs.   The Oxford Instruments TruMap processing software was used for peak deconvolution and background subtraction.  

Analyses were performed on a small oxide-filled crack in the austenitic stainless steel sample, which had been metallographically polished to a 1 μm diamond finish.  In-lens secondary electron images and corresponding XED spectrum images revealed the effect of accelerating voltage on the oxide microstructure.  Fe XED spectrum images acquired at 1.5 kV and 3 kV indicated the presence of a 2-layer oxide structure: an Fe-poor oxide adjacent to the oxide/metal interface, whereas these details are absent for the 15 kV spectrum image. Complementary Cr XED spectrum images confirmed that the oxide adjacent to the metal was Cr-enriched.  TEM and selected area electron diffraction confirmed the presence of a Cr2O3 innermost layer and an Fe-rich M3O4 in the centre of the oxide-filled crack.  The ability to generate viable XEDS datasets at low voltages provides significant improvements in spatial resolution of the analysis due to the significantly reduced depth of x-ray generation in the sample.  Thus, low voltage XEDS is providing new insights into materials analysis and new options for microstructural characterization.

References:

[1]. We thank James Holland for valuable technical discussions and suggestions.


Arne JANSSEN (Manchester, United Kingdom), M.g. BURKE, Simon BURGESS
08:00 - 18:15 #6953 - IM08-453 Is the electronic structure of few layer transition metal dichalcogenides always two dimensional ?
IM08-453 Is the electronic structure of few layer transition metal dichalcogenides always two dimensional ?

The transition metal dichalcogenides (MoS2 etc.) are a new class of layered materials that can be prepared in variable layer thickness down to single molecular layer.  Compared with the more well-known graphene, the monolayer version of graphite, the transition metal dichalcogenides are semiconductors and hence can be more useful in applications such as light emission or photovoltaics where an energy gap is essential.  Ultra thin transition metal dichalcogenides also show interesting layer thickness dependent physical properties.  For example, the semiconductor gap was found to change from indirect to direct when the layer thickness is reduced to monolayer, making monolayer MoS2 an efficient light emitter.

Here we present investigation of the dimensionality of the joint density of states involved in the interband transition in MoS2 using angle resolved as well as angle integrated electron energy loss spectroscopy [1].  To aid the analysis, we have extended the theory of joint density of states from three-dimensional semiconductors to low-dimensional semiconductors.

Our result and analysis shows not only that the character of the interband transition changes from indirect to direct, as the layer thickness is reduced down to monolayer, as expected, but the indirect band gap retains a three dimensional character down to the monolayer limit.  This is compared with the two dimensional character found for the direct bandgap transition in the monolayer MoSe and presumably also in MoS2.  This raised a question about the condition for observing a true two dimensional electronic structrue even when the atomic structure is reduced to single molecular thickness.  We will discuss physical factors might affecting the dimensionality of the electronic density-of-states.

Our result has practical implication.  For example, it is consistent with the assumption made by Castellanos-Gomez et al. [2] when interpreting the electrostatic screening effect observed in monolayer MoS2, which is very different from that of graphene.  Our result also can explain the sensitivity of the indirect interband transition as a function of the layer thickness and the bandgap cross-over of few layer MoS2 from indirect to direct.    

 

[1] J. H. Hong, K Li, C. H. Jin, X. X. Zhang, Z Zhang and J. Yuan (2016) “Layer-dependent anisotropic electronic structures of freestanding quasi-two-dimensional MoS2”, Phys. Rev. B93, 075440

[2] A. Castellanos-Gomez et al. (2013), "Electric field screening in atomically thin layers of MoS2: the role of interlayer coupling" Adv. Mater. 25, 899-903


Jun YUAN (York, United Kingdom), Jinghua HONG, Chuanhong JIN
08:00 - 18:15 #6986 - IM08-455 Raman imaging of biology and soft matter samples: a few examples.
IM08-455 Raman imaging of biology and soft matter samples: a few examples.

Electron microscopy (SEM, TEM) is widely used to characterize the internal structures with micrometer spatial resolution. AFM is also commonly employed for analyzing the surface topography with a superior spatial resolution. However, confocal Raman microspectrometry is a unique way to complete such structural investigation by knowledge on chemical information. Raman imaging combines the spatial resolution of optical microscopy with the molecular analysis capabilities of Raman scattering. Then, it is very well adapted to provide direct information about conformation, structure and behavior of lipids and biopolymers (proteins, polysaccharides) from micronsized zones of interest.

Also, the mainly structure-sensitive bands in protein and lipid spectra makes them suitable for multivariate analysis techniques such as principal component analysis (PCA) to deduce structural relationships.

Raman microspectrometry is then a method of choice for the compositional investigation with a high spectral resolution of hydrated biological systems of food interest along with the structural investigation performed conjointly with laser scanning confocal microscopy, AFM or electron microscopy with a superior spatial resolution.

We aim here to review few examples of Raman imaging performed on different biological systems (algae, plant and animal tissues) and on soft-matter based systems (highly diluted gels, dispersions) relevant in food industry, see Figures 1 and 2. We will focus on the complementarity with the other types of microscopy, and on the practical details concerning the sample preparation (choice of objectives, choice and influence of supports, smoothing or not of the surfaces,…).

 

 

REFERENCES

G. Philippe, C. Gaillard, J. Petit, N. Geneix, M. Dalgalarrondo, R. Franke, C. Rothan, L. Schreiber, D. Marion, B. Bakan, Ester-crosslink Profiling of the Cutin Polymer of Wild Type and Cutin Synthase Tomato (Solanum lycopersicum L.) Mutants Highlights Different Mechanisms of Polymerization, Plant Physiology

M. Gayral, C. Gaillard, B. Bakan, M. Dalgalarrondo, K. Elmorjani, C. Delluc, S. Brunet, L. Linossier, M.H. Morel, D. Marion, Transition from vitreous to floury endosperm in maize (Zea mays L.) kernels is related to protein and starch gradients, Journal of Cereal Science, 2016, accepté

Covis R., Vives T., Gaillard C., Maud Benoit, Benvegnu T., Interactions and hybrid complex formation of anionic algal polysaccharides with a green cationic glycine betaine derived surfactant, Accepted in Carbohydrate Polymers, 2015, May 5;121:436-48.


Cédric GAILLARD (NANTES)
08:00 - 18:15 #6989 - IM08-457 TEM analysis of multilayered nanostructures formed in the rapid thermal annealed silicon rich silicon oxide film.
IM08-457 TEM analysis of multilayered nanostructures formed in the rapid thermal annealed silicon rich silicon oxide film.

Silicon (Si) nanoparticles (NPs) embedded in an ultrathin silicon rich silicon oxide (SRSO) film through the thermal annealing process has emerged as a highly absorbing layer for third-generation solar cells 1. The concept of using Si NPs is to achieve a band gap tunable absorber layer by controlling the size and structure of Si NPs because of the quantum confinement effect 2. In our study, a multilayer stack of silicon oxide with 35 periods of alternating layers of 1-nm thick near-stoichiometric and 3-nm thick Si-rich hydrogenated silicon oxide were deposited on fused quartz substrate by plasma-enhanced chemical vapor deposition (PECVD) method. Two samples were annealed using a rapid thermal annealing (RTA) furnace in forming gas atmosphere (90% N2 + 10% H2) for 210s and 270s respectively. From the Raman spectroscopy, a reduction in crystallinity of Si has been discovered from 210s annealed sample to 270s annealed sample (shown in Figure 2). The goal of transmission electron microscopy (TEM) analysis is to investigate the nanostructural change of Si in these two annealed samples and try to correlate the TEM observations to the Raman spectroscopy results. 

As the dimension of the Si nanostructures formed in SRSO films is in nanometer-scale, the energy-filtered TEM (EFTEM) tomography technique using the low-loss signals in electron energy-loss spectroscopy (EELS) has been applied as a powerful technique to correlate the precipitated Si nanostructures to the phase transformation mechanisms in the thermally annealed SRSO films 3. In this case, EFTEM spectrum-imaging (SI) technique was applied to characterize the Si nanostructures formed in SRSO films by different annealing times. The EFTEM SI dataset was acquired from -4eV to 40eV using a 2eV energy slit and the reconstructed zero loss peak (ZLP) was used to calibrate the spectra shift. Si plasmon images were extracted by fitting a Gaussian into the low-loss region with a peak position at 16.7 eV 4 and FWHM of 4.5 eV. In order to analyze the multilayer structures at different annealing durations, the TEM samples were prepared in cross sectional geometry using the conventional polishing and ion milling methods.

Figure 1 shows the EFTEM images extracted from the Si plasmon peak, in these images Si appears as bright contrasts. For shorter annealing time, an alternating bright and dark contrast can be observed which indicates that the multilayer structure still remains whereas for longer annealing time, Si shows nanoparticles like contrast. The continuous layer like contrasts shown in Figure 1(a) indicates the overlapping of the contrasts generated by small Si crystallites in a very high density. After longer annealing time (Figure 1(b)), the small Si crystallites grow in size but may take overall less volume fraction due to the Ostwald ripening process. Therefore, it explains the reduction in crystallinity of Si discovered from 210s annealed sample to 270s annealed sample by Raman. However, such a reduction in Si crystallinity was not observed in nitrogen annealed SRSO films, this indicates that samples annealed in the forming gas environment follow a different crystallization mechanism and hydrogen must play a decisive role during the Si crystallization at the initial stage.

1.                 Conibeer, G. et al. Silicon quantum dot nanostructures for tandem photovoltaic cells. Thin Solid Films 516, 6748–6756 (2008).

2.                 Green, M. a. Third generation photovoltaics: Ultra-high conversion efficiency at low cost. Prog. Photovoltaics Res. Appl. 9, 123–135 (2001).

3.                 Friedrich, D. et al. Sponge-like Si-SiO2 nanocomposite-Morphology studies of spinodally decomposed silicon-rich oxide (vol 103, 131911, 2013). Appl. Phys. Lett. 103, (2013).

4.                    Egerton, R. F. Electron energy-loss spectroscopy in the electron microscope. Electron energy-loss Spectrosc. electron Microsc. xii+410 pp–xii+410 pp (1986). 


Hasan ALI (Uppsala, Sweden), Ling XIE, Martijn Van SEBILLE, Adele FUSI, Ren´e A C M M VAN SWAAIJ, Miro ZEMAN, Klaus LEIFER
08:00 - 18:15 #7043 - IM08-459 The highest characterization potentialities of sub-20 meV spatially resolved STEM-EELS.
IM08-459 The highest characterization potentialities of sub-20 meV spatially resolved STEM-EELS.

Recent developments in monochromator technologies have demonstrated electron microscope resolution of infrared features, by electron energy loss spectroscopy (EELS) carried out with an energy resolution of ~10 meV [1]. In this contribution, we will present two experiments in nanoplasmonics and phonon spectroscopies performed on the NION HERMES scanning transmission electron microscope (STEM) at Arizona State University with a spectral resolution better than 16 meV. EELS in a STEM is an invaluable technique for mapping optical excitations with a nanometer spatial resolution, with a clear interest in mapping surface plasmons [2] now down to plasmon energies as small as 170 meV thanks to new advances in monochromators [3]. We will go to show on the case of long plasmonic bimetallic nanorods (Fig 1.) the interest of increased spectral resolution such as the one provided by the HERMES for plasmonic studies. For the same reason, recording EEL spectra showing vibrational features of hydrogen-containing biological samples is now possible, resolving the characteristic C–H, N–H and NH2 vibrational signatures, with no observable radiation damage (Fig 2.) [4]. These two examples will illustrate the HERMES performances to show how such increases in performance may unveil new physical effects.

References:

[1]          Krivanek, O. L. et al. Nature 514, 209–212 (2015).
[2]          Kociak, M. & Stéphan, O. Chem. Soc. Rev. 43, 3865–3883 (2014).
[3]          Rossouw, D. & Botton, G. A. Phys. Rev. Lett. 110, 066801 (2013).
[4]          Rez, P. et al. Nature Communications 7, 10945 (2016).

 

Acknowledgements: This work has received support from the National Agency for Research under the program of future investment TEMPOS-CHROMATEM with the Reference No. ANR-10-EQPX-50. We gratefully acknowledge the use of facilities within the LeRoy Eyring Center for Solid State Science at Arizona State University. 


Katia MARCH (Orsay), Leonardo SCARABELLI, Luis M. LIZ-MARZÁN, Toshihiro AOKI, Peter REZ, Hagai COHEN, Peter A. CROZIER, Ondrej L. KRIVANEK, Odile STÉPHAN, Mathieu KOCIAK
08:00 - 18:15 #6190 - MS00-461 Characterization of CoO@MnFe2O4 Magnetic Hollow Nanoparticles.
MS00-461 Characterization of CoO@MnFe2O4 Magnetic Hollow Nanoparticles.

Magnetic core@shell nanoparticles are interesting candidates for applications in areas such as drug delivery, medical imaging, hyperthermia, sensing and biodetection. In many of these applications the availability of particles, being at the same time hollow and magnetic is a great technological advantage ahead of a realistic implementation. In this work we show the characterization of CoO@MnFe2O4 magnetic hollow nanoparticles obtained using octahedron-shaped CoO nanoparticles as templates.  A 3 nm magnetite (Fe3O4) layer was first deposited over the CoO octahedrons. In a second steep, a solid-state reaction transforms the Fe3O4 into MnFe2O4, and the former solid octahedrons into CoO@MnFe2O4 hollow and pierced nanoparticles. Characterization showed the octahedron shape was maintained along the process, electron diffraction and FT also confirmed an almost perfect epitaxial growth of the shell. Finally, EELS showed a higher Fe content in the shell.


J. Benito RODRÍGUEZ-GONZÁLEZ (VIGO, Spain), Rosalía MARIÑO-FERNÁNDEZ, Miguel A. RAMOS-DOCAMPO, Verónica SALGUEIRIÑO
08:00 - 18:15 #6226 - MS00-463 Development of nanostructures in hydrothermally grown TiO2.
MS00-463 Development of nanostructures in hydrothermally grown TiO2.

Development of nanostructure as a function of production temperature in hydrothermal processing of TiO2 is reported here. Nanostructured TiO2 was grown in autoclave at 3 different temperatures of 130, 170 and 200 °C. The samples were referred to as T‑130, T‑170 and T‑200 here. Powder of TiO2 with the particle size of 100-200 nm was mixed with NaOH and closed in an autoclave for 24 h at the respective temperatures. The resulting material was cooled to room temperature, washed in distilled water several times, followed by washing in diluted hydrochloric acid (pH=1.6) and again in distilled water until pH=7 was restored. The final product was dried a 400°C.

The structure of the as-received powder samples was first examined by X-ray diffraction (XRD). XRD suggested that all specimens are mixture of anatase and a monoclinic titanate phase, and the ratio of the two phases varied with changing the processing temperature. The analysis of the dependence of the width of the diffraction peaks as a function of the length of the scattering vector gave the average values of the crystallite size in the two phases, however provided no clue either about the shape of these crystallites or the separation of the phases between different morphological entities. Therefore, a detailed transmission electron microscopy (TEM) analysis was performed on the three samples.

Morphology and phase distribution were studied by two transmission electron microscopes after dispersing the “powder” sample in distilled water or alcohol and dropped on “Quantifoil” holey carbon support films. Bright field (BF) and dark field (DF) images together with selected area electron diffraction (SAED) patterns were recorded on imaging plates (IP) in a Philips CM-20 TEM, operated at 200 kV and equipped with a Bruker X-ray detector (EDS). Higher resolution images and SAED patterns were also recorded on a GATAN Orius CCD in a JEOL 3010 TEM operated at 300 kV. The EDS showed that the samples contained a few atomic percent Na. It was proved that the samples contain nanofibers and equiaxed nanoparticles. The SAED patterns were processed with the “ProcessDiffraction” program [1]. The measured 2D patterns were converted into an XRD-like 1D intensity distribution by averaging over ellipses (that correct for the minor elliptical distortion caused by the lenses of the TEM). Additionally, maximal intensity values over the ellipses were also rendered to detect faint features, caused by the presence of a small number of diffraction spots, not forming a complete ring. The SAED patterns recorded from a collection of large number of nano-components gave diffraction peaks at the same positions as XRD.

Individual fibers (Fig. 1) were examined by SAED (Fig.2) whenever they protruded from the bunch of fibers. For sample T‑130 these nanofibers look like nanotubes (Fig. 1). However the number of layers at the “wall” is occasionally different at the two sides of the same “tube”, which indicate that it might also be a rolled-up sheet. All diffraction patterns contained well-defined reciprocal lattice planes with less characteristic spots within the planes. None of them contained the diffraction spots characteristic of anatase (although the patterns from the bunch did contain them). DF images recorded by the anatase lines showed that this phase is always present in the small equiaxed nanoparticles (Fig. 3). High resolution (HRTEM) images recorded from sample T‑200 showed filled nanofibers in contrast to nanotubes (Fig. 4). They looked as covered with small particles. Sample T‑170 was between the previous two extremes, as expected.

[1] J.L. Lábár, M. Adamik, B.P. Barna, Zs. Czigány, Zs. Fogarassy, Z.E. Horváth, O. Geszti, F. Misják, J. Morgiel, G. Radnóczi, G. Sáfrán, L. Székely, and T. Szüts, Microsc. Microanal. 18, 406–420, 2012

[2] S. Cravanzola, L. Muscuso, F. Cesano, G. Agostini, A. Damin, D. Scarano, and A. Zecchina, Langmuir 2015, 31, 5469−547


János LÁBÁR (Budapest, Hungary), Mohammed EZZELDIEN, Khaled EBNALWALED, Regina NÉMETH, Jenő GUBICZA
08:00 - 18:15 #6245 - MS00-465 Dispersion, dose and stability of semiconductor quantum dot biomarkers.
MS00-465 Dispersion, dose and stability of semiconductor quantum dot biomarkers.

Photoluminescent semiconductor nanoparticles or quantum dots have significant potential for medical imaging. For optimum performance however, the dispersion of the nanoparticulate material when suspended in delivery or incubation media, any transformation of the particles in the media, plus the nature and degree of uptake of the nanoparticles by a particular cell or organism all need to be understood.  Analytical electron microscopy can play a vital role in assessing this complex inter-relationship, and we discuss here specific methods developed for this type of analysis.

First, we will review the in vitro cellular uptake of commercially available CdSe/ZnS quantum dot nanoparticles with a coating specifically targeted for endocytic uptake (Invitrogen QTracker 705), dispersed in cell culture media and exposed to human osteosarcoma (U-2 OS) cells. We have examined these nanoparticles as-dispersed in cell culture media (t = 0 h), after 1 hour exposure to cells and after a round of cell division (t = 24 h). Transmission electron microscopy (TEM) has been used to assess the dispersion state of the nanoparticles in media after rapidly freezing suspensions to avoid drying artefacts [1], and in exposed cells which have been fixed and resin embedded [2]. The resin-embedded cells have been further examined using serial block face scanning electron microscopy (SBF-SEM), which enables quantification of nanoparticle loaded organelles in whole cell volumes for quantitative correlation to imaging flow cell cytometry [2].  From this we have measured probability densities for the number of quantum dots per agglomerate when in cell culture media and following uptake by cells in vitro [3, 4 and Figure 1 a-d]. Thus, we will discuss the agglomeration processes that occur both in suspension and during endocytosis.

Second and looking forward, most commercially available semiconductor quantum dots currently contain cadmium although its health and environmental risks may limit exploitation.  Thus, copper indium sulfide (CIS) quantum dots have been investigated as a potential replacement [5]. Aberration corrected STEM-EELS has identified some elemental separation of Cu and In within individual quantum dots [Figure 1 e-h], which may be the origin of an In-Cu anti-site defect state known to act as a donor in the radiative recombination pathway for chalcopyrite CIS quantum dots. We will report here on further analysis using a FEI Titan cubed Themis 300 G2 S/TEM to assess elemental distribution by STEM-EDX.  Such analysis will enable additional characterisation of core-shell coatings (e.g. CIS/ZnS/ZnS:Al) designed to improve photo luminescent quantum yield while enhancing environmental stability of the particles.

 

[1] N. Hondow, R. Brydson, P. Wang, M.D. Holton, M.R. Brown, P. Rees, H.D. Summers and A. Brown (2012) Quantitative characterization of nanoparticle agglomeration within biological media. J. Nanopart. Res., 14, 977.

[2] H.D. Summers, M.R. Brown, M.D. Holton, J.A. Tonkin, N. Hondow, A.P. Brown, R. Brydson and P. Rees (2013) Quantification of nanoparticle dose and vesicular inheritance in proliferating cells. ACS Nano, 7, 6129-6137.

[3] M.R. Brown, N. Hondow, R. Brydson, P. Rees, A.P. Brown, H.D. Summers (2015) Statistical prediction of nanoparticle delivery: From culture media to cell. Nanotechnology, 26.

[4] N. Hondow, M.R. Brown, T. Starborg, A.G. Monteith, R. Brydson, H.D. Summers, P. Rees, A. Brown (2016) Quantifying the cellular uptake of semiconductor quantum dot nanoparticles by analytical electron microscopy. Journal of Microscopy, 261, pp.167-176.

[5] M. Booth, A.P. Brown, S.D. Evans, K. Critchley (2012) Determining the concentration of CuInS2 quantum dots from the size-dependent molar extinction coefficient. Chemistry of Materials, 24, pp.2064-2070.


Andy BROWN (Leeds, United Kingdom), Andrew HARVIE, Kevin CRITCHLEY, Ruth CHANTRY, Demie KEPAPTSOGLOU, Quentin RAMASSE, Paul REES, M Rowan BROWN, Huw SUMMERS, Rik BRYDSON, Nicole HONDOW
08:00 - 18:15 #6321 - MS00-467 Characterization and Preparation of Carvacrol Loaded Solid Lipid Nanoparticles and Imaging with Scanning Electron Microscopy (SEM).
MS00-467 Characterization and Preparation of Carvacrol Loaded Solid Lipid Nanoparticles and Imaging with Scanning Electron Microscopy (SEM).

Characterization and Preparation of Carvacrol Loaded Solid Lipid Nanoparticles and Imaging with Scanning Electron Microscopy (SEM)

Gökhan DIKMEN1*, Ilknur DAG2, Bukay YENICE GURSU3

1,2,3Eskisehir Osmangazi University, Central Research Laboratory Application and Research Center (ARUM), Odunpazarı, 26480, Eskisehir-Turkey

gokhandikmen1@gmail.com

Backgrounds: Drug carrier systems such as nano lipid particles, polymeric micelles, dendrimers and solid lipid nanoparticles (SLNs) provide controlled release of the drug both in the desired time and in specific region. A lot of anti cancerogen and anti microbial drugs such as carvacrol exhibit various side effects due to especially high dosage. These side effects can be eliminated using drug delivery systems such as SLNs and NLPs.

Material and methods: SLN formulations were prepared using hot homogenization method after then these formulations were characterized by Zeta Sizer, FT-IR, NMR and SEM. In order to image of SLN formulations, formulations were coated with Au-Pd complex and than imaged by SEM.

Results: Carvacrol loaded SLNs formulations were proven good stability (-34.4 mV) and small size (almost 190 nm). SLN formulations were compared with the freshly prepared formulations of carvacrol and tween 80 by FT-IR spectroscopy. In FT-IR spectra, any chemical shift or deformation in the bands and any stability problems were not observed. Moreover, SEM images were taken and measured the particle size of these formulations.

Conclusions: Particle size of Carvacrol was decreased using solid lipid nanoparticles and this formulation may be suitable as a nano drug carrier system for cancer and microbial treatment.

Keywords: Carvacrol, SLNs, SEM, Caharcterization, Spectroscopy

Acknowledgment: This work was supported by a grant from Eskisehir Osmangazi Universty (Project Number: 2015-910).


Gokhan DIKMEN (Eskısehir, Turkey), Ilknur DAG, Bukay YENICE GURSU
08:00 - 18:15 #6330 - MS00-469 Energy dispersive x-ray analysis of platinum-nickel nanoparticles embedded in hollow graphitic spheres used as fuel-cell catalysts.
MS00-469 Energy dispersive x-ray analysis of platinum-nickel nanoparticles embedded in hollow graphitic spheres used as fuel-cell catalysts.

Introduction

Proton Exchange Membrane Fuel Cells (PEM-FCs) are known as potential energy conversion devices in transportation systems. For the efficiency of these fuel cells a highly efficient and stable catalyst is needed. Platinum-Nickel bimetallic nanoparticles embedded in hollow graphitic spheres (HGS) have been proven as highly active catalyst for the oxygen-reduction reaction which plays a key role in the efficiency of PEM-FCs.1

These catalysts are synthesized via the confined-space alloying approach. The synthesis of PtNi@HGS starts with the impregnation of HGS with the metal precursors. After high temperature annealing treatments metallic nanoparticles with a small size (3.5 nm) and a narrow particle size distribution encapsulated in the pores of the HGS can be obtained.2

 

 

Methods

In this study the PtNi@HGS synthesized via confined-space alloying were analyzed using different electron microscopy methods like HAADF-STEM, EDX line scan and elemental mapping. Especially the electrochemically degraded samples were of great interest questioning the distribution of the two metals in the metallic nanoparticles.

To confirm the experimental results and to explain the structure of the nanoparticles after degradation theoretical EDX line scan profiles were calculated using Monte-Carlo-simulations3.

 

 

Results

In HR-STEM images the structure of this catalyst system can be seen clearly: The crystalline metallic nanoparticles are encapsulated in pores of the hollow graphitic spheres (fig. 1). The EDX elemental mapping shows that the metal nanoparticles contain Pt and Ni. EDX line scans with a high spatial resolution clearly evidence a 0.5-1 nm thick Pt-rich outer shell and Pt-Ni core after electrochemical degradation of the catalyst.

To confirm the experimental results and to explain the structure of the nanoparticles theoretical EDX line scan profiles were calculated using Monte-Carlo simulations. Simulated line scans of PtNi@Pt particles (0.5 nm shell and 3 nm core) show profiles similar to the experimental data as shown in figure 2. This excellent agreement supports the formation of core shell particles during the electrochemical degradation of the catalyst. 

 

 

References

1)    Mezzavilla, S., Baldizzone, C., et al, in preparation

2)    Baldizzone C., Mezzavilla S., et al, Angew. Chem. Int. Ed. 53, 14250-14254 (2014)

3)    Drouin, D., Couture, A. R., et al, Scanning, 29, 92–101 (2007)


Ann-Christin SWERTZ (Muelheim an der Ruhr, Germany), Stefano MEZZAVILLA, Norbert PFÄNDER, Ferdi SCHÜTH, Christian W. LEHMANN
08:00 - 18:15 #6433 - MS00-471 (S)TEM Study of the Influence of Synthesis conditions on the Nanostructure and Performance of Au/CeO2 Model Catalysts.
MS00-471 (S)TEM Study of the Influence of Synthesis conditions on the Nanostructure and Performance of Au/CeO2 Model Catalysts.

Ceria nanoparticles exhibiting controlled morphologies have been studied as model supports of gold nanoparticles to establish correlations between surface crystallography and catalytic performance [1]. It is generally assumed that the contacts between Au nanoparticles and support involve the expected ones, i.e. Au//CeO2 {100} in the case of nanocubes, Au//CeO2 {110} in nanorods and Au//CeO2 {111} for nano-octahedra. Nevertheless, it is important to recall at this respect that: (1) model crystallites involve more than one type of surface plane [2]; (2) previous reports have evidenced that gold nanoparticles anchor preferentially at sites allowing to maximize contact with {111} facets [3]; (3) the surface structure of the model support crystallites may strongly depends on the activation treatments performed on the catalyst prior to the catalytic assay. Therefore, as illustrated in this contribution, a combined 2D and 3D (S)TEM investigation is necessary to reveal the actual nature of the Au//ceria interfaces on these model supports.

CeO2 nanocubes (CeO2NC) were prepared using a hydrothermal method. This support was then treated in an O2(5%)/He atmosphere at 600oC for 1 hour to simulate the influence of activation at high temperatures (CeO2NC600). Gold was deposited over the two supports by Deposition-Precipitation method with the objective to anchor 1.5 wt. % of Au on each of these materials. The final gold loadings on those samples were 0.4% and 1.0% respectively (0.4% Au/CeO2NC and 1.0% Au/CeO2NC600 samples), which clearly indicated a large influence of the activation treatment on the capability of the model support crystallites to anchor the metallic phase on its surface.

HREM and HAADF-STEM tomography confirmed that the CeO2NC surface was a mixture of {100}, {110} and {111} facets, the latter two resulting from truncations of the cubes at edges and corners. In the CeO2NC600 support, the {110} surfaces on the edges of the nanocubes, which appeared flat in the CeO2NC sample, were fully transformed into a system of {111} nanofacets. Additionally, those edges grew in extent after the calcination process, from less than 1% up to 25% after the thermal treatment. These results suggest that surface nanofaceting significantly promotes the deposition of gold.

In contrast to expectations, STEM studies revealed that Au nanoparticles were always preferentially anchored on {111} surfaces: on the vertices of 0.4% Au/CeO2NC (Figures 1a,2a) and on the {111}-nanofaceted edges in the 1.0% Au/CeO2NC600 (Figures 1b, 2b). This result does not only explain the larger metal loading observed on the calcined support but also warns about simplifications about the nanostructure of these systems as well as on the importance of their detailed characterization by STEM.   

 

References:

[1] Wu, Z. et al., J. Catal. 285 (2012), p. 61-73.

[2] Florea, I.et al., Cryst. Growth Des. 13 (2013), p. 1110-1121.

[3] González, J. C. et al., Angew. Chem. Int. Ed. 48 (2009), p. 5313-5315.


Miguel TINOCO, Susana FERNANDEZ-GARCIA, Miguel LOPEZ-HARO (Puerto Real, Spain), Ana Belen HUNGRIA, Xiaowei CHEN, Ginesa BLANCO, Jose Antonio PEREZ-OMIL, Sebastian COLLINS, Hanako OKUNO, José Juan CALVINO
08:00 - 18:15 #6468 - MS00-473 Structural Transition of PtAg nanoalloys: annealing effect on atomic ordering and segregation.
MS00-473 Structural Transition of PtAg nanoalloys: annealing effect on atomic ordering and segregation.

Metallic nanoparticles made of more than one element (i.e. nanoalloys) are developed because they can present synergetic effects which enhance a wide range of properties in many fields of science such as reactivity, magnetic storage or medical imaging. Taking advantage of both alloying and size effects, the so-called nanoalloys have considerably widened the technological potential of nanoparticles due to their tunability by size, shape and composition [1-4].

The structural landscape of bi-metallic nanoparticles is very rich: the structure and the state of mixing or segregation depend on multiple parameters leading to different structures (crystalline, non-crystalline, alloyed, segregated, core shell, onion like, Janus…). Obtaining a complete and precise description of a single particle, and checking its representativeness, remain challenging and the latest developments in electron microscopy could contribute to address this key issue.

The present study was done in an attempt to investigate the effects of composition, post –annealing treatment on the size-dependent atomic arrangement in Pt-Ag nanoparticles to study the phase diagram of this system at the nano-scale. The availability of sub-nanometer electron probes in a STEM and aberration corrected (Cs-corrected) high resolution transmission electron microscopy (HRTEM), ensure great capabilities for the investigation of size, shape, structure and composition.

PtAg nanoparticles were prepared by electron beam deposition of Pt and Ag on an amorphous carbon layer kept at room temperature during the deposition. The deposition rate was adjusted to reach an average composition of Ag-52at%. Post deposition annealing treatment were carried out under ultrahigh vacuum at 673K.

Figure 1 shows TEM and Cs-corrected HRTEM images of the PtAg nanoparticles prepared at room temperature and after a post annealing treatment reaching 673K. After the room temperature deposition the particles are crystalline and ramified. This is due to static coaslescence effect: the consequence of high particle density on the carbon support. The post annealing treatment induces mobility of the atoms and particles and consequently Oswald ripening, dynamic coalescence and restructuration mechanisms leading to particles with a quasi-spherical shape. EDX analysis performed on single particles shows an evolution of the particles composition after the annealing process. Moreover, after the post annealing treatment some particles present an alternating contrast on HRTEM images. This is confirmed on HAADF STEM images as shown on figure 2. The combination of HAADF images and EDX analysis on single particles have shown that structural and chemical configurations depend on the composition showing alloyed or core-shell particles. Moreover a structural transformation from an alloyed disordered PtAg phase to an ordered L11 PtAg phase with the post annealing treatment was observed. This L11 phase appears for a very narrow interval of composition and presents some internal strains.

 

References:

[1] Nanoalloys: Synthesis, Structure and Properties edited by D. Alloyeau, C. Mottet, C. Ricolleau, London, Springer-Verlag, 2012

[2] Nanoalloys: from fundamentals to emergent applications edited by F. Calvo, Elsevier, 2013

[3] R. Ferrando, J. Jellinek, R.L. Johnson, Chem. Rev. 108 -3, 845 (2008)

[4] P. Andreazza, V. Pierron Bohnes, F. Tournus, C. Andreazza-Vignolle, V. Dupuis, Surf. Sc. Rep. 70, 188-258 (2015)

 

Acknowledgement:

The authors acknowledge financial support from the CNRS-CEA “METSA” French network (FR CNRS 3507) for the HRTEM experiments conducted on the MPQ – Paris Diderot platform


Caroline ANDREAZZA-VIGNOLLE (ICMN, Orléans), Pascal ANDREAZZA, Jérome PIRART, Asseline LEMOINE
08:00 - 18:15 #6488 - MS00-475 Quantitative Electron Tomography Study of Metal Catalysts Supported on Heavy Oxides Combining Image De-noising and Compressed Sensing Techniques.
MS00-475 Quantitative Electron Tomography Study of Metal Catalysts Supported on Heavy Oxides Combining Image De-noising and Compressed Sensing Techniques.

3D quantitative characterization of metal catalysts supported on heavy oxides by High Angle Annular Dark Field (HAADF) STEM electron tomography (ET) is a very challenging task. Noble metal nanoparticles (Au, Ru) supported on ceria or ceria mixed oxides illustrates the case. The difference, very small in some cases, between the atomic number (Z) of metal and support (ZRu=44, ZAu=79, ZCe=58) complicates the discrimination of the small particles.  This makes that each step, acquisition, alignment, reconstruction and segmentation, has to be carefully optimized not only to improve the visualization of the nanoparticles but also to extract relevant quantitative results, e.g. metal loading, specific surface area, or particle size distribution. In this work, we have combined advanced image processing algorithms, based on undecimated wavelets transform (UWT) [1], to improve the contrast and denoising the tilt series projections, with new reconstruction algorithms, based on compressed sensing (CS) [2], to study a series of catalysts with a high potential in different processes related to the production of hydrogen, as CeO2 Nanorods, Au/CeO2 Nanocubes or Ru/Ce2Z2O8 . The results obtained by ET have been compared to those determined by macroscopic characterization techniques as Inductively Coupled Plasma (ICP) or Brunauer, Emmett and Teller (BET) isotherm method.

HAADF-STEM ET has been carried out using a FEI TITAN3 THEMIS 60-300 operated at 200kV recently installed at Cadiz University. Data collections were obtained by tilting the specimen about a single axis perpendicular to the electron beam. Series of projections were acquired between -70º and +70° either every 2° or 5º. The images series were aligned using Inspect3D and TomoJ and reconstructed using the ASTRA Toolbox implemented in Matlab [3]. In the particular case of CS, Total Variation Minimization (TVM) was carried by using the TVAL3 solver [2]. 

Figure 1 shows the 3D-rendered voxel of a catalyst consisting of Au nanoparticles supported on CeO2 Nanocubes after reconstructing the raw tilt series by SIRT (Figure 1a) and TVM (Figure 1b) and after denoising the tilt series projections by UWT and reconstructed by SIRT (Figure 1c) and TVM (Figure1d). Note how in the case of UWT-TVM reconstruction an important improvement in terms of morphology of the support and visualization of nanoparticles is obtained. The 3D rendered surface of a similar sample and the 3D quantifications of relevant properties as metal loading, specific surface area and average particle size are shown in Figure 2. It is important to point out how the values are quite similar to those determined by macroscopic characterization techniques. These results indicate that this combination of techniques allows determining nanostructural features representative of the catalysts at macroscopic level.

References:

[1] T. Printemps et al. Ultramicroscopy 160 (2016) 23-24

[2] B. Goris et al. Ultramicroscopy 113 (2012) 120-130

[3] W. van Aarle et al. Ultramicroscopy 157 (2015) 35-47

[4] Authors acknowledge funding from MINECO/FEDER (MAT2013-40823R and CSD09-00013). Financial resources from the European Union Seventh Framework Programme under Grant Agreement 312483 – ESTEEM2 (Integrated Infrastructure Initiative – I3) is also acknowledged.


Miguel LOPEZ-HARO (Puerto Real, Spain), Miguel TINOCO, Ana Belen HUNGRIA, Jose Juan CALVINO
08:00 - 18:15 #6499 - MS00-477 Electron Tomography of entrapped iron nanoparticles in silicalite-1 (Fischer-Tropsch catalyst).
MS00-477 Electron Tomography of entrapped iron nanoparticles in silicalite-1 (Fischer-Tropsch catalyst).

It is known that Fischer-Tropsch synthesis [1] is one of the best processes to convert syngas emitted from combusted of fossil fuels like coal and natural gas into liquid gas/ liquid fuels and other petro chemicals. Moreover, iron based catalysts are known to be efficient and active components of Fischer-Tropsch catalyst. Encapsulating iron nanoparticles into mesosporous silica allows to provide a highly selective, active and stable Fe@silicalite-1 catalyst [2]. Its architecture prevents the particles from sintering under reaction conditions, it does not show any activity to water-gas-shift reaction during FTS and it does not produce any CO2 which is another advantage of this catalyst. These attributes made the Fe@silicalite-1 catalyst extremely selective.

 The 2D observation and analysis of iron nanoparticles on Silicate-1 gives only partial information regarding the distribution and position of the particles making necessary electron nano-tomography analyses. To understand the 3D position and size distribution of the iron nanoparticles in silica cages, high resolution electron tomography in bright field mode was performed in a FEI-Titan ETEM using a Fischione tomographic holder. We worked in a low dose mode to avoid as much as possible any beam damage of silica. After the segmentation of reconstructed volumes, the quantification of the 3D models was made (Fig 1). It was found that a large majority of iron nanoparticles are encapsulated in the walls of silica. The Fe particles average size is of 3.5 nm (Fig 2) [3].

[1] A. de Klerk, Fischer–Tropsch Process, Kirk-Othmer Encyclopedia of Chemical Technology,  (2013), 1–20.

[2] S. W. Li, L. Burel, C. Aquino, A. Tuel, F. Morfin, J. L. Rousset and D. Farrusseng, Chem. Commun., 49, 8507 (2013).

[3] Thanks to CLYM (Consortium Lyon - St-Etienne de Microscopie, www.clym.fr) for the access to the microscope funded by the Region Rhône-Alpes, the CNRS and the 'GrandLyon'.


Siddardha KONETI (VILLEURBANNE CEDEX), Lucian ROIBAN, David FARRUSSENG, Joffrey HUVE, Thierry EPICIER
08:00 - 18:15 #6548 - MS00-479 Microstructural characterization of Delaminated 2D Cobaltites.
MS00-479 Microstructural characterization of Delaminated 2D Cobaltites.

The lamellar cobaltites NaxCoO2 have awakened the interest of scientific community because of their superconductive phases [1], thermoelectric [2] and photocatalytic properties [3], and their possible use as cathodes in sodium batteries [4]. Their basic structure can be described on the basis of infinite [CoO6] octahedral edge-sharing layers with Na cations at the interlayer space. Depending on the Na content different polymorphs have been described [5]. The synthesis of these species at the nanoscale could be a key factor for their technological exploitation. Furthermore, recent researches have proved that the inclusion of certain transition metals as dopants in the original structure could improve some of these properties [6].

 

Here we present an electron microscopy study of delaminated 2D cobaltites in the NayCo1-xMxO2, (M = Mn, Ni, Cu) system obtained through a new synthesis strategy based on a co-precipitation reaction in a basic medium. After purification by centrifugation, a soft thermal treatment is performed before a selective sedimentation process in order to select the smallest flakes. Transmission electron microscopy proves the success of the delamination process. Low magnification TEM (figure 1a) shows the presence of two remarkable features: i) an apparently very thin matrix and ii) elongated particles in between 5 and 30 nm. The corresponding HREM (figure 1b) study reveals that both matrix and particles are crystalline with periodicities that can be interpreted in terms of [001] and [100] projections of the monoclinic cell of Na0.6CoO2 [5]. To get information about the atoms distribution and oxidation states a study in a probe aberration corrected microscope JEOL JEM ARM200 cFEG has been performed. Preliminary HAADF and ABF (figure 2) studies evidenced a lamellar structure similar to the Na0.6CoO2 with the alkali metal interlaying the Co1-xMxO2 sheets. EELS study confirms the presence of all Na, Co, Ni and O (figure 2c) suggesting an intermediate oxidation state of cobalt cations between 3 and 4 in good agreement with the sodium content stablished by ICP.   

 

References:

 

[1] K. Takada et al., Nature, 422 (2003) 53-55.

[2] M. Lee et al., Nature Materials, 5 (2006) 537-540.

[3] L.  Liao et al., Nature Nanotechnology, 9 (2014) 69-73.

[4] B. L Ellis et al., Current Opinion in Solid State and Materials Science, 16 (2012) 168-177.

[5] L. Viciu et al., Physical Review B, 73 (2006) 174104.

[6] E. Levi et al, Solid State Ionics, 264 (2014) 54-68.

 


Alberto AZOR LAFARGA (Madrid, Spain), María Luisa RUIZ, David PORTEHAULT, Clemént SANCHEZ, José María GONZÁLEZ-CALBET
08:00 - 18:15 #6554 - MS00-481 Topotactic reduction in SrMnO3-δ nanoparticles followed by atomically-resolved microscopy.
MS00-481 Topotactic reduction in SrMnO3-δ nanoparticles followed by atomically-resolved microscopy.

The current technological demand of new devices requires the continuous stabilization of new compounds with nanometric scale for novel applications. The huge diversity of functional properties of the perovskite related mixed oxides make them ideal candidates to study the effect of the particle size reduction [1]. Particular attention has been paid to Mn related perovskites since Mn can be stabilized in different oxidation states leading to a series of functional materials. Here, we present the study of SrMnO3 nanoparticles obtained from a novel [SrMn(edta)(H2O)5]·3/2H2O heterometallic precursor and we evidence the different reactivity of the SrMnO3 material in nanometric size [2].

Atomically-resolved high angle annular dark field (HAADF) images, acquired in a JEOL JEMARM200cF microscope, reveals 40-60 nm size SrMnO3 nanoparticles with 4H hexagonal related-perovskite structure (Figure 1). Oxygen deficient samples were obtained from SrMnO3.0 nanoparticles by reducing the oxygen content in a controlled way. The 4H-related structure is kept in the SrMnO2.82 sample confirming a topotactic reduction of the nanoparticles when the oxygen content decreases down to δ=0.2. This fact makes a difference with respect to the bulk material, where the stabilization of a cubic-related perovskite structure is observed for the same oxygen content [3]

The structural study performed on SrMnO3.0 reveals the presence of dislocations at the origin of the structural disorder in the 4H-perovskite structure, while more complex arrangement of cubic and hexagonal layers seems to be responsible for structural defects in SrMnO2.82 sample (Figure 2a). Additionally, electron energy loss spectra (EELS) were acquired to access the local oxidation state of manganese. The coexistence of Mn3+ and Mn4+ is observed in SrMnO2.82 but differences in the Mn-L2,3 line position suggests a higher presence of Mn3+ associated to the structural defect areas (Figure 2b).

References

[1] A. Querejeta et al. Chem. Mater.21, (2009), pp.1898

[2] I.N. González-Jiménez et al. Chem. Mater. 26, (2014), pp. 2256

[3] A. Varela et al. J. Am. Chem. Soc., 131 (24), 2009, pp. 8660

 


Almudena TORRES-PARDO (Madrid, Spain), Irma Noemí GONZÁLEZ-JIMÉNEZ, Aurea VARELA, Marina PARRAS, Jose M. GONZÁLEZ-CALBET
08:00 - 18:15 #6592 - MS00-483 Heterogeneity in nanoparticle size determination using several biophysical and microscopy methods.
MS00-483 Heterogeneity in nanoparticle size determination using several biophysical and microscopy methods.

Nanoparticles belong to the class of nanomaterial that are natural, incidental, or manufactured materials containing elementary particles where at least one external dimension is in the range of 1 nm to 100 nm for 50% or more of the particles in the number size distribution. Therefore, size criteria is a key control parameter for defining nanoparticles. Moreover, nanoparticles have the property of assembling, agglomerating, or aggregating elementary particles into larger entities. But, the definition clearly refers to elementary particle and thus fine methodology must be used to obtain the critical size of nanoparticles. Besides, nanotoxicology which is the field of study of toxicological effect of nanoparticle in health aims to relate putative toxicological effect to the size of nanoparticles as the current dogma in the field suggest a greatest impact/reactivity with smaller particles than larger ones. Thus, obtaining accurate size measurements of nanoparticles is of great scientific significance.

In this work, we have combined several biophysical and microscopic methods to characterize the size of several nanoparticles of main interest in toxicological studies. Although we have worked on more than 50 different metallic nanoparticles, we only focused our interest on two families: Silver (Ag) and titane oxide (TiO2). We have used atomic force microscopy, wet scanning transmission electron microscopy, dynamic light scattering, small-angle X-ray scattering. First, controls on well-behaved nanosize samples were performed and maximum dispersion between low-bound and high-bound sizes was about 30%. The striking results of this work is the relatively large dispersion of results obtained on Ag and TiO2 (several hundreds of percent) depending on the method used. Several hypotheses can explain these results: nanoparticle solutions are highly heterogeneous and some methods may capture different forms, measurement methods are biased toward a certain size, methodologies used to extract sizes are inaccurate. All these hypotheses are plausible and will be discussed in this work.


Jean-Luc PELLEQUER (GRENOBLE CEDEX 9), Julien CAMBEDOUZOU, Adèle GERDIL, Christian GODON, Aurélie HABERT, Nathalie HERLIN-BOIME, Renaud PODOR, Johann RAVAUX, Jean-Marie TEULON
08:00 - 18:15 #6605 - MS00-485 Impact of water and oxidation states in the galvanic replacement formation of hollow oxide nanoparticles.
MS00-485 Impact of water and oxidation states in the galvanic replacement formation of hollow oxide nanoparticles.

Metal-oxide hollow nanoparticles are appealing structures from the applied and fundamental viewpoints. The synthesis of bi-phase metal-oxide hollow nanoparticles has been reported based on galvanic replacement using an organic-based seeded-growth approach, but with the presence of H2O. Here we report on a novel route to synthesize hollow core-shell MnOx/FeOx nanoparticles by galvanic replacement without the use of H2O. We demonstrate that the role of H2O in the MnOx/FeOx galvanic replacement synthesis is to oxidize the MnO/Mn3O4 seeds into pure Mn3O4 in order to obtain the suitable oxidation state so that the Mn3+→Mn2+ reduction by the Fe2+ ions can occur. Thus, if no H2O is added, onion-like MnO/Mn3O4/Fe3O4 nanoparticles are obtained, while whenMn3O4 seeds are used, hollow core-shell MnOx/FeOx are achieved. Thus, a critical step for galvanic replacement is the existence of proper oxidation states in the seeds so that the chemical reduction by the shell ions is thermodynamically favoured.


Pau TORRUELLA BESA (Barcelona, Spain), Alberto LÓPEZ-ORTEGA, Alejandro ROCA, Michelle PETRECCA, Sónia ESTRADÉ, Francesca PEIRÓ, Victor PUNTES, Josep NOGUÉS
08:00 - 18:15 #6617 - MS00-487 Thermodynamics of Pd(-Au) nanoparticle-titania interface studied by aberration-corrected TEM.
MS00-487 Thermodynamics of Pd(-Au) nanoparticle-titania interface studied by aberration-corrected TEM.

Over the last decade, supported metallic nanoparticles (NPs) have garnered continuous interests across many fields of research due to their novel physico-chemical properties which are, among others, shape-dependent. Though many synthesis schemes are being developed to generate a variety of NP shapes, understanding why a NP adopts a given shape is still challenging due to the intricate influences of thermodynamic, kinetic and energetic factors. In this contribution, we first report on the structural properties of Au-Pd nanoalloys supported on rutile titania, which can be considered as model catalysts. Then, using a recently proposed scheme that combines TEM imaging of single nanoparticles and a generalized Wulff-Kaishew theorem [1], the interface and triple-line energies of the Au-Pd NP-titania system are determined experimentally and studied as a function of particle composition and epitaxial relationship.

Bimetallic Au-Pd nanoalloys with well-controlled composition were grown on well-defined rutile titania nanorods by pulsed laser deposition. Titania with rod-like shape and narrow size distribution was prepared using a two-step hydrothermal procedure developed by Li and Afanasiev [2]. The nanorods preferentially expose (110) facets. Bimetallic Au-Pd nanoalloys with well-controlled composition were grown on these nanorods by alternate ablation of two monometallic Au and Pd targets in a UHV chamber. During particle nucleation and growth, the rods were kept at a temperature of 300°C, the nominal thickness of deposited metal was 1 nm. For ultra-high resolution TEM imaging and X-ray spectroscopy, a JEOL ARM 200F microscope was used. This microscope combines a cold field emission gun and a CEOS hexapole spherical aberration corrector (CEOS GmbH) to compensate for the spherical aberration of the objective lens. The microscope was operated at 80 kV to limit beam damage.

Bimetallic nanoparticles with Au, Pd, Au38Pd62 and Au57Pd43 stoichiometries were synthesized. Their composition was precisely determined by EDX analyses of assemblies of particles. Single-particle imaging of the as-synthesized samples showed the formation of well-separated NPs with size range 2-8 nm. As a result of the poor epitaxy between the metallic NPs and their support, most NPs displayed droplet-like morphology with ill-defined crystalline structure. Wherever a higher degree of epitaxy prevailed, Au-Pd NPs in the shape of truncated octahedra and having a completely disordered fcc structure (random alloy) were observed. Various epitaxial relationships were identified between the nanoparticles and the titania support, with the two dominant and previously unreported relationships being Au-Pd(111)//Rutile(110)[1-1-1] and Au-Pd(100)//Rutile(110)[1-10] (Figure 1).

With the precise equilibrium morphology of the NPs known, the interface and triple-line energies of the metal/oxide systems were determined by combining particle size measurements in atomically-resolved projected TEM images acquired parallel to the metal-oxide interface and a generalized Wulff-Kaishew theorem derived from Sivaramakrishnan et al. [4] (Figure 2). This theorem takes into account the influence of triple-line energy on nanoparticle equilibrium shape. Interface and triple-line energies were investigated as a function of particle composition and epitaxy. For any given epitaxial relationship, the relative amplitude of the NP truncation at the interface is found to increase linearly with particle size, i.e. the bigger the NP, the more it wets the oxide surface. On the rutile support, analysis of Pd, Au38Pd62 and Au57Pd43 NPs in epitaxial relationship Au-Pd(111)//Rutile(110)[1-1-1] shows clearly that the interface and triple-line energies are strongly influenced by particle composition and epitaxy. The value of the interface energy of the bimetallic Au-Pd NPs γi,Au-Pd is about 1 J m-2, which is about two  times that of the monometallic Pd NPs, respectively (γi,Pd = 0.5 ± 0.1 J m-2 ). As for the triple-line energy, it is 0.8 ± 0.2 J m-2 for the monometallic Pd nanoparticles. This value is about four times the average triple-line energy measured in Au-Pd NPs.

[1]        S. Sivaramakrishnan et al, Phys. Rev. B 82, 195421-195431 (2010)

[2]       C H. Li and P. Afanasiev, Mater. Res. Bull. 46, 2506–2514 (2011)


Nhat Tai NGUYEN, Jaysen NELAYAH (LMPQ, Paris), Laurent PICCOLO, Pavel AFANASIEV, Damien ALLOYEAU, Guillaume WANG, Christian RICOLLEAU
08:00 - 18:15 #6637 - MS00-489 Lanthanide distribution in NaLuF4:Gd,Yb,Er upconversion nanocrystals by EFTEM and EELS.
MS00-489 Lanthanide distribution in NaLuF4:Gd,Yb,Er upconversion nanocrystals by EFTEM and EELS.

Lanthanide-doped nanoparticles (NPs) have gained interest within the last decade due to their photon upconversion properties. Upconversion is a multi-photon process in which two or more lower energy photons are converted to a higher energy photon by step-wise energy transfer between an absorber ion and an emitter ion (1). These upconversion nanoparticles (UCNPs) are a promising alternative to traditional organic fluorphores and quantum dots in the area of bioimaging because their excitation wavelength (980 nm) lies within an optical window where there is the least absorption and scattering by biomolecules (lower background signals), and they do not exhibit photobleaching or photoblinking.

One of the main challenges limiting their application is a trade-off between luminescence intensity and size of the NP. Smaller NPs exhibit less toxicity as they can be excreted through the urinary system, and they are better for intracellular imaging as the smaller size prevents interference with molecular trafficking within the cell, pharmacokinetics, and protein function; however, upconversion luminescence intensity decreases with size due to, in part, surface quenching from the presence of surface defects (2).

Few reports exist on the synthesis of sub-10 nm UCNPs, and even fewer exist on the synthesis of sub-5 nm UCNPs that show visible upconversion emission (3-6). We have recently synthesized two sizes of NaLuF4:Gd, Yb, Er UCNPs (ca. 4 nm and ca. 12 nm), through a facile one-pot method, that both show bright upconversion luminescence upon excitation by a 980 nm laser.

In order to better understand their luminescent properties, we have used energy filtered transmission electron microscopy (EFTEM) and electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) to investigate the distribution of the different lanthanides within the nanocrystal. Measurements were performed on an HF-3300 instrument operating at 300 kV.

The results suggest that Lu is enriched in the outer (shell) region of the nanocrystal, while Gd is enriched in the inner (core) region of the nanocrystal (Figure 1). Based on these results, we propose that the Lu shell protects the upconverting core from surface quenching, thereby allowing even 4 nm NPs to show upconversion luminescence. We also propose that the formation of the core-shell structure is mediated by the way the individual lanthanides nucleate in solution – Gd nucleates first to form the core, while Lu nucleates later to form the shell. This proposal is also in accordance with previous reports on the nucleation of lanthanide NPs (7).  

EFTEM and EELS in STEM are shown to be valuable tools to characterize the structure of lanthanide-doped UCNPs and to determine structure-property relationships, and can aid in the further development of these materials for various applications.  

(1)  Haase, M.; Schafer, H. Angew. Chem. Int. Ed., 2011, 50, 5808-5829.

(2)  Kobayashi, H.; Ogawa, M.; Alford, R.; Choyke, P. L.; Urano, Y. Chem. Rev., 2010, 110, 2620-2640.

(3)  Liu, Q.; Sun, Y.; Yang, TS.; Feng , W.; Li, CG.; Li, FY. J. Am. Chem. Soc., 2011, 133, 17122-17125.

(4)  Ostrowski, A. D.; Chan, E.C.; Gargas, D. J.; Katz, E. M.; Han, G.; Schuck, P. J.; Milliron, D. J.; Cohen, B. E. ACS Nano, 2012, 6, 2686-2692.

(5)  Gargas, D. J.; Chan, E. M.; Ostrowski, A. D.; Aloni, S.; Virginia, M.; Alteo, P.; Barnard, E. S.; Sanii, B.; Urban, J. J.; Milliron, D.; Cohen, B. E. Nature Nanotechnology, 2014, 9, 300-305.

(6)  Rinkel, T.; Nordmann, J.; Raj, A. N.; Haase, M. Nanoscale, 2014, 6, 14523-14530.

(7) Mai, H. X.; Zhang, Y. W.; Yan, Z. G.; Sun, L. D.; You, L. P.; Yan, C. H. J. Am. Chem. Soc., 2006, 128, 6426-6436.


Elsa LU (Thornhill, Canada), Jothirmayanantham PICHAANDI, Lemuel TONG, M. A. WINNIK
08:00 - 18:15 #6669 - MS00-491 Multiscale investigation of USPIO nanoparticles in atherosclerotic plaques and their catabolism and storage in vivo.
MS00-491 Multiscale investigation of USPIO nanoparticles in atherosclerotic plaques and their catabolism and storage in vivo.

Since applications of nanotechnologies for life and health sciences are booming, magnetic nanoparticles (NP) have undergone considerable development. They combine physical, chemical and magnetic properties that make them appropriate as contrast agents  for diagnosis using medical imaging techniques such as Magnetic Resonance Imaging (MRI) or ultrasonic imaging. Nanometric contrast agents are made of metallic rare earth elements (Gd) or transition metal (Mn, Fe) oxide cores.

      The storage and catabolism of Ultrasmall Super Paramagnetic Iron Oxide (USPIO) nanoparticles was analyzed through a multiscale approach combining Two Photon Laser Scanning Microscopy (TPLSM) and High-Resolution Transmission Electron Microscopy (HRTEM) at different times after intravenous injection (iv) in an atherosclerotic ApoE-/- mouse model. The atherotic plaque features and the USPIOs heterogeneous biodistribution were revealed from organ’s scale down to subcellular level. The biotransformation of the nanoparticle iron oxide (maghemite) core into ferritin, the non-toxic form of iron storage, was demonstrated for the first time ex vivo in atherosclerotic plaques as well as in spleen, the iron storage organ. These results rely on an innovative spatial and structural investigation of USPIO’s catabolism in cellular phagolysosomes. This study showed that these nanoparticles were stored as non-toxic iron compounds: maghemite oxide or ferritin, which is promising for MRI detection of atherosclerotic plaques in clinic using these USPIOs [1].

 

 

References

 

[1] VA Maraloiu, F Appaix, A Broisat et al., Nanomedicine: Nanotechnology, Biology and Medicine 12 (1), 191-200 (2016)

 

 

Acknowledgement

 

 The two-photon microscopy studies were performed on the National Platform of Intravital Microscopy in Grenoble (France Life Imaging). This platform was partly funded by the French program “Investissement d’Avenir” run by the “Agence Nationale pour la Recherche”; grant “Infrastructure d’avenir en Biologie Santé - ANR11-INBS-0006”. Researches were partially granted by the French National Agency for Research (ANR) in the frame of the INFLAM project and partially supported by a grant of the Romanian National Authority for Scientific Research, CNCS – UEFISCDI, project number PN-II-RU-PD-2011-3-0067.


Valentin-Adrian MARALOIU (Magurele, Romania), Florence APPAIX, Alexis BROISAT, Dominique LE GUELLEC, Valentin Serban TEODORESCU, Catherine GHEZZI, Boudewijn VAN DER SANDEN, Marie Genevieve BLANCHIN
08:00 - 18:15 #6695 - MS00-493 Influence of gamma-irradiation on the photocatalytic activity of undoped and Cu doped titania nanoparticles.
MS00-493 Influence of gamma-irradiation on the photocatalytic activity of undoped and Cu doped titania nanoparticles.

Copper doped and undoped TiO2 powders have been prepared by sol-gel technique and annealed at 400 °C. The powders were gamma irradiated at ambient temperature and doses between 14 and 60 KGy. The objective of the proposed work is to study the effect of gamma irradiation on the physical properties of undoped and Cu doped TiO2 photocatalyst. The structural, morphological and optical properties of initial undoped and doped TiO2 powders have been investigated. The performance of such a system strikingly depends on the insertion of impurities in the TiO2 structure sublattice and of the disruption brought about. Consequently, this work is mainly focused on a nanoscale electron energy loss spectroscopy (EELS) study, which has been performed on samples with various Cu to Ti molar ratios (0-12at.%). This study is an attempt to identify at the atomic level, the nature of the dopant insertion in the structure. It also allows evaluation of the composition of the studied TiO2 powders throughout individual crystallites. In Cu doped TiO2 sol gel powders, Cu2+ ion has been found to substitute to Ti4+ ions. Gamma irradiated samples present a crystalline core and a disordered shell structures (see Figure 2) as a result of the formation of oxygen vacancies. Such oxygen vacancies at the surface of TiO2 nanocrystals lead to a remarkable enhancement of the photocatalytic activity of Cu doped TiO2 nanocrystals (see Figure 3). This preparation method by gamma treatement could be potentially used for large-scale production of high-surface-area anatase titania nanoparticles with trapped electrons on oxygen vacancies. Such catalysts show remarkable enhancement in the visible light absorption and photocatalytic activity. The doping and gamma irradiation doses impacts on the structural, optical and photocatalytic efficiencies will be thus highlighted and correlated.

 


Lolwa SAMET (Tunis, Tunisia), Katia MARCH, Odile STEPHAN, Radhouane CHTOUROU
08:00 - 18:15 #6720 - MS00-495 Synthesis of ultra-small iron-oxide and cobalt ferrite nanoparticles by a simple thermal decomposition approach.
MS00-495 Synthesis of ultra-small iron-oxide and cobalt ferrite nanoparticles by a simple thermal decomposition approach.

 

Ferrite nanoparticles are promising candidates for a range of bio-medical applications due to their interesting physical and magnetic properties.  In order for their nano-scale properties to be utilised however, synthesis methods which enable fine control over size, shape and composition are required.

In this work we explore the size-controlled synthesis of iron-oxide and cobalt ferrite nanoparticles by thermal decomposition and their characterisation by advanced microscopy techniques. The tailored synthesis of the nanoparticles was addressed by exploring the parameters in the reduction of both an iron precursor (Fe(III)(acac)3) and a cobalt precursor (Co(II)(acac)3) in oleylamine. In this thermal decomposition approach, oleylamine acts as the sole surfactant, reducing agent, and solvent. By controlling the surfactant-to-precursor ratio, we have produced ultra-small nanoparticles with a narrow size distribution. The size, shape and atomic structure of the resulting particles were examined by aberration-corrected annular dark-field scanning-transmission electron microscopy; and the results show that their average size is <3 nm and they are highly crystalline. Electron energy loss spectroscopy was used to analyse the composition of the resulting nanoparticles and the oxidation state of the metals, confirming that they consist of Fe3O4 and CoFe2O4.

Our results serve to form a solid support for future studies into the size-dependent interaction of iron-oxide and cobalt ferrite nanoparticles with cells.

 

The authors thank the EPSRC for financial support for this work.

 

[1] K. Mandel, F. Dillon, A. A. Koos, Z. Aslam, F. Cullen, H. Bishop, A. Crossley, and N. Grobert, ‘Customised transition metal oxide nanoparticles for the controlled production of carbon nanostructures’, RSC Adv., vol. 2, no. 9, pp. 3748–3752, Apr. 2012.

[2] S. Amiri and H. Shokrollahi, ‘The role of cobalt ferrite magnetic nanoparticles in medical science’, Materials Science and Engineering: C, vol. 33, no. 1, pp. 1–8, Jan. 2013.

[3] Y. Yu, W. Yang, X. Sun, W. Zhu, X.-Z. Li, D. J. Sellmyer, and S. Sun, ‘Monodisperse MPt (M = Fe, Co, Ni, Cu, Zn) Nanoparticles Prepared from a Facile Oleylamine Reduction of Metal Salts’, Nano Lett., vol. 14, no. 5, pp. 2778–2782, May 2014.

[4] V. Georgiadou, C. Kokotidou, B. L. Droumaguet, B. Carbonnier, T. Choli-Papadopoulou, and C. Dendrinou-Samara, ‘Oleylamine as a beneficial agent for the synthesis of CoFe2O4 nanoparticles with potential biomedical uses’, Dalton Trans., vol. 43, no. 17, pp. 6377–6388, Apr. 2014.


Dominique PICHÉ (OXFORD, United Kingdom), Juan G LOZANO, Frank DILLON, Nicole GROBERT
08:00 - 18:15 #6724 - MS00-497 Atomic resolution electron microscopy of cobalt ferrite nanoparticles.
MS00-497 Atomic resolution electron microscopy of cobalt ferrite nanoparticles.

Cobalt ferrite (CoFe2O4) nanoparticles have recently emerged as a potential candidate for a range of bio-medical applications due to their interesting physical and magnetic properties. The high magneto-crystalline anisotropy of CoFe2O4 nanoparticles in particular offers improved efficiency over iron-oxide nanoparticles, allowing for smaller particles to be used. Synthesis of cobalt ferrite nanoparticles is conventionally achieved using thermal decomposition in oleic acid and oleylamine. Recent methods using oleylamine alone demonstrate greater suitability for biomedical applications, as oleylamine facilitates the phase-transfer process required to make the nanoparticles water-soluble. However changing the surfactant is known to have a significant effect on the crystal structure and morphology of metal-oxide nanoparticles, and the crystal structure of oleylamine-capped cobalt ferrite nanoparticles has not been studied in detail before. Here we demonstrate the inverse spinel structure of cobalt ferrite nanoparticles synthesised with oleylamine as the sole surfactant, by aberration-corrected annular dark-field scanning-transmission electron microscopy. The crystal structure is resolved with atomic-level detail which has not been demonstrated with cobalt ferrite nanoparticles previously. Furthermore the distribution of cobalt and iron atoms is shown by atomic-resolution EELS spectroscopy mapping. This data serves to form a solid support for future studies into the size-dependent interaction of cobalt ferrite nanoparticles with cells.

 

Acknowledgements

The authors thank the EPSRC for financial support for this work through grant numbers EP/M010708/1 and EP/K040375/1, for the South of England Analytical Electron Microscope. The research leading to these results has also received funding from the European Union Seventh Framework Programme under Grant Agreement 312483 - ESTEEM2 (Integrated Infrastructure Initiative–I3).

 

[1] K. Mandel, F. Dillon, A. A. Koos, Z. Aslam, F. Cullen, H. Bishop, A. Crossley, and N. Grobert, ‘Customised transition metal oxide nanoparticles for the controlled production of carbon nanostructures’, RSC Adv., vol. 2, no. 9, pp. 3748–3752, Apr. 2012.

[2] L. Jones, H. Yang, T. J. Pennycook, M. S. J. Marshall, S. V. Aert, N. D. Browning, M. R. Castell, and P. D. Nellist, ‘Smart Align—a new tool for robust non-rigid registration of scanning microscope data’, Adv Struct Chem Imag, vol. 1, no. 1, pp. 1–16, Jul. 2015.

[3] Y. Yu, W. Yang, X. Sun, W. Zhu, X.-Z. Li, D. J. Sellmyer, and S. Sun, ‘Monodisperse MPt (M = Fe, Co, Ni, Cu, Zn) Nanoparticles Prepared from a Facile Oleylamine Reduction of Metal Salts’, Nano Lett., vol. 14, no. 5, pp. 2778–2782, May 2014.

[4] V. Georgiadou, C. Kokotidou, B. L. Droumaguet, B. Carbonnier, T. Choli-Papadopoulou, and C. Dendrinou-Samara, ‘Oleylamine as a beneficial agent for the synthesis of CoFe2O4 nanoparticles with potential biomedical uses’, Dalton Trans., vol. 43, no. 17, pp. 6377–6388, Apr. 2014.


Dominique PICHÉ (OXFORD, United Kingdom), Juan G LOZANO, Aakash VARAMBHIA, Frank DILLON, Lewys JONES, Peter D NELLIST, Nicole GROBERT
08:00 - 18:15 #6745 - MS00-499 XTEM observations revealing high diffusivity and Ge segregation in UV laser pulse annealed SiGeO and GeTiO amorphous films.
MS00-499 XTEM observations revealing high diffusivity and Ge segregation in UV laser pulse annealed SiGeO and GeTiO amorphous films.

XTEM observations revealing high diffusivity and Ge segregation in UV laser pulse annealed SiGeO and GeTiO amorphous films  

 

V.S. Teodorescu1, A.V. Maraloiu1, A. Kuncser1, C. Ghica1, M.L. Ciurea1, A.M. Lepadatu1,

I. Stavarache1, D.N. Scarisoreanu2, M. Dinescu2, M-G. Blanchin3

 

 

1 National Institute of Materials Physics, 077125, Bucharest-Magurele, Romania

2 National Institute of Lasers Plasma and Radiation Physics, 077125 Bucharest-Magurele, Romania

3 ILM- Université Claude Bernard Lyon1, 69622 Villeurbanne Cedex, France

 

Ge nanoparticles embedded in dielectric oxide matrix are very interesting for application in memory devices. Amorphous SiGeO and GeTiO films with different Ge/oxide ratio where produced by magnetron sputtering deposition on Si wafers. In these systems, the Ge nanoparticles are formed during RTA annealing by segregation of the Ge atoms via a nucleation and growth processes. The Ge nanoparticles can remain in amorphous state or become crystallized. The SiO2 matrix remains amorphous after annealing, but the TiO2 matrix crystallize in the same time with the Ge nanocrystals formation in the case of RTA annealing or remain amorphous in the case of laser pulse annealing [1]. The SiGeO and the GeTiO oxide films were laser pulse irradiated, using the forth harmonics radiation of the Nd-YAG laser (l = 266 nm) and a low laser pulse fluences between 15 and 100 mJ/cm2. These fluence values are less than the melting threshold of the amorphous oxide films. 

 

The nanoscale films structure investigation was performed with the JEM ARM200F electron microscope using specimens prepared by cross section method (XTEM).  The structural modifications induced by the laser pulse irradiation are present under the film surface in a depth of about 60 to 80 nm, which is more than the expected absorption depth of the laser radiation. The XTEM structural study is the only method for the study of the structural modifications induced by the laser pulse irradiation in a nanometric layer under the film surface. Figure 1 shows the Ge segregation under surface of the irradiated GeTiO amorphous film. The Ge nanoparticle and the titanium oxide matrix remain amorphous after the laser annealing. Figure 2 shows a similar situation in the case of the SiGeO amorphous film. In this case, the estimated temperature of the film surface is close to the Ge melting point in a lapse of time of the order of magnitude of 10ns.

 In all cases, the oxide matrix remains in solid phase during the laser pulse action. Formation of the Ge nanoparticles during laser pulse action shows the presence of a very high diffusivity of the Ge atoms in the laser pulse field, similar to the diffusivity taking place in the liquid state.

 

 This work was supported by  PNII- ID –project number 289/2011.

 

[1].  Nanostructuring of GeTiO amorphous films by pulsed laser irradiation , V.S. Teodorescu, C. Ghica, A.V. Maraloiu, M. Vlaicu ,A. Kuncser, M.L.  Ciurea,  I. Stavarache,  A. M Lepadatu, N.D.  Scarisoreanu, A. Andrei, V. Ion, M. Dinescu,  Beilstein Journal of Nanotechnology, 04/2015; 6(1):893-900.


Valentin Serban TEODORESCU, Valentin Serban TEODORESCU (Bucharest-Magurele, Romania), Adriaan Valentin MARALOIU, Andrei KUNCSER, Corneliu GHICA, Magdalena Lidia CIUREA, Ana-Maria LEPADATU, Ionel STAVARACHE, Doinel Nicolae SCARISOREANU, Marie-Genevieve BLANCHIN, Ana-Maria DINESCU
08:00 - 18:15 #6755 - MS00-501 Deformation behavior of micron-sized polycrystalline gold particles studied by in situ compression experiments and frictional finite element simulation.
MS00-501 Deformation behavior of micron-sized polycrystalline gold particles studied by in situ compression experiments and frictional finite element simulation.

Gold particles in the micro- and nanometer size regime find wide spread technical applications. Especially for micro- and nanoelectromechanical applications the mechanical properties can determine device reliability and overall performance. Whereas studies on the compression of single crystal gold particles are quite abundant [1–3], the detailed deformation behavior of polycrystalline gold or other fcc metal particles is far less understood [4–5]. It has been shown for that the hardness of gold particles varies with strain and depends on the particle size: whereas hardness decreases for submicron particles (geometric softening) an increase in hardness is commonly observed for millimeter sized samples (work hardening). Geometric softening is driven by an ongoing geometric shape change during stressing and occurs for work hardened samples. Also an increase of yield strength has been observed: this effect is related to the particles’ small dimensions and restricted dislocation activities. Particularly for metal particles it is known that the initial deformations are concentrated in proximity to the contact areas; only with increasing strain the deformed regions progresses deeper into the particles. Friction at the contact interfaces thus affects the plastic deformation inside the particles. In general frictional processes at the contact interfaces are difficult to access - one possibility is the finite element method (FEM). So far mainly full stick (infinite coefficient of friction) or perfect slip (frictionless contacts) conditions have been modeled and the effect of friction on the deformation behavior of gold particles has not seen significant attention.

Within this contribution a combined experimental and finite element study on the deformation behavior of micron-sized polycrystalline gold particles is presented [6]. In situ uniaxial compression experiments of single spherical polycrystalline gold particles in the size range of 1 µm were performed with an in situ scanning electron microscope supported custom built manipulation device [7]: stress-strain data and information on particle morphology are thus accessible. A well reproducible stress-strain behavior without plastic creep is observed. From the FEM modelling a detailed insight into the deformation and the influence of friction is obtained. The stress-strain behavior and the observed geometric shape of the stressed particles can be modeled by an elastic-perfectly plastic finite element model which accounts for frictional effects at the contact interfaces. Coefficients of friction are experimentally assessed by atomic force microscopy. A comparison to a frictionless finite element model reveals the necessity of considering the effects of friction: at small strains the particles appear to be softer due to a reduced dissipation of plastic energy, whilst at large strains the resistance to deformation is increased. The latter effect is found to be mainly due to the dissipation of frictional energy at the contact interfaces.

1 W.M. Mook, C. Niederberger, M. Bechelany, L. Philippe, J. Michler, Nanotechnology 21, 2010, 055701.

2 Z.J. Wang, Z.W. Shan, J. Li, J. Sun, E. Ma, Acta Mater. 60, 2012, 1368–1377.

3 D. Mordehai, S.-W. Lee, B. Backes, D.J. Srolovitz, W.D. Nix, E. Rabkin, Acta Mater. 59, 2011, 5202–5215.

4 N. Gane, Proc. Roy. Soc. Lond. A. 317, 1970, 367–391.

5 M.M. Chaudhri, I.M. Hutchings, P.L. Makin, Philos. Mag. A, 1984, 493–503.

6 J. Paul, S. Romeis, P. Herre, W. Peukert, Powder Technol. 286, 2015, 706–715.

7 S. Romeis, J. Paul, M. Ziener, W. Peukert, Rev. Sci. Instrum. 83, 2012, 095105.

Financial support by the Deutsche Forschungsgemeinschaft (DFG) through the Cluster of Excellence “Engineering of Advanced Materials” and GRK1896 “In situ microscopy with electrons, X-rays and scanning probes” is gratefully acknowledged.


Stefan ROMEIS (Erlangen, Germany), Jonas PAUL, Patrick HERRE, Wolfgang PEUKERT
08:00 - 18:15 #6759 - MS00-503 High Resolution Study of Epoxy Resin with Silicon Dioxide Nanoparticles in Sputter Coated and Natural state in ESEM.
MS00-503 High Resolution Study of Epoxy Resin with Silicon Dioxide Nanoparticles in Sputter Coated and Natural state in ESEM.

A number of sites have studied properties of nano-composites, such as epoxy resin with nano-particles or micro-particles. The studies have shown that the already very good electrical insulation properties of epoxy resin, used for example in protective coats of transformers, can be substantially improved by addition of nano-particles. Enrichment of epoxy resin with silica nano-particles increases inner resistance and significantly reduces the loss agent [1]. Improved properties of nano-composites are beneficial for all industries from military and cosmic to electric energy, electronics and cosmetics.

Due to the high carbon and hydrogen levels epoxy resin shows lower signal electron emission coefficient. The material electric conductivity is poor. When observing in the classical SEM the resin specimen must therefore be coated with a thick electrically conductive layer or observed under primary electron beam very low energy conditions, in the order of single keV units. Due to the high sensitivity of the sample to damage by radiation it is further necessary to significantly reduce the beam current and observe the specimen at higher scanning speeds. All of the abovementioned factors significantly complicate observation of these samples in the classical scanning electron microscope and due to the low detected signal to noise ratio make achievement of high resolution impossible. As a consequence of interactions of the signal electrons with the gas positive ions are generated in the environmental scanning electron microscope (ESEM), causing compensation of the emerging charge on the non-conductive samples. This allows for observation of non-conductive samples under conditions of higher energy of the electron beam without metal plating. The positive ions hitting the sample surface also remove contamination from the sample surface which facilitates escape of the low-energy secondary electrons from the sample and their getting to the detector. 

Although under the high gas pressure conditions in ESEM the charge is compensated with positive ions and the sample is in addition covered with a 5 nm thick layer of carbon, charging can be observed on the sample peaks and edges, see fig. 1A. The charging is caused by the higher beam current chosen to compensate for the insufficient intensity of signal of the secondary electrons penetrating through the carbon layer and in the effort to achieve higher resolution of the nano-particles. Despite all this the image shown in fig. 1 is blurred and does not show visible details. This may be addressed by the sample coating with a thicker conductive layer, which results in a substantially negative effect, as shown by the results of our experiments. The specimen surface is modified, the nano-structure is made invisible and artefacts are produced. This may be resolved by reduced beam current, optimisation of the detection ability of the detector by correct selection and setting of the microscope and especially by removal of the conductive layer form the sample surface. Figs. 1B and 1C show clearly visible nano-particles with a substantially higher resolution. In the case of figs. 1B and 1C the specimen is in its natural condition without use of any conductive layer, observed in the ESEM environment with 150 Pa vapour pressure. This work was supported by the project [4].

References:

[1] Hudec J, et al., Fine Mechanics and Optics 60 (9) (2015), p. 268.

[2] Neděla V, et al., Nucl. Instrum. Methods in Physics A, 645 (1) (2011), p. 79.

[3] Maxa J, et al., Advances in Military Technology 7 (2) (2012), p. 39.

[4] The European Commission (ALISI No. CZ.1.05/2.1.00/01.0017)


Jiří HUDEC (Brno, Czech Republic), Vilém NEDĚLA
08:00 - 18:15 #6766 - MS00-505 Improvement of Soft Matter transmission Electron Microscopy; Application and Interpretation Pitfalls.
MS00-505 Improvement of Soft Matter transmission Electron Microscopy; Application and Interpretation Pitfalls.

Transmission Electron microscopy (TEM) is an increasingly popular tool for the characterization of soft, supramolecular materials. TEM can give direct structural information and can be used to complement indirect techniques like dynamic light scattering, NMR and spectroscopic methods. Although the most common TEM preparation techniques are well documented, many are erroneously used or the images misinterpreted. A survey of around 200 recent and highly cited publications indicates that artefacts are a wide-spread problem in the field of soft matter electron microscopy.

Subjecting doxorubicin loaded liposomes, “Doxil®”, to the four most common TEM techniques, drying, drying followed by staining, negative staining and cryo-electron microscopy,  reveals the possibilities and impossibilities of each of them. Upon drying (figure 1a,b), the structure of the liposomes is completely altered. Because of the lack of heavy elements, without staining the remaining structures are only visible at extreme defocus values (Figure 1a). Staining after drying improves the contrast, but the structure of the liposomes was lost (Figure 1b). Negative staining preserves the structure of the liposomes but only the outside is visible (figure 1c). Cryo-electron microscopy reveals both the liposome and the doxorubicin crystal inside the liposomes. Furthermore, the bilayer of the phospholipid vesicle is clearly visible and its dimensions can be measured (figure 1d).

Unaware of the lack of structural preservation, many studies use drying of their soft materials without staining to prove self-assembly into vesicles or micelles. Most supramolecular self-assembled structures are composed of light elements which hardly scatter electrons, nevertheless high contrast images are presented. Most likely these are the result of the drying process where also dissolved materials will form particles. A better solution to image soft materials is negative staining, where the structures are surrounded by a “glassy” dried heavy-metal stain that preserves the structures and gives the objects a high contrast halo. Although better than just drying, negative staining suffers from limited resolution by the grain size of the stain, and the obtained information originates from the surface of the object as the stain obscures the internal structure.  However,  various mistakes are made including positive contrast after negative staining and measuring the stain layer as proof of bilayer thickness. The best method is cryo-electron microscopy where the sample is vitrified in a thin layer of its own solvent. The structure is well preserved and a near atomic resolution can be achieved. The lack of heavy metal stain is compensated by a very good phase contrast upon defocusing. Expertise is needed to distinguish between sample and artefact. Lack thereof results in ice contamination interpreted as part of the sample.

A systematic search on “self-assembly” or “vesicle” in combination with “electron microscopy” in the recent, highly cited, literature brings to light that almost half of the evaluated papers contains erroneous or non-interpretable electron microscopy pictures or images that were misinterpreted. In most cases soft, supra molecular, materials were dried without any staining on the grid and present dense round objects. Apparently peer review fails at this point.  Lack of TEM expertise amongst reviewers and previously published incorrect literature seem to be the main cause. Regarding the number of mistakes in application and interpretation, there is room for improvement in both the reviewing process and the application of different TEM techniques and their corresponding interpretation.


Linda FRANKEN (Groningen, The Netherlands), Egbert BOEKEMA, Marc STUART
08:00 - 18:15 #6790 - MS00-507 Combined macroscopic, nanoscopic and atomic-scale characterization of highly dispersed bimetallic particles supported on ceria-zirconia mixed oxide catalysts.
MS00-507 Combined macroscopic, nanoscopic and atomic-scale characterization of highly dispersed bimetallic particles supported on ceria-zirconia mixed oxide catalysts.

Highly dispersed gold nanoparticles appear as promising catalysts in the field of fine chemistry. However, the relatively low resistance to sintering of gold particles under reaction conditions often leads to a significant loss of catalytic activity. One strategy to overcome this limitation is combining gold with another metal to form a bimetallic system with enhanced stability, activity and/or selectivity. [1]

 

The catalytic behavior of bimetallic particles is determined by their structure, size, morphology and chemical composition. Undoubtedly, to design efficient and high-quality catalyst requires controlling all these features during the synthesis as well as a careful characterization of the synthesized catalysts at the finest scales. Such a characterization poses demanding challenges to STEM techniques if we want it to be representative of the actual macroscopic state of the surface of the catalyst.

In this work, the capabilities and limitations of both the macroscopic (XPS, XRD, ICP-AES, and chemisorption) and atomic scale (STEM-XEDS) techniques in the characterization of highly dispersed bimetallic particles, AuRu and AuPd, supported on a ceria-zirconia mixed oxide (CZ) have been evaluated. In particular, the effects of the catalyst activation pretreatment on nanostructure and catalytic performance for the selective oxidation of glycerol to glyceric acid of both bimetallic systems are investigated in comparative terms.

Following the approach described in [2], the relationship between composition (Au at.%), as determined by quantitative STEM-XEDS analysis, and size, as determined by HREM and HAADF, of a large ensemble of individual nanoparticles on the two types of catalysts was established as a function of calcination temperature, Figures 1 and 2. According to size-composition maps shown there, Figures 1(a) and 2(a), the monometallic gold particles exhibit a wider larger of sizes and a larger average size, whereas monometallic Ru or Pd particles are smaller in average. Bimetallic entities are found in the intermediate size range. Raising the temperature up to 700ºC, Figures 1 and 2 (b), induces a compositional homogenization in the case the AuPd catalysts which is not observed in the case of the AuRu bimetallics. From this point of view both catalysts behave in a quite different manner, in spite of Ru and Pd being elements very close in the Periodic Table.

Comparison of data obtained on the corresponding monometallic reference catalysts clearly indicates that the second metal, Ru or Pd, moderates the sintering behavior of Au, i.e. the stability of this type of catalysts. Moreover, a significant improvement in the catalytic activity takes place in the bimetallic catalysts, which is related to the presence of bimetallic entities in both catalysts. STEM data suggest that these bimetallic nanoparticles are formed by decoration of the surface of Au nanoparticles with 3D, nanosized, domains of the second metal, instead of forming actual Au-Ru or Au-Pd alloys. [3,4]

The limitations of STEM studies to reach a precise representation of the composition on both bimetallic systems determined by macroscopic techniques (like XPS or ICP) will also be addressed, Figure 1and 2 (c). The likely origin of such discrepancies as well as strategies to overcome this limitation will also be discussed.

[1] Ch. W. Han et al, Nano Lett.,2015, 15, 8141–8147.

[2] L. Bednarova, C. E. Lyman, E. Rytter, A. Holmen, J. Catal. 2002, 211, 335-346.

[3] L. Chinchilla et al, Catal. Today 2015, 253,178-189.

[4] C. Olmos et al, Appl. Catal. B-Environ. 2016 (In press).


Lidia CHINCHILLA, Carol OLMOS, Xiaowei CHEN, Ana Belen HUNGRIA, José Juan CALVINO (Cadiz, Spain)
08:00 - 18:15 #6791 - MS00-509 Observation of the graphitization process of hollow graphitic spheres.
MS00-509 Observation of the graphitization process of hollow graphitic spheres.

Introduction

Hollow graphitic spheres (HGS) are interesting support materials for catalytic active metal nanoparticles. HGS can be widely used as tailored mesoporous carbon support with several advantages over other carbon materials.1 The spheres have a high surface area and a pore system with narrow pore size distribution which makes this material interesting for the impregnation of metal nanoparticles and techniques like the confined-space alloying of bimetallic nanoparticles.2 Additionally HGS have a high degree of graphitization what makes the material stable under common catalytic reaction conditions.  A typical synthesis route1 for HGS covers 3 major steps starting with silica spheres coated with a mesoporous silica shell:

-          Impregnation of the SiO2 template with iron nitrate and polymer-precursor

-          Carbonization/graphitization of the polymer shell

-          Leaching of the silica to obtain hollow graphitic spheres

 

Methods

The polymer-coated SiO2 spheres were dry-prepared  and heated up to 1000°C with a heating rate of 5 °C min-1. At certain points the temperature was maintained to minimize the thermal drift for the image acquisition.

 

Results

Starting the thermal treatment at first the activation of iron particles could be observed. Beginning at about 250°C the finely dispersed iron started to agglomerate and formed metallic nanoparticles. By further heating the iron particles became mobile and the graphitization started at about 900°C.

 

References

1)      C. Galeano et al., J. Am. Chem. Soc., 134, 20457-20465 (2012)

2)      C. Baldizzone, S. Mezzavilla et al, Angew. Chem. Int. Ed. 53, 14250-14254 (2014)


Norbert PFÄNDER (Mülheim an der Ruhr, Germany), Ann-Christin SWERTZ, Christian W. LEHMANN, Robert SCHLÖGL
08:00 - 18:15 #6801 - MS00-511 Characterization of bimetallic PdAg nanoparticle arrays by the diblock copolymer micelle approach.
MS00-511 Characterization of bimetallic PdAg nanoparticle arrays by the diblock copolymer micelle approach.

Bimetallic nanoparticles (NPs) display unique properties drastically different from those of the corresponding single-component particles. These properties are assumed to result from both the electronic and structural effects of the bimetallic NP. As these properties depend also on the preparation conditions, the synthesis of bimetallic NPs with accurately controlled structures and compositions is essential to obtaining advanced materials for electronic, magnetic, optic and catalytic properties. In the present study, 2D ordered arrays of bimetallic PdAg NPs were successfully synthesized via the copolymer micelle approach and characterized by various spectroscopic and microscopic characterization methods. A special focus was laid on the influence of the type of reduction treatments on the chemical nature and the stability of the PdAg NPs. A comparison with the synthesis of single metal (Pd and Ag) NPs obtained by the same method was made.

A series of polystyrene-b-poly(4-vinylpyridine) (PS-b-P4VP) diblock copolymers of various compositions and molecular weights was synthesized by nitroxide mediated radical polymerization using an alkoxyamine unimolecular initiator (Styryl-SG1). Intermolecular interactions between the PdCl2 and/or AgNO3 salts and P4VP micellar core and formation of nanoparticles from the micellar complex were investigated by various spectroscopic (UV-vis, XPS) and microscopic (AFM, HRTEM/EDX) characterization methods.

Once the base solutions were made, three ways to produce the final arrays of bimetallic NPs were investigated (Figure 1). One consisted in using an oxygen-plasma treatment after dip-coating of the SiO2 surface (Figure 1a); this method uses the large amount of electrons generated by the plasma to reduce the metallic cations and lead to the formation of the NPs that eventually oxidize under the oxygen-plasma. A second method consisted in introducing a reducing agent (hydrazine) to the base solution (Figure 1b-path1). The third method consisted on flowing a vapour of the reducing agent (hydrazine) over the film after dip-coating of the SiO2 surface (Figure 1b-path2). Spectroscopic and microscopic characterization of the resulting films before and after reduction showed that the two first methods consistently lead to the formation of rather regular arrays of NPs. In the case of the films before reduction we observe that, for the three methods, the metallic loaded micelles preferentially arrange to form a quasi-hexagonal pattern on the carbon coated copper grid; a close observation of the P4VP cores revealed a fine grain substructure inside every micelle corresponding to ultrasmall (bi)metallic NPs (Figure 2e). After reduction either by oxygen-plasma or by hydrazine in the solution (Figure 2) we obtain rather organized arrays of bimetallic NPs. The NPs have uniform sizes (Figure 2d-insert) and compositions. Unlike the NPs obtained by oxygen plasma, those obtained by hydrazine in the solution are not oxidized. A full characterization of the physicochemical properties of the NPs was enabled by the use of different methods (ICP, AFM, HRTEM/EDX, XPS, UV-Vis). 

The copolymer micelle approach is an excellent method to obtain ordered arrays of bimetallic nanoparticles supported on flat surfaces with controlled sizes, spacing and compositions [1]. These collections of NPs can thus be used as model catalysts (for COV abatement in the case of PdAg) where important parameters that influence their catalytic behaviour can be finely monitored and modulated.[2]

References
[1] E. Ehret, E. Beyou, G.V. Mamontov, T.A. Bugrova, S. Prakash, A. Aouine, B. Domenichini and F.J. Cadete Santos Aires, Nanoscale 7 (2015) 13239-13248.

[2] E. E. and F. J. C. S. A. thank CNRS for grant n° 98087 within the Franco-Siberian Center; G. V. M. and T. A. B. acknowledgethe Tomsk State University Academic D. I. Mendeleev Fund Program.The authors thank the CLYM (Centre Lyon-St Etienne de Microscopie) for access to the Ly-EtTEM.


Eric EHRET, Emmanuel BEYOU, Grigory V MAMONTOV, Tatiana A. BUGROVA, Bruno DOMENICHINI, Swamy PRAKASH, Mimoun AOUINE, Francisco José CADETE SANTOS AIRES (VILLEURBANNE CEDEX)
08:00 - 18:15 #6814 - MS00-513 Nanometer WOx species evidenced by HRTEM/EDX in WO3/SiO2 catalysts for the metathesis reaction.
MS00-513 Nanometer WOx species evidenced by HRTEM/EDX in WO3/SiO2 catalysts for the metathesis reaction.

The demand for propylene is growing rapidly in the chemical industry since it is used for the production of commercial products such as polypropylene, acrylonitrile, alcohol, acrylic acid, and other petrochemical products. The metathesis reaction (using feeds of ethylene and butenes) is among other methods (naphtha steam crackers, fluid catalytic crackers, propane dehydrogenation, Fischer–Tropsch reactions) a way of producing propylene. Rather recently, metathesis reaction over WO3/SiO2 catalysts has received considerable attention by the industry to produce propylene [1] even though WO3/SiO2 catalysts have long been considered and used in the metathesis of linear olefins [2]. Despite thorough characterization of the WO3/SiO2 catalysts only a few works make use of transmission elec-tron microscopy to study such catalysts [3]. In those studies particular interest has been taken to the morphology of the WO3 rather large particles as well as to coking issues. Indeed TEM observations show the presence of large WO3 crystallites (tens or hundreds of nm). It is generally admitted that two tungsten phases co-exist : crystalline WO3 and a surface phase in strong inter-action with the support. The latter is supposed to be at the origin of the active sites but no TEM characterization of it has yet been performed to our knowledge. In this work we report HRTEM/EDX evidence of the co-existence of highly divided WOx nanoparticles (< 2 nm) with WO3 large crystallites.

Catalysts with different tungsten loadings (4, 6, 8, 10 wt%) were prepared by incipient wetness impregnation of an aqueous solution of ammonium metatungstate hydrate (Aldrich, 99.9%) over silica gel. Electron microscopy (HRTEM, EDX) was performed with a JEOL JEM 2010 TEM equipped with a LaB6 gun, UHR pole-piece and a Pentafet LinK-Isis EDX spectrometer (Oxford Insts.).

In all samples irregular shaped polycrystalline (Figure 1a) and singlecrystal (Figure 1b-d) large particles (10–50 nm) were observed. For both cases they result from the agglomeration of smaller crystallites. Together with these large particles, numerous smaller particles exist in every sample (Figure 2a). These nanopar-ticles are generally smaller that 2 nm and even in the subnanometer range (Figure 2a-c). The former can be isolated (Figure 2d) or tend to agglomerated and rearrange in larger structures after sometime under the electron beam (Figure 2b-bottom, Figure 2e). The latter are rather difficult to detect and only the EDX spectra confirm the presence of  W; diffraction contrast (Figure  2c) only appears after sometime under the electron beam. It is rather difficult to estimate the oxygen quantitative concentration on the WOx nanostructures since we are dealing with only a few atoms and above all the support is an oxide yielding a large contribution to the oxygen signal. The smaller nanoparticles (≤ 1 nm) present internal diffraction contrasts that can be attributed to a pseudo-structure. However this is only a short-range order and no finite periodicity was devised. For larger nanoparticles (1–2 nm) high resolution images (Figure 2d,e) show interplanary distances and angles between planes that can reasonably be attributed to a cfc structure. We cannot rule out however hcp structures in some cases. This is not inconsistent with the more classic orthorhombic or tetragonal structures for WO3 since the values of the structural parameters a, b and c are very close to each other and since we expect these structures to be rather WOx (x<3) than WO3. These very small species may thus form the so-called surface phase thought to be at the origine of the active sites for the metathesis reaction.[4]

References
[1] J.C. Mol, J. Mol. Catal. A: Chem. 213 (2004) 39.

[2] A.J. Moffat et al., J. Catal. 18 (1970) 345; R.C. Luckner, G.B. Wills, J. Catal. 28 (1973) 83; R. Westhoff, J.A. Moulijn, J. Catal. 46 (1977) 414;. F.P.J.M. Kerkhoff, J.A. Moulijn, J. Electron Spectrosc. Related Phenom. 14 (1978) 453.

[3] A. Spamer et al., Appl. Catal. A: Gen. 255 (2003) 133; A. Spamer et al., Appl. Catal. A: Gen. 255 (2003) 153; D.J. Moodley  et al., Appl. Catal. A: Gen. 318 (2007) 155.

[4] The Thailand Research Fund and SCG Chemicals Co. Ltd. are gratefully acknowledged for financial support.


Narongrat POOVARAWAM, Kongkiat SURIYE, Joongjai PANPRANOT, Piyasan PRASERTHDAM, Francisco José CADETE SANTOS AIRES (VILLEURBANNE CEDEX)
08:00 - 18:15 #6860 - MS00-515 Structure characteristic of Ni-poly-p-xylylene nanocomposites synthesized by VDP.
MS00-515 Structure characteristic of Ni-poly-p-xylylene nanocomposites synthesized by VDP.

The simplicity of synthesis of polymer nanocomposites together with elasticity and plasticity, make these materials attractive in the aspect of possible applications for different application, including electronics and sensors, like different rectifiers and switching devices based on their high nonlinear VAC (volt-ampere characteristics) and tendency to form Schottky diodes, transistors, nanowires. Recent progress in spintronic and application of nanocomposites in that area have been shown in the work of Y. Liu, et al. [1,2]. Distinct attention in than and other investigations was attracted to the spin-valves, which use the effect of giant or tunneling magnetoresistance. Typically these devices consist on three-layer system: nonmagnetic layer is sandwiched between two ferromagnetic (hard and soft) of those. Based on these systems scanning heads of magnetic plates and magnetoresistance memory elements were produced. Usually the polymer materials were used as interlayer material between two ferromagnetic layers (hard and soft), while the adaptation of ferromagnetic polymer nanocomposites with embedded magnetic atoms (Ni, Co, Fe) will allow to construct spin-valve structures based on the homogeneous material, introducing a number of technological advantages. For the fabrication of these heterostructures the study of physical properties, like magnetoresistive effects, including anomalous Hall effect demonstrating the evidence of spin polarization of charge carriers have to be performed together with the correlation between these effects and the structure of material. The coercive force can be changed by pinning of the ferromagnetic stage with antiferromagnetic inclusions.

In this work we present the results of electron microscopy and microanalysis study of Ni-poly-p-xylylene nanocomposites stuffed with Ni nanoparticles in 5 - 30 vol. % range of concentration. The magnetic and electrophysical properties for these samples are slightly above the percolation threshold and strongly above it.

 

1. Liu, Yaohua; Watson, Shannon M.; Lee, Taegweon; Gorham, Justin M.; Katz, Howard E.; Borchers, Julie A.; Fairbrother, Howard D.; Reich, Daniel H., Physical Review B, 2009. V. 79. 075312 

2. «Structure and optical properties of thin poly(p-xylylene) – silver nanocomposite films prepared by low–temperature vapor deposition polymerization» Dmitry R. Streltsov, Karen A. Mailyan, Alexey V. Gusev, Ilya A. Ryzhikov, Yury I. Kiryukhin, Anton S. Orekhov, Alexander L. Vasiliev, Natalia A. Erina, Andrey V. Pebalk, Yaroslav I. Odarchenko, Dmitri A. Ivanov, and Sergei N. Chvalun // POLYMER 71:60-69 · AUGUST 2015


Anton OREKHOV (Moscow, Russia), Alexsander VASILIEV, Sergey OZERIN, Artem VDOVICHENKO, Sergey CHVALUN
08:00 - 18:15 #6893 - MS00-517 Identification of core-shell structures in high active Pt-alloy catalysts for oxygen reduction by electron spectroscopy.
MS00-517 Identification of core-shell structures in high active Pt-alloy catalysts for oxygen reduction by electron spectroscopy.

A potential clean alternative to traditional power sources, in particular for the automotive industry, is represented by low temperature fuel cells [1].

The major limitation of this promising technology lies in the high loading of the mostly used catalyst Pt necessary to drive the chemical reactions at the electrodes of the cells, impacting significantly on costs.

Generally, the performance is limited by the sluggishness of the Oxygen reduction reaction (ORR) that occurs at the metal catalyst surface present at cathode. Therefore, a great effort is put in finding catalysts with higher efficiency for the ORR [2][3].

A promising strategy for enhancing the ORR activity is to alloy Pt with other metals [2]. However, commercially available Pt alloys with late transition metals are mostly unstable under the harsh conditions in a fuel cell cathode [4].

Pt-Gd has been identified as a promising material among a new class of Pt-lanthanide alloys as highly performing catalyst for the ORR in both activity and stability, surpassing the previously reported Pt-Y [5-7].

The experimental results have shown that PtxGd nanoparticles exhibit an outstanding ORR activity of 3.6 A (mg Pt)-1 at 0.9 V with respect to a reversible hydrogen electrode [8].

To fully understand the enhanced performance of these catalysts, the knowledge of the detailed structure and elemental distribution at the nanoparticle level is of extreme importance. Here we present an advanced Scanning Transmission Electron Microscopy (STEM) study of PtxGd nanoparticle catalyst.

High resolution HAADF-STEM imaging and STEM-EDX spectrum imaging has been performed in a double Cs-corrected FEI Titan Themis 60-300 at CIME laboratories, equipped with a monochromated high-brightness FEG, an EDS SUPER X system with a 0.7 srad of solid angle and a Gatan GIF Quantum ERS high energy resolution EELS spectrometer and energy filter.

PtxGd nanoparticles have been prepared through a gas aggregation technique in a multi-chamber ultrahigh vacuum system (Omicron Multiscan Lab) at DTU CINF laboratories.

Figure 1 shows a high resolution STEM micrograph and STEM-EDX elemental maps of PtxGd nanoparticles after exposure to ORR conditions during electrochemical tests. From the micrographs the sample presents a polycrystalline structure with a Pt rich shell and a Pt-Gd core. The formation of the Pt shell is assigned to the initial dissolution of Gd when exposed to the acidic solution of the ORR test. 

References

 

[1] M. K. Debe, Nature, 486 (2012), 43-51.

[2] I. E. L. Stephens et al, Energy & Environmental Science, 5 (2012), 6744.

[3] P. Strasser et al, Nature chemistry, 6 (2010), 454–60.

[4] S. Chen et al, J. Electrochem. Soc. (2010), 1571, A82.

[5] J. Greeley et al, Nature chemistry, 7 (2010), 552–6.

[6] M. Escudero-Escribano, et al, J. Am. Chem. Soc. (2012), 130, 16476.

[7] P. Hernandez-Fernandez et al. Nature Chemistry 6, 732–738 (2014).

[8] A. Velázquez-Palenzuela et al. Journal of Catalysis 328, 297–307 (2015).

 

Acknowledgment

The Danish National Research Foundation’s Center for Individual Nanoparticle Functionality is supported by the Danish National Research Foundation. 


Davide DEIANA (Lausanne, Switzerland), Amado Andres VELAZQUEZ-PALENZUELA, Maria ESCUDERO-ESCRIBANO, Federico MASINI, Ifan STEPHENS, Ib CHORKENDORFF, Cécile HEBERT
08:00 - 18:15 #6909 - MS00-519 Structure of CoAg nanoparticles embedded in a matrix.
MS00-519 Structure of CoAg nanoparticles embedded in a matrix.

Since CoAg nanoparticles are composed of two immiscible metals, their theoretical structure is predicted to be Co@Ag due to the weaker surface energy of Ag [1]. In the literature these particles are synthesized by chemistry techniques [2-3], the structure obtained is Co(core)Ag(shell) and has been confirmed by the optical response in UV-Vis spectroscopy [2]. The localized surface plasmon resonance (LSPR) of silver shell and the magnetic anisotropy of cobalt core open the access to magneto-plasmonic studies. That is why we have decided to elaborate those particles in a different approach using physical method under ultra high vacuum (UHV).

We have elaborated by low energy cluster beam deposition (LECBD [4]) technique Co50Ag50 nanoparticles of different diameter (approximatively 1 to 10 nm) in UHV which are mass selected by a quadrupole ion deflector. These clusters are embedded in different matrices (metal oxides, amorphous carbon) to protect them from oxidization. The clusters stoichiometry has been checked by EDX measurements.

The structure of Co50Ag50 clusters in carbon matrix is polycrystalline fcc. On high resolution transmission electron microscopy (HRTEM) images we can distinguish two different phases between the top and the bottom of the particle (figure 1.a) by using the intensity as a discrimination factor. Then we have determined by Fourier transforms analysis that the silver is in fcc structure and we measured approximatively the same lattice parameter than the silver bulk. Nevertheless we could not identify expected bcc, hcp or fcc [5] crystalline cobalt structure. High angle annular dark field electron microscopy (HAADF) measurements provided us informations about the contrast between cobalt and silver (figure 1.b), which depends of their respective atomic number. Inhomogeneous Janus-like structures have been identified, with cobalt assumed to be in dark and silver in bright (figure 1.b), this segregation is partially in agreement with theoretical predictions [1] which expect a core/shell segregated structure.

In Al2O3 matrix another phenomena occurs, an amorphous shell appears on each particle. As we can see on TEM image (figure 1.c and 1.d), we can distinguish a core in the particles composed of a dark part and a brighter one and an amorphous bright shell, assumed to be a reaction with the matrix. SQUID magnetic measurements confirmed us that the clusters are still ferromagnetic, an antiferromagnetic behaviour is expected for CoO, which means that the Co cannot be completely oxidized. As in carbon matrix, we can distinguish an inhomogeneous structure and an intensity contrast between the topand the bottom of the particle (figure 1.d). Then the silver is also in fcc structure and the lattice parameter obtained by Fourier analysis measurements matches with the bulk one. Moreover the same problem encountered in carbon matrix appears when we try to identify the Co crystalline structure.

[1]: F. Dorfbauer, T. Schrefl, M. Kirschner, G. Hrkac, D. Suess et al J. Appl. Phys. 99, 08G706 (2006)

[2]: P. Saravanan et al Journal of Alloys and Compounds 509, 3880–3885 (2011)

[3]: A.J. Garcia-Bastida et al Science and Technology of Advanced Materials 6, 411–419 (2005)

[4]: V. Dupuis et al Phys. Chem. Chem. Phys. 17, 27996-28004 (2015)

[5]: M. Pellarin et al Chemical Physics Letters, volume 2 17, 4 (1994)


Ophelliam LOISELET (Villeurbanne), Florent G TOURNUS, Katia MARCH
08:00 - 18:15 #6945 - MS00-521 Exchange-coupled spinel oxides: micro-Raman and in field Mossbauer spectroscopies correlated to HRTEM.
MS00-521 Exchange-coupled spinel oxides: micro-Raman and in field Mossbauer spectroscopies correlated to HRTEM.

In this work, we investigate on spinel oxides exchange-coupled on CoxFe3-xO4 (x=0, 0.2, 0.4, 0.6, 0.8 and 1). The samples were synthesized using a solvothermal chemical route. X-ray (XRD) and electron diffraction (ED), associated with High Resolution Transmission Electron Microscopy (HRTEM), Magnetic investigations, micro-Raman spectroscopy and in-field 57Fe Mossbauer Spectroscopy were used to study the CoxFe3-xO4structural and physical properties.

XRD (fig.1), ED and HRTEM (fig.2) analyzes exhibit the presence of two phases, the hematite and the magnetite, for x=0. However, typical spinel structures for samples with cobalt concentrations x>0 have been found. Low temperature magnetic measurements demonstrate the presence of a jump in M (H) curves for x>0 (fig.3). This result has been reported to the presence of two exchange-coupled magnetic phases. TEM images have shown the presence of two shapes and sizes till x=0.6. The largest rectangular particles (~250 nm for x=0), investigated by ED, index in the spinel space group (Fd-3m, magnetite) for x=0. Referring to M (H) curves, these two shapes may have different chemical compositions. ED analyses done on the other compositions didn’t exhibit any structure difference between the nanoparticles. The presence of the second phase (magnetite) has been deduced by a heat treatments correlated to micro-Raman spectroscopy. In-field Mossbauer (fig.4 up) correlated to HRTEM (fig.4 down) investigations evidence the exchange-coupling of the magnetite and the cobalt ferrite. The jump like behavior has been found to disappear for x=1 (single phase).


Mohamed SAIDANI (Tunis, Tunisia), Wajdi BELKACEM, Jean François BARDEAU, Adrian BEZERGHIANU, Loic PATOUT, Jena Marc GRENECHE, Najeh MLIKI
08:00 - 18:15 #6950 - MS00-523 STEM investigation of titania supported gold nanoparticles stabilized by ceria.
MS00-523 STEM investigation of titania supported gold nanoparticles stabilized by ceria.

Gold nanoparticles show an excellent catalytic performance in energy production related processes such as low temperature CO oxidation, PROX and WGS reactions [1-2]. The effect of the support, like titania or ceria, and/or the presence of different kinds of promoters on the catalytic performance of gold have also been investigated, and a general agreement about the advantages of using reducible oxides is deduced from a revision of the most recent literature. Gold catalysts have also proven to be active in environmental reactions as those occurring in the catalytic converters (TWC) for depuration of exhaust gases in vehicles. The use of gold as a component of the current TWC formulations, substituting the more critical Pt and Pd, would only be feasible if the excellent catalytic properties of this metal could be maintained after exposure at high temperature operating conditions. However due to its relative low melting point gold suffers a severe sintering process starting at temperatures of around 473 K [3].

In order to investigate the stabilization of gold nanoparticles a reference system, 1.5 wt% Au/TiO2World Gold Council catalyst, was modified by depositing on its surface a monolayer of CeO2by incipient wetness impregnation to a final ceria molar loading of 5.4%.Scanning Transmission Electron Microscopy (STEM) studies show that the dispersion of the gold nanoparticles remained unchanged after the impregnation in a value about 36%. Afterwards, both catalysts were tested in consecutive CO oxidation reaction loops at increasing final temperatures. In these cycles, the ceria-modified catalyst showed not only a higher activity but, more importantly, a largely enhanced stability against deactivation.

Scanning Transmission Electron Microscopy has provided key information to rationalize the origin of the stabilization effect provided by ceria. In particular, STEM-HAADF images haveclearly revealed the presence of nanometer-sized ceria rafts, less than 1 nm thick, on the surface of the fresh CeO2(5.4%)/Au(1.5%)/TiO2catalysts. After the CO oxidation test at the highest temperature, 1223 K, the conventional WGC catalyst suffered from a very severe Au nanoparticle sintering, Figure 1(a),whereas Au nanoparticle growth was very much limited in the ceria-modified catalyst after the same aging test, Fire 1(b).



Cs-corrected STEM results reveal that a major fraction of the Au nanoparticles (75%), comprising all the smaller ones (< 5 nm), was contacting the ceria nanolayers. This evidences an important stabilizing effect of the proposed surface modification. Moreover, these results open up possibilities for gold catalysts in applications where high temperatures are reached under working conditions.

(1) G.J. Hutchings, Catalysis by gold, Catal. Today. 100 (2005) 55–61. doi:10.1016/j.cattod.2004.12.016.

(2) M. López-Haro, J.J. Delgado, J.M. Cies, E. Del Rio, S. Bernal, R. Burch, et al., Bridging the gap between CO adsorption studies on gold model surfaces and supported nanoparticles, Angew. Chemie - Int. Ed. 49 (2010) 1981–1985. doi:10.1002/anie.200903403

(3) H. Zhu, Z. Ma, S.H. Overbury, S. Dai, Rational design of gold catalysts with enhanced thermal stability: post modification of Au/TiO2 by amorphous SiO2 decoration, Catal. Letters. 116 (2007) 128–135. doi:10.1007/s10562-007-9144-3.


Ana HUNGRÍA, Miguel TINOCO, Eloy DEL RÍO, Ramón MANZORRO, Miguel A. CAUQUI, Jose Juan CALVINO, José A. PEREZ-OMIL (Puerto Real, Spain)
08:00 - 18:15 #6969 - MS00-525 AEM Characterization of the products yielding from Chlorination Process to obtain TiO2 from natural Ilmenite.
MS00-525 AEM Characterization of the products yielding from Chlorination Process to obtain TiO2 from natural Ilmenite.

In the titanium industry, chlorination of ilmenite (FeOTiO2) at elevated temperatures in the presence of a reducing agent promotes formation of TiCl4 in gaseous form, which can be subsequently selective condensed and then reduced to titanium metal or oxidized to producing TiO2 [1]. Alternatively, in the absence of the reducing agent, the process becomes selective, favoring the formation of iron chlorides and promoting enrichment in content of TiO2 obtained in the solid product of the reaction [2].  Therefore, the present study reports the observations by Analytical Electron microscopy (AEM) of principals characteristics of the TiO2 polymorphs, anatase and rutile, obtained by chlorination with and without reducing agent respectively.  The experimental analysis involved the as-received material, the intermediate and final products, all sequentially characterized by means of X-Ray Diffraction (XRD), X-Ray Fluorescence (XRF), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and Transmission Electron Microscopy (TEM).

Fig. 1a., shows a low mag SEM image of the as-received material constituted essentially by Ilmenita particles rich on Ti and Fe.  Fig. 1b and 1c., are secondary electrons (SE) SEM images of the products after chlorination process for 60 minutes.  While Fig 1b., corresponds to direct chlorination product shows faceted TiO2 crystals, Fig 1b., corresponds to the product resulting from chlorination in the presence of carbon showing spheroidal TiO2 anatase aggregates.  The XR-Difractograms shown in Fig 2., corroborated the crystal identification on each mentioned products.  Fig 3.a and 3b., is TEM bright field (BF) -dark field (DF) pair of a robust single crystal of TiO2 rutile and corresponding diffraction patron pointing in red the diffracted bean use for the DF image.  Fig 4a., and 4b, is also BF and DF pair however of an anatase aggregates and the correspond diffraction patron in the Fig 4c., showing, namely in the DF imagen shaped nanocrystals about 10 nm in sizes.  Interested to note in this aggregated nucleation rate of nanocrystals in a still shapeless aggregated.  The same anatase product has been captured in the BF-DF pair of Fig 5a and 5b and corresponding diffraction patron of Fig. 5c. These images correspond to a later state of nucleation and growth processes, configurating well-defined spherical nanocrystalline aggregates of TiO2 anatase in order to minimized of surface energy.  After calcination of this product under N2 atmosphere, it can seen the TiO2 nanoparticles of about 10 nm in size have been more homogeneity distributed, mostly spheroidal and some exhibiting facets thereby implying in a thermodynamics states closer to the equilibrium.[2]

[1]. MOODLEY S, et.al. Chlorination of titania feedstocks, 3rd International Symposium on High-Temperature Metallurgical Processing, 2012.

[2]. L.M. Cáceres, I.G. Solorzano, E. Brocchi.  Electron Microscopy observations over the processes yielding to obtaining TiO2 from Natural Ilmenite Mineral.

 

The authors are grateful to LaBNano /CBPF for the access of TEM and XRD, the financial support of CAPES, CNPq and FAPERJ (Brazil).


Ludy CACERES MONTERO (Rio de Janeiro, Brazil), Guillermo SOLORZANO, Eduardo A. BROCCHI
08:00 - 18:15 #7041 - MS00-527 Surface effects in nano-cobalt ferrites.
MS00-527 Surface effects in nano-cobalt ferrites.

Magnetic nanoparticles have been the issue of continuous and growing interest, from both fundamental and technological points of view, in the last decades. Their unique physical objects with remarkable magnetic properties differ significantly from their parent massive materials. These properties are due to finite size effects of the magnetic core, related to the reduced number of spins cooperatively linked within the particle, and to surface and interface effects, related to the lack of coordination for the surface ions, inducing broken exchange bonds that can result in frustration and spin disorder. A description of ferrite magnetic properties requires a through characterization of the crystallographic structure down to atomic scale. Indeed, synthesis processes significantly alter the chemistry of the involved compounds, and then their physical properties.

In this work, experimental investigations on cobalt ferrite nanoparticles CoxFe3-xO4 (1 < x < 1.8) are reported, providing a comprehensive description of different surface and interface effects. Surface and exchange anisotropy in ferrite nanoparticles are investigated by means of several experimental techniques such as X ray diffraction, Transmission Electron Microscopy and magnetization measurements. A strong correlation between the structural and the magnetic properties has been revealed. It is shown that the proposed synthesis technique leads to the formation of a spinel nanoparticles well dispersed. Many of them are faceted having cub-octahedral polygonal growth forms with exclusively the {1 1 1} and {1 0 0} type faces. Rather than core-shell structures, a number of ordered defects were observed.


Mohamed SAIDANI, Wajdi BELKACEM, Loïc PATOUT, Ahmed CHARAI, Najeh MLIKI (Tunis, Tunisia)
08:00 - 18:15 #6145 - MS00-527b Quantitative compositional characterisation of fuel-cell catalysts using EDX ionisation cross sections.
MS00-527b Quantitative compositional characterisation of fuel-cell catalysts using EDX ionisation cross sections.

Hydrogen fuel-cells are a ‘zero emission’ technology because they only release H2O, making them a very attractive source of clean electric power. Unfortunately, fuel-cells such as the polymer exchange membrane (PEM) fuel-cell are heavily reliant on a platinum catalyst at both the anode and cathode in order for the reaction to proceed at the low operating temperatures. It is largely the cost of this platinum metal which limits their more wide-scale manufacture and use.

In light of this, the search is on for more active catalysts with lower platinum content. A great deal of success has been seen in the research of bimetallic alloy catalysts where the expensive platinum metal is combined with a much less expensive metal such as nickel or cobalt. Such catalysts not only provide a reduction in the amount of platinum used but also an increase in the activity, which may be due to the compressive strain that the alloying element introduces.

In order to develop these catalysts further and make them a viable alternative to platinum, we need to understand what is happening at the nanometre and even sub-nanometre scales. For this we need to be able to characterise our catalysts at high resolution, understanding both the composition and structure. A new method for quantitative energy dispersive x-ray (EDX) [1] analysis in the scanning transmission electron microscope (STEM) has been developed with this in mind.

In the same way that the scattering cross section, σ, can be calculated from ADF image intensity and for ionisation edges in EELS, it is possible to calculate an EDX partial cross section using an approach that demonstrates similarities with the ζ-factor method. Rather than the ratio approach provided by the traditional k-factor method, this is a direct measurement which yields the number of atoms of each element after quantification, as such thickness can easily be extracted as well. This quantification method was applied to PtCo alloy nanoparticles that have been acid-leached to provide platinum enrichment (or rather cobalt depletion) at the particle surface [2]. It is possible to quantify the levels of cobalt depletion in the first few atomic layers of the particle, showing that the leaching produces a localised surface depletion that can only be determined by this high resolution EDX quantification.

[1]          K. E. MacArthur, T. J. A. Slater et al. Microsc. & Microanal.  22 (1) (2016) 71-81

[2]         K. E. MacArthur, T. J. A. Slater et al. Mater. Sci. Technol. In press


Katherine MACARTHUR (Juelich, Germany), Thomas SLATER, Sarah HAIGH, Dogan OZKAYA, Marc HEGGEN, Peter NELLIST, Sergio LOZANO-PEREZ
08:00 - 18:15 #6080 - MS01-529 Identification of occupation site of Al doped in Y2Ti2O7 based by ab initio calculation and statistical high-angular resolution electron channeling X-ray spectroscopy.
MS01-529 Identification of occupation site of Al doped in Y2Ti2O7 based by ab initio calculation and statistical high-angular resolution electron channeling X-ray spectroscopy.

     SiCf/SiCm is expected to be a turbine material of next generation aircraft engine, though the environment barrier coating (EBC) is indispensable to shield oxygen and reflect the radiant heat from the outer environment. It was reported that the periodic layers of Al2O3 and Y2Ti2O7 (YT) that have different refraction indices worked very effectively as EBC.*1 However, a problem was found that Al effusion from Al2O3 to Y2Ti2O7 gave rise to collapse of the layer structure and the property of EBC was significantly deteriorated. In order to avoid this problem, it was also found that doping a small amount of Al into YT stabilized the layer structure and improved the oxygen permeation property. It is thus necessary to identify which atomic site and how much fraction Al occupies in Al doped Y2Ti2O7 (AYT) to clarify the mechanism of this property improvement. In this study, we applied a statistical ALCHEMI technique, electron energy loss spectroscopy (EELS) and first principles theoretical calculation for the above purpose by comparing with the obtained macroscopic analysis.

     ALCHEMI is a technique for quantitatively identifying the occupancies of substitutional impurities in a crystalline material. The method takes advantage of the electron channeling effect, which is a phenomenon that electron probability densities change with the incident electron beam direction with respect to the crystalline orientation. However, there is a possibility that we may obtain a wrong result using this method because of delocalization effects of electron that provides systematic errors from difference in the electron orbital spread of different atoms. The statistical ALCHEMI technique acquires a large amount of data points as an incoherent channeling pattern (ICP), followed by the statistical analysis, so that the site occupancies are very precisely determined, insusceptible to the delocalization effects.*2

     The samples used for the ICP measurement are three kinds of AYT (nominal Al concentration was approximately 1 cation%) annealed under different oxygen partial pressures (PO2=10-10, 10-1, 105 Pa) at 1300 °C for 50 hours after vacuum sintering at 1500 °C for 5 hours. We assumed that Al can only substitute for the Y and Ti sites in the crystals.

     Fig.1 shows the measured ICP of these samples. The statistical ALCHEMI analysis showed that Al occupied both the Y and Ti sites at a ratio of approximately 1:1, and at the lower oxygen partial pressure the Al occupancy was slightly biased to the Ti site. The concentration of Al was estimated to be 1.6 cat%. It is considered that the concentration of oxygen vacancies in AYT should increase under the lower oxygen partial pressures, where AYT tends to be positive charged, which can be compensated for by preferential substation of Al3+ for Ti4+ to maintain the electrical neutrality.

     We also measured the Al-K and L2,3 ELNES and compared them with those obtained by ab initio calculation to confirm if the Al substitution sites in AYT were consistent with the statistical ALCHEMI results. For the theoretical ELNES simulation we created the AYT conventional cell (a, b, c = 10.45 Å, α, β, γ = 90°) by substituting an Al atom for a Y or Ti atom in the YT conventional cell and carried out the geometry optimization (Fig.2). The concentration of Al atoms is expected to be very small and the calculating cell must be large enough to ignore the interaction between two Al atoms in the neighboring cells. We used CASTEP code for the geometry optimization and the FEFF code based on a multiple scattering method for the ELNES calculation.

     Fig.3 shows the theoretical (upper) and experimental (lower) Al-K ELNES. ‘AlY’ and ‘AlTi‘ in the upper figure are calculated spectra which respectively substitute Al for the Y or Ti site. ‘Sum’ is the summed spectra of both with the Gaussian function convolved, to compare with the experimental spectrum with 1:1 occupation deduced by the ALCHEMI method above. The first peak of ‘Sum’ was aligned to match the peak position of the experimental spectrum. The ELNES result seems to be consistent with the ALCHEMI result.

     In summary, it is considered that Al atoms substitute the Y and Ti atoms at a rate of 1:1. The more detailed discussion is presented in the poster.

*1 M. Tanaka et al, j. soc. mater. sci. jpn, 2015, Vol. 64, No. 6, 431-437

*2 C. J. Rossouw et al, Phil, Mag, Lett, 1989, Vol. 60, No. 5, 225-232


Yoshihiro OBATA (Nagoya, Japan), Kenji ODA, Masahiro OHTSUKA, Shunsuke MUTO, Makoto TANAKA, Satoshi KITAOKA
08:00 - 18:15 #6084 - MS01-531 Interfaces and defects in directionally solidified oxide-oxide eutectics.
MS01-531 Interfaces and defects in directionally solidified oxide-oxide eutectics.

Oxide-oxide eutectic ceramic materials prepared by unidirectional solidification from the melt seem to be promising candidates for thermo-mechanical applications at high temperatures such as for gas turbine parts applications. They are prepared from Al2O3 - RE2O3 - ZrO2 (RE = Y, Er, Sm) systems and associate 2 or 3 phases among: Al2O3 (corundum structure), RE3Al5O12 (garnet structure), REAlO3 (perovskite structure) and ZrO2 (fluorite structure) phases. The microstructure consists of a three-dimensional interpenetrated network of single-crystal phases, free of grain boundary (fig. 1) and preferred orientation relationships occur between constituent phases1. Consequently, they exhibit a noticeable thermal stability of the microstructure and good mechanical properties 2,3.

Compressive tests were carried out at 1450°C and 1550°C under 100 MPa and 200 MPa. Low strain rates obtained confirm good creep resistance at high temperature of these materials. Deformation mechanisms were studied by TEM with conventional two-beam analysis. During creep tests, the specimens deform via micro-twinning in alumina and dislocation activity (climb in most cases) in all phases (fig. 2).

The interface nature of directionally solidified eutectic ceramics is the origin of their good properties in comparison with sintered equivalent ceramics. Thus, the different types of interfaces were studied at atomic scale by HRTEM (fig. 3). In a first approach, the chosen observation direction axis was parallel to the growth direction. Investigations were made on as-grown materials and after creep tests in order to:

     - understand interface structure and defects at the atomic scale in as-grown materials ;

     - analyse modification of interfacial structure after creep deformation ;

     - correlate microstructure and deformation mechanisms.

References:

1. Mazerolles, L. et al. New microstructures in ceramic materials from the melt for high temperature applications. Aerosp. Sci. Technol. 12, 499–505 (2008).

2. Waku, Y. et al. High-temperature strength and thermal stability of a unidirectionally solidified Al2O3/YAG eutectic composite. J. Mater. Sci. 33, 1217–1225 (1998).

3. Mazerolles, L., Perriere, L., Lartigue-Korinek, S., Piquet, N. & Parlier, M. Microstructures, crystallography of interfaces, and creep behavior of melt-growth composites. J. Eur. Ceram. Soc. 28, 2301–2308 (2008).


Laura LONDAITZBEHERE (Thiais), Sylvie LARTIGUE-KORINEK, Leo MAZEROLLES
08:00 - 18:15 #6108 - MS01-533 Evaluation of local atomic arrangements and lattice distortions in layered Ge-Sb-Te crystal structures.
MS01-533 Evaluation of local atomic arrangements and lattice distortions in layered Ge-Sb-Te crystal structures.

Ge-Sb-Te (GST) compounds are of high interest due to their outstanding optical and electronic properties. Thin films of GST alloys are widely used as phase change materials (PCMs) in optical and electronic data storage devices [1]. The operating principle of conventional PCMs is based on ultrafast, reversible transformation between the amorphous and metastable (cubic) crystalline phases.  Recently, a new type of phase change memory device, so called ‘interfacial phase change memory’ (iPCM) was proposed. iPCM consists of GeTe-Sb2Te3 superlattices. In the case of iPCMs, the phase transitions occur between two crystalline structures, thus allowing for a drastic reduction in energy consumption in memory devices. However, it has been experimentally demonstrated that the structure of iPCM corresponds to van der Waals bonded layers of Sb2Te3 and various layered GST crystal structures [2]. The switching mechanism of iPCM and the electronic properties of these materials are determined by the local atomic arrangement of Ge and Sb atoms. Consequently, knowledge on the proper local atomic arrangement in layered GST crystal structures is of paramount importance. The aim of this work is to study the local atomic arrangements and lattice distortions in GST thin films consisting of layered Ge2Sb2Te5 (GST225), Ge1Sb2Te4 and Ge3Sb2Te6 crystal structures using a combination of atomic-resolution Cs-corrected HAADF-STEM imaging and theoretical image simulation. 

In this work, large crystallites of trigonal GST were prepared by ex-situ heating of amorphous GST225 thin films [3].  Fig. 1 shows the microstructures of GST thin films heated at different temperatures. The thin films consist of various building blocks with 7, 9 and 11 layers, indicating pronounced chemical disorder along the c-axis. The averaged composition of the thin films was verified to be 20 at.% of Ge, 24 at.% of Sb and 56 at.% of Te. Consequently, the disorder is attributed to deviations in local chemical composition of GST thin films which appears to be typical for layered GST compounds.

Fig. 2 gives a HAADF image of a single 9-layer GST225 building block. The block consists of alternating cation (GeSb) and anion (Te) layers. There are four different stacking sequences proposed in the literature, which differ in site occupancy of the distinct cation layers and in thermal displacement parameters (B). Due to the sensitivity of image intensities to B factors, the parameters can be used for the distinguishing between various stacking sequences. Fig. 2(b) and Figs. 2(c)-(f) show the comparisons between experimental and theoretical averaged intensity maxima for specific lattice sites in a GST225 lattice, respectively. The results reveal that the Ge and Sb atomic species tend to form intermixed cation layers with different ratios of Ge to Sb between distinct cation layers. Moreover, the Ge and Sb atoms in the studied structures are off-centre displaced from the centre of (GeSb)Te6 octahedrons. However, the distortions in Ge1Sb2Te4 and Ge3Sb2Te6 lattices are found to be larger than in the literature reported structures and strongly depended on the annealing temperature. Thus, the crystal structure of a single GST building block is conceptually similar to the local structure of the cubic GST [4].

In conclusion,the outcomes of this work shed new insights into the local structure of layered GST compounds, which may assist theoretical modelling of the switching mechanism of iPCM.

[1] S. Raoux, W. Wełnic, D. Ielmini, Chem. Rev. 110, 240 (2010).

[2] J. Momand, R. Wang et al., Nanoscale 7, 19136 (2015).

[3] U. Ross, A. Lotnyk et al., Appl. Phys. Lett. 104, 121904 (2014).

[4] A. Lotnyk, S. Bernütz et al., Acta Mater. 105, 1 (2016).


Andriy LOTNYK (Leipzig, Germany), Ulrich ROSS, Sabine BERNÜTZ, Erik THELANDER, Bernd RAUSCHENBACH
08:00 - 18:15 #6117 - MS01-535 In situ TEM electrical biasing studies on defect based crystal-amorphous transformation in GeTe nanowire devices.
MS01-535 In situ TEM electrical biasing studies on defect based crystal-amorphous transformation in GeTe nanowire devices.

Germanium telluride (GeTe), a phase-change material, switches rapidly and reversibly between crystalline and amorphous phase. The crystalline to amorphous transformation pathway is based on melting the crystalline phase and quenching it to amorphize in nanoseconds timescale. However, this is inefficient and energy consuming, and it is necessary to look for alternate pathways to carry out this transformation.

Using in situ TEM electrical biasing experiments on GeTe nanowires, we discovered a defect-assited low energy pathway for crystal-amorphous transformation. GeTe is both ferroelectric (FE) and inherently defective (Ge vacancies) metallic material, an unusual combination of properties in any material system. We show through dark-field TEM movies that interaction between extended defects of different origins (ferroelectric and metallic) can result in a pathway towards amorphization. In the “forming stage”, voltage pulses applied on metallic GeTe act as heat shocks creating anti-phase boundaries (APB) by coalescing and quenching Ge vacancies in a Ge plane. These APBs interact with the pre-existing 71o ferroelectric domain boundaries converting them into 109o boundaries. The partial dislocations surrounding the APBs migrate in the direction of the electrical wind-force, only to be impeded by the 109o boundaries. Eventually, the mobility of the partial dislocations becomes zero, analogous to a scenario of traffic jam on a highway. Accumulating more extended defects at the jam, eventually collapses the crystallinity ‘nucleating’ an amorphous phase with medium range order, in a very local region that cuts across the cross-section of the nanowire. The amorphous mark can be recrystallized via another electrical pulse which heat it beyond the crystallization temperature. 


Pavan NUKALA (Massy-Palaiseau), Ritesh AGARWAL
08:00 - 18:15 #6152 - MS01-537 He-filled bi-dimensional defects in Ti3SiC2 MAX Phases.
MS01-537 He-filled bi-dimensional defects in Ti3SiC2 MAX Phases.

Ti3SiC2 is a member of the family of layered ternary compounds well known as the Mn+1AXn phases (n = 1 – 3, or ‘MAX phases’) where M is a transition-metal, A is an A-group element and X is either carbon or nitrogen. These compounds have attracted increasing attention since they possess a unique combination of metallic and ceramic properties. They are elastically stiff, electrically and thermally conductive, relatively soft, damage tolerant and resistant to thermal shock. Therefore, Ti3SiC2 have been proposed to be used in the generation IV nuclear reactors and several works were devoted to studying radiation damage by high energy heavy ions. Ti3SiC2 is mainly synthesised by powder metallurgy. Nevertheless, it was recently shown that monocrystalline Ti3SiC2 thin films onto 4H-SiC can be formed by magnetron sputtering using Al and Ti co-deposition on SiC at room temperature following by an annealing [1]. Ti3SiC2 formation is based on interdiffusion processes between the substrate and the deposited layer. A layered hexagonal structure is obtained which consists of alternate near-close-packed layers of Ti6C octahedral interleafed with layers of Si atoms. Thin-film of Ti3SiC2 could become suitable for many applications such as electrical contacts, wear protective coatings and to produce the new 2D materials labelled MXène.  It is then crucial to progress in the knowledge of the physical properties of Ti3SiC2 thin-film especially their behaviour under ion implantation. Light ion implantation (He, H) is commonly used to produce two dimensional defects in Si which are considered to be the precursors of cracks that are particularly interesting for the thin layer transfer technique well-known as the smart-cut process. The purpose of this work is to study the defects induced by light ion implantation (He, H) in Ti3SiC2 thin-film in order to create He/H-platelets. The microstructural analysis of the implant Ti3SiC2 thin films and their evolution under subsequent annealing will be performed by XRD and XTEM.  First XTEM results (Fig. 1) show a high density of He-platelets after low energy He implantation at medium fluence and subsequent annealing.  Works are in progress for studying in more detailed the MAX phase and the He-platelets. Results will be compared to a theoretical work who predicts that He atoms prefers staying near Si atoms [2].

The authors wish to acknowledge P. Guerin for his help during the film deposition and M. Marteau for He implantation experiments.

 

[1] A. Drevin-Bazin, J. F. Barbot, M. Alkazaz, T. Cabioch, and M. F. Beaufort, Appl. Phys. Lett. 101, 021606 (2012)

[2] L.X. Jia, Y.X. Wang, X.D. Ou, L.Q. Shi, W. Ding, Mater. Lett. 83, 23 (2012)


Julien NICOLAI (Buxerolles), Marie-France BEAUFORT, Jean-François BARBOT, Bénédicte WAROT-FONROSE
08:00 - 18:15 #6162 - MS01-539 Dislocation and microstructure analysis of tungsten.
MS01-539 Dislocation and microstructure analysis of tungsten.

The demand for neutron scattering and imaging techniques for material characterization under controlled conditions is continuously growing over the last couple of years. For such measurements large scale neutron facilities are needed and the European Spallation Source (ESS) will soon be the world’s most powerful neutron source, build in Lund, Sweden [1]. Here, neutrons are produced through a spallation process in tungsten, which due to its high atomic number has a high neutron production density and localized neutron production. The use of tungsten avoids issues related to corrosion effects related to water cooling and it is relatively environmentally friendly compared to other target materials. Its disadvantages, however, are its low ductility and a high ductile-to-brittle transition temperature. Tungsten is the most critical non-structural material and its integrity during operation is essential for maintaining helium circulation and retaining of transmutation elements, therefore it must operate reliably and predictably for the planned lifetime of the target. In order to estimate the target life, reliable data is needed on the mechanical properties of tungsten, both in unirradiated and irradiated conditions. Dedicated irradiation programs were established to examine the behavior of tungsten under representative operational conditions, which studies are performed in PSI.

In this current study, in order to evaluate the properties of irradiated tungsten, initially as a comparison we must observe the microstructure and mechanical properties of unirradiated tungsten. Evaluating the microstructure of the unirradiated tungsten material normally would not be complicated; such transmission electron microscopy (TEM) samples can be created relatively easily by cutting 3 mm discs and then thinning them by jet polishing. However, in this case we developed samples in a more complex way, with the use of focused ion beam (FIB) and then flash electrochemical polishing the lamella in order to establish a method where in the future the irradiated tungsten samples can also be examined safely. Thanks to FIB, with the reduction of the sample size the activity of the sample also gets reduced dramatically, ensuring safe handling. The sample is lifted out internally inside the FIB by a micromanipulator and a 8 x 8 μm2 and 200 nm thick lamella is created. Then, by flash polishing (in 0.5% NaOH, 2 °C) this lamella is more thinned down to the thickness of approx. 60 nm, which is necessary to remove the FIB induced damages on the surface of the lamella. Electron microscopy observation is performed with a JEOL 2010 type TEM operated at 200 keV and equipped with EDX. Bright field (BF and weak-beam dark field (WBDF) imaging conditions were used at (g, 4g) or (g, 5g), while g=110. In order to obtain quantitative information of the dislocations, they are counted on several low magnification pictures on different areas of the sample.

Reference:

[1] K. Andersen et al., ESS Conceptual Design Report, ISBN 978-91-980173-0-4, edited by S. Peggs


Barbara HORVATH (Villigen, Switzerland), Yong DAI, Yongjoong LEE
08:00 - 18:15 #6192 - MS01-541 Characterization of the microstructure of composite Ti6Al4V-AA2519 obtained by explosive welding.
MS01-541 Characterization of the microstructure of composite Ti6Al4V-AA2519 obtained by explosive welding.

A composite which combines good thermal resistance and high mechanical properties of titanium alloys with good plasticity and low density of aluminium alloys seems to be a promising materials for airspace applications. However, welding of titanium and aluminium is difficult because they are extremely chemically reactive with oxygen and nitrogen at high temperatures. In this concept, the explosive welding (EXW) is one of most promising solid-state welding methods because it gives an opportunity to form the bonding on over the entire junction surface. In order to understand the phenomena taking place at joined surfaces, the detailed microstructural analysis is required, which was a prime goal of the present work.

Ti6Al4V and AA2519 plates 5 mm in thickness were joined via EXW with a detonation speed of 2000 m/s. The samples for scanning electron microscopy (SEM) observations were prepared by using HITACHI IM-4000 ion milling system, which is a damage-less polishing process and allows to see the structure on  SEM through the channelling contrast. SEM observation was carried out in a HITACHI SU-70 field emission Schottky scanning electron microscope at 10 kV accelerating voltage with the in-lens back-scatter electron (BSE) mode at 7mm working distance to get as much as possible surface contrast and resolution. Careful observations of selected areas were carried out on CS-corrected dedicated scanning transmission electron microscope (STEM) Hitachi HD-2700 operating at the accelerating voltage of 200 kV. The STEM thin foilswere prepared via in-situ lift-out in Hitachi NB 5000 focused ion beam. Precise EDX analysis were carried out on FEI Tecnai Osiris  200 kV microscope using Super-X EDX detectors.

Figure 1a shows an overview of a Ti-Al interface. EXW caused a high grain refinement in aluminium plate. The interface zone can be divided into two sections. The first one is  5 µm thickness zone consisted of nano-sized grains of three intermetallic phases: TiAl3, TiAl2 and TiAl which were identified by X-ray analysis and electron diffraction. The second zone consist of a small aluminium grains and a white (BSE) Cu rich net around them (Figure 1b). These intermetallic inclusions were often accompanied by nano-cracks (Figure 1b). Figure 2a  shows the magnified structure of this interfacial area in High-Angle Annular Dark-Field (HAADF)-STEM mode. The high resolution imaging (Figure 2b) shows that the copper net region have a crystalline structure. EDX mapping presented on Figure 3 shows the distribution of Ti, Al and Cu in the matrix and a gradient distribution of these alloying compounds in the structure. Copper net phenomenon was explained by the breaking or dissolving of big rich in copper equilibrium particles during explosive welding. Supersaturated solid solution of aluminium cannot contain all dissolved copper, so its excess was secondarily separated in the grain boundaries. 


Piotr BAZARNIK (Warsaw, Poland), Marco CANTONI, Lucian ŚNIEŻEK, Małgorzata LEWANDOWSKA
08:00 - 18:15 #6214 - MS01-543 Nanostructure of Mo2BC thin films and the effect on mechanical properties.
MS01-543 Nanostructure of Mo2BC thin films and the effect on mechanical properties.

The demand for materials in structural and functional applications requires nowadays more and more combined properties like high stiffness and simultaneously good ductility. The investigation and understanding of these unique properties is very important regarding a continuing optimizing of the materials and finally taking benefit from the outstanding properties in the future. Mo2BC is a promising candidate in this field as it combines properties preventing crack formation and also ensuring long lifetime. Density functional theory calculations predicated a high stiffness and a moderate ductility for Mo2BC by determining the electronic structure and the mechanical properties.[1, 2] A possible application of this material is the use as a hard coating for cutting tools protection.

In our work, we investigated Mo2BC thin films on silicon substrates which were synthesized by high-power pulsed magnetron sputtering deposition technique.[3] Transmission electron microscopy (TEM) methods (bright-field, high-resolution TEM, selected area diffraction, electron energy loss spectroscopy) were used to compare the nanostructure of several Mo2BC films which were deposited at different substrate temperatures ranging from 380 °C to 630 °C. TEM samples were prepared conventionally using grinding and Ar+ ion beam milling as well as by focused ion beam fabrication of thin lamellae extracted from the Mo2BC films. TEM investigations were performed at 300 kV using a FEI Titan Themis 60-300. In Figure 1, TEM cross-sectional micrographs of the Mo2BC film synthesized at the highest substrate temperature are shown exemplarily. The coating is fully crystalline and exhibits nanocrystalline columnar grains with a diameter of 10-20 nm.[4]

Furthermore, X-ray diffraction experiments and micromechanical tests were performed in order to correlate the mechanical properties of the films with their nanostructure. We detected an increasing crystallinity and hardness but a decreasing fracture toughness with increasing substrate temperature.

 

 

 

References

[1] J. Emmerlich et al., Journal of Physics D-Applied Physics 42 (2009), 1-6.

[2] H. Bolvardi et al., Journal of Physics-Condensed Matter 25 (2013), 1-6.

[3] H. Bolvardi et al., Thin Solid Films 542 (2013), 5-7.

[4] S. Djaziri et al., Surface & Coatings Technology 289 (2016), 213-218.


Stephan GLEICH (Düsseldorf, Germany), Soundes DJAZIRI, Hamid BOLVARDI, Jochen M. SCHNEIDER, Gerhard DEHM, Christina SCHEU
08:00 - 18:15 #6241 - MS01-545 Microstructural investigation of Fe-Mn-B-Nb glassy ribbons.
MS01-545 Microstructural investigation of Fe-Mn-B-Nb glassy ribbons.

The microstructure of Fe79.7-xMnxB20Nb0.3 glassy ribbons has been investigated using transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDX), for manganese concentrations of x=12, 16 and 20. For each manganese concentration the ribbon is found to consist of nanocrystalline inclusions in an amorphous matrix. Through detailed analysis of electron diffraction patterns and in conjunction with JEMS simulation, the crystalline phase is shown to be manganese diboride (MnB2), and high resolution TEM investigation confirms this. Using dark-field TEM, the mean size of the nanocrystalline inclusions as well as their phase fraction are measured and found to increase with manganese concentration. EDX mapping shows the tendency for manganese to form nano-scale clusters in agreement with the dark-field investigation.

This research was supported by the European Commission FP7-REGPOT-2012-2013-1, Grant Agreement no. 316194 NANOSENS.


Lawrence WHITMORE (Iasi, Romania), Gabriel ABABEI, Luiza BUDEANU, Nicoleta LUPU, Horia CHIRIAC
08:00 - 18:15 #6243 - MS01-547 InAs/GaSb interface investigation by high resolution HAADF-STEM.
MS01-547 InAs/GaSb interface investigation by high resolution HAADF-STEM.

Heterojunctions with broken band alignment are of significant interest for tunnel field effect transistors (TFETs) because they decrease the tunneling distance for band-to-band tunneling and thereby increase the tunnel current [1]. InAs and GaSb crystallize in the familiar zincblende structure which consists of two interleaved face-centred cubic sublattices. The lattice constant of these two materials is about 0.61nm so that lattice-matched heterostructures can be grown [2]. At such a heterojunction between two semiconductors that do not share a common species, two distinct bond configurations are possible with either In–Sb or Ga–As bonds. Which kind of bond is formed depends on the details of the growth process and presents different characteristics in terms of defects and stress.

Broken gap InAs/GaSb heterojunctions are grown by molecular beam epitaxy. In order to characterize the nature of the interface two cross-section transmission electron microscopy (TEM) samples are prepared for observation along the [110] and [-110] zone axes respectively. The TEM specimens are prepared by FIB lift-out. HAADF-STEM is performed using a double corrected TEM (FEI Titan3 60-300) at 300 kV.

In Figure 1, a schematic of the two possible bonds (In-Sb type in Figure 1 a,b and Ga-As type in Figure 1 c,d) interface configurations is shown along the [110] (a,c) and [-110] (b,d) zone axes. For a perfectly flat interface, adjacent intensity profiles across the interface along the [001] growth direction will show:

-          in Figure 1a vs b, and in 1c vs d, a reversal of the brightness of the dumbbells in the bulk of the InAs and GaSb for the 2 zone axes. 

-          that the brightness reversal is present at the interface for all traces in case of Figure 1b (low-high high-low) and 1c (high-low low-high) while, in Figure 1a and 1d, alternating traces show either reversed brightness or dumbbells with nearly equal brightness at the interface (high-high on Figure 1a or low-low on Figure 1d).

Based on these models a unique interpretation of the nature of the interface can be made if the interface is free of roughness over the thickness of the TEM specimen. In Figure 2, HAADF-STEM micrographs along the [110] (a) and [-110] (b) zone axes are shown. Three adjacent intensity profiles across the interfaces, corresponding to traces 1-3 in the micrographs, are shown in Figures 2c and d. In Figure 2c, traces 1 and 3 show unequal intensities - high-low dumbbells - whereas trace 2 reveals an “equal” intensity dumbbells at the interface consistently with the case in Figure 1a. The brightness of the “equal” dumbbells is not as high as expected for an In-Sb bond. This is probably caused by stress at the interface which also results in the dark band contrast as can be seen on Figure 2a,b. Figure 2d shows intensity profiles with unequal intensity dumbbells (low-high) which for all traces invert at the interface. This is consistent with Figure 1b. The observations along both [110] and [-110] zone axes indicate that the interface is In-Sb type, which is consistent with the RHEED patterns acquired during the MBE growth of the stack.

[1] CMOS and Beyond: Logic Switches for Terascale Integrated Circuits edited by Tsu-Jae King Liu, Kelin Kuhn, p. 125 (2014).

[2] H. Kroemer. The 6.1A family (InAs, GaSb, AlSb) and its heterostructures: a selective review. Physica E, 20:196–202, 2003.


Paola FAVIA (Leuven, Belgium), Olivier RICHARD, Salim EL KAZZI, Patricia VAN MARCKE, Hugo BENDER
08:00 - 18:15 #6337 - MS01-549 Studies of the structure of spray pyrolysed bioactive glasses using electron diffraction and DFT simulations.
MS01-549 Studies of the structure of spray pyrolysed bioactive glasses using electron diffraction and DFT simulations.

Bioactive glasses have received considerable attention during the past few decades. Recently, Shih et al. demonstrated that Si-Ca-P based glasses prepared by spray pyrolysis can have better bioactivity than glasses prepared by other methods [1]. To understand the reason behind these improved properties we have studied the structure of several Si-Ca-P glasses with different compositions.

In this study structural information from bioactive glass samples was obtained using electron diffraction. Compared to X-ray and neutron diffraction electrons can be easily focused on specific nano volumes and used to probe nanoscale variations in structure. Using reduced density function (RDF) analysis local structural parameters of the materials can be extracted from experimental diffraction patterns with high precision [2]. However, experimental diffraction data alone is not sufficient to build reliable atomic models. Therefore, we used DFT molecular dynamics simulations of liquid-quench to obtain atomic models of the materials, which serve as initial models for further structure refinements.

All experimental data presented here was collected using a JEOL JEM2100 transmission electron microscope (TEM) operating at 200kV. Electron diffraction patterns were recorded on a Gatan Orius CCD that eliminates charge overflow to the neighbouring pixels, even when saturated. Using a camera length of ~180mm and the central beam positioned at the edge of the detector, the usable range of scattering vectors, q extends to 18Å-1, comparable with X-ray experiments.  Figure 1 (a-d) shows typical TEM images and diffraction patterns of two specimens, with the corresponding RDF curves shown in Figure 1 (e).

DFT simulations were carried out on ARC supercomputer facilities at the University of Oxford. The CASTEP software [3] was used to perform molecular dynamics simulations of liquid quench from 3000K to 300K, with cooling rate of 2·1014K/s. Energy optimizations with a 300eV pseudo potential cut-off were performed after quenching. Figure 2 (a) shows a model of 60%SiO2-35%CaO-5%P2O5 glass simulated by Reverse Monte Carlo using only experimental diffraction data and the model after DFT simulation is presented in Figure 2 (b), indicating considerable structural changes. This model already demonstrates a good agreement with the experimental RDF curve (Figure 2 (c) and has been used for further RMC refinements.

We will discuss correlations between bioactivity and structural data in these materials.

Financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative (Ref 312483-ESTEEM2) is gratefully acknowledged.

[1] S.J. Shih, Y.J. Chou, I.C. Chien, One-step synthesis of bioactive glass by spray pyrolysis, J. Nanopart. Res., 14 (2012) 1-8.

[2] D.J.H. Cockayne, D.R. McKenzie, Electron diffraction analysis of polycrystalline and amorphous thin films, Acta Crystallogr. A, 44 (1988) 870-878.

[3] S.J. Clark, M.D. Segall, C.J. Pickard, P.J. Hasnip, M.I. Probert, K. Refson, M.C. Payne, First principles methods using CASTEP, Zeitschrift für Kristallographie-Crystalline Materials, 220 (2005) 567-570.


Yu-Jen CHOU (Oxford, United Kingdom), Konstantin BORISENKO, Shao-Ju SHIH, Angus KIRKLAND
08:00 - 18:15 #6359 - MS01-551 Atomic structure and segregation phenomena at copper grain boundaries.
MS01-551 Atomic structure and segregation phenomena at copper grain boundaries.

Abstract


The segregation of impurity atoms to grain boundaries can have significant influence on the cohesive properties, atomic arrangements and the mechanical properties of such interfaces. Therefore, it strongly impacts the macroscopic behavior of materials and understanding the atomic structure and related segregation behavior at grain boundaries is crucial to tailor materials with optimized physical properties [1]. Copper (Cu) is an attractive material for electronic applications, because of its good electrical and thermal conductivity. The effect of Sulphur on grain boundaries in Cu is of particular interest since it is improving the electromigration resistance but can also lead to grain boundary embrittlement [2].

In this study the atomic structure and chemistry of grain boundaries in polycrystalline Cu with variable Sulphur content (7 – 4000 ppm) are analyzed. In order to determine the distribution, size and orientation of the grains, Electron Backscatter Diffraction (EBSD) measurements were performed, as shown in Figure 1. The measurement reveals a grain size of 1-4 mm and an orientation of the grain normal close to the [001] direction. Transmission electron microscopy (TEM) specimens are prepared conventionally by grinding, electro polishing and Ar+ ion beam milling at specific regions from the EBSD scan in order to select special grain boundaries. This is shown exemplarily by the black circle in Figure 1.

TEM methods (bright-field imaging, selected area diffraction and high resolution TEM) are used to investigate the structure of selected grain boundaries. A preliminary example represented in Figure 2 reveals a high angle grain boundary. The specimen is tilted so that the upper grain is oriented in [001] zone axis while the resulting orientation of the lower grain is close to the [013] zone axis. The tilt component between both grains was determined to  by measuring the misorientation between the (200) reflexes of both grains which is in good agreement with the EBSD measurement. The twist component of this random grain boundary is not yet fully determined and is part of current investigations.

The atomic structure and segregation of Sulphur are characterized by aberration-corrected scanning transmission electron microscopy (STEM) in combination with analytical techniques including energy-dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS). Hence, information on the atomic arrangement of impurity atoms (interstitial and substitutional), the respective bonding and possible grain boundary precipitates will be obtained with sub-nanometer resolution.

References:
[1] M. Rajagopalan, M. A. Tschopp, and K.N. Solanki, JOM1, 1(2014)
[2] A.Wimmer, M. Smolka, W.Heinz, T. Detzel, W.Robl, C. Motz, V.Eyert, E. Wimmer, F. Jahnel, R. Treichler, G. Dehm; Mater. Sci. Eng. A, 618(2014), pp. 398-405


Thorsten MEINERS (DUSSELDORF, Germany), Christian H. LIEBSCHER, Gerhard DEHM
08:00 - 18:15 #6371 - MS01-553 Grain boundary structure and its interaction with dislocations in copper.
MS01-553 Grain boundary structure and its interaction with dislocations in copper.

Most of the nowadays used structural materials are of polycrystalline nature since single crystal fabrication is very cost intensive and sometimes not even desired. For instance, increasing the internal interface fraction – like grain boundaries – is known to strengthen metals significantly according to the Hall-Petch relation, thereby reducing the amount of load bearing material needed and hence the overall cost. Unfortunately, internal interfaces are often found to be weakest links within a failed material, contradicting the benefit from increased interface fractions. Consequently, understanding the dislocation interaction with distinct grain boundaries has the potential to tune a structural material’s performance. However, profound knowledge does not only include tracking of dislocation movement but it is crucial to understand grain boundaries from the atomistic structural and chemical level including aspects like faceting, grain boundary phase transformations and/or segregation of impurities. Thus, the present study aims on comprehensively understanding the interplay between atomistic grain boundary structure and its mechanical behavior (i.e. interaction with dislocations) using a ∑5 36.9° {310} tilt grain boundary in copper as a model system.

 

Macroscopic copper bicrystals were grown using the Bridgeman method. The seed crystals were arranged to form a symmetric ∑5 36.9° {310} tilt grain boundary. Grain boundary orientation and structure where studied by aberration-corrected high-resolution STEM as well as conventional TEM methods and compared to findings from SEM-EBSD measurements. For mechanical testing, tailored square-shaped nanocompression pillars were FIB machined on top of TEM lamellae to ensure a defined testing geometry and stress state. Defects introduced into the compression samples upon FIB machining were annihilated during an annealing step. Finally, in situ nanomechanical testing was performed using conventional TEM as well as STEM mode to study the dislocation behavior at the boundary. In addition, in situ microcompression experiments were performed inside the SEM to establish the mechanical size effect of the chosen boundary system.

 

It is shown by EBSD that the desired ∑5 grain boundary was successfully grown within the entire macroscopic bicrystal. However, structural investigations at the atomic level reveal a range of deviations from the ideal symmetrical case along the course of the boundary throughout the bicrystal. The observed grain boundary structures include symmetrical and asymmetrical segments as well as segments showing grain boundary facets (Figure 1). The overall 36.9° misorientation is found to remain within the deviation predicted by Brandon’s criterion in all of the structures. In situ SEM deformation along the [100]-compression direction reveals activation of multiple major slip systems in single crystals that were not found in the ∑5 bicrystal compression samples (Figure 2). Preliminary TEM compression experiments indicate a cross slip mechanism as the prevalent dislocation-boundary interaction rather than the formation of pile ups. This observation is also supported by the measured stress vs. strain curves as boundary containing pillars do not show increased hardening behavior relative to single crystalline reference samples.


Nicolas J PETER (Düsseldorf, Germany), Christian H LIEBSCHER, Christoph KIRCHLECHNER, Gerhard DEHM
08:00 - 18:15 #6377 - MS01-555 Determination of the platelet structure in natural diamond by ADF-STEM.
MS01-555 Determination of the platelet structure in natural diamond by ADF-STEM.

Electron microscopy is well known for its capability of determining the structure of many materials down to the atomic scale. A heavily studied material is natural diamond, but its rather small interatomic distance has made it a challenging material for TEM investigation. In this work we will demonstrate how novel TEM techniques can give fresh insights to this heavily studied material. Imperfections in natural diamond range from point lattice defects to dislocations and platelets. Platelet defects were first observed by means of TEM in the 1960s [1, 2] and nitrogen was detected making use of EELS in the 1980s [3]. Nevertheless, the exact crystalline structure of the platelets in natural diamond remains, perhaps surprisingly, still unclear.

In this work, we demonstrate our approach to determine the structure of platelet defects making use of annular dark field scanning transmission electron microscopy (ADF-STEM) combined with advanced image processing. Combining experimental data with image simulations we are able to offer a consistent crystallographic model of the defect. Furthermore, using monochromated energy loss spectroscopy technique we suggest the type of nitrogen embedding into the defect plane.

TEM samples were prepared by a focused ion beam lift out procedure from natural type Ia diamond. ADF-STEM and EELS experiments were carried out on FEI Titan microscope equipped with probe aberration corrector. We studied more than 50 platelets from different parts of the sample. In order to reduce scan distortions and damage to the defect plane a series of images with fast dwell time was obtained. The images were treated in the Smart Align software [4] to reduce the scan noise, correct the sample drift and a final summed image was obtained. Improved signal to noise ratio in this image allowed us to estimate the atomic positions and create a model of the platelet. Based on this model STEM image simulations were carried out. They are found to be in the good agreement with the experimental data. Using STEM-EELS we prove the presence of nitrogen exactly in the platelet plane. Comparing DFT calculations of different nitrogen centres in diamond and the experimental spectra extracted from the defect plane we suggest the model for the nitrogen coordination in the platelet. Using this detailed information on the platelet defect, we will discuss the possible mechanisms of platelet formation.

[1] Evans T., Phaal C. (1962) Proc. R. Soc., A270, 535-552.

[2] Lang A. R., (1964) Proc. phys. Soc. Lond. 84, 871-876.

[3] Berger S.D., Pennycook S.J. (August 1982), Nature Vol. 298, 635-637, 12.

[4] Pennycook T. J., Jones L., Pettersson H., Coelho J., Canavan M., Mendoza-Sanchez B., Nicolosi V., Nellist P.D., Scientific Reports, 4, 7555.

[5] S.K. and J.V. aknowledge the FWO-Vlaanderen for financial support under contract G.0044.13N ‘Charge ordering’.


Svetlana KORNEYCHUK (Antwerp, Belgium), Stuart TURNER, Artem ABAKUMOV, Johan VERBEECK
08:00 - 18:15 #6500 - MS01-557 Electron microscopic characterization of thermally modified surface layers generated by electro-discharge machining.
MS01-557 Electron microscopic characterization of thermally modified surface layers generated by electro-discharge machining.

Functional properties of construction components like wear resistance or fatigue strength heavily depend on their surface modifications like grain size, residual stresses, hardness, etc. Since these modifications are generated during machining, knowing about the resulting modifications beforehand is in high demand in industry. So far many time-consuming iterative procedures are necessary to find the machining parameters that provide the desired surface integrity. Brinksmeier et al. [1, 2] introduced a new energy based approach called “Process Signatures” that is supposed to solve this problem. Process Signatures describe the relationship between internal material loads – like strain, temperature and their gradients – and the resulting material modifications for instance residual stresses, hardness and microstructure. Hence production processes are characterized by their mechanical, thermal and chemical loads or a combination of those instead of their machining parameters. The present work focuses on electro discharge machining (EDM), which is mainly characterized by thermal effects due to the high temperatures and temperature gradients arising from the generated spark plasma [3, 4].

 

In the present studies, scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), electron probe microanalysis (EPMA) and transmission electron microscopy (TEM) have been used to analyze the surface modification of 42CrMo4 steels processed by EDM. According to the very high surface temperatures (above melting temperature) and high temperature gradients applied by EDM, the surface zone contains martensite and even dendrites (figure 1). Investigations on the carbon content in the surface zone reveal about 8 times higher carbon contents than in the matrix due to carbonization (figure 2). Carbonization occurs because of decomposition of the dielectric fluid and carbon diffusion results due to the high applied temperatures. The increase in carbon content also stabilizes the fcc crystal structure, as the EBSD phase map shows (figure 3). These surface modifications reveal information about the mechanisms and applied internal loads, since the internal loads, in particular temperature and temperature gradients, influence diffusion of carbon, generation of dendrites and martensitic transformation. Together with temperature measurements during processing and simulation of temperature evolution in the material, Process Signatures for EDM can be developed.

 

Acknowledgement:

The authors gratefully acknowledge the financial support of the German Research Foundation (DFG) within the Collaborative Research Center SFB TRR136 „Process Signatures“ (Bremen, Aachen, Oklahoma), subprojects C02 and F02.

 

Literature:

[1] E. Brinksmeier et al., Process Signatures- an Alternative Approach to Predicting Functional Workpiece Properties, Procedia Engineering 19 (2011), p. 44–52

[2] E. Brinksmeier et al., Process Signatures - a new approach to solve the inverse surface integrity problem in machining processes, Procedia CIRP 13 (2014), p. 429–434

[3] A. Klink et al., Surface Integrity Evolution of Powder Metallurgical Tool Steel by Main Cut and Finishing Trim Cuts in Wire-EDM. Procedia Engineering 19 (2011), p. 178-183

[4] F. Klocke et al., Investigations on Surface Integrity of 42CrMo4 (AISI 4140) with Varied Heat Treatment Conditions Processed by Sinking EDM, Procedia CIRP 42 (2016), p. 580-585


Lisa EHLE (Aachen, Germany), Sebastian SCHNEIDER, Alexander SCHWEDT, Silvia RICHTER, Joachim MAYER
08:00 - 18:15 #6503 - MS01-559 A precession electron diffraction study of ordered-disordered phases in Ni-Cr based alloys.
MS01-559 A precession electron diffraction study of ordered-disordered phases in Ni-Cr based alloys.

The alloy 690 is a nickel-based alloy (60% Ni, 30% Cr, 10% Fe) used in nuclear Pressurized Water Reactors for different components (steam generator tubes, reactor vessel clevis etc.). These components are subjected to long thermal ageing for 40 to 60 years at 325 °C.
For these kind of alloys, thermal ageing can produce an order-disorder transformation due to the formation of the Ni2Cr ordered phase by a nucleation growth mechanism. This transformation strongly modifies mechanical properties (strength increasing and ductility decreasing) as well as electrical properties when the orthorhombic ordered domains grow in the cubic disordered matrix.
In order to correlate the ordering state of these alloys to the evolution of their macroscopic properties, TEM studies are conducted. Ordered domains are generally very small (a few nanometers) so that imaging is not always feasible. Hence, ordering state is investigated using electron diffraction where we want to measure the intensity ratio between superlattice reflexions, related to the ordered domains, to the fundamental ones, related to both ordered domains and the disordered matrix (see figure 1). Indeed, in the kinematical approximation, the square of the order parameter s is proportional to Is/If, where Is and If are the intensities of the superlattice and fundamental reflections respectively. We want to appreciate the validity of this approach using Precession Electron Diffraction (PED) coupled to dynamical calculations of the intensities1. For this kind of quantitative study, PED is advantageous since it strongly reduces sensitivity to experimental parameters such as sample thickness and exact orientation, which renders comparison with intensity calculations much more reliable. Reflections of the <011> cubic matrix zone axis pattern are targeted. In this orientation, superlattice reflections come from only one of the six possible orientation variants of the ordered phase related to the disordered one (see figure 2). This particular type of zone axis thus gives the richest information about the ordered phase.
In the present study, model alloys with iron content of 0 to 3 wt. % Fe are aged between 24 and 20 000 h in the range of 325 to 500 °C. The precipitation of Ni2Cr ordered phase is detected by an increasing Vickers hardness and ThermoElectric Power (TEP) at the macroscopic scale.
We first need to validate our dynamical calculations on the fully ordered orthorhombic domains. In this attempt, specifically aged alloys are also studied, where ordered domains are well extended (a few tens of nanometers). Microdiffraction patterns are then collected on single domains and a systematic study of the intensity ratio Is/If as a function of the sample thickness is conducted in order to compare experimental and calculated data. Generalization of the procedure to the mixed alloys containing both ordered and disordered domains in various proportions will then be proposed.

 

Acknowledgements: The authors gratefully acknowledge L. Legras2, J. Stodolna2 and D. Loisnard2 of for useful advice for thin foil preparation and observation; Y. Fontaine and his team2 for all the machining work; C. Vincent2 for the thermal treatments and P. Stadelmann3 for helpful discussions about JEMS software.

 

1 Dynamical diffraction are simulated with JEMS software
2 Matériaux et Mécanique des Composants, EDF Lab les Renardières, Ecuelles FRANCE
3 Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, SUISSE

Baptiste STEPHAN (Juvisy-sur-Orge), Damien JACOB, Frederic DELABROUILLE
08:00 - 18:15 #6540 - MS01-561 ANALYTICAL ATOMIC-RESOLUTION MICROSCOPY OF OXYGEN DEFICIENT Ca2Mn3O8-d.
MS01-561 ANALYTICAL ATOMIC-RESOLUTION MICROSCOPY OF OXYGEN DEFICIENT Ca2Mn3O8-d.

Manganese related perovskites (AMnO3, A=alkaline earth) present a wide range of fascinating functional properties due to the ability of Mn to adopt several oxidation states and different coordination polyhedra. Regarding their catalytic behaviour, CaMnO3-δ selectively oxidizes, at least on a laboratory scale, propene to benzene and 2-methyl propene [1]. Moreover, the Ca-Mn-O system presents a great variety of oxides with different Ca/Mn ratio and crystalline structure and a particular behaviour: their reduction process leads to a rock-salt type structure which, in most cases, can be again oxidized to the starting material [2].

Here we show the combination of oxygen engineering performed under adequate controlled atmosphere with local characterization techniques like atomic resolution electron microscopy associated to Energy Electron Loss Spectroscopy (EELS) to provide a complete characterization of other member of the Ca-Mn-O system. In particular, Ca2Mn3O8 crystallizes in a monoclinic layered structure [3] with sheets of MnIV in octahedral coordination held together by Ca2+ cations alternately stacked along a axis (Fig. 1). The total reduction process of this material leads to Ca2Mn3IIO5 with rock-salt type structure.

By means of partial reduction, different samples have been stabilized in the Ca2Mn3O8-d system. Among them, Ca2Mn3O6.5, a new layered calcium manganese oxide with only Mn3+, has been stabilized. The different samples obtained in the Ca2Mn3O8-δ system have been characterized by using High Angle Annular Dark Field (HAADF) and Annular Bright Field (ABF) imaging associated to EELS and Energy Dispersive Spectroscopic (EDS) in an aberration-corrected JEOL JEMARM200cF electron microscope. The structural evolution and the local variation of the Mn oxidation state in different phases with different anionic composition will be discussed.

 

[1] A. Reller et al, Proc. R. Soc. Lond. A, 394 (1984), 223-241.

[2] A. Varela et al, J. Am. Chem. Soc., 131 (2009), 8660-8668.

[3] G. B. Ansell et al, Acta Crystallogr. B, 38 (1982) 1795-1797.


Ángel MAZARÍO-FERNÁNDEZ (MADRID, Spain), Almudena TORRES-PARDO, Raquel CORTÉS-GIL, Aurea VARELA, Marina PARRAS, Maria HERNANDO, Jose María GONZÁLEZ-CALBET
08:00 - 18:15 #6553 - MS01-563 Towards imaging of defects in diamond by high-resolution TEM.
MS01-563 Towards imaging of defects in diamond by high-resolution TEM.

Nitrogen-Vacancy (NV), silicon-vacancy (SiV), germanium-vacancy (GeV) and other colour centres in diamond have been of rising interest in recent years due to their potential applications such as quantum information processing [1] and fluorescent labelling in biology. For such applications, it is necessary to incorporate the colour centres in diamond thin films or nanodiamond particles in a controllable way. Since the colour centres are formed by single atomic vacancy and single substitution, one fundamental step towards controlled incorporation is to characterize the structure of the colour centres with high spatial resolution. Although structural characterisation of NV-centres has been accomplished by optical and magnetic resonance methods, atomic structures of other colour centres often remain elusive.

Aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) has proven to be a powerful technique for structural analysis with atomic resolution. However, the imaging conditions necessary to directly image the structure of an SiV, GeV or other colour centres remain unclear. Here we explore the optimum imaging conditions for the detection of SiV and GeV centres by using HRTEM image simulation. In order to maximize the image contrast from the SiV and GeV centres, we carried out a series of HRTEM simulations under various imaging conditions such as crystal orientation, acceleration voltage, spherical aberration coefficient (Cs) and defocus. The HRTEM image simulation was implemented using a multislice algorithm in the QSTEM software package [4].

Our results show that it should be possible to directly image both SiV and GeV centres in [120] projection at an acceleration voltage of 300 kV (see Figures 1 and 2, respectively). Under negative Cs imaging conditions (Cs = -15 µm and slight overfocus), both SiV and GeV centres can be clearly detected. Due to the higher atomic number of Germanium, GeV centres provide slightly higher contrast as compared to SiV centres.

[1] F. Jelezko and J. Wachtrup, phys. stat. sol. (a) 203, 13, 3207–3225 (2006)

[2] J. Tisler et al., ACS Nano, 3(7), 1959-1965 (2009)

[3] I. Vlasov et al., Nature Nanotechnology 9, 54–58 (2014)

[4] C. Koch, Determination of core structure periodicity and point defect density along dislocations, PhD. thesis, 2002.


Robert LEITER (Ulm, Germany), Haoyuan QI, Johannes BISKUPEK, Boris NAYDENOV, Fedor JELEZKO, Ute KAISER
08:00 - 18:15 #6613 - MS01-565 Order/disorder mechanisms in complex (CaFe2O4)(FeO)n ferrites (n=1,3).
MS01-565 Order/disorder mechanisms in complex (CaFe2O4)(FeO)n ferrites (n=1,3).

Numerous studies are always devoted to mixed valence state iron oxides in materials research due to their complex magneto transport properties like the famous Verwey transition [1].  Among these oxides, a special attention is focused on the orthoferrites LnFeO3 (Ln= rare earth) related to the distorted GdFeO3-type perovskite structure which can exhibit some possible spin reorientation transitions versus temperature and the nature of Ln [2]. Recently, iron based oxides like LnFe2O4 have also focused a large attention due to their ability to exhibit some multiferroic properties [3]. In these systems, both kinds of Fe species (Fe2+ and Fe3+) localize magnetic moments leading to a ferrimagnetic ordering associated to ferroelectric properties. An exciting challenge is to evidence similar properties in other iron based systems. The Ca-Fe-O system offers several interesting candidates like the CaFe5O7 and CaFe3O5 phases in regard to the richness of its phase diagram.

CaFe5O7 oxide exhibits a complex structure which can be described as an intergrowth between one CaFe2O4 unit and n=3 slices of FeO Wustite-type structures [4]. A recent structural study performed by transmission electron microscopy (TEM) observations has revealed a supercell with a lower monoclinic symmetry [5]. From the intensity extraction and hkl conditions deduced from the precession electron diffraction (PED) study, a structural model considering to this supercell and the centrosymmetric P21/m setting can be proposed. The fine structural analysis combining Rietveld refinements from neutron and X-ray data evidence six independent iron sites and two specific oxygen environments with coordination 6 and 5+1 respectively. According to the chemical formula CaFe5O7, the iron species average state valence is +2.4 and implies the coexistence of Fe+3 and Fe2+. The magnetic dependence versus temperature has been studied and susceptibility measurements have revealed discontinuity around 360K [6]. The structural evolution of CaFe5O7 depending on temperature has been also tuned from diffraction techniques. A clear reversible transition (monoclinic to orthorhombic) has been detected in the same temperature range with the disappearing of the supercell [6]. A complementary STEM-HAADF study has allowed to highlight the impact of this superstructure at atomic scale (Fig.1) : ordered contrasts at the level of calcium rows can be observed. A second ferrite, CaFe3O5 related to the n=1 member of the generic (CaFe2O4)(FeO)n series, has also been analysed by TEM techniques. Thus a superstructure is revealed but the first STEM-HAADF highlight a complex nanostructural feature related to the coexistence of two polymorphs (Fig.2)

 

[1] E J W Verwey, Nature 144, 327 (1939)

[2] R. Bozorth & al  Phys. Rev. Lett., 1, 3, (1958)

[3] M. Hervieu & al, Nature Materiels, 13 (2014)

[4] O. Evrard & al,  JSSC 35, 112 (1980)

[5] C. Delacotte & al Key Engineering Materials (2014)

[6] C. Delacotte & al Inorg. Chem. (2014)


Charléne DELACOTTE, Laurine MONNIER, Yohann BRÉARD, Sylvie HÉBERT, Denis PELLOQUIN (Caen)
08:00 - 18:15 #6620 - MS01-567 Dislocation mobility in GaN nanowire arrays by in-situ heating in the TEM.
MS01-567 Dislocation mobility in GaN nanowire arrays by in-situ heating in the TEM.

Wide bandgap semiconductors are a current area of interest for a new generation of high-temperature, high-voltage and high-power semiconductor-based electronics. Gallium nitride (GaN) is a promising candidate and is already extensively used in blue and UV LEDs[1,2]. Thin films are grown on substrates such as silicon and sapphireas to produce transistors with high electron mobility. However, these films suffer from large dislocation densities (108-1010cm-2)[3,4] due to the intrinsic strain of the substrate, resulting in devices with reduced reliability because of increased current leakage, disrupted electric field distribution and a premature breakdown of microplasma[5].

Therefore, novel methods of GaN device manufacturing using nanostructured systems such as nanowires and nanorods are a promising solution to minimise the presence of structural defects. Understanding how growth conditions affect the nanowire's structure is important for future device fabrication, in particular the effect of annealing conditions on the dislocation density.

Here, we investigate unannealed GaN nanowiresgrown by metalorganic vapour phase epitaxy on Si substrates[6]. The nanowires are doped with varying levels of Si, subjected either an N2 or N2+NH3 atmosphere upon growth.

The annealing process is seen to reduce dislocation density[7]. Ex-situ annealing during growth shows a slight reduction in dislocation density. Figure 1 shows a comparison of dislocation density between an unannealed sample and a sample annealed at 900oC. Dislocation densities are measured to be 1.6x109 cm-2 and 1x109 cm-2 for unannealed and annealed nanowires respectively. The drop in dislocation density is, however, lower than expected for annealing at this temperature. In-situ heating experiments allow the direct observation of dislocation mobility during annealing, giving a valuable insight into dislocation bending.

[1] Y Huang et al, Science 294 (2001) 1313-1317.

[2] F. Qian et al, Nano Lett. 4 (2004) 1975.

[3] S Nakamura, J. Appl. Phys. 30 (1991) 1705-1707.

[4] H Amano, N Sawaki and I Akasaki, Appl. Phys. Lett. 48 (1986) 353.

[5] E Cicek et al, Appl. Phys. Lett. 96 (2010).

[6] B Alloing et al, Appl. Phys. Lett. 98 (2011).

[7] R Collazo et al, J. Cryst. Growth, 287(2), 586–590 (2006).

 


Mathew MCLAREN (Belfast, United Kingdom), Vitaly ZUBIALEVICH, Peter PARBROOK, John SHEN, Miryam ARREDONDO
08:00 - 18:15 #6621 - MS01-569 Contribution of transmission electron microscopy to the elaboration of transparent (glass)ceramics.
MS01-569 Contribution of transmission electron microscopy to the elaboration of transparent (glass)ceramics.

Transparent polycrystalline (glass)ceramics present significant economical and functional advantages over single crystal materials for optical, communication, and laser technologies. To date, transparency in (glass)ceramics is ensured either by an optical isotropy (i.e. cubic symmetry) or a nanometric crystallite size. Polycrystalline ceramics offer several advantages, particularly in the fabrication of complex shapes and large-scale industrial production, and enable greater and more homogenous doping of optically active ions than is possible in single crystals. Our recent work shows the possibility to obtain transparent polycrystalline ceramics by full and congruent crystallization from glass. Transparency in these materials is observed despite micrometer scale crystals and a non cubic symmetry (no structural isotropy) of the crystalline phase. Transmission electron microscopy used in TEM – STEM – High Resolution modes and coupled with EDX map or line scan, enables to complete the nanostructure characterization which explains the transparence properties and to highlight the crystallization processes occurring during the heat treatments. Three cases where transmission electron microscopy has played an important role to develop transparent (glass-)ceramics will be presented.

Highly transparent ZnGa2O4 glass-ceramic materials are elaborated via a simple heat treatment of a 55SiO2–5Na2O–17ZnO–23Ga2O3 parent glass composition, which presents nanoscale spinodal phase separation. This optimized glass-ceramic exhibits 50 wt% of ZnGa2O4 nanocrystals showing a homogeneous and tuneable size. To describe the crystallization process, the glass and glass-ceramic nanostructures are studied by high resolution scanning transmission electron microscopy analysis coupled with in situ high temperature X-ray diffraction and optical measurements. From these results, an original mechanism is proposed to explain the crystallization process occurring in a spinodal phase separated glass. Remarkably, red long-lasting luminescence arising from the entire sample volume is observed in the Cr3+ doped transparent glass-ceramics, opening the route to a wider range of performing applications for this famous zinc gallate persistent phosphor.[1]

A series of biphasic (100 − z)BaAl4O7−zBaAl2O4 (0 < z ≤ 45) transparent polycrystalline ceramics have been synthesized by full crystallization from glass process. Despite being composed of two birefringent crystalline phases, these new materials exhibit improved transparency compared to the pure BaAl4O7 ceramic recently reported to show remarkable scintillation properties. Multiscale structural characterizations demonstrate that this transparency enhancement can be explained by the presence of nanometer scale BaAl2O4 crystals which crystallize coherently with the BaAl4O7 matrix. We show that the BaAl2O4 nanostructuration limits the BaAl4O7 growth via an original Zener pinning effect, such decreasing light scattering due to the material birefringence. Interestingly, the BaAl4O7 scintillation properties can be retained in these two-phase transparent ceramics.[2]

The full and congruent crystallization of Sr1+x/2Al2+xSi2-xO8 (0 < x ≤ 0.4) leads to new transparent polycrystalline ceramics with hexagonal symmetry. We use a controlled degree of chemical disorder in the structure to obtain optical isotropy at the micrometer length scale. The structure and the chemical disorder were characterized by X ray Diffraction, solid state NMR and STEM-HAADF imaging. These materials reach the theoretical limit in transmittance that is to say 90%.[3]

1. S. Chenu, E. Veron, C. Genevois, A. Garcia, G. Matzen, M. Allix, Long-lasting luminescent ZnGa2O4:Cr3+ transparent glass-ceramics, J. Mater. Chem.C, 2 10002-10010 (2014).

2. M. Boyer, S. Alahrache, C. Genevois, M. Licheron, F-X Lefevre, C. Castro, G. Bonnefont, G. Patton, F. Moretti, C. Dujardin, G. Matzen, M. Allix, Enhanced transparency through second phase crystallization in BaAl4O7 scintillating ceramics, Crystal Growth and Design, Vols 16, Issue 1 (2016) 386-395.

3. K. Al Saghir, S. Chenu, E. Veron, F. Fayon, M. Duchomel, C. Genevois, F. Porcher, G. Matzen, D. Massiot, M. Allix, Transparency through structural disorder: a new concept for innovative transparent ceramics, Chemistry of Materials, Vols 27, Issue 2 (2015) 508-514.


Cécile GENEVOIS (Orleans Cedex 2), Marina BOYER, Kholoud AL-SAGHIR, Sébastien CHENU, Emmanuel VÉRON, Franck FAYON, Guy MATZEN, Mathieu ALLIX
08:00 - 18:15 #6626 - MS01-571 In-Situ SEM Study of Mechanical Properties of Aluminide Bond Coating at Elevated Temperature.
MS01-571 In-Situ SEM Study of Mechanical Properties of Aluminide Bond Coating at Elevated Temperature.

Diffusion aluminide bond coats are compositionally and microstructurally graded material with significant variation in engineered mechanical properties across the cross-section. Bond coating exhibits three-layered microstructure: (a) outer layer contains intermetallic PtAl2 and Cr-rich fine precipitates, (b) intermediate layer contains B2-(Ni,Pt)Al and (c) inner layer is interdiffusion zone containing coarse precipitates in B2-NiAl matrix. This study focuses on understanding deformation mechanisms at elevated temperature and the variation in mechanical properties as a function of temperature. In-situ nanomechanical instrument, PI 87xR SEM PicoIndenter (Hysitron, Inc., Minneapolis, USA) with an integrated high-temperature stage and an active tip heating was used to conduct uniaxial compression of pillar samples. In-situ mechanical testing allows precise alignment of the tip with the sample as well as direct, real-time observation of the deformation processes. A side benefit of performing these tests in the SEM is that the high vacuum environment limits the oxidation of the sample, especially at high temperatures, enabling the measurement of the true mechanical properties of the bond coating and superalloy. Water circulation through cooling blocks at the sample heater and transducer minimizes thermal drift of the system.

Micropillars of dimensions 8 μm x 8 μm in cross-section and 25 μm in height were prepared from the outer layer of PtNiAl coating and Ni-base superalloy region by focused ion beam (FIB). In-situ quasistatic uniaxial compression experiments were conducted with a 20 μm flat punch diamond probe. Using the displacement-controlled feedback mode of the system, the pillars were compressed to 5-12% strain at a strain rate of 10-3 s-1. Compression tests were conducted at room temperature (RT) as well as several elevated temperatures up to 800°C. Heating was achieved through closed-loop resistive heating of both the probe and sample. Tilt and rotation in sample motion allows flexibility in pillar alignment with respect to flat punch probe.

The microstructure of the pillar surface after uniaxial compression of bond coating and superalloy are shown in fig. 1. Fig. 2 displays stress-strain curves which are calculated from load-displacement data. The stress-strain curves of bond coating indicate that plasticity is characterized by major strain hardening after yielding at RT and limited strain hardening at higher temperature. The surface of the bond coating pillars shows grain boundary sliding at higher temperature. Elastic moduli of the bond coating remain nearly constant up to 800oC whereas yield stress of the coating decreases to ~50%. Transgranular fracture appears on the pillar surface at room temperature whereas intergranular fracture dominates deformation at higher temperature.

Stress-strain curves plotted in figure 2b show larger load drops in superalloy samples. Figure 1c and d indicate that load drops are associated with the formation of slip bands. A large number slip bands with bigger step size can be observed on the pillar surface at 600oC. At 600°C the yield strength of superalloy sample decreased by ~20% compared to room temperature. In summary, uniform plastic deformation without slip bands was observed in Pt-rich layer of bond coating. Grain boundary siding predominantly controlled plastic deformation. In contrast, multiple slip bands were observed in Ni-base superalloy. The density and severity of the slip banding increased with temperature.


Sanjit BHOWMICK, Douglas STAUFFER (Minneapolis, USA), S.a. Syed ASIF
08:00 - 18:15 #6632 - MS01-573 Simulation of STEM-HAADF image contrast of Ruddlesden Popper faulted LaNiO3 thin films.
MS01-573 Simulation of STEM-HAADF image contrast of Ruddlesden Popper faulted LaNiO3 thin films.

Perovskite nickelates are interesting candidates to be used as electrode materials or in the research towards artificial superconductors. Among them, LaNiO3 (LNO) is of high interest because of its exceptional transport properties, with a resistivity lower than 100 µΩ·cm, and the potential tuning of electrical and magnetic interactions through appropriated strain engineering. A precise control of the stoichiometry, structural phases, lattice distortions and the presence/absence of dislocations/defects is critical to make LNO electrodes and related heterostructures suitable for electronic applications1–3.

Frequent defects present in perovskite structures are Ruddlesden Popper (RP) faults which consist on the relative displacement of two perfect defect free perovskite ABO3 blocks a distance of half- unit cell along the [111] direction. The earlier observations of RP faults were based on diffraction results, but they have also been imaged using advanced microscopy tools4,5. When observed along the [001] zone axis, this defect appears as a zig-zag arrangement of the A cations with a BO2 plane lost at the defect boundary.

In the present work we focus our attention on the characterization of RP faults observed in LNO thin films 14 nm and 35 nm thick, grown by pulsed laser deposition on (001) oriented LaAlO3 (LAO) single crystal substrates at an oxygen pressure P = 0.15 mbar and at a temperature T = 700°C. The preliminary characterization of the layers by high resolution transmission electron microscopy (HREM) and electron diffraction, confirmed the good pseudo-cube-on-cube epitaxial growth with atomic-sharp interfaces and the expected [010]LNO(001)//[010]LAO(001) epitaxial relationship, despite the compressive strain driven by the 1% mismatch between LNO (3.838 Å) and LAO (3.795 Å). Nevertheless, defects identified as potential RP faults oriented in both [100] and [010] directions were also observed.

Detailed high angle annular dark field (HAADF) imaging of these defects enabled a better identification of the defects as Ruddlesden Popper type through the appropriated correlation of the contrast of the atomic columns with cationic La(A) and Ni(B) positions as shown in the figure 1.

We will systematically address the interpretation of the contrast of these HAADF images through STEM-HAADF simulations calculated through the multislice procedure6 from atomistic models based on different arrangements of defect free perovskite blocks with octaetrahedral Ni3+ coordination (Fig. 2).  Gradual variation of Z-contrast is interpreted in terms of the average of the atomic numbers of the La and Ni in A and B sites in RP displaced overlapping perovskite crystals7. The good agreement between the experimental images and the simulated ones (Fig. 3) validates the proposed geometrical configurations of the RP faulted crystals.

References:

1.           Scherwitzl, R., Zubko, P., Lichtensteiger, C. & Triscone, J. M. Electric-field tuning of the metal-insulator transition in ultrathin films of LaNiO3. Appl. Phys. Lett. 95, 10–13 (2009).

2.           Zhu, M. et al. Effect of composition and strain on the electrical properties of LaNiO3 thin films. Appl. Phys. Lett. 103, 141902 (2013).

3.           Detemple, E. et al. Polarity-driven nickel oxide precipitation in LaNiO3-LaAlO3 superlattices. Appl. Phys. Lett. 99, (2011).

4.           Beznosikov, B. V & Aleksandrov, K. S. Perovskite-Like Crystals of the Ruddlesden – Popper Series 1. Crystallogr. Reports 45, 864–870 (2000).

5.           Ruddlesden, S. N. & Popper, P. New compounds of the K2NiF4 type. Acta Crystallographica 10, 538–539 (1957).

6.           Kirkland, E. J. Computation of Transmission Electron Micrographs. Plenum New York 129, (1998).

7.           Detemple, E. et al. Ruddlesden-Popper faults in LaNiO3/LaAlO3 superlattices. J. Appl. Phys. 112, 1–6 (2012).

 


Catalina COLL (Barcelona, Spain), Lluís LÓPEZ-CONESA, Cesar MAGÉN, Florencio SANCHEZ, Josep FONTCUBERTA, Sònia ESTRADÉ, Francesca PEIRÓ
08:00 - 18:15 #6650 - MS01-575 Size and orientation effects on the mechanical response of a Ni-Ti-Al-Nb-Hf alloy.
MS01-575 Size and orientation effects on the mechanical response of a Ni-Ti-Al-Nb-Hf alloy.

NiTi-Al based alloy is considered as a potential high temperature structural material [1]. The addition of Nb is able to improve the oxidation resistance of NiTi-Al based alloys at ~ 800°C [2] and also their strengths at room and elevated temperatures [3]. A Ni-43Ti-4Al-2Nb-2Hf alloy has been demonstrated to be a promising lightweight high-temperature structural material [4]. It is thus of significance to understand the effect of crystal orientations on its mechanical behaviours. In the past, mechanical testing of single crystal metals was performed on large crystal. However, the preparation of single crystals of this class of alloys is very difficult. Meanwhile, understanding material behaviour with decreasing sample size is necessary for exploring the potential application in nano-technologies.  In this study, electron backscattered diffraction (EBSD) was used to identify the grain orientations (e.g. close to [001], [011] and [111] directions) of a directional solidified Ni-43Ti-4Al-2Nb-2Hf alloy. Pillars with diameters ranged of 0.5 mm ~ 4 mm were machined using a focussed ion beam (FIB) microscope. Compression tests were performed using a Hysitron PI85 picoindenter. Specimens for transmission electron microscopy (TEM) were prepared along longitudinal direction of the pillars by FIB, and then examined in an FEI Tecnai F20 microscope.

The results show that its strength depends on the crystal orientations and the size of pillars (Fig. 1). The pillars were plastically deformed via dislocation gliding (Fig. 2) and twinning.

References:

1. Koizumi Y, Ro Y, Nakazawa S, Harada H. Mater Sci Eng A 1997; 223:36–41.
2. Zhao XQ, Xu J, Tang L, Gong SK. Intermetallics 2007; 15; 1105-15.
3. Meng LJ, Li Y, Zhao XQ, Xu HB. Intermetallic 2007; 15: 814-8.
4. Pan LW, Zheng LJ, Han WJ, Zhou L, Hu ZL, Zhang H. Mater. & Design 2012, 39: 192-9.


Rengen DING (Birmingham, United Kingdom), Lijing ZHENG, Yulung CHIU
08:00 - 18:15 #6685 - MS01-577 Effect of Alloying Content on the Defect Structure Formation and Evolution in the Ta-W system.
MS01-577 Effect of Alloying Content on the Defect Structure Formation and Evolution in the Ta-W system.

I INTRODUCTION
Nowadays tantalum coating of tungsten targets used in spallation sources (e.g. ISIS, LANCE) is considered as a promising route to improve the target integrity, neutron production, operational reliability, and hopefully reduce the need of handling radioactive materials at the end of the target lifetime [1]. Tantalum offers attractive corrosion and mechanical resistance properties, and its neutronic performance is relatively similar to that of tungsten. However, the difference in the thermal expansion coefficient of tantalum and tungsten may lead to significant geometry variations between the coating and the substrate that could cause the degradation and failure of the Ta/W component at elevated temperatures. This suggests that doping Ta with controlled amounts of W (up to 10wt.%) would improve the thermal stability of the compound target.
Supplementary to this another question which is apparently open now is that fatigue failure of tantalum cladding will be the limiting factor of target lifetime. Tensile pre-stress and radiation embrittlement can make the fatigue situation worse and irradiation creep and stress relaxation may reduce the average stress. And in this case the addition of tungsten to tantalum can potentially increase the yield strength and the rate of work hardening of the final material.

II EXPERIMENTAL

A Non-radioactive materials

In this work pure tantalum and tungsten samples, together with selected binary alloy compositions (Ta2.5wt.%W; Ta5wt.%W and Ta10wt.%W) have been analyzed before study of the proton irradiation. Four alloys were annealed at temperatures close to the onset of recrystallization. Changes in a grain size and grains orientation have been observed together with the presence and nature of nano-scale defects such as dislocation lines, nets and tangles Tungsten has been reported to influence the dislocation density and dynamics in non-irradiated Ta-W alloys during mechanical testing [3]. However, W contents about 10wt.% would induce the formation of a secondary brittle phase in the structure, according to the Ta-W phase diagram.
Using analytical electron microscopy techniques different structure of dislocations has been detected with increasing concentration of tungsten in tantalum in non-irradiated samples. In alloys with highest tungsten concentration of 10% dislocations form nets of intersected lines with increasing its number density (Fig.1) which directly affects modifications in hardening behaviour of these kinds of materials. Detailed examination of thin foils indicates that dislocations presented in this alloy are screw dislocations with ½ a [111] type Burgers vector.

B Proton irradiation of Tantalum-Tungsten alloys
Two proton irradiation experiments have been implemented using a 5MV Tandem Pelletron ion accelerator (NEC model 15SDH-4) and high current TORVIS source in order to go up to 3 MeV 1H+ at 350C and up to 1.6 dpa level in Dalton Cumbrian Facility (University of Manchester) for the aim of investigating tungsten doping impact on the irradiation-induced defects in microstructure and changes in mechanical behaviour such as radiation-induced embrittlement in Ta-W alloys.
Pure Tantalum and two Tantalum-Tungsten alloys with different tungsten concentration have been loaded together on a specially designed target stage, pumped with high level of vacuum (7.44 *10-7Torr) and equipped with ceramic heater and cooling system allowing not overheating the stage.

III STUDY OF IRRADIATED SAMPLES
A Bragg peak position. Hardness test
Hardness of bulk UHP Ta, Ta5wt.%W and Ta10wt.%W irradiated with single proton beam of 3 MeV during 36 hours at 350oC, as described above is assessed by nanoindentation.
Nanoindentation tests (Fig.2) have been carried out from the cross-section area of each sample exposed under irradiation in order to observe changes in hardness depending on different dpa level and defect density. This experiment also has been performed in order to compare the data with SRIM calculations of Bragg peak position (Fig.3). As it is showed on the graph above Bragg peak position for all alloys is varied between 25-40 μm which corresponds to the SRIM calculations. 

B Scanning electron imaging
The determination of the Bragg peak can be straight forward in Scanning electron microscope as different contrast may arise with back scattered electrons detector (BSE) since the irradiation damage mutes more the crystal structure. In the Fig. 4 presented below, the BSE detector revealed (at high voltage of 30 kV) a line of brighter contrast, perfectly parallel to the irradiated surface and all along the sample. It crosses several grains of different orientation without interruption, as clearly showed by the different BSE contrast. Also nano indenters after hardness test are showed in order to prove matches of hardness data. It should be noticed that the higher contrast line crosses the point with the highest hardness.

C Current work on irradiated materials

Irradiation-induced dislocation loops formation are reported to occur in pure tantalum at a damage dose of ≤ 0.3 dpa at a relatively high temperatures of 700°C [2]. However, radiation-induced hardening in pure Ta as well as in Ta-W alloys seems to take place already at a dose of ≤ 0.3 dpa and temperatures up to 350°C, based on mechanical testing data of irradiated samples [4-6]. Nevertheless, the correlation of the hardening phenomenon with the characteristics of the irradiated structures and mechanism of dislocation loops formation still remains unknown. Irradiated sample preparation of irradiated Ta and Ta-W alloys is carrying out for advanced Transmission microscopy analysis in order to observe irradiation-induced defects such as vacancy clusters and dislocation loops and influence of dose on the nature and forming of these defects . This detailed study constitutes the stepping stone in understanding the effect of the alloying content as well as radiation dose on the defect formation and dynamics of these materials under mechanical deformation and irradiation conditions.

ACKNOWLEDGMENT
First of all the author acknowledges the financial support of the Dalton Cumbrian Facility and Professor Simon Pimblott for the funding throughout the project. Also I would like to thank Material Science Centre in the University of Manchester for the equipment provided.


Iuliia IPATOVA (Carlisle, United Kingdom), Enrique JIMENEZ-MELERO
08:00 - 18:15 #6691 - MS01-579 Fivefold symmetries in silicon thin films induced by multiple twinning.
MS01-579 Fivefold symmetries in silicon thin films induced by multiple twinning.

Fivefold symmetry, like any kind of n-fold rotational symmetry, can be identifiable when rotating a crystalline configuration 5 times (or n times) around a certain axis and realizing that the structure is transformed into a configuration that is equivalent to the initial one. The occurrence of this specific symmetry, forbidden by the conventional periodic crystallography, was attributed in the literature to the presence of a new state of matter “the quasicrystals” [1] [2] or simply to an effect of multiple twinning. Particularly, the tendency of multiply twinning in a fivefold symmetry has been widely reported in small particles having a special morphology like the decahedral [3] or icosahedral [4] structures, usually called multiply twinned particles. In this study, we will highlight on the fivefold symmetry observed in the electron diffraction patterns of two types of materials elaborated in different growth conditions, originating from multiple twinning and not from the presence of multiply twinned particles.

The first case concerns the fivefold symmetry on p-type doped silicon thin films containing a non-negligible amount of carbon and oxygen. These films were deposited in a plasma enhanced chemical vapor deposition reactor (PECVD) at 0.2 W/cm2 using silane, hydrogen, diborane and hexamethydisiloxane (C6H18OSi2, HMDSO) diluted in argon. Since all the diffraction patterns recorded on different regions of these films exhibit a fivefold symmetry along [0-11] zone axis (Figure 1), it is clear that this symmetry is real and characteristic of our films. Further diffraction measurements reveal that there is a relation of epitaxy with the (100) crystalline silicon substrate. This is also confirmed by high resolution TEM images, where {111} planes are continuing from the substrate to the film across the interface. Moreover, energy filtered TEM images were correlated with SIMS measurements to provide elemental mapping of silicon, carbon and oxygen with absolute values.

The second case illustrates a quasi-fivefold symmetry recorded on intrinsic silicon thin films deposited by PECVD using silicon tetrafluoride, hydrogen and argon chemistry at a purposely high power density of 0.3 W/cm2. After few hundred nanometers of epitaxial growth, a high density of defects appears, followed by a multiply twinned part (as shown in Figure 2a). Fourier Transforms recorded on the first part reveal a monocrystalline structure (Figure 2c), and on the second part a fivefold symmetry (Figure 2b), which is, in this case also, linked to an epitaxial growth.

It has been proved in some references [5] [6] that a high power density is responsible for a high ion energy impinging on the substrate and causing some surface or even bulk damage. Thus, the twin defects present in our films are most probably caused by the application of a high power density. However, to obtain a fivefold symmetry, it is necessary to have at least three orders of twinning that contribute to 10 spots in the diffraction pattern, i.e, if there only exist two orders of twinning, some additional diffraction spots appear without giving rise to a fivefold symmetry as it is the case of Figure 3. Detailed investigation of the multiple twinning in a fivefold symmetry fashion will be presented.

 

1.      Shechtman, D., et al., Metallic Phase with Long-Range Orientational Order and No Translational Symmetry. Physical Review Letters, 1984. 53(20): p. 1951-1953.

2.      Pauling, L., Apparent Icosahedral Symmetry Is Due to Directed Multiple Twinning of Cubic-Crystals. Nature, 1985. 317(6037): p. 512-514.

3.      Iijima, S., Fine Particles of Silicon. II. Decahedral Multiply-Twinned Particles. Japanese Journal of Applied Physics, 1987. 26(3R): p. 365.

4.      Yang, C.Y., Crystallography of decahedral and icosahedral particles: I. Geometry of twinning. Journal of Crystal Growth, 1979. 47(2): p. 274-282.

5.      Rosenblad, C., et al., Silicon epitaxy by low-energy plasma enhanced chemical vapor deposition. Journal of Vacuum Science & Technology A, 1998. 16(5): p. 2785-2790.

6.      Ohmi, T., et al., Study on further reducing the epitaxial silicon temperature down to 250 °C in lowenergy bias sputtering. Journal of Applied Physics, 1991. 69(4): p. 2062-2071.


Farah HADDAD (Palaiseau), Prabal GOYAL, Ronan LÉAL, Junegie HONG, Erik JOHNSON, Pere ROCA I CABARROCAS, Jean-Luc MAURICE
08:00 - 18:15 #6696 - MS01-581 Optimisation of the FIB induced damage in TEM diamond samples.
MS01-581 Optimisation of the FIB induced damage in TEM diamond samples.

Due to diamond extreme properties, it is very hard to prepare a TEM sample from diamond using traditional methods of preparation including mechanical thinning, ion milling or chemical etching. At the same time diamond can be relatively easily micro-machined using focused ion beam (FIB) technique. Using this technique a cross-sectional TEM sample of diamond can be prepared in a few hours. Also, combination of ion implantation and FIB milling allows device fabrication in diamond at micro and nano scales levels. In the last decade FIB milling became essential tool for TEM sample preparation as well as for nanofabrication in diamond. However, Ga FIB milling has an unavoidable result in formation of the damage layers which can significantly reduce the device working areas and limit the applications of the FIB technique for nanofabrication of diamond. The damage layers in the FIB prepared TEM diamond samples can also significantly aggravate the quality of high-resolution imaging. So, the knowledge of the extent of damage induced in diamond during FIB milling is critical for nanofabrication as well as for TEM imaging. In this work the damage layers after FIB milling of the synthetic single crystal diamond at different ion beam energies were studied using high-resolution and analytical electron microscopy.

TEM image of cross-section of TEM lamella prepared using 30 keV Ga FIB milling is shown in Fig. 1.  Amorphous layer with thickness ~ 16 nm are clearly visible on both sides of TEM lamella. EELS measurements of the carbon K-edge in the amorphous region shows a prominent feature at 285eV, the p* peak associated with the presence of sp2 bonding. This indicates the conversion of diamond sp3 bonds to sp2 in the amorphous damage area. Electron energy loss spectrum image was taken in STEM mode from central part of cross-section of TEM lamella shown in Fig.1. Using Gatan Digital Micrograph software the chemical maps for sp2 and sp3 bonded carbon were obtained. Fig.2 shows maps for features of carbon K-edge at 285 eV (sp2) and 290 eV (sp3 bonding). It is visible from Fig. 1, 2 that TEM lamella prepared from diamond using 30 keV FIB milling contained ~ 20 % of amorphous sp2 bonded carbon. In case of thinner lamellas (60 nm) prepared using 30 keV FIB milling the fraction of amorphous sp2 bonded carbon increases to ~50%.

The thickness of damage layers with sp2 bonded carbon in TEM diamond samples can be reduced by using low voltage FIB milling. Fig.3 and Fig. 4 show the HREM images of damage layers in diamond after 30 keV and 2 keV FIB milling. The thickness of amorphous damage layers reduced from 16 to less than 2 nm. Thus, very thin TEM diamond samples with low fraction of amorphous sp2 bonded carbon could be prepared by using 2 keV FIB milling at final stage of TEM lamella preparation.

 

Acknowledgments

 This work was supported by the Australian Research Council under Linkage Infrastructure, Equipment and Facilities program (LE 130100090).


Sergey RUBANOV (Melbourne, Australia)
08:00 - 18:15 #6697 - MS01-583 Analytical STEM study of sintered polycrystalline c-BN materials for cutting tool applications.
MS01-583 Analytical STEM study of sintered polycrystalline c-BN materials for cutting tool applications.

Cubic boron nitride (c-BN) is the second hardest material next to diamond with high thermal conductivity but better chemical stability than diamond, therefore, it is widely used in the form of sintered polycrystalline cubic boron nitride (PCBN) for cutting tools in machining of hardened steel, cast irons and super alloys showing high chemical stability when abraded by ferrous materials at high temperature. Commercial PCBN cutting tools are classified into two types, firstly  low c-BN content composites containing  typically 40 -70 vol%  c-BN with ceramic binders such as TiN and TiC, and secondly high c-BN content PCBN containing about 75–95 vol% of c-BN with Al and other metallic binders in addition. PCBN materials designed for mild to medium interrupted hard part turning (HPT) applications have been produced by using different raw materials and sintering conditions. These PCBN materials have been investigated by SEM and XRD for microstructure and phase information and XRF for the overall chemical composition.  It was observed that, for some of the PCBN material, there was a discrepancy between the elements detected as well as their measured quantity by XRF and the phases identified by XRD. Advanced analytical STEM was applied  for an in depth characterization of the complex microstructures formed in those PCBN materials with grain size ranging from sub-micrometer down to a few nanometers. The aim of this study was to increase the understanding of the relationship between raw material selection, processing conditions, and machining performance. The raw material selection, milling and sintering operations play a crucial role in the solid state phase diffusion processes which governs what phases are formed and how these constituents bond to each other and, thus, the mechanical behaviour. To be able to capture the light and heavy elements present in the microstructure, elemental maps were acquired in a CS corrected Titan3 60-300 kV (FEI Company) equipped with ChemiSTEM and DualEELS capabilities. Figure 1 depicts elemental maps of two PCBN materials produced by different methods of Al processing showing greatly differing microstructures.  In Fig. 1a, the Al appears to have flowed well and coated the c-BN interphases forming a continuous binder phase, mainly consisting of AlN.  It appears that almost all of the AlN phase is connected to c-BN.  Whereas in Fig. 1b, the Al phases are much less continuous, but still coat most of the c-BN.  Most of the Al appears to be in discrete aluminium oxide phase. To be able to determine all reaction products and phases present advanced TEM and STEM techniques had to be applied due to the small and overlapping grains. The results presented are of importance to further improve machining performance by tailoring the microstructure by carefully selecting the initial raw material and processing conditions.


Jacob PALMER, Martina LATTEMANN (Stockholm, Sweden), Ernesto CORONEL, Arno MEINGAST, Larry DUES, Rachel SHAO, Gerold WEINL
08:00 - 18:15 #6716 - MS01-585 HR(S)TEM, EELS and Raman spectroscopy analysis of a LCMO and PCMO films.
MS01-585 HR(S)TEM, EELS and Raman spectroscopy analysis of a LCMO and PCMO films.

Interplay between charge, orbital and magnetic orderings in perovskitemanganitesR1-xAxMnO3 (R – rare earth, A – alkaline element) is of fundamental interest to describe electronic correlations in transition metal oxides. In particular, the overdoped systems with x > 0.5 are a part of the phase diagram that is less explored as compared to the underdoped manganites (x~0.3), where colossal magnetoresistance is observed. Until now, the overdoped manganites were studied manily as the polycrystalline pellets or powders. Here we report on the study of highly doped heteroepitaxial La0.25Ca0.75MnO3/MgO films grown by metalorganic aerosol deposition (MAD) technique on MgO(100) substrate. Cross-sectional and plan-view TEM specimens were prepared by mechanical polishing followed by Ar+ ion milling.

TEM studies reveal that the La0.25Ca0.75MnO3 film consisted of domains with three different orientations (Fig. 1) described by epitaxial relationships with respect to the MgO substrate as: 1) [001]MgO||[010]LCMO and [100]MgO||[10-1]LCMO; 2) [001]MgO||[-101]LCMO and [100]MgO||[010]LCMO; 3) [001]MgO||[-101]LCMO and [100]MgO||[101]LCMO. The domain interfaces are CaO layers as revealed by atomic resolution STEM imaging and EELS measurements (Fig. 2). These defects cause the appearance of streaks visible in the ED patterns.

Upon the cooling down to the temperature below 140K the material demonstrates a structural transition manifested by the elongation of diffraction spots (marked in Fig. 3 with arrows)  and appearance of crosses along [10-1]* and [010]* directions in the selected area diffraction patterns taken from plan-view specimens (see, for example, selected spot in Fig.3). These changes evidence the formation of charge-ordered (CO) domains, however their size is rather small due to the presence of numerous defects and compositional variations. The CO transition is also visible in the Raman spectra, which were recorded in four different polarizationconfigurations as shown in Fig.3. Three additional lines pop up at 521cm-1, 646 cm-1 and 707 cm-1 and the P21/m structure can be identified as a new emerging structure when the sample undergoes CO-transition.

As a reference system we have also studied heteroepitaxial thin films of Pr0.65Ca0.35MnO3 deposited on single crystalline SrTiO3 substrates by sputtering deposition technique. Upon cooling this model system undergoes a phase transition to the CO state, which has been extensively studied, e.g. [1,2]. This CO state is revealed by the appearance of 2a and 2c superstructure reflexes in the diffraction pattern, and two emerging peaks at 650 cm-1 and 709 cm-1 which can be seen (Fig. 4) when the temperature falls below CO-transition temperature.

Thus, besides the electron diffraction experiments Raman spectroscopy can also be used as a powerful tool to visualize CO-transitions that are often accommodated by structural transitions.

 

We would like to thank M. Abrashev for very helpful discussions regarding the measured Raman intensity and twinning of the Pnma structure. F. F. and V.M. acknowledge funding from DFG Project DR 228/36. We also are thankful for funding from DFG Sonderforschungsbereich 1073 (TP B02, B04).

 

 

[1] Jooss et al., Proc. Natl. Acad. Sci. U. S. A.2007,104, 13597–13602

[2] Wu et. al., Phys. Rev. B 2007, 76, 174210


Vladimir RODDATIS (Göttingen, Germany), Florian FISCHGRABE, Sebastian MERTEN, Benedikt IFLAND, Vasily MOSCHNYAGA, Christian JOOSS
08:00 - 18:15 #6810 - MS01-587 Transmission electron microscopy study of defects generated during chemical vapor deposition diamond lateral growth.
MS01-587 Transmission electron microscopy study of defects generated during chemical vapor deposition diamond lateral growth.

Synthetic diamond is one of the most promising materials for high power devices due to its extraordinary physical properties, such as high thermal conductivity (22 W/cm K, 4 times that of Cu), electric breakdown field (>10 MV/cm), and carrier mobility (mn =1000 cm2/Vs, mp = 2000 cm2/ Vs). Moreover, 3D architectures, i.e. lateral growth, allowed the use of vertical geometries for the design of such devices, in addition to other advantages such as higher miniaturization, distribution of the electric field and reduction of technology steps and costs. In fact, in the quest for power electronic devices sustaining ever higher reverse blocking voltages and forward currents, buried heavily boron doped (p+) diamond layers have been shown recently [1] to reduce markedly the on-state resistance (Ron) of pseudo-vertical crystal diamond Schottky diodes. Such advanced designs rely on an improved control of selective 3D overgrowth of dry etched mesa and trenches [2].

Here, MPCVD diamond overgrowth on patterned-etched diamond substrate is demonstrated to be highly selective depending on the methane concentration. This can be very useful for the design of 3D engineered semiconducting devices such as p-n junctions. However, some growing conditions are shown to generate defects (dislocations, planar defects…). In addition, boron doping is also shown to induce the generation by a proximity strain related mechanism [3] of another type of defects. Mesa structures were fabricated by reactive-ion etching (RIE) on masked substrates. Overgrowth was performed by microwave induced plasma chemical vapor deposition (MPCVD). A stratigraphic approach of heavily boron doped layers and undoped ones allows to follow the “history” of the growth, in the vicinity of mesa patterns [4], thanks to further cross section TEM observations. The latter identify and distinguish between extended defects generated by: (i) the boron inclusion, (ii) the strain related to the mesa-step and (iii) the growth conditions.

Defects are studied using dark field (DF) and weak beam DF (WB) in diffraction contrast modes on focused ion beam lamellas. From the invisibility criterion,  and  families of Burger vectors have been identified. Based on the position of this defects respect the MESA structure, their origin is identified to be: (i) edge and threading dislocations with  type of Burger vector are favorably generated by the boron doping while (ii) planar defects with  type of Burger vector are highly influenced by the strain accumulated in the corner of the step generated by the mask before the overgrowth.

In addition, multilayer doping allows identifying the regions of different growth orientation in the mentioned stratigraphic approach. Susceptibility of dislocation generation by boron proximity effects respect to the surface growth orientation is well revealed in such growth geometrical design where several growth orientations have to coexist at the same time. Higher density of type (i) of defects where obtained in closer planes as (111). Finally, the role of the methane concentration in the generation of extended defects will be discussed.

 

 

[1]            A. Traoré, P. Muret, A. Fiori, D. Eon, E. Gheeraert, and J. Pernot, Appl. Phys. Lett. 104, 052105 (2014).

[2]             K. Sato, T. Iwasaki, Y. Hoshino, H. Kato, T. Makino, M. Ogura, S. Yamasaki, S. Nakamura, K. Ichikawa, A. Sawabe, and M. Hatano, Jap. J. Appl. Phys. 53, 05FP01 (2014).

[3]             M.P. Alegre, D. Araújo, A. Fiori, J.C. Pinero, F. Lloret, M.P. Villar, P. Achatz, G. Chicot, E. Bustarret, and F. Jomard, Appl. Phys. Lett. 105, 173103 (2014).

[4]            F. Lloret, A. Fiori, D. Araujo, E. Eon, M.P. Villar, and E. Bustarret, Appl. Phys. Lett. , to be published.


Fernando LLORET (Puerto Real, Spain), Daniel ARAUJO, David EON, M. Pilar VILLAR, Etienne BUSTARRET
08:00 - 18:15 #6811 - MS01-589 STEM-EELS investigation of planar defects in olivine.
MS01-589 STEM-EELS investigation of planar defects in olivine.

Iron is an abundant element in meteorites, where it is contained in various forms such as metal, oxides, silicates or sulfides. In these materials, investigation of the oxidation state of transition metal elements and Fe in particular is an indicator of the environmental conditions during the meteorite formation and evolution. The detailed quantification of the element distribution, concentration variation and the structure of defects are important for understanding the formation and transformation stages. Therefore the correlative investigation of defects structure and oxidation state variation within a meteoritic material at the atomic level can be essential to the understanding of the distinct formation mechanisms.

In this context, the current study focusses on the detailed investigation by STEM-EELS coupled to HAADF imaging of planar defects in Fe-rich olivine (Mg,Fe)2SiO4, present in the Allende meteorite [1]. The nature of the planar defects in olivine is still controversial in the literature: it can be associated to a deformation mechanism [2] or can be due to an aqueous alteration episode [3]. HAADF images of two types of planar defects, present in the Allende meteorite are given in Fig. 1 (a) and (b). Both planar defects are parallel to (100) planes of the olivine. The thicker ones, Fig. 1(a), are Cr-rich as seen on the EELS spectra given in Fig. 2. STEM-EELS mapping reveals an enrichment of Fe at the interface between the thick Cr-rich defects and olivine. The Fe-L3,2 ELNES structures do not seem to indicate any change of the oxidation state in this Cr-rich defect. The thinner (100) defects, Fig. 1(b), are associated to considerable Fe enrichment and Mg depletion over 2 to 4 atomic planes. Even though these thinner defects are often linked to the Cr-rich defects, they do not contain Cr. The analysis of the atomically resolved Fe-L3,2 fine structure reveals the appearance in certain cases of a change of oxidation state of iron and partial Fe3+ state within the thin Fe-rich planar defects. This study gives an important insight on the structure of planar defects in the olivine and the associated change of the Fe oxidation state. Based on this fine structure analysis, a possible formation mechanism constraining the evolution of the environment redox condition will be proposed.  

  

References

[1] H. Palme, B. J. Fegley, Earth and Planetary Science Letters (1990), vol. 101, p. 180–195.

[2] L. P. Keller, Meteoritics and Planetary Science (1998), Vol. 33, p. A83.

[3] Khisina, R. Wirth, S. Matsyuk, M. Koch-Müller, Eur. J. Mineral. (2008) vol. 20, p. 1067.

Acknowledgement

The CEA-METSA network is acknowledged for financial support. The TEM national facility in Lille (France) is supported by the Conseil Regional du Nord-Pas de Calais, the European Regional Development Fund (ERDF), and the Institut National des Sciences de l’Univers (INSU, CNRS).


Maya MARINOVA (Villeneuve d'Ascq), Priscille CUVILLIER, Alexandre GLOTER, Damien JACOB, Hugues LEROUX
08:00 - 18:15 #6821 - MS01-591 The microstructure of ZnSnO and its correlation to electrical and optical properties.
MS01-591 The microstructure of ZnSnO and its correlation to electrical and optical properties.

Over the last years, the interest in the field of transparent conductive oxides (TCOs) has grown dramatically due to their wide applicability and improved properties that may be reached when incorporating these materials into devices. TCOs are mainly used in the industry of low-emissivity windows, flat panel displays, light emitting diodes and photovoltaics [1]. For photovoltaic applications, the main purpose of TCOs is to let light enter into the solar cell and to extract the electric charges allowing them to be drifted towards the electric contacts. Therefore, it is necessary for these materials to be as transparent and as conductive as possible [2]. Ideally, TCOs should be indium-free, as indium is scarce and hence expensive [3]. The goal is therefore to optimize a material that is earth-abundant, low-cost and with good electrical and optical properties. As many steps in photovoltaic device fabrication require a high temperature, a crucial requisite for TCOs is also thermal stability.

Based on these criteria, an amorphous compound of Zn-Sn-O (ZTO) deposited by sputtering was selected for the present study [4]. The microstructure of ZTO is known to strongly influence its electrical and optical properties, as well as its thermal stability. In that regard, transmission electron microscopy (TEM), in situ X-ray diffraction (XRD) experiments and conventional electrical and optical characterization were performed to assess the links between annealing treatments, ZTO microstructure and optical and electrical properties. 

First, samples were annealed in air, in an oven up to 150 and 500 °C and then investigated by transmission electron microscopy. While electrical and optical properties were measured to change significantly upon annealing, no major microstructural change was observed in TEM images. In situ theta-2theta XRD experiments were then performed by increasing the temperature up to 1000-1200°C in air and vacuum. Substrates resistant to these temperatures were employed, namely fused silica and sapphire. Different heating rates were used, ranging from 3°C/min up to 10°C/min. The XRD results (Fig.1) demonstrate that the amorphous phase is stable up to >500 °C when annealed in air and > 900 °C when annealed in 10-4 mbar, hence highlighting a strong influence of the annealing atmosphere on the crystallisation temperature. Rutile SnO2 is the first phase to crystallize and remains the main crystal structure observed throughout the whole process, with Al2ZnO4 forming at higher temperatures as a result of an interaction between the TCO layer and the sapphire substrate. Electrical properties were measured to decrease after annealing, with TEM measurements demonstrating that Zn migration at high temperature leads to the formation of a defective crystalline structure (Fig.2). This effect is more severe when annealing in air when compared to vacuum conditions. Indeed, the presence of oxygen in the surrounding atmosphere facilitates the formation of crystalline SnO2, a process that repeals  Zn atoms to grain boundaries and surfaces of the TCO layer (Fig.3). On the other hand, the formation of crystalline SnO2 and the release of zinc are both delayed when annealing in vacuum. In general, crystallisation and Zn evaporation are observed to be detrimental to the electrical properties as it leads to the formation of voids in the structure. On a technological level, the high thermal stability of the defect-free amorphous ZTO microstructure in oxygen-poor atmospheres may enable its application in high efficiency photovoltaic architectures. 

References:

[1] R.G. Gordon, "Criteria for Choosing Transparent Conductors," MRS Bulletin 25, 52 (2000)

[2] A.J. Leenheer, J.D. Perkins, M. Van Hest, J.J. Berry, R.P. O’hayre and D.S. Ginley, “General mobility and carrier concentration relationship in transparent amorphous indium zinc oxide films”, Physical Review B 77, 115215 (2008)

[3] European Commission, “Report on critical raw materials for the EU” (2014)

[4] M Morales-Masis, F Dauzou, Q Jeangros et al., “An Indium-Free Anode for Large-Area Flexible OLEDs: Defect-Free Transparent Conductive Zinc Tin Oxide” Advanced Functional Materials 26 (2016)


Federica LANDUCCI (Lausanne, Switzerland), Quentin JEANGROS, Esteban RUCAVADO, Carole SPORI, Monica MORALES-MASIS, Christophe BALLIF, Cécile HÉBERT, Aïcha HESSLER-WYSER
08:00 - 18:15 #6838 - MS01-593 Finding pinholes in carrier selective polycrystalline Si / crystalline Si contacts: like a needle in a haystack.
MS01-593 Finding pinholes in carrier selective polycrystalline Si / crystalline Si contacts: like a needle in a haystack.

Reducing surface recombination is a key factor in the race for high efficient silicon-based solar cells. One solution is the use of carrier selective contacts, which have been investigated extensively by several groups in the last years [1]-[5]. Even though polycrystalline (poly-)Si/SiOx/crystalline (c‑)Si junctions were subject of research decades ago for use in bipolar transistors [6]-[7] there are still different point of views about the physical principles of current transport in these junctions [8],[2]. Besides tunneling, current transport through pinholes is discussed [2]. It was already shown that high fractions of oxide disruptions lead to inferior electrical properties [5]. However, as stated in the model [2], only pinhole densities as low as 8 × 105 to 3 × 109 cm-² are needed to describe the current flow / the junction resistance correctly.

Analyzing such hole densities in poly-Si/SiOx/c‑Si junctions is very difficult. If we assume, that the existence of holes leads to an increased diffusion of dopants from the poly-Si into the c-Si we can indirectly prove the existence by measuring the local dopant concentration. However, methods like electrochemical capacitance-voltage profiling or secondary ion mass spectrometry show the averaged distribution of dopants in a larger area and can only be used to compare different samples qualitatively. Conductive AFM is possible in general but it is not suitable for our samples due to the high transverse conductivity of the highly doped poly-Si of about 150 nm thickness. We have to remove or at least drastically reduce the thickness of the poly-Si, but therefore an etch process with a high selectivity ratio to SiO2 with a thickness well below 2 nm is needed. Even when all these issues are solved, we don’t get detailed information about hole diameter (expected to be around 5 nm [2]) and structure of the oxide around these holes. These questions can be answered by TEM, but the probability of finding holes with densities that low is very small. However, proving the existence of holes in the oxide by TEM for samples with good electrical results would be the first step of proving that current through poly-Si/SiOx/c‑Si junctions is not only related to tunneling.

In this paper we investigate the influence of annealing temperature on the structural properties of in situ boron doped p+-poly-Si/SiOx/c-Si interfaces after annealing at temperatures between 800 °C and 1050 °C. We analyze the evolution of holes for 1.7 nm thin wet-chemically grown SiOx in comparison to thermally grown oxide using high resolution TEM and compare our findings to electrical results.

We confirm that a massive break-up of the oxide leads to poor electrical properties. Additionally, we prove the existence of pinholes in a sample with wet-chemically grown oxide annealed at 800 °C showing good electrical results with an emitter current density J0e as low as 41 fA/cm2. These results indicate a certain area fraction of pinholes is not in contradiction with good passivation properties of  poly‑Si/SiOx/c‑Si junctions. The flow of charge carriers through these pinholes possibly poses an important current transport mechanism besides the superposed tunneling in the region in which the interfacial oxide is still intact.

 

References

[1]   U. Römer et al., IEEE Journal of Photovoltaics 5 (2015) 507-514.

[2]   R. Peibst et al., IEEE Journal of Photovoltaics 4 (2014) 841-850.

[3]   S.W. Glunz et al., 31st European Photovoltaic Solar Energy Conf. and Exhibit., Hamburg, Germany, 2015.

[4]   A. Cuevas et al., 42nd IEEE Photovoltaic Specialist Conference (2015), 1-6.

[5]   A. Moldovan et al., Solar Energy Materials and Solar Cells 142 (2015) 123-127.

[6]   H. C. de Graaff and J. G. de Groot, IEEE Transactions on Electron Devices 26 (1979) 1771-1776.

[7]   A. A. Eltoukhy and D. J. Roulston, IEEE Transactions on Electron Devices 29 (1982) 1862-1869.

[8]   H. Steinkemper et al., IEEE Journal of Photovoltaics 5 (2014) 1348-1356.


Dominic TETZLAFF (Hannover, Germany), Jan KRÜGENER, Yevgeniya LARIONOVA, Sina REITER, Mircea TURCU, Nils FOLCHERT, Robby PEIBST, Uwe HÖHNE, Jan-Dirk KÄHLER, Tobias WIETLER
08:00 - 18:15 #6849 - MS01-595 A Study of Heavy Ion Irradiation-Induced Segregation at Grain Boundaries in Alloy 800H.
MS01-595 A Study of Heavy Ion Irradiation-Induced Segregation at Grain Boundaries in Alloy 800H.

Environmentally-Assisted Cracking (EAC) of  structural components in a nuclear reactor core of light water reactors (LWRs) and water-cooling systems in fusion reactors is of concern in that it can directly influence on the safety of a nuclear reactor.  Previous studies showed that one of the many factors that governing the EAC of a structural component is the changes of the chemical composition of the grain boundaries of the material used after exposed to neutron radiation [1].  This phenomenon is also known as irradiation-assisted stress corrosion cracking (IASCC). The changes of the chemistry of grain boundaries induced by irradiation, i.e. radiation-induced segregation (RIS), and the increase in irradiation-induced defects can promote hardening of the material, thereby affecting the resultant mechanical and environment-sensitive behaviour.  With long-term (~80 years) reactor operation under consideration for power generation, Alloy 800H is one of the candidate alloy systems that may be used in the next generation advance light water nuclear energy system [2].  One of the reasons for this choice is that Alloy 800H is code-certified for high temperature (up to 760 ᵒC) use in nuclear power systems [3].  Also, the high Ni and Cr concentrations in the alloy provide good resistance to void swelling and corrosion in light water environments [4].

 

In this study, RIS in ion-irradiated Alloy 800H was investigated.  A commercial grade Alloy 800H was subjected to simultaneous Fe++ and He++ ion-beam irradiation to simulate the effect of neutron irradiation-induced segregation.  The alloy was irradiated to a dose of 16.6 dpa at temperature of 440ᵒC using the facility at University of Michigan Ion Beam Laboratory, Ann Arbour, Michigan.  The microstructural characterisation was performed using a spherical aberration-corrected FEI Titan G2 80-200 with Super X EDX (ChemiSTEM™) operated at 200kV and equipped with a GIF Quantum 965 EELS to provide independent compositional analyses of the intergranular segregation induced during ion irradiation.  Scanning transmission electron microscopy (STEM) – Electron Energy Loss Spectroscopy (EELS) analyses show that the grain boundaries in Alloy 800H are enriched with Ni, Si and Ti after irradiation, as shown in Figure 1. Fe and Cr depletion was also detected at the same grain boundary, as shown in Figures 2 and 3. Apart from that, a denuded zone with no chemical-related irradiation-induced defects decorating along the grain boundary was observed.  However, diffraction contrast imaging shows that a high number density of the irradiation-induced dislocation loops was observed along the grain boundary. This observation and its implications for the alloy will be further discussed.

 

References & Acknowledgement:

[1] K. Fukuya et. al., Role of Radiation-Induced Grain Boundary Segregation in Irradiation Assisted Stress Corrosion Cracking, Journal of Nuclear Science and Technology, (2004), Vol, 41, No. 5,

[2] U.S. DOE Nuclear Energy Research Advisory Committee and the Generation IV International Forum, A Technology Roadmap for Generation IV Nuclear Energy Systems, 2002.

[3] K. Natesan et. al., 2003, “Materials Behaviour in HTGR Environments,” ANL-02/37 and NUREG/CR-6824.

[4] F.A. Garner and A.S. Kumar, in: Radiation-Induced Changes in Microstructure: 13th International Symposium (part I), in: F.A. Garner, N.H. Packan, A.S. Kumar (Eds.), ASTM STP, 955, ASTM, Philadelphia, 1987, p. 289.

[5] ACKNOWLEDGE EPSRC grant and G. Was for providing the ion-irradiated specimens.


Joven Jun Hua LIM (Manchester, United Kingdom), M Grace BURKE
08:00 - 18:15 #6866 - MS01-597 Study the microstructure of three and four component phases in Al-Ni-Fe-La alloys.
MS01-597 Study the microstructure of three and four component phases in Al-Ni-Fe-La alloys.

Aluminium alloys play a key role in modern engineering since they are the most used non-ferrous material. They have been widely used in automotive, aerospace, and construction engineering due to their good corrosion resistance, superior mechanical properties along with good machinability, weldability, and relatively low cost. The progress in practical application has been determined by intensive research and development works on the Al alloys. A new class of Al–REM–TM aluminum alloys (REM indicates rare earth metal and TM is transition metal) was revealed in the end of the last century. These alloys differ from conventional ones by their extraordinary ability to form metal glasses and nanoscale composites in a wide range of compositions. Having low density, these alloys possess unique mechanical characteristics and corrosion resistance. Two as received alloys, namely Al85Ni9Fe2La4 and Al85Ni7Fe4La4 were obtained in the form of ingots from melts of corresponding compositions upon cooling in air were studied by scanning/transmission electron microscopy (STEM), energy dispersive X-ray (EDX) microanalysis and X-ray diffraction (XRD). The microstructural analyses were performed in a aberration corrected TITAN 80-300 TEM/STEM (FEI, USA) attached with EDX spectrometer with ultrathin window (EDAX, USA). The specimens for transmission electron microscopy (TEM) were prepared by an electrochemical or ion etching. It was found that the received alloys exhibits along with fcc Al and Al4La (Al11La3) particles, these alloys contain a ternary phase Al3Ni1 ⎯ хFeх isostructural to the Al3Ni phase and a quaternary phase Al8Fe2 ⎯ хNiхLa isostructural to the Al8Fe2Eu phase and monoclinic phase Al9(Fe,Ni)2 isostructural to the Al9Co2. The study by HRSTEM together with a new atomic resolution energy dispersive X-ray microanalysis method demonstrated that Fe and Ni atoms substituted one another in the Al8Fe2-хNiхLa quaternary compound. Besides, several types of defects were determined: first ones have a form of a δ -layers and they are Al3.2Fe1-хNix ternary compound with a Al3.2Fe structure type. Second ones were point defects, which are La vacancies.

The experimental part of this work was partially done on the equipment of the Resource Center of Probe and Electron Microscopy (Kurchatov Complex of NBICS- Technologies, NRC "Kurchatov Institute")


Natalia KOLOBYLINA (Moscow, Russia), Alexander VASILIEV, Sergey LOPATIN, Mikhail PRESNIAKOV, Natalia BAKHTEEVA, Anna IVANOVA, Elena TODOROVA
08:00 - 18:15 #6921 - MS01-599 TEM of microstructures and lattice bending formed in thin Sb film with thickness gradient.
MS01-599 TEM of microstructures and lattice bending formed in thin Sb film with thickness gradient.

Thin-film Sb-based phase-change materials (PCMs) are widely used for memory devices that utilize amorphous-crystalline transitions in local areas. Microstructures of Sb thin films are of special interest since Sb films are known for fast crystallization rates [1], including “explosive” crystallization (more known and studied for Si and Ge films). In this paper we study the role of film thickness and use bend-contour technique [2] for crystal misorientation studies [3] (supported by local thickness estimates). It was out of focus for several dozens of papers devoted to the Sb crystallized thin films.

Sb thin films were evaporated in vacuum on mica substrates covered by thin evaporated carbon film to provide initial amorphous structure. Since thin-film crystallization strongly depends upon thickness we use masks to obtain strong thickness gradients (about 40 nm per film length 1 mm). The film separated from the substrate and placed on TEM grid are studied using TEM, SAD, STEM, SEM, EDX in JEM-2100 (80Kv and 200 Kv). Bend contours are indexed with the help of bright and dark fields and indexed electron diffraction patterns. Measured distances between bend contours and ZAPs are used for estimates of lattice bending, while measurements of fine structure of some strong contours in dark fields add estimates of film thickness.

The final microstructures give indications of initial amorphous structure. The crystallization starts at the thicker area and stops at the thinner areas, Fig. 1 a, where labyrinthine and islands microstructures are observed. SADs of these areas demonstrate superposition of amorphous hallo and single crystalline orientation. The spot pattern usually does not change while moving aperture several microns around. The amorphous hallo outside crystallization front does not include any crystal spots. Going from thinner area to the thicker one, Fig. 1 c-d-e-f, along the thickness gradient one can trace in TEM the increase of density of amorphous islands finally resulting in labyrinthine microstructure. In parallel the spread of island sizes decreases from 0-20nm to around 40 nm and their density increases twice from ~250/µm2.

More or less prominent bend contours (Fig. 1 b) or similar weak contrast (Fig. 1 a) are observed everywhere in crystalized areas. Similar but not analyzed bend contour patterns were published earlier in some TEM studies of Sb films (see e.g. [1, 4]). Going from thinner area to the thicker one in the areas of entire film along the thickness gradient, Fig. 1 g-h-i-j, we calculate essential decrease of lattice planes bending (around axes lying in the film plane) in the range from most strong values, 120 degrees per µm, to ~ 10 degrees per µm. We suppose that this lattice bending can be attributed to the “transrotational” structure revealed and proved earlier for other thin-film crystals of different chemical nature and preparation conditions [3]. Both maximal values and film thickness dependence of transrotation correspond to those studied earlier for some other substances [5]. The microstructure texture reminding parquet drawing is also observed (in the regions of intermediate thickness) with subgrain sizes: width 0,1 - 1 µm, length 2-10 µm and above. The lattice orientation texture is also revealed with preferred orientations [0 0 1], [-1 1 1], [1 2 -1]. There are other details of lattice orientation texture observed along the crystal grains and thickness gradient. 

The nature of transrotation, unusual phenomenon for crystal growth in amorphous films, is discussed.

References

[1] J. Solis; C.N. Afonso, Appl. Phys., 2003, A76, 331-338

[2] I.E. Bolotov, V.Yu. Kolosov, Phys. Stat. Sol., 1982, 69a, 85-96.

[3] V.Yu. Kolosov, A.R. Thӧlen,. Acta Mater., 2000, 48, 1829–1840.

[4] H. Müller, Phys. Stat. Sol. 1982, 70a, 249-255.

[5] V.Yu. Kolosov et al., Semiconductors, 2005, 39, 955-959.

Supported by RF Ministry Education & Sci. (No. 1362), Program 211 of RF Government (No. 02.A03.21.0006).


Vladimir KOLOSOV (Ekaterinburg, Russia), Anton YUSHKOV, Lev VERETENNIKOV, Ilya POLOGOV
08:00 - 18:15 #6923 - MS01-601 Electron microscopy characterization of the wear of textured α-Al2O3 and κ-Al2O3-TiN multilayer coatings for cutting tool applications.
MS01-601 Electron microscopy characterization of the wear of textured α-Al2O3 and κ-Al2O3-TiN multilayer coatings for cutting tool applications.

In metal cutting applications, coatings are often applied onto cemented carbide inserts as wear and heat resistant protection layers extending the tool life. A commonly used coating on inserts is Al2O3 which provides chemical stability, thermal and wear protection for the cemented carbide insert. The crater wear and plastic deformation behavior in certain applications can be improved by altering the phase and/or texture of the wear protective coating.  Worn (0001)-textured α-Al2O3 and κ-Al2O3-TiN multilayer coatings on inserts which had been used in cutting applications have been investigated by means of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDXS), XRD, electron backscatter diffraction (EBSD) in the SEM and (scanning) transmission electron microscopy ((S)TEM) techniques. The microstructure of the α-Al2O3 coating can be seen in the SE-SEM image and its (0001)-texture is shown in the EBSD orientation map, see Fig. 1a and b. The specimens for (S)TEM characterization were prepared in a Helios NanoLab 650 instrument (FEI Company) equipped with an EBSD detector (NordlysMax2, Oxford Instruments), EDXS detector (X-MaxN, Oxford Instruments) and AZtec software package (Oxford Instruments). (S)TEM characterization was performed using a Titan3 60-300 equipped with ChemiSTEM (FEI Companay). (S)TEM characterization of the worn α-Al2O3 coating revealed a modified region and EDXS elemental maps showed that this region contains Mg, Ca and Si beside the Al and O, see Fig. 2. Also, small grains of Fe were observed below this modified region.  For comparison, (S)TEM characterization was performed on the worn κ-Al2O3-TiN multilayer coating. By determining the elemental distribution and formed phases the chemical wear mechanisms can be described.


Ernesto CORONEL (Stockholm, Sweden), Arno MEINGAST, Babak RABIEI, Jeanette PERSSON, Martina LATTEMANN
08:00 - 18:15 #6938 - MS01-603 Structural and chemical analysis of topologically close packed (TCP) phases in high generation Ni-based superalloy.
MS01-603 Structural and chemical analysis of topologically close packed (TCP) phases in high generation Ni-based superalloy.

The investigated material belongs to the new generation single crystal Ni-base superalloy family. These kind of alloys exhibit excellent high-temperature creep strength as well as oxidation and corrosion resistance [1,2]. However, due to high content of refractory elements the microstructural stability can be strongly affected by precipitation of topologically close packed (TCP) phases. [3,4] The morphology, structure type as well as chemical composition of TCP phases can significantly vary and depend on alloy’s composition and applied heat treatment. It is expected that TCP phases growth from gamma matrix, which is mainly composed of Ni, Re, Co, Ru and Cr in high generation Ni-based superalloys. For this reason the tested material was subjected to long term aging at high temperature and investigated at different states of TCP phase evolution. The aim of the study is to understand the process of TCP phase precipitation including identification of nucleation sites, the chemical composition and structure type determination at different stages of heat treatment.

     The microstructural imaging was performed using transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM) and scanning electron microscopy (SEM). The chemical analysis was accomplished by energy dispersive X-ray (EDX), and the TEM lamella were cut by focused ion beam (FIB) technique.

     The results were obtained from two samples which come from the parent material. The material was subjected to standard heat treatment procedure consisting of homogenization and a two step aging treatment followed by long term exposure at high temperature. Sample 1 was derived from the initial state of long term exposure, while sample 2 was obtained from the equilibrium state of TCP phase precipitation.

     Analysis of the microstructure of the 2 samples shows distinct differences between the states. The microstructure of the initial stage of long term exposure exhibits only few TCP precipitates in the early stage of precipitation, while in sample 2 the extensive formation of TCPs with plate-like morphology was observed. To fully understand the process of TCP precipitation the determination of nucleation sites is essential. Figure 1 presents a high magnification bright field STEM image taken from sample 1. In this figure it is clearly seen, that TCP starts to nucleate within a gamma channel. After long-term exposure, gamma, gamma prime as well as TCP phases strongly evolved, what is shown in Figure 2. This figure presents the equilibrium stage of TCP precipitation. It was also shown, that gamma prime phase changed its morphology from regular cubic (beginning of exposure) to rafted irregular shape (after long term exposure). In case of TCP precipitates not only the number, but also their size strongly increased. Consequently, it is expected that a change of creep and fatigue strength will occur with a changing microstructure morphology.

     The selected area diffraction analysis performed in TEM allowed to identify the structure type of individual phases as well as determination of lattice parameter change during thermal exposure. Moreover the EDX measurements showed tendency to strong segregation of Re and Ru elements into TCP phase at the expense of gamma matrix. All microstructural investigations combined with EDX chemical analysis resulted in evaluation of TCP precipitation process at the structural and chemical aspects.

 

    

References:

[ 1] A.F. Giamei and D.L. Anton, “Rhenium Additions to a Ni- base Superalloy: Effects on Microstructure”, Metal1 Tram 16A, (1985), 1997-2005.

[ 2] K. Harris, G.L. Erickson, S.L. Sikkenga, W. Brentnall, J.M. Aurrecoechea and K.G. Kubarych, “Development of the rhenium-containing superalloys CMSX-4 & CM186LC for single crystal blade and directionally solidified vane applications in advanced turbine engines”, Suuerallovs, ed. S.D. Antolovitch et al., (Warrendale, PA, USA, 1992), 297-306.

[ 3] A.K. Sinha, “Topologically Close-Packed Structures of Transition Metal Alloys”, Progress in Material Science, (1972), 79-185.

[ 4] C.M.F. Rae, M.S.A. Karunaratne, C.J. Small, R.W. Broomfield, C.N. Jones, and R. Reed, “Topologically Close Packed Phases in an Experimental Rhenium–Containing Single Crystal Superalloy,” Superalloys 2000, ed. T.M. Pollock et al., (Warrendale, Pa: TMS, 2000), 767-776.


Roman SOWA (Gniewczyna, Poland), Magdalena PARLINSKA-WOJTAN
08:00 - 18:15 #6954 - MS01-605 Examination of semiconducting properties of oxides in the vicinity of metal-oxide interfaces for selected alloys.
MS01-605 Examination of semiconducting properties of oxides in the vicinity of metal-oxide interfaces for selected alloys.

Radovan Vanta1, Sousan Abolhassani1, Shiv Ashish Kumar2, Massoud Dadras2, Adrienn Baris1, Guillaume Boetsch3, Harry Brandenberger4, Andreas Rummel5

1 Laboratory for Materials Behaviour, Paul Scherrer Institut, 5232 Villigen-PSI, Switzerland, 2 Service of Microscopy and Nanoscopy, IMT, University of Neuchâtel, Neuchâtel, Switzerland, 3 Imina Technologies SA, EPFL Innovation Park, Bâtiment E, 1015 Lausanne, Switzerland, 4 Gloor Instruments AG,  Schaffhauserstrasse 121, 8301 Kloten, Switzerland, 5 Kleindiek Nanotechnik GmbH, Aspenhaustr. 25, 72770 Reutlingen, Germany,

This paper provides a brief overview of the studies performed on semi-conducting properties of oxides and the change of these properties, for specific materials. A direct method is developed to measure the properties of the oxide by means of micromanipulators, in the SEM.

The interest of this method is to evaluate the role of such change of properties in the vicinity of interface of metal-oxides and to correlate the properties to the oxidation behavior and also to the hydrogen uptake of the alloy.

In a previous study the properties of a material has been measured by means of micromanipulators, outside of the microscope. This study has been performed in the SEM. The present study reports the properties of two families of alloys. It shows that an alloy with a sub-stoichiometric oxide in the vicinity of the interface has a lower resistivity.  The method consists of using a fine micromanipulator installed in the SEM; a surface is created by FIB micromachining and the measurements are made by means of the micromanipulators inside the SEM, in this manner an accurate positioning is possible.

As it can be observed in Figure 1, the oxide in alloy Zr2.5%Nb is sub-stoichiometric near the metal oxide interface [1]. Figure 2 presents the results of measurements of the Zr2.5%Nb and low-tin Zircaloy-4. The results of measurements and the comparison of the two alloys show that the second alloy having a stoichiometric oxide does not show such variation in resistivity in the vicinity of the metal-oxide interface. The results will be discussed to confirm the role of the different properties of the oxide, on the oxidation behavior.

Acknowledgements: Mr. Andrej Bullemer (AHL) and Dr. Elisabeth Müller (EMF) are acknowledged for the assistance for sample preparation.

Reference: [1] Abolhassani, S., Bart, G., and Jakob, A., “Examination of the Chemical Composition of Irradiated Zirconium Based Fuel Claddings at the Metal/Oxide Interface by TEM,” J. Nucl. Mater., Vol. 399, 2010, pp. 1–12.


Radovan VANTA, Sousan ABOLHASSANI, M DADRAS (Neuchâtel, Switzerland)
08:00 - 18:15 #6962 - MS01-607 Microstructural and chemical characterization of the system CaO–Al2O3 using environmental scanning electron microscopy (ESEM).
MS01-607 Microstructural and chemical characterization of the system CaO–Al2O3 using environmental scanning electron microscopy (ESEM).

The calcium and alumina oxide is a highly interesting functional materials. In the binary compound 12CaO·7Al2O3 has a unique crystal structure as a nano-sized cage with free oxygen anions randomly distributed inside the cages. C12A7 has gained much attention for potential applications in various fields, such as ion conducting solid electrolyte, field and ion emitters, oxidizing catalyst and as a transparent conductive oxide (TCO) in flat panel displays, solar cells and energy conservation (smart windows) devices [1, 2]. The functional properties of electrides are strongly depend on the microstructure. There is in the literature some information about the influence of specific surface area and impurities of alumina on the sintering behaviour of an alumina material. But in this study, the objective is to determine if the various processing techniques have an influence on the microstructure evolution of materials made from alumina and calcium oxide.

Post-fabrication C12A7 samples were subjected to heat treatment using different processing methods in order to achieve desired crystal structure. The final products were prepared by sintering (1) and melted in an electric furnace (2). Crystalline and amorphous phases were obtained.

The aim of the present study was to evaluate the microstructure of CA ceramics under different melting conditions. The microstructure characteristics were analyzed by means of optical microscopy (OM), X-ray diffraction (XRD), energy dispersive X-ray spectroscopy (EDXS) and environmental scanning electron microscopy (ESEM).

For scanning electron microscopy (SEM) examination, sintered specimens were cut and polished. ESEM allows the direct examination of specimens without a conductive metallic coating. The application of ESEM could have advantages in the study of ceramic samples due to a reduction in preparation time. The microstructures of bulk materials were observed before and after sintering, and the effect of solution processing parameters and the formation of surface defects was studied. Microstructural differences were observed for the same composition materials under the different processing conditions (Fig. 1). The morphological and compositional properties of the final C12A7 samples are highly affected by their structure and crystallisation.

References

  1. S. W. Kim, Y. Toda, K. Hayashi, M. Hirano, H. Hosono, Chem. Mater., 18 (2006) 1938
  2. L. Palacios, A. G. De La Torre, S. Bruque et al. , Inorg. Chem., 46 (2007) 4167

Acknowledgement

This work was financially supported by grant of the National Science Centre SONATA 8 2014/15/D/ST8/02630.


Katarzyna BERENT (Krakow, Poland)
08:00 - 18:15 #6964 - MS01-609 Discovery of pyridinic nitrogen defects and single atom spin in graphene.
MS01-609 Discovery of pyridinic nitrogen defects and single atom spin in graphene.

Nitrogen is one of the most important doping elements for carbon materials. N doping was reported to enhance the catalytic ability of carbon materials and can improve the oxygen reduction reaction efficiency. Besides, the N doped graphene are also anticipated for several applications such as n-type transistor, sensor or lithium battery. Distinct N configurations, i.e., graphitic N and pyridinic N, have been predicted to behave different electronic properties. Therefore, to precisely control the type of N doping is considered a critical issue to realize high performance graphene-based devices. Though X-ray photoelectron spectroscopy (XPS) analysis suggests distinct N 1s states for different N configuration, however, the direct link to the specific N defect is still limited by the spacial resolution. Here, we present systematic studies of atomic structures and the atomic EELS studies on graphitic N and pyridinic N defect in graphene by scanning transmission electron microscopy [1]. Figure 1a and 1b show the ADF images and the corresponding atomic models of graphitic and pyridinic N defect in graphene. The energy loss near-edge structures of the graphitic N and pyridinic N defects are shown in Figure 1c. The graphitic N K-edge shows two sharp peaks at 401.4 eV (π*) and 407.6  eV (σ*), while the π* and σ* peak of pyridinic N exhibits significant down shift to 398.0 eV and 406.6 eV.

 

Pyridinic N defects are also found highly reactive to attract individual single transition metals (TM) to the defect sites. The spin state of single TM atoms in graphene defect was studied by core-level electron spectroscopy. Figure 2a and 2b show the ADF images of single Fe atoms anchored at graphene divacancy and at the four pyridinic N defects. We found that the single Fe atom possess high spin at graphene divancacy, while the spin state can be altered to low spin when bonding to pyridinic N (Figure 2c). This work realize the controllable of spin state of an individual TM atom which can be regarded as the smallest component of spintronic devices [2].

 

 

Reference

  1. Y. C. Lin et al., Nano Lett. 15, 7408-7413 (2015).
  2. Y. C. Lin et al., Phys. Rev. Lett. 115, 206803 (2015).

 


Yung-Chang LIN (Tsukuba, Japan), Kazu SUENAGA
08:00 - 18:15 #7040 - MS01-611 Advanced Microstructure Characterization of β Ti-Nb-Ta-Fe Alloys obtained by Powder Metallurgy.
MS01-611 Advanced Microstructure Characterization of β Ti-Nb-Ta-Fe Alloys obtained by Powder Metallurgy.

In order to obtain advanced biomaterials, with low elastic modulus and acceptable mechanical strength titanium alloys with high contents of refractory materials are used. The addition of niobium, tantalum and molybdenum difficult the manufacturing processes of these alloys. One way to obtain these β-Ti alloys is the powder metallurgy (P/M) that allow obtaining of customized materials. Although it presents intrinsic limitations, such as porosity, lack of diffusion and the increasing of grain size with sintering parameters. The objective of this work was the microstructure characterization of phases and mechanical properties of Ti35Nb10Ta alloy with Fe additions, using transmission electron microscopy (TEM) and selected area electron diffraction (SAD). The distribution of phases and grain orientation maps were determined with an Automatic Crystal Orientation Mapping (ACOM) system installed in a FEI Tecnai F20 TEM with LaB6 gun. An ASTAR NanoMegas system was used for ACOM diffraction data acquisition. The analyzed map step was 10 nm based on a rectangular grid (400 x 200 pixels). The identification of phases and orientations are obtained through image matching between experimental diffraction patterns and calculated templates. The microstructure obtained is composed mainly by β-Ti phase (bcc) in β-stabilizers rich areas (Nb, Ta, Fe), and α+β phase´s region confirmed in TEM image (Fig. 1.a and 1.c) and SAD with orientation relationship ([0001]a// [110]β) in β-stabilizers poor areas (Ti rich). The a-Ti (hcp) phase occurs mainly along the grain boundaries, growing inwards. In between it is possible to identify metastable w phase in nanometric scale, confirmed by TEM image (Fig. 1.b) and by spots with orientation relationship with β-Ti matrix in the SAD zone axis [11-20]w//[1-10]β (Fig. 1.d). Fig. 2 shows ACOM image of Ti35Nb10Ta alloy sintered at 1250ºC with virtual bright field (BF) combined with Reliability of α+β region (Fig. 2.a) and (b) PhaseMap combined with Virtual-BF image of β (red) and α (green) region (Fig. 2.b). β-Ti phase is mainly observed, with some α+β regions (β-stabilizer poor elements concentration) and higher β-Ti stabilization with Fe addition and sintering temperature. Nanometric ω phase was observed inside β-Ti phase using TEM analysis. TEM and ASTAR provide complementary information both on phase constitution and orientation distribution in nanosized α phase precipitated inside β-stabilizer poor regions.


Conrado Ramos Moreira AFONSO (São Carlos - SP, Brazil), A. M. AMIGÓ, V.b. AMIGÓ
08:00 - 18:15 #7068 - MS01-613 Multi-technique approach to study the corrosion of plasma assisted surface treatments of 316L stainless steel.
MS01-613 Multi-technique approach to study the corrosion of plasma assisted surface treatments of 316L stainless steel.

Different plasma assisted methods can be used to nitriding, carburizing, carbonitriding or to produce a coating over stainless steels. In order to preserve their excellent corrosion resistance is important to  control  these  processes  parameters,  avoiding  the  chromium  depletion of  the  steel  matrix, produced  mainly  due  to longer  process  time  and/or higher temperatures.  This  work  has  the  aim  to analyze  the  corrosion  morphology  and  behavior  under  certain  test  conditions  using  different characterization methods. For  assessing  the  corrosion  resistance,  cyclic  potentiodynamic  anodic  tests  have  been  done.  A three electrodes cell has been used, where the counter electrode is a platinum wire, the reference electrode is a saturated calomel electrode and the treated surface sample is the working electrode. When  the  current  density  reach  an  arbitrary  value  of  200 mA/cm2,  the  potential  is  registered  as E200,  and  the  potential  is  swept  in  reverse  direction.  This E200 value is used as a parameter  of comparison,   obtaining   the   highest  values for   those   samples   with   the   thickest   modified   layers.   The morphology  observed  for  the nitrided  and  carburized AISI  316L  samples, consists  in  pits  located below  the  modified  layer,   and originated  in  some  non-metallic  inclusions present in the "as received" alloy.  SEM/FIB microscopy was used to identify and characterize this behavior. At present, there are  some  points  of  interest  under  research.  The  interphase  between  the modified layer  and  the  steel  seems  to  be  a  preferable  site  for  pits  to  nucleate and  grow.  Atomic probe  microscopy,  TEM  as  well  as  EBSD  were  used  to  identify  possible  chemical  and  structural singularities in that place. The connection between the interphase and the electrolyte is produced by  channels  originated  in   the inclusions,  but  not  all  of  them  nucleate  the  attack.  Different kind of inclusions have been observed and identified using TEM and EBSD.


L ESCALADA, A.s. GASCO OWENS, F. SOLDERA, M. ÁVALOS, S BRÜHL, S SIMISON (Mar del Plata, Argentina)
08:00 - 18:15 #6299 - MS02-615 Atomic Scale in-situ Studies of Catalytic Reactions between Iron Clusters and Single-walled Carbon Nanotubes.
MS02-615 Atomic Scale in-situ Studies of Catalytic Reactions between Iron Clusters and Single-walled Carbon Nanotubes.

Atomic Scale in-situ Studies of Catalytic Reactions between Iron Clusters and Single-walled Carbon Nanotubes

Kecheng Cao(1), Johannes Biskupek (1), Thomas W. Chamberlain(2), Andrei N. Khlobystov (2) and Ute Kaiser (1)

(1) Electron Microscopy of Materials Science, Central Facility for Electron Microscopy, Ulm University, Albert Einstein Allee 11, Ulm 89081, Germany

(2) School of Chemistry, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom

 

Metal nanoparticle catalysts play an important role in the field of catalytics. Understanding the reaction between metal nanoparticles (MNPs) and carbon at the atomic scale contributes to the design of highly efficient catalysts. Single-walled carbon nanotubes (SWNTs) with the characteristics of heat resistance, cleanness and transparency areideal nano-test tubes for MNPs to study their catalytic properties in-situ. Moreover, with the aid of the powerful aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM), several kinds of MNPs are filled into SWNT and have been investigated their reactions with SWNT.The transition metals are varied along groups as well as periods of the periodic table of elements, and characterized systematically to track their interactions with the electron beam and the carbon special environment1-4. Among them, Os and Ni nanoparticles exhibit the ability of cutting SWNT under electron beam irradiation2, 3. But iron nanoparticles with Fe3C structure are much more stable that no significant reactions are observed between Fe3C and SWNT4.

In this study we present in-situ irradiation experiments of sub-nanometer sized α- Fe clusters enclosed in SWNTs by means of low-voltage AC-HRTEM. The Fe nanoparticles show different structure to the previously published experiments on Fe3C nanoparticles4, and are observed to be unstable under e-beam irradiation at 80 kV. In our experiments, the particular technique of HRTEM combines imaging tool and irradiation source in one integral experiment. Here, SWNTs are initially filled with Fe3(CO)12 molecules and then irradiated by election-beam with acceleration voltage 80 kV in TEM. α- Fe nanoparticles are obtained in the lumen of SWNTs. Being irradiated, α- Fe nanoparticles keep changing shape and restructuring the geometric construction of SWNT and ultimately cut it into two parts. Additional experiments regarding the stability under e-beam irradiation at much lower voltages down to 20 kV will be carried out to study influences of knock-on damage and ionization effects. Figure 1 shows a time series of the cutting process. . Thus we confirm that two kinds of clusters, α- Fe nanoparticle and Fe3C can be obtained by breaking the Fe3(CO)12 molecules in SWNT and they exhibits distinct catalytic activities that Fe3C is stable but α- Fe nanoparticle can cut SWNTs. The experiments were conducted using a CS-corrected FEI Titan 80-300 operated at 80 kV. The dose rate was 1.4*106 e-/s*nm2 and the exposure time was 1.0 second.

[1] Thilo Zoberbier et.al. J. Am. Chem. Soc. 134, 3073−3079 (2012)

[2] Thomas W. Chamberlain et.al. Chem. Sci. 3, 1919–1924 (2012)

[3] Irina V. Lebedeva et.al. Naoscale, 6, 14877-14890 (2014)

[4] Thilo Zoberbier et.al. Small, DOI: 10.1002/smll.201502210 (2016)

Acknowledgment

We gratefully acknowledge the support of the “Graphene Flagship”, DFG SPP “Graphene”, the DFG and the Ministry of Science, Research and the Arts (MWK) of Baden–Wuerttemberg within the frame of the SALVE ( Sub Angstrom Low-Voltage Electron Microscopy ) project, ERC Consolidator Grants and EPSRC and NUST "MISiS" (grant K3-2015-030) for financial support.

 


Kecheng CAO (ULM, Germany), Johannes BISKUPEK, Thomas W. CHAMBERLAIN, Andrei N. KHLOBYSTOV, Ute KAISER
08:00 - 18:15 #6314 - MS02-617 In-situ TEM study of the formation of the smallest possible fullerenes on metal surfaces.
MS02-617 In-situ TEM study of the formation of the smallest possible fullerenes on metal surfaces.

The nucleation and growth of carbon on catalytically active metals is one of the most important techniques to produce a large variety of graphenic nanomaterials. The most prominent species that have been grown on metals by vapor or solid phase deposition are graphene and carbon nanotubes. Small closed cages such as fullerenes have hardly been observed to nucleate catalytically on metal surfaces. The formation of fullerene molecules, in particular under realistic growth conditions is difficult to observe at high spatial resolution. The smallest possible fullerene is C20 which is a dodecahedron composed of 12 pentagons. This molecule with exteme curvature is in a hybridization state between sp2 and sp3. Until now, only few studies reported the synthesis of C20 due to its instability and high reactivity. Isolated cages of C20 haven’t been observed to date by electron microscopy.

Here we report the nucleation and growth of spherical carbon cages, some of them corresponding to the smallest possible fullerenes starting with approximately the size of C20, on metal surfaces [1]. The experiments were carried out in-situ in a transmission electron microscope (TEM) by using a heating stage. The samples were prepared on few-layer graphene suspended on standard Cu grids for electron microscopy. Different transition metal layers (Co, Fe, Ru) with thickness of 5 nm were deposited by cathodic sputtering onto the graphene layers. After an initial heating and cooling cycle of the samples, small carbon cages appeared on the graphene layers around the periphery of metallic nanoparticles. Fig.1 shows schematically how the experimental procedure was carried out. A series of examples for the observed structures is shown in Fig. 2. The contrast of these circular features closely resembles the appearance of C60 in TEM images. However, the diameter of most of the observed cages ranges between 0.35 and 0.4 nm which is clearly smaller than the diameter of C60 (0.7nm). No isolated cages were observed; the small cages always appeared as aggregates and in many cases as an ordered arrangement, in particular when the cages were encapsulated by a graphenic shell. The prerequisite for the nucleation of the cages was an uncovered metal surface. The cages persist after cooling to room temperature. In order to identify the elemental composition and the bonding states of the observed cages, electron energy-loss spectra with a monochromated electron beam were taken at energy resolution of 0.2 eV. To relate the observed contrast in the TEM images to fullerene-like clusters, image simulations were carried out by using the EMS (Electron Microscope Simulator) simulation program. Polymerized and unpolymerized C20 were simulated. Fig. 3 shows the calculated appearance of the aggregate of three C20 molecules on a monolayer of graphene. The observations are in accordance with the simulated images of polymerized C20 molecules.

The nucleation of the cages occurs by the dissolution of carbon in the metal at high temperature and the diffusion through the bulk, followed by the segregation on the surface upon cooling. Since the C20 cages are less stable than larger fullerenes, their formation should be driven by kinetics under non-equilibrium conditions. Due to their large curvature and inherent reactivity, the cages tend to polymerize.


[1] F. Ben Romdhane, J. A. Rodríguez-Manzo, A. Andrieux-Ledier, F. Fossard, A. Hallal, L. Magaud, J. Coraux, A. Loiseau, F. Banhart. "The formation of the smallest fullerene-like carbon cages on metal surfaces", Nanoscale, 2016, 8, 2561.


Ferdaous BEN ROMDHANE (STRASBOURG CEDEX), Julio A RODRÍGUEZ-MANZO, Amandine ANDRIEUX-LEDIER, Frédéric FOSSARD, Ali HALLAL, Laurence MAGAUD, Johann CORAUX, Annick LOISEAU, Florian BANHART
08:00 - 18:15 #6323 - MS02-619 Characterization of nanodispersed graphite in mesoporous carbon for supercapacitor applications.
MS02-619 Characterization of nanodispersed graphite in mesoporous carbon for supercapacitor applications.

Starbon®, a family of mesoporous carbonaceous materials, was recently developed at the University of York from polysaccharides (e.g. starch) [1,2]. The novelty and the advantages of these materials include cheap, green and renewable sources, low temperature carbonization processing, avoidance of harmful chemicals, and a tunability of the surface functionality from hydrophilic to hydrophobic. These properties make Starbon® an ideal candidate for applications in catalysis and material absorption [3]. Recently the tunability of the properties of these materials has been successfully extended to their functional properties by ballmixing it with graphite before the carbonization process. This resulted in an enhanced nanocomposite material (see picture) that adds to the porosity of the mesoporous carbon the conductivity of the graphite nanoflakes. This material shows promising characteristics as electrode material in electrochemical double layer capacitors (EDLC or supercapacitor). Here we present an Electron Microscopy study of this enhanced composite material, by combining Electron Diffraction, Electron Energy Loss Spectroscopy and Aberration Corrected TEM/STEM Imaging in correlation with the physical and transport properties exhibited by the materials as electrodes for supercapacitors including I-V curves, Galvanostatic charge-discharge curves and charge retention measurements.


References:
[1] P. S. Shuttleworth, A. Matharu, J. H. Clark, in Polysaccharide Building Blocks, John Wiley & Sons, Inc., 2012, pp. 271285.
[2] V. Budarin, J. H. Clark, J. J. E. Hardy, R. Luque, K. Milkowski, S. J. Tavener, A. J. Wilson, Angew. Chem.Int. Edit. 2006, 45, 37823786.
[3] R. J. White, V. Budarin, R. Luque, J. H. Clark, D. J. Macquarrie, Chem. Soc. Rev. 2009, 38, 34013418.

Acknowledgments: P.S. gratefully acknowledges the Spanish Ministry, Economy and Competitivity  (MINECO) for the concession of a Ramón y Cajal fellowship and a proyecto de I+D+I para jóvenes investigadores  (MAT2014-59674-JIN).


Leonardo LARI (York, United Kingdom), Zlatko NEDELKOSKI, Peter SHUTTLEWORTH, Gary ELLIS, Vitaliy BUDARIN, James CLARK, Vlado LAZAROV
08:00 - 18:15 #6395 - MS02-621 Colloidal Quantum-Dot Heterostructures Studied Using Aberration-Corrected Scanning Transmission Electron Microscopy.
MS02-621 Colloidal Quantum-Dot Heterostructures Studied Using Aberration-Corrected Scanning Transmission Electron Microscopy.

Complex colloidal semiconductor quantum- dot heterostructures, such as core/shell or core/crown nanoplatelets, can now be readily synthesized [1-4]. Such heterostructures significantly enhance the optical properties of the colloidal quantum dots. The optical properties of these colloidal quantum dots depend not only on the morphology of the heterostructure – i.e. the size and shape of the core-, but, more importantly on the chemical nature and the presence of a composition gradient at the heterostructure interfaces, and on the elastic deformation inside the quantum dots that is due to a lattice mismatch between the core and shell/crown materials. The study of these heterostructures through aberration-corrected Scanning Transmission Electron Microscopy (STEM) provides access to their structure down to the atomic scale. High Angle Annular Dark Field STEM images, in particular, provide direct access to the atomic structure of the nanoparticles, and through the contrast of the atomic columns ("Z-contrast” images) to their chemical nature. Therefore, atomic resolution STEM images allow one possible to precisely map the strain fields of the heterostructure. Finally, chemical information accessed through the Z-contrast can be correlated to quantitative STEM-EDX with a spatial resolution of 1 nm. The present talk summarizes such studies conducted on CdSe/Cd(Zn)S core/shell [1,2], and core/crown CdSe/CdS [3,4] and CdSe/CdTe nanoplatelets.

 

References:

[1] Core/Shell Colloidal Semiconductor Nanoplatelets
B. Malher, B. Nadal, C. Bouet, G. Patriarche, B. Dubertret
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 134 (2012) 18591-18598

[2] Colloidal CdSe/CdS Dot-in-Plate Nanocrystals with 2D-Polarized Emission
E. Cassette, B. Mahler, J.-M. Guigner, G. Patriarche, B. Dubertret, T. Pons
ACS NANO 6 (2012) 6741-6750

[3] Efficient Exciton Concentrators Built from Colloidal Core/Crown CdSe/CdS Semiconductor Nanoplatelets
M. D. Tessier, P. Spinicelli, D. Dupont, G. Patriarche, S. Ithurria, B. Dubertret
NANO LETTERS  14 (2014) 207-213

 [4] Type-II CdSe/CdTe Core/Crown Semiconductor Nanoplatelets
S. Pedetti, S. Ithurria, H. Heuclin,  G. Patriarche, B. Dubertret,
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 136 (2014) 16430-16438


Gilles PATRIARCHE (MARCOUSSIS), Konstantinos PANTZAS, Silvia PEDETTI, Michel NASILOWSKI, Mickael TESSIER, Elsa CASSETTE, Benoit MALHER, Benoit DUBERTRET
08:00 - 18:15 #6457 - MS02-623 Van der Waals heterostructures of MoSe2 and graphene studied by transmission electron microscopy.
MS02-623 Van der Waals heterostructures of MoSe2 and graphene studied by transmission electron microscopy.

       Two dimensional layered transition metal dichalcogenides (TMDs) have attracted much attention for future electronics and optoelectronics due to their unique semiconducting features [1]. Nonetheless their properties are strongly influenced by the structural and chemical atomic arrangement in these atomically thin layers. The control and understanding of the atomic structure of synthesized TMD monolayers are thus crucial to exploit the potential properties predicted and/or to be newly discovered. In addition, compared to graphene which is a mono-atomic planar structure, the structural and chemical configuration of the TMD materials can have a lot of variations and it can be a way to tune their semi-conducting features. For instance, a ternary mixture such as MoxW1-xS2 and vertical/horizontal heterostructures between TMD structures with different chemical components or with other layered structures such as graphene and boron nitride can open the possibility of unique architectures [2]. In particular, vertical heterostructures are promising building blocks for novel semiconducting future materials because these layers have no surface dangling bond and vertically stacked layers are connected with van der Waals (vdW) forces. This allows to create atomically sharp interface with a desired structure design down to single atomic layered scale. Today a lot of efforts have been made to fabricate vdW heterostructures [3].

       In this work, vdW vertical heterostructures of MoSe2 and graphene are studied using a transmission electron microscopy (TEM). The vdW stacks are fabricated by two step growth process. First graphene is grown by conventional CVD technique on Pt substrate, then followed by MoSe2 growth via vdW epitaxy by Molecular beam epitaxy (MBE) technique in another reactor. The direct growth approach presents various interests compared to the manual stacking, such as clean interface and large surface production. In addition, using as grown CVD graphene, the obtained stack layers can be easily transferred on appropriate substrates. The synthesized MoSe2/graphene layers are studied from micron down to atomic scale by several TEM techniques mainly using Low Voltage Aberration Corrected (LVAC) TEM in order to understand the growth mechanism of the vdW epitaxy by MBE and the correlation between grown MoSe2 layer and graphene substrate. Using (S)TEM techniques, abundant information on synthesized structures can be provided. Local number of layers can be determined by several STEM techniques such as STEM HAADF imaging (Figure 1) and PACBED (Partially averaged convergent beam electron diffraction) [4]. Domains in graphene and MoSe2 layers were independently recognized together with their local orientation using diffraction information, which allowed to study the local structural relationship between MoSe2 and graphene substrate. Figure 2 shows a TEM image of stack layer and the orientation of MoSe2 and graphene is determined by Fourier transform shown in the inset. MoSe2 layers are often grown oriented to graphene with small range of misorientation 0 to 5°. The edge of MoSe2 monolayer are observed along the zig-zag line of graphene in the case of non-continuous MoSe2 monolayers. In addition, typical line defects are observed in a continuous domain (Figure 3a). This line defect consists of a symmetrical mirror structures (Figure 3b and 3c) [5], considered to be related to the stoichiometry control during the growth. Local chemical quantitative analysis by energy dispersive X-ray spectroscopy (EDX) was also applied on MoSex in order to exploit the sensitivity of the measurements, which will be a powerful method applicable at multi scale to predict various defect structures influencing their stoichiometry. Finally the MoSe2 layers grown on CVD graphene with different experimental conditions were characterized using TEM and STEM based techniques. The influence of process parameters on the atomic configuration such as line defects are studied and the crystal mosaicity in MoSe2 monolayer related to graphene substrate will be discussed by local structural analysis with a theoretical support.

References

[1] Splendiani et al., Nano Lett. 10 (2010) p1271

[2] A. Geim et al., Nature 499 (2013) p419

[3] N. Massicotte, Nature Nanotechnology 11 (2016) p42

[4] Thesis of Y. Martin ; University Joseph Fourier, Grenoble France, 2014

[5] Lehtinen et al., ACS Nano 9 (2015) p3724


Hanako OKUNO (GRENOBLE CEDEX 9), Tuan DAU MINH, Eric ROBIN, Alain MARTY, Helene LE POCHE, Pascal POCHET, Matthieu JAMET
08:00 - 18:15 #6473 - MS02-625 Identifying and Mapping the Polytypes and Orientation Relationships in ZnO / CdSe Core Shell Nanowire Arrays.
MS02-625 Identifying and Mapping the Polytypes and Orientation Relationships in ZnO / CdSe Core Shell Nanowire Arrays.

  Core shell ZnO nanowire (NWs) heterostructures have emerged, over the past decade, as a potential building block for a large variety of nanoscale optoelectronic devices, including self-powered UV photodetectors, dye-sensitized solar cells (DSSCs), and extremely thin absorber (ETA) solar cells. These heterostructures benefit from a high absorption over the UV and visible parts of the electromagnetic spectrum through sophisticated optical processes (i.e., optically guided and radiated modes). In this work, we focused on ZnO / CdSe core shell  NW heterostructures. The ZnO NWs are typically grown by chemical bath deposition on top of a ZnO seed layer deposited by sol-gel process and strongly oriented along the polar c-axis, but with no in-plane orientation. Then, the growth of the CdSe shell was performed by molecular beam epitaxy.

  CdSe is known to crystallize into the two following polytypes: cubic zinc blende (ZB) and hexagonal wurtzite (WZ). Identifying the different polytypes of CdSe by standard characterization techniques, such as x-ray diffraction (XRD) and selected area electron diffraction (SAED) using transmission electron microscopy (TEM), as well as Raman scattering, is complicated in the present case. Both the ZB and WZ crystalline phases have very similar properties: most of the diffraction peaks and phonon modes of the ZB crystalline phase are located very closely to those of the WZ crystalline phase; similarly, the bang gap energy of both crystalline phases is almost identical. In addition to the identification of the different polytypes and potential epitaxial relationships, the spatial information on the local scale through mapping is of great interest, but requires the use and development of advanced TEM-based experiments.

  In order to address these issues, the morphology and structural properties of ZnO / CdSe core shell NW heterostructures are thoroughly investigated by field-emission gun scanning electron microscopy (FEG-SEM), XRD, Raman spectroscopy, TEM-HRTEM (Figure 1) and ASTAR  (Automated crystal phase and orientation mapping in TEM). We show the strong interest in ASTAR for identifying and mapping the different polytypes of the CdSe shell , but also for revealing the occurrence of orientation relationships with the ZnO NWs, as shown in figure 2.

 

ACKNOWLEDGEMENTS 

 

This work was partially supported by the Nanosciences Foundation of Grenoble through the project II-VI Photovoltaic and by the Carnot Institute Energies du Futur through the project CLAPE. Electron microscopy was performed at the CMTC characterization platform of Grenoble INP supported by the Centre of Excellence of Multifunctional Architectured Materials "CEMAM" n°ANR-10-LABX-44-01 funded by the "Investments for the Future" Program.  This work was also supported by the Spanish Ministry of Economy and Competitiveness under the project MAT2015-71035.


Laetitia RAPENNE (GRENOBLE), Vincent CONSONNI, Gilles RENOU, Hervé ROUSSEL, Lionel GERARD, Edgar RAUCH
08:00 - 18:15 #6506 - MS02-627 Investigations of transition metal dichalcogenides with momentum-resolved electron energy-loss spectroscopy.
MS02-627 Investigations of transition metal dichalcogenides with momentum-resolved electron energy-loss spectroscopy.

Investigations of transition metal dichalcogenides with momentum-resolved electron energy-loss spectroscopy

Michael R. S. Huang, Wilfried Sigle, and Peter A. van Aken

Max Planck Institute for Solid State Research, Stuttgart, Germany

When fast electrons pass through a thin film, various solid-state excitations occur through mutual Coulomb interactions, which convey useful information relevant to the fundamental materials properties. Measurements by momentum-dependent electron energy-loss spectroscopy (q-dependent EELS or ω - q map) directly access the dispersion relation, enabling the physical origins of the intrinsic electronic excitations to be explored [1]. This research is concentrated on anisotropic titanium diselenide (TiSe2), a two-dimensional material in the transition metal dichalcogenide group. The ω - q maps were acquired in the Zeiss sub-electron-volt-sub-angstrom microscope (SESAM), which is equipped with a monochromator and the advanced in-column Mandoline energy filter. To enhance the angular resolution, the specimen was purposely raised above the eucentric height, which significantly extends the effective camera length (ECL) beyond the originally achievable specification [2]. Figure 1 shows the characteristic dispersion of TiSe2 recorded along the momentum transfer parallel to the Γ-K direction. The specific selection of scattering vector in reciprocal space is achieved through a narrow slit well positioned in the filter entrance pupil plane. With further increase of the ECL as well as in the spectral magnification, the details of the dispersion become clearly resolved (Figure 2). Similar to other layer- structured crystals such as graphite or molybdenite (MoS2) [3,4], the two dominant features at approximately 6.5 and 19.7 eV can be interpreted as the π and π + σ plasmons, which stem from the collective oscillations of the π and π + σ valence electrons, respectively. Moreover, another weak spectral feature at a lower energy of about 1.9 eV without significant dispersive behavior was also noticed. This excitation could probably be attributed either to the interband transition or to another plasmon resonance as a result of the negative real part of the dielectric function within this regime. However, more comprehensive investigations are required for clarity.

References:
[1] H. Raether, Excitation of plasmons and interband transitions by electrons, Springer Tracts in Modern Physics, v.88 (1980), Springer, Berlin
[2] P. A. Midgley, Ultramicroscopy 76 (1999), p.91
[3] E. A. Tapt and H. R. Philipp, Phys. Rev. 138 (1965), A197
[4] K. Zeppenfeld, Optic Commun. 1 (1969), p119
[5] The research leading to these results has received funding from the European Union Seventh Framework Program [FP7/2007-2013] under grant agreement no. 312483 (ESTEEM2).

Keywords: transition metal dichalcogenides, dispersion, momentum-resolved EELS 


Huang MICHAEL R. S. (Stuttgart, Germany), Sigle WILFRIED, Van Aken PETER A.
08:00 - 18:15 #6532 - MS02-629 Advanced STEM characterisation of composition controlled MoxW1 xS2 mixed transition metal dichalcogenide alloys grown by chemical vapour deposition.
MS02-629 Advanced STEM characterisation of composition controlled MoxW1 xS2 mixed transition metal dichalcogenide alloys grown by chemical vapour deposition.

Nanoengineering of transition metal dichalcogenides (TMDs) (MX2: M= Mo, W, Nb; X= S, Se, Te) offers exciting new prospects for the production of two‑dimensional nanomaterials with tailored properties1. In particular, single layer TMD alloys, including MoxW1-xSand MoSe2(1-x)S2x (x=0-1), have been shown to have a compositionally modulated electronic structure5,6,7,8, providing a tunable band gap that could be advantageous for new nanoelectronic, optoelectronic or photonic applications. Powders of such nanostructured materials may also offer improved catalytic capabilities due to optimised edge structures9. However, to date, synthesis of these ternary alloys has been limited to exfoliation of flakes from single crystals that are produced by vapour transport using bulk Mo, W, and S5,6 or MoS27, offering limited prospects for large-scale manufacturing in the future. 

Here we investigate composition-controlled MoxW1-xS2 nanoflakes synthesised by atmospheric‑pressure chemical vapour deposition (CVD) using novel Mo and W containing precursors10. Conventional TEM and EDX analysis, supported by complementary XPS, where used to investigate the shape and thickness of the flakes and demonstrates that the W dopant composition can be varied from as little as a few percent (x=0.98), to over 86% (x=0.14). Through atomic-resolution annular dark field scanning transmission electron microscopy (STEM) using a Cs probe corrected JEOL ARM200F we directly observe the substitution of W atoms for Mo atoms within the MoS2 lattice. This confirms the synthesis of alloyed dichalcogenides rather than heterostructures, with W randomly distributed throughout the nanoflakes11. This new method for growth of ternary 2D TMD alloys offers improved composition control for application as industrial catalysts, while opening a new avenue for bandgap engineering of monolayers in the future.

 

  1. A. Ferrari et al, Nanoscale, 7, 4598 (2015)
  2. C. Huang et al, Nature Materials, 13, 1096 (2014)
  3. Y. Gong et al, Nature Materials, 13, 1135 (2014)
  4. X. Duan et al, Nature Nanotechnology, 9, 1024 (2014)
  5. Y. Chen et al, ACS Nano, 7, 4610 (2013)
  6. D.O. Dumcenco et al, Nature Communications, 4, 1351 (2013)
  7. Z. Lin, APL Materials, 2, 092514 (2014)
  8. Y. Gong et al, Nano Letters, 14, 442 (2013)
  9. L.P. Hansen, Angewandte Chemie International Edition, 50, 10153 (2011)
  10. A. Prabakaran, Chemical Communications, 50, 12360 (2014)
  11. A.T. Murdock et al, manuscript in preparation

Adrian MURDOCK, Juan G LOZANO (Oxford, United Kingdom), Arunvinay PRABAKARAN, Frank DILLON, Nicole GROBERT
08:00 - 18:15 #6534 - MS02-631 Structural and chemical characterisation of novel FeS nanostructures for energy storage synthesised using a single-source precursor.
MS02-631 Structural and chemical characterisation of novel FeS nanostructures for energy storage synthesised using a single-source precursor.

Iron sulphide is an interesting material for a wide range of potential applications due to its number of possible phases, high abundance, low cost and non-toxicity [1]. In particular, Fe-S phases are capable of undergoing reversible electrochemical reactions with lithium-ions making Fe-S a potential material for anodes in lithium-ion batteries [2]. Furthermore, by engineering the electrode materials to nanometre scale, there will be (a) a larger surface area of electrode material in contact with the electrolyte per unit mass, allowing a larger flux of Li-ions between the two electrodes, resulting in faster charging and discharging of the battery; (b) shorter diffusion distances of Li-ions which will result in a higher power density; (c) a better accommodation of strain following conversion reactions, thus resulting in longer cycling life. This advantages are even further strengthened if the nanostructures are synthesised in the two-dimensional form, since then the accessible surface area of the materials is dramatically increased. Despite their superior properties, the scarce number of published reports on the synthesis on two-dimensional FeS nanostructures is remarkable [3].

Here we report structural and chemical characterisation of iron sulphide nanoparticles and two-dimensional nanosheets synthesised using a one-pot, fast and facile single source precursor method. This synthesis method offers the possibility of tailoring the design of the nanostructures with slight variations of the synthesis conditions. Conventional transmission electron microscopy (TEM), high resolution TEM, and selected area electron diffraction patterns confirmed that the nanoparticles consisted of high-crystalline quality troilite FeS; while the nanosheets are made of small crystallites with random rotations while still lying on their (0001) basal plane. Scanning-transmission electron microscopy (STEM) and electron energy-loss spectroscopy confirmed that the majority of the crystallites in the nanosheets are troilite FeS, with some residual pyrite also present; and no oxides were formed during synthesis.  Electrochemical tests also indicate that the nanosheets show much larger capacities compared with the nanoparticles.

  1. V. Yufit et al.   Electrochim Acta 50, 417 (2004).
  2. A. S. Aricò et al.  Nat Mater.4, 366 (2005)
  3. X. Rui et al.  Nanoscale 6, 9889 (2014)

Juan G LOZANO (Oxford, United Kingdom), Frank DILLON, Andy NAYLOR, Lok Yi LEE, Chris LIPPARD, Duncan JOHNSTONE, Peter G BRUCE, Nicole GROBERT
08:00 - 18:15 #6536 - MS02-633 Morphology, structure and composition of TiO2-based nanocomposites fabricated by dealloying.
MS02-633 Morphology, structure and composition of TiO2-based nanocomposites fabricated by dealloying.

Abstract:

Nanostructured TiO2 and many titanates are of tremendous fundamental and technological interests for a wide range of applications not only in areas such as catalysis, but also for energy or hydrogen storage because of their unique structure and large surface area [1–3]. TiO2 and titanates in form of nanotubes, nanowires or nanobelts can be fabricated by reaction of raw TiO2 and NaOH [4,5]. Nanostructured TiO2 can also be directly fabricated by dealloying Al-Ti ribbon using a simple and highly efficient corrosion process [6], where the reaction solution is one of the key factors for the morphology and structure of the final product.

In the present work, several TEM techniques are employed to study the morphology, crystal structure and composition of products from Al85at.%-Ti15at.% ribbons dealloyed in NaOH, KOH and HCl solutions. Figure 1, 2 and Table 1 show the analytic results for the dealloyed product in NaOH solution. A polycrystalline layered structure with ~0.75 nm lattice distance is observed (Fig.1). Around 8 at.% Na were identified by EDX analysis of different areas (Table 1). In order to further study the structure of this phase, a radial distribution function (RDF) was calculated based on electron diffraction to provide the distribution of atomic distances and compared to a simulated RDF for crystalline Na2Ti6O13 structure, which shows good agreement (Fig.2a). The determined structure is supported by XRD result in Fig.2b, which shows that this product consists of two compositions, Na2Ti6O13 phase and some anatase TiO2. Multivariate statistical analysis of 2500 EDX spectra of an area of 100 nm × 100 nm is used to image the Na2Ti6O13/TiO2 distribution and electron tomography is used to provide three dimensional (3D) information of the morphology. Comparing the structures fabricated by different dealloying solutions will lead to understand the formation mechanism and to better control nanostructures TiO2-based compounds.

Keywords: TiO2-based nanocomposites, Dealloying, Layer structure.

 

Acknowledgement: Wu Wang is grateful for the financial support of the China Scholarship Council (CSC) for PhD study.

 

References

[1]         Allen MR, Thibert A, Sabio EM, Browning ND, Larsen DS, Osterloh FE. Chem Mater 2010;22:1220.

[2]         Wagemaker M, Kentgens a PM, Mulder FM. Nature 2002;418:397.

[3]         Bavykin D V., Lapkin A a., Plucinski PK, Friedrich JM, Walsh FC. J Phys Chem B 2005;109:19422.

[4]         Kasuga T, Hiramatsu M, Hoson A, Sekino T, Niihara K. Langmuir 1998;14:3160.

[5]         Kasuga T, Hiramatsu M, Hoson a, Sekino T, Niihara K. Adv Mater 1999;11:1307.

[6]         Xu C, Wang R, Zhang Y, Ding Y. Nanoscale 2010;2:906.


Wu WANG (Karlsruhe, Germany), Di WANG, Xiaoke MU, Christian KÜBEL
08:00 - 18:15 #6560 - MS02-635 Direct Observation of CVD Graphene Growth and Related Surface Dynamics of Active Metal Catalysts by In-situ Scanning Electron Microscopy.
MS02-635 Direct Observation of CVD Graphene Growth and Related Surface Dynamics of Active Metal Catalysts by In-situ Scanning Electron Microscopy.

During the last three years, we have modified the set-up of a conventional scanning electron microscope in order to enable the observation of catalyst surface dynamics under controlled atmosphere and temperature. Using this instrument, we investigate chemical vapor deposition (CVD) growth of graphene on different metal catalysts. Since the experiments are performed in the chamber of a microscope, it is possible to observe a complete CVD process from substrate annealing through graphene nucleation and growth and, finally, substrate cooling in real time at nanometer-scale resolution without the need of sample transfer. The nucleation and growth of single layer graphene can be investigated at temperatures of up to 1000°C, while at the same time, surface dynamics of the active metal catalyst can be imaged and directly related to the catalytic activity (Figure 1).[1] Due to the high sensitivity of the secondary electron signal to changes in the work function and charge transfer at the surface, we are able to visualize different degrees of graphene-substrate coupling [2] as well as the stacking sequence of few layer graphene. The in situ SEM image in Figure 2a and the plot in Figure 2b illustrate the step-wise variation of the contrast that allows identification of up to 9 individual graphene layers on platinum substrates, starting with the brightest first layer in contact with the substrate. In addition, the in situ SEM images of edge misalignment between mutual layers and individual sheets provide real-time information on the evolution of the rotation angle between growing layers and formation of the stacking order. The growth behavior of graphene on nickel, copper and platinum substrates shows characteristic differences that are related to the catalytic activity and carbon solubility of the respective catalysts (Figure 3).

In the case of Cu and Pt substrates, we observe grain orientation dependent growth dynamics. Real-time imaging during growth thus allows us to directly visualize and study the catalytic activity of differently oriented surfaces.            
ESEM observations during graphene growth highlight the dynamic nature of catalysts and reveal the sensitive response of the surface to changes in the chemical potential of the gas phase. In situ scanning electron microscopy furthermore covers the spatial resolution of complementary in situ techniques that provide spectroscopic information, such as ambient pressure X-ray and Raman spectroscopy. It completes the spectroscopic data with visual information and spatially resolved chemical dynamics.

 

References:

[1] Zhu-Jun Wang et al., ACS Nano, 2015, 9 (2), 1506-1519

[2] Piran R. Kidambi et al., Nano Lett., 2013, 13 (10), 4769-4778


Zhu-Jun WANG, Gisela WEINBERG, Rober SCHLÖGL, Marc Georg WILLINGER (Berlin, Germany)
08:00 - 18:15 #6581 - MS02-637 Quantative atomic column mapping of oxygen functionalized two-dimensional Ti3C2 MXene sheets.
MS02-637 Quantative atomic column mapping of oxygen functionalized two-dimensional Ti3C2 MXene sheets.

Two-dimensional (2D) materials, in particular MXenes, are growing in interest as a result of exhibiting excellent energy storage capabilities [1]. Prone to intercalation, high surface to volume ratio as well as originating from a large family of laminar compounds, called MAX phases, offers high chemical tunability. The latter grants a high chemical versatility originating from the many possible combinations of transition metal-carbide or transition metal-nitride bonds, providing a wide range a tunable properties [2]. Additionally, surface functionalization, which naturally occurs in MXene synthesis, has been shown to further alter the properties of MXene [3]. MXene synthesis is performed through chemical etching of the nanolaminated MAX structure, resulting in removal of the A layer, which is separating the transition metal-carbide/nitride layers (MX), and the result is 2D MX layers terminated by functional groups originating from of the etching agent. To date, the most frequently studied MXene is Ti3C2, and the etching agent used is HF diluted in water, this leading to OH- and F-termination groups on the MXene [3]. The surface functional groups are identified as disordered after etching [4]. However, effects of thermal treatment of functionalized Ti3C2 has to the best of our knowledge not been directly imaged for single sheets. In order to further understand surface functionalization on MXenes at high temperatures, which is imperative for energy storage, a thermal evolution investigation of single Ti3C2 sheets was performed in an aberration corrected transmission electron microscope (TEM).

 

In this contribution, we present an investigation of reorganization of the surface functionalized groups on Ti3C2 MXene surfaces at high temperatures, employing atomically resolved scanning TEM (STEM) and a high angle annular dark field (HAADF) detector. A powder of Ti3C2 was dispersed in ethanol, ultra-sonicated for 1 minute and subsequently filtered on a heating holder chip. Low dose STEM annealing investigations were carried out using a DENS Solution holder in the double-corrected FEI Titan3 60-300 located in Linköping operating at 300 kV.

 

Fig. 1 shows an atomically resolved STEM image of a single Ti3Csheet at 500 °C. A statistical analysis was performed, effectively mapping out intensities of the atomic columns, as shown in Fig. 2. A basic Rutherford model of the electron scattering was hypothesized and a Z2 intensity dependence was calculated for the atomic columns and possible adatoms, values are shown in Fig. 3a. In Fig. 3b, a colormap is applied on the image in Fig.1, image intensities has been vacuum intensity substracted and normalized to a value defined for a pure Ti+C column. Fig.4 present a structural model of O functionalized Ti3C2 MXene based on the mapping the positions corresponding to relative intensities matching 2O adatoms in the Ti+C column. It is clear from the model that O align on top of a single Ti column forming a large hexagonal lattice, as seen in Fig. 4.

 

[1] Barsoum, M. W. (2000). Progress in Solid State Chemistry 28(1–4): 201-281.

[2] Naguib, M., et al. (2011). Adv. Mater. 23(37): 4248.

[3] Wang, X., et al. (2015). J. Am. Chem. Soc. 137(7): 2715.

[4] Xie, Y. et al. (2014) J. Am. Chem. Soc. 136: 6385.

 

The authors would like to acknowledge the funding support from the Kunt and Alice Wallenberg Foundation (KAW) for funding of the electron microscopy laboratory in Linköping. The authors declare no competing financial interest.


Ingemar PERSSON (Linköping, Sweden), Justinas PALISAITIS, Per PERSSON
08:00 - 18:15 #6590 - MS02-639 Microscopic study of TiO2 nanostructures formed by electrochemical method.
MS02-639 Microscopic study of TiO2 nanostructures formed by electrochemical method.

TiO2 as the material exhibits properties that allow its use in various applications such as photocatalysts, solar cells, gas sensors, and biomedical applications. The typical organic solar cells are produced on transparent conductive layers covered with nanostructured TiO2. The surface roughness is one of the key parameters for high efficiency. In that sense the nanotube arrays offer numerous advantages.

The initial Ti films were deposited by evaporation (Fig 1) or magnetron sputtering. By variation of deposition conditions, different crystal sizes, orientation and grain sizes were obtained. TiO2 nanostructures were formed by anodic oxidation on Ti substrates in ethylene glycol based electrolytes. Anodization parameters (anodization time, applied voltage, amount of added water and ammonium fluoride), were varied during preparation of TiO2 nanostructures. As-prepared TiO2 films were amorphous, while polycrystalline TiO2 anatase phase was obtained after heat treatment. The film structure and crystallinity, before and after annealing, were studied by Raman spectroscopy and grazing incidence X-ray diffraction. Scanning electron microscopy was used to determine the morphologies of prepared anodic films.

The diameter, shape and density of the nanostructures were correlated with the processes parameters. The results indicate that geometric characteristics and morphology of prepared TiO2 critically depend on initial Ti crystal grains sizes as well as anodization conditions (Fig 2).

 

Acknowledgement

This work has been supported by European social fond ESF, Human resources development. This work has been supported in part by Croatian Science Foundation under the project (IP-2014-09-9419).


Kereković IRENA (Zagreb, Croatia), Plodinec MILIVOJ, Juraić KRUNOSLAV, Mandić VILKO, Salamon KREŠIMIR, Meljanac DANIEL, Janicki VESNA, Gracin DAVOR, Gajović ANDREJA
08:00 - 18:15 #6643 - MS02-641 Sn catalysts and Sn dopants for Ge Nanowire Growth.
MS02-641 Sn catalysts and Sn dopants for Ge Nanowire Growth.

Vapor-liquid-solid (VLS) growth of semiconductor nanowires has been extensively studied as an avenue to control composition, crystallinity, strain and doping of nanowires for potential applications in Si device processing. As evidenced by studies of the Ge nanowire/Au catalyst system, an advantage of nanowire growth as compared with bulk synthesis is the generally large departure from equilibrium, which allows for supersaturation and undercooling during growth1,2 and formation of metastable structures and compositions.3,4,5  Non-equilibrium growth also offers possiblities for metastable solute trapping of dopants. Here we show results using Sn both as the growth catalyst, and as a dopant in the nanowires using SnCl4 as the dopant gas. Incorporating Sn into the nanowires offers the possibility of increasing the carrier mobility, and of achieving a direct band-gap for efficient light absorption and emission by pushing the concentration of Sn in Ge beyond the equilibrium value.Fig. 1 shows the morphology and single crystallinity of nanowires grown using Sn as the catalyst. The catalyst, formed by evaporation of thin Sn layers on Ge substrates, produces wires with typical diameters <10 nm and a <110> growth axis. The Ge-Sn binary eutectic liquid occurs at a composition that is close to pure Sn so that the expected composition of the liquid droplet from which the Ge NW grows is very tin-rich. However, the tip that remains after growth degrades rapidly in the electron beam, preventing reliable EDS analysis. Nanowires that are grown using Au catalysts, with Sn added via the introduction of SnCl4 gas partway through the growth process, are shown in Fig. 2.  Sn is incorporated into the liquid catalyst droplet, which enlarges the catalyst and the nanowire diameter.  During end-of-growth cool-down Sn and Ge are rejected from the catalyst resulting in tapered ends, with Au remaining at the tip.  Fig. 3 and 4 show the effect of higher and lower concentrations of SnCl4 gas flow respectively. Higher Sn concentration causes the Sn to precipitate out at the surface of the nanowires. Lower Sn concentration allows the wire to form a coreshell structure with stacking faults, presumably dislocation loops, forming in the outer region. Preliminary EDS results suggest a Sn concentration of 2-5 at%, well above the <1 at% equilibrium value. We are currently investigating the nature of the stacking faults, and the growth parameters needed to achieve high Sn concentrations while minimizing defects.

Acknowlegements:  Financial support is provided by National Science Foundation grant DMR-1206511. Part of this work was performed at the Stanford Nano Shared Facilities.

1. Kodambaka, S., Tersoff, J., Reuter, M. C., and Ross, F. M., Science 316, 729 (2007).

2. Adhikari, H., Marshall, A. F., Goldthorpe, I. A., Chidsey, C. E. D., and McIntyre, P. C., ACS Nano 1, 415 (2007).

3.  Marshall, A. F., Goldthorpe, I. A., Adhikari, H., Koto, M., Wang, Y.-C., Fu, L., Olsson, E., and McIntyre, P. C., Nano Lett. 10, 3302 (2010).

4. Sutter, E. and Sutter, P., Nanotechnology 22, 295605 (2011).

5. Gamalski, A. D., Tersoff, J., Sharma, R., Ducati, C., and Hofmann, S., Phys. Rev. Lett. 108, 255702 (2012).

6. Kouvetakis, J., Menendez, J., and Chizmeshya, A. V. G.,  Annu. Rev. Mater. Res. 36, 497 (2006).


Ann F. MARSHALL (Stanford, CA, USA), Gerentt CHAN, Andrew C. MENG, Michael BRAUN, Paul C. MCINTYRE
08:00 - 18:15 #6699 - MS02-643 Atomic-scale visualization of the growth and structure of MoS2-based hydrodesulfurization catalysts.
MS02-643 Atomic-scale visualization of the growth and structure of MoS2-based hydrodesulfurization catalysts.

Atomic-scale visualization of the growth and structure of MoS2-based hydrodesulfurization catalysts

 

Lars P. Hansen*1, Yuanyuan Zhu2, Quentin M. Ramasse3, Christian Kisielowski4, Christian Dahl-Petersen1, Michael Brorson1 and Stig Helveg1

 

1Haldor Topsoe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark.

2Pacific Northwest National Laboratory, Richland, WA, United States

3SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Daresbury WA4 4AD, United Kingdom

4Lawrence Berkeley National Laboratory, National Center for Electron Microscopy and Joint Center for Artificial Photosynthesis, Berkeley CA 94708, United States of America.

*email: lpha@topsoe.dk

 

Current environmental legislation calls for the production of clean fuels with ultra-low sulfur contents. To produce such fuels, oil refineries have to process mineral oil by catalytic hydrodesulfurization reactions. The state-of-the-art hydrodesulfurization catalysts are based on highly anisotropic MoS2 nanocrystals as the active component [1,2]. The MoS2 structure consists of two-dimensional S–Mo–S slabs which may be stacked to various degrees. The catalytic reactivity of the MoS2 nanocrystals has been associated with their exposed edges and the catalysis can be further boosted by attaching promoter metals such as Co or Ni to the edges [1,2].  However, a detailed understanding of how these Co-promoted MoS2 catalysts functions has been lacking, reflecting that information about the abundance and structure of the edge sites on MoS2-based catalysts has not been accessible.

Recent advancements have made (scanning) transmission electron microscopy (S)TEM a powerful technique for studying industrial-style catalysts at the atomic-level [3-7]. This presentation will outline the benefit of these advancements for the study of MoS2-based hydrodesulfurization catalysts. First, a differentially pumped electron microscope, dedicated entirely to corrosive sulfur-containing gas reaction environments, was used for time-resolved TEM imaging of the growth of MoS2 nanocrystals during the sulfidation reaction that transforms a molybdenum oxide precursor into highly dispersed MoS2 nanocrystals (Figure 1). Specifically, these time-resolved image series provide new information about the evolution of MoS2 nanocrystals with different size, morphology and stacking and thus uncover mechanisms responsible for the nucleation and growth of the MoS2 nanocrystals. These in situ observations are beneficially combined with STEM imaging and electron energy loss spectroscopy (EELS) enabling the detection of the catalytic active edge structures and the location of promoter atoms at the single atom level (Figure 2). Thus, the combined use of in situ and single-atom sensitive (S)TEM observations provides new insight into the formation of MoS2 nanocrystals at the atomic-level that can help to develop the understanding of structure-sensitive properties in industrial-style hydrodesulfurization catalysts.

 

References:

[1] H. Topsøe et al, Hydrotreating Catalysis, vol. 11, Springer, Berlin (1996).

[2] F. Besenbacher et al, Catal. Today, 130 (2008), p. 86.

[3] C. Kisielowski et al, Angew. Chem., Int. Ed. 49 (2010), p. 2708.

[4] L. P. Hansen et al, Angew. Chem., Int. Ed. 50 (2011), p. 1015

[5] L. P. Hansen et al., J. Phys. Chem. C 118 (2014), p. 22768

[6] Y. Zhu et al., Angew. Chem. Int. Ed. 53 (2014), p. 10723.

[7] S. Helveg, J. Catal. 328 (2015), p. 102


Lars Pilsgaard HANSEN (Kgs. Lyngby, Denmark), Yuanyuan ZHU, Quentin M. RAMASSE, Christian KISIELOWSKI, Christian DAHL-PETERSEN, Michael BRORSON, Stig HELVEG
08:00 - 18:15 #6747 - MS02-645 Crystal structure of 1DCuCl@SWCNTs determined by low voltage high resolution transmission electron microscopy.
MS02-645 Crystal structure of 1DCuCl@SWCNTs determined by low voltage high resolution transmission electron microscopy.

A wide variety of metal oxides, metal halides and other materials may be introduced into opened multiwalled or single-walled carbon nanotubes (SWCNT). These experiments have permitted the study of the crystal growth of low-dimensional materials whereby the incorporated crystals are constrained to just a few atomic layers in cross-section by the internal van der Waals surface of the carbon nanotubes. The type of encapsulated crystal and its interaction with the carbon nanotube determines the electronic properties of the entire system. Change in the local crystal chemistry of incorporated crystals has been observed directly by HRTEM and has also been predicted from ab initio calculations. Therefore, the precise the composition and structure data of the encapsulated crystal is important for a correct interpretation of the filled nanotubes electronic properties.

In this work, the structure and composition of SWCNTs filled by CuCl molecules from gas-phase was characterized by High-Resolution Transmission Electron Microscopy (HRTEM), Scanning Transmission Electron Microscopy (STEM) and X-ray Energy Dispersion Spectroscopy (EDS). The measurements were carried out on a Titan 60-300 TEM/STEM microscope (FEI, The Netherlands) at acceleration voltage of 80 kV equipped with monochromator and Cs spherical aberration corrector. Characterization and interpretation of the experimental images were performed by comparison with simulated HRTEM images. The CuCl@SWCNT films were characterized by Raman spectroscopy (Ar–Kr ion laser at the wavelengths of 488 nm (2.54 eV), 514.5 nm (2.41 eV), 568 nm (2.18 eV), and 647 nm (1.92 eV)). The spectral resolution was 0.5 cm-1.

A series of HRTEM images with different orientations of encapsulated CuCl crystal inside the nanotubes was obtained and analyzed. The chemical composition of the filled nanotubes was evaluated by EDS. It is shown that the composition ratio of copper and chlorine is 1:1. A typical fragment of filled CuCl@SWCNT is shown in Fig. 1. Fast Fourier transform was applied for the interplanar distances and angles between the vectors of reciprocal lattice estimation. The good coincidence between the calculated and experimental values of interplanar distances of encapsulated CuCl was observed for the case of NaCl type crystal lattice deformed along the [110] direction. Simulation of CuCl@SWCNT HRTEM images revealed a good correspondence of calculated and experimental data. It was found the significant changes in the Raman spectra of the CuCl@SWCNT films relative to unfilled nanotubes. The G Raman mode had a large shift (up to 20 cm-1) and a different shape. This could be explained by efficient charge transfer between the nanotube surface and the encapsulated CuCl crystal.

The work was supported by RSF-15-12-30041.


Andrey OREKHOV (Moscow, Russia), Andrey CHUVILIN, Alexander TONKIKH, Elena OBRAZTSOVA
08:00 - 18:15 #6750 - MS02-647 Study of Thermally Tunable Coupled Magnetic Vortex Oscillators with Lorentz Transmission Electron Microscopy and Differential Phase Contrast Microscopy.
MS02-647 Study of Thermally Tunable Coupled Magnetic Vortex Oscillators with Lorentz Transmission Electron Microscopy and Differential Phase Contrast Microscopy.

Magnetic vortex oscillators are an ideal system to study the dynamics of magnetic systems at very small length scales and over a wide frequency range. Their dynamic behavior shows characteristics known from other fundamental physical systems like the harmonic oscillator [1] and is in many aspects well understood. Their lateral dimension vary from a few microns [2] down to the nanometer scale [3]. Due to their flux closure configuration they are magnetically stable and a potential candidate for high density magnetic logic devices and magnonic crystals [4]. The oscillations, which can be obtained in essentially zero external magnetic field (besides the driving field), exhibit a narrow line width and resonance frequencies starting from the MHz range up to GHz frequencies [5]. They can be excited using magnetic field pulses [6] and electric currents harnessing the Spin Transfer Torques (STT) [5].

Recently, the magnetization dynamics in neighbouring magnetic vortex oscillators coupled via their stray fields come into focus of research [7-10]. The system behaves like damped coupled harmonic oscillators. It has been shown that the dynamics of such systems is strongly influenced by the strength of the magnetostatic interaction given by the distance between the elements and the relative configuration of the core polarizations, e.g., the directions of the out-of-plane magnetization components [9].

Here we present a study of coupled vortices with Lorentz Transmission Electron Microscopy (LTEM) and Differential Phase Contrast Microcopy (DPC) at zero magnetic field. We show a novel technique to control the interaction of two or more vortex oscillators by directly influencing their resonance frequencies. The resonance frequencies depend on the saturation magnetization Ms of the magnetic material, in this case permalloy and is highly dependent on the temperature of the disk. We use Joule heating to electrically manipulate the resonance frequencies of one element to control its excitation by a second neighbouring disk. We systematically mapped the frequency response of both disks for different temperatures to fully understand the behavior of the system.

 

References
[1] S. Zhang and Z. Li, Phys. Rev. Lett. 93, 127204 (2004)
[2] T. Shinjo1, T. Okuno, R. Hassdorf, K. Shigeto, T. Ono, Science 11, 289, 930-932 (2000)
[3] A. Imre, G. Csaba, L. Ji, A. Orlov, G.H. Bernstein, W. Porod, Science 13, 311, 205-208 (2006)
[4] Anjan Barman, Saswati Barman, T. Kimura, Y. Fukuma and Y. Otani, Journal of Physics D: Applied Physics, 43, 422001 (2010)
[5] Matthias Noske, Ajay Gangwar, Hermann Stoll, Matthias Kammerer, Markus Sproll, Georg Dieterle, Markus Weigand, Manfred Fähnle, Georg Woltersdorf, Christian H. Back, and Gisela Schütz, Phys. Rev. B 90, 104415 (2014)
[6] Jung, Hyunsung and Yu, Young-Sang and Lee, Ki-Suk and Im, Mi-Young and Fischer, Peter and Bocklage, Lars and Vogel, Andreas and Bolte, Markus and Meier, Guido and Kim, Sang-Koog, Applied Physics Letters, 97, 222502 (2010)
[7] K. Yu. Guslienko, V. Novosad, Y. Otani, H. Shima, and K. Fukamichi, Phys. Rev. B 65, 024414 (2001)
[8] A. Vogel, M. Martens, M. Weigand, and G. Meier, Appl. Phys. Lett. 99, 042506 (2011)
[9] A. Vogel, A. Drews, T. Kamionka, M. Bolte, and G. Meier, Phys. Rev. Lett. 105, 037201 (2010)
[10] Satoshi Sugimoto, Yasuhiro Fukuma, Shinya Kasai, Takashi Kimura, Anjan Barman, and YoshiChika Otani PRL 106 (2011)

 


Johannes WILD (Regensburg, Germany), Michael VOGEL, Michael MÜLLER, Felix SCHWARZHUBER, Christian BACK, Josef ZWECK
08:00 - 18:15 #6762 - MS02-649 InAs1-xSbx / Al core-shell nanowire epitaxy.
MS02-649 InAs1-xSbx / Al core-shell nanowire epitaxy.

   Hybrid materials with topological classification have received immense attention in recent years and become a focal point of condensed-matter research [1-2]. This development is to a large extent driven by the search for materials hosting Majorana bound states, proposed as building blocks for topologically protected quantum computation [3]. Recently, semi- and superconducting hybrid nanowires (NW) have been shown to be a feasible material combination, fulfilling the criteria of withstanding high magnetic fields while maintaining large spin-orbit interaction of the semiconductors [4]. Prior growth studies of semiconducting InAs NWs with epitaxial superconducting Al shells have given detailed insight into the mechanisms of Al grain growth kinetics and especially how the growth evolution depends on the NW morphology [5]. In general, the quality of the interfaces have been shown to play an essential role in a variety of nanostructured device applications, ranging from photovoltaics to quantum transport, and is therefore an important hybrid material characteristics.

   In this study we present compositional and structural control of InAs1-xSbx NWs grown by molecular beam epitaxy (MBE), ranging from pure InAs to pure InSb. We show that the hybrid system, InAs1-xSbx with epitaxial Al, offers new possibilities to form alternative epitaxially matched interfacial domains controlled by the Sb influence on the lattice parameter and the broken bond energy of the facets. By changing the molar fraction of Sb, the electrical properties of the semiconducting core can be tuned to desirable properties, which may be relevant for designing topological superconducting materials. An example of the InAs1-xSbx/Al hybrid system is shown in figure 1 with x = 0.34. Also presented in this study is a method to grow long and pure wurtzite (WZ) InAs1-xSbx NWs having a surprisingly high degree of epitaxial match between Al and the NWs.  

 

References

 [1] Hell, M., et al. ” Time scales for Majorana manipulation using Coulomb blockade in gate-controlled superconducting nanowires”,arXiv:1601.07369[2] Beenakker, C. W. J. (2013). Search for Majorana Fermions in Superconductors.Annual Review of Condensed Matter Physics, Vol 4. J. S. Langer. Palo Alto, Annual Reviews. 4: 113-136.

[3] Alicea, J., et al. “Non-Abelian statistics and topological quantum information processing in 1D wire networks.” Nature Physics 7, 412–417 (2011)

[4] Van Weperen, I., et al. "Spin-orbit interaction in InSb nanowires." Physical Review B 91(20). (2015)

[5] Krogstrup, P., et al. "Epitaxy of semiconductor-superconductor nanowires." Nature Materials 14(4): 400-40. (2015)


Thomas KANNE (Frederiksberg, Denmark), Aske GEJL, Joachim SESTOFT, Erik JOHNSON, Søren SIMONSEN, Jesper NYGÅRD, Peter KROGSTRUP
08:00 - 18:15 #6867 - MS02-651 The oxidation of gallium (II) sulphide.
MS02-651 The oxidation of gallium (II) sulphide.

Introdution

Gallium (II) sulphide (GaS) is a III-VI layered semiconductor, which has recently been exfoliated using liquid-phase exfoliation. As a wide-gap semiconductor it has potential in a range of applications including photodetectors, non-linear optics, optoelectronics, Li ion battery anodes, but also as a catalyst for hydrogen evolution. However, early devices fabricated using GaS stopped functioning after a few weeks. Upon close inspection it was noted that the edges of exfoliated flakes were seen to have oxidised very shortly after exfoliation, and become amorphous, but the cause of device failure was unclear. 

Methods

A combination of ab initio Density Functional Theory (DFT) calculations and High Resolution Scanning Transmission Electron Microscopy (HRSTEM) has been used to study the initiation and progression of oxidation from two potential species: Oand H2O - the latter of particular importance due to potential effects on hydrogen evolution. DFT was implemented in the CP2K code, modelling GaS as monolayer nanoribbons with various edge terminations to explore potential reaction sites and pathways.

Experimentally, GaS was exfoliated in IPA using ultrasonication, resulting in flakes several layers thick. The dispersion was drop-cast onto Au TEM grids, and then aged in two environments: ambient and under de-ionised water, to explore the effect we have observed stark contrasts between flakes exposed to air (Figure 1) and those exposed to water (Figure 2). During ageing, they were investigated with HRSTEM combining high spatial resolution imaging with pixel-by-pixel energy dispersed X-ray (EDX) mapping.

Results

O2 seems to react with the edges of the flake, substituting into sulphur sites, resulting in a loss of crystalline structure. However this reaction, while initially exothermic at all edges, ceases progressing the oxidation after the first few nm of the edge leaving the rest of the flake pristine, even after over 100 days.

Exposure to DI H2O, on the other hand, resulted in significant changes after only a couple of weeks. The resulting HAADF contrast was mottled, with small crystallite regions remaining. The brighter regions (corresponding to thicker regions) contain higher concentrations of sulphur, but seem localised more towards edges, although overall there is an increase in the amount of sulphur relative to gallium. This suggests that GaS undergoes a reaction with water resulting in the loss of gallium from the flakes, and our theory is that remaining sulphur redeposits at the step edges. 


Edmund LONG (Dublin, Ireland), Clotilde CUCINOTTA, Andrew HARVEY, Clive DOWNING, Stefano SANVITO, Valeria NICOLOSI
08:00 - 18:15 #6884 - MS02-653 High-resolution TEM study of colloidal cesium lead bromide nanocrystals.
MS02-653 High-resolution TEM study of colloidal cesium lead bromide nanocrystals.

Cesium lead halide perovskites, of the type CsPbX3 (X=Cl, Br, I), are promising candidate materials for optoelectronics, solar devices and high-energy radiation detection [1-6]. Colloidal CsPbBr3 nanocrystals with morphology of nanocubes [1], nanoplatelets [2-3] and nanowires [4] have been successfully synthesized in the last few years. Orthorhombic, tetragonal, and cubic phases were reported for bulk CsPbBr3, the cubic phase being the high-temperature one [6]. The majority of CsPbBr3 nanocrystals were reported to have cubic phase, e.g.  nanocubes [1] and nanoplatelets [2-3]. On the other hand, nanowires [4] and also nanocubes [5] exhibited orthorhombic phase, the latter ones despite their cubic shape. Here a study of colloidally grown CsPbBr3 nanocubes (NCs), with edge length of about 40 nm, and large nanosheets (NSs) using high-resolution TEM (HRTEM) and selected area electron diffraction (SAED) shows that nanocrystals with both morphologies share the same orthorhombic phase (ICSD # 97851, see Figure 1). The observations were carried out by using an image Cs-corrected JEOL JEM-2200FS TEM (accelerating voltage = 200 kV). The lattice parameters, a’,  b’, c, recalculated with respect to the ideal perovskite(a/ , b/ , c/2) for bulk orthorhombic CsPbBr3 are very similar at room temperature (298 K) and further decreasing of temperature below the transition temperature 361 K increases the discrepancy between them. Here we performed HRTEM and SAED study for CsPbBr3 NCs at various lower temperatures (Figure 2). The results have shown that the spacing among closely spaced peaks (298 K) increases at low temperature (153 K), indicating a larger discrepancy among the lattice parametes (see the arrows labelled in Figure 2). The orthorhombic CsPbBr3 NCs and NSs exhibit significantly different facetting: the NCs are enclosed by {1-10}, {110} and {001} planes (Figure 3(a,b)). However, in the growth condition of NSs, the {001} planes are strongly passivated and the growth along [001] is inhibited. The growth in the plane of (001) leads to formation of large nanosheets confined in [001], and extended at the plane (001) and enclosed by {1-10} and {110} (Figure 3(c,d)).

References

[1] L. Protesescu et al., Nano Lett. 15, 3692 (2015)

[2] Y. Bekenstein et al., J. Am. Chem. Soc. 137, 16008 (2015)

[3] Q. Akkerman et al., J. Am. Chem. Soc. 138, 1010 (2016)

[4] D. Zhang et al., J. Am. Chem. Soc. 137, 9230 (2015)

[5] A. Swarnkar et al., Angew. Chem. Int. Ed. 54, 15424 (2015)

[6] M. Rodová et al., J. Therm. Anal. Calorim. 71, 667 (2003)

 

Acknowledgement: The research leading to these results has received funding from the European Union 7th Framework Programme under Grant Agreement No. 614897 (ERC Consolidator Grant “TRANSNANO”).


Zhiya DANG (Genova, Italy), Rosaria BRESCIA, Quinten AKKERMAN, Javad SHAMSI, Mirko PRATO, Liberato MANNA
08:00 - 18:15 #6885 - MS02-655 Low Voltage Imaging of Defects in 2D-Quantum Materials.
MS02-655 Low Voltage Imaging of Defects in 2D-Quantum Materials.

The discovery of extraordinary new quantum materials with striking properties has caused great excitement, and promises to transform signal processing and computation. We have performed integrated research on three materials (1) Graphene (G) - electrons that move as massless particles at a constant speed; (2) Topological Insulators (TI) - mobile surface electrons with spins fixed to the direction of motion; and (3) Nitrogen-vacancy (NV) Centers in Diamond - a single spin stores a bit of quantum information.  Remarkably, the quantum phenomena displayed by these materials persists at room temperature, changing the rules for signal processing and computation and opening the way for quantum electronics.   

 Defects in materials effect the propagation of electrons and holes in graphene and topological insulators act in ways that are totally unlike carriers in conventional semiconductors - they move like two-dimensional (2D) massless, ultra-relativistic electrons, except their speed is much less than the speed of light. Because there is no bandgap, an electron can pass through a potential barrier by temporarily turning into a hole, dramatically reducing scattering and improving coherence. In addition, for topological insulators the direction of the spin of a surface electron is tied to its direction of motion, providing an ideal means to transport spin information. 

We have imaged and characterized high quality graphene-like materials, such as hexagonal boron nitride (hBN) and hybrid graphene-hBN structures (Fig. 1). Compared with mechanical exfoliation, CVD synthesis [1-2] can provide larger areas, with wafer-scale monolayer or multilayer graphene sheets. Aberration-corrected electron microscopy has been used to characterize MBE-grown films with high resolution at low beam voltages (40 & 80kV) to directly visualize structural defects and relate them to performance.   

We use a Cs corrected Zeiss Libra TEM to investigate chemical vapor deposition (CVD) graphene with added copper and mercury defects. With TEM we address the question, where the Hg and Co atoms are placed on the graphene. At the same time, we observe the effect of the copper and mercury on the pi electrons in graphene with Raman spectroscopy. Furthermore, we are interested in graphene based hybrid structures, such as graphene oxide embedded in a vanadium pentoxide nanofiber matrix (Fig. 2). The graphene sheets and the nanofibers have approximately the same thickness, leading to a material with enhanced mechanical performance in comparison to pure vanadium pentoxide and pure graphene oxide sheets.

Application of Low-Voltage Electron Microscopy and its development and future directions will be presented.

.

References:

[1] A. Reina, X. Jia, J. Ho, D. Nezich, H. Son, V. Bulovic, M.S. Dresselhaus, & J. Kong,Nano Lett. 9, 30–35 (2008).

[2] K.S. Kim, Y. Zhao, H. Jang, S.Y. Lee, J.M. Kim, K.S. Kim, J.H. Ahn, P. Kim, J.Y. Choi, and B.H. Hong,  Nature 457, 706-710 (2009).

[3] This work was supported by the STC Center for Integrated Quantum Materials, NSF Grant No. DMR-1231319.


David BELL (Cambridge, USA), Felix VONCUBE
08:00 - 18:15 #6896 - MS02-657 Seeing nanostructures from a new angle – tomography in a transmission electron microscope.
MS02-657 Seeing nanostructures from a new angle – tomography in a transmission electron microscope.

Research interest in low dimensional materials has expanded immensely in the last decade. The fascinating properties of nanotubes, graphene and transition metal dichalcogenides (TMDCs) has pushed this research toward applications in composites, (opto)-electronics and photovoltaics.

 

Seeing and understanding the physical and chemical structure of these nanostructures is a vital aspect of this growing research area. Using rotational tomography on low dimensional TMDCs, we reveal additional points of view that are not routine in transmission electron microscopy (TEM). Bright field TEM highlights the non-uniformity of tungsten disulphide (WS2) nanotube tips, as well as revealing structural deformities in the nanotubes as a whole. Complimentary to this, we present high-angle annular dark field (HAADF) scanning TEM tomography, which provides clearer structural interpretation through fewer Bragg scattering events being detected. 2D nanosheets are also characterised via high resolution TEM tomography, allowing for a three dimensional view of a 2D object. As the sample is rotated, further lattice and thickness information is acquired.

 

Having these complimentary tomographic methods available for nanomaterial characterisation will help to improve the accuracy of interpretation and results. Often, 2D TEM images lead to assumptions about the nature of these materials. Tomography at high resolution will reveal more information on the shape and structure of the studied nanomaterials (e.g., ripples) in 3D.


Eoghan O'CONNELL (Limerick, Ireland), Yina GUO, Robert YOUNG, Florian WINKLER, Beata KARDYNAL, Ursel BANGERT
08:00 - 18:15 #6900 - MS02-659 Measuring flexural phonon spectrum of graphene by electron diffraction.
MS02-659 Measuring flexural phonon spectrum of graphene by electron diffraction.

Graphene surface is always corrugated, particularly, when it is not in contact with a substrate [1]. The main reason for this are out-of-plane thermal oscillations (so-called flexural phonons) whose amplitude reaches rather high values in suspended 2D crystals [2]. Studying suspended sheets is of great importance because crystal relief gives us information on the very intrinsic properties of graphene in this case.  Contrariwise, graphene being in contact with a substrate either repeats its relief [3] or demonstrates a stationary state of the flexural phonon spectrum frozen by the interaction with the substrate and, thus, significantly distorted [4]. At the same time, suspended graphene shows the highest charge carriers mobility values and, thus, is the most prospective material for high-speed electronics [5]. And flexural phonons are the main limiting factor of free-standing graphene conductance [6], thus, investigating them is crucial for the developments in this field.

However, it is almost impossible to measure a suspended 2D crystal relief by direct techniques like atomic-force or scanning tunneling microscopies because of the very high flexibility of the ultrathin sheets. Particularly, it is so for the dynamic, rapidly varying relief caused by the thermal oscillations.

Here we present a technique for measuring flexural phonon spectrum in suspended graphene. The technique is based on analysis of electron diffraction patterns [7]. The technique utilizes intensities variations around a diffraction spot observed when crystal is being tilted with respect to the incident electron beam. The measured intensities in the vicinity of a diffraction spot (Fig. 1) vary in different manner depending on the distance from the spot (Fig. 2). A mathematical model of a corrugated 2D crystal representation in the reciprocal space is developed. This model shows a way to extract flexural phonons spectral amplitudes from the experimental data. The main difficulty arises from the relatively broad tails of the microscope point-spread-function, which is defined by the spatial coherency of the electron beam in the case of diffraction imaging. A couple of spectrum reconstruction techniques are suggested which allow measuring the spectrum in a relatively wide range of wave-vector lengths (0.4-4 nm-1 is achieved in our case).

The directly measured spectrum and reconstructed by different techniques are shown in Fig. 3. The most remarkable is the q-4 dependence at the right hand part, which is in agreement with the theoretical predictions. This allows direct measuring of the bending rigidity of suspended graphene. At the same time, the dependencies at smaller wave-vectors are considerably weaker than the predicted. This may be a sign of a more significant influence of charge carriers interaction with the lattice distortions on the flexural phonons dynamics. We performed a simulation of the point-spread-function effect on the measurements and also checked the validity of the suggested reconstruction techniques (Fig. 4) and found it all in agreement with our experimental data.

Finally, we introduce a technique for measuring flexural phonon spectrum in suspended graphene. The obtained dependence of the spectral amplitude on the wave-vector can be directly compared with the results of theoretical simulations, which are quite abundant in this field (while, there is a lack of such straightforward experimental data). The found spectrum profile raises questions on the role of different mechanisms involved in the flexural phonon dynamics. Moreover, the technique is applicable to studying of suspended 2D crystals of any other types that can be of great importance in the corresponding fields.

Acknowledgments

The author thanks RFBR (grant no. 16-32-60165) for the partial support of this work and Joint Research Center ‘Materials science and characterization in advanced technology’ with financial support by Ministry of Education and Science of the Russian Federation (Agreement 14.621.21.0007, 04.12.2014, id RFMEFI62114X0007) for the use of their equipment.

References

1. J.C. Meyer, A.K. Geim, M.I. Katsnelson, K.S. Novoselov, T.J. Booth, S. Roth. Nature, 2007, 446, 60-63.

2. A. Fasolino, J. H. Los, M. I. Katsnelson. Nature Materials, 2007, 6, 858-861.

3. C.H. Lui, L. Liu, K.F. Mak, G.W. Flynn, T.F. Heinz. Nature, 2009, 462, 339-341.

4. V. Geringer, M. Liebmann, T. Echtermeyer, S. Runte, M. Schmidt, R. Ruckamp, M. C. Lemme, M. Morgenstern. Phys. Rev. Lett., 2009, 102, 076102.

5. A.S. Mayorov, D.C. Elias, I.S. Mukhin et al. Nano Letters, 2012, 12, 4629-4634.

6. S. Das Sarma, S. Adam, E. Rossi. Rev. of Mod. Phys., 2011, 83, 407-470

7. D.A. Kirilenko, P.N. Brunkov. Ultramicroscopy, 2016, (available on-line, DOI: 10.1016/j.ultramic.2016.03.010)


Demid KIRILENKO (St-Petersburg, Russia)
08:00 - 18:15 #6901 - MS02-661 Low energy electron beam induced cleaning of graphene layers in SEMs.
MS02-661 Low energy electron beam induced cleaning of graphene layers in SEMs.

In order to examine mutually overlapped flakes of two-dimensional crystals such as graphene with an electron microscope we need to obtain a contrast contribution from a single layer of carbon atoms. This task requires increasing the scattering rate of incident electrons by means of a drastic lowering of their energy to hundreds of eV or less.

The effect of airborne contaminants, mainly hydrocarbons, on graphene layers distinguishing in low energy S(T)EMs can be significant and due to their removing from the surface by appropriate in-situ methods is very important from practical point of view. During the scanning of the surfaces by electrons, the image usually gradually darkens because the hydrocarbon layer is deposited on the top. This effect can be described as an electron stimulated deposition, the thermal diffusion of organic molecules around the irradiated area is use as a source of building atoms, precursor. On the other hand, the effect of electron stimulated desorption occurred at the same time, especially at low observation energies, and then depends which process, deposition or desorption, is dominated. Our experiments have showed the fact that prolonged bombardment with electrons in a range of hundreds or even tens eV gradually increases the transmissivity (and decreases the reflectivity) of graphene due to the removal of adsorbed gas molecules providing an ultimate cleaning procedure evidently leading to an atomically clean surface. A sample such as graphene enables one to distinguish this kind of cleaning from radial damage, so this result opens up new possibilities for certain surface studies performed without ultrahigh vacuum.

Experiments have been performed in a FEI SEM/STEM microscope equipped by beam deceleration mode on free standing graphene (Ted Pella®) and the effects of landing electron energy, samples biasing, electron dose, heating, etc. on the cleaning efficiency of electrons was studied in details. Moreover, the structural damage of the graphene after extremely high electron doses was observed, and the critical values for selected impacted energies were also calculated.

Acknowledgment

The work was financially supported from the European Commission for the Marie Curie Initial Training Network (ITN) SIMDALEE2: Grant No. 606988 under FP7- PEOPLE-2013-ITN.


Eliska MIKMEKOVA (Eindhoven, The Netherlands), Ludek FRANK, Ilona MULLEROVA, Seyno SLUYTERMAN
08:00 - 18:15 #6904 - MS02-663 Gap measurements via low-loss EELS on atomically thin MoxW(1-x)S2 nanoflakes.
MS02-663 Gap measurements via low-loss EELS on atomically thin MoxW(1-x)S2 nanoflakes.

The properties of alloyed materials are a fundamental issue in Materials Science. For years, layered semiconductors of the TX2 type (T=Mo, W; X=S, Se, Te) have been the subject of a varied range of studies due to their interesting electric, optical, catalytic and structural properties. In this sense, MoxW(1-x)S2 alloys have been recently reported [1,2]; but most of their properties haven’t been delved into yet. In this contribution, we focus on the local optoelectronic properties of such atomically thin (up to 6-8 layers) of MoxW(1-x) S2 . These properties have been probed by low-loss EELS measurements [3] and we have examined the bandgap behavior for different alloying degrees of such nanomaterials as well as a function of the number of layers. 

These works have been carried out using a FEI Titan Cs probe-corrected microscope equipped with a monochromator (working at 80 KV and with an energy resolution of ~180 meV).

Figure 1 displays three HRSTEM-HAADF micrographs of three different monolayers of MoS2, Mo0.5W0.5S2 and WS2 samples, respectively. The alloying effects of such materials can be easily distinguished from the HAADF image corresponding to the Mo0.5W0.5S2 sample (Fig. 1(a) second image from the left). The areas of reduced number of layers have been selected via optical and low-magnification TEM images and identified for the low-loss measurements, see Fig. 1(b).

            Low-loss EEL spectra, using the spectrum-line mode, have been recorded in regions where different stacks of a few layers can be noticed, see Fig. 2. In each of these stacks, easily recognisable for being the flat regions in the HAADF intensity profile (Figure 2(b)), several spectra have been integrated over a window of 10 to 12 nm. After zero loss peak (ZLP) extraction, the different spectra are fitted to obtain the band-gap value in each of these zones. In parallel, the thickness of these areas has been estimated, using the standard procedure [4]. Finally, these results show a relation between the band-gap of the material and the number of layers for every composition (Figure 2(c)).

All these results will be deeply discussed in the framework of previous experimental (photoluminescence) and theoretical (DFT calculations) works carried out in these material [1,2]. In conclusion, the present studies improve our knowledge of the optoelectronic properties of atomically thin layered alloys of dichalcogenides and provides further insight into the potential applications of these materials.

 

[1] D.O. Dumcenco, H. Kobayashi, Z. Liu, Y.S. Huang, K. Suenaga, Nature Comm. 4, 1351 (2013).

[2] Y. Chen, J. Xi, D.O. Dumcenco, Z. Liu, K. Suenaga, et al., Acs Nano 7, 4610-4616 (2013).

[3] R Arenal, O Stephan, M Kociak, D Taverna, A Loiseau, C Colliex, Phys. Rev. Lett. 95, 127601 (2005).

[4] R.F. Egerton, Electron energy-loss spectroscopy in the electron microscope, Springer, New York, 2011.

 

Acknowledgements:

This work was supported by the project ESTEEM2 (Integrated Infrastructure Initiative - I3, Grant Agreement 312483), the Spanish MINECO (FIS2013-46159-C3-3-P) and from the EU under Grant Agreement 604391 Graphene Flagship. Low-loss EELS studies were developed at the Advanced Microscopy Laboratory (LMA) of Institute of Nanoscience of Aragon (INA) - U. of Zaragoza (Spain).

 


Mario PELAEZ FERNANDEZ (Zaragoza, Spain), Kazu SUENAGA, Raul ARENAL
08:00 - 18:15 #6929 - MS02-665 Structural and Compositional EELS Studies on Doped Carbon Nanostructures used as Cold Field Emitters.
MS02-665 Structural and Compositional EELS Studies on Doped Carbon Nanostructures used as Cold Field Emitters.

Nowadays, more and more microscopes are equipped with cold field emission guns (C-FEG) due to their higher performance. For further improvement of C-FEGs, new emitter materials need to be explored. In this sense, carbon nanotube (CNTs) related materials are very promising candidates as cold field emitter [1]. However, more recently, carbon cone nanotips (CcNT) [2] have been considered as one of the most applicable form of carbon as field emitter, answering most of the technological problems of CNTs installation in a C-FEG [3,4]. For a higher performance of C-FEG, the electronic band structure of carbon nano-objects (tube or cones) can be modulated through the introduction of heteroatoms into the graphene lattice leading to a lower work function [5,6]. This work is devoted to the doping of these carbon nanostructures by nitrogen and/or boron, the deep study of their structure and atomic composition, and to the evaluation of their cold field emission characteristics. In this contribution, we will focus on our recent results related to doping of carbon nanotubes. HRTEM imaging, spatially-resolved EELS and X-ray photoelectron spectroscopy (XPS) studies have been developed on these NTs. After heating treatments, there is no significant structural modification in the CNTs (Fig.1). C-B and C-N bonds are identified at macro scale by XPS (Fig.2 (a)) and at local scale by EELS-STEM (Fig.2 (b), (c)). DFT calculations are also carried out and point out how the CNTs are affected by BN dopants. All these results will be discussed in depth in this contribution.

References:
[1] N. de Jonge et al, Nature 420 (2002),p. 393–395.
[2] R. L. Jacobsen, M. Monthioux, Nature 385 (1997), p. 211-212.
[3] F. Houdellier et al, Carbon 50 (2012), p. 2037-2044.
[4] F. Houdellier et al,Ultramicroscopy 151 (2015), p. 107-115
[5] P. Ayala et al, Reviews of modern physics 82 (2010), p. 1843-1885.
[6] R. Arenal, X. Blase, A. Loiseau, Advances in Physics 59, 101 (2010).

Acknowledgements:
This work was supported by the project ANR LASCAR (ANR-13-BS04-0007), by the European Union Seventh Framework Program under Grant Agreement 312483 – ESTEEM2 (Integrated Infrastructure Initiative – I3), and by the international associated laboratory TALEM (CNRS - U. of Zaragoza). TEM studies were developed in the Advanced Microscopy Laboratory (LMA) of Institute of Nanoscience of Aragon (INA) - U. of Zaragoza (Spain). R.A. acknowledges funding from the Spanish MINECO (FIS2013-46159-C3-3-P), and from the EU under Grant Agreement 604391 Graphene Flagship.


Rongrong WANG, Masseboeuf AURÉLIEN (Toulouse), David NEUMEYER, Marc MONTHIOUX, Alejandro LOPEZ-BEZANILLA, Raul ARENAL
08:00 - 18:15 #6931 - MS02-667 Atomic Scale Characterization on III-V Based Heterostructure Nanowire Interfaces.
MS02-667 Atomic Scale Characterization on III-V Based Heterostructure Nanowire Interfaces.

Quasi-one-dimensional III-V semiconducting nanowires attract enormous attention owing to their physical properties such as tunable direct bandgap, high surface to volume ratio, high carrier mobility, tunable structures. Hence they have  potential application in next generation electronics, sensors, photonics and photovoltaics. Understanding the details such as, atomic scale structure, local chemical stoichiometry and defects in a sub nanometer scale are inevitable when nanowires are intended for devices.

A systematic interfacial investigation on molecular beam epitaxy grown III-V based nanowires such as InAs, GaAs,[1] in general and in particular, heterostructure nanowires of axially grown GaxIn1_xAs-InAs and InAs-InAsSb will be presented.[2] In this work, atomic scale structural interfaces and interfacial chemical composition are analyzed using advanced aberration corrected transmission electron microscopy.  Atomic resolution high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) and high resolution energy dispersive x-ray spectroscopy techniques are predominatly used for characterizing the grown nanowires. Our work demonstrates on tailoring the growth, periodicities and the stoichiometry of III-V nanowire heterostructure containing single/multiple electronic barriers involving In,Ga,As and Sb. We aim to provide understanding on the growth of dissimilar interfaces in heterostructure nanowire (see fig 1). In the InAs-InAsSb heterostructure wires,[1] our work demonstrates the quality of the misfit strained interface in terms of structural abruptness and chemical homogeneity. 

References

1. S. Venkatesan, P. Krogstrup, C. Liebscher, G.Dehm, (Unpublished)

2. S. Venkatesan, M.H. Madsen, H. Schmid, P. Krogstrup, E. Johnson and C. Scheu, Appl. Phys. Lett. 103, 063106, (2013).


Sriram VENKATESAN (Duesseldorf, Germany), Peter KROGSTRUP, Christina SCHEU, Christian LIEBSCHER, Gerhard DEHM
08:00 - 18:15 #6966 - MS02-669 Beam exfoliation of MoS2 layers with a helium ion beam.
MS02-669 Beam exfoliation of MoS2 layers with a helium ion beam.

Precise modification of two dimensional (2D) materials with high resolution will be instrumental in future device fabrication. Such a method is presented here for the removal of layers of MoS2. The thickness of selected regions of few layer MoS2 has been altered with a sub-nanometre beam of He+. This ‘beam exfoliation’ of MoS2 has been characterised and controlled. An investigation of annealing and of the modified regions is now underway. 

MoS2 is a material in the transition metal dichalcogenide (TMD) family which undergoes a transition from indirect to direct bandgap when going from multilayer to monolayer. This makes it ideally suited to applications in digital electronics as well as numerous photonic applications such as light emitters, photodetectors and solar cells. Excellent mechanical flexibility also provides potential for use in flexible electronics. Even more interesting than the superlative physical properties of 2D materials is the ability to tune these properties with precision. Considerable alteration of MoS2 behaviour is already possible by tailoring the crystal structure, stoichiometry and geometry. Since there is such a significant difference between the behaviour of single layer and multilayer MoS2, thinning of MoS2 has been reported in a number of different manners. These include laser ablation and Ar+ plasma etching. 

Few-layer molybdenum disulphide (MoS2) was obtained by mechanical and liquid exfoliation and transferred to a TEM grid. It was irradiated with He+ at 30 keV in a number of different configurations . In the images presented, thinning is observed in the bright regions where the beam did not penetrate the material.

Figure 1 is a 300kV TEM image which shows a region with intact crystal structure demonstrating a thinned front progressing towards a fully milled region. In addition, the crystal structure is clearly intact.

From previous work, it is known that few layer (one to roughly five or six layers) MoS2 can be milled (cut through completely) with a minimum dose in the approximate range of 1017-1018 ions cm-2. In order to perform rudimentary characterisation on the thinning of material SEM was used to measure the minimum helium ion dose at which altered contrast -and it is implied, thinning- could be observed (of course this does not exclude other possible effects on the complex systems of electron microscope contrast). A variety of SEM operation modes were tested to determine which was the most sensitive to the changes (secondary electron (SE2), Inlens, bright field STEM and dark field STEM). It was found that dark field STEM exhibited the sharpest change in contrast with respect to dose as indicated in figure 2.

Finally figure 3 is a schemtic diagram of the thinning process.

 


Hongzhou ZHANG, Pierce MAGUIRE (Dublin, Ireland), Daniel S FOX, Yangbo ZHOU
08:00 - 18:15 #7042 - MS02-671 Exchange-coupled Sm–Co/Co thin layers; structural and magnetic investigations.
MS02-671 Exchange-coupled Sm–Co/Co thin layers; structural and magnetic investigations.

Exchange-coupled SmCo/Co hard/soft magnetic bilayers with different thicknesses of hard and soft phases were deposited on (100) silicon substrate, using Ultra High Vacuum (UHV) evaporation. Structural properties were investigated by transmission electron microscopy. Magnetic properties were measured, at room temperature, by Polar Magneto-Optical Kerr Effect. Hysteresis loops show single-phase magnetic behavior suggesting a strong exchange coupling between hard and soft phases. The magnetization ratio Mr/Ms and coercive field Hc were found to increase with increasing hard layer thickness. The highest remanence (Mr/Ms = 1) and coercivity (Hc =670 Oe) were obtained when SmCo and Co thicknesses are respectively 2.5 and 0.5 nm. The STEM-HAADF images exhibit that this bilayer was not thoroughly continuous; it is composed of Co elliptical particles surrounded by SmCo. PMOKE imaging shows that the magnetization reversal process is dominated by wall propagation.


Marwen HANNACHI (Tunis, Tunisia), Wajdi BELKACEM, Martiane CABIÉ, Lotfi BESSAIS, Najeh MLIKI
08:00 - 18:15 #6338 - MS03-673 Nitride layers grown on patterned graphene/SiC.
MS03-673 Nitride layers grown on patterned graphene/SiC.

Self-heating of high power GaN devices during their operation is a major drawback that limits the performance. Integration of sheets with very high thermal conductivity material could help in this matter. After some unsuccessful GaN growth experiments carried out directly on graphene, we succeeded to grow nitride layers on patterned graphene/6H-SiC by Metalorganic Chemical Vapour Deposition (MOCVD). The growth is similar to the well-known Epitaxial Lateral Overgrowth method in which the graphene buried stripes are overgrown laterally from the window regions, where AlN could grow on bare SiC with epitaxy. An AlN buffer layer was first deposited on patterned graphene/6H-SiC surface followed by a deposition of  ~ 300 nm thick Al0.2Ga0.8N and ~ 1.5 µm thick GaN layer. The AlN buffer deposited onto the graphene stripe was grown in a 3D way (Fig.1a). The heterostructure was studied using aberration-corrected transmission electron microscopy (TEM) methods in combination of electron energy-loss X-ray spectroscopy (EDXS) and electron energy-loss spectroscopy (EELS). TEM specimens were prepared using both conventional and focused ion beam methods.

The most surprising details of this study is the appearance of the AlN/GaN superlattices, which were formed in a self-organised way over the buffer layer. Instead the ternary AlGaN we have superlattice (Fig. 1.b and c) in which the thickness of the AlN/GaN is determined by the available elements from the Al0.2Ga0.8N which we wanted to grow. The control sample (without graphene) showed a much more flat AlN buffer and a ternary Al0.2Ga0.8N on that without any phase separation. EDXS mapping and also superlattice reflections show however, clearly the complete phase separation in the case the nitride layers are grown on graphene. We suppose, that some excess carbon induced the phase separation.

The detailed TEM studies revealed the AlN nucleation directly on SiC and lateral overgrowth of graphene island as shown in Fig.2a. The high resolution image in Fig.2.b shows three layers of graphene and the AlN that is in epitaxy with SiC. Both interfaces are sharp and no interdiffusion of the elements are observed according to the Si, C (not shown) and Al maps in Fig. 2c  The results show that high quality GaN layer over graphene/SiC can be grown with MOCVD that can serve as templates for high power GaN devices.    

 

Acknowledgements. Authors thank the support of the Hungarian National Scientific Foundation (OTKA) through Grant No. K 108869 and NN118914. B. P thanks to the European Commission for providing support to access the ER-C facility through the ESTEEM2 project.

 

(1)   A. Kovács, M. Duchamp, R.E. Dunin-Borkowski, R. Yakimova, P. L. Neumann, H. Behmenburg, B. Foltynski, C. Giesen, M. Heuken and B. Pécz, Advanced Materials Interfaces, published online: 22 DEC 2014 | DOI: 10.1002/admi.201400230, Vol. 2, Iss. 2, January 21 201597


Bela PECZ (Budapest, Hungary), Andras KOVACS, Rafal E DUNIN-BORKOWSKI, Rositza YAKIMOVA, Michael HEUKEN
08:00 - 18:15 #6356 - MS03-675 Controlled production and growth of hexagonal gold nanostructures during self-assembly on a Ge(001) surface.
MS03-675 Controlled production and growth of hexagonal gold nanostructures during self-assembly on a Ge(001) surface.

Self-organized gold nanostructures on Ge(001) surfaces are currently of special interest due to their applications for mono-molecular electronic devices and the growth of Ge nanowires. The understanding of electrical as well as physical properties of the system is of great importance and is strongly linked to its atomic structure.

Here, we report on studies concerning post-annealing induced nanostructure formation after room temperature deposition of a thin film of Au on Ge(001) in Ultra High Vaccuum (UHV). Deposition of 6 monolayers of Au by Molecular Beam Epitaxy (MBE) resulted in the formation of a continuous Au overlayer which was confirmed to be crystalline by Reflection High Energy Electron Diffraction (RHEED). Just after deposition, the samples were post-annealed in UHV to temperatures ranging from 473 K to 773 K with different cooling rates. The self-organized structures, in the form of Au nanoislands, were characterized by HR-SEM and HR-STEM methods as well as EBSD. It has been found that a preferential island orientation exists along the crystallographic direction of the substrate surface as can be seen in Fig. 1(a),(b). For an annealing temperature close to the eutectic temperature of the Au/Ge system (640 K), a change in size and shape of the Au nanoislands is observed as well as the occurence of the hexagonal phase of gold, indicating eutectic melting of the system as can be seen in Fig. 1. Au(011) orientation of the Au islands with respect to the Ge surface was revealed, independent of the annealing temperature Fig. 1(c),(d). TEM measurements of Au/Ge(001) sample cross sections revealed that the nanoislands created upon annealing at T640 K part of the islands are buried beneath the substrate surface (Fig. 1g), which confirms eutectic AuGe melting. The chemical composition of the Au/Ge interface was uncovered using quantitative atomically resolved HAADF-STEM and indicates the absence of alloying (Fig. 1f and 1h). The crystallographic structure of the Au islands and the presence of hexagonal gold as well as the Au/Ge interface were studied by quantitative atomically resolved HAADF-STEM allowing the determination of the structure.

N.G. and J.V. acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant 278510 VORTEX. F.K. acknowledges funding from the Polish National Science Center, grant no. DEC-2012/07/B/ST5/00906. All authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative (Reference No. 312483-ESTEEM2).


Nicolas GAUQUELIN (Antwerpen, Belgium), Benedykt JANY, Marek NIKIEL, Tom WILHAMMAR, Karel VAN DEN BOS, Sandra VAN AERT, Konrad SZAJNA, Johann VERBEECK, Gustaff VAN TENDELOO, Franziszek KROK
08:00 - 18:15 #6364 - MS03-677 Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy.
MS03-677 Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy.

Scaling of silicon microelectronics is reaching fundamental physical limitations related in particular to the power consumption. A possible solution is represented by III-V semiconductors integrated on Si which have much higher electron mobility and injection velocity. The possibility to grow III-V nan-owires allows also the creation of new transistor concepts for Tunnel Field-Effect Transistors [1], which could lead to an increase in the efficiency of the circuits by reducing the supply voltage and thus the power consumption.
The growth of III-V nanowires by Template Assisted Selective Epitaxy (TASE) (Fig. 1a) [2] has enabled the direct integration of heterostructures on Si (100) for TFET applications. The performance of the de-vice may however be affected by the presence of defects (twins, dislocations, stacking faults, anti-phase boundaries) along the nanowire since every single discontinuity in the crystal can lead to a mod-ification in the electrical properties of the material. The understanding, control and suppression of such defects have always been a very challenging task and a crucial point to obtain well performing devices.
Here, we report the investigation of different III-V compounds, by means of atomic-resolution STEM, starting from GaAs homostructures to InAs-GaSb heterostructures (Fig.1b), allowing detailed charac-terization of defects, strains and compositions. We make use of the large degree of freedom of growth parameters in the TASE technique (temperature, V/III ratio, molar flux of precursors) to prepare nan-owire samples (Fig.1b) with the aim to find the right parameters combination to reduce the defects density. Our analysis confirms a process-dependent defect density in nanowires and shows that de-fect-free nanowires can be indeed obtained by optimizing the growth conditions (Fig.2).

[1]. Riel, H., Wernersson, L.-E., Hong, M. & del Alamo, J. a. III–V compound semiconductor transistors—from planar to nanowire structures. MRS Bull. 39, 668–677 (2014)
[2]. Schmid, H. et al. Template-assisted selective epitaxy of III–V nanoscale devices for co-planar heterogeneous inte-gration with Si. Appl. Phys. Lett. 106, 233101 (2015).


Acknowledgments: This work was supported by the Swiss National Science Foundation (project no. 200021_156746) and E2SWITCH (project no. 619509).


Nicolas BOLOGNA (Zurich, Switzerland), Moritz KNOEDLER, Mattias BORG, Davide CUTAIA, Rolf ERNI, Heike RIEL, Marta ROSSEL D.
08:00 - 18:15 #6389 - MS03-679 New phases in Cu3Si solid solution.
MS03-679 New phases in Cu3Si solid solution.

   

Cu3Si is used as a catalyst for the production of technologically highly important chlorosilanes, an intermediate compound in the production of ultrapure silicon for the semiconductor industry [1]. Copper silicides and copper germanides have also been studied as materials for applications as contacts and interconnects in Si and Ge-Si electronic devices [2]. Different structures of Cu3Si and Cu3(SiGe) have been reported over the years [3,4,5], however, new aspects have been revealed by this study.

   

Nanoobjects of various shapes were prepared by the CVD method using organometallic precursors (SiH­­4, EtSiH4, BuSiH3, and their mixtures with H2) and copper substrates at temperature of about 500 °C. For comparison and more variability in composition, bulk samples of various compositions (Cu78Si22, Cu77Si23, Cu76Si24, Cu75Si25, Cu74Si26) were prepared by arc melting.

  

Samples were screened by SEM/EDX/EBSD and powder XRD. Selected samples were studied by single-crystal XRD and TEM. TEM was performed on a Philips CM 120 (LaB6, 120kV) equipped with a NanoMEGAS precession unit DigiStar, an Olympus SIS CCD camera Veleta (2048x2048), and an EDAX windowless EDX detector Apollo XLTW. Precession-assisted electron diffraction tomography (EDT) in microdiffraction setup was used to acquire data for structure characterization of nanoobjects.

   

In the Cu3Si solid solution (Fig. 1), two variants were identified sharing the same average structure (P63/mmc, a=4.06Å, c =14.66Å). The structures of the two variants (diagonal (D) and off-diagonal (O)) differ in the placement of satellite reflections, which are caused by strong modulation of the honeycomb copper layers. The D and O variants are most likely stabilized by composition. The D-variant was observed in bulk sample with composition of Cu77Si23 and also in the nanoplatelets prepared by CVD on Cu-substrates, whereas the O-variant was present in the samples richer in silicon. Moreover, additional periodicity along c-axis was detected in Cu3Si compared to Cu3(SiGe) with c=7.33Å (Fig. 2). Temperature experiments are currently under progress, and will be also presented.

  

  

[1] Bernard, F.; Souha, H.; Gaffet, E. Mater. Sci. Eng., A 2000, 284, 301–306.

[2] An, Z.; Ohi, A.; Hirai, M.; Kusaka, M.; Iwami, M. Surf. Sci. 2001, 493, 182–187.

[3] Solberg, K. J. Acta Crystallogr. 1978, A34, 684–698.

[4] Wen, Y. C.; Spaepen, F. Philos. Mag. 2007, 87, 5581–5599.

[5] Palatinus, L.; Klementová, M.; Dřínek, V.; Jarošová, M.; Petříček, V., Inorg. Chem. 2011, 50, 3743–3751.

[6] The study was supported by the Czech Science Foundation under project No. 15-08842J.


Klementová MARIANA (Prague, Czech Republic), Cinthia CORREA, Vladislav DŘÍNEK, Petr BRÁZDA, Jaromír KOPEČEK, Lukáš PALATINUS
08:00 - 18:15 #6434 - MS03-681 Automated in situ transmission electron microscopy experiments.
MS03-681 Automated in situ transmission electron microscopy experiments.

In situ transmission electron microscopy (TEM) involves the application of a stimulus to a specimen in the TEM while changes to the specimen are recorded using imaging, diffraction or spectroscopic techniques. However, in most previous in situ TEM studies the apparatus that was used to apply a stimulus did not communicate with the software or hardware that was used to control the TEM and collect data.

.

Important criteria for in situ TEM experiments include minimisation of irradiation dose and avoidance of user bias, resulting in the need to work quickly - and ideally in an automated way. A direct interface between a setup used to apply a stimulus and an interface used to control the TEM is therefore crucial. We have implemented plug-ins for Digital Microcrograph (DM), which can be used to communicate directly with a GPIB bus compatible setup (Fig. 1 a) and external Labview-based software that can then be used to control the stimulus applied to the specimen (e.g., temperature regulation). Values of the applied stimulus and signals measured from the specimen are recorded and added to the tags and titles of TEM images.

.

We have studied silicon oxide-based resistive switching devices in situ in the TEM using a movable W needle and recorded bright-field (BF) TEM images with different voltages applied to the specimen (Figs 1 b-d). A DM script was used to apply a voltage ramp and to measure the current flowing through the sample in an automated way for each applied voltage. By using this approach, we were able to follow the formation and destruction of a conductive path across the SiOx layer and to correlate it with a measured change in conductivity.

.

A second experiment involved in situ electrical biasing of a solar cell and recording a map of electron beam induced current (EBIC) inside the TEM. DM plug-ins were used to record the current generated by the electron beam while scanning the active layer of a μc-Si:H solar cell (Fig. 2 a). The same script was used to measure the current across the sample as the electron beam was scanned across the specimen and a voltage applied to the solar cell. Simultaneously acquired scanning TEM and EBIC maps are shown in Figs 2 (c-d).

.

A further in situ TEM experiment performed on a biased solar cell involved the acquisition of off-axis electron holograms to determine changes in electrostatic potential across the active layer. An external stimulus such as an applied bias can be applied to such as specimen to remove the unwanted mean inner potential contribution from the results. For each applied voltage, a hologram was acquired from the area of interest on the specimen, the stage was moved to record a vacuum reference hologram and it was then returned to the same sample area. This approach was used to record a series of amplitude and phase images from electron holograms of an electrically biased Si:H solar cell (Fig. 2 e) and to extract phase profiles across the top ZnO contact, the p-doped Si layer and the amorphous intrinsic layer (top right of Fig. 2 e).

.

We are grateful to Michael Farle and AG Farle at the University of Duisburg-Essen for technical help. We also acknowledge the European Union under the Seventh Framework Programme under a contract for an Integrated Infrastructure Initiative (Reference 312483 ESTEEM2) and the European Research Council for an Advanced Grant (Reference 320832 IMAGINE).


Martial DUCHAMP (Jülich, Germany), Vincent VIGNÈRES, Gautier DUFOURCQ, Vadim MIGUNOV, Rafal E. DUNIN-BORKOWSKI
08:00 - 18:15 #6471 - MS03-683 FIB patterning for position-controlled nanowire growth.
MS03-683 FIB patterning for position-controlled nanowire growth.

Semiconductor nanowire (NW) based heterostructures are a promising material system for next generation optoelectronic devices, such as flexible solar cells and light emitting diodes [1]. Their reduced contact area and surface strain relaxation allow for epitaxial growth on lattice-mismatched substrates, a key advantage for integration of different III-V semiconductors with existing silicon-based technology.

 

Position-controlled NWs can be grown in ordered arrays on Si to improve uniformity and device integration. This is commonly performed by using a SiO2 thin film as a mask. Patterning of circular holes in the mask (Fig. 1(a)) allows for site-specific NW growth in predefined patterns and positions. To date, this is performed using lithography techniques such as electron beam lithography or nanoimprint lithography [2]. Important processing parameters include oxide thickness, hole diameter and pattern pitch, requiring several steps to be optimized in order to achieve a high yield of uniform NWs [3]. Additionally, the catalytic particle is rarely centered in the hole, leading to undesirable asymmetry in the NW cross-sections [4].

 

In this work, the parameter space for direct patterning of NW growth substrates by focused ion beam (FIB) is explored (Fig. 1). Self-catalyzed GaAsSb NWs were grown using molecular beam epitaxy (MBE) on a FIB patterned Si(111) substrate with 40 nm thermal oxide, where hole size, dose and Ga-beam overlap were systematically varied (Fig. 1(a-c)). It is expected that a higher degree of flexibility and control can be attained using FIB compared to the conventionally used resist-based patterning techniques. In addition, patterning by FIB leads to Ga implantation in both Si and SiO2, which could positively affect the self-catalyzed NW growth and the properties of the NW-substrate system in a unique way.

 

After MBE growth, three distinct growth regimes can be recognized, present in all arrays (Fig. 1(d-e)): The smallest (10 nm pattern) diameter row features a high yield (≤ 80%) of straight NWs. As the hole diameter increases there is initially a transition to more parasitic crystal growth and finally multiple (2-5) NWs grow within each hole. As the dose increases between arrays in each column, the patterned diameter for these transitions decreases proportionally. The results demonstrate that using FIB the parameter space can be mapped out efficiently within a single growth session and that growth can be tuned between aligned single NWs, 2D parasitic crystals and multiple NWs per hole. Transmission electron microscopy and electrical testing of single NWs directly on the growth substrate [5] will be used to refine the structural analysis and study the electrical properties of these NWs. It is expected that in addition to the flexibility of FIB patterning, III-V NWs grown on FIB-patterned Si will exhibit novel properties due to the implantation of Ga and the altered NW-substrate interface.

 

References:

[1] Joyce, H. J. et al., Prog. Quant. Electron., 35, 23–75 (2011), DOI: 10.1016/j.pquantelec.2011.03.002

[2] Munshi, A. M. et al., Nano Lett., 14, 960–966 (2014), DOI: 10.1021/nl404376m

[3] Plissard, S. et al., Nanotechnology, 22, 275602 (2011), DOI: 10.1088/0957-4484/22/27/275602

[4] Nilsen, J. S. et al., J. Phys. Conf. Ser., 644, 012007 (2015), DOI: 10.1088/1742-6596/644/1/012007

[5] Fauske, V. T. et al., J. Microsc., (2015, in press), DOI: 10.1111/jmi.12328

 

Acknowledgements: This work is supported by the Research Council of Norway through funding for the NorFab (197411) facility and the FRINATEK (214235) program.


Aleksander Buseth MOSBERG (Trondheim, Norway), Dingding REN, Bjørn-Ove FIMLAND, Antonius Theodorus Johannes Van HELVOORT
08:00 - 18:15 #6513 - MS03-685 In-situ propagation of a Cu phase in germanium nanowires observed by transmission electron microscopy.
MS03-685 In-situ propagation of a Cu phase in germanium nanowires observed by transmission electron microscopy.

Semiconductor nanowires (NWs) are promising candidates for many device applications ranging from electronics and optoelectronics to energy conversion and spintronics. However, typical NW devices are fabricated using electron beam lithography and therefore source, drain and channel length still depend on the spatial resolution of the lithography. In this work we show fabrication of NW devices in a transmission electron microscope (TEM) where we can obtain atomic resolution on the channel length using in-situ propagation of a metallic phase in the semiconducting NW. The corresponding channel length is independent on the lithography resolution. We show results on semiconducting NW devices fabricated on two different electron transparent Si3N4 membranes: a calibrated heater chip from DENs solution [1] and homemade membranes where the NW-metal contact is locally heated by Joule heating [2]. We demonstrate a real-time observation of the metal diffusion in the semiconducting NW. First we present results on in-situ propagation of a copper-germanium phase in Ge NWs while monitoring the system temperature [3] and by Joule heating while measuring the current through the device. We study the kinetics and rate limiting step by monitoring the position of the reaction front as a function of time. Second we will show characterization of the formed phase at atomic length scales with different (S)TEM techniques (electron diffraction tomography, energy dispersive X-ray spectroscopy, HR(S)TEM) to understand how the metal atoms diffuse and incorporate into the germanide phase at the reaction front and how these parameters relate to the electrical properties of the same interface. Using EDX and diffraction characterization we find that an orthorombic Cu3Ge phase is created in the reacted NW part, see Fig. 2,3. Furthermore, both Cu and Ge are diffusing in opposite directions. Both EDX and diffusion studies indicate that the reaction proceeds via surface diffusion along the Cu3Ge segment.

Refrences

[1]  http://denssolutions.com/products/nano-chip

[2] M. Mongillo, P. Spathis, G. Katsaros, P. Gentile, M. Sanquer and S. De Franceschi, ACS, Nano, 5,

      7117-7123 (2011).

[3] T. Buchhart, A. Lugstein, Y. J. Hyun, G. Hochleitner and E. Bertagnolli, Nano. Lett, 9, 3739-3742 (2009).

 

 

 

Acknowledgements

Financial support from the French ANR for the “COSMOS” project is acknowledged. We thank B. Fernadez and T. Fournier for their technical support.


Khalil EL HAJRAOUI (Grenoble), Clemens ZEINER, Eric ROBIN, Stéphanie KODJIKIAN, Alois LUGSTEIN, Jean-Luc ROUVIÈRE, Martien DEN HERTOG
08:00 - 18:15 #6543 - MS03-687 Self-Induced Compositional Variations in GaAs/AlGaAs Core-Shell Nanowires.
MS03-687 Self-Induced Compositional Variations in GaAs/AlGaAs Core-Shell Nanowires.

Semiconductor nanowires (NWs) have promising properties for optoelectronic devices such as solar cells and light emitting diodes. For the development of such NW-based devices, the correlation between structural features, composition, and optoelectronic properties of the NWs must be well understood. This task can be challenging as the growth can induce large NW-to-NW variations. As a statistical meaningful sampling at the required spatial resolution by multiple techniques would be very time consuming, correlated studies where the exact same NWs are characterized optically and structurally by different techniques are an alternative [1]. In this study, the same single self-catalyzed GaAs/AlGaAs core-shell NW is studied using micro-photoluminescence (µ-PL) and transmission electron microscopy (TEM). After conventional TEM, cross-sections of two regions of the same NW were made using focused ion beam (FIB) to obtain a 3D impression of the NW. To study variations in the shell, a cross-section was made perpendicular to the growth direction from the lower half of the NW, and to study variations in the tip a section was made perpendicular to the -1-12-direction from the top of the NW (Fig. 1(a)). The cross-sections were studied using high-angle annular dark-field scanning TEM (HAADF STEM) and quantitative electron-dispersive x-ray spectroscopy (EDS) to reveal compositional variations in the different directions of the NW.

 

The NWs in the growth batch are mostly defect free zinc blende (ZB), with stacking faults and a wurtzite (WZ) region towards the tip area (Fig. 1(b-c)). µ-PL of 17 studied NWs shows a signal at the ZB GaAs free exciton energy at 12 K. About half of the NWs also have an additional PL signal at higher energy, as can be seen in Fig. 1(e). Compositional variations in the AlGaAs shell of the NWs could possibly explain this high-energy PL emission in the 1.6-1.8 eV energy range [2]. In both cross-sections (Fig. 1(d) and Fig. 2) this type of structure, with narrow Al-rich and Al-deficient bands parallel to the facets of the NW, is visible. Quantitative EDS maps based on the zeta-method [3] (Fig. 3(a)) shows that the Al concentration in the Al deficient bands for the observed widths is too high to explain the sharp PL emission in the range 1.6-1.8 eV. In addition to the shell, the tip region also depicts compositional variations. These features were only visible in the cross-section normal to the -1-12 - direction (Fig. 1(d) and 2(b)) and not apparent by conventional TEM imaging (Fig. 1(c)). Quantitative EDS (Fig. 3(b)) shows that the Al concentration is varying within the tip. Correlated studies on the very same NW including µ-PL, conventional TEM, FIB preparation in different directions and quantitative EDS are required to visualize and explain self-induced compositional variations and peculiar optical characteristics within these GaAs/AlGaAs core-shell NWs.

 

 

[1] J. Todorovic et al., Nanotechnology 22.32 (2011), 325707.         

[2] J. S. Nilsen et al., Journal of Physics: Conference Series 644 (2015), 012007

[3] M. Watanabe and D. B. Williams, Journal of Microscopy 221 (2006), 89-109.

 

 

Acknowledgements: The Research Council of Norway for the support to the NorFab (197411) and the NORTEM (197405) facilities, as well funding from the NANO2021 (239206) and FRINATEK (214235) programs.


Julie Stene NILSEN (Trondheim, Norway), Aleksander Buseth MOSBERG, Andreas GARMANSLUND, Johannes Frøhaug REINERTSEN, Abdul Mazid MUNSHI, Dheeraj DASA LAKSHMI NARAYANA, Bjørn-Ove FIMLAND, Helge WEMAN, Antonius Theodorus Johannes VAN HELVOORT
08:00 - 18:15 #6547 - MS03-689 Nanostructure and luminescence of Ga and Fe-doped IZO´s.
MS03-689 Nanostructure and luminescence of Ga and Fe-doped IZO´s.

The study of transparent semiconducting oxides (TCO) constitutes a large field of research due to its applications as transparent electrodes in transistors, flat panel displays, solar cells, sensors, etc. [1, 2]. Most of the interest is aimed to optimize both conductivity and transparency in the visible region of commercial indium tin oxide (ITO), with lower production costs. In this sense, the In2ZnkO3+k system seems to be one of the best candidates. Moriga et al [3] reported the discovery of nine members in this system. The physical properties of these phases are a function of the k value. Likewise these phases allow doping with other elements, which provides greater flexibility when designing materials [4, 5].

 In this work, In2-xMxZn7O10 (M = Ga and Fe, and 0≤x≤0.5) materials have been prepared by the ceramic method. The k=7 term crystallizes in the space group R-3m, the introduction of dopant decreasing the lattice parameter without changing the crystalline structure. HRTEM images show these materials formed by ordered layers of InO octahedra sharing edges with layers of (InZnk)Ok+1+ composition along c-axis, in such a way that the (001) plane of the ZnO structure and the (111) In2O3 plane are epitaxially equivalent to the (001) plane of ZnkIn2Ok+3. The existence of extended defects such as twins, dislocations and disordered intergrowths were observed.

Cathodoluminescence (CL) measurements show the existence of two emission bands, one associated to defects whose intensity and width vary depending on the chemical composition of the material. The second issue is the band edge of the material, which is present in the undoped sample, and it disappears and reappears depending on dopant concentrations. EDS spectroscopy confirms the presence of Ga and Fe dopants. A deeper study by means of atomic resolved microscopy has been performed in order to stablish the structure-properties relationship.

References:

[1] C.G. Granqvist, Solar Energy Materials & Solar Cells. 91 (2007) 1529-1598

[2] G.B. Palmer, K.R. Poeppelmeier, T.O. Mason, Chem. Mater .9 (1997) 3121-3126.

[3] T. Moriga, D. D. Edwards, T. O. Mason, G. B. Palmer, K. R. Poepperlmeier, J. L. Schindler, C. R. Kannewurf, I. Nakabayashi, J. Am. Ceram. Soc. 81 (1998) 5, 1310-1316

[4] R. Wang, A. W. Sleight, R. Platzer y J. A. Gardner, J. Solid StateChem. 122, (1996) 166-175.

[5] A. Ambrosini, S. Malo, K. R. Poeppelmeier, M. A. Lane, C. R. Kannewurf y T. O. Mason, Chem. Mater. 14 (2002) 58-63.


Javier GARCÍA-FERNÁNDEZ, Almudena TORRES-PARDO, Julio RAMIREZ-CASTELLANOS, Ana CREMADES, Javier PIQUERAS, Jose M GONZÁLEZ-CALBET (MADRID, Spain)
08:00 - 18:15 #6570 - MS03-691 Analysis of core/shell nanoparticles by electron microscopy techniques.
MS03-691 Analysis of core/shell nanoparticles by electron microscopy techniques.

Core-shell nanoparticles are being intensively studied due to their exceptional properties like quantum dot confinement. In these nanoparticles, their optical and electronic properties can be modulated changing their dimensions [1]. In particular, materials such as CdSe/ZnS or InP/ZnS are extensively used in a variety of applications such as biochemical sensors [2], light emitting diodes [3] or photovoltaic devices [4]. In these nanoparticles, the shell has the function of avoiding the re-absorption of the light emitted by the core of the particle [5]. Recently, special attention is paid to InP/ZnS nanoparticles to replace the CdSe cores because of the harmful consequences in the environment and health due to the presence of Cd.     

In this communication, we analyse core/shell nanoparticles of different compositions by electron microscopy techniques. In particular, we have studied CdSe/ZnS and InP/ZnS nanoparticles with diameter of the core of approx. 2.7 nm and 0.6 nm thick shells. Initial analyses have been carried out by high resolution transmission electron microscopy (HRTEM). Fig 1 a) shows an HRTEM image of CdSe/ZnS nanoparticles, where one of the particles has been marked. The observed particles have been found to be very homogeneous in shape and dimensions The measured average size of the observed particles is 3 nm approx., which agrees with the designed value. However, and as it can be observed, the core and the shell cannot be distinguished with this technique. The small thickness of the shell is not expected to produce a layer with a noticeably different lattice parameter than the core. Because of this, the samples have been analysed by high angle annular dark field scanning transmission electron microscopy (HAADF-STEM), where the intensity in the images can be related to the atomic number Z of the atoms in the material. Fig. 1 b) shows an HAADF-STEM image of CdSe/ZnS nanoparticles. As it can be observed, a clear interface between the core and the shell is not noticed, but it can be seen that the edge of the particle shows smaller intensity than the core. This can be related to two reasons. On the one hand, in these particles, the Z number of the material in the shell is smaller than in the core (ZZnS = 46, ZCdSe = 82). However, it should also be considered that the electron beam finds a smaller amount of material at the edge of the particle, what would cause a reduction of intensity. Because of this, the correlation of the area of reduced intensity with the ZnS shell is not straightforward. In order to investigate the possibility to distinguish the core and the shell in these nanoparticles, structures with different sizes of core and shell are being studied by HAADF-STEM. Image simulations will be carried out in order to help with the interpretation of these images, to allow the correlation of the structural characteristics of these nanoparticles with their optoelectronic properties.

Acknowledgements: This work was supported by the Spanish MINECO (projects TEC2014-53727-C2-1-R, -2-R and CONSOLIDER INGENIO 2010 CSD2009-00013) and Junta de Andalucía (PAI research group TEP-946). The research leading to these results has received co-funding from the European Union.

References:

[1] S. Baskoutas, A.F. Terzis, Journal of Applied Physics, 99 (2006) 013708.

[2] D. Vasudevan, R.R. Gaddam, A. Trinchi, I. Cole, Journal of Alloys and Compounds, 636 (2015) 395-404.

[3] A. Rizzo, Y. Li, S. Kudera, F. Della Sala, M. Zanella, W.J. Parak, R. Cingolani, L. Manna, G. Gigli, Applied Physics Letters, 90 (2007) 051106.

[4] A.J. Nozik, Physica E: Low-Dimensional Systems and Nanostructures, 14 (2002) 115-120.

[5] F. Meinardi, A. Colombo, K.A. Velizhanin, R. Simonutti, M. Lorenzon, L. Beverina, R. Viswanatha, V.I. Klimov, S. Brovelli, Nature Photonics, 8 (2014) 392-399.


Natalia FERNÁNDEZ-DELGADO (Cádiz, Spain), Miriam HERRERA-COLLADO, Pedro RODRÍGUEZ-CANTÓ, Rafael ABARGUES, E MOYA LÓPEZ, Juan MARTÍNEZ-PASTOR, Sergio MOLINA
08:00 - 18:15 #6589 - MS03-693 Precision top-down delayering of microelectronics devices using broad-beam argon ion milling.
MS03-693 Precision top-down delayering of microelectronics devices using broad-beam argon ion milling.

The semiconductor industry is a dynamic, rapidly growing manufacturing sector. In 2015, global sales of semiconductor products increased 9.9% and reached a record US $335.8 billion [1]. Constantly evolving microelectronic device designs continue to grow more complex, more compact, and smaller. For example, three-dimensional (3D) NAND flash memory cells are layered vertically in three-dimensional stacks, which provides much greater cell density and increases memory capacity [2]. Such design complexity makes maintaining manufacturing quality standards a consistent challenge for the industry and failure analysis plays a critical role in meeting that challenge. Failure analysis can determine the root cause of a defective device; it enables failure identification and characterization, as well as provides feedback for product and process improvement. Many failure analysis techniques, both nondestructive and destructive, have been developed in the past five decades [3, 4]:

·         nondestructive techniques: electrical measurement and testing, infrared and X-ray examination, and optical or electron microscopy evaluation

·         destructive techniques: chemical etching, mechanical polishing, plasma etching, and delayering

Many techniques are untenable for multilayer devices. For example, Samsung found that etching agents are too aggressive and the company enumerated several major structural failures that can occur in NAND flash memory related to etching or particle contamination. Delayering is a popular choice because it allows top-down, whole chip characterization. However, delayering 3D devices with multiple layers is difficult. The main challenge presented by a vertical stack is looking through a stack of many dissimilar layers. Instrumentation that employs low energy, broad beam, argon ion milling using a top-down delayering technique can help to expose a defect region for further analysis [5]. The work presented is a new development in semiconductor device delayering for failure analysis using low energy, broad-beam argon ion milling. 

References

  1. Rosso, D. (2016, February 1). Semiconductor Industry Association - Global semiconductor sales top $335 billion in 2015. Retrieved from http://www.semiconductors.org/news/2016/
    02/01/global_sales_report_2015/global_semiconductor_sales_top_335_billion_in_2015.
  2. Shimpi, A. L. (2013, August 21). Samsung’s V-NAND: Hitting the reset button on NAND scaling. Retrieved from http://www.anandtech.com/show/7237/samsungs-vnand-hitting-the-reset-button-on-nand-scaling.
  3. Lakshminarayanan, V. (2001). Failure analysis techniques for semiconductors and other devices. Retrieved from Mobile Dev & Design website: http://mobiledevdesign.com/news/
    failure-analysis-techniques-semiconductors-and-other-devices.
  4. Crockett, A., Almoustafa, M., & Vanderlinde, W. (2004). Plasma delayering of integrated circuits. Microelectronics Failure Analysis Desk Reference, 4, 243-25. 

Pawel NOWAKOWSKI (Export, USA), Kristin OLEXA, Mary RAY, Paul FISCHIONE
08:00 - 18:15 #6627 - MS03-695 SEM based electro-optical characterization of core-shell LEDs and simulation of imaging including CL and EBIC excitation inside ensembles.
MS03-695 SEM based electro-optical characterization of core-shell LEDs and simulation of imaging including CL and EBIC excitation inside ensembles.

Three dimensional (3D) nano- and microstructures (NAMs) are attracting a lot of attention and are discussed regarding several applications, especially in optoelectronics and sensors. For example GaN based 3D light emitting diodes (LEDs) with a core-shell geometry are supposed to have substantial advantages over conventional planar LEDs: The active area along the sidewalls of hexagonal GaN pillars can considerably be increased by high aspect ratios - leading to a lower current density inside the InGaN quantum well (QW) at the same operation current per substrate area. [1]

Thus related methods are requested for characterization of local electro-optical properties with a high spatial resolution on single structures as well as in ensembles. Usually, electron microscopy is employed to investigate the geometry and properties of such 3D-NAMs and for mapping of vertical features by an SEM a certain sample tilt (e.g. about 30°) is needed. Investigation of single 3D-LEDs by electron beam induced current (EBIC) using an SEM based manipulator setup proves the presence of a pn-junction and doping type of the core and shell, while cathodoluminescence (CL) gives an insight to the optical properties of the QW [2]. But in contrast to SEM on planar regions the interactions of the electron probe are significantly affected by the 3D geometry and the surrounding of the NAMs.

In ensembles of 3D-NAMs a certain portion of incident electrons are scattered into neighbor structures and conventional SEM signals (SE, BSE, CL, X-ray emission) are partly shadowed. This interaction is affecting the SEM imaging contrast and the probed signal also includes contributions which are not related to the material properties at the electron beam spot. As such parasitic signals are generated quite close to the original region of the interaction most (global) SEM detectors cannot separate them from the original source. In particular scattering events occur in an enlarged volume of the sample (of the substrate and NAMs) leading to a reduced excitation density and parasitic effects, e.g. this causes a significant contribution of defect related yellow luminescence (YL)

We present results of InGaN/GaN core-shell LEDs obtained with an FE-SEM which is equipped with SE, In-Beam SE, low-kV BSE, EBIC and monochromatic CL detection as well as a piezo controlled manipulator setup, see Figure 1. A modified parabolic collection mirror enables measuring luminescence from planar samples up to 4’’ in a tilted view up to 30°. For a quantitative interpretation of CL and EBIC measurement values and image contrasts, the physical modeling of SEM images and spatially resolved energy transfer by a probe spot is necessary. This is performed using the simulation program MCSEM [3]. It models the different stages of image formation and generates SEM images of complex NAM shapes using e.g. GaN as model material. Aspects of the simulation are the electron probe formation, a 3D model of the specimen structure, the interaction of electron probe and solid state by means of scattering trajectories, the emission of secondary electrons, and different types of electron detectors, see Figure 2 and Figure 3. An insight to CL and EBIC imaging is gained by evaluating the scattering energy deposited in a distinct volume inside the NAMs as an imaging signal - this is related to the generation rate of electron-hole pairs inside the respective volume of the semiconductor.

Consent to the experiments this simulation reveals an edge contrast and shadowing of signals by the ensemble as well as scattering of primary electrons inside the ensemble of 3D-NAMs. A quantitative comparison is possible by the absorbed current (EBAC). Artefacts of the EBIC are also demonstrated by the simulation, in particular edge contrast by a reduced generation rate and parasitic signals by scattering from neighbor structures.

 

1. Mandl, M. et al. Group III nitride core-shell nano- and microrods for optoelectronic applications. Phys. status solidi - Rapid Res. Lett. 7, 800–814 (2013). doi: 10.1002/pssr.201307250a

2. Ledig, J. et al. Characterization of the internal properties of InGaN/GaN core-shell LEDs. Phys. status solidi 213, 11–18 (2016). doi:10.1002/pssa.201532485

3. Frase, C. G., Gnieser, D. & Bosse, H. Model-based SEM for dimensional metrology tasks in semiconductor and mask industry. J. Phys. D. Appl. Phys. 42, 183001 (2009). doi: 10.1088/0022-3727/42/18/183001


Johannes LEDIG (Braunschweig, Germany), Carl Georg FRASE, Frederik STEIB, Jana HARTMANN, Hergo-Heinrich WEHMANN, Andreas WAAG
08:00 - 18:15 #6668 - MS03-697 Analytical electron microscopy characterization of light-emitting diodes based on ordered InGaN nanocolumns.
MS03-697 Analytical electron microscopy characterization of light-emitting diodes based on ordered InGaN nanocolumns.

Self-assembled nanocolumns (NCs) with InGaN/GaN disks constitute an alternative to conventional light emitting diodes (LED) planar devices [1]. However, their efficiency and reliability are hindered by a strong dispersion of electrical characteristics among individual nanoLED. Polychromatic emission derives from an inhomogeneous distribution of indium concentration due to the inherent tendency of InGaN alloys to develop composition fluctuations as a function of the polarity of the growth crystallographic planes [2]. The recent development of selective area growth of NCs by molecular beam epitaxy has allowed the achieving of highly homogeneous and controllable GaN/InGaN NCs with improved crystalline quality and higher control over the indium distribution [3].

 

In this work, we present the characterization performed on LEDs based on ordered NCs with InGaN active disks (figure 1). The detailed structural characterization of the nanostructures has been performed by scanning transmission electron microscopy (STEM) carried out on an aberration-corrected JEOL-JEMARM200 microscope. High crystal quality of the NCs is set by the analysis of atomically-resolved high angle annular dark field (HAADF) images. The indium distribution within the InGaN disks is studied by EDS elemental mapping while the polarity of the semiconductor NCs is followed by locating the nitrogen atomic columns in annular bright field (ABF) images while (figure2). Direct correlation of the optical and structural properties on a nanometer-scale was achieved using low temperature cathodoluminescence (CL) spectroscopy in an FEI STEM Tecnai F20 [4].

References

 

[1] R. Penn et al., Am. Mineral. 83 (1998) p.1077

[2] J. F. Banfield, et al., Science 289 (2000), p. 751

[3] M. P. Boneschanscher et al., Science 344 (2014), p.1377

[4] Ž. Gačević et al., Phys.Rev. B (2016) accepted

 


Almudena TORRES-PARDO (Madrid, Spain), Žarko GAČEVIĆ, Noemi GARCÍA-LEPETIT, Marcus MÜLLER, Sebastian METZNER, Ana BENGOECHEA-ENCABO, Steven ALBERT, Frank BERTRAM, Peter VEIT, Juergen CHRISTEN, Enrique CALLEJA, Jose M. GONZÁLEZ-CALBET
08:00 - 18:15 #6687 - MS03-701 Diamond-based MOSFETs: Bandgap interface profiling by STEM-EELS.
MS03-701 Diamond-based MOSFETs: Bandgap interface profiling by STEM-EELS.

In the view of developing high performance metal-oxide-diamond field effect transistor (diamond MOSFET), recent reports presents different approach in the choice of the gate material and, in particular, on the dielectric layer [1-2]. However, a nanometric analysis of the band levels is necessary to understand the electron dynamic across the MOS stack. Recently, STEM-EELS have been revealed as reliable technique to estimate the bandgap of SiO2 dielectric materials. Nevertheless, its applicability has been limited to SiNx materials.

To evaluate electron transitions near the bandgap energy in the EELS spectra, researchers have to overcome several experimental difficulties. Here, we evaluate the effect of Čerenkov radiation and volume plasmon-related peaks in low-loss range of EELS spectra. In this study, STEM-EELS techniques are used to analyse the O-terminated diamond/Al2O3 interface (similarly to previous studies presented in SiO2 by other authors [3]). Indeed, volume plasmons (VP) and Čerenkov (Ch) radiation contribution are evidenced in Fig.1, which also shows diamond-related D1-2 peaks and Al2O3-related peak A1 however, in the Al layer, only plasmon-related peaks are revealed. Probe position of the previously presented EELS spectra are shown in Fig.2, as numbered dots. Figure 2 shows 001-BF TEM micrography of the diamond/Al2O3/Al layers. Inset of Fig.2 shows HREM micrography of the diamond/Al2O3 interface, revealing variations in the crystalline quality of the low temperature (100ºC) ALD-deposited Al2O3 layer.

In this work, we present a methodology to evaluate the influence of the Čerenkov losses and plasmon-related peaks in the low-loss EELS spectra. In some cases, such peaks are shown to mask the interband-related transition. Indeed, in such cases, Čerenkov-related and plasmon-related peaks have to be deconvoluted and removed, in order to accurately apply the linear-fit method [3], which allows calculating the diamond/oxide bandgaps.

The previously described methodology allows determining the bandgap variations in the oxygen-terminated diamond/oxide interfaces.

 

[1] S. Cheng, L. Sang, M. Liao, J. Liu, M. Imura, H. Li, and Y. Koide, Appl. Phys. Lett. 101, 232907 (2012).

[2] A. Maréchal, M. Aoukar, C. Vallée, C. Rivière, D. Eon, J. Pernot, and E. Gheeraert, Appl. Phys. Lett. 107 (14), 141601 (2015).

[3] Jucheol Park, Sung Heo, Jae-Gwan Chung, Heekoo Kim, HyungIk Lee, Kihong Kim, and Gyeong-Su Park,  ULTRAMICROSCOPY 109 (9), 1183 (2009).


José PIÑERO, Daniel ARAÚJO (, Spain), Pilar VILLAR, Julien PERNOT
08:00 - 18:15 #6713 - MS03-703 Visualization of ordering phenomena in di-fluorinated sexiphenyl by HRTEM.
MS03-703 Visualization of ordering phenomena in di-fluorinated sexiphenyl by HRTEM.

Asymmetrically, di-fluorinated para-sexiphenyl (6P-F2) can be used as a model system of a polar conjugated molecule for the growth on an inorganic semiconductor forming a hybrid inorganic/organic system (HIOS) for opto-electronic applications. The two fluorine atoms are positioned terminally at only one end of the 6P molecule. This asymmetry triggers a dipole moment causing strong interaction with the electric field of the polar crystal structure of ZnO serving as inorganic substrate. The molecule/substrate interaction is expected to be much stronger than that for pure 6P or for symmetrically fluorinated 6P-F4 [1].

Based on the findings for non-fluorinated 6P which was found to form a well ordered crystalline structure when grown on ZnO(10-10) [2], structure models of the 6P-F2/ZnO interface are created to predict the high-resolution TEM image contrast. In a first approach, only potential 6P-F2 bulk structures derived from the β-6P structure were considered. 6P molecules were replaced by 6P-F2 molecules in three different ways (see structure models of Fig. 1a) to c) (left column)). In Fig. 1a) a tip-to-end ordering is considered where the fluorinated tip of the molecule points always in the same direction possibly towards the substrate surface. In Fig. 1b) an alternating ordering is realized. Only every second molecule points downwards the others point upwards. The alternating arrangement is realized for two directions being the horizontal direction and the direction normal to the projection plane. The third type of ordering is a tip-to-tip and end-to-end one (see Fig. 1c). The difference between these 3 types is highlighted by the green arrow markers symbolizing the fluorinated tips. For comparison, the crystal structure of pure 6P is seen in Fig. 1d).

HRTEM image contrast simulations were performed with the JEMS software package [3]. The results are given in the 3rd and 4th column of Fig. 1. According to the findings published in [2] a large defocus df up to 1000 nm underfocus was applied for gaining high phase contrast for the low spatial frequency details of the 6P-F2 structure. Moreover, the sample thickness t was varied up to 100 nm in steps of 25 nm. Here the results for t = 100 nm are given.

A clear indication for ordering is only seen in Fig. 1c viz. for the tip-to-tip / end-to-end alignment. The other types (Fig. 1a and b) show fringes almost identical to those of pure 6P (Fig. 1d). Also, for df = -1000 nm the image contrast seems directly interpretable in terms of basic structural features. The dark lines trace the position of the center of mass of the next neighbor 6P-F2 or 6P molecules.

Having a more careful look now at Fig. 1c where a clear indication for ordering is seen. The contrast transfer for tip-to-tip / end-to-end alignment simulated for df = -500 nm promotes two dark fringes for the end-to-end position of the molecules (see yellow arrows in Fig. 1c) whereas the fluorinated tips do not exhibit any fringes. For df = -1000 nm a faint fringe appears at the tip-to-tip position (cf. red arrows) while the distance between the two dark fringes increases.

Conclusively, only the tip-to-tip / end-to-end alignment of 6P-F2 can be clearly identified by HRTEM imaging at large underfocus and the defocus condition strongly influences the visibility of structural details and interpretability of the HRTEM image contrast.

With respect to HIOS applications, the arrangement of 6P-F2 on either the polar (0001) or the nonpolar (10-10)ZnO surface will be studied in further detail. A potential influence of the polar/nonpolar substrate surface on the arrangement of the polar 6P-F2 molecules will be considered.

References:

[1]    M. Sparenberg, A. Zykov, P. Beyer, L. Pithan, C. Weber, Y. Garmshausen, F. Carla`, S. Hecht, S. Blumstengel, F. Henneberger, S. Kowarik, Phys. Chem. Chem. Phys. 16 (2014) 26084.

[2]    H. Kirmse, M. Sparenberg, S. Sadovef, A. Zykov, S. Kowarik, S. Blumstengel, accepted for publication in Cryst. Growth Des. (2016).

[3]    P.A. Stadelmann, http://cimewww.epfl.ch/people/Stadelmann/jemsWebSite/jems.html


Holm KIRMSE (Berlin, Germany), Mino SPARENBERG, Sergey SADOFEV, Sylke BLUMSTENGEL, Christoph T KOCH
08:00 - 18:15 #6727 - MS03-705 Quantitative and non-destructive defect metrology for beyond Si semiconductors.
MS03-705 Quantitative and non-destructive defect metrology for beyond Si semiconductors.

Electron channeling contrast imaging (ECCI) is a powerful scanning electron microscopy (SEM) technique for the visualization and analysis of crystalline defects like dislocations and stacking faults. Distortion of the crystal lattice of a material due to the presence of such defects causes the variation of the backscattered electron intensity, allowing their visualization.  ECCI has been demonstrated to be a fast and robust method for assessing the density and Burgers vector of different defect types in various materials with reliability comparable to that of transmission electron microscopy [1, 2]. However, in contrast to TEM, ECCI can be used for the non-destructive investigation of large areas.

This fact makes the technique particularly interesting for the semiconductor industry, where defect metrology techniques for the non-destructive analysis of (Si)Ge and III/V compounds with  dislocation densities below 105cm-2, are crucial to support CMOS scaling beyond the 10nm node.

In order to analyze such lowly defective samples, areas exceeding about 200 x 200µm2 in size need to be examined to ensure proper statistics. For this purpose we acquire a set of tiles that can be stitched into a single image, thereby leading to an image resolution allowing for the detection of single threading dislocations. The FEI software application MAPS, dedicated to the automated acquisition of high resolution images from large areas, is used to record a set of ECC images that are further processed and examined for the presence of defects. It is important to note that for proper ECC imaging (i.e. maximum channeling contrast at a defect site), the sample needs to be oriented close to the Bragg condition. This is facilitated by tilting and rotating the sample according to the electron channeling pattern (Fig. 1) acquired by scanning the sample at low magnification. The investigated area of the tilted specimen is maintained in focus during the acquisition through the interpolation of the settings.  Imaging conditions such as accelerating voltage and beam current were fine-tuned in advance using a sample with higher defect density (Fig. 2). A retractable below-the-lens backscatter electron (BSE) detector is used to record the individual ECC images.

Using the above described procedure we analyzed in detail the density and distribution of threading dislocations in blanket SiGe layers of different defect densities. Our results reveal that in case of dedicated strain relaxed buffer layers the surface appears basically defect free over several tens of micrometers, only locally one can observe individual defects and pile-ups of threadings reaching the layer surface. Results are verified by defect decoration using chemical etching followed by optical etch pit detection.

Our work demonstrates that ECCI in combination with automated image acquisition provides quantitative information on defect density and distribution on systems foreseen for future semiconductor devices.

 

[1] S. Zaefferer and N-N. Elhami, Acta Mat. 75 (2014) 20-50.

[2] I. Gutierrez-Urrutia and D. Raabe, Scripta Mat. 66 (2012) 343-346.


Anna PROKHODTSEVA (Brno, Czech Republic), Tomas VYSTAVEL, Andreas SCHULZE, Matty CAYMAX
08:00 - 18:15 #6741 - MS03-707 Control of Polarity, Structure and Growth Direction in Sn-Seeded GaSb Nanowires.
MS03-707 Control of Polarity, Structure and Growth Direction in Sn-Seeded GaSb Nanowires.

Among III-V semiconductor materials GaSb is highly interesting for several device applications such as optoelectronics.1 The epitaxial growth of GaSb nanowires has mainly been done using Au as the seed material which demonstrated several limitations like direct nucleation and crystal structure tuning.2 In this work we have investigated the epitaxial growth of Sn-seeded GaSb nanowires directly nucleated on GaSb (111)A substrates with controlled Ga- and Sb-polarities, and study their structural and physical properties.

Nanowires are grown by metal organic vapor phase epitaxy (MOVPE) in a standard low pressure (100 mbar) horizontal MOVPE reactor (Aixtron 200/4). Sn-seed particles are formed in-situ by using Tetraethyltin (TESn) precursor at 530°C. Following the particle formation, the reactor temperature was changed to the nanowire growth temperature in the range of 490-570°C. Trimethylgallium (TMGa) and trimethylantimony (TMSb) are used as precursors for nanowire growth.

The polarity of the nanowires is confirmed by aberration-corrected scanning transmission electron microscopy (STEM) as can be seen in Figure 1. It is shown that there are differences in the structural properties (i.e. growth direction, composition of the seed particle, and crystal purity) of Ga- and Sb-polar nanowires; and their growth mechanism is studied. In addition, the formation of inclined twins which only occurs in the Sb-polar nanowires is explained by using simulation methods. Also high-angle annular dark-field (HAADF-) STEM image simulation is employed for realization of subtle features in the experimental images, as shown in Figure 2. In this Figure, presence of twin boundaries which is not perpendicular to the zone axis is proven. Finally, photoluminescence response of the Sn-seeded GaSb nanowires is compared with their Au-seeded counterpart, suggesting incorporation of Sn atoms from the seed particle into the nanowires.3

 

 

References

1 A.G. Milnes and A.Y. Polyakov, Solid-State Electronics 36, 803 (1993).

2 M. Jeppsson et al, J. Cryst. Growth 310, 5119 (2008).

3 R.R. Zamani et al, submitted (2016).

 

Acknowledgements

The authors thank the scientific staff in DTU-Cen and the access to the microscopy facilities. Additionally, RRZ and KAD acknowledge the European Research Council (ERC) for funding the “NEWIRES” project under grant agreement number 336126.


Reza R. ZAMANI (Lund, Sweden), Sepideh GORJI GHALAMESTANI, Jie NIU, Niklas SKÖLD, Kimberly A. DICK
08:00 - 18:15 #6761 - MS03-709 In-situ operation of oxide-based memories in a transmission electron microscope.
MS03-709 In-situ operation of oxide-based memories in a transmission electron microscope.

There is a great deal of activity in the development of new memory technologies that can be used to provide the required density and reliability for future generations of data storage [1, 2]. At this time there is a bewildering array of proposed systems each with advantages and disadvantages. One of the problems with the development of these types of materials systems is that it is not clear exactly how these devices function and as a consequence, it is difficult to select the best combinations of materials to provide the best overall performance.


In this presentation we will present results that have been obtained on a range of different TaO and Ta2O5 OxRAM structures that have processed using reactive and RF deposition physical vapour deposition (PVD). The focus on this work is the mapping of oxygen and results will be presented that have been obtained by a range of different techniques including aberration-corrected high-resolution annular bright-field (ABF) scanning transmission electron microscopy (STEM) imaging, EDS (Energy dispersive X-Ray Spectroscopy) or Electron Energy Loss Spectroscopy (EELS) for the measurement of oxygen concentration (atoms) and electron holography and differential phase contrast (DPC) for the distribution of electrostatic potential caused by the distribution of the oxygen. An example is shown in Figure 1 where a (a) high resolution ABF STEM and (b) HAADF STEM image of a TaO/Ta2O5 stack with TiN top and bottom electrodes can be seen. Figures 1(c) and (d) show EELS spectra that have been acquired for the N, Ti, O and Ta regions. Figure 1(e) and (f) show quantitative maps and profiles respectively. Here the variations in the Ta and O concentrations can be observed across the active region of the device. In this presentation we will highlight the best techniques for measuring the variations of oxygen in the devices and discuss which stacks have the best stoichiometry for memory device applications.

The key to the performance of these devices is the movement of oxygen during switching. As a consequence it is necessary to perform these observations in situ in the TEM to avoid problems with locating the conducting filaments during specimen preparation and additional issues such as device retention and other modifications that could occur during specimen preparation. In this presentation we will present results on specimens that have been switched using a dedicated in-situ holder in the electron microscope. Figure 2 shows how a movable probe is placed onto a FIB-prepared specimen with nm-scale accuracy by using a Nanofactory biasing system. An electrical pulse is then used to switch the specimen in situ in the TEM. In this presentation we will show how to avoid common problems such as device heating and electrical shorting of the specimen from redeposition during preparation by focused ion beam milling. Finally in this presentation we will show results obtained on our TaO specimens that have been switched in situ in the microscope.


Acknowledgements: EV thanks the Labex Minos ANR-10-LabEx-55-01 for funding this PhD position. DC thanks the European Union for the ERC Starting Grant 306535 “Holoview”. These experiments were performed on the Platform Nanocharacterisation at Minatec.


References
[1] Waser, R. et al. Nature materials, 6 (2007) 833-840.
[2] M. J. Lee et al. Nature materials, 10, (2011) 625-630.


Edouard VILLEPREUX (Grenoble), David COOPER, Zineb SAGHI, Anne ROULE, Mirielle MOUIS
08:00 - 18:15 #6786 - MS03-711 Strain at interfaces of the InAs/AlSb heterostructure for quantum cascade lasers.
MS03-711 Strain at interfaces of the InAs/AlSb heterostructure for quantum cascade lasers.

Devices based on epitaxially grown multilayers can be highly sensitive to structural and chemical properties at interfaces, especially when the active zones are of nanometric size. The InAs/AlSb system is particularly sensitive to this phenomenon due to the lack of common atomic species between the two materials. While the lattice mismatch between the two material layers is moderate (1.3%), the formation of chemical bonds at interfaces that are different from those existing in layers such as Al-As or In-Sb may result in large and very-localized strains. The lattice parameters of AlAs bonds (aAlAs=0.566 nm) or InSb bonds (aInSb=0.6479 nm), as bulk materials, are 6.6% smaller or 6.9% higher than that of InAs (aInAs=0.6058 nm), respectively. The stress states at interfaces are therefore highly dependent on their dominant bond type, being tensile for AlAs-like interfaces or compressive for InSb-like interfaces. In a previous study, a first estimation of the composition at interfaces in the InAs/AlSb system was obtained by combining strain analysis with chemical ones [1]. It was shown that the formation of the tensile AlAs-type interface is spontaneously favored compared to InSb-type, which is attributed to its higher thermal stability.

In this work we focused on the meaning of the measured strain at interfaces in order to get quantitative data on their atomic composition and thus to improve the understanding of interface formation. In this perspective, a strain analysis achieved by using the geometrical phase analysis (GPA) was performed on atomically-resolved Z-contrast images acquired by HAADF-STEM (Fig. 1). Experimental strain profiles were then compared to those obtained from simulated images, with a focus on the effect of convolution due to the mask used in the GPA treatment. Very high negative strains at the scale of two atomic planes are observed from experimental images, both at the InAs-on-AlSb and at the AlSb-on-InAs interfaces. The comparison with simulated strain profiles highlights the strong AlAs-type character of the interfaces when they are spontaneously formed within the chosen growth conditions (Fig. 2). The strain states at interfaces of these structures were also investigated by using the density functional theory (DFT) and compared to the ones predicted by the theory of linear elasticity (Fig.3).

 

This work is supported by the French national project ANR NAIADE (ANR-11-BS10-017) and by ESTEEM2

 

 

[1] J. Nicolai et al., J. Appl. Phys. 118, 035305 (2015)


Maxime VALLET (Toulouse), Yann CLAVEAU, Bénédicte WAROT-FONROSE, Christophe GATEL, Nicolas COMBE, Cesar MAGEN, Roland TEISSIER, Alexei BARANOV, Anne PONCHET
08:00 - 18:15 #6807 - MS03-713 Epitaxy of GaN nanowires on graphene.
MS03-713 Epitaxy of GaN nanowires on graphene.

Nitride nanowires (NWs) are today actively explored as an active material for a large number of optoelectronic devices (light emitting diodes, photodetectors, solar cells). The NWs are usually grown on bulk crystalline substrates (Si, sapphire) but these substrates impose their properties which may not be adapted to the device functionality (low electrical or thermal conductivity, opacity, weigh, rigidity, cost,...). Recently, graphene has been proposed as an attractive candidate to grow III-V semiconductor NWs [1]. Graphene is transparent, flexible and it has high thermal and electrical conductances and it can be synthesized at low cost on large areés. Furthermore, graphene films are easily transferable to almost any carrier substrate, including amorphous and/or flexible materials.

In this study, epitaxial growth of GaN nanowires on graphene is demonstrated using molecular beam epitaxy without any catalyst or intermediate layer. We have grown GaN NWs on isolated mono-crystalline graphene flakes transfered onto SiO2/Si carrier substrates. The nanowires grow vertically and X-Ray diffraction (XRD) show that the nanowires have grown along their c-axis. We have observed by SEM that locally, the NW factes have the same in-plane orientation over several µm². The 10-10 facets of the NWs have been determined by high angle annular dark field scanning transmission electron microscopy (HAADF-STEM). Cross-sections have been prepared by focussed ion-beam (FIB). HAADF images of NW-graphene/silica interface show that the base of the NWs is defect-free. Selected area electron diffraction (SAED) patterns taken from different zones show identical patterns indicating that the nanowires from all the zones have same in-plane orientation. Since it is well established that the hexagonal periphery of the graphene flakes corresponds to zig-zag edges of the graphene lattice, we can conclude that the epitaxial relationship is 11-20 GaN parallel to the graphene zig-zag. It leads to an apparent mismatch of 29% between the graphene and the GaN wurtzite structure. This value is very large. We show that an in-plane super cell coincidence between 4 unit cells of graphene and 3 unit cells could lead to a more favorable mismatch of -3.1%. The optical properties of NWs arrays have been probed by photoluminescence spectroscopy.

 

[1] Munshi A.M., Dheeraj D.L., Fauske V.T., Kim D.C., Van Helvoort A.T., Fimland B.O., Weman H. NanoLetters, 12 (9), 4570 (2012)

ACKNOWLEDGEMENTS

We acknowledge Agence Nationale de la Recherche (ANR), program of investment for the future, TEMPOS project (n°ANR-10-EQPX-50) for having funded the acquisition of the NANOTEM platform (Dualbeam FIB-FEG FEI SCIOS system and TEM-STEM FEI Titan Themis equipped with the Super-X Chemistem EDX detectors) used in this work


Vishnuvarthan KUMARESAN, Ludovic LARGEAU (Marcoussis), Ali MADOURI, Frank GLAS, Hezhi ZHANG, Fabrice OEHLER, Antonella CAVANNA, Andrey BABICHEV, Noelle GOGNEAU, Maria TCHERNYCHEVA, Jean-Christophe HARMAND
08:00 - 18:15 #6812 - MS03-715 Phase formation and growth behavior of Co-Ge thin films.
MS03-715 Phase formation and growth behavior of Co-Ge thin films.

     The potential use of germanide thin films as self-aligned metallization in Ge-based Complementary Metal-Oxide Semiconductor (CMOS) technology has drawn interest in the solid-state reactions of Ge and metal films [1-3]. In order to integrate these germanide thin films as a contact material, a complete analysis of the solid-state reactions of amorphous Ge (a-Ge) and metals is required. The solid-state reactions in the Co-Ge thin films systems previously examined by in situ x-ray diffracting annealing experiments only probed the crystal structures present in the film and did not identify the morphological variations of the process [1]. Furthermore, to the authors knowledge previous works Co-Ge thin film systems have only analyzed systems with Ge in excess of Co. 

     In this study, the phase formation and crystallization behavior of a-Ge and Co thin film layers are investigated by ex situ transmission electron microscopy (TEM) coupled with in situ x-ray diffraction (XRD) annealing experiments. Four different specimens were prepared, alternating the stacking order and film thickness (200 nm and 30 nm), in order to explore the influence of the free surface on the crystallization and the phase reactions with Co in excess of a-Ge. Thin film layers of a-Ge and Co were deposited via electron beam evaporation onto (100) silicon wafers with the native oxide film present on the surface (~1–2 nm). The thin film specimens were characterized by TEM before and after annealing during the phase formation process. Bright field TEM images of the 200 nm Co on top of 30 nm a-Ge stack are shown in Figure 1: (a) as-deposited, (b) annealed at 280°C and (c) 400°C. Upon heating to 280°C, the a-Ge layer reacts with the Co layer to form CoGe, which then undergoes an additional phase transformation to CoGe2 with continued heating to 400°C. 

     The influence of the free surface (fs) on the crystallization process was examined on the 200 nm a-Ge and 30 nm Co film stack. The scanning electron microscopy images of the specimens after annealing to 400°C are shown in Figure 2. (a) The specimen with a-Ge at the free surface (a-Ge fs) shows two distinct contrast indicating the presence of two different crystalline phases near the surface, while (b) the specimen with Co at the free surface (Cofs) shows a more homogeneous contrast throughout the surface. Both specimens have voids visible at the surface, which formed during annealing. By viewing the specimens in cross-section, the presence of large voids is visible in (c) the specimen a-Gefs, but the voids are not present in (d) the specimen with Cofs. The resulting formation of voids in only one of two specimens indicates the free surface has a direct influence of the phase formation process.

 

Citation Information:

[1] K. Opsomer, D. Deduytsche, C. Detavernier, R.L. Van Meirhaeghe, a. Lauwers, K. Maex, and C. Lavoie, Appl. Phys. Lett. 90, 2005 (2007).

[2] W. Knaepen, S. Gaudet, C. Detavernier, R.L. Van Meirhaeghe, J.J. Sweet, and C. Lavoie, J. Appl. Phys. 105, (2009).

[3] T.H. Phung, R. Xie, S. Tripathy, M. Yu, and C. Zhu, J. Electrochem. Soc. 157, H208 (2010).

 

Acknowledgments:

Ce travail a bénéficié d’une aide de l’Etat gérée par l’ANR au titre du programme d’Investissements d’Avenir A*MIDEX portant la référence ANR-11-IDEX-0001-02 


Carlos ALVAREZ (MARSEILLE CEDEX 20), Maxime BERTOGLIO, Khalid HOUMMADA, Alain PORTAVOCE, Ahmed CHARAI
08:00 - 18:15 #6894 - MS03-717 In-Situ Formation of Crystallographically-Oriented Semiconductor Nanowire Arrays via Selective Vaporization.
MS03-717 In-Situ Formation of Crystallographically-Oriented Semiconductor Nanowire Arrays via Selective Vaporization.

Mass production of high-quality semiconductor nanowire arrays (SNAs) with precisely controlled orientation and structure is essential for their application in nanoelectronics and optoelectronics. Here, we present a single-step approach for large-scale fabrication of [0001]-oriented SNAs via direct heating of their bulk components in a H2/Ar atmosphere. Real-time imaging during in-situ SEM experiments clearly demonstrates that the SNAs form through a selective vaporization process with respect to the crystallography of wurtzite crystals. We propose that the selective vaporization relies on the low symmetry of the wurtzite structure with large differences between surface energies of low-index planes. Further, we demonstrate that the approach can be extended to zinc-blende type structures through a cation exchange process. Finally, the high-quality of the SNAs is demonstrated by fabrication of photodetectors that present outstanding optoelectronic performances. We believe that our method represents a transformative new fabrication platform for large-scale fabrication of orientated SNAs with novel functionalities.


Xing HUANG (Berlin, Germany), Yongqiang YU, Travis JONES, Hua FAN, Lei WANG, Jing XIA, Zhujun WANG, Xiangmin MENG, Marc WILLINGER
08:00 - 18:15 #6912 - MS03-719 EELS analysis of cation intermixing around LaAlO3/SrTiO3 interfaces.
MS03-719 EELS analysis of cation intermixing around LaAlO3/SrTiO3 interfaces.

The pioneering work by Ohtomo and Hwang1 reported the formation of an electron gas with a large charge carrier density at the interface between two band insulators, LaAlO3 (LAO) film on SrTiO3 (STO) substrate. However the mechanisms of charge transfer and transport in this system are still not clearly established.

Epitaxial films with 3 and 5 u.c. thickness were grown by Pulse Laser Deposition. The oxygen partial pressure during deposition was fixed at 10-4 Torr, and the temperature reached 750°C. The parameter misfit between the substrate (aSTO = 3.905 A) and the film (aLAO = 3.791 A using a pseudo cubic description) did not induce strain relaxations via interfacial misfit dislocations as no dislocations could be detected along the foil observed for both samples, as seen on Figure 1. The 5 u.c. sample exhibited a conductive interface while for the 3 u.c. film the resistance exceeded our instrumental limits (> 100 MΩ). Thus, consistently with previous studies, the critical thickness lies between 3 and 5u.c. These samples are good candidates to investigate structural and/or chemical differences between conductive and insulating samples.

 EELS profiles across the interface of the selected samples were used to deduce the contribution of Ti3+ to the Ti-L2,3 absorption edges. A minimum valence of Ti3.9+ (+/- 0.05) was found located in the first unit cell below the interface of both samples (Figure 2). This would lead to a maximum theoretical density of free charge carriers of 6.6x1013 (+/- 3.28x1013) cm-2 if we assume that all the carriers originate from Ti4+ reduction. Experimental measurements of Hall coefficient on the 5 u.c. sample below 10 K revealed a 2D charge carrier density (≈ 3x1014 cm-2) that was comparable to theoretical density (3.3x1014 cm-2). However, 2D charge carrier density at room temperature (n > 1.2x1015 cm-2), was much higher than the density calculated based on EELS valence measurements. This suggests that the conduction was not purely bidimensional. The hypothesis of a quasi 2D conduction zone restricted to the first layers above and below the interface, still underestimates the charge carrier density with respect to the Hall measurements This would confirm the 3D nature of the conducting layer. 

At the partial pressure of 10-4 Torr used during the PLD growth, no signature of oxygen vacancies could be detected in the O-K edge recorded in the substrate and around the interface by EELS, as observed on Figure 3. The interfacial O-K EELS spectra reflect intermixing rather than oxygen vacancies. Although a low level of oxygen non-stoichiometry is not excluded, it would be insufficient to explain the sheet resistance measured and the differences between the 3 and 5 u.c. samples.

The full presentation will combine this analysis with elemental profiles and strain analysis obtained by Medium-Energy Ion Scattering (MEIS), and additional electrical measurements to give a rather complete description of these films. Neither electronic reconstruction nor anionic vacancies alone can explain the carrier density observed. Intermixing is demonstrated in the two samples, excluding a donor doping scenario as single mechanism. The measured c/a ratio are larger than those predicted by epitaxial strains obtained from an elastic calculation taking intermixing into account. This indicates that compressive electrostatic forces developed around the interface, and extended deeper into the substrate in the 3 u.c. sample, reducing the confinement and diluting the interfacial charge carrier. A complex competition between donor doping, structural distortions and reconstruction, and ionic compensation is revealed.

We thank the French  METSA network and the European 7th framework program ‘‘ESTEEM2’’ for financial support.


Hicham ZAID, Marie-Hélène BERGER, Richard AKROBETU, Alp SEHIRLIOGLU, Denis JALABERT, Michael WALLS (LPS, Orsay)
08:00 - 18:15 #6937 - MS03-721 Atomic scale study of Cu2O/ZnO heterojunction interfaces by TEM, STEM and DFT.
MS03-721 Atomic scale study of Cu2O/ZnO heterojunction interfaces by TEM, STEM and DFT.

Atomic scale study of Cu2O/ZnO heterojunction interfaces by TEM, STEM and DFT

Sandeep Gorantla1, Jiantuo Gan1, Ole Martin Løvvik1,2, Spyros Diplas2, Kristin Bergum1, Bengt G. Svensson1, Edouard Monakhov1,  Phuong D. Nguyen1, Anette E. Gunnæs1

1 Department of Physics, Center for Materials Science and Nanotechnology, University of Oslo, Norway

2 Department of Materials and Nanotechnology, SINTEF, Oslo, Norway

 

Cuprous oxide (Cu2O) is a low-cost, nontoxic semiconductor interesting for photovoltaic applications. Together with ZnO it forms a p-n junction diode.  With a theoretically estimated conversion efficiency of 18 % [1] it is envisaged as a potential material system for the next generation thin-film based solar cells. However, experimentally reported efficiencies are only 2-5 %. In order to better understand the microstructural factors that limit their practical achievable efficiency, Cu2O/ZnO model systems were grown and studied by conventional TEM and Cs probe corrected scanning TEM (STEM) methods and interfaces evaluated using Density Functional Theory (DFT). For the model systems, c-axis single crystal ZnO substrates (both Zn- and O polar) were used and the Cu2O films were grown by both ceramic and reactive RF magnetron sputtering methods [2]. Cross section specimens were prepared in order to study the films and Cu2O/ZnO heterojunction interfaces.

Regardless of the polarity, in reactive sputtering case, the (111) [1-10] Cu2O || (001) [110] ZnO orientation relation was observed consistent with an epitaxial relationship across the Cu2O\ZnO interface. However, only in O-polar ceramic sputtering case, additional (110) Cu2O || (001) ZnO orientation relationship was also observed. The STEM investigations revealed the presence of an unexpected ~ 5 nm thick polycrystalline interfacial CuO layer between the ZnO substrate and Cu2O film, as shown in figure 1. The presence of CuO is unexpected because the deposition conditions were optimized for the Cu2O film growth. Repeated growth experiments have, however, confirmed the findings.  Interestingly, despite the presence of this interfacial layer, epitaxial twinning of the Cu2O films was observed in all the specimens except for the case with O-polar ZnO, ceramic grown Cu2O film. Also notable, the films grown by reactive sputtering were more dense relative to films grown by ceramic sputtering [2].The CuO grains in the interfacial layer were observed to have certain preferred orientations with respect to the substrate i.e. textured growth. Geometric Phase Analysis evaluation of the CuO/ZnO STEM images clearly showed an array of misfit dislocations along their interface reducing the strain in the epitaxial CuO film, as shown in figure 2. DFT calculations were carried out based on the experimentally observed Cu2O/CuO/ZnO interfaces. It was found that the formation of CuO on ZnO and Cu2O on CuO is energetically favorable compared to the Cu2O/ZnO interface even when dislocations are not taken into consideration on the CuO/ZnO interface. The total lattice strain of (111) Cu2O/ (100) CuO/ (001) ZnO is lower than the calculated lattice strain between (111) Cu2O and (001) ZnO. It can be concluded that the driving force for formation of the ~ 5 nm thick CuO interface layer is strain induced. Such a CuO interfacial layer is detrimental for Cu2O/ZnO p-n heterojunction diode efficiency and its existence can explain the large gap between the experimental and theoretical reported conversion efficiencies.

Acknowledgements: This work was conducted under the research project ES483391 Development of a Hetero-Junction Oxide-Based Solar Cell Device (HeteroSolar), financially supported by the Research Council of Norway (RCN) through the RENERGI program.

[1] T. Minami, Y. Nishi, T. Miyata, App. Phys. Express 6, 044101, 2013.

[2] J. Gan, S. Gorantla, H. N. Riise, Ø. S. Fjellvåg, S. Diplas, O. M. Løvvik, B. G. Svensson, E. V. Monakhov, and A. E. Gunnæs,  App.   Phys. Lett. 2016 (in press).

 

 

 


Sandeep GORANTLA (Oslo, Norway), Jiantuo GAN, Ole Martin LØVVIK, Spyros DIPLAS, Kristin BERGUM, Bengt SVENSSON, Edouard MONAKHOV, Phuong NGUYEN, Anette GUNNAES
08:00 - 18:15 #6988 - MS03-723 Strain measurements at AlGaN/GaN HEMT structures on Silicon substrates.
MS03-723 Strain measurements at AlGaN/GaN HEMT structures on Silicon substrates.

High Electron Mobility Transistors (HEMTs) based on AlGaN/GaN are of great interest due to their high electrical performance and the related applications. The high carrier density, electron mobility, breakdown voltage, and the good thermal stability of AlGaN/GaN are great benefits for high power and high frequency technologies. The high electron mobility is a consequence of a two dimensional electron gas (2DEG) which is formed at the interface between GaN and AlGaN. The source, drain, and gate of the transistors are realized by metal contacts on top of the semiconductor. Strain in the transistor structures may arise due to thermal processing steps or applied passivation layers on top of the HEMT structure. Especially the thermal processes may cause strain due to the mismatch in the coefficients of thermal expansion between the metal contacts and the GaN/AlGaN. Additional stress may be induced by the substrate material. In order to reduce material costs, such as those associated with power electronic applications, the usage of silicon substrates to replace the expensive silicon carbide and sapphire are under development. The disadvantage of GaN on silicon is the lower quality of the deposited AlGaN/GaN layers caused by the mismatch of the lattice parameters which differ by 17%. This can cause higher defect densities and residual strain in the AlGaN/GaN epi-layers.

In this work the local residual strain distribution in the AlGaN/GaN layers of HEMT structures is characterized. Investigations were conducted utilizing Nano Beam Electron Diffraction (NBED) which is a well-established and sensitive method for strain analysis in semiconductors. The experiments were performed with an image Cs-corrected TEM (Titan3 G2 60-300, FEI) equipped with a 3-condenserlens system and a small condenser aperture (10 µm) which is crucial for NBED experiments. The NBED data were further analyzed using the FEI Epsilon Nanobeam Diffraction Strain Analysis Package (v1.1.0.39).

Fig. 1a shows a dark field STEM overview of a normally-on AlGaN/GaN HEMT representing the typical arrangement of the source, gate, and drain metal contacts and the field plate. In Fig. 1b a detailed image of the gate contact can be seen where the AlGaN-layer on top of the GaN substrate is visible. Fig. 1c presents the elemental mapping of the gate Schottky contact in order to depict the different contact metals and partially the field plate. The contact is out of gold with a thin layer of nickel metallization underneath to form the Schottky contact to the active layer. No abnormalities at this gate structure could be found by TEM and EDX analysis. Nevertheless, electrical measurements of the investigated HEMT show a significant gate-drain leakage current. Consequently, despite no irregularities were discovered with high resolution TEM of the interface region of the gate contact, NBED results showed local strain at the area (Fig. 2b). The compressive strain in [002] direction starts at the Schottky interface of the gate structure and runs through the AlGaN layer to the GaN bulk material. This may implicate a low resistance electron path from the gate into the 2DEG and must be further investigated.


David POPPITZ (Halle, Germany), Andreas GRAFF, Michél SIMON-NAJASEK, Mikael BROAS, Frank ALTMANN
08:00 - 18:15 #6153 - MS04-725 Two new microcrystalline (oxo)nitridosilicates with complex crystal structures determined by combination of TEM and synchrotron micro diffraction.
MS04-725 Two new microcrystalline (oxo)nitridosilicates with complex crystal structures determined by combination of TEM and synchrotron micro diffraction.

Nitridosilicates and oxonitridosilicates doped with rare earth elements are well known as luminescent materials, e.g. in phosphor-converted LEDs.[1] The synthesis of such complex multinary materials often leads to inhomogeneous microcrystalline samples that contain unknown compounds. With respect to structure-property relationships, precise structure determination is essential to predict and understand luminescence properties.

Two novel La,Ba-(oxo-)nitridosilicates were found in a microcrystalline sample. They are coherently intergrown which renders structure determination challenging. The two phases were identifies by selected-area electron diffraction (SAED) and X-ray spectroscopy (EDX). Suitable (not intergrown) single crystals of each phase were located in TEM images. Lattice parameters and the chemical composition were determined. Both phases show hexagonal metrics and exhibit the same c lattice parameter; however, they differ in the a lattice parameter and the chemical composition (Fig. 1). Single-crystal data of these crystallites on TEM grids were collected using sub-micron synchrotron beams (ID11, ESRF, Grenoble).[2] Corresponding structure solution yielded two structure models. These were confirmed by HRTEM along characteristic directions, including corresponding simulations, as well as Z-contrast imaging (STEM-HAADF, Fig. 1). The latter shows heavy atom sites (La, Ba). For both compounds, the plane groups of HRTEM images (along [001]: p3) and the symmetry of SAED patterns pointed to the Laue class 6/m. The distribution of elements with lacking scattering contrast such as O/N and Ba/La on mixed occupied sites were analyzed by bond-valence sum calculations.

The oxonitridosilicate Ba24La54Si129N240O3 (a = 17.49 Å, c = 22.70 Å) shows an interrupted, centrosymmetric 3D framework of vertex- and edge-sharing Si(O,N)4 tetrahedra. The crystal structure can be described assuming two slab-like building blocks (Fig. 2A). Slab a consists of two layers of dreier rings that are interconnected via pairs of Si(O,N)4 tetrahedra. Slab c forms asymmetric dreier, vierer, fünfer, sechser and siebner rings of Si(O,N)4 tetrahedra and contains the edge-sharing Si(O,N)4 tetrahedra. These two blocks are interconnected via an additional layer (part b) that formally consists of isolated groups of four Si(O,N)4 tetrahedra.

The second phase is a nitridosilicate (Ba29La80Si173N330 with a = 20.19 Å, c = 22.68 Å). Comparable to Ba12La14Si43N76O5, the crystal structure consists of an interrupted 3D network of SiN4 tetrahedra, which can also be divided in different parts. The main difference is part c, especially concerning the arrangement and linkage of the edge sharing SiN4 tetrahedra. The difference is caused by the pairs of Si(O,N)4 tetrahedra parallel to (Fig. 2B, white tetrahedra) in Ba24La54Si129N240O3 which are replaced by three SiN4 tetrahedra linked over one Si atom (Fig. 2C) in Ba29La80Si173N330. The pronounced tendency towards intergrowth of both phases is due to the fact that part a and b are very similar in both structures.

[1]        M. Zeuner, S. Pagano, W. Schnick, Angew. Chem. Int. Ed. 2011, 50, 7754-7775.

[2]        F. Fahrnbauer, T. Rosenthal, T. Schmutzler, G. Wagner, G. B. M. Vaughan, J. P. Wright, O. Oeckler, Angew. Chem. 2015, 127, 10158-10161; Angew. Chem. Int. Ed. 2015, 54, 10020-10023.


Lukas NEUDERT (Munich, Germany), Schultz PETER, Dajana DURACH, Oliver OECKLER, Wolfgang SCHNICK
08:00 - 18:15 #6181 - MS04-727 Defects and strain analysis of GaAs/Si nanostructures from high-resolution HAADF-STEM images.
MS04-727 Defects and strain analysis of GaAs/Si nanostructures from high-resolution HAADF-STEM images.

The increasing demand for high-performance, ultra-small size electronics and photonics requires the development of new nanostructured materials. Promising candidates for this purpose are monolithically integrated GaAs nanocrystals, selectively grown by metal organic vapor phase epitaxy (MOVPE), on top of Si nano-tips and nano-pillars (Fig. 1,2) with ~ 60 nm and ~ 40 nm diameter, respectively. Growth on substrate nanopatterns eliminates threading dislocations similar to “aspect ratio trapping” in submicron trenches and pits [1]. It may even prevent plastic strain relaxation by misfit dislocations in contrast to the growth of thin films on planar substrates by taking advantage of the compliant substrate effects [2]. Consequently, it is important to study the local atomic defects at the GaAs/Si interface and their evolution with changing shape/size of the substrate pattern, and to analyze the residual elastic strain of the grown crystals by means of the scanning transmission electron microscopy (STEM) technique in order to find the maximum crystal size below which elastic relaxation is favorable.

STEM investigation of the GaAs/Si nanostructures has been performed on lamellas prepared by focused ion beam (FIB). From the analysis of aberration-corrected high-resolution high-angle annular dark-field (HAADF) STEM images the presence of 60º misfit dislocations (MDs), as well as 90º and 30º Shockley misfit partial dislocations (MPDs) at the GaAs/(001)Si tip interface has been revealed (Fig. 3). The latter generate extrinsic and intrinsic stacking faults, respectively, which propagate through the entire crystal. Gliding of a group of 30º Shockley MPDs along parallel successive slip planes produces a nanotwin. In the GaAs crystals grown on (001) Si pillars two intrinsic stacking faults, lying in {111}-type planes, meet at the interface and build a V-shaped defect (Fig. 4). According to the literature [3], such V-shaped configuration of stacking faults suggests their formation upon island coalescence. These stacking faults border at the interface a stair-rod dislocation, which is formed by the interaction of two 30º Shockley MPDs located in the Si pillar. Among the observed defects, the most efficient ones for relaxing misfit strain are 60º MDs, whereas 30º MPDs release strain only partially. Geometrical phase analysis (GPA) [4] has been also applied to estimate the misfit strain in the GaAs crystals.

[1] J.G. Fiorenza et al., ECS Trans. 33 (2010) 963-976.

[2] P. Zaumseil et al., J. Appl. Phys. 112 (2012) 043506.

[3] E.W.Z. Liliental-Weber, J. Washburn, Defect Control in Semiconductors, edited by K. Sumino, Elsevier, Amsterdam, (1990) pp. 1295-1305.

[4] M.J. Hÿtch et al., Ultramicroscopy 74 (1998) 131-146.


Roksolana KOZAK (Dübendorf, Switzerland), Ivan PRIETO, Oliver SKIBITZKI, Yadira ARROYO-ROJAS DASILVA, Marta ROSSELL, Rolf ERNI, Thomas SCHROEDER, Hans VON KÄNEL
08:00 - 18:15 #6202 - MS04-729 Revisiting the EELS analyses and its coupling with multi-wavelength Raman spectroscopy: the case of hydrogenated amorphous carbon thin films.
MS04-729 Revisiting the EELS analyses and its coupling with multi-wavelength Raman spectroscopy: the case of hydrogenated amorphous carbon thin films.

       Thanks to the long-term stability of their properties, hydrogenated amorphous carbon (a:C-H)  thin films are very promising materials for numerous applications including coatings for spatial applications.1 In order to improve their performances, a full understanding of their local chemistry is highly required. Fifteen years ago, according to the seminal work of Ferrari et al.,2 EELS was the most used technique to get such kind of quantitative information on these materials. Nowadays the complexity of the physics phenomena behind EELS is well known3 and this technique is regarded as time-consuming and difficult to interpret properly. Other optical techniques such as Raman spectroscopy are now clearly favored by the scientific community. However they still lack of the spatial resolution that EELS in a STEM offers for getting direct chemical information.

      

       a-C:H thin films, with a thickness around 300 nm, were deposited on a Si wafer and submitted to isothermal annealing at 500°C with different annealing times up to 2500 minutes. The hydrogen content was monitored by multi-wavelength (MW) Raman using a set of reference materials. To determine the sp2 fraction (sp2 %) from core-loss EELS, the R ratio (R = Iπ*(ΔE)/I(π*(ΔE)+σ*(ΔE)) was determined first by taking into account the asymmetry of the π* character (Fig. 1a).4,5 This value was then normalized by the maximum R value (RREF) that could be obtained from a HOPG sample in the same experimental condition using relativistic calculations (Fig. 1b).6 When needed, this method was also slightly modified to take into account the contribution of heterospecies. In addition, the mass density and the oxygen content was derived from low-loss and core-loss spectra, respectively.

 

       The EELS C-K edge spectra (Fig. 2a) present all a typical signature of amorphous carbons. However, the intensity of the massif above 292 eV differs from sample to sample and clearly highlights a slight variation of the sp2 %. The samples annealed 2500 min also presents a supplementary peak (red arrow in Fig. 2a), which is related to the oxidation of the thin film. As expected, the sp2 % increases with the annealing time (Fig. 2b). This effect is related to the H desorption of the thin films as monitored by Raman spectroscopy. Two samples do not follow this trend: the as-deposited sample and the sample annealed 2500 minutes. This latter presents a strong oxidation, leading to a decrease of the sp2 %. On the other hand, the as-deposited sample shows variation of the C-K edge fine structures (Fig. 3a) highlighting chemical inhomogneities in the thin film. This sample presents a strong gradient of the sp2 % induced by the deposition process (Fig. 3b) which is cured with the annealing time.

              All these results will be detailed together with the influence of the oxidation on the chemical and physical properties. In addition, the coupling of MW Raman, infrared and EELS spectroscopies to extract a wealth of chemical information will be discussed. Our results provide a complete combination of C-hybridization, spatial elemental analyses and structural defects studies for shedding light on these complex materials.7,8

 

1. A. Rusanov et al., Carbon. 81, 788–799 (2015) ; 2. A.C. Ferrari et al., Phys. Rev. B 62 (16), 11089 (2000) ; 3. P. Schattschneider et al., Phys. Rev. B 72, 045142 (2005) ; 4. N. Bernier et al., J. Electron Spectrosc. Relat. Phenom. 164, 34–43 (2008) ; 5. J. Titantah, D. Lamoen, Phys. Rev. B. 70, 075115 (2004) ; 6. F. Bocquet et al., Ultramicroscopy. 107 81–94 (2007); 7. L. Lajaunie, C. Pardanaud, C. Martin, P. Puech, C. Hu, M.J. Biggs and R. Arenal, Submitted; 8. We acknowledge funding from the EU under Grant Agreement 312483-ESTEEM2, Grant Agreement 604391 Graphene Flagship and the Spanish Ministerio de Economia y Competitividad (FIS2013-46159-C3-3-P).


Luc LAJAUNIE (Zaragoza, Spain), Cédric PARDANAUD, Céline MARTIN, Puech PASCAL, Cheng HU, Mark James BIGGS, Raul ARENAL
08:00 - 18:15 #6269 - MS04-731 Unusually high iron enrichment in hard dental tissues of coypu.
MS04-731 Unusually high iron enrichment in hard dental tissues of coypu.

Living organisms possess a unique capability to form complex bio-minerals with very diverse compositions and structures. Organic matrix and crystalline constituents are closely linked together in unique material constructions that are formed under conditions of moderate temperature, pressure and pH value. Many of these bio-minerals show excellent physical and mechanical properties [1, 2] that cannot be reproduced in the laboratory.   

Rodents have long opposing pairs of continuously growing incisors that are worn down by gnawing. The front surface of the incisors is enamel consisting of 96 wt% of inorganic material; the inner part is softer dentine that forms the bulk of the teeth [3]. The surfaces of incisors of different rodent species show a characteristic orange-brown color and are identified with the presence of iron [4].

In our study, the microstructure and the chemical composition of continuously growing incisors from the coypu (Myocastor coypus Molina) were investigated in detail using energy-dispersive X-ray spectroscopy (EDX) and electron energy-loss spectroscopy (EELS) combined with scanning transmission electron microscopy (STEM) imaging at high spatial as well as high energy resolution. VG HB501UX, Zeiss SESAM and Jeol ARM200F microscopes were used and the resulting data were combined with knowledge obtained from mechanical testing experiments.

A layer with variable thickness, which has not been observed before, was detected on the outer surface of the incisors as marked on the optical micrograph image (Fig. 1). An annular dark field (ADF)-STEM image of a cross-sectional view showing the interface between the Fe-rich surface layer (Fe-SL) and Fe-rich enamel (Fe-E) is shown in Figure 2a. Analytical investigations of this surface layer showed much higher amounts of iron compared to the concentration values reported in the literature up to now. Within the iron-rich surface layer we surprisingly detected multiple iron containing varieties where iron is present in predominantly the 3+ valence state, as revealed by studies of electronic structure. O-K fine structural features suggest the presence of different intermixing levels of Fe phosphate and Fe oxide/hydroxide (Fig. 2b).

The present discoveries will greatly enhance the understanding of the function of the incorporation of iron at the nanoscale level and its effect on the microstructural properties.

 

[1] UGK Wegst and MF Ashby, Philos Mag 84 (2004), 2167.

[2] AP Jackson and JFV Vincent, J Mater Sci 25 (1990), 3173.

[3] BA Niemec in “Small animal dental, oral & maxillofacial disease” (2010), Manson Publishing Ltd, London.

[4] EV Pindborg JJ Pindborg and CM Plum, Acta Pharmacol 2 (1946), 294.


Vesna SROT (Stuttgart, Germany), Ute SALZBERGER, Birgit BUSSMANN, Julia DEUSCHLE, Masashi WATANABE, Bostjan POKORNY, Ida JELENKO TURINEK, Alison F. MARK, Peter A. VAN AKEN
08:00 - 18:15 #6294 - MS04-733 Morphologies of a solvent cast polystyrene-polybutadiene-polystyrene (S-B-S) triblock copolymer characterised by TEM, AFM and Energy Filtered SEM.
MS04-733 Morphologies of a solvent cast polystyrene-polybutadiene-polystyrene (S-B-S) triblock copolymer characterised by TEM, AFM and Energy Filtered SEM.

The most common method of characterisation of the morphologies of block copolymers is transmission electron microscopy (TEM) of ultrathin sections because of the nanoscale of the domains in the morphologies of this block copolymer[1]. The contrast of polymer phases is often enhanced by heavy metal element staining using, typically, OsO4. TEM provides imaging at high resolution at the cost of time-consuming and challenging specimen preparation by cryo-ultramicrotoming and the negative staining which is not only toxic but also introduces artifacts[2]. Furthermore, the 2D projection by TEM imaging makes direct interpretation of a nanoscale complex material difficult when the specimen sections thickness (~100nm) is considered. Atomic force microscopy (AFM) can characterise a multiphase material by detecting localised variation in mechanical properties, e.g. friction, adhesion and modulus, and has been used to identify the morphology in block copolymers in some recent studies without staining [3]. Combined AFM and TEM characterisation of multiphase copolymers has been developed to characterise the complex microstructures of block polymers in a complementary way [3,4]. Novel holders were designed to facilitate sample preparation for both techniques and to direct correlation of the topographical information provided by the AFM better to interpret the two-dimensional images provided by TEM. However, the lateral resolution of AFM is significantly worse than TEM limited by the scanning tip although the depth resolution is super. An alternative approach is to use the recent energy-filtered scanning electron microscopy (EFSEM) technique, which is based upon the energy spectroscopy of detected secondary electrons (SE)[5].  In this work, the S-B-S triblock copolymer cast from toluene, cyclohexane and ethyl acetate was characterised in order to understand the effect of casting solvent on the solid state morphology of this triblock copolymer. The morphology varies from continuous to spherical and lamella structures ranging from a few nm to ~100nm. Preliminary results have shown complementary morphologies provided by AFM and TEM, as shown in Figures 1 and 2. The contrast mechanisms from the three methods and consequences for the morphology determination will be discussed, as well as the sample preparation methods.

References:

1, L.C.Sawyer, D.T.Grubb, G.F.Meyers. Polymer Microscopy,3rd ed.,Springer-Verlag, 2008 (Chapter4).

2,T.M.Chou, P.Prayoonthong, A.Aitouchen, M.Libera. Nanoscale artifacts in RuO4-stained poly(styrene), Polymer 43(2002), 2085–2088

3, H.Ott, V.Abetz, V.Altstadt, Y.Thomanna, A.Pfau. Comparative study of a block copolymer morphology by transmission electron microscopy and scanning force microscopy. J Microsc. 205 (2002), 106–108.

4, Y.Thomann, R.Thomann, M.Ganter, G.Bar, & R.Mühlhaupt, Combined ultramicrotomy for AFM and TEM using a novel sample holder. J. Microsc.195 (1999), 161–163.

5. R.C.Masters, A.J.Pearson, T.S.Glen, F.-C. Sasam, L. Li, M. Dapor, A.M. Donald, D.G. Lidzey, C.Rodenburg. Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy. Nature communications 6(2015):6928 


Zhaoxia ZHOU (Loughborough, United Kingdom), Scott S DOAK, Dave B GRANDY, Kerry J ABRAMS, Cornelia RODENBURG, Nicole WESTON, Douglas J HOURSTON
08:00 - 18:15 #6295 - MS04-735 Valence states of new Mn coordination sites at the ferromagnetic domain walls of TbMnO3 thin films.
MS04-735 Valence states of new Mn coordination sites at the ferromagnetic domain walls of TbMnO3 thin films.

Bulk TbMnO3 is a classic multiferroic material that combines antiferromagnetic ordering below 42 K and, below 27 K, a spin spiral transition with inversion symmetry breaking below 27 K that causes ferroelectricity [1]. However, it was recently demonstrated that strained TbMnO3 thin films grown on SrTiO3 (001) display an induced ferromagnetic behavior absent in the bulk material. This net magnetic moment arises from a two-dimensional ferromagnetic phase synthesized at the ferroelastic (orthorhombic) domain walls (DW), which nucleate to accommodate the huge epitaxial strain induced by the substrate, and thus, scales with the DW density [2]. These ferromagnetic DWs are characterized by a spatially-ordered substitution of alternate Tb sites by Mn atoms along the pseudocubic [100] growth direction, inducing magnetic frustration and a spin canted ferromagnetic ground state. First-principle calculations point to two different types of Mn atoms occurring at the boundary planes, Mn(I) and Mn(II), with different magnetic moments and crystal environments, i.e. tetrahedral and a quasi-square-planar O coordinations, respectively [see Fig.1(a)].

 

This work presents the detailed aberration-corrected Scanning Transmission Electron Microscopy (STEM) study of the different structural environments and electronic properties of Mn cations located at the Tb sites of the DW structure. For this purpose, atomically resolved High Angle Annular Dark Field (HAADF), Annular Bright Field (ABF) imaging and fine structure Electron-Energy Loss Spectroscopy (EELS) in plane view and cross sectional configurations have been combined. ABF imaging evidences that the two first neighbor O coordinations for Mn(I) and Mn(II) sites predicted theoretically are present in plane-view specimens, see Fig. 1(b). Furthermore, the analysis of the O K edge fine structure has allowed us to map the nominal Mn oxidation state [3] using atomic-resolution STEM-EELS, see Figure 2. This experiment has confirmed the decrease of the overall Mn valence at the domain wall previously reported and a fine modulation of the electronic state between the tetrahedrally-coordinated Mn(I) and the square-planar-coordinated Mn(II) replacing Tb cations, as predicted by DFT calculations.

 

References

[1] Y. Kimura et al., Nature 426, 55 (2003).

[2] S. Farokhipoor, C. Magén, et al., Nature 515, 379 (2014).

[3] M. Varela et al., Physical Review B 79, 085117 (2009).


Roger GUZMAN, Jorge IÑIGUEZ, Saeedeeh FAROKHIPOOR, Beatriz NOHEDA, César MAGÉN (Zaragoza, Spain)
08:00 - 18:15 #6306 - MS04-737 Quantitative analysis of a model pharmaceutical material, theophylline, by transmission electron microscopy.
MS04-737 Quantitative analysis of a model pharmaceutical material, theophylline, by transmission electron microscopy.

Modern electron microscopy (EM) techniques and hardware offer some of the highest attainable spatial resolutions for crystal imaging, making EM one of the best tools for microstructural analysis of a wide variety of materials. Organic materials, specifically pharmaceuticals, for which microstructure is a key part of their functionality would make ideal candidates for EM analysis, as it could provide useful feedback at various stages during drug development to check the presence of desired crystalline polymorphs, assess mixing quality, quantify crystal lattice defects and identify contamination. However, the major drawback to the use of EM is the high sensitivity of organic crystalline materials to electron beam exposure. Employing fluence rates that are typically used for inorganic samples would destroy all traces of crystallinity in most pharmaceutical materials[1]. Low-dose techniques have been used for many years to analyse beam sensitive samples[2] using EM, but with recent improvements in CCD camera sensitivities, microscope stabilisation and current control, combined with existing low-dose techniques, there is great opportunity for EM to be used for detailed organic materials analysis. Initially, the limits and flexibility of low-dose techniques need to be tested and documented, both qualitatively and quantitatively. From this, a deeper understanding of the damage mechanisms at play can be drawn out, informing on the limits of organic crystalline materials analysis by EM and indicating appropriate damage mitigation strategies which could be employed in future studies.

 
Initial experiments with a model pharmaceutical, theophylline, observed by transmission electron microscopy (TEM) considered the effects of changing sample and electron beam conditions[3]. The aim was to determine the conditions which resulted in the highest critical dose (CD) (the dose where the intensity in a given diffraction spot decays to 1/e of its highest value). Since then, further experiments have been undertaken, including tests at 300 kV and a range of temperatures, from 93 K to 423 K. The ideal conditions identified use a high accelerating voltage with a graphene support for improved heat and electronic conduction, at a reduced sample temperature if necessary (only minor CD improvement in theophylline). Figure 1 shows the critical doses measured for the selection of variables investigated. Using this knowledge of theophylline’s limits, lattice imaging has been attempted using a number of different techniques. Both bright field TEM and STEM imaging modes have been used and their results compared. Figure 2 shows a bright field STEM image of theophylline. Of note is that STEM results were acquired at a total electron fluence several times higher than the average CD of theophylline in TEM mode, suggesting an inherent damage reduction when analysing organic samples in STEM mode. Future work will focus on the use of improved hardware for direct lattice imaging in low-dose TEM and determining the best conditions for STEM mode to exploit the potential differences between imaging modes.

 
The authors would like to thank Dr. Ian Ross of the University of Sheffield, and Prof. Bill Jones and Dr. Mark Eddleston of the University of Cambridge.

 
[1] M S’ari, J Cattle, N Hondow, H Blade, S Cosgrove, RMD Brydson, AP Brown, ‘Analysis of Electron Beam Damage of Crystalline Pharmaceutical Materials by Transmission Electron Microscopy’, Journal of Physics: Conference Series, 644, (2015)
[2] DT Grubb, ‘Radiation Damage and Electron Microscopy of Organic Polymers’, Journal of Materials Science, 9, 1715 – 1736, (1974)
[3] J Cattle, M S’ari, N Hondow, P Abellán, A Brown, R Brydson, ‘Transmission Electron Microscopy of a Model Crystalline Organic, Theophylline’, Journal of Physics: Conference Series, 644, (2015)
[4] J Cattle, M S’ari, N Wilkinson, N Hondow, A Brown, R Brydson, ‘Prospects for High Resolution Analytical Electron Microscopy of Organic Crystalline Materials’, Microscopy and Microanalysis, 21, (2015)


James CATTLE (Leeds, United Kingdom), Mark S'ARI, Patricia ABELLÁN, Quentin RAMASSE, Nicole HONDOW, Andy BROWN, Rik BRYDSON
08:00 - 18:15 #6322 - MS04-739 Electron microscopy analysis of flash-annealed CuZr based bulk metallic glass.
MS04-739 Electron microscopy analysis of flash-annealed CuZr based bulk metallic glass.

Bulk metallic glass (BMG) is an amorphous material with no long-range order. Still, topological and chemical short-range or medium-range order is expected to occur. The unique atomic structures of BMG lead to interesting physical and mechanical properties that make them useful for potential applications. To circumvent the limited ductility of BMG, the concept of heterogeneous microstructure by forming composites has recently been used [1]. One route to achieve a composite structure is thermal treatment of the BMG. Here we present the structure of flash-annealed CuZr based BMG studied by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) methods including electron diffraction and fluctuation electron microscopy (FEM).

During the flash-annealing process the structure of BMG samples is modified by heating to different target temperatures above glass transition temperature and subsequent rapid cooling in a water bath leading to changes in the atomic structure. Cu44Zr44Al8Hf2Co2 samples heated to 898 K and 916 K with a mean rate of 67 K/s were studied in a Zeiss Supra 55VP SEM at 20 kV as well as a Philips CM200 TEM operating at 200 kV.

SEM observation of the 916 K sample using back-scattered electrons reveals both an amorphous and a crystalline part each taking up about 50 percent of the sample with a transition area of amorphous material containing crystallites of different size in between (Figure 1). Figure 2 results from the TEM study of a FIB lamella prepared from a single crystallite as shown in Figure 1. The associated diffraction pattern (DP) with superlattice reflections indicates the presence of the B2 ordered structure. It is interesting to note that in crystalline CuZr based materials, devitrified from the amorphous structure, Cu10Zr7 and CuZr2 structures are expected to occur.

To obtain structural information of the samples flash-annealed to 898 K, fluctuation electron microscopy was applied since no indication of crystallization was found. Figure 3a illustrates a corresponding DP with integrated intensity using the software PASAD [2] indicating a fully amorphous structure. Tilted dark field (DF) images show intensity variations in form of speckles as a result of local structural correlations (Figure 3b). Statistical analysis of a series of DF images acquired at different scattering vectors k and angles φ yields mean intensity and normalized variance as a function of k. The normalized variance is defined as V(k) = (<I(k,r)²>/<I(k,r)>²) – 1, with I being the image intensity and <> meaning the average over sample position r. Figure 4 shows intensity and variance curves for the 898 K sample using an objective aperture of 10 µm. While the maximum of mean intensity is located at about 4.0 nm-1 the normalized variance shows a significant shift to larger k values. Similar curves were obtained using different spatial resolution by varying the objective aperture size.

Based on our results flash-annealing of CuZr based BMGs facilitates the formation of the B2 ordered crystalline structure as a metastable phase. In the amorphous phase of all samples the presence of a significant medium range order can be concluded from peaks in the normalized variance curve of DF FEM analysis. The maxima position of the normalized variance (~ 5 nm-1) is different to that found in Zr50Cu45Al5 BMG at about 4.0 nm-1 reported in literature [3].

 

We kindly acknowledge financial support by the Austrian Science Fund (FWF): [I1309, J3397].

 

References

[1] J. Eckert, J. Das, S. Pauly, C. Duhamel, Journal of Materials Research 22, 285 (2007).

[2] C. Gammer, C. Mangler, C. Rentenberger, H. P. Karnthaler, Scr Mater 63, 312 (2010).

[3] J. Hwang, Z. H. Melgarejo, Y. E. Kalay, I. Kalay, M. J. Kramer, D. S. Stone, P. M. Voyles, Phys. Rev. Lett. 108, 195505 (2012)


Christoffer MÜLLER (Mödling, Austria), Christian EBNER, Christoph GAMMER, Konrad KOSIBA, Benjamin ESCHER, Simon PAULY, Jürgen ECKERT, Christian RENTENBERGER
08:00 - 18:15 #6423 - MS04-741 Phase identification of complex grain boundary precipitation in a high Cr and Ni superalloy upon direct-aging.
MS04-741 Phase identification of complex grain boundary precipitation in a high Cr and Ni superalloy upon direct-aging.

The need for corrosion-resistant alloys applied to support increasingly harsh environments at high temperatures resulted in the development of high chromium-containing nickel-base superalloys. It is well established in several complex multicomponent alloy systems, the concurrence of several modes of precipitation phenomena. Perhaps the most intriguing is the occurrence of concomitant general precipitation (GP, homogenous and heterogeneous) and discontinuous mode of precipitation (DP). While the former is controlled by lattice diffusion the latter is driven by grain boundary (GB) diffusion and migration. It is well established that the mechanical and corrosion properties depends critically on the phase stability under service conditions. This study is focused on identification of the different phases precipitated at a specific grain boundary.  Here, the precipitation takes place in an high performance superalloy 33 with austenitic matrix and chemical composition (wt.%) of 32,75Cr-32,53Fe-31,35Ni-1,49Mo-0,54Cu-0,4N-0,012C-0,63Mn-0,30Si. For this purpose, a JEOL JEM-ARM200CF aberration-corrected scanning transmission electron microscope (STEM) has been used at Lehigh.

Figure 1A presents a complex precipitation product at a specific GB in this alloy upon direct-aging at 700 °C for 100 h. Different phases have nucleated and grown, driven by the diffusion of a moving GB. The two diffraction patterns of Figs 1B and 1D correspondto both grains across the GB and the dark field (DF) TEM image of Fig. 1C shows the adjacent grain being consumed by the advancement of the GB reaction front of the DP.  In a previous study [1], X-ray elemental maps show the degree of partition of different substitutional elements (Fe, Ni, Cr, Mo) and interstitial N. In fact, one can identify more than two phases in this precipitate colony. In general, such complex GB precipitation products depend on the structure and thermodynamic properties of individual GBs [2].

Figure 2 shows a high angle annular dark field (HAADF) image of the region boxed in red in Fig. 1A.  This TEM session was conducted in a ChemiSTEM FEI Titan at UFRJ with the foil upside down respect to Fig 1A. This study reveals that the discontinuous precipitation at grain boundary results in three different phases. The precipitate indicated by n° 1 at the GB reaction front itself has been identified as η phase, Cr3Ni2SiN, with diamond cubic crystal structure. At the original position of the GB, however, two different phases have precipitated: precipitate n° 2 is a M23C6 carbide with FCC structure and precipitate n° 3 is an intermetallic σ phase with tetragonal structure. The precipitation of the latter is associated with embrittlement [3]. XEDS spectra and elemental mapping have corroborated such phase identification [1].

References

[1] Spadotto, J.C., Watanabe, M., Solórzano, I.G. (2016). Submitted to Microscopy&Microanalysis 2016.

[2] Solorzano, I. G., Purdy, G. R., Weatherly, G. C. (1984). Acta Metall. 32, 1709–1717.

[3] Sourmail, T. (2001). Mater. Sci. Technol. 17, 1–14.

Acknowledgements: This research was sponsored by CNPq (Brazil) and NSF-MWN (US: DMR-0303429) joint CIAM Program. One co-author acknowledges the financial support from FAPERJ. The authors are grateful to the Nucleo de Microscopia Electronica (UFRJ) for access to their TEM.


Julio Cesar SPADOTTO, Masashi WATANABE, Jean DILLE, Ivan Guillermo SOLÓRZANO (Rio de Janeiro, Brazil)
08:00 - 18:15 #6444 - MS04-743 Effect of processing parameters on microstructure and mechanical properties of additively manufactured stainless steel.
MS04-743 Effect of processing parameters on microstructure and mechanical properties of additively manufactured stainless steel.

Additive manufacturing (AM) allows for the building up of bulk structures through the fusion of powder particles layer by layer using a high power laser. This novel technique is practical for the fabrication of complex structures without any mold or tool, but this flexibility is accompanied by the delicate balance of AM processing and post-processing parameters which are to be optimized to ensure the desired microstructure in order to obtain the required mechanical properties [1-4]. The current study is aimed at understanding the effect of the AM processing parameters used for the preparation of AM samples on the resulting microstructure, its anisotropy according to growth direction, as well as its implications on the mechanical properties.

Bulk structures of conventional 316L grade stainless steel (with Cr-16.5-18.5%, Ni-10-13%, Mo 2-2.5%, traces of Mn, Si, P, S, C)  were produced by AM through selective laser melting (SLM), followed by an annealing heat treatment for material internal stress release. Two sets of processing conditions with variations in parameters such as the incident laser energy, the laser spot size and the direction of growth were varied, and the resulting effect on the microstructures both before and after the heat treatment are studied through diverse microscopy techniques such as SEM, EBSD and TEM. The variation in the phase distributions, grain size and porosity are analyzed as a function of the process parameters. Mechanical properties are measured by tensile tests completed by microhardness. Additionally, XRay Diffraction (XRD) has been used for identifying the phases present in the alloy and also for measuring residual stress and crystallographic texture.

The presence of the pores with unmolten particles has been observed in all samples produced with lower laser energy (Fig. 1). Alongside, the layers formed immediately on top of such pores show different microstructure, with the new phase observed consistently on the same side of the porosity in all samples (Fig. 2). The origin of this phase separation is expected to be from the differential heat dissipation (during fabrication) through the pore as opposed to the bulk material. The mechanical properties of the bulk structures (tensile stress, microhardness) showed that increasing the laser power results to an increase in the yield point. Fracture surface (Fig. 3) shows clearly presence of the pores which influences largely the mechanical properties such as ductility.

Overall, through the variation of the process parameters, the trend in evolution of the microstructural and mechanical properties is elucidated aimed at optimizing the parameters for AM products of 316L stainless steel.

  1. H. D. Carlton, A. Haboub, G. F. Gallegos, D.Y. Parkinson, A. A. MacDowell, Materials Science & Engineering A, 651 (2016) 406–414

  2. J. A. Cherry, H. M. Davies, S.Mehmood, N. P. Lavery, S. G. R. Brown, J. Sienz, International Journal of Advanced Manufacturing Technology, 76 (2015) 869–879

  3. T. M. Mower, M. J. Long, Materials Science & Engineering A, 651 (2016) 198–213

  4. A. Yadollahi, N. Shamsaei, S.M.Thompson, D.W.Seely, Materials Science&EngineeringA, 644 (2015) 171–183


Kaushik VAIDEESWARAN (Neuchâtel, Switzerland), Olha SEREDA, Youness ZANGUI, Hervé SAUDAN, Lionel KIENER, Massoud DADRAS
08:00 - 18:15 #6518 - MS04-745 Temperature rise during laser-induced self-organization of nanoparticle gratings revealed by Raman microspectroscopy and electron microscopy.
MS04-745 Temperature rise during laser-induced self-organization of nanoparticle gratings revealed by Raman microspectroscopy and electron microscopy.

Self-organization of metallic nanoparticles (NPs) has recently been reported upon visible continuous-wave (cw) laser exposure [1]. The self-organized structures are Ag NP gratings embedded in a thin TiO2 film deposited on glass. Such composite structures exhibit singular visual effects that can find applications in secured traceability. The related optical properties directly depend on the NP size distribution, the average grating period, the organization rate and the TiO2 thickness and refractive index. These sample features appear to be largely controlled by the temperature rise that occurs during the laser-induced self-organization process. The aim of the present contribution is to estimate the plasmon-induced temperature rise which appears to be strongly influenced by the laser scanning speed. To do so, Raman microspectroscopy and various modes of transmission electron microscopy (TEM) are used. The latter allow accurate information to be acquired on the NP size distributions resulting from different temperature rises, on their localization in the film and on the phase and chemical changes that occur in the film and the substrate surrounding NPs. Finally, we show how such thermal effects can be considerably decreased when using femtosecond (fs) laser pulses to initiate the NP self-organization.

The TiO2 thin layer used in this work is initially mesoporous and amorphous and contains small silver NP of 1-3 nm as described in a previously published article [1]. The self-organized growth of silver NPs is implemented by scanning a laser beam focused on the sample surface at a constant speed. Post mortem Raman microspectroscopy shows that TiO2 remains amorphous or adopt successively anatase, both anatase and rutile or only rutile crystalline forms for increasing laser scanning speeds, which was confirmed by high resolution TEM micrographs. Further in situ Raman microspectrocopy characterizations also attest an increase in temperature from 200°C to 750°C from low speed to higher speed in a range where anatase is formed; This increase of the temperature when the scanning speed increases was totally unexpected.  In addition to TEM crystallographic characterization, scanning electron microscopy (SEM) appeared to be useful to identify different morphologies for anatase and rutile nanocrystals and to study changes in the nanocrystal density as a function of speed.

Scanning TEM (STEM) micrographs and electron energy loss spectroscopy (EELS) analysis of sample cross-sections prepared by focused ion beam (FIB) give further interesting information about the in-depth structure of samples. Ag nanoparticles are located below the TiO2 film (Fig. 1a) made of TiO2 nanocrystals immersed in a Si-based amorphous phase, in a new interfacial thin amorphous layer mixing both Ti from the initial film and Si from the glass substrate (Fig. 1b). A three-dimensional reconstruction of the film sample from a series of FIB-SEM experiments confirms that all Ag NPs are rather spherical and located in a single plane just below the nanocrystalized TiO2 layer. High angle annular dark field scanning TEM (HAADF STEM) imaging was used to study systematically non-monotonous changes in the NP size distribution with the temperature rise for many samples.

All studies that we have performed so far point out that the temperature rise can be considered as a drawback since it affects the integrity of the supporting material; we present here few results obtained with fs laser pulses in order to investigate a way to self-organize metallic NPs without high temperature rise in order to preserve the substrate and give the ability to work on softer substrates like plastic ones. Self-organization can successfully be obtained without altering the substrate top surface (Fig. 1 c-d). Ag NPs remain localized in the TiO2 films, which is only locally crystallized around the grown NPs, as attested by STEM-diffraction maps recorded in TEM.

To conclude, this paper demonstrates the interest of a multimodal application of TEM techniques in order to provide a thorough study of the 3D nanostructure and chemical composition of complex samples made of Ag NP gratings embedded in a nanocrystallized TiO2film, which result from laser-induced self-organization processes. It provides crucial information on thermal effects that drive the laser-induced self-organization process.


Z. LIU, G. VITRANT, L. SAVIOT, M. MARCO-DE-LUCAS, T. EPICIER, M. BUGNET (Ontario, Canada), Y. LEFKIR, S. REYNAUD, J. SIEGEL, M. GARCIA-LECHUGA, J. SOLIS, N. DESTOUCHES
08:00 - 18:15 #6519 - MS04-747 Deconvolution of EDS steel spectra using low acceleration voltages and low energy X-ray lines.
MS04-747 Deconvolution of EDS steel spectra using low acceleration voltages and low energy X-ray lines.

One of the most important materials used in industry is steel. Its fine microstructure consisting of different phases and inclusions, has led to the development of new steel alloys that push the analytical requirements for spatial resolutions down to the 100 nm scale. In X-ray microanalysis either using energy or wavelength dispersive spectrometry (EDS, WDS), low accelerating voltages, e.g. ≤ 6 kV, can fulfill this requirement. At low accelerating voltages only the L lines for most steel alloying elements (e.g. Cr, Mn, Fe, Co, Ni) can be determined as their K lines can no longer be excited. Qualitative and quantitative analysis of low energy L lines is very challenging due to the presence of absorption edges within the bremsstrahlung background, the energy dependence of the efficiency and the uncertainties of absorption effects [1]. Peak overlaps, furthermore are considerable for EDS and can even be significant for WDS.

Due to these effects this type of analysis poses difficulties for EDS and WDS. To evaluate and compare these challenges for both techniques, a systematic study was performed on steels at acceleration voltages of 15 kV and 5-6 kV [1,2]. Spectra and net intensities of 15 steel samples covering a wide range of concentrations of the major elements were simultaneously acquired on a JEOL JXA8530F electron microprobe equipped with 5 WD spectrometers and a Bruker XFlash ED spectrometer.

The results of the 15 kV spectra show that for elements with a concentration of < 1 wt.% the WDS results are more accurate when significant peak overlaps occur in ED spectra (Mn, Co, Cu). For elements without peak overlaps, EDS results were comparable (Si, Mo) to WDS [2]. At an acceleration voltage of 6 kV, the deconvolution results of ED spectra show  agreement with the experimental spectra, fig. 1. Since the quantification of L lines is more sensitive to the quantification procedure and fundamental parameters (e.g. mass absorption coefficient) used, the comparison focuses on  k-ratios instead of the quantified mass fractions. Fig. 2 shows a good agreement between EDS and WDS k-ratios, substantiating the peak deconvolution procedure shown in fig. 1.

 

References:

[1] Llovet et al, IOP Conf. Series: Materials Science and Engineering 32, 2012, 012014

[2] PT Pinard et al, Micosc. Microanal. 21 (Suppl 3), 2015, 1879


Ralf TERBORG (Berlin, Germany), Tobias SALGE, Philippe PINARD, Silvia RICHTER
08:00 - 18:15 #6678 - MS04-749 Atomically-resolved insight of unusual Sr-Mn(V) oxyhydroxide.
MS04-749 Atomically-resolved insight of unusual Sr-Mn(V) oxyhydroxide.

Inorganic compounds containing Mn(V) in tetrahedral coordination are known to show strong optical absorption, producing turquoise- to green-colored compounds [1]. The existence of hypermanganate anion MnO43- has been found, for example, in the Ba5(PO4)3-x(MnO4)xCl [2]. However, Mn(V) is very rarely found in oxides. The ability of Mn to be stabilized in mixed oxidation states leads in turn to interplay among spin, charge, and orbital degrees of freedom. In this sense, it has been recently reported that the electrochemical activity of the Mn(IV)/Mn(V) couple, plays a very important role in the discharge capacity of the nanostructured Li4Mn2O5 material [3].

 

In this work we show the characterization of a Sr-Mn (V) oxide with blue-greenish color and nominal composition Sr2(MnO4)(OH) [4]. Atomically-resolved high angle annular dark field (HAADF) images acquired in a JEOL JEMARM200cF microscope shows that the Sr-Mn oxide crystallizes according to the apatite-type structure [5]. In this structure, each Mn ion is coordinated by distorted oxygen tetrahedral giving rise to isolated MnO4 tetrahedra (Figure 1). Evidence of Mn(V) was shown by high energy resolution Electron Energy Loss Spectroscopy (EELS) (Figure 2a). However, contrast variations in the hexagonal tunnels of the apatite structure suggest either the direct imaging of light OH groups in the HAADF image or the presence of a heaviest element in these positions. Image simulation is used to elucidate the origin of such contrast because of the low stability of the sample under the electron beam prevents point-by-point spectroscopic analysis (Figures 2b and 2c).

 

References

[1] P. Jiang et al. Inorg. Chem. 52 (2013), pp.1349

[2] M. Uchida, J. Phys. Soc. Japan, 70 (2001), pp.1790

[3] M. Freire et al. Nat. Mat. 15 (2016), pp. 173

[4] E. J. Baran et al. Monatshefte für Chemie, 100 (1969), pp. 1674

[5] E. Banks et al. Inorg. Chem. 4 (1965), pp. 78


Isabel GÓMEZ-RECIO (MADRID, Spain), Almudena TORRES-PARDO, María HERNANDO, Aurea VARELA, Marina PARRAS, Jose Maria GONZALEZ-CALBET
08:00 - 18:15 #6703 - MS04-751 Correlative Raman spectroscopy and scanning electron microscopy of thermosetting carbon nanotube composite microstructures.
MS04-751 Correlative Raman spectroscopy and scanning electron microscopy of thermosetting carbon nanotube composite microstructures.

In recent years carbon nanotubes (CNT) have attracted significant research into their processing, properties and applications due to their extraordinary mechanical [1], electrical [2] and thermal properties [3]. Incorporating CNTs into polymer matrices to produce composite materials is one strategy to harness the potential of these materials. The development of a powder based processing route for thermosetting nanocomposites allows the manufacture of materials with high loading fractions (up to 20wt%) of CNTs [4]. Typically, nanocomposites with randomly dispersed CNTs show a decline in strength and plateau in elastic modulus beyond a few volume percent CNTs, as well as severe embrittlement [5, 6]. However, in recent work, the highest strength and modulus of the powder-based composites increased up to the highest loading [4]. Differential interference contrast (DIC) optical reflective microscopy of these nanocomposites have revealed a texture with domains on the length scale of the original powder particles, suggesting the migration of resin out of the nanocomposite particles to fill voids at particle interfaces. Raman spectroscopy combined with scanning electron microscopy is a powerful tool to identify the presence of epoxy rich regions and variations in CNT density. The correlated chemical and morphological analysis provides insight into the unique microstructure of the nanocomposite not possible by elemental analysis methods, such as EDS. Using correlated Raman and SEM techniques, the relationship between CNT loading on the “grain size” is quantified and calibrated resulting in an enhanced understanding of how the microstructure affects the macro mechanical properties of the nanocomposite.

 

References

[1] Salvetat, J.P., et al., Mechanical properties of carbon nanotubes. Applied Physics A, 1999. 69(3): p. 255-260.

[2] Popov, V.N., Carbon nanotubes: properties and application. Materials Science and Engineering: R: Reports, 2004. 43: p. 61–102.

[3] Hone, J., et al., Thermal properties of carbon nanotubes and nanotube-based materials. Applied Physics A, 2002. 74(3): p. 339-343.

[4] Herceg, T.M., et al., Thermosetting nanocomposites with high carbon nanotube loadings processed by a scalable powder based method. Composites Science and Technology, 2016. 127: p. 62-70.

[5] Coleman, J.N., et al., Small but strong: A review of the mechanical properties of carbon nanotube–polymer composites. Carbon, 2006. 44(9): p. 1624-1652.

[6] Yeh, M.-K., T.-H. Hsieh, and N.-H. Tai, Fabrication and mechanical properties of multi-walled carbon nanotubes/epoxy nanocomposites. Materials Science and Engineering: A, 2008. 483-484: p. 289-292.

 

Acknowledgements

This project has received funding from the European Union’s Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie grant agreement No 642890

 


Sandra FISHER (London, United Kingdom), Milo SHAFFER
08:00 - 18:15 #6729 - MS04-753 Microstructure Analysis of Transient Liquid Phase Bonded Joints with Sn based Rapidly Solidified Braze Ribbons.
MS04-753 Microstructure Analysis of Transient Liquid Phase Bonded Joints with Sn based Rapidly Solidified Braze Ribbons.

Transient liquid phase (TLP) bonding is a diffusion based joining process that has been applied to different metallic systems. It is based on diffusion of filler metal constituents into the base material and/or vice-versa leading to isothermal solidification. Combining isothermal solidification with a subsequent solid state homogenisation treatment offers the possibility of producing bonds that are almost chemically identical to the base material and have no significant microstructural discontinuity at the bond line [1]. In this work, braze ribbons as filler material were produced by melt spinning process resulting in flexible ribbons with homogenous element distribution, which in the end will enable equally homogenous melting characteristics of the braze material [2]. The aim of this work is to analyse the microstructure of the braze ribbons to understand their melting and solidification behaviour in a TLP bonding process.

In this work, we present the microstructure analysis of two braze ribbons made of Sn78Cu22 and Sn75Cu20Ge5. Germanium was added for improving the glass forming properties. Electron backscatter diffraction (EBSD) and SEM EDS analysis were performed on a JEOL field emission SEM JSM-7000F equipped with EDS and EBSD detectors by EDAX. The TEM lamellae were prepared by the focused ion beam technique (FIB) using an FEI single beam FIB Strata 205. Scanning transmission electron microscope (STEM) investigations were conducted using a 200 kV field emission in column corrected omega filter TEM Zeiss Libra 200 FE equipped with HAADF and EDS detectors from Fischione and Bruker, respectively.

EBSD shows the differences in grain morphology after rapid solidification by the melt spinning process for the Sn75Cu20Ge5 braze ribbon (figure 1). It has been also revealed by EBSD analysis that metastable hexagonal CuSn phase could be found in the Sn matrix of the Sn75Cu20Ge5 braze ribbon. More detailed analyses for both braze ribbons were done by means of STEM combined with EDS analysis. These results revealed that CuSn phases in a Sn matrix can be found in both braze ribbons. Furthermore, cross sections of the Sn75Cu20Ge5 braze ribbon show different phases as well as different microstructures (figure 2). Crystalline CuSn phases were formed in a Sn matrix with amorphous Ge at the grain boundaries, whereas amorphous SnG areas were formed in the upper and lower part of the cross sections respectively. Moreover, DSC measurements were conducted to determine the melting behaviour of two ribbons and the measurement curves reveal two exothermic peaks up to 450 °C [3].

The brazing processes were performed in high vacuum by putting each braze ribbon in between aluminium cast material AlSi7Mg0.3. To achieve a uniform contact between the filler and base material during brazing, each joint was statistically loaded with p = 5.3 N/mm2 during the brazing process. SEM EDS analysis was used to reveal the phases present at the brazed joints. As can be seen in figure 3, all phases are enclosed in a Sn matrix for both brazed joints. The Sn diffuses into the aluminium base material and the aluminium diffuses into the brazed joint material (see inset). In the Sn78Cu22 braze joint, intermetallic CuxAly phases can be detected. In the Sn75Cu20Ge5 braze joint, smaller CuAl precipitates spread over the joint with addition of GeAl. The results suggest that Ge induces a change of the intermetallic CuAl phase, while Ge binds a part of the Al.

Acknowledgments:

The authors wish to thank Kevin Kistermann for his assistance in preparing the samples for EBSD measurements. This study was part of the Collaborative Research Centre SFB 1120 “Precision Melt Engineering” at RWTH Aachen University and funded by the German Research Foundation (DFG).

References:

1. W.F. Gale & D.A. Butts (2004) Transient liquid phase bonding, Science and Technology of Welding and Joining, 9:4, 283-300

2. Kalinkichenka, S, Rascherstarrte nanokristalline Magnesiumlegierungen für die Wasserstoffspeicherung, Dissertation TU Dresden, 2011

3. K. Bobzin, M. Öte, S. Wiesner, L. Pongratz, J. Mayer, A. Aretz , R. Iskandar, A. Schwedt, Charakterisierung von Erstarrungsprozessen während des TLP-Bondings mit rasch erstarrten Lotbändern aus dem Melt-Spinning-Verfahren, 2016 WTK Chemnitz und IOP conference series


Riza ISKANDAR (Aachen, Germany), Ludwig PONGRATZ, Stefanie WIESNER, Mehmet ÖTE, Alexander SCHWEDT, Kirsten BOBZIN, Joachim MAYER
08:00 - 18:15 #6832 - MS04-755 Imaging molecular sieve 3A.
MS04-755 Imaging molecular sieve 3A.

The framework of many zeolites has been studied using different TEM techniques even though these materials are easily damaged by the electron beam1. Until now the mechanisms for radiation damage in zeolites are not fully understood due to the complexity of their structure except for some works which have given a general indication on its origin1-4. Despite the fact that each work used different zeolites it can be derived from them that the main factors for the stability of a zeolite under the electron beam are the Si/Al ratio, the size of cations and the water content. In this work we present the investigation of molecular sieve 3A (LTA framework) by HRTEM, with a Si/Al ratio of 1, and Na and K cations (Sigma Aldrich). Although the Si/Al ratio is unity i.e. the material is highly sensitive to electron irradiation2 our results show that with electron dose rates up to 1000 e/nm2s the atomic structure of such material can be obtained (observation timespan ~1200 s) independent of the electron energy (80 keV, 200 keV or 300 keV). The latter indicates that by using an electron energy above 80 keV electronic exitations (e.g. radiolysis) and knock-on damage are simultaneously taking place during electron irradiation thus no dominance of either radiation mechanism, these results are in agreement with previous findings reported by Ugurlu et al.4. Although the structure of zeolite could be obtained, damage invariable occurred during recording, however, at a slow rate. In conclusion, these results are one step foward for the understanding of radiation damage mechanisms in molecular sieves, and a step towards imaging the cation positions.
 
 
[1] Bursill L.A., Lodge E.A., Thomas J.M. Nature 286 (1980)
[2] Csencsits R., Gronsky R. Ultramicrosocpy 23 (1987)
[3] Bursill L.A., Thomas J.M., Rao K.J. Nature 289 (1981)
[4] Ugurlu et al. Physical Review B 83 (2011)


Gerardo ALGARA-SILLER (Berlin, Germany), Thomas LUNKENBEIN, Robert SCHLÖGL, Marc Georg WILLINGER
08:00 - 18:15 #6970 - MS04-757 Microstructure of stainless steel produced by direct metal laser sintering.
MS04-757 Microstructure of stainless steel produced by direct metal laser sintering.

Microstructure of stainless steel produced by direct metal laser sintering
C. Labre1, 2, A. L. Pinto1, G. Solórzano2
1. Brazilian Center of Physics Research, Rio de Janeiro, Brazil.
2. Department of Chemical and Materials Engineering, PUC-Rio de Janeiro, Brazil.
Keywords: Additive manufacturing, direct metal laser sintering, 3D
Additive manufacturing or rapid prototyping is a layer-by-layer fabrication technique based on selective fusing and consolidating thin layers of loose powders with a scanning laser beam, for building three-dimensional (3D) objects [1]. Among the various methods of additive manufacturing the direct metal laser sintering (DMLS) had a big progress in the recent years and as an alternative manufacturing route to produce components, it attracted great attention due to the easy processing, high process speed and capability of producing complex shaped metallic objects. The present study focuses on the microstructural characteristics of the 15-5 PH stainless steel powder and a component built by DMLS from the same powder (composition: Cr 16,4wt%, Ni 4wt%, Cu 3,7 wt%, Mn 1,3wt%, Si 0,045wt%, Mo 0,5wt%, Nb 0,35wt%, C 0,045wt% and Fe (bal.)). For this purpose, JEOL JSM 7100FT scanning electron microscope (SEM), LYRA3 FEG SEM and electron backscattered diffraction (EBSD) have been used at Brazilian Center of Physics Research (CBPF).
Figure 1A shows that the 15-5 PH powders are in spherical shape and the particle size are in the ranged of 20 to 50μm. Preliminary EBSD results of the slice view of Figure 1B show that the grains are randomly oriented (Figure 1C), each orientation is indicated by a specific color, and it has a higher concentration of grain size of up to 7μm (Figure 1D). Grain orientation map shows that there is not a preferential crystallographic orientation.
Figure 2A shows a SEM image of the cross section of an object produced by DMLS. A laser scanning was repeated to build the subsequent layers until the objects is completed. Arrow indicates the building direction. The grain orientation map presents columnar grains randomly oriented melt pool boundaries (Figure 2B). The grain size distributions show a higher concentration of grain size below 5m (Figure 1C). The grain size of the object is reduced comparing with the grain size of the original powder.
Reference
[1] Journal of Materials Processing Technology 213 (2013) 2126 - 2136.


Cilene LABRE, Andre PINTO, Guillermo SOLÓRZANO (Rio de Janeiro, Brazil)
08:00 - 18:15 #6976 - MS04-759 atomic-resolution analysis of the structure and dopants of beam sensitive ordered porous materials.
MS04-759 atomic-resolution analysis of the structure and dopants of beam sensitive ordered porous materials.

With the modern transmission electron microscopes (TEM) sub-angstrom resolution has become readily achievable overcoming the lateral resolution problem. However, there are many cases where its fully potential cannot be totally exploited due the strong interaction between the high energetic electron beam and the material. Zeolites, zeotypes and metal organic framework (MOFs) suffer from this interaction resulting in an irreversible framework disruption through a radiolytic mechanism[1].

Since the pioneers electron microscopy observations of zeolites in the 70’s, its application and image resolution has been always been limited by this high sensitivity making impossible to fully exploit the TEM capabilities. However, in recent years with the introduction of the spherical aberration correctors and paying special attention to the electron dose, images with unprecedented resolution has been able to be obtained, making feasible the truly identification of the atoms conforming the structure.

In here, it will be presented atomic-column resolution images which will provide new information on guest species[2] within the zeolite cavities, as well as the observation of structural defects[3] providing new information about the ion exchange properties of these solids. Figure 1 displays the data obtained after introducing rare earth metals into ETS-10.

Furthermore, it will be shown how aberration corrected STEM provide unique information dealing with the analysis of new complex materials[4]; making able the observations of pores linked by single four-rings, double four-rings or oxygen linkers.

Acknowledgements

The authors would like to thank the European Union Seventh Framework Programme under grant agreement no. 312483 (ESTEEM2, Integrated Infrastructure Initiative).

References

[1] I. Díaz, A. Mayoral, TEM studies of zeolites and ordered mesoporous materials, Micron, 42 (2011) 512–527.

[2] A. Mayoral, T. Carey, P.A. Anderson, A. Lubk, I. Diaz, Atomic Resolution Analysis of Silver Ion-Exchanged Zeolite A, Angew. Chem. Int. Ed., 50 (2011) 11230–11233.

[3] A. Mayoral, J. Coronas, C. Casado, C. Tellez, I. Díaz, Atomic Resolution Analysis of Microporous Titanosilicate ETS-10 through Aberration Corrected STEM Imaging, Chem. Cat. Chem., 5 (2013) 2595–2598.

[4] M. Mazur, P. Wheatley, M. Navarro, W. Roth, M. Položij, A. Mayoral, P. Eliasova, P. Nachtigall, J. Cejka, R. Morris, Synthesis of unfeasible zeolites, Nat. Chem., 8 (2016) 58–62.

 

 


Alvaro MAYORAL (Zaragoza, Spain), Jennifer READMAN, Marta NAVARRO, Russell E. MORRIS, Isabel DÍAZ
08:00 - 18:15 #6985 - MS04-761 A multimodal and multiscale approach to investigate the micronsized organisation of a very complex biological material : the wheat grain.
MS04-761 A multimodal and multiscale approach to investigate the micronsized organisation of a very complex biological material : the wheat grain.

Nowadays, a large set of microscopy tools are commonly used to investigate the nanostructure of complex biological or synthetic materials with a multiscaled organisation: epi-fluorescence and laser scanning confocal microscopes (LSCM), scanning and transmission electron microscopes (SEM, TEM), atomic force microscopy (AFM), or Raman imaging. In particular, transmission electron microscopy (TEM) allows observation of the internal structures of natural systems (grains, cells and tissues) with a high spatial resolution. However, such observation requires in parallel dedicated sample preparation steps to prepare the fragile hydrated biological samples with successive steps including chemical or physical fixation, dehydration or vitrification of the water content, resin-inclusion and contrast-enhancement staining. Its well-known these steps may induce artefacts that reduce the image resolution and valuable information, but are often considered as the unique way to access to the ultrastructural information.

We propose here to explore alternative routes for the ultrastructure investigation of the grain tissues, as an example of a very complex biological material, with the main objective to reduce the preparation steps as most as possible while adapting the same preparation to be process with several microscopy tools: TEM, SEM, AFM, Raman imaging, Fluorescence imaging, X-ray microscopy. Depending on the successfulness of this approach, a set of complementary experiments from the same zone of a native sample can alloy to connect the plant ultrastructure with a high spatial resolution to accurate chemical information.

The multimodal and multiscale approach has been fully tested to study wheat grains tissues. We will show how unique features in the wheat outer layers organisation have been revealed due to both the capacity of keeping the native tissue “true contrast”, free from any chemical artefacts, or the native mechanical stress between the components, exempt from any alteration from resin infiltration. Moreover, taking advantage from the capacity of keeping the wheat tissue in its native shape, the mechanical properties of the native wheat outer layers (intenal and external pericarp, aleurone and sub-aleurone layers and starchy endosperm) have been characterised by AFM at the nonometer scale, see Figure 1. Additionally, the chemical composition has been acquired by Raman mapping from the different zones of interest, giving in an unique way the capability to understand the natural assemblies of biopolymers and mineral nutrients at the sub-cellular level in regard to their chemical, physicochemical and structural properties.

 

 

REFERENCES

C. Karunakaran, C.R. Christensen, C. Gaillard, R. Lahlali, L.M. Blair, V. Perumal, S.S Miller, A.P. HitchcockIntroduction of soft X-ray spectromicroscopy as an advanced technique for plant biopolymers research. PLoS One, 2015 26;10 (3) pages: e0122959.

Berquand A., B. Bouchet and C. Gaillard: Investigating the ultrastructure and mechanical properties of wheat grain tissues using optical microscopy and HarmoniX, Application Note, n°AN122, Veeco Instruments (2008)


Cédric GAILLARD (NANTES)
08:00 - 18:15 #6376 - MS05-763 Application of different imaging techniques for characterization and visualization of micro­ and nanostructural elements in Allvac 718Plus superalloy.
MS05-763 Application of different imaging techniques for characterization and visualization of micro­ and nanostructural elements in Allvac 718Plus superalloy.

Allvac 718Plus (718Plus) is a newly developed Ni-based superalloy, high strength, corrosion resistant and has improved higher temperature performance compared to the Inconel 718 superalloy. The 718Plus superalloy is used for applications in power generation, aeronautics and aerospace. The combination of a different chemistry and adequate heat treatments causes precipitation mainly the γ′ and δ or η- phases. The 718Plus microstructure consists of a γ matrix with spherical precipitates of ordered face centred cubic γ'-Ni3(Al,Ti) type phase, some orthorhombic δ-Ni3Nb and hexagonal η-Ni3Ti, η*-Ni6AlNb or Ni6(Al,Ti)Nb particles precipitated at the grain boundaries.

The aim of this study was characterization of phases and 3D visualization of microstructural element morphology using several microscopy techniques, mainly HRSTEM-HAADF, STEM-EDX spectrometry. The present work concerns also the application of TEM and FIB-SEM electron tomography for imaging and evaluation of qualitative and quantitative information about microstructure of materials. Performed analysis in atomic level (HRSTEM-HAADF) of selected precipitates in the 718Plus superalloy revealed the complex nature of these precipitates, as shown in Fig.1. X-ray spectroscopic imaging (STEM-EDX), enables the mapping of local concentrations of selected chemical elements. This technique was used for qualitative and quantitative evaluation of η- phase precipitates with resolution about of 0.2 nm. STEM-EDX maps of selected elements forming η particles in 718Plus superalloy are presented in Fig.2.

The electron tomography is currently a relatively new technique in materials science that uses a TEM or FIB-SEM to 3D imaging of microstructural elements in various engineering materials. The TEM electron tomography technique enables obtaining 3D model of the investigated object(s) from the multiple 2D projection images, acquired over a range of viewing directions (±75°). The TEM investigation was performed on FIB lamella by a Cs-corrected Titan3 G2 60-300 with EDX ChemiSTEM™ technology, which allowed to achieve high X-ray signal over a large tilt angle of sample  and collect a tomographic series of 2D elemental maps at the angular range from -40° to +60° (with a step of 4°) of tilting the sample. The STEM-EDX imaging by ChemiSTEM™ provides new opportunities for 3D visualization of changes in the concentrations of particular chemical elements in nanoparticles or analysis of the microstructure of thin foils. Tomographic reconstruction of a tilt series images was performed using SIRT method, which allowed visualizing the three-dimensional distribution of selected elements (Al, Cr) in the analysed volume. Application of elemental maps imaging (STEM-EDX) acquired during tilting the sample was used for 3D imaging of coherent γ′ precipitates in 718Plus superalloy (Fig.3a).

FIB-SEM tomography is based on a serial slicing technique using a FIB-SEM dual beam workstation. Dual-beam SEM enables the acquisition of serial images with small (few nanometers) and reproducible spacing between the single imaging planes - because no mechanical stage tilting is necessary between the FIB milling and the electron beam SEM imaging steps. Meso-scale FIB-SEM tomography technique, was used for characterization of spatial distribution and metrology of the η- phases in 718Plus superalloys with resolution of 12 nm. SEM backscattered electrons (BSE) image of 718Plus superalloy presents different shapes of the η- phase precipitated in the γ matrix. Fig. 3b shows three-dimensional visualization of FIB-SEM tomographic reconstructed η- phase. Fig. 3b shows at different angle of view a morphology of selected η particles precipitated at the γ grain boundary. Platelets, occasionally as a lamellar structure at grain boundaries and in the grains were observed in the microstructure of the 718Plus. The η- phase precipitates at the γ grain boundaries had much higher thickness (270 nm) than the thickness of the η- phase plates (56 nm) in lamellar precipitates inside γ grains (Fig. 3b). Application of HRSTEM-HAADF imaging and tomographic techniques (STEM-EDX, FIB-SEM) allowed for visualization the precipitates in 718Plus superalloy, their quantitative assessment, spatial distribution and morphology. 

Acknowledgement: The authors acknowledge the financial support from EU 7FP under Grant Agreement 312483 - ESTEEM2 


Adam KRUK (Krakow, Poland), Aleksandra CZYRSKA-FILEMONOWICZ
08:00 - 18:15 #6485 - MS05-765 HAADF STEM and EELS Analysis of Li(Ni0.8Co0.15Al0.05)O2 Cathode Held at High Voltages.
MS05-765 HAADF STEM and EELS Analysis of Li(Ni0.8Co0.15Al0.05)O2 Cathode Held at High Voltages.

Ni rich Li(Ni0.8Co0.15Al0.05)O2 commonly known as NCA is being used commercially as Li-ion battery cathode material for its high discharge capacity. [1] The stability and related safety concerns at high charge voltages limit the use of NCA to 3.6 V charge voltage corresponding to 0.5 extracted Li.  In order to extract a higher amount of Li, high charge voltages to 4.75 V are required. The bulk R-3m layered structure of NCA does not change, however new surface phases are formed wich are induced by oxygen loss. To utilize the full potential of NCA, high-voltage studies of surface phases, their chemical evolution and their mechanisms are needed.  We present here the evolution of surface phases in NCA held at constant voltages up to 4.75V.

The surface phases of NCA were observed in a cold cathode field emission aberration corrected JEOL ARM (at Lehigh University) for HAADF STEM imaging. The spatial resolution of the STEM images was 0.07 nm. EELS as well as HAADF STEM imaging were carried out using a cold cathode aberration corrected HITACHI HD2700C TEM and GATAN Enfina EELS spectrometer with an energy resolution of 0.5 eV. A HAADF STEM image of a NCA particle (held at 4.75V for 2 weeks) oriented along [010] zone axis of layered (R-3m) structure is shown in Figure 1.  Atomic–resolution images from different regions of the particle were obtained revealing structural inhomogeneity with two different surface phases. The HAADF STEM image from region 1 (Figure 2a) shows that the bulk layered structure (R-3m) is maintained up to the surface, but with almost 1/3 of transition metal (TM) ions (mostly Ni) occupying to the Li layer as determined from the intensity profile (Figure 2b). In region 2 the surface shows a HAADF contrast corresponding to “rocksalt (RS) type” phase (Figure 2c), however with a higher O content than for stoichiometric NiO.  The presence of two different phases within the same particle shows that the surface of NCA particles is highly inhomogeneous. Also, this large scale migration of TM ions (1/3 of TM moving to Li layer) from its original octahedral site to a tetrahedral Li site is driven by the presence of oxygen vacancies. This is consistent with the earlier report which shows that the diffusion barrier for TM migration is reduced when initial configuration of TM octahedron is five coordinated (MO5, deficient in one O) instead of regular six coordinated (MO6).[2]  Oxygen loss as measured by EELS indeed accompanied these surface phase transformations.  A surface with NiO chemistry is observed only within 1-2 nm from the surface.  A characteristic EELS feature of pristine NCA is the presence of O-pre-peak, 12.0 eV from the main O peak, which occurs due to a transition from O 1s to a hybridized state formed by O 2p and Ni 3d states. For NiO, this pre-peak is smaller and located 7.5 eV from the main O peak.  This pre-peak is almost missing at the surface as shown for a sample held at 4.75V (Figure 3a).  The O edge at this voltage resembles that of NiO phase (Figure 3b) with a lower pre-peak intensity and average energy position of 7.5 eV. The O/TM atomic ratio of 1.6 measured for the surface phases and averaged over several particles show that the surface is oxygen deficient as compared to pristine NCA (2). Also, a reduction in Ni valence, measured from Ni L3/L2 ratio is observed at the surface (Ni+2.4) as compared to pristine NCA (Ni+3). Both of these values are between pristine NCA and NiO (O/TM ratio of 1 and Ni2+ valence state).  So, the reduction in Ni observed at 4.75V is corroborated by a shift of Ni L edge with respect to bulk NCA (Figure 3c). [3]

References:

[1] S. Hwang, et. al. Appl. Phys. Lett. 105 (2014) 103901 (4pp)

[2] D. Qian, et. al. Phys. Chem. Chem. Phys. 16 (2014) 14665 (4pp)

[3]The funding for this work is provided by NECCESS, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award Number DE-SC0001294.                    


Pinaki MUKHERJEE, Dong SU, Nathalie PEREIRA, Glenn AMATUCCI, Frederic COSANDEY (Piscataway, USA)
08:00 - 18:15 #6502 - MS05-767 EELS analysis of He bubbles in ODS Steel and vanadium.
MS05-767 EELS analysis of He bubbles in ODS Steel and vanadium.

 

The understanding and the assessment of neutron irradiation in nuclear materials is critical in the design of the next-generation nuclear fission reactors. Here, one of the most promising structural and fuel cladding materials, an oxide-dispersion-strengthened (ODS) steel was implanted with He and Fe ion in order to simulate the transmutant He and the damage (He/dpa) caused by neutron irradiation. The fine distribution of Y-Ti-O nanoparticles (NPs, 1-20 nm) in the Fe-Cr ferritic matrix is expected to improve thermal and mechanical properties. STEM-EELS was used to investigate the structure and chemistry of these NPs and the He bubbles generated. The ODS material (Fe-14Cr-1W-0.3TiH2- 0.3Y2O3, wt.%) was prepared by mechanical alloying of Fe-Cr-W-TiH2 and Y2O3 powders followed by hot extrusion. Ion irradiation was carried out at 500°C, producing 5 dpa damage (Fe) with 1000 appm/dpa He implantation. Core loss spectrum-images were denoised using principal component analysis [1]. Implanted He is shown to be trapped in some Y-Ti-O NPs (fig. 1) although bubbles also exist outside the NPs. The ion irradiation has also changed the Cr distribution, removing the Cr-shell observed around the NPs in non-irradiated ODS samples (fig. 1) [2,3] and rendering the Cr distribution in the metallic phase generally more heterogeneous.

 

The He-K line (21.218 eV for free atoms) shifts to higher energy in the bubbles (ΔE = 0.5 to 4 eV); this is shown to be correlated with the He density. He quantification has been carried out with three different methods: spatial difference, curve-fitting and Multivariate analysis (MVA) methods (see below), as well as hybrid approaches combining the latter two methods which are proving promising for the elimination of the problems associated with each method on its own. The density and pressure values are found to reach 105 nm-3 and 8 GPa respectively, although the pressure measurement is only semi-quantitative given that the error bars can reach 30%. The curve-fitting method allows us to map the He-K energy position and intensity, yielding the density, in individual bubbles (fig. 2). The spectral response of individual bubbles can be separated in an SI containing many bubbles at different densities using independent component analysis (ICA: example shown in figure 3) or vertex component analysis (VCA). Bubbles larger than 4 nm are shown to be under-pressurized or at equilibrium with the Fe-Cr matrix. Below 3.5 nm, the He pressure is shown to increase markedly, passing into the over-pressurised regime.

In the presentation we will also describe experiments and analysis on similar bubbles implanted in vanadium at 700 and 1000°C. Here the size/pressure relation is much less clear, but the MVA approach is similarly promising.

 

We thank the French ‘‘Contrat de Programme de Recherche: ODISSEE’’ funded by AREVA, CEA, CNRS, EDF and Mécachrome under contract n070551, the METSA network and the European 7th framework program ‘‘ESTEEM2’’ for financial support. We also thank the ANR programme EPIGRAPH and all its memebers for their contribution to the vanadium studies.

 

[1] www.hyperspy.org

[2] A. Hirata et al. Nature Materials 2011;10:922.

[3] V. Badjeck et al. J. of Nucl. Mat. 456 (2015) 292


Michael WALLS (LPS, Orsay), Nathalie BRUN, Vincent BADJECK
08:00 - 18:15 #6505 - MS05-769 Reduction of Fe antisite defects in LiFePO4 for Li-ion batteries.
MS05-769 Reduction of Fe antisite defects in LiFePO4 for Li-ion batteries.

Triphylite (LiFePO4 or LFP) has raised as promising cathode material in lithium-ion batteries, due to its superior safety, high theoretical capacity (~170  mAhg-1), high stability, and suitable operating voltage (~3.4 V). Olivine has a structure with Pnma space group, with lithium ions confined in the channels (M1 site) formed by interconnecting FeO6 octahedra (M2 site) and PO4 tetrahedra (see Figure 1 top). One of the limiting factors in ionic conductivity in these sample is the presence of Fe antisite defects (Fe in M1 site) blocking Li diffusion. This affects the hydrothermal synthesis of LiFePO4 (lowest cost method but able to produce large scale material). We have found that the hydrothermal synthesis involves indeed an intermediate vivianite phase, which inevitably creates Fe-antisite defects. However, these can be progressively removed by cation exchange, assisted by a nanometer-thick Li rich amorphous layer at the surface, which acts as a second phase to exchange Li and Fe atoms with (Figure 1). To study the presence of antisite defects we have combined neutron scattering with HAADF-STEM, XPS, and EELS. The presence of Fe antisites in the M1 site can easily be spotted in aberration corrected HAADF images (see Figure 2) and the amount of defects quantified by comparison with image simulations [1]. We have found that the defects can be reduced to ~2% by prolonging the synthesis procedure to 5 hr, while reducing at the same time the amorphous layer thickness at the surface. Moreover, the time of treatment can further be largely reduced (to approx. 30 min) by making use of Ca+ ions added during the synthesis, which favors the Fe antisites removal while keeping optimal charge characteristics [2]. This is achieved by two concomitant effects: (i) the Fe-antisite defects aggregate at the surface of the LiFePO4 crystal during crystal reduction in size, (ii) the increase in the surface area, which further exposes the Fe-antisite defects. Figure 2 compares the HAADF images from the samples synthesized in 30 min. using Ca+ and without Ca+, respectively [3].

ACKNOWLEDGEMENTS

[1] Paolella A. et al. Cation exchange mediated elimination of the Fe-antisites in the hydrothermal synthesis of LiFePO4. Nano Energy 16, 256–267. doi:  10.1016/j.nanoen.2015.06.005 (2015)

[2] Paolella A. et al. Accelerated Removal of Fe-Antisite Defects while Nanosizing Hydrothermal LiFePO4 with Ca2+. Nano Letters, Article ASAP. doi: 10.1021/acs.nanolett.6b00334 (2016)

[3] European Union FP7 Grant Agreement n. 265073 ITN-Nanowiring, and FP7 Grant Agreement n. 312483 ESTEEM2 for Integrated Infrastructure Initiative – I3


Giovanni BERTONI (Parma, Italy), Andrea PAOLELLA, Stuart TURNER, Karim ZAGHIB
08:00 - 18:15 #6528 - MS05-771 Factors limiting the doping efficiency in atomic layer deposited ZnO:Al thin films: a dopant distribution study by transmission electron microscopy and atom probe tomography.
MS05-771 Factors limiting the doping efficiency in atomic layer deposited ZnO:Al thin films: a dopant distribution study by transmission electron microscopy and atom probe tomography.

Transparent conducting oxides (TCOs), such as indium tin oxide (ITO),  are commonly used as transparent electrodes in a wide variety of devices, such as in displays and solar cells. ZnO has been reported to be a promising alternative TCO for ITO, because of its lower cost. As the conductivity of intrinsic ZnO films is too low for the applications in mind, doping the ZnO film is essential, the most common dopant being Al. Atomic layer deposition (ALD) is an emerging technique for the deposition of doped ZnO thin films, allowing for accurate thickness control and excellent conformality on high aspect ratio topologies. Due to the self-limiting half-reactions and cyclic nature of the ALD process, not only  the aforementioned characteristics can be met, but also the amount and distribution of dopants can be controlled by selecting the precursors (i.e. the Zn or Al precursors) for each individual half-cycle. However, thus far, the maximum conductivity that can be obtained in Al-doped ZnO (ZnO:Al) thin films prepared by ALD appears to be limited by the low doping efficiency of Al.

To better understand the origin of this limitation, the 3-dimensional distribution of Al atoms in ZnO films has been examined using a combination of Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). For this study, three ZnO:Al films with different Al:Zn ratios were grown sequentially in one film stack, and capped and separated by intrinsic ZnO films. A diagram of the stack is shown in Fig. 1a. This geometry allowed a single APT or TEM measurement to collect data on all three doped films, keeping the analytical conditions identical. BFTEM studies (Fig 1b) showed that for high Al concentrations the ZnO grains are interrupted, while they continue across the lower doped layers. Scanning TEM – High Angle Annular Dark Field (HAADF) imaging and 2-D EDX mappings allows for revealing the aluminum distribution as a function of film depth, showing that the Al-doped layers follow the surface topography of the ZnO grains during growth Fig. 1c,d. However, TEM is limited in providing 3-D dopant distributions, on the one hand because of the limited sensitivity of EDX, on the other hand because of the projection of rough interfaces in a 2-D image. The latter is illustrated in Fig. 2a: individual Al-doped layers can clearly be discerned for larger interspacings, but are poorly recognizable in layer ‘AZO-3’.

One-dimensional depth profiles extracted from cylindrical sub-volumes of the 3D APT data (Fig. 2 b) are presented in Fig. 2c. These 1D profiles show that the peaks in Al concentration are no δ-functions, as might be expected from the binary nature of the ALD process. Instead, the peaks have a full width at half maximum (FWHM) of ~2 nm. The 3-dimensional dopant distribution can be used to explain the dependencies of resistivity and doping efficiency on growth recipes used. When the local Al density is too high, the doping efficiency is limited by two proposed limiting factors: the solid solubility limit of Al atoms in a ZnO matrix and the disorder-induced carrier localization.


Marcel VERHEIJEN (Eindhoven, The Netherlands), Yizhi WU, Devin GIDDINGS, Ty PROSA, David LARSON, Fred ROOZEBOOM, Erwin KESSELS
08:00 - 18:15 #6533 - MS05-773 TEM investigation of the effects of cycling on electrochemically stable hybrid Pt@NbOx nanocatalysts.
MS05-773 TEM investigation of the effects of cycling on electrochemically stable hybrid Pt@NbOx nanocatalysts.

Renewable energies and fuel cell technologies will likely play a major role in reducing our dependency on fossil fuels. In particular, proton exchange membrane fuel cells (PEMFCs) are suitable for use in both domestic and automotive applications. This sophisticated technology requires a functional nanostructured material that contains platinum to catalyse both the hydrogen oxidation reaction (HOR) and the oxygen reduction reaction (ORR) to produce water, electricity, and heat. [1] Unfortunately, in spite of their remarkable potential, the high cost and degradation of platinum-based catalytic materials have been a barrier to widespread adoption of this type of technology. Reducing platinum content while simultaneously improving the durability will therefore require novel approaches in the catalyst design and its characterization at nanoscale level. [2]

Transmission Electron Microscopy (TEM) techniques have continued to play a major role in the design and characterization of PEMFC materials. Using an aberration-corrected microscope (Titan cubed 80-300), we investigated the structural stability over the lifetime of a proposed fuel cell cathode material containing nano-particulate platinum on a NbOx-carbon hybrid support. The characterization of this material included a series of ex-situ TEM analyses before or after accelerated stress tests that cycled the sample 30,000 times between 0.6 and 1.0 V in an electrochemical cell.

The histograms shown in Fig1a and b reveal that some metal particle coarsening occurred during the 30,000-cycle test. The as-prepared catalyst contained 1–5 nm particles, the majority of which were determined to be bimetallic, as determined by electron energy loss spectroscopy (EELS), with some Pt-rich particles and Nb-rich grains (Fig. 1c). After 30,000 cycles, microanalysis data confirms that the cycling treatment caused some agglomeration of the small Pt-rich particles. Analysis of the EELS oxygen K ionization edge indicates that multiple niobium oxidation states are present in the system, predominantly Nb(V) before electrochemical cycling (Fig 1c). Although conventional image comparisons between the initial and final state of the hybrid catalyst suggest that the Pt particle size increased marginally, in order to obtain an improved understanding of the material’s degradation, morphological and structural evolution of the particles and hybrid support were tracked using the so-called Identical Location TEM technique [3]. The results in figure 2 indicate that no large-scale degradation of the hybrid support took place, suggesting carbon corrosion was minimized. In addition, only minor changes occurred to the average particle size, demonstrating the excellent stability of the metallic particles. These findings demonstrate that highly dispersed Pt/NbOx on carbon support material is a promising electrocatalyst for PEMFC.

[1] J. Wu, X. Z. Yuan, J. J. Martin, H. Wang, J. Zhang, J. Shen, S. Wu, Walter Merida, “A review of PEM fuel cell durability: Degradation mechanisms and mitigation strategies”, J. Power Sources, vol 184, no.1, pp 104-119, 2011

[2] B. Corain, G. Schmid, N. Toshina, Metal Nanoclusters in Catalysis and Materials Science: The Issue of Size Control, Elsevier, Amsterdam, 471 p, 2008

[3] K. J.J. Mayrhofer, J. C. Meier, S. J. Ashton, G. K.H. Wiberg, F. Kraus, M. Hanzlik, M, Arenz, “Fuel cell catalyst degradation on the nanoscale” Electrochemistry Communications, vol. 10, no. 8, pp.1144-1147, 2008


Lidia CHINCHILLA, David ROSSOUW (Dundas, Canada), Tyler TREFZ, Natalia KREMLIAKOVA, Gianluigi BOTTON
08:00 - 18:15 #6550 - MS05-775 Insight into CuInS2 thin films by electron microscopy.
MS05-775 Insight into CuInS2 thin films by electron microscopy.

Over the last decades the interest in materials for renewable energy applications has increased considerably. One promising material is copper indium disulfide, CuInS2, which has a band gap of 1.5 eV and a high absorption coefficient.[1] Due to the electronic and optical properties CuInS2 is not only attractive for solar cells but also for solar-driven water splitting devices and in photo catalysis to generate H2 as an energy carrier.[2, 3] For these applications, a large surface area and a high crystallinity are beneficial. CuInS2 thin films with such structural features can be grown by several wet chemical approaches. One is a solvothermal synthesis route [4, 5] which uses moderate temperatures of around 150 °C and common chemicals as precursors e.g. CuSO4 ∙ 5H2O and InCl3.

In the present work the used sulfur source Thioacetamide, which is toxic, has been replaced with L-Cysteine, a natural amino acid. The other solvothermal conditions have been kept as reported in literature. The CuInS2 films were grown on Fluorine-doped tin oxide (FTO) coated glass substrates and investigated using X-ray diffraction (XRD) and electron microscopic techniques such as scanning electron microscopy (SEM), (scanning) transmission electron microscopy ((S)TEM), energy-dispersive X-ray (EDX) spectroscopy and electron energy loss spectroscopy (EELS). SEM was done on a Zeiss Merlin microscope equipped with a Bruker EDX system. (S)TEM was performed on a FEI Titan Themis operated at 300 kV and equipped with a SuperX EDX system. EELS was done on a FEI Titan 80 – 300 kV and a Gatan Tridiem image filter. The aim of the work is to study the reaction path and to determine the microstructure of the films.

For the sulfur source L-Cysteine a different surface morphology is obtained compared to films grown with Thioacetamide as sulfur source. Thioacetamide gives an open flower-like surface topology (Figure 1(c)) whereas L-Cysteine leads to films consisting of agglomerates of small nanoparticles (Figure 1(a,b)). As visible in the SEM images there are also multiple larger agglomerates built up from nanoparticles on top of the film. For both sulfur sources the Chalcopyrite structure of CuInS2 is proven by XRD (not shown) and selected area electron diffraction (SAED, Figure 2 (d)). For increasing precursor concentration the film thickness increases. STEM images of CuInS2 films grown with a medium precursor concentration are shown in Figure 2. EDX maps show that the films contain mainly Cu, In and S. Quantification of several areas gives Cu:In 1:1 with a lack in sulfur. Compared to a scratched TEM sample, where a stoichiometric composition of Cu:In:S 1:1:2 is obtained, this results indicate that sulfur is not stable and leaves the sample during FIB preparation.

Since the Cu2+ of the precursors CuSO4 must be reduced to Cu+ to form CuInS2, the oxidation state of Cu was examined with EELS (Figure 3 (c)). The reaction product which forms between CuSO4 and L-Cysteine without heating consists of an amorphous matrix in which crystalline nanoparticles with a size of a few nanometers are embedded (Figure 3 (a)). Compared to literature[6] the EELS data indicate an oxidation state of +1 for copper. This means that L-Cysteine is sufficient to reduce Cu2+ to Cu+. Furthermore SAED shows distinct d-values for CuxS phases (Figure 3 (b)).

References

[1]        B. Tell, et al., Physical Review B 1971, 4, 2463.

[2]        J. Luo, et al., Nano Letters 2015, 15, 1395.

[3]        Y. Wang, et al., Materials Letters 2014, 137.

[4]        S. Peng, et al., Journal of Alloys and Compounds 2009, 481.

[5]        A. Wochnik, et al., J Mater Sci 2012, 47.

[6]        F. Hofer, et al., Ultramicroscopy 1987, 21.


Anna FRANK (DUSSELDORF, Germany), Angela WOCHNIK, Christina SCHEU
08:00 - 18:15 #6586 - MS05-777 Electron microscopy studies of Silicon Radial junction for stable and highly efficient thin film solar cells.
MS05-777 Electron microscopy studies of Silicon Radial junction for stable and highly efficient thin film solar cells.

Owing to their enhanced light trapping and anti-reflection effect, silicon nanowires (SiNWs) provide an effective platform for developing a new generation of low-cost and efficient solar cells. By decoupling the light absorption and carrier collection directions, SiNWs enable the use of ultra-thin intrinsic layers for high efficiency PIN radial junction solar cells fabricated on the NW matrix. Apart from reducing the material consumption, using thinner absorber layers provides higher built-in field and hence a better separation of carriers. Consequently, the cells operate as random arrays of microscopic PIN diodes connected in parallel with optical and electrical properties of microstructural elements strongly depending on their dimensions, occurrence of defects or structural imperfections. [1,2] From a fundamental point of view, it is expected that overall performances of the cells could be limited by weak diode elements related to local variations of microstructure.

Along this line, the goal of this work is to perform a comprehensive analysis using both TEM and the STEM-HAADF imaging modes, together with the STEM-HAADF electron tomography. This type of analysis provides reliable information regarding the morphology and the crystallographic structure of the radial junction (RJ) which allows us to propose hypotheses, firstly on the nucleation and the growth of SiNWs processes and second how conformaly the hydrogenated amorphous (a-Si:H) layer and ITO(Indium Tin Oxide) layers cover the SiNWs. In order to access the characteristics of each component prior to the TEM observations, an FIB (Focused Ion Beam) preparation technique was used to obtain thin lamellas on each studied radial junction sample. Figure 1(a) shows an SEM image of the complete PIN radial junction solar cell after the deposition of intrinsic and n-type a-Si:H and Fig. 1(c) after the ITO sputtering. Both images were taken at positions marked on the sample photo in Fig. 1(b). The TEM observations performed in bright field mode on transversal FIB cross-sections (see Fig. 2) for both samples allowed the identification of the SiNW- core, the a-Si:H layers (intrinsic and n-type) as well as the ITO. The typical total thickness of the the a-Si:H was estimated to be around 120 nm. Concerning the sputtered ITO layer, the observation allowed seeing that the deposition is done in an inhomogeneous manner with thickness varying from 50 to 90 nm around the RJ. Regarding the morphology of the radial junction, several tomographic studies were performed in STEM-HAADF imaging mode on a radial junction solar cell without an ITO layer. A detailed analysis of the reconstructions suggests that the diameter of the Si core NWs is varying from 22 nm at the bottom to 10-12 nm at the top. Concerning the a-Si:H layers, we have observed that they are not perfectly homogeneous, but have their  thickness varying from 140 nm at the top of the radial junction to 65 nm at its bottom.

 Reference:

[1] S. Misra, et al. J. Phys. D: Appl. Phys. 47 (2014) 39(3001)

[2] S. Misra, L. Yu, M. Foldyna, P. Roca i Cabarrocas. IEEE JPV, 5, 40 (2015)

 Acknowledgements: This work received support from the French state managed by the National Research Agency under the Investments for the Future program under the reference ANR-10-EQPX-50-NANOTEM, as well as from the project Solarium (ANR-14-CE05-0025).


Ileana FLOREA (Palaiseau), Soumyadeep MISRA, Martin FOLDYNA, Raul ARENAL, Jean-Luc MAURICE, Linwei YU, Pere ROCA I CABARROCAS
08:00 - 18:15 #6602 - MS05-779 In-situ thermal stability and reactivity monitoring of Au nanoparticles using Cs-Corrected environmental TEM.
MS05-779 In-situ thermal stability and reactivity monitoring of Au nanoparticles using Cs-Corrected environmental TEM.

        For the production of novel or more efficient catalysts, the link between nanoparticle (NP) structure and catalytic performances need to be understood. Such an understanding requires tools that allow the "observation" with single-atom sensitivity of the surface of real catalysts in response to reaction conditions. Indeed, when nanocatalysts operate in gas environment and high temperature, they do not remain static but undergo dynamic atomic-scale processes (surface restructuration, oxidation...) which directly influence catalytic properties. In this work, we have studied the thermal stability of Au-Cu nanocatalysts under oxidative and reductive environments and/or at high temperature using environmental aberration corrected TEM (ETEM).

 

        Au NPs with controlled sizes, compositions and morphology were synthesized by pulsed laser deposition. Environmental gas TEM of nanocatalysts at the atomic scale was undertaken in an aberration-corrected JEM-ARM200F TEM with in situ gas/temperature conditions achieved by using a MEMS-based nanoreactor (Protochips Inc.) and equipped with a high performance Gatan OneView camera enabling the capture of both high quality images and high-speed videos of in situ events (512 x 512 pixels at 300 fps).

   Figure 1 compares TEM images of Au NPs (a) at room temperature in vacuum, (b) at 300°C under O2 atmosphere and (c) at 300°C under H2 atmosphere. At room temperature, in vacuum, NPs are stable but once a gas, O2 and/or H2 is injected, coalescence phenomena appear. The coalescence continues at 100°C and 200°C. An additional phenomenon appears at 200°C with O2 that does not with H2: particle faceting. At 300°C, under O2, all particles are well facetted (truncated octahedron). When we cool down the sample with O2, the faceting disappears. Thus, particles size and morphology are clearly dependent on temperature and gas nature with an increase in temperature favoring particle coarsening and exposure to an O2 atmosphere leading to more facetted Au NPs.

   Figure2 shows TEM images of Au NPs at 300°C (a) which are all facetted at this temperature (truncated octahedron) and at constant temperature of 850 °C at different times (b,c,d). The NPs become more spherical at higher temperature and began to evaporate at 850°C. One can determine the surface energy of the evaporating particles by means of the Kelvin equation2. There is a size dependence of the surface energy of the NPs, indeed, the surface energy increases with the size. For a particle radius greater than 4nm, one cannot apply the Kelvin model. Thereby, in order to understand the underlying mechanism of the behavior of a nanoparticle in this size range, simulations using the tight binding model are in progress. Also, by alloying gold with copper, we are studying the phase reactivity of AuCu nanoparticles as well.

 

 

 

 

 

 

 

 

 

 

 

References

 

1)       Prunier H. et al., Phys. Chem. Chem. Phys., 2015,17:28339-28346.

2)       Sambles J.R et al., Proc. R. Soc. Long. 1970, A 318, 507.


Adrian CHMIELEWSKI (Paris), Hélène PRUNIER, Jaysen NELAYAH, Hakim AMARA, Jérôme CREUZE, Damien ALLOYEAU, Guillaume WANG, Christian RICOLLEAU
08:00 - 18:15 #6618 - MS05-781 Heterointerfaces TEM characterization of buffer layers in KF treated CIGS solar cells. Towards a new buffer layer?
MS05-781 Heterointerfaces TEM characterization of buffer layers in KF treated CIGS solar cells. Towards a new buffer layer?

Cu(In,Ga)Se2–based (CIGS) solar cells are thin film devices achieving nowadays the highest conversion efficiency (22.3% at the laboratory scale [1]), surpassing any other thin-film or multi-crystalline silicon technology. A heterojunction is obtained in these solar cells by depositing a cadmium sulfide (CdS) buffer layer (n-type semiconductor) on the CIGS absorber layer (p-type semiconductor). The strong conversion efficiency increase over the past three years is due to the introduction of a potassium fluoride treatment (KF evaporation) between the CIGS coevaporation stage and the CdS chemical bath deposition stage [2]. The understanding of the KF deposition stage on the solar cell performance is still under debate, due at least partly to the lack of material characterization at the nanometer scale.

We first present the characterization of two samples with the same CIGS absorber, with and without KF treatment. Transmission electron microscopy (TEM) conducted on cross section lamellae prepared by focused ion beam (FIB) allowed us to evidence several material changes induced by the KF treatment: compared to the untreated sample, the KF-treated sample shows a depletion of Cu, Ga, and Se and a segregation of K and O at grain boundaries close to the CIGS/CdS interface (figure 1). Without KF the CdS/CIGS interface is abrupt and homogenous in the longitudinal direction. The KF treated sample exhibits a 5 nm-thick layer containing mainly Cd, S, In, Se and O at the CdS/CIGS interface, as well as few 50 nm large CdSe particles (figure 2). This ultra-thin interface layer could result in p-CIGS/n+-CdIn2(S,Se)4 type/n-CdS heterojunction, explaining the possibility to reduce the CdS thickness without loss of performance, as already reported in [2].

To go deeper in the understanding of the benefit of such a layer, two other samples were synthesized: both with the same CIGS layer but either with a CdS or a CdIn2S4 buffer layer. The CdS layer was obtained by chemical bath deposition while the CdIn2S4 layer was deposited by physical vapor deposition (PVD). TEM results concerning the sulfur diffusion in CIGS and the crystalline structure of CdIn2S4 layer will be presented [3].

 

[1] Solar Frontier. Press release (2015)

[2] Chirilă, A.et al., Nature materials 12, 1107-1111 (2013)

[3] The authors want to thank the French national network METSA, the CLYM centre in Lyon and the Hubert Curien Program “Pessoa” to provide them TEM and FIB facilities. 


Eric GAUTRON (Nantes), Thomas LEPETIT, Sylvie HAREL, Ludovic ARZEL, Lionel ASSMANN, Agathe FRELON, R-Ribeiro ANDRADE, Sascha SADEWASSER, Thierry DOUILLARD, Thierry EPICIER, Nicolas BARREAU
08:00 - 18:15 #6648 - MS05-783 STEM-EELS valence mapping and charge relaxation in LiFePO4 cathode.
MS05-783 STEM-EELS valence mapping and charge relaxation in LiFePO4 cathode.

LiFePO4 has emerged as an important cathode material for Li-ion batteries because of it stability and high rate capabilities.  It is now well established that lithiation-delithiation occurs via a two-phase reaction. At high charge/discharge rates, the process of nucleation and growth of a two phase reaction is too slow and a non-equilibrium single phase reaction has been proposed followed by relaxation into LiFePO4 and FePO4 end product phases [1].  In this study, we studied relaxation mechanisms and determined the spatial distribution of lithiated/delithiated phases by STEM/EELS spectrum imaging.

LiFePO4 particles from partially charged or discharge electrodes were observed with a cold cathode field emission Hitachi HD2700C STEM and Gatan Enfina EELS spectrometer. The energy resolution of the combined STEM/EELS system was 0.5eV.  The energy was calibrated with respect to the main O-K peak at 539 eV. Typical EELS spectrum for LiFePO4 and FePO4 are shown in Fig.1a and 1b respectively. A characteristic feature of delithiated FePO4 phase is the presence of an oxygen pre-peak marked by an arrow in Fig.1b. This pre-peak in non existant in LiFePO4.  The existence of this O prepeak has been attributed to a transition from O 1s to 2p hybridized state with Fe 3d [2].  In addition the change in Fe valence state from LiFe2+PO4 to Fe3+PO4 is accompanied with a shift to higher energy of Fe-L3 peak position of about 1.5 eV.  In this study we have quantified the existence of these two lithiated and delithiated phases from the shift in Fe-L3 peak energy, Fe L3/L2 peak intensity ratio and from quantification of normalized O pre-peak intensities.  Measurements made from about 50 particles reveal two clusters of data with average Fe-L3 peak energy of 708.2 eV and 709.8 eV with O pre-peak intensity ratio of 0.037 and 0.16 respectively.  These two data clusters correspond to fully lithiated LiFePO4 and delithiated FePO4 phases.  The spectrum images of the lithiated LiFePO4 and delithiated FePO4 expressed as the normalized O pre-peak intensity are shown in Fig.2a and 2b respectively revealing uniform lithiation throughout the particles, i.e. the particles are either fully lithiated or fully delithiated in accordance with the non-equilibrium solid solution transformation path followed by relaxation. An ADF-STEM image taken from an area with many particles and the corresponding phase distribution map are shown in Fig.3a and 3b respectively, revealing a non-uniform distribution of phases with agglomeration of fully lithiated and delithiated regions that include many nanoparticles clusters. 

References

[1]        F. Omenya et al. Adv. Energy Mater. 4 (2014) 1401204 (9pp)

[2]        M.K. Kinyanjui et al. J. Phys. Condens.Matter, 22 (2010) 275501 (8pp)

[3]        The funding for this work is provided by NECCESS, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award Number DE-SC0001294.


Joseph SCHNEIDER-HAEFNER, Dong SU, Yuxuan WANG, Jiye FANG, Fredrick OMENYA, Natasha CHERNOVA, Frederic COSANDEY (Piscataway, USA)
08:00 - 18:15 #6653 - MS05-785 Effect of grain size, precipitation and texture on mechanical and corrosion properties of ECAPed AZ80.
MS05-785 Effect of grain size, precipitation and texture on mechanical and corrosion properties of ECAPed AZ80.

Magnesium alloys have increasing engineering applications due to its high specific strength, for instance in automobile, aerospace and electronics industries [1]. Grain refinement of AZ80 magnesium alloy was achieved by Equal Channel Angular Pressing (ECAP) at 573K for 1, 2 and 4 passes using Bc route [2]. Backpressure of 100MPa was applied to increase the workability and uniformity of the samples [3]. Grain diameter was reduced from 18±0.5 µm to ~6±0.5 µm and further reduced when low processing temperature of 423K was used. SEM/EBSD showed B-fibre texture was obtained after 4 passes of the ECAP process (Figure 1). Number of passes had no significant effect on grain refinement but improve the homogeneity of the samples. Hardness was increased approximately 15% after ECAP. Corrosion resistance of the ECAPed samples was decreased due to the increase in the volume fraction of the grain boundaries and the presence of the uneven distribution of Mg17Al12 precipitates [4]. Grain orientation also affected corrosion rate to some extent. The morphology and composition of the corrosion products was studied using SEM and EDX (Figure 2). The main corrosion products could be a mixture of magnesium hydroxide (Mg(OH)2) and magnesium carbonate (MgCO3).

 

 

References:

1)    A. Yamamoto, R. Tamai, H. Tsubakino, Magnesium: Proceedings of the 6th International Conference, magnesium Alloys and Their Applications, 22 Apr 2005, 568

2)    K. Nakashima, Z. Horita, M. Nemoto, T.G Langdon, Materials and Science Engineering A, 281, 2000, 82

3)    R.E. Lapovok, Metally, Issue 1, 2004, 44

4)    G. Song, Advanced Engineering Materials, 7(7), 2005, 563

 

 

 

 

 

 


Yau Yau TSE (Loughborough, United Kingdom), Kaiyuan ZHANG, Yang DU, Diana MARADZE, Yang LIU
08:00 - 18:15 #6654 - MS05-787 Quantitative approach to twin boundaries in Cu3Pt nanoparticles.
MS05-787 Quantitative approach to twin boundaries in Cu3Pt nanoparticles.

Imperfections of the crystal structure, such as partial ordering, formation of core-shell and Pt rich skin improve the electro-catalytic activity of Pt-based intermetallic nanoparticles used as a catalyst material in low-temperature fuel cells [1, 2]. Impact on the surface reactivity by the core–shell nanostructures could be explained with the induced lattice strain [3, 4]. In the case of twinned structure, the lattice strain significantly influences the interatomic distances and consequently the energy levels of bonding electrons, which determines the catalytic, electrical and optical properties [5]. 

In this work we studied the local structure and chemistry near the lamellar (111) twin boundaries in sol-gel prepared intermetallic Cu3Pt nanoparticles, specially tailored [6] to exhibit high amount of polysynthetic twins.  Using HAADF-STEM (Jeol ARM 200 CF) imaging in conjunction with image simulations we extracted the information about chemical composition and strain on the level of individual atom columns. Experimental Cu-Pt column intensities were measured using modified approach by LeBeau and Stemmer [7]. Experimental intensities were compared to the intensities from simulated images where chemical composition and thickness of individual Cu-Pt columns were varied.

In Fig. 1a a LAADF micrograph (20 – 80 mrad) of (111) twin boundaries in 60 nm sized Cu3Pt nanoparticle is displayed. Enlarged image of lamellar twins is shown in Fig. 1b. The bright contrast around planar defect indicates strain. From HAADF (70 – 180 mrad) images (Fig. 2a) the intensity ratios were extracted and correlated to the average chemical composition of individual columns. Fig. 2b is the distribution of normalized intensities of atomic columns around the twin boundary where a significant decrease in the intensity near the boundary indicating depletion in Pt content. For conversion of intensities to Pt/Cu ratio HAADF images were simulated using a multislice method with frozen phonon approximation (QSTEM software). Using DFT calculations the energy and lattice relaxation were calculated as a function of local chemical composition near the twin boundaries. Taking into account the local strain and chemical composition variation the influence of twin boundaries on electrocatalytic properties will be discussed in details.

 

Acknowledgement

The authors acknowledge funding from the Slovenian Research Agency (J2-6754 and P2-0393)

References

[1] J. Greeley, et al, Nature Chemistry, 1 (2009), p. 552.

[2] D. Wang, et al, Nature Mater., 12 (2013), p. 81.

[3] C. Kuo, et al, ChemSusChem, 6, 10 (2013), p. 113.

[4] P. Strasser, et al, Nat. Chem., 2 (2010), p. 454.

[5] J. Wu, et al, J. Am. Chem. Soc., 134, 29 (2012), p. 11880.

[6] M. Bele, et al, Chem. Comm., 50, 86 (2014), p. 13124.                                       

[7] J. LeBeau and S. Stemmer, Ultramicroscopy 108 (2008), 1653–1658.


Goran DRAZIC (Ljubljana, Slovenia), Francisco RUIZ ZEPEDA, Anja LAUTAR, Primoz JOVANOVIC, Marjan BELE, Miran GABERSCEK
08:00 - 18:15 #6662 - MS05-789 The Importance of Nano-Confinement in Nanoporous Catalysts: Atom Probe Tomography and FIB/SEM study of surface segregation.
MS05-789 The Importance of Nano-Confinement in Nanoporous Catalysts: Atom Probe Tomography and FIB/SEM study of surface segregation.

To improve the understanding of catalytic processes, the surface structure and composition of the active materials need to be determined before and after reaction. Morphological changes may occur under reaction conditions and can dramatically influence the reactivity and/or selectivity of a catalyst. Gold-based catalysts with different architectures are currently being developed for selective oxidation reactions at low temperatures. Specifically, nanoporous Au (npAu) with a composition of Au97-Ag3 is obtained by dealloying a Ag70-Au30 bulk alloy. Recent studies highlight the efficiency of npAu catalysts for methanol oxidation as well as the importance of the residual Ag in the catalytic process. Ozone is used to activate the catalysts before methanol oxidation. In this work, we studied the morphological and compositional changes occurring at the surface of Au-based catalysts of different compositions.

To get better insight of the Ag distribution within the Au backbone, we first analysed nanoporous Au catalysts (composition: Au97-Ag3) by atom probe tomography (APT). APT is a powerful technique to characterize the composition and 3D structure of materials at the atomic-scale, but the presence of pores make the analysis and reconstruction difficult. New developments in sample preparation are required, and we were able to successfully image npAu samples by atom probe tomography and analyse the segregation of Ag atoms in the npAu sample (Fig. 1). Complimentary experiments were performed on a bulk sample of the same composition, and XPS and APT experiments confirm the surface segregation of Ag (as silver oxide species) after ozone treatment, which is then reduced after exposing the catalyst to reaction conditions. Further experiments were performed on bulk Ag70-Au30 samples which were exposed to ozone and reaction conditions. Ozone induces the segregation of Ag at the surface, which forms a distinct black layer of silver oxides. Below this oxide, a homogeneous Ag-depleted region (Ag56-Au44) can be observed, and extends over a depth of a few μm (the depth depends on the duration of the ozone treatment). As it can be seen on Fig. 2, this region undergoes severe morphological changes, and the bulk sample becomes porous. FIB cross-section analysis proves the segregation behaviour and long-range diffusion of Ag in bulk samples, as compared to the nanoscale-segregation observed by APT, correlating previous observations by E-TEM. The nanoconfinement induced by the specific architecture of the nanoporous sample is then responsible of the long term stability and efficiency of the catalyst.

 This study highlights the importance of ozone treatment in the segregation of Ag at the surface, which can dramatically influence the local chemistry and morphology of a catalyst. The combination of APT, FIB/SEM and XPS allows studying the surface and subsurface compositional and morphological changes of the sample after various physicochemical treatments, and also allows the segregation behaviour of Ag in different Au-based catalysts to be correlated.


Cedric BARROO, Nare JANVELYAN, Branko ZUGIC, Juergen BIENER, Austin AKEY, Cynthia FRIEND, David BELL (Cambridge, USA)
08:00 - 18:15 #6689 - MS05-791 Revealing nanoscale morphology of organic solar cell blend by analytical electron microscopy.
MS05-791 Revealing nanoscale morphology of organic solar cell blend by analytical electron microscopy.

Organic photovoltaic as future technology with cost-efficient production and printability is a promising research field. New materials and studying improved synthesis techniques over the past years lead to efficiencies of more than 13 % by organic solar cell [1]. In order to improve device efficiencies, the conversion rate of photo-generated excitons to electron-hole pairs should be increased. This critical aspect, depends on the complex morphology of distributed donor and acceptor materials.

In this work we resolve the morphology of an organic solar cell, where the active layer is a blend of two small molecules; ZnPc (ZnC32H18N8) as donor and C60 as acceptor.  The investigation of nanoscale morphology and phase distribution is conducted using Energy Dispersive X-ray spectroscopy (EDX) and Energy selective Backscattered (EsB) imaging in SEM [2]. The results are confirmed using analytical TEM.

The unique aspect of this work is substituting complicated TEM method by SEM with these advantages:

• Possibility of resolving chemical composition in a real solar cell in contrast to commonly deposited blend layer on TEM grids, that allows to study the complete stack of glass substrate, Indium tine oxide (ITO) electrode, electron and hole transport layers and aluminum top electrode.

• No influence of thick (90 nm) layer of heavy ITO, which is under the donor acceptor blend layer, on the TEM study.

• Gaining insight into the height distribution and roughness beside the lateral distribution (as in TEM)

To correlate morphology and material contrast we combined EDX data of the pure materials (composition of specific structure) with EsB detector mapping (strong contrast, unknown corresponding material). EDX spectrum of two material phase is shown in Figure 1, the same features where imaged by EsB detector, as it can be seen in Figure 2. Taking advantage of this combined data, we overcome poor EDX lateral and depth resolution. Since exciting Zn-K using high energy electrons, deteriorates the spatial resolution and damage the material.

Furthermore, we manage to observe the phase morphology, despite the very close mass average and quite similar chemical composition of the two phases.

In principle the technique can be extended to 3D mapping by use of slice-and-view approaches. Finally, our analytical TEM (EELS and EDX) investigations proved the corresponding morphology of each phase.

 

Acknowledgement:

Authors thank A. Garitagoitia Cid for SEM supply of the images in figure 2. This work was supported by the German Science Council Center of Advancing Electronics Dresden (cfaed).

 

References:

[1] Heliatek record on February 8thhttp://www.heliatek.com/en/press/press-releases

[2] “Energy-filtered backscattered imaging using Low Voltage SEM” A. G. Cid, M. Sedighi, M. Löffler, W. F. van Dorp and E. Zschech. (submitted)


Mona SEDIGHI (Dresden, Germany), Markus LÖFFLER, Ehrenfried ZSCHECH
08:00 - 18:15 #6701 - MS05-793 Characterization of Solution-Annealed and Thermally-Treated Alloy 600 Intergranular Oxidation using Advanced Analytical Electron Microscopy.
MS05-793 Characterization of Solution-Annealed and Thermally-Treated Alloy 600 Intergranular Oxidation using Advanced Analytical Electron Microscopy.

The susceptibility of Ni-Cr-Fe alloy (Alloy 600) to intergranular stress corrosion cracking (IGSCC) in light water reactor (LWR) primary water environment is well-known. However, SCC initiation mechanism is still unclear and under debate, especially the key parameters responsible for the general and localised “internal” oxidation susceptibility of Alloy 600 in LWR primary environment require elucidation to develop a mechanistic understanding of the phenomena and to assess their relative importance. 

It is well-known that the precipitation of intergranular M7C3 carbide network improves Alloy 600 Stress Corrosion Cracking resistance in PWR primary water environment. However, the main reason for the beneficial effect of intergranular carbides is still uncertain. In this study, the effect of grain boundary carbides on the preferential intergranular oxidation susceptibility and local grain boundary (GB) migration of Alloy 600 has been studied in detail. Solution-annealed (SA) and thermally-treated (TT) Alloy 600 oxidation coupons were exposed for 120 hours in hydrogenated steam environment at 480°C. This oxidation system successfully simulated PWR oxide morphologies [1-3]. A combination of field emission gun (FEG) scanning electron microscopy (SEM), focused ion beam (FIB) microscopy and analytical electron microscopy (AEM) techniques have been used to characterize in detail the type and extent of preferential oxidation associated with the development of SCC initiation sites.

The surfaces of the oxidized Alloy 600SA and Alloy 600TT specimens were evaluated in an FEI Magellan XHR FEG-SEM using both secondary electron (SE) and backscattered electron (BSE) modes. High resolution SEM characterization revealed a marked difference between the two thermal treatments especially in terms of HAGB undulations and oxide GB structure, Fig. 1. Surface oxide morphology was correlated with intergranular oxidation susceptibility and local GB migration by using FIB cross-sections analysis and TEM examination (Fig. 2).  Further AEM analyses were performed using the FEI Titan G2 80-200 aberration-corrected S/TEM with Super EDX.  Detailed scanning transmission electron microscope (STEM) - energy dispersive x-ray (EDX) microanalysis of FIB TEM lift-out specimens containing at least one grain boundary revealed the presence of a Cr-Fe rich oxide at the grain boundaries and a marked microchemical redistribution in the near-surface region for both SA and TT Alloy 600 (Fig. 3, Fig. 4). However, a noticeable difference in terms of intergranular oxide penetration and local grain boundary migration was observed when comparing the solute segregation/depletion and Intergranular oxidation between the SA and TT specimens.

References:

[1] F. Scenini, R. C. Newman, R. A. Cottis, R. J. Jacko, “Alloy 600 oxidation studies related to PWSCC.” In: Proceedings of the 12th Int’l. Symp. on Environmental Degradation of Materials in Nuclear Power System- Water Reactors (2005).

[2] G. Bertali, F. Scenini, M. G. Burke, “Oxidation Studies of Alloy 600 in Low Pressure Hydrogenated Steam  In: Proceedings”, In: proceedings of the 16th international symposium on environmental degradation of materials in nuclear power system- water reactors (2013).

[3] G. Bertali, F. Scenini, M.G. Burke, “Advanced Microstructural Characterization of Alloy 600 Intergranular Oxidation.”, Corrosion Science 100 (2015), 474-483.


Giacomo BERTALI (manchester, United Kingdom), Fabio SCENINI, Grace BURKE
08:00 - 18:15 #6765 - MS05-795 Analysis of capping with GaAsSbN thin layers in (un)coupled InAs/GaAs multi quantum dot layers for enhanced solar cells.
MS05-795 Analysis of capping with GaAsSbN thin layers in (un)coupled InAs/GaAs multi quantum dot layers for enhanced solar cells.

Nowadays, stacked InAs/GaAs quantum dots (QDs) capped with layers different than GaAs are being applied in photovoltaic and photodetector technologies due to their potential for tailoring the optical properties and enhancing the device efficiency.1,2 The particular use of GaAsSbN capping layers (CLs) allows controlling the QD size as well as the electron and hole confinement potentials in a wide range.3 In addition, multi-coupled QD structures formed by vertically aligned QDs represent a very interesting approach, which enhances the photoluminescence (PL) intensity and reduces the spectral width by utilizing carrier tunneling among QDs. However, in this type of nanostructures the control of the QD composition, size and alignment are important parameters as they affect the electronic coupling and the carrier lifetime. In this work, we analyze the effect of using 2.5 nm-thick capping layers of GaAs0.76Sb0.2N0.04 in an (un)coupled 10 stacked layer structure of InAs/GaAs QD by transmission electron microscopy (TEM) techniques. For this, we have compared three samples: two samples with uncoupled QDs (the spacer thickness is 40 nm) with (SbN-u) and without CL (Ref), and a coupled sample with CL and a spacer thickness of 10 nm (SbN-c). PL and photocurrent (PC) data are also used in the discussion.

Cross sectional g200 dark field (DF) images sensitive to composition have been used to obtain a statistic of the buried QD size (Figure 1). For the uncoupled samples, our measurement on more than 90 QDs revealed an unexpected similar height for Ref and SbN-u samples (4.7 nm) while the average diameter presents a slight increase in sample SbN‑u with respect to Ref sample (from 17 to 19 nm). The panorama changes totally for SbN-c sample, where the average height and diameter increases layer by layer from 4.7 to 5.2 nm and from 23 to 34 nm, respectively. The relative volume rises quickly (Figure 1) up to the 4th layer, and after slowly, becoming 7 times higher in the upper layer. The shield effect of Sb in the QD decomposition is not appreciated. Indeed, EDX measurements revealed only tiny traces of Sb in the CLs that we related with the typical delay observed in the Sb incorporation due to the CL small thickness. In addition, strain maps from high resolution TEM images acquired on the [110] pole axis were calculated. The comparison between the uncoupled samples discloses that N is incorporated in the CL. The same occurs in the coupled sample where a high compressive strain appears over the QDs (Figure 2). More important, the strain into the QDs decreases in a similar way that the volume increases. Finite element simulations suggest a modification of segregation process during the growth, with an increase of Ga incorporation in the QDs of the upper layers.

Acknowledgments

We acknowledge the Spanish MICINN–MINECO for funding through Project MAT2013-47102-C2, and SCCYT-UCA for technical support.

References

1 D. Gonzalez et al., Solar Energy Materials & Solar Cells 145 (2016) 154–161

2 A. D. Utrilla et al., Solar Energy Materials & Solar Cells 144 (2016) 128–135

3 J. M. Ulloa et al.,Appl. Phys. Lett. 100, 013107 (2012)

 


Daniel F. REYES (Chiclana de la Frontera, Spain), Veronica BRAZA, Antonio D. UTRILLA, Teresa BEN, Alvaro GUZMAN, Adrian HIERRO, Jose M. ULLOA, David GONZALEZ
08:00 - 18:15 #6800 - MS05-797 Combining TEM and APT for a better understanding of super high efficiency Cu(In,Ga)Se2 thin film solar cells.
MS05-797 Combining TEM and APT for a better understanding of super high efficiency Cu(In,Ga)Se2 thin film solar cells.

The Sharc25 EU H2020 project aim is to push the efficiency of Cu(In,Ga)Se2 (CIGS) thin film solar cells to their maximum theoretical limit. Sharc25 consists in a large consortium to take under consideration both theoretical and experimental aspects. One of the strategies to achieve this goal is to improve and understand the CIGS absorber material deposited by co-evaporation.

The polycrystallinity of the CIGS absorber layer is one of the key elements which plays a crucial role in its efficiency. We combine here atom probe tomography (APT) (Fig. 2) and transmission electron microscopy (TEM) to study the distribution of alkali elements at sub-nanometer scale and with statistic relevancy. 3D APT atomic mapping of grain boundaries (GB) is here completed by systematic STEM-EDS analyses of GB all along the CIGS absorber layer (Fig. 1). Issues on samples preparation for APT and TEM will be also discussed.

This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No 641004


Celia CASTRO (UMR 6634 CNRS, Université et INSA, Rouen), Mohit RAGHUWANSHI, Philippe PAREIGE, Sébastien DUGUAY, Emmanuel CADEL, Wolfram WITTE, Philip JACKSON, Dimitrios HARISKOS, Friedrich KESSLER, Stephan BUECHELER, Romain CARRON, Enrico AVANCINI, Benjamin BISSIG, Ayodhya TIWARI
08:00 - 18:15 #6809 - MS05-799 The Influence of Gold on Corrosion Resistance of PtCu3/C Nanoparticles Composite.
MS05-799 The Influence of Gold on Corrosion Resistance of PtCu3/C Nanoparticles Composite.

One of the applications of Pt-based nanoparticles on high surface area carbon (HSAC) support composites is as a catalyst in polymer electrolyte membrane fuel cells (PEMFC) [1]. Yet the full commercial implementation of the technology has been hindered by the composite cathode which exhibits a low catalytic activity for oxygen reduction reaction (ORR), a poor stability in electrochemical environment and is expensive due to use of Pt. One solution to those issues is to alloy Pt with other transitional metals, which will not only reduce the composite costs, but also increase the catalytic activity for ORR [2]. Chemical ordering of the Pt-M/HSAC (M=Metal) composite has shown to improve the stability of the nanoparticles, as well as to enhance the catalytic activity for ORR. [3]. Recent work has shown that adding a small amount of gold can improve the durability of Pt and Pt-based nanoparticles [4,5], as well as inhibit the oxidation of HSAC support [5].

We have used Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) to study the effect of gold on the Pt-skin partially ordered intermetallic PtCu3/HSAC composite. Au doped PtCu3/C and PtCu3/C composites were compared side to side, before and after an electrochemical cycling treatment. Fig. 1 shows scanning transmission electron microscopy annular dark filed images and energy dispersive x-rays maps of the two composites after 200 cycles of electrochemical activation (EA, 0.05 – 1.35 VRHE, 300 mVs-1). Less porous nanoparticles and lower Cu dissolution are observed in the Au doped PtCu3/C composite. Surface modifications were also observed in non-porous nanoparticles after performing 10 000 cycles of severe degradation (0.4 – 1.4 V, 1 Vs-1): (1) thickening of the Pt skin, (2) faceting and (3) surface dislocations (Fig. 2). These surface modifications may have influence on stress and nanoparticle stability. Overall, the Au doped PtCu3/C composite exhibited higher Cu retention and better durability compared to its binary analogue.

 

References:

[1] M. K. Debe, Nature 486 (2012) 43−51.

[2] J. Greeley, I. E. L. Stephens, A. S. Bondarenko, T. P. Johansson, H. A. Hansen, T. F. Jaramillo, J. Rossmeis, I. Chorkendorff and J. K. Nørskov, Nature Chemistry 1 (2009) 552 – 556.

[3] M. Bele, P. Jovanovič, A. Pavlišič, B. Jozinović, M. Zorko, A. Rečnik, E. Chernyshova, S. Hočevar, N. Hodnik and M. Gaberšček, Chem. Commun. 50 (2014) 13124-13126.

[4] J. Zhang, K. Sasaki, E. Sutter, R. Adzic, Science 315 (2007) 220−222.

[5] M. Gatalo, P. Jovanovič, G. Polymeros, J. P. Grote, A. Pavlišič, F. Ruiz-Zepeda, V. S. Šelih, M. Šala, S. Hočevar, M. Bele, K. J. J. Mayrhofer, N. Hodnik, M. Gaberscek. ACS Catal. 6 (2016) 1630–1634.

 

Acknowledgments:

The authors would like to acknowledge support from Slovene Research Agency and NATO SfP “Durapem” project.


Francisco RUIZ-ZEPEDA (Ljubljana, Slovenia), Matija GATALO, Primož JOVANOVIČ, Marjan BELE, Goran DRAŽIĆ, Miran GABERŠČEK
08:00 - 18:15 #6825 - MS05-801 Nanostructured MnxOy as catalyst for Oxygen Reduction Reaction.
MS05-801 Nanostructured MnxOy as catalyst for Oxygen Reduction Reaction.

Nowadays the development of new and clean energy resources represents one of the major scientific challenges, due to the growing concerns about global warming. The electrochemical Oxygen Reduction Reaction (ORR) occurring at the cathode of fuel cells and metal-air batteries is one of the key limits for their further development and requires electrocatalysts to increase its efficiency. Manganese oxides are among the most interesting non-precious metal-based catalysts due to their low cost, relatively high abundance, low environmental impact and considerable electrocatalytic activity.

In this work we present nanostructured manganese oxides in the form of xerogels (obtained by means of the sol-gel plus freeze-drying techniques) and in the form of nanofibers (obtained by means of the electrospinning technique). They were synthesized by employing manganese acetate as the Mn source and by employing environmental friendly (water is the used solvent) templating agents, such as agar and polyethylene oxide, for xerogels and nanofibers respectively.

To investigate the oxidation process forming the manganese oxides species, structural and morphological characterizations (in-situ X-ray diffraction, field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM)) were performed on both the nanostructures.

Concerning manganese oxide xerogels, in situ X-ray diffractograms were recorded while heating in air the as-prepared material from room temperature up to 725 °C, at a heating rate of  2.5°C/min. Figure (1a) shows the phase evolution of the xerogel as a function of the temperature. From this image it can be observed that Mn3O4 nucleates and grows at temperatures between 175 °C and 475 °C, temperature at which the α-Mn2O3 phase starts to evolve; the latter completes its formation at 700 °C approximately, while Mn3O4 is progressively disappearing. From Rietveld refinements of all diffractograms, major differences were found in the crystal size of the two phases, where the average size for Mn3O4 was 21± 1 nm, while it was 65.8±0.8 nm for α-Mn2O3.

By means of bright field TEM and selected area electron diffraction (SAED) techniques, two different morphologies were observed, i.e. nanosized grains and large dendritic structures, composed of rectangular domains of less than 100 nm (Figure 2). The SAED pattern is composed by two different patterns, that are clearly distinguished. The first corresponds to complete and low-intensity rings, which were indexed as Mn3O4, and that could, a priori, be assigned to the nanosized grains. The second pattern of bright spots was assigned to the large dendritic structure, and indexed as Mn2O3 along the [201] axis zone. The TEM and SAED results are in agreement with the Rietveld analysis.

Regarding manganese oxide nanofibers, in-situ X-ray diffractograms were recorded while heating in air the as-prepared material from room temperature up to 725 °C, at a heating rate of  2.5°C/min. Figure (1b) shows the phase evolution of the nanofibers as a function of the temperature. From this image is observed that Mn3O4 starts to nucleate and grow at temperatures between 125 °C and 575 °C, temperature at which the α-Mn2O3 phase start to evolve, while Mn3O4 is progressively disappearing.

From FESEM and bright field TEM characterizations (Figure 3), it is evident that the nanofibers are composed by nanosized grains of few nanometers.

The catalytic performance of the two nanostructured catalysts were characterized by means of the rotating ring disk electrode technique by using 4-electrodes measurements. Both xerogels and nanofibers showed extremely good performances for the oxygen reduction reaction, with n values between 3.5 and 3.7, meaning a predominant 4-electrons reduction pathway.

In conclusion, nanostructured xerogels and nanofibers of manganese oxides were prepared through the sol-gel plus freeze-drying and the electrospinning techniques respectively, and by using biocompatible and biodegradable precursors. The obtained materials were composed by Mn3O4, Mn2O3, or a mix of both, depending on the temperature. Both materials showed good catalytic performance for the ORR, making them good candidates as low-cost and green catalysts for applications in electrochemical devices.


Jose Alejandro MUÑOZ TABARES (Torino, Italy), Gian Paolo SALVADOR, Luisa DELMONDO, Matteo GEROSA, Adriano SACCO, Nadia GARINO, Giulia MASSAGLIA, Marzia QUAGLIO, Candido Fabrizio PIRRI, Angelica CHIODONI
08:00 - 18:15 #6858 - MS05-803 Decorated Carbon Nanotubes for Electrochemical Energy Storage (EES) systems.
MS05-803 Decorated Carbon Nanotubes for Electrochemical Energy Storage (EES) systems.

Electrochemical Energy Storage (EES) systems have various applications ranging from large-scale generation and transmission-related systems, to distribution networks, customer/end-user sites or electrical mobility and transportation. [1] Still higher performance and more environmentally acceptable component materials are continuously required. This can only be overcome by major advances in materials with nanomaterials playing a central role. Lithium-Ion batteries, by far the most common form of EES system, share three common features: two electrodes and an ionically conducting electrolyte which provides means of transporting ions to and from the component electrodes. The electrodes comprise a current collector and an active material. Improvement in the design of one or more of these features may lead to EES systems with improved performance, delivering higher energy densities and characteristics such as increased capacity, charge/discharge rates and cycle lifetime.

Along this line the key-issue addressed by the present work relates to the assessment of the batteries performances when nanostructured electrode materials are considered for both the anode and the cathode. Grown directly on the current collector (copper for anode and respectively aluminum for cathode) substrate, thin walled carbon nanotubes in the form of very dense vertically aligned (VACNT) carpets are considered as ideal support matrix (current collector) for the insertion active materials due to their efficient electron transport pathways and stable mechanical support. [3] The present work focuses in presenting preliminary 2D analysis based on advanced electron microscopy techniques (TEM, HR-TEM, STEM) coupled with the spectroscopy ones (EELS and EDX), dedicated to the characterization of both anode and cathode decorated carbon nanotubes based electrodes. The different analyses allowed the validation of the CNTs carpets fabrication, which becomes nanostructured current collector upon their coupling (decoration) with Si nanoparticles for anodes and metallic lithiated nanoparticles (LiMO2) for cathode. The electrochemical experiences performed on the nanostructured system confirmed the devices performance. Regarding the anode fabrication, the synthesis of CNTs directly on the copper substrate is visible from figure 1a) that using a dHF-CVD technique one can obtain a homogenous and very dense carpet of VACNT having a 60µm length. The HR-TEM analysis allowed identifying a double walled structure for the nano-tube with a diameter size of 3-4nm presenting surface defects which act as anchorage sites for the eletrodeposition of the nanoparticles. Concerning the nano-tubes decoration with silicon nanoparticles the process has been carried following an innovative approach using ionic liquid with SiCl4 as precursor for Si. These hybrid nanostructures are expected to enhance the electrode capacity since the VACNT acts as both mechanical support and electrical conductor while silicon nanoparticles as high capacity insertion anode material. Figure 2b) illustrates silicon decorated CNTs. The HR-TEM analyses on several areas on the current collector allowed evidencing that the deposition is obtained homogenously on all nanotubes with nanoparticles sizes ranging from 5 to 30nm. Regarding the cathode fabrication, similar TEM analyses have been performed to validate the synthesis of CNTs carpets on aluminum foil substrate as well as their subsequent decoration with LiMO2 nanoparticles.

 

References:

[1] Nanostructured Materials for Electrochemical Energy Production and Storage; Springer (2009) eds. David J. Lockwood, doi: 10.1007/978-0-387-49323-7 or (b)

[2] A.K. Shukla and T. Prem Kumar; WIREs Energy Environ 2013, 2: 14–30, doi: 10.1002/wene.48

[3].A. Gohier, B. Laïk, K. Kim, J. Maurice, J-P. Pereira-Ramos et al, Advanced Materials 84 (2012) 2592-2597

 

Acknowledgements:

Authors gratefully acknowledge funding from Chaire Development Durable Ecole-Polytechnique-EDF.

 


Mariam EZZEDINE (Palaiseau), Ileana FLOREA, Costel-Sorin COJOCARU
08:00 - 18:15 #6882 - MS05-805 2D-TEM investigations of CNTs synthetized within vertical-PAA templates for devices applications.
MS05-805 2D-TEM investigations of CNTs synthetized within vertical-PAA templates for devices applications.

Since their discovery in 1991 carbon nanotubes (CNTs) become one of the most emblematic type of nanostructures due to their unique electrical, mechanical, thermal and optical properties. Despite these promising and astonishing properties, the critical subject of their manipulation remains a primordial challenge. Very expensive and time consuming techniques, like e-beam lithography, have been developed in order to precisely control their growth, or to obtain a nano-object from the etching of a bulk material. Such techniques are suitable as proofs of concept; however the object-by-object manipulation approach is unrealistic because they are not compatible with a massive integration. On the other hand the miniaturization of the fabricated devices is reaching a bottleneck since the scaling-down for enhancing their performance is approaching many physical limitations. The efforts concentrated to achieve device fabrication by continuous miniaturization are nowadays struggling with performance decline in the electrical conductivity transports values and a significantly loss of reliability. Self-organized templates such as porous anodic alumina (PAA) templates provide several advantages for controlling the nanostructures growth.[1,2] Its well-ordered structure and the confinement imposed by the nanopores the PAA template offer a promising approach for cost-effective, stable and efficient fabrication of carbon nanotubes based devices.[3]

Here we present a complete 2D analysis based on advanced electron microscopy techniques devoted to the full characterization of both the PAA structure and the as-grown CNTs using a dHF-CVD (double-Hot Filament assisted CVD) synthesis method. More exactly, we combine the FIB (Focused Ion Beam) preparation technique with advanced TEM characterization techniques such as STEM-EDX and EELS spectroscopy for the assessment of an accurate correlation between the synthesis parameters and the morphological, structural and chemical characteristics of both the PAA structure and the as-grown CNTs.

In a first step, the TEM analysis of different PAA cross-sections prepared using the FIB technique, allowed us accessing precise characteristics such as the pore length (800nm) and their diameter (30nm) as well as the inter-pore distance (30nm) (see figure1). A more detailed analysis on the bottom part of the PAA structure helped us evidencing the presence of a branched nanopores structure product of an exponential voltage decrease process, applied in order to thin the oxide barrier layer at the bottom of the pores.

For the CNTs, we first examined the impact of the catalyst pretreatment step performed prior to the CNTs growth step. Secondly, by varying the hot-filaments power applied during the growth, we investigated the impact of the additional gas phase activation conditions over the synthesized carbon nanostructures. The results revealed that the pretreatment conditions determine the catalyst distribution at the bottom pores of the PAA membranes, with a strong impact on the CNTs growth within the PAA templates. Another important finding concerns the amount of defects incorporated into the grown CNTs walls which could be related to the hot-filament power applied during the synthesis.

 

References:

[1] Maune, H.T., et al., Nature Nanotechnology, 2010. 5 (1): p. 61-66.

[2] Choi, W.B., et al., Applied Physics Letters, 2001. 79(22): p. 3696-3698.

[3] Kim K.-W., et al., Adv. Mater. 2014, 26, 4363–4369.

 

Acknowledgements:

This work received support from the French state managed by the National Research Agency under the Investments for the Future program under the reference ANR-10-EQPX-50-NANOTEM.


Ileana FLOREA (Palaiseau), Leandro Nicolas SACCO, Marc CHATELET, Costel-Sorin COJOCARU
08:00 - 18:15 #6892 - MS05-807 Microstructure-Thermal Conductivity Relationship in Pressureles Sintered AlN Ceramics for Energy Applications.
MS05-807 Microstructure-Thermal Conductivity Relationship in Pressureles Sintered AlN Ceramics for Energy Applications.

Aluminum nitride (AlN) ceramics are attractive materials for microelectronic packaging due to its high thermal conductivity, low dielectric constant and good matching of thermal expansion coefficient [1-4]. However, it is difficult to sinter AlN due to its strong covalent bonding. Densification of AlN powder has been attempted by various techniques. For full densification, rare earth and/or alkaline earth oxides are often added as sintering aids during the fabrication of AlN ceramics [4]. To investigate the effect of microstructure on the thermal properties and sintering behaviour, commercially available AN powder (Grade H, Tokuyama Co. Ltd., Japan) was sintered pressureless by using commercially available Sm203 and Yb203 powders (purity > % 99, Treibacher Industrie, AG, Austria ) as sintering additives and graphene as a secondary phase to improve the thermal properties.

The powder mixture was milled by plenatory ball mill in ethanol for 1.5 hours at 300 cycles / min. Then, the ethanol in the slurry was evaporated. After drying, the powders were pressed by handpress at 50 MPa to obtain pellets. The pellets were cold isostatically pressed (CIP'ed) under 200 MPa. The specimens were then placed into a BN crucible and sintered at 1800 — 1860oC in a graphite furnace with a flowing nitrogen gas.

The heat capacities of the samples were measured by DSC (NETZSCH STA 449F3) whereas the thermal diffusivities of the samples were measured by laser flash technique (Netzsch-LFA 457). The sintered samples were characterized by employing XRD, SEM and TEM techniques. XRD patterns of the samples were recorded using a (Rigaku Rint 2200, Tokyo, Japan) monochromatic CuKα radiation. Scanning electron microscope (SEM) investigations were carried out using a ZEISS SUPRA 50 VP microscope. For TEM investigations 200 kV field emission TEM (JEOL JEM-2100F) equipped with STEM high angle annular dark field (STEM-HAADF) detector (Model 3000, Fischione), electron energy loss spectrometer (EELS) and energy filter (Gatan TM GIF Tridiem), and energy dispersive spectrometer (EDS) (JEOL JED-2300T) was used.

Three different liquid phase addition caused to obtain different intergranular phase formation resulting in a decrease in the thermal diffusivity of the materials with the addition of Yb203 (Fig 1a). When the micstructure was investigated with STEM HAADF (Fig 1 (b, c and d)), the grain boundary intergranular films found to have a very different behaviour. In this study, property-microstructure realtionship for AlN ceramics and AlN-graphene composites will be presented as a function of different sintering addities, different sinterin conditions and heat treatment procedures.

References

[1] C. Yun et al. (2015) Ceramics International 41, 8643.

[2] R.R. Tummala, (1991), J. Am, Ceram. Soc. 74, 895.

[3] L.M. Sheppard, (1990), Am. Ceram. Soc. Bull. 69, 1801.

[4] A.V. Virkar, (1989), J. Am. Ceram. Soc. 72 2031.

[5] J . Yoshikawa et al. (2005), J. Am. Ceram. Soc.88 3501.


Servet TURAN (Eskisehir, Turkey), Alper CINAR, Pinar KAYA
08:00 - 18:15 #6895 - MS05-809 Characterization of the glass-coated CoSb3 thermoelectric material by electron microscopy.
MS05-809 Characterization of the glass-coated CoSb3 thermoelectric material by electron microscopy.

  Over the last years alternative sources of energy took on special significance. Durability, reliability and maintenance-free operation make the devices for power generation based on thermoelectric materials very attractive. Beside high efficiency, one of the main requirements for thermoelectric materials is the stability of the properties during the long-time operating at elevated temperatures. Doped cobalt triantimonides (CoSb3) are used as components of thermoelectric devices at temperature range about 400–600 ˚C. The main difficulty of the CoSb3 application is the degradation of its thermoelectric properties as a result of antimony sublimation and material oxidation at elevated temperatures. To prevent these processes protective coatings are foreseen.

   The objective of this work was to characterize the glass coating/CoSb3 interface and to determine its influence on the CoSb3 stability at elevated temperatures. The borosilicate glass coatings with different chemical compositions were applied on the CoSb3 substrates by dipping and then fired in air at temperature up to 700 ˚C.  To determine oxidation resistance, coated samples were oxidized at 600 ˚C in air. Then samples were examined by SEM/EDS and TEM/EDS. Merlin Gemini II of ZEISS (SEM) as well as a probe Cs-corrected Titan3 G2 60-300 equipped with ChemiSTEM™ system were used to investigate the oxidized samples. TEM lamellae were prepared by FIB facility. Phase identification was performed by STEM-EDS and SAED electron diffraction supported with the JEMS software. Surfaces, fractures facets and cross-sections were analyzed to assess the quality of the coatings, adherence to the underlying substrate and glass coating/CoSb3 interface structure.

   Depending on the chemical composition of the glass (the content of the network modifiers), different effects were observed at the glass coating/CoSb3 interface. The results of the study showed that effective protection for CoSb3 against oxidation at 600 ˚C in air was possible only if:

1)    No crystallization near glass/substrate interface occurred. During coating firing antimony oxides were formed and reacted with the glass. However, glasses with too high Sb2O3 content (more than 50%) tends to crystallize. Air trapped in the voids in the crystallization zone caused degradation of the substrate by oxidation during annealing at elevated temperatures.

2)    Porosity at the glass coating/CoSb3 interface caused by the antimony sublimation during firing was as small as possible (Fig. 1).

3)    Bonding mechanism due to mutual solubility of the glass to the substrate was involved. The Sb2O3 and SiO2 form an eutectic type phase diagram with low eutectic temperature. Increased antimony concentration in the inner part of the coating (Fig. 1) denotes the scale dissolving in the liquid phase.

4)    Mechanical bonding was developed (Fig. 2).

5)    Chemical bonding was of less importance in studied case. The Cu precipitates observed on the SEM/EDS maps near the interface indicated that following reaction could be involved:

3 CuO(glass) + 2 Sb(substrate) = Sb2O3(glass) + 3 Cu.

However the glass coating/CoSb3 interface as shown in the TEM image (Fig. 3) is sharp and shows no transition zone, characteristic for the chemical bonding.

   Summarizing, the borosilicate glass with high titania content was found to be an effective protection for CoSb3 during the exposure to air at 600 ˚C. The glass coating was an effective barrier for oxygen diffusion into the material and for antimony sublimation, therefore chemical and phase composition of the substrate was not affected by the oxidation. Good coating/substrate adhesion was ensured mainly due to mutual solubility and mechanical bonding mechanisms.

 

Acknowledgments The study was supported by the AGH-UST statutory project (no. 11.11.110.299). The authors wish to acknowledge Mr Adam Gruszczynski, MSc. for FIB lamellae preparation.


Kinga ZAWADZKA, Oleksandr KRYSTHAL, Marek NOCUŃ, Elżbieta GODLEWSKA, Aleksandra CZYRSKA-FILEMONOWICZ (KRAKOW, Poland)
08:00 - 18:15 #6898 - MS05-811 Study of the Mg Insertion in Mn-based Spinel and Birnessite Structures Upon Electrochemical Cycling.
MS05-811 Study of the Mg Insertion in Mn-based Spinel and Birnessite Structures Upon Electrochemical Cycling.

The search for low cost and environmental friendly intercalation cathode materials offering high power density in rechargeable ion-exchange batteries is driven by the limitations of the existing Li-ion technology. At present, the use of the lithium metal as a negative electrode is restricted to the use of specific polymer electrolytes1 which hinder the formation of the dendrites. Therefore, the graphite negative electrodes are employed. However, they reduce the theoretical capacity density from 2046 mAh cm-3 to ~850 mAh cm-3 and drastically increase costs. Here, the application of multivalent battery technology that pairs an intercalation cathode with the metal electrode thus allowing for higher energy density and lower costs, is desired2.

Among the candidates, Mg metal that possesses high volumetric specific capacity of 3833 mAh cm-3, exhibits no dendrite growth on deposition2, is safe to handle in ambient atmosphere and largely available, is of special interest3. Various materials have shown the initial promise for multivalent intercalation, including Chevrel phase Mo6S6, layered V2O5, graphitic fluoride, etc. However, owing to the limited mobility of Mg ions and possible concurrent insertion of water and/or protons, the cycling stability of these host materials has been shown insufficient.

The promising candidates for the cathode materials that display higher voltages than Chevrel phases are variants of manganese oxide. In this study we have chosen a MgMn2O4 spinel and (MgxNay)Mn2O4 birnessite phases. These materials crystal structures employ different mechanisms for keeping the stability upon cycling and allow for Mg de/insertion, which was performed in magnesium nitrite aqueous electrolyte. The aim of the study was to investigate the possible Mg insertion mechanisms in both materials prior assembling a battery by correlating the cyclic voltammetry (CV) results with the structural and compositional changes of these cathode materials by S/TEM at the atomic level upon increasing number of cycles.

 The spinel phase was prepared by the delithiation of the commercially available LiMn2O4 spinel in 0,1 M Mg(NO3)2 aqueous electrolyte and its following magnesiation. The Mg containing birnessite phase was synthesized by the rout described by Aronson and coworkers via Na-birnessite phase4. The STEM-EDX confirmed partial exchange of Na over Mg with the Mg occupying fully the smaller particles and only the outer shells of the larger particles. Same behavior was observed in the spinel material, where the small particles had a higher Mg content than the large particles (above 200 nm). Both materials were then put through the CV tests to explore the Mg de/insertion mechanisms. Plots in Fig 1 (a,c)  show that both spinel and birnessite structures can reversibly insert the Mg ions. The complete stabilization of the CV curve was observed in both materials at around the 20th cycle (Fig. 1 a,c). STEM-ABF images (Fig. 1 b,d) were taken from the material after the third cycle, when the initial changes of structure due to the Mg de/insertion took place. The ABF technique allowed for the visualization of the lighter Mg and O atoms that can be vaguely seen in case of spinel structure. The ABF imaging of birnessite, in its turn, confirmed the presence of extra O atoms belonging to the crystal water interlayer that has been reported to play a crucial role in the layered cathode materials by enhancing the ion diffusion as well as suppressing the Mn2+ dissolution5.

 

1 L. Damen, J. Hassoun, M. Mastragostino, B. Scrosati, J. Power Sources 195, 6902, (2010)

2 H. D. Yoo, I. Shterenberg, Y. Gofer, G. Gershinsky, N. Pour, D. Aurbach, Energy Environ. Sci. 6, 2265, (2013)

3 J. Muldoon, C. B. Bucur, T. Gregory, Chem. Rev. 114, 11683, (2014)

4 B. J. Aronson, A. K. Kinser, S. Passerini, W. H. Smyrl and A. Stein, Chem. Mater. 11, 949, (1999)

5 K. W. Nam, S. Kim, E. Yang, Y. Jung, E. Levi, D. Aurbach and J. W. Choi, Chem. Mater. 27, 3721 (2015)


Elena TCHERNYCHOVA (Ljubljana, Slovenia), Ana ROBBA, Miran GABERŠČEK, Robert DOMINKO
08:00 - 18:15 #6924 - MS05-813 Ni-based superalloy: crystalline orientation mapping and gamma-gamma’ phases discrimination with the iCHORD method.
MS05-813 Ni-based superalloy: crystalline orientation mapping and gamma-gamma’ phases discrimination with the iCHORD method.

Electron backscatter diffraction (EBSD) is routinely employed as a characterization tool to obtain individual grain orientations, local texture and phase identification. However, in the case of γ - γ’ Ni-based superalloys, the EBSD technique allows mapping the orientations but fails discriminating the two phases because their diffraction signature is too similar. A coupling with EDX analysis for instance helps to identify the two phases but suffers from the lack of spatial resolution of the EDX maps.  Another way to discriminate the two phases is to use the BSE images, sensible to the chemistry, but because of the difference in the geometry of acquisition of the EBSD images and the BSE images, superposition of the two information is complicated by strong  spatial distortions. In this context, any new technique that can lead to an easier phase and orientation mapping would be welcome, especially to resolve the fine secondary γ’ precipitates (typically few tens of nanometers).

We proposed recently the iCHORD method (for ion CHanneling ORientation Determination), aiming at constructing orientation maps based on the well-known channeling contrast phenomenon observed in a rotation series of ionic images (see figure 1) [1]. The proof-of-concept of the iCHORD method was established using a titanium nitride specimen (TiN) and further tests were conducted on different metallic materials. In the case of Ni-based superalloys, the channeling contrast is very strong and allows obtaining quite easily orientation maps comparable in all aspects to the one obtained by the EBSD technique. Furthermore, when using the ion beam to scan the surface, a secondary ion signal can be detected and used for imaging the sample. In the case of γ - γ’ superalloys, this secondary ion signal provides a strong contrast between the γ phase and the γ’ phase (see figure 2). Because of the identical geometry of acquisition for the iCHORD orientation maps and the secondary ion images, both information can be easily superimposed. It allows discriminating between the two phases and giving their crystallographic orientations (see figure 3). Moreover, the spatial resolution of the secondary ion images is around few tens of nanometers, which is far better than the resolution of ~1 µm of EDX maps.

To conclude, the advantages of using ion images to study Ni-based γ - γ’ superalloys are discussed, particularly the benefits taken from the higher spatial resolution and the ease of mixing orientation and phase information.

 

 

References:

[1] Crystal Orientation Mapping via ion channeling: an alternative to EBSD

C. Langlois, T. Douillard, H. Yuan, N.P. Blanchard, A. Descamps-Mandine, B. Van de Moortèle, C. Rigotti, T. Epicier, Ultramicroscopy 157 65-72 (2015)


Cyril LANGLOIS (Villeurbanne Cedex), Marie-Agathe CHARPAGNE, Sébastien DUBAIL, Thierry DOUILLARD, Nathalie BOZZOLO
08:00 - 18:15 #6936 - MS05-815 Texture, microstructure and mechanical anisotropy in SLM processed superalloys.
MS05-815 Texture, microstructure and mechanical anisotropy in SLM processed superalloys.

Samples of Nickel-based (IN738LC and Hastelloy X) and Cobalt-based (Mar-M509) alloys were built by selective laser melting (SLM). To evaluate the anisotropy in the mechanical behavior of the material due to layer-wise build up, specimens were built with their cylinder axis (loading direction) oriented either parallel to the building direction, or perpendicular to the building direction. After building up the specimens by SLM, they were investigated either under the “as-built” condition or after heat treatment. The analysis of microstructural anisotropy in SLM made specimens was done by using EBSD, EDX and X-ray texture analysis methods, and then correlated with anisotropic material behavior observed during tensile and creep testing at room temperature and 850°C. All Ni-based samples possess the same general texture, with the majority of grains forming one single component of a cube texture with one of the cubic axes parallel to the building direction, and another cubic axis parallel to the laser scanning direction. The Young’s modulus determined during tensile testing is lowest parallel to the building direction and parallel to the laser scanning direction. By applying suitable laser scanning strategies, the possibility to switch from transverse anisotropic to transverse isotropic properties and reverse is demonstrated for triple layered tensile samples. While the Ni-based alloys exhibit coarse and elongated grains with a sharp texture and thus a pronounced mechanical anisotropy, the Co-based alloy shows smaller grains with only moderate structural and mechanical anisotropy. These differences are discussed with respect to different recovery and recrystallization behavior of the two groups. Furthermore, recrystallisation heat treatment leads to a weakening of the texture and a reduction in mechanical anisotropy. The anisotropy of Young’s modulus was modeled based on the single crystal elastic tensor and the measured crystallographic preferred orientations, and compares well with the data from tensile tests.

References:

Michael Cloots, Karsten Kunze, Peter J. Uggowitzer, Konrad Wegener (2016) Microstructural characteristics of the nickel-based alloy IN738LC and the cobalt-based alloy Mar-M509 produced by selective laser melting, Materials Science and Engineering: A658, 68-76, 10.1016/j.msea.2016.01.058. 

Thomas Etter, Karsten Kunze, Fabian Geiger, Hossein Meidani (2015) Reduction in mechanical anisotropy through high temperature heat treatment of Hastelloy X processed by Selective Laser Melting (SLM), IOP Publishing 82(1) (ICOTOM 17)  10.1088/1757-899X/82/1/012097 

Fabian Geiger, Karsten Kunze, Thomas Etter (2016) Tailoring the texture of IN738LC processed by selective laser melting (SLM) by specific scanning strategies, Materials Science and Engineering: A661, 240-246, 10.1016/j.msea.2016.03.036.

Karsten Kunze, Thomas Etter, Jürgen Grässlin, Valery Shklover (2015) Texture, anisotropy in microstructure and mechanical properties of IN738LC alloy processed by selective laser melting (SLM), Materials Science and Engineering: A620, 213-222, 10.1016/j.msea.2014.10.003.


Karsten KUNZE (Zürich, Switzerland), Thomas ETTER, Fabian GEIGER, Michael CLOOTS
08:00 - 18:15 #6949 - MS05-817 Decoupling of valence and coordination number contributions at perovskite surfaces.
MS05-817 Decoupling of valence and coordination number contributions at perovskite surfaces.

Perovskite oxide nanostructures are on the forefront of technology due to the wide spectrum of possible applications pertinent to renewable energy sources, such as water-splitting, solar cells, fuel cells, batteries, and catalysis. In particular, the exceptional properties for the oxygen reduction reaction in catalysis have been detailed recently in a volcano plot and the results reveal that orthorhombic, Jahn-Teller distorted LaMnO3 perovskite nanoparticles are the leading, non-noble metal candidate for enhanced catalytic activity on the cathode electrode of fuel cells [1]. Since the functional properties of these nanoparticles lie on their active surfaces, our approach involves a detailed structural and chemical evaluation of the surfaces on the atomic scale to determine what/where the reaction centres are. Subsequently, the morphology of the particles can be optimised to maximise the number of these reaction centres, allowing us to attain the highest possible performance of perovskite catalysts.

From structural transmission electron microscopy (TEM) data it was determined that polar facets exist on crystallites, which lead to assumptions on possible surface reconstruction/relaxation. However, high resolution TEM indicated that the atomic terminations of several surfaces remained defect-free up to the very surface with no visible reconstruction taking place [2], as shown in Figure 1. Next, the surface and subsurface of the working perovskite catalyst was probed by high spatial and temporal resolution electron energy-loss spectroscopy (EELS) in scanning TEM mode. The results revealed that the surface shows different character than the bulk. Tan et al. has previously shown that different oxidation states of Mn can be probed at neighbouring sites in the same compound [3] but it was also theoretically predicted that such a change can be attributed to coordination number differences as well [4]. Indeed, the extracted experimental information by EELS for the pristine LaMnO3 powder was analysed utilising density functional theory calculations under the optic matrix elements approximation, as shown for the Mn L3 peak in Figure 2, and the shift to lower energies of the Mn L3,2 edge was found to be a convolution of both changes in oxidation state and in the number of nearest neighbours (coordination).

 

References

 

[1] J. Suntivich, H. A. Gasteiger, N. Yabuuchi, H. Nakanishi, J. B. Goodenough, and Y. Shao-Horn,

Nat Chem 3  546-550 2011.

[2] E. A. Ahmad, V. Tileli, D. Kramer, G. Mallia, K. A. Stoerzinger, Y. Shao-Horn, A. R. Kucernak,

and N. M. Harrison, J. Phys. Chem. C 119  16804-16810 2015.

[3] H. Tan, S. Turner, E. Yucelen, J. Verbeeck, and G. Van Tendeloo, Phys. Rev. Lett. 107 107602 2011.

[4] E. A. Ahmad, G. Mallia, D. Kramer, V. Tileli, A. R. Kucernak, and N. M. Harrison, Phys.

Rev. Lett. 108  259701 2012.


Vasiliki TILELI (Lausanne, Switzerland), Ehsan AHMAD, Ross WEBSTER, Giuseppe MALLIA, Martial DUCHAMP, Kelsey STOERZINGER, Yang SHAO-HORN, Rafal DUNIN-BORKOWSKI, Nicholas HARRISON
08:00 - 18:15 #6968 - MS05-819 Electron microscopy of novel technical superconducting materials.
MS05-819 Electron microscopy of novel technical superconducting materials.

The improvement of characteristics of modern superconducting devices could be achieved by changing technologies or utilization of new materials. The electron microscopy (EM), electron diffraction (ED) and microanalysis (MA) investigations of Nb-Sn based superconducting wires used for ITER project demonstrated the severities to form A15 Nb3Sn structure over all volume of superconducting wires. Similar wires might be used for upgraded Large Hadron Collider (LHC) and Very Large Hadron Collider (VLHC). The Sn content in the large part of the superconducting wires could be less then 20 at% which could lead to the deviation of crystal structure of wires from A15 and consequent drop of electrophysical properties. The superconducting wires were formed by bronze method [1] and Nb3Sn phase was grown during solid phase reaction of Sn solved in the bronze with Nb inserts. One possible reason of Sn depletion is the diffusion barrier appeared on the Nb/bronze interface at the early stages of superconducting wires formation. It was found that this barrier is simply uniform and slowly growing layer of Nb3Sn adopted A15 crystal structure. The EDX elemental mapping with the help of SuperX detector (Bruker, US) in Osiris (FEI, US) STEM (Fig.1) unambiguously demonstrated the absence of Sn diffusion along Nb grain boundaries. After A15 Nb3Sn reached critical thickness the Nb-Sn grains with Sn content less than 18 at% began to form. HAADF STEM study of these Sn depleted grains in Cs probe corrected TITAN 80-300 TEM/STEM (FEI, US) at 300 kV (Fig.2) indicated that these grains contained high density of antisite defects start to form and it was Nb substituted for Sn atoms. That conclusion was made by the estimation of intensities of atomic columns as it was done in [2] and comparison with simulated images (P.Stadelmann’s JEMS software was used for image simulations). To increase Sn content in the grains, the changes of technology were proposed. Another possibility is the utilization of new materials and possible candidates are FeTeX (where X- Se or S) superconductors. The X-ray crystal structural analysis, TEM, HAADF STEM, electron diffraction and microanalysis (TITAN 80-300 TEM/STEM) were applied to the study of FeTeX based single crystals and thin films on different substrates. One of HRSTEM images is presented in Fig.3. It was found that there are uncertainties in Fe1 and Fe2 position in FeTeX compounds and ordering of S atoms. The misfit between the FeTeX films and substrates were released through misfit dislocation or an intermediate layer at the film/substrate interface. Thus the FeTeX films were stress free and critical temperature Tc should not change due to structural modifications.

 

[1] E.Dergunova, A.Vorobieva, I.Abdyukhanov, K.Mareev, S.Balaev, R.Aliev, A.Shikov, A.Vasiliev, M.Presnyakov, A.Orekhov Physics Procedia (2012) 36, 1510.

[2] S.Van Aert, K.J.Batenburg, M.D.Rossell, R.Erni, G.Van Tendeloo Nature (2011) 470, 374.


Alexander VASILIEV (Moscow, Russia), Igor KARATEEV, Mikhail KOVALCHUK, Mikhail PRESNYAKOV
08:00 - 18:15 #6990 - MS05-821 A Review on Interface Engineering and Thin Film Nanotechnology for Low-Cost High Efficient Photovoltaic (PV) Solar Cell Devices.
MS05-821 A Review on Interface Engineering and Thin Film Nanotechnology for Low-Cost High Efficient Photovoltaic (PV) Solar Cell Devices.

Currently, the major challenge of the research and development (R&D) in the field of Photovoltaic (PV) renewable energy is to lower the cost per Wp of electricity generation and to improve the conversion efficiency of the solar cell devices.

In comparison with the crystalline silicon technology, silicon (Si) thin film nanotechnology hold the promise of reducing the solar cell cost through lowering the material amounts and energy requirement of the manufacturing process.

In this review, several aspects of the material engineering at interfaces and process optimisation for low-cost high-efficient silicon based thin film photovoltaic (PV) solar cells are discussed.

A basic understanding of the thin film growth technique using a plasma enhanced chemical vapour deposition (PECVD) system coupled with analytical nanostructural characterisations of Si thin film solar cells with particular emphasis on hydrogenated amorphous and microcrystalline p-i-n single and double (tandem) junction silicon solar cells are presented.

Nanostructural defects including microvoids and cracks at interfaces – as potential extrinsic effects on the hydrogenated microcrystalline (uc-Si:H) solar cells performance – are studied.

Analytical nanostructures of an ultrathin interfacial buffer amorphous hydrogenated germanium (a- Ge:H) layer at the P+- type a-Si:H/Transparent Conducting Oxide (TCO) are investigated using STEM and EDS. It was shown that such an interfacial buffer layer could improve the electrical performance and enhance the efficiency of the a-Si:H single junction solar cells.


Mohamed SAAD (Belfast, United Kingdom), J KIM, P KOZLOWSKI, J OTT, D SADANA, T.c CHEN
08:00 - 18:15 #6996 - MS05-823 TEM investigation of Li2MnSiO4 microstructure at different states of charge of Li-ion battery cell.
MS05-823 TEM investigation of Li2MnSiO4 microstructure at different states of charge of Li-ion battery cell.

The study concerns dilithium manganese orthosilicate nanomaterial (Li2MnSiO4 - LMS), which is a promising new candidate for cathodes in Li-ion systems. The material is characterized by high theoretical capacity, working voltage and low production costs. Unfortunately, LMS material cannot be successfully applied in commercial systems yet, due to its structural instability in initial charging/discharging cycles of a battery cell. The reasons of structural changes (amorphization) of the material, that occur during electrochemical reaction in the cell, are still not clear. In order to find a stage of the electrochemical process in which a destruction of long-range ordering in LMS crystalline structure occurs, we conducted ex-situ TEM observations at different states of charge of a battery cell. To facilitate microscopic observations of particular LMS grains, a working electrode was prepared by using TEM support grid as a current collector. Thanks to that, the same sample could be used in TEM observations and in potentiostatic charging/discharging processes. Our study (Fig.1) shows that destruction of Li2MnSiO4 crystalline structure takes place at potentials lower (e.g. 3.5 V) than oxidation reaction of manganese ions (i.e. 4.2 V). It suggests that, in opposition to previous literature reports, amorphization process of the material is connected with other, and not yet specified, electrochemical reactions.


Marta GAJEWSKA (Krakow, Poland), Michał ŚWIĘTOSŁAWSKI, Marcin MOLENDA
08:00 - 18:15 #6287 - MS06-825 3D-TEM studies of hierarhical graphene-composite aerogels for ultra-long-life Li-ion batteries.
MS06-825 3D-TEM studies of hierarhical graphene-composite aerogels for ultra-long-life Li-ion batteries.

Among all potential application fields of graphene, most important are still the electrochemical  energy-storage devices, in particular the Li-ion batteries (LIB). Despite of all the efforts, the performance of the graphene-based Li-ion batteries is still far from satisfactory, considered their insufficient electrical capacity, rate performance and long-term stability (1). In the present work, we present the technique allowing the production of hierarchical graphene-based composite aerogels as binder-free anodes for the ultra-long-life Li-ion batteries (LIBs).  Our approach is to increase an active area of the composite aerogel for the Li-ion uptake (or adsorption)by the introduction of spacers between the graphene sheets. The spacers are the MoxSy particles of three different size ranges:  sub-nanometer (iii), a few nanometers (ii) and several hundreds of nanometer large amorphous carbon balls (i) filled with nanometer-sized MoxSy (see schematic in Figure 1). The incorporation of these poly-dispersed particles as spacers between the graphene sheets results in the hierarchically porous aerogel.  Such structures as anodes in LIBs possess high capacity, 1069 mAh/g at 0.35 A/g, rate performance, 425 mAh/g at 10 A/g and 304 mAh/g at 50 A/g, and show ultra-long stability.   

In the present work, MoxSy-particle loaded aerogels before and after the Li-ion uptake  were studied by HRTEM / HRSTEM. Morphological and elemental analyses of the particle populations were performed (Figure 2).  Moreover, all three groups of the spacers were analyzed for their spatial arrangement in relationship to graphene sheets by HRTEM and HRSTEM tomography, revealing the fully homogeneous spatial distribution of two groups of the small-sized clusters on the sheets and the hierarchical nature of the largest spacers consisting of the polymer balls uniformly filled with the small clusters. TEM analyses confirmed that all three kinds of the spacers are very effective in the preventing the graphene sheets from coalescence. Both, graphene sheets and the spacers can intake Li-ion, contributing to the charge-discharge cycles and are as such responsible for the long-life electrochemial performance.

  1. J. Liu, Charging graphene for energy, Nat. Nanotechnol.2014,  9, 739-741.

Alla SOLOGUBENKO (Zurich, Switzerland), Guobo ZENG, Elena TERVOORT, Fabian GRAMM, Markus NIEDERBERGER
08:00 - 18:15 #6367 - MS06-827 Identification of Laves- and Z-phase formed in 9%Cr ferritic alloy after long-term thermal treatment.
MS06-827 Identification of Laves- and Z-phase formed in 9%Cr ferritic alloy after long-term thermal treatment.

High-performance reduced-activation ferritic–martensitic steels (EUROFER 97) with 9%Cr (WMnVTa) content have been envisaged for application as a structural material for operations at up to 650°C in future fusion reactors as well as in Generation IV fission reactors [1]. The thermal stability of steel’s microstructure is a basis for its application in structural components exposed for long time at a very hostile environment, which includes high neutron fluxes at high temperatures, as the one expected during operation of future fusion reactors. The desired mechanical properties of the EUROFER 97 were achieved by the formation of M23C6, TaC, and VN precipitates on the grain and lath boundaries during alloy fabrication and thermal treatment [1]. The long term annealing for up to 100.000h leads to the changes in this desired precipitates distribution and formation of coarse Z- and Laves phases which might influence the mechanical properties of the steel. Transmission Electron Microscopy (TEM) Energy Dispersive X-ray analysis (EDX) and Electron Energy Loss Spectroscopy has been used for identification and to study the morphology, structure, and chemical composition of new phases formed during long-term thermal treatment.

Fig. 1 shows TEM investigation of precipitate’s distribution in the specimen annealed at 550°C for 76.000h. The different phases are imaged with different colours in 2 dimensional elemental map (b). The investigation reveals the presence of tungsten rich precipitates additionally to the typical for EUROFER 97 three phases: M23C6, TaC, and VN phases. These new W-rich precipitates have been identified as Laves phase with (FeCr)W2 composition. The corresponding EDX spectrum shown in Fig. 3a demonstrates typical Laves phase composition.

Fig. 2 shows a distribution of main compositional elements in a specimen annealed at 600°C for 35000 h, which was obtained using EDX elemental mapping. The investigated area is marked by a square in the HAADF image (Fig. 2). The new precipitates identified by this temperature are V-rich Z-phase. The smaller precipitates of M23C6 imaged with red colour have a size that varies from 50 nm to 120 nm. The faceted Z-phase have been found to be up to 700 nm in size. Ta and V are present in small precipitates of MX type (VN and TaC [1]) as well as in the Z-phase. Based on these analytical results, it was found that the Z-phase can be differentiated well from other phases, which also may contain Cr, V, and Ta or a combined composition of these elements [2]. M23C6 and VN precipitates in ferritic steels can have a contrast similar to that of the matrix in HAADF and bright field images, they can only be studied using 2-dimensional analytical imaging.

The results demonstrate that precipitation mechanism of secondary phases changes in the narrow temperature range between 550°C and 600°C. Formation Z-phase precipitates with Cr2TaVN2 composition was detected only at 600° after annealing for as longer as 30.000h.

[1] M. Klimenkov, et. al Progress in Nuclear Energy 57 (2012) 8-13

[2] H. K. Danielsen Ph.D. thesis (2007) Technical University of Denmark


Michael KLIMENKOV (Eggenstein-Leopoldshafen, Germany), Ute JÄNTSCH, Jan HOFFMANN, Michael RIETH
08:00 - 18:15 #6384 - MS06-829 Atomic structure and magnetic circular dichroism of antiphase boundary defects in NiFe2O4 thin films.
MS06-829 Atomic structure and magnetic circular dichroism of antiphase boundary defects in NiFe2O4 thin films.

      The complex and interesting properties of ferrimagnetic spinel ferrite thin films are of great fundamental interest, as well as being of practical importance for applications in spintronic devices and ultra-high-density recording media. The presence of antiphase boundary (APB) defects is responsible for reduced spin polarization and magnetism in spinel ferrites[1,2]. There is also considerable discussion about the relationship between the atomic structures of APBs and their magnetic properties. Whereas atomic structures of many APBs have been determined using high-resolution transmission electron microscopy and high-angle annular dark field (HAADF) imaging[3], local measurements of magnetic properties at APBs on the nm scale have not yet been achieved.

      Electron magnetic circular dichroism (EMCD) was demonstrated experimentally in 2006 for a specific diffraction geometry[4]. Since then, the spatial resolution of EMCD has been improved to approximately 1 nm using nanobeam diffraction[5]. In 2013, we developed a site-specific EMCD method for magnetic structure determination and achieved EMCD spectra with high signal-to-noise ratio[6]. Here, we combine site-specific EMCD in nanobeam diffraction mode with high-resolution HAADF imaging, in order to simultaneously determine the magnetic circular dichroism and atomic structure of APBs in NiFe2O4 thin films.

      We find the atomic structures of APBs that are formed on {111} planes by a crystallographic translation of 1/4a[0-11]  using HAADF imaging. The EMCD signals at such defects were obtained using an electron beam with a diameter of ~1 nm and compared with signals obtained from a perfect single crystalline region under the same illumination and acquisition conditions. We demonstrate experimentally that the strength of the magnetic circular dichroism at APBs is suppressed significantly when compared with that in the perfect area. The capability of EMCD at 1 nm spatial resolution enable us to correlate our experimental magnetic circular dichroism spectra from local defects with corresponding structural and chemical information recorded at the atomic scale, opening the door to experimental investigations of the relationship between atomic structure and magnetic properties of local defects in materials.

References

[1] D.T. Margulies, et al, Phys. Rev. Lett., 79 (25), 5162, 1997

[2] W. Eerenstein, et.al. Phys.Rev.B.68.014428(2003)

[3] K.P. McKenna, et.al, Nat. Commun. 5,5740 (2014).

[4] P. Schattschneider, et al, Nature 441, 486–488 (2006).

[5] J. Salafranca, et al, Nano Lett., 12: 2499, 2012

[6] Z.Q.Wang, X.Y. Zhong, et al, Nat. Commun. 4, 1395 (2013).

Acknowledgements

This work is financially supported by the National Basic Research Program of China (2015CB921700), the National Natural Science Foundation of China (51471096), the Tsinghua University Initiative Scientific Research Program and partly supported by JST under Collaborative Research Based on Industrial Demand ”High Performance Magnets: Towards Innovative Development of Next Generation Magnets”. This work made use of the resources of the National Centre for Electron Microscopy in Beijing and the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons in Forschungszentrum Jülich. RDB is grateful to the European Research Council for an Advanced Grant. We are grateful to Prof. R. Yu, Prof. J. Zhu, Prof. C. L. Jia, Prof. J. Yuan, Dr. M. Bornhöfft and Mr. D. S. Song for valuable discussions


Zechao WANG (Beijing, China), Xiaoyan ZHONG, Lei JIN, Hideto YANAGIHARA, Eiji KITA, Hanbo JIANG, Rafal E DUNIN-BORKOWSKI
08:00 - 18:15 #6392 - MS06-831 Atomic scale structure and local chemistry of CoFeB-MgO perpendicular spin injector.
MS06-831 Atomic scale structure and local chemistry of CoFeB-MgO perpendicular spin injector.

The development of spin light emitting diode (spin-LED) with spin injectors with perpendicular magnetic anisotropy (PMA) is a prerequisite for the conversion of carrier spin polarization to the circular polarization (PC) of photon without magnetic field for practical applications. In our previous study, a maximum PC at zero field (20% at 25K, 8% at 300K) was reported with an ultrathin perpendicular MgO/CoFeB spin injector with Ta capping layer [1]. To achieve a good PMA, post-annealing is indispensable with a narrow optimal window around 250°C. Recent work shows that the PMA can be increased by 20%, by replacing Ta layer with a Mo layer [2]. Moreover, Mo capping increases the temperature stability of the spin injector, allowing post annealing up to 425°C.

The specific crystal structure, local chemistry and local bonding of all staking layer that make up the perpendicular spin injector remain unclear, hindering the establishment of the relationships between the material properties and the nanoscale structure. The interfacial anisotropy depends critically on the crystal structure. The composition, chemical states, and local defects in CoFeB and in MgO are known to be critical for transport and magnetic properties. Experimentally the structural and chemical issues in CoFeB-MgO have been addressed utilising HRTEM, EDS, XPS, secondary-mass spectroscopy. A consistent picture has not emerged yet due to the difficulty of probing local atomic details. In particular there is many contradictory results on the fate of B following annealing, including diffusion into Ta [3], segregation at the CoFe interface [4], B diffusion into MgO forming a magnesium boride phase [5].

Here, we combine HRTEM, aberration corrected STEM (HAADF and BF) and spatially resolved EELS to follow the structure and the local chemistry of MgO\ CoFeB capped with Ta or Mo, before and after annealing up to 400°C. The spin injectors consist in 2.5 nm of MgO / 1.2 nm CoFeB / 5 nm Ta or Mo deposited on a GaAs-based LED (Fig 1). For FeCoB layer caped with Ta at temperature higher than 250°C, annealing favours the diffusion of B into Ta when CoFe crystallises then Ta diffuses trough the CoFe layer into the MgO barrier (Fig 2). For CoFeB layer caped with Mo, boron stays in the CoFe layer close to the CoFe-Mo interface (Fig 3). Mo diffusion into the CoFe layer also occurs, but for higher temperature than for Ta diffusion. In extension we'll show that for both structures, annealing has a strong influence on the Fe/Co ratio at the MgO-CoFe interface and at the CoFe-capping layer (Fig 2 and 3). The influence of the structure and of local chemical composition on the properties of the spin injector will be discussed.

 

[1] S. H. Liang et al., Phys. Rev. B 90 (2014) 085310

[2] T. Liu et al., Sci. Rep. 4 (2014) 5895

[3] X. Kozina et al., Appl. Phys. Lett. 96 (2010) 072105

[4] J. Burton et al. , Appl. Phys. Lett. 89 (2006) 142507

[5] Z. Q. Bai et al Phys. Rev. B 87 (2013) 014114


Bingshan TAO, Xavier DEVAUX (NANCY), Philippe BARATE, Pierre RENUCCI, Bo XU, Julien FROUGIER, Michel HEHN, Stéphane MANGIN, Henri JAFFRES, Jean-Marie GEORGE, Xavier MARIE, Xiufeng HAN, Zhanguo WANG, Yuan LU
08:00 - 18:15 #6412 - MS06-833 Scanning electron microscopy study of rhodium, palladium and platinum foils treated in NH3-air flow.
MS06-833 Scanning electron microscopy study of rhodium, palladium and platinum foils treated in NH3-air flow.

     Ammonia oxidation with air on platinum catalyst gauzes is widely used in chemical industry for synthesis of nitric acid. It is well known that during this process the gauzes undergo deep structural rearrangement of surface layers (catalytic etching) leading to a loss of platinum and decrease of catalytic activity. To determine the role of individual metals: Pt, Pd and Rh in the catalytic etching of platinum catalyst gauzes during the NH3 oxidation, we carried out detailed investigation of the surface microstructure of platinum, palladium and rhodium catalysts treated in the reaction medium (NH3+O2). Polycrystalline Pt, Pd and Rh foils with the size of 10 х 5 х 0.04 mm were used as the catalyst samples. Each sample was assembled into a package with four platinum gauzes required to maintain standard conditions of the NH3 oxidation process. The platinum catalyst gauzes were made from a polycrystalline wire (d ≈ 82 μm) with the chemical composition (in wt.%) 81% Pt, 15% Pd, 3.5% Rh and 0.5% Ru. A laboratory flow reactor made of a quartz tube with the inner diameter of 11.2 mm was used at the feed (ca. 10% NH3 in air) flow rate 880-890 l/h, the gauze temperature 860±5 °C and total pressure about 3.6 bar. The surface microstructure was studied using a scanning electron microscope (SEM) JSM-6460 LV (Jeol) in the mode of secondary electrons at beam energy 25 keV.

     The SEM study of polycrystalline Pt, Pd and Rh foils after treatment at T~860°C for 5 h in the reaction medium (~10% NH3 in air) revealed differences in the surface microstructure of these samples. The O2 reaction with Rh during the catalytic oxidation of NH3 over rhodium foil results in deep rhodium oxidation followed by the formation of a continuous layer of Rh2O3 crystals with the size 1-2 μm. Fast reaction of gaseous NH3 molecules with O atoms of rhodium oxide leads to the formation of oxygen vacancies and movement of Rh atoms to the surface of the oxide crystals. Rh atoms quickly migrate over the oxide surface and desorb into the gas phase. Increased concentration of Rh atoms in the near-surface gas layer initiates the formation and gradual growth of elongated pyramidal Rh crystals with low concentration of defects. Such continuous processes lead to the formation of a solid layer of pyramidal Rh crystals with the sizes 0.3-0.5 μm at the base, 0.05-0.1 μm at the end and the length 1-2 μm (Fig. 1a,b). The O2 interaction with Pd during the NH3 oxidation on palladium foil leads to intense dissolving of oxygen atoms at defects and in the metal lattice, whereas the resulting oxide PdO quickly decomposes under these conditions. The reaction of gaseous NH3 molecules with absorbed oxygen atoms Oabs with the formation of gaseous NO results in local overheating of the surface initiating the release of metal atoms to the surface.  Intense release of metal atoms from the grain boundaries leads to the formation of extended voids between the grains. Adsorbed Pd atoms quickly migrate over the metal surface and get incorporated into energetically the most favorable sites. Due to these processes, pits, pores and crystalline facets grow on the surface, whereas grains are gradually reconstructed into faceted crystalline agglomerates with through pores formed due to the growth and merging of pits. So, dramatic structural reconstruction of the foil surface layer (catalytic etching) with the formation of a rough layer takes place during the catalytic NH3 oxidation with air on Pd. This rough layer contains microcrystals and porous agglomerates with the size of ~10-20 μm containing pores with the diameter 1-2 μm separated by voids with the width ~1-10 μm (Fig. 2a,b). The O2 interaction with platinum during the NH3 oxidation over Pt foil results in removal of the surface carbon impurities followed by dissociative chemisorption of oxygen on the surface. It is well known that oxygen dissolution in the Pt lattice with the formation of oxide phases is substantially slower than on Pd and Rh. Small amount of oxygen atoms can be absorbed at the grain boundaries and other defects. The NH3 reaction with Oabs at these defects initiates release of a few Pt atoms to the surface leading to weak etching of the platinum foil surface. The catalytic NH3 oxidation on Pt at T~860°C for 5 h results in minor structural reconstruction of the foil surface layer related to the formation of grain boundaries and shallow parallel furrows with the width 1-2 μm covered with crystalline facets (Fig. 3a,b).

Acknowledgement

This work was supported by Russian Academy of Sciences and Federal Agency of Scientific Organizations (project 44.1.17).


Aleksei SALANOV (Novosibirsk, Russia), Natalia KOCHUROVA, Elena SUTORMINA, Lyubov ISUPOVA, Valentin PARMON
08:00 - 18:15 #6417 - MS06-835 Electron Radiolytic Triggering Metal-Insultor Transformation in VO2 Nanowire.
MS06-835 Electron Radiolytic Triggering Metal-Insultor Transformation in VO2 Nanowire.

Vanadium dioxide (VO2) is a correlated-electron materials that, in the strain-free state, undergoes a first-order metal–insulator phase transition (MIT) at Tc=341 K with a change in conductivity of several orders of magnitude. The MIT is accompanied by a structural phase transition from the high-temperature rutile phase (metallic, R) to the low-temperature monoclinic phase (insulating, M). Although VO2 is a promising functional material to build up micro sensors, switches and actuators, the precise localization of MIT is still unavailable, and the M/R domain wall evolution is out of control. There are big challenges for device design at micro/nano scale. In this work, we demonstrate how we locally trigger nano-scale metal-insulator transition of vanadium dioxide with a focused electron beam. Basically, the electron beam provides a nano-sized probe for local oxygen vacancies doping to control the transition temperature in nano-area of the VO2 nanowires. Our results shed lights on understanding the mechanism of MIT in VO2 and developing VO2-based MEMS device with better flexibility.

 

Individual single-crystal VO2 nanowire cantilever is fabricated to be free from various strains and mounted in a transmission electron microscope (TEM) as shown in Fig. 1a. One end of the single crystal nanowire is attached on the copper substrate and the other end is free standing. It was originally an entire monoclinic phase (M1) at room temperature (25 °C). At elevated temperature of 68 °C, metallic rutile phase (R) is more stable, the entire pristine VO2 nanowire abruptly transformed from M1 phase into R phase. That is, no metallic-insulator domains are observed. However, as 200 KeV electron beam in TEM was employed to radiate at the free end tip of a VO2 nanowire of 3.7 µm long with cross sectional area of 7.1×10-2 μm2 with the dose of about 7.2×105 Å-2, R phase was found to preferentially nucleate just at the irradiated site at 62.2 °C, obviously lower than 68 °C in the pristine VO2 nanowire (Fig. 1b). The enlarged image (Fig. 1c) shows the coexistence of the R-phase and M-phase domains. Fig. 1d shows that the transition temperature can be controlled with the electron dose. When the total dose is lower than a critical dose, no metallic-insulator domains are observed, but the transition temperature decreases accordingly. The domain size and structure of metallic-insulator can be controlled with irradiation of electron beam. Fig.1e shows a VO2 nanowire marked the electron beam irradiation sites at room temperature. Fig. 1f shows the dark field image of the designed domain structure of the nanowire. Once the metallic R phase domain forms in the tip of VO2 nanowire, the rest of insulator M phase will transform into the R phase gradually rather than abruptly. The growth kinetics of R phase can then be controlled by the temperature. Fig. 2a is a series of TEM images to show the temperature dependent transformation of insulator M phase to metallic R phase, while Fig. 2b shows the transformation fraction of R phase vs. temperature. The transformation kinetics and the mechanism of the radiolytic triggering MIT in VO2 nanowire will be discussed in detail in the talk.

 

Acknowledgement The authors acknowledge the support by the National Natural Science Foundation of China (Grants Nos. 11374028 and U1330112). M.L.S. acknowledges the Cheung Kong Scholars Programme of China. The authors acknowledge very useful discussion with Li-Min Liu. The authors also thank Bin Zhang and Jin-Hua Hong for help with EELS measurement. The authors are also grateful to Rui-Wen Shao and Yong-He Li for assistance during in situ electrical measurement with Nanofactory holder.


Zhen-Hua ZHANG, Hua GUO, Wen-Qiang DING, Xiao-Xiang KE, Fu-Rong CHEN, Man-Ling SUI (Beijing, China)
08:00 - 18:15 #6443 - MS06-837 Aberration-corrected STEM and EELS investigations of grain boundaries in an optimised BaTiO3 based PTCR ceramic.
MS06-837 Aberration-corrected STEM and EELS investigations of grain boundaries in an optimised BaTiO3 based PTCR ceramic.

Positive temperature coefficient of resistivity (PTCR) effect is a property found in polycrystalline materials which can transform from a low resistance state to a high state of resistance in response to heat. Accordingly, this effect has found extensive applications in sensing technologies such as self-regulating heating elements, current sensors and sensors for the detection of air flow, liquid level and temperature changes.[1] Among the various materials exhibiting PTCR effect to date, the most favoured material group is Barium Titanate (BaTiO3) based or quasi-BaTiO3 based ternary perovskite compounds where the temperature at which this switch in behaviour occurs, near the ferroelectric-paraelectric Curie transition temperature (Tc), and the magnitude of the switch can be controlled and optimised via the addition of different dopants and/or changes in the processing conditions.[2, 3]

The role of grain boundaries in these ceramics has been strongly deliberated in previous studies with most of the experimental evidence towards the role of grain boundaries established by macroscopic studies, allowing the interpretation of grain-boundary resistivity in terms of equivalent circuit diagrams.[4, 5] Yet, direct visualisation and mapping studies of the PTCR behaviour on the nanoscale has been missing. Here, we identify the grain boundaries as the pivotal region of interest by reporting clear evidence of non-linear changes in electrical potential (via Kelvin probe force microscopy (KPFM)) observed locally across single grain boundaries, explicating their central role in this phenomenon.

Several studies have suggested that chemical diffusion, and segregation at the grain boundaries could play a part in creating the PTCR effect, but attempts to provide evidence of this chemical heterogeneity have so far been unsuccessful.[6, 7] We employed aberration-corrected scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) to investigate chemical inhomogeneity and electronic structure changes across grain boundaries on the atomic scale. These studies have revealed the presence of localised PbTiO3-like formation (Figure 1) and striking changes in Ti-L2,3 and O-K ELNES features approaching the grain boundary (Figure 2). Due to the clear chemical and intrinsic change in symmetry identified, a quantitative analysis of the crystal field splitting (CFS) was carried out across the grain boundary. We present the remarkable CFS trend, suggestive of octahedral distortion, transitioning across single grain boundaries.

The state-of-the-art microscopy techniques involved in this investigation have allowed us to unravel the complexity of this PTCR ceramic. As a result, we provide a logic interpretation of the BaTiO3-like grain interior and PbTiO3-like grain boundary regions in terms of an enhanced normal polarisation component at the grain boundary interface, which according to the modified Heywang-Jonker model[8, 9] augments electronic transport in the ferroelectric phase and enhances the magnitude of resistivity jump at Tc. We demonstrate the idea that a confined grain boundary region which exists in such a strategic manner offers a novel route towards engineering better performing PTCR devices.

 

 References

[1] B. M. Kulwicki, , Journal of Physics and Chemistry of Solids. 1984, 45(10), 1015-1031.

[2] D. Y. Wang, K. Umeya, , J Am Ceram Soc. 1990, 73(3), 669-677.

[3] J. Nowotny, M. Rekas, , Ceram. Int. 1991, 17(4), 227-241.

[4] D. C. Sinclair, A. R. West, , Journal of Applied Physics. 1989, 66, 3850.

[5] F. D. Morrison, D. C. Sinclair, A. R. West, , Journal of the American Ceramic Society. 2001, 84, 531.

[6] L. Affleck, C. Leach, , Journal of the European Ceramic Society. 2005, 25(12), 3017-3020.

[7] J. Hou, Z. Zhang, W. Preis, W. Sitte, G. Dehm, , Journal of the European Ceramic Society. 2011, 31(5), 763-771.

[8] W. Heywang, , Journal of the American Ceramic Society. 1964, 47(10), 484.

[9] G. H. Jonker, , Solid-State Electronics. 1964, 7(12), 895-903.

 


Kristina HOLSGROVE (Belfast, United Kingdom), Demie KEPAPTSOGLOU, Alan DOUGLAS, Quentin RAMASSE, Eric PRESTAT, Sarah HAIGH, Amit KUMAR, Marty GREGG, Miryam ARREDONDO
08:00 - 18:15 #6496 - MS06-839 Piezoelectric thin films investigated by dark-field electron holography and in-situ biasing.
MS06-839 Piezoelectric thin films investigated by dark-field electron holography and in-situ biasing.

Ferroelectric and piezoelectric oxides have a large number of applications in memories and micro-electro-mechanical systems (MEMS). Recently, a piezoelectronic transistor (PET) has been proposed as an alternative to the conventional metal-oxide-semiconductor (CMOS) transistor [1]. Therefore, there is a growing need for the characterisation of piezoelectric thin films at the nanoscale.

We investigated Pb(Zr,Ti)O3 (PZT) and Pb(Mg1/3Nb2/3)O3−PbTiO3 (PMN-PT) epitaxial thin films containing c- and a-domains (or 90° domains) using transmission electron microscopy (TEM) techniques. Experiments were carried out using the I2TEM-Toulouse microscope (Hitachi HF-3300) equipped with a cold field emission gun, an image corrector (B-COR) and multiple electron biprisms. Firstly, dark-field electron holography [2] was carried out to map the residual deformations due to the epitaxial constraints. Secondly, in-situ biasing was conducted using a picoindenter PI 95 (Hysitron) to observe directly the switching of ferroelectric domains.

We found that the residual deformation and rotation fields depend on the inclination of neighbouring a-domains. Fig. 1(a) shows an example of dark-field electron hologram obtained on a tetragonal Pb(Zr0.2,Ti0.8)O3 thin film grown on SrTiO3. The investigated region contains two main a-domains with opposite inclination, forming a hat shape. The rotation map in Fig. 1(b), retrieved from the hologram, reveals two rotation gradients in the direction perpendicular to the a-domains, increasing towards the interface. The rotation field is guided by partial a-domains located in the central region. These gradients are related to the lattice mismatch at the domain walls and the growth constraints onto the substrate [3].

Fig. 2(a) shows an in-situ biasing experiment conducted on a Pb(Zr0.2,Ti0.8)O3 thin film using a diamond probe (doped) placed in contact with the surface of the film. The SrTiO3 substrate (Nb doped) is connected to the ground. The application of the electric field favours the formation of c-domains (vertical polarisation) at the expense of the two a-domains (horizontal polarisation) located just below the probe. When applying -15V (Fig. 2(b)), the a-domains become narrower and then they are completely erased at -25V (Fig. 2(c)). New a-domains are created on the left side of the probe which can be due to a redistribution of the deformation or a deviation of the electric field from the vertical direction (stronger in-plane component) in this region.

Finally, Fig. 3(a) shows an experiment conducted on the same film but with a gold top electrode. The region showed here contains two a-domains indicated by dashed lines. When applying +10V (Fig. 3(b)), it was observed that c/c domain walls move laterally through the film until they form close pairs. The two domain walls on the right side moved quickly towards each other and finally disappeared (Fig. 3(c)). The c/c domain walls on the left side were slower (still exist after 60s in Fig. 3(c)) which might be related to defects or pre-existing domain walls.

 

[1]  D.M. Newns et al, Advanced Materials, 24, 3672–3677 (2012)

[2]  M.J. Hÿtch et al, Nature, 453, 1086–1089 (2008)

[3]  G. Catalan et al, Nature Materials, 10, 963-967 (2011)

 

Acknowledgments

This work was funded through the European Metrology Research Programme (EMRP) Project IND54 Nanostrain. The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union. This work has been supported by the French National Research Agency under the "Investissement d'Avenir" program reference No. ANR-10-EQPX-38-01. The authors acknowledge the "Conseil Regional Midi-Pyrénées" and the European FEDER for financial support within the CPER program.


Thibaud DENNEULIN (TOULOUSE CEDEX), Nicole WOLLSCHLÄGER, Martin HŸTCH
08:00 - 18:15 #6504 - MS06-841 Quantitative investigation of the all round shape memory effect in a Ni51Ti49 alloy by TEM orientation imaging.
MS06-841 Quantitative investigation of the all round shape memory effect in a Ni51Ti49 alloy by TEM orientation imaging.

Ni-Ti shape memory alloys are being investigated for a new application which focuses on the artificial sphincter for human implantation. In this application, the all round shape memory effect (ARSME) [1], which describes the effect of a dramatic and repeatable shape change from the parent (austenite) phase to an opposite shape in the product (martensite) phase, controls the performance of the alloy for its utilization.

According to the Ni-Ti phase diagram, several precipitates can appear during thermal treatment, with the metastable Ni4Ti3 type being the most relevant one for controlling the SME. These precipitates can be produced by appropriate ageing and normally have a lenticular shape and remain coherent with the matrix if they do not grow too large, leading to small but important strain fields around the precipitates [2]. For the alloy with ARSME, the way of training is by constrained ageing. The different strain state on the outside and inside of the bended alloy ribbon will cause the formation of different variants of the Ni4Ti3 precipitates, and this difference leads to the final result of the ARSME. Although Nishida et al. have already clarified the origin of this effect, their conclusions are mainly based on direct acquisition of images from different conditions and then matching those with the macroscopic performance of the alloy [3]. Obtaining quantitative and statistically relevant data on these precipitates, however, remains a problem due to their small size and the four orientation variants in which they can appear.

In this study, a Ni51Ti49 alloy was fabricated by arc melting from Ni and Ti powders with fast solidification, followed by different sets of treatment which include constrained aging and stress free aging. The ARSME varies when aging conditions are changed in both time and temperature. DSC was used to investigate the thermal behavior and TEM was used for studying the microstructure of the alloys. The new technique of automated crystal orientation and phase mapping (ACOM-TEM from NanoMEGAS®) is used to investigate the precipitates at nanoscale resolution. The electron diffraction spot patterns are collected with an external CCD camera, capturing the diffraction pattern on the small retractable phosphorous screen inside the column, while the sample area of interest is scanned by a nanoprobe electron beam. Local crystallographic orientation and/or phase are identified through an algorithm that compares the recorded electron diffraction spot patterns with pre-simulated kinematical templates for all possible orientations and/or phases of a number of pre-selected structures. This technique provides clear orientation and phase distribution information yielding quantitative information on the precipitates’ dispersion.

Since this is the first attempt to apply this technique to nanosized Ni4Ti3 precipitates, a parameter optimization was performed before the quantification and based on reliability maps and shape and size measures of detected precipitates when compared to BF TEM images. The best conditions include an incoming beam precession of 0.2°, a spot size 9 and a 30 μm C2 aperture (Tecnai G2 microscope equipped with field emission gun). The template generation for the Ni4Ti3 structure should be performed with an excitation error of 0.2, intensity scale 14 and step count 120 while for the template generated for the Ni-Ti B2 matrix an excitation error of 0.5 and step count 120 is preferred.

Figure 1 gives one example on one of the stress free samples to show the result of orientation and phase mapping of Ni4Ti3 precipitates in the Ni-Ti B2 matrix. Figure 2 shows the result of orientation and phase mapping of a stress assisted sample. The precipitate density in figure 1b is calculated to be 17%, while density in figure 2b is increased to 21%. From these images, such quantitative comparisons between different fabrication processes can be obtained, which will lead to better understanding and improvement of the ARSME in Ni-Ti. 

[1] M. Nishida, T. Honma, Scripta Metallurgica, 18 (1984) 1293-1298.

[2] W. Tirry, D. Schryvers, Nat Mater, 8 (2009) 752-757.

[3] M. Nishida, C.M. Wayman, T. Honma, Scripta Metallurgica, 18 (1984) 1389-1394.


Xiayang YAO (Antwerp, Belgium), Yuanyuan LI, Shanshan CAO, Xiao MA, Xin-Ping ZHANG, Dominique SCHRYVERS
08:00 - 18:15 #6530 - MS06-843 Structural special features of the gold nanolayer sputtered on the glass surface modified by surface ion exchange and chemical etching.
MS06-843 Structural special features of the gold nanolayer sputtered on the glass surface modified by surface ion exchange and chemical etching.

     The research data are related to X-ray structure analysis of the gold nanolayers (50, 100 and 200 nm thick) on glass surface modified by the surface ion exchange, chemical etching or by treatment combining two indicated above methods. The soda lime silica glass has been modified by the special Surface Ion Exchange Paste (SIEP) [1-3]. Na+/Li+ ion exchange with SIEP has included next stages: glass surface degreasing and washing; the SIEP laying on the glass surface; thermal treatment at ~ 300º C for 15 – 20 min.; washing with running and distilled water. The chemical etching of glass have been carried out with the composition containing hydrofluoric acid [4]. The glass surface morphology has been observed by the SEM JSM-6460 (Jeol, Japan); the gold nanolayers were deposed on glass surface by the special device JVC-1600 (Jeol, Japan).

     X-ray data have been measured with diffractometer D8 Advance (CuKa radiation, one-dimensional detector Lynx–Eye with nickel filter). The range of the measurement was 2q = 10 – 120° with step 0,02° and acquisition interval 35,4 с. The program Topas 4.2 (Bruker AXS, Germany) and initial structural data of inorganic base ICSD, FIZ Karlsruhe, Germany have been also used in calculations.  

     X-ray data analysis allows make conclusion that the surface modification of the soda lime silica glass by the surface ion exchange and chemical etching has a substantial influence upon the size of gold crystal grains (Figure 1 i). Gold crystal grains have elongated shape in direction . The increase of the gold nanolayer thickness leads to decreasing of the crystal grains size.  The least size have been related to gold nanolayer 200 nm thick on glass surface modified by combined method indicated above: in direction average calculated grains size is ~ 14.7 nm; grains size averaged in directions , and is ~ 6.8 нм.

Authors express thanks to N.V. Bulina for technical support.                               

References

1. A.A. Sidelnikov, D.V. Svistunov, O.N. Sidelnikova Patent RF 2238919, (2004) 1-3.

2. O.N. Sidel’nikova, A.N. Salanov Glass and Ceramics, 64 (2007) 425 – 428.

3. O.N. Sidelnikova, G.A. Pozdnyakov, A.N. Salanov A.N., A.N. Serkova A.N. Glass Tech.: European J. of Glass Sc. and Tech. Part A, 52 (2011) 15 – 22.

4. E.K. Lazareva, T.M. Chelsova, A.A. Vernyj Inventor’s sertificate USSR 948926A (1982).

 


Olga SIDELNIKOVA, Aleksei SALANOV (Novosibirsk, Russia), Dmitriy YATSENKO, Alexandra SERKOVA
08:00 - 18:15 #6561 - MS06-845 TEM study of the explosive crystallization process in perovskite PZT-based heterostructures.
MS06-845 TEM study of the explosive crystallization process in perovskite PZT-based heterostructures.

Explosive crystallization (EC) of materials has been extensively studied both theoretically and experimentally in the end of 20th century. Now EC can be used for investigations of fast phase transitions [1] and controlled fabrication of heterostructures, for example, by the laser annealing [2]. In this case, location of the heat source depends on an absorption coefficient of an annealing substance. In transparent amorphous material high energy, laser pulses give rise to ionization due to multiphoton absorption, which initiates melting with further crystallization. The power density to start the process falls in the range of tenths TW/cm2 [3]. The use of ultrashort pulses provides locality of the process seeding while the surrounding layers accept almost unperturbed even if ablation of material accrues [4]. In this work we have studied of the EC process in ferroelectric precursor films after multipulse femtosecond laser annealing.

For the study we used films of lead zirconate-titanate (PZT) with the thickness of 700nm deposited on a platinized silicon substrate (Pt (80 nm)/SiO2 (300nm)/Si (300μm)) by RF magnetron sputtering. Wavelength of the laser radiation was set at 800nm.The laser pulses have duration of 100fs, and the repetition rate of 80MHz. To anneal the ferroelectric film the latter was exposed to the laser radiation for the period τA from 0.1s to 1.2s. The power density at the annealed spot ranges from 1.0 to 2.0 MW/cm2. Cross-sections for TEM were prepared by focused ion beam (FIB) in a FEI Helios. TEM investigations were carried out in a Tecnai G230ST equipped by a HAADF detector for STEM mode and an EDX detector at accelerating voltage of 300kV and Tecnai Osiris equipped by Bruker Super-X system at accelerating voltage of 200kV.

General TEM views of the cross-sectional selected annealed microstructures are shown in Fig.1. The marked areas are semicircles with the center at the surface of the film. In the annealed areas, the structure is changed to a granulated one. The size of grains varies from 10 to 200nm. The most unexpected peculiarity of these images is the semispherical shape of crystallized areas. Although the heat source is located at the bottom PZT/Pt interface, the center of semi-spheres is located at the top interface (surface) of the PZT film. Calculations of the interplanar distances showed that the perovskite in this area has an increased tetragonality (1.357±0.05) compared to the tabulated value of 1.02.

Cross-sectional transmission electron microscopy (TEM) images obtained for different crystallization times allow us to consider the crystallization propagation within the film. Although the femtosecond pulses are practically not absorbed by the film and result in an ultrafast laser induced heating of Pt-layer, the crystallization is seeded at the surface of the film and propagates to the heat source at the film/Pt interface (Fig. 2.).

The source of the heat is localized at the bottom interface. However, the heat propagates very fast and the temperature of both the top and the bottom interfaces are almost equal due to a very small thickness of the layer. At the same time, the film at the bottom interface undergoes high strain due to the difference in thermal expansion of Pt and PZT layers. The strain increase results in an increase of activation energy, which suppresses crystallization at the bottom interface. As a result, crystallization starts from the top interface i.e. the surface of the film.

This work was performed using the equipment of the Shared Research Center IC RAS and particularly supported by the Ministry of Education and Science of Russian Federation (State task no. 11.144.2014) and Grant no.14.Z50.31.0034, p220.

References:

1)    N. Zheludev, Nature Photonics 1 (2007) 551.

2)    D.N.Khmelenin, O.M.Zhigalina, K.A.Vorotilov, I.G.Lebo. Phys. of Solid State, 2012, 54, 5, 999-1001

3)    N.YuFirsova, E.D.Mishina, A.S.Sigov, S.V.Senkevich, I.P.Pronin, A.Kholkin, I. Bdikin, Yu.I.Yuzyuk, Ferroelectics 433 (2012) p.164.

4)    A.S.Elshin, I.P.Pronin, O.M.Zhigalina, M.Yu.Presnyakov, D.N.Khmelenin, E.D.Mishina, V.I.Emel’yanov. Solid State Comm., 2015, 224, 5.


Olga ZHIGALINA (Moscow, Russia), Dmitrii KHMELENIN, Mikhail PRESNIAKOV, Igor PRONIN, Andrew ELSHIN, Elena MISHINA
08:00 - 18:15 #6566 - MS06-847 Atomic scale studies of La/Sr ordering in La2-2xSr1+2xMn2O7 single crystals.
MS06-847 Atomic scale studies of La/Sr ordering in La2-2xSr1+2xMn2O7 single crystals.

Many fascinating properties of materials depend strongly on the local chemical environment. This is the case for many complex oxides, such as materials with colossal magnetoresistance, where small variations of composition at the atomic scale can affect drastically the macroscopic properties. The main objective of the present work is to analyze the local chemical composition with atomic resolution and to find out if any underlying chemical order is in any way connected to the magnetic properties of double perovskite La2-2xSr1+2xMn2O7 (LSMO) manganite oxides. For these compounds, charge and orbital ordering are observed for some doping values near x = 0.50 [1, 2].  

For this purpose, we have use aberration corrected scanning transmission electron microscopy (STEM) combined with electron energy-loss spectroscopy (EELS) measurements and also theoretical simulations. We have compared different compositions within three distinct magnetic regions of the phase diagram: a ferromagnetic metallic sample with x=0.36, an insulating, antiferromagnetic (AF) x=0.56 and an additional AF x=0.50 sample which also exhibits charge ordering.

High angle annular dark-field (HAADF) images, also known as Z-contrast, confirm that our single crystals exhibit high crystal quality. No secondary phases or defects are observed. Figure 1 displays an atomic resolution image obtained with the c-axis perpendicular to the electron beam of a x=0.50 sample. The perovskite (P)-like planes and the rock salt (R)-like planes are clearly observed, highlighted in green and red, respectively, on the image. The P-like planes exhibit a slightly high contrast, suggesting a possible La enrichment. EELS atomic resolution maps (inset) support a high degree of La segregation on those planes, while R-like planes are Sr rich. However, due to dechanneling of the beam, detailed image simulations are essential to accurately quantify the local chemical composition in an atomic column-by-atomic column fashion. For all our samples, we find a significant degree of long-range chemical ordering, which increases in the AF range. However, ordering is not complete and it cannot explain by itself the macroscopic electronic ordering phenomena [3].

 

Acknowledgements: Research at Oak Ridge National Laboratory and at Argonne National Laboratory was sponsored by the US Department of Energy, Office of Basic Energy Sciences, Materials Sciences and Engineering Division. Research at Univ. Complutense was supported by the European Research Council. This work was supported in part by DOE grant No. DE-FG02-09R46554. The authors are thankful to M. Watanabe for the PCA plug in for Digital Micrograph.

References

[1] Q. Li, K.E  Gray, H. Zheng, H. Claus, S. Rosenkranz, S.N. Ancona, R. Osborn, J.F. Mitchell, Y. Chen & J.W. Lynn (2007). “Reentrant orbital order and the true ground state of LaSr2Mn2O7”. Phys. Rev. Lett. 98 167201 (2007).

[2] J.F. Mitchell, D.N. Argyriou, A. Berger, K.E. Gray, R. Osborn & U. Welp. “Spin, Charge, and Lattice States in Layered Magnetoresistive Oxides”. J. Phys. Chem. B  105 (44) 10731-11052 (2001).

[3] “Atomic scale studies of La/Sr ordering in colossal magnetoresistant La2-2xSr1+2xMn2O7 single crystals”. M. A. Roldan, M. P. Oxley, Q. A. Li, H. Zheng, K. E. Gray, J. F. Mitchell, S. J. Pennycook, M. Varela. Microscopy & Microanalysis 20, 1791-1797 (2014).

[4] M. Bosman, M. Watanabe, D.T.L. Alexander, D.T.L. & V.J. Keast. “Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images”. Ultramicroscopy 106, 1024–1032 (2006).


Manuel ROLDAN (Thuwal, Saudi Arabia), Mark OXLEY, Qiang LI, Kenneth GRAY, John MITCHELL, Stephen PENNYCOOK, Maria VARELA
08:00 - 18:15 #6569 - MS06-849 Full structural and chemical characterization of the uniaxial relaxor SBN-67 (Sr0.67Ba0.33Nb2O6).
MS06-849 Full structural and chemical characterization of the uniaxial relaxor SBN-67 (Sr0.67Ba0.33Nb2O6).

SBN belongs to the tetragonal tungsten bronze (TTB) family of uniaxial ferroelectric relaxor materials, with a single component polarization vector pointing along the tetragonal c axis. The high dielectric constants observed and polarization controlling around the ordering temperature 'Tm' make of relaxors promising systems for applications such as electrocaloric, pyroelectric, piezoelectric/electrostrictive devices and sensors.

The idealized structure of SBN, with the generalized formula A2B4C4Nb2Nb8O30, has three types of structural channels along the c axis, formed by two types of crystallographically independent NbO6 octahedra. Disorder due to presence of voids on A cation sites (occupied by Sr atoms) and random distribution of Ba and Sr on B cation sites are thought to be responsible for the relaxor behavior, via the formation of random electric fields and, subsequently, polar nanodomains oriented in the only easy polarization axis c, without a structural change occurring in the phase transition. In this work we present structural and chemical studies of a SBN single crystal by means of Selected Area Electron Diffraction (SAED), High Angular Annular Dark Field (HAADF), Annular Bright Field (ABF) and Electron Energy Loss Spectroscopy (EELS) along the [001] and [100] zone axes. Experiments were carried out in non-aberration corrected (Phillips CM30, JEOL J2100, JEOL2010F) and probe-corrected (Titan3 G2, ARM cF200) TEMs.

An incommensurate structural modulation in SAED experiments along the [100] direction already points to structural disorder (Fig. 1). Diffuse scattering in the form of streaking patterns in the main reflections can also be related to strain induced by the presence of vacant sites. HAADF imaging along the [100] zone axis directly shows in real space the presence of cationic vacancies in A-type sites. Elongation of the atomic columns in the center of the B pentagonal sites in HAADF images along the [001] zone axis (Fig. 2) is compatible with the presence of Ba and Sr randomly occupying that crystallographic position. EELS spectrum imaging along the [001] zone axis (Fig. 3) directly confirmed the mixing of Sr/Ba in the B-type sites. With these results, the causes for local charge disorder in the structure are mapped in direct space with atomic column resolution. ABF imaging allowed mapping the oxygen sublattice in the structure, achieving the full structural characterization of the material.

Acknowledgement: research leading to these results received financial support from the Spanish Ministry of Economy and Competitivity via the projects Consolider-IMAGINE (CSD2009-20013), MAT2010-16407 and MAT2013-41506.


Lluís LÓPEZ-CONESA (Barcelona, Spain), José Manuel REBLED, Alicia RUIZ-CARIDAD, Guilhem DEZANNEAU, Almudena TORRES-PARDO, Luisa RUIZ-GONZÁLEZ, José Maria GONZÁLEZ-CALBET, Sonia ESTRADÉ, Francesca PEIRÓ
08:00 - 18:15 #6571 - MS06-851 TEM/STEM study of rapidly quenched hard magnetic Nd-Fe-B ribbons.
MS06-851 TEM/STEM study of rapidly quenched hard magnetic Nd-Fe-B ribbons.

The increase of coercivity and simultaneously reducing the amount of heavy rare earth elements of Nd-Fe-B magnets is of great economic and scientific interest. Both, the grain size of the hard magnetic Nd2Fe14B phase and the presence of a grain boundary (GB) phase and its chemical composition have a crucial influence on the coercivity of sintered Nd-Fe-B magnets [1], [2]. Besides the sinter processing also the production route of rapid solidification, also called melt-spinning, for Nd-Fe-B magnets satisfies the demand of the industry for magnets with high coercivity and energy product [3]. The variation of the process parameters has a significant influence on the microstructure, like grain size and occurring phases. Two isotropic Nd-Fe-B melt-spun ribbons, ms-A and ms-B, with an average grain size of about 19 nm (STDV = 6 nm) (ms-B) and 60 nm (STDV = 22 nm) (ms-A) and a coercive field ranging from µ0Hc = 0.6 T (ms-A) to 1.0 T (ms-B) were investigated in a nanoanalytical TEM/STEM study carried out on an analytical field emission transmission electron microscope (TEM) (FEI Tecnai F20) at 200 kV, which is equipped with a high angle annular dark field detector (HAADF), a silicon drift energy dispersive X-ray detector (EDX) from EDAX and a Gatan Tridem GIF electron energy loss spectrometer (EELS). Conventional TEM sample preparation (cutting, thinning, ion milling) was conducted, in order to investigate large sample areas. For detailed nanoanalytical investigations Focused Ion Beam (FIB) samples were prepared in an FEI Quanta 200 3D DualBeam-FIB using the lift-out technique. A TEM bright field (BF) image shows the large grains of sample ms-A (Fig.1a). Besides selected area electron diffraction (SAED) analysis (Fig1.b), the occurring phases were identified with Fast Fourier Transformation (FFT) (Fig.1c) of High Resolution (HR) TEM images (Fig.1d). The [100], [110] and [111] lattice fringes of the single crystalline (Pr,Nd)2(Fe,Co)14B phase (φ) are visible in Fig.1d. Beside the 2-14-1 phase two further Fe dominating phases Fe-1 and Fe-2 were found. Two single crystalline bcc-Fe (α) grains of phase Fe-1, which contains mostly Fe and small amounts of Co and O, are displayed in Fig.1d. This phase shows characteristic dotted morphology, were else the Fe-2 phase has a homogeneous contrast like the Nd-Fe-B phase. Besides Fe also significant amounts of Nb and O were found in this phase. Large area EDX analysis have indicated about 40 % of the grains to be one of these two Fe phases and only 60 % are Nd-Fe-B grains and the ratio of the two Fe phases is approximately 50/50. The smaller grain size of sample ms-B is observed in the TEM-BF image (Fig.2a). The [001] lattice plains of an Nd-Fe-B grain was indexed with an FFT (Fig.2c) of the TEM Dark Field (DF) image (Fig.2d). An EELS line scan (ls) over an interface of two Nd-Fe-B grains shows no change in the chemical composition, implying that a grain boundary phase is not present in this material (Fig.3b,d). On the basis of the information on the microstructure obtained by this TEM study a numerical micromagnetic finite element model was created to simulate the influence of microstructural features like grain size and other occurring phases (Fig.3c). The micromagnetic simulation of the demagnetization curve of randomly oriented grains with direct intergranular coupling shows a decrease of the coercive field with increasing grain size (Fig.3a), which is in good agreement with the measured coercive field of the two samples.

 

[1]           G. A. Zickler, P. Toson, A. Asali, and J. Fidler, Phys. Procedia, vol. 75, pp. 1442–1449, 2015.

[2]           P. Toson, G. A. Zickler, and J. Fidler, Phys. B Condens. Matter, Oct. 2015.

[3]           J. J. Croat, J. F. Herbst, R. W. Lee, and F. E. Pinkerton, J. Appl. Phys., vol. 55, no. 6, p. 2078, 1984.

Acknowledgements: The funding from the European Community´s Seventh Framework Programme (FP7-NMP) under grant agreement no. 309729 (ROMEO) is acknowledged.


Gregor A. ZICKLER (Vienna, Austria), Josef FIDLER, Ahmad ASALI, David BROWN, Johannes BERNARDI
08:00 - 18:15 #6582 - MS06-853 Multiphase material sample preparation using broad-beam Ar ion milling for EBSD analyses.
MS06-853 Multiphase material sample preparation using broad-beam Ar ion milling for EBSD analyses.

When compared to monophase materials, multiphase materials can offer an improvement in properties or introduce new properties. For example, tungsten, carbides, and nitrides do not have many applications as monophase materials; these metals are brittle, which can override their other desirable properties, such as hardness, high temperature stability, and wear. However, when these materials are dispersed in a soft matrix, such as low-carbon steel, nickel, or cobalt, and form a composite, the multiphase materials are then characterized by desirable mechanical properties, such as ductility, strength, and resistance to creep and fatigue [1,2]. Other types of multiphase materials are protective surface coatings, such as tribological and antioxidation applications, and microelectronics devices [3].

Knowledge of the phases present in the material, their distribution, and their fractions is fundamental to materials characterization. A common investigative approach for engineered materials is electron backscatter diffraction (EBSD) combined with energy dispersive spectroscopy (EDS). EBSD provides information about crystallographic orientations or misorientations and allows the study of grain boundaries, deformation, and recrystallization. EDS can define the chemical composition of the materials. When combined, these techniques permit phase identification with high accuracy [4].

Sample preparation of multiphase materials for EBSD and EDS can be challenging, especially when the different phases have very different characteristics. For example, if one phase is hard and brittle and the second phase is soft and ductile, the rate of material removal during mechanical polishing can vary widely. In addition, the hard particles removed from the first phase can act as a grinding medium and tear the soft matrix of the second phase. The result is a surface inappropriate for EBSD analyses. Electrolytic etching is another sample preparation technique that is not ideal for multiphase materials; it often requires the use of toxic or dangerous chemicals, it can cause differential etching of the sample surface, and it can give the sample surface a varied topography, which will produce a shadowing effect in the EBSD/EDS analysis.           

The goal of this work is to illustrate how the use of low energy, broad-beam argon ion milling can improve and facilitate multiphase material sample preparation. Several examples are discussed, including hard particles within a soft matrix and a multiphase protective layer on a metal substrate.

References

  1. Fogagnolo, J., Robert, M., & Torralba, J. (2006). Mechanically alloyed AlN particle-reinforced Al-6061 matrix composites: Powder processing, consolidation and mechanical strength and hardness of the as-extruded materials. Materials Science and Engineering: A, 426(1-2), 85-94. doi:10.1016/j.msea.2006.03.074
  2. Maetz, J., Douillard, T., Cazottes, S., Verdu, C., & Kléber, X. (2016). M23C6 carbides and Cr2N nitrides in aged duplex stainless steel: A SEM, TEM and FIB tomography investigation. Micron, 84, 43-53. doi:10.1016/j.micron.2016.01.007
  3. Nuri, K., & Halling, J. (1993). Multi-phase materials and their surface contact behaviour with reference to friction and wear. Wear, 160(2), 213-219. doi:10.1016/0043-1648(93)90423-j
  4. Nowakowski, P., Ubhi, H. S., & Mathieu, S. (2015). Investigation of phases and textures of binary V-Si coating deposited on vanadium-based alloy (V-4Cr-4Ti) using electron backscatter diffraction. IOP Conference Series: Materials Science and Engineering, 82(1), 012061. doi:10.1088/issn.1757-899x

Pawel NOWAKOWSKI (Export, USA), James SCHLENKER, Mary RAY, Paul FISCHIONE
08:00 - 18:15 #6584 - MS06-855 Topological insulator Sb2Te3/Bi2Te3 heterostructures: structural properties.
MS06-855 Topological insulator Sb2Te3/Bi2Te3 heterostructures: structural properties.

In a topological insulator (TI) the bulk electronic band structure behaves like an ordinary band insulator. However, at the surface topologically protected surface states occur, which give rise to a spin-locked, dissipation-less electronic transport. Hence, topological insulator materials, such as Sb2Te3 or Bi2Te3, are of great interest for spintronic devices or quantum computing. In order to achieve the dissipation-less transport, the Fermi level has to be exactly tuned within the Dirac cone like band structure at the surface.  To date intrinsic doping by vacancies or antisite defects renders Sb2Te3 and Bi2Te3 p- and n-type, respectively, which results in hole or electron transport in the bulk. Recently we solved this problem by growing p-n junctions made of Sb2Te3 and Bi2Te3 [1]. In this approach the carrier concentration at the surface is reduced by formation of the space charge layer at the buried heterointerface.

Structure-wise the X2Te3 (X=Bi, Sb) rhombohedral unit cell consists of three Te-X-Te-X-Te quintuple layers, which are linked by van der Waals forces.  In order to achieve layers of high structural perfection on Si(111) substrates  careful control of the growth parameters of the molecular beam epitaxy is required. In particular, we could demonstrate that the suppression of twin domains, which are the most prominent structural defects, is possible by van der Waals epitaxy [2].

Here we report on advanced scanning transmission electron microscopy and energy dispersive X-ray studies on MBE grown Sb2Te3/Bi2Te3 heterostructures. Figure 1 displays STEM bright-field and dark-field images, where the quintuple layers within the heterostructures and a highly perfect interface to the Si substrate are atomically resolved. The EDX measurement in Figure 2 reveals, that at the heterointerface a Sb and Bi gradient extends over about 4 nm, effectively introducing a ternary compound as interlayer. Corresponding electrical transport measurements demonstrate the tunability of the intrinsic carrier concentration by variation of the thickness of the individual films [3].

[1]   Eschbach M, Młyńczak E, Kellner J, Kampmeier, J, Lanius, M, Neumann, E., Weyrich C, Gehlmann M, Gospodaric P, Döring S, Demarina N, Luysberg M, Biehlmayer G, Schäpers, T,  Plucinski L, Blügel S, Morgenstern M, Schneider C M, Grützmacher D. Nature Communications. 2015;6(May):8816. doi:10.1038/ncomms9816.

[2]   Kampmeier J, Borisova S, Plucinski L, Luysberg M, Mussler G, Grützmacher D. Crystal Growth and Design. 2015;15(1):390-394. doi:10.1021/cg501471z.

[3]   Lanius, M,  Mussler, G.,  Kampmeier, J,  Weyrich, C.,  Schall, M.  Kölling, S.,  Schüffelgen, P., Neumann, E., Luysberg, M.,  Koenraad, P.  Schaepers, T.,  Grützmacher, D.  accepted for publication in Crystal Growth and Design. doi: 10.1021/acs.cgd.5b01717


Martina LUYSBERG (Jülich, Germany), Martin LANIUS, Jörn KAMPMEIER, Christian WEYRICH, Sebastian KÖLLING, Melissa SCHALL, Peter SCHÜFFELGEN, Elmar NEUMANN, Gregor MUSSLER, Paul M. KOENRAD, Thomas SCHÄPERS, Detlev GRÜTZMACHER
08:00 - 18:15 #6656 - MS06-857 EMCD investigation of the Verwey-transition in magnetite.
MS06-857 EMCD investigation of the Verwey-transition in magnetite.

Magnetite is of interest in physics as well as in chemistry, for example because of its surface chemistry [1]. Furthermore, the investigation of the magnetic properties is worthwhile as the material exhibits a magnetic phase transition (the so-called Verwey-transition) at 125 K [2]. Magnetite shows a drop in its magnetisation when cooled down below the transition temperature, together with a change in electronic and structural properties. This behaviour was subject to a number of investigations [2]. However, the details of the transformation mechanism are still under discussion.

EMCD (energy-loss magnetic chiral dichroism) is a versatile technique to investigate magnetic properties in the TEM on a nanoscale [3]. When performing EMCD on magnetite, the Fe L2,3-edge, acquired using two different scattering conditions, is compared. The difference signal corresponds to the magnetic properties of the investigated material. Using current TEMs, EMCD can be performed in-situ with a high spatial resolution, thus giving information about local changes of the magnetic moments [4].

We used a FEI Tecnai TF20 TEM, operated at 200 kV, equipped with a Gatan GIF Tridiem, and a Gatan Cryo-Transfer sample holder to investigate magnetite samples close to the transition temperature. Thus, not the whole specimen was transformed. Figure 1(a) shows a bright field image of the investigated sample area. Due to variations from the perfect stoichiometry, regions that already transformed are visible alongside sample regions still in the high-temperature phase. The diffraction patterns shown in Fig. 1(b,c) were acquired at two different regions, marked in Fig. 1(a), to check whether the material has already transformed.

The EMCD spectra that were recorded in the two marked sample regions are depicted in Fig. 2. It can be seen that in the non-transformed region a strong EMCD signal of 13.5% is visible, while in the transformed region no EMCD effect is observed. This indicates changes in the local magnetic moments due to the phase transition. The results are faced to Bloch-wave simulations [5], carried out for the same settings used in the EMCD measurements. Thus, the influence of different channelling conditions due to structural changes induced by the Verwey-transition is compared to the measured EMCD signal. It is shown that the difference in the EMCD effect is mainly caused by local changes of the magnetic moments and not by different channelling conditions due to the structural changes.

EMCD in combination with the versatility of a wide variety of analytical techniques in a TEM is an ideal tool to gain knowledge about the magnetic properties of a material on the nanoscale. The necessary combination of experiments with simulations (as elastic scattering strongly influences the measured signal) provides insight into the mechanisms of magnetic phase transitions.

[1] Weiss and Ranke, Prog. Surf. Sci 70 (2002) 1

[2] Walz, J. Phys. Condens. Matter 15 (2002) R285

[3] Schattschneider et al., Nature 441 (2006) 486

[4] Schattschneider et al., PRB 78 (2008) 104413

[5] Löffler and Schattschneider, Ultram. 110 (2010) 831

[6] The authors thank U. Diebold and G. Parkinson for providing the sample. A. Steiger-Thirsfeld is acknowledged for preparing the FIB-lamellae for TEM investigation.


Walid HETABA (Mülheim an der Ruhr, Germany), Michael STÖGER-POLLACH
08:00 - 18:15 #6659 - MS06-859 Structural evolution of Pt/CNF nanocomposites as a part of fuel cell’s gas-diffusion electrodes.
MS06-859 Structural evolution of Pt/CNF nanocomposites as a part of fuel cell’s gas-diffusion electrodes.

A search of new nanostructural materials (such as gas-diffusion layers, electrodes, catalysts, membranes etc.) for a polybenzimidazole-membrane fuel cell remains a crucial task nowadays. Reducing of noble metals content has become one of the most significant goals in development of fuel cells while a balanced union of electron and ion conductivity along with gas permeability and catalytic activity of electrodes serves as an essential condition of the hydrogen-air fuel cell efficiency [1].

In this study carbon nanocomposites of nanofiber nonwoven mats, produced by electrospinning and decorated with Pt, after work inside membrane electrode assembly as gas-diffusion cathode at 160-180 оС were investigated by analytical TEM and STEM methods [2].

Initially a nanofiber surface is evenly covered with a thick layer of Pt nanoparticles of anisotropic elongated shape with a number of sub angstrom atomic steps on their surface (Fig. 1a). This type of defects plays an important part in platinum catalytic activity [2,3].

The investigations of such a nanocomposite after work as a gas-diffusion cathode in a fuel cell revealed significant changes in the structure of the platinum layer. After several hours of work at a standard fuel cell working temperature (160 oC) the structure of metal nanoparticles changes slightly (Fig. 1b). Metal nanoparticles preserve their shape elongated in direction and specific distribution on fibers surface same as in initial nanocomposites. However, in this case platinum is covered with a thin amorphous layer. Some of the platinum nanocrystals demonstrate the signs of partial melting and a loss of initial acicular shape as well as the decrease of surface defects.

After several days of work at standard and high fuel cell working temperature (160-180 oC) the structure of catalyst  changes considerably (Fig. 1c) and can be observed as melted conglomerates of unspecified shape and size of 40-100 microns (Fig. 2) with a cover of thin (5-10 nm) amorphous layer.

Acknowledgements

This work was performed using the equipment of the Shared Research Center IC RAS and partially supported by RFBR grant # 14-29-04011 ofi-m.

 

1. Y. Wang, K.S. Chen, J. Mishler, S.C. Cho, X.C. Adroher. Appl. Energ., 2011, 88, Pp. 981-1007.

2. I.I. Ponomarev, Iv.I. Ponomarev, I.Yu. Filatov, Yu.N. Filatov, D.Yu. Razorenov, Yu.A. Volkova, O.M. Zhigalina, V.G. Zhigalina, V.V. Grebenev, N.A. Kiselev. Dokl. Phys. Chem. 2013, 448, P. 23.

3. V.G. Zhigalina, О.М. Zhigalina, I.I. Ponomarev, D.N. Khmelenin, D.Yu. Razorenov, Iv.I. Ponomarev, N.А. Kiselev. Nanomaterials and nanostructures — XXI century. 2012, 4, Pp. 36-40.


Victoria ZHIGALINA (Moscow, Russia), Olga ZHIGALINA, Igor PONOMAREV, Ivan PONOMAREV, Dmitriy RAZORENOV, Kirill SKUPOV
08:00 - 18:15 #6675 - MS06-861 The effect of spark plasma sintering on structure and phase stability in half-Heusler thermoelectric alloys.
MS06-861 The effect of spark plasma sintering on structure and phase stability in half-Heusler thermoelectric alloys.

Thermoelectric (TE) materials have the capability to directly convert a temperature difference into an electric voltage across the material and vice versa. Half-Heusler (HH) compounds are a promising group of TE materials. They are ternary intermetallic compounds, with the general formula XYZ – X and Y transition metals (e.g., X=Ti, Zr, Hf and Y=Ni, Co) and Z a metal or metalloid (e.g., Sn, Sb). The electronic structure and charge carrier concentration can be manipulated by atomic substitution on each crystallographic site to enhance the TE properties. However, further increase of efficiency of the alloys is limited by the relatively high thermal conductivity. Nanostructuring is reported to reduce the thermal conductivity as a result of an enhancement of the phonon scattering, thus increasing the efficiency of the TE materials [1].

Spark plasma sintering (SPS) is reported to give rapid densification of powders into bulk specimens and retain nanostructures (grain boundaries) from the starting powders. In the current study, n-type XNiSn alloys with different (Ti, Zr, Hf) compositions on the X-site were prepared by ball-milling of arc-melted and thermally annealed ingots, followed by SPS for 10 minutes, with temperatures between 850 and 1100 oC and applied pressures between 65 and 80 MPa. The SPS prepared alloys were investigated with a combination of X-ray diffraction (XRD) and scanning and transmission electron microscopy (SEM and TEM) techniques, supported by density functional theory (DFT) thermodynamic calculations.

In all SPS samples, graphite is present in the surface regions. At the interface between the graphite and the XNiSn alloys, carbides are present as illustrated in figure 1 for the HfNiSn alloy – sintered at 1100 oC and 80 MPa. In agreement with previous reports on HH studies, single phase HH does not form in any of the alloy systems [2]. Secondary phases are distributed along compositional HH boundaries as illustrated in figure 2 from the TiNiSn alloy, sintered at 900 oC and 80 MPa. Phase separation of HH phases, with different composition Xand HH lattice parameter, is generally evident by splitting of the HH reflections in the XRD diffractograms. In the case of the TiNiSn alloy, such splitting of the HH reflection is not observed; however, we find compositional variations of the HH phase from the nominal composition – consistent with the variations in the shades of grey seen in the HH regions in figure 2. In addition to the HH and secondary phases seen in the figure, grains of full-Heusler TiNi2Sn exist in the alloy.

REFERENCES

[1]  S. J. Poon, D. Wu, S. Zhu, W. Xie, T. M. Tritt, P. Thomas and R. Venkatasubramanian, Journal of Materials Research 26 (2011), 2795;

[2]  E. Rausch, S. Ouardi, U. Burkhardt, C. Felser, J. M. Stahlhofen and B. Balke, Condensed Matter – Materials Science (2015), e-print arXiv: 1502.03336v1 [cond-mat.mtrl-sci]

ACKNOWLEDGEMENTS

The authors gratefully acknowledge the financial support by the NANO2021 programme and THELMA research project (project no. 228854) of the Research Council of Norway (NFR).


Raluca TOFAN (OSLO, Norway), Cristina ECHEVARRIA-BONET, Kristian BERLAND, Matthias SCHRADE, Magnus SØRBY, Bjørn Christian HAUBACK, Clas PERSSON, Øystein PRYTZ, Vidar HANSEN, Anette Eleonora GUNNÆS
08:00 - 18:15 #6680 - MS06-863 Chemical reactivity between sol-gel deposited Pb(Zr, Ti)O3 layers and their GaAs substrates.
MS06-863 Chemical reactivity between sol-gel deposited Pb(Zr, Ti)O3 layers and their GaAs substrates.

The combination on the same wafer of materials having different physical properties is a key challenge. In particular, functional oxides of the perovskite family are very attractive for applications in the micro-optoelectronic field since they present a variety of physical properties (ferroelectricity, ferromagnetism, superconductivity, high Pockels coefficients, …). They are classically grown on SrTiO3 (STO) substrates, but molecular beam epitaxy (MBE) allows their epitaxy on Si and GaAs platforms, providing that specific interface engineering strategies are used. However, even in this case, chemical reactions between the growing oxide and the substrate strongly impact the epitaxy process and impose using specific growth procedures that are detrimental to the oxide crystal quality. Amongst the oxides that can be integrated on STO templates, Pb(Zr,Ti)O3 (PZT) is of particular interest because of its high remanent polarization (Pr), its low coercive field (Ec) and its outstanding piezoelectric properties

In this contribution, we report the study of sol-gel prepared PZT thin films on STO/GaAs templates grown by molecular beam epitaxy (MBE). The spin-coated layers were calcined at 350°C under air for 5 minutes to dty the sol film. The crystallization of the PZT have been studied in function of post-annealings at three different temperatures ranging (405°C, 420°C and 510 °C). High angle annular dark field scanning transmission electron microscopy (HAADF-STEM) and energy dispersive X-ray spectroscopy (EDXS) have been used to study the structure and the chemical composition of the layers. High resolution HAADF images coupling to geometrical phase analysis (GPA) show that PZT is locally strained on the STO/GaAs during the first steps of crystallization. Complete crystallization of the PZT laeyrs cannot be achieved due to a significant oxidation of the GaAs substrate which enhances As diffusion through the structure and further formation of parasitic PbAs and SrAs compounds.               

ACKNOWLEDGEMENTS

We acknowledge Agence Nationale de la Recherche (ANR), program of investment for the future, TEMPOS project (n°ANR-10-EQPX-50) for having funded the acquisition of the NANOTEM platform (Dualbeam FIB-FEG FEI SCIOS system and TEM-STEM FEI Titan Themis equipped with the Super-X Chemistem EDX detectors) used in this work


Benjamin MEUNIER, Ludovic LARGEAU (Marcoussis), Philippe REGRENY, José PENUEALS, Romain BACHELET, Bertrand VILQUIN, Baba WAGUE, Guillaume SAINT-GIRONS
08:00 - 18:15 #6692 - MS06-865 Mn 4+ holes localization around divalent cations in low-hole doped manganites.
MS06-865 Mn 4+ holes localization around divalent cations in low-hole doped manganites.

Magnetotransport properties of low Ca doping La1-xCaxMnO3 perovskite related manganites have been described on the basis of the existence of isolated metallic (M)-double exchange (DE) ferromagnetic (FM) nanoclusters embedded in a long range insulating (I) matrix. Taking into account the DE mechanism, long range FM order and M conduction are expected across the La1-xCaxMnO3 series. However, the real behaviour differs from this ideal description as an I state is observed for x£0.2. This can be understood by assuming that the electronic itinerancy is not spread to the whole sample but restricted to FM-M clusters embedded in the matrix. In spite of much effort devoted to their study, the behavior at atomic level is far from being satisfactorily explained. Here we report direct experimental evidence in La0.9Ca0.1MnO3, by means of STEM-EELS characterization in a JEOL ARM 200 cFEG aberration corrected microscope, that holes and divalent cations tend to be closely correlated in the sample. Figure 1 shows a characteristic HAADF image and corresponding EELS compositional maps showing a heterogeneous distribution of La and Ca. The study of the Mn oxidation state suggests a shift towards Mn3+ or Mn4+ when the environment is La and Ca richer, respectively (figure 2).[1] This Ca-hole attraction results in the formation of small clusters confined to one or two unit cells and would provide an answer to the long-standing problem of the origin of the electric and magnetic behavior in the low calcium region of the La1-xCaxMnO3 system.


Luisa RUIZ-GONZALEZ (MADRID, Spain), Raquel CORTÉS-GIL, Daniel GONZALEZ-MERCHANTE, Jose Maria ALONSO, José M. GONZALEZ-CALBET
08:00 - 18:15 #6694 - MS06-867 Revealing Lattice Oxygen Exchange During CO Oxidation over 6H-BaFeO3-δ Catalyst Nanoparticles by Diffraction and Atomic Resolution Techniques.
MS06-867 Revealing Lattice Oxygen Exchange During CO Oxidation over 6H-BaFeO3-δ Catalyst Nanoparticles by Diffraction and Atomic Resolution Techniques.

Eliminating or reducing the amount of noble metals and rare earths in catalysts is a primary issue to reach the goal of sustainable development. The substitution of noble metals by 3d metals is receiving increasing attention. Related to this strategy, ABO3 perovskite oxides (A=lanthanide and B=Fe, Co, Mn) are being essayed as catalysts in many reactions. Substitution of La by an alkaline earth has been reported to modify the catalytic activity of such perovskites.[1] To balance the charge deficiency produced by the incorporation of divalent ions into the A sublattice, either the B element increases its oxidation state or oxygen vacancies are created or, even more, both processes occur simultaneously. In general terms, a positive effect on the catalytic activity is observed on methane, propene and hydrogen oxidation reactions within the whole temperature range, after the addition of barium in Mn, Fe and Co perovskites. On the basis of these ideas, we have considered of interest exploring the catalytic behavior of a lanthanide-free, BaFeO3-δ perovskite in CO oxidation, putting emphasis on the influence of redox pre-treatments on catalytic activity and on the possible involvement of lattice oxygen in the process. This particular process was firstly of interest in automotive pollution control devices but more recently for cutting-edge technologies related to production of hydrogen for fuel cells. Though it is admitted that the catalytic behavior of perovskites is intimately related to the nature of their defects, studies focused on the detailed analysis of the nature of such defects at atomic scale are systematically lacking. Therefore, this contribution aims at illustrating the large potential of diffraction data combined with AC-STEM to establish structure-function correlations. As an illustration, we have explored the involvement of lattice oxygen in the catalytic activity of BaFeO3-δ perovskite for the CO oxidation.

BaFeO3-δ (0.2<δ<0.4) depicts a 6H perovskite hexagonal structural type, with Fe both in (III) and (IV) oxidation states and oxygen nonstoichiometry accommodated by random distribution of anionic vacancies.[2] Analysis of the redox properties of 6H-BaFeO2.78 reveals the involvement of two types of lattice oxygen atoms in the CO oxidation over BaFeO3-δ. On its hand, an exhaustive study combining different diffraction techniques (in-situ high temperature SAED, X-ray diffraction, powder neutron diffraction) and aberration-corrected STEM techniques, both in imaging and spectroscopic modes, have provided us with an atomically resolved picture of the accommodation of oxygen-non-stoichiometry. Thus, mapping of Ba, Fe and O atomic columns, Figure 1, have allowed us identifying the distribution of all the elements in the sample in the ...cchcch... sequence expected for the 6H-polytype. No systematic differences have been observed between the hexagonal and cubic layers in BaFeO3-δ this meaning, in agreement to NPD and ABF results, that there is not a preferential distribution of the oxygen vacancies along the different layers. From the whole set of results obtained it has been possible to propose the role of the oxygen deficiency responsible for the low temperature CO oxidation activity of BaFeO3-δ.

[1] Yamazoe, N.; Teraoka, Y.; Catal. Today 1990, 8, 175-199.

[2] Parras, M.; Vallet-Regi, M.; Gonzalez-Calbet, J. M.; Grenier, J. C. J. Solid State Chem. 1989, 83, 121-131.


Isabel GÓMEZ-RECIO (MADRID, Spain), Achraf EL HADRI, Raquel CORTES-GIL, Aurea VARELA, Marina PARRAS, Angel GUTIERREZ, F. Javier GARCÍA-GARCÍA, Eloy DEL RIO, Jose Juan CALVINO, Juan Carlos HERNADEZ, Juan Jose DELGADO, Jose Antonio PÉREZ-OMIL, Jose Maria GONZALEZ-CALBET
08:00 - 18:15 #6700 - MS06-869 Accommodation of oxygen deficiency in La0.5Ca2.5Mn2O7-d and LaSr2Mn2O7-d Ruddlesden-Popper Manganites.
MS06-869 Accommodation of oxygen deficiency in La0.5Ca2.5Mn2O7-d and LaSr2Mn2O7-d Ruddlesden-Popper Manganites.

Ruddlesden-Popper (RP) (AO)(ABO3)n mixed oxides have recently attracted considerable insight1 as a consequence of their potential for low-dimensional physic arising from their structural configuration which results from the ordered intergrowth between n ABO3 perovskite (P) blocks and one AO rock-salt (RS) layer. This ordered arrangement of different chemical and structural unities induces intriguing behaviours that can be modified by controlling the number of intergrowing unities. For instance, colossal magnetoresistance and ferromagnetic ordering have been reported by Moritomo2 et al in n=2 La2-2xSr1+2xMn2O7 system. However, it should be noticed the difficulty to stabilize pure high ordered terms, which are frequently obtained as disordered intergrowths between the basic unities. We have prepared and characterized ordered n=2 terms for the La0.5Ca2.5Mn2O7 and LaSr2Mn2O7 compositions. For instance, figure 1 shows characteristic HAADF and ABF images atomically resolved for the strontium sample. In addition, compositional variations at the anionic sublattice are scarce compared to other manganese related perovskite systems in which different superlattices have been described as a consequence of the ordering on non-occupied oxygen positions. In this work, we have also focused on the stabilization and characterization of new oxygen deficient La0.5Ca2.5Mn2O7-d and  LaSr2Mn2O7-d  phases.3 The ensemble of XRD, ND, SAED, HREM and aberration corrected HAADF, ABF images as well as EELS techniques allows proposing a topotactic reduction process in both systems through different oxygen sites, apical and equatorial, for the strontium and calcium samples, respectively.

[1] Mulder, A. T.; Benedek, N. A.; Rondinelli, J. M.; Fennie, C. J. Adv. Funct. Mater. 2013, 23, 4810.

[2] Moritomo, Y.; Asamitsu, A.; Kuwahara, H.; Tokura, Y. Nature 1996, 380, 141.

[3] Ruíz-González, M. L.; González Merchante D.; Cortés-Gil, R.; Alonso, J. M.; Martínez, J. L.; Hernando, A.; González-Calbet, J. M.; Chem. Mater. 2015, 27, 1397.


Raquel CORTÉS-GIL (Madrid, Spain), Daniel GONZALEZ-MERCHANTE, Jose M ALONSO, Luisa RUIZ-GONZALEZ, Jose M GONZALEZ-CALBET
08:00 - 18:15 #6711 - MS06-871 Real structure of highly oriented Ge-Sb-Te thin films investigated by Cs-corrected STEM.
MS06-871 Real structure of highly oriented Ge-Sb-Te thin films investigated by Cs-corrected STEM.

The phase-change effect in a wide class of tellurium-based chalcogenide compounds allows for the fast and reversible transition between crystalline and amorphous states that possess a large contrast in material properties. Application examples include optical storage media, phase-change RAM. Ge-Sb-Te (GST) compounds are often used as a model system for this behavior, and have thus received wide-spread attention in literature [1-3]. Recent interest in the material contrast switching behavior of GST has extended to the reversible switching of highly oriented layered superlattices [3]. The exact nature of the crystalline transition is still under debate, and detailed insight into the high-temperature trigonal phases in an epitaxial environment is required in order to accurately interpret experimental data. While such epitaxial thin films of GST are typically prepared by MOCVD or MBE, the here presented experimental results were obtained by pulsed laser deposition (PLD) from compound targets onto various substrates at elevated temperatures. The aim of the work presented is thus to investigate the microstructure of of GST thin films deposited by PLD, with particular focus on the interface formation, as well as to characterize the stacking sequences and defect structures in the trigonal phases produced [4].

GST thin films were deposited from a stoichiometric Ge2Sb2Te5 compound target onto various silicon substrates in a range of temperatures from 110 to 280 °C. The thin films deposited on amorphous surface layer and chemically cleaned substrates possessed closed surfaces and low roughness. While electron and x-ray diffraction data shows that all films are in the trigonal phase, some were found to be polycrystalline, while others possess are clear uniform epitaxial relation towards the substrate. Furthermore, a comparison of average chemical compositions by STEM-EDX revealed that the relative concentration of Ge rapidly declines at deposition temperatures above 200 °C.

Two atomic resolution images of polycrystalline columnar grain growth of GST by PLD are shown in Fig. 1. As can be seen in Fig. 1(a), when deposited onto a flat amorphous interface layer, the crystalline grains above can be misoriented towards the substrate, and the onset of systematic layering of the characteristic van der Waals (vdW) layers is delayed. Fig. 1(b) shows the disordered stacking in the bulk of a crystallite deposited onto cleaned Si(111) at 110 °C, with 7, 9 and 11-layered building blocks and Z-contrast correlating with Ge1Sb2Te4, Ge2Sb2Te5 and Ge3Sb2Te6, respectively. Fig. 2 shows the interface of GST on superficially cleaned Si(111) deposited at 110 °C (Fig. 2(a)) and 280 °C (Fig. 2(b)). All epitaxial thin films possess a  surface passivation Te/Sb layer, as well as a vdW gap immediately above [4,5]. We thus find a strong correlation between grain morphology, surface passivation and substrate treatment, as well as characteristic stacking disorder and chemical reordering of the Ge-rich layers.

We thank Mrs. A. Mill for her assistance in the FIB preparation. The financial support of the European Union and the Free State of Saxony (LenA project; Project No. 100074065) is gratefully acknowledged.

[1] U. Ross, A. Lotnyk et al., Appl. Phys. Lett. 104, 121904 (2014).

[2] A. Lotnyk, S. Bernütz et al., Acta Mater. 105, 1 (2016).

[3] J. Momand, R. Wang et al., Nanoscale 7, 45 (2015).

[4] U. Ross, A. Lotnyk et al., Journal of Alloys and Compounds (2016), doi: 10.1016/j.jallcom.2016.03.159

[5] A. Koma, Thin Solid Films 216, 72 (1992).


Ulrich ROSS, Andriy LOTNYK (Leipzig, Germany), Erik THELANDER, Bernd RAUSCHENBACH
08:00 - 18:15 #6721 - MS06-875 Scanning transmission electron microscopic studies of calcium silicate hydrates.
MS06-875 Scanning transmission electron microscopic studies of calcium silicate hydrates.

Cement-based materials play a vital role in our modern day concrete environment. During service life, they are often in contact with different aqueous solutions, which lead to structural and chemical changes and in turn, a possible deterioration of this material. Transport processes and intrinsic material properties are key components of such reactions. Evaluations on transport mechanisms, as well as shrinking and creep processes, require a detailed picture of the pore system. To this day, it has not been fully understood yet even though the nanometer small gel pores of the calcium silicate hydrate (CSH) phase have a significant impact on material performance. This calls for additional characterizations on a much smaller scale. However, the gel pore structure of the CSH is complex, heterogeneous and inaccessible making evaluations problematic. For this purpose, an analytical approach on multiple scales was applied. To determine the potential impact of gel pores on material properties and thus, performance, a structural characterization of a model cement paste was performed using scanning transmission electron microscopy (STEM) along with gas adsorption measurements (multi-point BET) in addition to standard mineralogical techniques. The model cement paste consisted of synthesized and hydrated tricalcium silicate. For this purpose, the focused ion beam (FIB) preparation technique was used, which is a fairly novel method concerning cementitious building materials. The challenge was the preparation of the FIB-lamella due to the water content, the unstable nature of the sample’s constituents and the high porosity of 20-30 %. Manual adjustments had to be performed throughout the entire milling process in order to prevent the disintegration of the lamella. Furthermore, it was necessary to build multiple robust frames by depositing high amounts of platinum. The lamella was analyzed with the FEI Titan 80-300 TEM in low-dose (80 keV) mode. STEM images reveal the complex structure of the CSH. It consists of 3-5 nm thin CSH foils oriented to one another in a honeycomb structure. The pore size spans from only a few nanometers up to 50 nm with a maximum at 15 nm. These gel pores touch and intersect each other producing a sponge-like conduit network. A similar pore width distribution was also observed with BET. Multiple selected area diffraction (SAED) patterns reveal the volatile nature of this material. The first pattern showed a broad diffuse ring between 2.5 and 3 Å, which can be attributed to CaO. In the following diffraction patterns, this ring becomes more pronounced with many small individual reflexes (Si-Si 1.6 Å) and further rings appear. These observations point towards a crystallization induced by the incident beam. This study shows that such advanced techniques can also be applied to building materials. The information gained is not only valuable to basic research of cementitious materials but also to applied problems related to deterioration processes. Further research and practice will be devoted to improve the FIB handling and technique for cement-based materials and to the analysis of other cement-based compounds, in order to investigate the relationship between nanoscale features and deterioration reactions.


Olivia WENZEL (Eggenstein-Leopoldshafen, Germany), Matthias SCHWOTZER, Torsten SCHERER, Venkata S. K. CHAKRAVADHANULA, Andreas GERDES
08:00 - 18:15 #6726 - MS06-877 Atomic resolution studies of La0.7Sr0.3MnO3/BaTiO3 multiferroic tunnel junctions.
MS06-877 Atomic resolution studies of La0.7Sr0.3MnO3/BaTiO3 multiferroic tunnel junctions.

In complex oxide heterostructures, the interplay between magnetic, electric and transport properties often results in novel functionalities [1-4]. The introduction of controlled densities of oxygen vacancies may allow further tuning of the interface magnetic structure, providing a new path towards enhanced device functionalities. In this work, we have fabricated multiferroic tunnel junctions combining a La0.7Sr0.3MnO(LSMO) ferromagnetic manganite electrodes with BaTiO3 (BTO) ferroelectric tunnel barriers. High quality heterostructures have been produced by high oxygen pressure RF sputtering system. In particular, we have grown samples where an ultrathin layer of a La-Sr cuprate with a nominal composition of oxygen deficient La0.84Sr0.16CuO3-x (LSCO) is inserted in between the BTO and the top LSMO electrode. The transport properties of such asymmetric LSMO/BTO/LSCO/LSMO junctions should be highly tunable via the application of external fields, since the physical properties of cuprates are highly sensitive to doping.

Aberration-corrected scanning transmission electron microscopy (STEM) combined with electron energy-loss spectroscopy (EELS) has been used to study the structure, chemistry and electronic properties of our systems, with atomic resolution in real space. These techniques constitute powerful tools to inspect cuprate/manganite interfaces, where charge transfer may take place [5].

Low magnification images such as the one in figure 1(a) show that the resulting magnetic tunnel junctions exhibit flat layers over long lateral distances. Atomic resolution images in figure 1(b) and 1(c) exhibit a high crystal quality and coherent growth. Figure 2(a) displays atomic resolution compositional maps obtained across the stacking, for the different elements La, Ti, Mn, Ba, Cu and O. Figure 2(b) exhibits the O K edge signal across the heterostructure, normalized and integrated laterally. A clear dip is observed within the cuprate layers, suggesting that the LSCO ultrathin film stores a large density of oxygen vacancies in the structure. Such thin cuprate layers are insulating, ensuring an electronic screening asymmetry. This behavior could yield values in excess of 104 % upon polarization switching, since ferroelectric switching would involve the motion of those oxygen vacancies. Vacancy accumulation would also affect the electronic structure of the interfaces. In fact, values of the tunneling magnetoresistance (TMR) of 125% have been obtained along with a change in the sign of the TMR when the BTO polarization is reversed. This finding (which is not observed in symmetric LSMO/BTO/LSMO structures) suggests that polarization switching has an effect on the spin polarization of the interface, related to the presence of the LSCO layer and the O vacancies. In summary, our results suggest that tailoring the spin polarization at interfaces by growing asymmetric heterostructures with O vacancy–rich thin cuprate layers may provide new ways to design the spin filtering devices of the future.

Acknowledgements

Research at ORNL supported by U.S. Department of Energy (DOE), Basic Energy Sciences (BES), Materials Sciences and Engineering Division. Research at UCM supported by Fundacion BBVA. We acknowledge financial support by Spanish MICINN through grants MAT2011-27470-C02, MAT2015-66888-C3-3-R and ConsoliderIngenio 2010 - CSD2009-00013 (Imagine), by CAM through grant S2009/MAT-1756 (Phama).

References 

[1] A. Ohtomo and H. Y. Hwang, Nature 427, 423-426 (2004).

[2] V. Garcia, M. Bibes et al., Science327,1106–1110 (2010).

[3] E. Y Tsymbal, Condensed Matter15, R109-R142 (2003).

[4] J. D. Burton  and E. Y. Tsymbal, Phys. Rev. B80, 174406 (2009).

[5] J. Salafranca et al., Phys. Rev.Lett. 112, 196802 (2014).


Mariona CABERO (Madrid, Spain), Ana PEREZ-MUÑOZ, David HERNÁNDEZ, Zohuair SEFRIOUI, Radu ABRUDAN, Sergio VALENCIA, Steve John PENNYCOOK, Carlos LEÓN, Maria VARELA, Jacobo SANTAMARÍA
08:00 - 18:15 #6781 - MS06-879 Microscopy study of the front and back sides of platinum catalyst gauzes used in ammonia oxidation.
MS06-879 Microscopy study of the front and back sides of platinum catalyst gauzes used in ammonia oxidation.

     Ammonia oxidation with air on platinum catalyst gauzes is widely used in chemical industry for synthesis of nitric acid. It is well known that during this process the gauzes undergo deep structural rearrangement of surface layers (catalytic etching) leading to the platinum loss and catalytic activity decrease. To reveal the mechanism of the catalytic etching of platinum catalyst gauzes during the NH3 oxidation, we studied in detail the surface microstructure of the front and back sides of platinum catalyst gauzes used in ammonia oxidation. The platinum catalyst gauzes used in the study were made from a polycrystalline wire with d ≈ 82 μm with the chemical composition (in wt.%) 81% Pt, 15% Pd, 3.5% Rh and 0.5% Ru. A laboratory flow reactor made of quartz tube with the inner diameter of 11.2 mm was used at the feed (ca. 10% NH3 in air) flow rate 880-890 l/h, the gauze temperature 860±5 °C and total pressure ca. 3.6 bar. A pack of four gauzes was loaded into the reactor to maintain standard conditions of the catalytic process. The surface microstructure was studied using a scanning electron microscope (SEM) JSM-6460 LV (Jeol).

     Substantially different surface layer microstructure of the front and back sides of the polycrystalline wire in the first gauze relative to the gas flow after the treatment in the reactor at T ≈ 860 °C for 50 h in the reaction medium (ca.10% NH3 in air) was observed after the SEM study. SEM images of the wire surface for the front and back sides of the gauze are shown in Figures 1 and 2, respectively. Images b and c in Figures 1 and 2 were obtained from the central part of the wires shown in Fig. 1a and Fig. 2a, respectively. The SEM images demonstrate that the front side of the wire was etched much more significantly than the back side due to the strong effect of the gas feed on this side of the wire. The wire surface on the front side of the gauze was covered by a continuous corrosion layer consisting of crystalline agglomerates with the sizes 5–15 μm separated by deep voids with the width 1–10 μm (Fig. 1a). The agglomerates had different shapes, crystalline faceting and contained through pores with the diameter 1–5 μm (Fig. 1b). The surface of these agglomerates consisted of crystalline facets without large defects (Fig. 1c). On the surface of the wire from the back side of the gauze weak etching was observed only at the wire interweaving places whereas the major part of the wire surface looked relatively smooth (Fig. 2a). Granular structure with 1–13 μm grains (Fig. 2b) separated by grain boundaries containing 200–400 nm pores was observed in the central part of the wire (Fig. 2a). Crystalline planes with the height ~ 100 nm and many dark spots with the diameter 50–150 nm were observed on the surface of the grains (Fig. 2c). Some of them had pyramidal shape resembling the shape of etching pits at the places where screw dislocation exit to the surface. The concentration of these pits is 4.0 x 108 cm-2, which is close to the dislocation density in platinum.

     The obtained data indicate that the size of agglomerates on the front side of the gauze (5–15 μm) is close to that of grains observed on the back side (1–13 μm). This result seems to suggest that the etching develops in the course of gradual growth and transformation of the grains into crystalline agglomerates during the growth and merging of etching pits at the grain boundaries. Through pores with the size of 1–5 μm inside the agglomerates may be formed during merging of growing etching pits on the surface and in the bulk of the grains. The emergence and growth of the pits can be related to the reaction of ammonia molecules with oxygen atoms absorbed at the grain boundaries, dislocations and other surface defects. The reaction of gaseous NH3 molecules with absorbed oxygen atoms Oabs with the formation of gaseous NO results in local overheating of the surface initiating the release of metal atoms to the surface. Intense release of metal atoms from pits at the grain boundaries forms extended voids between the grains. Metal atoms released from the defects quickly migrate over the grain surface and are gradually incorporated at the energetically most favorable sites. As a result, the grains are gradually reconstructed into faceted crystalline agglomerates with through pores formed due to the growth and merging of pits. When these processes go on for a long time, a rough corrosion layer including crystalline agglomerates with through pores separated by deep extended void is formed (Fig. 1).

Acknowledgement

This work was supported by RussianAcademy of Sciences and Federal Agency of Scientific Organizations (project 44.1.17).


Aleksei SALANOV (Novosibirsk, Russia), Evgenii SUPRUN, Elena SUTORMINA, Lyubov ISUPOVA, Valentin PARMON
08:00 - 18:15 #6817 - MS06-881 TiO2 nanotubes array decorated by Ag and modified in reduction atmosphere for photo-catalytic application using visible light.
MS06-881 TiO2 nanotubes array decorated by Ag and modified in reduction atmosphere for photo-catalytic application using visible light.

TiO2 nanostructures with promising physical and chemical properties, such as a high specific surface area, a high photo-activity and environmental stability, but also the low costs of synthesis inspire numerous studies over the past three decades. Titania nanostructures can be used for photo-catalysis, in solar cells (DSSC) and sensors, still it can absorb light and behave as photo-catalytically active only under irradiation with UV light since TiO2 has a relatively large band-gap (3.2 eV for anatase and 3 eV for rutile phase). So, one of the key parameters necessary to develop enhanced photo-catalytic properties in the visible and near-IR regions is to optimize the band-gap of TiO2 materials towards the bandgap of monocrystal silicon. In our study we use Ag nanoparticles and hydrogenation to manipulate with the bandgap, photo-absorption of TiO2 nanotubes with the aim to enhance photo-catalytic properties.

TiO2 nanotubes array (TiNTA) was synthesized by anodization of titanium foils as broadly used method for production of nanotubes arrays with different morphology and dimensions of nanotubes. In case of decorated nanotubes, the silver particles were obtained by the photo-reduction of AgNO3 under UV light. Pure and silver-decorated nanotubes were additionally heat treated in hydrogen. For the structural characterization we used conventional and analytical transmission electron microscopy (TEM) including high angle annular dark field imaging (HAADF), scanning electron microscopy (SEM) techniques, X-ray diffraction (XRD) and Raman spectroscopy. Using UV–ViS-NIR spectroscopy we studied bandgaps and the photo-catalytic activity (on a model organic compound - wastewater) for all the samples before and after hydrogenation.

We found that decoration of TiNTA with Ag broadened the light absorption also in visible range due to the surface plasmon resonance of Ag nanoparticles. Ag nanoparticles with different shapes and diameters are attached on TiO2 array surface (Fig. 1) as well as inside the nanotubes (Fig. 2). Therefore, the frequency of their plasmonic oscillations covers a wide range, permitting absorbance over a visible and UV part of solar spectrum. Moreover, the hydrogenation at high temperature was shown as essential to considerably increase the absorption of light in the visible and near-IR regions and enhance photo-catalytic activity. This is a consequence of the synergetic effects between the silver and the defects at the surface of TiO2 nanoparticles (the most probably oxygen vacancies) that increase the efficiency of the formation of electron–hole pairs and the charge transfer to the surface of the nanoparticles.

Acknowledgement

This work has been supported in part by Croatian Science Foundation under the project (IP-2014-09-9419), Croatia (MZOŠ)-Germany(DAAD) bilateral project and in part by European social fond ESF, Human resources development.


Andreja GAJOVIC (Zagreb, Croatia), Milivoj PLODINEC, Ivana GRČIĆ, Marc WILLINGER
08:00 - 18:15 #6822 - MS06-883 Structure and non-stoichiometry in Ca3-xFe15+xO27-y Hexaferrite.
MS06-883 Structure and non-stoichiometry in Ca3-xFe15+xO27-y Hexaferrite.

Recent studies led in the system Ca-Fe-O, and especially by considering the formation of intergrowths (CaFe2O4)(FeO)n [1], put forward a strong dependence in temperature so much point of structural view as electronics of these complex oxides with mixed valence Fe2+/Fe3+. In particular, it was demonstrated that CaFe5O7 ferrite, n = 3 member of the series, exhibits a structural monoclinic/orthorhombic reversible transition in 360K associated with a transition of charge order [2].


New crystal chemistry studies by playing on possible non stoichiometry, so anionic as cationic, around the composition CaFe5O7, revealed the existence of a new structure which the stacking mode is related to the large family of hexaferrite. The structural resolution of this compound was performed by combining electronic diffraction and X-ray diffraction data on powder. In particular, a tomographic approach in precession electron mode was carried out and will be presented. This structure which is also described as a mechanism of intergrowths will be detailed and illustrated by the high-resolution imaging (HREM, HAADF). The electronic properties will be also exposed. The latter put forward two magnetic transitions over the room temperature: the first one around 350K, sensitive to the actual stoichiometry of the sample, and the second one in 460K [3].

[1]- B. Malaman, H. Alebouyeh, F. Jeannot, A. Courtois, R. Gerardin, O. Evard. Materials Research Bulletin. 1981, Vol 16, 1139-1148.

[2]- C. Delacotte, F. Hüe, Y. Bréard, S. Hébert, O. Pérez, V. Caignaert, J.M. Greneche, D.  Pelloquin. Inorganic Chemistry. 2014, Vol 53, 10171-10177.

[3]- L. Monnier, C. Moussa, C. Delacotte, P. Boullay, A. Maignan and  D. Pelloquin (in preparation)

[4] – L. Palatinus, V. Petricek, CA. Correa. Acta Crystallographica A-Foundation and Advances. 2015, Vol 71, 235-244.


Laurine MONNIER (Caen), Phillipe BOULLAY, Denis PELLOQUIN
08:00 - 18:15 #6870 - MS06-885 Epitaxial BaTiO3 on Si and SiGe for low power devices: nanoscale characterization of the film and its interface with the semiconductor by HAADF and EELS in STEM.
MS06-885 Epitaxial BaTiO3 on Si and SiGe for low power devices: nanoscale characterization of the film and its interface with the semiconductor by HAADF and EELS in STEM.

Introduction. In the late 1990s, the success of SrTiO3 epitaxial growth on Si by molecular beam epitaxy (MBE) opened a path for integrating complex oxides on Si-based platforms. In particular, ferroelectric perovskite oxides offer promising perspectives to improve or add functionalities on-chip like low power logic devices or integrated photonics [1]. BaTiO3, the prototypical ferroelectric perovskite oxide, is a good candidate for these applications [2, 3]. However, regarding practical devices, integrating a perovskite oxide epitaxially on Si by MBE is still in its infancy. One key point is the control of the crystalline orientation, which determines the polarization orientation within the thin film. Playing with experimental parameters of growth and the composition of the Si xGe1-x semiconductor substrate are means to manipulate the competition between compressive stress from epitaxy and tensile stress from thermal expansion. In order to support MBE growth strategies, aberration-corrected scanning transmission electron microscopy has been investigated to determine both the strain and the chemical state of epitaxial BaTiO3 thin films.

 

Experiment. BaTiO3 was epitaxially grown on Si xGe1-x (x=1 and x = 0.20) substrates either using an SrTiO3 buffer layer to reduce both thermal and lattice mismatches between BaTiO3 and Si or without any buffer on Si0;2Ge0.8. The complex oxides were grown by MBE using Sr, Ba and Ti effusion cells. Details on the growth are given in refs [1,4]. BaTiO3 was grown directly on strained Si0.8Ge0.2/Si substrates using a barium passivation. STEM-HAADF images were collected on a FEI Titan Low-Base 60-300 probe corrected microscope and the data treated using the geometric phase analysis (GPA). STEM-EELS data were also acquired with a special attention to Ba, Ti and O elements.

 

Main results. In a first part, we will first describe the crystalline structure and cationic composition studied at the nanoscale in BaTiO3/SrTiO3/Si heterostructures. The effect of oxygen pressure will be discussed. We show that the lattice parameter profile evolution within the thickness of the BaTiO3 films is clearly associated with modifications of the cation stoichiometry within the thickness and that there is a clear impact of the oxygen pressure on both lattice parameter and composition profiles. In a second part, we will discuss the particular epitaxial state of BaTiO3 grown directly on Ba-passivated strained Si0.8Ge0.2.

 

References.

[1] L. Mazet et al., A review of molecular beam epitaxy of ferroelectric BaTiO3 films on Si, Ge and GaAs substrates and their applications, Science and Technology of Advanced Materials. 16, 036005 (2015)

[2] S. Salahuddin, S. Datta, Use of Negative Capacitance to Provide Voltage Amplification for Low Power Nanoscale Devices, Nano Letters. 8, 405–410 (2008)

[3] S. Abel et al., A strong electro-optically active lead-free ferroelectric integrated on silicon, Nature Communications, 4, 1671 (2013)

[4] L. Mazet et al., Structural study and ferroelectricity of epitaxial BaTiO3 films on silicon grown by molecular beam epitaxy, Journal of Applied Physics. 116, 214102 (2014) 


Sylvie SCHAMM-CHARDON (Toulouse cedex4), Cesar MAGEN, Lucie MAZET, Robin COURS, Martin FRANK, Vijay NARAYANAN, Catherine DUBOURDIEU
08:00 - 18:15 #6878 - MS06-887 Interface study of metal nitride films on MgO and Al2O3 substrate using CS-corrected TEM.
MS06-887 Interface study of metal nitride films on MgO and Al2O3 substrate using CS-corrected TEM.

 

Transition metal nitrides have found wide-spread applications in the cutting- and machining-tool industry due to their extreme hardness, thermal stability and resistance to corrosion. The increasing demand of these nitrides requires an in-depth understanding of their structures at the atomic level. This has led to some experimental and theoretical researches [1-6].

In this paper, we will present our recent results on the atomic and electronic structures of the interface between various metal nitride thin films (CrN, VN and TiN) on MgO and Al2O3 substrate using CS-corrected HRTEM and STEM, EELS/EDXS, quantitative atomic measurement and diffraction analysis as well as theoretical calculations. Interfacial detailed atomic and electronic structures are revealed and compared. Interface induced phenomena between nitride films and substrates are unveiled [1-4].

Figure 1 shows two typical interfacial atomic structures, frequently accompanied by interface atom reconstruction and interface dislocations to accommodate the misfit strains between two lattices. Particular studies on the effects of N defects in the metal nitride (CrN) film have been carried out. Combining the image analysis and spectrum analysis, some generalized conclusions are derived. (i) a relationship between the lattice constant and N vacancy concentration in CrN is established [5], (ii) the ionicity of CrN crystal is correlated with the N vacancy concentration; (iii) especially, a direct relationship between electronic structure change (L3/L2 ratio) and elastic deformation (lattice constants) in CrN films has been experimentally deduced, indicating that the elastic deformation may trigger a noticeable change in the fine structure of Cr-L2,3 edge (Figure2). The experiment demonstrates an indirect approach to acquire electronic structure changes during the elastic deformation. The effect of randomly distributed defects in the films has been explored in a quantitative way using electron diffraction, complemented with HRTEM and EELS analysis. Some quantitative relations are also established [5].

 

 

[1]. R. Daniel et al, Acta Materialia 58(2010), p. 2621.

[2]. Z. L. Zhang, et al  Physical. Review B 82(R)(2010) p060103-4

[3]. Z. L. Zhang, et al Journal of Applied Physics, 110(2011)p043524-4

[4]. Z.L. Zhang et al  Physical Review B  87 (2013) p014104.

[5]. T.P. Harzer, et al Thin Solid Films 545 (2013) p154–160

[6]. P. Wan, Z.L. Zhang, et al,  Acta Mater 98(2015)119–127

[7]. Acknowledgement: Gabriele Moser and Herwig Felber are gratefully acknowledged for their help with sample preparation, thanks are given to Dr. Hong Li for ab-initio calculations.  Thanks are also given to Rostislav Daniel and Christian Mitterer in Montanuniversität  Leoben, Leoben, Austria for preparing the materials, and to Gerhand Dehm (Max-Planck-Institut für Eisenforschung) for helpful discussion.


Zaoli ZHANG (Leoben, Austria)
08:00 - 18:15 #6917 - MS06-889 Ferroelectric/dielectric composite tunnel junctions: influence of the stacking sequence on their microstructure.
MS06-889 Ferroelectric/dielectric composite tunnel junctions: influence of the stacking sequence on their microstructure.

Increasing the tunnel electroresistance of ferroelectric tunnel junctions can be achieved by replacing the single ferroelectric barrier by a ferroelectric/dielectric bilayer. For a given thickness of the layers, the stacking sequence (ferroelectric/dielectric or dielectric/ferroelectric) can lead to different resistivity.

In this paper, we study composite tunnel junctions based on the Mn-BiFeO3/SrTiO3 bilayer, deposited on a LaSrMnO3 (LSMO) buffer, grown on (001)-oriented SrTiO3 (STO) substrates (fig. 1). The samples were grown by PLD. The nominal thicknesses are 0.8nm for SrTiO3 and 2.8 nm for Mn-BiFeO3 (BFO).

TEM/HRTEM micrographs reveal the homogeneity of the bilayers. The sharpness and roughness of the interfaces are then studied by mean of Cs-corrected HAADF-STEM for both stacking sequences.

STO/BFO/LSMO (fig. 1a): for this configuration, both BFO/LSMO and STO/BFO interfaces appear flat, suggesting a homogeneous thickness of the BFO layer of 2.8 nm. The top surface of STO exhibits steps of half perovskite-cell height leading to an effective STO thickness of about three to four unit-cell; somewhat thicker than the awaited one.

BFO/STO/LSMO (fig. 1b): whereas the STO/LSMO interface looks flat and sharp, the BFO/STO interface exhibits a roughness of the order of one perovskite unit-cell, indicating that the effective STO layer thickness is somewhat inhomogeneous, but close to the awaited 0.8nm thickness. The BFO surface looks flat, suggesting that the effective BFO thickness varies along the bilayer but also remains close to the 2.8nm awaited thickness.

Deeper insights on the interfaces sharpness are further obtained by ELNES measurements at the Mn L23 , Fe L23 , Ti L23 and O-K edges. Peculiar fingerprints of the Fe and Ti L23-edges are observed at the bilayer interfaces suggesting slight changes of the crystal field in their vicinity.


Frédéric PAILLOUX (FUTUROSCOPE CEDEX), Matthieu BUGNET, Arnaud CRASSOUS, Stéphane FUSIL, Vincent GARCIA, Manuel BIBES, Gianluigi BOTTON, Agnès BARTHÉLÉMY, Jéröme PACAUD
08:00 - 18:15 #6935 - MS06-891 Influence of Cu content on the structural and morphological features of TixCuy intermetallic thin films for biosignals acquisition.
MS06-891 Influence of Cu content on the structural and morphological features of TixCuy intermetallic thin films for biosignals acquisition.

Thin films synthesized by Physical Vapor Deposition (PVD) are currently studied to be used in different types of sensors [1,2]. Among these, sensors and electrodes used for biomedical devices are particularly important since they allow converting one or more measured signals of any living tissue into other quantities, usually an electrical signal. Beyond the electrical response, a biomedical sensor should also be biocompatible and totally innocuous for the patient. Additionally some degree of antibacterial effect is considered as a further asset for the sensor. The Ti-Cu system perfectly meets such requirements, Ti being biocompatible, while Cu is relevant for its antibacterial character. Objective of this study is to deeply characterize the nature and microstructure of Ti-Cu films in order to better understand and optimize the sensor response.
Films are deposited by a PVD magnetron sputtering process from a composite Ti-Cu target. Their chemistry, morphology and fine microstructure are characterized by X-Ray diffraction, Rutherford Backscattering Spectrometry, Scanning and Transmission Electron Microscopies.
Results show that three main zones were distinguished, in relation with the Cu/Ti atomic ratio into the films. SEM reveals that the morphology of micrometer- thick films changed from a columnar to an amorphous-like microstructure. XRD diffraction indicated that the hcp-Ti structure dominates for low Cu/Ti ratios. For higher Cu contents, formation of Ti-Cu intermetallic phases was noticed which becomes more clear and obvious for the third zone (Cu contents above 75 at.%). HR-TEM and STEM observations confirm the presence of nanocrystallites embedded into an amorphous matrix (Fig. 1). A further chemical characterisation allowed identifying the nature of  intermetallics, which contributed to explain sensors’ electrical behaviours (Fig. 2).

[1] C. Lopes; M. Vieira; J. Borges; J. Fernandes; M. S. Rodrigues; E. Alves; N. P. Barradas; M. Apreutesei; P. Steyer; C. J. Tavares; L. Cunha; F. Vaz; "Multifunctional Ti-Me (Me = Al, Cu) Thin Film Systems For Biomedical Sensing Devices"; Vacuum (2015).
[2] C. Lopes, P. Fonseca, T. Matamá, A. Gomes, C. Louro, S. Paiva, F. Vaz; “Protective Ag:TiO2 thin films for pressure sensors in orthopedic prosthesis: the effects of composition, structural and morphological changes on the biological response of the coatings”, Journal of Materials Science: Materials in Medicine; 25 (2014); 2069-2081.



Claudia LOPES, Siddhardha KONETI, Lucian ROIBAN, Joel BORGES, Thierry EPICIER, Filipe VAZ, Philippe STEYER (VILLEURBANNE CEDEX)
08:00 - 18:15 #6961 - MS06-893 Plan view STEM analysis of the domain structure in anisotropically strained epitaxial K<sub>0.95</sub>Na<sub>0.05</sub>NbO<sub>3</sub> ferroelectric films with giant piezoelectricity.
MS06-893 Plan view STEM analysis of the domain structure in anisotropically strained epitaxial K<sub>0.95</sub>Na<sub>0.05</sub>NbO<sub>3</sub> ferroelectric films with giant piezoelectricity.

In the past years lead free KxNa1-xNbO3 ceramics with huge d33-values, comparable to that of PbZr1-xTixO3, have been demonstrated [1]. The high piezoelectric coefficients are generally attributed to the presence of a monoclinic phase at the morphotropic phase boundary and the associated symmetry reduction. A recent work by Schwarzkopf et al. [2] reports that monoclinic phases can also be stabilized in ferroelectric perovskite thin films by utilizing anisotropic epitaxial strain. Another advantage of using epitaxial strain is to engineer by an appropriate choice of the substrate and film composition the arrangement and size of domains, which in turn influences on the piezo- and ferroelectric material properties. Ferroelectric thin films and their domain structure are commonly characterized by combining X-ray diffraction (XRD) and piezoresponse force microscopy (PFM). While XRD gives useful crystallographic information, its local resolution is limited and a detailed study of the domains is impossible. On the other hand PFM has sufficient spatial resolution but does not provide structural information.

Plan-view transmission electron microscopy (TEM) with its ability to study structural data with high accuracy at atomic resolution is in principle ideally suited to gain detailed information on the domain structure of the film. There is, however, one major challenge. In order to preserve the as-grown strain state of the film and thus its domain structure plan-view TEM samples with a thick substrate layer are necessary. Since TEM is a projective method it images typically the projected potential averaged along the beam direction including both film and substrate for a plan-view observation geometry. In this paper we will show that this challenge can be overcome by appropriate imaging conditions using high resolution scanning TEM (STEM) annular dark field (ADF) imaging. Due to the channeling effect and the reduced depth of focus in STEM mode we are able to obtain information mainly from the monoclinic distorted film, while the substrate gives rise to a uniform background intensity.

As an example we study a 26 nm thin film of K0.95Na0.05NbO3, which was epitaxially grown on top of a (110) NdScO3 substrate and shows giant piezoelectricity. PFM reveals a complex periodic domain structure with the coexistence of two different monoclinic domains (yellow and purple stripes in Fig. 2 a). According to XRD these domains differ from each other by the orientation of the in-plane monoclinic distortion. Based on the structural data provided by XRD and PFM we created a supercell consisting of a K0.95Na0.05NbO3 film, which contains two domains with a difference of the in-plane monoclinic distortion of 2β=8 mrad, on top of a 150 nm thick rigid NdScO3 substrate without any lattice distortion (Fig. 1 a). The chosen thickness of the substrate is a minimum value necessary to preserve the as-grown strain state of the film. Frozen phonon simulations reveal that if the incident electron probe is transmitted first through the film, then the final high resolution STEM ADF image pattern directly reflects the domain structure of the K0.95Na0.05NbO3 film with the evaluated shear angle 2β as in the supercell (Fig. 1 b). However, if the electron beam direction is inverted, i.e. the beam is transmitted first through the substrate, then no lattice distortion corresponding to the domain structure of the film is found in the obtained high resolution STEM ADF image. An analysis of the evolution of the electron probe inside the supercell (Fig. 1 c) shows that this 3-dimensional sensitivity is caused by the electron channeling effect. In the present case the high resolution pattern in the final image is produced basically in the first 20-30 nm of transmitted material. After this thickness the wave function of the electron beam is widely dispersed, irrespectively of the initial position of the electron probe. Thus the subsequent part of the specimen mainly contributes to a uniform background intensity in the final image.

Consequently, the frozen phonon simulations demonstrate the feasibility of our approach to study domains in epitaxially strained ferrolectic films by plan-view high resolution STEM ADF imaging. An experimental example for the STEM analysis of the domain structure for the above mentioned K0.95Na0.05NbO3 film is shown in Fig 2 c. A model of the complex domain pattern including the sub-domain structure will be discussed in the paper.

 

[1] Wang et al., J. Am. Chem. Soc. 136, 2905 (2014)

[2] Schwarzkopf et al., J. Appl. Cryst. 49, 375 (2016)


Toni MARKURT (Berlin, Germany), Jutta SCHWARZKOPF, Dorothee BRAUN, Martin SCHMIDBAUER, Martin ALBRECHT
08:00 - 18:15 #6982 - MS06-895 Microstructure investigation of Allvac 718Plus superalloy after heat treatment with temperature gradient.
MS06-895 Microstructure investigation of Allvac 718Plus superalloy after heat treatment with temperature gradient.

ATI Allvac 718Plus® superalloy (718Plus alloy) exhibits high strength and good corrosion resistance in high temperatures. The 718Plus alloy was designed to increase the maximal temperature of application without strong increase of production costs. It was achieved by improving the microstructure stability up to 700 °C and was possible due to the changes in the main strengthening mechanism of the 718Plus alloy.

The 718Plus alloy typical chemical composition is as follows: Ni-18Cr-10Fe-9Co-5.1(Nb+Ta)-2.7Mo-1W-0.7Ti-1.5Al-0.03C (wt%). Those elements create multiple phases and proper characterisation of those phases is the key for understanding properties of the 718Plus alloy. The 718Plus alloy microstructure consists of a γ matrix (Ni-base solid solution) with ordered face centred cubic γ’-Ni3(Al,Ti) type phase, some orthorhombic δ-Ni3Nb and hexagonal η-Ni3Ti, η*-Ni6AlNb or Ni6(Al,Ti)Nb particles precipitated mainly on the grain boundaries [1,2].

The aim of this study was to investigate the microstructural changes, with a special focus on the evolution of secondary phases, during the multiple-step heat treatment conditions. Establishing such understanding will allow to define an optimal heat treatment route for the best alloy performance and stability, and can provide major savings in production costs.

 

Several microscopy techniques were used for microstructure investigations, mainly SEM, TEM/HRTEM and STEM-EDX spectrometry. Phase identification was performed by XRD, EDX and electron diffraction (SAED, nD) supported by JEMS. The samples were prepared by conventional jet electropolishing and by FIB techniques. The research was conducted utilizing Merlin G20 TWIN (SEM) and a probe Cs corrected Titan3 Cubed G2 60-300 with a ChemiSTEM system. It provided a possibility of very detailed analyses mainly focused on identification, morphology and chemical composition of the phases strengthened the 718Plus alloy. STEM imaging using HAADF contrast and EDX mapping were used for characterization of the particles’ nanostructure down to the atomic level.

The as-received 718Plus alloy microstructure (Figs 1, 2) consists of spherical γ’-Ni3(Al,Ti) phase particles and various plate-like precipitates, some of them with a very complex structure. Observations in TEM dark-field revealed stripes of additional phase inside some of the plate-like precipitates (Fig. 3), which were not observed in the bright-field images. Fig. 4 shows HRSTEM-HAADF image of plate-like precipitate at atomic level, as seen along [110] axis. Identification by electron diffraction and EDX showed that it is a hexagonal η-Ni3Ti phase enriched in Nb (possibly η*-Ni6AlNb or Ni6(Al,Ti)Nb phase), however some reflections indicated a presence of a different phase. It seems to be orthorhombic δ-Ni3Nb phase (“white stripes”), which has similar chemical composition (Ni, Nb) but different crystal structure. Unambiguous identification of phases forming complex plate-like particles is in progress.

[1] O.M. Messé et al. : On the precipitation of delta phase in ALLVAC® 718Plus, Philosophical Magazine, 94(2014) 1132-1152

[2] E.J. Pickering et al.: Grain-boundary Precipitation in Allvac 718Plus, Acta Materialia 60 12012)2757-2769

 

Acknowlegments: The authors acknowledge Pratt & Whitney, USA for providing the material used in this investigation and for the financial support.


Sebastian LECH (Cracow, Poland), Adam KRUK, Bogdan RUTKOWSKI, Agnieszka WUSATOWSKA-SARNEK, Aleksandra CZYRSKA-FILEMONOWICZ
08:00 - 18:15 #6239 - MS07-897 Prospective scintillators for low-energy BSE detectors.
MS07-897 Prospective scintillators for low-energy BSE detectors.

Cerium activated bulk single crystals of yttrium aluminium garnet (YAG:Ce) Cex:Y3-xAl5O12 are widely used as scintillators for the detection of backscattered electrons (BSE). In the electron microscopy research of nanomaterials, biomaterials or semiconductors, low energy (units of keV) electron beam imaging is often necessary. Because BSE detectors are mostly non-accelerating or low-accelerating, electrons with approximately the same energy as primary beam (PB) have to be detected. However, commonly used YAG:Ce single crystal strongly loses its light yield (LY) with the decrease of the PB energy [1]. As possible available alternatives for this application, bulk single crystals of YAlO3:Ce (YAP:Ce) and CRY018 can be predicted. However, similar LY sink can be expected also with these scintillators.

There are two main reasons, why this occurs. Firstly, slower electrons don’t have enough energy to pass through the relatively thick conductive layer on the scintillator surface. Therefore, thinner conductive layer has to be used. Secondly, commonly available scintillators suffer from structural defects that are created mostly due to surface damage (as a result of its grinding, polishing, purification or contamination) or already during the own bulk single crystal growth.

The influence of all of these defects on cathodoluminescence (CL) properties can be eliminated by the scintillators in form of thin single crystalline films because, as shown previously [2], the concentration of these defects decreases with the decreasing temperature of the crystal growth. Therefore, single crystalline epitaxial films have attracted a lot of attention recently because the growth temperature of these films is about a half (1000 °C) of the bulk ones (2000 °C). Moreover, appropriate doping of the garnet structure can suppress the influence of the defects on the CL properties.

For the purpose of this work, bulk single crystals of YAG:Ce, YAP:Ce and CRY018 were studied. Results were compared with those of promising cerium activated single crystalline films of gadolinium aluminium gallium garnet (GAGG:Ce) Cex:Gd3-xGayAl5-yO12. These films were grown by the isothermal dipping liquid phase epitaxy onto YGG substrates from lead-free BaO-B2O3-BaF2 flux [3]. These specimens were coated with conductive layers of different composition and different thicknesses. Properties of these layers are in the table shown in Table 1.

The specimens were excited by an electron beam with energy in range from 0.8 to 10 keV using a specialized CL apparatus [4]. In this energy range, CL LY of YAG:Ce were measured for coating layers of different composition and different thicknesses (Fig. 1). Moreover, CL spectra (Fig. 2) and CL intensity decays (Fig. 3) have been measured for all presented specimens.

It was shown, that the coating layer with thickness of only units of nm has to be used to allow low-energy BSE penetrating the layer without significant losses. Moreover, it was shown, that the GAGG:Ce film with balanced Ga content shows excellent scintillation properties where the effect of unwanted structural defects was suppressed, the spectrally corrected CL LY value exceeded 160 % of the commercially available bulk YAG:Ce single crystal, and CL decay was dominated by a fast component with 50 ns decay time which is close to that of Ce3+ (5d-4f) photoluminescence decay. Thanks to these excellent CL properties at PB energy of 10 keV, GAGG:Ce single crystalline films are new prospective scintillators suitable for low-energy BSE detectors. This research is in progress, therefore other results at different PB energies will be presented at the conference.

Acknowledgements: The research was supported by the Technology Agency of the Czech Republic (TE01020118), by Czech Science Foundation (projects GA16-05631S, GA16-15569S) and by Ministry of Education, Youth and Sports of the Czech Republic (project LO1212) and by European Commission (project CZ.1.05/2.1.00/01.0017). The authors thank the company CRYTUR, s.r.o., for supplying with the specimens of bulk single crystals.

References:

[1] G. F. J. Garlick, Brit. J. Appl. Phys. 13 (1962) 541–547.

[2] M. Nikl, E. Mihokova, J. Pejchal, A. Vedda, Y. Zorenko, K. Nejezchleb, Phys. Status Solidi B 242 (2005) R119-R121.

[3] M. Kucera, K. Nitsch, M. Kubova, N. Solovieva, M. Nikl, J.A. Mares, IEEE Trans. Nucl. Sci. 55 (2008) 1201.

[4] J. Bok, P. Schauer, Rev. Sci. Instrum. 82 (2011) 113109.


Ondřej LALINSKÝ (Brno, Czech Republic), Petr SCHAUER, Miroslav KUČERA, Zuzana LUČENIČOVÁ, Martin HANUŠ
08:00 - 18:15 #6251 - MS07-899 VEELS investigation of perovskite manganite interfaces.
MS07-899 VEELS investigation of perovskite manganite interfaces.

As promising candidates for magnetic storage and magnetic field sensing applications at room temperature Sr-doped LaMnO3 (LSM) perovskite manganites show a very large negative magnetoresistance [1]. These materials exhibit a colossal magnetoresistance (CMR) which is very sensitive to the behaviour of the interface, due to the lattice misfit between substrate and thin film, and hence to the induced strain.

The investigated LSM thin film synthesised from La0.8Sr0.2MnO3 powder was prepared by pulsed laser deposition (PLD). The 140 nm thick LSM layer was epitaxially grown on a single crystalline LaAlO3 (LAO) (100) substrate. The preparation of a cross section specimen for TEM analysis was done by focused ion beam (FIB) followed by subsequently Ar+ ion polishing. The analytical TEM investigations were performed by using a FEI TECNAI G20 TEM equipped with a Gatan GIF 2001 energy filter and a field-emission FEI TECNAI F20 TEM equipped with a Gatan GIF Tridiem energy filter. In this work, we will present a study of the microstructure as well as the optical and electronic properties of LaSrMnO3-LaAlO3 interfaces at different temperatures and operating voltages. High-resolution (HR) TEM, high-angle annular dark field (HAADF) STEM and analytical methods, such as valence electron energy loss spectrometry (VEELS) and electron magnetic chiral dichroism (EMCD) were applied.

The bright field (Fig. 1B) and the dark field (Fig. 1C) image convey the impression of a non-uniform distribution in the LSM layer. This fact is confirmed by means of the HAADF image in Fig. 1A. A columnar structure is distinguished in the thin film. In addition, spot splitting perpendicular to the interface occurs from the lattice mismatch as shown in the Fourier transform (FT) (Fig. 1D) of the HRTEM image (Fig. 1E) recorded at the interface. It was observed that the columnar growth mechanism starts directly at the interface within a heavily strained region as reported in [2].

The EELS investigations of the LaSrMnO3-LaAlO3 interface are shown in Fig. 2. In the case of determining optical properties, high beam energy alters the valence EELS (VEELS) spectrum by exciting retardation losses and therefore, we reduced the operation voltage in order to eliminate these effects [3]. The Cerenkov contribution is observed at 200 keV in LAO and LSM in Fig. 2, while these losses are vanished at lower beam energy. The EELS spectrum after zero-loss peak (ZLP) removal is shown for LAO in Fig. 2A and for LSM in Fig. 2B at 40 keV and 200 keV, respectively. A pre-measured zero-loss peak was used for the ZLP removal of the VEELS signal. However, some artefacts at the bandgap can be seen in the insertion above in Fig. 2A. The VEELS spectrum image in Fig. 2C exhibits the bandgap transition at the LaSrMnO3-LaAlO3 interface with a beam energy at 60 keV.

 

Acknowledgements

We thank the FWF (Austrian Science Foundation) for financial support under the project F4501-N16.

 

References

[1] A. M. Haghiri-Gosnet, J. Wolfman, B. Mercey, C. Simon, P. Lecoeur, M. Korzenski, M. Hervieu, R. Desfeux, and G. Baldinozzi, ‘Microstructure and magnetic properties of strained La0.7Sr0.3MnO3 thin films’, Journal of Applied Physics (2000), vol. 88, no. 7, pp. 4257–4264.

[2] G. Van Tendeloo, O. I. Lebedev, and S. Amelinckx, ‘Atomic and microstructure of CMR materials’, Journal of Magnetism and Magnetic Materials (2000), vol. 211, no. 1, pp. 73–83.

[3] M. Stöger-Pollach, ‘Optical properties and bandgaps from low loss EELS: Pitfalls and solutions’, Micron (2008), vol. 39, pp. 1092-1110.

 


Wolfgang WALLISCH (Wien, Austria), Michael STÖGER-POLLACH, Edvinas NAVICKAS, Andreas STEIGER-THIRSFELD, Johannes BERNARDI
08:00 - 18:15 #6440 - MS07-901 Can transverse plasmonic fields be revealed by differential phase contrast?
MS07-901 Can transverse plasmonic fields be revealed by differential phase contrast?

Surface plasmons give rise to a wide range of applications from molecular sensors [1] over novel circuit designs [2] to the design of meta-materials with highly unusual optical properties [3]. Of particular importance are localized surface plasmons (LSPs) that are confined to the surface of nanoparticles as they can give rise to a significant enhancement of electromagnetic fields in the vicinity of the nanostructure. Because LSPs typically are confined to the nanometer regime, TEM is ideally suited for mapping those charge oscillations.

So far, the predominant method of studying plasmon oscillations has been EELS, which allows mapping the strength of selected resonance modes by measuring the energy loss probability of the probe beam for different LSP energies. In a non-relativistic approximation, this energy loss is brought about by the component of the electric field along the optical axis (and, in principle, the magnetic component perpendicular to the optical axis) of the excited plasmon resonance. Thus, it is impossible to gain any information about the electric field in the viewing plane (i.e., perpendicular to the optical axis). Precisely this component can, however, be studied using differential phase contrast (DPC) [4,5].

DPC exploits the fact that electrons subject to an electromagnetic field are deflected according to the Lorentz force. Any deflection along the optical axis gives rise to a change in kinetic energy and, hence, shows up in EELS. Any deflection perpendicular to the optical axis, however, changes the direction of the electron's momentum, but not its magnitude (in first order approximation). This gives rise to a shift in the electron's momentum distribution. The final momentum distribution, after passing the nanostructure, can then conveniently be measured in the TEM's diffraction plane. Compared to a reference measured without field, the displacement of the transmitted beam shows a shift that is proportional to the field integrated along the electron trajectory.

Here, we used the MNPBEM toolbox [6,7] to simulate the plasmonic response of a 200x50x50 nm³ Ag nanorod to the electron beam (see fig. 1). From the data of the surface charges and currents, we then calculated the EELS maps (see fig. 1) and in-plane deflections along a line parallel to the nanorod (see fig. 2) for different plasmonic modes. The EELS maps show the typical excitation probabilities for the first two modes with two and three maxima. The in-plane electric field components show a similar behavior in general, although the local extrema are less pronounced. The DPC deflections are found to be in good agreement with the electric field with some small differences close to the center of the rod which can be attributed to the cumulative nature of the DPC deflections as well as retardation effects. The absolute magnitude of the DPC deflections in fig. 2 is of the order of 0.1 µrad at 300 keV which, albeit small, should be measurable with latest generation TEMs when using large camera lengths and/or the LACBED technique. In addition, the deflections can be increased, e.g., by using a lower acceleration voltage.

This work shows that it should be feasible to determine all three components of the electromagnetic field caused by plasmons using a combination of DPC and EELS using state-of-the-art TEMs. This will open up new possibilities for understanding and designing novel plasmonic devices.

 

Acknowledgements: Financial support by the Austrian Science Fund (FWF) under grant nr. J3732-N27 and by the NSERC is gratefully acknowledged.

 

[1] Willets & Duyne, Ann. Rev. Phys. Chem. 58 (2007) 267
[2] Ozbay, Science 311 (2006) 189
[3] Zheludev & Kivshar, Nat. Mater. 11 (2012) 917
[4] Rose, Ultramicroscopy 2 (1977) 251
[5] Lohr et al., Ultramicroscopy 117 (2012) 7
[6] Hohenester & Trügler, Comp. Phys. Commun. 183 (2012) 370
[7] Hohenester, Comp. Phys. Commun. 185 (2014) 1177


Stefan LÖFFLER (Wien, Austria), Edson P BELLIDO, Isobel C BICKET, Gianluigi A. BOTTON
08:00 - 18:15 #6562 - MS07-903 ZnO Nanostructures for Mid-IR Plasmonics.
MS07-903 ZnO Nanostructures for Mid-IR Plasmonics.

Degenerate metal oxide nanocrystals (NCs) are promising systems to expand the significant achievements of plasmonics into the infrared (IR) range1. We report on the tunable mid IR Plasmon induced in degenerate Al and Ga doped ZnO (AZO and GZO) nanocrystals. The NCs were obtained by Low Energy Cluster Beam Deposition (LECBD). By varying the Al and Ga content from 3 to 9 at.% within the particles we are able to tune the plasmon wavelength from 3 to 4 μm.   However, the plasmon resonances are characterized by an unusually large damping, which originates from two mechanisms. The first one is the Oriented Attachment (OA) process (cf. figure 1, B)3. When NCs attach by epitaxy, the resulting structure has a lower symmetry, which induces a shift and broadening of the plasmon resonance. Embedding the particles in an Al2O3 matrix has prevented the OA, and hence the damping was reduced along with broadening. The second mechanism is the partial activation of the dopants. We have observed that less than half of the dopants actually participate to the electron gas2. The cause of the partial activation is related to the position of the dopants within the particles. It has been proposed that the damping is larger if the dopants are homogeneously distributed4. In the present work we investigate the possibility of mapping the spatial distribution of dopants within the nanocrystals usingFEI-TITAN ETEM equipped with High resolution Gatan GIF (see Figure 2). We subsequently anneal the nanocrystals to let them reach the thermodynamic equilibrium. The distribution of dopants, and its consequences on the plasmon resonances is then investigated [5,6].

References
[1] G.V. Naik, V.M. Shalaev, A. Boltasseva, “Alternative Plasmonic Materials: Beyond Gold and Silver”, Adv. Mat. 2013, 25, 3264-3294.
[2] M. K. Hamza, J.-M. Bluet, K. Masenelli-Varlot, B. Canut, O. Boisron, P. Melinon and B. Masenelli. ”Tunable mid IR plasmon in GZO nanocrystals”. Nanoscale, 2015, 7, 12030
[3] D. Hapiuk, B. Masenelli, K. Masenelli-Varlot, D. Tainoff, O. Boisron, C. Albin and P. Melinon.”Oriented Attachment of ZnO Nanocrystals ”. J. Phys. Chem. C, 2013, 117, 10220–10227.
[4]  S. D. Lounis, E. L. Runnerstrom, A. Bergerud, D. Nordlund  and D. J. Milliron, J. Am. Chem. Soc., 2014, 136, 7110–7116.
[5] V. C. Holmberg, J. R..Helps, K. A. Mkhoyan, D. J. Norris “Imaging Impurities in Semiconductor Nanostructures”, Chem. Mater., 2013, 25 (8), pp 1332–1350
[6] Thanks are due to the CLYM (Centre Lyon - St-Etienne de Microscopie, www.clym.fr) for access to the microscope.


Mohamed HAMZA TAHA (Villeurbanne), Jean BLUET, Karine MASENELLI-VARLOT, Cyril LANGLOIS, Thierry EPICIER, Matthieu BUGNET, Bruno CANUT, Olivier BOISRON, Patrice. MELINON, Bruno MASENELLI
08:00 - 18:15 #6957 - MS07-905 Hyperbolic Plasmons in the Topological Insulator Bi2Se3.
MS07-905 Hyperbolic Plasmons in the Topological Insulator Bi2Se3.

The surface plasmon excitation is one of the popular field of research due to their high potential to be applicable in sensor1 or information technologies2, cancer research3 etc. These coherent delocalized electron oscillations are common in metal-dielectric interfaces. However, recent studies show they also exist in highly doped semiconductors, conducting oxide system or graphene, in summary mostly the systems with high carrier mobility. The next question can be asked for the insulator interfaces.

Bismuth Selenide became popular material system due to its recently discovered topological insulator property, in which it behaves as an insulator in the bulk state and metallic at the surface state. This also makes Bi2Se3 as a potential candidate for surface plasmons,so that the first example of Dirac plasmons on Bi2Se3 was observed in 2013 in 0.5 – 1 eV energy loss region4.

The Dirac state is not the only reason of the existence of a plasmon resonance in Bi2Se3. It is a highly anisotropic with hypabolic dispersion Tetradymites crystal structure, which also makes the dielectric properties highly anisotropic which can allow the plasmon excitation5. In this study we would like to show energy filtered transmission electron microscopy (EFTEM) and a finite-difference frequency-domain (FDTD) study for investigating Bi2Se3 nanoplates and try to find an explanation for the existing plasmon excitations.

For the experimental observation of Hyporbolic dispersion in Bi2Se3, EFTEM study was carried out using FEG-TEM Sub-Electron-Volt-Sub-Ångstrom-Microscope (Zeiss SESAM) in the 200 kV equipped with an electrostatic monochromator and the in-column MANDOLINE filter with 0.2 eV slit width. As shown in Fig. 1 localized excitations exist at surface of Bi2Se3 crystal and they show different collective modes in different energies. These results supported by FDTD simulations to be able to explain the interplay between the edge plasmons and surface plasmons.   

References:

1.   Wang, Z.; Cheng, Z.; Singh, V.; Zheng, Z.; Wang, Y.; Li, S.; Song, L.; Zhu, J., Stable and Sensitive Silver Surface Plasmon Resonance Imaging Sensor Using Trilayered Metallic Structures. Analytical Chemistry 2013, 86, 1430-1436.

2.   Kosmeier, S.; De Luca, A. C.; Zolotovskaya, S.; Di Falco, A.; Dholakia, K.; Mazilu, M., Coherent control of plasmonic nanoantennas using optical eigenmodes. Sci. Rep. 2013, 3.

3.   Cai, W.; Gao, T.; Hong, H.; Sun, J., Applications of gold nanoparticles in cancer nanotechnology. Nanotechnology, Science and Applications 2008, 2008, 17-32.

4.   Di Pietro, P.; OrtolaniM; LimajO; Di Gaspare, A.; GilibertiV; GiorgianniF; BrahlekM; BansalN; KoiralaN; OhS; CalvaniP; LupiS, Observation of Dirac plasmons in a topological insulator. Nat Nano 2013, 8, 556-560.

5.   Esslinger, M.; Vogelgesang, R.; Talebi, N.; Khunsin, W.; Gehring, P.; de Zuani, S.; Gompf, B.; Kern, K., Tetradymites as Natural Hyperbolic Materials for the Near-Infrared to Visible. ACS Photonics 2014, 1, 1285-1289.

Acknowledgment:

The research leading to these results has received funding from the European Union Seventh Framework Programme [FP7/2007-2013] under grant agreement n°312483 (ESTEEM2). W. V. d. B. acknowledges the Carl Zeiss Foundation.


Cigdem OZSOY KESKINBORA (Stuttgart, Germany), Nahid TALEBI, Hadj BENIA, Christoph KOCH, Peter VAN AKEN
08:00 - 18:15 #6101 - MS08-907 Valence state analysis on iron in minerals of Earth’s lowermost mantle by electron energy loss spectroscopy.
MS08-907 Valence state analysis on iron in minerals of Earth’s lowermost mantle by electron energy loss spectroscopy.

Determining the ratio of ferrous and ferric iron concentrations in lower mantle minerals is essential to understand the geophysical and geochemical properties of the deep Earth. The two iron-bearing phases in the lower mantle are bridgmanite (Brg, (Mg,Fe)SiO3) and ferropericlase (Fp, (Mg,Fe)O) where the valence state and partitioning of iron have a strong impact on the physical and chemical properties [1,2]. Samples consisting of a Brg and Fp mineral assemblage have been previously synthesized from Al-rich olivine composition [3]. Brg turns into an amorphous matrix after decompression to atmospheric pressure and Fp remains crystalline with grain sizes ranging from 50 – 400 nm. To understand the correlation between the distribution and oxidation states of iron, characterization methods with a high spatial resolution are required. Electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM) is a useful method to investigate Fe3+/ ∑Fe in iron-rich minerals [4]. Things to take care of during acquisition are e.g. beam damage of the material or electron-beam-induced oxidation of iron. EELS analysis of Brg and Fp phases synthesized at different temperatures and pressures prepared by focused ion beam (FIB) sectioning will be discussed.

 

[1] Badro et al., Science 300 (2003) 789.

[2] Prescher et al., Earth and Planetary Science Letters 399 (2014) 86.  

[3] Piet et al., submitted

[4] van Aken et al., Physics and Chemistry of Minerals 29 (2002) 188.


Teresa DENNENWALDT (Lausanne, Switzerland), Hélène PIET, James BADRO, Philippe GILLET, Cécile HÉBERT
08:00 - 18:15 #6102 - MS08-909 TEM analysis of stress induced defects in baddeleyite xenocrysts from the Phalaborwa complex.
MS08-909 TEM analysis of stress induced defects in baddeleyite xenocrysts from the Phalaborwa complex.

Large deposits of baddeleyite (natural zirconia) were found in the Phalaborwa complex and mainly in the foskorite ore zone and to a lesser extent in the carbonatite ore body [1]. Baddeleyite has a monoclinic zirconia (ZrO2) structure at room temperature and undergoes a martensitic transformation to a tetragonal structure at approximately 11000C depending on the ambient pressure.  Transformation of the zirconia, on cooling, results in a 5% volume change in the unit cell as well as 8-14% increase in strain energy [2]. This volume change and strain energy during the transformation could result in crystal twinning and/or cracking during catastrophic changes in temperature and pressure especially during the emplacement process. Lumpkin [3] has commented on the lack of a detailed microstructural analysis for natural zirconia which would possibly provide information on the nature of primary and secondary physical alteration mechanisms, and hence the geothermal history of the material. Recent reports on the microanalysis for Phalaborwa zirconia produced data on the origin of secondary inclusions [4] as a result of physical alteration during the emplacement process.  Considering the thermal history of the material it is expected that there should be evidence for stress induced damage. In this paper, the nature of stress induced defects in baddeleyite xenocrysts will be presented and discussed.

 

Sections, approximately 2 mm in thickness, were cut from a Phalaborwa baddeleyite xenocryst using a diamond wire saw and polished to a 0.25 μm finish. TEM sections   were prepared in an FEI Helios NanoLab as well as a Gatan precision ion polishing system. The TEM sections were imaged and analysed using JEOL ARM 200F and JEM 2100 TEMs operated at 200 kV.

 

Both {001} and {011} twin domains were identified using SAD patterns. TEM bright field (BF) images for the {011} twin domains are shown in figure 1. Simulation of the diffraction pattern for the central twin domain shows a 3% elongation in the [001] direction indicating the possibility of strained material in this domain. The twin domains analysed in this work for the Phalaborwa baddeleyite are orders of magnitude larger and do not “pinch out” as described by Kerschofer et al [5]. Figure 2 presents evidence for small loop-like defects formed along what is assumed to be an individual ion track from a fission product recoil (indicated by the dashed lines). The entire field of view is covered by randomly distributed small defect structures which have not yet been identified. Figure 3 shows a few large extended defects which are believed to be oxygen interstitial complexes. These defects are similar in nature to those observed in synthetic stabilized zirconia which has been irradiated with high fluences of swift heavy ions followed by thermal annealing [6]. These high fluences are improbable for natural material and hence the damage is believed to be stress induced followed by thermal annealing.  These results have thus shown that stress induced damage is in fact present in the baddeleyite xenocryst and further analysis will be required to determine the exact characteristics of these defects. The results could possibly provide valuable information on the geochronological thermal history of the material

 

References

[1] JH Nielsen et al., Zirconium and Zirconium Alloys 26 (2000), p. 621.

[2] MTD Wingate and W Compston, Chemical Geology 168 (2000), p.75.

[3] GR Lumpkin, J. Nucl. Mater. 274 (1999),  p206.

[4] ME Lee et al., Proc. Microsc. Soc. South. Afr.42 (2012), p57.

[5] L Kerschhofer et al., Earth. Planet. Sci. Lett. 179 (2000), p219.

[6] K Yasuda et al., J. Nucl. Mater. 319 (2003), p74.


Mike LEE (Port Elizabeth, South Africa), Jacques O'CONNELL, Arno JANSE VAN VUUREN
08:00 - 18:15 #6439 - MS08-910 3D Elemental Mapping of Non-metallic Inclusions in Japanese Sword with FIB-SEM / EDS System.
MS08-910 3D Elemental Mapping of Non-metallic Inclusions in Japanese Sword with FIB-SEM / EDS System.

  Japanese swords are made of raw steel produced by smelting iron sand. The raw steel made by the Tatara method contains less phosphorus and sulphur, and higher concentrations of non-metallic inclusions than modern steel. By analyzing non-metallic inclusions the source of the iron sand and the heat process used during processing Japanese swords have been investigated [1,2]. The purpose of this study is to reveal the 3D distribution of non-metallic inclusions to understand the solidification process. The 3D distribution was observed with a Focused Ion Beam - Scanning Electron Microscope (FIB-SEM). The sample was repeatedly sliced with an FIB-SEM to expose a new surface which was then automatically analyzed using EDS. The 3D distribution was reconstructed from the acquired EDS data to analyze solidification processes of the non-metallic inclusions in the edge. There are structures in which aluminum and calcium-rich areas are wrapped in silicon-rich areas [3]. In this study, structures of non-metallic inclusions in back side of a Japanese sword were analyzed. The sample was a Japanese sword with the signature of Bizen Osafune Katsumitsu (property of M. Kitada). It was made in Japan in the 16th century.

  The 3D distribution of non-metallic inclusions was determined using a JIB-4610F (FIB-SEM, JEOL Ltd.) and an EDS (by Thermo Fisher Scientific). The SEM conditions were as follows; accelerating voltage: 10 kV, probe current: 10 nA, whereas the FIB processing conditions; accelerating voltage: 30 kV, probe current: 10 nA, and ion dose: 100 nC/μm2.

  Cross-sectional macrograph of the sword after etching is shown in Figure 1 a). The secondary electron image (SEI) of the analysis area indicated by the red square in Figure 1 a) is shown in Figure 1 b). Figure 1 c) is an example of backscattered electron image (BEI) of the non-metallic inclusion (red circle of Figure 1 b)) analyzed with the FIB-SEM / EDS. An image reconstructed from BEIs is shown in Figure 2 a). 3D reconstructed images of the non-metallic inclusions and interspace in the non-metallic inclusions extracted by volume rendering are shown in Figures 2 b) and c), respectively. The size of the analyzed volume was about X: 15μm, Y: 44 μm, and Z: 15 μm. The slice pitch was 100 nm. Each analysis took 20.5 minutes. BEI and EDS elemental maps of oxygen, aluminum, silicon, calcium, titanium, and iron obtained from the 90th slice are shown in Figure 3 a). A superimposed 3D elemental map of oxygen (green) and iron (black) is shown in Figure 3 b). Therefore, grains in the non-metallic inclusion are iron oxide. Figure 3 c) is a superimposed 3D elemental map of aluminum (green), silicon (yellow), calcium (cyan) and titanium (magenta). The elemental distribution in the non-metallic inclusions was clearly observed three dimensionally as shown in Fig.3 c). Elements excepting Fe and O described above in the non-metallic inclusion are unevenly distributed as shown in Fig. 3 c). That is, many oxides containing Al, Si, Ca and Ti are distributed around iron oxide grains. And interspace exists between the oxides.

  The back side of a Japanese sword is comprised of core steel. Unlike the blade known as edge steel, core steel is not heavily forged. Therefore, the non-metallic inclusions in the back side of the Japanese sword keeps the constitution of raw materials in some degree. And the shape of the non-metallic inclusion also keeps and remains the same as the original material. Interspaced distances between inclusions also remain the same. As to the distribution of the elements, many iron oxides of several micrometers were encapsulated by the non-metallic inclusions comprised of Al, Si, Ca and Ti oxides. The titanium distribution in the non-metallic inclusions suggests that the source of the iron sand contained an iron titanate; for example, ilumenite (FeTiO3).

 

References

[1] M. Kitada, Fine structures of a Japanese Sword Fabricated in the Late Muromachi Era (16th Century), Uchida-Roukakuho   Tokyo (2008) 27-36. p. 317

[2] M. Kitada,Microstructure of Sword Fabricated in Europe in 17-18th Century, Bulletin of The Faculty of Fine Arts, Tokyo University of The Arts, (2012) 37-50.

[3] H. Matsushima, M. Kitada and G. Brunetti. MCM12 (2015) p. 531


Hideki MATSUSHIMA (TOKYO, Japan), Masahiro KITADA, Minoru SUZUKI, Toshiyuki KANAZAWA
08:00 - 18:15 #6446 - MS08-911 Laser induced yellowing of stonework: a combined TEM imaging and STEM-EELS study on model samples.
MS08-911 Laser induced yellowing of stonework: a combined TEM imaging and STEM-EELS study on model samples.

Nd-YAG Q-Switched laser devices operating at 1064 nm have been considered in the 1990s as the most promising tool for cleaning stone sculptures, and more particularly eliminating indurated black gypsum crusts. However, the spreading of this laser technology has been undermined because of the yellow hue it occasionally conveys to the cleaned surfaces as seen on Figure 1. Especially in France, this yellowing effect is considered as a major esthetic issue by conservators and the laser technique has gradually disappeared from the restoration sites. This discoloration issue remains partly unexplained: a currently admitted hypothesis states that the iron containing compounds present in the black crusts would transform, upon laser irradiation, into yellow iron-rich nanophase(s) that would re-deposit on the cleaned substrate. To verify this hypothesis, model black crusts have been elaborated by mixing hematite α-Fe2O3 and gypsum CaSO4.2H2O in different proportions. The model crusts were irradiated using a Nd-YAG QS laser resulting in ablation of numerous particles in a visible smoke and the color of the samples shifted instantaneously from red to a bright yellow. Transmission electron microscopy (TEM) has been used to characterize the morphology of the nanostructures generated by the laser, both in the smoke and on the surface of the samples as observed in Figure 2. In addition, the chemical composition of the neo-formed nanophases was determined by aberration corrected scanning transmission electron microscopy in combination with electron energy loss spectroscopy (STEM-EELS) and high angle annular dark field imaging (HAADF) as seen on Figure 3. It was found that both the surface of the samples and the ablated micro-materials are covered by an irregular nano-film and by dispersed spherical nanoparticles, all containing iron and oxygen. These results ascertain the link between the yellowing effect and the presence of iron containing nanophases after irradiation.


Marie GODET (Paris), Nicolas GAUQUELIN, Véronique VERGÈS-BELMIN, Christine ANDRAUD, Mandana SAHEB, Judith MONNIER, Eric LEROY, Julie BOURGON, Johan VERBEECK, Gustaaf VAN TENDELOO
08:00 - 18:15 #6853 - MS08-912 Imaging and characterization of HgS nanoclusters in natural organic matrix: challenges and results.
MS08-912 Imaging and characterization of HgS nanoclusters in natural organic matrix: challenges and results.

Methylmecury is the environmental form of neurotoxic mercury that is biomagnified in the food chain. Methylation rates are reduced when the metal is sequestered in crystalline mercury sulfides or bound to thiol groups in macromolecular natural organic matter. Mercury sulfide minerals are known to nucleate in anoxic zones, by reaction of the thiol-bound mercury with biogenic sulfide, but not in oxic environments. However, recent work, using indirect characterization methods such as EXAFS spectroscopy, provided evidence that mercury sulfide forms from thiol-bound mercury alone in aqueous dark systems in contact with air. To confirm such new result, proof of mercury sulfide precipitation using direct characterization methods was needed. Such direct imaging, using TEM techniques, was however challenging due to the scarce occurrence and tininess of mercury sulfide particles in heterogeneous an beam-sensitive natural soil samples. First results of HRTEM imaging of HgS nanoclusters of particles in Hg-contaminated humic acid from Elliott reference soil, combined with diffraction technique to assess the of HgS polymorph, will be presented. Specific challenges due to the nature of the samples will be discussed.


Anne-Claire GAILLOT (NANTES Cedex 3), Cyprien LEMOUCHI, Martine LANSON, Alain MANCEAU, Kathryn L. NAGY
08:00 - 18:15 #6906 - MS08-913 3D study of pore space morphology of the shales.
MS08-913 3D study of pore space morphology of the shales.

       One of the goals of gas and oil shales study is the analysis of multiscale porosity. Pores are located in the areas, containing organic compounds, particularly kerogen, and in the mineral matrix. The analysis of porosity is required for the characterization of geological cores and development of hydrocarbon extraction methods. The parameters, which have to be determined, are pore size distribution, total pores volume and their connectivity. Different methods are used for these investigations and the most popular are the mercury intrusion porosimetry and the X-ray tomography. However, these methods are limited in space resolution and do not reveal completely the pore space at the micro- and nanoscale. Nowadays one of the frequently used methods of the porous material characterization is the scanning electron microscopy (SEM) combined with the focused ion beam (FIB), so-called “slice-and-view” method: it allows to reconstruct the three-dimensional (3D) microstructure of a sample, in particular its porous space, by successive imaging (by SEM) and slicing (by FIB) the object. An important step of 3D reconstruction is the SEM images segmentation, which allows identifying pores (images binarization). Often this task is complicated due to peculiarities of SEM images contrast formation and specific appearance of pores in SEM images. The solution of these problems and completion of all processing steps results in generation of pores surface model and that allows to get quantitative characteristics of pore space, including the connectivity of pores by skeletonization of the internal pore space.

       The study of pore space was performed on a number of shales from different areas of Bazhenov formation and these samples were in various katagenesis stages. Bazhenov formation is one of the largest Russian shale formation (Western Siberia) with unconventional hydrocarbon reserves, formed by sediments of the seabed in the late Jurassic and early Cretaceous period. The composition of the Bazhenov formation rocks is characterized by a large volume fraction of organic matter, in which the kerogen dominates. Other shales components, determined by X-ray diffraction (XRD), SEM and energy-dispersive X-ray spectroscopy, were silica minerals series (e.g., quartz), carbonates, clay minerals and pyrite. Moreover, the components of the shales, namely mineral component and organic compounds, contain pores of different types, which sizes vary over a wide range (nano- and micrometer ranges), and their distribution is nonuniform.

       Helios (FEI, USA), Scios (FEI, USA) and Versa 3D (FEI, USA) DualBeam (FIB/SEM) systems with the registration of secondary electrons (SE) and back-scattered electrons (BSE) were used in this study. Avizo and Amira software (FEI, USA) was used for image processing, 3D reconstruction and analysis.

       3D reconstruction of one of the shale samples is shown in Fig. 1. The overall microstructure consists of three main components: mineral matrix, pore-kerogen space and pyrite inclusions. This sample has a high concentration of the kerogen at a high katagenesis stage (MK3) and, therefore, high density of pores of different sizes. The pores sizes in the kerogen were in the range of 0.01 µm to 0.5 µm and in cross-sections they looked mostly roundish. More irregular pores were in mineral matrix and typically they were larger in size. The automatic segmentation by threshold level in this case was not always possible. The automatic segmentation of pores was challenging and, therefore, an advanced image processing, including image filtering, combined with more complicated segmentation methods were used. The result of 3D reconstruction of the pore space in the kerogen is presented in Fig. 2. Pores volume distribution was calculated on the basis of the 3D binarized image dataset. Next procedure was the skeletonization of pore space and the estimation of pores connectivity. After 3D reconstruction it was easy to estimate the volume fractions of the kerogen, pyrite and mineral matrix in the sample.

 

       This work was supported by Ministry of Education and Science of the Russian Federation under the contract RFMEFI58114X0008.


Alexey MIKHUTKIN, Evgeniy PICHKUR, Igor KARATEEV, Mikhail SPASENNYKH, Alexander VASILIEV (Moscow, Russia)
Exhibition Hall